Crimping jig for testing and detection device

Abstract

The embodiment of the invention discloses a crimping jig for testing and a detection device, the crimping jig for testing comprises a pressing assembly and a testing assembly, and the testing assembly comprises a first testing assembly and a second testing assembly; the first test assembly comprises a first probe group and a first conductive block; the second test assembly comprises a second probe group; at the first stage position, the first end of the first conductive block is spaced from the first contact end of the first probe group, and the second end of the first conductive block and the first contact end of the second probe group are respectively propped against two opposite sides of the first test part and are electrically matched with each other, so that a first functional test is carried out on the to-be-tested product; and at the second stage position, the first end of the first conductive block is abutted against and electrically matched with the first contact end of the first probe group so as to perform a second functional test on the to-be-tested product. According to the invention, two kinds of heterogeneous tests can be continuously completed without frequently replacing a jig, the test complexity is reduced, the two tests are ensured not to interfere with each other, and the overall test efficiency is greatly improved.

Description

Technical Field

[0001] This invention relates to the field of electronic component testing technology. More specifically, it relates to a crimping fixture and testing device for testing. Background Technology

[0002] In the field of Flex product testing, ICT (In-Circuit Test) and RF (Radio Frequency) testing are two core aspects of ensuring product quality, but there are significant differences between the two.

[0003] From a testing principle perspective, ICT testing is based on the conduction characteristics of DC or low-frequency signals, judging whether electrical connections are normal by detecting parameters such as resistance and capacitance in the circuit; while RF testing relies on the radiation and transmission characteristics of high-frequency electromagnetic signals, evaluating radio frequency performance based on parameters such as the frequency and power of electromagnetic waves. In terms of the conduction path, the conduction path in ICT testing is a clearly defined circuit loop, with signals transmitted directly through conductive components; the conduction path in RF testing not only includes circuit connections but also involves the spatial propagation of electromagnetic signals, requiring conductive structures to simultaneously undertake signal conduction and radiation functions.

[0004] In terms of testing objectives, ICT testing aims to verify the basic electrical performance of the circuit and ensure that there are no soldering defects, short circuits, or other faults; RF testing focuses on wireless communication functions to ensure that the RF module can transmit and receive signals normally according to standards.

[0005] Therefore, ICT testing and RF testing are two functional tests that differ fundamentally in their testing principles, conduction paths, and testing objectives. However, currently, the industry lacks integrated fixtures capable of simultaneously performing both testing functions, necessitating the replacement of different equipment during the testing process, which increases operational steps and reduces testing efficiency. Summary of the Invention

[0006] One of the technical problems to be solved by the present invention is to provide a crimping fixture for testing that can handle two different types of functional tests that have essential differences in testing principles, conduction paths and testing objectives.

[0007] Another technical problem to be solved by the present invention is to provide a testing device including the crimping fixture for testing as described above.

[0008] To solve the aforementioned technical problem, the present invention adopts the following technical solution:

[0009] A crimping fixture for testing a product under test, the product under test including a first testing section, and the crimping fixture including:

[0010] The pressing assembly includes two pressing modules, which are arranged adjacent to each other on both sides of the product to be tested along a first direction.

[0011] The test components include a first test component and a second test component;

[0012] The first test component includes a first probe group disposed on the first pressing module of the two pressing modules, and a first conductive block housed in the inner cavity of the first pressing module and movable along a first direction;

[0013] The second test component includes a second probe group disposed on the second press module of the two press modules;

[0014] The first contact end of the first probe group is located in the inner cavity of the first pressing module; the first end of the first conductive block is located in the inner cavity and is spaced apart from the first contact end of the first probe group; the second end of the first conductive block extends to the outside of the first pressing module near the second pressing module.

[0015] The two pressing modules have a first stage position where they are close to each other, and a second stage position where they continue to be close to each other after the first stage.

[0016] In the first stage position, the first end of the first conductive block is spaced apart from the first contact end of the first probe group, the second end of the first conductive block and the first contact end of the second probe group are respectively abutted on opposite sides of the first test part and electrically connected, and the second probe group, the first test part and the conductive block form a first test path for performing the first functional test on the product under test.

[0017] In the second stage, the first end of the first conductive block and the first contact end of the first probe group are electrically connected. The first probe group, the conductive block, the second probe group, and the first test section form a second test path for performing a second functional test on the product under test.

[0018] Furthermore, a preferred embodiment is that the first functional test and the second functional test are heterogeneous functional tests.

[0019] Furthermore, in a preferred embodiment, the same pressing module includes multiple first test components or multiple second test components; at least one of the multiple first test components on one pressing module and at least one of the multiple second test components on another pressing module are in corresponding mating positions relative to the same test part of the product under test.

[0020] Furthermore, a preferred embodiment is that the same pressing module includes a first test component and a second test component; the two pressing modules include at least a set of first test components and second test components in corresponding mating positions relative to the same test part of the product under test.

[0021] Furthermore, in a preferred embodiment, the test component further includes a signal conduction component, the signal conduction component comprising,

[0022] The first adapter is used to electrically connect the second probe group to the first electronic interface located on any one of the pressing modules;

[0023] The second adapter is used to electrically connect the first probe group to the second electronic interface located on any of the pressing modules.

[0024] Furthermore, a preferred embodiment is that the first pressing module and the second pressing module move closer to or further away from each other synchronously or asynchronously.

