Server board card testing method and device and electronic equipment

Abstract

The invention provides a server board card testing method and device and electronic equipment, and relates to the technical field of testing, and the method comprises the steps: receiving the model type of a tested board sent by a local server through a communication control module, and the alignment information of the server board card testing device and a sensor interface of the tested board; calling sensor data corresponding to the machine type from the storage module through the communication control module, and mapping the sensor data to a sensor interface according to the alignment information; if a first test instruction issued by the local server is received through the communication control module, sensor data is returned to the tested board through the transceiving control module and the sensor interface; and if a second test instruction issued by the local server is received through the communication control module, ending the test. The test efficiency can be improved.

Description

TECHNICAL FIELD

[0001] The present disclosure relates to the technical field of testing, in particular to a server board card testing method and device and electronic equipment. BACKGROUND

[0002] In related technologies, when performing FCT (Functional Test) testing, for a board card with a sensor communication function, a physical sensor is generally used as a test device to communicate with the board card under test, the board card under test can read the sensor register and obtain environmental condition data sensed by the sensor. Then, the board card under test can parse the obtained data according to a communication protocol, upload the parsed result, and complete the testing. This way has high testing cost and long testing period, resulting in low testing efficiency. SUMMARY

[0003] The present disclosure provides a server board card testing method, device and electronic equipment. The main purpose is to solve the problem of low testing efficiency.

[0004] According to a first aspect of the present disclosure, a server board card testing method is provided, applied to a server board card testing device, the server board card testing device comprising a communication control module, a USB conversion module, a storage module, a transceiver control module, the USB conversion module being connected with the communication control module and a USB interface of a local server, the storage module being connected with the communication control module, the communication control module being connected with the transceiver control module, the server board card testing method comprising: receiving, by the communication control module, a model type of a board under test and alignment information of a sensor interface of the server board card testing device and the board under test sent by the local server; calling, by the communication control module, sensor data corresponding to the model type from the storage module, and mapping the sensor data to the sensor interface according to the alignment information; if a first test instruction issued by the local server is received by the communication control module, returning the sensor data to the board under test through the transceiver control module and the sensor interface; if a second test instruction issued by the local server is received by the communication control module, ending the testing.

[0005] According to a second aspect of the present disclosure, a server board card testing device is provided, comprising: a data receiving module configured to receive a model type of a board under test and alignment information of a sensor interface of the server board card testing device and the board under test sent by a local server; a data transmission module, configured to call sensor data corresponding to the model type and map the sensor data to the sensor interface according to the alignment information; a test module, configured to return the sensor data to the DUT through the sensor interface if the first test instruction issued by the local server is received; a test end module, configured to end the test if the second test instruction issued by the local server is received.

[0006] According to a third aspect of the present disclosure, an electronic device is provided, comprising: at least one processor; and a memory in communication connection with the at least one processor; wherein the memory stores instructions executable by the at least one processor, and the instructions are executed by the at least one processor to enable the at least one processor to perform the method of the first aspect.

[0007] According to a fourth aspect of the present disclosure, a non-transitory computer readable storage medium storing computer instructions is provided, wherein the computer instructions are used to enable the computer to perform the method of the first aspect.

[0008] According to a fifth aspect of the present disclosure, a computer program product is provided, comprising a computer program which, when executed by a processor, implements the method of the first aspect.

[0009] In the embodiments of the present disclosure, the model type of the DUT and the alignment information between the server board test device and the sensor interface of the DUT are received by the communication control module; the sensor data corresponding to the model type is called from the storage module by the communication control module, and the sensor data is mapped to the sensor interface according to the alignment information; if the first test instruction issued by the local server is received by the communication control module, the sensor data is returned to the DUT through the transceiver control module and the sensor interface; and if the second test instruction issued by the local server is received by the communication control module, the test is ended. In this way, the sensor data can be used to replace the physical sensor to complete the test, thereby effectively reducing the cost and shortening the test period, thereby effectively improving the test efficiency; at the same time, dynamic model type identification and interface alignment can be supported, thereby quickly adapting to different DUTs, and thus the flexibility and reliability of the test can be enhanced.

