An automated calibration system and method for optical modules

Abstract

This invention relates to an automated calibration system and method for optical modules, belonging to the field of optical communication technology. The system includes: a control unit, communicatively connected to a test signal generation unit, an optical connection unit, and a test signal processing unit; the optical connection unit includes an optical path selector and a beam splitter connected via optical signals; the test signal generation unit includes a bit error rate analyzer and a pluggable optical module under test connected in sequence; the test signal processing unit acquires optical test signals and processes the data to obtain optical test data; the control unit determines whether the test light meets the requirements based on the optical test data. If it does, the calibration ends; if it does not, the TAP parameters of the optical module are modified and re-sent to the optical module until the optical test data meets the requirements or the maximum number of iterations is reached, at which point the calibration exits. This invention can achieve high-precision and high-efficiency TDECQ calibration, and is particularly suitable for mass production scenarios, reducing labor costs and improving the overall quality stability of optical modules.

Description

Technical Field

[0001] This invention belongs to the field of optical communication technology. Specifically, this invention relates to an automated calibration method, system, and storage medium for optical modules. Background Technology

[0002] In optical communication systems, TDECQ (Transmitter and dispersion eye closure for PAM4) is one of the key indicators for evaluating the performance of optical module transmitters, and its accuracy directly affects the communication quality and transmission stability of optical modules.

[0003] Currently, the TDECQ calibration of optical modules is mainly performed manually. Operators need to connect dedicated testing equipment, manually adjust various parameters of the optical module, and repeatedly collect test data for analysis and calculation to ultimately complete the TDECQ calibration. However, this manual calibration method has several drawbacks:

[0004] On the one hand, manual operation relies on the experience and skills of the operators. Different operators have different operating habits and judgment standards, which can easily lead to poor consistency of calibration results and make it difficult to guarantee accuracy.

[0005] On the other hand, the manual calibration process is cumbersome and requires a lot of time and manpower, especially in the scenario of mass production of optical modules, which seriously affects production efficiency and cannot meet the needs of large-scale industrial production.

[0006] Therefore, there is an urgent need for a technical solution that can automatically calibrate optical modules using TDECQ, in order to improve calibration accuracy and efficiency, reduce labor costs, and meet the requirements of industrial production. Summary of the Invention

[0007] To address the problems of low accuracy, low efficiency, and high cost in the existing manual operation process of TDECQ debugging and calibration of optical modules, this invention proposes an automated solution that achieves high-precision and high-efficiency TDECQ debugging and calibration by integrating a control unit, a data processing module, and algorithm optimization.

[0008] A first aspect of the present invention provides an automated calibration system for optical modules, comprising:

[0009] The control unit establishes a stable communication connection with the test signal generation unit, the optical connection unit, and the test signal processing unit.

[0010] The optical connection unit is used to receive optical test signals from the test signal generation unit and output optical test signals to the test signal processing unit. The optical connection unit includes an optical path selector and a beam splitter connected by optical signals. The optical path selector realizes the selection of the channel under test. The beam splitter is used for beam splitting processing of the test signal for clock recovery and testing.

[0011] The test signal generation unit includes a bit error rate tester and a pluggable optical module under test connected in sequence; the bit error rate tester is connected to the pluggable optical module under test and is used to output electrical data test signals to the pluggable optical module under test; the pluggable optical module under test is communicatively connected to the control unit and connected to the optical path selector through an optical signal, and is used to generate and output optical test signals.

[0012] The test signal processing unit is used to acquire optical test signals and process the data to obtain optical test data, and output the optical test data to the control unit; the optical test data includes optical power OMA, extinction ratio ER and TDECQ value;

[0013] The clock restorer (CDR) receives the optical test signal from the beam splitter and recovers the reference clock signal, which is then output to the test signal processing unit to trigger the test signal processing unit to acquire and measure the optical test signal.

[0014] The control unit controls the test signal generation unit to generate a preset reference test signal; the pluggable optical module under test converts the reference test signal into a corresponding optical test signal, which is then output to the test signal processing unit via the optical connection unit; the test signal processing unit collects the optical test signal and processes the data to obtain optical test data, which is then output to the control unit.

[0015] The control unit determines whether the test light meets the requirements based on the optical test data. If it does, the test is terminated. If it does not, the TAP parameters of the optical module are modified and reissued to the pluggable optical module under test. The test is terminated when the optical test data meets the requirements or the maximum number of iterations is reached.

