Defect imaging system, defect detection method, equipment and storage medium

Abstract

The invention provides a defect imaging system, a defect detection method, equipment and a storage medium. The system comprises a first light-emitting module, a second light-emitting module and an imaging module, the imaging module, the first light-emitting module and the second light-emitting module are arranged in a split mode, and the first light-emitting module is fixedly connected with the second light-emitting module through the light-emitting base. The first light-emitting module is used for emitting a first light source to a to-be-detected object; the second light-emitting module is used for emitting a second light source to the to-be-detected object; the first light source and the second light source have different emission angles; and the imaging module is used for performing defect imaging on the to-be-detected object based on the reflection light source of the to-be-detected object for the first light source and the second light source. Defect imaging is carried out through the reflection light sources of the two light sources with different emission angles, imaging of the to-be-detected objects in different feeding modes can be considered, the limitation that a single light source can only carry out defect imaging in a single feeding mode is avoided, and accurate and efficient defect imaging is achieved.

Description

Technical Field

[0001] This application relates to the field of defect detection technology, and in particular to a defect imaging system, defect detection method, device and storage medium. Background Technology

[0002] In industrial defect detection processes, incoming products are typically scanned to determine if defects exist. Traditional defect detection equipment can only detect defects in one direction of feed. To avoid missed defects, it is usually necessary to add a detection station after the product is rotated 90° for two scans, which is not only inefficient but also wastes space and costs. Summary of the Invention

[0003] This application provides a defect imaging system, defect detection method, device, and storage medium to at least solve the above-mentioned technical problems existing in the prior art.

[0004] According to a first aspect of this application, a defect imaging system is provided, the system comprising a first light-emitting module, a second light-emitting module, and an imaging module; wherein the imaging module is separately disposed from the first light-emitting module and the second light-emitting module, and the first light-emitting module is fixedly connected to the second light-emitting module via a light-emitting base;

[0005] The first light-emitting module is used to emit a first light source toward the object to be detected;

[0006] The second light-emitting module is used to emit a second light source toward the object to be detected; the emission angles of the first light source and the second light source are different;

[0007] The imaging module is used to perform defect imaging on the object to be inspected based on the reflected light from the first light source and the second light source.

[0008] In one possible embodiment, the first light-emitting module includes a first light-emitting unit, and the second light-emitting module includes a second light-emitting unit; wherein,

[0009] The first light-emitting unit is used to vertically emit a first light source toward the object to be detected;

[0010] The second light-emitting unit is used to emit a second light source at an angle toward the object to be detected; the first light-emitting unit and the second light-emitting unit alternately flash to emit either the first light source or the second light source.

[0011] In one possible embodiment, the first light-emitting module further includes a first light-shielding plate and a first lamp plate; the first light-shielding plate is fixed to the side of the first lamp plate by screws, and the first lamp plate is fixed to the light-emitting base by screws; wherein...

[0012] The first light-shielding plate is used to isolate interfering light sources other than the first light source, and to control the light divergence angle of the first light source;

[0013] The first lamp board is used to support the first light-emitting unit.

[0014] In one possible embodiment, the second light-emitting module further includes a second light-shielding plate and a second lamp plate; the second light-shielding plate is fixed to the side of the second lamp plate by screws, and the second lamp plate is fixed to the light-emitting base by screws; wherein...

[0015] The second light-shielding plate is used to isolate interfering light sources other than the second light source, and to control the light divergence angle of the second light source;

[0016] The second lamp panel is used to support the second light-emitting unit.

[0017] In one possible implementation, the imaging module includes a lens module and an image generation unit;

[0018] The lens module is used to collect the reflected light from the object under test in relation to the first light source and the second light source;

[0019] The image generation unit is configured to generate a first defect image based on the reflected light source of the object to be detected relative to a first light source; and to generate a second defect image based on the reflected light source of the object to be detected relative to a second light source.

[0020] In one possible implementation, the image generation unit includes a first generation unit and a first synthesis unit;

[0021] The first generation unit is used to generate a first defect sub-image based on the reflected light source of the object to be detected against the first light source within any alternating strobe cycle;

[0022] The first synthesis unit is used to synthesize the first defect sub-images to obtain the first defect image.

[0023] In one possible implementation, the image generation unit includes a second generation unit and a second synthesis unit;

[0024] The second generation unit is used to generate a second defect sub-image based on the reflected light source of the object to be detected against the second light source within any alternating strobe cycle;

[0025] The second synthesis unit is used to synthesize the various second defect sub-images to obtain a second defect image.

[0026] In one embodiment, the number of the first light-emitting units is multiple, and the number of the second light-emitting units is multiple.

[0027] In one possible implementation, the angle between the emission angles of the first light source and the second light source satisfies a first preset range.

[0028] According to a second aspect of this application, a defect detection method is provided, the method being applied to the aforementioned defect imaging system, the method comprising:

[0029] A first light source is emitted towards the object to be detected through a first light-emitting module, and a second light source is emitted towards the object to be detected through a second light-emitting module; the emission angles of the first light source and the second light source are different.

