Quality detection method and system for microwave baking tray

Abstract

The invention relates to the technical field of microwave baking tray quality inspection, and provides a quality detection method and system for a microwave baking tray, and the method comprises the steps: carrying out the photographing of infrared images of the microwave baking tray before and after microwave monitoring heating, comparing the color difference regions in the infrared images, and recognizing the coating region of a microwave coating in the currently detected microwave baking tray, according to the invention, the position of the coating on the microwave baking tray can be accurately identified and compared with the standard position of the microwave coating, and the quality of the microwave baking tray can be judged to be unqualified when the positions are inconsistent, so that the quality inspection efficiency of the microwave baking tray is improved, and the baking tray use experience of a user is guaranteed.

Description

Technical Field

[0001] This invention relates to the field of microwave baking pan quality inspection technology, and in particular to a quality inspection method and system for microwave baking pans. Background Technology

[0002] Microwave ovens are now common in most households, but most consumers use them to reheat food. Due to the special heating principle of microwave ovens, cooking food in a microwave oven causes significant moisture loss from the inside out, resulting in a poor taste. Therefore, there are special microwave baking trays designed for microwave ovens. These trays are made of metal and have microwave-absorbing material on the outer layer. The microwave-absorbing material converts microwaves into heat energy, which then heats the food inside the metal tray, preventing the microwaves from directly heating the food and causing moisture loss. If the microwave-absorbing coating is unevenly applied to a microwave oven, it will result in poor heating of food by the microwave oven, causing uneven heating that affects the taste, nutrient loss, or digestive burden. Current quality inspection methods mostly rely on visual inspection or touch to judge, which is inefficient and inaccurate. Summary of the Invention

[0003] This invention provides a quality inspection method for microwave baking pans, which solves the problem of low quality inspection efficiency of microwave baking pans in the prior art.

[0004] The first aspect of this invention provides a quality inspection method for microwave baking pans, comprising: After receiving the signal that the microwave baking pan has arrived at the detection position, the first infrared image of the microwave baking pan is acquired, and the standard position data of the microwave absorbing coating of the microwave baking pan is acquired. Within a first preset time after receiving the microwave detection signal, a second infrared image of the microwave baking pan is acquired; the first infrared image is compared with the second infrared image to determine whether the color difference area is consistent with the standard position of the microwave absorbing coating; if they are inconsistent, the microwave baking pan is deemed to be unqualified.

[0005] Optionally, after determining whether the color difference area matches the standard position of the absorbing coating, the method further includes: When the colors are consistent, the third infrared image of the microwave baking pan is acquired, and an image mask is constructed based on the color difference area. Region segmentation lines are set on the third infrared image according to the heat conduction direction, and the image region is divided based on the image mask to obtain multiple heat transfer rate identification regions. The average color change rate of pixels in each heat transfer rate identification region is calculated. If the difference between the average color change rates of pixels in any two regions is greater than a preset threshold, the microwave baking pan is judged to be unqualified in quality inspection.

[0006] Optionally, after acquiring the third infrared image of the microwave baking pan and constructing an image mask based on the color difference regions, the method further includes: The fourth infrared image of the microwave baking pan is acquired, and the region of interest is constructed based on the color difference region. The color non-uniformity of the region of interest in the fourth infrared image is identified. If the color non-uniformity is greater than a preset threshold, the microwave baking pan is judged to be unqualified in quality inspection.

[0007] Optionally, after acquiring the second infrared image of the microwave baking pan within a first preset time after receiving the microwave detection signal, the method further includes: After the second preset time, the fifth infrared image of the microwave baking pan is acquired, and it is determined whether the maximum color value in the image meets the heating temperature of the microwave baking pan. If not, the microwave baking pan is judged to be of substandard quality.

[0008] A second aspect of this application provides a quality inspection system for microwave baking pans, comprising: The image processing module is used to acquire the first infrared image of the microwave baking pan and the standard position data of the microwave baking pan's absorbing coating after receiving the signal that the microwave baking pan has arrived at the detection position. The quality inspection module is used to acquire a second infrared image of the microwave baking pan within a first preset time after receiving the microwave detection signal; compare the first infrared image with the second infrared image to determine whether the color difference area is consistent with the standard position of the microwave absorbing coating; if they are inconsistent, the microwave baking pan is judged to be unqualified in quality inspection.

