Charging cabinet full-link automatic test method

Abstract

The invention provides a full-link automatic test method for a charging cabinet, the method is controlled and executed by an upper computer, a tested charging cabinet assembly is connected through a test bottom plate, the test bottom plate is integrated with a multiplexing switch matrix, a first electronic switch, a second electronic switch and a communication interface circuit, and the method comprises the following steps: S1, the test bottom plate is integrated with a first electronic switch, a second electronic switch and a communication interface circuit; configuration information bound with the order is acquired from a remote server in advance; a shared analog-to-digital converter architecture is matched with a shared architecture of a multi-path analog signal selection circuit, so that time-sharing polling detection of voltages and access states of a plurality of bins is realized, and an independent analog-to-digital converter channel is prevented from being configured for each bin. According to the design, on the premise of ensuring the measurement precision, the number of components, the area occupation of a mainboard and the wiring complexity are greatly reduced, and the material cost and the manufacturing difficulty of the test bottom plate are effectively reduced. The problems of dependence on manpower, hardware redundancy, poor compatibility and the like in a traditional charging cabinet test are solved.

Description

Technical Field

[0001] This invention relates to the field of automated testing technology, and more specifically, to a fully automated testing method for charging cabinets. Background Technology

[0002] With the rapid development of the sharing economy and smart terminal devices, smart charging cabinets, as a key infrastructure providing centralized charging and discharging management for devices such as power banks, power tools, and logistics terminals, are experiencing continuous increases in system complexity and functional integration. Modern charging cabinets typically consist of a motherboard, multi-compartment boards, communication modules (such as 4G / 5G, Wi-Fi, and Bluetooth), a power management unit, sensor arrays (such as microswitches and photoelectric switches), and various control and drive circuits, exhibiting highly modular and distributed architecture characteristics. However, current testing systems for such devices still heavily rely on traditional manual methods, resulting in significant problems such as low efficiency, poor consistency, and incomplete coverage.

[0003] Specifically, existing testing methods generally employ a modular and step-by-step manual inspection process, which is not only time-consuming and labor-intensive but also makes it difficult to guarantee the repeatability and reliability of test results. Commercially available testing equipment lacks support for the parallel testing requirements of multiple nodes in charging cabinets, making it impossible to achieve simultaneous excitation and response acquisition across multiple compartments, resulting in lengthy testing cycles. While some preliminary automated testing solutions can complete single-function verification (such as testing only communication or verifying only power supply), a fully integrated automated testing platform covering the entire chain from the hardware layer and driver layer to the application layer has not yet been built, making it difficult to meet the needs of quality control throughout the product lifecycle.

[0004] At the hardware design level, traditional solutions for multi-bay status monitoring typically require a separate analog signal acquisition channel for each bay (e.g., 12 ADCs for 12 bays), resulting in high hardware costs, complex circuit layouts, and limited system scalability. Furthermore, existing architectures generally adopt a "one machine, one cabinet" model, meaning one host computer can only control a single charging cabinet for testing, leading to low utilization of computing resources and making it difficult to support large-scale parallel testing scenarios on production lines.

[0005] Furthermore, current testing systems also have significant shortcomings in terms of structural flexibility and maintainability. Although some solutions simplify system complexity through integrated hardware design, they lack modularity and reconfigurability when facing highly customized testing requirements, making it difficult to flexibly adjust test logic or replace faulty units. Especially in high-intensity, long-term operating testing environments, once critical hardware fails, overall replacement or repair is difficult and downtime is long, seriously affecting testing efficiency and productivity.

[0006] In specific functional testing phases, mechanical / optical sensing components such as microswitches and photoelectric switches still rely on manual point-by-point triggering and testing. This is not only inefficient but also susceptible to human error, making it difficult to guarantee test consistency. More seriously, most testing procedures directly power on the device under test without taking effective electrostatic discharge (ESD) protection measures, posing a risk of ESD breakdown and potentially causing irreversible hardware damage.

[0007] At the same time, existing technologies cannot simultaneously complete forward power supply (powering the cabinet from an external DC power source to verify normal operation) and reverse diode path detection (using a simulated power bank to reverse power supply to verify reverse connection protection) in the same test process, resulting in incomplete test coverage and making it difficult to expose potential design flaws.

[0008] Finally, in terms of data management, test results mostly rely on manual entry into the cloud system, which poses risks such as data delays, errors, and omissions. Furthermore, the local operation logs of the racks were not effectively collected and saved during the testing process. When individual devices failed to test, the lack of operational context information at that time greatly reduced the efficiency of root cause analysis and problem reproduction. Summary of the Invention

[0009] The technical problem to be solved by this invention is to provide a fully automated testing method for charging cabinets that solves the resource redundancy problem in multi-compartment hardware testing, addressing the shortcomings of the above-mentioned technical solutions.

