Power-on / off test device and power-on / off test method

Abstract

The invention discloses a power-on and power-off testing device and a power-on and power-off testing method. The power-on and power-off testing device comprises a startable storage device and a power module, the startable storage device is connected to a tested device, an operating system is stored in the startable storage device, a power-on and power-off testing script is stored in the operating system, and in the power-on and power-off testing process, the operating system runs the power-on and power-off testing script to generate a power-on and power-off instruction; and the power supply module is connected with the tested equipment and is used for receiving the power-on and power-off instruction to perform power-on and power-off testing on the tested equipment. By means of the mode, the power-on and power-off testing device is provided with the bootable storage device storing the storage operating system and the testing script, when the tested device is connected with the bootable storage device and the power module and powered on, the testing script can run, and therefore testing can be efficiently carried out, and compared with the prior art, the testing efficiency is improved. According to the invention, accurate control of the tested equipment can be realized without arranging an upper computer or a microcontroller, so that the test cost is remarkably reduced.

Description

Technical Field

[0001] This application relates to the field of automatic testing technology, specifically to a power-on / off testing device and a power-on / off testing method. Background Technology

[0002] In the research and development and quality testing phase of electronic products, power-on / off testing is a crucial process used to verify the stability and reliability of electronic devices under repeated power-on and power-off conditions. Traditional power-on / off testing methods typically require manual operation or rely on testing equipment. Manual testing is inefficient, and existing testing facilities, if simultaneously testing multiple modules such as communication, switching circuits, microcontrollers, displays, and power supplies, require setting up multiple testing devices and designing host computers or microcontrollers for individual control. Therefore, existing testing equipment often suffers from cumbersome setup and high costs. Summary of the Invention

[0003] To address the aforementioned problems, this application proposes a power-on / off testing device and a power-on / off testing method, aiming to solve the problems described above.

[0004] To solve the above-mentioned technical problems, one technical solution adopted in this application is: to provide a power-on / off testing device, which includes a bootable storage device and a power module. The bootable storage device is connected to the device under test. The bootable storage device stores an operating system, which stores a power-on / off test script. During the power-on / off test, the operating system runs the power-on / off test script to generate power-on / off commands. The power module is connected to the device under test and is used to receive the power-on / off commands to perform power-on / off tests on the device under test.

[0005] The power-on / off command includes a power-off countdown parameter and a power-on countdown parameter. During the power-on / off test, the power module starts timing after receiving the power-on / off command. When the countdown reaches the power-off countdown parameter, the power module stops supplying power to the device under test. When the countdown reaches the power-on countdown parameter, the power module starts supplying power to the device under test. The power-off countdown parameter is less than the power-on countdown parameter.

[0006] The operating system also contains a hardware self-test script. After the device under test is powered on, the operating system runs the hardware self-test script to control the device under test to perform a self-test. When the device under test passes the self-test, the operating system runs the power-on / off test script to control the power module to perform a power-on / off test on the device under test. When the device under test fails the self-test, the operating system controls the device under test to remain in its current state and alerts the tester to check.

[0007] Specifically, when the operating system controls the device under test to perform a self-test, the hardware self-test script searches for the hardware devices of the device under test based on a preset hardware device list. When a hardware device that matches the preset hardware device list is found, the hardware device is controlled to perform a self-test; when no hardware device that matches the preset hardware device list is found, the test stops.

[0008] The device under test (DUT) is equipped with a power interface and a communication interface. The power module provides power to the DUT through the power interface, and the DUT transmits power-on and power-off commands to the power module through the communication interface.

[0009] The power module is equipped with a data port and multiple output ports. Each output port corresponds to the power interface of a device under test, and the data port corresponds to the communication interface of multiple devices under test, which is used to realize the simultaneous power-on and power-off testing of multiple devices under test.

[0010] Bootable storage devices include M.2 solid-state drives, serial ATA hard drives, or external bootable storage media.

