Linkage test device, linkage test equipment and linkage test method

Abstract

The invention relates to the technical field of mainboard testing, and particularly provides a linkage testing device, linkage testing equipment and a linkage testing method.The linkage testing device comprises a bearing part, a first transmission part and a second transmission part, and the bearing part comprises a bearing seat and a testing seat; the test seat is movably connected with the bearing seat and can be switched between a first separation position and a first detection position relative to the bearing seat; the first transmission part is in transmission connection with the bearing part and is used for driving the test seat to switch positions during movement; the second transmission part is in transmission connection with the bearing part and is used for driving the bearing part to switch between a second separation position and a second detection position during movement; the first transmission part and the second transmission part move synchronously; when the test seat is switched to the first separation position, the test part is separated from the target test piece; the test seat is switched to the first detection position, the bearing piece is switched to the second detection position, and the test part on the test seat is in contact with the target test piece on the bearing seat to realize the test. Linkage testing can be achieved, and the space utilization rate and stability are high.

Description

Technical Field

[0001] This invention relates to the field of motherboard testing, and in particular to linkage testing devices, linkage testing equipment, and linkage testing methods. Background Technology

[0002] The motherboard is one of the most important components of a computer. After production, the motherboard needs to be tested. In current technology, testing some motherboards typically involves lifting the motherboard to a certain height using a lifting device before placing test probes into it. However, this testing equipment struggles to balance high space utilization with stability. Summary of the Invention

[0003] The linkage testing device, linkage testing equipment, and linkage testing method provided in this invention at least solve the problem that existing motherboard testing equipment is difficult to balance high space utilization and stability, and can achieve linkage testing with high space utilization and stability.

[0004] In a first aspect, the present invention provides a linkage testing device, including a carrier, a carrier base, and a test base; the carrier base is used to hold a target test piece; the test base is movably connected to the carrier base, and the test base can switch between a first separation position and a first detection position relative to the carrier base, and a test component is disposed on the test base; a first transmission member is pulsatorically connected to the carrier base; the first transmission member is used to drive the test base to switch positions when moving; a second transmission member is pulsatorically connected to the carrier base; the second transmission member is used to drive the carrier base to switch between a second separation position and a second detection position when moving; wherein, the first transmission member and the second transmission member are configured to move synchronously; when the test base switches to the first separation position, the test component separates from the target test piece; when the test base switches to the first detection position and the carrier base switches to the second detection position, the test component contacts the target test piece to perform testing.

[0005] In one embodiment of the present invention, the first transmission member includes a first part and a second part arranged sequentially; the second part includes a first slope and a first end face connected together; a first guide wheel is provided on the test seat, and the first guide wheel is movably connected to the first transmission member; wherein, when the first guide wheel is provided on the first part, the test seat switches to the first separation position; when the first guide wheel is provided on the first end face, the test seat switches to the first detection position; the second transmission member includes a second end face, a second slope and a third end face arranged sequentially; the second slope includes a first slope segment and a second slope segment connected together; a second guide wheel is provided on the support seat, and the second guide wheel is movably connected to the second transmission member; wherein, when the second guide wheel is provided on the second end face, the support member switches to the second separation position; when the second guide wheel is provided on the third end face, the support member switches to the second detection position; wherein, the first transmission member and the second transmission member move synchronously, so that the second guide wheel moves from the second end face, through the first slope segment and the second slope segment to the third end face, and simultaneously the first guide wheel moves from the first part, through the first slope segment to the first end face.

[0006] In one embodiment of the present invention, a plurality of first transmission members are provided; wherein at least a portion of the first transmission members are configured as first transmission groups, and multiple first transmission groups are provided, arranged sequentially along a second direction; each first transmission group is provided with a plurality of first transmission members, arranged sequentially along a first direction; or / and a plurality of second transmission members are provided; wherein at least a portion of the second transmission members are configured as second transmission groups, and multiple second transmission groups are provided, arranged sequentially along a second direction; each second transmission group is provided with a plurality of second transmission members, arranged sequentially along a first direction.

[0007] In one embodiment of the present invention, a driving member is further included, the driving end of the driving member being configured to be movable along the first direction; wherein, the first transmission group is disposed on at least one side of the driving member along the second direction, and the second transmission group is disposed on at least one side of the driving member along the second direction; and a third transmission member is respectively connected to the driving end of the driving member, the first transmission group, and the second transmission group.

[0008] In one embodiment of the present invention, the test seat is provided with a first elastic member, the first elastic member being used to provide a first elastic force to the test seat, the first elastic force being used to move the test seat from the first detection position to the first separation position.

[0009] In one embodiment of the present invention, a second guide member is further included, the second guide member comprising: a guide post; a guide sleeve movably disposed on the guide post and connected to the carrier; and a second elastic member connected to the guide post and the guide sleeve respectively, the second elastic member being used to provide a second elastic force to the carrier, the second elastic force being used to move the carrier from the second separation position to the second detection position.

[0010] In one embodiment of the present invention, the test base is detachably connected to the support base; or / and the test component is detachably connected to the test base.

[0011] Secondly, the present invention also provides a linkage testing device, including a limiting seat and a linkage testing device as described in any one of the above; the limiting seat is used to cooperate with the bearing seat to perform testing on the target test piece at the second detection position.

[0012] In one embodiment of the present invention, a clamping member is provided on the limiting seat, the clamping member including a clamping cylinder connected to the limiting seat; a clamping rod movably connected to the clamping cylinder, the clamping rod being movable relative to the clamping cylinder along its own axial direction, and a clamping component provided at one end of the clamping rod that contacts the target test piece; and a third elastic component connected to both the clamping cylinder and the clamping rod, the third elastic component providing a third elastic force to the clamping rod, the third elastic force causing the clamping rod to move from one end away from the target test piece to one end closer to the target test piece.

[0013] Thirdly, the present invention also provides a linkage testing method, applied to the linkage testing device or linkage testing equipment as described in any one of the above claims; the linkage testing method includes controlling a first transmission member and a second transmission member to move synchronously; wherein the first transmission member and the second transmission member are both pulsatorically connected to a carrier member, the carrier member includes a carrier seat and a test seat, the carrier seat is used to set a target test piece, the test seat is movably connected to the carrier seat, and a test component is provided on the test seat; by moving the first transmission member, the test seat is driven to switch from a first separation position to a first detection position relative to the carrier seat; wherein, when the test seat is switched to the first separation position, the test component is separated from the target test piece; by moving the second transmission member, the carrier member is driven to switch from a second separation position to a second detection position; when the test seat is switched to the first detection position and the carrier member is switched to the second detection position, the test is performed by the test component contacting the target test piece.

