Method for evaluating display driving element and display panel

Abstract

The invention relates to a method for evaluating a display driving element and a display panel. A method of evaluating a display driving element includes: controlling a transistor to be turned off, wherein the transistor is connected to a first end of a target driving transistor of a test element group (TEG) disposed in a non-display area of a display panel; and measuring characteristics of the target driving transistor through pads connected to respective terminals of the target driving transistor.

Description

[0001] This application claims priority to and all benefits arising therefrom of Korean Patent Application No. 10-2024-0093267, filed on July 15, 2024, the entire contents of which are incorporated herein by reference. Technical Field

[0002] Embodiments of this disclosure relate to methods for evaluating display driving elements and display panels. Background Technology

[0003] Pixel driving circuits, each included in a plurality of pixels in a display panel, can control the light-emitting device connected to each pixel driving circuit to emit light based on a received signal. The signal applied to the pixel driving circuit can affect the brightness and timing of the light-emitting device emitting light by the pixel driving circuit.

[0004] The brightness of the light-emitting device is determined by the driving current applied to it, and this driving current can be generated by driving transistors among various components included in the pixel driving circuit. Therefore, it may be desirable to accurately obtain the characteristics of the driving transistors, and to perform evaluations of the display panel and display driving elements based on these characteristics. Summary of the Invention

[0005] To inspect the manufactured display panel, a test element group (TEG) can be set up to verify the performance of the display panel by measuring its physical and electrical characteristics.

[0006] Embodiments of this disclosure provide a method and display panel for accurately evaluating display driving elements by blocking leakage current.

[0007] According to embodiments of this disclosure, a method for evaluating a display driving element includes: controlling a transistor to be turned off, wherein the transistor is connected to a first terminal of a target driving transistor in a test element group (TEG) disposed in a non-display area of ​​a display panel; and measuring the characteristics of the target driving transistor by means of pads connected to the respective terminals of the target driving transistor.

[0008] In an implementation, the TEG may have the same structure as the pixel driving circuit disposed in the display area of ​​the display panel.

[0009] In one implementation, the gate terminal of the transistor connected to the first end of the target driving transistor may be connected to an additional pad, and controlling the transistor to be turned off may include applying a turn-off voltage through the additional pad connected to the gate terminal of the transistor, wherein the transistor is connected to the first end of the target driving transistor.

[0010] In one implementation, the additional pad may also be connected to the gate terminal of one or more transistors, which are connected to a first terminal of each of the one or more driving transistors other than the target driving transistor.

[0011] In one implementation, measuring the characteristics of the target driving transistor may include changing the gate voltage of the target driving transistor and measuring the drive current flowing through the target driving transistor.

[0012] In one implementation, the first terminal of the target driving transistor may include the source terminal of the target driving transistor, and the source terminal of the target driving transistor may be connected to the source terminal of the transistor.

[0013] In one implementation, the transistor connected to the first end of the target driving transistor can be turned on by a sensing signal and can transmit a signal to initialize the light-emitting device.

[0014] According to another embodiment of the present disclosure, the display panel includes a display area in which a plurality of pixel driving circuits are disposed and a non-display area in which a structure having the same structure as the pixel driving circuits is disposed. The TEG includes a driving transistor and a first transistor, wherein the driving transistor has terminals respectively connected to pads, and the first transistor is connected to a first end of the driving transistor and has a gate terminal connected to an additional pad.

[0015] In one implementation, the first transistor can be controlled to be off, and the characteristics of the driving transistor are measured by pads connected to the respective terminals of the driving transistor.

[0016] In one implementation, the first transistor can be turned off by means of a turn-off voltage applied by an additional pad connected to the gate terminal of the first transistor.

[0017] In one implementation, the characteristics of the driving transistor can be measured by changing the gate voltage of the driving transistor and measuring the driving current flowing through the driving transistor.

[0018] In one implementation, the first terminal of the driving transistor may include the source terminal of the driving transistor, and the source terminal of the driving transistor may be connected to the source terminal of the first transistor.

[0019] In an implementation, the TEG may further include a second transistor, and the source terminal of the first transistor may be connected to the source terminal of the driving transistor, and the source terminal of the second transistor may be connected to the gate terminal of the driving transistor.

[0020] In one implementation, the first transistor can be turned on by a sensing signal to transmit a signal thereby initializing the light-emitting device, and the second transistor can be turned on by a scanning signal to transmit a data signal.

[0021] In one implementation, the first transistor can be turned on by an integrated scan / sensing signal to transmit a signal thereby initializing the light-emitting device, and the second transistor can be turned on by an integrated scan / sensing signal to transmit a data signal.

[0022] In addition to those described above, other features of the embodiments of this disclosure will become apparent from the following drawings, claims and detailed description of this disclosure.