[0010] This invention provides a fully automated testing method for charging cabinets. The method is controlled and executed by a host computer and connected to the charging cabinet components under test via a test base plate. The test base plate integrates a multiplexed switch matrix, a first electronic switch, a second electronic switch, and a communication interface circuit. The method includes the following steps: S1, obtain the configuration information bound to the order from the remote server in advance. The configuration information includes at least the device serial number (SN), the number of warehouse slots, and the test parameter set. S2, in response to scanning the identification of the charging cabinet component under test, automatically obtain the identification of the charging cabinet component under test, and match the corresponding test task from the pre-stored test task library according to the identification of the charging cabinet component under test. S3, write the device serial number SN and the number of compartments into the motherboard of the charging cabinet component under test, and verify whether the motherboard has correctly configured the multi-channel signal detection logic according to the number of compartments to adapt to the corresponding number of compartments. S4 adopts a shared analog-to-digital converter architecture. It switches analog input channels through the host computer and sequentially collects voltage signals from multiple compartments. It uses a single set of analog-to-digital converter circuits to detect the level status of at least four compartments. S5, in a single continuous test process, sequentially performs forward power supply test and reverse power supply test: In the positive power supply test, the first electronic switch is turned on to supply power to the charging cabinet component under test through an external power source, and the communication status and voltage of each compartment are detected to see if they are within a preset threshold range. In the reverse power supply test, the second electronic switch is turned on to connect an external load to simulate a reverse current path and to detect the conduction status of the reverse connection protection circuit. S6 automatically triggers the photoelectric switch or micro switch through the test fixture and collects the response status of the photoelectric switch or micro switch to complete the functional test; S7. In the same test phase, the read and write functions of the non-volatile memory of the motherboard are verified, the signal strength of the wireless communication module is detected, and the running status flag in the communication protocol stack is verified. S8. When any test item fails, a structured error message is generated and a repair prompt is given. After the repair is completed, the failed test item or the entire test process can be retested. After the S9 test is completed, it automatically uploads a data packet containing the test results, device serial number (SN), bay configuration information, and test process logs to a remote server for quality traceability and fault analysis.

[0011] In the fully automated testing method for charging cabinets described in this invention, the identification in step S2 is a QR code, one-dimensional barcode, or RFID tag attached to the charging cabinet component under test. It is automatically read and parsed into a unique device identifier by a scanning device, which is used to associate the corresponding order with the test task.

[0012] In the fully automated testing method for charging cabinets described in this invention, the test task library in step S2 is stored on a remote server or local storage unit, supporting dynamic loading of the corresponding test parameter set according to the order number, product model or batch number, and updating the status of the test task based on the actual test results after the test is completed.

[0013] In the fully automated testing method for charging cabinets described in this invention, in step S3, the device serial number SN and the number of compartments are written to the non-volatile memory of the motherboard through a serial communication interface, and a readback verification is performed after the writing is completed; if the readback data is inconsistent with the written data, it is determined to be a writing abnormality and a rewrite mechanism is triggered.

[0014] In the fully automated testing method for charging cabinets described in this invention, the shared analog-to-digital converter architecture in step S4 includes a multi-channel analog signal selection circuit and an analog-to-digital converter. The voltage detection nodes of each compartment are respectively connected to the input terminal of the multi-channel analog signal selection circuit, and the output terminal of the multi-channel analog signal selection circuit is connected to the analog input terminal of the analog-to-digital converter. The multi-channel analog signal selection circuit sequentially selects the corresponding channel of each compartment and connects the voltage signal of each compartment to the analog-to-digital converter in a time-division manner, thereby realizing the polling acquisition of the level status of multiple compartments.

[0015] In the fully automated testing method for charging cabinets described in this invention, in step S5, both the first electronic switch and the second electronic switch are controllable switching devices independently controlled by a host computer via GPIO signals. The first electronic switch is connected to an external DC power supply to provide forward power to the charging cabinet component under test. The second electronic switch is connected to an external load to inject reverse current into the charging cabinet component under test during reverse power supply testing. The external load is a rechargeable battery or an electronic load simulator. A voltage drop across the reverse power supply path is collected via an analog-to-digital converter to verify whether the reverse connection protection path is conductive and whether its voltage drop is below a preset threshold.

[0016] In the fully automated testing method for charging cabinets described in this invention, the test fixture in step S6 includes an automatic actuator. The automatic actuator is used to simulate the physical action of inserting a compartment or closing a compartment door to trigger a micro switch or photoelectric switch on the component of the charging cabinet under test, and cooperates with the software logic of the host computer to complete the switch function test.