[0014] Compared with the prior art, the above-described technical solution of the present invention has the following advantages:

[0015] In summary, the linkage testing device of this invention achieves the switching of the positions of the carrier and the test seat through the cooperation of the first and second transmission components. Compared with existing testing devices, on the one hand, the use of two small transmission components effectively reduces the overall size of the device and improves its space utilization. On the other hand, the cooperation of the two transmission components effectively avoids the problem of uneven force due to floating during testing, ensuring that the test component can stably and reliably contact the target test piece. Furthermore, it improves testing efficiency and reduces testing costs to a certain extent. Attached Figure Description

[0016] The accompanying drawings, which are included to provide a further understanding of the invention and form part of this invention, illustrate exemplary embodiments of the invention and are used to explain the invention, but do not constitute an undue limitation of the invention. In the drawings:

[0017] Figure 1 This is a schematic diagram of the linkage testing device in a preferred embodiment of the present invention.

[0018] Figure 2 This is one of the structural schematic diagrams of the first transmission component and the second transmission component in a preferred embodiment of the present invention.

[0019] Figure 3 This is one of the schematic diagrams illustrating the working principle of the linkage testing device in a preferred embodiment of the present invention.

[0020] Figure 4 This is the second schematic diagram of the working principle of the linkage testing device in a preferred embodiment of the present invention.

[0021] Figure 5 This is the third schematic diagram of the working principle of the linkage testing device in a preferred embodiment of the present invention.

[0022] Figure 6 This is the fourth schematic diagram of the working principle of the linkage testing device in a preferred embodiment of the present invention.

[0023] Figure 7 This is a second schematic diagram of the structure of the first transmission component and the second transmission component in a preferred embodiment of the present invention.

[0024] Figure 8 This is a cross-sectional structural schematic diagram of the linkage testing device in a preferred embodiment of the present invention.

[0025] Figure 9 This is a schematic diagram of the test stand in a preferred embodiment of the present invention.

[0026] Figure 10 This is a schematic diagram of the structure of the second guide member in a preferred embodiment of the present invention.

[0027] Figure 11 This is one of the cross-sectional structural schematic diagrams of the clamping member in a preferred embodiment of the present invention.

[0028] Figure 12 This is the second cross-sectional structural schematic diagram of the clamping member in a preferred embodiment of the present invention.

[0029] Figure 13 This is a partial cross-sectional view of the linkage testing device in a preferred embodiment of the present invention.

[0030] Figure 14 This is a flowchart illustrating the linkage testing method in a preferred embodiment of the present invention.

[0031] The above figures include the following reference numerals:

[0032] D0, Target direction; D1, First direction; D2, Second direction; 10, Bearing component; 11, Bearing seat; 111, Bearing plate; 1111, Target test piece; 1112, Test through hole; 112, Bearing box; 1121, First guide part; 1122, Second guide wheel; 12, Test seat; 121, Test component; 122, First guide wheel; 123, First elastic component; 20, First transmission group; 21, First transmission component; 211, First part; 212, Second part; 2121, First slope; 2122, First end face; 30, Second transmission... Moving assembly; 31, second transmission component; 311, second end face; 312, second slope; 3121, first slope section; 3122, second slope section; 313, third end face; 40, driving component; 41, third transmission component; 42, first guide component; 43, fourth transmission component; 50, second guide component; 51, guide post; 52, guide sleeve; 53, second elastic component; 60, limiting seat; 61, clamping component; 611, clamping cylinder; 612, clamping rod; 6121, clamping component; 613, third elastic component; 62, second guide section; 63, abutment component. Detailed Implementation

[0033] It should be noted that, unless otherwise specified, the embodiments and features described in the present invention can be combined with each other. The present invention will now be described in detail with reference to the accompanying drawings and embodiments.

[0034] It should be noted that the terminology used herein is for the purpose of describing particular embodiments only and is not intended to limit the scope of exemplary embodiments according to the invention. As used herein, the singular form is intended to include the plural form as well, unless the context clearly indicates otherwise. Furthermore, it should be understood that when the terms "comprising" and / or "including" are used in this specification, they indicate the presence of features, steps, operations, devices, components, and / or combinations thereof.

[0035] Unless otherwise specifically stated, the relative arrangement, numerical expressions, and values ​​of the components and steps set forth in these embodiments do not limit the scope of the invention. It should also be understood that, for ease of description, the dimensions of the various parts shown in the drawings are not drawn to actual scale. Techniques, methods, and devices known to those skilled in the art may not be discussed in detail, but where appropriate, such techniques, methods, and devices should be considered part of the specification. In all examples shown and discussed herein, any specific values ​​should be interpreted as merely exemplary and not as limitations. Therefore, other examples of exemplary embodiments may have different values. It should be noted that similar reference numerals and letters in the following figures denote similar items; therefore, once an item is defined in one figure, it need not be further discussed in subsequent figures.

[0036] It should be noted that there are many components on the motherboard that need to be tested, and these components are located on both sides of the motherboard. When testing the motherboard, it is necessary to test all the components on the motherboard simultaneously, if possible.

[0037] To facilitate testing and loading / unloading, traditional motherboard testing equipment places the motherboard horizontally on a support component, with corresponding testing components on both sides of the support component. For example, one side has a testing component for testing the motherboard interfaces, and the other side has test probes for testing the motherboard itself.

[0038] During testing, a separate driver lifts the carrier component and motherboard, moving them to the side of the interface testing component. This allows the interface testing component to contact the corresponding interface on the motherboard, enabling testing. Simultaneously, another separate driver lifts the test pins, ensuring they also contact the motherboard when it reaches its final position, completing the test. After testing, the carrier component and test pins are reset for motherboard replacement.

[0039] This type of testing device requires at least two independent actuators to lift the supporting components and the test probes respectively, resulting in a large device size and low space utilization.

[0040] To reduce size and improve space utilization, existing technologies also employ a three-layer structure for testing devices, requiring only a single actuator for lifting. For example, this device includes three stacked carrier plates: an upper, middle, and lower plate. The upper carrier plate houses the interface testing components and remains fixed in the height direction; the middle carrier plate houses the main board; and the lower carrier plate is connected to the middle carrier plate by a spring-loaded connection. Test probes are also mounted on the lower carrier plate.

[0041] During testing, the lower carrier board, middle carrier board, and motherboard are moved together by simply lifting them using a driver. Once the motherboard is in position, it can contact the interface testing components on the upper carrier board for interface testing. Simultaneously, the combined forces of the upper carrier board and the driver compress the springs between the lower and middle carrier boards, causing the lower carrier board to contact the motherboard relative to the middle carrier board, thus enabling the test probes to contact the motherboard and complete the test. After testing, the driver resets, allowing the motherboard to be replaced.

