Solid state hardware hot plug automated testing method and system

Abstract

The application discloses a solid-state hardware hot plug automation test method and system, relates to the technical field of computer hardware testing, and discloses the solid-state hardware hot plug automation test method and system. The disclosed solid-state hardware hot plug automation test method and system receives test configuration parameters input by a user through an automation script, controls an auxiliary jig to perform on-off operation of a solid-state hardware power line and a data line, collects electrical parameters in real time for analysis, automatically verifies system identification states, thereby efficiently and accurately completing a test process, improving the test efficiency of solid-state hardware hot plug, guaranteeing the consistency and repeatability of the test process, reducing human operation errors, improving the test precision of solid-state hardware hot plug, and avoiding hardware damage and system failure.

Description

Technical Field

[0001] This application relates to the field of computer hardware testing technology, and in particular to automated testing methods and systems for hot-swappable solid-state hardware. Background Technology

[0002] Hot-swapping testing of hardware devices such as solid-state drives (SSDs) is a crucial step in evaluating their reliability and stability. Current testing processes primarily rely on manual operation or basic automation tools. Testers must manually control the on / off operation of the power and data cables, observing changes in electrical parameters using oscilloscopes or measuring devices, and manually recording the results. This approach significantly reduces testing efficiency, makes it difficult to guarantee consistency and repeatability, and human error can easily distort test data. In repeated plug-in / plug-out cycles, manual operation cannot precisely control the timing of power and data cable disconnections. For example, the time interval between power and data cable disconnections is difficult to maintain stably, potentially causing momentary hardware overload or system crashes, leading to physical hardware damage or operating system malfunctions. While some existing automated testing solutions can achieve simple on / off functionality, they generally lack real-time status monitoring capabilities. They cannot dynamically collect key electrical parameters such as voltage and current during operation, nor can they perform immediate data analysis to identify abnormal states. These solutions cannot automatically pause the test process or save the current state when a sudden change in electrical parameters is detected, making it difficult to trace the cause of the anomaly. Furthermore, existing technologies lack automated verification mechanisms for hardware identification status within the operating system. For example, they cannot automatically query device identification status, transmission bandwidth, or connection rate information, nor can they capture error information in the system kernel logs. Therefore, it is difficult to comprehensively assess the impact of hot-plugging operations on hardware functionality and overall system stability. These issues result in insufficient reliability of test results, failing to meet the requirements of high-precision, high-repeatability testing, and hindering the efficiency of hardware product quality verification.

[0003] The above content is only used to help understand the technical solution of this application and does not represent an admission that the above content is prior art. Summary of the Invention

[0004] The main purpose of this application is to provide an automated testing method and system for hot-swapping solid-state hardware, which aims to improve the testing efficiency and accuracy of hot-swapping of solid-state hardware.

[0005] To achieve the above objectives, this application proposes an automated testing method for hot-plugging solid-state hardware, the method comprising:

[0006] The test configuration parameters are received from the user via an automated script; these parameters include the insertion / removal interval time and the number of insertion / removal cycles.

[0007] The test configuration parameters are sent to the auxiliary fixture to perform the switching operation of the solid-state hardware power line and data line, and electrical parameters are collected during the switching operation to obtain electrical parameter data;

[0008] Electrical parameter data is compared with preset thresholds to generate anomaly detection results;

[0009] When the anomaly judgment result indicates that the operation was successful, after completing one on / off operation, the recognition status of the solid-state hardware in the system is verified to generate a system verification result.

[0010] Based on the anomaly detection results, system verification results, and the number of plug-in / plug-out cycles in the test configuration parameters, the number of successful tests is counted and test report data is generated.

[0011] In one embodiment, the step of sending test configuration parameters to an auxiliary fixture to perform on / off operations on the solid-state hardware power lines and data lines, and acquiring electrical parameters during the on / off operation to obtain electrical parameter data includes:

[0012] The insertion / removal interval time is extracted from the test configuration parameters to generate time control data, and the number of insertion / removal cycles is extracted from the test configuration parameters to generate cycle control data;

[0013] Based on time control data and loop control data, generate wireless control commands containing a sequence of disconnect and connect commands;

[0014] Wireless control commands are sent to the wireless communication module of the auxiliary fixture via wireless communication to control the electromagnetic relay array of the auxiliary fixture to simultaneously perform on / off operations of solid-state hardware power lines and data lines.

[0015] During the on / off operation of the electromagnetic relay array, the power line voltage and power line current changes are collected by the status monitoring circuit of the auxiliary fixture to obtain power line voltage and power line current change data.

[0016] Electrical parameter data is obtained by transmitting power line voltage and current change data back via wireless communication.

[0017] In one embodiment, the step of sending wireless control commands to the wireless communication module of the auxiliary fixture via wireless communication to control the electromagnetic relay array of the auxiliary fixture to simultaneously perform on / off operations of the solid-state hardware power line and data line includes:

[0018] The wireless control command is sent to the wireless communication module of the auxiliary fixture;

[0019] The electromagnetic coils of the electromagnetic relay array are switched on and off via a wireless communication module, thereby driving the relay contacts to perform the switching operation of the solid-state hardware power line.

[0020] While controlling the electromagnetic relay array, the on / off operation of the solid-state hardware data line is synchronously controlled through the auxiliary contacts of the electromagnetic relay array.

[0021] In one embodiment, the method further includes:

[0022] After sending the disconnect command, the control electromagnetic relay array first disconnects the solid-state hardware power line, and then disconnects the data line. The time interval between the two is less than the preset minimum time interval.

[0023] After sending the connection command, the control electromagnetic relay array first connects the solid-state hardware power line, and then connects the data line. The time interval between the two is less than the preset minimum time interval.

[0024] In one embodiment, during the on / off operation of the electromagnetic relay array, the step of acquiring power line voltage and power line current changes through the status monitoring circuit of the auxiliary fixture to obtain power line voltage change data and power line current change data includes:

[0025] When the electromagnetic relay array performs a disconnection operation, the voltage change of the solid-state hardware power line is monitored in real time at a preset first sampling frequency.

[0026] When the electromagnetic relay array performs a switching operation, the current value of the solid-state hardware power line is monitored in real time at a preset second sampling frequency.

[0027] During the monitoring process, when a sudden change in voltage or current value is detected, the sampling frequency is increased to obtain high-resolution electrical parameter data;

[0028] High-resolution electrical parameter data is combined with power line voltage variation data and power line current variation data to obtain complete electrical parameter data.

[0029] In one embodiment, the step of comparing electrical parameter data with a preset threshold to generate an anomaly determination result includes:

[0030] Receive the electrical parameter data, and extract the voltage change data and current change data from the electrical parameter data;

[0031] The voltage change data is compared with a preset voltage threshold. When the voltage change data exceeds the preset voltage threshold range, a voltage anomaly identifier is generated and the specific time point and the value exceeding the voltage anomaly are recorded.

[0032] The current change data is compared with the preset current threshold. When the current change data exceeds the preset current threshold range, a current anomaly identifier is generated and the specific time point and the value exceeding the current anomaly are recorded.

[0033] Anomaly detection results are generated based on voltage and current anomaly indicators.

[0034] In one embodiment, the step of generating an anomaly judgment result based on voltage anomaly identifiers and current anomaly identifiers includes:

[0035] When a voltage abnormality indicator indicates a voltage abnormality or a current abnormality indicator indicates a current abnormality, the current insertion / removal operation is determined to be abnormal, and an operation abnormality indicator is generated.

