Case test method and system

Abstract

The invention provides a chassis testing method, which is suitable for a chassis and comprises the following steps of: arranging a noise simulation generator in the chassis, outputting a first testing signal by the noise simulation generator when the chassis is in an uncovered state, measuring a first decibel value corresponding to the first testing signal at a position which is separated from the chassis by a first distance, the noise simulation generator outputs a second test signal when the case is in the cover closing state, the second test signal and the first test signal have the same frequency, a second decibel value corresponding to the second test signal is measured at the position away from the case by a first distance, and a second decibel value corresponding to the second decibel value is measured; and when the difference value between the first decibel value and the second decibel value is not greater than the default value, performing a test at a second distance from the chassis, the second distance being smaller than the first distance. According to the case testing method provided by the invention, a mechanical engineer can perform pre-measurement and efficiency evaluation operation on the electromagnetic interference prevention and treatment efficiency of the case in design according to customer requirements.

Description

TECHNICAL FIELD

[0001] The present invention relates to a chassis testing method and system. BACKGROUND

[0002] Before a server chassis is shipped, engineers often need to verify the chassis' electromagnetic interference (EMI) prevention performance. However, these verifications can only be arranged after the system is ready for operation, so the scheduled verification time is almost in the late stage of the project development schedule.

[0003] However, when the chassis has relevant EMI problems, mechanical engineers often do not have enough time to seek solutions. In addition, as the project progresses, mechanical design engineers may encounter customer demands for modular design of the mechanical design module, which causes difficulties in chassis verification. SUMMARY

[0004] In view of the above, the present invention provides a chassis testing method and system to solve the above problems.

[0005] The chassis testing method according to an embodiment of the present invention is suitable for a chassis, and the method includes: setting a noise simulation generator in the chassis; outputting a first test signal by the noise simulation generator when the chassis is in an open cover state; measuring a first decibel value corresponding to the first test signal at a first distance from the chassis; outputting a second test signal by the noise simulation generator when the chassis is in a closed cover state, wherein the second test signal has the same frequency as the first test signal; measuring a second decibel value corresponding to the second test signal at the first distance from the chassis; and when the difference between the first decibel value and the second decibel value is not greater than a default value, performing a test at a second distance from the chassis, wherein the second distance is less than the first distance.

[0006] The chassis testing system according to an embodiment of the present invention includes a noise simulation generator, a processing device, and a measuring device. The noise simulation generator is set in the chassis. The noise simulation generator is used to output a first test signal when the chassis is in an open cover state, and output a second test signal when the chassis is in a closed cover state, wherein the second test signal has the same frequency as the first test signal. The measuring device is used to measure a first decibel value corresponding to the first test signal at a first distance from the chassis, and measure a second decibel value corresponding to the second test signal at the first distance from the chassis. The processing device is connected to the measuring device, and the processing device is used to output a test instruction when the difference between the first decibel value and the second decibel value is not greater than a default value, wherein the test instruction indicates to perform a test at a second distance from the chassis, wherein the second distance is less than the first distance.

[0007] In summary, according to the chassis testing method and system of one or more embodiments of the present application, mechanical engineers can perform pre-measurement and performance evaluation of the EMI prevention performance of the chassis in the design according to customer requirements, instead of relying on the past experience of engineers to make judgments, and can perform corresponding treatment in advance to reduce the risk of significant problems caused by EMI in the later stage.

[0008] The above description of the present application and the following description of the embodiments are used to demonstrate and explain the spirit and principles of the present application, and provide further explanation of the scope of the patent application of the present application. BRIEF DESCRIPTION OF DRAWINGS

[0009] Figure 1 A block diagram of a chassis testing system according to an embodiment of the present application is shown.

[0010] Figure 2 A schematic diagram of a chassis according to an embodiment of the present application is shown.

[0011] Figure 3 An installation schematic diagram of a chassis and a measurement device according to an embodiment of the present application is shown.

[0012] Figure 4 A flowchart of a chassis testing method according to an embodiment of the present application is shown.

[0013] Figure 5 A block diagram of a chassis testing system according to another embodiment of the present application is shown.

[0014] Figure 6 A flowchart of a chassis testing method according to another embodiment of the present application is shown.

