Equipment integration aging test method and system

Abstract

The invention relates to a multi-device integrated aging test method, which solves the problem that an aging room needs to be built independently in the traditional aging test by designing a movable multi-device integrated aging test cabinet, and greatly reduces the test cost. The aging cabinet can be connected with a plurality of camera devices at the same time for testing, thereby meeting the requirements of small-batch testing, and facilitating the later transition transportation. The equipment IP is automatically read and the connection is established by presetting an aging test tool, and the full-process automatic control of equipment self-inspection, parameter configuration, power-on and power-off test, high-temperature aging and the like is realized by combining a PLC control system, so that the aging process is simplified, and the operation difficulty is reduced; each power supply panel in the aging cabinet can be independently controlled at an aging control computer end, and flow control is performed through early-stage programming debugging, so that the test flexibility and accuracy are improved; the functions of automatic IP, firmware version checking and upgrading, hardware self-checking and the like are achieved in cooperation with independent order loading and placing equipment, the manual participation degree is reduced, and the production efficiency is improved. Compared with the prior art, the multi-device integrated aging test method and system provided by the invention have the advantages that the portability, automation and intelligentization of the aging test are realized, and the deployment efficiency and the test efficiency are remarkably improved.

Description

TECHNICAL FIELD

[0001] The present application relates to the field of electronic device aging test, in particular to a device integrated aging method and system, computer device and computer readable storage medium. BACKGROUND

[0002] With the rapid development of electronic device manufacturing industry, the aging test of electronic devices before leaving the factory becomes increasingly important. Aging test is to simulate various environmental conditions and working states that the device may encounter in actual use, to test the stability and reliability of the device, so as to screen out potential early failure products. At present, electronic device aging test is mainly carried out through special aging test equipment, which usually includes aging cabinet, test tool and control system and other components.

[0003] However, the existing electronic device aging test technology still has the following problems: first, the traditional electronic device aging test usually needs to build a separate aging room, which not only has high cost, but also is inconvenient to change the site, and is difficult to adapt to the changes of production demand; second, although the small aging cabinet on the market is convenient to move, it has single function and small space, and cannot meet the demand of small batch and multiple device test at the same time; third, most of the existing aging test equipment lacks convenient transportation and rapid deployment capability, resulting in long time consumption of device migration and test environment construction; fourth, the operation process of the existing aging test equipment is complex, which needs professional operation, and is not conducive to improving the test efficiency; finally, the existing aging test equipment often lacks multi-functional integrated capability, and cannot realize the unified test and management of multiple electronic devices, increasing the test cost and complexity.

[0004] Therefore, it is urgent to develop a mobile and easy-to-operate multi-device integrated aging test method and device to solve the above problems. SUMMARY

[0005] The embodiments of the present application provide a multi-device integrated aging test method, system, computer device and computer readable storage medium, to at least solve the problem of poor device aging test efficiency in related technologies.

[0006] In a first aspect, the embodiments of the present application provide a multi-device integrated aging test method for aging test of electronic devices through a mobile aging cabinet, which comprises: in response to an indication signal that the to-be-tested device has been placed in the aging cabinet, detecting whether the aging environment is ready; if yes, reading the device IP of the to-be-tested device through a preset aging test tool, and establishing a plurality of connection channels with a plurality of to-be-tested devices through a switch and a transmission line based on the device IP; The integrated aging test of each to-be-tested device is performed based on each connection channel through an aging control process pre-configured based on a programmed modulation mode, and an aging diagnosis report is generated after the aging test is completed.

[0007] In some embodiments, the integrated aging test of each to-be-tested device based on each connection channel comprises: An automatic configuration process of each to-be-tested device based on the connection channel is performed through the preset aging test tool, wherein the automatic configuration process comprises: automatically assigning a device IP, controlling the to-be-tested device to restart, performing a hardware self-check, and verifying a firmware version; If the hardware self-check and the firmware version verification are both passed, parameter configuration of the to-be-tested device is performed based on parameter configuration requirements in the aging control process; After the parameter configuration is completed, independent power-on and power-off tests of each to-be-tested device are controlled by an on-off controller in the aging test cabinet according to the aging control process, and at the same time, the internal temperature of the test cabinet is regulated to a preset aging temperature threshold through a heating temperature control system to perform high-temperature aging test.

