Load switch characteristic test method and device with transfer on-off branch

Abstract

The invention relates to the technical field of performance test of load switches, in particular to a load switch characteristic test method and device with a transfer on-off branch, and the method comprises the steps: firstly connecting a test circuit with a tested load switch; signal ends in three groups of probes of an oscilloscope are respectively connected with the first voltage acquisition point, the second voltage acquisition point and the third voltage acquisition point, and a ground wire of the oscilloscope is connected with the fourth voltage acquisition point; according to the method, the switch-off operation is carried out on the tested load switch, the voltage signals of the signal end in different time periods are acquired, the level change sequence diagram under different voltage acquisition points is obtained, the change condition of the current flowing through the arc extinguish chamber in the switch-off process can be accurately obtained, and a basis is provided for the design of the arc extinguish chamber.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of performance inspection of load switch, in particular to a load switch characteristic test method and device with a transfer opening branch. BACKGROUND

[0002] The high-voltage load switch is a key device in the power system, which is between the high-voltage circuit breaker and the high-voltage disconnector, mainly used for controlling the power transformer and distributing electric energy. The high-voltage load switch characteristic test is a key link to ensure the safe operation of power equipment, mainly involving mechanical characteristics, electrical performance and environmental adaptability and other parameters. The current high-voltage switch characteristic tester can only detect the high and low level signals of the loop of the measured switch, i.e. 0 and 1, to represent the two parameters of bounce and synchronism in the process of opening and closing. The utility model patent with the authorization announcement number CN214150964U discloses a high-voltage switch dynamic characteristic tester with stable measurement data, which converts the analog signals of the opening and closing coils of the high-voltage switch into current signals through the Hall sensor, and then converts the current signals into voltage signals through the measurement resistor R6. Then the signal is amplified by the in-phase amplifier, and finally the amplified current signal is sent to the A / D converter in the microprocessor S3C2410 for analog-digital conversion processing to complete the collection of the opening and closing coil current of the high-voltage switch. The microprocessor only detects the high and low levels to determine the state of the circuit breaker.

[0003] Moreover, in the prior art, when a switch with a transfer opening branch is encountered, only the overall bounce and synchronism of the measured switch can be displayed, and the abnormality in the process of opening and closing cannot be accurately analyzed and positioned.

[0004] The invention patent with the publication number CN116593881A discloses a three-phase high-voltage contact resistance and switch characteristic test device and method. When the data acquisition unit controls the interface driving unit to drive the first interface unit and the second interface unit to conduct, the three phases of the three-phase high-voltage switch are respectively measured for the closing voltage. When the data acquisition unit controls the interface driving unit to drive the third interface unit, the fourth interface unit and the fifth interface unit to conduct, the three phases of the three-phase high-voltage switch are respectively measured for the closing current. The waveform measurement unit is realized by a voltage dividing circuit, an A-phase operational amplifier circuit and an operational amplifier circuit. The voltage dividing circuit includes two resistors, and the amplifier circuit includes an amplifier and a resistor. It only detects the synchronism of the high-voltage switch opening through the voltage time waveform diagram of each phase. SUMMARY

[0005] Invention purposes: In order to overcome the deficiencies of the prior art, the application provides a load switch characteristic test method with a transfer opening branch, which solves the problems that the abnormal conditions in the actual opening process of the high load switch cannot be accurately judged and the judgment is not intuitive enough, and the application also provides a load switch characteristic test device with a transfer opening branch.

[0006] Summary of the application: The application provides a load switch characteristic test method with a transfer opening branch, which comprises the following steps: The first voltage collection point in the test circuit is connected with the moving contactor of the measured load switch, the second voltage collection point in the test circuit is connected with one end of the arc extinguishing chamber of the measured load switch away from the static contactor, the third voltage collection point in the test circuit is connected with the static contactor of the measured load switch, and the fourth voltage collection point in the test circuit is connected with one end of the arc extinguishing chamber of the measured load switch close to the static contactor. The signal ends in the three groups of probes of the oscilloscope are connected with the first voltage collection point, the second voltage collection point and the third voltage collection point respectively, and the ground wire of the oscilloscope is connected with the fourth voltage collection point. The measured load switch is subjected to an opening operation, and the voltage signals of the signal ends at different time periods are collected to obtain the level change time sequence diagram at different voltage collection points; the level change time sequence diagram is compared and analyzed with the corresponding theoretical time sequence diagram, so that the mutual influence between different collection points is determined.

