Automated control method and system for mmwave radar spurious testing

Abstract

The application discloses an automatic control method and system for millimeter wave radar stray test, and relates to the technical field of electrical measurement. The method comprises the following steps: performing a pre-scan test on a millimeter wave radar device in a preset frequency range, synchronously controlling a position locator, obtaining stray radiation test data under different spatial poses, and automatically identifying and generating a marker point according to a preset stray signal screening rule; generating a final-scan test parameter according to the frequency and spatial pose information of the marker point, and performing a final-scan test; and comparing the test results under different spatial poses to generate stray test data. The application solves the technical problem that the existing millimeter wave radar stray test method cannot comprehensively cover the stray radiation characteristics under different spatial poses, and the test efficiency and accuracy are low, and achieves the technical effects of comprehensively covering the stray radiation characteristics under different spatial poses, improving the test efficiency and accuracy by automatically controlling and optimizing the test process.

Description

Technical Field

[0001] This invention relates to the field of electrical measurement technology, specifically to an automated control method and system for millimeter-wave radar spurious emissions testing. Background Technology

[0002] In modern communication and radar technologies, millimeter-wave radar is widely used due to its high resolution and anti-jamming capabilities. However, millimeter-wave radar equipment may generate spurious radiation during operation. These spurious signals can interfere with the normal operation of other communication systems or radar equipment, affecting their performance and reliability. Therefore, accurate testing and evaluation of spurious radiation from millimeter-wave radar is crucial. However, existing radar spurious radiation testing methods mostly rely on manual operation, which is not only inefficient but also makes it difficult to guarantee test accuracy and consistency, failing to meet the comprehensive testing needs in complex environments. Summary of the Invention

[0003] This application provides an automated control method and system for millimeter-wave radar spurious emission testing, which solves the technical problem that existing millimeter-wave radar spurious emission testing methods are unable to fully cover the spurious emission characteristics under different spatial poses, resulting in low testing efficiency and accuracy.

[0004] The first aspect of this application provides an automated control method for spurious emission testing of millimeter-wave radar. The method includes: controlling a spectrum testing device to perform a pre-scan test on the millimeter-wave radar device under test within a preset frequency range; synchronously controlling a position locator to move according to a preset spatial pose sequence during the pre-scan test to acquire spurious emission test data corresponding to different spatial poses; based on the spurious emission test data obtained from all spatial poses under the pre-scan test, automatically identifying and generating at least one spurious candidate frequency point as a marker point according to a preset spurious signal filtering rule; automatically generating final scan test parameters according to the frequency information and spatial pose information corresponding to the marker point, and controlling the spectrum testing device to perform a final scan test on the marker point; and during the final scan test, performing maximum value comparison processing on the final scan test results obtained under different spatial poses to generate corresponding spurious emission test result data.

[0005] A second aspect of this application provides an automated control system for millimeter-wave radar spurious emission testing. The system includes: a pre-scan test module, used to control a spectrum testing device to perform a pre-scan test on the millimeter-wave radar device under test within a preset frequency range, and synchronously control a position locator to move according to a preset spatial pose sequence during the pre-scan test to acquire spurious emission test data corresponding to different spatial poses; a marker point identification module, used to automatically identify and generate at least one spurious candidate frequency point as a marker point based on the spurious emission test data obtained from all spatial poses under the pre-scan test, according to a preset spurious signal filtering rule; a final scan test module, used to automatically generate final scan test parameters based on the frequency information and spatial pose information corresponding to the marker point, and control the spectrum testing device to perform a final scan test on the marker point; and a spurious emission test result generation module, used to perform maximum value comparison processing on the final scan test results obtained under different spatial poses during the final scan test to generate corresponding spurious emission test result data.

[0006] One or more technical solutions provided in this application have at least the following technical effects or advantages:

[0007] The automated control method and system for millimeter-wave radar spurious emission testing provided in this application relate to the field of electrical measurement technology. It utilizes automated control of spectrum testing equipment and a position locator to perform a pre-scan of the millimeter-wave radar equipment. Based on the pre-scan data, marker points are automatically generated, and final scan test parameters are generated according to the frequency and spatial pose information of the marker points. During the final scan test, the test parameters are dynamically adjusted, the scan path is optimized, and accurate spurious emission test results are generated. This solves the technical problem that existing millimeter-wave radar spurious emission testing methods struggle to comprehensively cover spurious emission characteristics under different spatial poses, resulting in low testing efficiency and accuracy. It achieves the technical effect of comprehensively covering spurious emission characteristics under different spatial poses and improving testing efficiency and accuracy through automated control and optimized testing processes. Attached Figure Description

[0008] To more clearly illustrate the technical solutions in the embodiments of the present invention, the accompanying drawings used in the description of the embodiments will be briefly introduced below. Obviously, the accompanying drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0009] Figure 1 A schematic flowchart of an automated control method for millimeter-wave radar spurious emissions testing provided in an embodiment of this application;

[0010] Figure 2 This is a schematic diagram of the automated control system structure for millimeter-wave radar spurious emissions testing provided in an embodiment of this application.

[0011] Figure labeling: 11 Pre-scan test module, 12 Marker point recognition module, 13 Final scan test module, 14 Stray test result generation module. Detailed Implementation

[0012] This application provides an automated control method and system for millimeter-wave radar spurious emission testing, which solves the technical problem that existing millimeter-wave radar spurious emission testing methods are unable to fully cover the spurious emission characteristics under different spatial poses, resulting in low testing efficiency and accuracy.

[0013] The technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only a part of the embodiments of this application, and not all of them. All other embodiments obtained by those skilled in the art based on the embodiments of this application without creative effort are within the scope of protection of this application.

