Continuous testing device for OLED panel driving IC

Abstract

The invention relates to the technical field of testing devices, in particular to a continuous testing device for an OLED panel driving IC, which comprises a working table, and a testing frame, a driving IC conveying frame and a power supply mechanism which are arranged on the working table, the testing frame comprises a frame body and a plurality of groups of testing plates; a first servo motor is arranged at the bottom of the frame body; the test plate comprises a needle seat and a conductive plate, a plurality of groups of mounting holes are arrayed on the needle seat, and test probes are arranged in the mounting holes; the test probe comprises a supporting part and a power connection part and a probe part at the two ends, the probe part faces the advancing direction of the test plate, and the power connection part is electrically connected with the conductive plate; the driving IC conveying frame comprises a support and a conveying disc, a plurality of sets of containing grooves are formed in the conveying disc in a circumferential array mode, and an open groove is formed between every two adjacent sets of containing grooves. And a second servo motor is arranged on the bracket. According to the invention, the structural design and the cooperative operation mode of the testing frame and the driving IC conveying frame are optimized, the problem of abrasion when the probe is in contact with the driving IC in the existing device is effectively solved, and the continuity, the accuracy and the stability of testing are improved at the same time.

Description

Technical Field

[0001] This application relates to the field of testing equipment technology, and in particular to a continuous testing device for an OLED panel driver IC. Background Technology

[0002] The lighting of an OLED digital display requires the driver IC (i.e., driver chip) to run a driver program. Different models of OLED digital displays have different corresponding driver programs. Therefore, each model of OLED digital display needs to be equipped with a corresponding driver program circuit. In the testing of the driver IC, contact detection is required through probes, and the measured electrical signals are transmitted back to the testing equipment for analysis.

[0003] Chinese patent CN116359717B provides a continuous testing device for OLED panel driver ICs, including a mounting frame with multiple balanced slides fixedly connected to its bottom. The device also includes a support member connected to the inner wall of the balanced slides, used to mount test components and rotate them to a test position. The support member includes a support base slidably connected to the bottom of the multiple balanced slides, and the support base includes a snap-fit ​​portion that is snapped into a sealing portion at the bottom of the snap-fit ​​portion. This application utilizes a magnetic switch, a circuit layer test board, a contact unit, and a conductive ring. Electromagnetization of the magnetic spring allows for circuit connection of the corresponding circuit layer test board. Combined with test probes within a probe holder, the driver IC can be tested. The test probes can also be inserted into the probe holder in reverse, allowing personnel to assemble the appropriate number of probes according to testing needs. Furthermore, the flipped probes achieve a relative seal with the probe holder.

[0004] However, in actual use, although it can continuously detect and replace the driver IC, meet the needs of continuous detection, and has high detection efficiency, when the rotating probe mechanism contacts the driver IC, the probe will scrape the driver IC from the edge and enter the contact detection area of ​​the driver IC, so the probe is prone to wear with the driver IC under test, affecting the subsequent detection quality. Summary of the Invention

[0005] To overcome the problems existing in the prior art, this application provides a continuous testing device for OLED panel driver ICs.

[0006] The continuous testing device for OLED panel driver IC provided in this application adopts the following technical solution: A continuous testing device for OLED panel driver ICs includes a worktable, a test frame, a driver IC transport frame, and a power supply mechanism mounted on the worktable. The power supply mechanism supplies power to the test frame. The test frame is a ring-shaped rotating frame, including a frame body and several sets of test plates arranged circumferentially on the inner wall of the frame. A first servo motor is mounted at the bottom of the frame body to drive it to rotate around its own axis. The test plate includes a pin holder and a conductive plate fixed to the pin holder on the side opposite to the forward direction of the test plate. Several sets of mounting holes are arranged on the pin holder, and test probes are detachably mounted in the mounting holes. The test probes include a support portion in the middle and a portion located on the support portion. The test board has a power receiving section and a probe section at both ends. The probe section faces the forward direction of the test board, and the power receiving section is electrically connected to the conductive plate. The driver IC transport rack is located inside the test rack and rotates horizontally. It includes a support and a transport tray mounted on the support. The transport tray has several sets of placement slots arranged in a circular array for placing the driver IC to be tested. An opening slot for the probe seat to pass through is opened between two adjacent sets of placement slots. A second servo motor that drives the transport tray to rotate is mounted on the support. The area where the driver IC on the transport tray contacts the probe section of the test probe is the test station. The power supply mechanism forms a detachable electrical connection with the conductive plate of the test board at the test station.

