Heat insulation type aluminum electrolytic capacitor aging test equipment and test method thereof

Abstract

The invention relates to a heat insulation type aluminum electrolytic capacitor aging test device and a test method thereof, and relates to the technical field of capacitor aging test equipment.The heat insulation type aluminum electrolytic capacitor aging test device comprises a test box, a test board arranged in a test box body, a heating assembly arranged in the test box body and a vibration feeding disc arranged on one side of the test box; the vibration feeding disc is used for adjusting a capacitor to be vertical and conveying the capacitor into the test box, an opening is formed in the top side of the test box, a cover plate is arranged at the opening of the test box, and the cover plate movably seals the opening end of the test box. According to the invention, the aging test can be conveniently carried out on the capacitor with the bent / non-bent pin, the test efficiency of the aging test can be improved, and the influence of the aging test result between the capacitors can be reduced.

Description

Technical Field

[0001] This application relates to the technical field of capacitor aging test equipment, and in particular to a heat-insulated aluminum electrolytic capacitor aging test equipment and its test method. Background Technology

[0002] Aluminum electrolytic capacitors are made by inserting a bent aluminum strip as the positive electrode into an aluminum cylinder containing a liquid electrolyte, with the cylinder serving as the negative electrode. They also undergo DC voltage treatment to form an oxide film on the positive electrode as the dielectric. The core function of aluminum electrolytic capacitors is to perform energy storage, filtering, and signal coupling in electronic circuits. Due to their large capacitance, they are widely used in power management, industrial equipment, and consumer electronics.

[0003] When electrolytic capacitors leave the factory, they need to undergo aging tests to simulate the extreme environments in actual use. For example, accelerated stress scenarios such as high temperature, high humidity, and electrical signal loading are used to expose component defects before leaving the factory, thereby exposing potential defects in advance and ensuring the reliability and stability of the product in actual applications.

[0004] Common capacitor aging test equipment includes a housing, a hot air blower inside the housing, and a support plate on the inner wall of the housing. The support plate has multiple sets of slots for inserting capacitors, and each slot has a conductive plate. The support plate is connected to an external power source. The capacitors are inserted into the support plate through the slots. The housing also contains a camera assembly that captures images of the capacitors and records the real-time status.

[0005] When conducting aging tests on capacitors using the aforementioned equipment, the relevant technicians first insert the capacitor to be tested into the slot, circulate hot air into the chamber, and power on the carrier plate. By testing the capacitor's loading and aging conditions under high temperature conditions, the aging performance of the capacitor is determined by comparing the data from the camera assembly.

[0006] Regarding the aforementioned technologies, in the actual aging test process, the capacitor leads serve as the heat dissipation medium, and the bending angle of the capacitor leads directly affects the heat dissipation efficiency, thus affecting the aging degree and aging test results. Furthermore, under different operating conditions, the capacitor leads need to be bent / unbent and soldered onto the circuit board. Therefore, both bent and unbent capacitors require orderly aging tests, which is not easily achieved with existing equipment. Additionally, because the slots on the carrier board of existing aging test equipment are fixed, if a capacitor in any one slot ages and fails, it will affect the aging tests of all subsequent capacitors. Therefore, improvements are needed. Summary of the Invention

[0007] To facilitate aging tests on capacitors with bent / unbent leads, improve testing efficiency, and reduce the influence of aging test results between capacitors, this application provides an aging test device and method for heat-insulated aluminum electrolytic capacitors.

[0008] The aging test equipment and test method for heat-insulated aluminum electrolytic capacitors provided in this application adopt the following technical solution: An aging test device and test method for heat-insulated aluminum electrolytic capacitors include a test chamber, a test platform disposed inside the test chamber body, a heating component disposed inside the test chamber body, and a vibrating feeder disposed on one side of the test chamber. The vibrating feeder is used to adjust the capacitor to a vertical position and transport it into the test chamber. An opening is provided on the top side of the test chamber, and a cover plate is provided at the opening of the test chamber. The cover plate provides a movable seal to the opening end of the test chamber. The test chamber body is provided with a support plate that is connected to and communicates with the vibrating feed plate. The support plate is provided with a sliding groove for the capacitor to slide. There are multiple sets of test tables, which are arranged in parallel with each other at intervals. The test tables are arranged in parallel with the support plate. A transition platform is provided in the test chamber in a sliding and lifting manner. The transition platform corresponds to each of the multiple sets of test tables. The test chamber is provided with a drive component to drive the transition platform. The test bench is equipped with a bending component for partially bending the capacitor leads, and the cover plate is also equipped with a detection component. The test bench is equipped with an indicator light at the installation position of each capacitor. When the capacitor is undergoing normal aging test, the indicator light is lit, and when the capacitor fails due to aging, the indicator light is turned off. The camera assembly includes a camera mounted on the cover plate and positioned facing the test platform, and a detection element used to turn the indicator light on / off based on the capacitance status.

