Aging test device

Abstract

The invention provides an aging test device. The aging test device comprises a test box which is provided with an accommodating cavity, a first mounting hole and a second mounting hole; the aging device is arranged in the accommodating cavity and comprises a seat body and two electrode groups, the seat body is provided with a mounting cavity, two opposite cavity walls of the mounting cavity are respectively provided with one electrode group, one electrode group is connected or contacted with a high-voltage cable or a copper bar, and the other electrode group is connected with a grounding wire; the stretching device is arranged in the mounting cavity and comprises a clamping assembly and an adjusting structure, the clamping assembly is provided with a clamping space used for clamping a sample, and at least part of the adjusting structure is movably arranged so as to drive the clamping assembly to stretch the clamped sample; and when the stretching device clamps the sample and is mounted in the mounting cavity, the sample is in contact with at least two electrodes in the two electrode groups. The problem that in the prior art, a comprehensive aging experiment device cannot simulate the composite aging effect of the cable in the actual operation process is solved.

Description

Technical Field

[0001] This invention relates to the field of aging test technology for insulating materials, and more specifically, to an aging test apparatus. Background Technology

[0002] Currently, XLPE (cross-linked polyethylene) is the preferred insulation material for power cables, and its superior heat resistance, electrical, and mechanical properties have led to its widespread application in various fields such as offshore wind power, photovoltaic power generation, and urban power distribution networks. The aging process of XLPE insulation is influenced by multiple factors, including thermo-oxidative aging, water treeing (the synergistic effect of water and electric fields), and mechanical stress. However, existing research on the aging characteristics of XLPE insulation largely focuses on the influence of single factors. In practical applications, cables are often subjected to the combined effects of thermal, electrical, and mechanical stresses, making single-factor aging studies insufficient to comprehensively reflect the material's true aging behavior.

[0003] In existing technologies, comprehensive aging test devices are used to address the aforementioned problems by integrating thermal, electrical, and mechanical aging factors. However, comprehensive aging test devices have significant limitations in simultaneously controlling thermal, electrical, and mechanical aging stresses as well as environmental humidity. They lack the ability to simultaneously apply thermal and mechanical stresses to materials and cannot simulate the combined aging effects of cables during actual operation. Summary of the Invention

[0004] The main objective of this invention is to provide an aging test device to solve the problem that existing comprehensive aging test devices cannot simulate the combined aging effects of cables during actual operation.

[0005] To achieve the above objectives, the present invention provides an aging test apparatus, comprising: a test chamber having a receiving cavity, a first mounting hole, and a second mounting hole, both of which communicate with the receiving cavity; the first mounting hole is used for passing through a high-voltage cable or copper busbar, and the second mounting hole is used for passing through a grounding wire; an aging device disposed within the receiving cavity, the aging device comprising a base and two electrode groups, the base having a mounting cavity, and two electrode groups respectively disposed on opposite cavity walls of the mounting cavity, one electrode group being connected to or in contact with a high-voltage cable or copper busbar, and the other electrode group being connected to a grounding wire; each electrode group comprising a plurality of electrodes spaced apart along a preset direction; and a tensile device disposed within the mounting cavity, the tensile device comprising a clamping assembly and an adjusting structure interconnected thereto, the clamping assembly having a clamping space for clamping a sample, and at least a portion of the adjusting structure being movably disposed to drive the clamping assembly to stretch the clamped sample; wherein, when the tensile device clamps the sample and is installed within the mounting cavity, one surface of the sample is in contact with at least one electrode in one electrode group, and the other surface of the sample is in contact with at least one electrode in the other electrode group.

[0006] Furthermore, the aging test apparatus also includes: a heating device disposed inside the test chamber for heating the containment cavity; a first detection device for detecting the temperature value inside the containment cavity; a humidification device disposed inside the test chamber for humidifying the containment cavity; a second detection device for detecting the humidity value inside the containment cavity; and a control module electrically connected to the heating device, the first detection device, the humidification device, and the second detection device; wherein, when the detection value of the first detection device exceeds a preset temperature range, the control module controls the heating device to stop operating; and / or, when the detection value of the second detection device exceeds a preset humidity range, the control module controls the humidification device to stop operating.

[0007] Furthermore, the aging device also includes: a pressure sensor disposed between at least one electrode of one electrode group and one surface of the sample; and / or disposed between at least one electrode of another electrode group and another surface of the sample, for detecting the pressure value between the electrode and the sample.

[0008] Furthermore, the two electrode groups include a first electrode group and a second electrode group arranged opposite to each other. The base includes: a base plate, on which the first electrode group is disposed; a top plate, located above the base plate, on which the second electrode group is disposed on the side of the top plate facing the base plate; and a connecting assembly, including a first screw and a first nut threadedly connected to the first screw. The first screw passes through the base plate and the top plate, and when the distance between the top plate and the base plate is adjusted to a preset distance value, the first nut locks the base plate and / or the top plate. Multiple connecting assemblies are provided, spaced apart along the length and / or width of the base plate.

[0009] Furthermore, the base plate is made of epoxy resin; and / or, the top plate is made of epoxy resin; and / or, the connecting components are made of epoxy resin.

