Blade leading edge polishing and straightening equipment

Abstract

This invention relates to the field of optical technology, and more particularly to a blade leading and trailing edge polishing and straightening device. It includes a fixture for loading the guide vane to be inspected, with a polishing system arranged beside the fixture. The guide vane to be inspected is placed vertically on the fixture. It also includes a laser interferometer system. The laser interferometer system includes a laser and a beam splitter, which splits a measurement beam and a reference beam. A linear collimating lens is respectively arranged in the optical paths of the measurement beam and the reference beam, and the measurement beam and the reference beam pass through the collimating lenses to form a horizontal linear beam. The laser interferometer system enables online real-time inspection, accurately locating defects at the leading and trailing edges of the guide vane, facilitating the movement of the polishing head to the defective area for fine polishing, shortening the production cycle, and reducing production costs.

Description

Technical Field

[0001] This invention relates to the field of optical technology, and in particular to a blade leading and trailing edge polishing and straightening device. Background Technology

[0002] Guide vanes (guide blades) are key aerodynamic components in turbine systems, located between the combustion chamber and the turbine. Their function is to efficiently transfer energy by adjusting the direction of airflow. The design of the leading edge (inlet side) and trailing edge (outlet side) of the guide vanes directly affects aerodynamic efficiency and cooling performance.

[0003] Since the leading and trailing edges of the guide vanes are the most critical parts that bear the most concentrated airflow impact, stress and heat load, any tiny surface cracks or internal defects may rapidly expand under extreme working conditions, leading to blade breakage and causing serious engine failure. Therefore, the leading and trailing edges of aero-engine guide vanes must undergo rigorous non-destructive testing after manufacturing.

[0004] However, during the manufacturing process, a small amount of allowance is reserved for the leading and trailing edges to ensure the forming accuracy of the aerodynamic profile and cooling structure. This allowance needs to be removed by fine grinding. However, due to the small size of some allowances, a large number of blades still have invisible residual allowances after grinding. These blades are judged to be unqualified after a long period of non-destructive testing. After rework, they need to undergo another long period of non-destructive testing until they are qualified before they can be assembled.

[0005] Traditional operations involve frequent disassembly and reassembly work on a coordinate measuring machine (CMM). This method is costly, time-consuming, and fails to provide intuitive and rapid guidance for workers to perform precise repairs. Summary of the Invention

[0006] The purpose of this invention is to provide a blade leading and trailing edge polishing and straightening device to solve at least one of the above-mentioned technical problems.

[0007] The technical problem solved by the invention can be achieved using the following technical solutions:

[0008] The blade leading and trailing edge polishing and straightening equipment includes a fixture for loading the guide vane to be inspected, a polishing system arranged next to the fixture, and the guide vane to be inspected is placed vertically on the fixture;

[0009] It also includes laser interferometer systems;

[0010] The laser interferometer system includes a laser and a beam splitter, which splits the measurement beam and a reference beam.

[0011] In the optical paths of the measuring beam and the reference beam, a linear collimating lens is set up respectively. The measuring beam and the reference beam pass through the collimating lens respectively to form a horizontal linear beam.

[0012] The angle between the measurement beam and the reference beam is greater than 1 degree and less than 10 degrees.

[0013] Both the measurement beam and the reference beam are projected onto the leading edge or trailing edge surface to form a measurement spot and a reference spot arranged at intervals, and are reflected by the leading edge or trailing edge surface to form two reflected rays;

[0014] A vertically fixed light-absorbing plate is set up, with vertical gaps that match the leading or trailing edge end face. The leading or trailing edge end face is inserted into the gap and exposed, thereby reducing the residual light outside the leading or trailing edge end face.

[0015] The laser interferometer system also includes two light-shielding channels, which are parallel to the pointing directions of the measurement beam and the reference beam, respectively.

[0016] The light-shielding channel adopts a straight circular tube inner wall, and the straight circular tube inner wall has a black frosted surface;

[0017] The laser interferometer system also includes two optical components for adjusting the angle of light, and the two optical components are respectively located behind the two light-shielding channels;

[0018] The two optical components adjust the return beams transmitted from the two light-blocking channels to perform interference imaging.