[0030] The imaging module performs defect imaging on the object to be inspected based on the reflected light from the first light source and the second light source, and obtains the defect image.

[0031] Based on the defect image, defect detection is performed on the object to be detected, and the defect detection result is obtained.

[0032] In one embodiment, the first light-emitting module includes a first light-emitting unit, and the second light-emitting module includes a second light-emitting unit; the step of emitting a first light source to the object to be detected through the first light-emitting module and emitting a second light source to the object to be detected through the second light-emitting module includes:

[0033] A first light source is vertically emitted towards the object to be detected through a first light-emitting unit; and...

[0034] The second light source is emitted at an angle towards the object to be detected by the second light-emitting unit; the first light-emitting unit and the second light-emitting unit alternately flash to emit the first light source or the second light source.

[0035] In one embodiment, the first light-emitting module further includes a first light-shielding plate. Before the imaging module performs defect imaging on the object to be detected based on the reflected light from the first light source and the second light source to obtain a defect image, the method further includes:

[0036] The first light-shielding plate isolates interfering light sources other than the first light source and controls the light divergence angle of the first light source to a first preset angle.

[0037] In one embodiment, the second light-emitting module further includes a second light-shielding plate. Before the imaging module performs defect imaging on the object to be detected based on the reflected light from the first light source and the second light source to obtain a defect image, the method further includes:

[0038] The second light-shielding plate isolates interfering light sources other than the second light source and controls the light divergence angle of the second light source to a second preset angle.

[0039] In one embodiment, the imaging module includes a lens module and an image generation unit; the step of using the imaging module to perform defect imaging on the object to be detected based on the reflected light from the first light source and the second light source to obtain a defect image includes:

[0040] The lens module captures the reflected light from the object under test in relation to the first and second light sources.

[0041] A first defect image is generated by the image generation unit based on the reflected light source of the object to be detected relative to a first light source; and a second defect image is generated by the image generation unit based on the reflected light source of the object to be detected relative to a second light source.

[0042] The first defect image and the second defect image are used as defect images.

[0043] In one embodiment, the image generation unit includes a first generation unit and a first synthesis unit; the step of generating a first defect image based on the reflected light source of the object to be detected against a first light source by the image generation unit includes:

[0044] The first generation unit generates a first defect sub-image based on the reflected light source of the object to be detected against the first light source within any alternating strobe cycle.

[0045] The first defect image is obtained by synthesizing the first defect sub-images through the first synthesis unit.

[0046] In one embodiment, the image generation unit includes a second generation unit and a second synthesis unit; the step of generating a second defect image based on the reflected light source of the object to be detected against a second light source by the image generation unit includes:

[0047] The second generation unit generates a second defect sub-image based on the reflected light source of the object to be detected against the second light source within any alternating strobe cycle;

[0048] The second defect image is obtained by synthesizing the various second defect sub-images through the second synthesis unit.

[0049] In one possible implementation, the step of performing defect detection on the object to be detected based on the defect image to obtain a defect detection result includes:

[0050] Determine the type of defect to be detected for the object to be inspected;

[0051] Based on the geometric features of the defects corresponding to the detected defect type, candidate domains are filtered in the defect image. When a candidate domain exists in the first defect image or the second defect image in the defect image, a defect detection result is obtained indicating that the object to be detected has a defect.

[0052] In one possible implementation, it further includes:

[0053] When neither the first defect image nor the second defect image in the defect image has a candidate region, a defect detection result is obtained indicating that the object to be detected does not have a defect.

[0054] According to a third aspect of this application, an electronic device is provided, comprising:

[0055] At least one processor; and

[0056] A memory communicatively connected to the at least one processor; wherein,

[0057] The memory stores instructions that can be executed by the at least one processor to enable the at least one processor to perform the method described in this application.

[0058] According to a fourth aspect of this application, a non-transitory computer-readable storage medium is provided storing computer instructions for causing a computer to perform the methods described in this application.

[0059] In this application, the defect imaging system includes a first light-emitting module, a second light-emitting module, and an imaging module. The imaging module is separately configured from the first and second light-emitting modules, with the first light-emitting module fixedly connected to the second light-emitting module via a light-emitting base. The first light-emitting module emits a first light source towards the object to be inspected; the second light-emitting module emits a second light source towards the object to be inspected; the first and second light sources have different emission angles. The imaging module performs defect imaging on the object to be inspected based on the reflected light from the first and second light sources. This application uses reflected light from two light sources with different emission angles for defect imaging, enabling imaging of objects with different feeding methods and avoiding the limitation of a single light source only capable of imaging a single feeding method, thus achieving accurate and efficient defect imaging. Furthermore, compared to related technologies, this application does not require an additional rotating inspection station for secondary scanning imaging, significantly saving space and cost.