[0007] Further, the method further comprises: The displacement sensor is fixed between the moving contactor rotating shaft and the arc extinguishing chamber of the measured load switch, so that the displacement curve of the moving contactor and the inner contactor of the arc extinguishing chamber relative to the time change in the opening process is obtained, the time-displacement curve is obtained by corresponding combination of the different time periods in the level change theoretical time sequence diagram and the time axis of the displacement curve, so that the abnormal conditions of the moving contactor and the arc extinguishing chamber stroke in each time period are analyzed.

[0008] Further, it comprises: The test circuit comprises seven voltage regulating resistors with the same resistance value, wherein the first resistor R1 and the second resistor R2 are connected in series to form a second collection unit, the third resistor R3 and the fourth resistor R4 are connected in series to form a first collection unit, the fifth resistor R5 and the sixth resistor R6 are connected in series to form a third collection unit, and the seventh resistor R7 is connected in parallel with the sixth resistor R6, and the first collection unit, the second collection unit and the third collection unit are connected in parallel at both ends to the positive and negative poles of the power supply module.

[0009] Further, it comprises: The first voltage collection point is arranged between the third resistor R3 and the fourth resistor R4 in the first collection unit, the second voltage collection point is arranged between the first resistor R1 and the second resistor R2 in the second collection unit, the third voltage collection point is arranged between the fifth resistor R5 and the sixth resistor R6 in the third collection unit, and the fourth voltage collection point is arranged at the connection point of the sixth resistor R6 and the seventh resistor R7.

[0010] Further, comprising: The measured load switch is opened, and the voltage signals of the signal end in different time periods are collected to obtain the level change time sequence diagram in different voltage collection points, including: Seven time points in the opening process of the measured load switch are determined, which are t0, t1, t2, t3, t4, t5 and t6, respectively, t0 is the time when the opening action of the isolation switch of the measured load switch starts and the moving contact and the static contact start to separate, t1 is the time when the current starts to transfer to the arc extinguishing chamber, t2 is the time when the moving contact and the static contact complete separation, t3 is the time when the contacts in the arc extinguishing chamber complete separation, t4 is the time when the arc extinguishing device release and the static contact complete separation, t5 is the time when the contacts in the arc extinguishing chamber complete closing due to the self-closing force of the arc extinguishing chamber, and t6 is the time when the measured load switch is closed again. The level changes in different voltage collection points include the level changes between the first voltage collection point and the fourth voltage collection point, the level changes between the second voltage collection point and the fourth voltage collection point, the level changes between the first voltage collection point and the third voltage collection point, and the level changes between the fourth voltage collection point and the third voltage collection point.

[0011] Therefore, the time sequence diagrams of the above four kinds of level changes in different time periods are obtained respectively.

[0012] Further, comprising: The time sequence diagrams of the above four kinds of level changes in different time periods are obtained respectively, including: The values of the seven time points are determined according to the test circuit, the level changes in different voltage collection points are expressed as percentages relative to the power supply voltage, so as to obtain the voltage values between two different voltage collection points in different time periods, the voltage values include the power supply voltage V0, zero, 2 / 3 V0 and 1 / 2 V0, and the mutual influences among the four circuits are obtained according to the voltage values between two different voltage collection points.

[0013] Further, comprising: The resistance value of the voltage regulating resistor is set according to the power supply voltage value of the power supply module.

[0014] In another aspect, the present application also provides a load switch characteristic testing device with a transfer opening branch, which comprises a measured load switch, an oscilloscope, a test circuit and a power module, the measured load switch comprises a support, first and second support insulators are respectively arranged at two ends of the support, a connecting terminal is arranged on the first support insulator, the connecting terminal is connected with the rear end of a moving contact, a static contact is arranged on the second support insulator, an arc-extinguishing chamber is arranged between two blades of the moving contact, the rear end of the arc-extinguishing chamber is hinged with the moving contact, a contact piece at the front end of the arc-extinguishing chamber is inserted into a slot of the static contact, the front end of the moving contact is away from or close to the static contact, the positive and negative poles of the test circuit are connected with the power module, the voltage collection points of the test circuit are connected with the relevant positions of the measured load switch, the oscilloscope is connected with the voltage collection points, and the oscilloscope is used for displaying the voltage signals of the current voltage collection points, so as to obtain the level change timing diagram.