[0010] It should be understood that the content described in this part is not intended to identify key or important features of the embodiments of the present disclosure, nor to limit the scope of the present disclosure. Other features of the present disclosure will become apparent from the following description. BRIEF DESCRIPTION OF DRAWINGS

[0011] The accompanying drawings are used to better understand the present scheme and do not constitute a limitation on the present disclosure. Among them: Figure 1 A flowchart of a server board testing method provided by an embodiment of the present disclosure; Figure 2 A connection relationship diagram of a device under test and a server board testing device provided by an embodiment of the present disclosure; Figure 3 A structural diagram of a server board testing device provided by an embodiment of the present disclosure; Figure 4 A flowchart of another server board testing method provided by an embodiment of the present disclosure; Figure 5 A structural diagram of another server board testing device provided by an embodiment of the present disclosure. DETAILED DESCRIPTION

[0012] Exemplary embodiments of the present disclosure are described below with reference to the accompanying drawings, which include various details of the embodiments of the present disclosure to help understanding, and should be considered as merely exemplary. Therefore, those of ordinary skill in the art should recognize that various changes and modifications can be made to the embodiments described herein without departing from the scope and spirit of the present disclosure. Also, for the sake of clarity and conciseness, descriptions of well-known functions and structures are omitted in the following description.

[0013] As known from the background, in the current digital and information age, the performance and function of a server, as a core device for data processing and storage, directly affect the running efficiency and stability of the entire system. The stable and safe operation of the server cannot be achieved without monitoring the environment, and the monitoring of the environment by the server mainly relies on various sensor devices. Server sensors are usually installed inside or around the server to collect data about environmental conditions such as temperature, humidity, smoke, and liquid cooling leakage. These data can help administrators monitor the running status of the server, predict and prevent potential hardware failures, and take appropriate measures to ensure the reliability and stability of the server. During the production and manufacturing process of PCBA (Printed Circuit Board Assembly) in the server, each board card needs to be tested by FCT, which needs to verify the hardware and related links by running the basic functions of the board card to ensure the quality of the board card out of the factory.

[0014] In the FCT test, for the board card with sensor communication function, generally, the sensor is used as the matching test device to communicate with the measured board card, the measured board card reads the sensor register to obtain the environmental condition data sensed by the sensor, and then the measured board card analyzes the obtained data according to the communication protocol and uploads the analysis result. This method at least has the following technical problems: the matching test sensor is high in price, and the measured board card generally has multiple sensor communication interfaces, the sensor types used by each project are different, the communication modes are different, the sensors of different models are not compatible, which brings great test cost loss to the test; error injection verification cannot be performed, in the normal test environment, the sensor alarm environment cannot be simulated, the function of the measured board card in responding to the alarm information when the sensor abnormally alarms cannot be tested; the matching test structure is complex, the server sensor is generally large in size, the structure space is limited in the FCT, the complex and large sensor leads to complex FCT structure design, long debugging time, high manufacturing cost and long delivery cycle.

[0015] Based on this, the present disclosure provides a server board card test method, device and electronic equipment, which can be used to realize the communication with the sensor communication interface of the measured board card and realize the function of testing the sensor communication link of the measured board card. Generally, the sensor communication mode has three types of CAN (Controller Area Network), RS485 and RS232, the test device can be compatible with the three protocols and each protocol can be matched with multiple (for example, 8) channels, the test of the multi-channel sensor communication link of different models can be realized; and according to the communication protocol between the measured board card and the sensor, the normal environment data and the abnormal environment data can be simulated to communicate with the measured board card, so as to realize the test of the normal monitoring function and the abnormal alarm function of the measured board card. The test device used in this method occupies very little space, greatly simplifies the structure design of the FCT fixture, and further reduces the test cost.

[0016] The server board card test method, device and electronic equipment of the embodiments of the present disclosure are described below with reference to the accompanying drawings.

[0017] Figure 1 The flowchart of the server board card test method provided by the embodiments of the present disclosure is shown in the figure, and the method can be applied to the server board card test device. Referring to Figure 2 , Figure 2 The connection relationship between the measured board and the server board card test device is shown in the figure. As Figure 2As shown, the measured board with RS485 sensor communication interface can be connected to the server board testing device through a cable. The device (server board testing device) can be powered by an external DC power supply, the network interface is connected to the router through a network cable, and the USB (Universal Serial Bus) interface is connected to the local server through a USB cable, so that the device can be used. If the measured board is a CAN or RS232 type sensor communication interface, it can be connected to the corresponding type of interface of the device.