[0008] In some embodiments, during the power-on and power-off test and the high-temperature aging test, the running state and test data of each to-be-tested device are monitored in real time through the preset aging test tool, and if an abnormality is monitored, an artificial troubleshooting instruction is triggered, and if there is no abnormality in the test process, the integrated aging test is continuously performed.

[0009] In some embodiments, the to-be-tested electronic device is an industrial camera, and the high-temperature aging test comprises: Real-time acquisition of current time series data and surface temperature data of the industrial camera, calculation of current fluctuation entropy and temperature gradient based on the current time series data and the surface temperature data respectively through a feature extraction module; Input of the current fluctuation entropy, the temperature gradient, and a device self-check error code into a pre-trained aging fault prediction model to output a fault probability in a future set time window; In the test process, the aging strategy is dynamically adjusted according to the fault probability, and the aging strategy comprises: if the fault probability of a certain industrial camera exceeds a preset high-risk threshold, the power supply of the industrial camera is cut off and the position is marked; if the fault probability is in a preset medium-risk interval, the aging time of the industrial camera is extended and the data sampling frequency is increased; Based on the fault probability, current fluctuation entropy, and temperature gradient data, an aging diagnosis report containing a fault probability curve, abnormal feature tracing, and maintenance suggestions is generated in combination with the device self-check error code.

[0010] In some embodiments, the aging cabinet is internally provided with a plurality of power supply panels, the power supply panels are connected with the preset aging test tool, and the power supply state of each power supply panel is independently operated and regulated through the aging control computer.

[0011] In some embodiments, the power supply panel, the internal temperature of the aging test cabinet and the control time are flow-controlled through the pre-programmed debugging mode, wherein, during the aging test process, the control items of the power supply panel include the on-off of the power supply, the adjustment of the voltage and current, etc.

[0012] In some embodiments, detecting whether the test environment is ready includes: judging whether the to-be-tested electronic device has been correctly placed at a designated position inside the aging cabinet, if yes, judging whether the customized network cable between the to-be-tested electronic device and the aging cabinet has been connected, if yes, judging whether the power supply of the to-be-tested electronic device and the aging cabinet has been connected, whether the connection line is smooth, and whether the power supply interface is normal, if yes, judging whether the switch inside the aging cabinet is in a normal working state, if yes, judging whether the communication link between the aging control computer and the aging cabinet is smooth, if yes, outputting an indication signal that the test environment is ready. In a second aspect, the embodiments of the present application provide a multi-device integrated aging test system, the system comprising: a preprocessing module and a test module, wherein: The preprocessing module is configured to, in response to an indication signal that a to-be-tested device has been placed in an aging cabinet, detect whether an aging environment is ready; if yes, read a device IP of the to-be-tested device through a preset aging test tool, and based on the device IP, establish a plurality of connection channels with a plurality of to-be-tested devices through a switch and a transmission line; The test module is configured to, based on an aging control process pre-configured in a programmed mode, perform integrated aging test on each to-be-tested device based on each connection channel, and generate an aging diagnosis report after the aging test is completed.

[0013] In some embodiments, the aging cabinet is internally provided with a plurality of power supply panels, the power supply panels are connected with the preset aging test tool, and the power supply state of each power supply panel is independently operated and regulated through the aging control computer.

[0014] In a third aspect, the embodiments of the present application provide a multi-device integrated aging test cabinet, which is used for performing aging test on an electronic device according to the aging test method provided in the first aspect.

[0015] Compared with the related art, the multi-device integrated aging test method provided by the embodiment of the application solves the problem of the need for separately building an aging room for traditional aging test, greatly reduces the test cost, and the aging cabinet can simultaneously connect multiple camera devices for test, meets the small batch test demand, and is convenient for later scene transfer and transportation, the aging test tool is preset to automatically read the device IP and establish connection, the self-checking, parameter configuration, power-on and power-off test and high-temperature aging and other full-process automatic control are realized by combining the PLC control system, the aging process is simplified, and the operation difficulty is reduced, each power supply panel in the aging cabinet can be individually controlled at the aging control computer end, the process control is realized through the early programming debugging, and the flexibility and accuracy of the test are improved, the automatic IP, firmware version inspection and upgrading, hardware self-checking and other functions are realized by cooperating with the independent on-off device, the manual participation degree is reduced, and the production efficiency is improved. Compared with the prior art, the multi-device integrated aging test method and system provided by the application realize the portability, automation and intelligentization of the aging test, and significantly improve the deployment efficiency and test efficiency. BRIEF DESCRIPTION OF DRAWINGS

