Solar cell electric leakage detection method, system and device
By combining point-based illumination testing and thermal imaging, the location and cause of solar cell leakage can be quickly determined, solving the problem of long processing time in traditional detection methods and achieving efficient leakage detection.
Patent Information
- Application Number
- CN202411708272.7
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2024-11-26
- Publication Date
- 2025-11-25
AI Technical Summary
Traditional methods for detecting leakage in solar cells are difficult to quickly determine the location and cause of leakage, requiring a step-by-step investigation of each process step, which is time-consuming.
By conducting point-like luminescence tests on solar cells to obtain the distance between the luminous point and the edge, the leakage type is determined by combining the preset distance, and the contact between the leakage area and the edge is confirmed by combining thermal imaging tests. Microscopic morphology detection is then used to confirm edge abnormalities or impurity leakage.
Quickly identify the cause of leakage, reduce the time spent checking each process step one by one, improve detection efficiency, and save process flow and detection time.
Smart Images
Figure CN121011518A_ABST
Abstract
Description
Technical Field
[0001] This application relates to the field of photovoltaic technology, and in particular to a method, system and device for detecting leakage current in solar cells. Background Technology
[0002] In the fabrication of solar cells, the high temperature of the boron diffusion process means that if dust impurities settle on the cell surface before diffusion and then diffuse into the PN junction region during the diffusion process, leakage can occur. Furthermore, after the diffusion process, the surrounding coating needs to be removed by alkaline polishing or RCA edge etching. Incomplete removal of the surrounding coating in these steps will also lead to leakage. Traditional methods for detecting solar cell leakage use thermal imaging. However, the high heat at the leakage location causes the surrounding area to heat up, making it difficult to pinpoint the exact location of the leakage. Therefore, a step-by-step investigation of each process step is necessary to determine the specific cause of the leakage, making it difficult to quickly identify the cause. Summary of the Invention
[0003] Therefore, it is necessary to provide a method, system, and apparatus for detecting leakage current in solar cells. The solar cell leakage current detection method of this application can quickly determine the specific cause of leakage current in the solar cells.
[0004] In a first aspect, this application provides a method for detecting leakage current in solar cells, comprising the following steps:
[0005] A point-like luminescence test was performed on the solar cell to obtain the luminescence point of the solar cell;
[0006] The distance between each of the aforementioned emitting points and the edge of the solar cell closest to it is obtained and denoted as the judgment distance;
[0007] Compare each of the judgment distances with the preset distance. If there is a bright spot where the judgment distance is less than or equal to the preset distance, then the solar cell is judged to be an edge-abnormal cell; otherwise, the solar cell is judged to be an impurity leakage cell.
[0008] In some implementations, the point-like luminescence test of the solar cell includes the following steps:
[0009] A reverse voltage is applied to the solar cell to form a current loop in the solar cell;
[0010] The luminescence of the solar cell was observed in a dark room environment.
[0011] In some embodiments, the reverse voltage is 20V to 40V.
[0012] In some embodiments, the preset distance is 1mm to 3mm.
[0013] In some implementations, after determining that a solar cell is an edge-abnormal cell, the following steps are also included:
[0014] The microscopic morphology of the edge of the abnormal battery is examined to determine whether there is edge leakage.
[0015] In some implementations, the following steps are included before performing a spot luminescence test on the solar cell:
[0016] Thermal imaging tests are performed on the solar cells to obtain the leakage areas of the solar cells based on the thermal imaging images;
[0017] Determine whether the leakage area is in contact with the edge of the solar cell. If the leakage area is in contact with the edge of the solar cell, perform a point-like luminescence test on the solar cell; otherwise, determine that the solar cell is an impurity leakage cell.
[0018] In some embodiments, the method for preparing the solar cell to be tested includes the following steps:
[0019] Silicon doped layers with opposite doping types are formed on two opposite surfaces of the substrate by thermal diffusion.
[0020] Etching removes the surrounding plating layer on the substrate;
[0021] Gate lines are formed on the surface of the doped silicon material layer.