[0060] It should be understood that the description in this section is not intended to identify key or essential features of the embodiments of this application, nor is it intended to limit the scope of this application. Other features of this application will become readily apparent from the following description. Attached Figure Description

[0061] The above and other objects, features, and advantages of exemplary embodiments of this application will become readily apparent from the following detailed description taken in conjunction with the accompanying drawings. Several embodiments of this application are illustrated in the drawings by way of example and not limitation, in which:

[0062] In the accompanying drawings, the same or corresponding reference numerals indicate the same or corresponding parts.

[0063] Figure 1 A schematic diagram of the defect imaging system according to an embodiment of this application is shown;

[0064] Figure 2 A scene example diagram of the defect imaging system according to an embodiment of this application is shown;

[0065] Figure 3 An enlarged schematic diagram of the first and second light-emitting modules according to an embodiment of this application is shown;

[0066] Figure 4 A top view schematic diagram of the first light source and the second light source according to an embodiment of this application is shown;

[0067] Figure 5 A schematic diagram of the composition of the first light-emitting module according to an embodiment of this application is shown;

[0068] Figure 6 A schematic diagram illustrating the implementation flow of the defect detection method according to an embodiment of this application is shown;

[0069] Figure 7 A schematic diagram of the composition structure of an electronic device according to an embodiment of this application is shown. Detailed Implementation

[0070] To make the objectives, features, and advantages of this application more apparent and understandable, the technical solutions in the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, and not all embodiments. Based on the embodiments of this application, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application.

[0071] This application provides a defect imaging system, with reference to... Figure 1 As shown, the system includes a first light-emitting module, a second light-emitting module, and an imaging module; wherein the imaging module is separately disposed from the first light-emitting module and the second light-emitting module, and the first light-emitting module is fixedly connected to the second light-emitting module through a light-emitting base;

[0072] The first light-emitting module is used to emit a first light source toward the object to be detected;

[0073] The second light-emitting module is used to emit a second light source toward the object to be detected; the emission angles of the first light source and the second light source are different;

[0074] The imaging module is used to perform defect imaging on the object to be inspected based on the reflected light from the first light source and the second light source.

[0075] In this embodiment, the object to be inspected is the object or product to be inspected for defects, such as an LCD screen of an electronic device. Typically, the object to be inspected is a product with a regular shape. Taking a rectangular object as an example, the object may be fed in the direction of its wide side or its narrow side. Existing technologies usually only use one lighting source, which can only image defects in one feeding direction, easily leading to missed or incorrect detections. To solve this problem, existing technologies add a rotating imaging station. After being imaged by the first lighting source, the object to be inspected is transferred to the rotating imaging station, rotated 90°, and then imaged again, thus taking into account defect imaging in both feeding directions. However, the addition of the rotating imaging station increases economic and time costs.

[0076] Based on this, the defect imaging system of this application embodiment is equipped with two light-emitting modules: a first light-emitting module and a second light-emitting module. The first and second light-emitting modules can emit light sources at different angles towards the object to be inspected, thereby achieving accurate defect imaging regardless of the direction in which the object is fed. Considering that deploying two light-emitting modules in practical applications would result in a significant deviation in the incident light angles of the two light-emitting modules along the direction of operation, this embodiment designs the two light-emitting modules as a single unit. This reduces the difference in incident angles between the two light sources (the first and second light sources) within a limited object distance, ensuring effective imaging.

[0077] Specifically, the scene example diagram of the defect imaging system in this embodiment is shown below. Figure 2 As shown, Figure 2 The imaging module is specifically a line scan camera, which is set separately from the first light-emitting module and the second light-emitting module. Figure 3 This is an enlarged schematic diagram of the first and second light-emitting modules, which are fixedly connected by a light-emitting base (not shown). The first light source emitted by the first light-emitting module and the second light source emitted by the second light-emitting module have different emission angles. When the object to be inspected moves to the fixed imaging station, the first and second light-emitting modules emit the first and second light sources respectively towards the object. The line scan camera performs defect imaging based on the reflected light sources from the object towards the first and second light sources. In this embodiment, the defect can be any one or more defects specified by the user, such as various Mura defects.

[0078] In some alternative solutions, the first light-emitting module includes a first light-emitting unit, and the second light-emitting module includes a second light-emitting unit; wherein,

[0079] The first light-emitting unit is used to vertically emit a first light source toward the object to be detected;

[0080] The second light-emitting unit is used to emit a second light source at an angle toward the object to be detected; the first light-emitting unit and the second light-emitting unit alternately flash to emit either the first light source or the second light source.

[0081] In this application, the first light-emitting unit in the first light-emitting module and the second light-emitting unit in the second light-emitting module can be LED beads. The first light-emitting unit and the second light-emitting unit have the same structure, see reference. Figure 4 As shown, the difference lies in that the first light source emitted by the first light-emitting unit towards the object to be inspected is a vertical light source, while the second light-emitting unit emits a tilted light source towards the object to be inspected. The optimal angle between the first and second light sources is 15°. The first and second light-emitting units alternately flash light at a frequency of 2500Hz, which can avoid mutual interference between the two light sources and illuminate the object to be inspected from two different directions, facilitating accurate defect imaging.