[0016] The drawings described herein are used to provide further understanding of the application, form a part of the application, the illustrative embodiments of the application and the description thereof are used to explain the application, and do not constitute improper limitation on the application. In the drawings: Figure 1 is a schematic diagram of an aging test process according to an embodiment of the application Figure 2 is a schematic diagram of an aging test process according to an embodiment of the application Figure 3 is a structural block diagram of a multi-device integrated aging test system according to an embodiment of the application. DETAILED DESCRIPTION

[0017] In order to make the purpose, technical scheme and advantages of the application more clear, the application is described and explained below in combination with the drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the application, and do not limit the application. Based on the embodiments provided by the application, all other embodiments obtained by those of ordinary skill in the art without creative labor fall within the scope of the application.

[0018] It is apparent that the drawings in the following description merely show some examples or embodiments of the present application, and the present application can be applied to other similar situations without creative efforts by those skilled in the art based on these drawings. In addition, it can be understood that, although the efforts made in the development process can be complex and lengthy, some design, manufacture or production changes made on the basis of the technical content disclosed in the present application are only routine technical means for those skilled in the art related to the content disclosed in the present application, and should not be understood as insufficient disclosure of the content disclosed in the present application.

[0019] Reference to "an embodiment" in this application means that a particular feature, structure, or characteristic described in connection with the embodiment can be included in at least one embodiment of the application. The appearances of the phrase in various places in the specification are not necessarily all referring to the same embodiment, nor are they necessarily mutually exclusive of one another. It is explicitly contemplated that embodiments described herein can be combined with other embodiments in a non- conflicting manner.

[0020] Unless otherwise defined, technical terms or scientific terms used in the present application should be understood as their common meanings to those skilled in the art. The terms "a", "an", "one", "the", and similar terms in the present application do not denote a quantity of one, but can denote a singular or a plurality. The terms "comprise", "include", "have", and any variations thereof in the present application are intended to cover non-exclusive inclusion; for example, a process, method, system, product, or device including a list of steps or modules (units) is not limited to the listed steps or units, but can further include other steps or units not listed or can further include other steps or units inherent to such processes, methods, products, or devices. The terms "connect", "connected", "couple", and similar terms in the present application are not limited to physical or mechanical connections, but can include electrical connections, whether direct or indirect. The term "plurality" in the present application means two or more. The term "and / or" describes the association relationship between the associated objects, which means that there can be three relationships, for example, "A and / or B" can mean that A exists alone, A and B exist together, and B exists alone. The character " / " generally represents an "or" relationship between the associated objects. The terms "first", "second", "third", and the like in the present application are merely to distinguish similar objects, and do not represent a specific order for the objects.

[0021] Embodiment one The present embodiment provides a multi-device integrated aging test method, which tests electronic devices through a movable aging cabinet. The specific implementation steps of the method are as follows: First, when the device under test (DUT) is placed in the aging chamber, it will receive an indication signal. Responding to this signal, the process of determining if the aging environment is ready begins. This process involves the following steps: S1, determine whether the electronic device under test has been correctly placed in the designated position inside the aging cabinet; S2, If the electronic device under test has been placed correctly, determine whether the custom network cable between the electronic device under test and the aging cabinet has been connected. S3, If the customized network cable is connected, determine whether the power supply of the electronic device under test and the aging cabinet is connected, whether the connection line is unobstructed, and whether the power interface is normal. S4. If the power connection is normal, determine whether the switch built into the aging cabinet is in normal working condition. S5. If the switch is working properly, determine whether the communication link between the aging control computer and the aging cabinet is unobstructed. S6, if the communication link is unobstructed, outputs an indication signal that the test environment is ready.

[0022] Figure 1 This is a schematic diagram of an aging test process according to an embodiment of this application, as shown below. Figure 1 As shown, once the aging environment is confirmed to be ready, the device IP of the device under test (DUT) is read using a preset aging test tool. Based on the device IP, multiple connection channels are established with multiple DUTs via switches and transmission lines. The aging cabinet contains multiple power supply panels, which are connected to the preset aging test tool. The power supply status of each power supply panel can be independently operated and controlled via the aging control computer. The power supply panels, the internal temperature of the aging test cabinet, and the control time are controlled in a streamlined manner through pre-programmed debugging. During the aging test, the control items on the power supply panels include power on / off and voltage / current adjustment.

