Power line carrier communication chip function test method and system
By constructing a power line channel simulation test platform, voltage fluctuations and impedance changes are dynamically simulated to generate a predetermined proportion of harmonic interference signals. This solves the problem that existing test methods cannot simulate grid cooperative interference and enables accurate reliability assessment and optimization of power line carrier communication chips.
Patent Information
- Application Number
- CN202511591231.9
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-11-03
- Publication Date
- 2026-02-13
AI Technical Summary
Existing power line carrier communication chip testing methods cannot simulate the dynamic changes in power grid impedance and the coordinated interference of multiple characteristic harmonics in a specific proportion in a real power grid. This leads to a disconnect between laboratory test results and actual applications, making it difficult to accurately assess the reliability of chip communication.
A power line channel simulation test platform was constructed. By dynamically adjusting the power output and load switching, voltage fluctuations and rapid power switching conditions were simulated, generating multiple characteristic harmonic interference signals with a predetermined ratio. Combined with the dynamic impedance change process, a coupled interference environment was formed to test the key communication performance indicators of the chip and evaluate its carrier synchronization response and equalization algorithm convergence characteristics.
Accurately simulating harsh channel conditions in actual power grids exposes potential performance defects in chips, providing precise data for chip optimization and practical application selection, improving communication reliability, and promoting the large-scale application of power line carrier communication technology.