[0014] It should be noted that the terms "first," "second," etc., in the specification and accompanying drawings of this application are used to distinguish similar objects and are not necessarily used to describe a specific order or sequence. It should be understood that such data can be interchanged where appropriate so that the embodiments of this application described herein can be implemented in orders other than those illustrated or described herein. Furthermore, the terms "comprising" and "having," and any variations thereof, are intended to cover non-exclusive inclusion; for example, a process, method, system, product, or server that includes a series of steps or units is not necessarily limited to those steps or units explicitly listed, but may include other steps or modules not explicitly listed or inherent to such processes, methods, products, or devices.

[0015] Example 1, as Figure 1 As shown, this application provides an automated control method for millimeter-wave radar spurious emissions testing, the method comprising:

[0016] P10: Control the spectrum testing equipment to perform a pre-scan test on the millimeter-wave radar equipment under test within a preset frequency range. During the pre-scan test, synchronously control the position locator to move according to a preset spatial pose sequence to obtain stray radiation test data under different spatial poses.

[0017] Furthermore, during the pre-scan test, the position locator is synchronously controlled to move according to a preset spatial pose sequence. In this embodiment, step P10 further includes:

[0018] P11: Set the first spatial pose traversal rule, the traversal order of the first spatial pose traversal rule is antenna frequency band switching - antenna tower height adjustment - antenna tower polarization switching - device under test placement surface switching - turntable horizontal rotation - turntable vertical rotation; P12: Set the second spatial pose traversal rule, the traversal order of the second spatial pose traversal rule is antenna frequency band switching - antenna tower height adjustment - antenna tower polarization switching - device under test placement surface switching - turntable horizontal rotation; P13: Determine whether to enable the turntable according to the test configuration; P14: When the turntable is enabled, control the position locator to move the spatial pose sequence according to the traversal order of the first spatial pose traversal rule; P15: When the turntable is not enabled, control the position locator to move the spatial pose sequence according to the traversal order of the second spatial pose traversal rule.

[0019] It should be understood that, in order to ensure a comprehensive and accurate assessment of the stray radiation characteristics of the millimeter-wave radar equipment under test (EUT) in different spatial poses, this application designs a set of targeted positioner control logic. The core of this logic is to adopt different spatial pose traversal rules according to whether the turntable is enabled in the test configuration, thereby realizing omnidirectional and multi-angle stray radiation testing of the equipment under test.

[0020] Specifically, when the turntable is enabled in the test configuration, the positioner will operate according to the first spatial pose traversal rule. First, the operating frequency band of the antenna is switched according to the test requirements to ensure that the test can be conducted across the entire frequency range of the millimeter-wave radar equipment, thereby covering the equipment's operating state at different frequencies and providing a foundation for subsequent spurious radiation testing. After selecting a suitable frequency band, the system will adjust the height of the antenna tower to simulate various height environments that the radar equipment may face in actual applications, ensuring the comprehensiveness and applicability of the test results. Subsequently, the polarization mode of the antenna tower is switched, which is crucial for evaluating the spurious radiation characteristics of the millimeter-wave radar under different polarization states, as the polarization mode affects the signal propagation and reception characteristics. After completing the polarization switching, the placement surface of the device under test is adjusted so that different sides face the antenna tower, ensuring that the test can cover the spurious radiation characteristics of the equipment in all directions and avoiding test omissions due to different equipment placement orientations. After completing the above adjustments, the turntable is controlled to rotate horizontally, allowing the antenna to be aligned with the device under test from different angles, thereby comprehensively evaluating the equipment's spurious radiation in the horizontal direction. Finally, the turntable is rotated vertically to further expand the test angle, ensuring that the test can fully cover the stray radiation characteristics of the device under test in three-dimensional space. Through the above steps, the first spatial pose traversal rule can realize all-round, multi-angle stray radiation testing of the device under test, laying a solid foundation for subsequent stray signal screening and final scan testing.

[0021] When the turntable is not enabled in the test configuration, the positioner will operate according to the second spatial pose traversal rule. The main difference between this rule and the first rule is that the vertical rotation step is omitted, thus simplifying the test process. Specifically, the system first switches the antenna's operating frequency band to cover the entire frequency range. Then, the antenna tower height is adjusted to accommodate test requirements at different heights. Next, the antenna tower polarization is switched to evaluate the spurious radiation characteristics of the device under different polarization states. Afterward, the placement of the device under test is adjusted so that different sides face the antenna tower. Finally, only the horizontal rotation of the turntable is performed to evaluate the device's spurious radiation characteristics in the horizontal direction. Although the vertical rotation function of the turntable is not enabled, this simplified rule can still meet the test requirements to a certain extent, while reducing test complexity and improving test efficiency.

[0022] To implement the aforementioned spatial pose traversal rules, the system determines whether to enable the turntable during the pre-scan test based on the test configuration. The turntable is a device used to adjust the position of the device under test (DUT) in space, providing horizontal and vertical rotation capabilities. Enabling the turntable allows for precise control of the device's spatial position, ensuring test coverage of all angles and providing comprehensive data. Without enabling the turntable, spatial position adjustment must be achieved through other methods. The system automatically determines whether to enable the turntable through software logic, requiring no manual intervention.

[0023] When the turntable is activated, the system controls the positioner to move sequentially according to the first spatial pose traversal rule. Precise control of the positioner's movement ensures that the test can comprehensively evaluate the spurious radiation characteristics of the device under test (DUT) under different spatial conditions. The specific execution process includes controlling the spectrum testing equipment to perform operations such as antenna band switching, antenna tower height adjustment, antenna tower polarization switching, and DUT placement surface switching. Then, the positioner controls the turntable to rotate horizontally, and the spectrum testing equipment automatically scans and records data after each rotation. Next, the positioner controls the turntable to rotate vertically, and the spectrum testing equipment scans again after each rotation. After all steps are completed, the testing equipment automatically saves the test data under different spatial poses and generates test results according to the set rules.

[0024] Conversely, when the turntable is not activated, the system controls the positioner to move sequentially according to the second spatial pose traversal rule. While this simplified rule has limitations in terms of test angle coverage, it still meets testing requirements to a certain extent, while improving testing flexibility and adaptability. For example, the specific execution process includes sequentially performing operations such as antenna band switching, antenna tower height adjustment, antenna tower polarization switching, and switching the placement surface of the device under test. The positioner controls the turntable to rotate horizontally, and the spectrum testing equipment performs data acquisition after each rotation.