[0010] Furthermore, the top plate has a through hole, and the electrodes of the second electrode group include interconnected through-holes and heads. The through-holes are inserted into the through hole, and the heads are used to contact the sample. The aging device also includes: copper busbars, which are disposed on the upper surface of the top plate and connected to the through-holes. There are multiple copper busbars, which are spaced apart along the length and / or width of the top plate, and adjacent copper busbars are in contact with each other. Each copper busbar is connected to the top plate by a first fastener.

[0011] Furthermore, the aging test apparatus also includes a control module, which is electrically connected to a pressure sensor. The base plate includes: a base plate body; a lifting part, which is electrically connected to the control module. The lifting part is movably mounted on the base plate body. A first electrode group is mounted on the lifting part to move synchronously with the lifting part. The pressure sensor is mounted between at least one electrode of the first electrode group and a surface of the sample. When the pressure detection value of the pressure sensor is greater than or equal to a preset pressure value, the lifting part is stopped from rising by the control module.

[0012] Furthermore, the clamping assembly includes two clamping structures arranged opposite to each other, forming a clamping space between the two clamping structures. Each clamping structure includes a first plate and a second plate arranged opposite to each other, forming a clamping cavity between the first plate and the second plate for clamping the edge of the sample. The sample and the clamping structure are connected by passing a second fastener through the first plate, the sample, and the second plate.

[0013] Furthermore, the aging test apparatus also includes a control module and a display module, with the display module electrically connected to the control module; the tensile apparatus also includes a tensile force detection device, which is disposed between the clamping structure and the edge of the specimen to detect the tensile force applied to the specimen by the tensile apparatus; wherein, the control module is electrically connected to the tensile force detection device to display the detection value of the tensile force detection device through the display module.

[0014] Furthermore, the adjustment structure includes: a second screw, which passes through the two second plates and / or the first plate; and a second nut, which is threadedly connected to the second screw; wherein, during the process of installing the sample on the tensile device, if the display module shows that the detection value of the tensile testing device reaches the preset tensile value, the second plate and / or the first plate are locked by the second nut.

[0015] By applying the technical solution of this invention, an aging device and a tensile device are installed within the chamber of the test chamber, enabling simultaneous application of thermal aging, electrical aging, and mechanical tensile aging to the sample. This achieves the ability to conduct multi-factor aging tests on samples within a single device, simplifying the test process and reducing the complexity of applying different aging conditions one by one. Furthermore, because each stress condition (thermal, electrical, and mechanical) can be independently controlled, the accuracy and consistency of the test conditions are ensured, solving the problem that existing integrated aging test devices cannot simulate the combined aging effects of cables during actual operation. Simultaneously, by setting two electrode groups within the mounting cavity of the base and ensuring good contact between the electrodes in each electrode group and the corresponding surfaces of the sample, the electrical aging stress is uniformly distributed on the sample, avoiding uneven electric field distribution, localized overheating, or arcing caused by poor electrode-sample contact. Moreover, the adjustment structure of the tensile device can precisely adjust the tensile force of the sample. Combined with the design of the electrode groups, this ensures that throughout the aging process, the sample not only undergoes uniform electrical aging but also simulates the tensile state of cables in a real environment under the influence of mechanical stress, further enhancing the reliability and effectiveness of the test results. Attached Figure Description

[0016] The accompanying drawings, which form part of this application, are used to provide a further understanding of the invention. The illustrative embodiments of the invention and their descriptions are used to explain the invention and do not constitute an undue limitation of the invention. In the drawings:

[0017] Figure 1 A three-dimensional structural schematic diagram of an embodiment of the aging test apparatus according to the present invention is shown;

[0018] Figure 2 It shows Figure 1 A three-dimensional structural diagram of the aging test apparatus in the diagram;

[0019] Figure 3 It shows Figure 1 A schematic diagram of the three-dimensional structure of the tensile device and the sample after assembly in the aging test apparatus.

[0020] Figure 4 It shows Figure 1 A three-dimensional structural diagram of the tensile device and the sample installed in the aging test apparatus.

[0021] Figure 5 It shows Figure 1 A three-dimensional structural diagram of the tensile device installed inside the aging test apparatus.

[0022] Figure 6 It shows Figure 4 The front view of the sample.

[0023] The above figures include the following reference numerals:

[0024] 10. Test chamber; 11. Receiving cavity; 12. First mounting hole; 13. Second mounting hole;

[0025] 20. High-voltage cables or copper busbars;

[0026] 30. Aging device; 31. Base; 311. Mounting cavity; 312. Base plate; 3121. Base plate body; 3122. Lifting part; 313. Top plate; 314. First screw; 315. First nut; 32. Electrode group; 321. Electrode; 3211. Through part; 3212. Head; 322. Second electrode group; 323. First electrode group; 33. Copper busbar;

[0027] 40. Tensioning device; 41. Clamping assembly; 411. Clamping structure; 4111. First plate; 4112. Second plate; 42. Adjustment structure; 421. Second screw; 422. Second nut;

[0028] 50. Sample;

[0029] 60. High-voltage insulating bushing. Detailed Implementation

[0030] It should be noted that, unless otherwise specified, the embodiments and features described in this application can be combined with each other. The present invention will now be described in detail with reference to the accompanying drawings and embodiments.

[0031] It should be noted that, unless otherwise specified, all technical and scientific terms used in this application have the same meaning as commonly understood by one of ordinary skill in the art to which this application pertains.

