High-bandwidth integrated high-sensitivity photodiode amplifying circuit

By combining a first-stage amplification unit, a buffer isolation unit, and a second-stage amplification unit, a high-bandwidth, high-sensitivity photodiode amplifier circuit was realized, solving the problem that traditional circuits could not simultaneously achieve miniaturization, high performance, and low cost, and exhibiting high stability and reliability.

CN120896552AActive Publication Date: 2025-11-04SICHUAN HUIYUAN PLASTIC OPTICAL FIBER
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Patent Information

Application Number
CN202511374696.9
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2025-09-25
Publication Date
2025-11-04
Estimated Expiration
2045-09-25

AI Technical Summary

Technical Problem

Traditional silicon-based photodiode amplifier circuits cannot simultaneously meet the requirements of miniaturization, high performance, and low cost. Existing technologies make it difficult to achieve high-bandwidth integrated high-sensitivity photodiode amplifier circuits.

Method used

A high-bandwidth integrated photodiode amplifier circuit is formed by adopting a combination structure of a first-stage amplification unit, a buffer isolation unit, and a second-stage amplification unit, utilizing transconductance operational amplifiers and operational amplifiers, combined with a common-source common-gate structure, a unity negative feedback structure, and a differential amplification structure.

Benefits of technology

A high-bandwidth, low-cost, and high-sensitivity photodiode amplifier circuit was developed. The circuit is small in size and highly stable, which enhances the reliability and design flexibility of the circuit and reduces the impact of temperature and power supply voltage on the output.

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Abstract

The invention discloses a high-bandwidth integrated high-sensitivity photodiode amplifying circuit which comprises a first-stage amplifying unit, a buffer isolation unit and a second-stage amplifying unit which are connected in sequence, the first-stage amplifying unit is provided with a transconductance operational amplifier, and the buffer isolation unit is provided with an operational amplifier; the first-stage amplification unit is provided with a common-source and common-gate structure and keeps circuit gain stable, the buffer isolation unit connects an operational amplifier into a unit negative feedback structure to serve as a buffer, and an output end is connected with a forward diode for isolation, so that the influence of post-stage amplification output on a photodiode is prevented, and the reliability of the circuit is enhanced; the second-stage amplification unit adopts a differential amplification structure that a gate-drain end is connected with a resistor, not only is an output common mode point determined, but also the gain and the bandwidth can be adjusted according to resistance values of a resistor R4 and a resistor R5, the gain and the bandwidth can be adjusted to a higher bandwidth, the design flexibility is improved, and the differential structure also reduces the influence of the temperature, the power supply voltage and the process angle on the output.
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Description

TECHNICAL FIELD

[0001] The application belongs to the technical field of switching power supply, and particularly relates to a high-bandwidth integrated high-sensitivity photodiode amplification circuit. BACKGROUND

[0002] The silicon-based photodiode amplification circuit is widely applied in the fields of photoelectric detection and optical communication, and with the development of photoelectric detection systems in the direction of miniaturization, high integration, high speed, high performance and low cost, the traditional detector, amplification circuit and other separate device board-level link solutions cannot meet the application requirements, so a new generation of monolithic integrated photodiode amplification structure has great competitive advantage and application prospect.

[0003] Therefore, how to provide a high-bandwidth integrated high-sensitivity photodiode amplification circuit is a problem to be solved by those skilled in the art. SUMMARY

[0004] In view of the above problems in the prior art, the high-bandwidth integrated high-sensitivity photodiode amplification circuit provided by the application realizes the high-bandwidth integrated high-sensitivity photodiode amplification circuit by using a relatively simple circuit, reduces the circuit size, reduces the cost, enhances the reliability of the circuit, and has a high bandwidth, and solves the problem that the traditional amplification circuit cannot simultaneously meet the requirements of miniaturization, high performance and low cost.