[0022] Secondly, this application provides a solar cell leakage detection system, including a first testing module, an acquisition module, and a first judgment module;
[0023] The first test module is used to perform a point-like luminescence test on the solar cell to obtain the luminescence point of the solar cell;
[0024] The acquisition module is used to acquire the distance between each of the emitting points and the edge of the solar cell closest to it, which is denoted as the judgment distance;
[0025] The first judgment module is used to compare each judgment distance with a preset distance. If there is a bright spot where the judgment distance is less than or equal to the preset distance, the solar cell is judged to be an edge abnormal cell; otherwise, the solar cell is judged to be an impurity leakage cell.
[0026] In some implementations, a second testing module and a second judgment module are also included;
[0027] The second test module is used to perform thermal imaging tests on the solar cell and obtain the leakage area of the solar cell based on the thermal imaging image;
[0028] The second judgment module is used to determine whether the leakage area is in contact with the edge of the solar cell. If the leakage area is in contact with the edge of the solar cell, the solar cell is subjected to a point-like luminescence test; otherwise, the solar cell is determined to be an impurity leakage cell.
[0029] In some embodiments, the solar cell leakage detection system further includes a third test module;
[0030] The third testing module is used to detect the microscopic morphology of the edge of the edge-abnormal battery in order to determine whether the edge-abnormal battery has edge leakage.
[0031] Thirdly, this application provides a solar cell leakage detection device, including a controller;
[0032] The controller is used to control the solar cell to perform a point-like illumination test and obtain the illumination point of the solar cell;
[0033] The controller is also used to obtain the distance between each of the emitting points and the edge of the solar cell closest to it, denoted as the judgment distance;
[0034] The controller is also used to compare each of the judgment distances with a preset distance. If there is a bright spot where the judgment distance is less than or equal to the preset distance, the solar cell is judged to be an edge abnormal cell; otherwise, the solar cell is judged to be an impurity leakage cell.
[0035] In some embodiments, the controller is also used to control the solar cell to perform thermal imaging tests and obtain the leakage area of the solar cell based on the thermal imaging images;
[0036] The controller is also used to determine whether the leakage area is in contact with the edge of the solar cell. If the leakage area is in contact with the edge of the solar cell, a point-like luminescence test is performed on the solar cell; otherwise, the solar cell is determined to be an impurity solar cell.
[0037] In some embodiments, the controller is also used to control the edge abnormal battery to detect the micro-morphology of the edge in order to determine whether the edge abnormal battery has edge leakage.
[0038] In the aforementioned solar cell leakage detection method, point-like luminescence testing of the solar cell can be performed to obtain the luminescence points, thereby locating the specific leakage location. The distance between each luminescence point and the edge of the nearest solar cell is obtained and recorded as the judgment distance. Each judgment distance is compared with a preset distance. If there is a luminescence point whose distance from the edge of the solar cell is less than or equal to the preset distance, the solar cell is judged to be an edge-abnormal cell. Otherwise, the solar cell is judged to be an impurity-leaking cell. If the cell is judged to be an impurity-leaking cell, the cleanliness of the thermal diffusion equipment needs to be checked. If the solar cell is judged to be an edge-abnormal cell, the etching equipment needs to be adjusted and checked. The solar cell leakage detection method of this application can quickly determine the specific cause of leakage in the solar cell, and then check the corresponding process steps and equipment conditions, reducing the time required for checking each process step one by one. Attached Figure Description
[0039] Figure 1 This is a schematic flowchart of a solar cell leakage detection method provided in an embodiment of this application;
[0040] Figure 2 A schematic flowchart of a solar cell leakage detection method provided in another embodiment of this application;
[0041] Figure 3 A schematic diagram of the test results of a point-like luminescence test performed on a solar cell provided in an embodiment of this application;
[0042] Figure 4 This is a schematic diagram of the test results of a thermal imaging test of a solar cell provided in an embodiment of this application. Detailed Implementation
[0043] To make the above-mentioned objectives, features, and advantages of this application more apparent and understandable, a detailed description of specific embodiments of this application is provided below. Many specific details are set forth in the following description to provide a thorough understanding of this application. However, this application can be implemented in many other ways different from those described herein, and those skilled in the art can make similar modifications without departing from the spirit of this application. Therefore, this application is not limited to the specific embodiments disclosed below.
[0044] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs. The terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the application. The term "and / or" as used herein includes any and all combinations of one or more of the associated listed items.
[0045] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one of that feature. In the description of this application, "multiple" means at least two, such as two, three, etc., unless otherwise explicitly specified.