[0082] In some alternative solutions, the first light-emitting module further includes a first light-shielding plate and a first lamp plate; the first light-shielding plate is fixed to the side of the first lamp plate by screws, and the first lamp plate is fixed to the light-emitting base by screws; wherein,

[0083] The first light-shielding plate is used to isolate interfering light sources other than the first light source, and to control the light divergence angle of the first light source;

[0084] The first lamp board is used to support the first light-emitting unit.

[0085] In this application, references Figure 5 As shown, Figure 5 This is a schematic diagram of the first light-emitting module, which includes a first light-shielding plate and a first lamp plate. The first light-shielding plate is fixed to a screw hole on the side of the first lamp plate by screws. The first light-emitting unit is fixed to the first lamp plate, and the first lamp plate is fixed to a top screw hole of the light-emitting base by four screws. The first light-shielding plate isolates interference from ambient stray light, preventing it from affecting the imaging effect. Simultaneously, the first light-shielding plate can also control the divergence angle of the first light source by blocking part of its optical path, preventing the optical path of the first light source from being too long and the divergence angle from being too large, thus ensuring that the first light source does not illuminate the object to be detected.

[0086] In some alternative solutions, the second light-emitting module further includes a second light-shielding plate and a second lamp plate; the second light-shielding plate is fixed to the side of the second lamp plate by screws, and the second lamp plate is fixed to the light-emitting base by screws; wherein,

[0087] The second light-shielding plate is used to isolate interfering light sources other than the second light source, and to control the light divergence angle of the second light source;

[0088] The second lamp panel is used to support the second light-emitting unit.

[0089] In this application, the second light-emitting module has a structure that is basically the same as the first light-emitting module. The second light-shielding plate is fixed to the screw holes on the side of the second lamp plate by screws. The second light-emitting unit is fixed to the second lamp plate, and the second lamp plate is fixed to the top screw holes of the light-emitting base by four screws. The second light-shielding plate can isolate interference from other ambient stray light, avoiding affecting the imaging effect. Simultaneously, the second light-shielding plate can also control the divergence angle of the second light source by blocking part of its optical path, preventing the second light source from having an excessively long optical path and a large divergence angle, thus preventing the second light source from illuminating the object to be detected.

[0090] In some alternative solutions, the imaging module includes a lens module and an image generation unit;

[0091] The lens module is used to collect the reflected light from the object under test in relation to the first light source and the second light source;

[0092] The image generation unit is configured to generate a first defect image based on the reflected light source of the object to be detected relative to a first light source; and to generate a second defect image based on the reflected light source of the object to be detected relative to a second light source.

[0093] In this application, the imaging module includes a lens module and an image generation unit. The lens module is used to acquire the light source reflected by the object to be inspected. The image generation unit is used to generate defect images for the reflected light sources of the two light sources respectively. For example, assuming that when the object to be inspected passes the imaging position at a feeding speed of 500 mm / s, the first light-emitting unit and the second light-emitting unit flash alternately in sequence, with a pixel accuracy of 0.2 mm / pixel. The lens module acquires the reflected light sources of the first light source and the second light source respectively. The image generation unit generates the first defect image and the second defect image based on the reflected light sources at a frequency of 5000 Hz. When the object to be inspected passes the imaging end position, the first light source and the second light source are turned off, and the image generation unit stops generating defect images.

[0094] In some alternative embodiments, the image generation unit includes a first generation unit and a first synthesis unit;

[0095] The first generation unit is used to generate a first defect sub-image based on the reflected light source of the object to be detected against the first light source within any alternating strobe cycle;

[0096] The first synthesis unit is used to synthesize the first defect sub-images to obtain the first defect image.

[0097] In this application, the first defect image is obtained through a first generation unit and a first synthesis unit. Specifically, during the first alternating strobe cycle, assuming the first light-emitting unit's emission sequence precedes that of the second light-emitting unit, during the movement of the object to be detected, when it moves to the imaging position, the first light-emitting unit lights up, and simultaneously the first generation unit begins exposure. After the exposure time, the exposure ends, and the first light-emitting unit turns off, outputting the first row of images (the first defect sub-image within the first strobe cycle) to the acquisition card, completing the acquisition of the first row of images. As the object to be detected continues to move, during the second alternating strobe cycle, the first light-emitting unit lights up again, and simultaneously the first generation unit begins exposure again. After the exposure time, the exposure ends, and simultaneously the first light-emitting unit turns off, outputting the third row of images (the first defect sub-image within the second strobe cycle) to the acquisition card, completing the acquisition of the third row of images... and so on, completing the acquisition of the first defect sub-images within each strobe cycle. If images of all light sources within each flicker cycle are acquired onto the same acquisition card, then each first defect sub-image is an odd-numbered row image of the acquisition card (when the emission sequence of the first light-emitting unit is after the second light-emitting unit, each first defect sub-image is an even-numbered row image of the acquisition card). By synthesizing the first defect sub-images (extracting the odd-numbered rows of the acquisition card) within each flicker cycle through the first synthesis unit, a first defect image of the object to be detected under the first light source can be obtained.