[0015] ELEMENT NUMBER EXPLANATION

[0016] 1, 2 chassis testing system

[0017] 11, 21 noise simulation generator

[0018] 12, 22 measurement device

[0019] 13, 24 processing device

[0020] 23 test probe

[0021] A1 chassis

[0022] A10 cover

[0023] A11, A12 hole

[0024] D1, D2 direction

[0025] S101, S103, S105, S107, S109, S111, step

[0026] S201, S203, S205, S207, S209 DETAILED DESCRIPTION

[0027] The detailed features and advantages of the present application are described in detail in the embodiments below, which are sufficient to enable any person skilled in the relevant art to understand the technical content of the present application and to implement it, and according to the content disclosed in the specification, the scope of the application and the drawings, any person skilled in the relevant art can easily understand the related purposes and advantages of the present application. The following examples are used to further illustrate the concept of the present application, but do not limit the scope of the present application in any way.

[0028] Reference should also be made to Figure 1 , Figure 2 and Figure 3 , wherein Figure 1 shows a block diagram of a case test system according to an embodiment of the present application, Figure 2 shows a schematic diagram of a case according to an embodiment of the present application, Figure 3 shows a schematic diagram of the installation of a case and a measuring device according to an embodiment of the present application. As Figure 1 shown, the case test system 1 includes a noise simulation generator 11, a measuring device 12 and a processing device 13. The case test system 1 is used to test the ability of the case A1 to resist electromagnetic interference (EMI).

[0029] The case A1 can be the case of a server. The case A1 includes a movable cover A10, so that the case A1 can be in an open cover state and a closed cover state. The open cover state means that the cover A10 of the case A1 is opened, so that the noise simulation generator 11 arranged therein is exposed to the outside; the closed cover state means that the cover A10 of the case A1 is closed, so that the noise simulation generator 11 arranged therein is not exposed to the outside, wherein Figure 2 shown, the case A1 is in the closed cover state. Only the noise simulation generator 11 is arranged in the case A1, and no other components are arranged therein. The case A1 can also include a plurality of recesses or holes A11 and A12. Figure 2 The shape of the case A1, the arrangement position of the noise simulation generator 11 and the number of recesses or holes on the case A1 are only examples. The noise simulation generator 11 can include a transmitting antenna for generating a simulated electromagnetic interference signal to simulate the condition that a working printed circuit board assembly (PCA) such as a mainboard is arranged in the case A1.

[0030] The measurement device 12 is used to measure electromagnetic waves to output a decibel value corresponding to the electromagnetic waves, particularly to measure toward the cabinet A1. As shown in Figure 3 The cabinet A1 can be placed on a table, and the measurement device 12 can be fixed by a clamp at a height suitable for measurement, such as the same height as the cabinet A1 or the table. The measurement device 12 can include measurement equipment for measuring electromagnetic interference signals, such as a spectrum analyzer, a radio frequency scanner, a horn antenna, and the like. Figure 3 The measurement device 12 is shown as a horn antenna, but the present application is not limited thereto.

[0031] The processing device 13 can be electrically connected to the measurement device 12. The processing device 13 can include one or more processors, such as a central processing unit, a graphics processing unit, a microcontroller, a programmable logic controller, or other processors with signal processing functions. Figure 1 The processing device 13 is shown as being electrically connected to the noise simulation generator 11, but the processing device 13 can also be not connected to the noise simulation generator 11. When the processing device 13 is electrically connected to the noise simulation generator 11, the processing device 13 is used to control the noise simulation generator 11 to output a simulated test signal; when the processing device 13 is not connected to the noise simulation generator 11, the noise simulation generator 11 can be controlled by a user to output a simulated test signal. Then, the processing device 13 obtains a decibel value corresponding to the test signal from the measurement device 12 to determine whether to output a test instruction to a control unit of a test probe described below, or to a display, a user device (such as a computer, a smart phone), or the like according to the decibel value. The test instruction is used to instruct to perform further tests on the cabinet A1. Moreover, the noise simulation generator 11, the measurement device 12, and the cabinet A1 can be collectively arranged in an anechoic chamber.