[0017] In the fully automated testing method for the charging cabinet described in this invention, the functional verification of the motherboard in step S7 includes: performing a read-write consistency test on the non-volatile memory; detecting whether the signal strength of the wireless communication module meets a preset threshold; and verifying the operation flag bits in the communication protocol stack used to characterize the data transmission and reception status or communication anomalies.

[0018] In the fully automated testing method for charging cabinets described in this invention, when any test item fails in step S8, structured error information is generated. The structured error information includes fault type code, associated compartment number, abnormal electrical parameters, test timestamp, current firmware version number, and failed test item identifier, which is used to guide maintenance operations and quality analysis.

[0019] In the fully automated testing method for charging cabinets described in this invention, after the test is completed in step S9, a data packet containing the test results and operation logs is automatically uploaded to a remote server to trigger a quality traceability process. The quality traceability process includes comparing with historical batch data, identifying common defect patterns, and generating early warning information. The test process operation logs include system startup records, analog-to-digital converter sampling sequences, switch trigger events, communication message content, and power supply status switching sequence.

[0020] This invention presents a fully automated testing method for charging cabinets. Through deep hardware and software collaboration and system-level integration, it employs a shared analog-to-digital converter (ADC) architecture combined with a shared architecture of multiple analog signal selection circuits. This enables time-division multiplexing of voltage and path status detection across multiple compartments, avoiding the need for an independent ADC channel for each compartment. This design significantly reduces the number of components, motherboard area, and wiring complexity while ensuring measurement accuracy, effectively lowering the material cost and manufacturing difficulty of the test baseboard. It solves the problems of reliance on manual labor, hardware redundancy, and poor compatibility in traditional charging cabinet testing. Furthermore, through a shared ADC architecture, automatic verification of forward and reverse power supply testing, upper-level linkage control, and cloud-based collaborative verification, it achieves a highly efficient, low-cost, highly reliable, easy-to-maintain, and traceable integrated intelligent testing system, demonstrating outstanding practicality and broad industrial application prospects. Attached Figure Description

[0021] Figure 1 This is a flowchart illustrating an embodiment of the fully automated testing method for the charging cabinet of the present invention. Detailed Implementation

[0022] To make the objectives, technical solutions, and advantages of this invention clearer, the invention will be further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative and not intended to limit the invention.

[0023] It should be noted that the terms "first," "second," etc., in the specification, claims, and accompanying drawings of this invention are used to distinguish similar objects and are not necessarily used to describe a specific order or sequence. It should be understood that such data can be interchanged where appropriate so that the embodiments of the invention described herein can be implemented in orders other than those illustrated or described herein. Furthermore, the terms "comprising" and "having," and any variations thereof, are intended to cover a non-exclusive inclusion; for example, a process, method, system, product, or apparatus that comprises a series of steps or units is not necessarily limited to those steps or units explicitly listed, but may include other steps or units not explicitly listed or inherent to such processes, methods, products, or apparatus.

[0024] like Figure 1 The diagram shown is a flowchart illustrating an embodiment of an automated testing method for the entire charging cabinet supply chain according to the present invention. The method is controlled and executed by a host computer and connected to the charging cabinet component under test via a test base plate. The test base plate integrates a multiplexed switch matrix, a first electronic switch, a second electronic switch, and a communication interface circuit. The method includes the following steps: In step S1, configuration information bound to the order is obtained from a remote server in advance. The configuration information includes at least the device serial number (SN), the number of storage spaces, and the test parameter set. In step S2, in response to scanning the identification of the charging cabinet component under test, the identification of the charging cabinet component under test is automatically obtained, and the corresponding test task is matched from the pre-stored test task library according to the identification of the charging cabinet component under test. In step S3, the device serial number SN and the number of compartments are written into the motherboard of the charging cabinet component under test, and it is verified whether the motherboard has correctly configured the multi-channel signal detection logic according to the number of compartments to adapt to the corresponding number of compartments. In step S4, a shared analog-to-digital converter architecture is adopted. The analog input channel is switched by the host computer to sequentially collect the voltage signals of multiple compartments. The level status detection of at least four compartments is realized by using a single set of analog-to-digital converter circuits. In step S5, during a single continuous test process, the forward power supply test and the reverse power supply test are performed sequentially: In the positive power supply test, the first electronic switch is turned on to supply power to the charging cabinet component under test through an external power source, and the communication status and voltage of each compartment are detected to see if they are within a preset threshold range. In the reverse power supply test, the second electronic switch is turned on to connect an external load to simulate a reverse current path and to detect the conduction status of the reverse connection protection circuit. In step S6, the photoelectric switch or micro switch is automatically triggered by the test fixture, and the response status of the photoelectric switch or micro switch is collected to complete the functional test; In step S7, during the same testing phase, the read / write function of the non-volatile memory of the motherboard is verified, the signal strength of the wireless communication module is detected, and the running status flag bit in the communication protocol stack is verified. In step S8, when any test item fails, a structured error message is generated and a repair prompt is given. After the repair is completed, the failed test item or the entire test process can be retested. In step S9, after the test is completed, a data packet containing the test results, device serial number (SN), warehouse configuration information, and test process logs is automatically uploaded to a remote server for quality traceability and fault analysis.

