MicroLED module photoelectric performance test fixture

Abstract

The invention relates to the technical field of test fixtures, in particular to a micro LED module photoelectric property test fixture which comprises a support, and a supporting piece is installed on the support. A first rotating piece capable of adjusting the angle of a sample is mounted on the supporting piece, a first positioning piece capable of finely positioning the first rotating piece is mounted on the first rotating piece, and a first limiting piece capable of limiting the first rotating piece is mounted on the first positioning piece; a second rotating piece capable of adjusting the horizontal angle of the sample is mounted on the first rotating piece, and a second positioning piece capable of finely positioning the second rotating piece is mounted on the second rotating piece. According to the invention, comprehensive photoelectric performance test under multi-angle and multi-temperature conditions can be realized, the test precision is improved, and the application range is widened; according to the invention, the sample table is detachable, so that the compatibility of equipment is enhanced, and the sample table can be matched with various instruments such as an integrating sphere and a luminance meter with a test aperture of 45mm for use.

Description

Technical Field

[0001] This invention relates to the field of test fixture technology, and more specifically, to a test fixture for the optoelectronic performance of MicroLED modules. Background Technology

[0002] Mini / MicroLED, as a next-generation display technology, boasts advantages such as high brightness, high contrast, and low power consumption, and is widely used in display and lighting fields. With continuous advancements in the manufacturing process of Mini / MicroLED modules, accurate and comprehensive testing of their optoelectronic performance has become a crucial step in ensuring product quality. Currently, various optoelectronic testing equipment is available on the market, but most have limited functionality and cannot simultaneously meet the testing requirements under multiple parameters, angles, and temperature conditions.

[0003] Currently, most conventional Mini / MicroLED module testing devices in the industry use a single pressure plate to fix the sample, and the ribbon cable is only connected to the driver board through holes, without any additional fixing structure; the sample stage is an integrated design that cannot be disassembled and assembled separately, and can only be adapted to specific testing equipment (such as a single brightness meter), and cannot be compatible with commonly used testing equipment with different functions such as integrating spheres and luminance meters; the temperature control module is mostly external, with a narrow temperature control range (usually only 30℃-60℃), and there is no integrated constant temperature heating structure; the rotation adjustment function is missing, and it can only test photoelectric parameters at a fixed angle, and cannot verify the impact of the field of view on the test accuracy.

[0004] Therefore, we propose a MicroLED module optoelectronic performance testing fixture to solve the above problems. Summary of the Invention

[0005] To overcome the aforementioned deficiencies of the prior art, embodiments of the present invention provide a MicroLED module photoelectric performance testing fixture to solve the problems mentioned in the background art.

[0006] To achieve the above objectives, the present invention provides the following technical solution: a MicroLED module photoelectric performance testing fixture, comprising a bracket, on which a support member is mounted; a first rotating member capable of adjusting the sample angle is mounted on the support member, a first positioning member capable of fine positioning the first rotating member is mounted on the first rotating member, and a first limiting member capable of limiting the first rotating member is mounted on the first positioning member; a second rotating member capable of adjusting the sample horizontal angle is mounted on the first rotating member, a second positioning member capable of fine positioning the second rotating member is mounted on the second rotating member, and a second limiting member capable of limiting the second rotating member is mounted on the second positioning member; a fixing member capable of placing a drive board is mounted on the second rotating member; and a placement member capable of placing a sample is mounted on the fixing member.

[0007] In a preferred embodiment, the support includes a support plate mounted on a bracket, a temperature control box mounted on the side wall of the support plate, a vertical fixing plate welded to the upper end of the support plate, and a mounting base provided on one side of the vertical fixing plate. The mounting base is fixed to the vertical fixing plate by a plurality of first screws, which further facilitates the disassembly and installation of the base plate by the staff.

[0008] In a preferred embodiment, the first rotating component includes a first base disposed on one side of the mounting base, the first base being fixed to the mounting base by a plurality of second screws, a first rotating seat being rotatably connected to the first base, a first dial being rotatably connected to the first rotating seat, a first rotating rod being fixedly connected to the side wall of the first dial, and a first auxiliary measuring seat located on one side of the first dial being installed on the side wall of the first base by screws.

