A method, system, and apparatus for testing circuit devices.

Abstract

This invention provides a device testing method, system, and apparatus for a circuit. The circuit includes a power supply, a target device, and a digital signal processor (DSP). The method includes: the DSP acquiring an operating instruction, which includes a target operating current, a first frequency, a first time, a second frequency, and a second time, wherein the first frequency is higher than the second frequency; the DSP controlling the operating current of the target device to reach the target operating current according to the first frequency within the first time; after the first time ends, the DSP controlling the operating current of the target device to reach the target operating current according to the second frequency within the second time, and repeatedly acquiring the target voltage and target current of the target device at turn-on, and calculating the target resistance based on the target voltage and target current. In this invention, frequency switching is implemented at any time through software logic, thereby enabling reliable testing of dynamic resistance under high-frequency operation, reducing costs and improving accuracy.

Description

Technical Field

[0001] The present invention relates to the field of electronic circuit technology, and in particular to a device testing method, system and device for circuits. Background Technology

[0002] In modern electronic systems, monitoring and controlling dynamic performance is crucial, especially under high-frequency operating conditions. However, existing technologies place high demands on algorithm time and chip computing power. Under high-frequency operation, the computation time required for algorithm calculations may consume most of the cycle time, thus affecting the system's response speed and stability. Furthermore, when operating high-frequency signals, sampling the resistance value of devices cannot be done in real time with the device's turn-on voltage and current, making it impossible to obtain dynamic resistance values. For example, at a frequency of 500kHz, the entire cycle is only 2 microseconds, while the execution time of the control algorithm typically reaches 1.2 microseconds. Adding the time for multiple sampling and data conversions, which takes approximately 600 nanoseconds, this tight cycle makes it difficult for the system to obtain dynamic resistance within a limited time. Therefore, it is impossible to effectively monitor device performance, thereby affecting the system's control and regulation capabilities. Moreover, the characteristics of high-frequency operation result in a relatively small sampling interval, and the volatility of the monitored data also increases significantly, leading to a decrease in the accuracy of the sampled data. Summary of the Invention

[0003] This invention provides a method, system, and device for testing circuit components, addressing the problems of high sampling difficulty and low accuracy in existing component performance testing.

[0004] To solve the above-mentioned technical problems, the present invention is implemented as follows:

[0005] In a first aspect, embodiments of the present invention provide a device testing method for a circuit.

[0006] The circuit includes a power supply, a target device, and a digital signal processor. The target device includes a first switch, a second switch, a third switch, and a fourth switch. The input terminals of the power supply are connected to the input terminals of the first switch and the third switch, respectively. The output terminals of the power supply are connected to the output terminals of the second switch and the fourth switch, respectively. The output terminal of the first switch is connected to the input terminal of the second switch, and the output terminal of the third switch is connected to the input terminal of the fourth switch. The output terminal of the digital signal processor is connected to the input terminals of the first switch, the second switch, the third switch, and the fourth switch, respectively. The input terminals of the digital signal processor are connected to the output terminals of the first switch, the second switch, the third switch, and the fourth switch, respectively. The digital signal processor is used to control the switching on and off of the target device.

[0007] The method includes:

[0008] Step S1: The digital signal processor acquires an operating instruction, which includes a target operating current, a first frequency, a first time, a second frequency, and a second time, wherein the first frequency is higher than the second frequency;

[0009] Step S2: The digital signal processor controls the operating current of the target device to reach the target operating current according to the first frequency within a first time period;

[0010] Step S3: After the first time period ends, the digital signal processor controls the operating current of the target device to reach the target operating current according to the second frequency during the second time period, and repeatedly collects the target voltage and target current when the target device is turned on, and calculates the target resistance based on the target voltage and target current.

[0011] Optionally, the circuit may further include: capacitors and inductors;

[0012] The input terminal of the capacitor is connected to the input terminal of the power supply, and the output terminal of the capacitor is connected to the output terminal of the power supply.

[0013] The input terminal of the inductor is connected to the output terminal of the first switch and the input terminal of the second switch, respectively, and the output terminal of the inductor is connected to the output terminal of the third switch and the input terminal of the fourth switch, respectively.

[0014] Optionally, the circuit further includes a temperature sensor, which is connected to both the power supply and the digital signal processor to acquire the circuit temperature.