[0007] Furthermore, the power supply mechanism includes a mounting plate and connecting rods extending from the mounting plate to both sides of the test frame. Mounting grooves are formed on opposite sides of the connecting rods, and connecting blocks are slidably fitted within these grooves. The connecting blocks are elastically connected to the bottom of the mounting grooves via return springs. Connecting grooves are formed on both sides of the conductive plate, and the connecting blocks are adapted to these grooves to achieve electrical connection between the power supply mechanism and the conductive plate at the test station. Each connecting block includes a conductive block and a support block. A set of conductive blocks and at least one set of support blocks are provided within the mounting groove of a single connecting rod, with the conductive blocks and support blocks spaced apart along the length of the mounting groove. The conductive blocks are electrically connected to the power interface on the mounting plate via wires embedded in the connecting rods. The support blocks are made of insulating material. A control panel is mounted on the outer side of the mounting plate, and the control panel is electrically connected to the power interface for controlling power supply parameters. The radial width of the conductive plate is greater than the radial width of the pin seat and the radial width of the inner wall of the frame. The connecting grooves on both sides of the conductive plate are hemispherical grooves, and the connecting block is a hemispherical structure adapted to the hemispherical groove. The end face of the conductive plate facing the connecting rod and the end face of the connecting rod facing the conductive plate are provided with arc-shaped transition surfaces on both the upper and lower sides to reduce friction when the two rotate relative to each other.

[0008] Furthermore, the outer side of the test frame is provided with a first toothed surface, and the inner side of the frame is provided with two sets of symmetrically distributed second toothed surfaces, with the two sets of second toothed surfaces located at the two axial ends of the inner side of the frame respectively; the first toothed surface meshes with the drive toothed roller on the output shaft of the first servo motor; first driven toothed rollers are symmetrically provided on both sides of the drive toothed roller, and the two ends of the first driven toothed rollers are rotatably mounted on bearing seats fixed to the worktable, and the first driven toothed rollers mesh with the first toothed surface; a second driven toothed roller is provided on the inner side of the frame corresponding to the drive toothed roller, and one end of the second driven toothed roller is rotatably mounted on the bearing seat, and the second driven toothed roller meshes with the second toothed surface; the first driven toothed roller and the second driven toothed roller are horizontally distributed along the radial direction of the frame, used to jointly support and guide the rotation of the frame. The needle holder has a T-shaped structure, and the radial inner end of the needle holder is fixedly connected to the inner wall of the frame between the two sets of second toothed surfaces; the lower half of the needle holder forms clearance spaces on both sides, which are used for the second driven toothed roller to pass through; the needle holder is made of insulating material, and the needle holder is fixedly connected to the conductive plate by insulating bolts or insulating pins.

[0009] Furthermore, the conductive plate has several sets of electrical connection holes that are adapted to the electrical connection parts. The electrical connection parts are inserted into the electrical connection holes to achieve electrical connection. The support part has a conductive path inside, which is used to connect the electrical connection parts and the probe parts at both ends. The outer ring of the support part is wrapped with an insulating layer. The inner diameter of the mounting hole on the probe seat is adapted to the outer diameter of the support part. The inner wall of the mounting hole has an axially extending guide groove. The outer side of the support part is fixed with a guide ring that slides with the guide groove. The end of the guide ring away from the probe part is elastically connected to the side wall of the guide groove near the electrical connection part through a buffer spring to buffer the impact force when the test probe contacts the driver IC.

[0010] Furthermore, the circumferential side of the conveyor plate has several sets of open slots in a circular array, and an arc-shaped transition surface is provided between the opening end of the open slot and the circumferential side of the conveyor plate; the top surface of the conveyor plate has several sets of placement slots, the openings of the placement slots face upwards, and each set of placement slots is located in the top area between two adjacent sets of open slots.

[0011] Furthermore, an elastic protective sleeve is fitted around the probe portion of the test probe. The end of the elastic protective sleeve has a clearance hole that matches the end of the probe portion, and the length of the elastic protective sleeve does not exceed half the length of the probe portion. A position sensor is installed on the bottom surface of the connecting rod, and the position sensor is signal-connected to the control panel. The position sensor is used to detect the position of the driver IC under test in real time and feed back a signal to the control panel. Based on the feedback signal from the position sensor, the control panel controls the start / stop and speed of the second servo motor, ensuring that the driver IC under test is precisely positioned at the test station.