[0015] Further, comprising: The device further comprises a displacement sensor arranged between the moving contact shaft of the measured load switch and the arc-extinguishing chamber.

[0016] Further, comprising: The first voltage collection point in the test circuit is connected with the moving contact of the measured load switch, the second voltage collection point in the test circuit is connected with one end of the arc-extinguishing chamber away from the static contact of the measured load switch, the third voltage collection point in the test circuit is connected with the static contact of the measured load switch, and the fourth voltage collection point in the test circuit is connected with one end of the arc-extinguishing chamber close to the static contact of the measured load switch.

[0017] Further, comprising: The test circuit comprises seven voltage regulating resistors with the same resistance value, wherein the first resistor R1 and the second resistor R2 are connected in series to form a second collection unit, the third resistor R3 and the fourth resistor R4 are connected in series to form a first collection unit, the fifth resistor R5 and the sixth resistor R6 are connected in series to form a third collection unit, and the seventh resistor R7 is connected in parallel with the sixth resistor R6, and the first collection unit, the second collection unit and the third collection unit are connected in parallel at two ends to the positive and negative poles of the power module.

[0018] Advantages: compared with the prior art, the present application has the following advantages: (1) The present application is based on the proposed test circuit, combined with the oscilloscope, and is specially improved for the shortcomings in the prior art, can directly display the opening and closing bounce and synchronism of one loop composed of the moving blade and the static contact, the opening and closing bounce and synchronism of another loop of the transfer opening branch composed of the arc-extinguishing chamber, and the data output of the two loops is in the same page, so that the researchers can directly locate the abnormal points through the obtained waveform diagram.

[0019] (2) The test circuit provided by the application only needs to adopt a plurality of voltage regulating resistors in simple series and parallel connection, the resistance value is adaptively adjusted according to the power supply voltage value, a plurality of collection points are selected on the test circuit and connected with the related positions of the high-voltage load switch, so as to collect the voltage signals under different positions and different time intervals, thereby forming the level change waveform diagram of different positions under different time intervals, and the abnormal position can be clearly known after corresponding with the theoretical waveform diagram, the implementation scheme is simple and the executability is strong.

[0020] (3) The application combines the travel curve diagram of the moving contact knife and the actual time sequence diagram of the arc extinguishing chamber, so that the abnormal situation in the actual opening process can be more accurately judged, and the change of the current flowing through the arc extinguishing chamber in the opening process is accurately obtained, thereby providing a basis for the design of the arc extinguishing chamber. BRIEF DESCRIPTION OF DRAWINGS

[0021] Figure 1 The load switch characteristic test method flow chart with the transfer opening branch of the embodiment 1 of the application is described; Figure 2 The structure diagram of the test circuit of the embodiment 1 of the application is described; Figure 3 The action time sequence diagram obtained in the opening process of the embodiment 1 of the application is described; Figure 4 The theoretical time sequence diagram obtained under the same action time sequence diagram condition of Figure 3 is described; Figure 5 The load switch characteristic test method flow chart with the transfer opening branch of the embodiment of the application is described; Figure 6 The time-displacement curve diagram obtained in the opening process of the embodiment 2 of the application is described; Figure 7 The displacement time sequence diagram obtained in the opening process of the embodiment 2 of the application is described; Figure 8 The structure schematic diagram of the high load switch in the closing state of the embodiment 3 of the application is described; Figure 9 The schematic diagram of the high load switch in the opening state and the tested circuit connection of the embodiment 3 of the application is described; Figure 10 The displacement time sequence diagram under certain abnormal condition of the embodiment 3 of the application is described; The figure includes, support insulator 1, support 2, moving contact knife 3, static contact 4, vacuum arc extinguishing chamber 5, tension spring 6, contact patch 7, insertion slot 8, stop block 9, profile spring 10. DETAILED DESCRIPTION

[0022] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0023] Example 1

[0024] like Figure 1 As shown, the present invention provides a method for testing the characteristics of a load switch with a transfer interruption branch, the method comprising the following steps: S1 connects the first voltage acquisition point in the test circuit to the moving contact of the load switch under test, the second voltage acquisition point in the test circuit is connected to the arc-extinguishing chamber end of the load switch under test that is away from the stationary contact, the third voltage acquisition point in the test circuit is connected to the stationary contact of the load switch under test, and the fourth voltage acquisition point in the test circuit is connected to the arc-extinguishing chamber end of the load switch under test that is close to the stationary contact.