[0016] Furthermore, the control unit includes a communication control module, a data acquisition module, a data processing module, and a database unit;

[0017] The communication control module is used to establish communication connections with other units; the data acquisition module is used to acquire test data from the test signal processing unit; the data processing module is used to process data and store / read data to the database unit; the database unit includes device datasets, empirical datasets, and historical datasets.

[0018] The control unit saves the optical test data to the historical dataset and saves the current configuration data and basic information of the optical module to the experience dataset.

[0019] Furthermore, the control unit retrieves experience configuration data from the experience dataset and sends it to the test signal generation unit and the test signal processing unit to initialize them, including: setting the test signal type, rate, and encoding method of the bit error rate tester; setting the signal type, encoding method, and division ratio of the clock recovery unit (CDR); setting the test channel of the optical path selector; and setting the sampling frequency, sampling duration, and data storage format of the test signal processing unit.

[0020] Furthermore, the control unit establishes a communication connection with the pluggable optical module under test through the communication control module to obtain the basic information of the optical module under test; based on the basic information of the optical module, it retrieves empirical configuration data from the device dataset and empirical dataset and sends it to the test signal generation unit and the test signal processing unit to initialize them; the basic information of the optical module includes model, specifications and TAP parameters.

[0021] Furthermore, there are Gd optical splitters; each optical splitter has two optical output signals, one of which is connected to the test signal processing unit, and the other of which is connected to the clock recovery unit (CDR).

[0022] Furthermore, the optical path selector is connected to the Gd optical splitters, and the pluggable optical module under test outputs Gb optical fibers to the optical path selector. The control unit controls the selection of optical fibers for testing.

[0023] A second aspect of the present invention provides an automated optical module calibration method, applied to an automated optical module calibration system described in the first aspect of the present invention, comprising the following steps:

[0024] S1, Set the pluggable optical module under test to debug state, and extract the basic information, adjustment range and step parameters of the optical module;

[0025] S2, Extract the initial TAP parameters of the optical module;

[0026] S3, the test signal processing unit acquires the optical test signal and obtains the compensated TAP parameters;

[0027] S4. Perform convolution operation on the initial TAP parameters and the compensated TAP parameters, and round the result to obtain the first TAP parameters. Then, normalize the first TAP parameters according to the hardware characteristics of the optical module. Multiply by the adjustment coefficient Q to make each element of the TAP parameters conform to the hardware characteristics of the optical module, and obtain the second TAP parameters.

[0028] S5, send parameter adjustment instructions to the pluggable optical module under test, and send the second TAP parameters to the pluggable optical module under test; control the test signal generation unit to keep the reference test signal unchanged, and the test signal processing unit to collect the optical test signal;

[0029] S6, the test signal processing unit processes the acquired optical test signal to obtain the optical power OMA, extinction ratio ER and TDECQ value;

[0030] S7, perform iterative calculation based on the maximum number of iterations Pe: extract the current TDECQ value and compare it with the preset TDECQ target threshold W; if the current TDECQ value ≤ the preset TDECQ target threshold W, proceed to the next step; if the current TDECQ value > the preset TDECQ target threshold W, return to step S2 and execute other steps sequentially until the TDECQ value ≤ the preset TDECQ target threshold, then proceed to the next step; if the number of iterations reaches the maximum number of iterations Pe, stop, set the debugging failure flag and exit debugging;

[0031] S8, the data processing module receives and records the optical power OMA, extinction ratio ER, TDECQ value and the current optical module TAP parameter;

[0032] S9, then repeat steps S2 to S8 Ng times to obtain multiple sets of parameter combinations that satisfy ≤ preset TDECQ target threshold W;

[0033] S10, compare the performance indicators corresponding to each parameter combination, including optical power OMA, extinction ratio ER and TDECQ value, and select the parameter combination with the best overall performance as the optimal calibration parameter Ang of the optical module; write the parameters belonging to the optical module in the optimal calibration parameter Ang into the storage unit of the pluggable optical module under test through the communication control module; the test signal processing unit collects the test optical signal output by the pluggable optical module under test under the optimal calibration parameter Ang, and obtains the optical power OMA, extinction ratio ER and TDECQ value;

[0034] S11, extract the extinction ratio ER value at this time. If the extinction ratio ER meets the requirements, set the debugging success flag. If the extinction ratio ER does not meet the requirements, perform Da optical module parameter adjustments. The adjusted optical module parameters include Ibias and Imode parameters until the extinction ratio ER meets the requirements. If the extinction ratio ER still does not meet the requirements after Da optical module parameter adjustments, set the debugging failure flag and exit debugging.