[0012] In summary, this application includes at least one of the following beneficial technical effects: 1. This application enables the probe part of the test probe to face the direction of the test board's movement, and with the synchronous rotation of the test frame and the conveyor tray, the probe part can achieve accurate positive contact with the driver IC, avoiding wear caused by edge scratches and ensuring the quality of subsequent testing; 2. The test probes in this application are detachable and can be buffered by the guide groove and buffer spring to absorb the contact impact force. The elastic protective sleeve further reduces contact damage. At the same time, the number of probes can be flexibly adjusted according to the test requirements to adapt to the test of different models of driver ICs. 3. In this application, the power supply mechanism achieves precise positioning and stable power supply at the test station by adapting the connecting block and the conductive plate, combined with the coordinated control of the position sensor and dual servo motors. The structural design of the ring test frame and the inner conveyor frame ensures a continuous testing process and greatly improves the testing efficiency. 4. In this application, the test frame is supported and guided by multiple sets of toothed rollers, the arc transition surface between the conductive plate and the connecting rod reduces relative rotational friction, and the insulation design of the needle seat and the conductive plate and the optimization of the power connection structure further improve the stability and safety of the device operation, thus meeting the requirements of efficient, accurate and low-damage continuous testing of OLED panel driver ICs. Attached Figure Description

[0013] Figure 1 This is a schematic diagram of the overall structure of a continuous testing device for OLED panel driver ICs; Figure 2 This is a schematic diagram of the back structure of a continuous testing device for OLED panel driver ICs; Figure 3 This is a cross-sectional view of a test board and a portion of the test board within a continuous testing device for OLED panel driver ICs. Figure 4 This is an exploded view of a portion of the connecting rod structure in a continuous testing device for an OLED panel driver IC.

[0014] Explanation of reference numerals in the attached drawings: 1. Workbench; 2. Test frame; 21. Frame body; 22. Test plate; 221. Pin holder; 2211. Mounting hole; 2212. Guide groove; 2213. Guide ring; 2214. Buffer spring; 222. Conductive plate; 2221. Connecting groove; 2222. Power connection hole; 23. First servo motor; 231. Drive toothed roller; 24. Test probe; 241. Support part; 242. Power connection part; 243. Probe part; 25. First toothed surface; 26. Second toothed surface; 27. 28. First driven toothed roller; 29. ​​Second driven toothed roller; 30. Bearing housing; 31. Drive IC conveyor frame; 32. Support; 33. Second servo motor; 34. Conveyor tray; 35. Placement slot; 36. Opening slot; 47. Power supply mechanism; 48. Mounting plate; 49. Power interface; 40. Control panel; 41. Connecting rod; 42. Mounting slot; 42. Connecting block; 42. Conductive block; 42. Support block; 42. Return spring; 42. Position sensor; 5. Test station. Detailed Implementation

[0015] The following is in conjunction with the appendix Figure 1-4 This application will be described in further detail.

[0016] This application discloses a continuous testing device for OLED panel driver ICs.