[0015] Before the digital signal processor obtains the execution instructions, it also includes:

[0016] The digital signal processor acquires operating environment instructions, including a target operating temperature.

[0017] The digital signal processor acquires the circuit temperature obtained by the temperature sensor and controls the circuit temperature to meet the target operating temperature.

[0018] Optionally, before the digital signal processor controls the operating current of the target device to reach the target operating current according to the first frequency within the first time period, it further includes:

[0019] The digital signal processor controls the operating current of the target device according to the second frequency to monitor the circuit status and obtain the status of the circuit; if the circuit status is normal, the digital signal processor controls the operating current of the target device according to the first frequency to detect the circuit status and obtain the status of the circuit; if the circuit status is normal, the digital signal processor controls the operating current of the target device to reach the target operating current according to the first frequency within a first time.

[0020] Optionally, the digital signal processor repeats steps S1 to S3 until a preset test time is met and then terminates the operation.

[0021] Optionally, the digital signal processor controls the operating current of the target device to reach the target operating current according to the first frequency within a first time period, including:

[0022] During the first time period, the digital signal processor sets a pulse width modulation square wave according to the first frequency and adjusts the duty cycle of the square wave through proportional-integral-derivative methods, thereby controlling the operating current of the target device to reach the target operating current.

[0023] Optionally, after the digital signal processor controls the operating current of the target device to reach the target operating current according to the first frequency within a first time period, it includes:

[0024] After the first time period ends, the first duty cycle at which the operating current of the target device reaches the target operating current is recorded at the first frequency, and the first frequency is exited, wherein the first duty cycle is used to determine the initial duty cycle of the second frequency;

[0025] The digital signal processor controls the operating current of the target device to reach the target operating current according to the second frequency within a second time period, including:

[0026] During the second time period, the digital signal processor sets a pulse width modulation square wave according to the second frequency, and determines a second duty cycle based on the first duty cycle. The second duty cycle is the initial duty cycle of the second frequency. Based on the second duty cycle, the square wave is adjusted by proportional-integral-derivative operation, thereby controlling the operating current of the target device to reach the target operating current.

[0027] Optionally, the multiple acquisitions of the target voltage and target current when the target device is turned on include:

[0028] The sampling point is determined based on the second duty cycle, and the target voltage and target current of the target device when it is turned on are collected multiple times based on the sampling point.

[0029] Secondly, embodiments of the present invention provide a device testing system for circuits.

[0030] The circuit includes: a power supply, a target device, and a digital signal processor;

[0031] The target device includes: a first switch, a second switch, a third switch, and a fourth switch;

[0032] The input terminal of the power supply is connected to the input terminal of the first switch and the input terminal of the third switch, respectively, and the output terminal of the power supply is connected to the output terminal of the second switch and the output terminal of the fourth switch, respectively.

[0033] The output terminal of the first switch is connected to the input terminal of the second switch, and the output terminal of the third switch is connected to the input terminal of the fourth switch;

[0034] The output terminal of the digital signal processor is connected to the input terminals of the first switch, the second switch, the third switch, and the fourth switch, respectively. The input terminal of the digital signal processor is connected to the output terminals of the first switch, the second switch, the third switch, and the fourth switch, respectively. The digital signal processor is used to control the switching on and off of the target device. The digital signal processor is used to acquire operating instructions, which include a target operating current, a first frequency, a first time, a second frequency, and a second time, wherein the first frequency is higher than the second frequency. During the first time, the operating current of the target device is controlled to reach the target operating current according to the first frequency during the second time. After the first time ends, the operating current of the target device is controlled to reach the target operating current according to the second frequency during the second time. The target voltage and target current when the target device is turned on are collected multiple times, and the target resistance is calculated based on the target voltage and target current.

[0035] Thirdly, embodiments of the present invention provide an electronic device, including a processor, a memory, and a program or instructions stored in the memory and executable on the processor, wherein the program or instructions, when executed by the processor, implement the steps in the device testing method of the circuit as described in any one of the first aspects.

[0036] Fourthly, embodiments of the present invention provide a readable storage medium storing a program or instructions that, when executed by a processor, implement the steps in the device testing method for the circuit as described in any one of the first aspects.

[0037] Fifthly, embodiments of the present invention provide a computer program product, including computer instructions that, when executed by a processor, implement the steps in the device testing method for the circuit as described in any one of the first aspects.