[0025] In this embodiment, as Figure 2 As shown, the test circuit includes seven voltage-regulating resistors with the same resistance value. The first resistor R1 and the second resistor R2 are connected in series to form the second acquisition unit. The third resistor R3 and the fourth resistor R4 are connected in series to form the first acquisition unit. The fifth resistor R5 and the sixth resistor R6 are connected in series to form the third acquisition unit. The seventh resistor R7 is connected in parallel with the sixth resistor R6. The first acquisition unit, the second acquisition unit and the third acquisition unit are connected to the positive and negative terminals of the power module, respectively.

[0026] The first voltage acquisition point is set between the third resistor R3 and the fourth resistor R4 in the first acquisition unit; the second voltage acquisition point is set between the first resistor R1 and the second resistor R2 in the second acquisition unit; the third voltage acquisition point is set between the fifth resistor R5 and the sixth resistor R6 in the third acquisition unit; and the fourth voltage acquisition point is set at the connection point of the sixth resistor R6 and the seventh resistor R7.

[0027] Specifically, in a preferred mode of the embodiment, in actual application, the test circuit and the measured load switch are connected, the positive electrode of the power supply is connected to "+" in the test circuit schematic diagram, the negative electrode of the power supply is connected to "-", the voltage value of the power supply is V0, the first voltage collection point A1 is connected to the moving contact of the measured load switch, the second voltage collection point A3 is connected to one end of the arc extinguishing chamber away from the static contact, the third voltage collection point a is connected to the static contact, the fourth voltage collection point A2 is connected to one end of the arc extinguishing chamber close to the static contact, after the test circuit and the measured load switch are connected, the power supply is turned on, the signal ends in the three groups of probes of the oscilloscope are connected to the first voltage collection point A1, the second voltage collection point A3 and the third voltage collection point a respectively, the ground wires are connected to the fourth voltage collection point A2, the load switch is operated to open, the voltage signals of the three groups of probes of the oscilloscope in the opening operation process are collected, and three groups of voltage waveform diagrams are obtained.

[0028] Preferably, in the embodiment, the resistance value of the voltage regulating resistor is set according to the voltage value of the power supply module. As shown in the following table, several groups of recommended values of the voltage value V0 of the power supply and the voltage regulating resistor R are given.

[0029] S2 the signal ends in the three groups of probes of the oscilloscope are connected to the first voltage collection point, the second voltage collection point and the third voltage collection point respectively, and the ground wire of the oscilloscope is connected to the fourth voltage collection point. The embodiment does not limit the specific model of the oscilloscope.

[0030] S3 the measured load switch is operated to open, the voltage signals of the signal ends in different time periods are collected, the level change time sequence diagram under different voltage collection points is obtained, and the level change time sequence diagram is compared with the corresponding theoretical time sequence diagram, so that the time period when the abnormal situation occurs is obtained.

[0031] Preferably, in the embodiment, the measured load switch is operated to open, the voltage signals of the signal ends in different time periods are collected, and the level change time sequence diagram under different voltage collection points is obtained, including: Firstly, seven time points in the opening process of the measured load switch are determined, which are t0, that is, the time when the opening action of the isolation switch of the measured load switch starts and the moving contact starts to separate from the static contact; t1, that is, the time when the current starts to transfer to the arc extinguishing chamber; t2, that is, the time when the moving contact and the static contact complete separation; t3, that is, the time when the contacts in the arc extinguishing chamber complete separation; t4, that is, the time when the release of the arc extinguishing device and the static contact complete separation; t5, that is, the time when the contacts in the arc extinguishing chamber complete closing due to the self-closing force of the arc extinguishing chamber; and t6, that is, the time when the measured load switch is closed again. Secondly, the level changes considered at different voltage acquisition points include the level changes between the first and fourth voltage acquisition points, the level changes between the second and fourth voltage acquisition points, the level changes between the first and third voltage acquisition points, and the level changes between the fourth and third voltage acquisition points.