[0023] Furthermore, through an aging control process pre-configured based on programming modulation, integrated aging tests are performed on each device under test based on each connection channel.

[0024] Figure 2 This is a schematic diagram of another aging test process according to an embodiment of this application, such as... Figure 2 As shown, the specific test steps are as follows: First, using a pre-set aging test tool, an automatic configuration process is executed on each device under test (DUT) based on the connection channel. The automatic configuration process includes: automatically assigning device IP addresses, controlling the DUT to restart, hardware self-testing, and firmware version verification.

[0025] If the hardware self-check and firmware version check pass, the system configures the parameters of the devices under test based on the parameter configuration requirements in the aging control process. After the parameter configuration is completed, according to the aging control process, the upper and lower power controllers in the aging test cabinet control the independent power-on and power-off test of each device under test, and at the same time, the internal temperature of the test cabinet is adjusted to the preset aging temperature threshold through the heating temperature control system, to perform high-temperature aging test.

[0026] During the power-on and power-off test and high-temperature aging test, the running state and test data of each device under test are monitored in real time through the preset aging test tool. If an abnormality is monitored, an artificial troubleshooting instruction is triggered. If there is no abnormality in the test process, the integrated aging test is continuously performed.

[0027] In a preferred embodiment, the electronic device under test is an industrial camera, and the high-temperature aging test includes the following steps: S1, real-time acquisition of current time series data and surface temperature data of the industrial camera, calculation of current fluctuation entropy value and temperature gradient based on current time series data and surface temperature data respectively through a feature extraction module; Wherein, the current time series data is collected in real time by the power supply panel current sensor integrated in the aging cabinet, and the collection frequency can be set by PLC programming (for example, 10 Hz), and each power supply panel corresponds to an independent current collection channel, ensuring the independence of multi-device data collection; the surface temperature data is obtained by deploying a contact temperature sensor or a non-contact infrared temperature measurement module at a preset position of the industrial camera shell, and the signal of the temperature sensor is converted by the signal conditioning module of the heating temperature control system and then transmitted to the aging control computer; the feature extraction module is integrated in the aging tool software, and the current fluctuation entropy value is calculated by a preset algorithm (such as sample entropy algorithm) to represent the current stability, and the temperature gradient is calculated by gradient descent method to reflect the rate of change of camera surface temperature distribution.

[0028] S2, input the current fluctuation entropy value, temperature gradient and device self-check error code into the pre-trained aging failure prediction model, and output the failure probability in the future set time window.

[0029] Wherein, the device self-check error code includes sensor fault code, communication link abnormal code, firmware version mismatch code and the like generated in the hardware self-check process, which is automatically read and summarized by the aging tool software through network connection device; the aging failure prediction model is a neural network model based on deep learning, and its training samples include current fluctuation entropy value, temperature gradient, self-check error code and corresponding actual failure record of historical similar industrial cameras at different aging stages, and the model is calculated by the GPU acceleration module of the aging control computer; the set time window can be pre-configured by the aging tool software (for example, 1 hour, 2 hours), and dynamic adjustment according to the camera model or test requirements is supported.

[0030] S3, during the test process, the aging strategy is dynamically adjusted according to the failure probability. The aging strategy includes: if the failure probability of a certain industrial camera exceeds the preset high-risk threshold, the power supply of the industrial camera is cut off and the location is marked; if the failure probability is in the preset medium-risk interval, the aging time of the industrial camera is extended and the data sampling frequency is increased Wherein, the preset high-risk threshold (such as 80%) and the medium-risk interval (such as 30%-80%) can be customized through the parameter configuration interface of the aging tool software; cutting off the power supply of the industrial camera is realized by sending a power-off instruction from the aging control computer to the corresponding power supply panel, and the power-off state of the power supply panel is fed back to the aging tool software interface in real time; the marked location is the physical partition number in the aging cabinet, which is bound to the device IP of the industrial camera and is highlighted on the software interface; extending the aging time specifically increases 50%-100% (the preset ratio can be preset) based on the original preset aging time, and increasing the data sampling frequency specifically increases the current and temperature collection frequency to 2-3 times of the original frequency, and the adjustment instruction is sent to the corresponding collection module in real time through PLC.

[0031] S4, based on the failure probability, current fluctuation entropy value and temperature gradient data, combined with the device self-check error code, an aging diagnosis report containing the failure probability curve, abnormal feature tracing and maintenance suggestions is generated.