[0025] Through the detailed and coherent description above, this application ensures that the test can comprehensively evaluate the stray radiation characteristics of the device under test under different spatial conditions through a sophisticated position locator control logic during the pre-scan test phase.

[0026] P20: Based on the stray radiation test data of all spatial poses obtained from the pre-scan test, at least one stray candidate frequency point is automatically identified and generated as a marker point according to the preset stray signal screening rules.

[0027] Furthermore, automatically identifying and generating at least one spurious candidate frequency point as a marker point, step P20 of this embodiment also includes:

[0028] P21: Based on the pre-scan test data, within each limit sub-band, a preset number of frequency points are automatically selected as marker points according to the principle of signal power from large to small.

[0029] Optionally, the process proceeds to the spurious signal screening stage. Using preset spurious signal screening rules, the spurious radiation test data acquired during the pre-scan test under all spatial poses is analyzed, and at least one spurious candidate frequency point is automatically identified and generated as a marker point. These marker points will be the focus of subsequent final scan tests to further accurately evaluate spurious radiation characteristics.

[0030] To achieve this goal, the pre-scan test data is first divided into predefined limit sub-bands. These limit sub-bands are frequency ranges predefined according to relevant standards or test requirements, each corresponding to a specific spurious radiation power limit. This division helps break down complex spectral data into smaller, more manageable segments, thereby improving screening efficiency and accuracy. Next, within each limit sub-band, the signals are arranged in descending order of power, and the frequency points with the highest power are selected as candidate frequencies. These high-power frequencies are generally more likely to be actual spurious radiation sources and therefore have a higher screening priority.

[0031] Next, according to preset screening rules, a preset number of frequency points are automatically selected as marker points within each limit sub-band. The preset number can be adjusted based on testing requirements and equipment performance to ensure coverage of potential spurious signals without unduly increasing the complexity of subsequent tests. For example, in some application scenarios, the system may be configured to select the three highest-power frequency points within each limit sub-band as marker points. These marker points will be recorded and marked as key targets for subsequent final scan tests.

[0032] Through this automated screening mechanism, this application can efficiently identify potential spurious signal frequency points from a large amount of pre-scan data, reducing the need for manual intervention, while ensuring that the selection of marker points meets the test requirements, providing accurate targets for subsequent testing and data analysis.

[0033] Furthermore, automatically identifying and generating at least one spurious candidate frequency point as a marker point, step P20 of this embodiment also includes:

[0034] P23: Based on signal power ranking, candidate frequency points are selected for the target quantity. Multidimensional analysis is performed based on pre-scan test data to calculate the threat coefficient of each candidate frequency point. The multidimensional analysis includes frequency domain characteristics, spatial domain directivity, and proximity analysis to standard limits. P24: Based on the threat coefficient, a preset number of points are selected for screening to determine marker points. The marker points are identified by the threat coefficient.

[0035] In one possible embodiment of this application, in order to further optimize the screening process of spurious candidate frequencies, after initially screening out the target number of candidate frequencies based on signal power sorting, these candidate frequencies are further subjected to multi-dimensional analysis, including frequency domain characteristic analysis, spatial domain directivity analysis, and proximity analysis to standard limits, so as to improve the accuracy and effectiveness of marker selection.

[0036] Specifically, firstly, frequency domain characteristic analysis evaluates the performance of each candidate frequency point in the frequency domain, such as signal bandwidth, peak value, and spectral distribution. A wider signal bandwidth or a higher signal peak value may make the impact of that frequency point on the equipment more significant, and thus it will be considered a more threatening frequency point. Secondly, spatial directivity analysis considers the radiation intensity of the frequency point at different spatial angles and its interference effect on the equipment. For example, if the radiation directionality of a frequency point is strong, especially concentrated in a certain direction of the equipment, then that frequency point may have a greater impact on the equipment, and therefore has a higher threat factor. Finally, the approximation of the signal power of each candidate frequency point to the relevant standard limits is analyzed. If the signal power of a frequency point is close to or exceeds the standard limit, then the impact of that frequency point on the equipment will be more severe, thus increasing its threat factor.

[0037] After completing the multidimensional analysis described above, the system calculates a threat coefficient for each candidate frequency. This coefficient, calculated using weighted frequency domain characteristics, spatial directivity, and proximity to standard limits, yields a comprehensive index used to quantify the potential hazard level of each candidate frequency. The magnitude of the threat coefficient directly reflects the potential impact of that frequency on equipment performance or compliance; a higher coefficient indicates a greater threat level.

[0038] Subsequently, based on these threat coefficients, further screening is performed, selecting a preset number of frequency points as the final markers in descending order of threat coefficient. The preset number can be adjusted according to testing requirements and equipment performance to ensure coverage of potentially high-threat spurious signals without unduly increasing the complexity of subsequent testing. These markers not only have high signal power but also significant influence in threat coefficient, thus accurately reflecting the frequency points where spurious radiation may have a major impact on equipment performance. Each marker will be accompanied by a threat coefficient indicator, which helps subsequent analysis systems or testing personnel to more clearly identify and focus on those frequencies that have a significant impact on the equipment.

[0039] By introducing multidimensional analysis and threat coefficient calculation, this application can more accurately identify potential high-threat spurious frequency points. Compared with traditional screening methods based on single signal power, this multidimensional analysis method can comprehensively consider information from multiple dimensions such as frequency domain, spatial domain, and standard limits, thereby more comprehensively assessing the potential hazard of each candidate frequency point.

[0040] P30: Based on the frequency information and spatial pose information corresponding to the marked point, automatically generate final scan test parameters and control the spectrum test equipment to perform final scan test on the marked point.