[0042] This testing device effectively reduces its size and improves space utilization by eliminating the need for test probe drivers. However, the relatively large motherboard area typically requires numerous springs between the lower and middle carrier boards to achieve floating support. Designers found during actual testing that this floating structure struggles to ensure consistent spring compression across different locations. Uneven spring force leads to varying degrees of tilting in different positions, making it difficult for the test probes to reliably and stably contact the required parts of the motherboard, thus impacting testing efficiency.

[0043] Furthermore, the likelihood of test probe damage increases significantly when the probe is tilted or inserted incorrectly. When a damaged test probe is encountered, the lower and middle carrier boards are connected by a spring-loaded floating structure, requiring considerable time to disassemble and reassemble the floating connection for repair or replacement. This results in relatively low testing efficiency and relatively high testing costs.

[0044] To solve the above problems, refer to Figure 1 and Figure 2 As shown, the present invention provides a linkage testing device, including a carrier 10, a first transmission component 21, and a second transmission component 31.

[0045] The carrier 10 includes a carrier base 11 and a test base 12. The carrier base 11 is used to hold the target test piece 1111. During testing, the target test piece 1111 is placed on the bearing surface of the carrier base 11. Preferably, the target test piece 1111 is the motherboard to be tested.

[0046] The test holder 12 is movably connected to the carrier 11, and the test holder 12 can switch between a first separation position and a first detection position relative to the carrier 11. Those skilled in the art can set different movable connection structures according to actual needs to achieve the movable connection between the test holder 12 and the carrier 11, as long as it is ensured that the test holder 12 can switch positions relative to the carrier 11 between the first separation position and the first detection position.

[0047] For example, the support base 11 includes a support plate 111 and a support box 112, which are connected together. The target test piece 1111 is disposed on the support surface of the support plate 111, and the support box 112 is disposed on the side of the support plate 111 away from the target test piece 1111.

[0048] On the bearing surface of the bearing plate 111, those skilled in the art can set a limiting structure, such as a limiting block, a limiting shaft, a limiting recess, etc., according to actual needs, so as to limit the target test piece 1111.

[0049] Preferably, each limiting structure on the bearing surface is used only for limiting the target test piece 1111 in any direction perpendicular to the target direction D0. Of course, in some embodiments, the limiting structures on the bearing surface can also completely position the target test piece 1111.

[0050] When a limiting structure is set to limit the target test piece 1111, those skilled in the art can set corresponding structures on the limiting structure according to actual needs to improve work efficiency. For example, a guide ramp can be set so that the target test piece 1111 can be placed more smoothly into the limiting structure to achieve the limiting.

[0051] Preferably, the support plate 111 and the support box 112 are detachably connected. Those skilled in the art can configure the detachable connection method according to actual needs, such as snap-fit ​​connection or threaded connection.

[0052] Next, a movable space is provided within the carrier box 112, within which the test seat 12 is movably disposed. For example, it can move along a straight line or along a curve. In some embodiments, the carrier box 112 can be configured as a one-piece structure or as a detachable connection structure comprising multiple components.

[0053] Preferably, the test holder 12 can only move relative to the carrier box 112 along the target direction D0. In any direction perpendicular to the target direction D0, the test holder 12 can be clearance-fitted with the carrier box 112, or a corresponding guide structure can be provided to achieve limiting and guiding. Of course, care should be taken to avoid the test holder 12 from detaching from the carrier box 112 during testing. How to avoid detachment is common knowledge to those skilled in the art and will not be elaborated further.

[0054] In some embodiments, the target direction D0 is parallel to the thickness direction of the motherboard, that is, the first separation position and the first detection position are sequentially spaced along the target direction D0.

[0055] The test socket 12 is provided with a test component 121. Preferably, the test component 121 is configured as a test probe for testing the motherboard. When the test socket 12 moves relative to the support base 11, the test probe can separate from or make contact with the motherboard.

[0056] Specifically, when the test stand 12 is switched to the first separation position relative to the support stand 11, the test component 121 on the test stand 12 is separated from the target test piece 1111 on the support stand 11; when the test stand 12 is switched to the first detection position relative to the support stand 11, the test component 121 on the test stand 12 comes into contact with the target test piece 1111 on the support stand 11.

[0057] Understandably, taking the height direction as an example, the first separation position can be set above or below the first detection position.

[0058] When the first separation position is located above the first detection position, the carrier 10 moves from the first separation position to the first detection position by descending relatively close to the ground. Conversely, when the first separation position is located below the first detection position, the carrier 10 moves from the first separation position to the first detection position by rising relatively away from the ground.

[0059] Of course, apart from setting the support seat 11 as a combination of the support plate 111 and the support box 112, those skilled in the art can also set it as other structures according to actual needs. For example, in some embodiments, the test seat 12 is not set inside the support seat 11. In this case, the support seat 11 is set as a semi-open structure, and the test seat 12 is slidably connected to the support seat 11 through a corresponding guide structure.

[0060] By movably connecting the support base 11 and the test base 12, compared with the existing technology that uses a floating connection structure to achieve the connection, the difficulty of disassembling the two can be effectively reduced, thereby facilitating the corresponding maintenance work and improving the efficiency of maintenance work.

[0061] Taking the carrier plate 111 as an example, those skilled in the art can provide test through holes 1112 or hollow structures on the carrier plate 111 according to actual needs, so that the test component 121 can contact the target test piece 1111.

[0062] Taking the test probe as an example, when the test through hole 1112 is set, preferably, the test probe and the test through hole 1112 are coaxially arranged and the two are fitted with a gap, so that the test probe can pass through the test and contact the motherboard.

[0063] When cutouts are provided, those skilled in the art can set the number, size, and distribution of cutouts according to actual needs to adapt to the same type of motherboard or be compatible with different types of motherboards.

[0064] In some embodiments, an elastic member can be provided between the support 11 and the test 12 so that after the test is completed, the test 12 can be switched more smoothly so that the test component 121 can be separated from the target test piece 1111.

[0065] To drive the test stand 12 and the support stand 11, a first transmission component 21 and a second transmission component 31 are required. Both the first transmission component 21 and the second transmission component 31 are connected to the support stand 10 in a transmission manner.

[0066] Those skilled in the art can set the specific connection objects of the two transmission components according to actual needs.

[0067] For example, the first transmission member 21 is connected to the test base 12 and the second transmission member 31 is connected to the support base 11. Alternatively, the first transmission member 21 is connected to the support base 11 and the second transmission base is connected to the test base 12.

[0068] The first transmission member 21 is used to drive the test seat 12 to switch positions between the first separation position and the first detection position during movement. The second transmission member 31 is used to drive the carrier member 10 to switch positions between the second separation position and the second detection position during movement.

[0069] Preferably, both transmission components are mounted on a base surface, which can be the ground or a horizontal end face. Preferably, the carrier 10 can only move relative to the base surface along the target direction D0. In this case, the second separation position and the second detection position are sequentially spaced along the target direction D0.

