Motion error calibration method and device, storage medium and program product

Abstract

Provided are a kinematic error calibration method, apparatus, storage medium, and program product wherein the method comprises: determining phase information for phase modulation of a first reflector and a second reflector, the phase information varying with time, the phase information being used for phase modulation of the first reflector and the second reflector; the absolute value of the difference value between the moving distance of the second equipment along the gradient direction of the interference pattern and the moving distance of the interference pattern in the space caused by the change of the phase information is less than half of the space period of the interference pattern, the interference pattern indicates the distribution of the amplitudes of interference signals generated by the first reflector and the second reflector in the space; first configuration information and second configuration information are sent based on the phase information, the first configuration information is used for configuring the phase corresponding to the first reflector, and the second configuration information is used for configuring the phase corresponding to the second reflector, so that the problem of fuzzy position of the second equipment is solved, and the accuracy of determining the position of the second equipment is improved.

Description

TECHNICAL FIELD

[0001] The present application relates to the field of communication, and in particular, to a motion error calibration method and device, a storage medium, and a program product. BACKGROUND

[0002] In a synthetic aperture environment imaging based on a motion terminal, the accurate position of each virtual array element forming a synthetic aperture needs to be known, that is, the accurate position of the motion terminal needs to be known, so as to improve the quality of the imaging result. If the position error caused by the motion of the terminal is not eliminated, the image may be out of focus, distorted, or even unable to be imaged.

[0003] Currently, the motion error of the terminal can be calibrated based on the measurement of an interference signal. Exemplarily, a base station transmits a sensing signal for generating interference, and reflectors A and B passively or actively reflect the sensing signal to generate an interference signal. The distribution of the amplitude of the interference signal in space can be represented by an interference pattern. The terminal can continuously collect the amplitude of the interference signal during the motion, and estimate the change of its own position through the change of the amplitude, so as to calibrate the motion error of itself. However, the above-mentioned method may cause the problem of terminal position ambiguity. SUMMARY

[0004] The present application provides a motion error calibration method, device, storage medium, and program product, so as to solve the problem of terminal position ambiguity.

[0005] In a first aspect, the present application provides a motion error calibration method, which can be executed by a first device, or by a component (such as a processor, a chip, a chip system, etc.) configured in the first device, or by a logic module or software capable of realizing all or part of the functions of the first device, and the present application does not make any limitation in this regard.

[0006] Exemplarily, the method comprises: determining phase information, the phase information being used for phase modulation of a first reflector and a second reflector, the phase information changing with time to satisfy that the absolute value of the difference between the movement distance of the second device along the gradient direction of an interference pattern and the movement distance of the interference pattern in space caused by the change of the phase information is less than half of the spatial period of the interference pattern, wherein the interference pattern indicates the distribution of the amplitude of an interference signal generated by the first reflector and the second reflector in space; and based on the phase information, sending first configuration information and second configuration information, the first configuration information being used for configuring the phase corresponding to the first reflector, and the second configuration information being used for configuring the phase corresponding to the second reflector.

[0007] In the above technical solution, the interference pattern is translated in space by changing the phase information over time, while maintaining the shape of the interference pattern. By controlling the change of the phase information over time, the absolute value of the difference between the distance the second device moves along the gradient direction of the interference pattern and the distance the interference pattern moves in space is less than half of the spatial period of the interference pattern. In other words, the speed at which the interference pattern moves in space matches the speed at which the terminal moves along the gradient direction of the interference pattern. This avoids the spatial interval between two adjacent samplings of the interference signal by the second device spanning multiple spatial periods of the interference pattern, thereby solving the problem of ambiguous position of the second device. This facilitates the improvement of the accuracy of the determined position of the second device, resulting in better imaging effect in the imaging scenario.

[0008] In addition, it is understandable that in scenarios where the second device moves at high speed and the sampling rate is limited, there may be a problem that the absolute value of the difference between the distance the second device moves along the gradient direction of the interferogram and the distance the interferogram moves in space is much greater than half of the spatial period of the interferogram, which in turn leads to the problem of the second device's position being blurred. In other words, the above solution can be applied to scenarios where the second device moves at high speed and the sampling rate is limited.

[0009] It is understood that the absolute value of the difference between the distance the second device moves along the gradient direction of the interference pattern and the distance the interference pattern moves in space is less than half of the spatial period of the interference pattern includes: the difference between the distance the second device moves along the gradient direction of the interference pattern and the distance the interference pattern moves in space is less than half of the spatial period of the interference pattern, or the difference between the distance the interference pattern moves in space and the distance the second device moves along the gradient direction of the interference pattern is less than half of the spatial period of the interference pattern.

[0010] In conjunction with the first aspect, in some possible implementations of the first aspect, determining the phase information includes: determining the phase information based on the interferogram, the moving speed of the second device, and the time sampling interval of the second device for the interferometric signal.

[0011] In the above implementation, based on the moving speed of the second device and the time sampling interval of the interference signal, the moving distance corresponding to two adjacent samplings of the interference signal by the second device can be determined, and then appropriate phase information can be determined so that the moving distance of the interference pattern and the moving distance of the second device in the gradient direction of the interference pattern are matched, thereby solving the problem of the ambiguous position of the second device.

[0012] In conjunction with the first aspect, in some possible implementations of the first aspect, the aforementioned phase information includes the phase difference Δφ(t) between the phase modulations of the first reflector and the second reflector; and the aforementioned phase difference Δφ(t) satisfies the following formula:

[0013] Where v(t) represents the moving speed of the second device, θ(t) represents the angle between the moving direction of the second device and the gradient direction of the interference pattern, and T s λ represents the time sampling interval of the interference signal by the second device, λ represents the wavelength of the interference signal, and D(t) represents the spatial period of the interference pattern.

[0014] By varying the phase difference over time, the interference pattern is translated in space while maintaining its shape. The phase difference is controlled to ensure that the absolute value of the difference between the distance the second device moves along the gradient direction of the interference pattern and the distance the interference pattern moves in space is less than half the spatial period of the interference pattern. In other words, the speed at which the interference pattern moves in space matches the speed at which the second device moves along the gradient direction of the interference pattern. This prevents the spatial interval between two adjacent samples of the interference signal from the second device from spanning multiple spatial periods of the interference pattern, thus resolving the issue of ambiguous position of the second device. This improves the accuracy of determining the position of the second device, resulting in better imaging performance in the imaging scenario.

[0015] In conjunction with the first aspect, in some possible implementations of the first aspect, the method further includes: receiving first indication information, which indicates the moving speed of the second device and the time sampling interval of the interference signal by the second device.

[0016] By instructing the second device on its moving speed and the second device on the time sampling interval of the interference signal, the first device can determine the phase information based on the aforementioned parameters. In other words, the first device determines the phase information, which helps reduce the computational load of the second device and thus reduces its power consumption.

[0017] In conjunction with the first aspect, in some possible implementations of the first aspect, the method further includes: receiving a measurement result including an amplitude sequence based on a measurement of an interference signal on a first time-frequency resource, the first time-frequency resource being a time-frequency resource associated with a first reflector and a second reflector; and determining a second position of the second device based on the phase information, the interference pattern, the first position of the second device, and the amplitude sequence.

[0018] The first position can be considered as the approximate position of the second device, and the second position can be considered as the precise position of the second device after calibration.

[0019] When determining the second position of the second device, by considering phase information, the distance the interferogram moves in space can be determined, thereby avoiding the problem of ambiguity in the position of the second device. Then, by combining the interferogram and amplitude sequence, the precise position of the second device can be determined.

[0020] In conjunction with the first aspect, in some possible implementations of the first aspect, the method further includes: receiving second indication information indicating a first position of the second device; and determining an interference pattern based on the first position, the position of the first reflector, and the position of the second reflector.

[0021] By obtaining the first position of the second device, the first device can combine the first position with the positions of the two reflectors to more accurately determine the interference pattern, thereby facilitating the effective calibration of the motion error of the second device based on the interference pattern, and thus improving the positional accuracy of the second device.