[0035] S12, when the debugging success flag is obtained, the final optimal calibration parameter Ang is saved to the empirical dataset and then fixed into the storage unit of the pluggable optical module through the communication control module, thus completing the calibration of the pluggable optical module under test.

[0036] Furthermore, the optical module parameters adjusted during optical module parameter adjustment include the Ibias and Imode parameters;

[0037] The values ​​of Pe, Ng, and Da range from 5 to 10;

[0038] The TDECQ target threshold W is extracted from an empirical dataset, where W is either a TDECQ value that meets the requirements of the communication standard or the optimal TDECQ value under a specific application scenario.

[0039] The selection of the optimal parameter combination with the best overall performance as the optimal calibration parameter Ang of the optical module includes: screening the optimal parameter combination of bias current Ibias, modulation current Imod, optical power OMA, extinction ratio ER and TDECQ value.

[0040] Furthermore, the optical module parameter adjustment is carried out by sending parameter adjustment commands to the pluggable optical module under test according to the set adjustment sequence and step size, and gradually adjusting the various parameters of the optical module; after each parameter adjustment, the control test signal generation unit keeps the reference test signal unchanged, and the test signal processing unit collects the optical test signal.

[0041] Extinction ratio ER = 10 × log10(P1 / P0), where P1 and P0 represent the optical power at logic "1" and logic "0" respectively;

[0042] The requirement is met when the extinction ratio ER meets the internal control parameters of the equipment.

[0043] In a third aspect, the present invention provides a processor-readable storage medium storing a computer program, wherein when the processor executes the computer program, it implements the automatic calibration method for optical modules described in the second aspect of the present invention.

[0044] The advantages of this invention compared to the prior art are:

[0045] This invention enables high-precision TDECQ calibration. Through automated parameter adjustment and data acquisition, it eliminates subjective errors from manual operation. A preset algorithm accurately extracts key optical signal parameters, ensuring the consistency and accuracy of calibration results. It achieves highly efficient calibration and adjustment, requiring no manual intervention throughout the entire process, significantly shortening calibration time. This is particularly suitable for mass production scenarios, significantly improving optical module production efficiency and reducing labor costs. It possesses strong versatility and compatibility, supporting flexible initialization configuration and adapting to different models and specifications of optical modules. Only basic test parameters and algorithm parameters need to be adjusted to achieve automatic calibration of various optical modules. It provides high reliability assurance. Verification steps are set after calibration to ensure results meet preset thresholds, preventing unqualified products from affecting communication reliability. A dual verification mechanism enhances the overall quality stability of the optical modules.

[0046] This technology can be widely used in fields such as optical module manufacturing and communication equipment testing. It is especially suitable for the mass production of high-speed optical modules (such as 400G / 800G), providing core technical support for achieving high-precision, low-cost optical communication systems. Attached Figure Description

[0047] Figure 1 This is a schematic diagram of an automated calibration system for optical modules provided in an embodiment of the present invention.

[0048] Figure 2 This is a schematic diagram of an automated calibration method for optical modules provided in an embodiment of the present invention. Detailed Implementation

[0049] The technical solutions of the embodiments of this application will be clearly described below with reference to the accompanying drawings. Obviously, the described embodiments are only some, not all, of the embodiments of this application. All other embodiments obtained by those skilled in the art based on the embodiments of this application are within the scope of protection of this application.

[0050] The terms "first," "second," etc., used in the specification and claims of this application are used to distinguish similar objects and not to describe a specific order or sequence. It should be understood that such use of data can be interchanged where appropriate so that embodiments of this application can be implemented in orders other than those illustrated or described herein, and the objects distinguished by "first," "second," etc., are generally of the same class and the number of objects is not limited; for example, a first object can be one or more. Furthermore, in the specification and claims, "and / or" indicates at least one of the connected objects, and the character " / " generally indicates that the preceding and following objects are in an "or" relationship.

[0051] This invention achieves high-precision and high-efficiency TDECQ debugging and calibration by integrating a control unit, a data processing module, and optimizing algorithms. A first aspect of this invention provides an automated calibration system for optical modules, the structural diagram of which is attached. Figure 1 As shown, it includes:

[0052] The control unit establishes a stable communication connection with the test signal generation unit, the optical connection unit, and the test signal processing unit.