[0025] In one embodiment, the identification in step S2 is a QR code, one-dimensional barcode, or RFID tag attached to the charging cabinet component under test. It is automatically read and parsed into a unique device identifier by a scanning device, which is used to associate the corresponding order with the test task.

[0026] In one embodiment, the test task library in step S2 is stored on a remote server or local storage unit, supporting dynamic loading of the corresponding test parameter set according to the order number, product model or batch number, and updating the status of the test task based on the actual test results after the test is completed.

[0027] In one embodiment, in step S3, the device serial number SN and the number of bays are written to the non-volatile memory of the motherboard through a serial communication interface, and a readback verification is performed after the writing is completed; if the readback data is inconsistent with the written data, it is determined to be a write error and a rewrite mechanism is triggered.

[0028] In one embodiment, the shared analog-to-digital converter architecture in step S4 includes a multi-channel analog signal selection circuit and an analog-to-digital converter. The voltage detection nodes of each compartment are respectively connected to the input terminal of the multi-channel analog signal selection circuit, and the output terminal of the multi-channel analog signal selection circuit is connected to the analog input terminal of the analog-to-digital converter. The multi-channel analog signal selection circuit sequentially selects the corresponding channel of each compartment and connects the voltage signal of each compartment to the analog-to-digital converter in a time-division manner, thereby realizing the polling acquisition of the level status of multiple compartments.

[0029] In one embodiment, in step S5, both the first electronic switch and the second electronic switch are controllable switching devices independently controlled by the host computer via GPIO signals; wherein, the first electronic switch is connected to an external DC power supply to provide forward power to the charging cabinet component under test; the second electronic switch is connected to an external load to inject reverse current into the charging cabinet component under test during reverse power supply testing; the external load is a rechargeable battery or an electronic load simulator, and the voltage drop of the reverse power supply path is collected through an analog-to-digital converter to verify whether the reverse connection protection path is conductive and whether its voltage drop is lower than a preset threshold.

[0030] In one embodiment, the test fixture in step S6 includes an automatic actuator, which is used to simulate the physical action of inserting a compartment or closing a compartment door to trigger a micro switch or photoelectric switch on the charging cabinet component under test, and cooperate with the software logic of the host computer to complete the switch function detection.

[0031] In one embodiment, the functional verification of the motherboard in step S7 includes: performing a read-write consistency test on the non-volatile memory; detecting whether the signal strength of the wireless communication module meets a preset threshold; and verifying the operation flag bits in the communication protocol stack used to characterize the data transmission and reception status or communication anomalies.

[0032] In one embodiment, when any test item fails in step S8, a structured error message is generated. The structured error message includes a fault type code, associated warehouse number, abnormal electrical parameters, test timestamp, current firmware version number, and failed test item identifier, which is used to guide maintenance operations and quality analysis.

[0033] In one embodiment, after the test is completed in step S9, a data packet containing the test results and operation logs is automatically uploaded to a remote server to trigger a quality traceability process. The quality traceability process includes comparing with historical batch data, identifying common defect patterns, and generating early warning information. The test process operation logs include system startup records, analog-to-digital converter sampling sequences, switch trigger events, communication message content, and power supply status switching sequence.

[0034] The fully automated testing system for the charging cabinet includes a host computer, a remote server, a barcode scanning device, a test base plate, a test fixture, and the components of the charging cabinet under test.

[0035] The host computer runs test control software (which can be developed based on Python, C# or other general programming languages), communicates with the test baseboard through a USB to UART / I²C interface, and is responsible for scheduling the overall test process, issuing instructions, collecting data and judging results.

[0036] The remote server is deployed on the enterprise intranet or in the cloud to store configuration information bound to production orders, including the device serial number (SN), product model, number of storage locations (e.g., 4, 6, 8, or 12), and corresponding test parameter sets (e.g., normal voltage range of 4.8 V–5.2 V, 4G signal strength threshold ≥). (95 dBm, communication timeout threshold of 2 s, etc.). After the test is completed, the host computer uploads the test results to the server for quality traceability and defect analysis.

