Real-time damage detection device for communication receiver under strong electromagnetic pulse impact

Abstract

The invention discloses a real-time damage detection device for a communication receiver under strong electromagnetic pulse impact, and belongs to the field of electromagnetic compatibility. According to the device, different signal injection modes are adopted, the injection power and the injection duration of signals are adjusted, an injection experiment of high-power electromagnetic pulses is carried out, and the damage condition of the communication receiver under strong electromagnetic pulse attack in a complex electromagnetic environment is simulated through the working state of the most sensitive first-stage low noise amplifier of the receiver, so that the reliability of the communication receiver is improved. And real-time damage detection is carried out, and exploration about damage conditions is carried out, so that timely maintenance and further protection of the communication receiver in a complex environment are facilitated. The device can simulate the impact effect of strong electromagnetic pulses on the communication receiver, comprehensively monitor the working state of the communication receiver in real time and record the damage condition, provide core support for rapid positioning and isolation of fault equipment, and remarkably shorten the communication link repair time.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of electromagnetic compatibility, and particularly relates to a real-time damage detection device of a communication receiver under strong electromagnetic pulse impact. BACKGROUND

[0002] Modern communication systems bear the core function in civil infrastructure and key information networks, however, strong electromagnetic pulse effects including high-altitude nuclear electromagnetic pulse, high-power microwave weapon and ultra-wideband electromagnetic weapon may cause instantaneous damage or performance degradation of electronic devices. Strong electromagnetic pulse can invade the receiver system through front door coupling (antenna port, radio frequency front end) and back door coupling (power line, I / O interface, cabinet shielding defects), etc., resulting in burning or functional failure of core components such as low noise amplifier, mixer and digital signal processor.

[0003] Traditional post-detection methods (such as power-off inspection and manual testing) cannot meet the real-time judgment demand of device state in emergency scenarios, and may cause cascading failure due to failure to isolate the faulty device in time, or delay the recovery of the key communication link. Therefore, there is an urgent need for a technology that can monitor the real-time damage state of the communication receiver under strong electromagnetic pulse impact. SUMMARY

[0004] The present application provides a real-time damage detection device of a communication receiver under strong electromagnetic pulse impact, which can simulate the impact effect of strong electromagnetic pulse on the communication receiver, monitor the working state of the communication receiver in all aspects in real time and record the damage situation, thereby providing core support for rapid positioning and isolation of the faulty device and significantly shortening the communication link repair time.

[0005] The present application provides a real-time damage detection device of a communication receiver under strong electromagnetic pulse impact, which includes a signal generation module, a receiver test module, a logic analysis module, a spectrum analysis module and a PC control module.

[0006] The signal generation module is connected with the receiver test module and is used to generate a high-power electromagnetic pulse simulation signal, which is amplified by an amplifier and then connected to a directional coupler, and is injected into the receiver test module through a cable;

[0007] The receiver test module is used to generate voltage data of the voltage monitoring point;

[0008] The logic analysis module is connected with the receiver test module and is used to perform logic judgment according to the voltage data of the voltage monitoring point of the receiver test module and the voltage judgment value, to judge whether the receiver test module is damaged, and to realize millisecond-level state jump detection through the setting of the sampling frequency;

[0009] The spectrum analysis module is connected with the receiver test module through an attenuator, and is used for receiving the output of the receiver test module, monitoring and analyzing the spectrum information in real time, and monitoring the change of the output signal strength.

[0010] The PC control module is connected with the signal generation module and the logic analysis module, and is used for controlling the output of the signal generation module through a computer and recording and saving the result of the logic analysis module.

[0011] Optionally, in an embodiment of the present application, the high-power electromagnetic pulse simulation signal comprises a signal source generated signal and an amplifier amplified signal, the signal source generated signal is a single-tone continuous wave signal, and the working frequency is the working frequency band of the receiver test module, so that the strong signal cannot be filtered out by the filter of the receiver front end.

[0012] Optionally, in an embodiment of the present application, the directional coupler is used for ensuring that the strong reflected signal generated after the receiver test module is damaged cannot damage the amplifier, the isolation of the directional coupler is greater than 40 dB, so that the reflected signal is attenuated by more than 30 dB, and the coupling end of the directional coupler is connected with the spectrum analysis module, and is used for monitoring the output signal of the signal generation module.

[0013] Optionally, in an embodiment of the present application, the receiver test module comprises a front-end sensitive device low-noise amplifier and a voltage monitoring board, the low-noise amplifier is located at the first stage of the receiver test module, and whether the receiver test module can normally operate is judged by recording the working state of the low-noise amplifier under the electromagnetic pulse interference, and the working state of the low-noise amplifier is realized by monitoring and recording the voltage of the voltage monitoring point.

[0014] Optionally, in an embodiment of the present application, the voltage monitoring point is used for capturing parameters representing the working state of the device, including a bias voltage pin, a power supply current detection node and a temperature sensing node, the voltage measured by the voltage monitoring point is the bias voltage of the low-noise amplifier, the bias voltage pin is used for providing a stable direct current working point for the low-noise amplifier, the stable voltage provided by the LDO is connected to the bias voltage pin through a high-resistance resistor, and the voltage monitoring point is located between the high-resistance resistor and the bias voltage pin of the low-noise amplifier.