[0023] The embodiments of this disclosure can be practiced using any system, method, computer program, or any combination of systems, methods, or computer programs. Attached Figure Description

[0024] The above and other features of certain embodiments of this disclosure will become more apparent from the following description taken in conjunction with the accompanying drawings, in which: Figure 1 This is a schematic plan view of the display panel according to an embodiment; Figure 2 It is a circuit diagram used to describe the structure of a pixel driving circuit according to an embodiment; Figure 3 It is a circuit diagram used to describe the circuit structure of a test element group (TEG) according to an embodiment of the present disclosure; Figure 4 It is a circuit diagram used to describe the structure of a pixel driving circuit according to another embodiment; Figure 5 This is a circuit diagram used to describe the circuit structure of a TEG according to another embodiment of the present disclosure; Figure 6 This is a flowchart of a method for evaluating a display driving element according to embodiments of the present disclosure; Figure 7 This is a detailed flowchart illustrating the operation of a control transistor being turned off according to an embodiment of the present disclosure, the transistor being connected to a first terminal of a target drive transistor; Figure 8 This is a detailed flowchart illustrating the operation of measuring the characteristics of a drive transistor by means of pads connected to the respective terminals of the target drive transistor according to an embodiment of the present disclosure; and Figure 9 This is a block diagram of an apparatus for evaluating a display driving element according to an embodiment of the present disclosure. Detailed Implementation

[0025] The invention will now be described more fully below with reference to the accompanying drawings, in which various embodiments are illustrated. However, this disclosure may be embodied in many different forms and should not be construed as limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the scope of this disclosure to those skilled in the art. Throughout this specification, the same reference numerals refer to the same elements.

[0026] It will be understood that when an element is referred to as being "on" another element, it can be directly on that other element, or there can be an intervening element between them. Conversely, when an element is referred to as being "directly" on another element, there is no intervening element.

[0027] It will be understood that although terms such as “first,” “second,” “third,” etc., may be used herein to describe various elements, components, regions, layers, and / or parts, these elements, components, regions, layers, and / or parts should not be limited by these terms. These terms are used only to distinguish one element, component, region, layer, or part from another. Therefore, without departing from the teachings herein, “first element,” “first component,” “first region,” “first layer,” or “first part” discussed below may be referred to as a second element, second component, second region, second layer, or second part.

[0028] The terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting. As used herein, “a,” “an,” “the,” and “at least one” do not indicate a limitation of quantity and are intended to include both the singular and the plural unless the context clearly indicates otherwise. Thus, reference to “a” element following “the” element in a claim includes one element and multiple elements. For example, “a single element” has the same meaning as “at least one element” unless the context clearly indicates otherwise. “At least one” should not be construed as limiting “a” or “an.” “Or” means “and / or.” As used herein, the term “and / or” includes any and all combinations of one or more of the associated listed items. It will also be understood that when the terms “comprising” and / or “including,” or “containing” and / or “comprising” are used in this specification, they specify the presence of the stated features, areas, integrals, steps, operations, elements, components, and / or groups thereof, but do not preclude the presence or addition of one or more other features, areas, integrals, steps, operations, elements, components, and / or groups thereof.

[0029] Spatially relative terms, such as “below,” “under,” “down,” “above,” “up,” etc., may be used herein for ease of description to describe the relationship between one element or feature and another element(s) as shown in the figures. It will be understood that spatially relative terms are intended to include different orientations of the device in use or operation, in addition to those shown in the figures. For example, if the device in the figures is flipped, an element described as “below” or “under” other elements or features will be oriented “above” other elements or features. Thus, the term “below” can include both above and below orientations. The device may be otherwise oriented (rotated 90 degrees or in other orientations), and the spatially relative descriptors used herein should be interpreted accordingly.

[0030] In the following implementation, unless the context clearly indicates otherwise, terms such as “connection” or “combination” do not necessarily refer to a direct and / or fixed connection or combination of two components, and do not exclude the insertion of another component between the two components.

[0031] Furthermore, in the accompanying drawings, the dimensions of elements may be exaggerated or reduced for ease of description. For example, for ease of explanation, the dimensions and / or thickness of each component shown in the drawings are arbitrarily illustrated, and this disclosure is not necessarily limited to what is shown.

[0032] Unless otherwise defined, all terms used herein (including technical and scientific terms) shall have the same meaning as commonly understood by one of ordinary skill in the art to which this disclosure pertains. It will be further understood that terms such as those defined in commonly used dictionaries shall be interpreted as having the same meaning as they have in the context of the relevant art and this disclosure, and shall not be interpreted in an idealized or overly formal sense unless expressly defined herein.

[0033] Embodiments are described herein with reference to cross-sectional illustrations as illustrative examples of idealized embodiments. Thus, variations in the illustrated shapes due to, for example, manufacturing techniques and / or tolerances are expected. Therefore, the embodiments described herein should not be construed as limited to regions of the specific shapes shown herein, but should include, for example, shape deviations due to manufacturing processes. For example, regions shown or described as flat may generally have rough and / or non-linear characteristics. Furthermore, sharp corners shown may be rounded. Therefore, the regions shown in the figures are schematic in nature, and their shapes are not intended to illustrate precise shapes of the regions, nor are they intended to limit the scope of the claims.