[0017] Reference Figures 1 to 4A continuous testing device for OLED panel driver ICs includes a worktable 1, a test frame 2, a driver IC transport frame 3, and a power supply mechanism 4 mounted on the worktable 1. The power supply mechanism 4 supplies power to the test frame 2. The test frame 2 is a ring-shaped rotating frame, including a frame body 21 and several sets of test plates 22 arranged circumferentially on the inner wall of the frame body 21. A first servo motor 23 is mounted at the bottom of the frame body 21 to drive it to rotate around its own axis. The test plate 22 includes a pin holder 221 and a conductive plate 222 fixed to the side of the pin holder 221 away from the forward direction of the test plate 22. Several sets of mounting holes 2211 are arranged on the pin holder 221, and test probes 24 are detachably mounted in the mounting holes 2211. The test probes 24 include a support part 241 in the middle and two probes located at both ends of the support part 241. The test board 22 has a power receiving part 242 and a probe part 243. The probe part 243 faces the forward direction of the test board 22, and the power receiving part 242 is electrically connected to the conductive plate 222. The drive IC conveying frame 3 is located inside the test frame 2 and rotates horizontally. It includes a support 31 and a conveying disk 32 mounted on the support 31. The conveying disk 32 has a circumferential array of several sets of placement slots 321 for placing the drive IC to be tested. An opening slot 322 for the needle seat 221 to pass through is opened between two adjacent sets of placement slots 321. The support 31 is equipped with a second servo motor 311 that drives the conveying disk 32 to rotate. The area where the drive IC on the conveying disk 32 contacts the probe part 243 of the test probe 24 is the test station 5. The power supply mechanism 4 forms a detachable electrical connection with the conductive plate 222 of the test board 22 at the test station 5. Before testing, select the corresponding number of test probes 24 according to the model of the driver IC to be tested. After electrically connecting the power connection part 242 of the probes 244 to the conductive plate 222, they can be detachably assembled into the mounting holes 2211 of the probe holder 221, ensuring that the probe part 243 faces the forward direction of the test board 22. After the driver IC to be tested is placed in the placement slot 321 of the conveyor tray 32, the first servo motor 23 drives the ring test frame 2 to rotate around its own axis, and the second servo motor 311 synchronously drives the inner conveyor tray 32 to rotate horizontally. When the driver IC on the conveyor tray 32 reaches the test station 5 with the rotation, At that time, the corresponding test board 22 on the test rack 2 rotates synchronously to the position, and the needle seat 221 can pass through the opening slot 322 of the conveyor plate 32 to achieve rotation without interference between the two. Then, the test board 22 is driven to continue rotating, and the probe part 243 of the test probe 24 contacts the driver IC. At the same time, the power supply mechanism 4 forms a detachable electrical connection with the conductive plate 222 of the test board 22 to realize power supply and transmit the detection electrical signal back through the probe part 243. After completing a single set of tests, the test rack 2 and the conveyor plate 32 continue to rotate synchronously to enter the next set of continuous tests of the driver IC.

[0018] Reference Figures 1 to 4The power supply mechanism 4 includes a mounting plate 41 and connecting rods 42 extending from the mounting plate 41 to both sides of the test frame 2. The connecting rods 42 have mounting grooves 421 on opposite sides. A connecting block 422 is slidably fitted in the mounting groove 421. The connecting block 422 is elastically connected to the bottom of the mounting groove 421 by a return spring 423. The conductive plate 222 has connecting grooves 2221 on both sides. The connecting block 422 is adapted to the connecting groove 2221 to realize the electrical connection between the power supply mechanism 4 and the conductive plate 222 at the test station 5. The connecting block 422 includes a conductive block 4221 and a support block 4222. A set of conductive blocks 4221 and at least one set of support blocks 4222 are provided in the mounting groove 421 of a single connecting rod 42. The conductive blocks 4221 and the support blocks 4222 are distributed at intervals along the length of the mounting groove 421. The conductive blocks 4221 are electrically connected to the power interface 411 on the mounting plate 41 through the wires built into the connecting rod 42. The support blocks 4222 are made of insulating material. A control panel 412 is mounted on the outside of the mounting plate 41. The control panel 412 is electrically connected to the power interface 411 and is used to control the power supply parameters. The radial width of the conductive plate 222 is greater than the radial width of the pin seat 221 and the radial width of the inner wall of the frame 21. The connecting grooves 2221 on both sides of the conductive plate 222 are hemispherical grooves, and the connecting block 422 is a hemispherical structure adapted to the hemispherical groove. The end face of the conductive plate 222 facing the connecting rod 42 and the end face of the connecting rod 42 facing the conductive plate 222 are provided with arc-shaped transition surfaces on both the upper and lower sides to reduce friction when the two rotate relative to each other. The power supply mechanism 4 is set to the test frame 2 via connecting rods 42 on both sides of the mounting plate 41. The conductive block 4221 and the support block 4222 in the mounting groove 421 of the connecting rod 42 are kept in an elastic extension state by the return spring 423. When the test plate 22 rotates with the test frame 2 to the test station 5, the hemispherical connecting grooves 2221 on both sides of the conductive plate 222 are precisely matched with the hemispherical structure of the connecting block 422. The connecting block 422 is inserted into the connecting groove 2221 under the action of the return spring 423. The conductive block 4221 is connected to the power interface 411 through the built-in wire, realizing a stable electrical connection between the power supply mechanism 4 and the conductive plate 222. The support block 4222 plays an auxiliary support and positioning role. The arc transition surface of the conductive plate 222 and the end face of the connecting rod 42 reduces the friction during relative rotation. The control panel 412 can adjust the power supply parameters of the power interface 411 in real time to adapt to different test requirements.