[0015] Optionally, in an embodiment of the present application, the voltage data of the voltage monitoring point is transmitted through a 2*4 pin board-to-board connector connecting the low noise amplifier and the voltage monitoring board, the voltage monitoring board is connected with the logic analysis module through a signal line to transmit data to the logic analysis module for judgment and record; wherein the 2*4 pin board-to-board connector, two symmetrical pins are used for power supply, two symmetrical pins are used for transmitting voltage data, and the remaining pins are ground pins and a pair of ground pins are located between the power supply pins and the voltage data transmission pins;

[0016] The voltage monitoring board is connected with an external power supply through the power supply pins on the pin, and is connected with the power supply pins of the board-to-board connector through the wiring on the PCB board, and is connected with the low noise amplifier through the board-to-board connector to supply power for the low noise amplifier; the voltage monitoring board receives the voltage of the low noise amplifier monitoring point through the board-to-board connector, and transmits the voltage data to the pin through the wiring on the PCB board, and the pin is connected with the logic analyzer to transmit the data to the logic analysis module, the ground pins of the board-to-board connector are connected with the ground pins on the pin through the wiring, and the logic analysis module and the low noise amplifier are grounded.

[0017] Optionally, in an embodiment of the present application, the logic analysis module uses a logic analyzer to monitor and analyze the voltage of the voltage monitoring point in real time, and the voltage judgment value of the logic analysis module is the reference voltage of the logic analyzer;

[0018] The logic analyzer uses clock acquisition and display to display digital signals for timing determination and analysis; the logic analyzer only displays two voltage logic values, logic 1 and 0, after setting the reference voltage, the logic analyzer determines the measured signal through the comparator, which is logic 1 if higher than the reference voltage, and logic 0 if lower than the reference voltage, forming a digital waveform between 1 and 0.

[0019] Optionally, in an embodiment of the present application, the logic analysis module works as follows: if the real-time voltage of the voltage monitoring point measured by the receiver test module is higher than the judgment value, it is determined as high level, i.e. logic value 1, and is recorded as no damage, if it is lower than the judgment value, it is determined as low level, i.e. logic value 0, and is recorded as damage; a fixed sampling rate is set to use the logic analyzer to sample, real-time sampling points are generated, all collected sampling points of logic 1 or 0 are connected into a waveform by a straight line, the moment when the logic value changes from 1 to 0 is the moment of damage of the receiver test module, and the sampling data is uploaded to the PC control module in real time for display and saving.

[0020] Optionally, in an embodiment of the present application, the sampling rate supports 3 channels of 100MHz sampling, 6 channels of 50MHz sampling, 9 channels of 32MHz sampling and 16 channels of 16MHz sampling;

[0021] The sampling depth supports 20KSa-10GKSa, and the pre-sampling time is the ratio of the sampling depth and the sampling rate.

[0022] Optionally, in an embodiment of the present application, the logic analysis module is connected with the receiver test module and the PC control module, the sampling rate and the sampling depth of the logic analyzer are set through computer software, and the logic analyzer is driven to start running, when the logic analyzer is connected with the voltage monitoring board of the receiver test module, the GND channel is reliably connected with the ground, and then the logic analyzer signal channel is connected with the voltage signal transmission interface.

[0023] The logic analysis module has 16 signal channels and two GND channels, the 16 signal channels are all used for receiving signals, and the GND channels are used for sharing the ground with the measured equipment, that is, the logic analysis module is used for data logic judgment and record of the multi-channel receiver.

[0024] The real-time damage detection device of the communication receiver under strong electromagnetic pulse impact in the embodiment of the present application can comprehensively and real-timely monitor the working state of the communication receiver under strong electromagnetic pulse impact and record the damage condition, covers all damage modes such as short-circuit breakdown and open-circuit fusing, breaks through the technical limitation of single monitoring parameter, and has important significance for the protection, timely adjustment and repair of the receiver in actual application. By adopting different signal injection modes, adjusting the injection power and injection time length of the signal, performing high-power electromagnetic pulse injection experiments, and monitoring the working state of the most sensitive first-stage low-noise amplifier of the receiver, the damage condition of the communication receiver under strong electromagnetic pulse attack in a complex electromagnetic environment is simulated, real-time damage detection is performed, and the damage condition is explored, so that the communication receiver in the complex environment can be timely repaired and further protected.