[0032] In this invention, unless otherwise stated, directional terms such as "up" and "down" are generally used in relation to the direction shown in the accompanying drawings, or in relation to the vertical, perpendicular, or gravitational direction; similarly, for ease of understanding and description, "left" and "right" are generally used in relation to the left and right shown in the accompanying drawings; "inner" and "outer" refer to the inner and outer contours of each component itself, but the above directional terms are not intended to limit this invention.

[0033] To address the problem that existing comprehensive aging test devices cannot simulate the combined aging effects of cables during actual operation, this application provides an aging test device.

[0034] like Figures 1 to 6As shown, the aging test apparatus includes a test chamber 10, an aging device 30, and a tensile device 40. The test chamber 10 has a receiving cavity 11, a first mounting hole 12, and a second mounting hole 13, both of which are connected to the receiving cavity 11. The first mounting hole 12 is used to pass through a high-voltage cable or copper busbar 20, and the second mounting hole 13 is used to pass through a grounding wire. The aging device 30 is disposed inside the receiving cavity 11. The aging device 30 includes a base 31 and two electrode groups 32. The base 31 has a mounting cavity 311, and an electrode group 32 is respectively disposed on the two opposing cavity walls of the mounting cavity 311. One electrode group 32 is connected to or in contact with the high-voltage cable or copper busbar 20, and the other electrode group 32 is connected to the grounding wire. Each electrode group 32 includes multiple electrodes 321 spaced apart along a preset direction. The tensile device 40 is disposed within the mounting cavity 311. The tensile device 40 includes a clamping assembly 41 and an adjusting structure 42 connected to each other. The clamping assembly 41 has a clamping space for clamping the specimen 50. At least a portion of the adjusting structure 42 is movably disposed to drive the clamping assembly 41 to stretch the clamped specimen 50. When the tensile device 40 clamps the specimen 50 and is mounted within the mounting cavity 311, one surface of the specimen 50 is in contact with at least one electrode 321 in one electrode group 32, and the other surface of the specimen 50 is in contact with at least one electrode 321 in another electrode group 32.

[0035] By applying the technical solution of this embodiment, by setting an aging device 30 and a tensile device 40 in the receiving cavity 11 of the test chamber 10, thermal aging, electrical aging, and mechanical tensile aging can be applied to the sample 50 simultaneously. This achieves the ability to conduct multi-factor aging tests on the sample in a single device, which not only simplifies the test process and reduces the complexity of applying different aging conditions one by one, but also ensures the accuracy and consistency of the test conditions because each stress condition (thermal, electrical, and mechanical) can be controlled independently. This solves the problem that existing comprehensive aging test devices cannot simulate the combined aging effect of cables during actual operation. At the same time, by setting two electrode groups 32 in the mounting cavity 311 of the base 31 and ensuring good contact between the electrode 321 in each electrode group 32 and the corresponding surface of the sample 50, the electrical aging stress can be uniformly distributed on the sample, avoiding uneven electric field distribution, local overheating, or arcing caused by poor contact between the electrode and the sample. In addition, the adjustment structure 42 of the tensile device 40 can precisely adjust the tensile force of the sample. Combined with the design of the electrode group 32, it ensures that the sample is not only subjected to uniform electrical aging during the entire aging process, but also simulates the tensile state of the cable in the real environment under the influence of mechanical stress, which further enhances the reliability and effectiveness of the test results.

[0036] In this embodiment, the aging test apparatus further includes a heating device, a first detection device, a humidification device, a second detection device, and a control module. The heating device is disposed within the test chamber 10 to heat the containing cavity 11. The first detection device is used to detect the temperature value within the containing cavity 11. The humidification device is disposed within the test chamber 10 to humidify the containing cavity 11. The second detection device is used to detect the humidity value within the containing cavity 11. The control module is electrically connected to the heating device, the first detection device, the humidification device, and the second detection device. Specifically, when the detection value of the first detection device exceeds a preset temperature range, the control module controls the heating device to stop operating; and / or, when the detection value of the second detection device exceeds a preset humidity range, the control module controls the humidification device to stop operating. In this way, through real-time monitoring by the first detection device (temperature sensor) and the second detection device (humidity sensor), and with the intelligent adjustment of the control module, the aging test device can accurately control the temperature and humidity environment inside the containment cavity 11, ensuring that it is always kept within the preset range. It can not only simulate the operating state of cables under high temperature and high humidity conditions, but also study the aging characteristics of materials under various extreme environments by setting different temperature and humidity conditions.

[0037] Specifically, the electrical connection between the control module and the heating and humidifying devices enables automated management of these environmental control devices. When the detected temperature or humidity exceeds the preset range, the control module can automatically adjust the operating status of the corresponding devices, such as turning off the heating or humidifying devices, to prevent overheating or excessive humidity, thereby ensuring the safety of the experiment. This automated control method reduces the need for manual intervention, avoids experimental deviations caused by human error, and improves the efficiency and safety of the experiment.

