Radio frequency power supply test system

Abstract

The invention provides a radio-frequency power supply test system, and the system comprises a signal source module which is used for providing an excitation signal with adjustable frequency and power to a radio-frequency power supply to be tested; the upper computer module is used for coordinating a test process, generating a test instruction, integrating test data and generating an analysis report; the dynamic load simulation module is used for simulating different adjustable impedance environments to match actual load requirements; the vector network analysis module is used for measuring input and output reflection loss of the radio frequency power supply; the power measurement module is used for monitoring the output power of the radio frequency power supply in real time; and the environment simulation module is used for testing the temperature stability of the radio frequency power supply in a set temperature range and analyzing the relevance between power fluctuation and temperature variation. The system realizes performance verification of the radio frequency power supply under different load and frequency conditions through cooperative work of the dynamic load simulation module and the vector network analysis module; the influence of temperature change on power is predicted, and matching network parameters are adjusted in advance.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of power supply testing, and particularly relates to a radio frequency power supply testing system. BACKGROUND

[0002] In the application of the radio frequency power supply, the matching performance between the load and the power supply directly affects the stability, efficiency and reliability of the radio frequency signal transmission. When the load impedance and the radio frequency power supply transmission line impedance are not matched, power reflection at the load end will be caused, and under certain specific impedance conditions, the direct current supply of the radio frequency power supply will show instability with instantaneous large current, thereby affecting the overall performance of the system. Therefore, it is of great significance to accurately measure and analyze the power output characteristics of the radio frequency power supply at different phase changes on the load standing wave circle, for optimizing system matching, improving transmission efficiency and improving the stability of the radio frequency power supply.

[0003] At present, the common system for testing the radio frequency power supply is to directly connect the radio frequency power supply to a fixed dummy load for testing. The defect of this system is that the impedance is fixed and only the general performance and basic parameters of the radio frequency power supply can be tested, and the performance and parameters of the power supply in the customer's field cannot be reflected. The traditional test relies on a single instrument, and it is difficult to synchronously collect multi-dimensional parameters, resulting in one-sidedness of the test results, lack of dynamic load simulation capability, and inability to truly reflect the performance of the radio frequency power supply under actual working conditions.

[0004] Therefore, it is necessary to provide a new radio frequency power supply testing system to solve the above technical problems. SUMMARY

[0005] To solve the above technical problems, the present application provides a radio frequency power supply testing system.

[0006] The radio frequency power supply testing system provided by the present application comprises a signal source module for providing an adjustable frequency and power excitation signal to the radio frequency power supply to be tested;

[0007] The host computer module is used for coordinating the test process and generating test instructions, integrating test data and generating analysis reports;

[0008] The dynamic load simulation module is connected with the host computer module and is used for simulating adjustable different impedance environments to match the actual load requirements;

[0009] The vector network analysis module is used for measuring the input and output reflection loss of the radio frequency power supply;

[0010] The power measurement module is used for real-time monitoring of the output power of the radio frequency power supply;

[0011] The environmental simulation module is used for testing the temperature stability of the radio frequency power supply within a set temperature range and analyzing the correlation between power fluctuation and temperature change.

[0012] The power measurement module uses a root mean square detector to convert the radio frequency signal into a direct current voltage proportional to the power, measures the direct current input voltage and current using a multimeter, samples the power waveform in real time, analyzes harmonic distortion in combination with FFT, and uses a sliding window average algorithm to eliminate transient errors for pulse modulation signals.

[0013] Further, the adjustable different impedance environment simulation includes using a matching circuit composed of adjustable capacitors, inductors and resistors, and switching different impedance values through electronic switches.

[0014] Further, the analysis of the correlation between power fluctuation and temperature change in the environment simulation module includes the following steps:

[0015] Digital temperature sensors are installed at key parts of the radio frequency power supply to record temperature data in real time;

[0016] The environmental temperature, input and output values of the radio frequency power supply are recorded synchronously;

[0017] A linear regression model is established to analyze the direct impact of temperature on power, and a random forest is used to predict the power fluctuation range at different temperatures.