[0025] Additional aspects and advantages of the application will be set forth in part in the description which follows, and in part will become apparent to those skilled in the art upon examination of the following and / or can be learned by practice of the application. BRIEF DESCRIPTION OF DRAWINGS

[0026] The above and / or additional aspects and advantages of the present application will become apparent and be readily appreciated from the following description, taken in conjunction with the accompanying drawings, in which:

[0027] Figure 1 A structural schematic diagram of a real-time damage detection device of a communication receiver under strong electromagnetic pulse impact is provided according to an embodiment of the present application;

[0028] Figure 2The left drawing is the front view, and the voltage monitoring point position is marked in the drawing, the right drawing is the back view, and the position of the board-to-board connector and the function of each pin are marked in the drawing;

[0029] Figure 3 The voltage monitoring board layout design of the receiver test module of the embodiment of the application is shown in the drawing, and the position of the board-to-board connector and the pin are marked in the drawing;

[0030] Figure 4 The logic analyzer control and monitoring page of the PC control module of the embodiment of the application is shown in the drawing;

[0031] Figure 5 The multi-mode test flowchart of the embodiment of the application is shown in the drawing;

[0032] Figure 6 The logic record value diagram of the variable-power microwave signal continuous injection of the embodiment of the application is shown in the drawing;

[0033] Figure 7 The damage number statistical diagram of the embodiment of the application under different injection powers when damaged is shown in the drawing;

[0034] Figure 8 The logic record value diagram of the constant-power constant-time microwave signal injection of the embodiment of the application is shown in the drawing. DETAILED DESCRIPTION

[0035] The embodiments of the application are described in detail below, and examples of the embodiments are shown in the drawings, wherein the same or similar reference signs represent the same or similar elements or elements having the same or similar functions throughout. The embodiments described below by referring to the drawings are exemplary and are intended to explain the application, and cannot be understood as a limitation of the application.

[0036] Figure 1 The structure diagram of the real-time damage detection device of a communication receiver under strong electromagnetic pulse impact provided by the embodiment of the application is shown in the drawing.

[0037] As Figure 1 shown, the real-time damage detection device of the communication receiver under strong electromagnetic pulse impact includes a signal generation module, a receiver test module, a logic analysis module, a spectrum analysis module, and a PC control module.

[0038] The signal generation module is connected with the receiver test module, and is used to generate a high-power electromagnetic pulse simulation signal, which is amplified by an amplifier, connected to a directional coupler, and injected into the receiver test module through a cable;

[0039] The receiver test module is used to generate voltage data of the voltage monitoring point;

[0040] The logic analysis module is connected with the receiver test module, and is used for performing logic judgment according to voltage data of a voltage monitoring point of the receiver test module and voltage judgment values, judging whether the receiver test module is damaged or not, and realizing millisecond level state jump detection through setting of a sampling frequency.

[0041] The spectrum analysis module is connected with the receiver test module through an attenuator, and is used for receiving output of the receiver test module, and performing real-time monitoring and analysis on spectrum information, and monitoring change of output signal strength.

[0042] The PC control module is connected with the signal generation module and the logic analysis module, and is used for controlling output of the signal generation module through a computer, and recording and saving results of the logic analysis module.

[0043] In the embodiment of the application, the signal generation module is used for generating a high-power electromagnetic pulse simulation signal, including generating a signal by a signal source, amplifying the signal by an amplifier, connecting the signal to a directional coupler, and injecting the signal into the receiver test module through a cable; wherein the signal generated by the signal source is a single-tone continuous wave signal, and a working frequency is a working frequency band of the receiver test module, so as to ensure that a strong signal cannot be filtered out by a filter in a front end of the receiver.

[0044] The directional coupler is used for protecting the amplifier, so that a strong reflected signal generated after the receiver test module is damaged cannot damage the amplifier, an isolation degree is greater than 40 dB, so as to ensure that the reflected signal is attenuated by more than 30 dB, and a coupling end of the directional coupler is connected with a spectrum analyzer, so that the output signal of the signal generation module can be monitored.

[0045] The high-power electromagnetic pulse simulation signal injection is used for simulating the impact of a strong electromagnetic pulse on a communication receiver, and a signal power reaches 90% to 110% of a damage threshold of the receiver.

[0046] In the embodiment of the application, the receiver test module mainly includes a low noise amplifier of a front end sensitive device of the receiver and a voltage monitoring board, the low noise amplifier is located at a first stage of the receiver, is extremely susceptible to electromagnetic pulse interference, and is damaged, so that whether the receiver can normally operate can be judged by recording a working state of the low noise amplifier under the electromagnetic pulse interference.

[0047] The receiver test module damage refers to damage of the low noise amplifier, and the damage threshold of the receiver refers to a power value of the low noise amplifier when the low noise amplifier is damaged under injection of the electromagnetic wave.

[0048] The working state of the low noise amplifier is recorded by monitoring and recording voltage of the voltage monitoring point, and the voltage value of the voltage monitoring point is obviously different before and after the low noise amplifier is damaged, so that the state of the low noise amplifier or the receiver can be indirectly monitored by recording the change of the voltage value.

[0049] The voltage monitored by the voltage monitoring point is the bias voltage of the low noise amplifier, the bias voltage pin is used to provide a stable DC operating point for the low noise amplifier, and the stable voltage provided by the LDO is generally connected to the bias voltage pin through a high resistance resistor, and the voltage monitoring point is arranged between the high resistance resistor and the bias voltage pin of the low noise amplifier.

[0050] The voltage monitoring point is used to capture key parameters representing the working state of the device, including but not limited to the bias voltage pin, the power supply current detection node and the temperature sensing node.

