Method and system for automatically detecting floating crystal and computer readable storage medium
By acquiring sample grain images at the die-bonding end and performing grayscale processing, setting a floating crystal control threshold, and automatically detecting floating crystals, the problem of untimely identification of floating crystals during the sorting process is solved, improving product yield and reducing customer complaints.
Patent Information
- Application Number
- CN202511266379.5
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-09-05
- Publication Date
- 2025-12-16
AI Technical Summary
During LED production, the failure of sorting machines to promptly identify floating crystals due to wear and tear of consumables or jamming of mechanisms affects product yield and increases the frequency of customer complaints.
By acquiring sample grain images at the die-bonding end, performing image teaching and grayscale processing, setting a floating crystal control threshold, and comparing the grayscale values of a specific area of the current grain to determine the floating crystal, automatic detection is achieved.
This improved product yield, reduced customer complaints, enabled timely detection and handling of floating crystal abnormalities, and enhanced the controllability of the production process.
Smart Images
Figure CN121149030A_ABST
Abstract
Description
Technical Field
[0001] This invention relates to the field of semiconductor chip technology, and in particular to a method, system, and computer-readable storage medium for automatically detecting floating crystals. Background Technology
[0002] As the application scope of LEDs continues to expand, users are placing increasingly higher demands on the quality of LED products, especially high-end products, which require a high degree of consistency in LED brightness and wavelength. Therefore, LED testing and sorting are essential processes in LED production.
[0003] Currently, in the LED testing and sorting process, due to the wear of consumables or the jamming of the mechanism, the sorting machine produces floating crystals during the arrangement process. This means that the crystals are not completely bonded to the bottom blue film, and the crystals float up because there are foreign objects such as blue film debris at the bottom of the crystals.
[0004] Because it takes time for the floating crystal to float, the sorting machine cannot identify the floating crystal abnormality in a timely and effective manner when it identifies the currently solid crystal. This inability to identify the abnormality in a timely and effective manner will result in the production of a batch of abnormal floating crystal wafers. Due to the influence of the product manufacturing process, there are no effective error prevention measures to control the production of floating crystal wafers, which can easily lead to customer complaints. Summary of the Invention
[0005] Therefore, the purpose of this invention is to provide a method, system, and computer-readable storage medium for automatically detecting floating crystals, in order to overcome the shortcomings of the prior art.
[0006] To achieve the above objectives, the present invention provides a method for automatically detecting floating crystals, the method comprising:
[0007] A sample die is acquired at the die bonding end for image teaching. The image of the current die is compared with the image of the sample die, and the current die bonding success is determined based on the comparison result.
[0008] When the current grain is successfully solidified, grayscale processing is performed on the current grain to obtain the grayscale value to be measured in a specific region of the current grain. Based on the grayscale value of the specific region of the sample grain, a corresponding floating crystal control threshold is set. The grayscale value to be measured is compared with the floating crystal control threshold, and the presence of floating crystal in the current grain is determined based on the comparison result.
[0009] The beneficial effects of this invention are as follows: by obtaining a sample grain at the die-bonding end for image teaching, the image of the current grain is compared with the image of the sample grain, and the comparison result is used to determine whether the current grain has been successfully bonded. When the current grain has been successfully bonded, grayscale processing is performed on the current grain to obtain the grayscale value to be measured in a specific area of the current grain. The grayscale value to be measured in the specific area of the current grain is compared with the floating crystal control threshold, and the comparison result is used to determine whether the current grain has floating crystal. This invention differs from the prior art and solves the problem that floating crystal cannot be detected in time during the sorting process, which is conducive to improving product yield and reducing the frequency of customer complaints.