[0053] The optical connection unit is used to receive optical test signals from the test signal generation unit and output optical test signals to the test signal processing unit. The optical connection unit includes an optical path selector and a beam splitter connected by optical signals. The optical path selector realizes the selection of the channel under test. The beam splitter is used for beam splitting processing of the test signal for clock recovery and testing.

[0054] The test signal generation unit includes a bit error rate tester and a pluggable optical module under test connected in sequence; the bit error rate tester is connected to the pluggable optical module under test and is used to output electrical data test signals to the pluggable optical module under test; the pluggable optical module under test is communicatively connected to the control unit and connected to the optical path selector through an optical signal, and is used to generate and output optical test signals.

[0055] The test signal processing unit is used to acquire optical test signals and process the data to obtain optical test data, and output the optical test data to the control unit; the optical test data includes optical power OMA, extinction ratio ER, and TDECQ value, etc.

[0056] The clock restorer (CDR) receives the optical test signal from the splitter and restores the reference clock signal, which is then output to the test signal processing unit to trigger the test signal processing unit to acquire and measure the optical test signal.

[0057] Furthermore, the control unit includes a communication control module, a data acquisition module, a data processing module, and a database unit.

[0058] The communication control module is used to establish communication connections with other units; the data acquisition module is used to acquire test data from the test signal processing unit; the data processing module is used to process data and store / read data to the database unit; the database unit includes device datasets, empirical datasets and historical datasets.

[0059] Furthermore, the control unit retrieves the experience configuration data from the experience dataset and sends it to the test signal generation unit and the test signal processing unit to initialize them, including: setting the test signal type (e.g., SSPRQ), rate (e.g., 53.125G), and encoding method (e.g., PAM4) of the bit error rate analyzer; setting the signal type, encoding method, and division ratio of the clock restorer (CDR); setting the test channel of the optical path selector; and setting parameters such as the sampling frequency, sampling duration, and data storage format of the test signal processing unit.

[0060] Furthermore, the control unit establishes a communication connection with the pluggable optical module under test through the communication control module to obtain the basic information of the optical module under test; based on the basic information of the optical module, it retrieves the empirical configuration data from the device dataset and empirical dataset and sends it to the test signal generation unit and the test signal processing unit to initialize the two.

[0061] The basic information of the optical module includes its model, specifications, and TAP parameters.

[0062] Furthermore, the control unit controls the test signal generation unit to generate a preset reference test signal; the pluggable optical module under test converts the reference test signal into a corresponding optical test signal, which is then output to the test signal processing unit via the optical connection unit; the test signal processing unit acquires the optical test signal and performs data processing to obtain optical test data, which is then output to the control unit.

[0063] The reference test signal is the code pattern for measuring the eye diagram, defined using the 802.3 series standards. For example, if it is a PAM4 signal code pattern, it is SSPRQ; if it is an NRZ signal code pattern, it is PRBS13 / PRBS31.

[0064] Furthermore, the test signal processing unit performs data processing on the optical test signal, removes noise interference, and extracts the optical power OMA, extinction ratio ER, and TDECQ value of the optical test signal.

[0065] Furthermore, the control unit determines whether the test light meets the requirements based on the optical test data. If it does, the test is terminated. If it does not, the TAP parameters of the optical module are modified and reissued to the pluggable optical module under test. The test is terminated when the optical test data meets the requirements or the maximum number of iterations is reached.

[0066] Furthermore, the control unit saves the optical test data to a historical dataset and saves the current configuration data and basic information of the optical module to an experience dataset.

[0067] Furthermore, the control unit determines whether the test light meets the requirements based on the light test data, such as... Figure 2 As shown, the specific steps include:

[0068] S1, set the pluggable optical module under test to debug mode, and extract the basic information, adjustment range, and step parameters of the optical module.

[0069] S2, extract the initial TAP parameters of the optical module. The TAP parameters are a set of feedforward equalizer (FFE) tap coefficients in the optical module's DSP (Digital Signal Processor).

[0070] For example, Where x[nk] is the reference test signal, Y[n] is the optical test signal expected to be emitted by the optical module, and C k Here, k represents the TAP parameter, n represents the parameter number, and n represents the signal sequence.

[0071] S3, the test signal processing unit acquires the optical test signal and obtains the compensated TAP parameters.

[0072] For example, Where x[nk] is the reference test signal, R[n] is the optical test signal acquired by the test signal processing unit, and J k To compensate for the TAP parameters, k is the parameter number and n is the signal sequence.