[0070] Understandably, taking the height direction as an example, the second separation position can be set above or below the second detection position.

[0071] When the second separation position is located above the second detection position, the carrier 10 moves from the second separation position to the second detection position by descending relatively close to the ground. Conversely, when the second separation position is located below the second detection position, the carrier 10 moves from the second separation position to the second detection position by rising relatively away from the ground.

[0072] At the second detection position, a limit seat 60 can be set according to actual needs. The limit seat 60, in conjunction with the bearing seat 11, can limit the target test piece 1111 in the direction parallel to the target direction D0, thereby positioning the target test piece 1111 and enabling the test component 121 to make precise contact with the test part of the target test piece 1111.

[0073] Of course, in some embodiments, those skilled in the art can also set other testers on the limiting seat 60. For example, a tester for testing the motherboard interface can be set on the limiting seat 60 to perform testing of the motherboard interface at the second detection position.

[0074] Understandably, the second transmission component 31 drives the carrier 11 and the test base 12 to move together. Of course, during the test, it will also drive the target test piece 1111 on the carrier 11 to move together.

[0075] Taking the setting of the limiting seat 60 at the second detection position as an example, when the carrier 10 is switched to the second separation position, the distance between the carrier 10 and the limiting seat 60 is relatively long, and there is a relatively large operating space between them. At this time, the staff can easily replace the target test piece 1111 and perform maintenance on various components of the device.

[0076] When the carrier 10 is switched to the second detection position, the distance between the carrier 10 and the limiting seat 60 is shortened, and the space between them becomes smaller. At this time, the target test piece 1111 is fully positioned with the cooperation of the carrier 11 and the limiting seat 60.

[0077] Preferably, in some embodiments, those skilled in the art can set corresponding guide structures for the position switching of the carrier 10 to achieve guidance and improve structural stability.

[0078] During the process of the second transmission member 31 driving the carrier member 10 to switch from the second separation position to the second detection position, the first transmission member 21 moves synchronously with the second transmission member 31. Preferably, the directions of their synchronous movement are parallel.

[0079] Those skilled in the art can configure two methods for synchronous movement of the transmission components according to actual needs. For example, the first transmission component 21 and the second transmission component 31 can be connected to each other by a certain component, or the first transmission component 21 and the second transmission component 31 can be directly connected to achieve synchronous movement of the first transmission component 21 and the second transmission component 31.

[0080] Those skilled in the art can configure two driving methods for the transmission components according to actual needs. For example, a cylinder or a motor combined with a lead screw can be used to achieve driving. Of course, driving can also be achieved by manual pushing and pulling.

[0081] Preferably, in some embodiments, those skilled in the art can provide corresponding guide structures for the movement of the two transmission components to achieve guidance and improve structural stability.

[0082] Subsequently, with the carrier 10 switched to the second separation position, the test seat 12 switches to the first separation position. During the process of the second transmission member 31 driving the carrier 10 from the second separation position to the second detection position, the first transmission member 21 moves synchronously with the second transmission member 31. With the carrier 10 switched to the second detection position, the test seat 12 switches to the first detection position, thereby causing the test component 121 to contact the target test component 1111, achieving detection.

[0083] Those skilled in the art can configure the first transmission member 21 with different structures according to actual needs to achieve the switching of the position of the test seat 12, as long as it can be ensured that the test seat 12 will not switch to the first detection position when the support seat 11 has not switched to the second detection position. Similarly, those skilled in the art can configure the second transmission member 31 with different structures according to actual needs to achieve the switching of the position of the support member 10.

[0084] Preferably, when the carrier 11 is switched to the second separation position, the test seat 12 is simultaneously switched to the first separation position.

[0085] Of course, those skilled in the art can also adjust the number of the two transmission components according to actual needs, for example, setting the first transmission component 21 as one or more, and the second transmission component 31 as one or more, etc.

[0086] By setting the first transmission component 21 and the second transmission component 31 to move synchronously, the positions of the carrier 10 and the test seat 12 can be switched. This can effectively replace the test device in the prior art that sets multiple drivers and floating connection structures, and has high space utilization and stability.

[0087] Specifically, the linkage testing device of this invention uses a small-volume first transmission component 21 and a second transmission component 31 to switch the positions of the support component 10 and the test seat 12. Although the first transmission component 21 and the second transmission component 31 also occupy a certain volume, their volume is relatively small compared to testing devices with multiple drivers. Therefore, the overall volume of the linkage testing device of this invention is relatively reduced, effectively improving space utilization.

[0088] Meanwhile, through the mechanical transmission cooperation of the first transmission component 21 and the second transmission component 31, the problem of uneven force distribution in the floating connection structure in the prior art can be effectively avoided, thereby ensuring that the test component 121 will not tilt and contact the target test component 1111, which is very stable and reliable.

[0089] When the test component 121 and the target test piece 1111 are in correct contact, on the one hand, repeated debugging and testing are no longer required, effectively reducing the number of tests and improving testing efficiency. On the other hand, the possibility of damage to the test component 121 or the target test piece 1111 is reduced, thereby lowering testing costs.

[0090] Taking the control of the lifting and moving of the carrier 10 to contact and test the motherboard as an example, in some embodiments, the first transmission member 21 is connected to the test seat 12 and the second transmission member 31 is connected to the carrier seat 11.

[0091] During testing, the first transmission component 21 and the second transmission component 31 are first controlled to move synchronously. Driven by the second transmission component 31, the support base 11 moves the test base 12, causing the support component 10 to switch to the second separation position. Simultaneously, driven by the first transmission component 21, the test base 12 actively moves relative to the support base 11, causing the test base 12 to switch to the first separation position. Once in position, the motherboard is placed on the support base 11.

[0092] Secondly, the first transmission component 21 and the second transmission component 31 are controlled to move synchronously, causing the carrier 10 and the test seat 12 within the carrier base 11 to switch positions. On one hand, the carrier base 11 drives the test seat 12 to move together, causing the carrier 10 to switch from a relatively lower second separation position to a relatively upper second detection position. On the other hand, the test seat 12 actively moves relative to the carrier base 11, causing the test seat 12 to switch from a relatively lower first separation position to a relatively upper first detection position.

[0093] Finally, when the first transmission component 21 and the second transmission component 31 move into place, causing the test seat 12 to switch to the first detection position and the carrier component 10 to switch to the second detection position, the test component 121 on the test seat 12 contacts the main board on the carrier seat 11, realizing the lifting linkage test.

[0094] Taking the control of the carrier 10 to descend and move, thereby contacting and testing the motherboard as an example, in some embodiments, the first transmission member 21 is connected to the carrier 11 and the second transmission member 31 is connected to the test base 12.