[0010] Furthermore, the specific region includes a grain electrode region and a grain light-emitting region, the floating crystal control threshold includes a first floating crystal control interval and a second floating crystal control interval, and the step of comparing the grayscale value to be measured with the floating crystal control threshold includes:
[0011] The gray value to be measured in the grain electrode region of the current grain is compared with the first floating crystal control range;
[0012] The gray value to be measured in the light-emitting region of the current crystal is compared with the second floating crystal control range;
[0013] The functional expression for the first floating crystal control interval or the second floating crystal control interval is as follows:
[0014] X = (0.7δ, 1.3δ)
[0015] Wherein, X represents the first floating crystal control interval or the second floating crystal control interval, and δ represents the grayscale value of the grain electrode region or the grain light emission region of the sample grain.
[0016] Furthermore, the step of determining whether the current die bonding is floating based on the comparison result includes:
[0017] When the grayscale value to be measured is within the range of the floating crystal control threshold, it is determined that there is no floating crystal in the current grain;
[0018] When the grayscale value to be measured is not within the range of the floating crystal control threshold, it is determined that the current grain has floating crystals.
[0019] Furthermore, after determining whether the current grain contains floating crystals based on the comparison results, the method further includes:
[0020] When floating crystals are present in the current crystal grain, floating crystal control alarm and machine clearing processes are performed sequentially.
[0021] When there is no floating crystal in the current grain, readjust the floating crystal control threshold.
[0022] Furthermore, before obtaining the grayscale value to be measured for a specific region of the current grain, the method further includes:
[0023] Check if the current grain row position is correct.
[0024] Furthermore, the method also includes:
[0025] When there are floating crystals in the current grain, the number of floating crystal control attempts is accumulated, and the number of floating crystal control attempts is compared with a preset cumulative control threshold. Based on the comparison result, it is determined whether to issue an alarm prompt for exceeding the floating crystal control attempt limit.
[0026] To achieve the above objectives, the present invention also provides a system for automatically detecting floating crystals, used to implement the method for automatically detecting floating crystals described above, the system comprising:
[0027] The first judgment module is used to acquire a sample grain at the die bonding end for image teaching, compare the image of the current grain with the image of the sample grain, and determine whether the current grain has been successfully bonded based on the comparison result.
[0028] The second judgment module is used to perform grayscale processing on the current grain when the current grain is successfully solidified, so as to obtain the grayscale value to be measured in a specific region of the current grain, set a corresponding floating crystal control threshold based on the grayscale value of the specific region of the sample grain, compare the grayscale value to be measured with the floating crystal control threshold, and determine whether the current grain has floating crystal based on the comparison result.
[0029] Furthermore, the specific region includes a grain electrode region and a grain light-emitting region, the floating crystal control threshold includes a first floating crystal control interval and a second floating crystal control interval, and the second judgment module includes:
[0030] The first comparison unit is used to compare the gray value to be measured in the grain electrode region of the current grain with the first floating crystal control range;
[0031] The second comparison unit is used to compare the gray value to be measured in the light-emitting region of the current crystal with the second floating crystal control range;
[0032] The functional expression for the first floating crystal control interval or the second floating crystal control interval is as follows:
[0033] X = (0.7δ, 1.3δ)
[0034] Wherein, X represents the first floating crystal control interval or the second floating crystal control interval, and δ represents the grayscale value of the grain electrode region or the grain light emission region of the sample grain.
[0035] Furthermore, the second determination module includes:
[0036] The first judgment unit is used to determine that there is no floating crystal in the current grain when the grayscale value to be measured is within the range of the floating crystal control threshold.
[0037] The second judgment unit is used to determine that there is floating crystal in the current grain when the grayscale value to be measured is not within the range of the floating crystal control threshold.
[0038] To achieve the above objectives, the present invention also provides a computer-readable storage medium storing a computer program, characterized in that, when executed by a processor, the computer program implements the steps in the above-described method for automatically detecting floating crystals. Attached Figure Description
[0039] Figure 1 This is a flowchart of an automatic method for detecting floating crystals according to an embodiment of the present invention;
[0040] Figure 2 This is a structural block diagram of an automatic floating crystal detection system according to an embodiment of the present invention.
