Circuit testing method with dynamic threshold value

Abstract

The invention relates to the technical field of automatic temperature control devices, and discloses a circuit test method with a dynamic threshold value, which comprises the following steps of: acquiring a relation between current and voltage when low voltage and high voltage are simultaneously started, constructing a current-voltage curve graph, starting a communication circuit through communication control, and sending a discharge instruction to a detonator. Closing an ignition circuit and a communication circuit; comparing and judging the state of a control branch, if the control branch is normal, the detonator current IOHV is greater than the dynamic threshold ITH (t), if the control branch is short-circuited, the detonator current IOHV is approximately equal to the IIT (t), and if the control branch is open-circuited, the ignition circuit and the communication circuit are closed; if the current is not changed but the ignition voltage cannot be transmitted to the detonator, reporting the state of the control branch, and if the control branch is detected to be damaged, forbidding detonation and discharging by the system.

Description

[0001] This application is a divisional application of the invention entitled "An Online Circuit Testing Method with Dynamic Thresholds", filed on March 20, 2025, with application number CN202510331970.8. Technical Field

[0002] This invention relates to the field of automatic temperature control devices, and more specifically to a circuit testing method with dynamic thresholds. Background Technology

[0003] In the civil explosives industry, a long wire is typically used as the detonator wire to connect a number of electronic delay detonators. The detonator sends a signal to each electronic delay detonator through the detonator wire, and each electronic delay detonator responds to the instructions sent by the detonator according to a specific protocol.

[0004] To ensure the safety of blasting personnel, the blast line is generally very long, with 1000 meters being a common reference length. Due to the harsh conditions at blasting sites and the tight timeframe after detonation, short circuits in the blast line may occur during network connection testing. Overcurrent detection can rule out simple blast line short circuits, but it cannot prevent short circuits caused by the instantaneous explosion. At the moment of explosion, there is a certain probability that the blast line will experience a momentary or permanent short circuit. Since ignition is a time-limited process, the high voltage on the ignition line remains constant during this time, and its duration exceeds the time required for the detonation caused by the explosive charge. If a short circuit occurs during this ignition time, the control circuit of the detonator's ignition circuit will be affected after the blast. There is a risk of damage to the control branch circuit. Short circuits in the control branch circuit are generally more dangerous. Since the communication circuit is independent of the ignition circuit and operates at a low voltage, it is unlikely to be damaged. Therefore, when the control branch circuit of the ignition circuit is damaged, it is often possible to successfully perform a test connection. When entering the ready-to-detonate state, the ignition circuit starts working and outputs high voltage. Due to the damage to the control branch circuit of the ignition circuit, the ignition high voltage will be transmitted to the detonator along the damaged control branch when the ignition circuit starts, thus causing premature detonation. Premature detonation will affect the blasting effect and even threaten the lives of the workers. Therefore, it is necessary to conduct online inspections of the ignition control branch circuit to reduce premature detonation accidents and lower the risk.

[0005] For example, the online circuit testing method with dynamic threshold in patent application CN202411475115.6 can work reliably when the number of detonators is small or the load is stable. However, when the number of detonators is large, there are high false alarms due to changes in the line voltage, external interference, the discreteness and nonlinearity of the detonator current, and it is also sensitive to leakage current.

[0006] Based on this, this application proposes an online circuit testing method with dynamic threshold. Summary of the Invention

[0007] The purpose of this invention is to provide a circuit testing method with a dynamic threshold, which indirectly detects the circuit status of the ignition branch by detecting the current in the communication circuit, thereby reducing premature detonation accidents and lowering risks. This invention, by dynamically adjusting the threshold, can adapt to circuit states under different environments, significantly improving the accuracy and reliability of the detection.