[0041] Furthermore, based on the frequency information and spatial pose information corresponding to the marked points, the final scan test parameters are automatically generated. Step P30 in this embodiment further includes:

[0042] P31: Using the marked point frequency as the center frequency and the preset final scan frequency width as the span, determine the start and end frequencies of the final scan test; P32: Select the scan point calculation mode according to the configuration. If based on factor calculation, the scan point count equals the preset factor multiplied by the quotient of the span and the measured resolution bandwidth, plus one; otherwise, directly use the preset scan point count; P33: Select the scan time calculation mode according to the configuration. If based on factor calculation, the scan time equals the preset factor multiplied by the scan point count, and then multiplied by the rated cycle or measured duty cycle of the device under test; otherwise, directly use the preset scan time.

[0043] Specifically, based on the frequency and spatial pose information of the markers generated in the pre-scan stage, the final scan test parameters are automatically generated, and the spectrum testing equipment is controlled to perform a precise final scan test on these markers.

[0044] First, the frequency range for the final scan test is determined based on the frequency information of the marker points. Specifically, the system uses the marker point frequency as the center frequency and offsets it upwards and downwards by a preset sweep width, respectively, to obtain the start and end frequencies for the final scan test. For example, if the marker point frequency is 10 GHz and the preset final scan sweep width is 100 MHz, the system sets the start frequency to 9.95 GHz and the end frequency to 10.05 GHz. This precise frequency range setting ensures that the final scan test focuses on the frequency range where the marker point is located, while covering a sufficient frequency band to avoid missing potential stray radiation signals.

[0045] Next, select the scan point calculation mode based on the configuration. If the factor-based calculation mode is used, the system will dynamically calculate the number of scan points based on the preset factor, sweep span, and measured resolution bandwidth (RBW). Specifically, the number of scan points equals the preset factor multiplied by the quotient of the sweep span and the measured resolution bandwidth, plus one point. For example, if the sweep span is 100MHz, the measured resolution bandwidth is 1MHz, and the preset factor is 1, then the number of scan points is 101. This calculation method can dynamically adjust the number of scan points according to test requirements, ensuring that the test resolution meets the requirements. If the factor-based calculation mode is not used in the test configuration, the system directly uses the preset number of scan points. This mode is suitable for test scenarios with fixed requirements for the number of scan points, simplifying the calculation process and improving test efficiency.

[0046] After determining the number of scan points, the system further selects the scan time calculation mode based on the configuration. If a factor-based calculation mode is used, the system dynamically calculates the scan time based on a preset factor, the number of scan points, and the rated cycle or measured duty cycle of the device under test (DUT). Specifically, the scan time equals the preset factor multiplied by the number of scan points, and then multiplied by the DUT's cycle. For example, if the number of scan points is 101, the preset factor is 1, and the DUT's rated cycle is 10ms, then the scan time is 1010ms. This calculation method dynamically adjusts the scan time according to the device's actual operating cycle, ensuring the test can be completed within one full operating cycle of the device, thereby improving the accuracy of the test results. If the test configuration does not use a factor-based calculation mode, the system directly uses the preset scan time. This mode is suitable for test scenarios with specific requirements for scan time, simplifying time calculation and ensuring test stability.

[0047] After generating the above parameters, the system will control the spectrum testing equipment to perform a final scan test on the marked points according to the generated final scan test parameters. During the test, the system will monitor the status of the testing equipment in real time and record all data during the test, including frequency, power, scan time, etc., for subsequent data analysis and result evaluation.

[0048] Through the above process, this application ensures accurate evaluation of high-threat spurious candidate frequencies selected in the pre-scan stage by configuring refined test parameters in the final scan stage. This process not only improves the automation level of testing but also ensures the rationality of test parameters and the reliability of test results.

[0049] Furthermore, step P30 in this embodiment of the application also includes:

[0050] P34: Based on the threat coefficient identifier of the marked point, configure the sweep width span of the corresponding marked point, wherein the marked point with a threat coefficient higher than a first threshold is configured with a first sweep width; the marked point with a threat coefficient lower than the first threshold is configured with a second sweep width greater than the first sweep width; P35: Assign values ​​to preset factors according to the threat coefficient identifier, and determine the scanning time and number of scanning points parameters based on the preset factors, wherein the higher the threat coefficient, the larger the assigned value of the preset factors.

[0051] Optionally, the final scan test parameter generation process for marker points can be further optimized by configuring the scan frequency width and adjusting the preset factor to ensure that the test process can be precisely controlled for marker points with different threat coefficients.

[0052] Specifically, the system first configures the sweep width span of each marker based on its threat coefficient. For markers with a threat coefficient higher than a first threshold, the system configures their sweep width span as the first sweep width. This narrower width provides higher scanning accuracy, allowing for more refined testing of frequencies with a higher threat level. For markers with a threat coefficient lower than the first threshold, a second sweep width, larger than the first sweep width, is configured, suitable for frequencies with less impact on the equipment. The logic behind this differentiated configuration is that markers with higher threat coefficients have a greater impact on the equipment and typically require a narrower sweep width for more refined evaluation, thus more accurately capturing spurious radiation characteristics. Conversely, markers with low threat coefficients can use a wider sweep width for faster assessment of their spurious radiation, saving testing time. The first and second thresholds can be set based on empirical values.

[0053] Furthermore, preset factors are assigned values ​​based on the threat coefficient of the marker points, and the scan time and scan point count parameters are determined based on these preset factors. Specifically, the higher the threat coefficient, the larger the preset factor value assigned to the marker point. This is because marker points with high threat coefficients typically represent a higher frequency of impact on the equipment, requiring higher test precision and longer scan times to ensure test accuracy. The system dynamically adjusts these preset factors when calculating scan time and scan point count. For example, for marker points with high threat coefficients, a larger preset factor will result in a longer scan time and more scan points, thus providing more detailed test data; while for marker points with low threat coefficients, a smaller preset factor will reduce scan time and scan point count, improving test efficiency.

[0054] By using this dynamic parameter configuration method based on threat coefficients, the system can rationally allocate testing resources according to the potential hazard level of each marker, thereby ensuring that each marker can be tested appropriately and improving overall testing efficiency.