[0018] As shown in Figure 3 , Figure 3 is a structural block diagram of a server board testing device provided by an embodiment of the present disclosure, referring to Figure 3 , including a communication control module, a serial port expansion module (such as serial port expansion module 1 and serial port expansion module 2), a switching and multiplexing module (such as switching and multiplexing module 1 and switching and multiplexing module 2), a transceiver control module (including a 485 transceiver control module and a 232 transceiver control module), a CAN conversion module, a CAN transceiver control module, a USB conversion module, a network transparent transmission module, a storage module, a power supply interface, and a voltage conversion module. The communication network transparent transmission module, the USB conversion module, the CAN conversion module, the storage module, and the serial port expansion module are connected to the communication control module, the CAN transceiver control module is connected to the CAN conversion module, the transceiver control module is connected to the communication control module through the serial port expansion module and the switching and multiplexing module, and the power supply interface is connected to the voltage conversion module. The functions of each module can be as follows: ① Communication control module: as the control module of the device, mainly responsible for logical control, instruction recognition, data calling, measured board communication instruction receiving, sensor analog data sending, etc.

[0019] ② Serial port expansion module: the SPI (Serial Peripheral Interface) signal of the communication control module is expanded into 4 serial ports, each serial port sends and receives independently, the communication control module realizes data receiving function by reading the independent receiving register of each serial port of the serial port expansion module, and realizes data sending function by writing the independent sending register of each serial port of the serial port expansion module. In the system, as the SPI slave of the communication control module, two such module circuits are used to realize 8 serial port expansion.

[0020] ③ Switching and multiplexing module: the serial port signal output by the serial port expansion module is switched to two paths, one of which is connected to the 485 transceiver control module, or the other of which is connected to the 232 transceiver control module, only one of the two signals is conducted, and the other cannot be used at the same time, realizing the multiplexing function of one signal.

[0021] ④ 485 transceiver control module: converts the serial port signal into RS485 signal for measured board communication.

[0022] ⑤232 transceiver control module: convert serial port signal to RS232 signal for communication with the measured board.

[0023] ⑥CAN conversion module and CAN transceiver control module: convert SPI signal of the communication control module into CAN signal, and communicate with the measured board through the CAN transceiver control module. The communication control module realizes data receiving function by reading the receiving register of the CAN conversion module, and realizes data sending function by writing the sending register of the CAN conversion module. In the system, as the SPI slave of the communication control module, 8 CAN conversion module slaves are connected to one SPI, each CAN conversion module slave works independently, and 8 CAN signal extensions are realized.

[0024] ⑦USB conversion module: convert serial port of the communication control module into USB signal, access USB interface of the local server, and communicate with the server. The local server can be a test server system built by the FCT fixture.

[0025] ⑧Network transparent module: convert serial port of the communication control module into network signal, access router, and communicate with remote server. When a model of the device is not stored in the device, the protocol of the model can be written into the reserved partition of the storage module of the device through the communication control module through remote network.

[0026] ⑨Storage module: protocol data storage unit of the device, divided into A, B, C and D four storage areas, A, B and C areas store communication protocol data of commonly used models, and D area is a reserved partition where communication protocol data of special protocol models can be written.

[0027] Power supply interface and voltage conversion module: convert voltage input by the power supply interface, and provide required 1.8V, 3.3V, 5V and other voltages for all modules.

[0028] Based on the device, combined with Figure 4 The server board test method of the embodiment of the disclosure can include the following processes: ①Test start, the local server sends handshake information to the device, and the device enters the preparation state. The local server can be a test server system built by the FCT fixture.

[0029] ②After the device enters the preparation state, it is detected whether each module is in place, and whether each voltage is normal. If not, return abnormal information to the server. If all are normal, return preparation complete information to the server.

[0030] ③Server receives the preparation of the device returned information, send the measured board belongs to the model type (A, B, C, D) and sensor interface and the device interface alignment information to the device.

[0031] ④The device receives the model type and alignment information, according to the model type, call the corresponding partition data storage module, the data includes the device to simulate the transmission of normal sensor data and abnormal sensor data. The device will also be issued according to the alignment information of the server, determine the access to the device of each measured interface, corresponding to the need of simulation sensor information, such as temperature sensor, smoke sensor, liquid detection sensor, etc. After alignment, the measured board interface needs to send the simulation data.