[0009] Optionally, after determining whether the color difference area matches the standard position of the absorbing coating, the quality inspection module further includes: When the colors are consistent, the third infrared image of the microwave baking pan is acquired, and an image mask is constructed based on the color difference area. Region segmentation lines are set on the third infrared image according to the heat conduction direction, and the image region is divided based on the image mask to obtain multiple heat transfer rate identification regions. The average color change rate of pixels in each heat transfer rate identification region is calculated. If the difference between the average color change rates of pixels in any two regions is greater than a preset threshold, the microwave baking pan is judged to be unqualified in quality inspection.

[0010] Optionally, after acquiring the third infrared image of the microwave baking pan and constructing an image mask based on the color difference regions, the quality detection module further includes: The fourth infrared image of the microwave baking pan is acquired, and the region of interest is constructed based on the color difference region. The color non-uniformity of the region of interest in the fourth infrared image is identified. If the color non-uniformity is greater than a preset threshold, the microwave baking pan is judged to be unqualified in quality inspection.

[0011] Optionally, after acquiring the second infrared image of the microwave baking pan within a first preset time after receiving the microwave detection signal, the quality detection module further includes: After the second preset time, the fifth infrared image of the microwave baking pan is acquired, and it is determined whether the maximum color value in the image meets the heating temperature of the microwave baking pan. If not, the microwave baking pan is judged to be of substandard quality.

[0012] A third aspect of this application provides a quality inspection device for a microwave baking pan, the device comprising a processor and a memory: The memory is used to store program code and transmit the program code to the processor; The processor is configured to execute, according to the instructions in the program code, a quality inspection method for a microwave baking pan as described in any of the first aspects of the present invention.

[0013] The fourth aspect of this application provides a computer-readable storage medium for storing program code for executing a quality inspection method for a microwave baking pan as described in any of the first aspects of the present invention.

[0014] As can be seen from the above technical solutions, the present invention has the following advantages: by taking infrared images of the microwave baking pan before and after microwave monitoring and heating, and comparing the color difference areas in the infrared images, the coating area of ​​the microwave coating in the currently detected microwave baking pan can be identified. The coating position on the microwave baking pan can be accurately identified and compared with the standard position of the microwave coating. When there is a discrepancy, it can be judged that the microwave baking pan is unqualified, which improves the quality inspection efficiency of the microwave baking pan and ensures the user's baking pan experience. Attached Figure Description

[0015] To more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0016] Figure 1 A flowchart of a quality inspection method for microwave baking pans; Figure 2 This is a structural diagram of a quality inspection system for microwave baking pans. Detailed Implementation

[0017] To make the objectives, features, and advantages of this invention more apparent and understandable, the technical solutions of the embodiments of this invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the embodiments described below are only some embodiments of this invention, and not all embodiments. Based on the embodiments of this invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this invention.

[0018] This invention provides a quality inspection method for microwave baking pans, which solves the problem of low quality inspection efficiency of microwave baking pans in the prior art.

[0019] Please see Figure 1 , Figure 1 This is the first flowchart of a quality inspection method for a microwave baking pan provided in an embodiment of the present invention.

[0020] S100, after receiving the signal that the microwave baking pan has arrived at the detection position, acquires the first infrared image of the microwave baking pan and acquires the standard position data of the microwave baking pan's absorbing coating. It should be noted that the final step in the production of microwave baking trays on the assembly line requires factory testing. To ensure safety, a microwave transmitter is used to heat the baking tray, simulating its use in a microwave oven environment. A metal shielding mesh is installed at the testing location to block microwave radiation and avoid the dangers of no-load testing in a microwave oven simulation environment. An industrial infrared camera is set at the testing location. When the processed microwave baking tray arrives at the designated factory quality inspection location through the assembly line, before the microwave transmitter is activated to heat the tray, a first infrared image reflecting the room temperature distribution of the microwave baking tray will be taken. Before manufacturing a microwave baking pan, its shape needs to be designed, and a 3D model is created. The 3D model contains the structural data of the microwave baking pan, and based on the baking requirements of different types of microwave baking pans, the size of the spraying area for the microwave absorbing coating on the microwave baking pan is designed to achieve direct heating of specific areas of the microwave baking pan. Since the dimensions of the microwave baking pan, the shooting angle of the industrial camera, and the detection shooting position are all fixed, after setting the camera position and scaling, the ratio between the size of the microwave baking pan in the image and the actual size of the microwave baking pan can be determined. Based on the size of the position area of ​​the microwave absorbing coating in the 3D model, and the distance from the reference point to the reference point on the edge of the baking pan, the position is determined, and the standard position data of the microwave absorbing coating in the image can be determined. Alternatively, in the images of certain regularly symmetrical baking pans, the standard position of the microwave absorbing coating can be represented as the positional ratio of the coating to the overall baking pan, without the need to calculate accurate size data. After receiving the signal that the microwave baking pan has arrived at the detection position, the model of the microwave baking pan to be detected can be determined, and the corresponding standard position data of the microwave absorbing coating can be obtained.

