Accelerator mass spectrometer system based on positive and negative double ion sources

Abstract

The invention relates to an accelerator mass spectrometer system based on positive and negative double ion sources, and the system comprises a double ion source subsystem which comprises a solid sample introduction negative ion source, a gas sample introduction positive ion source, a reversible electrostatic analyzer, and a high-voltage rack. The gas sample injection positive ion source is an electron cyclotron resonance ionization source and can generate 1 +, 2 +, 3 + and full-stripping-state positive ion beams; according to the invention, the dual-ion source subsystem is arranged, the solid sample introduction negative ion source and the gas sample introduction positive ion source are respectively adopted, the measurement requirements of positive ions and negative ions in the same accelerator mass spectrometer system are met, the gas sample introduction positive ion source adopts an electron cyclotron resonance ionization source, positive ion beams in various charge states can be generated, and the measurement accuracy is improved. Covering nuclides from hydrogen to over uranium; the solid sample injection negative ion source adopts a sputtering negative ion source, meets the generation of various negative ion beams, is suitable for measuring long-life isotopes, and realizes quick switching of the two ion sources by arranging a reversible electrostatic analyzer.

Description

Technical Field

[0001] This invention relates to the field of accelerator mass spectrometry instruments and equipment, and in particular to an accelerator mass spectrometry system based on positive and negative dual ion sources. Background Technology

[0002] Accelerator mass spectrometry (AMS) is a high-energy isotope mass spectrometer based on an accelerator and an ion detector. It overcomes the limitations of traditional MS due to molecular background and isotope background interference, thus possessing extremely high isotope abundance sensitivity. Currently, the highest abundance sensitivity for traditional isotope MS measurements is 10-1. -8 AMS reached 10. -15 AMS not only has such high measurement sensitivity, but also has the advantages of small sample volume (ng level) and short measurement time. Therefore, AMS provides a powerful testing tool for the in-depth development of research in many disciplines such as geology, oceanography, archaeology, and environment.

[0003] In practice, some problems still exist: Current accelerator mass spectrometry (AMS) systems are mainly divided into two categories: one is the AMS system based on tandem accelerators, which can only use negative ion sources; the other is the AMS system based on single-stage (SS) electrostatic accelerators, which can use both positive and negative ion sources. Despite their different structures, both types of systems have the same limitation: they are only equipped with a single ion source, which means that only one type of ion can be measured. It is impossible to measure both positive and negative ions in the same AMS system. For example, current technology cannot simultaneously detect and analyze ^14C negative ions and ^85Kr positive ions in one AMS system. Summary of the Invention

[0004] (a) Technical problems to be solved To address the aforementioned problems in the prior art, this invention provides an accelerator mass spectrometer system based on dual positive and negative ion sources, solving the problem that existing AMS systems cannot simultaneously measure positive and negative ions.

[0005] (II) Technical Solution To achieve the above objectives, the main technical solution adopted by the present invention is as follows: An accelerator mass spectrometer system based on positive and negative dual ion sources includes a dual ion source subsystem comprising a solid-state negative ion source, a gas-state positive ion source, a reversible electrostatic analyzer, and a high-voltage platform. The gas-state positive ion source is an electron cyclotron resonance ionization source capable of generating positive ion beams in 1+, 2+, 3+, and fully stripped states. The solid-state negative ion source is a sputtered negative ion source capable of generating negative ion beams in the 1- charge state. The reversible electrostatic analyzer is positioned between the horizontal planes of the two ion sources and can be rotated 180° between the two positions. The high-voltage platform operates at the same potential as the accelerator and is insulated from the ground and surrounding environment.

[0006] The accelerator subsystem is a single-stage electrostatic accelerator, including a pre-acceleration section, an electrostatic analyzer-1, and a main acceleration section; the operating voltage range of the pre-acceleration section is 20-200kV; the operating voltage range of the main acceleration section is 0-800kV; the high-voltage power supply has two modes: positive high voltage and negative high voltage.

[0007] The Magnetic Analyzer-1 subsystem is located after the accelerator subsystem.

[0008] The Faraday cup system includes multiple Faraday cups, each connected to a corresponding ion exit port of the magnetic analyzer-1.

[0009] The energy absorption membrane subsystem includes a silicon nitride thin film and an energy spectrum detector, with a film thickness of 30-500 nm.

[0010] The high-energy analyzer subsystem includes electrostatic analyzer-2 and magnetic analyzer-2.