[0036] Record the time of occurrence of the operation anomaly and the corresponding electrical parameter data to obtain anomaly record data;

[0037] The system counts the number of consecutive operation anomaly flags. When the number of consecutive anomalies reaches a preset pause threshold, a pause command is generated and subsequent plugging / unplugging cycles are stopped. When the number of consecutive anomalies reaches a preset termination threshold, a test termination command is generated and a safety power-off operation is performed.

[0038] In one embodiment, when the anomaly determination result indicates that the operation was successful, the step of verifying the identification status of the solid-state hardware in the system to generate a system verification result after completing a switching operation includes:

[0039] After completing a switching operation, the device identification status of the solid-state hardware in the operating system can be queried through system commands;

[0040] When solid-state hardware is identified, its transmission bandwidth and connection speed information are further queried to generate hardware performance data.

[0041] When solid-state hardware is not recognized, device recognition error information is recorded in the system kernel log to generate a system error log;

[0042] Based on device identification status, hardware performance data, and system error logs, system verification results are generated.

[0043] In one embodiment, the steps of counting the number of successful tests and generating test report data based on the anomaly detection result, system verification result, and the number of plug-in / plug-out cycles in the test configuration parameters include:

[0044] Based on the number of plug-in / plug-out cycles in the test configuration parameters, the number of completed plug-in / plug-out cycles, the number of successfully executed plug-in / plug-out operations, and the number of abnormal plug-in / plug-out operations are counted to generate a count statistics.

[0045] Integrate anomaly detection results, system verification results, electrical parameter data, and test count statistics to generate test process data;

[0046] Analyze the abnormal patterns in the test process data and classify the abnormal patterns into power line abnormalities, data line abnormalities, or system identification abnormalities to generate abnormality classification data;

[0047] The test process data, anomaly classification data, and test configuration parameters are combined and analyzed to generate test report data. The test report data includes the total number of insertions and removals, the number of successful insertions and removals, the anomaly type, records of electrical parameters exceeding the standard, and the anomaly occurrence mode.

[0048] Furthermore, to achieve the above objectives, this application also proposes an automated testing system for hot-swappable solid-state hardware, comprising: a memory, a processor, and an automated testing program for hot-swappable solid-state hardware stored on the memory and executable on the processor, wherein the automated testing program for hot-swappable solid-state hardware is configured to implement the steps of the automated testing method for hot-swappable solid-state hardware.

[0049] The automated testing method and system for hot-swapping solid-state hardware proposed in this application receive test configuration parameters input by the user through an automated script, and control the auxiliary fixture to perform on / off operations on the power and data lines of the solid-state hardware. It collects and analyzes electrical parameters in real time, and automatically verifies the system's identification status, thereby completing the testing process efficiently and accurately. This improves the testing efficiency of hot-swapping solid-state hardware, ensures the consistency and repeatability of the testing process, reduces human error, improves the testing accuracy of hot-swapping solid-state hardware, and avoids hardware damage and system failure. Attached Figure Description

[0050] The accompanying drawings, which are incorporated in and form part of this specification, illustrate embodiments consistent with this application and, together with the description, serve to explain the principles of this application.

[0051] To more clearly illustrate the technical solutions in the embodiments of this application or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, for those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0052] Figure 1 This is a flowchart illustrating an embodiment of the automated testing method for hot-plugging of solid-state hardware provided in this application;

[0053] Figure 2 This is a schematic diagram of a structural embodiment of the solid-state hardware hot-swap automated testing system of this application.

[0054] Explanation of icon numbers:

[0055] 10. Memory; 20. Processor.

[0056] The purpose, features, and advantages of this application will be further explained in conjunction with the embodiments and with reference to the accompanying drawings. Detailed Implementation

[0057] The technical solutions of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, and not all embodiments. The components of this application described and shown in the accompanying drawings can generally be arranged and designed in various different configurations. Therefore, the following detailed description of the embodiments of this application provided in the accompanying drawings is not intended to limit the scope of this application, but merely represents selected embodiments of this application. All other embodiments obtained by those skilled in the art based on the embodiments of this application without inventive effort are within the scope of protection of this application.

[0058] It should be understood that similar reference numerals and letters in the following figures indicate similar items; therefore, once an item is defined in one figure, it does not need to be further defined and explained in subsequent figures. Furthermore, in the description of this application, the terms "first," "second," etc., are used only to distinguish descriptions and should not be construed as indicating or implying relative importance.

[0059] In existing technologies, hot-swapping testing methods for hardware devices such as solid-state drives (SSDs) mainly rely on manual operation or simple automated tools, resulting in low testing efficiency, poor consistency, and susceptibility to human error. Manual operation makes it difficult to precisely control the on / off timing of power and data cables, potentially causing hardware damage. Existing automated solutions lack real-time status monitoring, anomaly response, and automated verification capabilities for hardware system status identification, failing to comprehensively assess the impact of hot-swapping operations.

[0060] Based on this, embodiments of this application provide an automated testing method for hot-plugging solid-state hardware, referring to... Figure 1 The automated testing method for hot-plugging solid-state hardware includes steps S100 to S500, wherein:

[0061] Step S100: Receive test configuration parameters input by the user via an automated script; the test configuration parameters include the insertion / removal interval time and the number of insertion / removal cycles.

[0062] Step S200: Send the test configuration parameters to the auxiliary fixture to perform the switching operation of the solid-state hardware power line and data line through the auxiliary fixture, and collect electrical parameters during the switching operation to obtain electrical parameter data;

[0063] Step S300: Compare the electrical parameter data with a preset threshold to generate an anomaly judgment result;

[0064] Step S400: When the anomaly judgment result indicates that the operation was successful, after completing one on / off operation, verify the recognition status of the solid-state hardware in the system to generate a system verification result.

[0065] Step S500: Based on the anomaly judgment result, system verification result, and the number of plug-in / plug-out cycles in the test configuration parameters, count the number of successful tests and generate test report data.

[0066] In this embodiment, the automation script refers to pre-written program code configured to automatically execute a series of operations, such as receiving user input, sending instructions, and processing data, to automate the testing process. Test configuration parameters are settings used to define the specific behavior of the hot-swap test, including the insertion / removal interval time and the number of insertion / removal cycles. The insertion / removal interval time controls the time interval between each on / off operation, while the number of insertion / removal cycles defines the total number of on / off operations to be performed throughout the entire test process. The auxiliary fixture is a specially designed hardware device used to physically control the on / off state of the power and data lines of the solid-state hardware, and integrates sensors to collect electrical parameters. This fixture is typically connected to the test system via a communication interface to receive control commands and transmit collected data back. Solid-state hardware refers to the target device for hot-swap testing, such as a solid-state drive (SSD) or other storage devices using flash memory technology.

[0067] In this embodiment, electrical parameter data refers to the data set of electrical quantities such as voltage and current changing over time, collected by sensors during the switching operation of the solid-state hardware power and data lines. The preset threshold refers to a pre-set judgment standard or range when comparing electrical parameter data. When the collected electrical parameter data exceeds this threshold range, it is judged as abnormal. The abnormality judgment result refers to the determination of whether the current hot-plug operation was successful or whether an abnormality exists based on the comparison result of the electrical parameter data and the preset threshold. The system verification result refers to the verification and evaluation of whether the solid-state hardware is correctly identified in the system and whether its performance meets expectations after the solid-state hardware completes a switching operation, by querying the operating system or system logs. The test report data refers to the comprehensive report generated after integrating and analyzing various data, statistical results, abnormal situations, and system verification results during the entire hot-plug automated test.