[0021] Before testing, equipment calibration and preheating of the microwave testing equipment are required to ensure that the transmission power and frequency meet the standards. For example, a standard metal test block can be used to verify the sensitivity of the equipment. The positioning and fixing of the microwave transmitter and microwave baking tray must ensure that the testing area is unobstructed and that the microwave is emitted evenly onto the baking tray.

[0022] S200: Within a first preset time after receiving the microwave detection signal, acquire the second infrared image of the microwave baking pan; compare the first infrared image with the second infrared image to determine whether the color difference area is consistent with the standard position of the microwave absorbing coating; if they are inconsistent, determine that the microwave baking pan is unqualified.

[0023] It should be noted that the microwave detection signal will activate the microwave transmitter to heat the microwave baking tray. Within the first preset time after receiving the microwave detection signal, a shooting command is sent to the industrial infrared camera. The shooting needs to be carried out before the heat from the absorbing coating spreads to the microwave baking tray. In this way, the position of the color change in the second infrared image of the microwave baking tray reflects the position of the absorbing coating. Within the first preset time, the microwave only heats the absorbing coating, and the absorbing coating has not yet been heated to the bottom layer, thus heating the microwave baking tray. Depending on the material of the absorbing coating, different materials correspond to different dielectric loss factors. Under the same microwave frequency, the higher the dielectric loss factor, the stronger the material's ability to absorb microwaves, the faster the heating rate, and the shorter the corresponding first preset time. The ferrite absorbing coating with added manganese oxide has a microwave absorption heating rate of about 70 degrees Celsius per minute, and the corresponding first preset time can be set to several seconds. A portion of the microwave oven pan is made of metal, and a microwave-absorbing coating is sprayed onto the outer side of this metal portion. This shields the microwaves from directly heating the food, preventing moisture loss. Instead, microwave energy is converted into heat at the absorbing coating, heating the microwave oven pan and thus baking the food. Within a first preset time, the absorbing coating has not yet heated the pan to the required temperature. Therefore, the pan temperature should be consistent in both the first and second infrared images. Since the pan's overall material (excluding the coating) is uniform, the pan's outline can be distinguished from the surrounding environment based on color differences. The color of each pixel within the pan area in both images is compared. The specific comparison value is set according to whether the infrared camera captures grayscale or color images. Since the area heated within the first preset time is only the absorbing coating area... After comparing the first and second infrared images, the areas with significantly increased grayscale values ​​in the grayscale image reflect a temperature rise, corresponding to the area of ​​the microwave absorbing coating. The size and position of the microwave absorbing coating area in the image are calculated to see if they match the standard position data for the microwave absorbing coating. Alternatively, consistency can be determined based on size ratios. For example, in a circular baking pan, to ensure uniform heating, the microwave absorbing coating is generally applied in a circular pattern at the bottom of the pan. The ratio of the coating's circular diameter to the diameter of the circular baking pan is calculated. In subsequent steps, the size of the coating can be judged based on the ratio of the pan's size to the coating's size in the image. The position of the coating can be judged based on the ratio of the coating's size to the edge of the baking pan. If there is a discrepancy, it indicates that the coating position or size of the microwave absorbing coating on the microwave baking pan does not meet the design requirements, which will affect the heating effect of the baking pan in actual use.

[0024] In this embodiment, by taking infrared images of the microwave baking pan before and after microwave monitoring and heating, and comparing the color difference areas in the infrared images, the coating area of ​​the microwave coating in the currently detected microwave baking pan can be identified. This can accurately identify the coating position on the microwave baking pan and compare it with the standard position of the microwave coating. When there is a discrepancy, it can be determined that the microwave baking pan is unqualified, which improves the quality inspection efficiency of the microwave baking pan and ensures the user's baking pan experience.