[0005] In order to achieve the above-mentioned application purposes, the technical scheme adopted by the application is as follows: a high-bandwidth integrated high-sensitivity photodiode amplification circuit, comprising a first amplification unit, a buffer isolation unit and a second amplification unit connected in sequence, the first amplification unit is provided with a transconductance operational amplifier, and the buffer isolation unit is provided with an operational amplifier; The noninverting input terminal of the transconductance operational amplifier is connected with a reference voltage, the inverting input terminal of the transconductance operational amplifier is connected with a photodiode PD1, the output terminal of the transconductance operational amplifier and the noninverting input terminal of the operational amplifier, the inverting input terminal of the operational amplifier is connected with the output terminal of the operational amplifier and the inverting input terminal of the second amplification unit, and the noninverting input terminal of the second amplification unit is connected with the reference voltage.

[0006] Further, the first amplification unit further comprises a resistor R1 and a capacitor C1, and the transconductance operational amplifier comprises a transistor Q1, a transistor Q2, a transistor Q3, a transistor Q4, a transistor Q5, a transistor Q6, a MOS tube M1, a MOS tube M2, a MOS tube M3, a MOS tube M4, a MOS tube M5, a MOS tube M6, a MOS tube M7 and a MOS tube M8. The base of the triode Q1 is connected with the cathode of the photodiode PD1, one end of the resistor R1 and one end of the capacitor C1 respectively, and serves as the inverting input terminal of the transconductance operational amplifier, the collector of the triode Q1 is connected with the emitter of the triode Q3, the emitter of the triode Q1 is connected with the emitter of the triode Q2 and the drain of the MOS tube M3 respectively, the base of the triode Q2 is connected with the emitter of the triode Q5 and the drain of the MOS tube M7 respectively, and serves as the non-inverting input terminal of the transconductance operational amplifier, the collector of the triode Q2 is connected with the emitter of the triode Q4, the base of the triode Q3 is connected with the base of the triode Q4, the base of the triode Q5, the collector of the triode Q5 and the drain of the MOS tube M5 respectively, the collector of the triode Q3 is connected with the base of the triode Q6 and the drain of the MOS tube M1 respectively, the collector of the triode Q4 is connected with the gate of the MOS tube M1, the gate of the MOS tube M2 and the drain of the MOS tube M2 respectively, and the emitter of the triode Q6 is connected with the drain of the MOS tube M8, the other end of the resistor R1 and the other end of the capacitor C1 respectively, and serves as the output terminal of the transconductance operational amplifier; The source of the MOS tube M1, the source of the MOS tube M2, the source of the MOS tube M4, the source of the MOS tube M5 and the collector of the triode Q6 are connected with the power supply, the gate of the MOS tube M3, the gate of the MOS tube M6, the gate of the MOS tube M7 and the gate of the MOS tube M8 are connected with the bias voltage, the source of the MOS tube M3, the source of the MOS tube M6, the source of the MOS tube M7 and the source of the MOS tube M8 are grounded, and the gate of the MOS tube M4 is connected with the drain of the MOS tube M4, the gate of the MOS tube M5 and the drain of the MOS tube M6 respectively.