[0011] The detector subsystem is either a ΔE-E gas ionization chamber or a semiconductor detector.

[0012] In positive ion mode, the gas sample is mixed with the supporting gas and then enters the gas sample positive ion source. After passing through the accelerator subsystem, magnetic analyzer-1, Faraday cup system, energy absorption membrane subsystem, and high-energy analyzer subsystem, it enters the detector subsystem. In negative ion mode, the solid sample negative ion source and the accelerator subsystem are connected through a flip-up electrostatic analyzer, and the path is the same as in positive ion mode.

[0013] Gas-introduced positive ion sources include direct gas injection structures, liquid spray injection structures, secondary ion injection structures generated by sputtering solid surfaces, and solid heating and evaporation injection structures.

[0014] The flip-up electrostatic analyzer is driven by an electric or pneumatic drive mechanism and is equipped with a position locking device.

[0015] The high-voltage test bench is supported by epoxy resin insulated pillars or ceramic insulated pillars between itself and the ground.

[0016] The high-voltage power supply in the pre-acceleration section is up to 200kV and has two modes: positive high voltage and negative high voltage.

[0017] The magnetic analyzer-1 has a dual-focusing magnetic field structure.

[0018] The number of Faraday cups ranges from 1 to 15, and each Faraday cup is connected to an independent current measurement module.

[0019] The thickness of the silicon nitride film in the energy absorption membrane system is replaceable.

[0020] The high-energy analyzer subsystem has a beam alignment detector placed between the electrostatic analyzer-2 and the magnetic analyzer-2.

[0021] The ΔE-E gas ionization chamber includes multiple energy loss detection zones and residual energy detection zones.

[0022] (III) Beneficial Effects The beneficial effects of this invention are: 1. In this invention, by setting up a dual-ion-source subsystem, employing a solid-state negative ion source and a gas-state positive ion source respectively, the measurement requirements for both positive and negative ions are met within the same accelerator mass spectrometer system. The gas-state positive ion source uses an electron cyclotron resonance ionization source, capable of generating positive ion beams with multiple charge states, covering nuclides from hydrogen to transuranium. The solid-state negative ion source uses a sputtering negative ion source, satisfying the generation of various negative ion beams and suitable for measuring long-lived isotopes. By setting up a reversible electrostatic analyzer, rapid switching between the two ion sources is achieved, ensuring the system's efficient switching capability and stable beam transmission path, avoiding the need for equipment replacement or cumbersome operation. This significantly improves measurement efficiency and equipment utilization, overcoming previous limitations. Furthermore, the integrated single-stage electrostatic accelerator, comprising a pre-acceleration section, electrostatic analyzer-1, and a main acceleration section, enables efficient acceleration and energy regulation of both positive and negative ions. The pre-acceleration and main acceleration sections offer wide-range high-voltage operation and both positive and negative high-voltage modes, meeting the acceleration requirements of ions with different charge states and enhancing ion transport efficiency and acceleration stability. The equipped magnetic analyzer-1 subsystem precisely separates ions with different mass-to-charge ratios. Combined with the Faraday cup system, it enables simultaneous measurement of multiple nuclide beams, enhancing the system's resolution and measurement accuracy, and adapting to the multi-nucleus analysis needs of complex samples.

[0023] 2. In this invention, by setting up an energy absorption membrane subsystem and using a uniformly thick and replaceable silicon nitride thin film, the system distinguishes between ions with similar mass-to-charge ratios and energies, such as ^39Ar and ^39K, effectively reducing the impact of isotope interference on the measurement results. The accompanying energy spectrum detector and high-energy end analyzer subsystem further employ electrostatic analyzer-2 and magnetic analyzer-2 for multiple analyses and screening of the ion beam, enhancing the system's ability to suppress interfering ions and ensuring the accuracy and reliability of the measurement data. Furthermore, the ΔE-E gas ionization chamber detector, with its structure of multiple energy loss and residual energy detection zones, enables high-sensitivity counting and energy spectrum measurement of the ion beam separated by the high-energy end analyzer. This detector can distinguish between a very small number of interfering ions and target ions, ensuring the precision and accuracy of data acquisition. The overall system structure is reasonable. Combined with a flip-up electrostatic analyzer and multiple analytical detection subsystems, it realizes the multi-nucleometry function of an accelerator mass spectrometer system based on positive and negative dual ion sources, meeting the diverse needs of complex isotope analysis in scientific research and applications. Attached Figure Description

[0024] Figure 1 This is a simplified structural diagram of the AMS system with both positive and negative ion sources according to the present invention; Figure 2 A simplified diagram of the traditional AMS system based on a single-stage electrostatic accelerator; Figure 3 This is a schematic diagram of the mass spectrometer system of the present invention. Detailed Implementation

[0025] To better explain and facilitate understanding of the present invention, the present invention will be described in detail below with reference to the accompanying drawings and specific embodiments.