[0025] The above is a detailed description of the first embodiment of a quality inspection method for microwave baking pans provided in this application. The following is a detailed description of the second embodiment of a quality inspection method for microwave baking pans provided in this application.

[0026] In this embodiment, a quality inspection method for microwave baking pans is further provided. In the aforementioned step S200, after determining whether the color difference area is consistent with the standard position of the absorbing coating, the method further includes: when consistent, acquiring a third infrared image of the microwave baking pan and constructing an image mask based on the color difference area; setting region segmentation lines on the third infrared image in the direction of heat conduction, and dividing the image region based on the image mask to obtain multiple heat transfer rate identification regions; calculating the average pixel color change rate in each heat transfer rate identification region; if the difference in the average pixel color change rate between any two regions is greater than a preset threshold, the microwave baking pan is judged to be unqualified in quality inspection.

[0027] It should be noted that, based on the actual position of the absorbing coating in the first infrared image identified in step S200 above, an image mask is created on the image of the microwave baking pan to block the absorbing coating area and eliminate the interference of the pixel grayscale values ​​in the area on subsequent calculations; according to different microwave baking pan structures, corresponding heat conduction directions can be set. The heat conduction direction should be a straight line from the absorbing coating area to the nearest edge point of the microwave baking pan, that is, the direction of the heat gradient after the absorbing coating heats the microwave baking pan. According to different microwave baking pan types, region division lines can be preset based on their heat conduction directions. The specific number of region division lines is determined by the size of the baking pan. In the third infrared image, the absorbing coating area is first masked and removed from the image. Then, the remaining image is segmented using preset region division lines. The resulting multiple heat transfer rate recognition regions reflect the temperature in each direction under the heating of the absorbing coating. Since the third infrared image consists of multiple images taken after a first preset time, the temperature change rate can be reflected by dividing the color difference between images by the shooting time difference. The average grayscale value or color value of all pixels within the same heat transfer rate recognition region in two consecutive third infrared images is calculated and then divided by the time interval between the two images to obtain the pixel color average change rate. This corresponds to the heat absorption increase in the heat transfer rate recognition region during this time. Factors affecting this heat absorption include the thickness of the absorbing coating near the heat transfer rate recognition region, the material or structural quality of the microwave baking pan in the heat transfer rate recognition region, and the presence of internal cracks. The average change rate of pixel color in each heat transfer rate identification area can be corrected and averaged in multiple third infrared images. The average change rate of pixel color in each heat transfer rate identification area is compared. If the difference in the change rate is greater than a preset threshold, it indicates that the heating effect of the microwave absorbing coating on the microwave baking tray is uneven. In this embodiment, the microwave emission angle and range are set to make the microwave received by the microwave baking tray uniform. However, in actual use of the microwave baking tray, the microwaves in the microwave oven are not uniformly distributed. The microwave baking tray needs to be rotated and multi-faceted reflection to improve uniformity. If the microwave baking tray is not placed in a good position, the absorption efficiency of the microwave absorbing coating on the tray will be significantly different. When there are already differences in temperature changes under the uniform microwave detected in this embodiment, the heating effect of the microwave baking tray on the food under actual use conditions will be even more uneven, which will seriously affect the user experience.

[0028] Furthermore, after acquiring the third infrared image of the microwave baking pan and constructing an image mask based on the color difference region, the method further includes: acquiring the fourth infrared image of the microwave baking pan, constructing a region of interest based on the color difference region, identifying the color non-uniformity of the region of interest in the fourth infrared image, and determining that the microwave baking pan is unqualified if the color non-uniformity is greater than a preset threshold.