[0009] By adopting the above technical solution, when conducting aging tests on capacitors, the capacitors produced are first conveyed by a vibrating feeder, so that all capacitors entering the test chamber opening are in a state of capacitors facing up and leads facing down. The leads of the capacitors slide into the sliding groove of the carrier platform for conveying, so that the capacitor leads on the conveying line are all on the same straight line.

[0010] Simultaneously, the capacitors on the carrier platform are lifted and slidably transported to the test platform for clamping and fixing through a transition platform until all capacitors on the test platform are installed. Then, the cover is closed to seal the test chamber, and the heating component inside the test chamber heats up the capacitors on the test platform, thereby conducting an aging test. During normal aging testing, all indicator lights on the test platform are lit. When a capacitor on the test platform shows signs of aging failure, the corresponding indicator light on the test platform goes out. The time it takes for the indicator light to go out is recorded by a camera to determine the aging performance and fatigue life of the capacitor.

[0011] Simultaneously, by setting up a bending component on the test bench, the capacitor leads are bent before testing. Since the capacitor leads are the primary heat dissipation channels for the capacitor, and the heat dissipation performance directly affects the aging performance of the capacitor, the bending component is used to bend the capacitor leads, thereby enabling simultaneous aging tests on capacitors with bent and unbent leads. By comparing the time data when the indicator light goes out, the aging performance of the bent and unbent capacitors can be compared, thus determining the lifespan of the capacitor under different operating conditions.

[0012] Optionally, the bottom side of the transition platform is provided with multiple adsorption holes, each corresponding to a capacitor. The extension direction of the two leads of the capacitor is consistent with the extension direction of the sliding groove and the extension direction of the multiple adsorption holes. The test platform is provided with a test groove parallel to the sliding groove. The test platform includes a mounting base fixed to the test box and a clamping base slidably disposed in the test box. The clamping base moves close to the mounting base to form the test groove to clamp the leads.

[0013] By adopting the above technical solution, when conducting capacitance testing, the capacitors are first screened through a transition platform. Since the end face of the capacitor is usually flat, if the end face of the capacitor is convex, it indicates that the capacitor has aged and failed, and therefore it is not easy to adsorb. Therefore, the capacitors to be tested are screened through the first adsorption of the transition platform, which reduces the impact of defective products on the subsequent aging test results, thereby improving the accuracy of the capacitor aging test and making it easier to accurately determine the service life of the capacitor.

[0014] Optionally, the bending assembly includes a bending plate disposed on the test bench. The bending plate is located on the bottom side of the test bench, and the rotation axis of the bending plate is perpendicular to the extension direction of the test groove. The bending plate has bending holes for pin insertion, and conductive contacts are provided in the bending holes. There are two sets of conductive contacts, with each set of two contacts corresponding to one pin. When the conductive contacts are in contact with the pins, they clamp and conduct electricity to the pins. The test box also includes a switching element for adjusting the continuity of the conductive contacts, and a synchronizing element for simultaneously adjusting multiple bending plates located on the same straight line along the length of the test box.

[0015] By adopting the above technical solution, after the capacitor is installed on the test bench, the pins are clamped by a rotating bending plate. The bending plate rotates and drives the pins to rotate. Since the test bench clamps and fixes the pins on the top of the capacitor, the bending plate is less likely to cause the pins to detach from the capacitor when bending the pins, thereby reducing the impact on the quality of the capacitor during the bending process.

[0016] Simultaneously, by using a synchronizer, the leads of capacitors in the same straight line are bent before subsequent tests, thereby keeping the state of capacitors in the same straight line as consistent as possible. This ensures that capacitors in the same group will not have inconsistent states due to temperature differences in the same straight line, which would lead to differences in the final results due to temperature deviations.