[0022] Secondly, this application provides a motion error calibration method, which can be executed by a second device, or by a component configured in the second device (such as a processor, chip, chip system, etc.), or by a logic module or software capable of implementing all or part of the functions of the second device. This application does not limit the scope of the method.

[0023] For example, the method includes: determining first indication information, the first indication information indicating the moving speed of the second device and the time sampling interval of the interference signal by the second device; and sending the first indication information.

[0024] By instructing the second device on its moving speed and the second device on the time sampling interval of the interference signal, the first device can determine the phase information based on the aforementioned parameters. In other words, the first device determines the phase information, which helps reduce the computational load of the second device and thus reduces its power consumption.

[0025] Thirdly, this application provides a motion error calibration method, which can be executed by a second device, or by a component (such as a processor, chip, chip system, etc.) configured in the second device, or by a logic module or software capable of implementing all or part of the functions of the second device. This application does not limit the scope of the method.

[0026] For example, the method includes: determining phase information for phase modulation of a first reflector and a second reflector, the phase information varying over time to satisfy that the absolute value of the difference between the distance the second device moves along the gradient direction of the interferogram and the distance the interferogram moves in space due to the change in the phase information is less than half the spatial period of the interferogram, wherein the interferogram indicates the spatial distribution of the amplitude of the interference signals generated by the first reflector and the second reflector; and transmitting the phase information.

[0027] In the above technical solution, the phase information changes over time to achieve spatial translation of the interference pattern while maintaining its shape. By controlling the change of phase information over time, the absolute value of the difference between the distance the second device moves along the gradient direction of the interference pattern and the distance the interference pattern moves in space is less than half of the spatial period of the interference pattern. In other words, the speed at which the interference pattern moves in space matches the speed at which the terminal moves along the gradient direction of the interference pattern. This avoids the spatial interval between two adjacent samplings of the interference signal by the second device spanning multiple spatial periods of the interference pattern, thereby solving the problem of ambiguous position of the second device. This improves the accuracy of the determined position of the second device, resulting in better imaging performance in the imaging scenario.

[0028] In addition, it is understandable that in scenarios where the second device moves at high speed and the sampling rate is limited, there may be a problem that the absolute value of the difference between the distance the second device moves along the gradient direction of the interferogram and the distance the interferogram moves in space is much greater than half of the spatial period of the interferogram, which in turn leads to the problem of the second device's position being blurred. In other words, the above solution can be applied to scenarios where the second device moves at high speed and the sampling rate is limited.

[0029] Furthermore, in the above-described scheme, having the second device determine the phase information is more suitable for scenarios where the second device processes sensing signals, such as when the second device performs imaging based on the sensing signals. Since the second device determines the phase information, it does not need to send the parameters used to determine the phase information to the first device, thus reducing the impact of transmission signaling delays on the calculation results. For example, the phase information may be related to the movement speed of the second device. If the movement speed of the second device is indicated to the first device for phase information determination, the movement speed of the second device may change during the transmission period, resulting in lower accuracy of the determined phase information. Therefore, having the second device determine the phase information improves its accuracy. Additionally, the fact that the second device does not need to send the parameters used to determine the phase information to the first device also helps protect the privacy of the second device.

[0030] In conjunction with the third aspect, in some possible implementations of the third aspect, the determination of the phase information includes: determining the phase information based on the interferogram, the moving speed of the second device, and the time sampling interval of the second device for the interferometric signal.

[0031] In the above implementation, based on the moving speed of the second device and the time sampling interval of the interference signal, the moving distance corresponding to two adjacent samplings of the interference signal by the second device can be determined, and then appropriate phase information can be determined so that the moving distance of the interference pattern and the moving distance of the second device in the gradient direction of the interference pattern are matched, thereby solving the problem of the ambiguous position of the second device.

[0032] In conjunction with the third aspect, in some possible implementations of the third aspect, the aforementioned phase information includes the phase difference Δφ(t) between the phase modulations of the first reflector and the second reflector; and the aforementioned phase difference Δφ(t) satisfies the following formula:

[0033] Where v(t) represents the moving speed of the second device, θ(t) represents the angle between the moving direction of the second device and the gradient direction of the interference pattern, and T s λ represents the time sampling interval of the interference signal by the second device, λ represents the wavelength of the interference signal, and D(t) represents the spatial period of the interference pattern.

[0034] By varying the phase difference over time, the interference pattern is translated in space while maintaining its shape. The phase difference is controlled to ensure that the absolute value of the difference between the distance the second device moves along the gradient direction of the interference pattern and the distance the interference pattern moves in space is less than half the spatial period of the interference pattern. In other words, the speed at which the interference pattern moves in space matches the speed at which the second device moves along the gradient direction of the interference pattern. This prevents the spatial interval between two adjacent samples of the interference signal from the second device from spanning multiple spatial periods of the interference pattern, thus resolving the issue of ambiguous position of the second device. This improves the accuracy of determining the position of the second device, resulting in better imaging performance in the imaging scenario.

[0035] It is understandable that in a scenario where the second device determines the second position, the second device needs to use an interference pattern when determining the second position. One possible implementation is that the first device determines the interference pattern and then instructs the second device to use the interference pattern. For example, the above method further includes: receiving third instruction information, which instructs the interference pattern.

[0036] Optionally, the above method further includes: transmitting a first position of the second device, the first position being used to determine an interference pattern.

[0037] Determining the interference pattern using the first device and then instructing the second device helps reduce the computational load on the second device, thereby reducing its power consumption.

[0038] Another possible implementation is that the interference pattern is determined by a second device. Exemplarily, the method further includes determining the interference pattern based on a first position of the second device, the position of the first reflector, and the position of the second reflector.

[0039] Optionally, the above method further includes: receiving fourth indication information, which indicates the position of the first reflector and the position of the second reflector.

[0040] By determining the interference pattern using a second device, only the position information of the reflector needs to be transmitted, thus avoiding the transmission of the interference pattern and reducing air interface signaling overhead.

[0041] In conjunction with the third aspect, in some possible implementations of the third aspect, the above method further includes: sending a request message for requesting the location of the first reflector and the location of the second reflector.

[0042] By sending the aforementioned request message, the positions of the first reflector and the second reflector can be obtained, thereby facilitating the determination of the interference pattern by combining the first position.

[0043] In conjunction with the third aspect, in some possible implementations of the third aspect, the above method further includes: determining the second position of the second device based on the phase information, the interferogram, the first position of the second device, and the amplitude sequence, wherein the amplitude sequence is obtained based on the measurement of the interferometric signal on the first time-frequency resource, which is the time-frequency resource associated with the first reflector and the second reflector.

[0044] The first position can be considered as the approximate position of the second device, and the second position can be considered as the precise position of the second device after calibration.

[0045] When determining the second position of the second device, by combining phase information and interferogram, the distance the interferogram moves in space can be determined, thereby avoiding the problem of ambiguity in the position of the second device; furthermore, by combining the interferogram and amplitude sequence, the precise position of the second device can be determined.

[0046] Fourthly, this application provides a motion error calibration method, which can be executed by a first device, or by a component (such as a processor, chip, chip system, etc.) configured in the first device, or by a logic module or software capable of implementing all or part of the functions of the first device. This application does not limit the scope of the method.

[0047] For example, the method includes: receiving phase information for phase modulation of a first reflector and a second reflector, the phase information varying over time to satisfy that the absolute value of the difference between the distance the second device moves along the gradient direction of the interference pattern and the distance the interference pattern moves in space due to the change in phase information is less than half the spatial period of the interference pattern, wherein the interference pattern indicates the spatial distribution of the amplitude of the interference signals generated by the first reflector and the second reflector; and sending first configuration information and second configuration information based on the phase information, the first configuration information being used to configure the phase corresponding to the first reflector and the second configuration information being used to configure the phase corresponding to the second reflector.

[0048] In the above technical solution, the phase information changes over time to achieve spatial translation of the interference pattern while maintaining its shape. By controlling the change of phase information over time, the absolute value of the difference between the distance the second device moves along the gradient direction of the interference pattern and the distance the interference pattern moves in space is less than half of the spatial period of the interference pattern. In other words, the speed at which the interference pattern moves in space matches the speed at which the terminal moves along the gradient direction of the interference pattern. This avoids the spatial interval between two adjacent samplings of the interference signal by the second device spanning multiple spatial periods of the interference pattern, thereby solving the problem of ambiguous position of the second device. This improves the accuracy of the determined position of the second device, resulting in better imaging performance in the imaging scenario.