[0026] Please refer to Figures 1 to 3 As shown, the present invention discloses an accelerator mass spectrometer system based on positive and negative dual ion sources, comprising a dual ion source subsystem including a solid-state negative ion source, a gas-state positive ion source, a reversible electrostatic analyzer, and a high-voltage platform. The gas-state positive ion source is an electron cyclotron resonance ionization source capable of generating positive ion beams in 1+, 2+, 3+, and fully stripped states. The solid-state negative ion source is a sputtered negative ion source capable of generating negative ion beams in the 1- charge state. The reversible electrostatic analyzer is positioned between the horizontal planes of the two ion sources and can be rotated 180° between the two positions. The high-voltage platform operates at the same potential as the accelerator and is insulated from the ground and surrounding environment.

[0027] The accelerator subsystem is a single-stage electrostatic accelerator, including a pre-acceleration section, an electrostatic analyzer-1, and a main acceleration section; the operating voltage range of the pre-acceleration section is 20-200kV; the operating voltage range of the main acceleration section is 0-800kV; the high-voltage power supply has two modes: positive high voltage and negative high voltage.

[0028] The Magnetic Analyzer-1 subsystem is located after the accelerator subsystem.

[0029] The Faraday cup system includes multiple Faraday cups, each connected to a corresponding ion exit port of the magnetic analyzer-1.

[0030] The energy absorption membrane subsystem includes a silicon nitride thin film and an energy spectrum detector, with a film thickness of 30-500 nm.

[0031] The high-energy analyzer subsystem includes electrostatic analyzer-2 and magnetic analyzer-2.

[0032] The detector subsystem is either a ΔE-E gas ionization chamber or a semiconductor detector.

[0033] In positive ion mode, the gas sample is mixed with the supporting gas and then enters the gas sample positive ion source. After passing through the accelerator subsystem, magnetic analyzer-1, Faraday cup system, energy absorption membrane subsystem, and high-energy analyzer subsystem, it enters the detector subsystem. In negative ion mode, the solid sample negative ion source and the accelerator subsystem are connected through a flip-up electrostatic analyzer, and the path is the same as in positive ion mode.

[0034] Optionally, the gas-introduced positive ion source includes direct gas injection structures, liquid spray injection structures, solid secondary ion injection structures, and solid heating evaporation injection structures. In practical implementation, the gas-introduced positive ion source can select the appropriate injection method based on the physicochemical properties of different samples. Liquid spray injection structures are suitable for liquid or solution samples, achieving efficient atomization and uniform ionization through spraying. Solid secondary ion injection structures are suitable for the direct ionization of solid samples, improving sample utilization and reducing pretreatment steps. Solid heating evaporation injection structures are suitable for heating highly volatile or easily decomposed solid samples, promoting evaporation and ionization. These diverse injection structures ensure the system has good applicability and flexibility, meeting various scientific research and industrial testing needs and improving measurement accuracy and repeatability.

[0035] Optionally, the flip-up electrostatic analyzer is driven by an electric or pneumatic drive mechanism and is equipped with a position locking device. In actual implementation, the flip-up electrostatic analyzer uses an electric or pneumatic drive mechanism to achieve a precise 180° flip. The drive mechanism has stable power output and rapid response capability, ensuring accurate positioning during ion beam path switching and preventing measurement errors caused by position deviation. The position locking device can firmly lock the position of the electrostatic analyzer, avoiding displacement caused by vibration or external forces, and ensuring the stability and safety of the system's long-term operation. This structural design effectively improves the ease of operation and automation level, reduces manual intervention, and improves system switching efficiency and measurement continuity.

[0036] Optionally, the high-voltage test bench is supported by epoxy resin insulated pillars or ceramic insulated pillars. In actual implementation, the high-voltage test bench is effectively insulated from the ground by epoxy resin insulated pillars or ceramic insulated pillars, ensuring electrical safety during high-voltage operation. The insulating material has high dielectric strength and good mechanical strength, capable of withstanding the strong electric field and mechanical stress brought by the accelerator's operating voltage. The support structure is rationally designed to ensure the stability and shock resistance of the test bench. Optimized insulation performance reduces the risk of leakage and corona discharge, improves the overall reliability and safety of the system, and meets the technical requirements for long-term high-voltage operation.