[0051] The low noise amplifier can be damaged in two possible ways, one is short circuit damage, which is manifested as a sudden increase in DC point current, and the other is open circuit damage, which is manifested as a sudden drop in DC point current. The voltage of the monitoring point will decrease in both damage cases, the former is caused by breakdown, which causes an abnormal low resistance path, resulting in a decrease in bias voltage, and the latter is caused by thermal melting, which causes an open circuit, resulting in a decrease in bias voltage. According to the consistent change of the voltage of the monitoring point in different damage cases, the bias voltage is selected as the monitoring object, and the decrease in voltage is the evaluation standard for the damage of the low noise amplifier, and the obvious change in voltage can be used as the standard.

[0052] The voltage data of the voltage monitoring point is transmitted through the 2*4 pin board-to-board connector connecting the low noise amplifier and the voltage monitoring board, the voltage monitoring board is connected with the logic analysis module through the signal line, and the data is further transmitted to the logic module for judgment and recording.

[0053] Among them, the 2*4 pin board-to-board connector, two symmetrical pins are used for power supply, two symmetrical pins are used for transmitting voltage data, and the remaining pins are ground pins, and a pair of ground pins are located between the power supply pins and the voltage data transmission pins. The symmetrical pins and the ground pins are separated, which is conducive to the stability of data transmission and further reduces the influence of interference.

[0054] In the embodiment of the application, the voltage monitoring board is connected with the external power supply through the power supply pins on the pin, and then connected with the power supply pins of the board-to-board connector through the wiring on the PCB board, and then connected with the low noise amplifier through the board-to-board connector to supply power to the low noise amplifier; the voltage monitoring board receives the voltage of the monitoring point of the low noise amplifier through the board-to-board connector, and transmits the voltage data to the pin through the wiring on the PCB board, and then connects the pin with the logic analyzer to transmit the data to the logic analysis module. The ground pins of the board-to-board connector are connected with the ground pins on the pin through the wiring, and the logic analyzer and the low noise amplifier are grounded, which ensures the accuracy of the test.

[0055] The voltage monitoring board can supply power to multiple low noise amplifiers and output monitoring point voltage data at the same time, and can realize real-time damage monitoring of a multi-channel receiver.

[0056] In the embodiment of the present application, the logic analysis module comprises an FPGA and a voltage comparator, and the voltage of the receiver test module monitoring point is compared with the voltage judgment value and a logic judgment is made, so as to judge whether the receiver is damaged or not, and the millisecond level state jump detection is realized by setting the reference sampling frequency.

[0057] The logic analysis module uses a logic analyzer to perform real-time monitoring and judgment analysis on the voltage of the monitoring point. The logic analyzer uses clock acquisition and display of digital signals, and mainly functions in timing determination and analysis.

[0058] The logic analyzer only displays two logic voltages (logic 1 and 0), and after setting the reference voltage, the logic analyzer judges the measured signal through the comparator, and higher than the reference voltage is logic 1 and lower than the reference voltage is logic 0, forming a digital waveform between 1 and 0. Compared with the oscilloscope, the logic analyzer has more accurate timing and more data acquisition.

[0059] The voltage judgment value of the logic analysis module is the reference voltage of the logic analyzer, and the effective range of the reference voltage is -4V~+4V, and the voltage judgment value is set based on the voltage change range before and after damage.

[0060] The working of the logic analysis module is as follows: if the real-time voltage measured by the voltage monitoring module is higher than the judgment value, it is determined as high level (logic value 1), and is recorded as no damage; if the real-time voltage measured by the voltage module is lower than the judgment value, it is determined as low level (logic value 0), and is recorded as damage. A fixed sampling rate is set to use the logic analyzer for sampling, and a sampling point is generated in real time, and all collected sampling points (logic 1 and 0) are connected by a straight line to form a waveform. In addition, a suitable sampling depth is set to ensure the recording of the complete experiment process and realize the whole process monitoring and recording. The moment when the logic value changes from 1 to 0 is the moment when the receiver test module is damaged, and the sampling data is uploaded to the software on the computer in real time, and the software can restore the original data waveform in the computer, save the data, and also facilitate subsequent analysis and processing.

[0061] The sampling rate can support 3 channels of 100MHz sampling, 6 channels of 50MHz sampling, 9 channels of 32MHz sampling and 16 channels of 16MHz sampling, and the higher the sampling rate setting, the higher the sampling accuracy.

[0062] The sampling depth supports 20KSa~10GKSa, and the pre-sampling time is the ratio of the sampling depth and the sampling rate, and the specific sampling depth setting is dynamically configured according to the experiment duration.

[0063] The logic analyzer needs to be connected with a computer and a device under test (receiver test module). The logic analyzer and the computer are connected by a USB line, the sampling rate and the sampling depth of the logic analyzer are set by the computer software, and the logic analyzer is driven to start running. When the logic analyzer is connected with the voltage monitoring board of the receiver test module, it is necessary to ensure reliable connection of the GND channel with the ground, and then the signal channel of the logic analyzer is connected with the voltage signal transmission interface.