[0038] In this invention, a device testing method based on the circuit is provided. The method includes: a digital signal processor acquiring an operating instruction, the operating instruction including a target operating current, a first frequency, a first time, a second frequency, and a second time, wherein the first frequency is higher than the second frequency; the digital signal processor controlling the operating current of the target device to reach the target operating current according to the first frequency within the first time; after the first time ends, the digital signal processor controlling the operating current of the target device to reach the target operating current according to the second frequency within the second time, and repeatedly collecting the target voltage and target current when the target device is turned on, calculating the target resistance based on the target voltage and target current, and realizing the frequency switching at any time from a software logic perspective, thereby realizing the reliability testing of dynamic resistance under high-frequency operation, reducing costs and improving accuracy, and solving the problems of high sampling difficulty and low accuracy in existing device performance testing. Attached Figure Description

[0039] Various other advantages and benefits will become apparent to those skilled in the art upon reading the following detailed description of preferred embodiments. The accompanying drawings are for illustrative purposes only and are not intended to limit the invention. Furthermore, the same reference numerals denote the same parts throughout the drawings. In the drawings:

[0040] Figure 1 This is a flowchart of a device testing method for a circuit provided in an embodiment of the present invention;

[0041] Figure 2 This is a schematic diagram of a circuit structure provided in an embodiment of the present invention;

[0042] Figure 3 This is a general flowchart of a device testing method for a circuit provided in an embodiment of the present invention;

[0043] Figure 4 This is a frequency switching flowchart of a device testing method for a circuit provided in an embodiment of the present invention;

[0044] Figure 5 This is a schematic diagram of the structure of an electronic device provided in an embodiment of the present invention.

[0045] Figure label:

[0046] Circuit 01; Power supply 1; First switch 21; Second switch 22; Third switch 23; Fourth switch 24; Digital signal processor 3. Detailed Implementation

[0047] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some, not all, of the embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0048] Please refer to Figure 1 and Figure 2 This invention provides a device testing method for circuits.

[0049] Circuit 01 includes: power supply 1, target device, and digital signal processor 3; the target device includes: first switch 21, second switch 22, third switch 23, and fourth switch 24. The input terminal of power supply 1 is connected to the input terminal of first switch 21 and the input terminal of third switch 23 respectively. The output terminal of power supply 1 is connected to the output terminal of second switch 22 and the output terminal of fourth switch 24 respectively. The output terminal of first switch 21 is connected to the input terminal of second switch 22. The output terminal of third switch 23 is connected to the input terminal of fourth switch 24. The output terminal of digital signal processor 3 is connected to the input terminals of first switch 21, second switch 22, third switch 23, and fourth switch 24 respectively. The input terminal of digital signal processor 3 is connected to the output terminals of first switch 21, second switch 22, third switch 23, and fourth switch 24 respectively. Digital signal processor 3 is used to control the opening and closing of target device 2.

[0050] In this embodiment of the invention, the device testing method for the circuit is based on, for example... Figure 2 The H-bridge circuit shown includes a digital signal processor (DSP) 3, which may, but is not limited to, the F280021 chip. The DSP 3 can implement pulse width modulation (PWM) and proportional-integral-derivative (PID) control, enabling fast signal acquisition and processing, and improving the system's response speed and accuracy.

[0051] In this embodiment of the invention, circuit 01 may optionally include: capacitor 4 and inductor 5;

[0052] The input terminal of capacitor 4 is connected to the input terminal of power supply 1, and the output terminal of capacitor 4 is connected to the output terminal of power supply 1.

[0053] The input terminal of inductor 5 is connected to the output terminal of the first switch 21 and the input terminal of the second switch 22, respectively. The output terminal of inductor 5 is connected to the output terminal of the third switch 23 and the input terminal of the fourth switch 24, respectively.

[0054] In this embodiment of the invention, the specific output logic of circuit 01 is as follows:

[0055] 1. The digital signal processor 3 controls the first switch 21 and the fourth switch 24 to turn on, and the second switch 22 and the third switch 23 to turn off, thereby increasing the current in the inductor 5;

[0056] 2. The digital signal processor 3 controls the second switch 22 and the fourth switch 24 to be turned on, and the first switch 21 and the third switch 23 to be turned off. Since the current of the inductor 5 remains basically unchanged, the voltage and current of the second switch 22 and the fourth switch 24 are collected at this time to calculate the resistance value.