[0009] In a preferred embodiment, the first positioning member includes a first positioning seat fixedly connected to the side wall of the first base, the first positioning seat having a first positioning groove, a first measuring cylinder fixedly connected to the first positioning seat, a first adjusting cylinder sleeved on the first measuring cylinder, a first push rod fixedly connected to the first adjusting cylinder passing through the first measuring cylinder and extending into the first positioning groove, the first push rod and the first measuring cylinder being threadedly connected, the surfaces of the first measuring cylinder and the first adjusting cylinder both having graduations, a first stop cylinder fixedly connected to the side wall of the first positioning seat, and a first stop rod extending into the first positioning groove passing through the first stop cylinder.

[0010] In a preferred embodiment, the first limiting member includes a connecting seat fixed to the first rotating seat by a third screw. A positioning screw for the first positioning dial is threaded onto the connecting seat. A connecting post is fixedly connected to one end of the positioning screw. A knob is fixedly connected to one end of the connecting seat. One end of the first push rod and the first stop rod are in contact with the side wall of the first connecting seat, respectively.

[0011] In a preferred embodiment, the second rotating component includes a bent mounting plate fixed to a first dial by a plurality of screws, a second base provided on the bent mounting plate, the second base being fixed to the second base by a plurality of fourth screws, a second rotating seat rotatably connected to the second base, a second auxiliary measuring seat fixedly mounted on the second base by screws, a second dial rotatably connected to the second rotating seat, and a second rotating rod fixedly connected to the second dial.

[0012] In a preferred embodiment, the second positioning member includes a second positioning seat fixedly connected to the side wall of the second base. The side wall of the second positioning seat is provided with a second positioning groove. A second measuring cylinder is fixedly connected to the second positioning seat. A second adjusting cylinder is sleeved on the second measuring cylinder. A second push rod is fixedly connected to the second adjusting cylinder, passing through the second measuring cylinder and extending into the second positioning groove. The second push rod and the second measuring cylinder are threaded together. The surfaces of the second measuring cylinder and the second adjusting cylinder are both provided with graduations. A second stop cylinder is fixedly connected to the side wall of the second positioning seat. A second stop rod extending into the second positioning groove is provided through the second stop cylinder.

[0013] In a preferred embodiment, the fixing member includes a fixing seat fixedly connected to the second dial, a fixing screw threaded through the fixing seat, a screw hole matching the fixing screw threaded through the fixing seat, a rotating seat rotatably connected to the fixing seat, a drive plate bracket welded to the rotating seat, and multiple drive plate fixing columns fixedly connected to the drive plate bracket.

[0014] In a preferred embodiment, the placement component includes a placement seat fixedly connected to a rotating seat, the placement seat having an air extraction connector and a wire outlet hole, a temperature control seat mounted on the placement seat, a metal column in the temperature control seat having an air extraction hole, a wire pressure plate fixed to the temperature control seat by screws, and a wire through hole extending to the placement seat on the temperature control seat.

[0015] The technical effects and advantages of this invention are as follows: 1. This invention enables comprehensive photoelectric performance testing under multiple angles and temperatures, improving testing accuracy and applicability; 2. The detachable sample stage design in this invention enhances equipment compatibility and can be used with various instruments such as integrating spheres with a test aperture of 45mm and luminance meters; 3. The pressure strip fixing structure in this invention prevents the ribbon cable from slipping off, thus improving test stability. Attached Figure Description

[0016] Figure 1 This is a schematic diagram of the structure of the present invention; Figure 2 This is a side view schematic diagram of the connection structure of the present invention; Figure 3 This is a schematic diagram of a partial connection structure of the present invention; Figure 4 for Figure 3 A schematic diagram of the inverted connection structure; Figure 5 for Figure 4 A schematic diagram of the local connection structure; Figure 6 for Figure 4 A partially enlarged schematic diagram of the connection structure at point A in the middle; Figure 7 for Figure 3 A side view diagram of the connection structure; Figure 8 for Figure 7 A schematic diagram of the local connection structure; Figure 9 for Figure 8 A side view diagram of the connection structure.