[0064] The logic analysis module has 16 signal channels and two GND channels, the 16 signal channels can be used for receiving signals, and the GND channels are used for sharing the ground with the device under test, that is, the logic analysis module can be used for data logic judgment and recording of a multi-channel receiver.

[0065] In the embodiment of the application, the spectrum analysis module mainly includes real-time monitoring and analysis of spectrum information, the output of the receiver module is transmitted to the spectrum analysis module through a cable in a synchronous manner, the change of the output signal strength is monitored, and a spectrum power drop of more than 20 dB is taken as a composite criterion.

[0066] In order to protect the spectrum analysis module, an attenuator can be connected between the receiver test module and the spectrum analysis module to avoid the influence of high-power output on the instrument.

[0067] In the embodiment of the application, the PC control module can realize full automation of the test system through the control program of the computer, and specifically includes control of the signal output of the signal module and real-time data monitoring of the logic analysis module.

[0068] The signal output of the control signal module includes control of the frequency, power and signal output time of the signal source; the real-time data monitoring of the logic analysis module includes real-time recording and saving of the logic judgment data.

[0069] The application can simulate the damage of a communication receiver under attack of a strong electromagnetic pulse in a complex electromagnetic environment, can comprehensively and real-timely monitor the working state of the communication receiver and record the damage, and has important significance for protection, timely adjustment and repair of the receiver in practical application.

[0070] The application uses high-power single-tone continuous wave signals with different injection modes, different intensities and different injection times as inputs to interfere with the receiver test module, can detect the damage of the communication receiver, including whether the communication receiver is damaged and the time when the damage occurs, and is beneficial to maintenance of the communication system under strong electromagnetic interference and proposal of an emergency plan.

[0071] On the basis of detecting the damage, the application can explore the influence of the strong electromagnetic pulse interference on the communication receiver, including the probability of damage under a specific power and the time required for the damage, and specifically:

[0072] The experimental platform of real-time damage detection of the communication receiver mainly consists of a signal generation module, a logic analysis module, a receiver test module, an attenuator, a spectrum analysis module and a computer control end, and each part is connected by a cable. In order to prevent the power from being too large to damage the spectrum analyzer of the spectrum analysis module, the output of the receiver test module needs to be connected to the attenuator. The specific connection mode is as follows: the signal output by the signal source is amplified by the amplifier, then connected to the directional coupler, the signal is injected into the receiver test module through the cable, the voltage of the monitoring point of the receiver test module is input into the logic analysis module through the signal line, and the output of the receiver test module is connected to the attenuator through the cable, and then the attenuator is connected to the spectrum analyzer. The computer (PC) is connected to the signal source and the logic analysis module through the cable, the output of the signal source is controlled by the computer, and the results of the logic analysis module are recorded and saved by the computer. The schematic diagram of the real-time damage detection device of the communication receiver is as shown in Figure 1 .

[0073] The receiver test module used in the application mainly includes a low-noise amplifier and a voltage monitoring board, the 3D layout of the low-noise amplifier is as shown in Figure 2 , wherein the monitoring point is located between the bias voltage pin of the low-noise amplifier and the voltage dividing resistor, and the layout of the multi-channel voltage monitoring board (four channels) is as shown in Figure 3 , the low-noise amplifier is connected with the voltage monitoring board through a board-to-board connector, and the voltage monitoring board is connected with the logic analyzer and the voltage source through a pin. Figure 2 The bias voltage monitoring point is a preferred scheme, and other monitoring nodes can be selected according to the characteristics of the device in actual application: a current monitoring scheme (a sampling resistor is connected in series in the power supply path, and a voltage signal is converted by a differential amplifier) and a temperature monitoring scheme (a thermistor is attached to the heat dissipation area of the amplifier, and the resistance change reflects the damage condition).

[0074] The logic analyzer of the logic analysis unit selected in the application contains FPGA and voltage comparator, the detection accuracy of the voltage is 0.01V, and stable logic judgment is provided. The logic analysis module can determine that the voltage greater than the judgment value is 1 and the voltage less than the judgment value is 0. Since the voltage of the monitoring point of the low-noise amplifier used in the receiver test module is 1.25V when it works normally, and the voltage of the monitoring point is 1.1V after damage, 1.16V is set as the judgment voltage, the logic value is displayed as 1 when it works normally, and the logic value is displayed as 0 after damage, and the moment of logic value jump is the moment of damage, so the application can accurately record the time of damage of the receiver test module. The sampling rate, sampling depth and voltage judgment value of the logic sampling can be set through the PC control module, and the logic value data can be saved through the computer, and then subsequent data processing and statistics can be carried out.

[0075] In the embodiment of the present application, the single channel monitoring is adopted, the sampling rate of the logic analyzer is set to 4MHz, the sampling depth is 1GSa, and the judgment voltage is 1.16, as shown in Figure 4 .

[0076] The PC control module is used to realize the injection of high-power single continuous wave signals with different injection modes, different intensities, and different times, and the detection device is used for real-time damage detection of the receiver, including the continuous injection test of the variable-power microwave signal, the constant-power constant-time microwave signal injection test, and the damage time statistical test under the constant-power microwave signal injection, and the test flowchart is shown in Figure 5 .