[0019] Reference Figures 1 to 4The test frame 2 has a first toothed surface 25 on the outer side of the frame 21 and two sets of symmetrically distributed second toothed surfaces 26 on the inner side of the frame 21, with the two sets of second toothed surfaces 26 located at the two axial ends of the inner side of the frame 21 respectively. The first toothed surface 25 meshes with the drive toothed roller 231 on the output shaft of the first servo motor 23. The drive toothed roller 231 has first driven toothed rollers 27 symmetrically arranged on both sides. The two ends of the first driven toothed rollers 27 are rotatably mounted on the bearing seats 29 fixed to the workbench 1, and the first driven toothed rollers 27 mesh with the first toothed surface 25. The drive toothed roller 231 has a second driven toothed roller 28 on the inner side of the frame 21. One end of the second driven toothed roller 28 is rotatably mounted on the bearing seat 29, and the second driven toothed roller 28 meshes with the second toothed surface 26. The first driven toothed rollers 27 and the second driven toothed rollers 28 are horizontally distributed along the radial direction of the frame 21 to jointly support and guide the rotation of the frame 21. The needle holder 221 has a T-shaped structure. The radial inner end of the needle holder 221 is fixedly connected to the inner wall of the frame 21 between the two sets of second tooth surfaces 26. The lower half of the needle holder 221 forms clearance spaces on both sides, which are used for the second driven toothed roller 28 to pass through. The needle holder 221 is made of insulating material, and the needle holder 221 is fixedly connected to the conductive plate 222 by insulating bolts or insulating pins. After the first servo motor 23 starts, the drive toothed roller 231 on the output shaft meshes with the first tooth surface 25 on the outer side of the frame 21, driving the test frame 2 to rotate. The first driven toothed rollers 27 on both sides of the drive toothed roller 231 mesh with the first tooth surface 25 on the outer side of the frame 21, and the second driven toothed roller 28 on the inner side meshes with the second tooth surface 26 on the inner side of the frame 21. The two sets of toothed rollers are distributed horizontally in the radial direction, providing support and rotation guidance for the frame 21. The T-shaped needle holder 221 is fixed between the two sets of second tooth surfaces 26 on the inner side of the frame 21. The clearance space in its lower half allows the second driven toothed roller 28 to pass through smoothly, avoiding rotational interference. The needle holder 221 is made of insulating material and is fixed to the conductive plate 222 by insulating bolts or pins to ensure electrical insulation during the test.

[0020] Reference Figures 1 to 4The conductive plate 222 has several sets of electrical connection holes 2222 that are adapted to the electrical connection part 242. The electrical connection part 242 is inserted into the electrical connection hole 2222 to achieve electrical connection. The support part 241 has a conductive passage inside, which is used to connect the electrical connection part 242 and the probe part 243 at both ends. The outer ring of the support part 241 is wrapped with an insulating layer. The inner diameter of the mounting hole 2211 on the pin seat 221 is adapted to the outer diameter of the support part 241. The inner wall of the mounting hole 2211 is provided with an axially extending guide groove 2212. The outer side of the support part 241 is fixed with a guide ring 2213 that slides with the guide groove 2212. The end of the guide ring 2213 away from the probe part 243 is elastically connected to the side wall of the guide groove 2212 near the electrical connection part 242 through a buffer spring 2214 to buffer the impact force when the test probe 24 contacts the driver IC. The power receiving part 242 of the test probe 24 is inserted into the corresponding power receiving hole 2222 of the conductive plate 222. The power receiving part 242 and the probe part 243 are connected by the conductive path inside the support part 241. The insulating layer on the outer ring of the support part 241 prevents short circuits. When the probe is assembled into the mounting hole 2211 of the probe seat 221, the guide ring 2213 detachably connected to the outside of the support part 241 slides and engages with the guide groove 2212 on the inner wall of the mounting hole 2211 to form precise guidance. When the probe part 243 contacts the driver IC, the guide ring 2213 compresses the buffer spring 2214. The elastic deformation of the spring buffers the contact impact force, reduces contact damage between the probe and the driver IC, and ensures the stability of the test.