[0018] Further, the environment simulation module includes a temperature control box with a temperature range of -40℃ to +85℃, which tests the performance of the radio frequency power supply at extreme temperatures, synchronously collects data through high-precision temperature sensors and power meters, establishes a three-dimensional mapping relationship between temperature, output power and impedance, and dynamically adjusts the matching network parameters in combination with the random forest model to predict the impact of temperature change on output power.

[0019] Further, the prediction of the impact of temperature change on power includes the following steps:

[0020] The temperature control box gradually increases or decreases in temperature according to the preset temperature curve;

[0021] After each temperature change, the current power and impedance data are collected;

[0022] The current temperature and impedance are input into the trained random forest model to predict the output power;

[0023] The predicted power is compared with the actual power to calculate the deviation.

[0024] Further, the dynamic adjustment of the matching network parameters includes the following steps:

[0025] If the deviation between the predicted power and the actual power is greater than a threshold value, the matching network adjustment is triggered;

[0026] A matching parameter optimization model is constructed based on historical data, input of the matching parameter optimization model is current temperature and impedance, and output is optimal matching capacitance and inductance, and then a PID control algorithm is used to automatically adjust the value of the matching element.

[0027] Further, the vector network analysis module separates the incident wave and the reflected wave through the directional coupler and calculates the reflection coefficient.

[0028] Further, the incident wave separation process includes that the signal output by the signal source output end incident wave is transmitted to the measured device through the input end of the measured device, and a part of the signal is coupled by the coupled incident wave of the directional coupler.

[0029] Further, the reflected wave separation process includes that the reflected wave generated by the measured device returns from the input end of the measured device, and the reflected wave is detected by the directional coupler.

[0030] Further, the reflection coefficient is the ratio of the reflected wave to the incident wave.

[0031] Compared with the related art, the radio frequency power supply test system provided by the application has the following beneficial effects:

[0032] 1. The system realizes performance verification of the radio frequency power supply under different load and frequency conditions through the cooperative work of the dynamic load simulation module and the vector network analysis module, predicts the influence of temperature change on power by using the random forest model, and adjusts the matching network parameters in advance.

[0033] 2. The radio frequency signal is converted into a direct current voltage proportional to the power by using the root mean square detector, the direct current input voltage and current are measured by using the multimeter, the power waveform is sampled in real time, the harmonic distortion is analyzed by combining the fast Fourier analysis, the sliding window average algorithm is adopted to eliminate transient errors for the pulse modulation signal, multi-dimensional parameters are synchronously collected, and the test results are avoided to be one-sided.

[0034] 3. The matching circuit composed of adjustable capacitance, inductance and resistance is adopted, different impedance values are switched through the electronic switch, real working conditions are simulated, the stability of the radio frequency power supply under extreme conditions is verified, and the test environment is dynamically simulated. DETAILED DESCRIPTION

[0035] Figure 1 The structure block diagram of the radio frequency power supply test system provided by the application is shown in the figure;

[0036] Figure 2 The flow chart of analyzing the correlation between power fluctuation and temperature change provided by the application is shown in the figure;

[0037] Figure 3 The flow chart of predicting the influence of temperature change on power provided by the application is shown in the figure;

[0038] Figure 4 The flow chart of dynamically adjusting the matching network parameters provided by the present application. DETAILED DESCRIPTION

[0039] The present application is further illustrated below in conjunction with the accompanying drawings and embodiments.

[0040] Please refer to Figure 1 , Figure 2 , Figure 3 and Figure 4 , wherein, Figure 1 The structural block diagram of the radio frequency power supply test system provided by the present application; Figure 2 The flow chart of analyzing the correlation between power fluctuation and temperature change provided by the present application; Figure 3 The flow chart of predicting the impact of temperature change on power provided by the present application; Figure 4 The flow chart of dynamically adjusting the matching network parameters provided by the present application.