[0017] The attached diagram is labeled: 1. Support; 2. Support component, 21. Support plate, 22. Temperature control box, 23. Vertical fixing plate, 24. Mounting base plate, 25. First screw; 3 First rotating component, 31 First base, 32 Second screw, 33 First rotating seat, 34 First scale, 35 First rotating rod, 36 First auxiliary scale seat; 4 First positioning component, 41 First positioning seat, 42 First positioning groove, 43 First measuring cylinder, 44 First adjusting cylinder, 45 First push rod, 46 First stop cylinder, 47 First stop rod; 5 First limiting component, 51 Connecting seat, 52 Third screw, 53 Positioning screw, 54 Connecting column, 55 Knob; 6 Second rotating component, 61 Bending mounting plate, 62 Second base, 63 Fourth screw, 64 Second rotating seat, 65 Second auxiliary scale seat, 66 Second dial, 67 Second rotating rod; 7 Second positioning component, 71 Second positioning seat, 72 Second positioning groove, 73 Second measuring cylinder, 74 Second adjusting cylinder, 75 Second push rod, 76 Second stop cylinder, 77 Second stop rod; 8. Second limiting component; 9. Fixing component, 91. Fixing base, 92. Fixing screw, 93. Screw hole, 94. Rotating seat, 95. Drive board bracket, 96. Drive board fixing column; 10 Placement component, 1001 Placement base, 1002 Temperature control base, 1003 Metal pillar, 1004 Wire clamping plate, 1005 Wire threading hole. Detailed Implementation

[0018] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0019] Reference Figure 1 and Figure 2A MicroLED module photoelectric performance testing fixture includes a bracket 1, which includes two bases, and two vertically placed vertical rods are fixedly connected to each of the two bases. Reference Figure 3 and Figure 4 A support member 2 is installed on the bracket 1. The support member 2 includes a support plate 21 installed on the bracket 1. Notably, the support plate 21 is fixedly connected by multiple screws and multiple vertical rods, which facilitates the installation and disassembly of the support plate 21 by the operator. A temperature control box 22 is installed on the side wall of the support plate 21, and the temperature control box 22 is installed on the side wall of the support plate 21 by multiple screws. A vertical fixing plate 23 is welded to the upper end of the support plate 21. Notably, a supporting triangular plate is welded at the connection between the vertical fixing plate 23 and the support plate 21 for fixing the vertical fixing plate 23. A mounting base 24 is provided on one side of the vertical mounting plate 23. The mounting base 24 is fixed to the vertical mounting plate 23 by multiple first screws 25, which further facilitates the disassembly and installation of the mounting base 24 by the staff. This allows the device to be used with the ATA-500 after being disassembled and assembled separately. It can test parameters such as luminous flux, radiant flux, chromaticity coordinates, color rendering index, color temperature, and dominant wavelength of the Microled module. The temperature control platform can adjust the contact temperature of the sample bottom, which is convenient for testing the stability of the optical properties of the sample at different temperatures.

[0020] Refer to 3. Figure 4 , Figure 5 and Figure 6 The support member 2 has a first rotating member 3 on one side. The first rotating member 3 includes a first base 31 located on one side of the mounting base 24. The first base 31 is fixed to the mounting base 24 by a plurality of second screws, which further facilitates the installation and disassembly of the first base 31 by the staff. At the same time, a first rotating seat 33 is rotatably connected to the first base 31, and a first scale 34 is rotatably connected to the first rotating seat 33. A first rotating rod 35 is fixedly connected to the side wall of the first scale 34. A first auxiliary measuring seat 36 located on one side of the first scale 34 is installed on the side wall of the first base 31 by screws.