[0037] Optionally, the high-voltage power supply in the pre-acceleration section can reach a maximum of 200kV, with both positive and negative high-voltage modes. In actual implementation, the high-voltage power supply in the pre-acceleration section supports a maximum output of 200kV, has a positive / negative high-voltage switching function, and can adapt to different acceleration requirements of positive and negative ions. The power supply design features high stability and low ripple characteristics, ensuring a continuous and stable output of the accelerating voltage. It has a wide voltage adjustment range and fast response speed, facilitating precise control of the accelerating electric field intensity, ensuring energy consistency and beam quality during ion beam acceleration, improving the resolution and accuracy of subsequent analyses, and meeting diverse experimental needs.

[0038] Optionally, the magnetic analyzer-1 employs a dual-focusing magnetic field structure. In practical implementation, the magnetic analyzer-1 utilizes a dual-focusing magnetic field design. By optimizing the magnetic field distribution, it achieves high-precision focusing and separation of the ion beam. The dual-focusing structure reduces ion beam dispersion and scattering, improving mass resolution and transmittance. It can effectively distinguish ion beams with different mass-to-charge ratios, and its separation capability for multi-charge state isotopes is particularly significant. The magnet material is made of a high-permeability material to ensure a uniform and stable magnetic field. The magnetic analyzer has a compact structure, is easy to maintain and adjust, and enhances the system's performance stability and detection sensitivity.

[0039] Optionally, the number of Faraday cups can be 1-15, with each Faraday cup connected to an independent current measurement module. In practical implementation, the number of Faraday cups can be flexibly configured according to measurement needs, ranging from 1 to 15, enabling simultaneous detection of multiple ion beams. The independent current measurement module ensures accurate and reliable data acquisition for each Faraday cup. The module features high sensitivity and low noise characteristics, supports real-time monitoring and data transmission, and allows for synchronous acquisition and processing of signals from each Faraday cup, improving the efficiency and accuracy of multi-nucleus analysis. The system has a reasonable structural design, facilitating installation, calibration, and maintenance, and meeting the multi-parameter analysis needs of complex samples.

[0040] Optionally, the silicon nitride film thickness of the energy absorption membrane subsystem is replaceable. In practical implementation, the number of Faraday cups can be flexibly configured according to measurement needs, ranging from 1 to 15, enabling simultaneous detection of multiple ion beams. An independent current measurement module ensures accurate and reliable data acquisition for each Faraday cup. The module features high sensitivity and low noise characteristics, supports real-time monitoring and data transmission, and the system can synchronously acquire and process signals from each Faraday cup, improving the efficiency and accuracy of multi-nucleus analysis. The system has a reasonable structural design, facilitating installation, calibration, and maintenance, and meeting the multi-parameter analysis needs of complex samples.

[0041] Optionally, the high-energy-end analyzer subsystem includes a beam alignment detector between the electrostatic analyzer-2 and the magnetic analyzer-2. In practical implementation, the beam alignment detector in the high-energy-end analyzer subsystem is used to monitor the transmission status of the ion beam between the electrostatic analyzer-2 and the magnetic analyzer-2 in real time. The detector has high sensitivity and can promptly detect beam deviation or divergence. The feedback control system automatically adjusts to ensure the accurate path of the ion beam in the high-energy-end analyzer, improving separation efficiency and analytical accuracy. This detector has a compact structure, fast response speed, and is easy to maintain, enhancing the automation and intelligence level of the entire system.

[0042] Optionally, the ΔE-E gas ionization chamber includes multiple energy loss detection zones and residual energy detection zones. In practical implementation, the ΔE-E gas ionization chamber is designed as a multi-layered structure, containing energy loss zones and residual energy zones. Particle identification and energy spectrum analysis are achieved by measuring the energy loss of ions in each layer. It features a compact structure, high detection sensitivity, and the ability to effectively distinguish between different ions of the same substance, improving measurement resolution and accuracy. The internal gas pressure and composition of the ionization chamber are adjustable to adapt to different experimental conditions, exhibiting good stability and repeatability. The data acquisition system records signals from each layer in real time, meeting the needs of complex isotope analysis.