[0049] In addition, it is understandable that in scenarios where the second device moves at high speed and the sampling rate is limited, there may be a problem that the absolute value of the difference between the distance the second device moves along the gradient direction of the interferogram and the distance the interferogram moves in space is much greater than half of the spatial period of the interferogram, which in turn leads to the problem of the second device's position being blurred. In other words, the above solution can be applied to scenarios where the second device moves at high speed and the sampling rate is limited.

[0050] Furthermore, in the above-described scheme, having the second device determine the phase information is more suitable for scenarios where the second device processes sensing signals, such as when the second device performs imaging based on the sensing signals. Since the second device determines the phase information, it does not need to send the parameters used to determine the phase information to the first device, thus reducing the impact of transmission signaling delays on the calculation results. For example, the phase information may be related to the movement speed of the second device. If the movement speed of the second device is indicated to the first device for phase information determination, the movement speed of the second device may change during the transmission period, resulting in lower accuracy of the determined phase information. Therefore, having the second device determine the phase information improves its accuracy. Additionally, the fact that the second device does not need to send the parameters used to determine the phase information to the first device also helps protect the privacy of the second device.

[0051] In conjunction with the fourth aspect, in some possible implementations of the fourth aspect, the above method further includes: receiving a first position of the second device; determining an interference pattern based on the first position, the position of the first reflector, and the position of the second reflector; and sending third indication information indicating the interference pattern.

[0052] In other words, having the first device determine the interference pattern and then instruct the second device helps reduce the computational load on the second device, thereby reducing its power consumption.

[0053] In conjunction with the fourth aspect, in some possible implementations of the fourth aspect, the above method further includes: receiving a request message for requesting to obtain the positions of the first reflector and the second reflector; and sending fourth indication information indicating the positions of the first reflector and the second reflector.

[0054] In other words, the first device indicates the positions of the first and second reflectors to the second device so that the second device can determine the interference pattern. By having the second device determine the interference pattern, only the position information of the reflectors needs to be transmitted, thus avoiding the transmission of the interference pattern itself and reducing air interface signaling overhead.

[0055] Fifthly, this application provides a motion error calibration device capable of implementing the methods described in the first to fourth aspects and any possible implementation thereof. The device includes corresponding modules for performing the described methods. These modules can be implemented in software and / or hardware.

[0056] In a sixth aspect, this application provides a motion error calibration device, which includes a processor that can be used to execute a computer program in a memory to implement the methods described in the first to fourth aspects and any possible implementation of the first to fourth aspects.

[0057] Optionally, the device further includes a communication interface, to which the processor is coupled. The communication interface is used to receive signals from other devices outside the device and transmit them to the processor, or to send signals from the processor to other devices outside the device. Exemplarily, the communication interface may be a transceiver, circuit, bus, module, pin, or other type of communication interface.

[0058] Optionally, the device further includes a memory. The memory stores program instructions and data. The memory is coupled to the processor, which, when executing the instructions stored in the memory, can implement the methods described in the preceding aspects.

[0059] In a seventh aspect, this application provides a computer-readable storage medium storing a computer program or instructions that, when executed, implement the methods described in the first to fourth aspects and any possible implementations of the first to fourth aspects.

[0060] Eighthly, this application provides a computer program product including instructions that, when executed, implement the methods described in the first to fourth aspects and any possible implementations of the first to fourth aspects.

[0061] Ninthly, this application provides a chip system including at least one processor for supporting the implementation of the functions involved in the first to fourth aspects and any possible implementation of the first to fourth aspects, such as receiving or processing data involved in the above methods.

[0062] In one possible design, the chip system also includes a memory for storing program instructions and data, which may be located within or outside the processor.

[0063] The chip system can consist of chips or include chips and other discrete components.

[0064] In a tenth aspect, this application provides a communication system comprising a first device and a second device, wherein the first device is configured to implement the method described in the first aspect and any possible implementation thereof, and the second device is configured to implement the method described in the second aspect and any possible implementation thereof; or, the first device is configured to implement the method described in the fourth aspect and any possible implementation thereof, and the second device is configured to implement the method described in the third aspect and any possible implementation thereof.

[0065] It should be understood that the fifth to tenth aspects of this application correspond to the technical solutions of the first to fourth aspects of this application, and the beneficial effects obtained by each aspect and the corresponding feasible implementation are similar, and will not be repeated here. Attached Figure Description

[0066] Figure 1 This is a schematic diagram of synthetic aperture environmental imaging based on a motion terminal provided in an embodiment of this application;

[0067] Figure 2 This is a schematic diagram of the interference pattern provided in the embodiments of this application;

[0068] Figure 3 This is a schematic diagram of an existing motion error calibration method based on interferometry provided in the embodiments of this application;

[0069] Figure 4 This is a simulation scenario diagram of the motion error calibration method based on interferometry provided in the embodiments of this application;

[0070] Figure 5 This is a top view of a simulation scenario of the motion error calibration method based on interferometry provided in the embodiments of this application;

[0071] Figure 6 This is a schematic diagram showing the distribution of the amplitude of the interference signal along the x-axis according to an embodiment of this application;

[0072] Figure 7 This is a schematic diagram of the amplitude of the interference signal acquired by the terminal according to an embodiment of this application;

[0073] Figure 8 This is a schematic diagram illustrating the problem of ambiguous terminal location provided in the embodiments of this application;

[0074] Figure 9 This is a schematic diagram of the amplitude distribution of the interference pattern in the xy plane at different times, as provided in the embodiments of this application.

[0075] Figure 10 This is a schematic diagram of the amplitude distribution of the interference pattern in the x-direction at different times provided in the embodiments of this application;

[0076] Figure 11 This is a schematic diagram showing the relationship between the direction of the terminal's moving speed and the gradient direction of the interference pattern provided in the embodiments of this application;

[0077] Figure 12 This is a schematic flowchart of the motion error calibration method provided in the embodiments of this application;

[0078] Figure 13 This is a detailed flowchart illustrating the motion error calibration method provided in the embodiments of this application;

[0079] Figure 14 This is another schematic flowchart of the motion error calibration method provided in the embodiments of this application;

[0080] Figure 15 This is another detailed flowchart illustrating the motion error calibration method provided in the embodiments of this application;

[0081] Figure 16 This is another detailed flowchart illustrating the motion error calibration method provided in the embodiments of this application;

[0082] Figure 17 This is a schematic block diagram of the motion error calibration device provided in the embodiments of this application;

[0083] Figure 18 This is another schematic block diagram of the motion error calibration device provided in the embodiments of this application. Detailed Implementation

[0084] The technical solutions in this application will now be described with reference to the accompanying drawings.

[0085] Before introducing the methods provided in the embodiments of this application, the following points should be noted.

[0086] First, in this application, the terms "first" and "second" are used to distinguish identical or similar items with essentially the same function and effect. For example, "first instruction information" and "second instruction information" are used only to distinguish different instruction information and do not limit their order. Those skilled in the art will understand that the terms "first" and "second" do not limit the quantity or execution order, and that the terms "first" and "second" do not necessarily imply that they are different.

[0087] Second, in this application, the words "exemplarily" or "for example" are used to indicate that something is being described as an example, illustration, or illustration. Any embodiment or design that is described as "exemplarily" or "for example" in this application should not be construed as being more preferred or advantageous than other embodiments or design. Specifically, the use of the words "exemplarily" or "for example" is intended to present the relevant concepts in a specific manner.

[0088] Third, in this application, "at least one" means one or more, and "more than one" means two or more. "And / or" describes the relationship between related objects, indicating that three relationships can exist. For example, A and / or B can mean: A alone, A and B simultaneously, or B alone, where A and B can be singular or plural. The character " / " generally indicates an "or" relationship between the preceding and following related objects, but it does not exclude the possibility of indicating an "and" relationship; the specific meaning can be understood in context. "At least one of the following" or similar expressions refer to any combination of these items, including any combination of singular or plural items. For example, at least one of a, b, or c can mean: a, b, c; a and b; a and c; b and c; or a and b and c. Here, a, b, and c can be single or multiple.