[0037] The scanning device is an industrial-grade QR code scanner used to read machine-readable identifiers attached to the motherboard under test, including QR codes, 1D barcodes, or RFID tags. The host computer parses the identifier to obtain a unique device identifier (such as a serial number string or MAC address), and uses this identifier to match the corresponding test task from a test task library stored in a local cache or remote server. The test task library is stored on a remote server or local non-volatile storage unit such as an SSD, and supports dynamically loading test parameter sets based on order number, product model (such as CG8000), or batch number (such as Batch#202511W4), and updates the task status to "completed" or "abnormal" after the test is completed.

[0038] The test baseboard, serving as an intermediate interface layer, integrates the following core circuit modules: Multiplexed analog signal selection circuit (such as CD4051 multiplexer); A single high-precision analog-to-digital converter (ADC, such as ADS1115); Two MOSFET electronic switches (such as AO3400) independently controlled by GPIO signals from the host computer serve as the first electronic switch and the second electronic switch, respectively. The communication interface circuit is UART / I²C.

[0039] Each compartment's voltage detection node is connected to the input of a multi-channel analog signal selection circuit, and its common output is connected to the analog input pin of the ADC. The host computer sequentially selects the corresponding channels (e.g., channels 0 to 7) via the I²C protocol, causing the ADC to collect voltage signals from multiple compartments in a time-division multiplexing manner. This allows for the detection of the voltage levels of at least four compartments using a single analog-to-digital converter circuit. The system dynamically activates the corresponding number of analog input channels based on the number of compartments (4 / 6 / 8 / 12).

[0040] In the forward power supply test, the host computer outputs a high level through GPIO to turn on the first electronic switch (Q1), so that the external 12 V DC power supply supplies power to the charging cabinet components under test; the system synchronously detects the communication status of each compartment and whether the voltage is within the preset threshold range.

[0041] In the reverse power supply test, the host computer turns on the second electronic switch (Q2) and connects an external load (such as a fully charged rechargeable battery or an electronic load simulator) to the output terminal of the chassis to simulate reverse current injection. The ADC collects the voltage drop across the reverse connection protection diode; if the voltage drop is ≤0.6 V and communication is not interrupted, the reverse connection protection path is considered to be conducting normally. The forward and reverse power supply tests are performed sequentially in a single continuous process to ensure full coverage of the power path.

[0042] The test fixture includes an automatic actuator driven by a servo motor, electromagnetic push rod, or pneumatic actuator to simulate the physical actions of a user inserting a power bank or closing the compartment door, thereby triggering a micro switch or blocking a photoelectric switch. The host computer collects the switch response signals reported by the mainboard in real time; if no valid status change is received within 200 ms, the compartment switch is determined to be malfunctioning.

[0043] The tested charging cabinet components include a motherboard and a compartment board. The motherboard integrates a main control MCU, non-volatile memory (such as Flash or EEPROM), a wireless communication module (such as a 4G or NB-IoT module), and a power management unit; the compartment board supports 4, 6, 8, or 12 compartments.

[0044] During the functional verification phase, the system performs the following operations: Write preset test data (e.g., 0xA5A5) to a specified address (e.g., 0x0800F000) in non-volatile memory, read it back after a delay, and compare the consistency to complete the read / write function verification. Obtain the signal strength parameters (such as RSRP or RSSI values) of the wireless communication module and determine whether they exceed a preset communication threshold (e.g., 95 dBm); Verify the running flags in the communication protocol stack (such as the UART receive ready flag and frame error interrupt flag) to confirm the data transmission and reception status and communication anomalies.

[0045] When any test item fails (e.g., the voltage in compartment 5 is 3.2V), the host computer generates a structured error message, including: Fault type coding (e.g., ERR_VOLTAGE_OUT_OF_RANGE); Associated position number (e.g., Bay_05); Abnormal electrical parameters (e.g., 3.2 V); Test timestamp (e.g., 2025-11-28 10:15:23); Current firmware version number (e.g., V2.1.0); Failed test item identifier (e.g., TEST_ID_ADC_BAY5).

[0046] After completing the repair according to the prompts, the tester can select "Retest Current Item" or "Retest Full Process" through the host computer interface. The system will automatically resume execution at the fault point, supporting efficient closed-loop repair.

[0047] After the test, the data packet automatically packaged and uploaded by the host computer to the remote server includes: Test results (Pass / Fail); Equipment serial number (SN) and warehouse configuration information; A complete test process log, covering system startup records, ADC sampling sequences, switch trigger events, communication message content, and power supply status switching timing.