[0057] 3. The digital signal processor 3 controls the second switch 22 and the third switch 23 to be turned on, and the first switch 21 and the fourth switch 24 to be turned off, thereby reducing the current in the inductor 5;

[0058] 4. The digital signal processor 3 controls the first switch 21 and the third switch 23 to be turned on, and the second switch 22 and the fourth switch 24 to be turned off, while the current of the inductor 5 remains basically unchanged.

[0059] The method includes:

[0060] Step S1: The digital signal processor acquires an operating instruction, which includes a target operating current, a first frequency, a first time, a second frequency, and a second time, wherein the first frequency is higher than the second frequency;

[0061] In this embodiment of the invention, the running instruction includes specific target operating current, frequency, and time parameters, enabling the digital signal processor to clearly understand and execute the task. By setting two different frequencies (a first frequency and a second frequency), where the first frequency is a high frequency (greater than 400kHz) and the second frequency is a low frequency (less than or equal to 400kHz), the system can switch between high-frequency and low-frequency conditions. During the first time period, the system runs at a higher frequency, thereby achieving reliability testing of dynamic resistance under high-frequency operation. The system samples at a lower frequency, which makes the obtained dynamic resistance value more accurate and stable, thus improving the overall efficiency while enhancing the reliability of the system.

[0062] In this embodiment of the invention, optionally, before the digital signal processor controls the operating current of the target device to reach the target operating current according to the first frequency within a first time period, the method further includes:

[0063] The digital signal processor controls the operating current of the target device according to the second frequency to monitor the circuit status and obtain the status of the circuit; if the circuit status is normal, the digital signal processor controls the operating current of the target device according to the first frequency to detect the circuit status and obtain the status of the circuit; if the circuit status is normal, the digital signal processor controls the operating current of the target device to reach the target operating current according to the first frequency within a first time.

[0064] In this embodiment of the invention, the digital signal processor first performs circuit status monitoring at a low frequency, thereby effectively identifying potential problems in the circuit and ensuring system safety. The digital signal processor then ensures that the circuit status is monitored at a high frequency when the circuit is normal, reducing the risk to the control device under abnormal conditions and improving the reliability and safety of the system.

[0065] Step S2: The digital signal processor controls the operating current of the target device to reach the target operating current according to the first frequency within a first time period;

[0066] In this embodiment of the invention, within a first time period, the DSP controls the operating current of the target device according to a set first frequency, and operates at a higher frequency, thereby realizing the reliability test of dynamic resistance under high frequency operation. Controlling the operating current under high frequency conditions can more realistically reflect the working condition of the target device in actual application and realize aging test.

[0067] In this embodiment of the invention, optionally, the digital signal processor controls the operating current of the target device to reach the target operating current according to the first frequency within a first time period, including:

[0068] During the first time period, the digital signal processor sets a pulse width modulation square wave according to the first frequency and adjusts the duty cycle of the square wave through proportional-integral-derivative methods, thereby controlling the operating current of the target device to reach the target operating current.

[0069] In this embodiment of the invention, the operating current of the target device is controlled by a PWM signal, enabling it to quickly and accurately reach the set target operating current. The average output power is changed by adjusting the duty cycle, thereby improving the overall energy efficiency of the system. Furthermore, the PID control algorithm, through real-time feedback adjustment of the current error, can better maintain the stability of the current, reduce fluctuations, and improve the accuracy of the system.

[0070] Step S3: After the first time period ends, the digital signal processor controls the operating current of the target device to reach the target operating current according to the second frequency during the second time period, and repeatedly collects the target voltage and target current when the target device is turned on, and calculates the target resistance based on the target voltage and target current.

[0071] In this embodiment of the invention, during the second time period, the DSP controls the operating current of the target device according to the set second frequency, so that the system can operate sampling at a lower frequency, which can make the obtained dynamic resistance value more accurate and stable, thereby improving the reliability of the system and improving the overall efficiency.

