Uci e-based data link test method, device and chip

Abstract

The present disclosure relates to a UCIe-based data link test method, device and chip. The method comprises: obtaining, by a local chip, an eye diagram inspection result associated with any one data channel in a data link returned by a remote chip; determining, according to the eye diagram inspection result and a preset eye diagram threshold interval parameter, whether the eye diagram inspection result conforms to an interval range allowed by the eye diagram threshold interval parameter; in the case where the eye diagram inspection result conforms to the interval range allowed by the eye diagram threshold interval parameter, determining the any one data channel as a qualified channel; and in the case where the eye diagram inspection result does not conform to the interval range allowed by the eye diagram threshold interval parameter, determining the any one data channel as an unqualified channel. The technical solution of the present disclosure helps to improve the available bandwidth of the data link and ensure the stable communication rate of the data link, helps to improve the flexibility of the configuration related to the link training, and is compatible with the related UCIe protocol.

Description

TECHNICAL FIELD

[0001] The present disclosure relates to the chip technical field, and in particular to a data link test method, device and chip based on UCIe (Universal Chiplet Interconnect express). BACKGROUND

[0002] In the link training process of the UCIe protocol, the LTSM (Link Training and Status Machine) state machine plays a core role. The LTSM state gradually completes the whole process from physical layer initialization to link rate negotiation through a series of well-defined sub-states. Among them, the LINKSPEED sub-state is one of the key stages of link training, mainly responsible for determining the maximum stable communication rate that the current link can support, and configuring the corresponding transmission parameters accordingly. Ensuring the maximum stable communication rate is always the goal pursued by the UCIe protocol. SUMMARY

[0003] Therefore, the present disclosure provides a data link test method, device and chip based on UCIe to help ensure the stable communication rate of the selected link.

[0004] According to an aspect of an embodiment of the present disclosure, a data link test method based on UCIe is provided, comprising:

[0005] The local chiplet obtains an eye diagram test result associated with any one data channel in the data link returned by the remote chiplet, the eye diagram test result being at least one of an eye height test result based on eye height scanning and an eye width test result based on eye width scanning;

[0006] According to the eye diagram test result and a preset eye diagram threshold interval parameter, it is determined whether the eye diagram test result conforms to the interval range allowed by the eye diagram threshold interval parameter, wherein the eye diagram threshold interval parameter is at least one of an eye height threshold interval and an eye width threshold interval;

[0007] In the case where the eye diagram test result conforms to the interval range allowed by the eye diagram threshold interval parameter, the any one data channel is determined as a qualified channel;

[0008] In the case where the eye diagram test result does not conform to the interval range allowed by the eye diagram threshold interval parameter, the any one data channel is determined as an unqualified channel.

[0009] In a possible implementation, when the eye diagram test result comprises the eye height test result, the determining, according to the eye diagram test result and a preset eye diagram threshold interval parameter, whether the eye diagram test result conforms to an interval range allowed by the eye diagram threshold interval parameter, comprises:

[0010] comparing an eye height interval in which the eye height test result that passes the test is located and the eye height threshold interval;

[0011] when the eye height interval in which the eye height test result that passes the test is located completely covers the eye height threshold interval, determining that the eye diagram test result conforms to the interval range allowed by the eye diagram threshold interval parameter;

[0012] when the eye height interval in which the eye height test result that passes the test is located does not completely cover the eye height threshold interval, determining that the eye diagram test result does not conform to the interval range allowed by the eye diagram threshold interval parameter.

[0013] In a possible implementation, when the eye diagram test result comprises the eye width test result, the determining, according to the eye diagram test result and a preset eye diagram threshold interval parameter, whether the eye diagram test result conforms to an interval range allowed by the eye diagram threshold interval parameter, comprises:

[0014] comparing an eye width interval in which the eye width test result that passes the test is located and the eye width threshold interval;

[0015] when the eye width interval in which the eye width test result that passes the test is located completely covers the eye width threshold interval, determining that the eye diagram test result conforms to the interval range allowed by the eye diagram threshold interval parameter;

[0016] when the eye width interval in which the eye width test result that passes the test is located does not completely cover the eye width threshold interval, determining that the eye diagram test result does not conform to the interval range allowed by the eye diagram threshold interval parameter.

[0017] In a possible implementation, the UCIe-based data link test method further comprises:

[0018] performing bit error rate analysis on the arbitrary data channel to obtain a bit error rate of the arbitrary data channel;

[0019] determining, according to the bit error rate and a preset bit error rate threshold, whether the bit error rate is lower than the bit error rate threshold;

[0020] when the bit error rate is lower than the bit error rate threshold, determining that the arbitrary data channel is a qualified channel;

[0021] In the case that the error rate is not lower than the error rate threshold value, the arbitrary data channel is determined as an unqualified channel.

[0022] In a possible implementation, the UCIe-based data link test method further includes:

[0023] In the case that the arbitrary data channel is determined as the unqualified channel and there is a replaceable qualified backup data channel, the arbitrary data channel is replaced with the qualified backup data channel.

[0024] In a possible implementation, the UCIe-based data link test method further includes:

[0025] In the case that the arbitrary data channel is determined as the unqualified channel and there is no replaceable qualified backup data channel, a data link frequency reduction communication is performed or a data link retraining process is performed.

[0026] In a possible implementation, the UCIe-based data link test method is performed in response to a received eye diagram test start instruction.

[0027] In a possible implementation, the UCIe-based data link test method further includes:

[0028] In response to a received eye diagram test start instruction, a local chip performs an eye diagram scan and sends eye diagram test data to a remote chip through an arbitrary data channel, wherein the remote chip stores the same copy data as the eye diagram test data.

[0029] The remote chip receives the eye diagram test data and compares the received eye diagram test data with the copy data.

[0030] In the case that the received eye diagram test data is the same as the copy data, the remote chip returns an eye diagram check result with a pass content to the local chip.

[0031] In the case that the received eye diagram test data is not the same as the copy data, the remote chip returns an eye diagram check result with a fail content to the local chip.

[0032] In a possible implementation, in the case that the eye diagram scan is an eye height scan, the eye diagram check result is an eye height check result, and in the case that the eye diagram scan is an eye width scan, the eye diagram check result is an eye width check result.

[0033] According to another aspect of the embodiments of the present disclosure, a UCIe-based data link test device is provided, which includes:

[0034] a receiving module located at the local chiplet, configured to acquire an eye diagram inspection result associated with any one of the data lanes in the data link returned by the remote chiplet, the eye diagram inspection result being at least one of an eye height inspection result based on eye height scanning or an eye width inspection result based on eye width scanning;

[0035] an analyzing module located at the local chiplet, configured to determine whether the eye diagram inspection result conforms to an interval range allowed by a preset eye diagram threshold interval parameter according to the eye diagram inspection result and the eye diagram threshold interval parameter, the eye diagram threshold interval parameter being at least one of an eye height threshold interval or an eye width threshold interval;

[0036] a determining module located at the local chiplet, configured to determine the any one of the data lanes as a qualified lane in a case where the eye diagram inspection result conforms to the interval range allowed by the eye diagram threshold interval parameter, and determine the any one of the data lanes as an unqualified lane in a case where the eye diagram inspection result does not conform to the interval range allowed by the eye diagram threshold interval parameter.