[0021] Reference Figure 4 and Figure 5The first rotating component 3 is equipped with a first positioning component 4 capable of fine positioning. The first positioning component 4 includes a first positioning seat 41 fixedly connected to the side wall of the first base 31. The first positioning seat 41 is provided with a first positioning groove 42. A first measuring cylinder 43 is fixedly connected to the first positioning seat 41. A first adjusting cylinder 44 is sleeved on the first measuring cylinder 43. A first push rod 45 is fixedly connected to the first adjusting cylinder 44, passing through the first measuring cylinder 43 and extending into the first positioning groove 42. The first push rod 45 and the first measuring cylinder 43 are threadedly connected. The surfaces of the first measuring cylinder 43 and the first adjusting cylinder 44 are both provided with scales. A first stop cylinder 46 is fixedly connected to the side wall of the first positioning seat 41. A first stop rod 47 extending into the first positioning groove 42 is provided through the first stop cylinder 46.

[0022] Reference Figure 4 , Figure 5 and Figure 6 The first rotating part 3 is equipped with a first limiting part 5 capable of coarse positioning. The first limiting part 5 includes a connecting seat 51 fixed to the first rotating seat 33 by a third screw 52. A positioning screw 53 for the first positioning dial 34 is threaded onto the connecting seat 51. A connecting post 54 is fixedly connected to one end of the positioning screw 53. A knob 55 is fixedly connected to one end of the connecting seat 54. One end of the first push rod 45 and the first stop rod 47 respectively contact the side wall of the first connecting seat 51.

[0023] Reference Figure 7 , Figure 8 and Figure 9 The second rotating component 6 includes a bent mounting plate 61 fixed to the first dial 34 by multiple screws. A second base 62 is provided on the bent mounting plate 61. The second base 62 is fixed to the second base 62 by multiple fourth screws 63. A second rotating seat 64 is rotatably connected to the second base 61. A second auxiliary scale seat 65 is fixedly installed on the second base 62 by screws. A second dial 66 is rotatably connected to the second rotating seat 64. A second rotating rod 67 is fixedly connected to the second dial 66.

[0024] Reference Figure 7 , Figure 8 and Figure 9The second positioning component 7 includes a second positioning seat 71 fixedly connected to the side wall of the second base 62. The side wall of the second positioning seat 71 is provided with a second positioning groove 72. A second measuring cylinder 73 is fixedly connected to the second positioning seat 71. A second adjusting cylinder 74 is sleeved on the second measuring cylinder 73. A second push rod 75 is fixedly connected to the second adjusting cylinder 74, passing through the second measuring cylinder 73 and extending into the second positioning groove 72. The second push rod 75 and the second measuring cylinder 73 are threadedly connected. The surfaces of the second measuring cylinder 73 and the second adjusting cylinder 74 are both provided with scales. A second stop cylinder 76 is fixedly connected to the side wall of the second positioning seat 71. A second stop rod 77 extending into the second positioning groove 72 is provided through the second stop cylinder 76.

[0025] Reference Figure 7 , Figure 8 and Figure 9 The second limiting member 8 includes a horizontal seat fixed to the second rotating seat 64 by screws. A lead screw for positioning the second scale 66 is threaded onto the horizontal seat. A knob is fixedly connected to one end of the lead screw. One end of the second push rod 75 and the second stop rod 777 respectively contact the side wall of the horizontal seat. It is worth noting that the second limiting member 8 and the first limiting member 5 have the same structure. They are both used to position and adjust the rotating seat, and further adjust the overall angle of the device.

[0026] Reference Figure 7 , Figure 8 and Figure 9 The fastener 9 includes a fixing seat 91 fixedly connected to the second dial 66. Notably, the fixing seat 91 has a notch, which divides the fixing seat 91 into two parts. A fixing screw 92 passes through the fixing seat 91. The fixing seat 91 has screw holes 93 that match the fixing screw 92. Notably, the fixing screw 92 and screw holes 93 are located on opposite sides of the notch. A rotating seat 94 is rotatably connected to the fixing seat 91. A drive board bracket 95 is welded to the rotating seat 94. Multiple drive board fixing posts 96 are fixedly connected to the drive board bracket 95. Notably, the operator can fix the drive board to the drive board fixing posts 96 with screws, which facilitates the operator's fixation of the drive board.