[0038] Optionally, the aging apparatus 30 also includes a pressure sensor, which is disposed between at least one electrode 321 of one electrode group 32 and one surface of the sample 50; and / or, disposed between at least one electrode 321 of another electrode group 32 and another surface of the sample 50, for detecting the pressure value between the electrode 321 and the sample 50. In this way, the pressure sensor can monitor the pressure value between the contact surfaces of the electrode 321 and the sample 50 in real time. This is crucial for ensuring a uniform distribution of the electric field during the electro-aging process, and appropriate pressure can ensure close contact between the electrode and the sample surface, avoiding arcing or corona discharge caused by poor local contact, thereby improving the accuracy and consistency of the electro-aging test. Furthermore, by monitoring the pressure value, the sample fixing method can be optimized to ensure that the contact pressure between the electrode and the sample remains stable during mechanical stretching, avoiding pressure changes caused by stretching from affecting the electro-aging effect. At the same time, the above configuration makes the placement of the pressure sensor more flexible to meet different usage requirements and working conditions, and also improves the processing flexibility of the operators.

[0039] like Figure 2 As shown, the two electrode groups 32 include a first electrode group and a second electrode group 322 arranged opposite to each other. The base 31 includes a base plate 312, a top plate 313, and a connecting assembly. The first electrode group is disposed on the base plate 312, and the top plate 313 is located above the base plate 312. The second electrode group 322 is disposed on the side of the top plate 313 facing the base plate 312. The connecting assembly includes a first screw 314 and a first nut 315 threadedly connected to the first screw 314. The first screw 314 passes through the base plate 312 and the top plate 313. When the distance between the top plate 313 and the base plate 312 is adjusted to a preset distance value, the first nut 315 locks the base plate 312 and / or the top plate 313. In this way, the first screw 314 and the first nut 315 of the connecting assembly not only serve as mechanical connectors to ensure a stable connection between the top plate 313 and the bottom plate 312, but also provide the ability to adjust the distance between the top plate 313 and the bottom plate 312. By adjusting the first nut 315 on the first screw 314, the distance between the top plate 313 and the bottom plate 312 can be precisely controlled, thereby ensuring that the first electrode group and the second electrode group 322 are aligned in the vertical direction and maintain constant pressure contact with the sample 50. This design makes the contact between the electrodes and the sample closer and more uniform, ensuring a more consistent distribution of electro-aging stress on the sample, and improving the reliability and repeatability of the test.

[0040] In this embodiment, the combination of the first screw 314 and the first nut 315 facilitates the installation and removal of the sample. By loosening the first nut 315, the position of the top plate 313 can be easily adjusted, facilitating the insertion and removal of the sample. Furthermore, the above design allows the testing personnel to flexibly adjust the distance between the electrode groups according to the sample thickness or the specific requirements of the aging test, enabling the aging test apparatus to adapt to samples of different sizes, thus enhancing the versatility and adaptability of the apparatus. During the test, by fine-tuning the first nut 315, the pressure of the electrode groups on the sample can be adjusted at any time to cope with possible dimensional changes or other unexpected situations, improving the flexibility and responsiveness of the test operation.

[0041] Optionally, multiple connecting components are provided, spaced apart along the length and / or width of the base plate 312. This arrangement of multiple connecting components ensures that the mechanical pressure applied by the top plate 313 to the specimen 50 is more uniform across the entire specimen surface, thereby guaranteeing that the specimen experiences consistent mechanical stress during aging and improving the authenticity and reliability of the test results.

[0042] Optionally, the base plate 312 is made of epoxy resin; and / or, the top plate 313 is made of epoxy resin; and / or, the connecting components are made of epoxy resin. Thus, using epoxy resin as the material for the base plate 312, top plate 313, and connecting components in the aging test apparatus not only significantly improves the electrical insulation performance and mechanical stability of the apparatus, but also enhances its heat resistance and chemical corrosion resistance, achieving a lightweight design, improving the safety, accuracy, and service life of the test apparatus, while also increasing the convenience and economy of operation.

[0043] In this embodiment, the base plate 312, top plate 313, and connecting components are all made of epoxy resin. On the one hand, epoxy resin is a material with excellent electrical insulation properties. Using it in the base plate 312 and top plate 313 can effectively isolate the current during the electrical aging process, preventing current leakage or short circuits, protecting the safety of test personnel, and ensuring the uniformity of the electric field distribution, thus improving the accuracy and reliability of the electrical aging test. On the other hand, epoxy resin has high mechanical strength and durability, especially in tensile and compressive strength. Using epoxy resin in connecting components, such as the first screw 314 and the first nut 315, can withstand the lateral tensile force generated during mechanical tensile aging, while ensuring a secure lock between the top plate 313 and the base plate 312, avoiding structural deformation or damage caused by mechanical stress, and ensuring the long-term stable operation of the test device. Simultaneously, epoxy resin has good heat resistance and chemical corrosion resistance, which can resist thermal stress and possible chemical erosion under high temperature and high humidity environments during aging tests, maintaining the stability and structural integrity of the material, extending the service life of the test device, and reducing maintenance costs and the risk of test interruption.

[0044] like Figure 4 As shown, the top plate 313 has a through hole. The electrodes 321 of the second electrode group 322 include interconnected through portions 3211 and heads 3212. The through portions 3211 pass through the through hole, and the heads 3212 are used to contact the sample 50. The aging device 30 also includes copper busbars 33, which are disposed on the upper surface of the top plate 313 and connected to the through portions 3211. Multiple copper busbars 33 are spaced apart along the length and / or width of the top plate 313, with adjacent copper busbars 33 in contact. Each copper busbar 33 is connected to the top plate 313 by a first fastener. Thus, by having the through portions 3211 of the electrodes 321 pass through the through hole of the top plate 313, and the heads 3212 directly contact the sample 50, a stable and uniform contact between the electrodes and the sample is ensured, thereby optimizing the distribution of electrical stress on the sample. In addition, the copper busbar 33 can effectively improve the electrical connection stability between the electrode and the external power supply, reduce contact resistance, ensure uniform current introduction during the electrical aging process, and thus improve the accuracy and consistency of the electrical aging test.