[0068] In this embodiment, the automated hot-swapping testing method for solid-state hardware first receives test configuration parameters input by the user through an automated script. These parameters may include the insertion / removal interval time and the number of insertion / removal cycles. For example, the user can manually input these parameters through a command-line interface or through text boxes or drop-down menus in a graphical user interface (GUI). These parameters are used to guide subsequent testing procedures; for example, the insertion / removal interval time can be set to a fixed value, and the number of insertion / removal cycles can be set to a preset integer value.

[0069] Subsequently, the received test configuration parameters are sent to the auxiliary fixture. The auxiliary fixture is configured to perform on / off operations on the power and data lines of the solid-state hardware based on these parameters. During the on / off operation, the auxiliary fixture simultaneously acquires electrical parameters to obtain electrical parameter data. Specifically, the test configuration parameters can be sent to the auxiliary fixture via a wired connection (e.g., USB, serial port). After receiving the command, the controller inside the auxiliary fixture drives relays or other switching elements to physically connect or disconnect the power and data lines of the solid-state hardware. During these operations, sensors on the auxiliary fixture can be configured to continuously monitor voltage and current changes on the power and data lines and record this raw data to form electrical parameter data.

[0070] Furthermore, the collected electrical parameter data is compared with preset thresholds to generate an anomaly judgment result. This comparison process can be executed by the processor in the test system. For example, voltage or current values ​​in the electrical parameter data can be compared point by point with a fixed upper or lower limit value. If any data point exceeds the preset range, it can be marked as an anomaly. This preset threshold can be an empirical value or manually set according to the solid-state hardware specifications. After the comparison is completed, the system will generate an anomaly judgment result indicating whether the current switching operation was normal.

[0071] In this embodiment, when the anomaly detection result indicates successful operation, after completing a power-on / disconnection operation, the recognition status of the solid-state hardware in the system is verified to generate a system verification result. This verification process can be executed on the host of the test system. For example, standard commands provided by the operating system (such as lsusb, lspci, diskpart, etc.) can be executed to query whether the solid-state hardware has been correctly recognized and mounted by the operating system. If the solid-state hardware is recognized, the system recognition status is considered normal. If it is not recognized, manual checking of the system logs may be required. The verification result is recorded for subsequent analysis.

[0072] Finally, based on the anomaly detection results, system verification results, and the number of plug-in / plug-out cycles in the test configuration parameters, the number of successful operations is counted, and a test report is generated. This statistical and report generation process can be completed on the main processor of the test system. For example, the system can simply accumulate all plug-in / plug-out cycles determined to be successful and record the total number of plug-in / plug-out cycles. The test report data can be a simple text file containing the total number of tests, the number of successful operations, and a brief record of the anomaly detection results and system verification results for each operation.

[0073] In this embodiment, an automated script receives test configuration parameters and drives an auxiliary fixture to precisely execute the on / off operations of the solid-state hardware power and data lines, effectively solving the problems of low efficiency and inaccurate timing control in traditional manual operations. During the on / off process, electrical parameters are collected in real time and compared with preset thresholds, enabling timely detection of electrical anomalies. Simultaneously, the identification status of the solid-state hardware in the system is automatically verified, comprehensively evaluating the impact of hot-swapping operations on hardware functionality and system stability. Therefore, this method improves testing efficiency, ensures the consistency and accuracy of the testing process, and provides comprehensive test report data, facilitating the rapid location and analysis of potential problems during the hot-swapping process of solid-state hardware.

[0074] In one feasible implementation, the steps of sending test configuration parameters to an auxiliary fixture to perform on / off operations on the solid-state hardware power lines and data lines, and collecting electrical parameters during the on / off operations to obtain electrical parameter data, include: extracting the insertion / removal interval time from the test configuration parameters to generate time control data, and extracting the insertion / removal cycle count from the test configuration parameters to generate cycle control data; generating a wireless control command containing a sequence of disconnect and connect commands based on the time control data and cycle control data; sending the wireless control command to the wireless communication module of the auxiliary fixture via wireless communication to control the electromagnetic relay array of the auxiliary fixture to simultaneously perform on / off operations on the solid-state hardware power lines and data lines; collecting power line voltage and current changes through the status monitoring circuit of the auxiliary fixture during the on / off operations of the electromagnetic relay array to obtain power line voltage change data and power line current change data; and transmitting the power line voltage and current change data back via wireless communication to obtain electrical parameter data.

[0075] In this embodiment, after receiving the test configuration parameters input by the user, the automated script needs to parse and structure these parameters. The plug-in / plug-out interval is the time interval between each on / off operation, typically measured in seconds or milliseconds, used to control the frequency of operations. The plug-in / plug-out cycle count is the total number of times the on / off operation needs to be repeated throughout the entire test process. These raw parameters are converted into a format that the system can recognize and process internally, namely time control data and cycle control data. For example, they can be stored as integer or floating-point variables, or encapsulated in a specific data structure for use by the subsequent instruction generation module.

[0076] In this embodiment, after obtaining time control data and loop control data, the automation script or control module logically constructs a series of operation instructions based on this data. These instructions include a "disconnect instruction" for disconnecting the solid-state hardware power and data lines, and a "connect instruction" for connecting the solid-state hardware power and data lines. The generation of the instruction sequence takes into account the plug-in / plug-out interval time, ensuring sufficient waiting time between each on / off operation, and repeatedly generating corresponding instruction pairs according to the number of plug-in / plug-out cycles. For example, an instruction sequence containing a "connect-wait-disconnect-wait" loop can be generated, where the waiting time is determined by the plug-in / plug-out interval time, and the number of cycles is determined by the loop control data. These instructions are ultimately encapsulated into a format suitable for wireless transmission, forming wireless control instructions.

[0077] In this embodiment, the generated wireless control commands are sent to the auxiliary fixture via wireless communication technology. The wireless communication module can be a Bluetooth module, Wi-Fi module, ZigBee module, or a dedicated RF module, etc. Its function is to receive wireless control commands from the automation script and convert them into electrical signals recognizable by the controller inside the auxiliary fixture. Upon receiving the commands, the controller inside the auxiliary fixture drives an electromagnetic relay array. The electromagnetic relay array consists of multiple electromagnetic relays, each responsible for controlling the on / off state of one or more signals on the solid-state hardware power or data lines. Wireless communication enables physical isolation between the test system and the auxiliary fixture, improving testing flexibility and safety, and reducing wiring complexity. Simultaneous on / off operations mean that the disconnection or connection of the power and data lines are tightly coordinated in time to simulate a real hot-plugging scenario.

[0078] In this embodiment, when the electromagnetic relay array performs on / off operations on the solid-state hardware power line and data line according to wireless control commands, the status monitoring circuit inside the auxiliary fixture works synchronously to collect the voltage and current values ​​on the solid-state hardware power line in real time. The status monitoring circuit typically includes a high-precision analog-to-digital converter (ADC), voltage sensors, and current sensors (such as Hall effect sensors or shunt resistors), capable of converting analog voltage and current signals into digital signals. The collected data reflects the changes in the electrical characteristics of the power line at the moment of on / off, such as voltage drops and current surges. These raw voltage and current data are recorded, forming power line voltage change data and power line current change data, providing a basis for subsequent electrical parameter analysis.