[0008] The objective of this invention can be achieved through the following technical solutions: An online circuit testing method with dynamic threshold includes the following steps: S1: Obtain the relationship between current and voltage when low voltage and high voltage are turned on simultaneously, construct a current-voltage curve, and select the linear segment in the curve to establish a fitting formula. Determine parameter a TH and b TH ; S2: The communication circuit is activated by communication control to send a discharge command to the detonator, causing the detonator to discharge and release the residual voltage energy on the ignition capacitor; S3: Initiate low-voltage measurement of real-time detonator current V OLV (t) and establish a dynamic threshold I TH (t), starting the real-time detonator current I for high-voltage measurement OHV ; S4: Turn off the ignition circuit and communication circuit; S5: Compare and determine the status of the control branch. If the control branch is normal, the detonator current I... OHV Greater than dynamic threshold I TH (t); If the control branch is short-circuited, the detonator current I... OHV ≈I TH (t); If the control branch is open, the current remains unchanged but the ignition voltage cannot be transmitted to the detonator. S6: Report the status of the control branch. If damage to the control branch is detected, the system will prohibit detonation and discharge. S7: Based on multi-sensor fusion technology, data on circuit status is collected to build a historical database. Based on the processing of historical database and real-time monitoring data, early warning identification of circuit fault status is performed.

[0009] As a further aspect of the present invention: the dynamic threshold I TH (t) is set to 1 / 5 to 4 / 5 of the operating current of a single detonator.

[0010] As a further aspect of the present invention: the detonator discharge time T1 depends on the time constant of the detonator.

[0011] As a further aspect of the present invention: the dynamic threshold I THThe establishment of (t) is based on the current response curve of the detonator under different voltages. The threshold is dynamically adjusted by fitting the formula to adapt to the circuit state under different environments.

[0012] As a further aspect of the present invention: the firing line is raised, the voltage difference between firing line A and B is set to a predetermined low voltage, and the voltage detection circuit is activated to detect the detonator's operating voltage V. OLV (t), .

[0013] As a further aspect of the present invention: when the control branch is short-circuited, when If a short circuit is detected in the control branch, the control branch status is changed to damaged status.

[0014] As a further aspect of the present invention: the multi-sensor fusion technology includes a temperature sensor, a humidity sensor, and a vibration sensor, used to collect historical data from the circuit.

[0015] As a further aspect of the present invention, the early warning process for circuit fault status is based on processing historically collected data using machine learning algorithms.

[0016] As a further aspect of the present invention: the monitoring data is fused and processed to extract features from the historical data collected by the circuit, the historical data is used to train a machine learning model, and the extracted features are processed to obtain a health index.

[0017] As a further aspect of the present invention: when the health index is lower than a preset threshold, the system issues a fault warning, prompting the user to perform maintenance or replace circuit components.

[0018] The beneficial effects of this invention are as follows: This invention, combined with a microprocessor, can reliably detect short circuits in the control branch of the ignition circuit while being insensitive to the number of detonators and leakage current, significantly reducing premature detonation accidents and improving explosion safety. By dynamically adjusting the threshold, this invention can adapt to circuit states under different environments, significantly improving the accuracy and reliability of detection. This invention significantly improves the calculation performance of health index based on machine learning algorithms by combining multi-dimensional features such as temperature change rate, humidity change rate, vibration peak value, current fluctuation, and voltage fluctuation. This combination of multi-dimensional features not only comprehensively reflects the health status of the circuit but also captures potential fault modes, thereby improving the accuracy of fault prediction and reducing the occurrence of sudden failures. Real-time monitoring and analysis of these features provides strong support for circuit health management, extending equipment lifespan, reducing maintenance costs, and improving production efficiency and equipment reliability. Attached Figure Description

[0019] The invention will now be further described with reference to the accompanying drawings.

[0020] Figure 1 This is a flowchart of an online circuit testing method with dynamic threshold according to an embodiment of the present invention; Figure 2 This is an embodiment of an online circuit testing method with dynamic thresholds according to the present invention. OLV -V OLV Line graph; Figure 3 This is a block diagram of the detonation system according to an embodiment of the present invention; Figure 4 This is a block diagram of an electronic device according to an embodiment of the present invention. Detailed Implementation