[0045] In this embodiment, the copper busbar 33 not only provides a larger conductive path area but is also securely connected to the top plate 313 via a first fastener, preventing loosening of the connection due to vibration or thermal expansion and contraction during the aging test, thus enhancing the continuity and reliability of conductivity. Simultaneously, the high conductivity and low resistance of the copper busbar 33 reduce power loss and improve the energy efficiency of the electrical aging device. The spacing of multiple copper busbars 33 also disperses the electric field, reducing the possibility of arcing or corona discharge and improving the safety of the test.

[0046] Optionally, the first fastener is a screw or bolt.

[0047] like Figure 4 As shown, the control module is electrically connected to the pressure sensor. The base plate 312 includes a base plate body 3121 and a lifting part 3122. The lifting part 3122 is electrically connected to the control module and is movably mounted on the base plate body 3121. The first electrode group is mounted on the lifting part 3122 and moves synchronously with it. The pressure sensor is positioned between at least one electrode 321 of the first electrode group and a surface of the sample 50. When the pressure detected by the pressure sensor is greater than or equal to a preset pressure value, the control module controls the lifting part 3122 to stop rising. Thus, by monitoring the pressure between the electrode and the sample contact surface in real time through the pressure sensor, when the pressure value reaches a preset threshold, a signal is immediately transmitted to the control module, triggering the lifting part 3122 to stop rising. This ensures that the pressure applied by the electrode to the sample is within a safe range, avoiding sample damage that may be caused by excessive pressure. It also ensures the uniformity of electrical stress distribution during the electrical aging process, improving the reliability and consistency of the test data.

[0048] In this embodiment, the preset pressure value, combined with an automated control mechanism, effectively adds an intelligent protection layer to the testing device. Once an abnormal pressure is detected, the system responds immediately, effectively preventing pressure runaway caused by improper operation or mechanical failure, ensuring the long-term stable operation of the testing equipment, and reducing maintenance needs and potential test interruption risks.

[0049] Optionally, the electrode 321 of the first electrode group 323 has a block structure with chamfered edges, the chamfered edges being 2.0mm to 3.0mm in size; and / or, the head 3212 of the electrode 321 of the second electrode group 322 is disc-shaped. In this way, the chamfered structure and disc-shaped head can reduce the electric field intensity at the electrode edges and tips, reducing electric field concentration and thus avoiding partial discharge or corona discharge. Therefore, the chamfered structure of the electrode 321 and the disc-shaped design of the head 3212 can effectively improve the electric field distribution around the electrode, making it more uniform and ensuring the stability and accuracy of the electro-aging test results.

[0050] In this embodiment, the electrode 321 of the first electrode group 323 has a block structure, and the corners of the block structure are provided with chamfered structures with a size of 2.5mm. In this way, the chamfered structure of the electrode 321 reduces the risk of electrode damage due to local overheating or discharge by reducing the tip effect, thereby extending the service life of the electrode, reducing the frequency of electrode replacement during the test, and reducing maintenance costs and the risk of test interruption.

[0051] In this embodiment, the head 3212 of the electrode 321 in the second electrode group is disc-shaped. This disc-shaped design of the electrode head increases the surface area in contact with the sample, ensuring stable contact between the electrode and the sample, reducing contact resistance, improving the efficiency of electrical energy transfer, and thus enhancing the effectiveness and reliability of the electrical aging test data.

[0052] like Figures 3 to 5 As shown, the clamping assembly 41 includes two opposing clamping structures 411, forming a clamping space between them. Each clamping structure 411 includes a first plate 4111 and a second plate 4112, both opposing each other, forming a clamping cavity between them for clamping the edge of the sample 50. The sample 50 and the clamping structure 411 are connected by a second fastener passing through the first plate 4111, the sample 50, and the second plate 4112. Thus, the opposing clamping structures 411 of the clamping assembly 41 can precisely clamp the edge of the sample 50, ensuring accurate alignment of the sample during multi-stress aging tests. The clamping cavity formed between the first plate 4111 and the second plate 4112 provides a stable and controlled environment, allowing the sample 50 to maintain a stable state under the combined action of lateral tensile force, electric field, and thermal stress, avoiding sample displacement or deformation caused by insecure fixing, which would affect the accuracy of the test results. Meanwhile, by using a second fastener (such as a bolt or pin) to pass through the first plate 4111, the sample 50, and the second plate 4112, the clamping force can be adjusted to accommodate samples 50 of different sizes and thicknesses. This not only ensures the firm clamping of the sample edges but also avoids damage to the sample surface due to excessive clamping force or instability of the sample due to insufficient force, thereby improving the versatility and operational flexibility of the testing device.