[0077] When the variable-power microwave signal is continuously injected for testing, the control signal generation module generates continuously changing power, and the power of each kind of signal is constant for 5 seconds before changing, and the test is performed through the cable injection receiver test module, including:

[0078] A1. During the test, the signal generation module is used to generate signals with power changing from 34.5dBm to 36dBm, and the power change step interval is 0.1dBm, that is, a total of 16 signals with different powers are injected, each power is injected for 5 seconds before switching to the next power, and the power is fully traversed;

[0079] A2. 50 groups of receiver test modules are prepared, and the S parameters and the direct current are checked in advance to ensure normal operation;

[0080] A3. For any receiver test module, first run the logic analysis module and the spectrum analysis module to monitor the state of the receiver, then control the power change through the PC control module, and then inject the signal through the signal generation module and the cable, when the logic value of the logic analysis module jumps or the reading of the spectrum analysis module significantly decreases, it is determined that the receiver is damaged, and the time when the jump occurs is recorded as the damage duration T, wherein T is the time when the signal injection occurs when the logic value jumps. Since the injection time of each signal is a constant value and the starting power is a constant value, the injection power P of the receiver when the damage occurs can be calculated according to the damage time:

[0081]

[0082] Wherein, t fix = 5 seconds + 0.14 seconds, 0.14 seconds is the time required for the instrument switch and the computer control program to run when the power is switched, which is a fixed value.

[0083] A4. For each receiver test module, perform step A3 and repeat the experiment 50 times to obtain the damage duration of 50 groups of receivers, denoted as T1, T2, T3, …, T50;

[0084] A5. Based on the calculations, P1, P2, ..., P50 are obtained, and the number of failures occurring when switching to the same power level is counted. This is used to assess the probability of damage to the receiver test module under continuous variable power injection. The most vulnerable power point of the receiver is located through continuous variable power injection.

[0085] In embodiments of the present invention, the changes in logic values ​​during specific experiments are as follows: Figure 6 As shown, the drop point during the 5-second power injection duration is the moment of failure, and the 0.14-second drop in the middle is the time required for power switching. The injected power at the time of failure can be calculated. It is important to note that the failure time T is the signal injection time, while the logic record is opened before signal injection. The absolute reading of the logic record cannot be used as the failure time; the absolute reading must be subtracted from the time of the first rising edge (the time when signal injection begins). Based on the above experimental process, the number of failures occurring under the same power is counted as follows: Figure 7 As shown.

[0086] When performing injection testing using a constant power, constant time microwave signal, the control signal generation module generates a constant power signal with a duration of 20 seconds, which is injected into the receiver test module via a cable for testing, including:

[0087] B1. During the test, signals with power ranging from 35.7dBm to 36.9dBm were used, with a power step interval of 0.2dBm, that is, a total of 7 signals with different power were injected, and each power was injected for 20 seconds.

[0088] B2. Prepare 10 sets of receiver test modules for each constant power, for a total of 70 sets. Check the S-parameters and DC current in advance to ensure that they can work normally.

[0089] B3. For the receiver test module, first run the logic analysis module and the spectrum analysis module to monitor the receiver's status. Set the injection power and signal duration via the PC control module, then inject the signal through the signal generation module and cable. If the logic value of the logic analysis module changes abruptly or the reading of the spectrum analysis module decreases significantly, the receiver is considered damaged. Record the time of the change as the damage duration T, where T is the signal injection time when the logic value changes. If no change occurs within the signal duration, the receiver is considered not damaged, and the damage duration is recorded as T. >20s This means that the time required for damage exceeds 20 seconds. Based on the damage duration, the probability of receiver damage (PR) under a 20-second strong electromagnetic pulse impact at a specific power level can be calculated.

[0090]

[0091] Wherein, Num = 10 is the number of receiver test modules for injection experiment at each power point in the B1 power range, Num T<20s is the number of damages occurring within 20 seconds at this power;

[0092] B4. For each receiver test module, after setting the power according to B1 and B2, execute step B3, repeat the experiment, and obtain 70 groups of damage durations of the receiver test modules, denoted as T1, T2, T3, …, T70.

[0093] B5. According to the calculation, PR1, PR2, …, PR7 are obtained for evaluating the damage possibility of the receiver system at a specific high power segment. The greater PR is, the higher the possibility of damage of the receiver test module within 20 seconds at this power point is. If the calculated damage probability is equal to 0, it is determined that the receiver test module will not be damaged within 20 seconds of continuous injection at this power; if the calculated damage probability is equal to 1, it is determined that the receiver test module will be damaged within 20 seconds of continuous injection at this power. The logic recording diagram is shown in Figure 8 , and the drop point is the damage moment.

[0094] The damage time statistical test is performed by using constant power microwave signal injection. The control signal generation module generates a constant power signal with a duration of 20 seconds, which is injected into the receiver test module through a cable for testing. The injection power is set based on the power value at which the damage probability is greater than or equal to 95% in the constant power constant time injection test, and is defined as the certain damage power, including:

[0095] C1. During the test, signals with powers of 36 dBm to 36.9 dBm are used, and the power step interval is 0.1 dBm, that is, a total of 10 signals with different powers are injected, and each power is continuously injected for 20 seconds.