[0032] Please refer to Figures 1 to 4 , wherein Figure 4 is shown as a flowchart of a cabinet testing method according to an embodiment of the present application. As shown in Figure 4 , the cabinet testing method includes: step S101: arranging a noise simulation generator in a cabinet; step S103: outputting a first test signal by the noise simulation generator when the cabinet is in an open cover state; step S105: measuring a first decibel value corresponding to the first test signal at a first distance from the cabinet; step S107: outputting a second test signal by the noise simulation generator when the cabinet is in a closed cover state; step S109: measuring a second decibel value corresponding to the second test signal at the first distance from the cabinet; and step S111: when a difference between the first decibel value and the second decibel value is not greater than a default value, performing a test at a second distance from the cabinet.

[0033] At step S101, when the server is actually in operation, electromagnetic waves will generate noise on the chips on the mainboard or the signal transmission channel of the server when the server is subjected to electromagnetic interference from the outside. Therefore, the noise simulation generator 11 is arranged in the case Al, wherein the noise simulation generator 11 can be arranged in the position reserved for the printed circuit board assembly in the case Al.

[0034] At step S103, the case Al is in an open state (e.g. opened by the user), and the noise simulation generator 11 is controlled to output a first test signal. The first test signal is a simulated electromagnetic interference signal, and the first test signal can have a target test frequency. The noise simulation generator 11 can be controlled by the processing device 13 to output the first test signal, or can be controlled by the user to output the first test signal.

[0035] At step S105, the measuring device 12 measures the electromagnetic waves generated from the first test signal generated by the noise simulation generator 11 at a first distance from the case Al to obtain a first decibel value corresponding to the first test signal. In other words, the measuring device 12 is spaced apart from the case Al by a first distance. Further, step S105 can be performed simultaneously with step S103, so that the measuring device 12 measures the corresponding first decibel value at the same time as the noise simulation generator 11 outputs the first test signal. The processing device 13 can control the measuring device 12 to perform the measurement, or the user can operate the measuring device 12 to perform the measurement.

[0036] At step S107, the case Al is in a closed state (e.g. closed by the user), and the noise simulation generator 11 is controlled to output a second test signal. The second test signal is a simulated electromagnetic interference signal, and the second test signal has the same frequency as the first test signal. Furthermore, the second test signal can also have the same signal strength as the first test signal. In other words, the second test signal can be exactly the same signal as the first test signal, except that the output time of the second test signal is later than the output time of the first test signal. The noise simulation generator 11 can be controlled by the processing device 13 to output the second test signal, or can be controlled by the user to output the second test signal.

[0037] At step S109, the measuring device 12 measures the electromagnetic waves generated from the second test signal generated by the noise simulation generator 11 at a first distance from the case Al to obtain a second decibel value corresponding to the second test signal. In other words, the measuring device 12 is spaced apart from the case Al by a first distance. Further, step S107 can be performed simultaneously with step S109, so that the measuring device 12 measures the corresponding second decibel value at the same time as the noise simulation generator 11 outputs the second test signal. The position of measuring the first decibel value in step S105 and the position of measuring the second decibel value in step S109 can be the same as each other.

[0038] At step Slll, the processing device 13 determines whether the difference between the first and second decibel values is not greater than a default value, and outputs a test instruction when the difference between the first and second decibel values is not greater than the default value, wherein the test instruction instructs a test to be performed at a second distance from the chassis Al. The second distance is less than the first distance. Further, at step Slll, the processing device 13 can determine whether the difference between the first decibel value and the second decibel value is not greater than a default value, and output a test instruction when the difference between the first decibel value and the second decibel value is not greater than the default value, to thereby inform a user to perform a test using the measurement device 12 or a test probe described below at a second distance from the chassis Al. In other words, the measurement device 12 or the test probe is spaced apart from the chassis Al by the second distance. When the difference between the first and second decibel values is greater than the default value, the test can be ended. Further, when the difference between the first decibel value and the second decibel value is greater than the default value, the test can be ended.

[0039] Steps S103, S105, S107, and S109 can be regarded as far-field tests of the ability of the chassis Al to resist electromagnetic interference, and step Slll can be regarded as a near-field test of the ability of the chassis Al to resist electromagnetic interference.