[0072] In this embodiment of the invention, optionally, after the digital signal processor controls the operating current of the target device to reach the target operating current according to the first frequency within a first time period, the process includes:

[0073] After the first time period ends, the first duty cycle at which the operating current of the target device reaches the target operating current is recorded at the first frequency, and the first frequency is exited, wherein the first duty cycle is used to determine the initial duty cycle of the second frequency;

[0074] The digital signal processor controls the operating current of the target device to reach the target operating current according to the second frequency within a second time period, including:

[0075] During the second time period, the digital signal processor sets a pulse width modulation square wave according to the second frequency, and determines a second duty cycle based on the first duty cycle. The second duty cycle is the initial duty cycle of the second frequency. Based on the second duty cycle, the square wave is adjusted by proportional-integral-derivative operation, thereby controlling the operating current of the target device to reach the target operating current.

[0076] In this embodiment of the invention, recording the first duty cycle provides a data basis for subsequently determining the initial duty cycle at the second frequency, enabling the system to operate more smoothly. Furthermore, the PID control method is used to precisely adjust the operating current at the second frequency, thereby improving the system's accuracy and efficiency.

[0077] In this embodiment of the invention, optionally, the multiple acquisitions of the target voltage and target current when the target device is turned on include:

[0078] The sampling point is determined based on the second duty cycle, and the target voltage and target current of the target device when it is turned on are collected multiple times based on the sampling point.

[0079] In this embodiment of the invention, determining the sampling point based on the second duty cycle ensures accurate acquisition of current and voltage, thereby improving the acquisition rate.

[0080] In this embodiment of the invention, a device testing method based on the circuit is provided. The method includes: a digital signal processor acquiring an operating instruction, the operating instruction including a target operating current, a first frequency, a first time, a second frequency, and a second time, wherein the first frequency is higher than the second frequency; the digital signal processor controlling the operating current of the target device to reach the target operating current according to the first frequency within the first time; after the first time ends, the digital signal processor controlling the operating current of the target device to reach the target operating current according to the second frequency within the second time, and repeatedly collecting the target voltage and target current when the target device is turned on, calculating the target resistance based on the target voltage and target current, and realizing the frequency switching at any time from a software logic perspective, thereby realizing the reliability testing of dynamic resistance under high-frequency operation, reducing costs and improving accuracy, and solving the problems of high sampling difficulty and low accuracy in existing device performance testing.

[0081] In this embodiment of the invention, optionally, the circuit further includes: a temperature sensor, which is connected to the power supply and the digital signal processor respectively, for acquiring the circuit temperature;

[0082] Before the digital signal processor obtains the execution instructions, it also includes:

[0083] The digital signal processor acquires operating environment instructions, including a target operating temperature.

[0084] The digital signal processor acquires the circuit temperature obtained by the temperature sensor and controls the circuit temperature to meet the target operating temperature.

[0085] In this embodiment of the invention, the operating temperature of the circuit is acquired in real time by a temperature sensor and the data is transmitted to the DSP, so that the DSP can ensure that the circuit operates at the target operating temperature. This realizes the active adjustment of the circuit's operating conditions, which helps the circuit to undergo aging tests under ideal conditions, improves the effectiveness and reliability of the tests, and can also prevent overheating, thereby avoiding damage to the devices.

[0086] In this embodiment of the invention, optionally, the digital signal processor repeatedly executes steps S1 to S3 until a preset test time is met and then the operation ends.

[0087] In this embodiment of the invention, by repeatedly executing steps S1 to S3, the DSP can continuously monitor and control the target device within a set test time, providing sufficient data support for evaluating the device's performance under different conditions. With each iteration, the system can continuously collect the target device's operating data, thereby generating a rich dataset, which helps to conduct in-depth analysis of the target device's dynamic characteristics. Furthermore, by completing multiple tests within the set test time, the performance of the target device can be effectively verified, ensuring its reliability and stability in practical applications.

[0088] In the embodiments of this invention, please refer to Figure 3 Specific circuit device testing methods include:

[0089] The digital signal processor receives a first instruction sent by the host computer. The first instruction includes: device operating current xA and device control temperature T℃.

[0090] The digital signal processor receives a second instruction sent by the host computer. The second instruction includes: a first frequency k1 and a first time t1, i.e., a high frequency k1 and a hold time t1; a second frequency k2 and a second time t2, i.e., a low frequency k2 and a sampling time t2.

[0091] The digital signal processor reads the first instruction and the second instruction and runs a low-frequency process;

[0092] The digital signal processor samples the overall status of the machine and uploads it to the host computer, and starts running the high-frequency process of overall status detection and uploading. The host computer receives the overall status and makes a judgment, so that the high-frequency k1 can be run normally under non-fault conditions.