[0021] Reference Figures 1 to 4 The conveyor tray 32 has several sets of opening slots 322 arranged in a circular array on its circumferential side. An arc-shaped transition surface is provided between the opening end of the opening slot 322 and the circumferential side of the conveyor tray 32. Several sets of placement slots 321 are opened on the top surface of the conveyor tray 32. The openings of the placement slots 321 face upwards, and each set of placement slots 321 is located in the top area between two adjacent sets of opening slots 322. The conveyor tray 32 carries the driver IC to be tested through the placement slots 321. The placement slots 321 are located in the top area between adjacent opening slots 322. The opening slots 322 provide a clearance passage for the test fixture 2, ensuring that the test fixture 2 passes smoothly and contacts the driver IC. The arc-shaped transition surface at the opening end of the opening slot 322 reduces friction and interference when the pin holder 221 passes through. When the conveyor tray 32 rotates with the second servo motor 311, it can smoothly transport the driver IC to the test station 5. Simultaneously, in coordination with the rotation rhythm of the test fixture 2, a continuous and orderly testing process is achieved.

[0022] Reference Figures 1 to 4The probe portion 243 of the test probe 24 is fitted with an elastic protective sleeve. The end of the elastic protective sleeve has a clearance hole that matches the end of the probe portion 243, and the length of the elastic protective sleeve does not exceed half the length of the probe portion 243. A position sensor 424 is provided on the bottom surface of the connecting rod 42. The position sensor 424 is connected to the control panel 412. The position sensor 424 is used to detect the position of the driver IC under test in real time and feed back the signal to the control panel 412. The control panel 412 controls the start, stop and speed of the second servo motor 311 according to the feedback signal of the position sensor 424, so that the driver IC under test is accurately stopped at the test station 5. An elastic protective sleeve is fitted over the probe part 243 of the test probe 24. The clearance hole at the end of the protective sleeve does not affect the contact between the probe part 243 and the driver IC, and can reduce wear during contact. The length of the protective sleeve does not exceed half of the probe part 243 to avoid obstructing the detection area. The position sensor 424 on the bottom surface of the connecting rod 42 detects the position of the driver IC on the conveyor plate 32 in real time and feeds the signal back to the control panel 412. The control panel 412 accurately controls the start, stop and speed of the second servo motor 311 according to the feedback signal to ensure that the driver IC under test is accurately stopped at the test station 5 and to ensure the precise docking of the test probe 24 and the driver IC.

[0023] Working principle: During operation, firstly, according to the model of the driver IC to be tested, the corresponding number of test probes 24 are inserted into the power connection holes 2222 of the conductive plate 222 through the power connection part 242 to achieve electrical connection. At the same time, the support part 241 of the test probe 24 is assembled into the mounting hole 2211 of the probe seat 221. The guide ring 2213 slides with the guide groove 2212 and the buffer spring 2214 naturally extends and retracts. Then, the driver IC to be tested is placed one by one into the placement slot 321 of the conveyor tray 32. The power supply parameters are set through the control panel 412. After the device is started, the first servo motor 23 drives the test frame 2 to rotate through the meshing of the drive toothed roller 231 and the first tooth surface 25. The first driven toothed roller 27 and the second driven toothed roller 28 cooperate to support and guide the frame 21. The second servo motor 311 drives the conveyor tray 32 to rotate synchronously. The position sensor 424 detects the position of the driver IC in real time and feeds it back to the control panel 412. The control panel 412 controls the second servo motor 311. The rotation speed is precisely adjusted so that the driver IC to be tested stops at test station 5. At this time, the test board 22 on the test rack 2 rotates with the rack 21 to test station 5. The pin seat 221 passes through the opening slot 322 of the conveyor tray 32. The probe part 243 of the test probe 24 faces forward and makes positive contact with the driver IC. The elastic protective sleeve reduces contact damage, and the buffer spring 2214 buffers the contact impact force. At the same time, the connecting block 422 of the power supply mechanism 4 is locked into the connecting slot 2221 of the conductive plate 222 under the action of the reset spring 423. The conductive block 4221 realizes the electrical connection between the power supply mechanism 4 and the conductive plate 222. The power is transmitted to the driver IC through the conductive path of the conductive plate 222 and the test probe 24. The probe part 243 transmits the detection electrical signal back. After the test is completed, the test rack 2 and the conveyor tray 32 continue to rotate synchronously. The tested driver IC rotates out of test station 5 with the conveyor tray 32. The next set of driver ICs to be tested and the test board 22 enter test station 5 in sequence to realize continuous cyclic testing.