[0079] In this embodiment, the power line voltage and current change data collected by the auxiliary fixture's status monitoring circuit need to be transmitted back to the automated testing system for further analysis and processing. The auxiliary fixture's wireless communication module, while receiving control commands, is also responsible for wirelessly transmitting these collected electrical parameter data. The transmitted data can be the raw sampled data stream or a pre-processed (e.g., packaged, compressed) data packet. Through wireless transmission, the testing system can acquire the electrical behavior of solid-state hardware during hot-plugging in real time, without the need for additional wired connections, further enhancing the automation and remote monitoring capabilities of the testing system. These transmitted data collectively constitute the electrical parameter data.

[0080] In this embodiment, through the above technical solution, this application can achieve precise automated control and efficient electrical parameter acquisition for hot-swapping operations of solid-state hardware. Specifically, by extracting the insertion / removal interval time and the number of insertion / removal cycles from the test configuration parameters, and generating time control data and cycle control data accordingly, it ensures that the test process is strictly executed according to the user-preset conditions, improving the accuracy and repeatability of the test. Based on these control data, wireless control commands containing disconnection and connection command sequences are generated, enabling the auxiliary fixture to perform on / off operations according to a predetermined timing and number of cycles, achieving a high degree of automation. These commands are sent to the wireless communication module of the auxiliary fixture via wireless communication, and the electromagnetic relay array is controlled to simultaneously perform on / off operations of the power line and data line, effectively avoiding the complexity of traditional wired connections and improving the deployment flexibility and remote control capability of the test system. At the same time, during the on / off operation, the status monitoring circuit of the auxiliary fixture can collect power line voltage and current changes in real time and accurately, capture the electrical characteristics at the moment of hot-swapping, and transmit these data back via wireless communication, providing a comprehensive and reliable basis for subsequent electrical anomaly judgment. This wireless and automated control and data acquisition mechanism significantly improves the efficiency, reliability, and convenience of hot-swap testing for solid-state hardware.

[0081] In one feasible implementation, the step of sending wireless control commands to the wireless communication module of the auxiliary fixture via wireless communication to control the electromagnetic relay array of the auxiliary fixture to simultaneously perform on / off operations of the solid-state hardware power line and data line includes: sending the wireless control commands to the wireless communication module of the auxiliary fixture; controlling the on / off of the electromagnetic coils of the electromagnetic relay array via the wireless communication module to drive the relay contacts to perform on / off operations of the solid-state hardware power line; and simultaneously controlling the on / off operations of the solid-state hardware data line via the auxiliary contacts of the electromagnetic relay array.

[0082] In this embodiment, the wireless communication module that sends the wireless control commands to the auxiliary fixture aims to transmit wireless control commands, generated by an automated script and containing a sequence of disconnect and connect commands, to the auxiliary fixture. The wireless communication module can employ various wireless communication technologies, such as Bluetooth, Wi-Fi, Zigbee, or proprietary wireless protocols. Selecting a suitable wireless communication technology requires comprehensive consideration of factors such as transmission distance, data rate, power consumption, and anti-interference capabilities. Wireless control commands are typically encoded and encapsulated before transmission to ensure the integrity and accuracy of data transmission. Upon receiving these commands, the auxiliary fixture parses them and performs corresponding operations based on the command content.

[0083] Furthermore, the electromagnetic coils of the electromagnetic relay array are controlled via a wireless communication module to drive the relay contacts to perform the on / off operation of the solid-state hardware power supply. After receiving and parsing the wireless control commands, the wireless communication module converts them into electrical signals to control the electromagnetic coils in the electromagnetic relay array. When energized, the electromagnetic coils generate a magnetic field that attracts the armature, thereby driving the relay contacts to close or open. For the on / off operation of the solid-state hardware power supply, the main contacts of the relay are typically used to control the connection and disconnection of the power circuit. When the electromagnetic coil is energized, the power supply contacts close, and the power is connected; when the electromagnetic coil is de-energized, the power supply contacts open, and the power is disconnected. This control method enables precise control of the power supply to the solid-state hardware.

[0084] Building upon this, while controlling the electromagnetic relay array, the on / off operation of the solid-state hardware data lines is synchronously controlled via the auxiliary contacts of the electromagnetic relay array. To achieve synchronous switching of power and data lines, this solution utilizes the auxiliary contacts of the electromagnetic relay array. The auxiliary contacts are another set of contacts that are mechanically linked or electrically associated with the main contacts (used for power line control). When the electromagnetic coil of the electromagnetic relay array is energized or de-energized, its main contacts and auxiliary contacts will operate simultaneously or with a very small, controllable time difference. By connecting the solid-state hardware data lines to these auxiliary contacts, the on / off operation of the data lines can be ensured to be highly synchronized with the on / off operation of the power lines. This design avoids the synchronization errors that might be introduced by using independent control mechanisms, thus ensuring the coordination of power and data signals during hot-swapping.

[0085] In this embodiment, the above-described technical solution sends wireless control commands to the wireless communication module of the auxiliary fixture, and uses this module to control the on / off state of the electromagnetic coils of the electromagnetic relay array, thereby driving the relay contacts to perform the on / off operation of the solid-state hardware power lines. More importantly, while controlling the electromagnetic relay array, the on / off state of the solid-state hardware data lines is synchronously controlled through the auxiliary contacts of the electromagnetic relay array. This design enables the on / off operations of the power lines and data lines to be highly synchronized, effectively solving the problem of system instability or data corruption that may be caused by the asynchrony of power and data signals during hot-plugging. Since the power lines and data lines are controlled by the main and auxiliary contacts of the same electromagnetic relay array, the complexity and timing deviations that may be introduced by using independent control mechanisms are avoided, thereby improving the accuracy and reliability of hot-plugging testing and ensuring the stable identification and normal operation of the solid-state hardware in the system.

[0086] In one feasible implementation, the method further includes: after sending a disconnect command, controlling the electromagnetic relay array to first disconnect the solid-state hardware power line and then disconnect the data line, with the time interval between the two being less than a preset minimum time interval; after sending a connect command, controlling the electromagnetic relay array to first connect the solid-state hardware power line and then connect the data line, with the time interval between the two being less than a preset minimum time interval.

[0087] In this embodiment, when the system issues a disconnect command, the control logic of the auxiliary fixture first drives the corresponding relay in the electromagnetic relay array to cut off the power supply to the solid-state hardware, serving as the trigger condition for the subsequent disconnect sequence. After the power line is disconnected, another relay or auxiliary contact is driven to disconnect the data line connection of the solid-state hardware. This sequence of disconnecting power first and then data is designed to ensure that the solid-state hardware is in a de-energized state when the data line is disconnected, thereby avoiding potential data corruption or electrical faults caused by pulling out the data line while it is still powered on. The time difference between disconnecting the power line and disconnecting the data line is set to a small value, such as on the order of microseconds or milliseconds, to ensure the speed of the disconnection operation while ensuring that the power line is effectively disconnected before the data line is disconnected. The preset minimum time interval can be empirically set or determined experimentally based on the electrical characteristics of the solid-state hardware and the system response time to optimize testing efficiency while ensuring safety.