[0046] Reference Figure 1 As shown, one embodiment of this application provides a method for detecting leakage current in solar cells, including the following steps:
[0047] S11: Perform a point-like luminescence test on the solar cell to obtain the luminescence point of the solar cell;
[0048] S12: Obtain the distance between each emitting point and the edge of the solar cell closest to it, and record it as the judgment distance;
[0049] S13: Compare each judgment distance with the preset distance. If there is a bright spot with a judgment distance less than or equal to the preset distance, then the solar cell is judged to be an edge abnormal cell; otherwise, the solar cell is judged to be an impurity leakage cell.
[0050] In the aforementioned solar cell leakage detection method, point-like luminescence testing of the solar cell can be performed to obtain the luminescence points, thereby locating the specific leakage location. The distance between each luminescence point and the edge of the nearest solar cell is obtained and recorded as the judgment distance. Each judgment distance is compared with a preset distance. If there is a luminescence point whose distance from the edge of the solar cell is less than or equal to the preset distance, the solar cell is judged to be an edge-abnormal cell. Otherwise, the solar cell is judged to be an impurity-leaking cell. If the cell is judged to be an impurity solar cell, the cleanliness of the thermal diffusion equipment needs to be checked. If the cell is judged to be an edge-abnormal cell, the etching equipment needs to be adjusted and checked. The solar cell leakage detection method of this application can quickly determine the specific cause of leakage in the solar cell, and then check the corresponding process steps and equipment conditions, reducing the time required for checking each process step one by one.
[0051] It is understandable that an edge-related abnormal cell refers to a cell where leakage occurs at the cell's edge. However, this leakage could be caused by edge leakage or by impurities introduced during boron diffusion. An impurity-induced leakage cell refers to a cell where leakage is caused by impurities introduced during boron diffusion.
[0052] Reference Figure 4 As shown, Figure 4This is a schematic diagram of the test results of a point-like brightening test performed on a solar cell provided in an embodiment of this application. It can be seen that multiple bright spots exist on both the left and lower sides of the solar cell.
[0053] In some implementations, prior to performing a spot-brightness test on the solar cell, the following is also included:
[0054] The electrical performance of the solar cells was tested, and the leaky cells were screened for point-like luminescence tests.
[0055] It is understandable that electrical performance testing of solar cells refers to performing IV testing on the solar cells under test. This test can directly detect whether there is leakage in the solar cells. The test results can be used to screen out leaky cells in the solar cells for further testing.
[0056] In some implementations, the point-like luminescence test of the solar cell includes the following steps:
[0057] Apply a reverse voltage to the solar cell to form a current loop in the solar cell;
[0058] Observe the luminescence of the solar cell in a dark room environment.
[0059] In some implementations, the reverse voltage is 20V to 40V.
[0060] Within the aforementioned range of reverse voltage magnitudes, the ignition point can be easily observed. Optionally, the reverse voltage magnitude can be 20V, 22V, 24V, 26V, 28V, 30V, 32V, 34V, 36V, 38V, or 40V. Alternatively, the reverse voltage magnitude can also be within the range of any two of the aforementioned voltages.
[0061] In some of these implementations, the preset distance is 1mm to 3mm.
[0062] Optionally, the preset distance is 1mm, 1.2mm, 1.4mm, 1.6mm, 1.8mm, 2mm, 2.2mm, 2.4mm, 2.6mm, 2.8mm, or 3mm. It is understood that if the emitting point is located on the side of the solar cell, the detection distance for that emitting point is 0.
[0063] In some implementations, after determining that a solar cell is an edge-abnormal cell, the following steps are also included:
[0064] The microscopic morphology of the edge of the abnormal battery is examined to determine whether there is edge leakage.
[0065] Understandably, inspecting the microscopic morphology of the edges of abnormal solar cells can further confirm whether the leakage is caused by edge leakage. Microscopic observation can help determine if the coating around the cell has been completely removed and whether this coating is at the edge of the substrate, causing a short circuit between the front and back sides of the cell and leading to leakage. Inspecting the microscopic morphology of the edges of abnormal solar cells can further confirm the specific cause of leakage. If it can be determined that the leakage is due to incomplete removal of the coating, the etching equipment can be adjusted, reducing the time spent on step-by-step troubleshooting. Furthermore, if a solar cell is directly identified as a leaky cell due to impurities through spot brightness testing, or if an abnormal solar cell is determined to have no edge leakage after testing, the cleanliness of the heat diffusion equipment needs to be checked, which can also reduce the time spent on step-by-step troubleshooting of each process step.