[0025] Furthermore, in a preferred embodiment, the pressing module includes an adapter plate and a core component, the core component being detachably connected to the adapter plate;

[0026] The adapter plate includes a first adapter plate for detachable installation of the first probe group, and the core includes a first core for detachable installation of the first conductive block. The first conductive block is movably installed in the first core, and an elastic element with the force direction along the first direction is provided between the first conductive block and the first adapter plate.

[0027] The adapter plate also includes a second core component for detachable installation of the second probe group, and a second adapter plate detachably installed with the second core component.

[0028] Furthermore, in a preferred embodiment, the two pressing modules each include a module housing; the first pressing module is housed within the first module housing, and the second pressing module is housed within the second module housing; the first pressing module is reciprocating relative to the first module housing along a first direction within the first module housing.

[0029] The second pressing module can reciprocate relative to the second module housing in a first direction within the second module housing; the first electronic interface and / or the second electronic interface are exposed on the side of the first module housing away from the second module housing; the first electronic interface and / or the second electronic interface are exposed on the side of the second module housing away from the first module housing.

[0030] Furthermore, in a preferred embodiment, the first pressing module is provided with a first pressing part extending in a direction away from the second pressing module, the first pressing part passing through and being exposed outside the outer shell of the first module;

[0031] The second pressing module is provided with a second pressing part extending in a direction away from the first pressing module, and the second pressing part passes through and is exposed outside the housing of the second module.

[0032] To solve the aforementioned technical problem, the present invention adopts the following technical solution:

[0033] A testing device includes a crimping fixture for testing as described above.

[0034] The beneficial effects of this invention are as follows:

[0035] This invention first provides a crimping fixture for testing. When the two pressing modules are in the first stage position, the first end of the first conductive block is spaced apart from the first contact end of the first probe group. The second end of the first conductive block and the first contact end of the second probe group respectively abut against the opposite sides of the first test section and are electrically engaged. A first test path is constructed between the second probe group, the first test section, and the conductive block, enabling the completion of the first functional test of the product under test. When the two pressing modules are in the second stage position after the first stage position, the first end of the first conductive block abuts against the first contact end of the first probe group and is electrically engaged. A second test path is constructed between the first probe group, the conductive block, the second probe group, and the first test section, enabling the execution of the second functional test. The conductive block has a dual function: it can be used as an antenna for transmitting and receiving radio frequency signals in one functional test to achieve accurate detection of the radio frequency performance of the product under test; or it can be used as a conductor to achieve electrical connection of the circuit in another functional test to meet the conduction requirements of electrical performance testing. The crimping fixture for testing provided by this invention is particularly suitable for scenarios where two functional tests are fundamentally different. That is, when the test principles, conduction paths, and test objectives are completely different, two types of heterogeneous tests can be completed continuously without frequent fixture changes. This design not only reduces testing complexity but also ensures that the two tests do not interfere with each other, significantly improving overall testing efficiency.

[0036] Furthermore, this crimping fixture can be used in conjunction with a common adapter module, allowing for flexible integration with various automated equipment and supporting testing of different functions from both sides of the product under test. By adapting to the specific testing requirements of the product under test, double-sided crimping testing can be achieved, further expanding the applicable scenarios and automated testing capabilities of this crimping fixture.

[0037] The present invention also provides a testing device, which has technical advantages over the prior art, including the technical advantages of the testing crimping fixture as described above compared to the prior art. Attached Figure Description

[0038] The specific embodiments of the present invention will be described in further detail below with reference to the accompanying drawings.

[0039] Figure 1 This is a schematic diagram of the test crimping fixture provided in some embodiments.

[0040] Figure 2 This is a bottom view of the structure of the test crimping fixture provided in some embodiments.

[0041] Figure 3 This is a schematic diagram of the open state of the test crimping fixture structure provided in some embodiments.

[0042] Figure 4 This is a schematic diagram of the upper half of the test crimping fixture provided in some embodiments, according to the pattern shown in the figure.

[0043] Figure 5 for Figure 4 Assembly diagram of the structure shown.

[0044] Figure 6 This is a schematic diagram of the first test component and the first core assembly structure provided in some embodiments.

[0045] Figure 7 This is an assembly diagram of the first test component and the first core component provided in some embodiments.

[0046] Figure 8 This is a schematic diagram of the lower half of the test crimping fixture provided in some embodiments, according to the pattern shown in the figure.

[0047] Figure 9 for Figure 8 Assembly diagram of the structure shown.

[0048] Figure 10 This is a schematic diagram of the initial state structure of the test crimping device provided in some embodiments.

[0049] Figure 11 This is a schematic diagram of the first functional test state structure of the test crimping device provided in some embodiments.

[0050] Figure 12 This is a schematic diagram of the second functional test state structure of the test clamp provided in some embodiments.

[0051] Figure label:

[0052] 100. Pressing assembly; 101. Elastic element; 102. Bearing cavity;

[0053] 110. First pressing module; 1101. First adapter plate; 1102. First core component; 1103. First pressing part; 111. First module outer shell; 1111. First housing; 1112. First cover;

[0054] 120. Second pressing module; 1201. Second adapter plate; 1202. Second core component; 1203. Second pressing part; 121. Second module outer shell; 1211. Second housing; 1212. Second cover;

[0055] 130. Lock key assembly; 1301. Lock key; 1302. Card slot;

[0056] 200, Test component; 210, First test component; 2101, First probe group; 2102, First conductive block; 220, Second test component; 2201, Second probe group; 230, First electronic interface; 240, Second electronic interface; Detailed Implementation

[0057] To make the above-mentioned objectives, features, and advantages of this application more apparent and understandable, the specific embodiments of this application are described in detail below with reference to the accompanying drawings. Many specific details are set forth in the following description to provide a thorough understanding of this application. However, this application can be implemented in many other ways different from those described herein, and those skilled in the art can make similar modifications without departing from the spirit of this application. Therefore, this application is not limited to the specific embodiments disclosed below.