[0095] During testing, the first transmission component 21 and the second transmission component 31 are first controlled to move synchronously. Driven by the second transmission component 31, the test base 12 moves the support base 11, causing the support component 10 to switch to the second separation position. Simultaneously, driven by the first transmission component 21, the support base 11 actively moves relative to the test base 12, causing the test base 12 to switch to the first separation position. Once in position, the motherboard is placed on the support base 11.

[0096] Secondly, the first transmission component 21 and the second transmission component 31 are controlled to move synchronously, causing the carrier 10 and the test seat 12 within the carrier base 11 to switch positions. On one hand, the test seat 12 drives the carrier base 11 to move, causing the carrier 10 to switch from a relatively upper second separation position to a relatively lower second detection position. On the other hand, the carrier base 11 actively moves relative to the test seat 12, causing the test seat 12 to switch from a relatively upper first separation position to a relatively lower first detection position.

[0097] Finally, when the first transmission component 21 and the second transmission component 31 move into place, causing the test seat 12 to switch to the first detection position and the carrier component 10 to switch to the second detection position, the test component 121 on the test seat 12 contacts the main board on the carrier seat 11, realizing the lifting linkage test.

[0098] In summary, the linkage testing device of the present invention achieves the switching of the positions of the carrier 10 and the test seat 12 through the cooperation of the first transmission component 21 and the second transmission component 31. Compared with the testing devices in the prior art, on the one hand, the use of two small transmission components effectively reduces the overall size of the device and improves the space utilization rate. On the other hand, the transmission cooperation of the two transmission components effectively avoids the problem of uneven force due to floating during testing, ensuring that the test component 121 can stably and reliably contact the target test component 1111. In addition, it improves testing efficiency and reduces testing costs to a certain extent.

[0099] Reference Figures 2 to 6 As shown, in some embodiments, the linkage testing device of the present invention performs a lifting test on the target test piece 1111. In this case, the first separation position is relatively positioned below the first detection position, and the second separation position is also relatively positioned below the second detection position.

[0100] The first transmission member 21 includes a first part 211 and a second part 212 arranged sequentially, and a first guide wheel 122 is provided on the test seat 12. Of course, in some embodiments, the first transmission member 21 can also be set as a guide wheel, and the test seat 12 can be provided with the same structure as the first part 211 and the second part 212 to contact the guide wheel.

[0101] The first guide wheel 122 is movably connected to the first transmission member 21. This movable connection includes a sliding connection, a rolling connection, and a combination of sliding and rolling connections. In some cases, the first guide wheel 122 and the first transmission member 21 can separate and then contact, or contact and then separate. Preferably, the axial direction of the first guide wheel 122 is perpendicular to the direction of movement of the first transmission member 21.

[0102] Specifically, the first part 211 can be set as an end face or a slope. When the action to be performed is a lifting action, the highest height of the first part 211 can be set to be no higher than the lowest height of the second part 212, or the highest height of the first part 211 can be set to be lower than the highest height of the second part 212.

[0103] In some embodiments, taking the first part 211 as an end face as an example, the height of each part of the end face is equal and all are lower than the lowest height of the second part 212.

[0104] It should be noted that when the first guide wheel 122 is provided in the first part 211, those skilled in the art can configure the first guide wheel 122 to contact or separate from the end face of the first part 211.

[0105] Understandably, with the first guide wheel 122 set in the first part 211, the test seat 12 switches to the first separation position, causing the test component 121 to separate from the target test piece 1111.

[0106] The second part 212 includes a first ramp 2121 and a first end face 2122 connected together. The first ramp 2121 is a transition surface to allow the first guide wheel 122 to move between the first part 211 and the first end face 2122. With the first guide wheel 122 disposed on the first ramp 2121, the test seat 12 is also disposed accordingly between the first separation position and the first detection position.

[0107] Those skilled in the art can configure the first slope 2121 as a sloping plane, a convex surface, or a concave surface according to actual needs, as long as the first guide wheel 122 can move between the first part 211 and the first end face 2122. Preferably, the first slope 2121 and the first end face 2122 are transitioned by an arc surface.

[0108] Preferably, the first end face 2122 is a horizontal surface to provide support for the first guide wheel 122. With the first guide wheel 122 positioned on the first end face 2122, the test seat 12 switches to the first detection position, and the test component 121 can maintain contact with the target test piece 1111 to achieve the test.

[0109] The second transmission member 31 includes a second end face 311, a second slope 312, and a third end face 313 arranged sequentially, and a second guide wheel 1122 is provided on the support base 11. Of course, in some embodiments, the second transmission member 31 can also be set as a guide wheel, and the support base 11 can be provided with the same structure as the second end face 311, the second slope 312, and the third end face 313 to contact the guide wheel.

[0110] The second guide wheel 1122 is movably connected to the second transmission member 31. The movable connection includes a sliding connection, a rolling connection, and a combination of sliding and rolling connections. Preferably, the axial direction of the second guide wheel 1122 is perpendicular to the moving direction of the second transmission member 31.

[0111] Specifically, the second end face 311 is a horizontal plane to provide support for the second guide wheel 1122. The height of the second end face 311 is lower than that of the third end face 313. When the second guide wheel 1122 is positioned on the second end face 311, the support member 10 switches to the second separation position. Those skilled in the art can configure the second slope 312 as a sloping plane, a convex surface, or a concave surface according to actual needs.

[0112] The second slope 312 includes a first slope segment 3121 and a second slope segment 3122 connected together. The first slope segment 3121 is connected to the second end face 311, and the second slope segment 3122 is connected to the third end face 313. Preferably, the corresponding slope segments and end faces are transitioned by arc surfaces.

[0113] Preferably, when the second guide wheel 1122 is provided on the first slope section 3121, the first guide wheel 122 is provided on the first part 211. At this time, the test seat 12 remains in the first separation position, while the carrier 10 is provided between the second separation position and the second detection position, and is relatively closer to the second separation position.

[0114] With the second guide wheel 1122 positioned on the second slope section 3122, the first guide wheel 122 is positioned on the first slope surface 2121. At this time, the test seat 12 is positioned between the first separation position and the first detection position, while the carrier 10 is still positioned between the second separation position and the second detection position, and is relatively closer to the second detection position.

[0115] With the second guide wheel 1122 positioned on the third end face 313, the first guide wheel 122 is positioned on the first end face 2122. At this time, the test seat 12 switches to the first detection position, and the carrier 10 switches to the second detection position.

[0116] Taking the first guide wheel 122 and the second guide wheel 1122 with the same radial dimensions as an example, and with the test seat 12 in the first separation position and the height of the two guide wheels being consistent, the height of the first end face 2122 can be set to be higher than the height of the third end face 313.