[0098] In some alternative embodiments, the image generation unit includes a second generation unit and a second synthesis unit;

[0099] The second generation unit is used to generate a second defect sub-image based on the reflected light source of the object to be detected against the second light source within any alternating strobe cycle;

[0100] The second synthesis unit is used to synthesize the various second defect sub-images to obtain a second defect image.

[0101] In this application, the second defect image is obtained through a second generation unit and a second synthesis unit. Specifically, during the first alternating stroboscopic cycle, assuming the first light-emitting unit emits light before the second light-emitting unit, after the first light-emitting unit turns off, the second light-emitting unit lights up, and simultaneously the second generation unit begins exposure. After the exposure time, the exposure ends, and simultaneously the second light-emitting unit turns off, outputting the second row of images (the second defect sub-image during the first stroboscopic cycle) to the acquisition card, thus completing the acquisition of the second row of images. As the object to be detected continues to move, during the second alternating stroboscopic cycle, after the first light-emitting unit turns off, the second light-emitting unit lights up again, and simultaneously the second generation unit begins exposure again. After the exposure time, the exposure ends, and simultaneously the second light-emitting unit turns off, outputting the fourth row of images (the second defect sub-image during the second stroboscopic cycle) to the acquisition card, thus completing the acquisition of the fourth row of images... and so on, completing the acquisition of the second defect sub-images during each stroboscopic cycle. If images of all light sources within each flicker cycle are acquired onto the same acquisition card, then each second defect sub-image is an even-numbered row image of the acquisition card (when the emission sequence of the first light-emitting unit is after the second light-emitting unit, each second defect sub-image is an odd-numbered row image of the acquisition card). By synthesizing the second defect sub-images (extracting even-numbered rows of images from the acquisition card) within each flicker cycle through the second synthesis unit, a second defect image of the object to be detected under the second light source can be obtained.

[0102] In some alternative solutions, the number of the first light-emitting units is multiple, and the number of the second light-emitting units is multiple.

[0103] In this application, references Figure 5 As shown, the number of the first and second light-emitting units can be multiple, which can provide more uniform and sufficient illumination, help improve the clarity and contrast of defect imaging, and make defects easier to identify and analyze.

[0104] In some alternative solutions, the angle between the emission angles of the first light source and the second light source satisfies a first preset range.

[0105] In this application, the included angle between the emission angles of the first light source and the second light source should meet a first preset range, which is an empirical value, typically 10° to 30°, and preferably 15°. If the included angle between the first light source and the second light source is too small, the difference in defect imaging results under the two light sources will be small, making accurate defect identification impossible. If the included angle between the first light source and the second light source is too large, to achieve the integrated design of the first and second light-emitting modules in this embodiment, a larger lamp housing is required, and even the entire optomechanical system (defect imaging system) may need to be redesigned, increasing costs.

[0106] This application also provides a defect detection method, referencing... Figure 6 As shown, the method is applied to the aforementioned defect imaging system, and the method includes:

[0107] S601: A first light source is emitted towards the object to be detected through a first light-emitting module, and a second light source is emitted towards the object to be detected through a second light-emitting module; the emission angles of the first light source and the second light source are different;

[0108] For the working process and principle of the first and second light-emitting modules in this step, please refer to the detailed descriptions in the relevant sections above, which will not be repeated here.

[0109] S602: The imaging module performs defect imaging on the object to be inspected based on the reflected light from the first light source and the second light source, and obtains a defect image;

[0110] In this step, the relevant description of the defect image obtained through the imaging module can be found in the detailed explanations above, and will not be repeated here.

[0111] S603: Based on the defect image, perform defect detection on the object to be detected to obtain the defect detection result.

[0112] In this step, the defect image includes the aforementioned first defect image and second defect image. It can be understood that regardless of the direction in which the object to be inspected is fed, if the object has a defect, one of the first and second defect images will necessarily show the defect. Therefore, based on the obtained defect image, the detection result of whether the object to be inspected has a defect can be obtained. For a detailed explanation of the specific process, please refer to the following related sections; it will not be repeated here.

[0113] In the scheme shown in steps S601 to S603, a first light source is emitted towards the object to be inspected through a first light-emitting module, and a second light source is emitted towards the object to be inspected through a second light-emitting module; the emission angles of the first light source and the second light source are different; the imaging module performs defect imaging on the object to be inspected based on the reflected light sources of the object to be inspected in relation to the first and second light sources, obtaining a defect image; based on the defect image, defect detection is performed on the object to be inspected, obtaining a defect detection result. This application uses reflected light sources from two light sources with different emission angles for defect imaging, which can take into account imaging of objects to be inspected with different feeding methods, avoiding the limitation of a single light source only being able to perform defect imaging for a single feeding method, and achieving accurate and efficient defect imaging. At the same time, compared with related technologies, this application does not require adding a rotating inspection station for secondary scanning imaging, greatly saving space and cost waste.