[0043] Working Principle: By integrating a solid-state negative ion source and a gas-state positive ion source, the system achieves flexible switching and efficient measurement of positive and negative ions within the same AMS system. The core working principle of the system includes four stages: ion source generation, acceleration, separation, and detection. The specific process is as follows: First, the sample is ionized by selecting the appropriate ion source according to the type of ion to be measured. For samples requiring negative ion measurement, a solid-state negative ion source, usually a sputtering negative ion source, is used. The sample is excited within this ion source to generate a negatively charged ion beam. For positive ion measurement, a gas-state positive ion source is used. Based on electron cyclotron resonance ionization (ECR) technology, the sample gas is mixed with the support gas and introduced into the ionization chamber. Electron bombardment causes atoms or molecules to lose electrons, forming a positive ion beam with various charge states. This gas-state positive ion source also supports multiple sample introduction methods such as liquid spray, solid secondary ion, and heating evaporation to meet the diverse needs of different samples. After ion generation, the system switches between the two ion sources and the accelerator through a reversible electrostatic analyzer. The electrostatic analyzer is located between the horizontal planes of the two ion sources and can be flipped between 0° and 180° positions to ensure that the ion beam path is accurate when switching between different sources, thereby improving system stability and measurement efficiency. The high-voltage test bench provides a stable high-potential environment for the entire system and is insulated from the ground and surrounding walls to ensure safe and reliable operation of the system under high voltage. After entering the acceleration phase, the ion beam passes through the pre-acceleration section, electrostatic analyzer-1, and the main acceleration section in sequence. The voltage range of the pre-acceleration section is 20-200kV, and the voltage range of the main acceleration section is 0-800kV. Both support two working modes, positive and negative high voltage, which can meet the different acceleration requirements of positive and negative ions. The energy of the accelerated ion beam is increased, scattering and energy distribution width are reduced, thereby improving the accuracy of subsequent analysis. Electrostatic analyzer-1, as an energy analysis device, removes ions with large energy deviations and reduces background interference. The accelerated ion beam enters the magnetic analyzer-1, where it is separated based on the mass-to-charge ratio (M / q) of the ions by the action of the magnetic field. The magnetic analyzer adopts a dual-focusing magnetic field structure to enhance resolution and effectively distinguish ion beams with different masses and charge states, such as isotope ions stripped of different numbers of electrons. After magnetic analysis, multiple Faraday cups are set according to different ion exit ports to achieve synchronous detection of multi-nucleoside beams and provide preliminary beam intensity data. To further remove homogeneous interfering ions, the system is equipped with an energy absorption membrane subsystem. This subsystem uses a uniform, replaceable silicon nitride (Si3N4) film with a thickness typically in the range of 30-300 nm. Ions with the same mass-to-charge ratio and similar energies (such as ^39Ar and ^39K) will be separated due to different energy losses when passing through the film. After passing through the film, the ion energies are significantly different, providing conditions for further purification by the high-energy analyzer subsystem. The high-energy end analyzer includes an electrostatic analyzer-2 and a magnetic analyzer-2, which work together to perform multiple screenings on the ion beam, greatly suppressing the presence of interfering ions and reducing interfering beam currents such as ^39K to 10^-5 to 10^-8 times that of ^39Ar, significantly improving detection sensitivity and accuracy. After passing through the high-energy end analyzer, the beam current enters the final detection stage. The detector subsystem employs a ΔE-E gas ionization chamber, which includes multiple energy loss regions and residual energy regions. It is capable of performing high-resolution energy spectrum measurements and counting of ion beams. By analyzing the energy loss characteristics of ions in the detector, it further distinguishes residual interfering ions from target isotopes, ensuring the accuracy of the counting data. The detector data is recorded in real time, providing a basis for subsequent data analysis and sample isotope content determination. In summary, this invention constructs an accelerator mass spectrometer system capable of efficiently switching between and measuring positive and negative ions by rationally integrating dual ion sources, a reversible electrostatic analyzer, a multi-stage accelerator, and multiple analytical detection subsystems. This system is compact, highly automated, and has high resolution, meeting the diverse needs of complex isotope measurements and is applicable to multiple fields such as nuclear science research, environmental monitoring, and archaeological surveys.

[0044] The above description shows and illustrates the basic principles, main features, and advantages of the present invention. Standard parts used in the present invention can be purchased from the market, and irregular parts can be customized according to the description and drawings. The specific connection methods of each part adopt conventional methods such as bolts, rivets, and welding that are mature in the prior art. The machinery, parts, and equipment adopt conventional models in the prior art, and the circuit connection adopts conventional connection methods in the prior art, which will not be described in detail here.