[0117] Taking the start of the lifting test as an example, the first transmission component 21 and the second transmission component 31 move synchronously, causing the second guide wheel 1122 to move from the second end face 311, through the first slope section 3121 and the second slope section 3122 to the third end face 313. At the same time, the first guide wheel 122 moves from the first part 211, through the first slope 2121 to the first end face 2122. Correspondingly, the test seat 12 will switch from the first separation position to the first detection position, and the carrier 10 will switch from the second separation position to the second detection position.

[0118] Conversely, the test seat 12 is switched from the first detection position to the first separation position, and the carrier 10 is switched from the second detection position to the second separation position.

[0119] In some embodiments of the linkage testing device described in this invention, to increase the structural stability of the device, multiple first transmission members 21 are provided, or / and multiple second transmission members 31 are provided. Preferably, multiple of both types of transmission members are provided, and each transmission member is arranged in an array.

[0120] Furthermore, refer to Figure 7 As shown, in some embodiments, at least a portion of the first transmission members 21 are configured as first transmission groups 20. Multiple first transmission groups 20 are provided, arranged sequentially along the second direction D2. Each first transmission group 20 has multiple first transmission members 21, arranged sequentially along the first direction D1. Or / and, at least a portion of the second transmission members 31 are configured as second transmission groups 30, multiple second transmission groups 30 are provided, arranged sequentially along the second direction D2. Each second transmission group 30 has multiple second transmission members 31, arranged sequentially along the first direction D1. By configuring this structure, the structural stability of the device can be effectively increased to achieve stable and reliable drive operations, such as lifting or lowering.

[0121] Preferably, the first direction D1 is parallel to the moving direction of each transmission group, the second direction D2 is perpendicular to the first direction D1, and both the first direction D1 and the second direction D2 are perpendicular to the target direction D0.

[0122] Preferably, the first transmission group 20 and the second transmission group 30 are each provided in two groups. Each first transmission group 20 is provided with two first transmission components 21, and each second transmission group 30 is provided with two second transmission components 31, so as to balance high space utilization and stability.

[0123] Furthermore, refer to Figure 1 and Figure 7 As shown, in some embodiments, the linkage testing device of the present invention further includes a driving component 40 and a third transmission component 41.

[0124] The driving end of the driving member 40 is configured to move along the first direction D1. Those skilled in the art can configure different driving members 40 according to actual needs. For example, the driving member 40 can be configured as a cylinder, or as a combination of components such as a motor and a lead screw, to achieve driving. The third transmission member 41 is connected to the driving end of the driving member 40, as well as the first transmission group 20 and the second transmission group 30. Under the transmission of the third transmission member 41, the driving force of the driving member 40 is transmitted to the two transmission groups, thereby driving the support seat 11 and the test seat 12 to move.

[0125] The first transmission group 20 is disposed on at least one side of the driving member 40 along the second direction D2, and the second transmission group 30 is disposed on at least one side of the driving member 40 along the second direction D2.

[0126] Preferably, when both the first transmission group 20 and the second transmission group 30 are provided in two sets, the two sets of the first transmission group 20 are respectively provided on both sides of the driving member 40 along the second direction D2; the two sets of the second transmission group 30 are respectively provided on both sides of the driving member 40 along the second direction D2 and on the side of the first transmission group 20 that is relatively away from the driving member 40, so as to take into account both high space utilization and stability.

[0127] Preferably, in some embodiments, the linkage testing device of the present invention further includes a fourth transmission member 43, which is connected to each of the first transmission groups 20 and each of the second transmission groups 30. Simultaneously, along the first direction D1, the fourth transmission member 43 and the third transmission member 41 are respectively disposed on both sides of the driving member 40. This structure allows the transmission members to be interconnected, forming a square frame structure to further increase structural stability.

[0128] In some embodiments, the linkage testing device of the present invention further includes a first guide member 42, which is used to provide guidance for the driving member 40.

[0129] Those skilled in the art can configure the specific first guide member 42 according to actual needs, such as a guide rod. Preferably, the first guide member 42 is a combination of a guide rail and a guide block. Preferably, two first guide members 42 are provided, wherein the guide rail is fixedly set, and the guide block is fixedly connected to the second transmission member 31 to achieve guidance along the first direction D1 and increase the structural stability of the device.

[0130] Reference Figure 8 and Figure 9 As shown, in some embodiments of the linkage testing device of the present invention, a first elastic member 123 is provided on the test seat 12. The first elastic member 123 is used to provide a first elastic force to the test seat 12, and the first elastic force is used to move the test seat 12 from a first detection position to a first separation position.

[0131] Those skilled in the art can configure different types of first elastic components 123 according to actual needs. Preferably, the first elastic component 123 is configured as a spring. Those skilled in the art can configure the number of first elastic components 123 according to actual needs. Preferably, multiple first elastic components 123 are configured, and multiple first elastic components 123 are arranged in an array. Of course, in some embodiments, the first elastic component 123 can also be configured on the support plate 111 of the support seat 11.

[0132] After the target test piece 1111 is tested, the drive end of the drive piece 40 moves in the opposite direction to reset all components. By setting the first elastic component 123 to provide the first elastic force to the test seat 12, the test seat 12 can move more smoothly, avoiding problems such as jamming, and effectively improving the testing efficiency of the device.

[0133] Reference Figure 1 , Figure 7 and Figure 10 As shown, in some embodiments of the linkage testing device of the present invention, a second guide member 50 is further included, which includes a guide post 51, a guide sleeve 52, and a second elastic component 53.

[0134] Preferably, the axial direction of the guide post 51 is parallel to the target square. Preferably, the guide post 51 is fixedly disposed relative to the base surface. The guide sleeve 52 is movably disposed on the guide post 51 and is connected to the support seat 11. When the support seat 11 moves, the guide sleeve 52 and the guide post 51 cooperate to guide the movement of the support seat 11 and increase the structural stability of the device. Preferably, the support box 112 is provided with a through hole to avoid the guide post 51.

[0135] The second elastic component 53 is connected to the guide post 51 and the guide sleeve 52 respectively. The second elastic component 53 is used to provide a second elastic force to the carrier 10. The second elastic force is used to move the carrier 10 from the second separation position to the second detection position.

[0136] Those skilled in the art can configure different types of second elastic components 53, such as different types of springs, according to actual needs. Preferably, the second elastic component 53 is configured as a spring. Before testing, when the drive end of the drive member 40 moves, causing each transmission component to move the carrier member 10 and switch to the second detection position, the second elastic component 53 provides a second elastic force to the carrier member 10, making the movement smoother and effectively distributing some of the weight of the carrier member 10, allowing the drive member 40 to drive more easily and effectively improving testing efficiency. After the test is completed, the second elastic force can also play a certain buffering role, preventing the carrier member 10 from moving too fast and causing hard contact or damage, thus extending the service life of each component.

[0137] Those skilled in the art can determine the number and placement of the second guide members 50 according to actual needs. Preferably, four sets of second guide members 50 are provided, and they are respectively placed at the four corners of the square support 11 to increase structural stability.