[0096] C2. For each constant power, 15 groups of receiver test modules are prepared, a total of 150 groups, and the S parameters and direct current are pre-checked to ensure normal operation.

[0097] C3. For the receiver test module, first run the logic analysis module and the spectrum analysis module to monitor the state of the receiver, set the injection power and signal duration through the PC control module, and then inject the signal through the signal generation module and the cable. When the logic value of the logic analysis module jumps or the reading of the spectrum analysis module significantly decreases, it is determined that the receiver is damaged, and the time when the jump occurs is recorded as the damage duration T, wherein T is the time when the signal is injected when the logic value jumps.

[0098] C4. For each receiver test module, after setting the power according to B1 and B2, step B3 is performed, the experiment is repeated, and 150 groups of damage time of the receiver test module are obtained, recorded as T1, T2, T3, …, T150;

[0099] C5. According to the damage time T1, T2, T3, …, T150, the distribution rule of the damage time of the receiver system at a specific high power segment is evaluated, and the electromagnetic pulse attack time required at a specific damage power is analyzed.

[0100] In the embodiment of the application, the injection power with a damage probability of 1 within 20 seconds is used for the experiment, the relationship between the damage possibility and the injection time can be comprehensively analyzed, and the influence caused by the strong electromagnetic pulse attack in an instant or a short time is concentratedly studied. The continuous injection of other slightly lower high power values can also cause damage to the receiver, but the required time is longer.

[0101] The test process of the application is as follows: first, preheat the machine, then connect the various devices and equipment according to the test structure block diagram, open the logic analysis module, then control the signal generation module to generate signals, control and record relevant data through the PC, and save the data in time for subsequent processing and analysis.

[0102] The application provides a real-time damage detection method for a communication receiver under a strong electromagnetic pulse, which accurately determines the damage state of the equipment through automatic multi-mode testing:

[0103] (1) variable power continuous injection to locate the most fragile power point;

[0104] (2) constant power 20-second test to statistically damage the probability;

[0105] (3) record the time distribution rule under the certain damage power.

[0106] The application also adopts a double damage verification device, including a logic analysis module to capture signal jump and a spectrum analysis module to detect signal attenuation, to establish an electromagnetic protection threshold database for high-risk equipment such as military communication and satellite load, and to promote the reliability standard of anti-pulse attack. Compared with the traditional post-inspection method, the application can realize real-time monitoring at the millisecond level.

[0107] The application can also be used for damage detection of a multi-channel receiver under a strong electromagnetic pulse impact. The design of the voltage monitoring board can be appropriately adjusted to expand the channel number to 8 channels or 16 channels. In addition, adjusting the sampling depth and sampling rate of the logic analyzer can realize longer monitoring and more accurate recording.

[0108] The real-time damage detection device of the communication receiver under strong electromagnetic pulse impact according to the embodiment of the application can comprehensively and real-timely monitor the working state of the communication receiver under strong electromagnetic pulse impact and record damage conditions, covers all damage modes such as short-circuit breakdown and open-circuit fusing, breaks through the technical limitation of a single monitoring parameter, and has important significance for the protection, timely adjustment and repair of the receiver in actual application.

[0109] In the description of the present specification, the description referring to the terms "one embodiment", "some embodiments", "an example", "a specific example", or "some examples" and the like means that the specific features, structures, materials or characteristics described in connection with the embodiment or example are included in at least one embodiment or example of the present application. In the present specification, the illustrative description of the above terms does not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials or characteristics described can be combined in any one or N embodiments or examples in a suitable manner. In addition, the person skilled in the art can combine and combine the different embodiments or examples described in the present specification and the features of the different embodiments or examples without contradiction.

[0110] In addition, the terms "first", "second" are only for descriptive purposes, and cannot be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features. Therefore, the features defined with "first", "second" can explicitly or implicitly include at least one of the features. In the description of the present application, the meaning of "N" is at least two, for example, two, three, etc., unless otherwise specifically limited.

Claims

1. A real-time damage detection device for a communication receiver under strong electromagnetic pulse impact, characterized in that, include: Signal generation module, receiver testing module, logic analysis module, spectrum analysis module, and PC control module; The signal generation module is connected to the receiver test module and is used to generate a high-power electromagnetic pulse analog signal, which is amplified by an amplifier and then connected to a directional coupler, and injected into the receiver test module through a cable; The receiver test module is used to generate voltage data at the voltage monitoring point; The logic analysis module is connected to the receiver test module and is used to make logical judgments based on the voltage data and voltage judgment values ​​of the voltage monitoring points of the receiver test module to determine whether the receiver test module is damaged. The millisecond-level state transition detection is achieved by setting the sampling frequency. The spectrum analysis module is connected to the receiver test module through an attenuator, and is used to receive the output of the receiver test module, perform real-time monitoring and analysis of spectrum information, and monitor changes in the output signal strength. The PC control module is connected to the signal generation module and the logic analysis module, and is used to control the output of the signal generation module and record and save the results of the logic analysis module via computer.