[0007] Further, the buffer isolation unit further comprises a grounding resistor R3 and a diode D1, and the operational amplifier comprises a triode Q7, a triode Q8, a triode Q9, a triode Q10, a triode Q11, a MOS tube M9, a MOS tube M10, a MOS tube M11, a MOS tube M12, a MOS tube M13, a MOS tube M14, a MOS tube M15 and a MOS tube M16; The base of the triode Q7 is connected with the emitter of the triode Q12, the anode of the diode D1 and the drain of the MOS M16 respectively, and serves as the inverting input of the operational amplifier, the emitter of the triode Q7 is connected with the emitter of the triode Q8 and the drain of the MOS M11 respectively, the collector of the triode Q7 is connected with the emitter of the triode Q9, the base of the triode Q8 is connected with the emitter of the triode Q11 and the drain of the MOS M15 respectively, and serves as the non-inverting input of the operational amplifier, the collector of the triode Q8 is connected with the emitter of the triode Q10, the base of the triode Q9 is connected with the base of the triode Q10, the base of the triode Q11, the collector of the triode Q11 and the drain of the MOS M13 respectively, the collector of the triode Q9 is connected with the drain of the MOS M9 and the base of the triode Q12 respectively, the collector of the triode Q10 is connected with the drain of the MOS M10, the gate of the MOS M10 and the gate of the MOS M9 respectively, and the emitter of the triode Q12 serves as the output of the operational amplifier; The source of the MOS M9, the source of the MOS M10, the source of the MOS M12, the source of the MOS M13 and the collector of the triode Q12 are connected with the power supply, the gate of the MOS M11, the gate of the MOS M14, the gate of the MOS M15 and the gate of the MOS M16 are connected with the bias voltage, the source of the MOS M11, the source of the MOS M14, the source of the MOS M15 and the source of the MOS M16 are grounded, the gate of the MOS M12 is connected with the drain of the MOS M12, the gate of the MOS M13 and the drain of the MOS M14 respectively, and the cathode of the diode D1 is connected with the grounding resistor R3.

[0008] Further, the secondary amplification unit comprises the triode Q13, the triode Q14, the MOS M17, the MOS M18, the MOS M19, the resistor R2, the resistor R4, the resistor R5, the resistor R6, the grounding resistor R7 and the diode D2. One end of the resistor R2 is taken as the reverse input end of the secondary amplification unit, the other end of the resistor R2 is connected with the base of the triode Q13, the emitter of the triode Q13 is connected with the drain of the MOS tube M19 and the emitter of the triode Q14 respectively, the source of the MOS tube M19 is grounded, the gate of the MOS tube M19 is connected with a bias voltage, the collector of the triode Q13 is connected with one end of the resistor R4 and the drain of the MOS tube M17 respectively, and taken as the output end of the secondary amplification unit, the gate of the MOS tube M17 is connected with the other end of the resistor R4, the gate of the MOS tube M18 and one end of the resistor R5 respectively, the other end of the resistor R5 is connected with the drain of the MOS tube M18 and the collector of the triode Q14 respectively, the source of the MOS tube M17 and the source of the MOS tube M18 are connected with a power supply respectively, the base of the triode Q14 is connected with one end of the resistor R6, the other end of the resistor R6 is connected with the grounding resistor R7 and the cathode of the diode D2 respectively, and the anode of the diode D2 is taken as the same-phase input end of the secondary amplification unit.

[0009] The present application has the following advantages: (1) The present application provides a high-bandwidth integrated high-sensitivity photodiode amplification circuit, the primary amplification unit is provided with a common-source common-gate structure, which can ensure that the triode Q1 and the triode Q2 both work in the saturation region, maintain the stability of the circuit gain, the source of the triode Q6 is biased to the diode through the negative feedback formed by the resistor R1 and the capacitor C1, and the biasing and the first-stage amplification share the same circuit structure, which reduces the circuit size; the buffer isolation unit connects the operational amplifier into a unit negative feedback structure to serve as a buffer, and connects a forward diode at the output end to isolate, which prevents the influence of the output of the subsequent amplification on the photodiode, and enhances the reliability of the circuit; the secondary amplification unit adopts a differential amplification structure with a gate-drain terminal resistance, which not only determines the output common-mode point, but also makes the gain and bandwidth adjustable according to the resistance values of the resistors R4 and R5, and the bandwidth can be adjusted to a higher value, which increases the design flexibility, and the differential structure also reduces the influence of temperature, power voltage and process angle on the output.

[0010] (2) The present application realizes a high-bandwidth integrated high-sensitivity photodiode amplification circuit by using a relatively simple circuit, which has the advantages of small area, strong stability, high bandwidth and strong reliability compared with the prior art. BRIEF DESCRIPTION OF DRAWINGS

[0011] Figure 1 The present application is a high-bandwidth integrated high-sensitivity photodiode amplification circuit Figure One .