[0058] In the description of this application, it should be understood that if terms such as "center", "longitudinal", "lateral", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", "axial", "radial", "circumferential" appear, these terms indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings, and are only for the convenience of describing this application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of this application.

[0059] Furthermore, where the terms "first" and "second" appear, these terms are for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Thus, a feature defined with "first" or "second" may explicitly or implicitly include at least one of that feature. In the description of this application, where the term "multiple" appears, "multiple" means at least two, such as two, three, etc., unless otherwise explicitly specified.

[0060] In this application, unless otherwise expressly specified and limited, the terms "installation," "connection," "joining," and "fixing," etc., should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral part; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication of two components or the interaction between two components, unless otherwise expressly limited. Those skilled in the art can understand the specific meaning of the above terms in this application based on the specific circumstances.

[0061] In this application, unless otherwise expressly specified and limited, the use of descriptions such as "above" or "below" the second feature indicates that the first and second features are in direct contact or indirect contact via an intermediate medium. Furthermore, "above," "on top of," and "over" the second feature can mean that the first feature is directly above or diagonally above the second feature, or simply that the first feature is at a higher horizontal level than the second feature. Similarly, "below," "below," and "under" the second feature can mean that the first feature is directly below or diagonally below the second feature, or simply that the first feature is at a lower horizontal level than the second feature.

[0062] It should be noted that if an element is referred to as being "fixed to" or "set on" another element, it can be directly on the other element or there may be an intervening element. If an element is considered to be "connected to" another element, it can be directly connected to the other element or there may be an intervening element. If so, the terms "vertical," "horizontal," "upper," "lower," "left," "right," and similar expressions used in this application are for illustrative purposes only and do not represent the only possible implementation.

[0063] The technical solutions provided by the embodiments of this application are described below with reference to the accompanying drawings.

[0064] According to one aspect of the invention, see [reference] Figures 1 to 9 As shown, this application provides a crimping fixture for testing, which includes a pressing component 100 and a testing component 200. The fixture is configured to perform crimping tests on the product under test (DUT). The DUT includes at least one first testing section, which is a structure that enables signal interaction between the DUT and the crimping fixture. In this embodiment, the DUT that can be tested using this crimping fixture includes, but is not limited to, chip modules and liquid crystal display modules. In other feasible embodiments, the scope of the DUT can be further extended to circuit boards (including but not limited to single-layer circuit boards, double-layer circuit boards, multi-layer circuit boards, etc.) and core functional modules of digital products. This application does not limit the specific type of the DUT; as long as it possesses structural features and testing requirements compatible with the crimping fixture of this application, it falls within the protection scope of this application.

[0065] See Figure 5 , Figure 9The pressing assembly 100 includes two pressing modules, which are arranged adjacent to each other on both sides of the product under test along a first direction. In this embodiment, taking the pattern shown in the figure as an example, the two pressing modules include a first pressing module 110 and a second pressing module 120. During the test, the first pressing module 110 is positioned in the upper region of the product under test, and the second pressing module 120 is positioned in the lower region of the product under test. As will be understood in the art, the product under test should be positioned between the two pressing modules, so that the two pressing modules can move relatively closer to or further away from the module under test.

[0066] See Figure 5 , Figures 10 to 12 The test component 200 includes a first test component 210 and a second test component 220. The two test components 200 are respectively disposed on the first pressing module 110 and the second pressing module 120. The test component 200 is used to electrically connect with the first test part of the product under test, so that the product under test and the test interface on the pressing fixture can be electrically connected, constructing a complete signal transmission path and realizing the introduction or extraction of test signals of the product under test.

[0067] In the field of product testing, conventional testing methods for functional testing of products under test (DUTs) all have significant functional limitations. For example, in a typical testing approach, the test system is configured with two independent test components 200. These two test components 200 are configured to abut against the two sides of the first test section of the DUT, establishing a stable electrical connection to fulfill the basic functional testing requirements. The drawback of this testing approach is that the two test components 200 typically only contain probe assemblies. Conductivity is achieved through physical contact between the probes and the test section, limiting testing to basic electrical performance parameters of the DUT (such as resistance, capacitance, etc., to determine if the electrical connection is normal). Due to the structural characteristics of the probe assemblies, they can only provide simple electrical conduction and cannot meet the specific requirements of complex functional tests for signal transmission characteristics. Therefore, this testing approach cannot effectively cover functional tests requiring specific transmission environments (such as signal integrity, impedance matching, and shielding effectiveness in RF functional testing).

[0068] In another conventional testing method, a probe assembly is used to perform double-sided crimping and conduction on the test section of the product under test. This method utilizes probe assemblies with varying numbers of pins to form contact with corresponding contacts on the test section of the product under test, accommodating different numbers of test points and thus enabling the testing of the electrical performance of the product under test. This testing method shares a fundamental deficiency with the first method mentioned above: its core probe assembly can only achieve basic electrical connection functions. For functional tests beyond the scope of basic electrical testing (such as radio frequency functional testing), due to the fundamental differences in testing principles and technical approaches, this testing method also cannot perform effective testing.