[0019] The laser interferometer system is fixed on a vertically lifting hydraulic lifting device.

[0020] In the above design, after the laser interferometer system detects the defects at the leading and trailing edges, the polishing system performs fine polishing on the defective parts of the leading and trailing edges, reducing the difficulty of operation and eliminating the need for frequent disassembly and reassembly work on the coordinate measuring machine, thus shortening the production cycle and reducing production costs.

[0021] Traditional laser interferometer systems are high-precision measuring instruments based on the principle of interference. During the scanning process of a laser interferometer system, it is unavoidable that relative displacement and relative angle changes will occur between the laser interferometer system and the leading edge, and between the laser interferometer system and the trailing edge, at least at the micrometer level. This causes irregular jumps in the interference fringes, making it impossible to scan the true defect area.

[0022] This patent application innovatively eliminates the fixed reference mirror in traditional laser interferometer systems, using the leading or trailing edge surface as the reflecting surface of the measurement beam and the reference beam. Since the two beams scan synchronously, any common displacement or angular change has a synchronous and equal effect on the optical path of the two beams. Therefore, the optical path difference between the measurement beam and the reference beam changes synchronously and is almost unaffected by slight positional changes between the laser interferometer system and the leading or trailing edge surface. Consequently, there will be no irregular jumps in interference imaging during the scanning process, thus enabling precise scanning of minute damage locations. Theoretically, the scanning accuracy can be at the level of several micrometers or even nanometers.

[0023] The reference beam and the measuring beam form light spots (reflected rays) at the leading or trailing edge, which serve as references to each other. The edge itself at different positions is compared and verified, and the intact area of ​​the measured edge is used as a benchmark. It is also compared and verified with other parts of the measured edge, thus forming a self-reference measurement system. This system can accurately and reliably identify interference fringe anomalies caused by minute defects, so as to intuitively and quickly guide the polishing system to perform precise rework.

[0024] By setting linear collimating lenses in the optical paths of the measuring beam and the reference beam respectively, both the measuring beam and the reference beam are formed into horizontal linear beams. This allows the laser interferometer system to adapt to the curved profile of the leading or trailing edge of the guide vane, shortening the detection time and improving the stability of the detection process.

[0025] By setting up light-absorbing plates, the leading and trailing edges of the guide vanes are clearly separated, reducing residual light outside the leading or trailing edge end faces and reducing reflective interference, thus obtaining clearer interference imaging.

[0026] By setting up a light-shielding channel with a black frosted wall, stray light and ambient light are isolated, allowing only reflected light rays that are nearly parallel to the direction of the light-shielding channel to pass through. Light rays with excessively large angle differences are absorbed when they hit the black frosted structure, reducing the impact of stray light on interferometric imaging.

[0027] Since the orientation of the two light-blocking channels is fixed, it is easy for those skilled in the art to set up optical components to adjust the angle of the light, so it will not be elaborated on here.

[0028] Preferably, the reference beam and the measurement beam are aligned with the intact area of ​​either the leading edge or the trailing edge to obtain a standard interference image; the laser interferometer system moves up and down to make the reference beam and the measurement beam move synchronously to scan either the leading edge or the trailing edge; when a change in the interference image exceeding a set threshold is detected, it is marked as a defect, and the polishing system polishes the defect.

[0029] Preferably, the optical path difference fine-tuning component is provided in the optical path of the measuring beam; the optical path difference fine-tuning component includes a hollow transparent glass tube, and both ends of the transparent glass tube are connected to transparent glass end caps that seal the openings at both ends of the transparent glass tube; the surface of the transparent glass end caps is flat and perpendicular to the measuring beam; the transparent glass tube is connected to a gas supply pipe, the gas supply pipe is connected to a gas compressor, the gas compressor is connected to a xenon gas source, and the gas compressor fills or extracts xenon gas into the transparent glass tube through the gas supply pipe to adjust the gas pressure inside the transparent glass tube.