[0011] To solve the above-mentioned technical problems, another technical solution adopted in this application is: to provide a power-on / off testing method, which is applied to the power-on / off testing device of any of the above-mentioned methods. The power-on / off testing method includes: controlling the device under test to power on; determining whether the number of tests on the device under test has reached a preset number; in response to the preset number not being reached, running a power-on / off testing script to perform a power-on / off test on the device under test, and incrementing the number of tests after the power-on / off test is completed; in response to reaching the preset number, controlling the device under test to maintain its current state and reminding the staff to check.

[0012] Before determining whether the number of tests on the device under test has reached the preset number, the power-on / off test method also includes: running a hardware self-test script to perform a hardware self-test on the device under test; determining whether the hardware self-test passes; if the hardware self-test passes, executing the step of determining whether the number of tests on the device under test has reached the preset number; if the hardware self-test fails, controlling the device under test to maintain its current state and reminding staff to check.

[0013] The steps for running the power-on / off test script to perform power-on / off tests on the device under test include: running the power-on / off test script to generate power-on / off commands, wherein the power-on / off commands include power-off countdown parameters and power-on countdown parameters, the power-off countdown parameters being less than the power-on countdown parameters; after the power module receives the power-on / off commands, it starts timing; in response to the timing reaching the power-off countdown parameters, it controls the power module to stop supplying power to the device under test; in response to the timing reaching the power-on countdown parameters, it controls the power module to start supplying power to the device under test.

[0014] The beneficial effects of this application are as follows: Unlike existing technologies, the power-on / off testing device of this application includes a bootable storage device and a power module. The bootable storage device is connected to the device under test (DUT). The bootable storage device stores an operating system, which stores a power-on / off test script. During the power-on / off test, the operating system runs the test script to generate power-on / off commands. The power module is connected to the DUT and is used to receive the power-on / off commands to perform power-on / off tests on the DUT. Through this method, the power-on / off testing device of this application uses a bootable storage device containing the operating system and test scripts. When the DUT is connected to the bootable storage device and the power module and powered on, the test scripts can run, thus efficiently conducting the test. Compared to existing technologies, this application eliminates the need for a host computer or microcontroller to achieve precise control of the DUT, thereby significantly reducing testing costs. Attached Figure Description

[0015] The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with this application and, together with the specification, serve to explain the technical solutions of this application.

[0016] Figure 1 This is a schematic diagram of the structure of the first embodiment of the power-on / off testing device provided in this application;

[0017] Figure 2 This is a schematic diagram of the structure of the second embodiment of the power-on / off testing device provided in this application;

[0018] Figure 3 This is a flowchart illustrating the first embodiment of the power-on / off testing method provided in this application;

[0019] Figure 4 This is a flowchart illustrating the second embodiment of the power-on / off testing method provided in this application;

[0020] Figure 5 yes Figure 3 A flowchart of a specific embodiment of step S103. Detailed Implementation

[0021] The technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only a part of the embodiments of this application, and not all of the embodiments. Based on the embodiments of this application, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the scope of protection of this application.

[0022] In the research and development and quality testing phase of electronic products, power-on / off testing is a crucial process used to verify the stability and reliability of electronic devices under repeated power-on and power-off conditions. Traditional power-on / off testing methods typically require manual operation or rely on testing equipment. Manual testing is inefficient, and existing testing facilities, if simultaneously testing multiple modules such as communication, switching circuits, microcontrollers, displays, and power supplies, require setting up multiple testing devices and designing host computers or microcontrollers for individual control. Therefore, existing testing equipment often suffers from cumbersome setup and high costs.

[0023] To address the aforementioned problems, this application first proposes a power-on / off testing device, please refer to [link / reference needed]. Figure 1 , Figure 1 This is a schematic diagram of the structure of the first embodiment of the power-on / off testing device provided in this application. The power-on / off testing device 100 of this embodiment includes a bootable storage device 20 and a power module 10. The bootable storage device 20 is connected to the device under test 30. The bootable storage device 20 stores an operating system, which stores a power-on / off test script. During the power-on / off test, the operating system runs the power-on / off test script to generate power-on / off commands. The power module 10 is connected to the device under test 30 and is used to receive power-on / off commands to perform power-on / off tests on the device under test 30.