[0021] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0022] Example 1 Please see Figure 1 As shown, this invention provides an online circuit testing method with dynamic thresholds, comprising the following steps: Step 1: Obtain the relationship between the current and LV (low voltage) when both LV (low voltage) and HV (high voltage) are turned on simultaneously; Simultaneously turn on LV (low voltage) and HV (high voltage), and start the current detection circuit 20 to detect the operating current I of the detonator 40. OLV The voltage detection circuit 25 is activated to detect the operating voltage V of the detonator 40. OLV ; like Figure 2 As shown, draw I OLV -V OLV From the curve graph, select the linear segment and establish the fitting formula. Determine parameter a TH and b TH ; Step 2: Detonator discharge: The communication circuit 10 is started by the communication control Ctl. The microprocessor circuit 50 sends a discharge command to the input In of the communication circuit 10. After processing, the communication circuit 10 transmits the low voltage communication signal to the detonator 40 through the current detection circuit 20, the first anti-reverse diode D1 and the gun wire. Each detonator 40 performs a discharge action to completely release the residual voltage energy on the firing capacitor. The discharge time T1 depends on the time constant of the detonator, which is generally 1-10 seconds. Step 3: Measure the real-time detonator current V at low voltage. OLV(t) and establish a dynamic threshold I TH (t); Raise the firing line, set the voltage difference between firing line A and B to the set low voltage LV, and activate the voltage detection circuit 20 to detect the operating voltage V of the detonator 40. OLV (t), ; Step 4: Turn off the ignition circuit 30 and the communication circuit 10 to proceed with subsequent work; Step 5: Compare and determine the status of the control branch: If the control branch is normal, since the ignition enable En2 is not activated, the high voltage HV cannot be transmitted to the detonator wire A, and the detonator current I... OHV It should be greater than the dynamic threshold I TH (t), theoretically, this difference is at least the operating current of a detonator. Considering the influence of distributed parameters, this threshold I is set. TH (t) represents 1 / 5 to 4 / 5 of the operating current of a single detonator; Preferred, I TH (t) is set to half of the operating current of a single detonator; If the control branch is short-circuited, even if the ignition enable En2 is not activated, the high voltage HV (high voltage) will still be transmitted to gun wire A. Since HV (high voltage) is greater than LV (low voltage), the current I measured when the ignition circuit 30 is activated will be higher. OHV It does not include the detonator's operating current; its theoretical value is the detonator's dynamic threshold, i.e., I. OHV ≈I TH (t); when If a short circuit is detected in the control branch, the control branch status is changed to damaged status. If the control branch is open, although the current remains unchanged, the ignition voltage cannot be transmitted to the detonator 40 during detonation. The detonator can be replaced in time for operation. Step Six: Report the status of the control branch; Upon detecting damage to the control branch, the MCU reports the circuit failure to the system, which then prohibits detonation and discharge. Simultaneously, even if the MCU receives a charging command, it will not perform a charging action to ensure safety.

[0023] Example 2 During circuit operation, historical data on the circuit status are collected, including temperature, humidity, vibration, current, and voltage. This includes cleaning and preprocessing the collected historical data to remove noise and outliers; Extracting features from historical data; For example: The process for obtaining the rate of temperature change is as follows: Obtain the instantaneous temperature change rate ΔTs=T t -T t−1 ; Among them, T t The current temperature, T t−1 The temperature at the previous moment; Obtain the moving average temperature change rate ; Where n is the size of the sliding window, and Ti is the temperature at time i; Obtain the extreme temperature change rate ; in, The data represents the temperature from time tn to time t, where n is the time window. The instantaneous temperature change rate ΔTs and the moving average temperature change rate and the rate of change of extreme temperature values Perform weighted processing; The weighting of the instantaneous temperature change rate ΔTs is assigned as r1, and the moving average temperature change rate is... The weighting is assigned as r2, and the rate of change of extreme temperature values ​​is... The weighting percentage is r3; Through formula The calculated rate of temperature change Where r1+r2+r3=1, and r1, r2, and r3 are all greater than zero; The temperature change rate obtained in this embodiment can reflect the heat changes generated by the circuit during operation. By analyzing the temperature change rate, it is possible to effectively predict whether the circuit is at risk of overheating, and thus take measures in advance to avoid circuit damage.

[0024] The process of obtaining the humidity change rate is as follows: Obtain the instantaneous temperature change rate ΔHs=H t -H t−1 ; Among them, H t The current humidity, H t−1 The humidity at the previous moment; Obtain the moving average humidity change rate ; Where n is the size of the sliding window, and Hi is the humidity at time i; Obtain the extreme change rate of humidity ; in, The data represents humidity from time tn to time t, where n is the time window. The instantaneous humidity change rate ΔHs and the moving average humidity change rate and the rate of change of extreme humidity values Perform weighted processing; The weighting of the instantaneous humidity change rate ΔHs is assigned as R1, and the moving average humidity change rate is... The weighting percentage is assigned as R2, and the extreme humidity change rate is... The weighting is assigned as R3; Through formula The calculated rate of temperature change ,in, R1, R2, and R3 are all greater than zero; Humidity change rate can reflect the impact of changes in ambient humidity on circuits. Excessive humidity may lead to circuit leakage or short circuits, while excessively low humidity may lead to static electricity accumulation. By analyzing the humidity change rate, it is possible to effectively predict whether there is a risk of circuit failure caused by humidity changes.