[0029] It should be noted that the first, second, and third infrared images captured in the aforementioned steps were taken from the outside of the baking pan, and the color difference areas in the images correspond to the temperature of the microwave-absorbing coating. However, the fourth infrared image in this embodiment was taken from the inside of the baking pan. The microwave baking pan is coated with a microwave-absorbing coating on the outside of the color difference area to absorb microwaves and convert them into heat energy to heat the pan. The infrared image taken on the inside of the color difference area does not capture the microwave-absorbing coating, and its color will not reflect the heat of the coating. This refers to the inside of the baking pan covered with the microwave-absorbing coating. The microwave baking pan's absorbing coating is generally made of... Ferrite materials, with added manganese, zinc, and nickel oxides, are microwave-absorbing coatings that have good microwave absorption. However, after absorbing microwave energy and converting it into heat, the heat conduction within the coating is not very effective. Since microwave ovens mostly use millimeter-high frequency microwaves, they have poor penetration through microwave-absorbing materials. When the coating thickness is uneven, in areas where the coating is thicker, the heat from the surface of the microwave-absorbing coating still needs to be conducted to the bottom of the coating before heating the baking tray area, which is inefficient. In areas where the coating is thinner, the entire coating can be heated by microwaves, resulting in better heating of the covered baking tray area. The shooting angles of the first, second, and third infrared images are symmetrical and opposite to the camera shooting angle of the fourth infrared image. For example, one is shot from directly below the microwave oven, and the other is shot from directly above the microwave oven. The positions of the color difference regions in the images should be consistent. In this embodiment, the region of interest is constructed based on the color difference regions, and only the pixels in the region of interest of the fourth infrared image are processed and calculated. First, the average color value of each pixel in the region of interest is calculated to obtain the overall temperature of the region. Then, the color value of the pixel with the largest difference from the average color value is identified. This largest difference is used as the color non-uniformity, reflecting the temperature non-uniformity in the region. Since the temperature of the microwave oven cannot be limited to the area of ​​a single pixel, there need to be multiple and consecutive pixels with the largest average difference. This difference needs to be greater than a preset threshold. The specific preset threshold is set according to the pixel color fluctuation of the infrared images in historical images. When the color of the region of interest is uneven, it indicates that the thickness of the corresponding absorbing coating is also uneven. The fourth infrared image should be taken from the inside of the microwave baking pan, that is, from the opening inward. The uneven temperature of the baking pan area at the absorbing coating does not necessarily affect the uniformity of the temperature rise of the baking pan in the surrounding non-coating covered areas. Therefore, this step does not conflict with the uniformity identification of the third infrared image in the previous step. It is for the quality detection of different areas of the microwave baking pan.

[0030] Furthermore, in step S200, after acquiring the second infrared image of the microwave baking pan within a first preset time after receiving the microwave detection signal, the method further includes: after the second preset time, acquiring the fifth infrared image of the microwave baking pan, identifying whether the maximum color value in the image meets the heating temperature of the microwave baking pan; if not, the microwave baking pan is deemed unqualified. It should be noted that the microwave baking pan is used to heat and bake food. During baking, the microwave baking pan should reach 170℃-200℃. Therefore, after the temperature stabilizes, the temperature corresponding to the pixel with the maximum color value in the fifth infrared image should be consistent with the baking temperature of the microwave baking pan. The area with the highest temperature in the fifth infrared image is necessarily the heated microwave baking pan, so there is no need for further image region segmentation or other processing, thus improving efficiency. The second preset time can be set according to the cooking time specified by the microwave baking pan. For example, to complete the grilling of a steak, the optimal cooking temperature should be reached in 1 minute or 1.5 minutes. If the temperature corresponding to the maximum color value in the fifth infrared image cannot be reached, it indicates that the heating effect of the microwave baking pan is poor, unable to achieve the baking purpose, or difficult to effectively bake, resulting in unqualified quality.

[0031] The above is a detailed description of a quality inspection method for a microwave baking pan provided by the first aspect of this application. The following is a detailed description of an embodiment of a quality inspection system for a microwave baking pan provided by the second aspect of this application.

[0032] Please see Figure 2 , Figure 2 This is a structural diagram of a quality inspection system for a microwave baking pan. This embodiment provides a quality inspection system for a microwave baking pan, including: The image processing module 10 is used to acquire the first infrared image of the microwave baking pan and the standard position data of the microwave baking pan's absorbing coating after receiving the signal that the microwave baking pan has arrived at the detection position. The transmitting end can emit 2.45GHz microwaves through a magnetron, which uniformly covers the surface of the baking pan through a waveguide, control the power density, and the detection environment needs to maintain a temperature of 25±3℃ and a humidity of <60%RH to prevent condensation from affecting microwave propagation. The quality inspection module 20 is used to acquire a second infrared image of the microwave baking tray within a first preset time after receiving the microwave detection signal; compare the first infrared image with the second infrared image to determine whether the color difference area is consistent with the standard position of the microwave absorbing coating; if they are inconsistent, the microwave baking tray is judged to be unqualified. Unqualified products can be further divided into minor defective Class B products and unqualified Class C products. Class B products enter the manual re-inspection station, Class C products are automatically marked by laser etching and diverted to the rework area, while Class A qualified products directly enter the packaging line. This embodiment of the process can achieve high-speed inspection of 20-25 baking trays per minute, with a defect omission rate of <0.05%.