[0012] Figure 2 The present application is a high-bandwidth integrated high-sensitivity photodiode amplification circuit Figure Two . DETAILED DESCRIPTION

[0013] The specific embodiments of the present invention are described below to enable those skilled in the art to understand the present invention. However, it should be understood that the present invention is not limited to the scope of the specific embodiments. For those skilled in the art, various changes are obvious as long as they are within the spirit and scope of the present invention as defined and determined by the appended claims. All inventions utilizing the concept of the present invention are protected.

[0014] like Figure 1 As shown, in one embodiment of the present invention, a high-bandwidth integrated high-sensitivity photodiode amplifier circuit includes a first-stage amplification unit, a buffer isolation unit, and a second-stage amplification unit connected in sequence. The first-stage amplification unit is provided with a transconductance operational amplifier, and the buffer isolation unit is provided with an operational amplifier. The non-inverting input of the transconductance operational amplifier is connected to the reference voltage. The inverting input of the transconductance operational amplifier is connected to the photodiode PD1, the output of the transconductance operational amplifier, and the non-inverting input of the operational amplifier, respectively. The inverting input of the operational amplifier is connected to the output of the operational amplifier and the inverting input of the secondary amplifier unit, respectively. The non-inverting input of the secondary amplifier unit is connected to the reference voltage.

[0015] like Figure 2 As shown, the first-stage amplification unit also includes resistor R1 and capacitor C1, and the transconductance operational amplifier includes transistors Q1, Q2, Q3, Q4, Q5, Q6, MOSFETs M1, M2, M3, M4, M5, M6, M7, and M8. The base of transistor Q1 is connected to the cathode of photodiode PD1, one end of resistor R1, and one end of capacitor C1, serving as the inverting input of the transconductance operational amplifier. The anode of photodiode PD1 is grounded. The collector of transistor Q1 is connected to the emitter of transistor Q3. The emitter of transistor Q1 is connected to the emitter of transistor Q2 and the drain of MOSFET M3. The base of transistor Q2 is connected to the emitter of transistor Q5 and the drain of MOSFET M7, serving as the non-inverting input of the transconductance operational amplifier. The collector of transistor Q2 is connected to the cathode of photodiode PD1, one end of resistor R1, and one end of capacitor C1, respectively, and serves as the inverting input of the transconductance operational amplifier. The emitter of transistor Q4 is connected to the base of transistor Q4, the base of transistor Q5, the collector of transistor Q5, and the drain of MOSFET M5. The collector of transistor Q3 is connected to the base of transistor Q6 and the drain of MOSFET M1. The collector of transistor Q4 is connected to the gate of MOSFET M1, the gate of MOSFET M2, and the drain of MOSFET M2. The emitter of transistor Q6 is connected to the drain of MOSFET M8, the other end of resistor R1, and the other end of capacitor C1, and serves as the output terminal of the transconductance operational amplifier. The source of MOS transistor M1, the source of MOS transistor M2, the source of MOS transistor M4, the source of MOS transistor M5 and the collector of triode Q6 are connected with power supply, the gate of MOS transistor M3, the gate of MOS transistor M6, the gate of MOS transistor M7 and the gate of MOS transistor M8 are connected with bias voltage, the source of MOS transistor M3, the source of MOS transistor M6, the source of MOS transistor M7 and the source of MOS transistor M8 are grounded, the gate of MOS transistor M4 is connected with the drain of MOS transistor M4, the gate of MOS transistor M5 and the drain of MOS transistor M6 respectively.

[0016] As shown in Figure 2 In this embodiment, a common source common gate structure is arranged in the primary amplification unit, which is composed of triode Q1, triode Q2, triode Q3 and triode Q4, so that triode Q1 and triode Q2 can work in saturation region, and the circuit gain is stable.