[0030] By incorporating an optical path difference fine-tuning component in the optical path of the measurement beam, sensitive and reliable calibration is achieved. A transparent glass tube filled with xenon gas is placed within the measurement optical path. By changing the pressure of the xenon gas within the transparent glass tube, its refractive index is precisely adjusted to compensate for the optical path of the measurement beam. This allows the measurement beam and the reference beam to produce standard interference, forming a standard and easily distinguishable interference image. This provides a high-contrast benchmark for subsequent automated scanning and comparison, improving the reliability and efficiency of defect identification. Furthermore, based on the optical path difference fine-tuning method according to the relationship between refractive index and pressure change, combined with the design of an existing high-precision gas compressor and transparent glass tube, nanometer-level optical path difference precision adjustment is achieved. The adjustment process is highly simple and quick, requiring no complex operations; ordinary personnel can easily achieve precise control. This method is far superior to traditional macroscopic mechanical adjustments used to adjust the interference image, providing a higher level of measurement foundation for precision measurement.

[0031] Preferably, the cross-sectional area of ​​the inner cavity of the transparent glass tube is greater than 4 square centimeters and less than 8 square centimeters.

[0032] Preferably, the end of the gas supply pipe near the transparent glass tube has a trumpet-shaped structure with gradually increasing inner and outer cross-sectional areas, and the larger end of the gas supply pipe is connected to the transparent glass tube.

[0033] Preferably, the outer surface of the light-absorbing plate has a black frosted structure. By setting the light-absorbing plate, light passing through the gap, leading edge, and trailing edge of the guide vane to be detected is absorbed, while also absorbing some ambient light, reducing reflective interference and preventing reflective interference from affecting image clarity.

[0034] Preferably, the length of the light-shielding channel is 4 to 8 cm and the diameter is 1 to 1.5 cm.

[0035] Preferably, the polishing system includes a robotic arm located beside the fixture, with a polishing head connected to the end of the robotic arm for polishing the leading or trailing edge.

[0036] Preferably, the polishing head has a U-shaped cross-section, and an annular groove is formed circumferentially on the outer wall of the polishing head, with the annular groove smoothly transitioning to the surface of the polishing head.

[0037] Preferably, it also includes a blue light scanning system, which includes a blue light scanner located on the other side of the fixture opposite the polishing head.

[0038] In summary, the present invention has the following beneficial effects:

[0039] 1. The laser interferometer system enables online real-time detection, accurately locating defects in the leading and trailing edges of the guide vane. This allows the polishing head to be moved to the defective area for fine polishing, reducing the difficulty of the operation and eliminating the need for frequent disassembly and reassembly work on the coordinate measuring machine, thereby shortening the production cycle and reducing production costs.

[0040] 2. A blue light scanning coarse inspection system is used to quickly locate suspected defect areas at the leading and trailing edges. A laser interferometer system is then used to perform high-precision re-inspection of these areas, improving detection accuracy and reducing inspection time. Furthermore, this application innovatively uses the leading or trailing edge surface as the reflecting surface between the measurement beam and the reference beam, maintaining a stable optical path difference. This creates a prerequisite for identifying real defect areas at the micrometer or even nanometer level. Additionally, this application innovatively introduces an optical path difference fine-tuning component, precisely adjusting the refractive index by changing the xenon gas pressure inside the transparent glass tube. This compensates for the optical path of the measurement beam, enabling the measurement beam and reference beam to produce standard interference, forming a standard, easily distinguishable standard interference image. This provides a high-contrast benchmark for subsequent automated scanning and comparison, improving the reliability and efficiency of defect identification. Attached Figure Description

[0041] Figure 1 This is a schematic diagram of the overall structure of the blade leading and trailing edge polishing and straightening device of the present invention.

[0042] Figure 2 The blade leading and trailing edge polishing and straightening device of the present invention Figure 1 Enlarged structural diagram at point A;

[0043] Figure 3 This is a schematic diagram illustrating the structure of the light-absorbing plate in the blade leading and trailing edge polishing and straightening device of the present invention.

[0044] Figure 4 This is a cross-sectional schematic diagram of the transparent glass tube of the blade leading and trailing edge polishing and straightening device of the present invention.