[0069] It can be seen that the existing test fixtures, due to the functional limitations of their core test component 200 (probe component), can only cover basic electrical performance test scenarios, and cannot simultaneously cope with two or more different types of functional tests that have fundamental differences in test principles (such as electrical conduction and electromagnetic wave transmission), conduction paths (such as physical contact and non-contact coupling), and test objectives (such as basic parameter verification and high-frequency function verification). Therefore, it is difficult to meet the actual needs of multi-dimensional and full-function testing of the product under test at the same time.

[0070] See Figures 10 to 12 To address two different types of functional tests with fundamentally different testing objectives, this invention provides a test assembly 200, in which a first test assembly 210 includes a first probe group 2101 disposed on the first pressing module 110 of the two pressing modules, and a first conductive block 2102 housed within the cavity of the first pressing module 110 and movable along a first direction. A second test assembly 220 includes a second probe group 2201 disposed on the second pressing module 120 of the two pressing modules.

[0071] Specifically, the first contact end of the first probe group 2101 is located in the inner cavity of the first pressing module 110; the first end of the first conductive block 2102 is located in the inner cavity and is spaced apart from the first contact end of the first probe group 2101; the second end of the first conductive block 2102 extends to the outside of the first pressing module 110 near the second pressing module 120, that is, the first probe group 2101 is located on the side of the conductive block away from the second probe group 2201.

[0072] In this embodiment, see Figures 10 to 12 The two pressing modules are positioned in a first stage where they are close to each other, and a second stage where they continue to be close to each other after the first stage. In the first stage, the first end of the first conductive block 2102 is spaced apart from the first contact end of the first probe group 2101. The second end of the first conductive block 2102 and the first contact end of the second probe group 2201 are respectively abutted against the opposite sides of the first test part and electrically engaged. The second probe group 2201, the first test part and the conductive block form a first test path for performing the first functional test on the product under test.

[0073] In the second stage, the first end of the first conductive block 2102 and the first contact end of the first probe group 2101 are electrically connected. The first probe group 2101, the conductive block, the second probe group 2201 and the first test section form a second test path for performing a second functional test on the product under test, which is a different type of functional test from the first functional test.

[0074] The heterogeneous functional tests described in this embodiment refer to functional tests of different types. Specifically, the first functional test and the second functional test are two different functional tests with fundamental differences in test principle, conduction path, and test objective. For example, the first functional test is an "indirect collaborative functional test for the first test section of the product under test," such as signal transmission integrity, dynamic response, and feedback testing. In this case, the first conductive block 2102 only needs to be in electrical contact with the test section, and the second probe group 2201 conducts conductively and collaboratively with the first conductive block 2102. The second functional test is a "direct electrical characteristic test for the first test section of the product under test," such as basic conductivity and static voltage testing. In this case, multiple probes in the probe group are connected to multiple pins in the test section. For example, in this embodiment, the first functional test refers to radio frequency functional testing, and the second functional test refers to basic electrical performance.

[0075] Through the design of the test component 200 as described above, the first conductive block 2102 of the test component 200 has a dual function. In the radio frequency detection scenario, its surface current distribution satisfies the resonance condition of the antenna, which can convert the electrical signal into electromagnetic waves (or vice versa) to realize the radiation and reception of radio frequency signals. In the electrical detection scenario, its low impedance characteristics allow current to pass through, and it can be used as an electrical connector to realize the conduction of the circuit.

[0076] In actual testing, when radio frequency (RF) signals need to be transmitted, in the first stage position, the structure of the first conductive block 2102 acts as an antenna, contacting the antenna contact on the test section of the product under test (DUT), allowing the first conductive block 2102 to be used as an antenna for transmitting or receiving RF signals. When DC or low-frequency electrical signals need to be transmitted, the first conductive block 2102 acts as a conductive medium, serving as a connector between the first probe group 2101, the second probe group 2201, and the DUT, achieving electrical continuity of the circuit. This test assembly 200 can fulfill two testing requirements for the same product without the need for additional components.

[0077] In one embodiment, the same pressing module includes a plurality of first test components 210 or a plurality of second test components 220; at least one of the plurality of first test components 210 on one pressing module and at least one of the plurality of second test components 220 on another pressing module are in corresponding mating positions relative to the same test part of the product under test.

[0078] The same pressing module integrates multiple test components 200 (first test component 210 and / or second test component 220), providing diverse test unit options for different test sections of the product under test. By combining different test components 200, it can flexibly adapt to the differentiated testing requirements of the product under test in terms of function and performance, significantly expanding the applicability of the pressing fixture.

[0079] At least one first test component 210 and at least one second test component 220 are positioned in corresponding cooperative positions relative to the same test section of the product under test (DUT), ensuring that a collaborative test path is constructed for the same test section from different orientations of the DUT (such as top and bottom). This structure can satisfy at least one test requirement for heterogeneous functional tests of the same test section, and can also realize heterogeneous functional tests of the same test section (such as basic electrical continuity tests and high-frequency signal transmission tests), significantly improving test efficiency.

[0080] In one embodiment, the same pressing module includes a first test component 210 and a second test component 220; the two pressing modules include at least a set of first test components 210 and second test components 220 in corresponding mating positions relative to the same test part of the product under test.