[0089] Fourth, the method provided in this application can be applied to fourth-generation (4G) communication systems, such as long-term evolution (LTE) communication systems, as well as fifth-generation (5G) communication systems, such as 5G new radio (NR) communication systems, future communication systems, and also to Bluetooth systems, wireless fidelity (Wi-Fi) systems, long-range (LoRa) Internet of Things (IoT) systems, or vehicle-to-everything (V2X) systems.

[0090] Fifth, in this application, a terminal may also be referred to as user equipment (UE), access terminal, user unit, user station, mobile station, mobile station, remote station, remote terminal, mobile device, user terminal, terminal equipment, wireless communication equipment, user agent, or user apparatus.

[0091] A terminal can be a device that provides voice / data connectivity to a user, such as a handheld device or in-vehicle device with wireless connectivity. Currently, some examples of terminals include: mobile phones, tablets, computers with wireless transceiver capabilities (such as laptops and PDAs), mobile internet devices (MIDs), virtual reality (VR) devices, augmented reality (AR) devices, wireless terminals in industrial control, wireless terminals in self-driving, drones, wireless terminals in remote medical care, wireless terminals in smart grids, wireless terminals in transportation safety, wireless terminals in smart cities, wireless terminals in smart homes, cellular phones, cordless phones, session initiation protocol (SIP) phones, wireless local loop (WLL) stations, and personal digital assistants (PDAs). The following are examples of mobile communication devices: assistant (PDA), handheld devices with wireless communication capabilities, computing devices or other processing devices connected to a wireless modem, in-vehicle devices, wearable devices, terminals in 5G networks, or terminals in future public land mobile networks (PLMNs).

[0092] Furthermore, a terminal can also be a terminal in an IoT system. IoT is an important component of future information technology development. Its main technical characteristic is connecting objects to networks through communication technologies, thereby realizing an intelligent network that enables human-machine interconnection and machine-to-machine interconnection. IoT technology can achieve massive connectivity, deep coverage, and low terminal power consumption through technologies such as narrowband (NB).

[0093] In addition, the terminal may also include sensors such as smart printers, train detectors, and gas stations. Its main functions include collecting data (for some terminals), receiving control information and downlink data from network devices, and sending electromagnetic waves to transmit uplink data to network devices.

[0094] Sixth, in this application, network equipment may include, but is not limited to: radio network controller (RNC), evolved Node B (eNB), base station controller (BSC), base transceiver station (BTS), home base station (e.g., home evolved node B, or home node B, HNB), baseband unit (BBU), access point (AP), wireless relay node, wireless backhaul node, transmission point (TP), or transmission and reception point (TRP) in a Wi-Fi system, and may also be gNB or transmission point (TRP or TP) in a 5G (e.g., NR) system, one or a group (including multiple antenna panels) of antenna panels of a base station in a 5G system, or may also be network nodes constituting a gNB or transmission point, such as baseband unit (BBU), or distributed unit (DU), or base station in a future communication system, etc. The first device mentioned below may be, for example, a network device, and the second device mentioned below may be, for example, a terminal. This application does not limit the specific types of the first device and the second device.

[0095] To facilitate understanding of the embodiments of this application, the terminology involved in this application will be briefly explained below.

[0096] 1. Synthetic Aperture Environment Imaging Based on Moving Terminals: This method utilizes moving terminals (such as satellites, aircraft, drones, and ground vehicles) for environmental imaging. The moving terminal moves over or on the ground above the target area and transmits sensing signals at different locations, thereby acquiring echo signals from multiple locations (these echo signals can be formed by reflections of the sensing signals from the target). Signal processing techniques are then used to generate high-resolution images. The sensing signals transmitted by the moving terminal at different locations can be considered as being emitted by "virtual elements" at different locations.

[0097] Figure 1 This is a schematic diagram of synthetic aperture environmental imaging based on a motion terminal provided in an embodiment of this application. Figure 1 In this context, mobile platforms are exemplified by ground vehicles. Additionally, in... Figure 1The example given is of imaging using a base station, but this should not be construed as limiting this application. As another example, imaging can also be performed by a terminal; for instance, the terminal sends a sensing signal and receives an echo signal, and then images the target based on the echo signal.

[0098] like Figure 1 As shown, the terminal can send sensing signals, the base station can receive echo signals (which can be formed by the aforementioned sensing signals reflected by the target), and image the target based on the aforementioned echo signals.

[0099] It is understandable that in synthetic aperture environmental imaging based on motion-controlled terminals, the more precise the position of each virtual element, that is, the more precise the position of the motion-controlled terminal, the better the imaging effect. If the positional error caused by the motion of the terminal is not eliminated, it may cause image defocusing, distortion, or even failure to form an image.

[0100] The following are some methods to eliminate position errors caused by the movement of the terminal.

[0101] 2. Motion error estimation method based on inertial navigation: This is a method to eliminate position errors caused by the motion of the terminal. For example, an inertial navigation system (INS) calculates the position, velocity, and attitude of a moving platform by measuring its acceleration and angular velocity. However, due to sensor noise and drift, INS accumulates errors over time. In other words, motion error estimation methods based on inertial navigation suffer from error accumulation due to limitations in device performance.

[0102] 3. Data-based motion error estimation methods: These are methods to eliminate positional errors caused by terminal motion. For example, the phase gradient autofocus (PGA) algorithm processes the acquired echo data, then estimates the positional error caused by terminal motion based on features in the echo data, and performs corresponding error compensation, thereby improving image quality. Data-based motion error estimation methods typically require the presence of prominent points (or strong scattering points) in the scene, limiting their universality.

[0103] 4. Interferometry-based motion error calibration method: This is a method to eliminate position errors caused by terminal motion. For example, the base station sends a sensing signal to generate interference. Reflectors A and B passively or actively reflect the sensing signal to generate an interference signal. The terminal can continuously acquire the amplitude of the interference signal during motion and estimate its own position change by observing the amplitude changes, thereby calibrating its motion error. For example, motion error estimation can be performed using the maximum likelihood (ML) method or Kalman filtering. Before explaining the above interferometry-based motion error calibration method in detail, several related terms will be explained first.

[0104] (1) Interference signal: When two or more common source signals or phase-coherent signals are superimposed at a certain location in space, they will interfere. The signal produced by the superposition is called an interference signal. For example, the sensing signal sent by the base station, after being reflected by two reflectors, produces two reflected signals that are from the same source. Therefore, they can interfere in space (such as the space near the location of the terminal). The signal produced by the superposition of these two reflected signals can be called an interference signal.

[0105] (2) Interference pattern: The interference pattern is used to indicate the spatial distribution of the amplitude of the interference signal. If the amplitude of the interference signal is represented by brightness, the interference pattern usually appears as alternating bright and dark fringes in two-dimensional space and as alternating bright and dark curved surfaces in three-dimensional space. This alternating bright and dark characteristic is because the interference pattern usually has spatial periodicity.

[0106] The gradient of an interferogram refers to the gradient of the amplitude of the interference signal, that is, the rate of change of the amplitude of the interference signal along various directions in space. The gradient direction of the interferogram is the direction in which the amplitude of the interference signal changes the fastest. The spatial period of the interferogram refers to the period of change of the amplitude of the interference signal in space. For example, if the amplitude of the interference signal repeats every 2 centimeters (cm), then the spatial period of the interferogram is 2 cm.

[0107] Depending on the spatial dimension of interest, interference patterns can be represented by arrays of different dimensions.