[0024] In this embodiment, the device under test 30 is an industrial control computer. In this embodiment, the bootable storage device 20 can be connected to the industrial control computer. The bootable storage device 20 can be an M.2 hard drive or a serial hard drive adapted to the industrial control computer. In this embodiment, the bootable storage device 20 has an operating system corresponding to the industrial control computer test in its memory. The operating system contains a script to implement power-on and power-off test.

[0025] In this embodiment, the power module 10 can be configured as a programmable power supply, which can be connected to an industrial control computer. When the industrial control computer is powered on, it will default to entering the operating system of the bootable storage device 20. At this time, the power-on / off test script starts to run automatically, performing the corresponding operations for power-on / off testing of the industrial control computer. After completing one power-on / off test, the power-on / off test script will run automatically again when the industrial control computer is powered on again, thus starting a new round of power-on / off tests.

[0026] Unlike existing technologies, the power-on / off testing device 100 of this application includes a bootable storage device 20 and a power module 10. The bootable storage device 20 is connected to the device under test (DUT) 30. The bootable storage device 20 stores an operating system containing power-on / off test scripts. During power-on / off testing, the operating system runs the test scripts to generate power-on / off commands. The power module 10 is connected to the DUT 30 and receives the power-on / off commands to perform power-on / off testing on the DUT 30. Through this method, the power-on / off testing device 100 of this application uses a bootable storage device 20 containing the operating system and test scripts. When the DUT 30 is connected to the bootable storage device 20 and the power module 10 and powered on, the test scripts can run, thus efficiently conducting the test. Compared to existing technologies, this application eliminates the need for a host computer or microcontroller to achieve precise control of the DUT 30, thereby significantly reducing testing costs.

[0027] Optionally, based on the above embodiments, in this embodiment, the power-on / off command includes a power-off countdown parameter and a power-on countdown parameter. During the power-on / off test, the power module 10 starts timing after receiving the power-on / off command. When the time reaches the power-off countdown parameter, the power module 10 stops supplying power to the device under test 30. When the time reaches the power-on countdown parameter, the power module 10 starts supplying power to the device under test 30. The power-off countdown parameter is less than the power-on countdown parameter.

[0028] In this embodiment, when the operating system runs the power-on / off test script, it generates power-on / off commands, which are then sent to the power module 10 via the device under test 30 (i.e., the industrial control computer). In this embodiment, the power-on / off commands include a power-off countdown parameter Toff and a power-on countdown parameter Ton. Furthermore, in this embodiment, the power-off countdown parameter Toff is less than the power-on countdown parameter Ton. This is to ensure that the industrial control computer is powered off first and then powered on, thereby achieving a single power-on / off test.

[0029] When the power module 10 receives the power-on / off command, it can start the countdown. When the countdown reaches the power-off countdown parameter Toff, the power module 10 stops supplying power to the industrial computer. When the countdown reaches the power-on countdown parameter Ton, the power module 10 starts supplying power to the industrial computer.

[0030] Optionally, based on the above embodiments, in this embodiment, the operating system also stores a hardware self-test script. After the device under test is powered on, the operating system runs the hardware self-test script to control the device under test 30 to perform a self-test. When the device under test 30 passes the self-test, the operating system runs a power-on / off test script to control the power module 10 to perform a power-on / off test on the device under test 30. When the device under test 30 fails the self-test, the operating system controls the device under test 30 to remain in its current state and reminds the test personnel to check.

[0031] In this embodiment, the operating system of the bootable storage device 20 can also store a hardware self-test script. Before performing a power-on / off test, the operating system of the bootable storage device 20 can first run the hardware self-test script to control the device under test 30 to perform a self-test. When the hardware self-test of the device under test 30 passes, the power-on / off test script is run to control the power module 10 to perform a power-on / off test on the device under test 30. When the hardware self-test of the device under test 30 fails, the device under test 30 is kept in its current state, and the tester is reminded to check. A failure to pass the self-test means that the hardware of the device under test is not installed correctly and there is a problem. At this time, the tester should be reminded to check and solve the hardware problem before performing the power-on / off test.