[0032] Wherein, the failure probability curve is automatically drawn by the aging tool software, the horizontal axis is the aging time, the vertical axis is the failure probability, and the risk threshold interval is marked to intuitively show the trend of device state change; the abnormal feature tracing includes the temperature gradient change corresponding to the period when the current fluctuation entropy value exceeds the standard, the network communication log (such as packet loss rate, delay) when the self-check error code appears, and the physical connection link of the abnormal device is located through the port state record of the switch in the aging cabinet; the maintenance suggestions are generated based on the historical fault solving database, for example, for the characteristics of “temperature gradient mutation + high current fluctuation entropy value”, it is suggested to check the camera heat dissipation structure or the stability of the power supply circuit, the report can be exported to PDF format or pushed to the specified terminal in real time through the aging tool software.

[0033] Through the above multi-device integrated aging test method, the automatic and intelligent aging test of multiple electronic devices can be realized, the test efficiency is improved, and the manual intervention is reduced; combined with the specific self-check error code type and the pre-trained model, the failure probability prediction is more in line with the actual aging characteristics of the industrial camera, at the same time, the dynamic adjustment strategy can selectively screen high-risk devices to avoid invalid test or omission; and potential failures can be found in time, and detailed diagnosis reports can be provided to provide strong support for device maintenance and quality control.

[0034] Embodiment two The embodiment of the present application also provides a multi-device integrated aging test system, Figure 3 is a structural diagram of the multi-device integrated aging test system according to the embodiment of the present application, as Figure 3 shown, the system comprises a preprocessing module 30 and a test module 3131. The system is designed to perform integrated aging tests on multiple devices under test, ensuring the stability and reliability of the devices under long-time operation.

[0035] The main function of the preprocessing module 30 is to perform necessary preparations before the aging test starts. When the device under test is placed in the aging cabinet, the system will generate an indication signal, and the preprocessing module 30 will respond to this signal and then detect whether the aging environment is ready. The detection of the aging environment includes the inspection of multiple parameters such as temperature, humidity, power supply, etc., to ensure that the test environment meets the preset standards.

[0036] The preprocessing module 30 reads the device IP of the device under test through the preset aging test tool. This process uses automatic identification technology, and the preset aging test tool will scan all devices in the aging cabinet to obtain their device IP addresses. After obtaining the IP addresses, the preprocessing module 30 establishes multiple connection channels with multiple devices under test based on these device IPs through switches and transmission lines. These connection channels use high-speed data transmission technology to ensure the stability and real-time performance of data transmission during the test process.

[0037] The test module 31 is responsible for performing the actual aging test process. The test module 31 performs integrated aging tests on each device under test based on the aging control process configured in advance based on programming modulation and based on each connection channel. The aging control process includes multiple test scenarios, such as full-load operation test, data transmission test, function switching test, etc., to comprehensively evaluate the performance of the device under various working conditions. During the test process, the system will monitor the running state of each device in real time and record the changes of key parameters.

[0038] After the aging test is completed, the test module 3131 generates an aging diagnosis report. The report details the performance of each device during the test process, abnormal conditions and test conclusions, providing a basis for device quality evaluation.

[0039] Multiple power supply panels are provided inside the aging cabinet, and these power supply panels are connected with the preset aging test tool. The power supply panels adopt modular design, and each panel can be independently controlled to adapt to the power supply needs of different devices. The power supply state of each power supply panel is independently operated and regulated through the aging control computer end. The aging control computer end is equipped with a dedicated power supply management software, and the operator can monitor the working state of each power supply panel in real time through the software interface, including voltage, current, power and other parameters, and can adjust the power supply parameters or switch the power supply state according to the test needs.

[0040] The independent operation and regulation function of the power supply panel enables the system to provide customized power supply solutions for different types of devices, while also facilitating the simulation of power fluctuations, power recovery, and other special test scenarios during testing, to comprehensively evaluate the performance of the device under various power supply conditions.

[0041] In actual application, the operator first places the device to be tested into the aging cabinet, and the system automatically starts the pre-processing module 30 after detecting the placement of the device. After the pre-processing module 30 completes the environmental detection and connection establishment, the test module starts to execute the preset aging test process. During the test process, the operator can monitor the test progress and device status in real time through the aging control computer terminal, and adjust the power supply parameters if necessary. After the test is completed, the system automatically generates an aging diagnosis report, providing a basis for device quality evaluation and subsequent improvement.