[0088] In this embodiment, similarly, when the system issues a power-on command, the control logic of the auxiliary fixture first drives the corresponding relay in the electromagnetic relay array as the trigger condition for the subsequent power-on sequence, providing power to the solid-state hardware. After the power is stably connected, another relay or auxiliary contact is driven to connect the data line of the solid-state hardware. This order of powering on first and then connecting data aims to ensure that the solid-state hardware has a stable operating voltage before the data line is connected, thereby avoiding initialization anomalies or data transmission errors that may occur due to the data line being connected before the power supply. The time difference between power line connection and data line connection is also set to a small value to ensure the speed of the power-on operation while ensuring that the power line is stably powered before the data line is connected. The preset minimum time interval can also be adjusted according to the electrical characteristics of the solid-state hardware and the system response time to improve testing efficiency while ensuring system stability.

[0089] In this embodiment, the above technical solution enables precise control of the power and data cable connection / disconnection timing during hot-swapping of solid-state hardware. Specifically, during disconnection, the power cable is disconnected first, followed by the data cable, effectively preventing data corruption or electrical shocks that could occur if the data cable is removed while energized, thus protecting the solid-state hardware and the host system. During connection, the power cable is connected first, followed by the data cable, ensuring a stable power supply to the solid-state hardware before the data cable is connected. This avoids initialization failures or data transmission errors caused by unstable power, improving the recognition success rate and stability of the solid-state hardware in the system. By controlling the connection / disconnection time interval between the power and data cables within a preset minimum time interval, both operational safety and testing efficiency are ensured, making the entire automated hot-swapping testing process more reliable and efficient, significantly reducing the risk of hardware failure and data loss due to improper operation.

[0090] In one feasible implementation, during the on / off operation of the electromagnetic relay array, the step of acquiring power line voltage and current changes through the status monitoring circuit of the auxiliary fixture to obtain power line voltage change data and power line current change data includes: when the electromagnetic relay array performs a disconnect operation, monitoring the voltage change of the solid-state hardware power line in real time at a preset first sampling frequency; when the electromagnetic relay array performs a connect operation, monitoring the current change of the solid-state hardware power line in real time at a preset second sampling frequency; during the monitoring process, when a sudden change in voltage or current value is detected, increasing the sampling frequency to obtain high-resolution electrical parameter data; and merging the high-resolution electrical parameter data with the power line voltage change data and power line current change data to obtain complete electrical parameter data.

[0091] In this embodiment, when the electromagnetic relay array performs a disconnection operation, real-time monitoring of the voltage change of the solid-state hardware power line at a preset first sampling frequency means that during the disconnection operation of the electromagnetic relay array of the auxiliary fixture, the status monitoring circuit continuously collects the voltage value on the power line at a preset, relatively low sampling frequency. This first sampling frequency is typically set based on the expected rate of change of the power line voltage and system resource limitations, aiming to obtain baseline voltage data and preliminary trends during the disconnection operation. For example, the power line voltage can be periodically sampled using an analog-to-digital converter (ADC), and the sampling results can be stored.

[0092] In this embodiment, when the electromagnetic relay array performs a switching operation, real-time monitoring of the current value change of the solid-state hardware power line at a preset second sampling frequency means that during the operation of the electromagnetic relay array of the auxiliary fixture switching on the solid-state hardware power line, the status monitoring circuit continuously collects the current value on the power line at a preset, relatively low sampling frequency. This second sampling frequency is also set according to the expected rate of change of the power line current and system resource limitations, aiming to obtain baseline current data and preliminary trend changes during the switching operation. For example, the current can be converted into a voltage signal using a current sensor (such as a shunt resistor or Hall effect sensor), and then periodically sampled using an analog-to-digital converter. The first sampling frequency and the second sampling frequency can be the same or different, depending on the characteristics of the voltage and current changes.

[0093] In this embodiment, mutation detection can be achieved by comparing the difference between the current sampled value and one or more previous sampled values ​​to see if it exceeds a preset threshold, or by calculating whether the rate of change of voltage or current (i.e., the first derivative) exceeds a preset threshold. Once a mutation is detected, the state monitoring circuit immediately switches to a higher sampling frequency for data acquisition. For example, the operating clock frequency of the analog-to-digital converter can be dynamically adjusted, or a dedicated transient capture module with a higher sampling rate can be enabled. High-resolution electrical parameter data means acquiring more sampling points in a short time, thereby enabling a more detailed depiction of the transient waveforms of voltage or current, capturing key details such as spikes, drops, or oscillations that are easily missed under traditional fixed sampling frequencies.

[0094] In this embodiment, merging high-resolution electrical parameter data with power line voltage and current variation data to obtain complete electrical parameter data involves integrating conventional data collected at a preset sampling frequency with high-resolution data collected at a higher sampling frequency during sudden changes. This merging operation typically involves timestamp alignment to ensure that all data points are arranged in chronological order, forming a continuous and detailed electrical parameter time series. The merged complete electrical parameter data not only includes the macroscopic trends of the entire switching process, but more importantly, it accurately records the microscopic details during transient changes, providing a comprehensive and accurate basis for subsequent anomaly detection.

[0095] In this embodiment, through the above technical solution, during the hot-swapping operation of solid-state hardware, the system can intelligently and dynamically adjust the sampling frequency according to changes in electrical parameters. A lower frequency is used during stable phases to save resources, while the sampling frequency is rapidly increased during moments of drastic transient changes in voltage or current, thereby capturing high-resolution electrical parameter data. This adaptive sampling mechanism effectively solves the problem of missing critical transient events with a fixed sampling frequency, ensuring the integrity and accuracy of electrical parameter data. This allows subsequent anomaly detection to be based on more refined and comprehensive data, significantly improving the sensitivity and reliability of hot-swapping anomaly detection, and thus more accurately assessing the electrical stability of solid-state hardware in hot-swapping scenarios.

[0096] In one feasible implementation, the step of comparing electrical parameter data with a preset threshold to generate an anomaly judgment result includes: receiving the electrical parameter data and extracting voltage change data and current change data from the electrical parameter data; comparing the voltage change data with a preset voltage threshold, and when the voltage change data exceeds the preset voltage threshold range, generating a voltage anomaly identifier and recording the specific time point and the value exceeded by the voltage anomaly; comparing the current change data with a preset current threshold, and when the current change data exceeds the preset current threshold range, generating a current anomaly identifier and recording the specific time point and the value exceeded by the current anomaly; and generating an anomaly judgment result based on the voltage anomaly identifier and the current anomaly identifier.

[0097] In this embodiment, after receiving the electrical parameter data, it is first necessary to parse and classify it. The electrical parameter data typically includes real-time monitoring values ​​of power line voltage and current during the switching operation of solid-state hardware, and may exist in the form of time-series data packets or structured records. Extracting voltage and current change data refers to separating the voltage measurement values ​​and current measurement values ​​from these raw data streams to form two independent datasets. For example, the data parsing module can identify and separate the voltage and current numerical sequences according to a predefined protocol or data format for subsequent independent analysis.

[0098] In this embodiment, the preset voltage threshold typically defines an acceptable range of voltage fluctuations, such as the upper and lower limits of the nominal operating voltage of solid-state hardware. When any value in the voltage change data exceeds this preset range, it is determined to be a voltage anomaly. At this time, the system generates a voltage anomaly identifier, which can be a Boolean value or a specific status code, indicating that the voltage is abnormal. Simultaneously, to facilitate subsequent fault analysis, the system accurately records the specific time point of the voltage anomaly and the specific voltage value or amount exceeding the threshold. This information can be stored in a log file or a database.