[0081] This invention provides a fixture that integrates multiple identical or different test components 200 into a single pressing module, and achieves multi-item testing of the same or multiple test sections through the corresponding cooperation relationship across pressing modules. It eliminates the need for separate pressing mechanisms for each test function, reducing the overall size of the fixture while lowering the mechanical debugging complexity when multiple components work together, and improving the fixture's structural compactness and operational stability.

[0082] When the product under test requires additional test items or test points, a corresponding test component 200 can be added to the pressing module, and it can cooperate with the matching detection component of another module. This eliminates the need to modify the overall fixture structure; the test function can be upgraded simply through module-level expansion, significantly reducing the iteration cost of the fixture. For example, if the second test section of the product under test only requires the first functional test, a first test component 210 can be set on the first pressing module 110. Alternatively, if the second test section of the product under test requires different types of functional tests, such as the first test section, including both the first and second functional tests, then the first pressing module 110 and the second pressing module 120 correspond to the first test section, with the first test component 210 and the second test component 220 respectively set on both sides of the second test section.

[0083] Combination Figure 1 , Figure 2In one embodiment, the test assembly 200 further includes a signal conduction assembly, which includes a first adapter and a second adapter. The first adapter is used to electrically connect the second probe group 2201 to a first electronic interface 230 located on any one of the pressing modules. The first electronic interface 230 is used to conduct a signal for a functional test of the product under test. Specifically, the first electronic interface 230 is used to conduct a signal for a first functional test of the product under test.

[0084] The second adapter is used to electrically connect the first probe group 2101 to the second electronic interface 240 located on any one of the pressing modules. The second electronic interface 240 is used to conduct signals for another functional test of the product under test. Specifically, the second electronic interface 240 is used to conduct signals for a second functional test of the product under test.

[0085] Correspondingly, the first adapter is set in the second pressing module 120, and the second adapter is set in the first pressing module 110, so as to realize the import or export of two different test signals in a mutually isolated manner.

[0086] In one specific embodiment, the signal conduction component includes a third adapter for importing various test signals. The third adapter is disposed in the second pressing module 120. In the first stage position, the second probe group 2201, the first conductive block 2102, and the first test section constitute a first test path. Test signals can be imported into the first test section of the product under test through the third adapter. The second probe group 2201 abuts against the first test section and is electrically engaged. The first adapter can export the first functional test signal of the product under test through the first electronic interface 230. Similarly, in the second stage position, the first end of the first conductive block 2102 abuts against the first contact end of the first probe group 2101 and is electrically engaged. The first probe group 2101, the first conductive block 2102, the second probe group 2201, and the first test section constitute a second test path. Test signals can be imported into the first test section of the product under test through the third adapter. The second adapter can export the second functional test signal of the product under test through the second electronic interface 240. In this embodiment, the first electronic interface 230 is used for electrical connection with external equipment performing the first functional test; the second electronic interface 240 is used for electrical connection with external equipment performing the second functional test. This method can not only meet the bidirectional signal interaction requirements of the same test unit (such as signal input and feedback acquisition), but also enable the simultaneous performance of multiple types of tests on the same test unit, thereby improving test efficiency.

[0087] In another specific embodiment, the above-mentioned conduction method can also be set to other methods. Specifically, the test component 200 includes a third adapter and a fourth adapter. The third adapter is disposed in the second pressing module 120, at the first stage position. The second probe group 2201, the first conductive block 2102 and the first test section form a first test path. The test signal is introduced into the first test section of the product under test by the third adapter. The second probe group 2201 abuts against the first test section and is electrically engaged. The first adapter can export the first functional test signal of the product under test from the first electronic interface 230.

[0088] Furthermore, a fourth adapter is positioned in the second stage of the first pressing module 110. The first end of the first conductive block 2102 is electrically engaged with the first contact end of the first probe group 2101. The first probe group 2101, the first conductive block 2102, the second probe group 2201, and the first test section constitute a second test path. Test signals can be imported into the first test section of the product under test via the fourth adapter. The second adapter of the first probe group 2101 exports the second functional test signal of the product under test through the second electronic interface 240. This method ensures that each test is performed in an independent signal path, avoiding cross-interference between different types of test signals. It also ensures stable connection of test contacts through precise positional correspondence, thereby improving the reliability of heterogeneous test results.

[0089] See Figures 10 to 12 In one embodiment, the first pressing module 110 and the second pressing module 120 can synchronously or asynchronously move closer or further apart from each other. When in the first stage position, the first pressing module 110 moves towards the product under test, and the second pressing module 120 moves synchronously towards the product under test. At this time, the first conductive block 2102 makes contact with the antenna contact on the first test section of the product under test and achieves signal conduction; the second probe group 2201 makes contact with the first test section and forms an electrical connection with the first test section under the action of the signal control unit. In this state, the first end of the first conductive block 2102 and the first contact end of the first probe group 2101 are spaced apart, while the second end of the first conductive block 2102 and the first contact end of the second probe group 2201 abut against the opposite sides of the first test section and form an electrical connection. The second probe group 2201, the first test section, and the first conductive block 2102 then construct a first test path to perform the first functional test of the product under test.