[0032] ⑤Model type and alignment information confirmation is completed, the device will return the completion information to the local server through the USB interface, and then wait for the server to issue test instructions to the device.

[0033] ⑥If the server receives the instruction for the wrong test instruction, the device waits for the measured board sensor communication interface to issue the sensor data reading instruction, and returns the simulated abnormal alarm sensor data to the measured board sensor interface after receiving it. Each time you receive a query, you will return a data until you receive the next server through the USB port instruction, and then according to the instruction to the next step.

[0034] ⑦If the server receives the instruction for the normal test instruction, the device waits for the measured board sensor communication interface to issue the sensor data reading instruction, and returns the simulated normal sensor data to the measured board sensor interface after receiving it. Each time you receive a query, you will return a data until you receive the next server through the USB port instruction, and then according to the instruction to the next step.

[0035] In the process of communication between the device and the measured board sensor interface, it will always wait for the server to issue instructions again. If the instruction is not received, it will be in a communication state. When the instruction is received, if it is a test end instruction, the device is initialized and the test is ended. If the received instruction is a test instruction, the step ⑥ or step ⑦ is performed according to the instruction.

[0036] Among them, ⑧ and ⑨ described in the D partition of the device storage module need to be completed before the test begins.

[0037] Based on this, the server board card testing device provided by the embodiment of the present disclosure develops a multi-channel server sensor simulation device compatible with multiple protocols, which is used for communication interface communication with the sensor of the measured board card, and can realize compatibility with different models, realize testing of the multi-channel sensor communication link of the measured board card, and the device can also simulate normal environment data and abnormal environment data according to the communication protocol of the measured board card and the sensor, realize testing of the normal monitoring function and the abnormal alarm function of the measured board card, and improve the coverage rate of the function testing. The device can replace the existing testing method through the sensor physical object, reduces the testing cost, and the device occupies very little space, greatly simplifies the structure design of the FCT tool, and further reduces the testing cost.

[0038] Figure 1 The flowchart of the server board card testing method provided by the embodiment of the present disclosure is shown in FIG. 1. Figure 1 As shown in the figure, the method can be applied to the server board card testing device described above, and the method comprises the following steps: Step 101, receiving the model type of the measured board card sent by the local server through the communication control module, and the alignment information of the sensor interface of the server board card testing device and the measured board card.

[0039] Among them, two groups of information can be received from the local server through the communication control module: the model type of the measured board card, such as the specific model or category of the measured board card, which is used to determine which sensor data needs to be called; and the alignment information, such as the mapping relationship between the interface of the server board card testing device and the sensor interface of the measured board card, to ensure that the testing device can correctly send data to the corresponding interface of the measured board card.

[0040] Step 102, calling the sensor data corresponding to the model type from the storage module through the communication control module, and mapping the sensor data to the sensor interface according to the alignment information.

[0041] Among them, according to the received model type information, the sensor data corresponding to the model type can be called from the storage module through the communication control module, and the sensor data can include normal sensor data and abnormal sensor data. Then, according to the alignment information, the called sensor data can be distributed to the corresponding sensor interface, to ensure that the data can be accurately sent to the corresponding sensor interface of the measured board card.

[0042] Step 103, if the first test instruction issued by the local server is received through the communication control module, the sensor data is returned to the measured board card through the transceiver control module and the sensor interface.

[0043] Wherein, after mapping the sensor data to the sensor interface, the test instruction issued by the local server, i.e. the first test instruction, can be monitored. If the first test instruction issued by the local server is received through the communication control module, the sensor data pre-called and mapped can be sent to the board under test through the transceiver control module and the sensor interface, to simulate the actual working state of the sensor and verify whether the function of the board under test is normal.

[0044] In step 104, if the second test instruction issued by the local server is received through the communication control module, the test is ended.

[0045] Wherein, when the second test instruction issued by the local server is received through the communication control module, the test ending operation can be performed. This can include clearing the current test state, initializing the device or performing other necessary cleaning work, so that the test device can be prepared for the next test.