[0041] The following detailed description, in conjunction with the accompanying drawings, will further illustrate the present invention. Detailed Implementation
[0042] To make the objectives, technical solutions, and advantages of this application clearer, the application is described and illustrated below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative and not intended to limit the scope of this application. All other embodiments obtained by those skilled in the art based on the embodiments provided in this application without inventive effort are within the scope of protection of this application.
[0043] Obviously, the accompanying drawings described below are merely some examples or embodiments of this application. Those skilled in the art can apply this application to other similar scenarios based on these drawings without any inventive effort. Furthermore, it is understood that although the efforts made in this development process may be complex and lengthy, for those skilled in the art related to the content disclosed in this application, any changes to design, manufacturing, or production based on the technical content disclosed in this application are merely conventional technical means and should not be construed as insufficient disclosure of the content of this application.
[0044] In this application, the reference to "embodiment" means that a specific feature, structure, or characteristic described in connection with an embodiment may be included in at least one embodiment of this application. The appearance of this phrase in various places in the specification does not necessarily refer to the same embodiment, nor is it a separate or alternative embodiment that is mutually exclusive with other embodiments. It will be explicitly and implicitly understood by those skilled in the art that the embodiments described in this application may be combined with other embodiments without conflict.
[0045] Unless otherwise defined, the technical or scientific terms used in this application shall have the ordinary meaning understood by one of ordinary skill in the art to which this application pertains. The terms “a,” “an,” “an,” “the,” and similar words used in this application do not indicate quantity limitation and may indicate singular or plural. The terms “comprising,” “including,” “having,” and any variations thereof used in this application are intended to cover non-exclusive inclusion; for example, a process, method, system, product, or device that includes a series of steps or modules (units) is not limited to the listed steps or units, but may also include steps or units not listed, or may include other steps or units inherent to these processes, methods, products, or devices. The terms “connected,” “linked,” “coupled,” and similar words used in this application are not limited to physical or mechanical connections, but may include electrical connections, whether direct or indirect. “Multiple” used in this application refers to two or more. “And / or” describes the relationship between related objects, indicating that three relationships may exist; for example, “A and / or B” can represent: A alone, A and B simultaneously, and B alone. The character " / " generally indicates that the preceding and following objects are in an "or" relationship. The terms "first," "second," and "third" used in this application are merely to distinguish similar objects and do not represent a specific ordering of the objects.
[0046] Example 1
[0047] Please see Figure 1 The above is a flowchart of the automatic detection method for floating crystals according to the first embodiment of the present invention. The method includes the following steps:
[0048] Step S101: Obtain a sample die at the die bonding end for image teaching, compare the image of the current die with the image of the sample die, and determine whether the current die bonding is successful based on the comparison result;
[0049] In this process, a sample die is taken from the die-bonding end, ensuring its good appearance. This sample die serves as a template for the machine to determine the success of the die bonding process and is also used for grayscale brightness checks. It's understandable that the characteristics of different dies will not be exactly the same; slight differences will exist. Furthermore, slight differences will occur in each machine's identification process, which is unavoidable. Therefore, when the machine identifies a die, it compares the characteristics and brightness of the currently identified die with those of the sample die. If the similarity score is greater than a set threshold, the machine recognizes the die and determines that the die bonding was successful. The threshold can be customized, ranging from 30 to 100. Setting it too high increases the risk of missed identifications, while setting it too low increases the risk of false identifications. To balance missed and false identifications, the threshold is generally set around 50, meaning that if the similarity exceeds 50%, the die will be identified. The purpose and function of this process is to enable the machine to identify normal dies, thereby confirming whether the machine is operating correctly.
[0050] It should be noted that the specific steps for the machine to determine whether die bonding is successful are as follows: first, the appearance image of the sample die is obtained; then, the appearance image of the die to be tested is obtained; the appearance image of the die to be tested is compared with the appearance image of the sample die to obtain the feature similarity between the die to be tested and the sample die; when the feature similarity is ≥50%, the die bonding is determined to be successful, and then step S102 is performed; when the feature similarity is <50%, the die bonding is determined to be unsuccessful.