[0017] Optionally, the detection component includes a detection rod rotatably mounted on the test bench, the bottom side of the detection rod being movably attached to the top side of the capacitor, and the pivot of the detection rod being provided with a limiting component for keeping the detection rod in contact with the capacitor and an elastic component for driving the detection rod to rotate away from the capacitor. The switching component includes a wiring contact located on the test bench on the rotatable connection side of the detection rod, and the wiring contact is also provided in two sets, with each set of wiring contacts corresponding to one of the two pins. The wiring contact located on the same side is electrically connected to the conductive contact. When the wiring contacts are in contact with each other, the wiring contacts form a circuit, the conductive contact is short-circuited with the capacitor, and the indicator light goes out; When the wiring contacts move away from each other, the wiring contacts form an open circuit, the conductive contacts form a closed circuit, and the indicator light illuminates.

[0018] By adopting the above technical solution, if the aging test of electrolytic capacitors is judged solely by the current of the capacitor, a current sensor needs to be set at each terminal. When aging tests are performed on a large number of capacitors, a large number of sensors are required. Furthermore, when the sensors are densely distributed, adjacent current sensors will interfere with each other, resulting in inaccurate test results and high testing costs.

[0019] By using a testing rod to test the capacitor, since the capacitor is wrapped with insulating material on the outside, it is not easy to produce circumferential deformation even if the capacitor ages and fails. However, the top side of the capacitor is not restricted, so the capacitor often produces deformation on the top side, i.e., top bulge. By detecting the deformation of the top side of the capacitor with a testing rod, the number of current sensors introduced is reduced, the cost is reduced, and the influence between current sensors and the influence of current sensors at high temperatures is reduced, thereby improving the test accuracy.

[0020] Simultaneously, the rotation of the detection rod adjusts the continuity of the wiring contacts / conductive contacts, thereby achieving short circuits and circuits in the conductive contacts (capacitors), and thus achieving open circuits and normal detection of the capacitor. Three cameras built into the cover plate take pictures and record the brightness of the indicator lights, which facilitates the calculation of aging test results. Based on different areas / pin straightness / bending / temperature / time, the lifespan and aging performance of the capacitor can be obtained.

[0021] Optionally, the limiting component includes a limiting protrusion disposed on the test bench, a limiting cam is provided at the pivot of the detection rod, one wiring contact is disposed on the side with the larger diameter of the limiting cam, and the other wiring contact is located on the test bench, wherein the wiring contact is movably engaged with either the limiting cam or the other wiring contact.

[0022] By adopting the above technical solution, the position of the detection rod is limited by setting a limiting protrusion. When the detection rod is in contact with the top side of the capacitor, the limiting protrusion is engaged with the large end of the limiting cam, making it difficult for the detection rod to rotate. When the capacitor deforms, the detection rod is lifted up. When the limiting cam rotates to a position that is offset from the limiting protrusion, the detection rod separates from the capacitor under the action of the elastic element. This allows the limiting cam to rotate to a position where the two wiring contacts are in contact, short-circuiting the conductive contacts. This ends the aging performance test of the currently aged and deformed capacitor, preventing breakdown caused by excessive aging and its impact on adjacent capacitors.

[0023] Meanwhile, due to the cooperation between the elastic element, the limiting protrusion, and the limiting cam, when the detection rod is rotated to engage with the limiting protrusion, the limiting protrusion and the limiting cam are positioned. At the same time, under the action of the elastic element, the detection rod always tends to move away from the capacitor. Thus, even after a slight deformation occurs on the top side of the capacitor, the detection rod can still be driven to rotate, thereby achieving the circuit breaking of the capacitor aging test.

[0024] Optionally, each of the test benches is provided with multiple sets of bending plates, which are arranged at intervals. A fixing plate is provided between two adjacent sets of bending plates. The fixing plate is also provided with fixing holes, and conductive contacts are also provided in the fixing holes. The conductive contacts are also in contact with the pins.

[0025] By adopting the above technical solution, the bending plate and the fixing plate are arranged in an alternating manner. This arrangement evenly distributes the bent and non-bent capacitors in various positions within the test chamber, thereby reducing capacitor aging performance problems caused by temperature distribution issues.

[0026] At the same time, through the above settings, multiple capacitors located on the same test bench can be grouped into a group and labeled. For example, the test bench can be divided into the first group, the second group, the third group, the fourth group, etc., and the capacitors in each group from the side closest to the opening of the box to the side furthest from the opening of the box can be numbered A, B, C, D, etc.