[0025] Peak vibration value: V max =max(V t ); Where Vt is the vibration signal value at time t, and the vibration signal is usually acquired by a vibration sensor; Vibration peak values ​​reflect the intensity of mechanical vibration experienced by a circuit during operation. Excessive vibration may lead to loose circuit connections or component damage. By analyzing vibration peak values, it is possible to predict whether the circuit is at risk of failure due to vibration.

[0026] Current fluctuation: ΔI=I t -I t−1 ; Among them, I t Let I be the current at time t. t−1 The current at the previous moment; Current fluctuations reflect changes in current during circuit operation. Excessive current fluctuations may indicate unstable circuit load or a risk of short circuit. By analyzing current fluctuations, it is possible to predict whether the circuit is at risk of failure due to current instability. Voltage fluctuation: ΔU=U t -U t−1 ; Among them, U t Let U be the voltage at time t. t−1 The voltage at the previous moment; Voltage fluctuations reflect changes in voltage during circuit operation. Excessive voltage fluctuations may indicate power instability or a risk of short circuits. By analyzing voltage fluctuations, it is possible to predict whether a circuit is at risk of failure due to voltage instability. Use historical data to train machine learning models (such as random forest, XGBoost, neural networks, etc.), with the extracted features as input and the circuit health index as output; For example: Predict the health index using the random forest model: HI=RF(T,H,V,I,U,ΔT,ΔH,Vmax,ΔI,ΔU); RF stands for Random Forest model.

[0027] When the circuit health index falls below a preset threshold, the system issues a fault warning, prompting the user to inspect or replace circuit components. This application significantly improves the calculation performance of health index based on machine learning algorithms by combining multi-dimensional features such as temperature change rate, humidity change rate, vibration peak value, current fluctuation, and voltage fluctuation. This combination of multi-dimensional features not only comprehensively reflects the health status of the circuit but also captures potential fault modes, thereby improving the accuracy of fault prediction and reducing the occurrence of sudden failures. Real-time monitoring and analysis of these features provides strong support for circuit health management, extending equipment lifespan, reducing maintenance costs, and improving production efficiency and equipment reliability. Example 3

[0028] like Figure 3 The detonation system block diagram shown includes a communication circuit 10, a current detection circuit 20, a voltage detection circuit 25, an ignition circuit 30, a microprocessor circuit 50, and a detonator 40. The communication circuit 10, current detection circuit 20, voltage detection circuit 25, ignition circuit 30, and microprocessor circuit 50 together form the detonator. The detonator is connected to the detonator 40 via a blast wire, and multiple detonators 40 are connected in parallel. Example 4

[0029] Reference Figure 4 The present invention also provides a computer device 3, including: a memory 302 and a processor 301, and a computer program 303 stored in the memory 302. When the computer program 303 is executed on the processor 301, it implements the online circuit testing method with dynamic threshold.

[0030] The computer device 3 may be a desktop computer, laptop, handheld computer, or cloud server, etc. The computer device 3 may include, but is not limited to, a processor 301 and a memory 302. Those skilled in the art will understand that... Figure 3 The computer device 3 is merely an example and does not constitute a limitation on the computer device 3. It may include more or fewer components than shown in the figure, or combine certain components, or different components, such as input / output devices, network access devices, etc.

[0031] The processor 301 may be a Central Processing Unit (CPU), or it may be other general-purpose processors, digital signal processors (DSPs), application-specific integrated circuits (ASICs), field-programmable gate arrays (FPGAs), or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. A general-purpose processor may be a microprocessor or any conventional processor.

[0032] In some embodiments, the memory 302 may be an internal storage unit of the computer device 3, such as a hard disk or memory of the computer device 3. In other embodiments, the memory 302 may be an external storage device of the computer device 3, such as a plug-in hard disk, smart media card (SMC), secure digital (SD) card, flash card, etc., equipped on the computer device 3. Furthermore, the memory 302 may include both internal and external storage units of the computer device 3. The memory 302 is used to store the operating system, applications, bootloader, data, and other programs, such as the program code of the computer program. The memory 302 can also be used to temporarily store data that has been output or will be output. Example 5

[0033] This invention also provides a computer-readable storage medium storing a computer program thereon, which, when executed by a processor, implements the online circuit testing method with dynamic thresholds.