[0108] As an example, in one-dimensional space, an interference pattern can be represented by a one-dimensional array. Each element in the array corresponds to the amplitude of the interference signal at a point in space. For example, L(x) represents the amplitude of the interference signal at coordinate x in one-dimensional space. As another example, in two-dimensional space, an interference pattern can be represented by a two-dimensional array. Each element in the array corresponds to the amplitude of the interference signal at a point in two-dimensional space. For example, L(x, y) represents the amplitude of the interference signal at coordinate (x, y) in two-dimensional space. As yet another example, in three-dimensional space, an interference pattern can be represented by a three-dimensional array. Each element in the array corresponds to the amplitude of the interference signal at a point in three-dimensional space. For example, L(x, y, z) represents the amplitude of the interference signal at coordinate (x, y, z) in three-dimensional space.

[0109] It is understandable that some interference phenomena may occur only within a specific region, rather than the entire observation area. For interference phenomena occurring within a local spatial region, the amplitude distribution of the interference signal can be represented by a local interferometry pattern; in other words, a local interferometry pattern refers to the amplitude distribution of the interference signal within a local region. The spatial period and gradient direction of a local interferometry pattern remain almost unchanged. Therefore, local interferometry patterns can be represented using spatial period and gradient direction to save on data storage and transmission overhead.

[0110] The following will combine Figure 2 Provide an example of an interference pattern.

[0111] Figure 2 This is a schematic diagram of the interference pattern provided in an embodiment of this application. Wherein, Figure 2 For example, the distribution of the interference signal amplitude within a horizontal plane of z = 1.5m. Figure 2 In this context, the interference pattern appears as alternating bright and dark stripes. The darker the color, the greater the amplitude of the interference signal; correspondingly, the lighter the color, the smaller the amplitude of the interference signal.

[0112] like Figure 2 As shown, the amplitude of the interference signal exhibits distinct patterns within this plane: firstly, the amplitude of the interference signal possesses a clear spatial periodicity; secondly, the gradient of the interference signal's amplitude has a clear directionality. Specifically, the direction of the amplitude gradient refers to the direction in which the amplitude of the interference signal changes most rapidly, as indicated by... Figure 2 It can be seen that in the x-axis direction, the change from dark to bright stripes is rapid, so the gradient direction can be along the x-axis. In the y-axis direction, the change in amplitude is small (e.g., it is either always a bright stripe or always a dark stripe), and the gradient is almost zero.

[0113] (3) Spatial sampling interval of the terminal for the interference signal: This can also be called the spatial sampling period of the terminal for the interference signal, etc., and this application does not limit this name. The spatial sampling interval of the terminal for the interference signal refers to the distance between two adjacent points in space where the terminal collects the interference signal. For example, if the terminal collects the signal every 1 centimeter, the spatial sampling interval is 1 centimeter.

[0114] (4) Time sampling interval of the terminal for the interference signal: This can also be called the time sampling period of the terminal for the interference signal, or the measurement period of the terminal for the interference signal, the sampling time period of the terminal for the interference signal, etc. This application does not limit this name. The time sampling interval of the terminal for the interference signal refers to the time interval between two consecutive acquisitions of the interference signal by the terminal. For example, if the terminal acquires the interference signal once every 1 second, the time sampling interval is 1 second.

[0115] The terms interferometric signal, interferogram, spatial sampling interval, and temporal sampling interval have been explained above. The following section will combine... Figure 3 The motion error calibration method based on interferometry described above is introduced in detail.

[0116] Figure 3 This is a schematic diagram of an existing motion error calibration method based on interferometry provided in the embodiments of this application.

[0117] like Figure 3 As shown, the base station transmits a sensing signal to generate interference, which may be, for example, a single subcarrier signal. Reflectors A and B passively or actively reflect the sensing signal to generate an interference signal in a spatial region near the terminal's location. The terminal can continuously acquire the amplitude of the interference signal during movement and estimate its own position change by observing the amplitude changes, thereby calibrating its motion error.

[0118] Figure 4 This is a simulation scenario diagram of the motion error calibration method based on interferometry provided in the embodiments of this application.

[0119] like Figure 4As shown, taking three-dimensional space as an example, the unit is meters (m), and the origin coordinates are (0, 0, 0). This origin can be any geographical location, and this application does not limit it. Assume the base station's location coordinates are (0, 0, 30), the reflector A and B's location coordinates are (-20, 20, 10) and (20, 20, 10) respectively, and the starting and ending coordinates of the terminal's motion trajectory are (-10, 25, 1.5) and (10, 25, 1.5) respectively. The solid line represents the base station sending sensing signals to reflectors A and B respectively, and the dashed line represents reflectors A and B reflecting the received sensing signals to generate interference signals. The terminal can continuously collect the amplitude of the interference signal during movement and estimate its own position change through amplitude changes, thereby calibrating its own motion error.

[0120] Figure 5 This is a top view of the simulation scenario of the motion error calibration method based on interferometry provided in the embodiments of this application, that is, Figure 5 yes Figure 4 Top view.

[0121] like Figure 5 As shown, this top view is a top view in the xy plane. Regarding... Figure 5 For a detailed description of the motion error calibration process, please refer to [link / reference]. Figure 4 This will not be elaborated upon here.

[0122] As mentioned above, the terminal is moving, and the amplitude of the interference signal received by the terminal is related to the terminal's position. The following will combine... Figure 6 Explain in detail the relationship between the amplitude of the interference signal and the position of the terminal.

[0123] Figure 6 This is a schematic diagram showing the amplitude distribution of the interference signal along the x-axis according to an embodiment of this application. Figure 6 In this application, the y-axis coordinate of the terminal can be, for example, 25m, and the z-axis coordinate can be, for example, 1.5m. The frequency of the sensing signal transmitted by the base station can be, for example, 350 MHz, but this should not constitute any limitation on this application. The location coordinates of the terminal and the frequency of the sensing signal can also be other values.

[0124] like Figure 6 As shown, when the terminal moves along the x-axis, there is a stable mapping relationship between the amplitude of the received interference signal and the x-coordinate of the terminal's position. In this way, the terminal can continuously acquire the amplitude of the interference signal during movement and estimate its own x-coordinate changes by measuring amplitude variations, thereby calibrating its motion errors. The y-axis and z-axis directions are similar and will not be detailed here.

[0125] Figure 7This is a schematic diagram of the amplitude of the interference signal acquired by the terminal according to an embodiment of this application.

[0126] like Figure 7 As shown, the terminal can acquire the amplitude of the interference signal (e.g., during its movement along the x-axis) Figure 7 (As shown by the black dots in the middle), and then based on the amplitude sequence of the collected interference signal, the motion error of the terminal in the x-axis direction is estimated and calibrated.

[0127] When the spatial sampling interval of the interferometric signal by the terminal is greater than half the spatial period of the interferogram in the direction of terminal movement, it may lead to a problem of blurred terminal position. One possible scenario is that when the terminal moves at high speed and the sampling rate is limited, the spatial sampling interval of the interferometric signal may be much greater than half the spatial period of the interferogram in the direction of terminal movement. For example, if the terminal moves at a speed of 10 meters per second (m / s) and the spatial sampling interval is 10 cm, for an interferogram at a frequency of 3.5 GHz, the above spatial sampling interval is generally greater than the spatial period of the interferogram in the direction of terminal movement, thus causing a problem of blurred terminal position.

[0128] In this application, the projection of the spatial sampling interval of the interference signal by the terminal onto the gradient direction of the interference pattern is greater than half of the spatial period of the interference pattern, or the spatial sampling interval of the interference signal by the terminal is greater than half of the spatial period of the interference pattern in the direction of terminal motion. These two descriptions have the same meaning and can be substituted for each other.

[0129] To make it easier to understand, the following will be combined with Figure 8 An example of the problem of unclear terminal location is given. Figure 8 This is a schematic diagram illustrating the problem of unclear terminal location provided in an embodiment of this application. Figure 8 In the diagram, Dv represents the spatial period of the interferogram along the direction of terminal motion. Solid black dots represent sampling points where the terminal samples the interferometric signal during low-speed motion, while hollow dots represent sampling points where the terminal samples the interferometric signal during high-speed motion. These two sets of sampling points correspond to different terminal motion paths. It should be understood that high-speed and low-speed motion are relative and do not limit the specific speed of motion.