[0037] In a possible implementation, the UCIe-based data link testing apparatus further includes:

[0038] a sending module located at the local chiplet, configured to send eye diagram testing data to the remote chiplet through the any one of the data lanes;

[0039] a data comparison module located at the remote chiplet, configured to store copy data identical to the eye diagram testing data, receive the eye diagram testing data, and compare the received eye diagram testing data with the copy data;

[0040] a result feedback module located at the remote chiplet, configured to return an eye diagram inspection result with a pass content to the local chiplet in a case where the received eye diagram testing data is identical to the copy data, and return an eye diagram inspection result with a fail content to the local chiplet in a case where the received eye diagram testing data is not identical to the copy data.

[0041] In a possible implementation, the UCIe-based data link testing apparatus further includes:

[0042] a parameter configuration module located at the local chiplet, configured to configure the eye diagram threshold interval parameter.

[0043] In a possible implementation, the UCIe-based data link testing apparatus further includes:

[0044] A control module is located in the local die and coupled to the sending module, the receiving module, the analyzing module and the determining module, configured to receive instructions and start or stop the eye diagram scanning according to the instructions, and control the sending module, the receiving module, the analyzing module and the determining module to start or stop the data link test according to the instructions.

[0045] According to another aspect of the embodiments of the present disclosure, a chip is provided, which comprises the UCIe-based data link test device according to any one of the above.

[0046] As can be seen from the above solutions, the UCIe-based data link test method, device and chip of the present disclosure can select a data channel with a large enough eye diagram opening degree that meets the eye diagram threshold interval parameter requirement for data communication between the local die and the remote die through the judgment based on the eye diagram inspection result, so as to ensure that the selected data channel has sufficient voltage noise margin and clock offset margin, so that the selected data channel has higher tolerance to signal jitter, noise, crosstalk, temperature drift and the like, and better robustness, and the judgment of the bit error rate is combined to improve the reliability of data communication of the data link after the link training in UCIe, which is helpful to the stable communication rate of the data link, and can be compatible with the related UCIe protocol. In addition, the eye diagram test start instruction is triggered to execute, and then the local die and the remote die can execute the UCIe-based data link test method of the present disclosure in the link training stage through software means, which is helpful to improve the flexibility of the configuration of the link training. When the data channel is determined to be an unqualified channel, the unqualified channel is replaced with a qualified backup data channel in the case that there is a replaceable qualified backup data channel, so as to make full use of the backup channel resource, and in the case that there is no replaceable qualified backup data channel, the data link is executed to reduce the communication rate or to execute the retraining process of the data link, so as to realize the flexible configuration according to the communication strategy requirement. BRIEF DESCRIPTION OF DRAWINGS

[0047] Figure 1 is a flowchart of the LINKSPEED sub-state in the related art;

[0048] Figure 2 is a flowchart of a UCIe-based data link test method according to an illustrative embodiment;

[0049] Figure 3 is a step diagram of determining whether the eye diagram inspection result meets the interval range allowed by the eye diagram threshold interval parameter according to an illustrative embodiment;

[0050] Figure 4is a step diagram for determining whether an eye pattern test result meets a range allowed by an eye pattern threshold interval parameter based on an eye width test result according to an illustrative embodiment;

[0051] Figure 5 is a diagram of a judgment process based on a bit error rate according to an illustrative embodiment;

[0052] Figure 6 is a diagram of a process for obtaining an eye pattern test result according to an illustrative embodiment;

[0053] Figure 7 is a diagram of a comparison between an eye pattern test result and an eye pattern threshold interval parameter in a UCIe-based data link test method implemented by the present disclosure;

[0054] Figure 8 is a structural diagram of a UCIe-based data link test device according to an illustrative embodiment;

[0055] Figure 9 is a state machine diagram in one specific application scenario of a UCIe-based data link test method, device, and chip implemented by the present disclosure;

[0056] Figure 10 is a process block diagram of an application scenario in which a link quality check module performs multi-dimensional link quality checks.

[0057] In the drawings, the components represented by the numbers are as follows:

[0058] 801, receiving module,

[0059] 802, analysis module,

[0060] 803, determination module,

[0061] 804, sending module,

[0062] 805, data comparison module,

[0063] 806, result feedback module,

[0064] 807, parameter configuration module,

[0065] 808, control module,

[0066] 810, local chiplet,

[0067] 820, remote chiplet,

[0068] 901, main state machine control module,

[0069] 902, test data sending module,

[0070] 903, a link quality checking module,

[0071] 904, a threshold configuration module,

[0072] 910, a state machine. DETAILED DESCRIPTION

[0073] In order to make the purposes, technical solutions and advantages of the present disclosure clearer, further detailed description will be made to the present disclosure with reference to the accompanying drawings and embodiments.

[0074] It should be noted that the terms "first", "second" and the like in the specification and claims of the present disclosure and the above drawings are used to distinguish similar objects, and do not necessarily have to describe a specific order or sequence.

[0075] The "coupling (or connection)" used in the specification and claims of the present disclosure can refer to any direct or indirect connection means, for example, the first device is coupled (or connected) to the second device, which should be interpreted as that the first device can be directly connected to the second device, or the first device can be indirectly connected to the second device through other devices or certain connection means.

[0076] The embodiments of the present disclosure can be applied to the link speed optimization in the UCIe protocol, can be deployed in the LINKSPEED sub-state stage in the LTSM of the UCIe protocol, and can be used for dynamically optimizing the communication performance of the link in the link training process.

[0077] Figure 1 is a flow diagram of the LINKSPEED sub-state in the related art. As Figure 1 shown, the functions and processes of the LINKSPEED sub-state in the related art mainly include rate negotiation, rate test based on preset sequence, rate threshold determination and selection, and data channel level and link level decision.

[0078] Among them, about rate negotiation. After completing the previous stage before LINKSPEED, each data channel (Lane, or data transmission channel, or simply channel) in the data link has basic signal integrity guarantee, after entering the LINKSPEED stage, the sending end (Tx) and the receiving end (Rx) evaluate the data rate that the current data channel can support by exchanging specific training sequences (Training Sequence).