[0055] Furthermore, before performing the final scan test, step P30 of this embodiment of the application also includes:

[0056] P36: Based on the pre-scan test data, draw a spatial distribution heatmap of the signal power at each marker point; P37: Based on the spatial distribution heatmap, identify high-radiation areas where the signal power is higher than the spatial threshold, and use these as core scanning areas; P38: Configure the priority weight of the core scanning areas, with minimizing the total test time as the objective function, and using the core scanning areas and their priority weights, as well as the time constraints in the final scan test parameters, as inputs, and generate an optimized final scan spatial search path through a path planning algorithm.

[0057] It should be understood that the test path can be further optimized before performing the final scan test to ensure that the test process efficiently and specifically covers the most critical test areas.

[0058] First, based on the data collected during the pre-scan testing phase, a spatial distribution heatmap of the signal power is generated for each marked point. This process combines the signal power at each marked point with its corresponding spatial pose information to generate an intuitive heatmap, clearly showing the variation of signal power in different spatial locations. The generation of the heatmap comprehensively considers multiple dimensions, such as the antenna tower height, polarization direction, and the horizontal and vertical rotation angles of the turntable, to ensure a comprehensive reflection of the spatial characteristics of the signal power. For example, the system uses different colors to represent different intensity ranges of signal power and marks the location of each signal power measurement point in three-dimensional spatial coordinates, thus forming an intuitive signal power distribution map. For example, areas with higher signal power may appear red or orange, while areas with lower signal power may appear blue or green. This heatmap helps testers or automated systems quickly identify which areas have higher signal power and which areas may have stronger spurious radiation.

[0059] Based on the aforementioned spatial distribution heatmap, regions with signal power exceeding a preset spatial threshold are further identified and defined as core scanning areas. The preset spatial threshold is pre-set according to test requirements and equipment characteristics, used to distinguish between high-radiation and low-radiation areas. Any area exceeding this preset spatial threshold is considered to have strong spurious radiation and has a higher testing priority. The system can automatically select these high-radiation areas as key areas for subsequent testing through heatmap analysis. These areas typically correspond to spatial locations where spurious radiation from millimeter-wave radar equipment is significant, therefore requiring priority and detailed evaluation in the final scan test. For example, the system can set a power threshold to identify all consecutive areas in the heatmap exceeding that threshold as core scanning areas and record the spatial range and location information of these areas.

[0060] Next, priority values ​​are assigned to each core scan region. These priority values ​​are assigned based on the region's average signal power and the concentration of its spatial distribution. Specifically, the higher the average signal power of a region, or the more concentrated its signal distribution, the higher its priority value. This is because regions with high signal power or concentrated spatial distribution typically have a greater impact on device performance and therefore need to be prioritized in the final scan test. The system uses these priority values ​​to determine the level of attention given to each region during testing, ensuring that the most important regions are thoroughly tested first.

[0061] Next, the system uses minimizing the total test time as the optimization objective function. Taking into account factors such as the priority of core scanning regions and time constraints in the final scan test parameters, it generates an optimized final scan spatial search path through a path planning algorithm. This algorithm dynamically adjusts the search path based on the priority of core scanning regions and time constraints, ensuring that high-priority regions are scanned first during testing. Simultaneously, it optimizes path planning, reducing the movement time of the test equipment between different spatial locations, thereby improving test efficiency. For example, the algorithm might prioritize scanning the region with the highest average signal power and the most concentrated spatial distribution, then sequentially scan other core scanning regions, and finally scan non-core regions. In this way, the optimized final scan spatial search path not only ensures the comprehensiveness and accuracy of the test but also minimizes the total test time by rationally arranging the test order.

[0062] P40: During the final scan test, the maximum value of the final scan test results obtained under different spatial poses is compared to generate the corresponding stray test result data.

[0063] Furthermore, step P40 in this embodiment of the application also includes:

[0064] P41: During the final scan test, acquire the spectral curve data under the current spatial pose in real time or at preset intervals; P42: Compare the acquired spectral curve data with the existing maximum value curve data point by point, and retain the larger value to update the maximum value curve; P43: At the end of the test, use the maximum value curve as the final spurious test result of the marked point.

[0065] Optionally, during the final scan test, in order to accurately evaluate the stray radiation characteristics of the millimeter-wave radar equipment under different spatial poses, the system performs maximum value comparison processing on the final scan test results obtained under different spatial poses to generate corresponding stray test result data.

[0066] First, during the final scan test, the system acquires spectral curve data in real time or at preset intervals under the current spatial pose. Spectral curve data refers to the result obtained by the spectrum testing equipment scanning the spurious radiation signal in the frequency band of the marked point under a specific spatial pose. The system acquires test data according to the set time interval or in real time, collecting the corresponding spectral curve for each spatial pose. For example, the system can stay in each spatial pose for a certain period, such as 1 second, during which time complete spectral curve data is acquired, ensuring the accuracy and completeness of the data.

[0067] Next, the acquired spectral curve data is compared point-by-point with the existing maximum value curve data. After each acquisition of new spectral curve data, the system compares it point-to-point with the previously recorded maximum value curve. For each frequency point, if the signal power at the current spatial pose is greater than the value in the existing maximum value curve, the maximum value curve is updated, retaining the larger signal power value. This ensures that the final result is based on the statistics of the strongest spurious radiation signal throughout the entire test. For example, assuming the signal power at frequency 10.01 GHz is -20 dBm at the current spatial pose, while the existing maximum value curve shows -25 dBm, the system will update that point in the maximum value curve to -20 dBm.

[0068] By continuously updating the maximum value curve, the system can dynamically track the radiation at each marker point, ensuring that the final result reflects the strongest radiation signal at all spatial poses. This point-by-point comparison method not only improves the accuracy of the test but also avoids missing strong radiation signals at certain angles or directions.