[0041] In the specific implementation process, as shown in Figure 1 , the radio frequency power supply test system includes a signal source module for providing an excitation signal with adjustable frequency and power to the radio frequency power supply to be tested;

[0042] A host computer module for coordinating the test process and generating test instructions, integrating test data and generating analysis reports;

[0043] A dynamic load simulation module connected to the host computer module for simulating adjustable different impedance environments to match the actual load requirements, wherein the adjustable different impedance environment simulation includes a matching circuit composed of adjustable capacitors, inductors and resistors, and different impedance values are switched by electronic switches;

[0044] A vector network analysis module for measuring the input and output reflection loss of the radio frequency power supply;

[0045] A power measurement module for real-time monitoring of the output power of the radio frequency power supply;

[0046] An environment simulation module for testing the temperature stability of the radio frequency power supply within a set temperature range and analyzing the correlation between power fluctuation and temperature change;

[0047] The power measurement module uses a root mean square detector to convert the radio frequency signal into a direct current voltage proportional to the power, measures the direct current input voltage and current using a multimeter, samples the power waveform in real time, combines FFT analysis of harmonic distortion, and uses a sliding window average algorithm to eliminate transient errors for pulse modulation signals.

[0048] It should be noted that the purpose of the root mean square detector is to convert the effective value of the radio frequency signal into a direct current voltage proportional to the power, and the output direct current voltage effective value VRMS proportional to the effective value of the input signal.

[0049] FFT harmonic distortion analysis includes:

[0050] Windowing the sampled data to reduce spectral leakage;

[0051] Using a sliding window to intercept signal segments, the sliding window reduces transient noise and measurement jitter in the pulse-modulated signal by smoothing the data;

[0052] Performing FFT transform on the intercepted signal to obtain the frequency spectrum;

[0053] Extracting the fundamental frequency f0 and its harmonic components f0, 2f0, 3f0, …, nf0;

[0054] Total harmonic distortion calculation: Where V1 is the fundamental amplitude, V2, V3 is the harmonic amplitude.

[0055] Sliding window formula:

[0056]

[0057] Where N is the window length, x(n) is the original sampled data, and y(n) is the smoothed data.

[0058] It should be noted that the environmental simulation module includes a temperature control box, the temperature range of the temperature control box is -40℃ to +85℃, the performance of the test radio frequency power supply at extreme temperature is tested, the data is synchronously collected through a high-precision temperature sensor and a power meter, a three-dimensional mapping relationship of temperature, output power and impedance is established, the influence of temperature change on output power is predicted in combination with a random forest model, and the matching network parameter is dynamically adjusted;

[0059] The sampling timing of the temperature control box, the temperature sensor and the power measurement module is uniformly controlled through the main controller, so that the data time stamps are consistent, the temperature is collected every 10 seconds, and the power and impedance are collected every 1 second;

[0060] Temperature, output power and impedance form a three-dimensional data set:

[0061] It should be further explained that, as shown in Figure 2 The correlation between power fluctuation and temperature change in the environmental simulation module includes the following steps:

[0062] A digital temperature sensor is installed at a key part of the radio frequency power supply to record temperature data in real time;

[0063] Synchronously recording the environmental temperature, the input and output values of the radio frequency power supply;

[0064] A linear regression model is established to analyze the direct impact of temperature on power, and a random forest is used to predict the power fluctuation range at different temperatures;

[0065] The linear regression model of the single variable is as follows:

[0066] P out = β0+ β1·T+ ∈

[0067] where P out is the output power, T is the temperature, β0is the intercept, β1is the temperature coefficient (indicating the impact of unit temperature change on power), and ∈ is the error term;

[0068] The least squares method is used to fit the model, and the p-value of β1is checked to see if it is within the specified requirements, which requires p < 0.05.

[0069] Further, as shown in Figure 3 , the prediction of the impact of temperature change on power includes the following steps:

[0070] The temperature control box gradually increases or decreases the temperature according to the preset temperature curve;

[0071] After each temperature change, the current power and impedance data are collected;

[0072] The current temperature and impedance are input into the trained random forest model to predict the output power

[0073] The predicted power is compared with the actual power P actual , and the deviation

[0074] The random forest is constructed as follows:

[0075] Input features: temperature, power, impedance real part, impedance imaginary part, temperature gradient, power fluctuation rate, and impedance phase angle;

[0076] The output target is the output power or the reflection coefficient.