[0079] Rate test based on preset sequence. The training sequence usually includes a set of standardized patterns, which can be used to measure the eye diagram quality, bit error rate (BER), jitter characteristics and other indicators of the receiving end. For any data channel, these indicators can be used to determine whether the data channel can work stably at a certain rate.

[0080] Rate threshold determination and selection. The receiving end evaluates the performance of each data channel at different rates. If the preset decision threshold (UCIe requires bit error rate to be lower than 10 -15 or more stringent) is met, it is considered that the data channel can work normally at this rate. Finally, the working rate of the entire data link is determined by the lowest supported communication rate of all data channels between the sending end and the receiving end, to ensure the stability and consistency of the overall link.

[0081] Data channel level and data link level decision. In a multi-data channel architecture, even if some data channels have higher rate capability, as long as there is a data channel that cannot reach a certain rate level, the entire data link must be reduced to the maximum rate supported by the data channel that cannot reach a certain rate level. After completing the data channel level and data link level decision, if there is a data channel that cannot reach the corresponding rate level, the entire data link is reduced and retrained, and after the reduction, it reenters the rate negotiation. If all data channels of the data link reach the corresponding rate level, the data link maintains the current communication rate and enters the subsequent state.

[0082] As described above, in the related art, in the LINKSPEED phase, the communication rate of the data link is usually evaluated based on the preset training sequence, and the final working rate is determined according to the fixed bit error rate decision threshold. However, this mechanism has the following significant defects:

[0083] First, sensitive to the signal quality of a single data channel. In a multi-data channel parallel transmission architecture, if the signal quality of a data channel is poor (for example, the eye diagram is closed due to package mismatch, uneven channel loss or crosstalk interference), even if other data channels have good signal integrity, the communication rate of the entire data link may be forced to reduce to the maximum rate supported by the data channel with poor signal quality. This directly limits the bandwidth utilization of the system.

[0084] Second, the link replacement strategy is rigid. Although some existing solutions introduce a backup data channel replacement mechanism, the judgment basis is often only dependent on a single bit error rate threshold, lacking comprehensive evaluation and quantitative modeling of signal quality, which is prone to misjudgment or omission, resulting in poor replacement effect.

[0085] Third, poor flexibility and configurability. Most implementation schemes harden the link quality evaluation logic in hardware, lack of programmable interface, making it difficult for users to flexibly configure evaluation criteria and replacement strategies according to different application scenarios (such as high-performance computing, low-power mode, heterogeneous packaging structure).

[0086] Therefore, the present disclosure provides a UCIe-based data link test method, device and chip. By using the eye diagram inspection result, a data channel with sufficient eye diagram opening is selected to ensure that the selected data channel has sufficient voltage noise margin and clock offset margin, and finally to help improve the ability of the selected chiplet to resist crosstalk, power noise, jitter, temperature drift, clock offset, etc., so as to help ensure the stable communication rate of the selected link.

[0087] Figure 2 is a flowchart of a UCIe-based data link test method according to an illustrative embodiment. As shown in Figure 2 the data link test method mainly includes the following steps 201 to 204.

[0088] Step 201, the local chiplet obtains the eye diagram inspection result associated with any one of the data channels in the data link returned by the remote chiplet, the eye diagram inspection result being at least one of an eye height inspection result based on eye height scanning and an eye width inspection result based on eye width scanning;

[0089] Step 202, according to the eye diagram inspection result and the preset eye diagram threshold interval parameter, determine whether the eye diagram inspection result conforms to the interval range allowed by the eye diagram threshold interval parameter, wherein the eye diagram threshold interval parameter is at least one of an eye height threshold interval and an eye width threshold interval;

[0090] Step 203, in the case where the eye diagram inspection result conforms to the interval range allowed by the eye diagram threshold interval parameter, determine any one of the data channels as a qualified channel;

[0091] Step 204, in the case where the eye diagram inspection result does not conform to the interval range allowed by the eye diagram threshold interval parameter, determine any one of the data channels as an unqualified channel.

[0092] In the illustrative embodiment, eye height scanning refers to gradually increasing the voltage according to a set step size from the preset lowest voltage to the highest voltage, and sending test data based on different voltages. In the illustrative embodiment, eye width scanning refers to gradually increasing the clock phase according to a set phase step size from the preset minimum clock phase to the maximum clock phase, and sending test data based on different clock phases.

[0093] In combination with UCIe, the UCIe-based data link test method of the embodiments of the present disclosure can be applied to the LINK SPEED sub-state stage of the LTSM, and can select a data channel with high quality in cooperation with the bit error rate judgment performed in the LINK SPEED sub-state by the related UCIe protocol.

[0094] In the illustrative embodiment, in step 201, the eye diagram check result can be returned to the local die by the remote die through the sideband specified by UCIe.

[0095] In the illustrative embodiment, the eye diagram refers to repeatedly superimposing the received waveforms of multiple bit periods on the same graph according to the symbol period to form a graph like an “eye”, and the eye diagram is used to expand the voltage-time characteristics of the signal at one time with a graph similar to the shape of an eye, which can be used to quickly judge the quality of the communication link. The parameters of the eye diagram include eye height and eye width, where the eye height is the voltage represented by the region between the upper and lower boundaries of the eye diagram, and the eye height represents the voltage noise margin. The larger the eye height, the stronger the anti-crosstalk, reflection, and power noise capability. The eye width is the time range on the time axis between the left and right boundaries of the eye diagram that can ensure correct sampling, and the eye width represents the ability of the system to resist inter-symbol interference and jitter, as well as the time margin for correct sampling. The larger the eye width, the more sufficient the anti-jitter capability of the system. As can be seen, selecting a data channel with a large eye opening degree helps the selected data link to maintain a sufficient stable communication rate and be subjected to a small enough interference. Because the parameters of the eye diagram include the eye height and the eye width, in the illustrative embodiment, at least one of the eye height and the eye width can be judged for different purposes. In the preferred embodiment, in order to ensure that the selected data link maintains a sufficient stable communication rate and is subjected to a small enough interference, the eye height and the eye width are comprehensively judged.

[0096] Figure 3 FIG. 2B is a schematic diagram of a step of determining whether the eye diagram check result meets the interval range allowed by the eye diagram threshold interval parameter according to the eye height check result, according to an illustrative embodiment. As shown in FIG. 2B, in the illustrative embodiment, when the eye diagram check result includes the eye height check result, step 202 can specifically include steps 301 to 303. Figure 3

[0097] Step 301: comparing the eye height interval in which the eye height check result with a pass is located and the eye height threshold interval;

[0098] Step 302: in the case where the eye height interval in which the eye height check result with a pass is located completely covers the eye height threshold interval, determining that the eye diagram check result meets the interval range allowed by the eye diagram threshold interval parameter;

[0099] ​Step 303, in the case that the eye height interval where the content of the eye height test result is located does not completely cover the eye height threshold interval, the eye diagram test result is determined as not meeting the interval range allowed by the eye diagram threshold interval parameter.