[0045] Figure 5 This is a schematic diagram of the structure of the blade leading and trailing edge polishing and straightening device of the present invention, which illustrates the annular groove.

[0046] In the diagram, 1 is the polishing system; 11 is the polishing head; 2 is the laser interferometer system; 3 is the measuring beam; 4 is the light-absorbing plate; 5 is the transparent glass tube; 6 is the transparent glass end cap; 7 is the air supply pipe; 8 is the trumpet-shaped structure; and 10 is the hydraulic lifting device. Detailed Implementation

[0047] To make the technical means, creative features, objectives and effects of the invention easier to understand, the invention will be further explained below with reference to specific illustrations.

[0048] refer to Figures 1 to 5 The blade leading and trailing edge polishing and straightening equipment includes a fixture for loading the guide vane to be inspected, a polishing system 1 arranged next to the fixture, and the guide vane to be inspected is placed vertically on the fixture.

[0049] It also includes a laser interferometer system 2;

[0050] The laser interferometer system 2 includes a laser and a beam splitter, which splits the measurement beam 3 and the reference beam.

[0051] In the optical paths of the measuring beam 3 and the reference beam, a linear collimating lens is set respectively. The measuring beam 3 and the reference beam pass through the collimating lens respectively to form a horizontal linear beam.

[0052] The angle between the measured beam 3 and the reference beam is greater than 1 degree and less than 10 degrees.

[0053] Both the measurement beam 3 and the reference beam are projected onto the leading edge or trailing edge surface to form a measurement spot and a reference spot arranged at intervals, and are reflected by the leading edge or trailing edge surface to form two reflected rays;

[0054] A vertically fixed light-absorbing plate 4 is provided, and a vertical gap matching the leading or trailing edge end face is provided on the light-absorbing plate 4. The leading or trailing edge end face is inserted into the gap and exposed, thereby reducing the residual light outside the leading or trailing edge end face.

[0055] The laser interferometer system 2 also includes two light-shielding channels, which are parallel to the pointing directions of the measurement beam 3 and the reference beam, respectively.

[0056] The light-shielding channel uses a straight round tube with a black frosted inner wall.

[0057] The laser interferometer system 2 also includes two optical components for adjusting the angle of light, which are respectively located behind the two light-shielding channels;

[0058] The two optical components adjust the return beams transmitted from the two light-blocking channels to perform interference imaging.

[0059] The laser interferometer system 2 is fixed on a vertically lifting hydraulic lifting device 10.

[0060] In the above design, the laser interferometer system 2 detects the defects at the leading and trailing edges, enabling the polishing system 1 to perform fine polishing on the defects at the leading and trailing edges. This reduces the difficulty of the operation and transforms post-processing inspection into online real-time inspection during the manufacturing process. It eliminates the need for frequent disassembly and reassembly work on the coordinate measuring machine, shortening the production cycle and reducing production costs.

[0061] Traditional laser interferometer system 2 is a high-precision measuring instrument based on the principle of interference. During the scanning process of laser interferometer system 2, it is unavoidable that relative displacement and relative angle changes will occur between laser interferometer system 2 and the leading edge, and between laser interferometer system 2 and the trailing edge, at least at the micrometer level, resulting in irregular jumps in interference fringes, and thus making it impossible to scan the real defect area.

[0062] This patent application creatively eliminates the fixed reference mirror in the traditional laser interferometer system 2, and uses the leading or trailing edge surface as the reflecting surface of the measurement beam 3 and the reference beam. Since the two beams scan synchronously, any common displacement or angular change has a synchronous and equal effect on the optical path of the two beams. Therefore, the optical path difference between the measurement beam 3 and the reference beam changes synchronously and is almost unaffected by slight changes in the position between the laser interferometer system 2 and the leading or trailing edge surface. As a result, there will be no problem of irregular jumps in interference imaging during the scanning process, thus enabling precise scanning of tiny damage locations. Theoretically, the scanning accuracy can be at the level of several micrometers or even nanometers.