[0027] By comparing the overall data from the first, second, third, and fourth groups, the aging performance of the capacitors at different temperatures can be determined.

[0028] By comparing the aging data of all capacitors numbered A, C, E... with the aging data of all capacitors numbered B, D, F, the aging performance of capacitors with bent leads and those without bent leads can be obtained.

[0029] By comparing the aging data of capacitors numbered A, C, E... in the first group with the aging data of capacitors numbered A, C, E... in the second group, we can determine the effect of different temperatures on the aging performance of capacitors with bent leads.

[0030] By comparing the aging data of capacitors numbered B, D, and F in the first group with those in the second group, we can determine the effect of different temperatures on the aging performance of capacitors with unbent leads.

[0031] Therefore, by comparing the data above, we can determine the impact of temperature and lead bending / non-bending factors on capacitor aging performance, thus obtaining more accurate aging test results.

[0032] Optionally, the synchronization component includes a first connecting rod slidably disposed within the test chamber and a sliding component for slidingly driving the first connecting rod. The first connecting rod is provided with multiple sets of second connecting rods, and the multiple second connecting rods correspond one-to-one with the multiple test platforms. A third connecting rod rotatably connected to the second connecting rod is rotatably connected to a bending plate.

[0033] By adopting the above technical solution, the sliding component drives the first link to slide, thereby driving the second link to rotate, and the second link drives the third link to rotate, thus driving the bending plate and enabling bending of all capacitors on the test bench that require pin bending. This reduces environmental errors caused by distributed bending and further improves the accuracy of aging test results.

[0034] Optionally, a rotating rod is also rotatably provided on the test platform. The rotating rod corresponds to all the detection rods on the same test platform, and the rotating rod is movably engaged with the side of the detection rod away from the capacitor.

[0035] By adopting the above technical solution, after all the capacitors to be tested are installed on the test platform, the rotating rod can be used to rotate and adjust all the test rods at once, so that all the test rods are rotated to a position that is in contact with the upper surface of the capacitors. This improves the efficiency of rotating and adjusting the test rods and reduces the inefficiency caused by rotating and adjusting the test rods individually.

[0036] In summary, this application includes at least one of the following beneficial technical effects: 1. By setting up a carrier plate, test stage, transition stage and bending assembly in the test box, the capacitor is subjected to aging test, so as to carry out a unified aging test on capacitors with bent and non-bent leads, to obtain the impact of whether the leads are bent on the aging performance of the capacitor, and thus to obtain the service life of the capacitor under different operating conditions. 2. By setting up bending plates, detection rods, conductive contacts, and wiring contacts, the aging test of capacitors is carried out by controlling the opening and closing of conductive contacts or wiring contacts. At the same time, the opening and closing of a single capacitor is controlled to reduce the impact on the aging test of other capacitors. 3. By using spaced bending plates and fixing plates, the bent capacitors and non-bent capacitors on the same test bench are evenly distributed, thereby reducing the differences in aging performance test results caused by different areas and temperatures, and improving the accuracy of the test results. Attached Figure Description

[0037] Figure 1 This is a schematic diagram of the overall structure of an embodiment of this application; Figure 2 This is a schematic diagram of the connection structure between the support plate and the transition platform; Figure 3 This is a schematic diagram of the connection structure of the synchronizing component; Figure 4 This is a schematic diagram of the connection structure of the synchronizing component from another perspective; Figure 5 This is a schematic diagram of the connection structure of the detection component.

[0038] Reference numerals: 1. Test chamber; 11. Cover plate; 12. Vibrating feeder; 13. Test platform; 14. Test groove; 2. Bearing plate; 21. Sliding groove; 22. Transition platform; 23. Drive assembly; 24. Adsorption hole; 3. Detection assembly; 31. Camera; 32. Detection component; 33. Indicator light; 321. Detection rod; 322. Limiting protrusion; 324. Limiting cam; 325. Elastic component; 4. Bending assembly; 41. Bending plate; 42. Bending hole; 43. Switch; 431. Wiring contact; 432. Conductive contact; 5. Synchronizing component; 51. First connecting rod; 52. Second connecting rod; 53. Third connecting rod; 54. Sliding component; 6. Rotating rod. Detailed Implementation

[0039] The following is in conjunction with the appendix Figure 1-5 This application will be described in further detail.