[0032] Optionally, based on the above embodiments, in this embodiment, when the operating system controls the device under test 30 to perform a self-test, the hardware self-test script searches for the hardware devices of the device under test 30 based on a preset hardware device list. When a hardware device that matches the preset hardware device list is found, the hardware device is controlled to perform a self-test; when no hardware device that matches the preset hardware device list is found, the test is stopped.

[0033] In this embodiment, the self-test logic of the hardware self-test script is as follows: when the operating system starts, the hardware self-test script will run. At this time, the hardware self-test script searches for the hardware devices of the device under test 30 based on a preset hardware device list. If a hardware device with the same name, model, manufacturer, etc. is found, it is determined that the hardware device has been successfully installed. If no hardware device matching the preset hardware device list is found, the test will stop and a reminder will be issued so that the tester can check and resolve the hardware problem.

[0034] Optionally, such as Figure 1 As shown, in this embodiment, the device under test 30 is provided with a power interface 31 and a communication interface 32. The power module 10 provides power to the device under test 30 through the power interface 31, and the device under test 30 transmits power on / off commands to the power module 10 through the communication interface 32.

[0035] In this embodiment, the device under test 30 is an industrial control computer, and the communication interface 32 can be set as a UART port. This is a hardware interface for asynchronous serial communication. It realizes full-duplex data transmission through sending and receiving signal lines and is widely used in communication between devices. In other embodiments, the communication interface 32 can also be set as other interfaces, as long as it meets the function of transmitting power-on and power-off commands to the power module 10.

[0036] Optionally, please refer to Figure 2 , Figure 2 This is a schematic diagram of the second embodiment of the power-on / off testing device provided in this application. Figure 2 As shown, in this embodiment, the power module 10 is provided with a data port 11 and multiple output ports 12. Each output port 12 corresponds to the power interface 31 of a device under test 30, and the data port 11 corresponds to the communication interface 32 of multiple devices under test 30, which is used to realize the simultaneous power-on and power-off test of multiple devices under test 30.

[0037] In this embodiment, the power module 10 is a programmable power supply. The programmable power supply can be configured to have multiple channels to enable parallel power-on and power-off tests of the device under test 30, and the power-on and power-off tests of multiple industrial control devices under test 30 do not interfere with each other.

[0038] Optionally, based on all the above embodiments, in this embodiment, the bootable storage device 20 includes an M.2 solid-state drive, a serial ATA hard drive, or an external bootable storage medium.

[0039] In this embodiment, the device under test 30 is an industrial control computer, and the bootable storage device 20 mentioned above can be set as an M.2 solid-state drive or SATA hard drive adapted to the industrial control computer; in other embodiments, the bootable storage device 20 can also be set as an external bootable storage medium, such as a USB flash drive.

[0040] Optionally, this application further proposes a power-on / off test method, please refer to [link to relevant documentation]. Figure 3 , Figure 3 This is a flowchart illustrating the first embodiment of the power-on / off testing method provided in this application. In this embodiment, the power-on / off testing method is applied to the power-on / off testing apparatus of any of the above embodiments. Figure 3 As shown, the power-on / off test method of this embodiment specifically includes steps S101 to S104:

[0041] Step S101: Power on the device under test.

[0042] In this embodiment, after the bootable storage device and the power module are connected to the device under test, the device under test can be powered on by the power module.

[0043] Step S102: Determine whether the number of tests on the device under test has reached the preset number.

[0044] After the device under test is powered on, before the operating system controls the execution of the power-on / off test script, it will read the number of power-on / off tests of the device under test stored in the bootable storage device and determine whether the number of tests of the device under test has reached the preset number.

[0045] If the preset number of attempts is not reached, proceed to step S103; if the preset number of attempts is reached, proceed to step S104.

[0046] Step S103: Run the power-on / off test script to perform a power-on / off test on the device under test, and increment the test count by one after the power-on / off test is completed.

[0047] If the number of tests for the device under test has not reached the preset number, the operating system in the storage device can be started to run the power-on / off test script to perform a power-on / off test on the device under test. After the operating system completes one power-on / off test, the operating system in the storage device can be started to increment the number of power-on / off tests stored for the device under test by one, and then proceed to step S101 to perform the next power-on / off test.