[0034] In the following description, embodiments of the present disclosure will be described in detail with reference to the accompanying drawings, in which the same reference numerals refer to the same elements, and any repeated detailed descriptions thereof will be omitted or simplified.

[0035] Figure 1 This is a schematic plan view of the display panel according to an embodiment.

[0036] refer to Figure 1 An embodiment of the display panel 100 may include a display area 110 for displaying images and a non-display area 120 surrounding the display area 110, and elements and / or signal lines for generating and / or transmitting various signals to be applied to the display area 110 are arranged in the non-display area 120. The display area 110 may correspond to the screen of a display device including the display panel 100.

[0037] In an embodiment, the display area 110 of the display panel 100 may include a pixel portion, which includes one or more pixels PX arranged, for example, in a matrix. The pixels PX may be implemented as light-emitting devices, such as light-emitting diodes (LEDs). Signal lines (not shown), such as data lines, scan lines, drive voltage lines, and sensing lines, may also be provided in the display area 110. Scan lines and data lines are connected to each pixel PX, and scan signals (also called gate signals) and data signals (also called data voltages) can be received from these signal lines. The display area 110 may be configured to transmit a drive voltage ELVDD (see [reference needed]) to the pixels PX. Figure 2 The driving voltage line can be configured to transmit the initialization voltage Vinit to the pixel PX (see [link]). Figure 2 The initialization voltage line. Scan lines, data lines, sensing lines, drive voltage lines, and initialization voltage lines can each be in a first direction ( Figure 1 (left-right direction) and / or second direction ( Figure 1 (Extends upwards in the up-down direction)

[0038] Each pixel PX or sub-pixel SPXn (n is a positive integer) in the display area 110 of the display panel 100 may include a pixel driving circuit. Each pixel PX or sub-pixel SPXn may receive a signal from the lines described above. The pixel driving circuit may include transistors and capacitors. The pixel driving circuit according to embodiments of the present disclosure will now be described in detail.

[0039] Despite Figure 1 Although not shown, a driving section (e.g., a driving circuit) that generates and / or processes various signals for driving the display panel 100 may be located in the non-display area 120 of the display panel 100. The driving section may include a data driving section that applies data signals to data lines, a scan driving section that applies scan signals to scan lines, and a signal control section that controls the data driving section and the scan driving section.

[0040] The scan driving section can be integrated into the driving circuitry within the non-display area 120 of the display panel 100. The data driving section and the signal control section can be formed as a single chip or a separate chip, or defined by a single chip or a separate chip.

[0041] The non-display area 120 may include one or more test element groups (TEGs) 121. In an embodiment, the TEG 121 may be located, for example, in the lower left or lower right portion of the display panel 100 within the non-display area 120. The TEG 121 may include inspection circuitry for checking the characteristics and reliability of components (e.g., transistors) located in the display area 110. The TEG 121 may have the same structure as the pixel driving circuitry disposed in each of the pixels PX in the display area 110.

[0042] Since TEG 121 has the same structure as the pixel driving circuit of pixel PX in display area 110, the display driving element can be evaluated using TEG 121. In an embodiment, for example, the display driving element can be evaluated by measuring the characteristics of the driving transistors of the pixel driving circuit using TEG 121.

[0043] In the implementation method, although in Figure 1 Although not shown, the display panel 100 may also include other elements, circuits, and components for driving the display panel 100 or a display device including the display panel 100.

[0044] Figure 2 It is a circuit diagram used to describe the structure of a pixel driving circuit according to an embodiment.

[0045] Figure 2 The pixel driving circuit shown can be understood as including multiple sub-pixel driving circuits, and Figure 2 The multiple sub-pixel driving circuits shown can be designed to emit green, red, and blue light respectively. Depending on the color of the light to be emitted, each of the multiple sub-pixel driving circuits may include different elements.

[0046] refer to Figure 2 In addition to the light-emitting device, the sub-pixel driving circuit may also include three transistors T1, T2, and T3. For example, the sub-pixel driving circuit corresponding to the emission of green light may include three transistors T1_G, T2_G, and T3_G, as well as a storage capacitor.

[0047] The light-emitting device can emit light corresponding to the current supplied through the first transistor T1. The light-emitting device may include a first end, a second end, and at least one emitting layer disposed between the first end and the second end. The emitting layer can emit light within a specific wavelength range by means of electrical signals emitted from the first end and the second end.

[0048] The first terminal of the light-emitting device can be connected to the source terminal of the first transistor T1, and its second terminal can be connected to a second power voltage ELVSS (or common voltage or low voltage) that is lower than the first power voltage ELVDD (or driving voltage or high potential voltage). Furthermore, the first terminal of the light-emitting device can be connected to the source terminal of the third transistor T3.