[0100] The eye height test result is obtained by comparing the code pattern of the training sequence received by the remote chip from the local chip through the data channel under test with the code pattern of the training sequence stored by the remote chip, and the local chip sends the code pattern of the training sequence to the remote chip based on different signal voltages through the voltage scanning algorithm and through the data channel under test. The code pattern of the training sequence sent by the local chip to the remote chip is the same as the code pattern of the training sequence stored by the remote chip. In the case that the local chip sends the code pattern of the training sequence to the remote chip based on different signal voltages, the code pattern of the training sequence received by the remote chip may be incorrect due to the change of the signal voltage, and this error can be confirmed by comparing the received code pattern of the training sequence with the code pattern of the training sequence stored by the remote chip itself. The signal voltage corresponding to the incorrect code pattern of the training sequence received by the remote chip is in the over-high voltage interval or the over-low voltage interval, and the signal voltage corresponding to the correct code pattern of the training sequence received by the remote chip is between the over-high voltage interval and the over-low voltage interval, i.e. between the upper boundary and the lower boundary of the eye diagram.

[0101] In the illustrative embodiment, the content of the eye height test result includes “pass” or “fail”. The content of the eye height test result as pass indicates that the comparison result of the code pattern of the training sequence by the remote chip is consistent, and the content of the eye height test result as fail indicates that the comparison result of the code pattern of the training sequence by the remote chip is inconsistent. The content of the eye height test result by the local chip can know the range of the signal voltage when the remote chip correctly receives the code pattern of the training sequence.

[0102] Suppose that the eye height interval where the content of the eye height test result as pass is located is the voltage range from the first voltage to the second voltage, or the eye height value is the voltage range from the first voltage to the second voltage, and the eye height threshold interval is the voltage range from the third voltage to the fourth voltage. If the comparison result obtained by step 301 is that the first voltage is less than the third voltage, the third voltage is less than the fourth voltage, and the fourth voltage is less than the second voltage, then this satisfies the case that the eye height interval where the content of the eye height test result as pass is located completely covers the eye height threshold interval in step 302. If the comparison result obtained by step 301 is not that the first voltage is less than the third voltage, the third voltage is less than the fourth voltage, and the fourth voltage is less than the second voltage, then the case that the eye height interval where the content of the eye height test result as pass is located completely covers the eye height threshold interval in step 302 is not satisfied.

[0103] In an illustrative embodiment, in connection with the related art of UCIe, the eye height value of each data lane is derived from the reference voltage scan algorithm (Vref Training) of the MBTRAIN.DATATRAINVREF phase (i.e. the main band training-data training reference voltage phase) of the link training. The reference voltage scan algorithm initiates an eye scan by the local die, scans the entire reference voltage range, and obtains the pass interval of the reference voltage (Vref) (i.e. the range of the eye height) by the result of the related data check circuit of the remote die.

[0104] Figure 4 is a schematic diagram of a step of determining whether the eye pattern check result is within the range allowed by the eye pattern threshold interval parameter according to an illustrative embodiment, as shown in Figure 4 In an illustrative embodiment, in the case that the eye pattern check result includes the eye width check result, step 202 can specifically include steps 401 to 403 as follows.

[0105] Step 401, compare the eye width interval in which the eye width check result with the pass content is located and the eye width threshold interval;

[0106] Step 402, in the case that the eye width interval in which the eye width check result with the pass content is located completely covers the eye width threshold interval, determine that the eye pattern check result is within the range allowed by the eye pattern threshold interval parameter;

[0107] Step 403, in the case that the eye width interval in which the eye width check result with the pass content is located does not completely cover the eye width threshold interval, determine that the eye pattern check result is not within the range allowed by the eye pattern threshold interval parameter.

[0108] The eye width check result is also obtained by comparing the code pattern of the training sequence received by the remote chip from the data channel under test with the code pattern of the training sequence stored in the remote chip, and the code pattern of the training sequence sent by the local chip to the remote chip is based on the data transmission clock signals with different phases and is sent to the remote chip through the data channel under test by performing the phase interpolation scanning algorithm. The code pattern of the training sequence sent by the local chip to the remote chip is the same as the code pattern of the training sequence stored in the remote chip. In the case that the local chip sends the code pattern of the training sequence to the remote chip based on the data transmission clock signals with different phases, the code pattern of the training sequence received by the remote chip may be incorrect due to the phase mismatch between the data receiving clock signal and the data transmission clock signal, and this error can be confirmed by comparing the received code pattern of the training sequence with the code pattern of the training sequence stored in the remote chip. The phase of the data transmission clock signal corresponding to the incorrect code pattern of the training sequence received by the remote chip is in the left phase interval or the right phase interval, and the phase of the data transmission clock signal corresponding to the correct code pattern of the training sequence received by the remote chip is between the left phase interval and the right phase interval, i.e. between the left boundary and the right boundary of the eye diagram.

[0109] In the illustrative embodiment, the content of the eye width check result also includes “pass” or “fail”. The content of the eye width check result is pass, indicating that the comparison result of the remote chip for the code pattern of the training sequence is consistent, and the content of the eye width check result is fail, indicating that the comparison result of the remote chip for the code pattern of the training sequence is inconsistent. The local chip can know the range of the data transmission clock signal phase when the remote chip correctly receives the code pattern of the training sequence through the content of the eye width check result.

[0110] Suppose that the eye width interval in which the eye width check result with the content of pass is located is the voltage range between the first phase and the second phase, or the phase range between the first phase and the second phase, and the eye width threshold interval is the phase range between the third phase and the fourth phase. If the comparison result obtained by step 401 is that the first phase is less than the third phase, the third phase is less than the fourth phase, and the fourth phase is less than the second phase, then this satisfies the case that the eye width interval in which the eye width check result with the content of pass is located completely covers the eye width threshold interval in step 402. If the comparison result obtained by step 401 is not that the first phase is less than the third phase, the third phase is less than the fourth phase, and the fourth phase is less than the second phase, then the case that the eye width interval in which the eye width check result with the content of pass is located completely covers the eye width threshold interval in step 402 is not satisfied.

[0111] In the illustrative embodiment, in association with the related art of UCIe, the eye width value of each data lane is derived from the phase interpolation scan algorithm (PI SCAN) of the MBTRAIN.DATATRAINCENTER1 stage (i.e., the main band training-data training center 1 stage) of the link training. The phase interpolation scan algorithm initiates an eye scan by a local chip grain, scans the entire phase interpolation (PI) range, and obtains the passing interval of the phase, i.e., the range of the eye width, through the results of the associated data check circuit of a remote chip grain.