[0077] It should be noted that, as shown in Figure 4 , the dynamic adjustment of the matching network parameters includes the following steps:

[0078] If the deviation between the predicted power and the actual power is greater than the threshold, the matching network adjustment is triggered;

[0079] The matching parameter optimization model is constructed based on historical data, input of the matching parameter optimization model is current temperature and impedance, and output is optimal matching capacitance and inductance, then a PID control algorithm is used to automatically adjust the value of the matching element, wherein the historical data includes temperature, impedance and matching parameter, the PID control algorithm minimizes the reflection coefficient or stabilizes the output power at a set value.

[0080] It should be noted that the vector network analysis module separates incident waves and reflected waves through a directional coupler and calculates the reflection coefficient.

[0081] The incident wave separation process includes that the signal output by the signal source output end is transmitted to the measured device through the input end of the measured device, and a part of the signal is coupled through the directional coupler; the reflected wave separation process includes that the reflected wave generated by the measured device returns from the input end of the measured device, and the reflected wave is detected through the directional coupler; and the reflection coefficient is the ratio of the reflected wave to the incident wave.

[0082] The computing device for implementing the method according to the embodiment of the present application includes a processor and a memory;

[0083] The processor can be a multi-core processor, or can include a plurality of processors. In some embodiments, the processor can include a general-purpose main processor and one or more special-purpose coprocessors, such as a graphics processing unit (GPU), a digital signal processor (DSP), and the like. In some embodiments, the processor can be implemented using a customized circuit, such as an application specific integrated circuit (ASIC) or a field programmable gate array (FPGA).

[0084] The memory can include various types of storage units, such as a system memory, a read-only memory (ROM), and a permanent storage device. Among them, the ROM can store static data or instructions required by the processor or other modules of the computer. The permanent storage device can be a read and write storage device. The permanent storage device can be a non-volatile storage device that does not lose stored instructions and data even after the computer is powered off. In some embodiments, the permanent storage device uses a mass storage device (such as a magnetic or optical disk, flash memory) as a permanent storage device. In some other embodiments, the permanent storage device can be a removable storage device (such as a floppy disk, an optical drive). The system memory can be a read and write storage device or a volatile read and write storage device, such as a dynamic random access memory. The system memory can store some or all of the instructions and data required by the processor during runtime. In addition, the memory can include a combination of any computer readable storage media, including various types of semiconductor storage chips (DRAM, SRAM, SDRAM, flash memory, programmable read-only memory), magnetic disks and / or optical disks. In some embodiments, the memory can include a read and / or write removable storage device, such as a compact disc (CD), a read-only digital versatile disc (such as DVD-ROM, double-layer DVD-ROM), a read-only Blu-ray disc, an ultra-density optical disc, a flash memory card (such as an SD card, a min SD card, a Micro-SD card, etc.), a magnetic floppy disk, etc. The computer readable storage medium does not include carrier waves and transient electronic signals transmitted through wireless or wired transmission.

[0085] It should be understood that, unless otherwise explicitly stated herein, the execution of the above steps is not strictly limited in order, and the steps can be executed in other orders. Moreover, at least part of the steps in the processes involved in the above embodiments can include multiple steps or multiple stages, which do not necessarily be executed at the same time, but can be executed at different times, and the execution order of the steps or stages is not necessarily sequential, but can be executed alternately or alternately with at least part of other steps or steps or stages in other steps.

[0086] The above shows and describes the basic principles and main features of the present application and the advantages of the present application. It is obvious to those skilled in the art that the present application is not limited to the details of the above exemplary embodiments, and the present application can be implemented in other specific forms without departing from the spirit or essential characteristics of the present application. Therefore, from any point of view, the embodiments should be regarded as exemplary and non-limiting, and the scope of the present application is defined by the appended claims rather than the above description, and therefore all changes falling within the meaning and scope of the equivalent elements of the claims are intended to be included in the present application, and any reference signs in the claims should not be regarded as limiting the claims involved.