[0053] Optionally, the aging test apparatus also includes a control module and a display module, with the display module electrically connected to the control module. The tensile device 40 also includes a tensile force detection device, which is positioned between the clamping structure 411 and the edge of the sample 50 to detect the tensile force applied to the sample 50 by the tensile device 40. The control module is electrically connected to the tensile force detection device to display the detection value via the display module. Thus, the tensile force detection device, positioned between the two clamping structures 411 of the clamping assembly 41 and close to the edge of the sample 50, can directly measure the lateral tensile force applied to the sample 50, providing real-time and accurate tensile force data. This precise tensile force detection capability is crucial for studying the aging behavior of XLPE insulation materials under different mechanical stresses. Simultaneously, the control module communicates with the tensile force detection device in real time via electrical connection, automatically adjusting the tensile force output of the tensile device 40 based on the detection value fed back by the tensile force detection device to achieve a preset or real-time required tensile force level. This dynamic adjustment mechanism allows for continuous monitoring and fine-tuning of the mechanical stress borne by the sample during the test, ensuring the consistency of test conditions and the reliability of data. Furthermore, the display module is electrically connected to the control module, enabling real-time display of the tensile testing device's readings. This feature greatly improves the transparency of the test, allowing operators to immediately understand the tensile stress state experienced by the specimen 50.

[0054] like Figure 5 As shown, the adjustment structure 42 includes a second screw 421 and a second nut 422. The second screw 421 passes through two second plates 4112 and / or a first plate 4111. The second nut 422 is threadedly connected to the second screw 421. During the installation of the sample 50 on the tensile device 40, if the display module shows that the detection value of the tensile testing device reaches a preset tensile value, the second plate 4112 and / or the first plate 4111 are locked by the second nut 422. Thus, during the installation and tensile testing of the sample 50, the display module displays the detection value of the tensile testing device in real time. When the detection value reaches the preset tensile value, the operator rotates the second nut 422 to lock the second screw 421, thereby fixing the positions of the first plate 4111 and the second plate 4112. This ensures that the mechanical stress borne by the sample 50 remains constant in subsequent tests, unaffected by external factors or material elasticity, thus improving the accuracy and reliability of the test data. Meanwhile, the locking operation of the second nut 422 is simple and quick. Once the preset tension value is detected, the operator can respond quickly and fix the first plate 4111 and the second plate 4112 by locking the second nut 422. This avoids the errors that may occur during manual adjustment, and also saves the time for test preparation and adjustment, thus improving test efficiency.

[0055] Optionally, there is one tensioning device 40; or there are multiple tensioning devices 40, with each of the multiple tensioning devices 40 corresponding to one of the multiple electrodes 321 of the first electrode group 323.

[0056] like Figure 6 As shown, in use, first loosen the first nut to remove the top plate, take out the internal tensioning device, loosen the second nuts on both sides of the tensioning device, put the perforated XLPE insulation sheet into the tensioning device, and tighten the first screw so that the sample can be stably clamped on the clamping assembly. Then, fix the second nut located on the left side of the tensioning device so that one end of the first screw can remain stable. Use a wrench to adjust the second nut on the right side. Due to the restriction of the upper first screw and the second nut on the left, the sample will lengthen as the applied tension increases during the adjustment of the second nut on the right side. A tension sensor is installed at the top of the tensioning device. The tension sensor is used to quantitatively analyze the mechanical tension applied to the XLPE insulation material. When the specified mechanical tension is reached, tighten the second nut on the right side so that the XLPE insulation material is fixed at the target tensile length.

[0057] After setting the horizontal mechanical stress, install the tensile device on the base plate of the aging device. Adjust the position so that the sample can be aligned with the electrodes on the base plate as much as possible and completely cover the electrode area of ​​the base plate. After installation, install the top plate with the second electrode group. Adjust the first nut to adjust the height of the top plate and the vertical pressure applied to the sample by the electrodes of the second electrode group. By installing a pressure sensor on the top plate, the pressure applied to the sample by the electrodes of the second electrode group can be measured. Tighten the first nut to fix the top plate. Connect the upper and lower contacts to the power supply to apply electrical aging stress to the aging device. Place the entire device in the test chamber to apply thermal aging stress. The safe voltage and safe temperature of the entire device are outside the test voltage and temperature range, so the accuracy and safety of the test process can be guaranteed.

[0058] In this embodiment, the steps for using the aging test apparatus are as follows:

[0059] Step 1: Plane the XLPE sample to a regular size of 50mm×50mm×1mm using a planer. Use a drilling machine to drill 4 to 5 holes on both sides of the sample. The hole diameter is 5mm and the interval between adjacent holes is 5mm.

[0060] Step 2: Pass a small pin through the pre-drilled hole on the sample and tighten it with the tensile device 40 to fix the sample to the clamping assembly 41. Tighten one end of the sample so that it does not move with external tension. Tighten the other end of the sample and adjust the second nut 422 to move it outward to apply tension to the sample. Record the tension value using the tension sensor. After the target tension is reached, stop adjusting the second nut to keep the sample in the target position. Tighten the second nut to keep the tension constant.

[0061] Step 3: Place the adjusted tensile device 40 on the base plate 312 of the aging device 30, and adjust the position of the tensile device 40 so that the lower surface of the XLPE insulation sample it carries is in close contact with the electrodes of the first electrode group 323 of the aging device 30 in an appropriate manner.

[0062] Step 4: Place the second electrode group of the aging device 30 on the upper surface of the XLPE insulating sample and adjust it to a suitable position. Install the top plate of the aging device 30, fix the position of the top plate with the first screw, and limit the target position of the top plate with the first nut.