[0032] Therefore, the timing diagrams of the above four level changes in different time periods were obtained respectively.

[0033] In this embodiment, the values ​​of the seven time points are determined according to the test circuit. The level change at different voltage acquisition points is expressed as a percentage relative to the power supply voltage, thereby obtaining the voltage value between two different voltage acquisition points in different time periods. The voltage value includes the power supply voltage V0, zero, 2 / 3 V0, and 1 / 2 V0. The mutual influence between the four circuits is obtained based on the voltage value between two different voltage acquisition points.

[0034] Specifically, such as Figure 3 As shown, in the left column, "A1-A2" represents the level change between points A1 and A2, where A1 is the positive terminal of the oscilloscope signal acquisition probe and A2 is the negative terminal; "A3-A2" represents the level change between points A3 and A2, where A3 is the positive terminal of the oscilloscope signal acquisition probe and A2 is the negative terminal; "A1-a" represents the level change between points A1 and a, where A1 is the positive terminal of the oscilloscope signal acquisition probe and a is the negative terminal; "A2-a" represents the level change between points A2 and a, where A2 is the positive terminal of the oscilloscope signal acquisition probe and a is the negative terminal. This diagram illustrates the continuity of the loops between any two points in the four signal acquisition points A1, A2, A3, and a, such as the four loops A1-A2, A3-A2, A1-a, and A2-a. The circuit only has two signal levels, high and low. Each circuit has an independent and unrelated effect, making it impossible to observe the mutual influence between the three signal acquisition points simultaneously.

[0035] like Figure 4 As shown, in the left column, "A1-A2" represents the level change between points A1 and A2, where A1 is the positive terminal of the oscilloscope signal acquisition probe and A2 is the negative terminal of the oscilloscope signal acquisition probe; "A3-A2" represents the level change between points A3 and A2, where A3 is the positive terminal of the oscilloscope signal acquisition probe and A2 is the negative terminal of the oscilloscope signal acquisition probe; "a-A2" represents the level change between points a and A2, where a is the positive terminal of the oscilloscope signal acquisition probe and A2 is the negative terminal of the oscilloscope signal acquisition probe.

[0036] Figure 3 and Figure 4 The t value corresponding to the abscissa in the above table has the same meaning of time point, and is explained as follows: t0: the isolating knife switch starts to open, and the moving contact and the static contact start to separate; t1: the current starts to transfer to the arc extinguishing chamber; t2: the moving contact and the static contact complete separation; t3: the contacts in the arc extinguishing chamber complete separation; t4: the arc extinguishing device tripper and the static contact complete separation; t5: the contacts in the arc extinguishing chamber complete closing due to the self-closing force of the arc extinguishing chamber; and t6: the load switch is closed again.

[0037] Figure 4 is a theoretical timing diagram of the test circuit, since the test circuit proposed in the embodiment is referenced, the signals of the four circuits A1-A2, A3-A2, A1-a and A2-a between the four signal points are changed from high and low level signals to voltage signals relative to the input power supply voltage value, for example, the input power supply voltage value V0 volts, and four different voltage signals of 0 volts, 2 / 3 V0 volts, 1 / 2 V0 volts and V0 volts can be observed. The four different voltage values can show the mutual influence relationship between the four circuits during the opening process, for example: the voltage value of the A1-A2 circuit at the t2 time point, if there is no test circuit, for example, Figure 3 at the t2 time point and after the t2 time point, the voltage value collected by the A1-A2 circuit should be the same as that in the t0-t1 period, after the test circuit is connected, for example, Figure 4 the t0-t1 period is 2 / 3 V0, and at the t2 time point and after the t2 time point, the value becomes V0. Due to the test circuit proposed in the embodiment, the mutual influence between the four circuits is increased, and the mutual influence between the A1-A2 circuit and the a-A2 circuit at this moment is introduced: in the t0-t1 period, the a-A2 circuit and the A1-A2 circuit are both in the on state; at the t2 time point, the state of the a-A2 circuit is off, and the A1-A2 circuit is switched from off to on. For the convenience of understanding, the following table is introduced:

[0038] Due to the test circuit, the voltage signals between the circuits are expanded from only two kinds of high and low level signals to four different voltage signals of 0 volts, 2 / 3 V0 volts, 1 / 2 V0 volts and V0 volts, which can directly reflect the mutual influence between the A1-A2, A3-A2, A1-a and A2-a circuits.