[0099] In this embodiment, the preset current threshold is set based on the power consumption characteristics, startup current, steady-state current, and transient current characteristics that may occur during hot-plugging of the solid-state hardware. When any value in the current change data exceeds this preset range, it is determined to be a current anomaly. The system generates a current anomaly flag and records the specific time point and the value exceeded. For example, at the instant the solid-state hardware is connected, a brief surge current may occur, but its peak value and duration should be within the preset current threshold range; exceeding this range is considered an anomaly.

[0100] In this embodiment, an anomaly judgment result is generated based on the generated voltage anomaly flag and current anomaly flag. This process involves logically judging two independent anomaly flags. For example, if either the voltage anomaly flag or the current anomaly flag is true, the final anomaly judgment result can indicate that there is an electrical anomaly in this switching operation. More refined judgments can distinguish different anomaly types based on the combination of the two flags. For example, a voltage anomaly alone may indicate power supply instability, while both voltage and current anomalies may indicate an internal solid-state hardware fault. The anomaly judgment result can be a comprehensive status code used to indicate whether the operation was successful or not, or the specific anomaly type.

[0101] In this embodiment, the collected electrical parameter data is subdivided into voltage change data and current change data using the aforementioned technical solution, and each is compared with its respective preset threshold. This refined comparison method can more accurately identify whether the anomaly is voltage or current, avoiding false alarms or missed alarms that may result from general judgments. By generating voltage and current anomaly identifiers and recording the specific time points and exceeded values, detailed and targeted data support is provided for subsequent fault diagnosis, enabling testers to quickly locate the root cause of the problem and improve the efficiency and accuracy of fault analysis. Finally, anomaly judgment results are generated based on these independent anomaly identifiers, which not only improves the accuracy of anomaly judgment but also provides a solid foundation for the reliability of automated testing of solid-state hardware hot-swap.

[0102] In one feasible implementation, the steps for generating anomaly judgment results based on voltage anomaly indicators and current anomaly indicators include: when the voltage anomaly indicator indicates a voltage anomaly or the current anomaly indicator indicates a current anomaly, determining that the current insertion / removal operation is abnormal and generating an operation anomaly indicator; recording the occurrence time of the operation anomaly indicator and the corresponding electrical parameter data to obtain anomaly record data; counting the number of consecutive occurrences of the operation anomaly indicator, and when the number of consecutive anomalies reaches a preset pause threshold, generating a pause command and stopping subsequent insertion / removal cycles; and when the number of consecutive anomalies reaches a preset termination threshold, generating a test termination command and performing a safety power-off operation.

[0103] In this embodiment, when the system receives either a voltage anomaly flag or a current anomaly flag, it considers the current insertion / removal operation to be abnormal and generates an operation anomaly flag accordingly. This operation anomaly flag is a unified summary of electrical parameter anomalies, simplifying subsequent judgment logic. To facilitate subsequent fault analysis and tracing, the system records the time of occurrence of each operation anomaly and the corresponding electrical parameter data. This data together constitutes anomaly record data, providing detailed original information for the test report.

[0104] In this embodiment, to more effectively manage abnormal situations during the testing process, a statistical mechanism for the number of consecutive abnormalities is introduced. The system continuously tracks the number of consecutive occurrences of the operation abnormality indicator. If no abnormality occurs during a certain operation, the consecutive abnormality counter is reset to zero. When the number of consecutive abnormalities reaches a preset pause threshold, the system will automatically generate a pause command and stop subsequent plug-in / plug-out cycles. For example, if electrical abnormalities occur in three consecutive plug-in / plug-out operations, the system will pause the test to allow test personnel to intervene, check and analyze the problem, and take necessary actions, thereby avoiding unnecessary consumption of test resources and potential equipment damage. Furthermore, if the abnormal situation continues to worsen and the number of consecutive abnormalities reaches a preset termination threshold (usually higher than the pause threshold, such as five consecutive abnormalities), the system will generate a test termination command and immediately perform a safety power-off operation. This measure aims to protect the solid-state hardware under test and auxiliary fixtures from irreversible damage to the greatest extent possible, ensuring the safety of the testing process.

[0105] In this embodiment, through the above technical solution, this application can integrate discrete electrical anomaly information into a unified operational anomaly identifier, and achieve graded and intelligent test intervention based on the degree of continuous anomalies. This mechanism can not only promptly detect and record electrical anomalies during the testing process, but more importantly, it can automatically take measures to suspend or terminate the test and execute a safe power-off based on the persistence and severity of the anomaly, thereby effectively avoiding equipment damage and waste of test resources caused by continuous anomalies. At the same time, detailed anomaly record data also provides key basis for subsequent fault diagnosis and test optimization, significantly improving the safety, reliability, and efficiency of automated testing for solid-state hardware hot-swappable devices.

[0106] In one feasible implementation, when the anomaly judgment result indicates successful operation, the step of verifying the identification status of the solid-state hardware in the system to generate a system verification result after completing a connection / disconnection operation includes: after completing a connection / disconnection operation, querying the device identification status of the solid-state hardware in the operating system via system commands; when the solid-state hardware is identified, further querying the transmission bandwidth and connection rate information of the solid-state hardware to generate hardware performance data; when the solid-state hardware is not identified, recording device identification error information in the system kernel log to generate a system error log; and generating a system verification result based on the device identification status, hardware performance data, and system error log.

[0107] In this embodiment, after the solid-state hardware completes a power and data cable connection and disconnection operation, the system will use an automated script to call standard commands or API interfaces provided by the operating system. For example, in Linux systems, commands such as `lsblk`, `lsscsi`, or `lspci` can be used; in Windows systems, PowerShell commands such as `Get-Disk` or `Get-PnpDevice` can be used; or the Device Manager API can be used to query whether the currently connected solid-state hardware has been successfully recognized and enumerated by the operating system. This step aims to confirm that the solid-state hardware is not only electrically connected but also logically integrated into the operating system, becoming a usable device. If the solid-state hardware is successfully recognized by the operating system, the system will further perform performance-related query operations. This includes using tools or interfaces provided by the operating system or hardware manufacturer to obtain information such as the solid-state hardware's transmission bandwidth (e.g., PCIe link width and generation) and connection speed (e.g., SATA protocol version or NVMe negotiation speed). For example, for NVMe solid-state drives, the `nvme-cli` tool can be used to query its PCIe link speed and width; for SATA solid-state drives, its negotiated SATA version can be queried. These query results will be collected and integrated into hardware performance data to evaluate whether the performance of the solid-state hardware after hot-swapping meets expectations. If the solid-state hardware fails to be recognized by the operating system after the on / off operation, the system will no longer perform performance queries, but instead record diagnostic information. At this time, the automated script will access the operating system's kernel logs (such as the `dmesg` output or ` / var / log / syslog` in Linux systems, and the Event Viewer in Windows systems) to look for error information related to device recognition failure, driver loading anomalies, or hardware enumeration errors. This error information will be extracted and integrated into the system error log, providing key clues for subsequent troubleshooting. Finally, the system will comprehensively analyze the device recognition status (successfully recognized or not recognized), hardware performance data (if recognized successfully), and system error log (if not recognized) obtained in the above steps. Based on this information, a comprehensive system verification result will be generated. This result can be a boolean value (pass / fail) or structured data containing detailed status descriptions, such as "recognition successful, performance normal", "recognition successful, performance degraded", "not recognized, kernel error exists", etc. The system verification results are the final judgment on the system-level functional integrity and performance after hot-swapping solid-state hardware.