[0024] The above are all preferred embodiments of this application and are not intended to limit the scope of protection of this application. Therefore, all equivalent changes made in accordance with the structure, shape and principle of this application should be covered within the scope of protection of this application.

Claims

1. A continuous test apparatus of an OLED panel driving IC, characterized by: The utility model provides a kind of IC drive test device, including workbench (1), and test frame (2) installed on the workbench (1), drive IC conveying frame (3) and power supply mechanism (4);The power supply mechanism (4) is used to power the test frame (2); The test frame (2) is annular rotating frame, including frame body (21) and several groups of test plate (22) perimetrically arrayed on the inner wall of the frame body (21), the frame body (21) bottom is equipped with first servo motor (23) driving it rotates around its axis;The test plate (22) includes needle seat (221) and conductive plate (222) fixed to the side of needle seat (221) away from the direction of test plate (22) advancement, the needle seat (221) is arrayed with several groups of mounting hole (2211), and test probe (24) can be detachably assembled in the mounting hole (2211);The test probe (24) includes middle support part (241), and electrical connection part (242) and probe part (243) located at both ends of the support part (241) respectively, the probe part (243) is towards the direction of test plate (22) advancement, and the electrical connection part (242) is electrically connected with the conductive plate (222); The drive IC conveying frame (3) is located at the inside of the test frame (2) and rotates horizontally, including support (31) and conveying disc (32) installed on the support (31), the conveying disc (32) is perimetrically arrayed with several groups of placement slot (321) for placing the drive IC to be tested, and opening slot (322) is opened between two adjacent groups of the placement slot (321) for the needle seat (221) to pass through;The support (31) is equipped with second servo motor (311) driving the conveying disc (32) to rotate; The area where the drive IC on the conveying disc (32) contacts with the probe part (243) of the test probe (24) is test station (5), and the power supply mechanism (4) forms detachable electrical connection with the conductive plate (222) of the test plate (22) at the test station (5).

2. The continuous testing device for an OLED panel driver IC according to claim 1, characterized in that: The power supply mechanism (4) includes mounting plate (41) and connecting rod (42) extended to both sides of the test frame (2) by the mounting plate (41), mounting slot (421) is opened on the opposite side of the connecting rod (42), connecting block (422) is slidably assembled in the mounting slot (421), and the connecting block (422) is elastically connected with the groove bottom of the mounting slot (421) through return spring (423);Connecting slot (2221) is opened on both sides of the conductive plate (222), the connecting block (422) is matched with the connecting slot (2221), for realizing the electrical connection between the power supply mechanism (4) and the conductive plate (222) at the test station (5).

3. The continuous testing device of the OLED panel driving IC according to claim 2, characterized in that: The connecting block (422) comprises conductive blocks (4221) and supporting blocks (4222), a group of the conductive blocks (4221) and at least a group of the supporting blocks (4222) are arranged in the mounting groove (421) of the single connecting rod (42), the conductive blocks (4221) and the supporting blocks (4222) are distributed along the length direction of the mounting groove (421); the conductive blocks (4221) are electrically connected with the power supply interface (411) on the mounting plate (41) through wires arranged in the connecting rod (42), the supporting blocks (4222) are made of insulating material; the outer side of the mounting plate (41) is provided with a control panel (412), the control panel (412) is electrically connected with the power supply interface (411) and is used for controlling power supply parameters.

4. The continuous test apparatus of the OLED panel driving IC according to claim 3, characterized in that: The radial width of the conductive plate (222) is greater than the radial width of the needle seat (221) and the radial width of the inner wall of the frame body (21), the connecting grooves (2221) on both sides of the conductive plate (222) are semispherical groove bodies, and the connecting block (422) is a semispherical structure matched with the semispherical groove bodies; the end face of the conductive plate (222) facing the connecting rod (42) and the end face of the connecting rod (42) facing the conductive plate (222) are provided with arc transition surfaces on the upper and lower sides, so as to reduce friction when the two relatively rotate.