[0093] The digital signal processor triggers the PWM square wave control device to operate at a frequency of k1. During the time period t1, the device is kept running at the frequency of k1, that is, the operating current of the target device is controlled to reach the target operating current according to the first frequency within the first time period.

[0094] When time t1 is up, the high frequency is exited and the low frequency is started. The digital signal processor triggers the PWM square wave controller to operate the current according to the k2 frequency. That is, after the first time ends, the digital signal processor controls the operating current of the target device to reach the target operating current according to the second frequency in the second time.

[0095] Within time t2, the digital signal processor repeatedly samples the turn-on voltage and turn-on current of the device, calculates the dynamic resistance value and uploads it to the host computer, that is, it repeatedly collects the target voltage and target current when the target device is turned on, and calculates the target resistance based on the target voltage and target current;

[0096] When time t2 is reached, the digital signal processor exits the low frequency and runs at a high frequency, enters the loop process, and ends the operation after the set test time.

[0097] Please refer to Figure 4 The specific frequency switching control process of the circuit components includes:

[0098] After the program enters the high-frequency process, the digital signal processor starts the timer to count t1, the PWM sets the square wave according to the k1 frequency, and the PID adjusts the duty cycle of the square wave to make the current xA.

[0099] The digital signal processor controls the device temperature to T℃ by adjusting the fan size;

[0100] When time t1 is up, record the first duty cycle U1 when the current xA is reached at high frequency, and then exit high frequency.

[0101] The digital signal processor starts timer counting t2, the PWM is set to a square wave according to the k2 frequency, the second duty cycle (U1+50%) / 2 is calculated as U2 when running at low frequency, and the second duty cycle is set as the initial duty cycle U2 of low frequency k2, and the PID control current is xA.

[0102] Calculate the sampling point Y = k2*(U2+5%), sample the turn-on voltage and turn-on current of the device at the Y value sampling point, and calculate the corresponding resistance value Ron;

[0103] Upload the sampled resistance value Ron to the host computer and save the data;

[0104] When time t2 expires, the low-frequency operation is stopped, the high-frequency operation is started, the loop process is entered, and the operation ends after the set test time.

[0105] Please refer to Figure 1 and Figure 2 This invention provides a device testing system for circuits.

[0106] Circuit 01 includes: power supply 1, target device and digital signal processor 3;

[0107] The target devices include: a first switch 21, a second switch 22, a third switch 23, and a fourth switch 24;

[0108] The input terminals of power supply 1 are connected to the input terminals of the first switch 21 and the third switch 23 respectively, and the output terminals of power supply 1 are connected to the output terminals of the second switch 22 and the fourth switch respectively.

[0109] The output terminal of the first switch 21 is connected to the input terminal of the second switch 22, and the output terminal of the third switch 23 is connected to the input terminal of the fourth switch 24.

[0110] The output terminal of the digital signal processor 3 is connected to the input terminals of the first switch 21, the second switch 22, the third switch 23 and the fourth switch 24 respectively. The input terminal of the digital signal processor 3 is connected to the output terminals of the first switch 21, the second switch 22, the third switch 23 and the fourth switch 24 respectively. The digital signal processor 3 is used to control the opening and closing of the target device 2.

[0111] The digital signal processor 3 is used to acquire operating instructions, which include a target operating current, a first frequency, a first time, a second frequency, and a second time, wherein the first frequency is higher than the second frequency; within the first time, the operating current of the target device is controlled to reach the target operating current according to the first frequency; after the first time ends, within the second time, the operating current of the target device is controlled to reach the target operating current according to the second frequency, and the target voltage and target current of the target device at turn-on are collected multiple times, and the target resistance is calculated based on the target voltage and target current.

[0112] The device testing system for the circuit provided in this embodiment of the invention can achieve Figures 1 to 4 The various processes implemented in the method embodiments achieve the same technical effect, and will not be described again here to avoid repetition.

[0113] This invention provides an electronic device 50, see [link to relevant documentation]. Figure 5 As shown, Figure 5 This is a schematic block diagram of an electronic device 50 according to an embodiment of the present invention, including a processor 51, a memory 52, and a program or instructions stored in the memory 52 and executable on the processor 51. When the program or instructions are executed by the processor, they implement the steps in the device testing method of any circuit of the present invention.