[0039] Embodiment 2

[0040] As shown in Figure 5 , the embodiment provides a load switch characteristic test method with a transfer opening branch, and the method further comprises: S4 fixes the displacement sensor to the moving contactor shaft between the measured load switch and the arc chamber, so as to obtain the displacement curve of the moving contactor and the arc chamber in the opening process, and the displacement time sequence diagram is obtained by corresponding combination of the time axis of the displacement curve and the different time periods in the theoretical time sequence diagram of the level change, so as to analyze the abnormal situation of the moving contactor and the arc chamber in each time period.

[0041] As shown in Figure 6 , the displacement sensor is connected to the moving contactor and the arc chamber respectively, the displacement stroke change of the moving contactor and the arc chamber in the opening process is captured, the displacement curve of the moving contactor and the arc chamber in the opening process is obtained, and the time points t0-t5 marked in the horizontal coordinate in Figure 6 correspond to the time points t0-t5 in Figure 3 , Figure 4 , the displacement curve is combined with the time axis in Figure 4 and Figure 6 , and the displacement time sequence Figure 7 in the opening process is obtained. Figure 7 The displacement curve and the time sequence diagram given in the above are in the theoretical case, in the actual test process, the displacement time sequence diagram of the measured load switch in the opening process is compared with Figure 4 , whether the displacement of the moving contactor and the arc chamber in each time period and the time sequence diagram obtained by the test circuit and the oscilloscope are abnormal or not is analyzed.

[0042] Example 3

[0043] The embodiment also provides a load switch characteristic test device with a transfer opening branch, which comprises a measured load switch, an oscilloscope, a test circuit and a power module, the measured load switch comprises a support, first and second support insulators are respectively arranged at two ends of the support, a wiring end is arranged on the first support insulator, the wiring end is connected to the rear end of the moving contactor, a static contact is arranged on the second support insulator, an arc chamber is arranged between two blades of the moving contactor, the rear end of the arc chamber is hinged to the moving contactor, a contact piece at the front end of the arc chamber is inserted into a slot of the static contact, the front end of the moving contactor is away from or close to the static contact, the positive and negative electrodes of the test circuit are connected to the power module, a voltage acquisition point of the test circuit is connected to a related position of the measured load switch, the oscilloscope is connected to the voltage acquisition point, and is used for displaying the voltage signal of the current voltage acquisition point, so as to obtain the level change time sequence diagram.

[0044] The embodiment provides a high-voltage vacuum load switch structure and a schematic diagram connected with a test circuit, as shown in Figure 8As shown, in this load switch, a pair of supporting insulators 1 for each phase are mounted at a certain angle on the bracket 2. One insulator has a terminal hinged to the rear end of the moving contact 3, and the other insulator has a stationary contact 4. A vacuum interrupter 5 is located between the two blades of the moving contact 3, with its rear end hinged to the moving contact. A tension spring 6 is connected between the rear ends of the vacuum interrupter 5 of the moving contact. The contact piece 7 at the front end of the vacuum interrupter 5 is inserted into the slot 8 of the stationary contact. The structure of the slot part is similar to... Figure 9 As shown, there is a protruding stop 9 on one side of the inner wall of the slot, and an irregularly shaped spring 10 on the other side of the inner wall. The irregularly shaped spring presses the contact piece 7 under the stop 9 on the opposite side, so that the contact piece 7 cannot move upward and disengage from the stationary contact.