[0066] In some implementations, the following steps are included before performing a spot luminescence test on the solar cell:
[0067] Thermal imaging tests are performed on solar cells to identify leakage areas based on the thermal imaging images.
[0068] Determine whether the leakage area is in contact with the edge of the solar cell. If the leakage area is in contact with the edge of the solar cell, perform a point-like luminescence test on the solar cell; otherwise, determine that the solar cell is a leaky cell with impurities.
[0069] Before conducting point-like illumination tests on the solar cell, thermal imaging tests are performed to obtain thermal images of the solar cell. (Refer to...) Figure 3 As shown, Figure 3 This diagram illustrates the test results of a spot-light emission test performed on a solar cell provided in one embodiment of this application. It can be seen that the area of the cell exhibiting leakage is highlighted in red. If the leakage area is in contact with the edge of the solar cell, further spot-light emission testing can be performed to determine the specific location of the leakage. If the leakage area is not in contact with the edge of the solar cell, the leakage location is not near the edge of the cell, indicating that the leakage is caused by impurity contamination, and the solar cell is a contamination-leaking cell.
[0070] In some embodiments, the method for fabricating a solar cell includes:
[0071] Silicon doped layers with opposite doping types are formed on two opposite surfaces of the substrate by thermal diffusion.
[0072] Etching removes the coating layer on the substrate;
[0073] Gate lines are formed on the surface of a silicon-doped material layer.
[0074] After removing the coating, gate lines are directly formed on the surface of the doped silicon material layer to obtain a solar cell for leakage detection. Compared with the traditional method of performing leakage detection on the solar cell after the entire film layer is prepared, this method can save process steps and detection time. It can be understood that the coating layer refers to the BSG layer and / or PSG layer formed on the side of the substrate and the surface of the doped layer during the thermal diffusion preparation of the doped silicon material layer.
[0075] In some embodiments, the method for fabricating a solar cell includes the following steps:
[0076] The substrate is texturized to prepare a textured surface;
[0077] A p-type doped silicon layer is prepared by high-temperature boron diffusion on the front side of the substrate.
[0078] The substrate after high-temperature boron diffusion is subjected to alkaline polishing, and the back side of the substrate is polished by wet cleaning, and the BSG layer on the side of the substrate is removed.
[0079] A tunneling oxide layer and an N-type doped silicon layer are sequentially fabricated on the back side of the substrate;
[0080] The PSG layer on the side of the substrate is removed, and then the PSG layer on the back side and the BSG layer on the front side are removed by cleaning.
[0081] The pre-finished battery obtained from the above steps is then sent to the screen printing process to print the main grid and sub-grid on the front and back sides.
[0082] The solar cells are sintered to obtain solar cells.
[0083] Reference Figure 2 As shown, in some embodiments, the solar cell leakage detection method includes the following steps:
[0084] S21: Perform thermal imaging tests on solar cells and obtain the leakage areas of solar cells based on the thermal imaging images;
[0085] S22: Determine whether the leakage area is in contact with the edge of the solar cell. If the leakage area is in contact with the edge of the solar cell, perform a point-like luminescence test on the solar cell; otherwise, determine that the solar cell is an impurity leakage cell.
[0086] S23: Perform a point-like luminescence test on the solar cell to obtain the luminescence point of the solar cell;
[0087] S24: Obtain the distance between each emitting point and the edge of the solar cell closest to it, and record it as the judgment distance;
[0088] S25: Compare each judgment distance with the preset distance. If there is a bright spot where the judgment distance is less than or equal to the preset distance, then the solar cell is judged to be an edge abnormal cell; otherwise, the solar cell is judged to be an impurity leakage cell.
[0089] S26: Detect the microscopic morphology of the edge of the abnormal edge battery to determine whether there is edge leakage in the abnormal edge battery.