[0108] In this embodiment, through the above technical solution, the automated testing of solid-state hardware hot-swapping not only focuses on the normality of electrical parameters, but also, after the anomaly judgment result indicates successful operation, introduces verification of the solid-state hardware's identification status in the system. Specifically, the device identification status is queried through system commands to ensure that the solid-state hardware is correctly identified by the operating system; if identification is successful, transmission bandwidth and connection rate information are further queried to generate hardware performance data, thereby evaluating whether its function and performance are normal; if not identified, device identification error information is recorded in the system kernel log to generate a system error log, providing a basis for fault diagnosis. Based on this comprehensive information, a system verification result is generated. This method compensates for the shortcomings of relying solely on electrical parameter monitoring, and can discover potential faults where the electrical connection is normal but the system identification or performance has problems, thus providing more comprehensive and accurate solid-state hardware hot-swapping test results, significantly improving the reliability and effectiveness of the test, and ensuring the stability and compatibility of solid-state hardware in practical applications.

[0109] In one feasible implementation, the steps of counting the number of successful plug-in / plug-out cycles and generating test report data based on the anomaly judgment results, system verification results, and the number of plug-in / plug-out cycles in the test configuration parameters include: counting the number of completed plug-in / plug-out cycles, the number of successfully executed plug-in / plug-out operations, and the number of plug-in / plug-out operations that occurred abnormally, based on the number of plug-in / plug-out cycles in the test configuration parameters, to generate a count statistics data; integrating the anomaly judgment results, system verification results, electrical parameter data, and count statistics data to generate test process data; analyzing the anomaly patterns in the test process data and classifying the anomaly patterns into power line anomalies, data line anomalies, or system identification anomalies, to generate anomaly classification data; and merging and analyzing the test process data, anomaly classification data, and test configuration parameters to generate test report data; the test report data includes the total number of plug-in / plug-out cycles, the number of successful cycles, the anomaly type, records of electrical parameter exceedances, and the anomaly occurrence pattern.

[0110] In this embodiment, when generating the count statistics, the system calculates the total number of actual plug-in / plug-out operations performed in real time or after the test, based on the number of plug-in / plug-out cycles set in the test configuration parameters. Simultaneously, it distinguishes and accumulates the number of successfully executed plug-in / plug-out operations and the number of operations that resulted in anomalies, combining the anomaly judgment results and system verification results for each operation. For example, three counters can be maintained: one to record the total number of completed cycles, one to record all operations judged as successful, and another to record all operations judged as abnormal. The data from these counters collectively constitute the count statistics, providing a quantitative basis for the overall performance of the test.

[0111] In this embodiment, when generating test process data, the system integrates the collected anomaly judgment results, system verification results, electrical parameter data, and the aforementioned generated count statistics. This integration can involve associating data from different sources according to timestamps or operation cycle numbers and storing them in a structured dataset, such as a database table, JSON file, or XML file. In this way, all relevant information for each plug-in / plug-out operation, including electrical waveforms, anomaly indicators, system identification status, and overall statistical information, is gathered together to form a comprehensive test process record, facilitating subsequent querying and analysis.

[0112] In this embodiment, when generating anomaly classification data, the system performs in-depth analysis of the integrated test process data to identify and categorize anomaly patterns. For example, if the anomaly judgment result indicates a voltage anomaly (such as voltage drop or overshoot), the anomaly may be classified as a power line anomaly. If the system verification result shows that the solid-state hardware is not recognized by the operating system, the anomaly is classified as a system recognition anomaly. If there are abnormal features related to data lines in the electrical parameter data (e.g., through specific signal integrity analysis or association with system recognition anomalies), it can be classified as a data line anomaly. This classification can be performed using a preset rule set or based on machine learning algorithms, aiming to transform the original anomaly signal into a fault type with clear physical meaning, thereby guiding troubleshooting.

[0113] In this embodiment, when generating test report data, the system merges and analyzes the generated test process data, anomaly classification data, and initial test configuration parameters. This step aims to extract and organize all key information into an easy-to-understand report. The report includes not only the total number of plug-in / plug-out cycles and the number of successful plug-in / plug-out cycles, but also a detailed list of detected anomaly types (such as power cord anomalies, data cable anomalies, and system identification anomalies), records the specific time points and values ​​of electrical parameter exceedances, and analyzes the patterns of anomaly occurrence (e.g., whether anomalies are concentrated in a specific plug-in / plug-out cycle, or which stage of connection / disconnection is more likely to occur). This report can be presented in various formats, such as PDF, HTML, or CSV, providing test engineers and product developers with a comprehensive overview of test results and in-depth fault diagnosis support.

[0114] In this embodiment, the above technical solution first statistically analyzes the number of completed plug-in / plug-out cycles, the number of successfully executed plug-in / plug-out operations, and the number of abnormal plug-in / plug-out operations. This provides a quantitative overview of the testing process, enabling testers to quickly grasp the overall progress and success rate of the test. Secondly, it integrates anomaly judgment results, system verification results, electrical parameter data, and count statistics to form comprehensive test process data, ensuring centralized management of all key information and laying the foundation for subsequent in-depth analysis. Furthermore, by analyzing anomaly patterns in the test process data and classifying them into power line anomalies, data line anomalies, or system identification anomalies, it transforms ambiguous anomaly indications into clear fault types, greatly improving the accuracy and efficiency of fault location. Finally, this processed data is combined with test configuration parameters for analysis, generating test report data that includes the total number of plug-in / plug-out cycles, the number of successful cycles, anomaly types, electrical parameter exceedance records, and anomaly occurrence patterns. This provides comprehensive, structured, and easily understandable diagnostic information for evaluating the hot-swappable performance of solid-state hardware, significantly improving the usability of test results and the efficiency of troubleshooting.

[0115] In the embodiments of this application, the automated testing method for hot-swapping solid-state hardware receives test configuration parameters input by the user through an automated script, controls the auxiliary fixture to perform on / off operations on the power and data lines of the solid-state hardware, collects and analyzes electrical parameters in real time, and automatically verifies the system identification status, thereby completing the testing process efficiently and accurately. This method can improve the testing efficiency of hot-swapping solid-state hardware, ensure the consistency and repeatability of the testing process, reduce human error, improve the testing accuracy of hot-swapping solid-state hardware, and also avoid hardware damage and system failure.

[0116] It should be noted that the above examples are only for understanding this application and do not constitute a limitation on the solid-state hardware hot-plugging automated testing method of this application. Any simple modifications based on this technical concept are within the protection scope of this application.

[0117] This application also provides an automated testing system for hot-swapping solid-state hardware, see reference. Figure 2 The solid-state hardware hot-swap automated testing system includes: a memory 10, a processor 20, and a solid-state hardware hot-swap automated testing program stored on the memory 10 and executable on the processor 20. The solid-state hardware hot-swap automated testing program is configured to implement the steps of the solid-state hardware hot-swap automated testing method.

[0118] The automated testing system for hot-swapping solid-state hardware provided in this application, employing the automated testing method for hot-swapping solid-state hardware in the above embodiments, can improve the testing efficiency and accuracy of hot-swapping solid-state hardware. Compared with the prior art, the beneficial effects of the automated testing system for hot-swapping solid-state hardware provided in this application are the same as those of the automated testing method for hot-swapping solid-state hardware provided in the above embodiments, and other technical features of the automated testing system for hot-swapping solid-state hardware are the same as those disclosed in the methods of the above embodiments, and will not be repeated here.

