A design method of wave-absorbing material based on fractal geometry
By using fractal geometry design methods, combined with resonance effect factors and equivalent electromagnetic parameters, the iterative design of absorbing materials is optimized, solving the problems of low frequency band matching and broadband absorption efficiency of existing absorbing materials, and realizing thin-film and high-efficiency electromagnetic wave absorption.
Patent Information
- Application Number
- CN202511812735.9
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2025-12-04
- Publication Date
- 2026-03-24
- Estimated Expiration
- 2045-12-04
AI Technical Summary
Existing microwave absorbing materials suffer from problems such as difficulty in frequency band matching, low broadband absorption efficiency, and large thickness and weight in many fields. They lack systematic theoretical modeling methods and are difficult to meet the needs of specific applications such as RFID and microwave anechoic chambers.
By employing a fractal geometry design method, the geometric complexity of the absorbing material is quantitatively described through fractal dimension. Combining the resonance effect factor and equivalent electromagnetic parameters, the interface wave impedance model is derived based on the equivalent transmission line theory, enabling accurate prediction of electromagnetic wave reflectivity and reflection loss, and optimizing the iterative design of the absorbing material.
It achieves wideband and thin-film absorption of electromagnetic waves, improves the signal transmission efficiency of RFID tags and the testing accuracy of microwave anechoic chambers, and meets the electromagnetic wave absorption needs of multiple fields.