[0138] Reference Figure 9 As shown, in some embodiments of the linkage testing device of the present invention, the test base 12 is detachably connected to the support base 11; or / and the test component 121 is detachably connected to the test base 12.

[0139] Those skilled in the art can, according to actual needs, detachably connect only the test base 12 to the support base 11, and only detachably connect only the test component 121 to the test base 12. Preferably, both the test base 12 and the support base 11 are detachably connected, and the test component 121 is detachably connected to the test base 12.

[0140] Those skilled in the art can set the detachable connection between the components according to actual needs, such as by fastener thread connection, snap-fit, etc., and the present invention does not limit this.

[0141] With a detachable connection, if some of the test components 121 are damaged after a long period of testing, the staff can replace them locally, effectively reducing maintenance costs.

[0142] The present invention also provides a linkage testing device, including a limiting seat 60 and a linkage testing apparatus as described in any of the above embodiments. The limiting seat 60 is used to cooperate with the bearing seat 11 to perform testing on the target test piece 1111 at a second detection position.

[0143] Those skilled in the art can configure the limiting seat 60 according to actual needs. For example, the limiting seat 60 can be fixedly disposed at or near the second detection position to cooperate with the carrier 10 moved to the second detection position to achieve testing of the target test piece 1111. Alternatively, the limiting seat 60 can be movably disposed at or near the second detection position. For example, the limiting seat 60 can be connected to a corresponding driver, so that the limiting seat 60 moves along the target direction D0 under the drive of the driver, or it can be used with a rotating structure such as a hinge to rotate relative to the second detection position, thereby providing more space when testing is not required. The driver of the limiting seat 60 can be configured as a cylinder, motor, hydraulic cylinder, etc., which will not be described in detail here.

[0144] The linkage testing equipment described in this invention includes the linkage testing device described in the above embodiments, and therefore all the beneficial effects it has are also present in the linkage testing equipment, which will not be repeated here.

[0145] In some embodiments, those skilled in the art can set other testers on the limiting seat 60. For example, a tester for testing the motherboard interface is set on the limiting seat 60 to perform testing of the motherboard interface together at the second detection position.

[0146] Reference Figure 11 and Figure 12 As shown, in some embodiments of the linkage testing device of the present invention, a clamping member 61 is provided on the limiting seat 60. The clamping member 61 includes a clamping cylinder 611, a clamping rod 612 and a third elastic component 613.

[0147] The clamping cylinder 611 is connected to the limiting seat 60. Preferably, the two are fixedly connected. The clamping rod 612 is movably connected to the clamping cylinder 611; specifically, the clamping rod 612 can move relative to the clamping cylinder 611 along its own axial direction. A third elastic member 613 is connected to both the clamping cylinder 611 and the clamping rod 612. The third elastic member 613 provides a third elastic force to the clamping rod 612, which causes the clamping rod 612 to move from the end away from the target test piece 1111 to the end closer to the target test piece 1111. Preferably, the third elastic member 613 is a spring.

[0148] A clamping member 6121 is provided at one end of the clamping rod 612 that contacts the target test piece 1111. Preferably, the clamping member 6121 is a flexible / elastic member to avoid damaging the target test piece 1111.

[0149] During testing, when the target test piece 1111 moves to the second detection position, the clamping member 61 provides clamping force to the target test piece 1111 to ensure that the target test piece 1111 remains flat.

[0150] When the target test piece 1111 is in contact with the clamping component 6121, the clamping rod 612 and the clamping cylinder 611 cooperate to overcome the third elastic force, thereby causing the clamping rod 612 to move from the end closer to the target test piece 1111 to the end away from the target test piece 1111, achieving floating clamping and further preventing damage to the target test piece 1111. After the test is completed, the target test piece 1111 separates from the clamping component 6121. At this time, under the action of the third elastic force, the clamping rod 612 returns to its original position, awaiting subsequent testing.

[0151] Preferably, the limiting seat 60 is provided with a plurality of clamping elements 61, and the plurality of clamping elements 61 are arranged in an array to provide uniform clamping force for the target test piece 1111, ensuring that the target test piece 1111 remains flat, thereby improving the detection accuracy.

[0152] Reference Figure 13As shown, in some embodiments of the linkage testing equipment of the present invention, a first guide portion 1121 is provided on the carrier box 112, and a second guide portion 62 corresponding to the first guide portion 1121 is provided on the limiting seat 60. When the second guide portion 62 is in contact with the first guide portion 1121, it provides guidance for the carrier 10 and the limiting seat 60. By setting this structure, the mold closing jamming caused by errors can be corrected, ensuring that the corresponding components can be accurately aligned and tested, thus improving the testing accuracy.

[0153] Preferably, the first guide portion 1121 is configured as a guide hole and the second guide portion 62 is configured as a guide pin, with a clearance fit between the two. Preferably, the limiting seat 60 is also provided with an abutting member 63. When the abutting member 63 abuts against the support plate 111, the support plate 111 and the limiting seat 60 can no longer get closer to each other, so as to avoid damaging the target test piece 1111.

[0154] Reference Figure 14 As shown, the present invention also provides a linkage testing method, applied to the linkage testing device described in any of the above embodiments. The linkage testing method includes:

[0155] The first transmission component 21 and the second transmission component 31 are controlled to move synchronously. Both the first transmission component 21 and the second transmission component 31 are connected to the carrier component 10. The carrier component 10 includes a carrier seat 11 and a test seat 12. The carrier seat 11 is used to set the target test component 1111. The test seat 12 is movably connected to the carrier seat 11 and is provided with a test component 121.

[0156] The first transmission component 21 moves, causing the test base 12 to switch from a first separation position to a first detection position relative to the support base 11. When the test base 12 is switched to the first separation position, the test component 121 separates from the target test component 1111.

[0157] The second transmission component 31 moves, causing the carrier component 10 to switch from the second separation position to the second detection position.

[0158] When the test stand 12 is switched to the first detection position and the carrier 10 is switched to the second detection position, the test is performed by the test component 121 contacting the target test piece 1111.

[0159] Working principle:

[0160] Before testing the motherboard, the carrier 11 and test 12 are switched to the second separation position and the first separation position respectively by the drive unit 40. At this time, the motherboard is placed on the carrier board 111.

[0161] Next, driven by the drive member 40, the first transmission member 21 and the second transmission member 31 move synchronously, causing the carrier member 10 and the test seat 12 within the carrier base 11 to switch positions. At this time, on one hand, the second guide wheel 1122 moves from the second end face 311, through the first slope section 3121 and the second slope section 3122, to the third end face 313, causing the carrier member 10 to switch from the relatively lower second separation position to the relatively upper second detection position. On the other hand, the first guide wheel 122 moves from the first part 211, through the first slope 2121, to the first end face 2122, causing the test seat 12 to switch from the relatively lower first separation position to the relatively upper first detection position. During the lifting process, the first guide member 42, the second guide member 50, and the first guide part 1121 and the second guide part 62 cooperate to provide guidance.