2. The apparatus according to claim 1, characterized in that, The high-power electromagnetic pulse analog signal includes a signal generated by a signal source and a signal amplified by an amplifier. The signal generated by the signal source is a single-tone continuous wave signal, and its operating frequency is the operating frequency band of the receiver test module, ensuring that strong signals are not filtered out by the filter at the receiver front end.

3. The apparatus according to claim 1, characterized in that, The directional coupler is used to ensure that the strong reflected signal generated after the receiver test module is damaged will not damage the amplifier. The directional coupler has an isolation of >40dB, ensuring that the reflected signal is attenuated by more than 30dB. The coupling end of the directional coupler is connected to the spectrum analysis module to monitor the output signal of the signal generation module.

4. The apparatus according to claim 1, characterized in that, The receiver test module includes a front-end sensitive device, a low-noise amplifier, and a voltage monitoring board. The low-noise amplifier is located in the first stage of the receiver test module. The receiver test module can be judged to operate normally by recording the working status of the low-noise amplifier under electromagnetic pulse interference. The working status of the low-noise amplifier is realized by monitoring and recording the voltage of the voltage monitoring point.

5. The apparatus according to claim 4, characterized in that, Voltage monitoring points are used to capture parameters characterizing the operating state of the device, including bias voltage pins, power supply current sensing nodes, and temperature sensing nodes. The voltage measured by the voltage monitoring point is the bias voltage of the low-noise amplifier. The bias voltage pin is used to provide a stable DC operating point for the low-noise amplifier. The stable voltage provided by the LDO is connected to the bias voltage pin through a high-resistance resistor. The voltage monitoring point is set between the high-resistance resistor and the low-noise amplifier bias voltage pin.

6. The apparatus according to claim 5, characterized in that, Voltage data from the voltage monitoring point is transmitted by connecting a low-noise amplifier to the voltage monitoring board via a 2*4 pin board-to-board connector. The voltage monitoring board is connected to the logic analysis module via a signal line, transmitting data to the logic analysis module for judgment and recording. The 2*4 pin board-to-board connector has two symmetrical pins for power supply, two symmetrical pins for voltage data transmission, and the remaining pins are ground pins, with one pair of ground pins located between the power supply pins and the voltage data transmission pins. The voltage monitoring board is connected to an external power source via power pins on the connector, and then connected to the power supply pins of the board-to-board connector via traces on the PCB board. The board-to-board connector then connects to the low-noise amplifier to supply power. The voltage monitoring board receives the voltage at the monitoring point of the low-noise amplifier via the board-to-board connector, transmits it to the voltage data pins on the connector via traces on the PCB board, connects the connector to the logic analyzer, and transmits the data to the logic analysis module. The ground pin of the board-to-board connector is connected to the ground pin on the connector via traces. The logic analysis module and the low-noise amplifier share a common ground.

7. The apparatus according to claim 1, characterized in that, The logic analysis module uses a logic analyzer to monitor and analyze the voltage at the voltage monitoring point in real time. The voltage judgment value of the logic analysis module is the reference voltage of the logic analyzer. The logic analyzer uses a clock to acquire and display digital signals for timing determination and analysis. The logic analyzer only displays two voltage logic values, logic 1 and 0. After setting the reference voltage, the logic analyzer uses a comparator to determine the measured signal. If the voltage is higher than the reference voltage, it is logic 1; if it is lower than the reference voltage, it is logic 0. A digital waveform is formed between 1 and 0.

8. The apparatus according to claim 7, characterized in that, The logic analysis module works as follows: If the real-time voltage of the voltage monitoring point measured by the receiver test module is higher than the judgment value, it is determined to be a high level, i.e., logic value 1, and is recorded as no damage has occurred; if it is lower than the judgment value, it is determined to be a low level, i.e., logic value 0, and is recorded as damage has occurred; a fixed sampling rate is set and the logic analyzer is used to sample, and sampling points are generated in real time. All the collected sampling points are connected by straight lines to form a waveform. The instant when the logic value changes from 1 to 0 is the instant when the receiver test module is damaged. The sampling data is uploaded to the PC control module in real time for display and saving.

9. The apparatus according to claim 8, characterized in that, The sampling rate supports 3-channel 100MHz sampling, 6-channel 50MHz sampling, 9-channel 32MHz sampling and 16-channel 16MHz sampling; The sampling depth supports 20 kSa to 10 G kSa, and the presampling time is the ratio of the sampling depth to the sampling rate.

10. The apparatus according to claim 1, characterized in that, The logic analysis module is connected to the receiver test module and the PC control module. The sampling rate and sampling depth of the logic analyzer are set by computer software, and the logic analyzer is driven to start running. When the logic analyzer is connected to the voltage monitoring board of the receiver test module, the GND channel is reliably connected to ground, and then the signal channel of the logic analyzer is connected to the voltage signal transmission interface. The logic analysis module has a total of 16 signal channels and two GND channels. All 16 signal channels are used to receive signals, and the GND channels are used to share a common ground with the device under test. That is, the logic analysis module is used for data logic judgment and recording of the multi-channel receiver.

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