[0045] like Figure 9 As shown, connect the three sets of oscilloscope probes to... Figure 8 Connect the power supply between "+" and "-" at points "a", "A1", "A2", and "A3", with a power supply voltage value of "V0". Fix the displacement sensor to the rotating shaft of the moving contact 3 and the two ends of the arc-extinguishing chamber 5. Measure the waveforms of points A3, A2, and a with respect to point A2 using an oscilloscope to obtain the actual timing diagram of the tested high-voltage vacuum load switch during the opening process in Example 1. Collect the actual travel curves obtained by the displacement sensors of the moving contact 3 and the vacuum arc-extinguishing chamber 5. Match the obtained actual timing diagram with the actual displacement travel curves according to each time point and combine them to form a displacement timing diagram and the theoretical displacement timing diagram provided in this embodiment. Figure 7 By comparing and observing the anomalies in the timing waveforms and stroke curves, and identifying the time interval between which the anomalies occur, researchers can be guided to adjust the tripping action structure and provide assistance in optimizing the arc-extinguishing chamber structure.

[0046] like Figure 10 As shown, this is a displacement time series diagram recorded under an abnormal condition. The diagram shows fluctuations in the time series waveform near point A1 captured by the oscilloscope probe, and fluctuations also occur around time t1 in the arc-extinguishing chamber displacement curve. This can be observed by comparing the waveform with... Figure 7 By comparing the theoretical time-series displacement diagrams, the abnormal situation can be located near the moment when the current begins to transfer to the arc-extinguishing chamber during the tripping process. Figure 9 The given structural diagram of the high-voltage vacuum load switch under test shows that the fault point occurs near the moment when the moving contact blade fails to separate from the stationary contact and begins to contact one end of the arc-extinguishing chamber.

[0047] Although preferred embodiments of the invention have been described, those skilled in the art, upon learning the basic inventive concept, can make other changes and modifications to these embodiments. Therefore, the appended claims are intended to be interpreted as including both the preferred embodiments and all changes and modifications falling within the scope of the invention.

[0048] It will be apparent to those skilled in the art that various modifications and variations can be made to the present embodiments without departing from the spirit or scope of the present embodiments. Thus, it is intended that the present embodiments cover the modifications and variations of this application provided they come within the scope of the appended claims and their equivalents.

Claims

1. A method for testing the characteristics of a load switch with a transfer open break branch, characterized in that: The method comprises: The first voltage collection point in the test circuit is connected with the moving contact of the measured load switch, the second voltage collection point in the test circuit is connected with one end of the arc extinguishing chamber of the measured load switch away from the static contact, the third voltage collection point in the test circuit is connected with the static contact of the measured load switch, and the fourth voltage collection point in the test circuit is connected with one end of the arc extinguishing chamber of the measured load switch close to the static contact; the signal ends of the three groups of probes of the oscilloscope are connected with the first voltage collection point, the second voltage collection point and the third voltage collection point respectively, and the ground wire of the oscilloscope is connected with the fourth voltage collection point; the measured load switch is operated to be tripped, and the voltage signals of the signal ends in different time periods are collected to obtain the level change time sequence diagram of different voltage collection points; the level change time sequence diagram is compared and analyzed with the corresponding theoretical time sequence diagram, so that the mutual influence between different collection points is determined; the method further comprises: The displacement sensor is fixed to the moving contact shaft of the measured load switch between the arc extinguishing chamber, so that the displacement curve of the moving contact and the inner contact of the arc extinguishing chamber relative to the time change in the tripping process is obtained, the time axis of the displacement curve is combined with the different time periods in the theoretical time sequence diagram of the level change, so that the displacement time sequence diagram is obtained, and the abnormal conditions of the moving contact and the arc extinguishing chamber stroke in each time period are analyzed.

2. The method of claim 1, wherein: The test circuit comprises seven voltage regulating resistors with the same resistance value, wherein the first resistor R1 and the second resistor R2 are connected in series to form a second collection unit, the third resistor R3 and the fourth resistor R4 are connected in series to form a first collection unit, the fifth resistor R5 and the sixth resistor R6 are connected in series to form a third collection unit, and the seventh resistor R7 is connected in parallel with the sixth resistor R6, and the first collection unit, the second collection unit and the third collection unit are connected in parallel at both ends to the positive and negative poles of the power supply module.

3. The load switch characteristic test method with a transfer open branch according to claim 2, characterized in that: The first voltage collection point is arranged between the third resistor R3 and the fourth resistor R4 in the first collection unit, the second voltage collection point is arranged between the first resistor R1 and the second resistor R2 in the second collection unit, the third voltage collection point is arranged between the fifth resistor R5 and the sixth resistor R6 in the third collection unit, and the fourth voltage collection point is arranged at the connection point of the sixth resistor R6 and the seventh resistor R7.