[0042] Example Three This embodiment provides a multi-device integrated aging test cabinet for performing the aging test method described in Example One, for aging test of electronic devices.

[0043] The multi-device integrated aging test cabinet is designed to be mobile, facilitating flexible deployment in different test scenarios. The overall structure of the test cabinet includes the cabinet body, internal power supply system, temperature control system, network communication system, and control system, among other main parts.

[0044] The cabinet body is made of metal material, with good heat dissipation performance and robustness. It is internally provided with multiple adjustable device placement shelves for placing the electronic devices to be tested. Each shelf is equipped with a positioning device to ensure that the device to be tested can be accurately placed at the designated position.

[0045] The internal power supply system includes multiple independent power supply panels, each of which can be controlled independently to achieve independent power supply management for different devices to be tested. The power supply panel has voltage and current adjustment functions, and can provide suitable power supply parameters according to the needs of different devices to be tested. The power supply panel is connected to the aging test tool and can be independently operated and regulated through the aging control computer terminal.

[0046] The temperature control system includes a heating device and a temperature sensor, which can regulate the internal temperature of the test cabinet to the preset aging temperature threshold, achieving a high-temperature aging test environment. The temperature control system adopts a closed-loop control method to ensure stable and reliable test environment temperature.

[0047] The network communication system includes a built-in switch and multiple network interfaces, which are used to establish communication connection between the aging control computer and the devices to be tested. The switch supports simultaneous connection of multiple devices, enabling parallel test control of multiple devices to be tested. The test cabinet is equipped with a special custom network cable for connecting the devices to be tested to the built-in switch.

[0048] The control system is the core of the entire aging test cabinet, including the power-on / off controller and the aging control computer. The power-on / off controller is responsible for independent power-on / off testing of each device under test, simulating power fluctuations in the actual use environment. The aging control computer runs the preset aging test tool and executes the aging control process pre-configured based on the programmed modulation method, realizing the automatic management of the entire test process.

[0049] During use, first place the device under test in the designated position inside the test cabinet, and connect the custom network cable and power cable. After the system detects that the device under test has been placed and confirms that the aging environment is ready, it reads the device IP of the device under test through the preset aging test tool, and establishes a connection channel with each device under test through the switch and transmission line based on the device IP.

[0050] Next, the system executes the automatic configuration process for the device under test according to the aging test method described in Example One, including automatic allocation of device IP, control of device under test restart, hardware self-test, and firmware version verification, etc. After the parameter configuration is completed, the control system controls the power-on / off controller to perform independent power-on / off testing of each device under test according to the aging control process, and simultaneously controls the temperature inside the test cabinet through the heating temperature control system to perform high-temperature aging testing.

[0051] When the device under test is an industrial camera, the test cabinet is equipped with a dedicated data acquisition module for real-time acquisition of current time series data and surface temperature data of the industrial camera. The acquired data is processed by the feature extraction module to calculate the current fluctuation entropy value and temperature gradient, and input these data into the pre-trained aging failure prediction model to output the failure probability.

[0052] The control system of the test cabinet can dynamically adjust the aging strategy according to the failure probability, including cutting off the power supply of a specific device under high-risk conditions and marking the location, or extending the device aging time and increasing the data sampling frequency under medium-risk conditions. Finally, the system generates an aging diagnosis report containing the failure probability curve, abnormal feature tracing, and maintenance recommendations based on the test data.

[0053] The multi-device integrated aging test cabinet realizes the automation, intelligence and efficiency of electronic device aging testing through the close combination of hardware facilities and software systems, greatly improves the test efficiency, reduces the need for manual intervention, and provides reliable protection for the quality control of electronic devices.

[0054] The above-described embodiments are merely illustrative of several embodiments of the present application, which are described in more detail and in a specific manner, but should not be construed as limiting the scope of the patent. It should be noted that for those skilled in the art, several modifications and improvements can be made without departing from the concept of the present application, and these all belong to the protection scope of the present application. Therefore, the protection scope of the patent of the present application should be subject to the appended claims.