[0046] In the embodiments of the present disclosure, the model type of the board under test sent by the local server is received through the communication control module, and the alignment information of the server board card test device and the sensor interface of the board under test is received; the sensor data corresponding to the model type is called from the storage module through the communication control module, and the sensor data is mapped to the sensor interface according to the alignment information; if the first test instruction issued by the local server is received through the communication control module, the sensor data is returned to the board under test through the transceiver control module and the sensor interface; if the second test instruction issued by the local server is received through the communication control module, the test is ended. In this way, the sensor data can be simulated to replace the physical sensor to complete the test, thereby effectively reducing the cost and shortening the test period, thereby effectively improving the test efficiency; at the same time, dynamic model type identification and interface alignment can be supported, thereby different boards under test can be quickly adapted, and the flexibility and reliability of the test can be enhanced.

[0047] It should be noted that the embodiments of the present disclosure can include a plurality of steps, which are numbered for the convenience of description, but these numbers are not a limitation on the execution time slot and execution order between the steps; these steps can be implemented in any order, and the embodiments of the present disclosure do not limit this.

[0048] Further, before receiving the model type of the board under test sent by the local server and the alignment information of the server board card test device and the sensor interface of the board under test through the communication control module, it further includes: In the case of receiving the handshake information sent by the local server through the communication control module, entering the preparation state and performing self-checking; In the case of normal self-checking result, the communication control module returns a preparation completion information to the local server, so that the local server sends the model type of the tested board and the alignment information of the sensor interface of the server board card testing device to the testing device.

[0049] Further, in the case of receiving the handshake information sent by the local server through the communication control module, after entering the preparation state and performing self-checking, the method further comprises: In the case of abnormal self-checking result, the communication control module returns an abnormal information to the local server.

[0050] The self-checking comprises detecting whether each module is in place and detecting whether the voltage of each circuit is normal.

[0051] Before receiving the model type of the tested board and the alignment information of the sensor interface of the tested board sent by the local server through the communication control module, the local server can send a handshake information to the testing device, and the handshake information can be an initialization signal for informing the testing device that the testing process is about to start. After receiving the handshake information sent by the local server through the communication control module, the testing device can enter the preparation state and start self-checking, for example, detecting whether each module is in place and detecting whether the voltage of each circuit is normal. If the self-checking result shows that each module in the testing device is in place and the power supply is normal, the communication control module can return a preparation completion information to the local server, so that the local server sends the model type of the tested board and the alignment information of the sensor interface of the testing device to the testing device. The preparation completion information can be a confirmation signal for informing the local server that the testing device is ready to receive the next testing instruction and data. By returning the preparation completion information, the testing device and the local server can establish a synchronization mechanism to ensure the smooth progress of the testing process. On the contrary, if the self-checking result shows that the testing device is abnormal, for example, at least one module is not in place or the voltage of the circuit is abnormal, the communication control module can return an abnormal information to the local server, so that the local server can receive and understand the abnormal condition of the testing device.

[0052] Further, the communication control module calls the sensor data corresponding to the model type from the storage module, and maps the sensor data to the sensor interface according to the alignment information, comprising: The communication control module determines the sensor data corresponding to the model type from the storage partition of the storage module; and the communication control module calls the sensor data corresponding to the model type from the storage module; The communication control module maps the sensor data to the sensor interface according to the alignment information.

[0053] The storage module includes a plurality of different storage areas, each of which stores sensor data corresponding to different model types; the model types include a plurality of different board models to be tested; the sensor data can be normal sensor data and abnormal sensor data, which are used to simulate different test scenarios. The model type can refer to the specific model or category of the board to be tested, and each model type has its corresponding sensor data, which varies according to the model type. The sensor data corresponding to different model types is stored in different storage partitions for quick searching and calling.

[0054] When the sensor data corresponding to the model type is called from the storage module by the communication control module and mapped to the sensor interface according to the mapping information, the sensor data corresponding to the model type can be called from the storage partition of the storage module according to the received model type information. For example, the sensor data matching the model type can be found by searching the storage partition, to ensure that the test device can quickly obtain the correct data for subsequent test steps. Then, the called sensor data can be distributed to the corresponding sensor interface by the communication control module according to the mapping information. The mapping information specifies the mapping relationship between the interfaces of the server board test device and the sensor interfaces of the board to be tested, ensuring that the data can be correctly sent to the corresponding interfaces of the board to be tested. In this way, the calling and mapping of sensor data can be efficiently and accurately completed, ensuring the smooth progress of the test process.