[0130] like Figure 8As shown, when the terminal moves at low speed, the interval between the terminal positions corresponding to any two adjacent sampling points can be considered to be no greater than (i.e., less than or equal to) half of the spatial period of the interferogram. However, when the terminal moves at high speed, the interval between the terminal positions corresponding to any two adjacent sampling points may be greater than half of the spatial period of the interferogram. Furthermore, the terminal cannot determine exactly how many spatial periods of the interferogram the interval between the terminal positions corresponding to two adjacent sampling points crosses solely by observing the amplitude changes of the acquired interferometric signal, thus leading to the problem of terminal position ambiguity.

[0131] To address this, this application provides a motion error calibration method. By controlling the change of phase information over time, the interferogram is translated in space while maintaining its shape. The method ensures that the absolute value of the difference between the distance the terminal moves along the gradient direction of the interferogram and the distance the interferogram moves in space is less than half the spatial period of the interferogram. In other words, the speed of the interferogram in space matches the speed of the terminal moving along the gradient direction of the interferogram. This prevents the spatial interval between two adjacent samples of the interferometric signal from spanning multiple spatial periods of the interferogram, thus solving the problem of terminal position ambiguity and improving the accuracy of the determined terminal position. In imaging scenarios, this results in better imaging performance. The terminal is an example of a second device.

[0132] Before describing the method provided in this application in detail, the principle of the method will be explained in detail below.

[0133] By adjusting the phase modulation of the sensed signal using a reflector, the interference pattern can be moved in space.

[0134] One possible implementation is to adjust the phase difference between the phase modulation of the sensed signal by the two reflectors, thereby translating the interference pattern in space (e.g., shifting the amplitude value in the interference pattern along the gradient direction in space), while keeping the shape of the interference pattern unchanged. Here, the phase difference refers to the difference between the phase modulation amount of reflector A and the phase modulation amount of reflector B.

[0135] By controlling the magnitude of the phase difference, the movement speed of the interferometric pattern in space is matched with the movement speed of the terminal, thereby preventing the terminal from sampling the interferometric signal twice across multiple spatial periods of the interferometric pattern, thus solving the problem of terminal position ambiguity. For example, if the phase difference is continuously adjusted to change over time, the interferometric pattern will move in space at a certain speed. By controlling the rate of change of the phase difference, the movement speed of the interferometric pattern in space can be controlled, ensuring that the movement speed of the interferometric pattern matches the movement speed of the terminal, thus preventing the spatial interval between two adjacent samples of the interferometric signal from spanning multiple spatial periods of the interferometric pattern, and thus solving the problem of terminal position ambiguity.

[0136] The following will combine Figure 9 and Figure 10 Give an example of how an interference pattern moves in space.

[0137] Figure 9 This is a schematic diagram of the amplitude distribution of the interference pattern at different times in the xy plane provided in the embodiments of this application. Figure 9 a), b), c), and d) are interference patterns at four adjacent moments.

[0138] By adjusting the phase difference between the two reflectors that modulate the sensed signal, the interference pattern can be translated in space. Figure 9 As can be seen from a), b), c), and d), the interference pattern gradually shifts towards the positive x-axis over time. For example, taking the leftmost bright fringe as an example... Figure 9 The position of the bright fringe shown in a), b), c), and d) is shifted in the positive direction of the x-axis.

[0139] Figure 10 This is a schematic diagram of the amplitude distribution of the interference pattern in the x-direction at different times provided in the embodiments of this application. Figure 10 The amplitude distribution of the interferogram in the x-direction at four adjacent time points is shown.

[0140] like Figure 10 As shown, curves t1, t2, t3, and t4 represent the amplitude distribution of the interference pattern along the x-axis at four adjacent time points. It can be seen that as time progresses, the interference pattern shifts towards the positive x-axis.

[0141] By adjusting the phase modulation of the sensed signal by the reflectors, the movement of the interference pattern in space can be achieved. One possible implementation is that the phase modulation used when the two reflectors reflect the sensed signal is time-varying modulation. In other words, the difference in the phase modulation amount of the sensed signal by the two reflectors (i.e., the phase difference) changes with time, and the change in phase difference determines the speed at which the interference pattern moves in space. The phase difference is denoted as Δφ(t), and can be determined based on the following parameters: the magnitude of the terminal's moving speed v(t), the angle θ(t) between the direction of the terminal's moving speed and the gradient direction of the interference pattern, the time sampling interval Ts of the terminal for the interference signal, the spatial period D(t) of the interference pattern, and the wavelength λ of the interference signal. To facilitate understanding of the relationship between the direction of the terminal's moving speed and the gradient direction of the interference pattern, the following will combine... Figure 11 An illustration is provided.

[0142] Figure 11 This is a schematic diagram showing the relationship between the direction of the terminal's moving speed and the gradient direction of the interference pattern provided in the embodiments of this application.

[0143] like Figure 11 As shown, g(t) points to the gradient direction of the interference pattern at the location of the terminal at time t, v(t) points to the direction of the terminal's moving speed, and the angle between the two is θ(t).

[0144] To address the issue of ambiguous terminal position, Δφ(t) satisfies the following formula:

[0145] Where v(t)·cosθ(t)·Ts represents the distance the terminal moves along the gradient direction of the interference pattern within time Ts. It represents the distance the interference pattern moves in space due to the change in phase difference.

[0146] It is understandable that by controlling the change in phase difference, the movement of the terminal relative to the interferometric pattern can be made extremely slow. For example, by controlling the change in phase difference so that the projection of the terminal's moving velocity onto the gradient direction of the interferometric pattern is equal to the moving velocity of the interferometric pattern in space, then Δφ(t) satisfies:

[0147] The motion error calibration method provided in this application will be described in detail below with reference to the accompanying drawings. The following description uses the interaction between a first device, a second device, and two reflectors as examples, and should not be construed as limiting this application in any way. The first device can also be replaced by components configured in the first device (such as chips, chip systems, processors, etc.), or logic modules or software capable of implementing all or part of the functions of the first device. The second device can be replaced by components configured in the second device (such as chips, chip systems, processors, etc.), or logic modules or software capable of implementing all or part of the functions of the second device. The reflectors are similar and will not be described in detail here.

[0148] In addition, in this application, the specific device form of the reflector can be a base station, a TRP, a positioning reference unit (PRU), a reflective intelligent surface (RIS), etc. This application does not limit the specific form of the reflector.

[0149] The first device can be, for example, a network device, such as a base station, and the second device can be, for example, a terminal. In this application, the base station can act as one of two reflectors, forming an interference pattern with the other reflector. In this scenario, the base station can send a sensing signal to the other reflector, which reflects the sensing signal (e.g., the reflected signal is denoted as reflected signal 1). The base station can also send a sensing signal to the terminal (e.g., sensing signal 1). The aforementioned sensing signal 1 and reflected signal 1 interfere with each other in the spatial region near the location of the terminal.

[0150] In the following text, one possible implementation is that the first device determines the phase information (such as...). Figure 12 and Figure 13 The method shown); another possible implementation is that the second device determines the phase information (such as...). Figure 14 , Figure 15 and Figure 16 (The method shown). In scenarios where the first device determines the phase information, it helps reduce the computational load on the second device, thereby saving the power consumption of the second device; in scenarios where the second device determines the phase information, there is no need for the second device to upload information such as its movement speed, which helps protect the privacy of the second device.

[0151] Figure 12 This is a schematic flowchart of the motion error calibration method 1200 provided in the embodiments of this application. Figure 12 The method 1200 shown includes steps 1210 and 1220. The individual steps in method 1200 are described in detail below.

[0152] In step 1210, the first device determines phase information that changes over time, such that the absolute value of the difference between the distance the second device moves along the gradient direction of the interferogram and the distance the interferogram moves in space is less than half the spatial period of the interferogram.

[0153] The aforementioned phase information can be used for phase modulation of the first reflector and the second reflector. The phase information changes over time, which can be understood as meaning that time-varying modulation can be used when the first and second reflectors are phase-modulated. In other words, the phase modulation amount of the first reflector and the second reflector changes over time, and correspondingly, the difference (phase difference) between the phase modulation amounts of the first and second reflectors also changes over time.