[0073] By solving the system of linear equations, the compensation TAP parameter J can be obtained. k .

[0074] S4. Perform a convolution operation on the initial TAP parameters and the compensated TAP parameters, and round the result to obtain the first TAP parameters. Then, normalize the first TAP parameters according to the hardware characteristics of the optical module, and multiply them by the adjustment coefficient Q to make each element of the TAP parameters conform to the hardware characteristics of the optical module, thus obtaining the second TAP parameters.

[0075] For example, the adjustment factor Q is adjusted according to the actual situation. If the optical module hardware characteristics specify that the upper limit threshold of the optical module DSP is 168, then by multiplying by the adjustment factor Q, the sum of the absolute values ​​of each element of the TAP parameter is made close to but does not exceed 168.

[0076] For example, the DSP TAP parameter rule can be that the main TAP parameter should be greater than the sum of other TAP parameters.

[0077] S5, send parameter adjustment instructions to the pluggable optical module under test, and send the second TAP parameters to the pluggable optical module under test; control the test signal generation unit to keep the reference test signal unchanged, and the test signal processing unit to collect the optical test signal.

[0078] S6, the test signal processing unit processes the acquired optical test signal to obtain parameter values ​​such as optical power OMA, extinction ratio ER and TDECQ.

[0079] S7, perform iterative calculation based on the maximum number of iterations Pe: extract the current TDECQ value and compare it with the preset TDECQ target threshold W; if the current TDECQ value ≤ the preset TDECQ target threshold W, proceed to the next step; if the current TDECQ value > the preset TDECQ target threshold W, return to step S2 and execute other steps sequentially until the TDECQ value ≤ the preset TDECQ target threshold, then proceed to the next step; if the number of iterations reaches the maximum number of iterations Pe, stop, set the debugging failure flag and exit debugging;

[0080] The TDECQ target threshold W is extracted from an empirical dataset, where W is either a TDECQ value that meets the requirements of the communication standard or the optimal TDECQ value under a specific application scenario.

[0081] S8, the data processing module receives and records parameters such as optical power OMA, extinction ratio ER and TDECQ value, as well as the current optical module TAP parameters;

[0082] S9, then repeat steps S2~S8 Ng times to obtain multiple sets of parameter combinations that satisfy ≤ preset TDECQ target threshold W.

[0083] This step is to find the optimal combination of parameters among multiple sets of parameters.

[0084] S10, compare the performance indicators corresponding to each parameter combination, such as optical power OMA, extinction ratio ER, and TDECQ value, and select the parameter combination with the best overall performance as the optimal calibration parameter Ang of the optical module. Write the parameters belonging to the optical module in the optimal calibration parameter Ang into the storage unit of the pluggable optical module under test through the communication control module. The test signal processing unit collects the test optical signal output by the pluggable optical module under test under the optimal calibration parameter Ang and obtains parameters such as optical power OMA, extinction ratio ER, and TDECQ value.

[0085] For example, the optimal combination of parameters with the best overall performance is selected as the optimal calibration parameter Ang of the optical module, including selecting the optimal combination of parameters such as bias current Ibias, modulation current Imod, optical power OMA, extinction ratio ER, and TDECQ value.

[0086] The advantages of selecting the optimal bias current Ibias and modulation current Imod are as follows: The optical module contains many components, including a driver and laser at the transmitting end, and a PD and TIA at the receiving end. The DSP can compensate for both transmission and reception; the TAP parameter is a DSP parameter that controls the equalization parameters and is used for compensation. Parameters like Ibias and Imod are driver parameters used to control the laser. The bias current Ibias determines the threshold current of the laser diode, directly affecting the stability of the optical output power. By adjusting the magnitude of the bias current, a bias current value that stabilizes the optical power at the design value and ensures the laser diode operates at its optimal state can be obtained. The modulation current Imod affects the modulation depth of the optical signal, thus affecting the eye diagram quality and bit error rate. After stabilizing the optical power by adjusting the bias current, gradually adjusting the modulation current can yield a modulation current value that maximizes the eye diagram opening and minimizes jitter.

[0087] S11, extract the extinction ratio ER value at this time. If the extinction ratio ER meets the requirements, set the debugging success flag. If the extinction ratio ER does not meet the requirements, perform Da optical module parameter adjustments. The adjusted optical module parameters include parameters such as Ibias and Imode, until the extinction ratio ER meets the requirements, then set the debugging success flag. If more than Da optical module parameter adjustments are performed and the extinction ratio ER still does not meet the requirements, set the debugging failure flag and exit debugging.