[0090] Another embodiment of this application provides a solar cell leakage detection system, including a first testing module, an acquisition module, and a first judgment module;
[0091] The first test module is used to perform point-like illumination tests on solar cells to obtain the illumination points of the solar cells;
[0092] The acquisition module is used to obtain the distance between each emitting point and the edge of the solar cell, which is denoted as the judgment distance;
[0093] The first judgment module is used to compare each judgment distance with the preset distance. If there is a bright spot with a judgment distance less than or equal to the preset distance, the solar cell is judged to be an edge abnormal cell; otherwise, the solar cell is judged to be an impurity leakage cell.
[0094] In some implementations, a second testing module and a second judgment module are also included;
[0095] The second test module is used to perform thermal imaging tests on solar cells and obtain the leakage areas of solar cells based on the thermal imaging images.
[0096] The second judgment module is used to determine whether the leakage area is in contact with the edge of the solar cell. If the leakage area is in contact with the edge of the solar cell, the solar cell is subjected to a point-like luminescence test; otherwise, the solar cell is judged to be an impurity solar cell.
[0097] In some implementations, the solar cell leakage detection system also includes a third test module;
[0098] The third testing module is used to detect the microscopic morphology of the edge of the abnormal battery to determine whether there is edge leakage.
[0099] Another embodiment of this application provides a solar cell leakage detection device, including a controller;
[0100] The controller is used to control the solar cells to perform point-like illumination tests and obtain the illumination points of the solar cells;
[0101] The controller is also used to obtain the distance between each emitting point and the edge of the solar cell closest to it, which is denoted as the judgment distance;
[0102] The controller is also used to compare each judgment distance with a preset distance. If there is a bright spot with a judgment distance less than or equal to the preset distance, the solar cell is judged to be an edge abnormal cell; otherwise, the solar cell is judged to be an impurity leakage cell.
[0103] In some implementations, the controller is also used to control the solar cell to perform thermal imaging tests and to obtain the leakage area of the solar cell based on the thermal imaging images.
[0104] The controller is also used to determine whether the leakage area is in contact with the edge of the solar cell. If the leakage area is in contact with the edge of the solar cell, a point-like luminescence test is performed on the solar cell; otherwise, the solar cell is determined to be an impurity solar cell.
[0105] In some embodiments, the controller is also used to control the edge abnormality battery to detect the micro-morphology of the edge in order to determine whether the edge abnormality battery has edge leakage.
[0106] Another embodiment of this application provides a computer device, which includes a memory, a processor, and a computer program stored in the memory and executable on the processor. When the processor executes the computer program, it implements the steps of the above-described solar cell leakage detection method.
[0107] Another embodiment of the present invention provides a computer-readable storage medium having a computer program stored thereon, wherein the computer program, when executed by a processor, implements the steps of the above-described solar cell leakage detection method.
[0108] It is understood that those skilled in the art will recognize that all or part of the processes in the methods of the above embodiments can be implemented by a computer program instructing related hardware. The computer program can be stored in a non-volatile computer-readable storage medium, and when executed, it can include the processes of the embodiments of the methods described above. Any references to memory, storage, databases, or other media used in the embodiments provided by this invention can include non-volatile and / or volatile memory. Non-volatile memory may include read-only memory (ROM), programmable ROM (PROM), electrically programmable ROM (EPROM), electrically erasable programmable ROM (EEPROM), or flash memory. Volatile memory may include random access memory (RAM) or external cache memory. By way of illustration and not limitation, RAM is available in a variety of forms, such as static RAM (SRAM), dynamic RAM (DRAM), synchronous DRAM (SDRAM), dual data rate SDRAM (DDRSDRAM), enhanced SDRAM (ESDRAM), synchronous link DRAM (SLDRAM), RAMbus direct RAM (RDRAM), direct memory bus dynamic RAM (DRDRAM), and memory bus dynamic RAM (RDRAM).
[0109] The technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.
[0110] The embodiments described above are merely illustrative of several implementation methods of this application, and while the descriptions are relatively specific and detailed, they should not be construed as limiting the scope of the invention patent. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of this application, and these all fall within the protection scope of this application. Therefore, the protection scope of this patent application should be determined by the appended claims, and the specification and drawings can be used to interpret the content of the claims.