[0027] Reference Figure 7 , Figure 8 and Figure 9The placement component 10 includes a placement base 1001 fixedly connected to the rotating base 94. The placement base 1001 has an air extraction connector and a wire outlet hole. A temperature control base 1002 is mounted on the placement base 1001, and a temperature control heating plate is disposed within the temperature control base 1002. A metal column 1003 is provided in the temperature control base 1002, and the metal column 1003 has an air extraction hole. A wire clamping plate 1004 is fixed to the temperature control base 1002 by screws. The temperature control base 1002 has a wire through hole 1005 extending to the placement base 1001. Notably, the sample is fixed to the sample stage by air suction or the wire clamping plate 1004. The sample cable passes through the wire through hole 1005 on the sample stage and extends to the back of the sample base, where it can connect to the drive board on the drive board bracket 95. To prevent slippage, a wire clamping plate 1004 is added to the connection between the cable and the sample. This part of the sample stage can be detached and used separately for ATA-500 measurements.

[0028] Temperature control range: room temperature +10℃ - 85℃ When the temperature control base 1002 and the second rotating component 6 are used together, they can be placed in the OLED-200 for coordinated use.

[0029] The entire device, used in conjunction with the OLED-200, can test parameters such as brightness, external quantum efficiency, peak wavelength, chromaticity coordinates, and color temperature of Microled modules. The horizontal and vertical rotation angles can be adjusted by rotating the adjustment knob to test the field of view and check the accuracy of optical parameter measurements. The temperature control platform can adjust the contact temperature of the sample bottom, facilitating the testing of the stability of the sample's optical properties at different temperatures.

[0030] The temperature control base 1002 and the temperature control box 22 are connected and used together. The controller is located in the temperature control box 22, and the temperature control base 1002 is equipped with a resistance heating wire, which generates heat in the metal column 1003, further heating the test bench. The temperature control box 22 uses TEC temperature control to control the temperature. The specific principle is as follows: TEC, also known as a thermoelectric cooler, plays a crucial role in temperature control in many devices. Its basic working principle is based on the Peltier effect, a thermoelectric effect in which heat is absorbed on one side and released on the other at the metal contact point. Since the thermoelectric effect of pure metal is relatively small, in practical applications, semiconductor materials are usually used to significantly enhance this effect. By changing the direction of the current, the hot and cold sides of the TEC can be easily switched. This is essentially a process of transferring internal energy from one side to the other using electron flow under the action of an external electric field. TEC temperature control is a technology based on the Peltier effect, which uses current to control semiconductor devices to achieve bidirectional temperature regulation. It has advantages such as no noise, no vibration, and high precision.

[0031] Working principle: First method of use: The staff can connect the entire set of test instruments to the luminance meter, adjust the sample to different angles by rotating the adjustment knob, test the luminance and other parameters, and record the data changes at each angle.

[0032] More specifically, the operator can rotate the first rotating seat 33 and adjust it according to the first scale 34 and the first auxiliary scale seat 36. At the same time, the operator can rotate the first adjusting cylinder 44. It is particularly noteworthy that the first push rod 45 and the first scale cylinder 43 are threadedly connected, so the first push rod 45 can move forward with the assistance of the first adjusting cylinder 44. At the same time, the operator can move the position of the first push rod 45 according to the scale dimensions on the first scale cylinder 43 and the first adjusting cylinder 44. When the first push rod 45 moves, the connecting seat 51 can move, which makes it convenient for the operator to adjust the position of the first rotating seat 33. After the positions of the first rotating seat 33 and the first scale 34 are adjusted, the operator can rotate the positioning screw 53 to position the first scale 34, which further facilitates the operator to fix the angle of the first rotating part 3.

[0033] Then, the operator can rotate the second rotating seat 64 and the second scale 66 to position them appropriately, thus adjusting the horizontal position of the sample. Simultaneously, the operator can move the position of the second push rod 75 by adjusting the scale on the second measuring cylinder 73 and the second adjusting cylinder 74. Moving the second push rod 75 moves the horizontal seat, facilitating the adjustment of the position of the second rotating seat 64. After the positions of the second rotating seat 64 and the second scale 66 are adjusted, the operator can rotate the lead screw to position the second scale 66, further facilitating the fixing of the angle of the second rotating component 6, thus adjusting the horizontal angle of the sample.