[0055] Further, the server board test device further includes a transceiver control module connected with the communication control module; the sensor data includes normal sensor data and abnormal sensor data; the first test instruction is an error injection test instruction or a normal test instruction; If the first test instruction is received by the communication control module from the local server, the sensor data is returned to the board to be tested through the transceiver control module and the sensor interface, including: If the first test instruction is an error injection test instruction, the abnormal sensor data is returned to the board to be tested through the transceiver control module and the sensor interface; If the first test instruction is a normal test instruction, the normal sensor data is returned to the board to be tested through the transceiver control module and the sensor interface.

[0056] The sensor data stored in the server board card testing device can be divided into two categories: normal sensor data, used to simulate the output data of the sensor in the normal working state; and abnormal sensor data, used to simulate the output data of the sensor in the fault or abnormal state. Both of these two types of data are pre-stored in the storage module of the server board card testing device and are called according to the test requirements. The first test instruction issued by the local server has two types: error injection test instruction, used to instruct the testing device to return abnormal sensor data, for testing the processing capability of the measured board in the sensor fault condition; and normal test instruction, used to instruct the testing device to return normal sensor data, for testing the performance of the measured board in the normal working state.

[0057] When the error injection test instruction issued by the local server is received through the communication control module, the abnormal sensor data can be sent to the measured board through the transceiver control module and the sensor interface. In this way, the sensor fault scenario can be simulated, and the processing capability and fault detection mechanism of the measured board under abnormal conditions can be verified. When the normal test instruction issued by the local server is received through the communication control module, the normal sensor data can be sent to the measured board through the transceiver control module and the sensor interface. In this way, the normal working scenario of the sensor can be simulated, and the performance and function of the measured board in the normal working state can be verified. In this way, according to different test requirements, the corresponding sensor data can be flexibly selected and sent, ensuring the comprehensiveness and effectiveness of the test process.

[0058] Further, if the second test instruction issued by the local server is received through the communication control module, the test is ended, including: If the second test instruction issued by the local server is received through the communication control module, the initialization operation is performed, and the test is ended.

[0059] The server board card testing device can continuously monitor the instructions of the local server during the test. When the second test instruction is received through the communication control module, the second test instruction indicates that the current test process needs to be ended. At this time, the initialization operation can be performed through the communication control module, for example, the specific content of the initialization operation can include: clearing the current test state: clearing the current test related data and state information stored in the testing device; restoring the default settings: restoring the configuration of the testing device to the initial state for the next test; closing the interface connection: closing the connection of the sensor interface with the measured board, to ensure that the testing device is in standby state, etc. In this way, the initialization operation can ensure that the server board card testing device can quickly and safely prepare for the next test after the current test is ended, avoiding problems in subsequent tests caused by residual test states.

[0060] After the initialization operation is completed, the current test procedure is formally ended, for example, the current test task is exited, a standby state is entered, and the next test instruction is waited. In this way, it can be ensured that the server board testing device can safely stop working after completing the task, and at the same time, the next test is prepared. In this way, the current test can be safely and efficiently ended, and the next test is fully prepared, so that the integrity and reliability of the test procedure are ensured.

[0061] Further, after the communication control module calls the sensor data corresponding to the model type from the storage module and maps the sensor data to the sensor interface according to the alignment information, if the first test instruction issued by the local server is received through the communication control module, before the sensor data is returned to the measured board through the transceiver control module and the sensor interface, the method further includes: The communication control module returns the confirmation completion information to the local server through the USB conversion module; wherein the confirmation completion information is used to indicate the confirmation completion of the model type and the alignment information.

[0062] The communication control module can also generate confirmation completion information indicating the confirmation completion of the model type and the alignment information after calling the sensor data corresponding to the model type from the storage module and mapping the sensor data to the sensor interface according to the alignment information. For example, it can be used to indicate that the sensor data corresponding to the model type has been called, and the sensor data has been mapped to the sensor interface according to the alignment information. Then, the communication control module can return the confirmation completion information to the local server through the USB interface through the USB conversion module, so that the local server can clearly understand the situation of the testing device, and issue a test instruction, such as the first test instruction or the second test instruction, to the testing device.

[0063] Through the description of the above embodiments, those skilled in the art can clearly understand that the method according to the above embodiments can be realized by means of software and the necessary general hardware platform, of course, it can also be realized by hardware, but in many cases, the former is a better embodiment.