[0017] The buffer isolation unit further comprises ground resistance R3 and diode D1, and the operational amplifier comprises triode Q7, triode Q8, triode Q9, triode Q10, triode Q11, MOS transistor M9, MOS transistor M10, MOS transistor M11, MOS transistor M12, MOS transistor M13, MOS transistor M14, MOS transistor M15 and MOS transistor M16; The base of triode Q7 is connected with the emitter of triode Q12, the anode of diode D1 and the drain of MOS transistor M16 respectively, and serves as the inverting input terminal of the operational amplifier, the emitter of triode Q7 is connected with the emitter of triode Q8 and the drain of MOS transistor M11 respectively, the collector of triode Q7 is connected with the emitter of triode Q9, the base of triode Q8 is connected with the emitter of triode Q11 and the drain of MOS transistor M15 respectively, and serves as the non-inverting input terminal of the operational amplifier, the collector of triode Q8 is connected with the emitter of triode Q10, the base of triode Q9 is connected with the base of triode Q10, the base of triode Q11, the collector of triode Q11 and the drain of MOS transistor M13 respectively, the collector of triode Q9 is connected with the drain of MOS transistor M9 and the base of triode Q12 respectively, the collector of triode Q10 is connected with the drain of MOS transistor M10, the gate of MOS transistor M10 and the gate of MOS transistor M9 respectively, and the emitter of triode Q12 serves as the output terminal of the operational amplifier; The sources of MOSFETs M9, M10, M12, and M13, and the collector of transistor Q12 are all connected to the power supply. The gates of MOSFETs M11, M14, M15, and M16 are all connected to the bias voltage. The sources of MOSFETs M11, M14, M15, and M16 are all grounded. The gate of MOSFET M12 is connected to the drain of MOSFET M12, the gate of MOSFET M13, and the drain of MOSFET M14, respectively. The cathode of diode D1 is connected to the grounding resistor R3.

[0018] The secondary amplification unit includes transistors Q13 and Q14, MOSFETs M17, M18, and M19, resistors R2, R4, R5, and R6, grounding resistor R7, and diode D2. One end of resistor R2 serves as the inverting input of the second-stage amplifier unit. The other end of resistor R2 is connected to the base of transistor Q13. The emitter of transistor Q13 is connected to the drain of MOSFET M19 and the emitter of transistor Q14, respectively. The source of MOSFET M19 is grounded, and the gate of MOSFET M19 is connected to the bias voltage. The collector of transistor Q13 is connected to one end of resistor R4 and the drain of MOSFET M17, serving as the output of the second-stage amplifier unit. The gate of MOSFET M17... The base of transistor Q14 is connected to the other end of resistor R4, the gate of MOSFET M18, and one end of resistor R5. The other end of resistor R5 is connected to the drain of MOSFET M18 and the collector of transistor Q14. The sources of MOSFET M17 and MOSFET M18 are both connected to the power supply. The base of transistor Q14 is connected to one end of resistor R6. The other end of resistor R6 is connected to grounding resistor R7 and the cathode of diode D2. The anode of diode D2 serves as the non-inverting input of the secondary amplifier unit.

[0019] The specific operation process of the high-bandwidth integrated high-sensitivity photodiode amplifier circuit of the present invention is as follows: like Figure 1 As shown, the inverting input of the transconductance operational amplifier is connected to its output via resistor R1. The inverting input of the transconductance operational amplifier is also connected to photodiode PD1. Bias is achieved through a feedback network consisting of resistor R1 and capacitor C1 connected in parallel and series with the input resistance rbe1 of transistor Q1. This negative feedback extends bandwidth and suppresses distortion. In the absence of light, the current I1 in photodiode PD1 is 0. Due to the negative feedback, Vin1 ≈ Vin2 = VREF; Vo1 = Vin1 + I3 * R1. Since I3 is very small, Vo1 ≈ VREF.

[0020] The buffer isolation unit is an operational amplifier with an output end connected to an inverting input end, so Vo2 approximately equals Vo1 approximately equals VREF, Vin3 equals Vo2-VD1 equals VREF-VD1; similarly, Vin4 equals VREF-VD2 approximately equals Vin3, so the output level is approximately VOUT equals VDD-VGS17 when there is no light; when there is light, PD1 flows through the current, I3 is less than I4, Vo1 outputs high, so Vo2 also outputs high, at this time Vo2 is greater than VREF, so VOUT outputs low.