[0040] Accordingly, a mechanical engineer can perform a pre-measurement and performance evaluation of the ability of a chassis under design to resist electromagnetic interference according to a customer's requirements, rather than relying only on the engineer's past experience to make a judgment, and can perform a corresponding treatment in advance to reduce the risk of a significant problem caused by electromagnetic interference later.

[0041] Figure 4 An embodiment of step S103 of the method can include controlling the noise simulation generator 11 to output the first test signal in at least one designated direction of a direction Dl parallel to the bottom plate of the chassis Al and a direction D2 perpendicular to the bottom plate of the chassis Al. Specifically, the noise simulation generator 11 can be vertically disposed on the bottom plate of the chassis Al to output the first test signal in the direction Dl, and / or the noise simulation generator 11 can be laid flat on the bottom plate of the chassis Al to output the first test signal in the direction D2.

[0042] Figure 4 An embodiment of step S107 of the method can include controlling the noise simulation generator 11 to output the second test signal in the at least one designated direction. Specifically, the noise simulation generator 11 can be vertically disposed on the bottom plate of the chassis Al by a user to output the first test signal in the direction Dl, or laid flat on the bottom plate of the chassis Al to output the second test signal in the direction D2.

[0043] By outputting the test signal in the designated direction, the decibel values of the polarization phenomenon in different directions can be obtained even if the direction of the polarization phenomenon cannot be anticipated.

[0044] Please refer to this as well. Figure 2 and Figure 5 ,in Figure 5 The diagram shown is a block diagram of a chassis testing system according to another embodiment of the present invention. Figure 5 As shown, the chassis test system 2 includes a noise simulator 21, a measurement device 22, a test probe 23, and a processing device 24. The chassis test system 2 is used to test the electromagnetic interference immunity of chassis A1. The implementation and configuration of the noise simulator 21, the measurement device 22, and the processing device 24 can be respectively compared with... Figures 1 to 3 The noise simulation generator 11, measurement device 12 and processing device 13 shown are the same, so they will not be described again here.

[0045] Test probe 23 is electrically connected to processing device 24. When the noise simulator 21 outputs a test signal, test probe 23 can be used to measure the electromagnetic wave signal of chassis A1. Processing device 24 can control test probe 23 to perform measurements, or the user can operate test probe 23 to perform measurements.

[0046] Please refer to this as well. Figure 2 , Figure 5 and Figure 6 ,in Figure 6 The diagram shown is a flowchart illustrating a chassis testing method according to another embodiment of the present invention. Figure 6 Can be regarded as Figure 4 A detailed flowchart of one embodiment of step S111. Figure 6 As shown, the test performed at a second distance from the chassis includes: Step S201: At a second distance from the chassis, receiving an electromagnetic wave signal in response to a second or third test signal using a test probe; Step S203: Upon receiving a processing completion signal corresponding to the electromagnetic wave signal, outputting a fourth test signal using a noise simulator when the chassis is in an open state; Step S205: Measuring a third decibel value corresponding to the fourth test signal at a first distance from the chassis; Step S207: Outputting a fifth test signal using a noise simulator when the chassis is in a closed state; and Step S209: Measuring a fourth decibel value corresponding to the fifth test signal at a first distance from the chassis.

[0047] In an embodiment of step S201, the test probe 23 can be placed at the second distance from the cabinet Al to receive the electromagnetic wave signal from the cabinet Al while the noise simulation generator 21 outputs the second test signal. In another embodiment of step S201, the noise simulation generator 21 suspends outputting the second test signal and outputs a third test signal, where the second test signal and the third test signal can have the same or different frequencies. Specifically, the test probe 23 can be used to measure the electromagnetic wave signal of a local region on the cabinet Al, and the end point of the test probe 23 is spaced apart from the local region by the second distance, where the local region can include one or more holes Al 1 and Al 2 or grooves on the cabinet Al, but the present application is not limited thereto. Then, after the electromagnetic wave signal is obtained, the user can determine the performance of the local region on the electromagnetic interference based on the electromagnetic wave signal and perform corresponding treatment.