Claims

1. A multi-device integrated aging test method, characterized in that, The method for aging tests of electronic devices using a portable aging chamber includes: In response to the indication signal that the device under test has been placed in the aging chamber, check whether the aging environment is ready; If so, by using a preset aging test tool, the device IP of the device under test is read, and based on the device IP, multiple connection channels are established with multiple devices under test through switches and transmission lines respectively; An aging control process, pre-configured based on programming modulation, is used to perform integrated aging tests on each device under test based on each connection channel. After the aging test is completed, an aging diagnostic report is generated.

2. The method according to claim 1, characterized in that, Based on each connection channel, integrated aging tests are performed on each device under test, including: Using the preset aging test tool, an automatic configuration process is executed on each device under test based on the connection channel. The automatic configuration process includes: automatically assigning device IP, controlling the restart of the device under test, hardware self-test, and firmware version verification. If both the hardware self-test and the firmware version verification pass, the parameters of the device under test are configured based on the parameter configuration requirements in the aging control process. After the parameters are configured, the power-on and power-off controllers in the aging test cabinet are controlled to perform independent power-on and power-off tests on each device under test according to the aging control process. At the same time, the internal temperature of the test cabinet is adjusted to the preset aging temperature threshold through the heating temperature control system to carry out high-temperature aging tests.

3. The method according to claim 2, characterized in that, During the power-on / off test and high-temperature aging test, the operating status and test data of each device under test are monitored in real time by the preset aging test tool. If an abnormality is detected, a manual troubleshooting instruction is triggered. If there is no abnormality in the test process, the integrated aging test continues.

4. The method according to claim 2, characterized in that, The electronic device under test is an industrial camera, and the high-temperature aging test includes: The current time-series data and surface temperature data of the industrial camera are collected in real time. Based on the current time-series data and the surface temperature data, the current fluctuation entropy value and temperature gradient are calculated by the feature extraction module. The current fluctuation entropy value, the temperature gradient, and the device self-test error code are input into the pre-trained aging fault prediction model, and the fault probability within a future set time window is output. During the testing process, the aging strategy is dynamically adjusted based on the failure probability. The aging strategy includes: if the failure probability of a certain industrial camera exceeds a preset high-risk threshold, the power supply to the industrial camera is cut off and the location is marked; if the failure probability is in a preset medium-risk range, the aging time of the industrial camera is extended and the data sampling frequency is increased. Based on the aforementioned fault probability, current fluctuation entropy value, and temperature gradient data, an aging diagnostic report is generated by combining the equipment self-test error codes. The report includes fault probability curves, abnormal feature tracing, and maintenance suggestions.

5. The method according to claim 1, characterized in that, The aging cabinet is equipped with multiple power supply panels, which are connected to the preset aging test tool. The power supply status of each power supply panel can be independently operated and controlled through the aging control computer.

6. The method according to claim 5, characterized in that, The power supply panel and the internal temperature and control time of the aging test cabinet are controlled in a process-oriented manner through pre-programming and debugging. During the aging test, the control items of the power supply panel include power supply on / off, voltage and current adjustment, etc.

7. The method according to claim 6, characterized in that, Checking whether the test environment is ready includes: Determine whether the electronic device under test has been correctly placed in the designated position inside the aging chamber. If so, Determine whether the custom network cable between the electronic device under test and the aging cabinet is connected. If so, Determine whether the power supply of the electronic device under test is connected to the aging cabinet, whether the connection line is unobstructed, and whether the power interface is normal. If so, Determine whether the built-in switch of the aging cabinet is in normal working condition. If so, determine whether the communication link between the aging control computer and the aging cabinet is unobstructed. If so, output the indication signal that the test environment is ready to be completed.

8. A multi-device integrated aging test system, characterized in that, The system includes: a preprocessing module and a testing module, wherein: The preprocessing module is used to respond to the indication signal that the device under test has been placed in the aging cabinet and detect whether the aging environment is ready; if so, it reads the device IP of the device under test through a preset aging test tool, and establishes multiple connection channels with multiple devices under test through a switch and transmission line based on the device IP. The test module is used to perform integrated aging tests on each device under test based on each connection channel through an aging control process pre-configured by a programming modulation method, and to generate an aging diagnostic report after the aging test is completed.

9. The system according to claim 8, characterized in that, The aging cabinet is equipped with multiple power supply panels, which are connected to the preset aging test tool. The power supply status of each power supply panel can be independently operated and controlled through the aging control computer.

10. A multi-device integrated aging test cabinet, characterized in that, The aging test cabinet is used to perform aging tests on electronic devices according to the aging test methods provided in claims 1-7.

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