[0114] In some alternative solutions, the first light-emitting module includes a first light-emitting unit, and the second light-emitting module includes a second light-emitting unit; the step of emitting a first light source to the object to be detected through the first light-emitting module and emitting a second light source to the object to be detected through the second light-emitting module includes:

[0115] A first light source is vertically emitted towards the object to be detected through a first light-emitting unit; and...

[0116] The second light source is emitted at an angle towards the object to be detected by the second light-emitting unit; the first light-emitting unit and the second light-emitting unit alternately flash to emit the first light source or the second light source.

[0117] In this application, the working process and principle of the first light-emitting unit and the second light-emitting unit are detailed in the foregoing relevant sections and will not be repeated here.

[0118] In some alternative solutions, the first light-emitting module further includes a first light-shielding plate. Before the imaging module performs defect imaging on the object to be detected based on the reflected light from the first light source and the second light source to obtain a defect image, the method further includes:

[0119] The first light-shielding plate isolates interfering light sources other than the first light source and controls the light divergence angle of the first light source to a first preset angle.

[0120] For the working process and principle of the first light-shielding plate in this application, please refer to the detailed description in the relevant sections above, and it will not be repeated here.

[0121] In some alternative solutions, the second light-emitting module further includes a second light-shielding plate. Before the imaging module performs defect imaging on the object to be detected based on the reflected light from the first light source and the second light source to obtain a defect image, the method further includes:

[0122] The second light-shielding plate isolates interfering light sources other than the second light source and controls the light divergence angle of the second light source to a second preset angle.

[0123] For the working process and principle of the second light-shielding plate in this application, please refer to the detailed description in the relevant sections above, and it will not be repeated here.

[0124] In some alternative solutions, the imaging module includes a lens module and an image generation unit; the step of using the imaging module to perform defect imaging on the object to be detected based on the reflected light from the first light source and the second light source to obtain a defect image includes:

[0125] The lens module captures the reflected light from the object under test in relation to the first and second light sources.

[0126] A first defect image is generated by the image generation unit based on the reflected light source of the object to be detected relative to a first light source; and a second defect image is generated by the image generation unit based on the reflected light source of the object to be detected relative to a second light source.

[0127] The first defect image and the second defect image are used as defect images.

[0128] For details on the working process and principle of the lens module and image generation unit in this application, please refer to the detailed descriptions in the relevant sections above, which will not be repeated here.

[0129] In some alternative embodiments, the image generation unit includes a first generation unit and a first synthesis unit; the step of generating a first defect image based on the reflected light source of the object to be detected against a first light source by the image generation unit includes:

[0130] The first generation unit generates a first defect sub-image based on the reflected light source of the object to be detected against the first light source within any alternating strobe cycle.

[0131] The first defect image is obtained by synthesizing the first defect sub-images through the first synthesis unit.

[0132] For the working process and principle of the first generating unit and the first synthesizing unit in this application, please refer to the detailed descriptions in the relevant sections above, which will not be repeated here.

[0133] In some alternative embodiments, the image generation unit includes a second generation unit and a second synthesis unit; the step of generating a second defect image based on the reflected light source of the object to be detected against a second light source by the image generation unit includes:

[0134] The second generation unit generates a second defect sub-image based on the reflected light source of the object to be detected against the second light source within any alternating strobe cycle;

[0135] The second defect image is obtained by synthesizing the various second defect sub-images through the second synthesis unit.

[0136] In this application, the working process and principle of the second generating unit and the second synthesizing unit are detailed in the foregoing relevant sections and will not be repeated here.

[0137] In some alternative solutions, the step of performing defect detection on the object to be detected based on the defect image to obtain defect detection results includes:

[0138] Determine the type of defect to be detected for the object to be inspected;

[0139] Based on the geometric features of the defects corresponding to the detected defect type, candidate domains are filtered in the defect image. When a candidate domain exists in the first defect image or the second defect image in the defect image, a defect detection result is obtained indicating that the object to be detected has a defect.

[0140] Furthermore, when neither the first defect image nor the second defect image in the defect image has a candidate region, a defect detection result is obtained indicating that the object to be detected does not have a defect.

[0141] In this application, after obtaining the defect image, the type of defect the user wants to detect is first determined, such as stage mura defects, point mura defects, line mura defects, etc. Then, based on the geometric features corresponding to the defect, such as shape, size, and edges, candidate regions are filtered between the first and second defect images. If a candidate region exists in either of the two defect images, it indicates that the object to be detected has a defect. If no candidate region exists in either defect image, it indicates that regardless of the feeding method, the object to be detected does not have the specified type of defect.

[0142] According to embodiments of this application, this application also provides an electronic device and a readable storage medium.