[0088] The optical module parameter adjustment is carried out by sending parameter adjustment commands to the pluggable optical module under test according to the set adjustment sequence and step size, and gradually adjusting the various parameters of the optical module; after each parameter adjustment, the control test signal generation unit keeps the reference test signal unchanged, and the test signal processing unit collects the optical test signal.

[0089] Extinction ratio ER = 10 × log10(P1 / P0), where P1 and P0 represent the optical power at logic "1" and logic "0" respectively. It is defined as the ratio of the average optical power of the optical module when transmitting logic "1" (high level) to the average optical power when transmitting logic "0" (low level), and the unit is decibel (dB).

[0090] For example, the requirement is met when the ER meets the equipment internal control parameter requirements.

[0091] S12, when the debugging success flag is obtained, the final optimal calibration parameter Ang is saved to the empirical dataset and then fixed into the storage unit of the pluggable optical module through the communication control module, thus completing the calibration of the pluggable optical module under test.

[0092] For example, Pe and Ng, Da take values ​​from 5 to 10.

[0093] Furthermore, there are Gd optical splitters, each with two optical output signals. One optical output signal is connected to the test signal processing unit, and the other optical output signal is connected to the clock restorer (CDR); this serves to quickly select the optical path.

[0094] Furthermore, the optical path selector is connected to the Gd beam splitters.

[0095] Furthermore, the pluggable optical module under test outputs Gb optical fiber inputs to the optical path selector, and the control unit controls which optical fiber is selected for testing.

[0096] A second aspect of the present invention provides an automated optical module calibration method, applied to an automated optical module calibration system described in the first aspect of the present invention, such as... Figure 2 As shown, it includes at least the following steps:

[0097] S1, Set the pluggable optical module under test to debug state, and extract the basic information, adjustment range and step parameters of the optical module;

[0098] S2, Extract the initial TAP parameters of the optical module;

[0099] S3, the test signal processing unit acquires the optical test signal and obtains the compensated TAP parameters;

[0100] S4. Perform convolution operation on the initial TAP parameters and the compensated TAP parameters, round the result to obtain the first TAP parameters, and then normalize the first TAP parameters according to the hardware characteristics of the optical module. Multiply by the adjustment coefficient Q to make each element of the TAP parameters conform to the hardware characteristics of the optical module to obtain the second TAP parameters.

[0101] S5, send parameter adjustment command to pluggable optical module under test, send the second TAP parameter to pluggable optical module under test; control the test signal generation unit to keep the reference test signal unchanged, and the test signal processing unit to collect the optical test signal;

[0102] S6, the test signal processing unit processes the acquired optical test signal to obtain the optical power OMA, extinction ratio ER and TDECQ value;

[0103] S7, perform iterative calculation based on the maximum number of iterations Pe: extract the current TDECQ value and compare it with the preset TDECQ target threshold W; if the current TDECQ value ≤ the preset TDECQ target threshold W, proceed to the next step; if the current TDECQ value > the preset TDECQ target threshold W, return to step S2 and execute other steps sequentially until the TDECQ value ≤ the preset TDECQ target threshold, then proceed to the next step; if the number of iterations reaches the maximum number of iterations Pe, stop, set the debugging failure flag and exit calibration debugging;

[0104] S8, the data processing module receives and records the optical power OMA, extinction ratio ER, TDECQ value and the current optical module TAP parameter;

[0105] S9, then repeat steps S2 to S8 Ng times to obtain multiple sets of parameter combinations that satisfy ≤ preset TDECQ target threshold W;

[0106] S10, compare the performance indicators corresponding to each parameter combination, including optical power OMA, extinction ratio ER, and TDECQ value, and select the parameter combination with the best overall performance as the optimal calibration parameter Ang of the optical module; write the parameters belonging to the optical module in the optimal calibration parameter Ang into the storage unit of the pluggable optical module under test through the communication control module, control the test signal generation unit to generate the reference test signal again, and the test signal processing unit collects the test optical signal output by the pluggable optical module under test under the optimal calibration parameter Ang to obtain the optical power OMA, extinction ratio ER, and TDECQ value;

[0107] S11, extract the extinction ratio ER value at this time. If the extinction ratio ER meets the requirements, set the debugging success flag. If the extinction ratio ER does not meet the requirements, perform Da optical module parameter adjustments. The adjusted optical module parameters include Ibias and Imode parameters until the extinction ratio ER meets the requirements. If the extinction ratio ER still does not meet the requirements after Da optical module parameter adjustments, set the debugging failure flag and exit debugging.