[0021] The application has the advantages that: the application provides a high-bandwidth integrated high-sensitivity photodiode amplification circuit, the first-stage amplification unit is provided with a common-source and common-gate structure, which can ensure that the transistor Q1 and the transistor Q2 both work in a saturation region, maintain the stability of the circuit gain, the source of the transistor Q6 is biased to the diode through the negative feedback formed by the resistor R1 and the capacitor C1, and the biasing and the first-stage amplification share the same circuit structure, thereby reducing the circuit size; the buffer isolation unit connects the operational amplifier into a unit negative feedback structure to make a buffer, and connects a forward diode to the output end to isolate, thereby preventing the influence of the output of the later-stage amplification on the photodiode and enhancing the reliability of the circuit; the second-stage amplification unit adopts a differential amplification structure with a gate-drain terminal resistor, which not only determines the output common mode point, but also makes the gain and bandwidth adjustable according to the resistance values of the resistors R4 and R5, and the bandwidth can be adjusted to be higher, thereby increasing the design flexibility, and the differential structure also reduces the influence of temperature, power voltage and process angle on the output.

[0022] The application realizes the high-bandwidth integrated high-sensitivity photodiode amplification circuit by using a relatively simple circuit, and has the advantages of small area, strong stability, high bandwidth and strong reliability compared with the prior art.

[0023] In the description of the application, it should be understood that the orientations or positional relationships indicated by the terms "center", "thickness", "upper", "lower", "horizontal", "top", "bottom", "inner", "outer", "radial" and the like are based on the orientations or positional relationships shown in the drawings, and are only for the convenience of describing the application and simplifying the description, and therefore cannot be understood as indicating or implying that the devices or elements referred to must have a particular orientation, be constructed and operated in a particular orientation, and therefore cannot be understood as limiting the application. In addition, the terms "first", "second", "third" are only for descriptive purposes, and cannot be understood as indicating or implying relative importance or implying the number of technical features indicated. Therefore, the features limited by "first", "second", "third" can explicitly or implicitly include one or more features.

Claims

1. A high-bandwidth integrated high-sensitivity photodiode amplifier circuit, characterized in that, It includes a first-stage amplification unit, a buffer isolation unit, and a second-stage amplification unit connected in sequence. The first-stage amplification unit is equipped with a transconductance operational amplifier, and the buffer isolation unit is equipped with an operational amplifier. The non-inverting input of the transconductance operational amplifier is connected to the reference voltage. The inverting input of the transconductance operational amplifier is connected to the photodiode PD1, the output of the transconductance operational amplifier, and the non-inverting input of the operational amplifier, respectively. The inverting input of the operational amplifier is connected to the output of the operational amplifier and the inverting input of the secondary amplifier unit, respectively. The non-inverting input of the secondary amplifier unit is connected to the reference voltage.

2. The high-bandwidth integrated high-sensitivity photodiode amplifier circuit according to claim 1, characterized in that, The first-stage amplification unit also includes resistor R1 and capacitor C1, and the transconductance operational amplifier includes transistors Q1, Q2, Q3, Q4, Q5, Q6, MOSFETs M1, M2, M3, M4, M5, M6, M7, and M8. The base of transistor Q1 is connected to the cathode of photodiode PD1, one end of resistor R1, and one end of capacitor C1, serving as the inverting input of the transconductance operational amplifier. The collector of transistor Q1 is connected to the emitter of transistor Q3. The emitter of transistor Q1 is connected to the emitter of transistor Q2 and the drain of MOSFET M3. The base of transistor Q2 is connected to the emitter of transistor Q5 and the drain of MOSFET M7, serving as the non-inverting input of the transconductance operational amplifier. The collector of transistor Q2 is connected to the emitter of transistor Q4. The base of transistor Q3 is connected to the base of transistor Q4, the base of transistor Q5, the collector of transistor Q5, and the drain of MOSFET M5. The collector of transistor Q3 is connected to the base of transistor Q6 and the drain of MOSFET M1. The collector of transistor Q4 is connected to the gate of MOSFET M1, the gate of MOSFET M2, and the drain of MOSFET M2. The emitter of transistor Q6 is connected to the drain of MOSFET M8, the other end of resistor R1, and the other end of capacitor C1, and serves as the output terminal of the transconductance operational amplifier. The sources of MOSFETs M1, M2, M4, and M5, and the collector of transistor Q6 are all connected to the power supply. The gates of MOSFETs M3, M6, M7, and M8 are all connected to the bias voltage. The sources of MOSFETs M3, M6, M7, and M8 are all grounded. The gate of MOSFET M4 is connected to the drain of MOSFET M4, the gate of MOSFET M5, and the drain of MOSFET M6, respectively.