[0040] This application discloses an aging test device for heat-insulated aluminum electrolytic capacitors. (Refer to...) Figure 1 and Figure 2 An aging test device for heat-insulated aluminum electrolytic capacitors includes a test chamber 1 and a vibrating feeder 12 located on one side of the test chamber 1. The vibrating feeder 12 is used to vibrate and convey the capacitor vertically into the test chamber 1. A conveying track is provided between the vibrating feeder 12 and the test chamber 1. The conveying track is in the form of a circulating conveyor chain. Both the conveying track and the vibrating feeder 12 are existing technologies and will not be described in detail.

[0041] The test chamber 1 has an opening on one side near the vibrating feed plate 12, and a cover plate 11 is rotatably installed on one side of the opening. The cover plate 11 provides a movable seal to the opening of the test chamber 1. Multiple baffles are provided inside the cover plate 11, which divide the test chamber 1 into multiple areas. A heating element is provided inside the test chamber 1, and the power of the heating element in different areas is different. This allows for a cross-sectional comparison of data from different areas, thereby determining the impact of temperature and pin bending on the aging performance of the capacitor.

[0042] The test chamber 1 is equipped with a partition, which divides the test chamber 1 into two cavities along its extension direction. One cavity is equipped with a support plate 2, which is connected to the conveyor track. The support plate 2 is provided with a sliding groove 21. The width of the sliding groove 21 is smaller than the radius of the cylindrical part of the capacitor and larger than the width of the lead. The layout direction of the sliding groove 21 is consistent with the extension direction of the conveyor track, and the lead of the capacitor slides in the sliding groove 21.

[0043] The test chamber 1 is also equipped with a test platform 13. Multiple test platforms 13 are arranged in parallel along the length of the test chamber 1. Test slots 14 are provided on the test platforms 13. The test chamber 1 is also equipped with a transition platform 22 for transferring the capacitors on the support plate 2 to the test platform 13. Multiple adsorption holes 24 are provided on the bottom side of the transition platform 22. The multiple adsorption holes 24 are arranged at intervals along the length of the sliding groove 21. The multiple adsorption holes 24 correspond one-to-one with the multiple capacitors on the support plate 2. The transition platform 22 is raised, lowered and slidably disposed in the test chamber 1. The transition platform 22 is equipped with a power component that generates negative pressure in the adsorption holes 24. In this application, the power component is an air pump. At the same time, the sliding direction of the transition platform 22 is consistent with the length direction of the test chamber 1. In this application, the drive assembly 23 that drives the transition platform 22 is in the form of a cylinder and a lead screw. The cylinder drives the transition platform 22 to rise and fall, and the lead screw drives the transition platform 22 to slide.

[0044] Meanwhile, in order to facilitate the installation of the capacitor in the test slot 14 for subsequent stability testing, the test platform 13 includes a mounting base fixed in the test box 1 and a clamping base slidably disposed in the test box 1. The clamping base is slidably driven by a cylinder, and the mounting base and the clamping base together form the test slot 14 to clamp the capacitor.

[0045] The test bench 13 is also equipped with a bending component 4 for bending the capacitor leads and a detection component 3 for aging tests on the capacitor.

[0046] Reference Figure 3 and Figure 4 The detection component 3 includes a camera 31 located inside the cover plate 11. Each test platform 13 has a corresponding camera 31 on its top. In this application, the camera 31 is a camera with time recording. An indicator light 33 is provided on each corresponding capacitor position on the test platform 13. When the capacitor is undergoing normal aging test, the indicator light 33 lights up. When the capacitor fails due to aging, the indicator light 33 turns off. When more than 90% of the indicator lights 33 in the test chamber 1 turn off, the aging test ends. The test chamber 1 also has a detection component 32 that powers on / off the indicator lights 33 to monitor the capacitor status.

[0047] The bending assembly 4 includes a bending plate 41 rotatably mounted on the test bench 13. Each capacitor has two sets of bending plates 41. The two sets of bending plates 41 together form a clamping cavity for clamping the pins. Both sets of bending plates 41 are provided with bending holes 42 for pin insertion.

[0048] A conductive contact 432 is provided inside the bending hole 42. There are two conductive contacts 432, which are arranged opposite each other. One conductive contact 432 is in contact with the positive terminal pin, and the other conductive contact 432 is in contact with the negative terminal pin. In addition, each test platform 13 is embedded with a wire that electrically connects all the conductive contacts 432.