[0033] Furthermore, after determining whether the color difference area matches the standard position of the absorbing coating, the quality detection module 20 also includes: When the colors are consistent, the third infrared image of the microwave baking pan is acquired, and an image mask is constructed based on the color difference area. Region segmentation lines are set on the third infrared image according to the heat conduction direction, and the image region is divided based on the image mask to obtain multiple heat transfer rate identification regions. The average color change rate of pixels in each heat transfer rate identification region is calculated. If the difference between the average color change rates of pixels in any two regions is greater than a preset threshold, the microwave baking pan is judged to be unqualified in quality inspection.

[0034] Furthermore, after acquiring the third infrared image of the microwave baking pan and constructing an image mask based on the color difference regions, the quality detection module 20 also includes: The fourth infrared image of the microwave baking pan is acquired, and the region of interest is constructed based on the color difference region. The color non-uniformity of the region of interest in the fourth infrared image is identified. If the color non-uniformity is greater than a preset threshold, the microwave baking pan is judged to be unqualified in quality inspection.

[0035] Furthermore, in the quality detection module 20, after acquiring the second infrared image of the microwave baking pan within a first preset time after receiving the microwave detection signal, it further includes: After the second preset time, the fifth infrared image of the microwave baking pan is acquired, and it is determined whether the maximum color value in the image meets the heating temperature of the microwave baking pan. If not, the microwave baking pan is judged to be of substandard quality.

[0036] A third aspect of this application also provides a quality inspection method device for a microwave baking pan, including a processor and a memory: wherein the memory is used to store program code and transmit the program code to the processor; the processor is used to execute the aforementioned quality inspection method for a microwave baking pan according to the instructions in the program code.

[0037] A fourth aspect of this application provides a computer-readable storage medium, characterized in that the computer-readable storage medium is used to store program code for executing the above-described quality inspection method for a microwave baking pan.

[0038] Those skilled in the art will clearly understand that, for the sake of convenience and brevity, the specific working process of the above-described apparatus and equipment can be referred to the corresponding process in the foregoing method embodiments, and will not be repeated here.

[0039] In the several embodiments provided in this application, it should be understood that the disclosed systems, apparatuses, and methods can be implemented in other ways. For example, the apparatus embodiments described above are merely illustrative; for instance, the division of units is only a logical functional division, and in actual implementation, there may be other division methods. For example, multiple units or components may be combined or integrated into another system, or some features may be ignored or not executed. Furthermore, the coupling or direct coupling or communication connection shown or discussed may be an indirect coupling or communication connection between apparatuses or units through some interfaces, and may be electrical, mechanical, or other forms.

[0040] The units described as separate components may or may not be physically separate. The components shown as units may or may not be physical units; that is, they may be located in one place or distributed across multiple network units. Some or all of the units can be selected to achieve the purpose of this embodiment according to actual needs.

[0041] Furthermore, the functional units in the various embodiments of the present invention can be integrated into one processing unit, or each unit can exist physically separately, or two or more units can be integrated into one unit. The integrated unit can be implemented in hardware or as a software functional unit.

[0042] If the integrated unit is implemented as a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of the present invention, in essence, or the part that contributes to the prior art, or all or part of the technical solution, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions to cause a computer device (which may be a personal computer, server, or network device, etc.) to execute all or part of the steps of the methods described in the various embodiments of the present invention. The aforementioned storage medium includes various media capable of storing program code, such as USB flash drives, portable hard drives, read-only memory (ROM), random access memory (RAM), magnetic disks, or optical disks.

[0043] The above-described embodiments are only used to illustrate the technical solutions of the present invention, and are not intended to limit it. Although the present invention has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some of the technical features. Such modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the embodiments of the present invention.

Claims

1. A quality inspection method for microwave baking pans, characterized in that... include: After receiving the signal that the microwave baking pan has arrived at the detection position, the first infrared image of the microwave baking pan is acquired, and the standard position data of the microwave absorbing coating of the microwave baking pan is acquired. Within a first preset time after receiving the microwave detection signal, a second infrared image of the microwave baking pan is acquired; the first infrared image is compared with the second infrared image to determine whether the color difference area is consistent with the standard position of the microwave absorbing coating; if they are inconsistent, the microwave baking pan is deemed to be unqualified.