[0048] At step S203, based on the treatment completion signal, the noise simulation generator 21 is controlled to output a fourth test signal when the cabinet Al is in the open cover state. The treatment completion signal can be generated and output to the processing device 24 by the user clicking the button on the screen for starting the far-field test, and then the processing device 24 controls the noise simulation generator 21 to output the fourth test signal; or the processing device 24 outputs a notification corresponding to the treatment completion signal to the display or the user device to notify the user to control the noise simulation generator 21 to output the fourth test signal. The treatment completion signal is used to indicate that the aforementioned treatment has been completed, and the cabinet Al after treatment can be tested again for far-field test. In addition, the user can also not click the button on the screen for starting the far-field test, but directly control the noise simulation generator 21 to output the fourth test signal after determining that the treatment is completed.

[0049] The implementation of step S203 that the noise simulation generator 21 outputs the fourth test signal when the cabinet Al is in the open cover state, step S205, step S207 and step S209 can be the same as steps S103, S105, S107 and S109 of Figure 4 , and will not be described here. It should be particularly pointed out that the fourth test signal of step S203 and the fifth test signal of step S207 have the same frequency, and the frequency of the fourth test signal can be the same as or different from the frequency of the first test signal of step S103.

[0050] Through the step S205 and the step S209, the processing device 24 can determine whether to output again the test notification for testing at the second distance from the cabinet A1 according to the comparison result of the decibel difference value between the third decibel value and the fourth decibel value and the default value. In other words, when the decibel difference value between the third decibel value and the fourth decibel value is not greater than the default value, the step S201 can be executed again. Further, when the decibel difference value obtained by subtracting the fourth decibel value from the third decibel value is not greater than the default value, the step S201 can be executed again. When the difference value between the third decibel value and the fourth decibel value is greater than the default value, the test can be ended. Further, when the difference value obtained by subtracting the fourth decibel value from the third decibel value is greater than the default value, the test can be ended.

[0051] In addition, in one or more of the embodiments described above, the plurality of candidate test frequencies can be used as the target test frequency of the first test signal in turn. Further, the processing device can use the candidate test frequencies as the target test frequency of the first test signal in turn and control the noise simulation generator to output the first test signal with the target test frequency; or the user can control the noise simulation generator to output the first test signal with the target test frequency. The following is described by taking the processing device as an example. 18 gigahertz (GHz) can be the maximum value of the candidate test frequencies, 1 GHz can be the minimum value of the candidate test frequencies, and the frequency hopping step size can be 1 GHz. The processing device can use the candidate test frequency of 1 GHz as the target test frequency of the first test signal to execute the steps S103 and S107 as shown in Figure 4 ; then the processing device can use the candidate test frequency of 2 GHz as the target test frequency of the first test signal to execute the steps S103 and S107 as shown in Figure 4 ; and so on, until the candidate test frequency of 18 GHz is used as the target test frequency of the first test signal to execute the steps S103 and S107 as shown in Figure 4 . The candidate test frequencies can also be used as the target test frequency of the fourth test signal in turn. The values of the maximum value, the minimum value, and the frequency hopping step size of the candidate test frequencies described above are only examples, and the present application is not limited thereto.

[0052] Therefore, in the embodiment in which the plurality of candidate test frequencies are used as the target test frequency of the first test signal in turn, by selecting the candidate test frequency that does not meet the shielding effectiveness requirement and cooperating with the near-field test, the problem point of the cabinet in the relatively weak radiation frequency of the electromagnetic interference prevention and control effectiveness can be known.

[0053] In the present embodiment, the server of the present application can be used for artificial intelligence (AI) operation, edge computing, and can also be used as a 5G server, a cloud server, or a vehicle networking server.

[0054] In summary, according to the chassis test method and system of one or more embodiments of the present application, mechanical engineers can perform pre-measurement and performance evaluation of the electromagnetic interference prevention and treatment efficiency of the chassis in the design according to customer requirements, not just relying on the past experience of engineers to make judgments, and can perform corresponding treatment in advance to reduce the risk of significant problems caused by electromagnetic interference in the later stage. Moreover, by selecting a candidate test frequency that does not meet the shielding efficiency requirement and cooperating with near-field testing, the problem point of the chassis in the relatively weak radiation frequency of the electromagnetic interference prevention and treatment efficiency can be known.