[0049] The first transistor T1 can be referred to as the driving transistor. The first transistor T1 can adjust the current flowing from the first power voltage ELVDD to the light-emitting device according to the voltage difference between the gate terminal and the source terminal of the first transistor T1. The gate terminal of the first transistor T1 can be connected to the source terminal of the second transistor T2, the source terminal of the first transistor T1 can be connected to the first terminal of the light-emitting device, and the drain terminal of the first transistor T1 can be connected to the first power voltage ELVDD.

[0050] The second transistor T2 can be turned on by a scan signal (e.g., scan signal Scan) to connect a data line transmitting a data signal (e.g., data signal Data) to the gate terminal of the first transistor T1. The gate terminal of the second transistor T2 can be connected to the scan line, the source terminal of the second transistor T2 can be connected to the gate terminal of the first transistor T1, and the drain terminal of the second transistor T2 can be connected to the data line.

[0051] The third transistor T3 can be turned on by a sensing signal (e.g., sensing signal) from the sensing line to connect the initialization voltage line to the first terminal of the light-emitting device. The gate terminal of the third transistor T3 can be connected to the sensing line, and the source terminal of the third transistor T3 can be connected to the first terminal of the light-emitting device or the source terminal of the first transistor T1.

[0052] In implementations, the source and drain terminals of each of the first transistor T1, the second transistor T2, and the third transistor T3 are not limited to those described above and can be arranged interchangeably. Figure 2 The illustration shows an embodiment in which the first transistor T1, the second transistor T2, and the third transistor T3 are each configured as an N-type metal-oxide-semiconductor field-effect transistor (MOSFET), but this disclosure is not limited thereto. In another embodiment, the first transistor T1, the second transistor T2, and the third transistor T3 may each be formed as a P-type MOSFET, or some of the first transistor T1, the second transistor T2, and the third transistor T3 may be formed as N-type MOSFETs, while the others may be formed as P-type MOSFETs.

[0053] A storage capacitor can be connected or formed between the gate terminal and the source terminal of the first transistor T1. The storage capacitor can store the voltage difference between the gate voltage and the source voltage of the first transistor T1.

[0054] Figure 2 The pixel driving circuit shown may be included in the pixel PX disposed in the display area 110 of the display panel 100. However, as described above, the TEG 121 may have the same structure as the pixel driving circuit disposed in the pixel PX disposed in the display area 110, and therefore, the TEG 121 disposed in the non-display area 120 of the display panel 100 may also be configured as follows: Figure 2 The pixel driving circuit shown.

[0055] In such an implementation, as described above, the display driving element can be evaluated using TEG 121. Since the first transistor T1, as the driving transistor, is directly related to the current flowing to the light-emitting device, the characteristics of the first transistor T1 can be a key characteristic of the display driving element. Therefore, by increasing the gate voltage of the first transistor T1 (e.g., the gate-source voltage (V...)...) GS And measure the current flowing through the first transistor T1 to the light-emitting device (e.g., drain-source current (I)). DS The transfer curve of the first transistor T1 can be obtained, and the characteristics of the first transistor T1 can be measured.

[0056] When based on Figure 2 When evaluating the characteristics of the first transistor T1 using the pixel driving circuit shown, the gate terminals of other transistors may be floating, and leakage current may therefore occur. Leakage current can cause bulges on the transfer curve, which may lead to incorrect measurements of the characteristics of the first transistor T1.

[0057] For example, in order to measure and Figure 2 The characteristics of the first transistor T1_G corresponding to the emission of green light—that is, when the first transistor T1_G corresponding to the emission of green light is the target driving transistor—mean that the gate terminals of the first transistor T1_R corresponding to the emission of red light, the first transistor T1_B corresponding to the emission of blue light, and the third transistors T3_G, T3_R, and T3_B corresponding to the emission of green, red, and blue light, respectively, may be floating. Therefore, transistors other than the target driving transistor may not be completely turned off, which could cause leakage current.

[0058] In an implementation, in order to obtain an accurate transfer curve of the target driving transistor by effectively preventing the occurrence of leakage current, an implementation of the method for evaluating a display driving element according to this disclosure may be performed.

[0059] Figure 3 This is a circuit diagram used to describe the circuit structure of the TEG according to embodiments of the present disclosure.

[0060] Can be based on reference Figure 2 The pixel driving circuit described is used to configure Figure 3 The circuit shown.

[0061] and Figure 2 The pixel driving circuit shown is similar, according to Figure 3 The circuit of the TEG121 in the embodiment of the disclosure shown can be understood to include multiple sub-circuits, and each of the multiple sub-circuits may include the same circuit as the sub-pixel driving circuit designed to emit green, red or blue light.

[0062] refer to Figure 3 In addition to the light-emitting device, the sub-circuit may also include three transistors T1, T2, and T3. For example, the sub-circuit corresponding to the emission of green light may include three transistors T1_G, T2_G, and T3_G, as well as a storage capacitor.