[0048] Step S104: Keep the device under test in its current state and remind staff to check.

[0049] When the number of tests on the device under test reaches the preset number, it means that the power-on and power-off test of the device under test has been completed. At this time, the operating system can control the device under test to maintain the current state and issue a reminder to remind the staff to check after the test is completed.

[0050] Optionally, based on the above embodiments, please refer to Figure 4 , Figure 4 This is a flowchart illustrating the second embodiment of the power-on / off testing method provided in this application. Figure 4 As shown, the power-on / off test method of this embodiment specifically includes steps S201 to S206:

[0051] Step S201: Power on the device under test.

[0052] Step S201 is the same as step S101, and will not be repeated here.

[0053] Step S202: Run the hardware self-test script to perform a hardware self-test on the device under test.

[0054] In this embodiment, after the device under test is powered on, before performing a power-on / off test, the operating system in the storage device can be started to run a hardware self-test script to perform a hardware self-test on the device under test; wherein, the hardware self-test is performed so that subsequent tests can be completed normally.

[0055] Step S203: Determine whether the hardware self-test has passed.

[0056] When performing a hardware self-test on the device under test, you can search based on the hardware device list of the device under test. If a hardware device with the same name, model, and manufacturer is found, it is determined that the hardware device has been successfully installed, and the self-test has passed. If it is not found, the self-test has failed.

[0057] If the hardware self-test fails, proceed to step S206; if the hardware self-test passes, proceed to step S204.

[0058] Step S204: Determine whether the number of tests on the device under test has reached the preset number.

[0059] If the preset number of attempts is not reached, proceed to step S205; if the preset number of attempts is reached, proceed to step S206.

[0060] Step S204 is the same as step S102, and will not be described again.

[0061] Step S205: Run the power-on / off test script to perform a power-on / off test on the device under test, and increment the test count by one after the power-on / off test is completed.

[0062] Step S205 is the same as step S103, and will not be described again.

[0063] Step S206: Keep the device under test in its current state and remind staff to check.

[0064] In this embodiment, when the number of tests on the device under test reaches the preset number, it means that the power-on and power-off test of the device under test has been completed. At this time, the operating system can control the device under test to maintain its current state and issue a reminder to remind the staff to check after the test is completed.

[0065] Alternatively, if the hardware self-test of the device under test fails, indicating that the hardware is not installed correctly, the test results obtained even from power-on / off tests will be inaccurate. Therefore, the operating system needs to maintain the current state of the device under test and issue a reminder to prompt staff to check the problematic hardware.

[0066] Optionally, based on the above embodiments, please refer to Figure 5 , Figure 5 yes Figure 3 A flowchart illustrating a specific embodiment of step S103. This embodiment can be achieved through, as shown in... Figure 5 The steps shown implement step S103, specifically including steps S301 to S303:

[0067] Step S301: Run the power-on / off test script to generate power-on / off commands. The power-on / off commands include power-off countdown parameters and power-on countdown parameters, where the power-off countdown parameters are less than the power-on countdown parameters.

[0068] In this embodiment, when the operating system runs the power-on / off test script, it generates power-on / off commands and sends them to the power module via the device under test. The power module then performs a power-on / off test on the device under test based on these commands. In this embodiment, the power-on / off commands include a power-off countdown parameter Toff and a power-on countdown parameter Ton, where the power-off countdown parameter Toff is less than the power-on countdown parameter Ton.

[0069] Step S302: After the power module receives the power on / off command, it starts timing. When the timer reaches the power-off countdown parameter, the power module will stop supplying power to the device under test.

[0070] When the power module receives a power-on / off command from the device under test, it will start timing. When the timer reaches the power-off countdown parameter Toff, the power module will stop supplying power to the device under test.

[0071] Step S303: In response to the timing reaching the power-on countdown parameter, the control power module starts to supply power to the device under test.

[0072] When the countdown reaches the power-on countdown parameter Ton, the power module will begin supplying power to the device under test.

[0073] After the ascent operation is completed, a power-on / off test of the device under test is completed. As the device under test is powered on again, a new round of hardware self-test and power-on / off tests can begin.