[0051] Step S102: When the current grain is successfully solidified, grayscale processing is performed on the current grain to obtain the grayscale value to be measured in a specific region of the current grain. Based on the grayscale value of the specific region of the sample grain, a corresponding floating crystal control threshold is set. The grayscale value to be measured is compared with the floating crystal control threshold. Based on the comparison result, it is determined whether the current grain has floating crystal.
[0052] In this context, because the electrode area appears white and the light-emitting area appears gray in the machine's recognition image, and the grayscale values of the two differ significantly, the selected specific areas include the grain electrode area and the grain light-emitting area. After the crystal floats, the grayscale values of the selected grain electrode area and the grain light-emitting area will change. Specifically, the floating crystal occurs when the grain is not completely bonded to the bottom blue film. Due to foreign objects such as blue film debris at the bottom of the grain, the grain floats up. At this time, two situations will occur. One is that the grain floats up. Because the position of the grain changes, the machine will recognize the grain in a blurry way, which will cause the grayscale value of the grain electrode area to change, the color to darken, the grayscale value to decrease, and the grain as a whole to appear gray or black (card-controlled electrode grayscale). The other is that the grain is tilted and not flat and bonded to the blue film. Due to the change in the angle of the reflected light from the grain, the machine will recognize the grain as white (card-controlled light-emitting surface grayscale), that is, the grayscale value of the grain light-emitting area changes, the color to brighten, and the grayscale value to increase.
[0053] Through the above steps, a sample die is obtained at the die bonding end for image teaching. The image of the current die is compared with the image of the sample die. Based on the comparison result, it is determined whether the current die bonding is successful. When the current die bonding is successful, grayscale processing is performed on the current die to obtain the grayscale value to be measured in a specific area of the current die. The grayscale value to be measured in the specific area of the current die is compared with the floating crystal control threshold. Based on the comparison result, it is determined whether the current die has floating crystal. Unlike existing technologies, this solves the problem of floating crystal not being detected in time during the sorting process, which is conducive to improving product yield and reducing the frequency of customer complaints.
[0054] Furthermore, the specific region includes a grain electrode region and a grain light-emitting region, the floating crystal control threshold includes a first floating crystal control interval and a second floating crystal control interval, and the step of comparing the grayscale value to be measured with the floating crystal control threshold includes:
[0055] The gray value to be measured in the grain electrode region of the current grain is compared with the first floating crystal control range;
[0056] The gray value to be measured in the light-emitting region of the current crystal is compared with the second floating crystal control range;
[0057] When setting the upper and lower limits for grayscale tolerance, both are typically set to 30%. This is because differences exist between equipment and between chips, and recognition is continuous, causing fluctuations in the recognized grayscale values. Therefore, upper and lower limits are needed, using the tested standard value as a benchmark to control chips that exceed these limits; those exceeding the limits are considered floating chips. The purpose and function of this setting is to mitigate the impact of equipment differences and chip color differences, preventing the equipment from mistakenly triggering floating chip alarms.
[0058] The functional expression for the first floating crystal control interval or the second floating crystal control interval is as follows:
[0059] X = (0.7δ, 1.3δ)
[0060] Wherein, X represents the first floating crystal control interval or the second floating crystal control interval, and δ represents the grayscale value of the grain electrode region or the grain light emission region of the sample grain.
[0061] Furthermore, the step of determining whether the current die bonding is floating based on the comparison result includes:
[0062] When the grayscale value to be measured is within the range of the floating crystal control threshold, it is determined that there is no floating crystal in the current grain;
[0063] When the grayscale value to be measured is not within the range of the floating crystal control threshold, it is determined that the current grain has floating crystals.
[0064] Specifically, when the grayscale value to be measured in the grain electrode region is in the first floating crystal control range, and when the grayscale value to be measured in the grain light-emitting region is in the second floating crystal control range, it is determined that the current grain does not have floating crystals.