[0114] This invention provides a readable storage medium on which a program or instruction is stored. When the program or instruction is executed by a processor, it implements various processes of the embodiment of the device testing method for the circuit as described above, and can achieve the same technical effect. To avoid repetition, it will not be described again here.

[0115] This application also provides a computer program product, including computer instructions. When executed by a processor, these computer instructions implement the various processes of the method embodiments shown in the figures above and achieve the same technical effects. To avoid repetition, they will not be described again here.

[0116] Computer-readable media include both permanent and non-permanent, removable and non-removable media, which can store information using any method or technology. Information can be computer-readable instructions, data structures, modules of programs, or other data. Examples of computer storage media include, but are not limited to, phase-change memory (PRAM), static random access memory (SRAM), dynamic random access memory (DRAM), other types of random access memory (RAM), read-only memory (ROM), electrically erasable programmable read-only memory (EEPROM), flash memory or other memory technologies, CD-ROM, digital versatile optical disc (DVD) or other optical storage, magnetic tape, magnetic disk storage or other magnetic storage devices, or any other non-transferable medium that can be used to store information accessible by a computing device. As defined herein, computer-readable media does not include transient computer-readable media, such as modulated data signals and carrier waves.

[0117] It should be noted that the collection, gathering, updating, analysis, processing, use, transmission, and storage of user personal information involved in this disclosed technical solution all comply with relevant laws and regulations, are used for legitimate purposes, and do not violate public order and good morals. Necessary measures are taken to prevent unauthorized access to user personal information data and to safeguard user personal information security and network security.

[0118] It should be noted that, in this document, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. Unless otherwise specified, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes that element.

[0119] The sequence numbers of the above embodiments of the present invention are for descriptive purposes only and do not represent the superiority or inferiority of the embodiments.

[0120] Through the above description of the embodiments, those skilled in the art can clearly understand that the methods of the above embodiments can be implemented by means of software plus necessary general-purpose hardware platforms. Of course, they can also be implemented by hardware, but in many cases the former is a better implementation method. Based on this understanding, the technical solution of this application, in essence, or the part that contributes to the prior art, can be embodied in the form of a software product. This computer software product is stored in a storage medium (such as ROM / RAM, magnetic disk, optical disk) and includes several instructions to cause a service classification device (which may be a mobile phone, computer, server, air conditioner, or network device, etc.) to execute the methods described in the various embodiments of this application.

[0121] The above description is only a preferred embodiment of this application. It should be noted that for those skilled in the art, several improvements and modifications can be made without departing from the principle of this application, and these improvements and modifications should also be considered within the scope of protection of this application.