[0049] Meanwhile, bending plates 41 are also arranged at intervals on the same test bench 13. A fixing plate is fixed between adjacent bending plates 41. The fixing plate is also provided with fixing holes for pin insertion. Conductive contacts 432 are arranged in a relatively staggered manner in the fixing holes. The conductive contacts 432 are movably corresponding to and in contact with the pins.

[0050] Reference Figure 2 and Figure 3 The detection element 32 includes a detection rod 321 rotatably mounted on the test bench 13. The bottom side of the detection rod 321 is in contact with the top side of the capacitor. The pivot of the detection rod 321 is provided with a limiting element for keeping the detection rod 321 in contact with the top side of the capacitor and an elastic element 325 for driving the detection rod 321 to rotate away from the capacitor. The switching element 43 includes a wiring contact 431 located on the test bench 13 near the pivot of the detection rod 321. There are two sets of wiring contacts 431. The two sets of wiring contacts 431 correspond one-to-one with the two sets of conductive contacts 432. The wiring contacts 431 and the conductive contacts 432 are located in the same current loop, and the two sets of wiring contacts 431 are in contact.

[0051] Furthermore, when the wiring contacts 431 are in contact, the wiring contacts 431 form a circuit, the conductive contact 432 is short-circuited with the capacitor, and the indicator light 33 goes out.

[0052] When the wiring contacts 431 are far apart, the wiring contacts 431 form an open circuit, the conductive contacts 432 form a closed circuit, and the indicator light 33 lights up.

[0053] Simultaneously refer to Figure 3 , Figure 4 and Figure 5 The limiting component includes a limiting cam 324 rotatably mounted on the test bench 13 at the pivot of the detection rod 321 and a limiting protrusion 322 fixed to the bottom side of the clamping seat. One wiring contact 431 is located at the large end of the limiting cam 324, and the other wiring contact 431 is located on the test bench 13. The wiring contact 431 located at the large end is selectively engaged with the limiting protrusion 322 and the other wiring contact 431.

[0054] Furthermore, the elastic element 325 is a torsion spring located at the pivot of the detection rod 321, and the torsion spring drives the detection rod 321 to always have a force that rotates in the direction away from the capacitor.

[0055] Due to the cooperation between the elastic element 325, the limiting protrusion 322, and the limiting cam 324, when the detection rod 321 is rotated to engage with the limiting protrusion 322, the limiting protrusion 322 and the limiting cam 324 are positioned. At the same time, under the action of the elastic element 325, the detection rod 321 always tends to move away from the capacitor. Thus, even after a slight deformation occurs on the top side of the capacitor, the detection rod 321 can still be driven to rotate, thereby achieving a short circuit test for capacitor aging.

[0056] Simultaneously, after the aging test is completed, the relevant technicians open the cover plate 11 and remove the capacitor. During the removal process, the detection rod 321 automatically resets to a position away from the capacitor. At this time, before conducting the next aging test, after all the capacitors are placed on the test platform 13, the detection rod 321 needs to be rotated to a position that is in contact with the upper surface of the capacitor. To simplify this step, a rotating rod 6 is rotatably provided on the test platform 13. The rotation axis of the rotating rod 6 is consistent with the rotation axis of the bending plate 41, and there are multiple rotating rods 6. Each rotating rod 6 corresponds to one of the multiple test platforms 13. The rotating rod 6 corresponds to all the detection rods 321 on the same test platform 13 and is movably in contact with the side of the detection rod 321 away from the capacitor.

[0057] By using the rotating rod 6, after all the capacitors to be tested are installed on the test platform 13, all the detection rods 321 can be rotated and adjusted at once, so that all the detection rods 321 are rotated to a position that is in contact with the upper surface of the capacitor. This improves the efficiency of the rotation adjustment of the detection rods 321 and reduces the inefficiency caused by single rotation adjustment of the detection rods 321.