Claims
1. A method for detecting leakage current in solar cells, characterized in that, Includes the following steps: A point-like luminescence test was performed on the solar cell to obtain the luminescence point of the solar cell; The distance between each of the aforementioned emitting points and the edge of the solar cell closest to it is obtained and denoted as the judgment distance; Compare each of the judgment distances with the preset distance. If there is a bright spot where the judgment distance is less than or equal to the preset distance, then the solar cell is judged to be an edge-abnormal cell; otherwise, the solar cell is judged to be an impurity leakage cell.
2. The solar cell leakage detection method according to claim 1, characterized in that, The point-source luminescence test of solar cells includes the following steps: A reverse voltage is applied to the solar cell to form a current loop in the solar cell; The luminescence of the solar cell was observed in a dark room environment.
3. The solar cell leakage detection method according to claim 2, characterized in that, The magnitude of the reverse voltage is 20V~40V.
4. The solar cell leakage detection method according to claim 1, characterized in that, The preset distance is 1mm to 3mm.
5. The solar cell leakage detection method according to claim 1, characterized in that, The following steps are included before conducting spot luminescence tests on solar cells: Thermal imaging tests are performed on the solar cells to obtain the leakage areas of the solar cells based on the thermal imaging images; Determine whether the leakage area is in contact with the edge of the solar cell. If the leakage area is in contact with the edge of the solar cell, perform a point-like luminescence test on the solar cell; otherwise, determine that the solar cell is a leaky cell with impurities; and / or, After determining that a solar cell is an edge-abnormal cell, the following steps are also included: The microscopic morphology of the edge of the abnormal battery is examined to determine whether there is edge leakage.
6. The solar cell leakage detection method according to any one of claims 1 to 5, characterized in that, The method for preparing the solar cell includes the following steps: Silicon doped layers with opposite doping types are formed on two opposite surfaces of the substrate by thermal diffusion. Etching removes the surrounding plating layer on the substrate; Gate lines are formed on the surface of the doped silicon material layer.
7. A solar cell leakage detection system, characterized in that, It includes a first test module, an acquisition module, and a first judgment module; The first test module is used to perform a point-like luminescence test on the solar cell to obtain the luminescence point of the solar cell; The acquisition module is used to acquire the distance between each of the emitting points and the edge of the solar cell closest to it, which is denoted as the judgment distance; The first judgment module is used to compare each judgment distance with a preset distance. If there is a bright spot where the judgment distance is less than or equal to the preset distance, the solar cell is judged to be an edge abnormal cell; otherwise, the solar cell is judged to be an impurity leakage cell.
8. The solar cell leakage detection system according to claim 7, characterized in that, It also includes a second testing module and a second judgment module; The second test module is used to perform thermal imaging tests on the solar cell and obtain the leakage area of the solar cell based on the thermal imaging image; The second judgment module is used to determine whether the leakage area is in contact with the edge of the solar cell. If the leakage area is in contact with the edge of the solar cell, the solar cell is subjected to a point-like luminescence test; otherwise, the solar cell is judged to be an impurity leakage cell. And / or, The solar cell leakage detection system also includes a third testing module; The third testing module is used to detect the microscopic morphology of the edge of the edge-abnormal battery in order to determine whether the edge-abnormal battery has edge leakage.
9. A solar cell leakage detection device, characterized in that, Including the controller; The controller is used to control the solar cell to perform a point-like illumination test and obtain the illumination point of the solar cell; The controller is also used to obtain the distance between each of the emitting points and the edge of the solar cell closest to it, denoted as the judgment distance; The controller is also used to compare each of the judgment distances with a preset distance. If there is a bright spot where the judgment distance is less than or equal to the preset distance, the solar cell is judged to be an edge abnormal cell; otherwise, the solar cell is judged to be an impurity leakage cell.
10. The solar cell leakage detection device according to claim 9, characterized in that, The controller is also used to control the solar cell to perform thermal imaging tests and to obtain the leakage area of the solar cell based on the thermal imaging images. The controller is also used to determine whether the leakage area is in contact with the edge of the solar cell. If the leakage area is in contact with the edge of the solar cell, a point-like luminescence test is performed on the solar cell; otherwise, the solar cell is determined to be an impurity solar cell. And / or, The controller is also used to control the edge abnormal battery to detect the micro-morphology of the edge in order to determine whether the edge abnormal battery has edge leakage.