[0090] Furthermore, when the first pressing module 110 and the second pressing module 120 are in the second stage position, the second pressing module 120 maintains electrical connection while maintaining the first stage position state, and the first pressing module 110 continues to move in the direction close to the first test section, so that the first contact end of the first probe group 2101 and the first end of the first conductive block 2102 form an abutment and achieve electrical cooperation. Then, the first probe group 2101, the first conductive block 2102, the second probe group 2201 and the first test section construct a second test path to perform a second functional test that is a different type of functional test from the first functional test.

[0091] During this process, the first pressing module 110 and the second pressing module 120 can choose to move towards each other synchronously or asynchronously according to the test requirements; after the test is completed, the first pressing module 110 and the second pressing module 120 can move synchronously or asynchronously in a direction away from the first test part, and finally separate from the first test part.

[0092] In one embodiment, the pressing module adopts a modular assembly structure. The pressing module includes an adapter plate and a core component, which are detachably connected by the cooperation of a positioning pin and a locking hole. A locking component (such as a fastening screw) is provided at the connection point to ensure assembly accuracy and structural stability. (Continue reading) Figure 7 As shown, the pressing module includes an adapter plate and a core component, with the core component detachably connected to the adapter plate. The adapter plate includes a first adapter plate 1101 for detachable installation of the first probe assembly 2101, and the core component includes a first core component 1102 for detachable installation of the first conductive block 2102. The first core component 1102 has a receiving cavity for mounting the first conductive block 2102, and the first conductive block 2102 is movably installed in the receiving cavity of the first core component 1102. An elastic member 101 with the force direction along a first direction is provided between the first conductive block 2102 and the first adapter plate 1101. The two ends of the elastic member 101 abut against the top end of the first conductive block 2102 and the limiting surface of the first adapter plate 1101, respectively, to ensure the initial positional stability of the first conductive block 2102 in the non-working state and to provide the first conductive block 2102 with movement capability and buffer pressure during the test. The adapter plate also includes a second core component 1202 for detachable installation of the second probe assembly 2201, and a second adapter plate 1201 detachably installed with the second core component 1202. The second core component 1202 and the second adapter plate 1201 also employ a detachable structure, for example, achieving a stable connection through a combination of tenon and mortise joints and locking components. Furthermore, the connecting surfaces of the two are machined with positioning steps to ensure that the installation position of the second probe assembly 2201 and the first probe assembly 2101 achieves a preset alignment accuracy. This configuration allows for the individual replacement or maintenance of a component according to testing requirements, improving the assembly flexibility and maintenance convenience of the crimping fixture.

[0093] See Figure 4 , Figure 5 , Figure 8 as well as Figure 9 In one embodiment, the two pressing modules are respectively configured with corresponding module housings, wherein the first pressing module 110 is housed inside the first module housing 111, and the second pressing module 120 is housed inside the second module housing 121. The two sets of module housings form an independently packaged modular structure, which is convenient to use or replace as needed.

[0094] To ensure that the first pressing module 110 and the second pressing module 120 can move closer to or further away from the product being tested along the first direction, a sliding fit structure is adopted between the first pressing module 110 and the first module housing 111. This allows the first pressing module 110 to reciprocate relative to the first module housing 111 along the first direction. An elastic element 101 (such as a return spring) is also provided between them. This elastic element 101 is arranged along the first direction shown vertically in the figure, and its two ends abut against the outer wall of the first pressing module 110 and the inner wall of the first module housing 111, respectively, to provide a reset force after the pressing action is completed. Similarly, the second pressing module 120 and the second module housing 121 also adopt the same sliding fit structure. The second pressing module 120 can reciprocate relative to the second module housing 121 along the first direction, and an elastic element 101 arranged along the first direction is also provided between them to realize the elastic reset function of the second pressing module 120.

[0095] Furthermore, in one embodiment, when the first pressing module 110 and the second pressing module 120 are respectively configured with multiple first electronic interfaces 230 and / or second electronic interfaces 240, in order to meet the requirements of performing different functional tests from both sides of the product under test, the first electronic interfaces 230 and / or the second electronic interfaces 240 can be selectively exposed from the opposite side of the corresponding module housing. Specifically, the first electronic interface 230 can be exposed outward from the side of the first module housing 111 opposite to the second module housing 121, and / or the second electronic interface 240 can be exposed outward from the side of the second module housing 121 opposite to the first module housing 111. This interface layout design avoids cross-interference between the test lines on both sides and provides operational space for the connection between external test equipment and electronic interfaces, ensuring that the requirements for heterogeneous functional tests are met.

[0096] Furthermore, the module housing includes a support cavity 102 for carrying the test section of the product under test. The support cavity 102 is located on the end face of one module housing near another module housing. In this embodiment, the support cavity 102 is located on the second module housing 121. It includes a portion for carrying the product under test and a portion for carrying the first test section of the product under test. Optionally, it also includes a portion for carrying multiple other test sections of the product under test. It is understood in the art that the portion of the support cavity 102 for carrying multiple other test sections of the product under test can be determined according to the actual structure of the product under test and is not affected by the test components 200 provided on the pressing module or its use.

[0097] See Figure 1 , Figure 2 , Figure 4 In one embodiment, the first pressing module 110 is provided with a first pressing portion 1103 extending in a direction away from the second pressing module 120. The first pressing portion 1103 penetrates the first module housing 111 and is exposed to the outside, forming a force-applying end for external driving force. Correspondingly, the second pressing module 120 is provided with a second pressing portion 1203 extending in a direction away from the first pressing module 110. The second pressing portion 1203 penetrates the second module housing 121 and is exposed to the outside, also constituting an independent force-applying end.