[0058] Furthermore, to reduce the impact on accuracy caused by step-by-step bending, the test chamber 1 is also equipped with a synchronizing element 5 for simultaneously adjusting multiple bending plates 41 located in the same straight direction (the length direction of the test chamber 1). The synchronizing element 5 includes a first connecting rod 51 slidably disposed in the test chamber 1 and a sliding element 54 that drives the first connecting rod 51 to slide. Multiple second connecting rods 52 are spaced apart along the length direction of the test chamber 1 from the first connecting rod 51. A third connecting rod 53 is rotatably connected to the bending plate 41. The third connecting rod 53 is rotatably connected to the second connecting rods 52. The sliding element 54 drives the first connecting rod 51 to slide, thereby driving the second connecting rods 52 to rotate. The second connecting rods 52 drive the third connecting rod 53 to rotate, thereby driving the bending plate 41 and enabling bending of all capacitors on the test stage 13 that require pin bending. This reduces environmental errors caused by distributed bending and further improves the accuracy of the aging test results. In this application, the sliding element 54 is in the form of a cylinder.

[0059] The implementation principle of the aging test equipment for heat-insulated aluminum electrolytic capacitors in this application embodiment is as follows: First, the capacitors after production are conveyed by vibration feeding plate 12 so that the capacitors entering the opening of the test box 1 are all in the state of capacitors facing up and pins facing down. The capacitor pins slide into the sliding groove 21 of the support platform for conveying, so that the capacitor pins on the conveying line are all in the same straight line.

[0060] Simultaneously, the capacitors on the carrier platform are lifted and slidably transported to the test platform 13 via the transition platform 22 for clamping and fixing until all capacitors on the test platform 13 are installed. Then, the first connecting rod 51 is slid to drive the bending plate 41 to rotate and bend the leads. Finally, the rotating rod 6 rotates all the detection rods 321 to a state where they are in contact with the top wall of the capacitor. The heating component raises the temperature, and the conductive contact 432 energizes the capacitor to perform load aging and thermal aging tests. The test results of the capacitor are judged based on the final results.

[0061] It should be noted that when making the final data comparison, multiple capacitors located on the same test bench 13 are grouped together and labeled. For example, the test bench 13 is divided into the first group, the second group, the third group, the fourth group, etc., and the capacitors in each group from the side closest to the opening of the box to the side furthest from the opening of the box are numbered A, B, C, D, etc.

[0062] By comparing the overall data from the first, second, third, and fourth groups, the aging performance of the capacitors at different temperatures can be determined.

[0063] By comparing the aging data of all capacitors numbered A, C, E... with the aging data of all capacitors numbered B, D, F, the aging performance of capacitors with bent leads and those without bent leads can be obtained.

[0064] By comparing the aging data of capacitors numbered A, C, E... in the first group with the aging data of capacitors numbered A, C, E... in the second group, we can determine the effect of different temperatures on the aging performance of capacitors with bent leads.

[0065] By comparing the aging data of capacitors numbered B, D, and F in the first group with those in the second group, we can determine the effect of different temperatures on the aging performance of capacitors with unbent leads.

[0066] The above are all preferred embodiments of this application, and are not intended to limit the scope of protection of this application. Therefore, all equivalent changes made in accordance with the structure, shape and principle of this application should be covered within the scope of protection of this application.

Claims

1. An aging test device for heat-insulated aluminum electrolytic capacitors, characterized in that: The test box (1) includes a test platform (13) inside the test box (1) body, a heating component inside the test box (1) body, and a vibrating feeder (12) on one side of the test box (1). The vibrating feeder (12) is used to adjust the capacitor to a vertical position and feed it into the test box (1). The test box (1) has an opening on its top side, and a cover plate (11) is provided at the opening of the test box (1). The cover plate (11) provides a movable seal to the opening of the test box (1). The test box (1) has a support plate (2) that is connected to the vibrating feed plate (12). The support plate (2) has a sliding groove (21) for the capacitor to slide. The test bench (13) has multiple sets. The multiple sets of test benches (13) are arranged in parallel with each other at intervals. The test benches (13) are arranged in parallel with the support plate (2). The test box (1) has a sliding and lifting transition platform (22). The transition platform (22) corresponds to the multiple sets of test benches (13) in one-to-one movement. The test box (1) has a drive component (23) for driving the transition platform (22). The test bench (13) is provided with a bending component (4) for partially bending the capacitor pins, and the cover plate (11) is also provided with a detection component (3). The test bench (13) is provided with an indicator light (33) at the installation position of each capacitor. When the capacitor is undergoing normal aging test, the indicator light (33) lights up, and when the capacitor fails due to aging, the indicator light (33) turns off. The detection component (3) includes a camera (31) disposed on the cover plate (11) facing the test stage (13) and a detection component (32) for turning the indicator light (33) on / off according to the capacitance state.