[0063] To describe the operation of each component and the detailed circuitry, the above references can be applied similarly. Figure 2 Details of the description.

[0064] The circuitry of TEG 121 according to embodiments of this disclosure may further include one or more pads. Electrical signals (e.g., voltage or current) can be applied or output through one or more pads.

[0065] In an implementation, the circuitry of TEG 121 may further include pads connected to the terminals of the driving transistors. When the first transistor T1_G, corresponding to the emission of green light, is the target driving transistor, that is, in... Figure 3 In the example shown, the circuitry of TEG 121 may further include pads 311, 312, and 313, which are respectively connected to the terminals of the target driving transistor. Pad 311 may be connected to the gate terminal of the target driving transistor, pad 312 may be connected to the drain terminal of the target driving transistor, and pad 313 may be connected to the source terminal of the target driving transistor.

[0066] In this embodiment, pads 311, 312, and 313, respectively connected to the terminals of the target driving transistor, can be used to measure the characteristics of the target driving transistor. Voltage can be applied to each terminal of the target driving transistor via pads 311, 312, and 313, or the current flowing through each terminal can be measured. In this embodiment, for example, by increasing the gate voltage applied to the target driving transistor through pad 311, the gate-source voltage (Vo) of the target driving transistor can be increased. GS ), and by measuring the drain-source current (I) using pads 312 and 313. DS ), which can obtain the transfer curve of the target driving transistor, where the drain-source current (I DS ( ) is the current flowing to the light-emitting device through the target-driven transistor.

[0067] In one embodiment, the circuitry of TEG 121 may further include pads connected to the gate terminal of a transistor connected to a terminal of a driving transistor. In another embodiment, the circuitry of TEG 121 may further include pads connected to the gate terminal of a third transistor T3 (e.g., third transistor T3_G, third transistor T3_R, and / or third transistor T3_B) connected to the source terminal of a driving transistor.

[0068] In this implementation, the third transistor T3 can be turned off using a pad connected to the gate terminal of the third transistor T3. That is, a turn-off voltage (V0) can be applied through the pad connected to the gate terminal of the third transistor T3. off The turn-off voltage is the voltage used to turn off the third transistor T3. For example, the turn-off voltage (V) off It can be approximately -5 volts (V), but it can vary depending on the specifications and type of the third transistor T3.

[0069] In the implementation method, such as Figure 3 As shown, the circuitry of TEG 121 can further include additional pad 331. (See reference) Figure 3 The additional pad 331 can be connected to the sensing line. When a turn-off voltage (V) is applied through the additional pad 331... off When ), the turn-off voltage (V) off The third transistor T3_G, the third transistor T3_R, and the third transistor T3_B are applied so that the third transistor T3_G, the third transistor T3_R, and the third transistor T3_B can be turned off.

[0070] In the implementation, when the third transistor T3_G, the third transistor T3_R, and the third transistor T3_B are turned off by means of the additional pad 331, the voltage (V) is applied.off When the transistor is turned off, the leakage current that causes a bulge on the transfer curve can be effectively blocked, thus allowing for an accurate transfer curve of the target drive transistor to be obtained.

[0071] Figure 4 This is a circuit diagram used to describe the structure of a pixel driving circuit according to another embodiment.

[0072] Figure 4 The pixel driving circuit shown can be understood as including multiple sub-pixel driving circuits, and Figure 4 The multiple sub-pixel driving circuits shown can be designed to emit green, red, and blue light respectively. Depending on the color of the light to be emitted, each of the multiple sub-pixel driving circuits may include different elements.

[0073] In addition to applying scanning and sensing signals in an integrated manner, Figure 4 The pixel driving circuit shown is Figure 2 The pixel driving circuits shown are basically the same. (Reference) Figure 4 In this implementation, the integrated scanning / sensing signal can be applied to the second transistors T2_G, T2_R, T2_B and the third transistors T3_G, T3_R, T3_B.

[0074] Therefore, the second transistor T2 can be turned on by the integrated scan / sensing signal of the scan / sensing line to connect the data line to the gate terminal of the first transistor T1, and the third transistor T3 can be turned on by the integrated scan / sensing signal of the scan / sensing line to connect the initialization voltage line to the first terminal of the light-emitting device.

[0075] about Figure 4 The operation of other components and the detailed description of the circuitry in the pixel driving circuit shown above can be similarly applied to the above reference. Figure 2 The details described.

[0076] Figure 5 This is a circuit diagram used to describe the circuit structure of a TEG according to another embodiment of the present disclosure.

[0077] Can be based on reference Figure 4 The pixel driving circuit described is used to configure Figure 5 The circuit shown.

[0078] and Figure 4 Similar to the pixel driving circuit shown, the circuit of TEG 121 according to the embodiments of this disclosure can be understood to include a plurality of sub-circuits, and each of the plurality of sub-circuits may include the same circuit as the sub-pixel driving circuit designed to emit green, red and blue light respectively.