[0065] When the grayscale value to be measured in the grain electrode region is not in the first floating crystal control range, or when the grayscale value to be measured in the grain light-emitting region is not in the second floating crystal control range, it is determined that the current grain has floating crystal.
[0066] Furthermore, after determining whether the current grain contains floating crystals based on the comparison results, the method further includes:
[0067] When floating crystals are present in the current crystal grain, floating crystal control alarm and machine clearing processes are performed sequentially.
[0068] Among them, the machine cleaning process is used to check the scope of the floating crystal impact. This machine cleaning process is performed by the employee after the floating crystal control alarm is triggered, and is not handled by the machine. Specifically, the machine cleaning process involves selecting "Crystal Quantity ≥ 1" in the machine's single-cart batching interface and clicking "Single Cart Batch Closing". The machine will then clear out all wafers. Wafers with floating crystals will be reworked, while wafers without floating crystals will be released normally.
[0069] It should be noted that the specific steps for investigating the impact of floating crystals are as follows: by reviewing the machine operation records and alarm records, find the time point when floating crystals started being produced. All square pieces produced after this time point should be reworked. If the time point when floating crystals started being produced cannot be found, square pieces produced before this machine need to be found and checked. Check each piece one by one, according to the production time, until there are no more floating crystals.
[0070] Understandably, in other embodiments, after the machine is cleaned, it is necessary to investigate the cause of the abnormal crystal production, adjust the machine condition, and after the cause of the abnormality is resolved, run the machine for a period of time to observe whether there is still crystal production. If not, the machine will operate normally. If there is still crystal production, continue to investigate and process until the abnormality is resolved and the machine operates normally.
[0071] When there is no floating crystal in the current grain, readjust the floating crystal control threshold.
[0072] If no floating crystal is generated, readjusting the floating crystal control parameters indicates a false alarm caused by machine error or crystal color difference. The floating crystal control parameters need to be readjusted, mainly by adjusting the control threshold value.
[0073] Furthermore, before obtaining the grayscale value to be measured for a specific region of the current grain, the method further includes:
[0074] Check if the current grain row position is correct.
[0075] Since it takes time for the floating crystal to rise, if the sorting machine identifies a currently solidified crystal before it has risen, it's necessary to set a forward detection row position to allow sufficient time for the floating crystal to rise. The set detection position cannot exceed the solidified crystal range that the machine can recognize; generally, setting it to detect two rows forward is sufficient. The purpose of this setting is to give the floating crystal enough time to rise and prevent it from being left uncontrolled before it has risen.
[0076] It should be noted that the position of the detected die is based on the current die bonding position, and the detection extends forward by two rows. These two rows cannot be set beyond the die bonding range that the machine can recognize. Generally, it is set to detect two rows forward, and the detection liquid is not the die in the first two rows. Because die bonding and die detection are performed simultaneously, once the die bonding of this die is completed, the corresponding dies in the first two rows can also be completely detected.
[0077] Furthermore, the method also includes:
[0078] When there are floating crystals in the current grain, the number of floating crystal control attempts is accumulated, and the number of floating crystal control attempts is compared with a preset cumulative control threshold. Based on the comparison result, it is determined whether to issue an alarm prompt for exceeding the floating crystal control attempt limit.
[0079] To mitigate the impact of machine errors and grain color differences, and to prevent the machine from erroneously triggering a floating crystal alarm, when a floating crystal is detected, the corresponding number of floating crystal triggering attempts is accumulated. Additionally, in cases where floating crystal production is not continuous, such as when the sorting machine has two swing arms that operate alternately, if one swing arm malfunctions, the produced floating crystals will be produced in alternating patterns. Therefore, the number of floating crystal triggering attempts needs to be accumulated to prevent the floating crystals from flowing out without being blocked.