5. The continuous testing device of the OLED panel driving IC according to claim 1, characterized in that: The frame body (21) of the test frame (2) is provided with a first tooth surface (25) on the outer side, and the inner side of the frame body (21) is provided with two groups of symmetrically distributed second tooth surfaces (26), wherein the two groups of second tooth surfaces (26) are respectively located at the axial two ends of the inner side of the frame body (21); the first tooth surface (25) is engaged with a driving tooth roller (231) on the output shaft of the first servo motor (23); first driven tooth rollers (27) are symmetrically arranged on both sides of the driving tooth roller (231), and both ends of the first driven tooth roller (27) are rotatably installed on a bearing seat (29) fixed to the workbench (1), and the first driven tooth roller (27) is engaged with the first tooth surface (25); The inner side of the frame body (21) corresponding to the driving tooth roller (231) is provided with a second driven tooth roller (28), one end of the second driven tooth roller (28) is rotatably installed on the bearing seat (29), and the second driven tooth roller (28) is engaged with the second tooth surface (26); the first driven tooth roller (27) and the second driven tooth roller (28) are horizontally distributed along the radial direction of the frame body (21) and are used for jointly supporting and guiding the rotation of the frame body (21).

6. The continuous test apparatus of the OLED panel driving IC according to claim 5, wherein: The needle seat (221) is a T-shaped structure, and the radial inner side of the needle seat (221) is fixedly connected to the inner wall of the frame body (21) between the two groups of second tooth surfaces (26); the lower half of the needle seat (221) forms an avoiding space on both sides, and the avoiding space is used for the second driven tooth roller (28) to pass through; the needle seat (221) is made of insulating material, and the needle seat (221) and the conductive plate (222) are fixedly connected through insulating bolts or insulating pins.

7. The continuous testing device of the OLED panel driving IC according to claim 1, characterized in that: A plurality of groups of electrically-conductive holes (2222) are arranged on the electrically-conductive plate (222) and are adapted to the electrically-conductive portions (242); the electrically-conductive portions (242) are inserted into the electrically-conductive holes (2222) to achieve electrical connection; an electrically-conductive path is arranged inside the support portion (241) and is used to connect the electrically-conductive portions (242) and the probe portion (243) at two ends; an insulating layer is arranged on the outer periphery of the support portion (241). The inner diameter of the mounting hole (2211) on the needle seat (221) is adapted to the outer diameter of the support portion (241); an axially-extending guide groove (2212) is arranged on the inner wall of the mounting hole (2211); a guide ring (2213) is fixed to the outer side of the support portion (241) and is in sliding fit with the guide groove (2212); one end of the guide ring (2213) that is away from the probe portion (243) is elastically connected to the side wall of the guide groove (2212) that is close to the electrically-conductive portion (242) through a buffer spring (2214) to buffer the impact force when the test probe (24) contacts the driving IC.

8. The continuous test apparatus of the OLED panel driving IC according to claim 1, wherein: A plurality of groups of the open grooves (322) are arranged in a circumferential direction on the circumferential side of the conveying disc (32) and are arranged in a circumferential direction; an arc-shaped transition surface is arranged between the open end of the open groove (322) and the circumferential side of the conveying disc (32); a plurality of groups of the placement grooves (321) are arranged on the top surface of the conveying disc (32); the opening of the placement groove (321) faces upwards; and each group of the placement grooves (321) is located at the top region between two adjacent groups of the open grooves (322).

9. The continuous testing device of the OLED panel driving IC according to claim 1, characterized in that: An elastic protective sleeve is arranged on the outer side of the probe portion (243) of the test probe (24); an avoiding hole is arranged on the end of the elastic protective sleeve and is adapted to the end of the probe portion (243); and the length of the elastic protective sleeve is not more than one half of the length of the probe portion (243).

10. The continuous test apparatus of the OLED panel driving IC according to claim 3, wherein: A position sensor (424) is arranged on the bottom surface of the connecting rod (42) and is in signal connection with a control panel (412); the position sensor (424) is used to detect the position of the driving IC to be tested in real time and feed back a signal to the control panel (412); the control panel (412) controls the start-stop and rotating speed of the second servo motor (311) according to the feedback signal of the position sensor (424) to make the driving IC to be tested accurately stay at the test station (5).

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