[0098] The aforementioned pressing part serves as a force transmission medium between the external driving force and the pressing module. When pressure is applied to the first pressing part 1103 in the first direction towards the product under test, it directly drives the first pressing module 110 to overcome the elastic force of the elastic element 101 and move in the first direction towards the product under test until a conductive connection is formed between the first conductive block 2102 and the corresponding test part of the product under test, or between the first probe group 2101 and the first conductive block 2102. Similarly, when pressure is applied to the second pressing part 1203 in the same direction, it drives the second pressing module 120 to move in the first direction towards the product under test, achieving an electrical conductive connection between the second probe group 2201 and the test part of the product under test. Conversely, when the external pressure is removed, the pressing module can retract the pressing part under the reset action of the elastic element 101, causing the test assembly 200 to separate from the product under test.

[0099] In this embodiment, the external driving force is accurately transmitted to the pressing module through the exposed pressing part, ensuring that the pressing module can stably perform the action of approaching or moving away from the product under test in a preset first direction, thereby reliably realizing the crimping and connection and separation between the test component 200 and the test part of the product under test, and providing a stable mechanical driving basis for the switching of test paths at different stages.

[0100] Furthermore, the module housing is provided with a support cavity 102 for supporting the test section of the product under test. This support cavity 102 is located on the end face of one module housing near the other, forming a positioning reference structure for the product under test. In this embodiment, the support cavity 102 is specifically located on the end face of the second module housing 121 facing the first module housing 111. Its internal structure is adapted to the shape and test section layout of the product under test. The support cavity 102 includes a main support area, a first test section positioning area, and optionally an extended support area. The main support area is used to accommodate and limit the main body of the product under test. Through a cavity structure matching the outer contour of the product under test, it ensures that the product under test will not undergo horizontal displacement during testing. The first test section positioning area corresponds to the position of the first test section of the product under test. Its cavity depth and contour are adapted to the structural features of the first test section, ensuring precise alignment between the first test section and the test assembly 200 during the pressing process. To expand the bearing area, according to the design requirements of multiple test sections of the product under test, a positioning structure corresponding to other test sections can be added in the bearing cavity 102 to support and limit the other multiple test sections of the product under test.

[0101] Those skilled in the art should understand that the number, location, and structural form of the extended bearing area of ​​the bearing cavity 102 can be adaptively adjusted according to the actual design of the product under test. Its layout and size are not limited by the number and distribution of the test components 200 on the pressing module, thereby ensuring that the pressing fixture can be compatible with products under test with different test configurations and improving the versatility of the fixture.

[0102] See Figure 4 , Figure 5 , Figure 8 as well as Figure 9 In the embodiment provided by the present invention, the first module housing 111 is composed of a first shell 1111 and a first cover 1112, which are detachably fastened together by positioning buckles and fastening screws, forming a first receiving cavity for accommodating the first pressing module 110. The first pressing module 110 is confined within the first receiving cavity, and an elastic member 101 arranged along a first direction is assembled between it and the inner wall of the first shell 1111. The two ends of the elastic member 101 rigidly abut against the corresponding end face of the first pressing module 110 and the limiting wall surface of the first shell 1111, respectively, to provide a reset elastic force along the first direction.

[0103] Correspondingly, the second module housing 121 adopts the same structural design as the first module housing 111. The second housing 1211 and the second cover 1212 are fixedly connected by a fastening structure, together forming a second receiving cavity for accommodating the second pressing module 120. The second pressing module 120 is constrained within this second receiving cavity, and an elastic element 101 arranged along the first direction is also fitted between it and the inner wall of the second housing 1211. The elastic element 101 provides elastic support and reset force for the second pressing module 120 along the first direction through the abutment relationship at both ends. The rigid fastening between the housing and the cover ensures the structural stability of the receiving cavity, provides precise guiding constraint for the reciprocating movement of the pressing module along the first direction, and, together with the elastic element 101, ensures the smoothness of movement and the reliability of reset of the pressing module during the testing process.

[0104] See Figure 4 , Figure 5 , Figure 8 as well as Figure 9 In one embodiment, in a plane perpendicular to the first direction, the two module housings are connected by a hinge to achieve an openable and closable fit. The adjacent side edges of the two module housings are connected by a hinge structure. The rotation axis of the hinge is arranged along an axis perpendicular to the first direction, so that the two module housings can rotate relative to each other around the axis, thereby realizing the opening and closing action. Between the other side edges of the two module housings that are symmetrically distributed with respect to the hinge position, a locking key assembly 130 for locking the closed state is provided.

[0105] In the locking key assembly 130, the fixed end of the locking key 1301 is rotatably connected to the side of one of the module housings via a pin, allowing it to rotate around the pin. The free end of the locking key 1301 extends towards the other module housing, and this free end is bent inward to form a locking edge. Correspondingly, the corresponding side of the other module housing has a locking platform 1302 that matches the locking edge. The contour of the locking platform 1302 matches the bending angle of the locking edge, forming a complementary locking structure.

[0106] The two module housings are rigidly locked by the rotational preload of the locking key 1301. When opening, the locking key 1301 is rotated in the opposite direction to disengage the locking edge from the locking table 1302, and the two module housings can be opened through the hinge structure, which facilitates the picking up and placing of the product under test and the testing operation.