[0063] Step 5: Place the assembled aging device and tensile device into the test chamber. Introduce the copper busbar as the high-voltage inlet electrode through the high-voltage insulating sleeve 60 on the upper side of the test chamber. Connect the high voltage of the external transformer terminal to the copper busbar at the top of the aging device through the wire to apply high voltage. The second mounting hole is used to connect to the copper busbar at the bottom of the aging device to ground the device.

[0064] Step 6: Start the external transformer and set the AC voltage.

[0065] Step 7: Start the aging test device, set the temperature and humidity parameters, and start the multi-stress coupling aging test.

[0066] Specifically, the cut material is first placed into the tensile device 40. Holes are pre-drilled on the XLPE insulation sample using a punching machine. The number of holes is set according to the size of the sample, generally 4 to 5 is appropriate. The sample is then clamped by the clamping structure of the tensile device. After installation, the second screw is installed. The clamping structure is then stretched laterally using a tensile testing machine. The first screw ensures that the tensile testing machine moves horizontally. Once the target tensile force value is reached, the tensile force value is recorded. The second nuts on both sides of the second screw are then tightened to fix the stretched sample, thereby fixing the sample and maintaining a constant tensile force.

[0067] After setting the mechanical tension, the tightened tension devices 40 are placed into the aging device 30 to ensure good contact between the electrodes of the first electrode group and the lower surface of the sample. The height of the top plate can be adjusted by adjusting the first nut on the first screw to ensure tight contact between the second electrode group and the upper surface of the sample. Then, high-voltage cables or copper busbars are inserted into the high-voltage insulating sleeve, and the terminals on the top plate of the aging device and the copper busbars are connected using AGG high-voltage insulating wires. Similarly, the terminals on the bottom plate are connected to the external grounding wire using AGG high-voltage insulating wires, and then led out from the side grounding wire hole of the aging device, connecting to the outside through the second mounting hole of the test chamber. Through this setup, the aging device inside the test chamber can be connected to the external high-voltage transformer.

[0068] After completing the installation of the aging device, place the aging device containing the tensile device and the sample into the receiving cavity 11 of the test chamber, ensuring that the aging device does not directly contact the inner wall of the receiving cavity 11. Close the chamber door, set a suitable test temperature and humidity, and set a suitable AC voltage for the external transformer to perform multi-factor coupled aging test operations.

[0069] As can be seen from the above description, the embodiments of the present invention achieve the following technical effects:

[0070] By incorporating an aging device and a tensile device within the test chamber, thermal aging, electrical aging, and mechanical tensile aging can be applied to the sample simultaneously. This enables multi-factor aging tests on samples within a single device, simplifying the testing process and reducing the complexity of applying different aging conditions individually. Furthermore, because each stress condition (thermal, electrical, and mechanical) can be independently controlled, the accuracy and consistency of the test conditions are ensured, resolving the problem that existing integrated aging test devices cannot simulate the combined aging effects of cables during actual operation. Simultaneously, by placing two electrode groups within the mounting cavity of the base and ensuring good contact between the electrodes in each group and the corresponding surfaces of the sample, the electrical aging stress is uniformly distributed on the sample, avoiding uneven electric field distribution, localized overheating, or arcing caused by poor electrode-sample contact. Moreover, the adjustment structure of the tensile device allows for precise adjustment of the tensile force on the sample. Combined with the electrode group design, this ensures that throughout the aging process, the sample not only undergoes uniform electrical aging but also simulates the tensile state of cables in a real environment under mechanical stress, further enhancing the reliability and validity of the test results.

[0071] Obviously, the embodiments described above are merely some, not all, embodiments of the present invention. All other embodiments obtained by those skilled in the art based on the embodiments of the present invention without inventive effort should fall within the scope of protection of the present invention.

[0072] It should be noted that the terminology used herein is for the purpose of describing particular embodiments only and is not intended to limit the exemplary embodiments according to this application. As used herein, the singular form is intended to include the plural form as well, unless the context clearly indicates otherwise. Furthermore, it should be understood that when the terms "comprising" and / or "including" are used in this specification, they indicate the presence of features, steps, operations, devices, components, and / or combinations thereof.

[0073] It should be noted that the terms "first," "second," etc., used in the specification, claims, and accompanying drawings of this application are used to distinguish similar objects and are not necessarily used to describe a specific order or sequence. It should be understood that such data can be interchanged where appropriate so that the embodiments of this application described herein can be implemented in sequences other than those illustrated or described herein.

[0074] The above description is merely a preferred embodiment of the present invention and is not intended to limit the invention. Various modifications and variations can be made to the present invention by those skilled in the art. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the present invention should be included within the scope of protection of the present invention.

Claims

1. An aging test apparatus, characterized in that, include: The test chamber (10) has a receiving cavity (11), a first mounting hole (12) and a second mounting hole (13), both of which are connected to the receiving cavity (11); the first mounting hole (12) is used to pass through a high-voltage cable or a copper busbar (20), and the second mounting hole (13) is used to pass through a grounding wire; An aging device (30) is disposed within the receiving cavity (11). The aging device (30) includes a base (31) and two electrode groups (32). The base (31) has a mounting cavity (311). Each of the two opposing cavity walls of the mounting cavity (311) is provided with an electrode group (32). One electrode group (32) is connected to or in contact with the high-voltage cable or copper busbar (20), and the other electrode group (32) is connected to the grounding wire. Each electrode group (32) includes a plurality of electrodes (321) spaced apart along a preset direction. A tensile device (40) is disposed in the mounting cavity (311). The tensile device (40) includes a clamping assembly (41) and an adjusting structure (42) connected to each other. The clamping assembly (41) has a clamping space for clamping a specimen (50). At least a portion of the adjusting structure (42) is movably disposed to drive the clamping assembly (41) to stretch the clamped specimen (50). When the tensile device (40) clamps the sample (50) and installs it in the mounting cavity (311), one surface of the sample (50) is in contact with at least one electrode (321) in one of the electrode groups (32), and the other surface of the sample (50) is in contact with at least one electrode (321) in another of the electrode groups (32).