[0143] Figure 7 A schematic block diagram of an example electronic device 700 that can be used to implement embodiments of this application is shown. The electronic device is intended to represent various forms of digital computers, such as laptop computers, desktop computers, workstations, personal digital assistants, servers, blade servers, mainframe computers, and other suitable computers. The electronic device may also represent various forms of mobile devices, such as personal digital processors, cellular phones, smartphones, wearable devices, and other similar computing devices. The components shown herein, their connections and relationships, and their functions are merely illustrative and are not intended to limit the implementation of the application described and / or claimed herein.

[0144] like Figure 7 As shown, the electronic device 700 includes a computing unit 701, which can perform various appropriate actions and processes based on a computer program stored in a read-only memory (ROM) 702 or a computer program loaded from a storage unit 708 into a random access memory (RAM) 703. The RAM 703 may also store various programs and data required for the operation of the electronic device 700. The computing unit 701, ROM 702, and RAM 703 are interconnected via a bus 704. An input / output (I / O) interface 705 is also connected to the bus 704.

[0145] Multiple components in electronic device 700 are connected to I / O interface 705, including: input unit 706, such as keyboard, mouse, etc.; output unit 707, such as various types of displays, speakers, etc.; storage unit 708, such as disk, optical disk, etc.; and communication unit 709, such as network card, modem, wireless transceiver, etc. Communication unit 709 allows electronic device 700 to exchange information / data with other devices through computer networks such as the Internet and / or various telecommunications networks.

[0146] The computing unit 701 can be a variety of general-purpose and / or special-purpose processing components with processing and computing capabilities. Some examples of the computing unit 701 include, but are not limited to, a central processing unit (CPU), a graphics processing unit (GPU), various special-purpose artificial intelligence (AI) computing chips, various computing units running machine learning model algorithms, a digital signal processor (DSP), and any suitable processor, controller, microcontroller, etc. The computing unit 701 performs the various methods and processes described above, such as defect detection methods. For example, in some embodiments, the defect detection method may be implemented as a computer software program tangibly contained in a machine-readable medium, such as storage unit 708. In some embodiments, part or all of the computer program may be loaded and / or installed on the electronic device 700 via ROM 702 and / or communication unit 709. When the computer program is loaded into RAM 703 and executed by the computing unit 701, one or more steps of the defect detection method described above may be performed. Alternatively, in other embodiments, the computing unit 701 may be configured to perform defect detection methods by any other suitable means (e.g., by means of firmware).

[0147] Various embodiments of the systems and techniques described above herein can be implemented in digital electronic circuit systems, integrated circuit systems, field-programmable gate arrays (FPGAs), application-specific integrated circuits (ASICs), application-specific standard products (ASSPs), system-on-a-chip (SoCs), complex programmable logic devices (CPLDs), computer hardware, firmware, software, and / or combinations thereof. These various embodiments may include implementations in one or more computer programs that can be executed and / or interpreted on a programmable system including at least one programmable processor, which may be a dedicated or general-purpose programmable processor, capable of receiving data and instructions from a storage system, at least one input device, and at least one output device, and transmitting data and instructions to the storage system, the at least one input device, and the at least one output device.

[0148] The program code used to implement the methods of this application may be written in any combination of one or more programming languages. This program code may be provided to a processor or controller of a general-purpose computer, special-purpose computer, or other programmable data processing device, such that when executed by the processor or controller, the functions / operations specified in the flowcharts and / or block diagrams are implemented. The program code may be executed entirely on a machine, partially on a machine, as a standalone software package partially on a machine and partially on a remote machine, or entirely on a remote machine or server.

[0149] In the context of this application, a machine-readable medium can be a tangible medium that may contain or store a program for use by or in conjunction with an instruction execution system, apparatus, or device. A machine-readable medium can be a machine-readable signal medium or a machine-readable storage medium. Machine-readable media can be, but is not limited to, electronic, magnetic, optical, electromagnetic, infrared, or semiconductor systems, apparatus, or devices, or any suitable combination of the foregoing. More specific examples of machine-readable storage media include electrical connections based on one or more wires, portable computer disks, hard disks, random access memory (RAM), read-only memory (ROM), erasable programmable read-only memory (EPROM or flash memory), optical fibers, portable compact disk read-only memory (CD-ROM), optical storage devices, magnetic storage devices, or any suitable combination of the foregoing.

[0150] To provide interaction with a user, the systems and techniques described herein can be implemented on a computer having: a display device for displaying information to the user (e.g., a CRT (cathode ray tube) or LCD (liquid crystal display) monitor); and a keyboard and pointing device (e.g., a mouse or trackball) through which the user provides input to the computer. Other types of devices can also be used to provide interaction with the user; for example, feedback provided to the user can be any form of sensory feedback (e.g., visual feedback, auditory feedback, or tactile feedback); and input from the user can be received in any form (including sound input, voice input, or tactile input).