[0063] The reference beam and the measuring beam 3 form light spots (reflected rays) at the edge (leading edge or trailing edge), which serve as references to each other. The edge at different positions is compared and verified, and the intact area of ​​the measured edge is used as a benchmark. It is also compared and verified with other parts of the measured edge, thus forming a self-reference measurement system. This system can accurately and reliably identify interference fringe anomalies caused by minute defects, so as to intuitively and quickly guide the polishing system to perform precise rework.

[0064] By setting linear collimating lenses in the optical paths of the measuring beam 3 and the reference beam respectively, both the measuring beam and the reference beam form horizontal linear beams. This allows the laser interferometer system 2 to adapt to the curved profile of the leading or trailing edge of the guide vane, shortening the detection time and improving the stability of the detection process.

[0065] By setting up the light-absorbing plate 4, the leading and trailing edges of the guide vane are clearly separated, the residual light outside the leading or trailing edge end face is reduced, and the reflection interference is reduced, so as to obtain a clearer interference imaging.

[0066] By setting up a light-shielding channel with a black frosted wall, stray light and ambient light are isolated, allowing only reflected light rays that are nearly parallel to the direction of the light-shielding channel to pass through. Light rays with excessively large angle differences are absorbed when they hit the black frosted structure, reducing the impact of stray light on interferometric imaging.

[0067] Since the orientation of the two light-blocking channels is fixed, it is easy for those skilled in the art to set up optical components to adjust the angle of the light, so it will not be elaborated on here.

[0068] The optical path of the measuring beam 3 is provided with an optical path difference fine adjustment component; the optical path difference fine adjustment component includes a hollow transparent glass tube 5, both ends of the transparent glass tube 5 are connected to transparent glass end caps 6 that close the openings at both ends of the transparent glass tube 5; the surface of the transparent glass end caps 6 is flat and perpendicular to the measuring beam 3; the transparent glass tube 5 is connected to a gas supply pipe 7, the gas supply pipe 7 is connected to a gas compressor, the gas compressor is connected to a xenon gas source, the gas compressor fills or extracts xenon gas into the transparent glass tube 5 through the gas supply pipe 7, and adjusts the gas pressure inside the transparent glass tube 5.

[0069] By setting an optical path difference fine-tuning component in the optical path of the measurement beam 3, sensitive and reliable calibration is achieved. A transparent glass tube 5 filled with xenon gas is set in the measurement optical path. By changing the pressure of the xenon gas in the transparent glass tube 5, its refractive index is precisely adjusted to compensate for the optical path of the measurement beam 3, thereby enabling the measurement beam 3 and the reference beam to produce standard interference, forming a standard interference image that is easy to distinguish. This provides a high-contrast benchmark for subsequent automated scanning and comparison, improving the reliability and efficiency of defect identification.

[0070] Furthermore, based on the optical path difference fine-tuning method according to the relationship between refractive index and pressure change, combined with the design of existing high-precision gas compressor and transparent glass tube 5, nanometer-level optical path difference precision adjustment was achieved. The adjustment process is highly simple and quick, requiring no complicated operation. Ordinary staff can easily achieve precise control. This method is far superior to the traditional macroscopic mechanical adjustment method to adjust the interference image, providing a higher level of measurement foundation for accurate measurement.

[0071] The cross-sectional area of ​​the inner cavity of the transparent glass tube 5 is greater than 4 square centimeters and less than 8 square centimeters.

[0072] Both the transparent glass tube 5 and the transparent glass end cap 6 are made of fused silica to minimize the effects of temperature instability.

[0073] The gas supply pipe 7 has a trumpet-shaped structure 8 with gradually increasing inner and outer cross-sectional areas at one end near the transparent glass tube 5, and the larger end of the gas supply pipe 7 is connected to the transparent glass tube.

[0074] The horn-shaped structure 8 has a gradually increasing cross-sectional area inside and out, which reduces the gas flow rate of xenon gas and prevents the xenon gas from directly rushing into the inner cavity of the transparent glass tube and causing violent disturbances. This allows the gas inside the transparent glass tube to quickly and stably reach equilibrium, further improving detection efficiency.