2. The aging test apparatus according to claim 1, characterized in that, The aging test apparatus also includes: A heating device is provided inside the test chamber (10) for heating the receiving cavity (11); The first detection device is used to detect the temperature value inside the receiving cavity (11); A humidification device is provided inside the test chamber (10) for humidifying the containment cavity (11); The second detection device is used to detect the humidity value inside the accommodating cavity (11); The control module is electrically connected to the heating device, the first detection device, the humidification device, and the second detection device. Specifically, when the detection value of the first detection device exceeds the preset temperature range, the heating device is controlled to stop operating by the control module; and / or, when the detection value of the second detection device exceeds the preset humidity range, the humidification device is controlled to stop operating by the control module.

3. The aging test apparatus according to claim 1, characterized in that, The aging device (30) also includes: A pressure sensor is disposed between at least one electrode (321) of one electrode assembly (32) and one surface of the sample (50); and / or, disposed between at least one electrode (321) of another electrode assembly (32) and another surface of the sample (50), for detecting the pressure value between the electrode (321) and the sample (50).

4. The aging test apparatus according to claim 3, characterized in that, The two electrode groups (32) include a first electrode group (323) and a second electrode group (322) disposed opposite to each other, and the seat (31) includes: A base plate (312) is provided on which the first electrode group (323) is disposed; A top plate (313) is located above the bottom plate (312), and the second electrode group (322) is disposed on the side of the top plate (313) facing the bottom plate (312); The connecting assembly includes a first screw (314) and a first nut (315) threadedly connected to the first screw (314). The first screw (314) passes through the base plate (312) and the top plate (313). When the distance between the top plate (313) and the base plate (312) is adjusted to a preset distance value, the first nut (315) is used to lock the base plate (312) and / or the top plate (313). The connecting components are multiple, and the multiple connecting components are spaced apart along the length direction and / or width direction of the base plate (312).

5. The aging test apparatus according to claim 4, characterized in that, The base plate (312) is made of epoxy resin; and / or, The top plate (313) is made of epoxy resin; and / or, The connecting components are made of epoxy resin.

6. The aging test apparatus according to claim 4, characterized in that, The top plate (313) has a through hole, and the electrodes (321) of the second electrode group (322) include interconnected through portions (3211) and heads (3212). The through portions (3211) pass through the through hole, and the heads (3212) are used to contact the sample (50). The aging device (30) further includes: A copper busbar (33) is disposed on the upper surface of the top plate (313), and the copper busbar (33) is connected to the through part (3211); There are multiple copper busbars (33), which are spaced apart along the length and / or width of the top plate (313), and two adjacent copper busbars (33) are in contact with each other; each copper busbar (33) is connected to the top plate (313) by a first fastener.

7. The aging test apparatus according to claim 5, characterized in that, The aging test apparatus further includes a control module, which is electrically connected to the pressure sensor. The base plate (312) includes: Base plate body(3121); The lifting part (3122) is electrically connected to the control module. The lifting part (3122) is movably mounted on the base plate body (3121). The first electrode group (323) is mounted on the lifting part (3122) to move up and down synchronously with the lifting part (3122). The pressure sensor is disposed between at least one electrode (321) of the first electrode group (323) and a surface of the sample (50). When the pressure detection value of the pressure sensor is greater than or equal to a preset pressure value, the lifting part (3122) is controlled by the control module to stop rising.

8. The aging test apparatus according to claim 1, characterized in that, The clamping assembly (41) includes two opposing clamping structures (411), with the clamping space formed between the two clamping structures (411). Each clamping structure (411) includes: The first plate (4111) and the second plate (4112) are arranged opposite to each other, and a clamping cavity is formed between the first plate (4111) and the second plate (4112) for clamping the edge of the sample (50); The sample (50) and the clamping structure (411) are connected by passing a second fastener through the first plate (4111), the sample (50) and the second plate (4112).

9. The aging test apparatus according to claim 8, characterized in that, The aging test apparatus further includes a control module and a display module, the display module being electrically connected to the control module; the tensile device (40) further includes: A tensile testing device is disposed between the clamping structure (411) and the edge of the specimen (50) for detecting the tensile force applied to the specimen (50) by the tensile device (40); The control module is electrically connected to the tensile testing device to display the test value of the tensile testing device through the display module.

10. The aging test apparatus according to claim 9, characterized in that, The adjustment structure (42) includes: The second screw (421) is threaded through the two second plates (4112) and / or the first plate (4111); The second nut (422) is threadedly connected to the second screw (421); During the process of installing the sample (50) on the tensile device (40), if the display module shows that the detection value of the tensile testing device reaches the preset tensile value, the second plate (4112) and / or the first plate (4111) are locked by the second nut (422).

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