[0048] After receiving the data, the remote server automatically triggers the quality traceability process: it compares the data with historical data of the same batch. If a common defect pattern is identified (such as multiple devices experiencing the same voltage anomaly in the same compartment), an early warning message is generated and pushed to the quality management platform to achieve early intervention for defects.

[0049] Through the above methods, this invention achieves a single-unit test time of ≤90 seconds, improving test efficiency by more than 3 times; reducing manual intervention by 90%, significantly reducing the false judgment rate; providing closed-loop test data throughout the entire life cycle, supporting rapid location of design or process issues; and optimizing hardware costs (the shared ADC architecture can save approximately 15% of BOM costs).

[0050] This invention, through hardware and software co-design and system-level integration, constructs a highly efficient, highly compatible, and low-cost end-to-end automated testing solution for charging cabinets. Employing a shared analog-to-digital converter (ADC) architecture, the host computer controls a multi-channel analog signal selection circuit on the test baseboard to switch analog input channels. A single ADC circuit sequentially acquires voltage signals from multiple workstations, enabling time-division multiplexing detection of the voltage levels of at least four workstations. This design avoids configuring an independent ADC channel for each workstation, effectively reducing the number of components, motherboard area, and wiring complexity, making it particularly suitable for space-constrained production line workstations.

[0051] In a single continuous test process, the host computer controls the first and second electronic switches on the test base plate to sequentially complete the forward power supply test (powered by an external power source) and the reverse power supply test (connected to an external load to simulate a reverse current path). The system also automatically detects the communication status, voltage level, and reverse connection protection circuit continuity of each compartment. The entire process requires no manual intervention or replacement of test fixtures, ensuring the comprehensiveness and consistency of the power path functional verification.

[0052] The test fixture automatically triggers the photoelectric switch or micro switch on the charging cabinet component under test, and the host computer collects its response status, completely eliminating the force deviation and timing error caused by manual pressing. At the same time, the software logic precisely controls the power-on and power-off timing of the component under test (such as applying power after the fixture has completed its operation), effectively avoiding the risk of component breakdown caused by hot plugging or electrostatic discharge (ESD), and significantly improving test safety and result repeatability.

[0053] The system dynamically adapts the test logic based on the configuration information obtained from the remote server (including equipment serial number SN, number of storage compartments and test parameter set), and supports a unified test process for different numbers of storage compartments and functional modules. When any test item fails, it automatically generates a structured error message containing information such as fault type, storage compartment number and abnormal parameters, and supports retesting of failed items or the entire process, which greatly reduces the complexity of production line operation and maintenance response time.

[0054] The matching and verification with the order configuration is completed during the stage of writing the device serial number (SN) and the number of storage spaces to the motherboard to prevent incorrect or missing burn-in. After the test is completed, the data package containing the test results, device serial number (SN), storage space configuration information and complete operation logs is automatically uploaded to the remote server. It supports comparison with historical batch data, identification of common defects and generation of early warnings, providing high-value data support for R&D optimization and quality control.

[0055] Based on a shared analog-to-digital converter architecture, the host computer collaborates with multiple test baseboards and fixtures via standard communication buses (such as UART and I²C). Each test baseboard generates a unique I²C slave address through hardware differentiation design (such as pull-down resistor configuration), enabling a single host computer to simultaneously identify and independently control up to four test baseboards and their corresponding fixtures, achieving true parallel testing of four charging cabinet components. This capability increases testing capacity per unit time by nearly four times, significantly improving production line equipment utilization and output efficiency.

[0056] Through an adaptive test configuration mechanism, the same host computer firmware and customized test applications do not require code refactoring for different product models (such as 4-bay, 8-bay, and 12-bay) or functional modules (motherboard, multi-bay board, communication module). The system only needs to load the configuration file that matches the order to automatically adapt the test item order, channel mapping relationship, judgment threshold, and communication protocol parameters, ensuring the consistency of the testing process across the entire product series and significantly reducing production line switchover costs, operational complexity, and the risk of human error.

[0057] The host computer synchronously triggers the cylinder actuator via GPIO signals to batch activate the microswitches or photoelectric switches of all compartments and collects the switch response status in real time, achieving millisecond-level consistency verification of electromechanical functions. At the same time, the software logic strictly controls the power-on and power-off sequence of the PCBA board (e.g., first complete the fixture positioning → then turn on the first electronic switch to power on → then turn off the power after the test is completed), fundamentally avoiding damage to sensitive components caused by hot-plugging or electrostatic discharge (ESD), and improving the reliability of long-term testing and the lifespan of the equipment.