[0055] Although the present application is disclosed with the above-mentioned embodiments, it is not intended to limit the present application. Any changes and modifications made without departing from the spirit and scope of the present application shall fall within the scope of the patent protection of the present application. For the scope of protection of the present application, please refer to the attached patent claim.

Claims

1. A chassis testing method, characterized in that, Applicable to a chassis, the chassis testing method includes: A noise simulation generator is installed in the chassis; The noise simulation generator outputs a first test signal when the chassis is in an open state; At a first distance from the chassis, a first decibel value corresponding to the first test signal is measured; The noise simulation generator outputs a second test signal when the chassis is in a closed state, wherein the second test signal has the same frequency as the first test signal; At a distance from the chassis, a second decibel value corresponding to the second test signal is measured; as well as When the difference between the first decibel value and the second decibel value is not greater than a default value, the test is performed at a second distance from the chassis, wherein the second distance is less than the first distance.

2. The chassis testing method according to claim 1, characterized in that: The output of the first test signal by the noise simulator when the chassis is in the open state includes: controlling the noise simulator to output the first test signal in at least one specified direction, either parallel to the chassis floor or perpendicular to the chassis floor. The output of the second test signal by the noise simulator when the chassis is in the closed state includes: controlling the noise simulator to output the second test signal in the at least one specified direction.

3. The chassis testing method according to claim 1, characterized in that, The test performed at the second distance from the chassis includes: At a distance from the chassis, a test probe receives an electromagnetic wave signal in response to the second test signal or a third test signal; Upon receiving a processing completion signal corresponding to the electromagnetic wave signal, the noise simulation generator outputs a fourth test signal when the chassis is in the open state. At a distance from the chassis, a third decibel value corresponding to the fourth test signal is measured; The noise simulator outputs a fifth test signal when the chassis is in the closed state, wherein the fourth test signal and the fifth test signal have the same frequency; and At a distance from the chassis, a fourth decibel value corresponding to the fifth test signal is measured. Based on the comparison between the decibel difference between the third and fourth decibel values ​​and the default value, it is determined whether to perform the test again at a distance from the chassis.

4. The chassis testing method according to claim 1, characterized in that, The test at the second distance from the chassis includes: the test at the second distance from the openings in the chassis.

5. The chassis testing method according to claim 1, characterized in that, Also includes: Multiple candidate test frequencies are used in turn as a target test frequency for the first test signal.

6. A chassis testing system, characterized in that, Include: A noise simulation generator is installed inside a chassis. The noise simulation generator outputs a first test signal when the chassis is in an open state and outputs a second test signal when the chassis is in a closed state, wherein the second test signal has the same frequency as the first test signal; and A measuring device is used to measure a first decibel value corresponding to a first test signal at a first distance from the chassis, and to measure a second decibel value corresponding to a second test signal at the first distance from the chassis. A processing device is connected to the measuring device. The processing device is used to output a test command when the difference between the first decibel value and the second decibel value is not greater than a default value. The test command instructs to perform a test at a second distance from the chassis, wherein the second distance is less than the first distance.

7. The chassis testing system according to claim 6, characterized in that, The noise simulator outputs the first test signal in at least one designated direction, either parallel to the bottom plate of the chassis or perpendicular to the bottom plate of the chassis, and the noise simulator outputs the second test signal in the at least one designated direction.

8. The chassis testing system according to claim 6, characterized in that, Also includes: A test probe, connected to the processing device, is used to receive an electromagnetic wave signal in response to a second test signal or a third test signal at a second distance from the chassis. The noise simulation generator is also used to output a fourth test signal when the chassis is in the open state, and When the chassis is in the closed state, a fifth test signal is output, wherein the fourth test signal and the fifth test signal have the same frequency. The measuring device is further configured to measure a third decibel value corresponding to the fourth test signal at a first distance from the chassis, and to measure a fourth decibel value corresponding to the fifth test signal at a first distance from the chassis. The processing device is used to determine whether to output the test command again based on the comparison result between the decibel difference between the third decibel value and the fourth decibel value and the default value.

9. The chassis testing system according to claim 6, characterized in that, The processing device is tested at a second distance from the opening in the chassis.

10. The chassis testing system according to claim 6, characterized in that, The processing device is further configured to take turns using multiple candidate test frequencies as a target test frequency for the first test signal and the second test signal.

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