[0064] According to the embodiments of the present disclosure, the present disclosure also provides a server board testing device. For example, Figure 5 A structural schematic diagram of a server board testing device provided by the embodiments of the present disclosure. The server board testing device 500 includes: The data receiving module 510 is configured to receive the model type of the measured board sent by the local server, and the alignment information of the sensor interface of the server board testing device and the measured board; The data transmission module 520 is configured to call the sensor data corresponding to the model type, and map the sensor data to the sensor interface according to the alignment information. The test module 530 is configured to return the sensor data to the DUT through the sensor interface if the first test instruction issued by the local server is received. The test end module 540 is configured to end the test if the second test instruction issued by the local server is received.

[0065] Further, the server board test device 500 further comprises: The self-check module is configured to enter a preparation state and perform self-checking if the handshake information sent by the local server is received. The normal information return module is configured to return preparation completion information to the local server if the self-checking result is normal, so that the local server sends the model type of the DUT and the alignment information of the server board test device and the sensor interface to the server board test device.

[0066] Further, the self-checking comprises checking whether each module is in place and checking whether the voltage of each path is normal.

[0067] Further, the data transmission module 520 is configured to: Determine the sensor data corresponding to the model type in a preset sensor data set, wherein the preset sensor data set comprises sensor data corresponding to different model types; the model type comprises different DUT models; and the sensor data corresponding to the different model types is respectively stored in different storage partitions according to the different model types. Call the sensor data corresponding to the model type. Map the sensor data to the sensor interface through the alignment information.

[0068] Further, the sensor data comprises normal sensor data and abnormal sensor data; and the first test instruction is an error injection test instruction or a normal test instruction. The test module 530 is configured to: If the first test instruction is the error injection test instruction, return the abnormal sensor data to the DUT through the sensor interface. If the first test instruction is the normal test instruction, return the normal sensor data to the DUT through the sensor interface.

[0069] Further, the test end module 540 is configured to: If the second test instruction issued by the local server is received, perform an initialization operation and end the test.

[0070] Further, the server board testing apparatus 500 further comprises: The abnormal information returning module is configured to return abnormal information to the local server when the self-checking result is abnormal.

[0071] Further, the server board testing apparatus 500 further comprises: The confirmation information returning module is configured to return confirmation completion information to the local server through a universal serial bus (USB) interface, wherein the confirmation completion information is used to indicate that the model type and the alignment information are confirmed to be completed.

[0072] It should be noted that the description of the features in the embodiments of the server board testing apparatus can refer to the related description of the embodiments of the server board testing method, which will not be repeated here.

[0073] Embodiments of the present disclosure further provide an electronic device, comprising a memory and a processor, the memory stores a computer program, and the processor is configured to run the computer program to perform the steps in any of the above-mentioned server board testing method embodiments.

[0074] Embodiments of the present disclosure further provide a computer readable storage medium, which stores a computer program, wherein the computer program is configured to perform the steps in any of the above-mentioned server board testing method embodiments when running.

[0075] In an example embodiment, the above-mentioned computer readable storage medium can include, but is not limited to, a U disk, a read-only memory (ROM), a random access memory (RAM), a mobile hard disk, a magnetic disk or an optical disk, and various media that can store computer programs.

[0076] Embodiments of the present disclosure further provide a computer program product, which comprises a computer program, and the computer program is executed by a processor to implement the steps in any of the above-mentioned server board testing method embodiments.

[0077] Embodiments of the present disclosure further provide another computer program product, which comprises a non-volatile computer readable storage medium, and the non-volatile computer readable storage medium stores a computer program, and the computer program is executed by a processor to implement the steps in any of the above-mentioned server board testing method embodiments.

[0078] Those skilled in the art will further realize that the mere concepts, teachings, and embodiments described herein are merely meant to provide an enabling description of the claimed embodiments and are not intended to limit the scope of the claims. Consequently, although specific embodiments have been described herein, any alterations, modifications, equivalents, combinations, sub-combinations, and / or improvements thereon falling within the scope of the disclosed concept, teachings, and embodiments may be resorted to by those skilled in the art based on the present disclosure. Accordingly, the scope of the claims should not be limited by the detailed description and specific examples given above, but should be determined by the appended claims and their equivalents.