[0058] Using the same set of first and second electronic switches on the test baseboard, the power supply mode is dynamically switched by software: in forward power supply mode, the first electronic switch is turned on, allowing the external DC power supply to power the charging cabinet component under test; in reverse power supply mode, the second electronic switch is turned on, connecting the external load to inject reverse current. Simultaneously, through a multiplexed switch matrix and a single analog-to-digital converter, the voltage drop across the reverse polarity protection diode and other key node voltages are collected in a time-division manner. Without changing any fixtures, the complete verification of the electrical characteristics of the normal operating power path and the reverse polarity protection path is automatically completed, ensuring the reliability of the power management function under various operating conditions.

[0059] During the device serial number (SN) and bay quantity burning stage, real-time verification with cloud work order data is performed to prevent incorrect or missed burning. After testing, structured data packages (including test results, operation logs, ADC sampling sequences, switching events, power supply timing, etc.) can be selectively uploaded to a remote server. This mechanism not only supports batch traceability and defect warnings for the quality department, but also allows the R&D team to remotely retrieve complete rack operation logs, accelerating root cause analysis, firmware iteration, and hardware design optimization, forming a highly efficient closed loop of "test-feedback-improvement".

[0060] This invention, without relying on complex peripheral expansion, solves the problems of hardware redundancy, low efficiency, poor compatibility, and high manual dependence in traditional charging cabinet testing by using a shared analog-to-digital converter architecture, automatic verification of forward and reverse power supply testing, upper-level linkage control, and cloud data closed loop. It achieves an integrated intelligent testing solution that is highly efficient, low-cost, highly reliable, easy to maintain, and traceable, and has outstanding practicality and broad prospects for industrial application.

[0061] It should be noted that the specific device models (such as ADS1115, CD4051, AO3400), voltage values ​​(such as 5.0 V ± 0.2 V), and signal strength thresholds (such as...) mentioned in the above embodiments are not specified. The figures (e.g., 95 dBm) are merely illustrative and do not constitute a limitation on the scope of protection of this invention. Those skilled in the art can employ functionally equivalent alternatives to achieve the same technical effect according to actual needs.

[0062] It should be noted that, for the sake of simplicity, the foregoing method embodiments are all described as a series of actions. However, those skilled in the art should understand that the present invention is not limited to the described order of actions, because according to the present invention, some steps can be performed in other orders or simultaneously. Furthermore, those skilled in the art should also understand that the embodiments described in the specification are preferred embodiments, and the actions and modules involved are not necessarily essential to the present invention.

[0063] Through the above description of the embodiments, those skilled in the art can clearly understand that the methods according to the above embodiments can be implemented by means of software plus necessary general-purpose hardware platforms. Of course, they can also be implemented by hardware, but in many cases the former is a better implementation method. Based on this understanding, the technical solution of the present invention, in essence, or the part that contributes to the prior art, can be embodied in the form of a software product. This computer software product is stored in a storage medium (such as ROM / RAM, magnetic disk, optical disk) and includes several instructions to cause a terminal device (which may be a mobile phone, computer, server, or network device, etc.) to execute the methods described in the various embodiments of the present invention.

[0064] Therefore, the above description is only a preferred embodiment of the present invention, and the scope of protection of the present invention is not limited thereto. Any changes or substitutions that can be easily conceived by those skilled in the art within the scope of the technology disclosed in the present invention should be included within the scope of protection of the present invention. The scope of protection of the present invention should be determined by the scope of the claims.