[0112] In the related art, in the LINKSPEED sub-state in UCIe, whether a data lane can normally transmit data at the current communication rate is evaluated by the bit error rate, for example, by comparing the bit error rate with a preset decision threshold (e.g., 10 -15 ). If the bit error rate of a data lane at the current communication rate is lower than the decision threshold, it is considered that the data lane can normally work at the current communication rate. Finally, the working rate of the entire link is determined by the lowest supportable communication rate of all data lanes. Based on this, in the illustrative embodiment, the UCIe-based data link test method of the present embodiment can be compatible with the bit error rate evaluation of UCIe. Figure 5 is a schematic diagram of a bit error rate-based judgment process according to an illustrative embodiment. As shown in Figure 5 In the illustrative embodiment, the UCIe-based data link test method of the present embodiment can further include the following steps 501 to 504.

[0113] Step 501, performing bit error rate analysis of any one data lane to obtain the bit error rate of the data lane;

[0114] Step 502, determining whether the bit error rate is lower than a preset bit error rate threshold value according to the bit error rate and the bit error rate threshold value;

[0115] Step 503, in the case where the bit error rate is lower than the bit error rate threshold value, determining the data lane as a qualified lane;

[0116] Step 504, in the case where the bit error rate is not lower than the bit error rate threshold value, determining the data lane as an unqualified lane.

[0117] In the related art of UCIe, in the illustrative embodiment, step 501 can include: the local chip sending a test pattern (for example, a LFSR (Linear Feedback Shift Register) test pattern) for error rate analysis to the remote chip through any one data channel, the remote chip generating the same test pattern as the test pattern sent by the local chip, and comparing the received test pattern with the generated test pattern bit by bit to obtain the error rate of the any one data channel.

[0118] In the related art of UCIe, steps 502 to 504 can be implemented in the remote chip, and the remote chip feeds back information about whether the any one data channel is a qualified channel to the local chip through a sideband.

[0119] In the illustrative embodiment, the eye diagram checking result judgment process of steps 201 to 204 and the error rate judgment process of steps 501 to 504 can be combined to determine whether the any one data channel is a qualified channel.

[0120] In the related art of UCIe, in addition to data channels, the data link between the local chip and the remote chip also includes backup data channels, which can be replaced when a data channel is disconnected or the error rate does not meet the requirements. On this basis, in the illustrative embodiment, the UCIe-based data link test method of the present disclosure can further include: in the case that the any one data channel is determined to be an unqualified channel and there is a qualified backup data channel that can be replaced, replacing the any one data channel with the qualified backup data channel.

[0121] In the illustrative embodiment, the qualified backup data channel that can be replaced refers to a backup data channel that is confirmed to be a qualified channel through the eye diagram checking result judgment process of steps 201 to 204 of the UCIe-based data link test method of the present disclosure, and further includes a backup data channel that is confirmed to be a qualified channel through the error rate judgment process of steps 501 to 504.

[0122] In the illustrative embodiment, when a certain data channel between the local chiplet and the remote chiplet is a disqualified channel and there is no alternative qualified backup data channel, the data link between the local chiplet and the remote chiplet cannot meet the minimum requirement of the current communication rate, and based on UCIe, the data link between the local chiplet and the remote chiplet can be downgraded in communication rate, and after the downgrade, the link training is performed again based on the new communication rate, or the retraining process can be performed to try again whether normal communication can be achieved at the current communication rate. Based on this, in the illustrative embodiment, the UCIe-based data link test method of the present disclosure can further include: in the case where any data channel is determined to be a disqualified channel and there is no alternative qualified backup data channel, performing the downgraded communication of the data link or performing the retraining process of the data link.

[0123] In the illustrative embodiment, the UCIe-based data link test method of the present disclosure can be performed in response to the received eye diagram test start instruction. The eye diagram test start instruction can be sent to the local chiplet by software means so that the local chiplet and the remote chiplet perform the UCIe-based data link test method of the present disclosure in the link training phase, for example, in the LINKSPEED sub-state, which helps to improve the flexibility of the configuration of the link training.

[0124] In the illustrative embodiment, the eye diagram scanning before obtaining the eye diagram test data can be performed on the local chiplet side. In the illustrative embodiment, the eye diagram check result includes an eye diagram check result with a pass content and an eye diagram check result with a fail content. Figure 6 is a process diagram for obtaining an eye diagram check result according to an illustrative embodiment, as Figure 6 As shown in the illustrative embodiment, the UCIe-based data link test method of the present disclosure further includes steps 601 to 604.

[0125] Step 601, in response to the received eye diagram test start instruction, the local chiplet performs eye diagram scanning and sends eye diagram test data to the remote chiplet through any data channel, wherein the remote chiplet stores the same copy data as the eye diagram test data;

[0126] Step 602, the remote chiplet receives the eye diagram test data and compares the received eye diagram test data with the copy data;

[0127] Step 603, in the case where the received eye diagram test data is the same as the copy data, the remote chiplet returns an eye diagram check result with a pass content to the local chiplet;

[0128] Step 604, in the case that the received eye diagram test data is not identical to the copy data, the remote chiplet returns an eye diagram check result with a fail content to the local chiplet.

[0129] In the illustrative embodiment, in the case that the eye diagram scan is an eye height scan, the eye diagram check result is an eye height check result, and in the case that the eye diagram scan is an eye width scan, the eye diagram check result is an eye width check result.

[0130] The above steps 601 to 604 can be implemented in the LINKSPEED sub-state phase, and in combination with the eye diagram judgment process of steps 201 to 204 to test any data lane, and can be implemented in the LINKSPEED sub-state phase in combination with the error rate judgment process of steps 501 to 504 to test any data lane.

[0131] Figure 7 is a schematic diagram of the comparison between the eye diagram check result and the eye diagram threshold interval parameter in the UCIe-based data link test method implemented by the present disclosure. Figure 7 In the illustrated embodiment, the data lanes include a first data lane, a second data lane, …, an nth data lane, and a backup data lane. The eye diagram check result of the first data lane is less than the interval range allowed by the eye diagram threshold interval parameter, and the eye diagram check results of the second data lane to the nth data lane and the backup data lane are all greater than the interval range allowed by the eye diagram threshold interval parameter. Therefore, the backup data lane is replaced by the first data lane for data communication.