[0119] It should be understood that the various parts disclosed in this application can be implemented using hardware, software, firmware, or a combination thereof. In the description of the above embodiments, specific features, structures, materials, or characteristics can be combined in any suitable manner in one or more embodiments or examples.

[0120] The above description is merely a specific embodiment of this application, but the scope of protection of this application is not limited thereto. All equivalent structural transformations made under the technical concept of this application using the contents of the specification and drawings of this application, or direct / indirect applications in other related technical fields, are included within the scope of patent protection of this application.

Claims

1. An automated testing method for hot-swapping solid-state hardware, characterized in that, The method includes: The test configuration parameters are received from the user via an automated script; these parameters include the insertion / removal interval time and the number of insertion / removal cycles. The test configuration parameters are sent to the auxiliary fixture to perform the switching operation of the solid-state hardware power line and data line, and electrical parameters are collected during the switching operation to obtain electrical parameter data; Electrical parameter data is compared with preset thresholds to generate anomaly detection results; When the anomaly judgment result indicates that the operation was successful, after completing one on / off operation, the recognition status of the solid-state hardware in the system is verified to generate a system verification result. Based on the anomaly detection results, system verification results, and the number of plug-in / plug-out cycles in the test configuration parameters, the number of successful tests is counted and test report data is generated. The steps for sending test configuration parameters to an auxiliary fixture to perform on / off operations on the solid-state hardware power and data lines, and acquiring electrical parameters during the on / off operation to obtain electrical parameter data include: The insertion / removal interval time is extracted from the test configuration parameters to generate time control data, and the number of insertion / removal cycles is extracted from the test configuration parameters to generate cycle control data; Based on time control data and loop control data, generate wireless control commands containing a sequence of disconnect and connect commands; Wireless control commands are sent to the wireless communication module of the auxiliary fixture via wireless communication to control the electromagnetic relay array of the auxiliary fixture to simultaneously perform on / off operations of solid-state hardware power lines and data lines. During the on / off operation of the electromagnetic relay array, the power line voltage and power line current changes are collected by the status monitoring circuit of the auxiliary fixture to obtain power line voltage and power line current change data. Electrical parameter data are obtained by transmitting power line voltage and current change data back via wireless communication. During the switching operation of the electromagnetic relay array, the steps for acquiring power line voltage and current changes through the status monitoring circuit of the auxiliary fixture to obtain power line voltage and current change data include: When the electromagnetic relay array performs a disconnection operation, the voltage change of the solid-state hardware power line is monitored in real time at a preset first sampling frequency. When the electromagnetic relay array performs a switching operation, the current value of the solid-state hardware power line is monitored in real time at a preset second sampling frequency. During the monitoring process, when a sudden change in voltage or current value is detected, the sampling frequency is increased to obtain high-resolution electrical parameter data; High-resolution electrical parameter data is combined with power line voltage variation data and power line current variation data to obtain complete electrical parameter data.

2. The automated testing method for hot-plugging solid-state hardware as described in claim 1, characterized in that, The steps of sending wireless control commands to the wireless communication module of the auxiliary fixture via wireless communication to control the electromagnetic relay array of the auxiliary fixture to simultaneously perform on / off operations of the solid-state hardware power line and data line include: The wireless control command is sent to the wireless communication module of the auxiliary fixture; The electromagnetic coils of the electromagnetic relay array are switched on and off via a wireless communication module, thereby driving the relay contacts to perform the switching operation of the solid-state hardware power line. While controlling the electromagnetic relay array, the on / off operation of the solid-state hardware data line is synchronously controlled through the auxiliary contacts of the electromagnetic relay array.

3. The automated testing method for hot-plugging solid-state hardware as described in claim 2, characterized in that, The method further includes: After sending the disconnect command, the control electromagnetic relay array first disconnects the solid-state hardware power line, and then disconnects the data line. The time interval between the two is less than the preset minimum time interval. After sending the connection command, the control electromagnetic relay array first connects the solid-state hardware power line, and then connects the data line. The time interval between the two is less than the preset minimum time interval.

4. The automated testing method for hot-plugging solid-state hardware as described in claim 1, characterized in that, The steps for comparing electrical parameter data with preset thresholds to generate anomaly detection results include: Receive the electrical parameter data, and extract the voltage change data and current change data from the electrical parameter data; The voltage change data is compared with a preset voltage threshold. When the voltage change data exceeds the preset voltage threshold range, a voltage anomaly identifier is generated and the specific time point and the value exceeding the voltage anomaly are recorded. The current change data is compared with the preset current threshold. When the current change data exceeds the preset current threshold range, a current anomaly identifier is generated and the specific time point and the value exceeding the current anomaly are recorded. Anomaly detection results are generated based on voltage and current anomaly indicators.

5. The automated testing method for hot-swapping solid-state hardware as described in claim 4, characterized in that, The steps for generating anomaly judgment results based on voltage anomaly indicators and current anomaly indicators include: When a voltage abnormality indicator indicates a voltage abnormality or a current abnormality indicator indicates a current abnormality, the current insertion / removal operation is determined to be abnormal, and an operation abnormality indicator is generated. Record the time of occurrence of the operation anomaly and the corresponding electrical parameter data to obtain anomaly record data; The system counts the number of consecutive operation anomaly flags. When the number of consecutive anomalies reaches a preset pause threshold, a pause command is generated and subsequent plugging / unplugging cycles are stopped. When the number of consecutive anomalies reaches a preset termination threshold, a test termination command is generated and a safety power-off operation is performed.

6. The automated testing method for hot-plugging solid-state hardware as described in claim 1, characterized in that, When the anomaly detection result indicates successful operation, the steps to verify the recognition status of the solid-state hardware in the system and generate system verification results after completing one on / off operation include: After completing a switching operation, the device identification status of the solid-state hardware in the operating system can be queried through system commands; When solid-state hardware is identified, its transmission bandwidth and connection speed information are further queried to generate hardware performance data. When solid-state hardware is not recognized, device recognition error information is recorded in the system kernel log to generate a system error log; Based on device identification status, hardware performance data, and system error logs, system verification results are generated.

7. The automated testing method for hot-plugging solid-state hardware as described in claim 1, characterized in that, The steps for calculating the number of successful tests and generating a test report based on the anomaly detection results, system verification results, and the number of plug-in / plug-out cycles in the test configuration parameters include: Based on the number of plug-in / plug-out cycles in the test configuration parameters, the number of completed plug-in / plug-out cycles, the number of successfully executed plug-in / plug-out operations, and the number of abnormal plug-in / plug-out operations are counted to generate a count statistics. Integrate anomaly detection results, system verification results, electrical parameter data, and test count statistics to generate test process data; Analyze the abnormal patterns in the test process data and classify the abnormal patterns into power line abnormalities, data line abnormalities, or system identification abnormalities to generate abnormality classification data; The test process data, anomaly classification data, and test configuration parameters are combined and analyzed to generate test report data. The test report data includes the total number of insertions and removals, the number of successful insertions and removals, the anomaly type, records of electrical parameters exceeding the standard, and the anomaly occurrence mode.

8. An automated testing system for hot-swapping solid-state hardware, characterized in that, The solid-state hardware hot-swap automated testing system includes: a memory, a processor, and a solid-state hardware hot-swap automated testing program stored on the memory and executable on the processor, wherein the solid-state hardware hot-swap automated testing program is configured to implement the steps of the solid-state hardware hot-swap automated testing method as described in any one of claims 1 to 7.

Images