[0034] Meanwhile, the operator can directly rotate the placement seat 1001. After the placement seat 1001 is in place, the operator can directly rotate the fixing screw 92, which will connect the fixing screw 92 and the screw hole 93. This will limit the rotation seat 94 of the fixing seat 91, and further limit the placement seat 1001. Then, the operator can use the wire clamping plate 1004 to fix the sample on the temperature control seat 1002. At the same time, the operator can also fix the drive board to the drive board fixing seat 96 with screws, and then pass the wire through the wire hole 1005 to complete the sample installation. The operator can also use the air suction connector to connect to an external air pump, which will allow the sample to be fixed through the air suction hole on the metal column 1003, thereby meeting the usage requirements of different samples. The temperature control seat 1002 can work with the temperature control box 22 to adjust the temperature to adapt to the usage environment of different samples.

[0035] The second method of use: Fix the Mini / MicroLED module to the sample stage by air suction, connect the ribbon cable to the driver board, use the 1004 wire clamp to fix the ribbon cable, place the sample stage on the temperature control platform, set the temperature to 60℃, and start testing the luminous flux, chromaticity coordinates and other parameters using an integrating sphere with a test aperture of 45mm.

[0036] Finally, the following points should be noted: First, in the description of this application, it should be noted that, unless otherwise specified and limited, the terms "installation", "connection", and "linkage" should be interpreted broadly, and can be mechanical or electrical connections, or internal connections between two components, or direct connections. "Up", "down", "left", "right", etc. are only used to indicate relative positional relationships. When the absolute position of the described object changes, the relative positional relationship may change. Secondly: The accompanying drawings of the embodiments disclosed in this invention only involve the structures involved in the embodiments disclosed in this invention. Other structures can refer to the general design. In the absence of conflict, the same embodiment and different embodiments of this invention can be combined with each other. In conclusion, the above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the present invention should be included within the protection scope of the present invention.

Claims

1. A fixture for testing the optoelectronic performance of a MicroLED module, characterized in that; Includes a bracket (1), on which a support member (2) is installed; The support member (2) is equipped with a first rotating member (3) capable of adjusting the sample angle, the first rotating member (3) is equipped with a first positioning member (4) capable of fine positioning of the first rotating member (3), and the first positioning member (4) is equipped with a first limiting member (5) capable of limiting the first rotating member (3). The first rotating part (3) is equipped with a second rotating part (6) that can adjust the horizontal angle of the sample. The second rotating part (6) is equipped with a second positioning part (7) that can be used for fine positioning of the second rotating part (6). The second positioning part (7) is equipped with a second limiting part (8) that can limit the second rotating part (7). The second rotating part (6) is equipped with a fixing part (9) that can hold the drive plate; The fixture (9) is equipped with a placement component (10) capable of placing a sample.

2. The MicroLED module photoelectric performance testing fixture according to claim 1, characterized in that: The support member (2) includes a support plate (21) mounted on the bracket (1). A temperature control box (22) is mounted on the side wall of the support plate (21). A vertical fixing plate (23) is welded to the upper end of the support plate (21). A mounting base (24) is provided on one side of the vertical fixing plate (23). The mounting base (24) is fixed to the vertical fixing plate (23) by multiple first screws (25), which further facilitates the disassembly and installation of the base plate (24) by the staff.

3. The MicroLED module photoelectric performance testing fixture according to claim 2, characterized in that: The first rotating component (3) includes a first base (31) disposed on one side of the mounting base (24). The first base (31) is fixed to the mounting base (24) by a plurality of second screws. A first rotating seat (33) is rotatably connected to the first base (31). A first dial (34) is rotatably connected to the first rotating seat (33). A first rotating rod (35) is fixedly connected to the side wall of the first dial (34). A first auxiliary measuring seat (36) located on one side of the first dial (34) is installed on the side wall of the first base (31) by screws.