[0075] The outer surface of the light-absorbing plate 4 has a black frosted structure. By setting the light-absorbing plate 4, light passing through the gap, leading edge and trailing edge of the guide vane to be detected is absorbed, and some ambient light is also absorbed to reduce reflection interference and prevent reflection interference from affecting image clarity.

[0076] The length of the light-blocking channel is 4-8cm, and the diameter is 1-1.5cm.

[0077] The polishing system 1 includes a robotic arm located beside the fixture, with a polishing head 11 connected to the end of the robotic arm for polishing the leading edge or trailing edge.

[0078] The polishing head 11 has a U-shaped cross-section, and an annular groove is formed on the outer wall of the polishing head 11 in the circumferential direction. The annular groove smoothly transitions with the surface of the polishing head 11.

[0079] It also includes a blue light scanning system, which comprises a blue light scanner located on the other side of the fixture opposite the polishing head 11. The blue light scanner projects blue light stripes onto the leading and trailing edges of the guide vane to be inspected, performing a preliminary inspection of the leading and trailing edges of the guide vane.

[0080] In use, the guide vane to be tested is vertically connected to the fixture, and the leading or trailing edge of the guide vane to be tested is inserted into the gap of the light-absorbing plate 4 and exposed. The blue light scanner projects blue light stripes onto the leading or trailing edge surface of the guide vane to be tested, and obtains the three-dimensional morphological data of the leading and trailing edge surfaces of the guide vane to be tested. Then, the obtained three-dimensional morphological data is compared with the design data, and the deviation part is marked as the suspected problem area.

[0081] The laser interferometer system 2 is moved to the side of the suspected problem area by the hydraulic lifting device 10, and the measuring beam 3 and the reference beam are projected onto the smooth and intact surface next to the suspected problem area on the leading edge or trailing edge surface to form a measuring spot and a reference spot. The measuring spot and the reference spot are arranged at intervals. The smooth and intact surface is located within 3 mm of the edge of the suspected problem area and is scanned and detected by the blue light scanner to determine that its three-dimensional topography data deviates from the design data within the allowable tolerance of the leading edge or trailing edge surface area.

[0082] Using the physical property that the speed of a light beam in air is greater than its speed in xenon gas, xenon gas is injected into or extracted from the transparent glass tube 5 by an air pump. The gas pressure inside the transparent glass tube 5 is adjusted to correct the optical path difference, improve the measurement accuracy, and obtain a standard interference image. The interference fringes of the standard interference image must be clear, continuous, and have high contrast with alternating bright and dark fringes. Furthermore, during the one-second acquisition period, the interference fringes should not have any drastic jumps or blurring. An interference image that meets the above conditions is a standard interference image.

[0083] The laser interferometer system 2 moves slowly and smoothly in the vertical direction, so that the measurement beam 3 and the reference beam move synchronously, and the leading edge and trailing edge are scanned to obtain multiple sets of measurement interference images. The measurement interference images are compared with the standard interference images. When a change in the interference image that exceeds the set threshold is detected, it is marked as a defect point.

[0084] Based on the location of the defect mark, the robotic arm drives the polishing head 11 to move to the defect location and polish the defect location.

[0085] The foregoing has shown and described the basic principles, main features, and advantages of the invention. Those skilled in the art should understand that the invention is not limited to the above embodiments. The embodiments and descriptions in the specification are merely illustrative of the principles of the invention. Various changes and modifications can be made without departing from the spirit and scope of the invention, and all such changes and modifications fall within the scope of the claimed invention. The scope of protection of the invention is defined by the appended claims and their equivalents.