[0132] The UCIe-based data link test method of the embodiments of the present disclosure selects a data channel with a large enough eye opening that meets the eye threshold interval parameter requirement for data communication of the local die and the remote die based on the judgment of the eye diagram inspection result, ensures that the selected data channel has sufficient voltage noise margin and clock offset margin, so that the selected data channel has higher tolerance and better robustness to signal jitter, noise, crosstalk, reflection, temperature drift, clock drift, etc., and improves the reliability of data communication of the data link after link training in UCIe in combination with the judgment of the bit error rate, which helps to stabilize the communication rate of the data link and can be compatible with related UCIe protocols. In addition, the eye diagram test start instruction is triggered for execution, and then the local die and the remote die can execute the UCIe-based data link test method of the embodiments of the present disclosure in the link training stage through software means, which helps to improve the flexibility of the configuration of the link training. When the data channel is determined to be an unqualified channel, the unqualified channel is replaced with a qualified backup data channel in the case that there is a replaceable qualified backup data channel, which fully utilizes the backup channel resources, and in the case that there is no replaceable qualified backup data channel, the data link is executed for frequency reduction communication or retraining process, which can realize flexible configuration according to the communication strategy requirement.

[0133] Figure 8 is a structural schematic diagram of a UCIe-based data link test device according to an illustrative embodiment, as shown in Figure 8 The UCIe-based data link test device mainly includes a receiving module 801, an analysis module 802 and a determination module 803. The receiving module 801 is located in the local die 810 and is used to obtain the eye diagram inspection result associated with any one of the data channels in the data link returned by the remote die 820, the eye diagram inspection result being at least one of the eye height inspection result based on eye height scanning and the eye width inspection result based on eye width scanning. The analysis module 802 is located in the local die 810 and is used to determine whether the eye diagram inspection result conforms to the interval range allowed by the eye threshold interval parameter according to the eye diagram inspection result and the preset eye threshold interval parameter, wherein the eye threshold interval parameter is at least one of the eye height threshold interval and the eye width threshold interval. The determination module 803 is located in the local die 810 and is used to determine any one of the data channels as a qualified channel in the case that the eye diagram inspection result conforms to the interval range allowed by the eye threshold interval parameter, and determine any one of the data channels as an unqualified channel in the case that the eye diagram inspection result does not conform to the interval range allowed by the eye threshold interval parameter.

[0134] In an illustrative embodiment, the UCIe-based data link test device further comprises a sending module 804, a data comparison module 805 and a result feedback module 806. The sending module 804 is located in the local chiplet 810 and is configured to send the eye diagram test data to the remote chiplet 820 through any data channel. The data comparison module 805 is located in the remote chiplet and is configured to store a copy of the eye diagram test data, receive the eye diagram test data and compare the received eye diagram test data with the copy. The result feedback module 806 is located in the remote chiplet and is configured to return an eye diagram test result with a pass content to the local chiplet 810 if the received eye diagram test data is the same as the copy, and return an eye diagram test result with a fail content to the local chiplet 810 if the received eye diagram test data is not the same as the copy.

[0135] In an illustrative embodiment, the UCIe-based data link test device further comprises a parameter configuration module 807. The parameter configuration module 807 is located in the local chiplet 810 and is configured to configure the eye diagram threshold interval parameter.

[0136] In an illustrative embodiment, the UCIe-based data link test device further comprises a control module 808. The control module 808 is located in the local chiplet 810 and is coupled to the sending module 804, the receiving module 801, the analysis module 802, the determination module 803 and the parameter configuration module 807, and is configured to receive an instruction and start or stop the eye diagram scan according to the instruction, control the parameter configuration module 807 to configure the eye diagram threshold interval parameter, and control the sending module 804, the receiving module 801, the analysis module 802 and the determination module 803 to start or stop the data link test according to the instruction. In an illustrative embodiment, when the instruction is an eye diagram test start instruction, the control module 808 starts the eye diagram scan and controls the sending module 804, the receiving module 801, the analysis module 802 and the determination module 803 to start the data link test. In an illustrative embodiment, when the instruction is an eye diagram test stop instruction, the control module 808 stops the eye diagram scan and controls the sending module 804, the receiving module 801, the analysis module 802 and the determination module 803 to stop the data link test.

[0137] As to the UCIe-based data link test device in the above embodiments, the specific manner in which each unit performs the operation has been described in detail in the embodiments of the UCIe-based data link test method, and will not be described in detail here.

[0138] In the illustrative embodiments, the implementation of at least one of the receiving module 801, the analyzing module 802, the determining module 803, the sending module 804, the data comparing module 805, the result feedback module 806, the parameter configuring module 807, and the controlling module 808 can be a combination of hardware, firmware, and software (i.e., programs) according to different designs.

[0139] In the hardware form, at least one of the receiving module 801, the analyzing module 802, the determining module 803, the sending module 804, the data comparing module 805, the result feedback module 806, the parameter configuring module 807, and the controlling module 808 can be implemented as logic circuits on an integrated circuit. For example, the functions of at least one of the receiving module 801, the analyzing module 802, the determining module 803, the sending module 804, the data comparing module 805, the result feedback module 806, the parameter configuring module 807, and the controlling module 808 can be implemented as various logic blocks, modules, and circuits in one or more hardware controllers, microcontrollers, hardware processors, microprocessors, ASICs, DSPs, FPGAs, CPUs, or other processing units. The functions of at least one of the receiving module 801, the analyzing module 802, the determining module 803, the sending module 804, the data comparing module 805, the result feedback module 806, the parameter configuring module 807, and the controlling module 808 can be implemented as hardware circuits, such as various logic blocks, modules, and circuits in an integrated circuit, using hardware description languages (e.g., Verilog HDL or VHDL) or other suitable programming languages.

[0140] In software or firmware form, the functions of at least one of the receiving module 801, the analyzing module 802, the determining module 803, the sending module 804, the data comparison module 805, the result feedback module 806, the parameter configuration module 807, and the control module 808 can be implemented as programming codes. For example, at least one of the receiving module 801, the analyzing module 802, the determining module 803, the sending module 804, the data comparison module 805, the result feedback module 806, the parameter configuration module 807, and the control module 808 can be implemented by using general programming languages (such as C, C++, or assembly language) or other suitable programming languages. The programming codes can be recorded, stored in a non-transitory machine-readable storage medium. In some embodiments, the non-transitory machine-readable storage medium includes, for example, semiconductor memories and / or storage devices. An electronic device (such as a CPU, a hardware controller, a microcontroller, a hardware processor, or a microprocessor) can read and execute the programming codes from the non-transitory machine-readable storage medium, thereby implementing the functions of at least one of the receiving module 801, the analyzing module 802, the determining module 803, the sending module 804, the data comparison module 805, the result feedback module 806, the parameter configuration module 807, and the control module 808.

[0141] In illustrative embodiments, the UCIe-based data link test method and the UCIe-based data link test device according to the embodiments of the present disclosure are applicable to SoC chips, etc., where the SoC chip can be any one of a CPU (Central Processing Unit), a GPU (Graphics Processing Unit), a TPU (Tensor Processing Unit), a NPU (Neural network Processing Unit), a DPU (Deep learning Processing Unit), an APU (Accelerated Processing Unit), and a GPGPU (General-Purpose computing on Graphics Processing Unit).