[0080] Example 2
[0081] Please see Figure 2 The diagram below shows the structural block diagram of the automatic floating crystal detection system according to the second embodiment of the present invention. The system includes:
[0082] The first judgment module is used to acquire a sample grain at the die bonding end for image teaching, compare the image of the current grain with the image of the sample grain, and determine whether the current grain has been successfully bonded based on the comparison result.
[0083] The second judgment module is used to perform grayscale processing on the current grain when the current grain is successfully solidified, so as to obtain the grayscale value to be measured in a specific region of the current grain, set a corresponding floating crystal control threshold based on the grayscale value of the specific region of the sample grain, compare the grayscale value to be measured with the floating crystal control threshold, and determine whether the current grain has floating crystal based on the comparison result.
[0084] In practical implementation, a sample die is obtained at the die-bonding end for image teaching. The image of the current die is compared with the image of the sample die. Based on the comparison result, it is determined whether the current die bonding is successful. When the current die bonding is successful, grayscale processing is performed on the current die to obtain the grayscale value to be measured in a specific area of the current die. The grayscale value to be measured in the specific area of the current die is compared with the floating crystal control threshold. Based on the comparison result, it is determined whether the current die has floating crystal. Unlike existing technologies, this solves the problem of floating crystal not being detected in time during the sorting process, which is conducive to improving product yield and reducing the frequency of customer complaints.
[0085] Furthermore, the specific region includes a grain electrode region and a grain light-emitting region, the floating crystal control threshold includes a first floating crystal control interval and a second floating crystal control interval, and the second judgment module includes:
[0086] The first comparison unit is used to compare the gray value to be measured in the grain electrode region of the current grain with the first floating crystal control range;
[0087] The second comparison unit is used to compare the gray value to be measured in the light-emitting region of the current crystal with the second floating crystal control range;
[0088] The functional expression for the first floating crystal control interval or the second floating crystal control interval is as follows:
[0089] X = (0.7δ, 1.3δ)
[0090] Wherein, X represents the first floating crystal control interval or the second floating crystal control interval, and δ represents the grayscale value of the grain electrode region or the grain light emission region of the sample grain.
[0091] Furthermore, the second determination module includes:
[0092] The first judgment unit is used to determine that there is no floating crystal in the current grain when the grayscale value to be measured is within the range of the floating crystal control threshold.
[0093] The second judgment unit is used to determine that there is floating crystal in the current grain when the grayscale value to be measured is not within the range of the floating crystal control threshold.
[0094] Furthermore, after the second determination module, the system also includes:
[0095] The card control alarm module is used to sequentially perform floating crystal control alarm and machine clearing process when floating crystal is present in the current crystal.
[0096] The re-adjustment module is used to re-adjust the floating crystal control threshold when the current grain does not have a floating crystal.
[0097] Furthermore, prior to the second determination module, the system further includes:
[0098] The inspection module is used to check whether the current number and position of the grain are correct.
[0099] Furthermore, the system also includes:
[0100] The comparison module is used to accumulate the number of times the floating crystal is controlled when the current grain has floating crystals, and compare the number of times the floating crystal is controlled with a preset cumulative control threshold. Based on the comparison result, it determines whether to issue an alarm prompt for exceeding the limit of the number of times the floating crystal is controlled.
[0101] Example 3
[0102] In a third embodiment of the present invention, based on the same inventive concept, the present invention proposes a computer-readable storage medium storing a computer program that, when executed by a processor, implements the steps of the automatic detection method for floating crystals described in the above embodiments.
[0103] The logic and / or steps represented in the flowchart or otherwise described herein, for example, can be considered as a ordered list of executable instructions for implementing logical functions, and can be embodied in any computer-readable medium for use by, or in conjunction with, an instruction execution system, apparatus, or device (such as a computer-based system, a processor-included system, or other system that can fetch and execute instructions from, an instruction execution system, apparatus, or device). For the purposes of this specification, "computer-readable medium" can be any means that contains storage, communication, propagation, or transmission programs for use by, or in conjunction with, an instruction execution system, apparatus, or device.