[0107] The crimping fixture for testing provided by this invention is particularly suitable for application scenarios where two functional tests are fundamentally different. When the two types of tests differ fundamentally in their testing principles, conduction paths, and testing objectives, continuous execution of two dissimilar functional tests can be achieved without frequent fixture changes. This design, through the partitioned independent test paths and the mutual exclusion guidance of the second probe group 2201, structurally ensures that the two tests do not interfere with each other during signal transmission. This simplifies the switching process between multiple types of test fixtures, avoids positioning errors caused by fixture changes, significantly reduces the operational complexity of the testing system, and greatly improves the overall testing efficiency.

[0108] Furthermore, this crimping fixture can be standardized and interfaced with a common adapter module, allowing for flexible compatibility with various automated testing equipment through a unified interface. It supports simultaneous or step-by-step testing of different functions from both sides of the product under test. Based on the specific testing requirements of the product under test, the fixture can be modularly adjusted to achieve targeted double-sided crimping test configurations. This not only meets the multi-dimensional testing requirements of a single product but also accommodates testing scenarios for products of different specifications, effectively expanding the applicability and automation integration capabilities of the crimping fixture and providing efficient and stable hardware support for large-scale mass production testing.

[0109] According to another aspect of the present invention, the present invention also provides a testing device that has technical advantages over the prior art, including the technical advantages of the testing crimping fixture as described above compared to the prior art.

[0110] The embodiments described above are merely illustrative of several implementation methods of this application, and while the descriptions are relatively specific and detailed, they should not be construed as limiting the scope of the patent application. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of this application, and these all fall within the protection scope of this application. Therefore, the protection scope of this patent application should be determined by the appended claims.

Claims

1. A crimping fixture for testing products under test, the products under test including a first testing section, characterized in that, The crimping fixture for testing includes: The pressing assembly includes two pressing modules, which are arranged adjacent to each other on both sides of the product to be tested along a first direction. The test components include a first test component and a second test component; The first test component includes a first probe group disposed on the first pressing module of the two pressing modules, and a first conductive block housed in the inner cavity of the first pressing module and movable in a first direction; The second test component includes a second probe group disposed on the second press module of the two press modules; The first contact end of the first probe group is located in the inner cavity of the first pressing module; the first end of the first conductive block is located in the inner cavity and is spaced apart from the first contact end of the first probe group; the second end of the first conductive block extends to the outside of the first pressing module near the second pressing module. The two pressing modules have a first stage position where they are close to each other, and a second stage position where they continue to be close to each other after the first stage. In the first stage position, the first end of the first conductive block is spaced apart from the first contact end of the first probe group, the second end of the first conductive block and the first contact end of the second probe group are respectively abutted on opposite sides of the first test part and electrically connected, and the second probe group, the first test part and the conductive block form a first test path for performing the first functional test on the product under test. In the second stage, the first end of the first conductive block and the first contact end of the first probe group are electrically connected. The first probe group, the conductive block, the second probe group, and the first test section form a second test path for performing a second functional test on the product under test.

2. The testing crimping fixture according to claim 1, characterized in that, The first and second functional tests are different types of functional tests.

3. The testing crimping fixture according to claim 1, characterized in that, The same pressing module includes multiple first test components or multiple second test components; at least one of the multiple first test components on one pressing module and at least one of the multiple second test components on another pressing module are in corresponding mating positions relative to the same test part of the product under test.

4. The crimping fixture for testing according to claim 1, characterized in that, The same pressing module includes a first test component and a second test component; the two pressing modules include at least one set of first test components and second test components in corresponding mating positions relative to the same test part of the product under test.

5. The crimping fixture for testing according to claim 1, characterized in that, The test component also includes a signal conduction component, which includes... The first adapter is used to electrically connect the second probe group to the first electronic interface located on any one of the pressing modules; The second adapter is used to electrically connect the first probe group to the second electronic interface located on any of the pressing modules.

6. The crimping fixture for testing according to claim 1, characterized in that, The first pressing module and the second pressing module move closer to or further away from each other, either synchronously or asynchronously.

7. The crimping fixture for testing according to claim 1, characterized in that, The pressing module includes an adapter plate and a core component, the core component being detachably connected to the adapter plate; The adapter plate includes a first adapter plate for detachable installation of the first probe group, and the core includes a first core for detachable installation of the first conductive block. The first conductive block is movably installed in the first core, and an elastic element with the force direction along the first direction is provided between the first conductive block and the first adapter plate. The adapter plate also includes a second core component for detachable installation of the second probe group, and a second adapter plate detachably installed with the second core component.

8. The testing crimping fixture according to claim 5, characterized in that, The two pressing modules each include a module housing; the first pressing module is housed within the first module housing, and the second pressing module is housed within the second module housing; the first pressing module can reciprocate relative to the first module housing along a first direction within the first module housing; The second pressing module can reciprocate relative to the second module housing in a first direction within the second module housing; the first electronic interface and / or the second electronic interface are exposed on the side of the first module housing opposite to the second module housing; The first electronic interface and / or the second electronic interface are exposed on the side of the second module housing that is away from the first module housing.

9. The testing crimping fixture according to claim 8, characterized in that, The first pressing module is provided with a first pressing part extending in a direction away from the second pressing module, the first pressing part passing through and exposed outside the first module housing; The second pressing module is provided with a second pressing part extending in a direction away from the first pressing module, and the second pressing part passes through and is exposed outside the housing of the second module.

10. A detection device, characterized in that, Includes the test crimping fixture as described in any one of claims 1 to 9.

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