[0108] S12, when the debugging success flag is obtained, the final optimal calibration parameter Ang is saved to the empirical dataset and then fixed into the storage unit of the pluggable optical module through the communication control module, thus completing the calibration of the pluggable optical module under test.

[0109] Furthermore, the optical module parameters adjusted during optical module parameter adjustment include the Ibias and Imode parameters;

[0110] The values ​​of Pe, Ng, and Da range from 5 to 10;

[0111] The TDECQ target threshold W is extracted from an empirical dataset, where W is either a TDECQ value that meets the requirements of the communication standard or the optimal TDECQ value under a specific application scenario.

[0112] The selection of the optimal parameter combination with the best overall performance as the optimal calibration parameter Ang of the optical module includes: screening the optimal parameter combination of bias current Ibias, modulation current Imod, optical power OMA, extinction ratio ER and TDECQ value.

[0113] Furthermore, the optical module parameter adjustment is carried out by sending parameter adjustment commands to the pluggable optical module under test according to the set adjustment sequence and step size, and gradually adjusting the various parameters of the optical module; after each parameter adjustment, the control test signal generation unit keeps the reference test signal unchanged, and the test signal processing unit collects the optical test signal.

[0114] Extinction ratio ER = 10 × log10(P1 / P0), where P1 and P0 represent the optical power at logic "1" and logic "0" respectively;

[0115] The requirement is met when the extinction ratio ER meets the internal control parameters of the equipment.

[0116] In a third aspect, the present invention provides a processor-readable storage medium storing a computer program, wherein when the processor executes the computer program, it implements the automatic calibration method for optical modules described in the second aspect of the present invention.

[0117] The embodiments of this application have been described above with reference to the accompanying drawings. However, this application is not limited to the specific embodiments described above. The specific embodiments described above are merely illustrative and not restrictive. Those skilled in the art can make many other forms under the guidance of this application without departing from the spirit and scope of the claims, and all of these forms are within the protection scope of this application.