[0154] The aforementioned interferogram is used to indicate the spatial distribution of the amplitude of the interference signals generated by the first and second reflectors. For an explanation of the interferogram and interference signals, please refer to the above text, which will not be elaborated here.

[0155] The aforementioned phase information changes over time, ensuring that the absolute value of the difference between the distance the second device moves along the gradient direction of the interferogram and the distance the interferogram moves in space is less than half the spatial period of the interferogram. In other words, the spatial sampling interval of the second device for the interferometric signal is less than half the spatial period of the interferogram in the direction of the second device's movement. Alternatively, the speed at which the interferogram moves in space matches the speed at which the second device moves along the gradient direction of the interferogram. This prevents the spatial interval between two adjacent samples of the interferometric signal from spanning multiple spatial periods of the interferogram, thereby resolving the problem of ambiguous position of the second device. This improves the accuracy of the determined position of the second device, resulting in better imaging performance in the imaging scenario.

[0156] It is understood that, as exemplified above, the condition that the phase information satisfies the following condition is used: the absolute value of the difference between the distance the second device moves along the gradient direction of the interferogram and the distance the interferogram moves in space is less than half the spatial period of the interferogram. However, this should not constitute any limitation on this application. For example, in practical applications, it is possible that the distance the interferogram moves in space is greater than the distance the second device moves along the gradient direction of the interferogram. Therefore, the above condition can be replaced with: the absolute value of the difference between the distance the second device moves along the gradient direction of the interferogram and the distance the interferogram moves in space is less than half the spatial period of the interferogram.

[0157] One possible implementation for determining phase information is that the first device determines phase information based on the interferogram, the moving speed of the second device, and the time sampling interval of the second device for the interferometric signal.

[0158] The aforementioned time sampling interval may also be referred to as the sampling time interval, time sampling period, measurement period, or sampling time period, etc., and this application does not limit this name. The aforementioned time sampling interval refers to the time interval between two consecutive acquisitions of interference signals by the second device. For example, if the second device acquires an interference signal every 1 second, then the time sampling interval is 1 second.

[0159] The moving speed of the second device and the time sampling interval can be used to determine the moving distance of the second device. Furthermore, by combining the angle between the moving direction of the second device and the gradient direction of the interferogram, the moving distance of the second device along the gradient direction of the interferogram can be determined. The interferogram can be used to determine the spatial period of the interferogram.

[0160] Optionally, the aforementioned phase information includes the phase difference between the phase modulations of the first reflector and the second reflector, wherein the phase difference refers to the difference between the phase modulation amount of the first reflector and the phase modulation amount of the second reflector. The aforementioned phase difference satisfies the condition that the absolute value of the difference between the distance the second device moves in the gradient direction of the interference pattern and the distance the interference pattern moves in space is less than half the spatial period of the interference pattern. For example, the phase difference is represented by Δφ(t), and the phase difference Δφ(t) satisfies: Where v(t) represents the moving speed of the second device, θ(t) represents the angle between the moving direction of the second device and the gradient direction of the interference pattern, Ts represents the time sampling interval of the interference signal by the second device, λ represents the wavelength of the interference signal, and D(t) represents the spatial period of the interference pattern.

[0161] It can be understood that the above "less than" can also be replaced with "less than or equal to". That is, the phase information satisfies that the absolute value of the difference between the distance the second device moves along the gradient direction of the interferogram and the distance the interferogram moves in space is less than or equal to half the spatial period of the interferogram. When the phase information is represented by the phase difference Δφ(t), the phase difference Δφ(t) satisfies:

[0162]

[0163] Optionally, the moving speed of the second device and the time sampling interval of the interference signal by the second device can be indicated by the second device. For example, the second device sends first indication information, which indicates the moving speed of the second device and the time sampling interval of the interference signal by the second device. Correspondingly, the first device receives the first indication information.

[0164] Optionally, the aforementioned interference pattern can be determined by the first device or by the second device.

[0165] One possible design is that the aforementioned interference pattern is determined by the first device. As an example, and not a limitation, the second device sends a second indication message indicating a first position of the second device; correspondingly, the first device receives the second indication message and determines the interference pattern (which can be a local interference pattern, in other words, an interference pattern near the first position) based on the first position, the position of the first reflector, and the position of the second reflector. Exemplarily, the shape of the equal-amplitude surface of the interference pattern in three-dimensional space approximates multiple hyperboloids with the positions of the two reflectors as foci. Therefore, based on the positions of the two reflectors and the first position (rough position) of the second device, a local interference pattern near the first position of the second device can be determined. More specifically, based on the position coordinates of the first reflector and the coordinates of the first position of the second device, the distance d1 from the first reflector to the second device is determined; based on the position coordinates of the second reflector and the coordinates of the first position of the second device, the distance d2 from the second reflector to the second device is determined, thereby determining the hyperboloid equation with the first and second reflectors as foci: |d1-d2=nλ. Where n is an integer, and λ is the wavelength of the interference signal.

[0166] It is understood that the aforementioned first location may be a rough location of the second device. For example, the aforementioned first location may be obtained by the second device, such as by the second device determining the first location based on a positioning system; or by the second device determining the first location based on a sensor. This application does not specifically limit the method by which the second device determines the first location.

[0167] In addition, the first device can determine the first reflector and the second reflector based on the first position. When the first device determines the first reflector and the second reflector, the following conditions must be met: the first reflector and the second reflector are located at different positions, and the second device moves within the coverage area of ​​the first reflector and the second reflector.

[0168] Another possible design is that the interference pattern is determined by the second device. As an example, and not a limitation, the first device identifies a first reflector and a second reflector, and indicates the positions of the first and second reflectors to the second device. Further, the second device acquires a first position and, based on the first position, the positions of the first and second reflectors, determines the interference pattern (this interference pattern can be a local interference pattern; in other words, it can be an interference pattern near the first position). The specific process by which the second device determines the interference pattern can be found in the explanation of how the first device determines the interference pattern, and will not be detailed here.

[0169] If the second device determines the second position, it does not need to indicate the interference pattern to the first device after determining the interference pattern; if the first device determines the second position, it can indicate the interference pattern to the first device after determining the interference pattern. As an example, the second device sends an array representing the interference pattern, which can be one-dimensional, two-dimensional, or three-dimensional; this application does not limit its dimension. As another example, the second device can indicate the spatial period and gradient direction of the interference pattern near the first position to facilitate the first device's determination of the interference pattern.

[0170] In step 1220, the first device sends first configuration information and second configuration information based on the aforementioned phase information. Correspondingly, the first reflector receives the first configuration information, and the second reflector receives the second configuration information.

[0171] After determining the phase information (such as the phase difference), the first device can configure the phase modulation amount for the first reflector and the second reflector based on the phase difference, and the phase modulation amount of the first reflector and the phase modulation amount of the second reflector satisfy the phase difference.

[0172] For example, if the phase difference is 90 degrees, then the difference between the phase modulation amount of the first reflector and the phase modulation amount of the second reflector is 90 degrees.

[0173] A first device sends first configuration information to a first reflector, the first configuration information being used to configure the phase of the first reflector. The first device also sends second configuration information to a second reflector, the second configuration information being used to configure the phase of the second reflector. Accordingly, the first reflector receives the first configuration information, and the second reflector receives the second configuration information.

[0174] As previously mentioned, the first device can act as one of the reflectors (such as the first reflector). In this scenario, the first device does not need to send the first configuration information; instead, it can send the second configuration information to the second reflector.

[0175] Optionally, after the first device determines the phase information, it can also determine the second position of the second device based on the phase information. The second position can be the calibrated precise position.

[0176] By way of example and not limitation, the first device determines the second position of the second device based on phase information, the interferogram, the first position of the second device, and the amplitude sequence. The amplitude sequence may be obtained by the second device based on measurements of the interferometric signal on a first time-frequency resource, which is the time-frequency resource associated with the first and second reflectors.