[0087] Furthermore, it should be understood that although the description is made according to the embodiments, not every embodiment includes only one independent technical solution, and the description of the specification is only for the sake of clarity, and the skilled in the art should consider the specification as a whole, and the technical solutions in each embodiment can also be combined appropriately to form other embodiments that can be understood by the skilled in the art.

Claims

1. A radio frequency power supply test system, characterized by, The application relates to a test system for radio frequency power supply, comprising: a signal source module for providing adjustable frequency and power excitation signals to the radio frequency power supply to be tested; a host computer module for coordinating the test process and generating test instructions, integrating test data and generating analysis reports; a dynamic load simulation module connected to the host computer module for simulating adjustable different impedance environments to match actual load requirements; a vector network analysis module for measuring the input and output reflection loss of the radio frequency power supply; a power measurement module for real-time monitoring of the output power of the radio frequency power supply; an environment simulation module for testing the temperature stability of the radio frequency power supply within a set temperature range and analyzing the correlation between power fluctuation and temperature change; The power measurement module uses a root mean square detector to convert the radio frequency signal into a direct current voltage proportional to the power, measures the direct current input voltage and current using a multimeter, samples the power waveform in real time, combines FFT analysis of harmonic distortion, and uses a sliding window average algorithm to eliminate transient errors for pulse modulation signals.

2. The RF power supply test system of claim 1, wherein, The adjustable different impedance environment simulation includes a matching circuit composed of adjustable capacitors, inductors and resistors, and different impedance values are switched through electronic switches.

3. The RF power supply test system of claim 2, wherein, The correlation between power fluctuation and temperature change in the environment simulation module includes the following steps: Digital temperature sensors are installed at key positions of the radio frequency power supply to record temperature data in real time; Synchronously record the ambient temperature, input and output values of the radio frequency power supply; Establish a linear regression model to analyze the direct impact of temperature on power, and use a random forest to predict the power fluctuation range at different temperatures.

4. The RF power supply test system of claim 3, wherein, The environment simulation module includes a temperature control box with a temperature range of -40 DEG C to +85 DEG C, which tests the performance of the radio frequency power supply at extreme temperatures, synchronously collects data through high-precision temperature sensors and power meters, establishes a three-dimensional mapping relationship of temperature, output power and impedance, combines a random forest model to predict the impact of temperature change on output power, and dynamically adjusts the matching network parameters.

5. The RF power supply test system of claim 4, wherein, The prediction of the impact of temperature change on power includes the following steps: The temperature control box gradually increases or decreases the temperature according to a preset temperature curve; After each temperature change, the current power and impedance data are collected; The current temperature and impedance are input into the trained random forest model to predict the output power; Compare the predicted power with the actual power to calculate the deviation.

6. The RF power supply test system of claim 5, wherein, The dynamic adjustment of the matching network parameters includes the following steps: If the deviation between the predicted power and the actual power is greater than a threshold value, the matching network adjustment is triggered; Based on historical data, a matching parameter optimization model is constructed, the input of the matching parameter optimization model is the current temperature and impedance, and the output is the optimal matching capacitor and inductor, and then a PID control algorithm is used to automatically adjust the matching element value.

7. The RF power supply test system of claim 6, wherein, The vector network analysis module separates incident waves and reflected waves through a directional coupler and calculates the reflection coefficient.

8. The RF power supply test system of claim 7, wherein, The incident wave separation process includes that the signal output by the incident wave output end of the signal source is transmitted to the measured device through the input end of the measured device, and a part of the signal is coupled through the coupling incident wave of the directional coupler.

9. The RF power supply test system of claim 8, wherein, The reflected wave separation process includes that the reflected wave generated by the measured device returns from the input end of the measured device and the reflected wave is detected through the directional coupler.

10. The RF power supply test system of claim 9, wherein, The reflection coefficient is the ratio of the reflected wave to the incident wave.

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