[0079] The above describes in detail a target detection method provided by the present disclosure. The principles and implementation manners of the present disclosure are described by applying specific examples. The above description of the examples is only for helping to understand the method of the present disclosure and its core idea. It should be pointed out that, for those skilled in the art, some improvements and modifications can be made to the present disclosure without departing from the principles of the present disclosure, and these improvements and modifications also fall within the protection scope of the claims of the present disclosure.

Claims

1. A method of testing a server board card, the method comprising: The application is applied to a server board testing device, which comprises a communication control module, a USB conversion module, a storage module, and a transceiver control module. The USB conversion module is connected with the communication control module and a USB interface of a local server. The storage module is connected with the communication control module. The communication control module is connected with the transceiver control module. The server board testing method comprises the following steps: Receiving, by the communication control module, a model type of a tested board sent by the local server and alignment information of a sensor interface of the server board testing device and the tested board; Calling, by the communication control module, sensor data corresponding to the model type from the storage module and mapping the sensor data to the sensor interface according to the alignment information; If a first test instruction issued by the local server is received by the communication control module, returning the sensor data to the tested board through the transceiver control module and the sensor interface; If a second test instruction issued by the local server is received by the communication control module, ending the test.

2. The method of claim 1, wherein, Before the step of receiving, by the communication control module, a model type of a tested board sent by the local server and alignment information of a sensor interface of the server board testing device and the tested board, the method further comprises the following steps: In the case that handshake information sent by the local server is received by the communication control module, entering a preparation state and performing self-checking; In the case that the self-checking result is normal, returning, by the communication control module, preparation completion information to the local server, so that the local server sends a model type of a tested board and alignment information of a sensor interface of the server board testing device to the server board testing device.

3. The method of claim 2, wherein, The self-checking comprises detecting whether each module is in place and detecting whether the voltage of each path is normal.

4. The method of claim 1, wherein, The step of calling, by the communication control module, sensor data corresponding to the model type from the storage module and mapping the sensor data to the sensor interface according to the alignment information comprises the following steps: Determining, by the communication control module, sensor data corresponding to the model type from a storage partition of the storage module; wherein the storage module comprises a plurality of different storage areas, each of the storage areas stores sensor data corresponding to different model types; and the model type comprises a plurality of different tested board models; Calling, by the communication control module, sensor data corresponding to the model type from the storage module; Mapping, by the communication control module and the alignment information, the sensor data to the sensor interface.

5. The method according to claim 1 or 4, characterized in that, The server board testing device further comprises a transceiver control module connected with the communication control module; The sensor data comprises normal sensor data and abnormal sensor data; and the first test instruction is an error injection test instruction or a normal test instruction. If the first test instruction issued by the local server is received by the communication control module, the sensor data is returned to the board under test through the transceiver control module and the sensor interface, including: If the first test instruction is the error injection test instruction, the abnormal sensor data is returned to the board under test through the transceiver control module and the sensor interface; If the first test instruction is the normal test instruction, the normal sensor data is returned to the board under test through the transceiver control module and the sensor interface.

6. The method of claim 1, wherein, If the second test instruction issued by the local server is received by the communication control module, the test is ended, including: If the second test instruction issued by the local server is received by the communication control module, the initialization operation is performed and the test is ended.

7. The method of claim 2, wherein, After entering the preparation state and performing self-checking when the handshake information sent by the local server is received by the communication control module, the method further includes: If the self-checking result is abnormal, the communication control module returns abnormal information to the local server.

8. The method of claim 2, wherein, After the sensor data corresponding to the model type is called from the storage module by the communication control module and the sensor data is mapped to the sensor interface according to the alignment information, if the first test instruction issued by the local server is received by the communication control module, the sensor data is returned to the board under test through the transceiver control module and the sensor interface, and the method further includes: The communication control module returns confirmation completion information to the local server through the USB conversion module; wherein the confirmation completion information is used to indicate that the model type and the alignment information are confirmed to be completed.

9. An electronic device, characterized in that, comprising: at least one processor; and a memory connected with the at least one processor in communication; wherein the memory stores instructions executable by the at least one processor, and the instructions are executed by the at least one processor to enable the at least one processor to perform the method of any one of claims 1 to 8.

10. A non-transitory computer-readable storage medium having stored thereon computer instructions, wherein, The computer instructions are used to enable the computer to perform the method of any one of claims 1 to 8.

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