[0069] At the end of the test, the system will use the final maximum value curve as the final spurious emission test result for that marker point. The maximum value curve summarizes the maximum signal power at each frequency point under all spatial poses, comprehensively reflecting the maximum spurious emission level of the millimeter-wave radar equipment in all directions. This final result not only provides crucial data support for the evaluation of the equipment's spurious emission performance but can also be used for subsequent compliance assessments and optimization improvements. For example, if the signal power at certain frequency points in the final spurious emission test results exceeds the limits specified in relevant standards, it indicates that the equipment has excessive spurious emission at these frequency points, requiring further design optimization or adjustment of operating parameters.

[0070] Furthermore, during the pre-scan test and / or final scan test, the method of performing the spectrum scan is controlled according to the selected turntable rotation mode. In this embodiment, step P40 further includes:

[0071] P44: If the step rotation mode is selected, the control flow is that after the positioner moves and stabilizes to a preset spatial pose, the spectrum testing equipment is triggered to perform a complete frequency scan; P45: After the current scan is completed, the positioner moves to the next pose; P46: If the continuous rotation mode is selected, the control flow is that the spectrum testing equipment performs continuous frequency scans while the turntable rotates continuously in a single direction; the spectrum scan is paused only when the antenna polarization state, antenna height, or the placement surface of the device under test needs to be switched, and resumed after the switch is completed.

[0072] Specifically, during the pre-scan and / or final scan tests, to ensure the coordination between the spectrum scan and the turntable rotation mode, this application further refines the method of controlling the spectrum scan according to the selected turntable rotation mode. Based on different turntable rotation modes, the triggering and execution mechanism of the spectrum scan is optimized, thereby improving test efficiency and ensuring the accuracy of test results.

[0073] Specifically, if the step-rotation mode is selected, the control flow is as follows: After the positioner moves and stabilizes at a preset spatial pose, the spectrum testing equipment is triggered to perform a complete frequency scan. After the scan is completed, the positioner moves to the next pose and begins the next frequency scan cycle. This process ensures that stray radiation signals in each spatial pose are completely scanned, and the test data between each spatial pose are relatively independent, resulting in accurate results. For example, when the turntable moves from one angle to the next, the system waits for the turntable to stabilize completely before triggering a spectrum scan, avoiding signal interference or instability caused by the turntable movement from affecting the scan results.

[0074] In this mode, since the position locator needs to reach the next preset position and stabilize after each scan, the efficiency of the entire testing process is relatively low, but it can ensure the accuracy and integrity of each test point. It is suitable for situations that require high-precision scanning but where the testing time is not so tight.

[0075] On the other hand, if the continuous rotation mode is selected, the control process proceeds as follows: In this mode, the turntable rotates continuously in a single direction, and the spectrum testing equipment performs continuous frequency scanning during the rotation. Unlike the step rotation mode, in continuous rotation mode, the spectrum scanning does not pause at each spatial pose, but rather acquires spectrum data in real time during the continuous rotation of the turntable. This method improves testing efficiency and reduces the waiting time for each scan, making it suitable for time-sensitive testing tasks.

[0076] However, in certain situations, the system needs to pause spectrum scanning. A switching mechanism is in place: spectrum scanning pauses only when the antenna polarization, antenna height, or the placement of the device under test needs to be changed. In this case, the system first stops the current spectrum scan, waits for the antenna polarization, antenna height, or device placement to be adjusted, and then resumes the spectrum scan. These adjustments affect the directionality and range of signal reception, therefore pausing the scan is necessary to ensure the accuracy of the adjusted data.

[0077] By employing these two turntable rotation modes, the system can flexibly select the appropriate testing mode to achieve testing efficiency and accuracy in different scenarios. In step rotation mode, it ensures comprehensive data acquisition for each spatial pose and guarantees the independence and accuracy of each scan. In continuous rotation mode, continuous scanning improves testing efficiency, making it particularly suitable for scenarios requiring shorter testing cycles. Therefore, by appropriately selecting the turntable rotation mode, the system can optimize the testing process according to specific testing needs, improving testing efficiency while ensuring data comprehensiveness.

[0078] In summary, the embodiments of this application have at least the following technical effects:

[0079] This application achieves full automation of millimeter-wave radar spurious emission testing through automated control spectrum testing equipment and position locators, significantly improving testing efficiency and result accuracy. Based on multidimensional analysis and threat coefficient calculation, it accurately identifies high-threat spurious signals and optimizes test resource allocation. It supports multiple turntable rotation modes and dynamically adjusts the spectrum scanning mechanism, enhancing the adaptability and flexibility of the testing method. By generating the final test results through maximum value comparison processing, it comprehensively reflects the maximum spurious emission level of the equipment under different spatial poses, ensuring the integrity and reliability of the test results.

[0080] This achieves the technical effect of comprehensively covering stray radiation characteristics under different spatial poses through automated control and optimized testing processes, thereby improving testing efficiency and accuracy.

[0081] Example 2, based on the same inventive concept as the automated control method for millimeter-wave radar spurious emissions testing in the aforementioned examples, such as... Figure 2 As shown, this application provides an automated control system for millimeter-wave radar spurious emissions testing. The system and method embodiments in this application are based on the same inventive concept. The system includes:

[0082] The pre-scan test module 11 is used to control the spectrum test equipment to perform pre-scan tests on the millimeter-wave radar equipment under test within a preset frequency range. During the pre-scan test, the position locator is synchronously controlled to move according to a preset spatial pose sequence to obtain stray radiation test data under different spatial poses.

[0083] The marker identification module 12 is used to automatically identify and generate at least one spurious candidate frequency point as a marker point based on the spurious radiation test data under all spatial poses obtained from the pre-scan test and according to the preset spurious signal filtering rules.

[0084] The final scan test module 13 is used to automatically generate final scan test parameters based on the frequency information and spatial pose information corresponding to the marker points, and control the spectrum test equipment to perform a final scan test on the marker points.

[0085] The stray test result generation module 14 is used to perform maximum value comparison processing on the final scan test results obtained under different spatial poses during the final scan test, and generate corresponding stray test result data.