[0079] refer to Figure 5 In addition to the light-emitting device, the sub-circuit may also include three transistors T1, T2, and T3. For example, the sub-circuit corresponding to the emission of green light may include three transistors T1_G, T2_G, and T3_G, as well as a storage capacitor.

[0080] The descriptions of the operation and detailed circuitry for each component can be similarly applied to the above reference. Figure 2 or Figure 4 Details of the description.

[0081] The circuitry of TEG 121 according to embodiments of this disclosure may further include one or more pads.

[0082] In an implementation, the circuitry of TEG 121 may further include pads connected to the terminals of the driving transistors. When the first transistor T1_G, corresponding to the emission of green light, is the target driving transistor, that is, in... Figure 5 In the example shown, the circuitry of TEG 121 may further include pads 511, 512, and 513, which are respectively connected to the terminals of the target driving transistor. Pad 511 may be connected to the gate terminal of the target driving transistor, pad 512 may be connected to the drain terminal of the target driving transistor, and pad 513 may be connected to the source terminal of the target driving transistor.

[0083] In this embodiment, pads 511, 512, and 513, respectively connected to the terminals of the target driving transistor, can be used to measure the characteristics of the target driving transistor. Voltage can be applied to each terminal of the target driving transistor via pads 511, 512, and 513, or the current flowing through each terminal can be measured. In this embodiment, for example, by increasing the gate voltage applied to the target driving transistor through pad 511, the gate-source voltage (Vo) of the target driving transistor can be increased. GS ), and by measuring the drain-source current (I) using pads 512 and 513. DS This allows us to obtain the transfer curve of the target driving transistor, which is the drain-source current (Id). DS ( ) is the current flowing to the light-emitting device through the target-driven transistor.

[0084] In an embodiment, the circuitry of TEG 121 may further include pads connected to the gate terminal of a transistor connected to a terminal of a driving transistor. The circuitry of TEG 121 according to an embodiment of this disclosure may further include additional pads connected to the gate terminals of a second transistor T2 (e.g., the second transistor T2_G, the second transistor T2_R, and / or the second transistor T2_B), the second transistor T2 being connected to the gate terminal of the driving transistor, and / or additional pads connected to the gate terminals of a third transistor T3 (e.g., the third transistor T3_G, the third transistor T3_R, and / or the third transistor T3_B), the third transistor T3 being connected to the source terminal of the driving transistor.

[0085] In an implementation, additional pads connected to the gate terminals of the second transistor T2 and / or the third transistor T3 can be used to control the second transistor T2 and / or the third transistor T3 to be turned off. That is, a voltage, i.e., a turn-off voltage (V), can be applied to turn off the second transistor T2 and / or the third transistor T3 via the additional pads connected to the gate terminals of the second transistor T2 and / or the third transistor T3. off ).

[0086] In the implementation method, such as Figure 5 As shown, the circuitry of the TEG 121 may also include an additional pad 531. (See reference) Figure 5 The additional pad 531 can be connected to the scan / sensing line. When a turn-off voltage (V) is applied through the additional pad 531... off When ), the turn-off voltage (V) off An application is made to the second transistor T2_G, the second transistor T2_R, the second transistor T2_B, the third transistor T3_G, the third transistor T3_R, and the third transistor T3_B, such that the second transistor T2_G, the second transistor T2_R, the second transistor T2_B, the third transistor T3_G, the third transistor T3_R, and the third transistor T3_B can be turned off.

[0087] In the implementation, when a turn-off voltage (V) is applied through the additional pad 531, the second transistor T2_G, the second transistor T2_R, the second transistor T2_B, the third transistor T3_G, the third transistor T3_R, and the third transistor T3_B, off When this is done, the leakage current that causes the bulge on the transfer curve can be blocked, thus allowing the accurate transfer curve of the target drive transistor to be obtained.

[0088] Figure 6 This is a flowchart of a method for evaluating a display driving element according to an embodiment of the present disclosure.

[0089] because Figure 6The evaluation method for the drive element shown herein relates to the embodiments described above, and therefore any repeated detailed descriptions of the same or similar elements as described above will be omitted or simplified below.

[0090] Figure 6 The implementation of the method for evaluating display driving elements shown can be a method for evaluating display driving elements using the implementation of TEG 121 described above.

[0091] Figure 6 The implementation of the method for evaluating display driving elements shown can be performed by a device for evaluating display driving elements, specifically by a processor included in the device for evaluating display driving elements.

[0092] According to embodiments of the present disclosure, an apparatus for evaluating display driving elements can perform a method for evaluating display driving elements by controlling the pads of the circuitry of TEG 121 according to embodiments of the present disclosure.

[0093] refer to Figure 6 An implementation of the method for evaluating a display driving element may include controlling a transistor to be turned off, wherein the transistor is connected to a first terminal of a target driving transistor (S10).

[0094] As described above, here, the target driving transistor may refer to the driving transistor whose characteristics are measured among the driving transistors included in TEG121 located in the non-display area 120.