Claims

1. A full-link automatic test method for a charging cabinet, the method being executed by a host computer and connected to a component of a charging cabinet to be tested through a test board, characterized in that, The test baseboard integrates a multiplexed switch matrix, a first electronic switch, a second electronic switch, and a communication interface circuit. The method includes the following steps: S1, obtain the configuration information bound to the order from the remote server in advance. The configuration information includes at least the device serial number (SN), the number of warehouse slots, and the test parameter set. S2, in response to scanning the identification of the charging cabinet component under test, automatically obtain the identification of the charging cabinet component under test, and match the corresponding test task from the pre-stored test task library according to the identification of the charging cabinet component under test. S3, write the device serial number SN and the number of compartments into the motherboard of the charging cabinet component under test, and verify whether the motherboard has correctly configured the multi-channel signal detection logic according to the number of compartments to adapt to the corresponding number of compartments. S4 adopts a shared analog-to-digital converter architecture. It switches analog input channels through the host computer and sequentially collects voltage signals from multiple compartments. It uses a single set of analog-to-digital converter circuits to detect the level status of at least four compartments. S5, in a single continuous test process, sequentially performs forward power supply test and reverse power supply test: In the positive power supply test, the first electronic switch is turned on to supply power to the charging cabinet component under test through an external power source, and the communication status and voltage of each compartment are detected to see if they are within a preset threshold range. In the reverse power supply test, the second electronic switch is turned on to connect an external load to simulate a reverse current path and to detect the conduction status of the reverse connection protection circuit. S6 automatically triggers the photoelectric switch or micro switch through the test fixture and collects the response status of the photoelectric switch or micro switch to complete the functional test; S7. In the same test phase, the read and write functions of the non-volatile memory of the motherboard are verified, the signal strength of the wireless communication module is detected, and the running status flag in the communication protocol stack is verified. S8. When any test item fails, a structured error message is generated and a repair prompt is given. After the repair is completed, the failed test item or the entire test process can be retested. After the S9 test is completed, it automatically uploads a data packet containing the test results, device serial number (SN), bay configuration information, and test process logs to a remote server for quality traceability and fault analysis.

2. The full link automated test method of the charging cabinet according to claim 1, characterized in that, The identification mark mentioned in step S2 is a QR code, one-dimensional barcode, or RFID tag attached to the charging cabinet component under test. It is automatically read and parsed into a unique device identifier by a scanning device, which is used to associate the corresponding order and test task.

3. The full link automated test method of the charging cabinet according to claim 2, characterized in that, In step S2, the test task library is stored on a remote server or local storage unit, which supports dynamically loading the corresponding test parameter set according to the order number, product model or batch number, and updating the status of the test task based on the actual test results after the test is completed.

4. The method of claim 1, wherein, In step S3, the device serial number SN and the number of bays are written to the non-volatile memory of the motherboard through the serial communication interface, and a readback verification is performed after the writing is completed; if the readback data is inconsistent with the written data, it is determined to be a write error and a rewrite mechanism is triggered.

5. The fully automated testing method for charging cabinets according to claim 1, characterized in that, In step S4, the shared analog-to-digital converter architecture includes a multi-channel analog signal selection circuit and an analog-to-digital converter. The voltage detection nodes of each compartment are connected to the input terminal of the multi-channel analog signal selection circuit, and the output terminal of the multi-channel analog signal selection circuit is connected to the analog input terminal of the analog-to-digital converter. The multi-channel analog signal selection circuit sequentially selects the corresponding channel of each compartment and connects the voltage signal of each compartment to the analog-to-digital converter in a time-division manner, thereby realizing the polling acquisition of the level status of multiple compartments.

6. The fully automated testing method for charging cabinets according to claim 1, characterized in that, In step S5, both the first electronic switch and the second electronic switch are controllable switching devices independently controlled by the host computer via GPIO signals. The first electronic switch is connected to an external DC power supply to provide forward power to the charging cabinet component under test. The second electronic switch is connected to an external load to inject reverse current into the charging cabinet component under test during reverse power supply testing. The external load is a rechargeable battery or an electronic load simulator. The voltage drop of the reverse power supply path is collected through an analog-to-digital converter to verify whether the reverse connection protection path is conductive and whether its voltage drop is lower than a preset threshold.

7. The fully automated testing method for charging cabinets according to claim 6, characterized in that, In step S6, the test fixture includes an automatic actuator, which is used to simulate the physical action of inserting a compartment or closing a compartment door to trigger a micro switch or photoelectric switch on the charging cabinet component under test, and cooperate with the software logic of the host computer to complete the switch function test.

8. The fully automated testing method for charging cabinets according to claim 7, characterized in that, The functional verification of the motherboard in step S7 includes: performing a read-write consistency test on the non-volatile memory; detecting whether the signal strength of the wireless communication module meets a preset threshold; and verifying the operation flag bits in the communication protocol stack used to characterize the data transmission and reception status or communication anomalies.

9. The fully automated testing method for charging cabinets according to claim 8, characterized in that, In step S8, when any test item fails, a structured error message is generated. The structured error message includes a fault type code, associated warehouse number, abnormal electrical parameters, test timestamp, current firmware version number, and failed test item identifier, which is used to guide maintenance operations and quality analysis.

10. The fully automated testing method for charging cabinets according to claim 1, characterized in that, After the test is completed in step S9, the data packet containing the test results and operation log is automatically uploaded to the remote server to trigger the quality traceability process. The quality traceability process includes comparing with historical batch data, identifying common defect patterns and generating early warning information. The test process operation log includes system startup records, analog-to-digital converter sampling sequences, switch trigger events, communication message content and power supply status switching sequence.

Images