[0086] Furthermore, the pre-scan test module 11 is also used to perform the following steps:

[0087] A first spatial pose traversal rule is set, and the traversal order of the first spatial pose traversal rule is: antenna frequency band switching - antenna tower height adjustment - antenna tower polarization switching - device under test placement surface switching - turntable horizontal rotation - turntable vertical rotation; a second spatial pose traversal rule is set, and the traversal order of the second spatial pose traversal rule is: antenna frequency band switching - antenna tower height adjustment - antenna tower polarization switching - device under test placement surface switching - turntable horizontal rotation; the turntable is enabled or disabled based on the test configuration; when the turntable is enabled, the positioner is controlled to move according to the traversal order of the first spatial pose traversal rule; when the turntable is disabled, the positioner is controlled to move according to the traversal order of the second spatial pose traversal rule.

[0088] Furthermore, the marker recognition module 12 is also used to perform the following steps:

[0089] Based on the pre-scan test data, within each limit sub-band, a preset number of frequency points are automatically selected as marker points according to the principle of signal power from large to small.

[0090] Furthermore, the marker recognition module 12 is also used to perform the following steps:

[0091] Candidate frequency points are selected based on signal power ranking. Multidimensional analysis is performed based on pre-scan test data to calculate the threat coefficient of each candidate frequency point. The multidimensional analysis includes frequency domain characteristics, spatial domain directivity, and proximity analysis to standard limits. Based on the threat coefficient, a preset number of points are selected to determine marker points, wherein the marker points are identified by the threat coefficient.

[0092] Furthermore, the final scan test module 13 is also used to perform the following steps:

[0093] Using the marked point frequency as the center frequency and the preset final scan frequency width as the span, determine the start and end frequencies of the final scan test; select the scan point calculation mode according to the configuration, where if it is based on factor calculation, the scan point number is equal to the preset factor multiplied by the quotient of the span and the measured resolution bandwidth plus one; otherwise, directly use the preset scan point number; select the scan time calculation mode according to the configuration, where if it is based on factor calculation, the scan time is equal to the preset factor multiplied by the scan point number, and then multiplied by the rated cycle or measured duty cycle cycle of the device under test; otherwise, directly use the preset scan time.

[0094] Furthermore, the final scan test module 13 is also used to perform the following steps:

[0095] Based on the threat coefficient identifier of the marked points, the sweep width span of the corresponding marked points is configured, wherein marked points with a threat coefficient higher than a first threshold are configured with a first sweep width; marked points with a threat coefficient lower than the first threshold are configured with a second sweep width greater than the first sweep width; preset factors are assigned values ​​according to the threat coefficient identifier, and scanning time and number of scanning points are determined based on the preset factors, wherein the higher the threat coefficient, the larger the assigned value of the preset factors.

[0096] Furthermore, the final scan test module 13 is also used to perform the following steps:

[0097] Based on the pre-scan test data, a spatial distribution heatmap of the signal power at each marker point is plotted. Based on the spatial distribution heatmap, high-radiation areas with signal power exceeding the spatial threshold are identified as core scanning areas. The priority weight of the core scanning areas is configured, with minimizing the total test time as the objective function. The core scanning areas and their priority weights, as well as the time constraints in the final scan test parameters, are used as inputs. An optimized final scan spatial search path is generated through a path planning algorithm.

[0098] Furthermore, the stray test result generation module 14 is also used to perform the following steps:

[0099] During the final scan test, the spectral curve data under the current spatial pose is acquired in real time or at preset intervals; the acquired spectral curve data is compared point by point with the existing maximum value curve data, and the larger value is retained to update the maximum value curve; at the end of the test, the maximum value curve is used as the final spurious test result of the marked point.

[0100] Furthermore, the stray test result generation module 14 is also used to perform the following steps:

[0101] If the step rotation mode is selected, the control process is as follows: after the position locator moves and stabilizes to a preset spatial pose, the spectrum testing equipment is triggered to perform a complete frequency scan; after the current scan is completed, the position locator moves to the next pose. If the continuous rotation mode is selected, the control process is as follows: while the turntable rotates continuously in a single direction, the spectrum testing equipment is controlled to perform continuous frequency scans; the spectrum scan is paused only when the antenna polarization state, antenna height, or the placement surface of the device under test needs to be switched, and resumed after the switch is completed.

[0102] It should be noted that the order of the embodiments described above is merely for descriptive purposes and does not represent the superiority or inferiority of the embodiments. Furthermore, the above description focuses on specific embodiments of this specification. Additionally, the processes depicted in the accompanying drawings do not necessarily require a specific or sequential order to achieve the desired results. In some implementations, multitasking and parallel processing are possible or may be advantageous.

[0103] The above description is only a preferred embodiment of this application and is not intended to limit this application. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of this application should be included within the protection scope of this application.

[0104] This specification and accompanying drawings are merely illustrative examples of this application and are intended to cover any and all modifications, variations, combinations, or equivalents within the scope of this application. Clearly, those skilled in the art can make various alterations and modifications to this application without departing from its scope. Therefore, if such modifications and variations fall within the scope of this application and its equivalents, this application intends to include such modifications and variations.