[0142] In illustrative embodiments, a chip is also provided, which includes the UCIe-based data link test device according to any one of the embodiments described above.

[0143] The UCIe-based data link test method, device and chip provided by the embodiments of the present disclosure provide a data channel selection and replacement mechanism based on signal quality evaluation, are compatible with UCIe, can identify and replace low-quality data channels in the LINK SPEED sub-state of UCIe, preferentially use data channels with larger eye diagrams and higher signal quality for data transmission, and not only help to improve the available bandwidth and stability of the data link, but also have high configurability, for example, the data link test based on eye diagram scanning can be started or stopped as needed, so as to better meet the high-performance requirements of UCIe in chip-to-chip interconnection. In addition, the embodiments of the present disclosure can be closely combined with the link training process of UCIe, that is, efficient link management capability can be realized, and are suitable for advanced chip design scenarios such as multi-data channel parallel transmission and heterogeneous packaging architecture.

[0144] In one specific application scenario implementation of the UCIe-based data link test method, device and chip of the present disclosure, the following three stages can be divided.

[0145] Stage one: test data sending stage. In this stage, according to the provisions of the UCIe protocol, the local chip sends eye diagram test data to the remote chip through the tested data channel, waits for the remote chip to receive and return the eye diagram inspection result, and according to the provisions of the UCIe protocol, the local chip also sends test code patterns for bit error rate analysis to the remote chip through the tested data channel, and waits for the remote chip to receive and return the bit error rate.

[0146] Stage two: data channel quality judgment stage. In this stage, the local chip judges based on the eye diagram inspection result and the bit error rate returned by the remote chip, in combination with the set eye diagram threshold interval parameters (including the eye height threshold interval and the eye width threshold interval) and the bit error rate threshold value, determines that the data channel that meets the requirements of the eye diagram threshold interval parameters and the bit error rate threshold value at the same time is a qualified channel, otherwise it is an unqualified channel.

[0147] Stage three: replaceable data channel inspection stage. In this stage, it is checked whether there is a replaceable standby data channel. If there is a replaceable standby data channel, the LTSM state machine jumps to the REPAIR (repair) state specified by UCIe to replace the channel, otherwise the data link is processed for speed reduction.

[0148] Figure 9 is a state machine schematic diagram in one specific application scenario of the UCIe-based data link test method, device and chip of the present disclosure, as Figure 9As shown, the state machine 910 includes a main state machine control module 901, a test data sending module 902, a link quality checking module 903, and a threshold configuration module 904.

[0149] The main state machine control module 901 is responsible for coordinating the workflow of other modules as the core controller of the communication link selection, and can interact deeply with the UCIe protocol state machine (especially the LINKSPEED sub-state). The state machine 910 includes an initialization (INIT) state, a training (TRAIN) state, an assessment (ASSESS) state, and a switching (SWITCH) state. The initialization state is used to initialize the link topology, the training state is used to start the training mode, the assessment state is used to trigger the link quality assessment, and the switching state is used to perform the link switching. In the assessment state, the UCIe-based data link test method and device of the embodiment of the present disclosure is used to test the data link, and when it is detected that the eye diagram check result does not conform to the interval range allowed by the eye diagram threshold interval parameter, the switching state is automatically jumped to. The test data sending module 902 is used to send test data, and can use the PRBS (pseudo-random binary sequence) test data sending module 902 of the related UCIe. The link quality checking module 903 is used to receive the test data check result and perform eye diagram comparison judgment and bit error rate judgment. This module is the intelligent decision center of the link quality assessment, is responsible for managing the judgment standard of the signal quality, is responsible for the precise diagnosis of the link signal health, and realizes the quality assessment in multiple dimensions. The test data check result includes the eye diagram check result and the bit error rate. The threshold configuration module 904 can be used to configure the eye diagram threshold interval parameter.

[0150] Figure 10 is the application scenario process block diagram of the link quality checking module for performing the link quality multi-dimensional checking, as shown in Figure 10 As shown, the process mainly includes the following steps 1001 to 1008.

[0151] Step 1001, receive the check data of the current data channel from the remote chip, and then perform steps 1002, 1003, and 1004.

[0152] The check data includes the eye diagram check result and the bit error rate, wherein the eye diagram check result includes the eye height check result based on the eye height scanning and the eye width check result based on the eye width scanning.

[0153] Step 1002, compare the eye height check result with the eye height threshold interval, and then perform step 1005.

[0154] Step 1003, compare the eye width check result with the eye width threshold interval, and then perform step 1006.

[0155] Step 1004: Compare the bit error rate with the bit error rate threshold, and then proceed to step 1007.

[0156] Step 1005: Determine whether the current data channel is a qualified channel based on the eye height comparison results, and then proceed to step 1008.

[0157] Step 1006: Determine whether the current data channel is a qualified channel based on the eye width comparison result, and then proceed to step 1008.

[0158] Step 1007: Determine whether the current data channel is a qualified channel based on the bit error rate comparison result, and then proceed to step 1008.

[0159] Step 1008: Determine whether the current data channel is a qualified channel based on the combined results of eye height comparison, eye width comparison, and bit error rate comparison.

[0160] If at least one of the eye height comparison result, eye width comparison result, and bit error rate comparison result determines the current data channel as an unqualified channel, then the current data channel is ultimately determined to be an unqualified channel. If all three of the eye height comparison result, eye width comparison result, and bit error rate comparison result determine the current data channel as a qualified channel, then the current data channel is ultimately determined to be a qualified channel.

[0161] In an illustrative embodiment, the link quality inspection module 903 can enable or disable the eye diagram judgment process in steps 1002, 1005, 1003, and 1006 according to the software configuration.

[0162] like Figure 9 As shown, the eye height check result in the eye diagram examination results can be implemented using the UCIe reference voltage scanning algorithm (Vref Training). The eye height value of each data channel originates from the reference voltage scanning algorithm in the link training stage MBTRAIN.DATATRAINVREF (main band training.data training reference voltage). The reference voltage scanning algorithm initiates a local core eye diagram scan to scan the entire reference voltage range (eye height range), and obtains the eye height check result through the data inspection circuit of the remote core. The eye width check result in the eye diagram examination results can be implemented using the UCIe phase interpolation scanning algorithm (PI SCAN). The eye width value of each data channel originates from the phase interpolation scanning algorithm in the link training stage MBTRAIN.DATATRAINCENTER1 (main band training.data training center 1). The phase interpolation scanning algorithm initiates a local core eye diagram scan to scan the entire phase interpolation (PI) range (eye width range), and obtains the eye width check result through the data inspection circuit of the remote core.

[0163] The above description is only the preferred embodiment of the present disclosure, and is not intended to limit the present disclosure. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present disclosure shall be included in the scope of protection of the present disclosure.