4. The method of claim 3, wherein: The measured load switch is operated to be tripped, and the voltage signals of the signal ends in different time periods are collected to obtain the level change time sequence diagram of different voltage collection points, comprising: Seven time points are determined in the opening process of the measured load switch, which are t0, the time when the opening action of the isolation switch of the measured load switch starts and the moving contact blade starts to separate from the static contact; t1, the time when the current starts to transfer to the arc extinguishing chamber; t2, the time when the moving contact blade and the static contact complete separation; t3, the time when the contacts in the arc extinguishing chamber complete separation; t4, the time when the arc extinguishing device tripper and the static contact complete separation; t5, the time when the contacts in the arc extinguishing chamber complete closing due to the self-closing force of the arc extinguishing chamber; and t6, the time when the measured load switch is closed again. The level changes at different voltage collection points include the level change between the first voltage collection point and the fourth voltage collection point, the level change between the second voltage collection point and the fourth voltage collection point, the level change between the first voltage collection point and the third voltage collection point, and the level change between the fourth voltage collection point and the third voltage collection point. Therefore, the timing diagrams of the above four kinds of level changes in different time periods are obtained.

5. The method of claim 4, wherein: The timing diagrams of the above four kinds of level changes in different time periods are obtained by: According to the test circuit, the values of the seven time points are determined, and the level changes at different voltage collection points are expressed as percentages relative to the power supply voltage. Therefore, the voltage values between two different voltage collection points in different time periods are obtained, which include the power supply voltage V0, zero, 2 / 3 V0 and 1 / 2 V0. The mutual influence among the four circuits is obtained according to the voltage values between two different voltage collection points.

6. The method of claim 2, wherein: The resistance value of the voltage regulating resistor is set according to the power supply voltage value of the power supply module.

7. A load switch characteristic testing device with a transfer open branch, characterized by: The device includes a measured load switch, an oscilloscope, a test circuit and a power supply module. The measured load switch includes a support, two ends of the support are respectively provided with a first support insulator and a second support insulator, the first support insulator is provided with a wiring terminal, the wiring terminal is connected to the rear end of a moving contact blade, the second support insulator is provided with a static contact, an arc extinguishing chamber is located between two blades of the moving contact blade, the rear end of the arc extinguishing chamber is hinged to the moving contact blade, a contact piece at the front end of the arc extinguishing chamber is inserted into a slot of the static contact, the front end of the moving contact blade is away from or close to the static contact, the positive and negative electrodes of the test circuit are connected to the power supply module, the voltage collection points of the test circuit are connected to the relevant positions of the measured load switch, and the oscilloscope is connected to the voltage collection points to display the voltage signals between two voltage collection points in different time periods, thereby obtaining the level change timing diagram.

8. The load switch characterization test apparatus with transfer break branch of claim 7, wherein: The device further includes a displacement sensor arranged between the moving contact blade rotating shaft of the measured load switch and the arc extinguishing chamber.

9. The load switch characterization test apparatus with transfer break branch according to claim 7 or 8, characterized in that: The first voltage collection point in the test circuit is connected to the moving contact blade of the measured load switch, the second voltage collection point in the test circuit is connected to one end of the arc extinguishing chamber away from the static contact of the measured load switch, the third voltage collection point in the test circuit is connected to the static contact of the measured load switch, and the fourth voltage collection point in the test circuit is connected to one end of the arc extinguishing chamber close to the static contact of the measured load switch.

10. The load switch characteristic testing device with transfer opening branch according to claim 9, characterized in that: the test circuit comprises seven voltage regulating resistors with the same resistance value, wherein the first resistor R1 and the second resistor R2 are connected in series to form a second acquisition unit, the third resistor R3 and the fourth resistor R4 are connected in series to form a first acquisition unit, the fifth resistor R5 and the sixth resistor R6 are connected in series to form a third acquisition unit, and the seventh resistor R7 is connected in parallel with the sixth resistor R6, and the first acquisition unit, the second acquisition unit and the third acquisition unit are connected in parallel and connected to the positive and negative poles of the power module respectively.

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