[0095] In an implementation, the transistor connected to the first terminal of the target driving transistor may be a second transistor T2 and / or a third transistor T3.

[0096] refer to Figure 6 An implementation of the method for evaluating display driving elements may include measuring the characteristics of the target driving transistor by means of pads connected to the respective terminals of the target driving transistor (S20).

[0097] As described above, TEG 121 may include pads connected to the gate terminal of the target driving transistor, pads connected to the drain terminal of the target driving transistor, and pads connected to the source terminal of the target driving transistor, and the characteristics of the target driving transistor can be measured through the pads.

[0098] Figure 7 This is a detailed flowchart illustrating the operation of turning off a control transistor according to an embodiment of the present disclosure, wherein the transistor is connected to a first terminal of a target driving transistor.

[0099] refer to Figure 7In an embodiment, the operation (S10) of controlling the transistor connected to the first terminal of the target driving transistor to be turned off may include the operation (S11) of applying a turn-off voltage through a pad connected to the gate terminal of the transistor (which is connected to the first terminal of the target driving transistor).

[0100] In implementation methods, for example, such as Figure 3 As shown in the figure, the first transistor T1_G is the target driving transistor, and the transistor connected to the first end of the target driving transistor can be the third transistor T3_G.

[0101] refer to Figure 7 In an embodiment, the operation (S10) of controlling the transistor connected to the first terminal of the target driving transistor to be turned off may include the operation of applying a turn-off voltage by means of a pad connected to the gate terminal of one or more transistors connected to the first terminal of one or more driving transistors other than the target driving transistor (S12).

[0102] In implementation methods, for example, such as Figure 3 As shown, the first transistor T1_G is the target driving transistor, and one or more driving transistors other than the target driving transistor may be the first transistor T1_R and the first transistor T1_B. One or more transistors connected to the first terminal of each of the one or more driving transistors other than the target driving transistor may be the third transistor T3_R and the third transistor T3_B.

[0103] Figure 8 This is a detailed flowchart illustrating the operation of measuring the characteristics of a drive transistor by means of pads connected to the respective terminals of the target drive transistor according to an embodiment of the present disclosure.

[0104] refer to Figure 8 In one embodiment, the operation (S20) of measuring the characteristics of the target driving transistor by means of the pads connected to the respective terminals of the target driving transistor may include changing the gate voltage of the target driving transistor (S21).

[0105] In an implementation, as described above, voltage can be applied to each terminal of the target driving transistor via pads connected to the respective terminals of the target driving transistor.

[0106] refer to Figure 8 In one embodiment, the operation (S20) of measuring the characteristics of the target driving transistor by means of the pads connected to the terminals of the target driving transistor may include the operation (S22) of measuring the driving current flowing through the target driving transistor.

[0107] In the implementation, as described above, the current flowing through each terminal of the target driving transistor can be measured by the pads connected to the respective terminals.

[0108] Each operation of the method for evaluating display driving elements described above is illustrated by way of example, and the method for evaluating display driving elements can be performed based on the various implementations described above.

[0109] Figure 9 This is a block diagram of an apparatus for evaluating a display driving element according to an embodiment of the present disclosure.

[0110] refer to Figure 9 An embodiment of the device 1000 for evaluating display driving elements may include a communication section 1010, a processor 1020, and a database (DB) 1030. Figure 9 Only components related to an embodiment of the device 1000 for evaluating display driving elements are shown. Therefore, those skilled in the art will understand that, in addition to... Figure 9 In addition to the components shown, other general-purpose components may also be included.

[0111] The communication section 1010 may include one or more components that communicate with the display panel 100 or a display device including the display panel 100.

[0112] DB 1030 is hardware that stores various data processed within the device 1000 used for evaluating display driving elements, and can store programs used for processing and controlling the processor 1020. DB 1030 may include any type and form of memory.

[0113] Processor 1020 can control the overall operation of device 1000 for evaluating display driving elements. In one embodiment, for example, processor 1020 can control at least some of the operations of device 1000 for evaluating display driving elements by executing a program stored in DB 1030. In another embodiment, the operation of device 1000 for evaluating display driving elements may include the methods for evaluating display driving elements described above. Processor 1020 can be implemented using any type and form of processor device.

[0114] In one embodiment, the device 1000 for evaluating display driving elements may be included in the display panel 100 or a display device including the display panel 100. In another embodiment, for example, the device 1000 for evaluating display driving elements may be the same as or included therein any of the driving components that generate and / or process the various signals used to drive the display panel 100 described above.

[0115] In another embodiment, the device 1000 for evaluating display driving elements includes a device separately disposed outside the display panel 100 or the display device including the display panel 100, and can be electrically connected to the display panel 100 or the display device including the display panel 100, and performs a method for evaluating display driving elements.

[0116] Each of the embodiments described above can be implemented independently, but the configuration of each embodiment can also be applied in combination with other embodiments.