[0034] In this embodiment, if the integrated unit is implemented as a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, all or part of the processes in the methods of the above embodiments can be implemented by a computer program instructing related hardware. The computer program can be stored in a computer-readable storage medium, and when executed by a processor, it can implement the steps of the various method embodiments described above. The computer program includes computer program code, which can be in the form of source code, object code, executable files, or certain intermediate forms. The computer-readable medium can include at least: any entity or device capable of carrying computer program code to a photographing device / terminal device, a recording medium, a computer memory, a read-only memory (ROM), a random access memory (RAM), an electrical carrier signal, a telecommunication signal, and a software distribution medium. Examples include USB flash drives, portable hard drives, magnetic disks, or optical disks. In some jurisdictions, according to legislation and patent practice, computer-readable media cannot be electrical carrier signals or telecommunication signals.

[0035] In the above embodiments, the descriptions of each embodiment have different focuses. For parts that are not described in detail or recorded in a certain embodiment, please refer to the relevant descriptions of other embodiments.

[0036] Those skilled in the art will recognize that the units and algorithm steps of the various examples described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, or a combination of computer software and electronic hardware. Whether these functions are implemented in hardware or software depends on the specific application and design constraints of the technical solution. Those skilled in the art can use different methods to implement the described functions for each specific application, but such implementation should not be considered beyond the scope of this application.

[0037] In the embodiments disclosed in this application, it should be understood that the disclosed devices / terminal equipment and methods can be implemented in other ways. For example, the device / terminal equipment embodiments described above are merely illustrative. For instance, the division of modules or units is only a logical functional division, and in actual implementation, there may be other division methods. For example, multiple units or components may be combined or integrated into another system, or some features may be ignored or not executed. Furthermore, the displayed or discussed mutual coupling or direct coupling or communication connection may be through some interfaces; the indirect coupling or communication connection between devices or units may be electrical, mechanical, or other forms.

[0038] The units described as separate components may or may not be physically separate. The components shown as units may or may not be physical units; that is, they may be located in one place or distributed across multiple network units. Some or all of the units can be selected to achieve the purpose of this embodiment according to actual needs.

[0039] The working principle of this invention: This invention, combined with a microprocessor, can reliably detect short circuits in the control branch of the ignition circuit while being insensitive to the number of detonators and leakage current, significantly reducing premature detonation accidents and improving explosion safety. By dynamically adjusting the threshold, this invention can adapt to circuit states under different environments, significantly improving the accuracy and reliability of detection. Meanwhile, this invention combines multi-sensor fusion technology, which can reliably detect short circuits in the control branch of the ignition circuit while being insensitive to the number of detonators and leakage current, significantly reducing premature detonation accidents and improving blasting safety.

[0040] The foregoing has provided a detailed description of one embodiment of the present invention, but this description is merely a preferred embodiment and should not be construed as limiting the scope of the invention. All equivalent variations and modifications made within the scope of the claims of this invention should still fall within the patent coverage of this invention.