Claims

1. A method for automated control of millimeter wave radar spurious testing, characterized in that, include: The control spectrum testing equipment performs a pre-scan test on the millimeter-wave radar device under test within a preset frequency range. During the pre-scan test, the position locator is simultaneously controlled to move according to a preset spatial pose sequence to obtain stray radiation test data under different spatial poses. Based on the stray radiation test data of all spatial poses obtained from the pre-scan test, at least one stray candidate frequency point is automatically identified and generated as a marker point according to the preset stray signal filtering rules. Based on the frequency information and spatial pose information corresponding to the marked points, the final scan test parameters are automatically generated, and the spectrum test equipment is controlled to perform a final scan test on the marked points. During the final scan test, the maximum value of the final scan test results obtained under different spatial poses is compared to generate the corresponding stray test result data. The process of synchronously controlling the position locator to move according to a preset spatial pose sequence during the pre-scan test includes: Set a first spatial pose traversal rule. The traversal order of the first spatial pose traversal rule is: antenna frequency band switching - antenna tower height adjustment - antenna tower polarization switching - device under test placement surface switching - turntable horizontal rotation - turntable vertical rotation. Set the second spatial pose traversal rule. The traversal order of the second spatial pose traversal rule is: antenna frequency band switching - antenna tower height adjustment - antenna tower polarization switching - device under test placement surface switching - turntable horizontal rotation. Determine whether to enable the turntable based on the test configuration; When the turntable is activated, the position locator is controlled to move in the spatial pose sequence according to the traversal order of the first spatial pose traversal rule. When the turntable is not enabled, the position locator is controlled to move in the spatial pose sequence according to the traversal order of the second spatial pose traversal rule.

2. The automated control method for millimeter-wave radar spurious emission testing according to claim 1, characterized in that, Based on the frequency information and spatial pose information corresponding to the marked points, the final scan test parameters are automatically generated, including: Using the marked point frequency as the center frequency and the preset final scan frequency width as the span, determine the start and end frequencies of the final scan test. Select the scan point calculation mode according to the configuration. If it is based on factor calculation, the scan point count is equal to the preset factor multiplied by the quotient of the span and the measured resolution bandwidth plus one; otherwise, the preset scan point count is used directly. Select the scan time calculation mode according to the configuration. If it is based on factor calculation, the scan time is equal to the preset factor multiplied by the number of scan points, and then multiplied by the rated cycle or actual duty cycle of the device under test; otherwise, the preset scan time is used directly.

3. The automated control method for millimeter-wave radar spurious emission testing according to claim 1, characterized in that, Automatically identify and generate at least one spurious candidate frequency point as a marker point, including: Based on the pre-scan test data, within each limit sub-band, a preset number of frequency points are automatically selected as marker points according to the principle of signal power from large to small.

4. The automated control method for millimeter-wave radar spurious emission testing according to claim 1, characterized in that, The final scan test results obtained under different spatial poses are compared by maximum value processing to generate corresponding stray test result data, including: During the final scan test, the spectral curve data of the current spatial pose is acquired in real time or at preset intervals. The acquired spectrum curve data is compared point by point with the existing maximum value curve data, and the larger value is retained to update the maximum value curve. At the end of the test, the maximum value curve is taken as the final stray test result for that marker point.

5. The automated control method for millimeter-wave radar spurious emission testing according to claim 3, characterized in that, Automatically identify and generate at least one spurious candidate frequency point as a marker point, including: Based on the signal power ranking, candidate frequency points for the target number are screened. Multidimensional analysis is performed based on the pre-scan test data to calculate the threat coefficient of each candidate frequency point. The multidimensional analysis includes frequency domain characteristics, spatial domain directivity, and closeness to standard limits. Based on the threat coefficient, a preset number of marker points are selected and filtered to determine the marker points, wherein each marker point has a threat coefficient identifier.

6. The automated control method for millimeter-wave radar spurious emission testing according to claim 5, characterized in that, Based on the frequency information and spatial pose information corresponding to the marked points, the final scan test parameters are automatically generated, including: Based on the threat coefficient identifier of the marked points, the sweep width span of the corresponding marked points is configured, wherein marked points with a threat coefficient higher than a first threshold are configured with a first sweep width; marked points with a threat coefficient lower than the first threshold are configured with a second sweep width greater than the first sweep width. The preset factors are assigned values ​​based on the threat coefficient identifier, and the scanning time and number of scanning points are determined based on the preset factors. The higher the threat coefficient, the larger the assigned value of the preset factors.

7. The automated control method for millimeter-wave radar spurious emission testing according to claim 6, characterized in that, Before performing the final scan test, the following is also included: Based on the pre-scan test data, draw a spatial distribution heatmap of the signal power at each marker point; Based on the spatial distribution heatmap, high-radiation regions with signal power exceeding the spatial threshold are identified as core scanning regions. Configure the priority value of the core scanning region, take minimizing the total test time as the objective function, and take the core scanning region and its priority value, as well as the time constraint in the final scan test parameters as input, and generate an optimized final scan space search path through a path planning algorithm.

8. The automated control method for millimeter-wave radar spurious emission testing according to claim 1, characterized in that, During the pre-scan and / or final scan tests, the spectral scanning method is controlled according to the selected turntable rotation mode, including: If the step rotation mode is selected, the control process is as follows: after the positioner moves and stabilizes in a preset spatial pose, the spectrum test equipment is triggered to perform a complete frequency scan; after the scan is completed, the positioner moves to the next pose. If the continuous rotation mode is selected, the control process is to control the spectrum testing equipment to perform continuous frequency scanning while the turntable rotates continuously in a single direction; the spectrum scanning is paused only when the antenna polarization state, antenna height, or the placement surface of the device under test needs to be switched, and resumed after the switch is completed.

9. An automated control system for millimeter-wave radar spurious emission testing, characterized in that, An automated control method for performing millimeter-wave radar spurious emissions testing according to any one of claims 1 to 8, the system comprising: The pre-scan test module is used to control the spectrum test equipment to perform pre-scan tests on the millimeter-wave radar equipment under test within a preset frequency range. During the pre-scan test, the position locator is synchronously controlled to move according to a preset spatial pose sequence to obtain stray radiation test data under different spatial poses. The marker identification module is used to automatically identify and generate at least one spurious candidate frequency point as a marker point based on the spurious radiation test data under all spatial poses obtained from the pre-scan test, according to the preset spurious signal filtering rules. The final scan test module is used to automatically generate final scan test parameters based on the frequency information and spatial pose information corresponding to the marker points, and control the spectrum test equipment to perform a final scan test on the marker points; The stray test result generation module is used to compare the maximum values ​​of the final scan test results obtained under different spatial poses during the final scan test and generate the corresponding stray test result data.

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