Claims

1. A UCIe-based data link test method, characterized by, The method comprises the following steps: acquiring an eye diagram inspection result associated with any one of data channels in a data link, the eye diagram inspection result being at least one of an eye height inspection result based on eye height scanning and an eye width inspection result based on eye width scanning, the eye diagram inspection result being acquired from a local core grain and returned from a remote core grain; determining whether the eye diagram inspection result is within a range allowed by preset eye diagram threshold interval parameters according to the eye diagram inspection result and the eye diagram threshold interval parameters, the eye diagram threshold interval parameters being at least one of an eye height threshold interval and an eye width threshold interval; performing bit error rate analysis on the any one of data channels to obtain a bit error rate of the any one of data channels, and determining whether the bit error rate is lower than a preset bit error rate threshold value according to the bit error rate and the bit error rate threshold value; in a case where the eye diagram inspection result is within the range allowed by the eye diagram threshold interval parameters and the bit error rate is lower than the bit error rate threshold value, determining the any one of data channels as a qualified channel; in a case where the eye diagram inspection result is not within the range allowed by the eye diagram threshold interval parameters and / or the bit error rate is not lower than the bit error rate threshold value, determining the any one of data channels as an unqualified channel; in a case where the any one of data channels is determined as the unqualified channel and there is a qualified backup data channel, replacing the any one of data channels with the qualified backup data channel.

2. The UCIe-based data link test method of claim 1, wherein, in a case where the eye diagram inspection result comprises the eye height inspection result, the determining whether the eye diagram inspection result is within the range allowed by the eye diagram threshold interval parameters according to the eye diagram inspection result and the eye diagram threshold interval parameters comprises: comparing an eye height interval in which a passing eye height inspection result is located and the eye height threshold interval; in a case where the eye height interval in which the passing eye height inspection result is located completely covers the eye height threshold interval, determining that the eye diagram inspection result is within the range allowed by the eye diagram threshold interval parameters; in a case where the eye height interval in which the passing eye height inspection result is located does not completely cover the eye height threshold interval, determining that the eye diagram inspection result is not within the range allowed by the eye diagram threshold interval parameters.

3. The UCIe-based data link test method of claim 1, wherein, in a case where the eye diagram inspection result comprises the eye width inspection result, the determining whether the eye diagram inspection result is within the range allowed by the eye diagram threshold interval parameters according to the eye diagram inspection result and the eye diagram threshold interval parameters comprises: comparing an eye width interval in which a passing eye width inspection result is located and the eye width threshold interval; in a case where the eye width interval in which the passing eye width inspection result is located completely covers the eye width threshold interval, determining that the eye diagram inspection result is within the range allowed by the eye diagram threshold interval parameters; in a case where the eye width interval in which the passing eye width inspection result is located does not completely cover the eye width threshold interval, determining that the eye diagram inspection result is not within the range allowed by the eye diagram threshold interval parameters.

4. The UCIe-based data link test method of claim 1, wherein, The UCIe-based data link test method further comprises: In the case that the arbitrary data lane is determined as the unqualified lane and there is no alternative qualified standby data lane, performing a reduced-rate communication of the data link or performing a retraining process of the data link.

5. The UCIe-based data link test method according to claim 1, wherein: The UCIe-based data link test method is performed in response to a received eye diagram test start instruction.

6. The UCIe-based data link test method of claim 1, wherein, The UCIe-based data link test method further comprises: In response to the received eye diagram test start instruction, the local chip performs an eye diagram scan and sends eye diagram test data to the remote chip through the arbitrary data lane, wherein the remote chip stores the same copy data as the eye diagram test data; The remote chip receives the eye diagram test data and compares the received eye diagram test data with the copy data; In the case that the received eye diagram test data is the same as the copy data, the remote chip returns an eye diagram check result with a pass content to the local chip; In the case that the received eye diagram test data is not the same as the copy data, the remote chip returns an eye diagram check result with a fail content to the local chip.

7. The UCIe-based data link test method according to claim 6, wherein: In the case that the eye diagram scan is an eye height scan, the eye diagram check result is the eye height check result, and in the case that the eye diagram scan is an eye width scan, the eye diagram check result is the eye width check result.

8. A UCIe-based data link test apparatus, characterized by, Comprise: A receiving module located at a local chip, configured to acquire an eye diagram check result associated with an arbitrary data lane in a data link and a bit error rate returned by a remote chip, the eye diagram check result being at least one of an eye height check result based on an eye height scan and an eye width check result based on an eye width scan, wherein the bit error rate is obtained by performing a bit error rate analysis of the arbitrary data lane; An analyzing module located at the local chip, configured to determine whether the eye diagram check result conforms to an interval range allowed by an eye diagram threshold interval parameter according to the eye diagram check result and the eye diagram threshold interval parameter, wherein the eye diagram threshold interval parameter is at least one of an eye height threshold interval and an eye width threshold interval; A determining module located at the local chip, configured to determine the arbitrary data lane as a qualified lane in the case that the eye diagram check result conforms to the interval range allowed by the eye diagram threshold interval parameter and the bit error rate is lower than a preset bit error rate threshold value, and determine the arbitrary data lane as an unqualified lane in the case that the eye diagram check result does not conform to the interval range allowed by the eye diagram threshold interval parameter and / or the bit error rate is not lower than the bit error rate threshold value; In the case that the arbitrary data lane is determined as the unqualified lane and there is an alternative qualified standby data lane, the arbitrary data lane is replaced by the qualified standby data lane.

9. The UCIe-based data link test device of claim 8, wherein, The UCIe-based data link test device further comprises: a sending module located at the local kernel, configured to send eye pattern test data to the remote kernel through the arbitrary data channel; a data comparison module located at the remote kernel, configured to store copy data identical to the eye pattern test data, receive the eye pattern test data and compare the received eye pattern test data with the copy data; a result feedback module located at the remote kernel, configured to return an eye pattern inspection result with a pass content to the local kernel in the case that the received eye pattern test data is identical to the copy data, and return an eye pattern inspection result with a fail content to the local kernel in the case that the received eye pattern test data is not identical to the copy data.

10. The UCIe-based data link test apparatus of claim 8, wherein, The UCIe-based data link test device further comprises: a parameter configuration module located at the local kernel, configured to configure the eye pattern threshold interval parameter.

11. The UCIe-based data link test apparatus of claim 9, wherein, The UCIe-based data link test device further comprises: a control module located at the local kernel and coupled to the sending module, the receiving module, the analysis module and the determination module, configured to receive an instruction and start or stop eye pattern scanning according to the instruction, and control the sending module, the receiving module, the analysis module and the determination module to start or stop data link test according to the instruction.

12. A chip, characterized by The UCIe-based data link test device comprises any one of claims 8 to 11.

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