Claims

1. An automated calibration method for optical modules, characterized in that: The aforementioned automated optical module calibration method is applied to an automated optical module calibration system, which includes: The control unit establishes a stable communication connection with the test signal generation unit, the optical connection unit, and the test signal processing unit. The optical connection unit is used to receive optical test signals from the test signal generation unit and output optical test signals to the test signal processing unit. The optical connection unit includes an optical path selector and a beam splitter connected by optical signals. The optical path selector realizes the selection of the channel under test. The beam splitter is used for beam splitting processing of the test signal for clock recovery and testing. The test signal generation unit includes a bit error rate tester and a pluggable optical module under test connected in sequence; the bit error rate tester is connected to the pluggable optical module under test and is used to output electrical data test signals to the pluggable optical module under test; the pluggable optical module under test is communicatively connected to the control unit and connected to the optical path selector through an optical signal, and is used to generate and output optical test signals. The test signal processing unit is used to acquire optical test signals and process the data to obtain optical test data, and output the optical test data to the control unit; the optical test data includes optical power OMA, extinction ratio ER and TDECQ value; The clock restorer (CDR) receives the optical test signal from the beam splitter and recovers the reference clock signal, which is then output to the test signal processing unit to trigger the test signal processing unit to acquire and measure the optical test signal. The control unit controls the test signal generation unit to generate a preset reference test signal; the pluggable optical module under test converts the reference test signal into a corresponding optical test signal, which is then output to the test signal processing unit via the optical connection unit; the test signal processing unit collects the optical test signal and processes the data to obtain optical test data, which is then output to the control unit. The control unit determines whether the test light meets the requirements based on the optical test data. If it does, the test is exited. If it does not, the TAP parameters of the optical module are modified and re-sent to the pluggable optical module under test. The test is exited when the optical test data meets the requirements or the maximum number of iterations is reached. The control unit includes a communication control module, a data acquisition module, a data processing module, and a database unit; The communication control module is used to establish communication connections with other units; the data acquisition module is used to acquire test data from the test signal processing unit; the data processing module is used to process data and store / read data to the database unit; the database unit includes device datasets, empirical datasets, and historical datasets. The automated calibration method for optical modules includes the following steps: S1, Set the pluggable optical module under test to debug state, and extract the basic information, adjustment range and step parameters of the optical module; S2, Extract the initial TAP parameters of the optical module; S3, the test signal processing unit acquires the optical test signal and obtains the compensated TAP parameters; S4. Perform convolution operation on the initial TAP parameters and the compensated TAP parameters, round the result to obtain the first TAP parameters, and then normalize the first TAP parameters according to the hardware characteristics of the optical module. Multiply by the adjustment coefficient Q to make each element of the first TAP parameters conform to the hardware characteristics of the optical module to obtain the second TAP parameters. S5, send parameter adjustment instructions to the pluggable optical module under test, thereby sending the second TAP parameters to the pluggable optical module under test; control the test signal generation unit to keep the reference test signal unchanged, and the test signal processing unit to collect the optical test signal; S6, the test signal processing unit processes the acquired optical test signal to obtain the optical power OMA, extinction ratio ER and TDECQ value; S7, perform iterative calculation based on the maximum number of iterations Pe: extract the current TDECQ value and compare it with the preset TDECQ target threshold W; if the current TDECQ value ≤ the preset TDECQ target threshold W, proceed to the next step; if the current TDECQ value > the preset TDECQ target threshold W, modify the TAP parameter and return to step S2 and execute other steps sequentially until the TDECQ value ≤ the preset TDECQ target threshold, then proceed to the next step; if the number of iterations reaches the maximum number of iterations Pe, stop, set the debugging failure flag and exit debugging; S8, the data processing module receives and records the optical power OMA, extinction ratio ER, TDECQ value and the current optical module TAP parameter; S9, then repeat steps S2 to S8 Ng times to obtain multiple sets of parameter combinations that satisfy ≤ preset TDECQ target threshold W; S10, compare the performance indicators corresponding to each parameter combination, including optical power OMA, extinction ratio ER and TDECQ value, and select the parameter combination with the best overall performance as the optimal calibration parameter Ang of the optical module; write the parameters belonging to the optical module in the optimal calibration parameter Ang into the storage unit of the pluggable optical module under test through the communication control module; the test signal processing unit collects the test optical signal output by the pluggable optical module under test under the optimal calibration parameter Ang, and obtains the optical power OMA, extinction ratio ER and TDECQ value; S11, extract the extinction ratio ER value at this time. If the extinction ratio ER meets the requirements, set the debugging success flag; if the extinction ratio ER does not meet the requirements, perform Da optical module parameter adjustments. The adjusted optical module parameters include Ibias and Imod parameters, until the extinction ratio ER meets the requirements, then set the debugging success flag. If more than Da optical module parameter adjustments are performed and the extinction ratio ER still does not meet the requirements, set the debugging failure flag and exit debugging; where Ibias is the bias current and Imod is the modulation current. S12, when the debugging success flag is obtained, the final optimal calibration parameter Ang is saved to the empirical dataset and then solidified into the storage unit of the pluggable optical module under test through the communication control module, thus completing the calibration of the pluggable optical module under test; The TAP parameters of an optical module are a set of feedforward equalizer FFE tap coefficients in the optical module's DSP.

2. The automated calibration method for optical modules according to claim 1, characterized in that: The optical module parameters adjusted during optical module parameter adjustment include the Ibias and Imod parameters; The values ​​of Pe, Ng, and Da range from 5 to 10; The TDECQ target threshold W is extracted from an empirical dataset, where W is either a TDECQ value that meets the requirements of the communication standard or the optimal TDECQ value under a specific application scenario. The selection of the optimal parameter combination with the best overall performance as the optimal calibration parameter Ang of the optical module includes: screening the optimal parameter combination of bias current Ibias, modulation current Imod, optical power OMA, extinction ratio ER and TDECQ value.

3. The automated calibration method for optical modules according to claim 2, characterized in that: The optical module parameter adjustment is achieved by sending parameter adjustment commands to the pluggable optical module under test according to a set adjustment sequence and step size, and gradually adjusting various parameters of the optical module; after each parameter adjustment, the control test signal generation unit keeps the reference test signal unchanged, and the test signal processing unit collects the optical test signal; Extinction ratio ER = 10 × log 10 (P1 / P0), where P1 and P0 represent the optical power at logic "1" and logic "0" respectively; The requirement is met when the extinction ratio ER meets the internal control parameters of the equipment.

4. A processor-readable storage medium, characterized in that, The processor-readable storage medium stores a computer program, and when the processor executes the computer program, it implements an automated optical module calibration method as described in any one of claims 1 to 3.

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