Claims

1. A blade leading and trailing edge polishing and straightening device, comprising a fixture for loading the guide vane to be inspected, wherein a polishing system (1) is arranged beside the fixture, characterized in that: The guide vane to be tested is placed vertically on the fixture; It also includes a laser interferometer system (2); The laser interferometer system (2) includes a laser and a beam splitter, which splits the measurement beam (3) and a reference beam. In the optical paths of the measuring beam (3) and the reference beam, a collimating lens of the line type is set respectively. The measuring beam (3) and the reference beam pass through the collimating lens respectively to form a horizontal line-type linear beam. The angle between the measured beam (3) and the reference beam is greater than 1 degree and less than 10 degrees; The measuring beam (3) and the reference beam are both projected onto the leading edge or trailing edge surface to form a measuring spot and a reference spot arranged at intervals, and are reflected by the leading edge or trailing edge surface to form two reflected rays; A vertically fixed light-absorbing plate (4) is provided. A vertical gap matching the front or rear edge end face is provided on the light-absorbing plate (4). The front or rear edge end face is inserted into the gap and exposed, thereby reducing the residual light outside the front or rear edge end face. The laser interferometer system (2) also includes two light-shielding channels, which are parallel to the pointing directions of the measurement beam (3) and the reference beam, respectively. The light-shielding channel adopts a straight circular tube inner wall, and the straight circular tube inner wall has a black frosted surface; The laser interferometer system (2) also includes two optical components for adjusting the angle of light, and the two optical components are respectively located behind the two light-shielding channels; The two optical components adjust the return beams transmitted from the two light-blocking channels to perform interference imaging. The laser interferometer system (2) is fixed on a vertically lifting hydraulic lifting device (10).

2. The blade leading and trailing edge polishing and straightening device according to claim 1, characterized in that: The reference beam and the measurement beam (3) are aligned with the intact area of ​​either the leading edge or the trailing edge to obtain a standard interference image; The laser interferometer system (2) moves up and down to make the reference beam and the measurement beam (3) move synchronously and scan one of the leading edge and the trailing edge. When the interference image is detected to have a change that exceeds the set threshold, it is marked as a defect. The polishing system (1) polishes the defect.

3. The blade leading and trailing edge polishing and straightening device according to claim 1, characterized in that: The optical path of the measuring beam (3) is provided with an optical path difference fine adjustment component; The optical path difference fine adjustment component includes a hollow transparent glass tube (5), and both ends of the transparent glass tube (5) are connected to transparent glass end caps (6) that seal the openings at both ends of the transparent glass tube (5). The transparent glass end cap (6) has a flat surface and is perpendicular to the measuring beam (3); The transparent glass tube (5) is connected to a gas supply pipe (7), which is connected to a gas compressor. The gas compressor is connected to a xenon gas source. The gas compressor fills or extracts xenon gas into the transparent glass tube (5) through the gas supply pipe (7) to adjust the gas pressure inside the transparent glass tube (5).

4. The blade leading and trailing edge polishing and straightening device according to claim 3, characterized in that: The cross-sectional area of ​​the inner cavity of the transparent glass tube (5) is greater than 4 square centimeters and less than 8 square centimeters.

5. The blade leading and trailing edge polishing and straightening device according to claim 3, characterized in that: The gas supply pipe (7) has a trumpet-shaped structure (8) with gradually increasing inner and outer cross-sectional areas at one end near the transparent glass tube (5), and the large end of the gas supply pipe (7) is connected to the transparent glass tube.

6. The blade leading and trailing edge polishing and straightening device according to claim 1, characterized in that: The outer surface of the light-absorbing plate has a black frosted structure.

7. The blade leading and trailing edge polishing and straightening device according to claim 1, characterized in that: The length of the light-shielding channel is 4-8cm, and the diameter is 1-1.5cm.

8. The blade leading and trailing edge polishing and straightening device according to claim 1, characterized in that: The polishing system (1) includes a robotic arm located beside the fixture, with a polishing head (11) connected to the end of the robotic arm for polishing the leading edge or trailing edge.

9. The blade leading and trailing edge polishing and straightening device according to claim 8, characterized in that: The polishing head (11) has a U-shaped cross section, and an annular groove is provided on the outer wall of the polishing head (11) in the circumferential direction. The annular groove is smoothly connected to the surface of the polishing head (11).

10. The blade leading and trailing edge polishing and straightening device according to claim 1, characterized in that: It also includes a blue light scanning system, which includes a blue light scanner located on the other side of the fixture opposite the polishing head (11).

Images