[0104] More specific examples of computer-readable media (a non-exhaustive list) include: electrical connections (electronic devices) having one or more wires, portable computer disk drives (magnetic devices), random access memory (RAM), read-only memory (ROM), erasable and editable read-only memory (EPROM or flash memory), fiber optic devices, and portable optical disc read-only memory (CDROM). Furthermore, computer-readable media can even be paper or other suitable media on which the program can be printed, since the program can be obtained electronically, for example, by optically scanning the paper or other medium, followed by editing, interpreting, or otherwise processing as necessary, and then stored in computer memory.
[0105] The memory may include a large-capacity storage device for data or instructions. For example, and not limitingly, the memory may include a hard disk drive (HDD), a floppy disk drive, a solid-state drive (SSD), flash memory, an optical disk drive, a magneto-optical disk drive, magnetic tape, or a Universal Serial Bus (USB) drive, or a combination of two or more of these. Where appropriate, the memory may include removable or non-removable (or fixed) media. Where appropriate, the memory may be internal or external to the data processing device. In a particular embodiment, the memory is non-volatile memory. In a particular embodiment, the memory includes read-only memory (ROM) and random access memory (RAM). Where appropriate, the ROM may be a mask-programmed ROM, a programmable read-only memory (PROM), an erasable programmable read-only memory (EPROM), an electrically erasable programmable read-only memory (EEPROM), an electrically alterable read-only memory (EAROM), or flash memory, or a combination of two or more of these. Where appropriate, the RAM can be Static Random-Access Memory (SRAM) or Dynamic Random-Access Memory (DRAM). DRAM can be Fast Page Mode Dynamic Random-Access Memory (FPMDRAM), Extended Data Out Dynamic Random-Access Memory (EDODRAM), Synchronous Dynamic Random-Access Memory (SDRAM), etc.
[0106] Example 4
[0107] In the fourth embodiment of the present invention, based on the same inventive concept, the present invention proposes a terminal, the terminal comprising: a processor and a memory; the processor and the memory communicate with each other; the memory is used to store instructions; the processor is used to execute the instructions in the memory to execute the automatic detection method for floating crystals described in the above embodiment.
[0108] It should be understood that various parts of the present invention can be implemented in hardware, software, firmware, or a combination thereof. In the above embodiments, multiple steps or methods can be implemented in software or firmware stored in memory and executed by a suitable instruction execution system. For example, if implemented in hardware, as in another embodiment, it can be implemented using any one or a combination of the following techniques known in the art: discrete logic circuits having logic gates for implementing logical functions on data signals, application-specific integrated circuits (ASICs) having suitable combinational logic gates, programmable gate arrays (PGAs), field-programmable gate arrays (FPGAs), etc.
[0109] In the description of this specification, references to terms such as "one embodiment," "some embodiments," "example," "specific example," or "some examples," etc., indicate that a specific feature, structure, material, or characteristic described in connection with that embodiment or example is included in at least one embodiment or example of the invention. In this specification, the illustrative expressions of the above terms do not necessarily refer to the same embodiment or example. Furthermore, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in one or more embodiments or examples.
[0110] Without causing conflict, those skilled in the art can freely combine and use the above-mentioned additional technical features.
[0111] The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. Any modifications, equivalent substitutions, and improvements made within the spirit and principles of the present invention should be included within the protection scope of the present invention.
Claims
1. A method for automatically detecting floating crystals, characterized in that, The method includes: A sample die is acquired at the die bonding end for image teaching. The image of the current die is compared with the image of the sample die, and the current die bonding success is determined based on the comparison result. When the current grain is successfully solidified, grayscale processing is performed on the current grain to obtain the grayscale value to be measured in a specific region of the current grain. Based on the grayscale value of the specific region of the sample grain, a corresponding floating crystal control threshold is set. The grayscale value to be measured is compared with the floating crystal control threshold, and the presence of floating crystal in the current grain is determined based on the comparison result.