[0117] Thus, this disclosure has been described with reference to embodiments shown in the accompanying drawings; however, these are merely illustrative, and those skilled in the art will understand that various modifications and equivalent embodiments can be made therefrom. Therefore, the scope of this disclosure should be determined by the spirit of the appended claims.

[0118] The specific implementations described with reference to the embodiments are examples and do not limit the scope of the embodiments in any way. Furthermore, unless specifically described using terms such as "necessary" or "important," they may not be an essential component of the application of this disclosure.

[0119] In the description of the embodiments (particularly in the claims), the use of the term "above" and similar reference terms may refer to both the singular and the plural. Furthermore, when a range is described in the examples, this disclosure includes the application of individual values ​​within that range (unless otherwise stated), and that range is identical to each individual value constituting the range in the detailed description. Finally, unless the order of steps constituting the method according to the embodiment is clearly stated, or unless otherwise described, the steps may be performed in a suitable order. The embodiments are not necessarily limited to the order of description of the steps above. All use of illustrative or explanatory terms in the embodiments is for the purpose of describing the embodiments in detail only, and the scope of the embodiments is not limited by the illustrative or explanatory terms, except as limited by the claims. Additionally, those skilled in the art will recognize that various modifications, combinations, and changes can be made based on the design conditions and factors within the scope of the appended claims or their equivalents.

[0120] According to embodiments of this disclosure, the characteristics of a driving transistor can be accurately measured by blocking the path of leakage current.

[0121] In particular, the drive current in the low-voltage region on the transfer curve (e.g., the region where the differential voltage between the gate terminal and the source terminal is less than 0) can be measured normally.

[0122] This invention should not be construed as being limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the concept of this disclosure to those skilled in the art.

[0123] Although the invention has been specifically shown and described with reference to embodiments thereof, those skilled in the art will understand that various changes in form and detail may be made without departing from the spirit or scope of the invention as defined by the appended claims.

Claims

1. A method of evaluating a display driving element, the method comprising: controlling a transistor to be turned off, the transistor being connected to a first terminal of a target driving transistor of a test element group provided in a non-display area of a display panel; and measuring a characteristic of the target driving transistor through pads connected to respective terminals of the target driving transistor.

2. The method of claim 1, wherein, the test element group has a structure identical to that of a pixel driving circuit provided in a display area of the display panel.

3. The method of claim 1, wherein, a gate terminal of the transistor connected to the first terminal of the target driving transistor is connected to an additional pad, and the controlling the transistor to be turned off includes applying a turn-off voltage through the additional pad connected to the gate terminal of the transistor, wherein the transistor is connected to the first terminal of the target driving transistor.

4. The method of claim 3, wherein, the additional pad is further connected to a gate terminal of one or more transistors connected to a first terminal of each of one or more driving transistors other than the target driving transistor.

5. The method of claim 1, wherein, the measuring the characteristic of the target driving transistor includes: changing a gate voltage of the target driving transistor; and measuring a driving current flowing through the target driving transistor.

6. The method of claim 1, wherein, the first terminal of the target driving transistor includes a source terminal of the target driving transistor; and the source terminal of the target driving transistor is connected to a source terminal of the transistor.

7. The method of claim 1, wherein, the transistor connected to the first terminal of the target driving transistor is turned on by a sensing signal and transmits a signal to initialize a light emitting device.

8. A display panel, comprising: a display area in which a plurality of pixel driving circuits are provided; and a non-display area in which a test element group having a structure identical to that of the plurality of pixel driving circuits is provided, wherein the test element group includes: a driving transistor having terminals connected to pads, respectively; and a first transistor connected to a first terminal of the driving transistor and having a gate terminal connected to an additional pad.

9. The display panel of claim 8, wherein, the first transistor is controlled to be turned off, and a characteristic of the driving transistor is measured through the pads connected to respective terminals of the driving transistor.

10. The display panel of claim 9, wherein, the first transistor is controlled to be turned off by a turn-off voltage applied through the additional pad connected to the gate terminal of the first transistor.

11. The display panel of claim 9, wherein, the characteristic of the driving transistor is measured by changing a gate voltage of the driving transistor and measuring a driving current flowing through the driving transistor.

12. The display panel of claim 8, wherein, the first terminal of the driving transistor includes a source terminal of the driving transistor, and the source terminal of the driving transistor is connected to a source terminal of the first transistor.

13. The display panel of claim 8, wherein, the test element group further includes a second transistor, and a source terminal of the first transistor is connected to a source terminal of the driving transistor, and a source terminal of the second transistor is connected to a gate terminal of the driving transistor.

14. The display panel of claim 13, wherein, the first transistor is turned on by a sensing signal to transmit a signal to initialize a light emitting device, and the second transistor is turned on by a scan signal to transmit a data signal.

15. The display panel of claim 13, wherein, The first transistor is turned on by an integrated scan / sense signal to pass a signal to initialize the light emitting device, and The second transistor is turned on by the integrated scan / sense signal to pass a data signal.

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