[0162] When the first transmission component 21 and the second transmission component 31 move into position, causing the test seat 12 to switch to the first detection position and the carrier component 10 to switch to the second detection position, the clamping component 61 on the limiting seat 60 clamps the mainboard, and the test component 121 on the test seat 12 contacts the mainboard on the carrier seat 11 to perform the test. After the test is completed, all components are reset so that the mainboard can be replaced for subsequent tests.

[0163] For ease of description, spatial relative terms such as "above," "on top of," "on the upper surface of," "above," etc., are used herein to describe the spatial positional relationship of a device or feature as shown in the figures to other devices or features. It should be understood that spatial relative terms are intended to encompass different orientations in use or operation beyond the orientation of the device as described in the figures. For example, if the device in the figures were inverted, a device described as "above" or "on top of" other devices or structures would subsequently be positioned as "below" or "under" other devices or structures. Thus, the exemplary term "above" can include both "above" and "below." The device may also be positioned in other different ways (rotated 90 degrees or in other orientations), and the spatial relative descriptions used herein will be interpreted accordingly.

[0164] Furthermore, it should be noted that the use of terms such as "first" and "second" to define components is merely for the purpose of distinguishing the corresponding components. Unless otherwise stated, the above terms have no special meaning and therefore should not be construed as limiting the scope of protection of this invention.

[0165] The above are merely preferred embodiments of the present invention and are not intended to limit the present invention. Various modifications and variations can be made to the present invention by those skilled in the art. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the present invention should be included within the scope of protection of the present invention.

Claims

1. A linkage testing device, characterized in that, include: The carrier includes a carrier base and a test base; the carrier base is used to set the target test piece; the test base is movably connected to the carrier base, and the test base can switch between a first separation position and a first detection position relative to the carrier base; the test base is provided with a test component. A first transmission component is connected to the carrier component; the first transmission component is used to drive the test seat to switch positions when moving. The second transmission component is connected to the carrier component; the second transmission component is used to drive the carrier component to switch between a second separation position and a second detection position when moving. The first transmission component and the second transmission component are configured to move synchronously; when the test seat is switched to the first separation position, the test component separates from the target test piece; when the test seat is switched to the first detection position and the carrier is switched to the second detection position, the test component contacts the target test piece to perform the test.

2. The linkage testing device according to claim 1, characterized in that: The first transmission component includes a first part and a second part arranged sequentially; the second part includes a first slope and a first end face connected together; the test seat is provided with a first guide wheel, which is movably connected to the first transmission component; wherein, when the first guide wheel is provided in the first part, the test seat switches to the first separation position; when the first guide wheel is provided in the first end face, the test seat switches to the first detection position. The second transmission component includes a second end face, a second slope, and a third end face arranged sequentially; the second slope includes a first slope segment and a second slope segment connected together; a second guide wheel is provided on the bearing seat, and the second guide wheel is movably connected to the second transmission component; wherein, when the second guide wheel is provided on the second end face, the bearing component switches to the second separation position; when the second guide wheel is provided on the third end face, the bearing component switches to the second detection position; The first transmission component and the second transmission component move synchronously, causing the second guide wheel to move from the second end face, through the first slope and the second slope to the third end face, while the first guide wheel moves from the first part, through the first slope to the first end face.

3. The linkage testing device according to claim 1 or 2, characterized in that: The first transmission component is provided in multiple ways; wherein, at least some of the first transmission components are provided as first transmission groups, and multiple first transmission groups are provided, arranged sequentially along the second direction; each first transmission group is provided with multiple first transmission components, and the multiple first transmission components are arranged sequentially along the first direction. or / and, The second transmission component is provided in multiple ways; wherein, at least some of the second transmission components are provided as second transmission groups, and multiple second transmission groups are provided in sequence along the second direction; each second transmission group is provided with multiple second transmission components, and the multiple second transmission components are provided in sequence along the first direction.

4. The linkage testing device according to claim 3, characterized in that, Also includes: A driving member, wherein the driving end of the driving member is configured to be movable along the first direction; wherein the first transmission group is disposed on at least one side of the driving member along the second direction, and the second transmission group is disposed on at least one side of the driving member along the second direction. The third transmission component is connected to the driving end of the driving component, as well as the first transmission group and the second transmission group.

5. The linkage testing device according to claim 1, characterized in that: The test stand is provided with a first elastic component, which provides a first elastic force to the test stand and causes the test stand to move from the first detection position to the first separation position.

6. The linkage testing device according to claim 1, characterized in that, It also includes a second guide member, the second guide member comprising: Guide post; A guide sleeve is movably mounted on the guide post and is connected to the bearing seat. The second elastic component is connected to the guide post and the guide sleeve respectively. The second elastic component is used to provide a second elastic force to the carrier, and the second elastic force is used to move the carrier from the second separation position to the second detection position.

7. The linkage testing device according to claim 1, characterized in that: The test base and the support base are detachably connected; or / and, The test component is detachably connected to the test base.

8. A linkage testing device, characterized in that, It includes a limiting seat and a linkage testing device as described in any one of claims 1 to 7; the limiting seat is used to cooperate with the bearing seat to perform testing on the target test piece at the second detection position.

9. The linkage testing equipment according to claim 8, characterized in that, The limiting seat is provided with a clamping element, the clamping element comprising: A clamping cylinder is connected to the limiting seat; A clamping rod is movably connected to the clamping cylinder. The clamping rod can move relative to the clamping cylinder along its own axial direction. A clamping component is provided at the end of the clamping rod that contacts the target test piece. A third elastic component is connected to the clamping cylinder and the clamping rod respectively. The third elastic component is used to provide a third elastic force to the clamping rod, and the third elastic force is used to move the clamping rod from the end away from the target test piece to the end closer to the target test piece.

10. A linkage testing method, applied to the linkage testing device as described in any one of claims 1 to 7, or applied to the linkage testing equipment as described in claim 8 or 9, characterized in that, include: The first and second transmission components are controlled to move synchronously; wherein, both the first and second transmission components are connected to a carrier component, the carrier component includes a carrier seat and a test seat, the carrier seat is used to set the target test component, the test seat is movably connected to the carrier seat, and a test component is provided on the test seat; The movement of the first transmission component causes the test seat to switch from a first separation position to a first detection position relative to the support seat; wherein, when the test seat is switched to the first separation position, the test component separates from the target test piece; The movement of the second transmission component causes the carrier component to switch from the second separation position to the second detection position; When the test stand is switched to the first detection position and the carrier is switched to the second detection position, the test is performed by the test component contacting the target test piece.

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