Claims

1. A method of circuit testing with dynamic threshold, characterized in that, The method comprises the following steps: S1: Obtain the relationship between current and voltage when low voltage and high voltage are turned on at the same time, start the current detection circuit to detect the working current I of the detonator OLV , start the voltage detection circuit to detect the working voltage V of the detonator OLV , draw the I OLV -V OLV curve diagram, and select the linear segment in the curve diagram to establish a fitting formula , determine parameters a TH and b TH ; S2: Start the communication circuit by communication control, send discharge command to the detonator, and make the detonator discharge to release residual voltage energy on the ignition capacitor; S3: Measure real-time detonator voltage V at low voltage OLV (t) and establish dynamic threshold I TH (t), measure real-time detonator current I at high voltage OHV ; Pull up the gun line, set the gun line A / B voltage difference to the set low voltage, start the voltage detection circuit to detect the working voltage V of the detonator OLV (t), ; S4: Turn off the ignition circuit and the communication circuit; S5: compare the control branch state, if the control branch is normal, the detonator current I OHV is greater than the dynamic threshold I TH (t); If the control branch is short-circuited, the current I measured when the ignition circuit is switched on OHV will not contain the operating current of the detonator, whose theoretical value is the dynamic threshold value of the detonator, the detonator current I OHV ≈ I TH (t); If the control branch is open, the current remains unchanged, but the ignition voltage cannot be transmitted to the detonator; S6: Report the state of the control branch. If it is detected that the control branch is damaged, the system prohibits detonation and discharges; S7: Based on the multi-sensor fusion technology, the historical database is constructed by collecting data of the circuit state, and the early warning identification of the circuit fault state is performed according to the processing of the historical database and the real-time monitoring data; In the process of circuit operation, the historical data of the circuit state is collected, and the collected data includes temperature, humidity, vibration, current and voltage; The collected historical data is cleaned and preprocessed to remove noise and outliers; The process of obtaining the temperature change rate is as follows: acquiring a rate of change of the instantaneous temperature ΔTs = T t −T t−1 ; wherein T t is the temperature at the current time, T t−1 is the temperature at the previous time. Obtaining a moving average temperature change rate ; Wherein, n is the size of the sliding window, and Ti is the temperature at the i th moment; Acquiring temperature extreme rate of change ; wherein, Tn is the temperature data from time t-n to t, n is the time window; The transient temperature change rate ΔTs, the moving average temperature change rate and the temperature extreme change rate are subjected to a weighting process; The weight ratio of the instantaneous temperature change rate ΔTs is allocated as r1, the weight ratio of the moving average temperature change rate is allocated as r2, and the weight ratio of the temperature extreme change rate is allocated as r3. The temperature change rate is calculated by the formula wherein, r1+r2+r3=1, and r1, r2, r3 are all greater than zero.​ The process of obtaining the humidity change rate is as follows: Acquisition of the instantaneous temperature change rate AHs = H t −H t−1 ; H t is the humidity at the current time, H t−1 is the humidity at the previous time; Obtaining a moving average humidity change rate ; wherein n is the size of the sliding window, i is the humidity at the i-th moment; Acquiring a rate of change of a humidity extreme ; wherein, is the humidity data from time t-n to t, n is the time window; The instantaneous humidity change rate , the moving average humidity change rate , and the humidity extreme change rate are subjected to a weighting process; The weight ratio of the instantaneous humidity change rate is allocated as R1, the weight ratio of the moving average humidity change rate is allocated as R2, and the weight ratio of the humidity extreme value change rate is allocated as R3. The temperature change rate is calculated by the formula wherein , , , , are all greater than zero; Vibration peak: V max = max(V t ); Wherein, Vt is the vibration signal value at t moment, and the vibration signal is collected by a vibration sensor; Current fluctuation: ΔI = I t −I t−1 ; where I t is the current at time t, I t−1 is the current at the previous time; Voltage fluctuation: ΔU = U t − U t−1 ; where U t is the voltage at time t, U t−1 is the voltage at the previous time.

2. The method of claim 1, wherein, The dynamic threshold I TH (t) is set to 1 / 5 to 4 / 5 of the operating current of the individual detonator.

3. The method of claim 1, wherein, The detonator discharge time T1 depends on the time constant of the detonator.

4. The method of claim 1, wherein, The dynamic threshold I TH The establishment of (t) is based on the current response curve of the detonator under different voltages, and the threshold is dynamically adjusted by fitting formula to adapt to the circuit state under different environments.

5. The method of claim 1, wherein, When controlling a short circuit of the branch, when a short circuit of the control branch is determined, the state of the control branch is modified to a damaged state.

6. The method of circuit testing with dynamic threshold of claim 1, wherein, The multi-sensor fusion technology includes a temperature sensor, a humidity sensor and a vibration sensor, which are used to collect the historical data of the circuit.

7. The method of testing a circuit having a dynamic threshold according to claim 6, wherein, The early warning process of the circuit fault state is based on the machine learning algorithm to process the historical data.

8. The method of claim 7, wherein the method further comprises: The features of the circuit historical data are extracted by fusion processing of the monitoring data, the machine learning model is trained using the historical data, and the health index is obtained by processing the extracted features.

9. The method of claim 8, wherein the method further comprises: When the health index is lower than the preset threshold, the system issues a fault warning and prompts the user to repair or replace the circuit components.

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