3. The high-bandwidth integrated high-sensitivity photodiode amplifier circuit according to claim 1, characterized in that, The buffer isolation unit also includes a grounding resistor R3 and a diode D1, and the operational amplifier includes transistors Q7, Q8, Q9, Q10, Q11, MOSFETs M9, M10, M11, M12, M13, M14, M15, and M16. The base of transistor Q7 is connected to the emitter of transistor Q12, the anode of diode D1, and the drain of MOSFET M16, serving as the inverting input of the operational amplifier. The emitter of transistor Q7 is connected to the emitter of transistor Q8 and the drain of MOSFET M11, respectively. The collector of transistor Q7 is connected to the emitter of transistor Q9. The base of transistor Q8 is connected to the emitter of transistor Q11 and the drain of MOSFET M15, serving as the non-inverting input of the operational amplifier. The collector of transistor Q8... The base of transistor Q9 is connected to the base of transistor Q10, the base of transistor Q11, the collector of transistor Q11, and the drain of MOSFET M13. The collector of transistor Q9 is connected to the drain of MOSFET M9 and the base of transistor Q12. The collector of transistor Q10 is connected to the drain of MOSFET M10, the gate of MOSFET M10, and the gate of MOSFET M9. The emitter of transistor Q12 serves as the output terminal of the operational amplifier. The sources of MOSFETs M9, M10, M12, and M13, and the collector of transistor Q12 are all connected to the power supply. The gates of MOSFETs M11, M14, M15, and M16 are all connected to the bias voltage. The sources of MOSFETs M11, M14, M15, and M16 are all grounded. The gate of MOSFET M12 is connected to the drain of MOSFET M12, the gate of MOSFET M13, and the drain of MOSFET M14, respectively. The cathode of diode D1 is connected to the grounding resistor R3.

4. The high-bandwidth integrated high-sensitivity photodiode amplifier circuit according to claim 1, characterized in that, The secondary amplification unit includes transistors Q13 and Q14, MOSFETs M17, M18, and M19, resistors R2, R4, R5, and R6, grounding resistor R7, and diode D2. One end of resistor R2 serves as the inverting input of the second-stage amplifier unit. The other end of resistor R2 is connected to the base of transistor Q13. The emitter of transistor Q13 is connected to the drain of MOSFET M19 and the emitter of transistor Q14, respectively. The source of MOSFET M19 is grounded, and the gate of MOSFET M19 is connected to the bias voltage. The collector of transistor Q13 is connected to one end of resistor R4 and the drain of MOSFET M17, serving as the output of the second-stage amplifier unit. The gate of MOSFET M17... The base of transistor Q14 is connected to the other end of resistor R4, the gate of MOSFET M18, and one end of resistor R5. The other end of resistor R5 is connected to the drain of MOSFET M18 and the collector of transistor Q14. The sources of MOSFET M17 and MOSFET M18 are both connected to the power supply. The base of transistor Q14 is connected to one end of resistor R6. The other end of resistor R6 is connected to grounding resistor R7 and the cathode of diode D2. The anode of diode D2 serves as the non-inverting input of the secondary amplifier unit.

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