[0151] The systems and technologies described herein can be implemented in computing systems that include backend components (e.g., as a data server), or computing systems that include middleware components (e.g., an application server), or computing systems that include frontend components (e.g., a user computer with a graphical user interface or web browser through which a user can interact with embodiments of the systems and technologies described herein), or any combination of such backend, middleware, or frontend components. The components of the system can be interconnected via digital data communication of any form or medium (e.g., a communication network). Examples of communication networks include local area networks (LANs), wide area networks (WANs), and the Internet.

[0152] Computer systems can include clients and servers. Clients and servers are generally located far apart and typically interact via communication networks. Client-server relationships are created by computer programs running on the respective computers and having a client-server relationship with each other. Servers can be cloud servers, servers in distributed systems, or servers incorporating blockchain technology.

[0153] It should be understood that the various forms of processes shown above can be used to rearrange, add, or delete steps. For example, the steps described in this application can be executed in parallel, sequentially, or in different orders, as long as the desired result of the technical solution disclosed in this application can be achieved, and this is not limited herein.

[0154] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one of that feature. In the description of this application, "a plurality of" means two or more, unless otherwise explicitly specified.

[0155] The above description is merely a specific embodiment of this application, but the scope of protection of this application is not limited thereto. Any variations or substitutions that can be easily conceived by those skilled in the art within the scope of the technology disclosed in this application should be included within the scope of protection of this application. Therefore, the scope of protection of this application should be determined by the scope of the claims.

Claims

1. A defect imaging system, characterized in that, The system includes a first light-emitting module, a second light-emitting module, and an imaging module; wherein the imaging module is separately disposed from the first light-emitting module and the second light-emitting module, and the first light-emitting module is fixedly connected to the second light-emitting module through a light-emitting base; The first light-emitting module is used to emit a first light source toward the object to be detected; The second light-emitting module is used to emit a second light source toward the object to be detected; the emission angles of the first light source and the second light source are different; The imaging module is used to perform defect imaging on the object to be inspected based on the reflected light from the first light source and the second light source.

2. The system according to claim 1, characterized in that, The first light-emitting module includes a first light-emitting unit, and the second light-emitting module includes a second light-emitting unit; wherein, The first light-emitting unit is used to vertically emit a first light source toward the object to be detected; The second light-emitting unit is used to emit a second light source at an angle toward the object to be detected; the first light-emitting unit and the second light-emitting unit alternately flash to emit either the first light source or the second light source.

3. The system according to claim 2, characterized in that, The first light-emitting module further includes a first light-shielding plate and a first lamp plate; the first light-shielding plate is fixed to the side of the first lamp plate by screws, and the first lamp plate is fixed to the light-emitting base by screws; wherein... The first light-shielding plate is used to isolate interfering light sources other than the first light source, and to control the light divergence angle of the first light source; The first lamp board is used to support the first light-emitting unit.

4. The system according to claim 2, characterized in that, The second light-emitting module further includes a second light-shielding plate and a second lamp plate; the second light-shielding plate is fixed to the side of the second lamp plate by screws, and the second lamp plate is fixed to the light-emitting base by screws; wherein... The second light-shielding plate is used to isolate interfering light sources other than the second light source, and to control the light divergence angle of the second light source; The second lamp panel is used to support the second light-emitting unit.

5. The system according to any one of claims 2 to 4, characterized in that, The imaging module includes a lens module and an image generation unit; The lens module is used to collect the reflected light from the object under test in relation to the first light source and the second light source; The image generation unit is used to generate a first defect image based on the reflected light source of the object to be detected in relation to the first light source; And, for generating a second defect image based on the reflected light source of the object to be detected relative to the second light source.

6. The system according to claim 5, characterized in that, The image generation unit includes a first generation unit and a first synthesis unit; The first generation unit is used to generate a first defect sub-image based on the reflected light source of the object to be detected against the first light source within any alternating strobe cycle; The first synthesis unit is used to synthesize the first defect sub-images to obtain the first defect image.

7. The system according to claim 5, characterized in that, The image generation unit includes a second generation unit and a second synthesis unit; The second generation unit is used to generate a second defect sub-image based on the reflected light source of the object to be detected against the second light source within any alternating strobe cycle; The second synthesis unit is used to synthesize the various second defect sub-images to obtain a second defect image.

8. A defect detection method, characterized in that, The method is applied to the defect imaging system according to any one of claims 1-7, and the method includes: A first light source is emitted towards the object to be detected through a first light-emitting module, and a second light source is emitted towards the object to be detected through a second light-emitting module; the emission angles of the first light source and the second light source are different. The imaging module performs defect imaging on the object to be inspected based on the reflected light from the first light source and the second light source, and obtains the defect image. Based on the defect image, defect detection is performed on the object to be detected, and the defect detection result is obtained.

9. An electronic device, characterized in that, include: At least one processor; as well as A memory communicatively connected to the at least one processor; wherein, The memory stores instructions that can be executed by the at least one processor to enable the at least one processor to perform the method of claim 8.

10. A non-transitory computer-readable storage medium storing computer instructions, characterized in that, The computer instructions are used to cause the computer to perform the method according to claim 8.

Images