2. The quality inspection method for a microwave baking pan according to claim 1, characterized in that, After determining whether the color difference area matches the standard position of the absorbing coating, the process further includes: When the colors are consistent, the third infrared image of the microwave baking pan is acquired, and an image mask is constructed based on the color difference area. Region segmentation lines are set on the third infrared image according to the heat conduction direction, and the image region is divided based on the image mask to obtain multiple heat transfer rate identification regions. The average color change rate of pixels in each heat transfer rate identification region is calculated. If the difference between the average color change rates of pixels in any two regions is greater than a preset threshold, the microwave baking pan is judged to be unqualified in quality inspection.

3. The quality inspection method for a microwave baking pan according to claim 2, characterized in that, After acquiring the third infrared image of the microwave baking pan and constructing an image mask based on the color difference regions, the process further includes: The fourth infrared image of the microwave baking pan is acquired, and the region of interest is constructed based on the color difference region. The color non-uniformity of the region of interest in the fourth infrared image is identified. If the color non-uniformity is greater than a preset threshold, the microwave baking pan is judged to be unqualified in quality inspection.

4. The quality inspection method for a microwave baking pan according to claim 1, characterized in that, After acquiring the second infrared image of the microwave baking pan within a first preset time after receiving the microwave detection signal, the process also includes: After the second preset time, the fifth infrared image of the microwave baking pan is acquired, and it is determined whether the maximum color value in the image meets the heating temperature of the microwave baking pan. If not, the microwave baking pan is judged to be of substandard quality.

5. A quality inspection system for microwave baking pans, characterized in that, include: The image processing module is used to acquire the first infrared image of the microwave baking pan and the standard position data of the microwave baking pan's absorbing coating after receiving the signal that the microwave baking pan has arrived at the detection position. The quality inspection module is used to acquire a second infrared image of the microwave baking pan within a first preset time after receiving the microwave detection signal; compare the first infrared image with the second infrared image to determine whether the color difference area is consistent with the standard position of the microwave absorbing coating; if they are inconsistent, the microwave baking pan is judged to be unqualified in quality inspection.

6. A quality inspection system for microwave baking pans according to claim 5, characterized in that, In the quality inspection module, after determining whether the color difference area matches the standard position of the absorbing coating, the following steps are also included: When the colors are consistent, the third infrared image of the microwave baking pan is acquired, and an image mask is constructed based on the color difference area. Region segmentation lines are set on the third infrared image according to the heat conduction direction, and the image region is divided based on the image mask to obtain multiple heat transfer rate identification regions. The average color change rate of pixels in each heat transfer rate identification region is calculated. If the difference between the average color change rates of pixels in any two regions is greater than a preset threshold, the microwave baking pan is judged to be unqualified in quality inspection.

7. A quality inspection system for microwave baking pans according to claim 6, characterized in that, The quality inspection module, after acquiring the third infrared image of the microwave baking pan and constructing an image mask based on the color difference regions, also includes: The fourth infrared image of the microwave baking pan is acquired, and the region of interest is constructed based on the color difference region. The color non-uniformity of the region of interest in the fourth infrared image is identified. If the color non-uniformity is greater than a preset threshold, the microwave baking pan is judged to be unqualified in quality inspection.

8. A quality inspection system for microwave baking pans according to claim 5, characterized in that, The quality detection module, after acquiring the second infrared image of the microwave baking pan within a first preset time after receiving the microwave detection signal, further includes: After the second preset time, the fifth infrared image of the microwave baking pan is acquired, and it is determined whether the maximum color value in the image meets the heating temperature of the microwave baking pan. If not, the microwave baking pan is judged to be of substandard quality.

9. A quality inspection device for microwave baking pans, characterized in that, The device includes a processor and a memory: The memory is used to store program code and transmit the program code to the processor; The processor is used to execute, according to the instructions in the program code, a quality inspection method for a microwave baking pan as described in any one of claims 1-4.

10. A computer-readable storage medium, characterized in that, The computer-readable storage medium is used to store program code for executing a quality inspection method for a microwave baking pan as described in any one of claims 1-4.

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