4. The MicroLED module photoelectric performance testing fixture according to claim 3, characterized in that: The first positioning component (4) includes a first positioning seat (41) fixedly connected to the side wall of the first base (31), a first positioning groove (42) provided on the first positioning seat (41), a first measuring cylinder (43) fixedly connected on the first positioning seat (41), a first adjusting cylinder (44) sleeved on the first measuring cylinder (43), a first push rod (45) fixedly connected on the first adjusting cylinder (44) passing through the first measuring cylinder (43) and extending into the first positioning groove (42), the first push rod (45) and the first measuring cylinder (43) being threadedly connected, the surfaces of the first measuring cylinder (43) and the first adjusting cylinder (44) being provided with scales, a first stop cylinder (46) fixedly connected to the side wall of the first positioning seat (41), and a first stop rod (47) extending into the first positioning groove (42) passing through the first stop cylinder (46).

5. The MicroLED module photoelectric performance testing fixture according to claim 4, characterized in that: The first limiting member (5) includes a connecting seat (51) fixed on the first rotating seat (33) by a third screw (52). A positioning screw (53) for the first positioning dial (34) is threaded onto the connecting seat (51). A connecting post (54) is fixedly connected to one end of the positioning screw (53). A knob (55) is fixedly connected to one end of the connecting seat (54). One end of the first push rod (45) and the first stop rod (47) respectively contact the side wall of the first connecting seat (51).

6. The MicroLED module photoelectric performance testing fixture according to claim 2, characterized in that: The second rotating component (6) includes a bent mounting plate (61) fixed to the first dial (34) by a plurality of screws. A second base (62) is provided on the bent mounting plate (61). The second base (62) is fixed to the second base (62) by a plurality of fourth screws (63). A second rotating seat (64) is rotatably connected to the second base (61). A second auxiliary measuring seat (65) is fixedly installed on the second base (62) by screws. A second dial (66) is rotatably connected to the second rotating seat (64). A second rotating rod (67) is fixedly connected to the second dial (66).

7. A MicroLED module photoelectric performance testing fixture according to claim 6, characterized in that: The second positioning component (7) includes a second positioning seat (71) fixedly connected to the side wall of the second base (62). The side wall of the second positioning seat (71) is provided with a second positioning groove (72). A second measuring cylinder (73) is fixedly connected to the second positioning seat (71). A second adjusting cylinder (74) is sleeved on the second measuring cylinder (73). A second push rod (75) is fixedly connected to the second adjusting cylinder (74) through the second measuring cylinder (73) and extending into the second positioning groove (72). The second push rod (75) is threadedly connected to the second measuring cylinder (73). The surfaces of the second measuring cylinder (73) and the second adjusting cylinder (74) are both provided with scales. A second stop cylinder (76) is fixedly connected to the side wall of the second positioning seat (71). A second stop rod (77) extending into the second positioning groove (72) is provided through the second stop cylinder (76).

8. A MicroLED module photoelectric performance testing fixture according to claim 7, characterized in that: The fixing component (9) includes a fixing seat (91) fixedly connected to the second dial (66), a fixing screw (92) passing through the fixing seat (91), a screw hole (93) matching the fixing screw (92) on the fixing seat (91), a rotating seat (94) rotatably connected to the fixing seat (91), a drive plate bracket (95) welded on the rotating seat (94), and multiple drive plate fixing columns (96) fixedly connected to the drive plate bracket (95).

9. A MicroLED module photoelectric performance testing fixture according to claim 8, characterized in that: The placement component (10) includes a placement seat (1001) fixedly connected to the rotating seat (94). The placement seat (1001) is provided with an air extraction connector and a wire outlet hole. A temperature control seat (1002) is installed on the placement seat (1001). A metal column (1003) is provided in the temperature control seat (1002). An air extraction hole is provided on the metal column (1003). A wire pressure plate (1004) is fixed on the temperature control seat (1002) by screws. A wire through hole (1005) extending to the placement seat (1001) is provided on the temperature control seat (1002).

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