Claims

1. A device testing method for a circuit, characterized in that, The circuit includes: a power supply, a target device, and a digital signal processor; the target device includes: a first switch, a second switch, a third switch, and a fourth switch; The circuit further includes an inductor; the positive terminal of the power supply is connected to the first terminal of the first switch and the first terminal of the third switch, respectively; the ground terminal of the power supply is connected to the second terminal of the second switch and the second terminal of the fourth switch, respectively; the second terminal of the first switch is connected to the first terminal of the second switch, and the second terminal of the third switch is connected to the first terminal of the fourth switch; one end of the inductor is connected to the second terminal of the first switch and the first terminal of the second switch, respectively; the other end of the inductor is connected to the second terminal of the third switch and the first terminal of the fourth switch, respectively; the digital signal processor is connected to the first switch, the second switch, the third switch, and the fourth switch, respectively, and is used to output control signals to the first switch, the second switch, the third switch, and the fourth switch to control the opening and closing of the first switch, the second switch, the third switch, and the fourth switch; The method includes: Step S1: The digital signal processor acquires an operating instruction, which includes a target operating current, a first frequency, a first time, a second frequency, and a second time, wherein the first frequency is higher than the second frequency; Step S2: The digital signal processor controls the operating current of the target device to reach the target operating current according to the first frequency within a first time period; Step S3: After the first time period ends, the digital signal processor controls the operating current of the target device to reach the target operating current according to the second frequency during the second time period, and repeatedly collects the target voltage and target current when the target device is turned on, and calculates the target resistance based on the target voltage and target current; The digital signal processor controls the first switch and the fourth switch to turn on, and the second switch and the third switch to turn off, thereby increasing the current of the inductor; the digital signal processor controls the second switch and the fourth switch to turn on, and the first switch and the third switch to turn off. Since the current of the inductor remains unchanged, the voltage and current of the second switch and the fourth switch are collected at this time to calculate the target resistance. The digital signal processor controls the operating current of the target device to reach the target operating current according to the first frequency within a first time period, including: During the first time period, the digital signal processor sets a pulse width modulation square wave according to the first frequency and adjusts the duty cycle of the square wave through proportional-integral-derivative methods, thereby controlling the operating current of the target device to reach the target operating current. After the digital signal processor controls the operating current of the target device to reach the target operating current according to the first frequency within a first time period, it includes: After the first time period ends, the first duty cycle at which the operating current of the target device reaches the target operating current is recorded at the first frequency, and the first frequency is exited, wherein the first duty cycle is used to determine the initial duty cycle of the second frequency; The digital signal processor controls the operating current of the target device to reach the target operating current according to the second frequency within a second time period, including: During the second time period, the digital signal processor sets a pulse width modulation square wave according to the second frequency, and determines a second duty cycle based on the first duty cycle. The second duty cycle is the initial duty cycle of the second frequency. Based on the second duty cycle, the square wave is adjusted by proportional-integral-derivative, thereby controlling the operating current of the target device to reach the target operating current. The process of repeatedly collecting the target voltage and target current when the target device is turned on includes: determining the sampling point based on the second duty cycle, and repeatedly collecting the target voltage and target current when the target device is turned on based on the sampling point.

2. The device testing method for the circuit according to claim 1, characterized in that, The circuit also includes: capacitors and inductors; The input terminal of the capacitor is connected to the input terminal of the power supply, and the output terminal of the capacitor is connected to the output terminal of the power supply.

3. The device testing method for the circuit according to claim 1, characterized in that, The circuit further includes a temperature sensor, which is connected to the power supply and the digital signal processor respectively, for acquiring the circuit temperature. Before the digital signal processor obtains the execution instructions, it also includes: The digital signal processor acquires operating environment instructions, including a target operating temperature. The digital signal processor acquires the circuit temperature obtained by the temperature sensor and controls the circuit temperature to meet the target operating temperature.

4. The device testing method for the circuit according to claim 1, characterized in that, Before the digital signal processor controls the operating current of the target device to reach the target operating current according to the first frequency within the first time period, it further includes: The digital signal processor controls the operating current of the target device according to the second frequency to monitor the circuit status and obtain the status of the circuit; if the circuit status is normal, the digital signal processor controls the operating current of the target device according to the first frequency to detect the circuit status and obtain the status of the circuit; if the circuit status is normal, the digital signal processor controls the operating current of the target device to reach the target operating current according to the first frequency within a first time.

5. The device testing method for the circuit according to claim 1, characterized in that, The digital signal processor repeats steps S1 to S3 until the preset test time is met and then ends the operation.

6. A device testing system for a circuit, characterized in that, The system is used to perform the device testing method for the circuit according to any one of claims 1-5. The circuit includes: a power supply, a target device, and a digital signal processor; The target device includes: a first switch, a second switch, a third switch, and a fourth switch; The circuit further includes an inductor; the positive terminal of the power supply is connected to the first terminal of the first switch and the first terminal of the third switch, respectively; the ground terminal of the power supply is connected to the second terminal of the second switch and the second terminal of the fourth switch, respectively; the second terminal of the first switch is connected to the first terminal of the second switch, and the second terminal of the third switch is connected to the first terminal of the fourth switch; one end of the inductor is connected to the second terminal of the first switch and the first terminal of the second switch, respectively; the other end of the inductor is connected to the second terminal of the third switch and the first terminal of the fourth switch, respectively; the digital signal processor is connected to the first switch, the second switch, the third switch and the fourth switch, respectively, and is used to output PWM control signals to the first switch, the second switch, the third switch and the fourth switch, respectively, to control the opening and closing of the first switch, the second switch, the third switch and the fourth switch.

7. An electronic device, characterized in that, The device testing method includes a processor, a memory, and a program or instructions stored in the memory and executable on the processor, wherein the program or instructions, when executed by the processor, implement the steps of the circuit as described in any one of claims 1 to 5.

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