[0074] The above description is merely an embodiment of this application and does not limit the patent scope of this application. Any equivalent structural or procedural transformations made using the content of this application's specification and drawings, or direct or indirect applications in other related technical fields, are similarly included within the patent protection scope of this application.

Claims

1. A power on / off test apparatus, characterized by comprising: The power-on / off testing device comprises: An accessible storage device, wherein the accessible storage device stores an operating system, the operating system stores a power-on / off testing script, and the operating system runs the power-on / off testing script to generate a power-on / off instruction during a power-on / off testing process; A power supply module, which is connected with the device under test and used to receive the power-on / off instruction to perform power-on / off testing on the device under test.

2. The on-off power test device according to claim 1, wherein The power-on / off instruction comprises a power-off countdown parameter and a power-on countdown parameter, and during the power-on / off testing process, the power supply module starts timing after receiving the power-on / off instruction, stops supplying power to the device under test when the timing reaches the power-off countdown parameter, and starts supplying power to the device under test when the timing reaches the power-on countdown parameter; wherein the power-off countdown parameter is less than the power-on countdown parameter.

3. The power-on / off test apparatus according to claim 1, wherein The operating system further stores a hardware self-checking script, and after the device under test is powered on, the operating system runs the hardware self-checking script to control the device under test to perform self-checking, and when the device under test passes the self-checking, the operating system runs the power-on / off testing script to control the power supply module to perform power-on / off testing on the device under test; when the device under test fails the self-checking, the device under test is kept in the current state, and the tester is reminded to check.

4. The power-on / off test apparatus according to claim 3, wherein During the self-checking of the device under test controlled by the operating system, the hardware self-checking script searches for hardware devices of the device under test based on a preset hardware device list, controls the hardware devices to perform self-checking when the hardware devices consistent with the preset hardware device list are searched, and stops the testing when the hardware devices consistent with the preset hardware device list are not searched.

5. The power-on / off test apparatus according to claim 1, wherein The device under test is provided with a power supply interface and a communication interface, the power supply module provides power for the device under test through the power supply interface, and the device under test transmits the power-on / off instruction to the power supply module through the communication interface.

6. The power-on / off test apparatus according to claim 5, wherein The power supply module is provided with a data port and a plurality of output ports, each output port corresponds to the power supply interface of one device under test, and the data port corresponds to the communication interfaces of a plurality of devices under test, so as to simultaneously perform power-on / off testing on a plurality of devices under test.

7. The power-on / off test apparatus according to claim 1, wherein The accessible storage device comprises an M.2 solid state disk, a serial hard disk, or an external bootable storage medium.

8. A method of testing continuity of an electrical circuit, characterized by, The power-on / off testing method is applied to the power-on / off testing device of any one of claims 1-7, and the power-on / off testing method comprises: Controlling the device under test to be powered on; Judging whether the test number of the device under test reaches a preset number; In response to not reaching the preset number, running a power-on / off testing script to perform power-on / off testing on the device under test, and increasing the test number by one after completing the power-on / off testing; In response to reaching the preset number, keeping the device under test in the current state, and reminding the worker to check.

9. The power-on / off test method according to claim 8, wherein Before the step of judging whether the test number of the device under test reaches a preset number, the power-on / off testing method further comprises: running a hardware self-check script to perform a hardware self-check on the device under test; determining whether the hardware self-check passes; in response to the hardware self-check passing, performing the step of determining whether the number of tests of the device under test reaches a preset number; in response to the hardware self-check failing, controlling the device under test to remain in the current state and prompting a staff member to check.

10. The power-on / off test method according to claim 8, wherein The step of running the power-on / off test script to perform a power-on / off test on the device under test comprises: running the power-on / off test script to generate a power-on / off instruction, wherein the power-on / off instruction comprises a power-off countdown parameter and a power-on countdown parameter, and the power-off countdown parameter is less than the power-on countdown parameter; starting a timer after the power supply module receives the power-on / off instruction, and in response to the timer reaching the power-off countdown parameter, controlling the power supply module to stop supplying power to the device under test; in response to the timer reaching the power-on countdown parameter, controlling the power supply module to start supplying power to the device under test.

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