2. The aging test equipment for heat-insulated aluminum electrolytic capacitors according to claim 1, characterized in that: The bottom side of the transition platform (22) is provided with a plurality of adsorption holes (24), which correspond one-to-one with a plurality of capacitors. The extension direction of the two pins of the capacitor is consistent with the extension direction of the sliding groove (21) and the extension direction of the plurality of adsorption holes (24). The test platform (13) is provided with a test groove (14) parallel to the sliding groove. The test platform (13) includes a mounting base fixed to the test box (1) and a clamping base slidably disposed in the test box (1). The clamping base moves close to the mounting base to form the test groove (14) to clamp the pins.

3. The aging test equipment for heat-insulated aluminum electrolytic capacitors according to claim 2, characterized in that: The bending assembly (4) includes a bending plate (41) disposed on the test bench (13). The bending plate (41) is disposed on the bottom side of the test bench (13), and the rotation axis of the bending plate (41) is perpendicular to the extension direction of the test groove (14). The bending plate (41) is provided with a bending hole (42) for inserting pins. The bending hole (42) is provided with a conductive contact (432). The conductive contact (432) is provided in two sets. The two sets of conductive contacts (432) correspond one-to-one with each pin. When the conductive contact (432) is in contact with the pin, it clamps and conducts electricity to the pin. The test box (1) is also provided with a switching element (43) for adjusting the on / off state of the conductive contact (432). The test box (1) is also provided with a synchronizing element (5) for simultaneously adjusting multiple bending plates (41) located on the same straight line along the length direction of the test box (1).

4. The aging test equipment for heat-insulated aluminum electrolytic capacitors according to claim 3, characterized in that: The detection component (32) includes a detection rod (321) rotatably mounted on the test bench (13). The bottom side of the detection rod (321) is movably attached to the top side of the capacitor. The pivot of the detection rod (321) is provided with a limiting component for driving the detection rod (321) to remain attached to the capacitor and an elastic component (325) for driving the detection rod (321) to rotate away from the capacitor. The switching component (43) includes a wiring contact (431) located on the test bench (13) on the side where the detection rod (321) is rotatably connected. The wiring contact (431) is also provided in two sets. The two sets of wiring contacts (431) correspond one-to-one with the two pins. The wiring contact (431) located on the same side is electrically connected to the conductive contact (432). When the wiring contacts (431) are in contact with each other, the wiring contacts (431) form a circuit, the conductive contact (432) is short-circuited with the capacitor, and the indicator light (33) is turned off; When the wiring contacts (431) are far apart, the wiring contacts (431) form an open circuit, the conductive contacts (432) form a closed circuit, and the indicator light (33) lights up.

5. The aging test equipment for heat-insulated aluminum electrolytic capacitors according to claim 4, characterized in that: The limiting component includes a limiting protrusion (322) on the test bench (13), a limiting cam (324) at the pivot of the detection rod (321), a wiring contact (431) on the side with a larger diameter of the limiting cam (324), and another wiring contact (431) on the test bench (13). The wiring contact (431) is selectively engaged with the limiting cam (324) and the other wiring contact (431).

6. The aging test equipment for heat-insulated aluminum electrolytic capacitors according to claim 5, characterized in that: Each test bench (13) is provided with multiple sets of bending plates (41), and the multiple sets of bending plates (41) are arranged at intervals. A fixing plate is provided between two adjacent sets of bending plates (41), and a fixing hole is also provided on the fixing plate. A conductive contact (432) is also provided in the fixing hole, and the conductive contact (432) is also in contact with the pin.

7. The aging test equipment for a heat-insulated aluminum electrolytic capacitor according to claim 6, characterized in that: The synchronization component (5) includes a first connecting rod (51) slidably disposed in the test box (1) and a sliding component (54) for slidingly driving the first connecting rod (51). The first connecting rod (51) is provided with multiple sets of second connecting rods (52), and the multiple second connecting rods (52) correspond one-to-one with the multiple test platforms (13). A third connecting rod (53) rotatably connected to the second connecting rods (52) is rotatably connected to a bending plate (41).

8. The aging test equipment for heat-insulated aluminum electrolytic capacitors according to claim 7, characterized in that: A rotating rod (6) is also rotatably mounted on the test bench (13). The rotating rod (6) corresponds to all the detection rods (321) on the same test bench (13), and the rotating rod (6) and the detection rod (321) are movably attached to the side away from the capacitor.

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