[0045] The above description is merely an embodiment of the present invention and does not limit the patent scope of the present invention. Any equivalent modifications made based on the content of the present invention specification and drawings, or direct or indirect applications in related technical fields, are similarly included within the patent protection scope of the present invention.

Claims

1. An accelerator mass spectrometer system based on a positive ion source and a negative ion source, characterized in that, include: The dual ion source subsystem includes a solid-injection negative ion source, a gas-injection positive ion source, a reversible electrostatic analyzer, and a high-voltage bench. The gas-introduced positive ion source is an electron cyclotron resonance ionization source, capable of generating positive ion beams in 1+, 2+, 3+ and fully stripped states; the solid-introduced negative ion source is a sputtered negative ion source, capable of generating negative ion beams in 1- charge states; the reversible electrostatic analyzer is positioned between the horizontal planes of the two ion sources and can be rotated 180° between the two positions; the high-voltage platform has the same operating potential as the accelerator and is insulated from the ground and surrounding area. The accelerator subsystem is a single-stage electrostatic accelerator, including a pre-acceleration section, an electrostatic analyzer-1, and a main acceleration section; the operating voltage range of the pre-acceleration section is 20-200kV; the operating voltage range of the main acceleration section is 0-800kV; the high-voltage power supply has two modes: positive high voltage and negative high voltage. The Magnetic Analyzer-1 subsystem is located after the accelerator subsystem. The Faraday cup system includes multiple Faraday cups, each connected to a corresponding ion exit port of the magnetic analyzer-1. The energy absorption membrane subsystem includes a silicon nitride thin film and an energy spectrum detector, with a film thickness of 30-500 nm. The high-energy analyzer subsystem includes electrostatic analyzer-2 and magnetic analyzer-2. The detector subsystem is either a ΔE-E gas ionization chamber or a semiconductor detector. In positive ion mode, the gas sample is mixed with the supporting gas and then enters the gas sample positive ion source. After passing through the accelerator subsystem, magnetic analyzer-1, Faraday cup system, energy absorption membrane subsystem, and high-energy analyzer subsystem, it enters the detector subsystem. In negative ion mode, the solid sample negative ion source and the accelerator subsystem are connected through a flip-up electrostatic analyzer, and the path is the same as in positive ion mode.

2. The accelerator mass spectrometer system based on a positive ion source and a negative ion source according to claim 1, characterized in that, Gas-introduced positive ion sources include direct gas injection structures, liquid spray injection structures, secondary ion injection structures generated by sputtering solid surfaces, and solid heating and evaporation injection structures.

3. The accelerator mass spectrometer system based on a positive ion source and a negative ion source according to claim 1, characterized in that, The flip-up electrostatic analyzer is driven by an electric or pneumatic drive mechanism and is equipped with a position locking device.

4. The accelerator mass spectrometer system based on a positive ion source and a negative ion source according to claim 1, characterized in that, The high-voltage test bench is supported by epoxy resin insulated pillars or ceramic insulated pillars between itself and the ground.

5. The accelerator mass spectrometer system based on a positive ion source and a negative ion source according to claim 1, characterized in that, The high-voltage power supply in the pre-acceleration section is up to 200kV and has two modes: positive high voltage and negative high voltage.

6. The accelerator mass spectrometer system based on a positive ion source and a negative ion source according to claim 1, characterized in that, The magnetic analyzer-1 has a dual-focusing magnetic field structure.

7. An accelerator mass spectrometer system based on a positive ion source and a negative ion source according to claim 1, characterized in that, The number of Faraday cups ranges from 1 to 15, and each Faraday cup is connected to an independent current measurement module.

8. An accelerator mass spectrometer system based on a positive ion source and a negative ion source according to claim 1, characterized in that, The thickness of the silicon nitride film in the energy absorption membrane system is replaceable.

9. An accelerator mass spectrometer system based on a positive ion source and a negative ion source according to claim 1, characterized in that, The high-energy analyzer subsystem has a beam alignment detector placed between the electrostatic analyzer-2 and the magnetic analyzer-2.

10. An accelerator mass spectrometer system based on a positive ion source and a negative ion source according to claim 1, characterized in that, The ΔE-E gas ionization chamber includes multiple energy loss detection zones and residual energy detection zones.

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