2. The method for automatically detecting floating crystals according to claim 1, characterized in that, The specific region includes a grain electrode region and a grain light-emitting region; the floating crystal control threshold includes a first floating crystal control interval and a second floating crystal control interval; the step of comparing the grayscale value to be measured with the floating crystal control threshold includes: The gray value to be measured in the grain electrode region of the current grain is compared with the first floating crystal control range; The gray value to be measured in the light-emitting region of the current crystal is compared with the second floating crystal control range; The functional expression for the first floating crystal control interval or the second floating crystal control interval is as follows: X = (0.7δ, 1.3δ) Wherein, X represents the first floating crystal control interval or the second floating crystal control interval, and δ represents the grayscale value of the grain electrode region or the grain light emission region of the sample grain.
3. The method for automatically detecting floating crystals according to claim 1, characterized in that, The step of determining whether the current die bonding is floating based on the comparison results includes: When the grayscale value to be measured is within the range of the floating crystal control threshold, it is determined that there is no floating crystal in the current grain; When the grayscale value to be measured is not within the range of the floating crystal control threshold, it is determined that the current grain has floating crystals.
4. The method for automatically detecting floating crystals according to claim 1, characterized in that, After determining whether the current grain contains floating crystals based on the comparison results, the method further includes: When floating crystals are present in the current crystal grain, floating crystal control alarm and machine clearing processes are performed sequentially. When there is no floating crystal in the current grain, readjust the floating crystal control threshold.
5. The method for automatically detecting floating crystals according to claim 1, characterized in that, Before obtaining the grayscale value to be measured for a specific region of the current grain, the method further includes: Check if the current grain row position is correct.
6. The method for automatically detecting floating crystals according to claim 1, characterized in that, The method further includes: When there are floating crystals in the current grain, the number of floating crystal control attempts is accumulated, and the number of floating crystal control attempts is compared with a preset cumulative control threshold. Based on the comparison result, it is determined whether to issue an alarm prompt for exceeding the floating crystal control attempt limit.
7. A system for automatically detecting floating crystals, used to implement the method for automatically detecting floating crystals as described in any one of claims 1-6, characterized in that, The system includes: The first judgment module is used to acquire a sample grain at the die bonding end for image teaching, compare the image of the current grain with the image of the sample grain, and determine whether the current grain has been successfully bonded based on the comparison result. The second judgment module is used to perform grayscale processing on the current grain when the current grain is successfully solidified, so as to obtain the grayscale value to be measured in a specific region of the current grain, set a corresponding floating crystal control threshold based on the grayscale value of the specific region of the sample grain, compare the grayscale value to be measured with the floating crystal control threshold, and determine whether the current grain has floating crystal based on the comparison result.
8. The system for automatically detecting floating crystals according to claim 7, characterized in that, The specific region includes a grain electrode region and a grain light-emitting region; the floating crystal control threshold includes a first floating crystal control interval and a second floating crystal control interval; the second judgment module includes: The first comparison unit is used to compare the gray value to be measured in the grain electrode region of the current grain with the first floating crystal control range; The second comparison unit is used to compare the gray value to be measured in the light-emitting region of the current crystal with the second floating crystal control range; The functional expression for the first floating crystal control interval or the second floating crystal control interval is as follows: X = (0.7δ, 1.3δ) Wherein, X represents the first floating crystal control interval or the second floating crystal control interval, and δ represents the grayscale value of the grain electrode region or the grain light emission region of the sample grain.
9. The system for automatically detecting floating crystals according to claim 7, characterized in that, The second judgment module includes: The first judgment unit is used to determine that there is no floating crystal in the current grain when the grayscale value to be measured is within the range of the floating crystal control threshold. The second judgment unit is used to determine that there is floating crystal in the current grain when the grayscale value to be measured is not within the range of the floating crystal control threshold.
10. A computer-readable storage medium storing a computer program, characterized in that, When executed by a processor, the computer program implements the steps in the method for automatically detecting floating crystals as described in any one of claims 1-6.