[0177] For example, the second device can measure the amplitude of the interference signal on a first time-frequency resource to obtain an amplitude sequence and send the measurement result, which includes the amplitude sequence, to the first device. Accordingly, the first device receives the measurement result. The first time-frequency resource can be configured by the first device for the second device. For example, the first device sends first information indicating the first time-frequency resource, and the second device receives the first information. There are various methods for determining the second position of the second device. One possible implementation for determining the second position is given below, but this should not be construed as limiting this application. Exemplarily, firstly, the first position is determined as a rough position of the second device in space. Then, for the first amplitude value A1 in the amplitude sequence, based on its corresponding time and phase information, the corresponding interference pattern for that time is determined, and the position Q1 in the interference pattern whose amplitude is closest to the first amplitude value A1 and whose distance is closest to the rough position is determined. Position Q1 is actually the projection of the second device's position P1 during the first interference signal sampling onto the gradient direction of the interference pattern. Position P1, position Q1, and amplitude value V1 correspond one-to-one.

[0178] Similarly, for the second amplitude value A2 in the amplitude sequence, based on its corresponding time and phase information, the interferogram for that time is determined, and the position Q2 in the interferogram whose amplitude is closest to the second amplitude value A2 and whose position is closest to position Q1 is identified. Position Q2 is actually the projection of the position P2 of the second device during the second sampling of the interferometric signal onto the gradient direction of the interferogram. Position P2, position Q2, and amplitude value V2 correspond one-to-one.

[0179] By analogy, the projection position sequence {Qi} of the second position corresponding to the amplitude sequence in the gradient direction of the interferogram can be determined step by step. The number of elements in this projection position sequence is equal to the number of elements in the amplitude sequence. This projection position sequence {Qi} can be used as the second position of the second device. Because this second position is determined based on the interferogram, it has higher accuracy than the coarse position. In some cases, this second position can be directly used in the imaging calculation process. For example, when the motion direction of the second device is known and remains basically unchanged, the true spatial position of the second device during interferometric signal measurement can be estimated based on the motion direction and the second position. This spatial position can meet the imaging requirements.

[0180] Furthermore, when there are multiple interferometric patterns with different gradient directions, multiple projection position sequences can be obtained. Based on these multiple projection position sequences, the true spatial position of the second device when performing interferometric signal measurement can be estimated, and this spatial position can also be used in the imaging calculation process.

[0181] It is understood that the above example describes a scenario where the first device determines the second position, but this should not be construed as limiting this application. For example, the second device can also determine the second position. Specifically, the first device can send the aforementioned phase information to the second device, and the second device can determine its second position based on the phase information, the interferogram, the second device's first position, and the amplitude sequence.

[0182] In the above technical solution, the interference pattern is translated in space by changing the phase information over time, while maintaining the shape of the interference pattern. By controlling the change of the phase information over time, the absolute value of the difference between the distance the second device moves along the gradient direction of the interference pattern and the distance the interference pattern moves in space is less than half of the spatial period of the interference pattern. This avoids the spatial interval between two adjacent samplings of the interference signal by the second device spanning multiple spatial periods of the interference pattern, thereby solving the problem of ambiguous position of the second device. This facilitates the improvement of the accuracy of the determined position of the second device, resulting in better imaging effect in the imaging scenario.

[0183] In addition, it is understandable that in scenarios where the second device moves at high speed and the sampling rate is limited, there may be a problem that the absolute value of the difference between the distance the second device moves along the gradient direction of the interferogram and the distance the interferogram moves in space is much greater than half of the spatial period of the interferogram, which in turn leads to the problem of the second device's position being blurred. In other words, the above solution can be applied to scenarios where the second device moves at high speed and the sampling rate is limited.

[0184] The following will combine Figure 13 right Figure 12 The detailed process of the method shown will be introduced.

[0185] Figure 13 This is a detailed flowchart illustrating the motion error calibration method provided in the embodiments of this application.

[0186] In step 1301, the second device sends indication information 1, which indicates the moving speed of the second device and the time sampling interval of the interference signal by the second device. Accordingly, the first device receives the aforementioned indication information 1.

[0187] The above instruction information 1 is an example of the first instruction information.

[0188] In step 1302, the second device sends indication information 2, which indicates the first position of the second device. Accordingly, the first device receives the indication information 2.

[0189] The above instruction information 2 is an example of the second instruction information.

[0190] The aforementioned indication information 1 and indication information 2 may be carried in the same signaling or in different signaling; this application does not impose any limitation on this. When indication information 1 and indication information 2 are carried in the same signaling, the second device sends signaling 1, which indicates the moving speed of the second device, the time sampling interval of the interference signal by the second device, and the first position of the second device. When indication information 1 and indication information 2 are carried in different signaling, this application does not impose any limitation on the order in which they are carried.

[0191] In step 1303, the first device determines the interference pattern based on the first position, the position of the first reflector, and the position of the second reflector.

[0192] In step 1304, the first device determines the phase information based on the moving speed of the second device, the time sampling interval of the interference signal by the second device, and the interference pattern.

[0193] In step 1305, the first device sends first configuration information and second configuration information. Correspondingly, the first reflector receives the first configuration information and the second reflector receives the second configuration information.

[0194] In step 1306, the first device sends indication information 3, which indicates the first time-frequency resource associated with the first reflector and the second reflector. Accordingly, the second device receives the indication information 3.

[0195] The aforementioned first time-frequency resource is used by the second device to measure the interference signal.

[0196] In step 1307, the second device measures the amplitude of the interference signal on the first time-frequency resource to determine the amplitude sequence.

[0197] In step 1308, the second device sends a measurement result, which includes an amplitude sequence. Correspondingly, the first device receives the measurement result.

[0198] In step 1309, the first device determines the second position of the second device based on the interferogram, the first position, the phase information, and the amplitude sequence.

[0199] Figure 13 For a detailed explanation of each step in the method shown, please refer to [link / reference]. Figure 12 The relevant information will not be repeated here.

[0200] It should be understood that Figure 13 The steps of the method shown, and their order, are merely examples and should not be construed as limiting the scope of this application. For example, Figure 13The order of the steps in the method shown can also be different; for example, steps 1301 and 1302 can be interchanged. For another example, step 1309 can also be performed by the second device. In this case, the first device can send the interference pattern and phase information to the second device. For yet another example, step 1303 can also be performed by the second device. In this case, the first device can send the positions of the first and second reflectors to the second device. These are just a few examples.

[0201] Figure 14 This is another schematic flowchart of the motion error calibration method 1400 provided in the embodiments of this application. Figure 14 The method 1400 shown includes steps 1410 to 1430. The individual steps in method 1400 are described in detail below.

[0202] In step 1410, the second device determines phase information that changes over time, such that the absolute value of the difference between the distance the second device moves along the gradient direction of the interferogram and the distance the interferogram moves in space is less than half the spatial period of the interferogram.

[0203] The aforementioned phase information can be used for phase modulation of the first reflector and the second reflector. The phase information changes over time, which can be understood as meaning that time-varying modulation can be used when the first and second reflectors are phase-modulated. In other words, the phase modulation amount of the first reflector and the second reflector changes over time, and correspondingly, the difference (phase difference) between the phase modulation amounts of the first and second reflectors also changes over time.

[0204] The aforementioned interferogram is used to indicate the spatial distribution of the amplitudes of the interference signals generated by the first and second reflectors.

[0205] One possible implementation is that the first device determines the phase information based on the interferogram, the moving speed of the second device, and the time sampling interval of the interferometric signal by the second device. More detailed steps can be found in [link to documentation]. Figure 12 The explanation in the text will not be elaborated here.

[0206] Optionally, the aforementioned phase information includes the phase difference between the phase modulations of the first reflector and the second reflector, wherein the phase difference refers to the difference between the phase modulation amount of the first reflector and the phase modulation amount of the second reflector. The aforementioned phase difference satisfies the condition that the absolute value of the difference between the distance the second device moves in the gradient direction of the interference pattern and the distance the interference pattern moves in space is less than half the spatial period of the interference pattern. For example, the phase difference is represented by Δφ(t), and the phase difference Δφ(t) satisfies: Where v(t) represents the moving speed of the second device, θ(t) represents the angle between the moving direction of the second device and the gradient direction of the interferogram, Ts represents the time sampling interval of the second device for the interferometric signal, λ represents the wavelength of the interferometric signal, and D(t) represents the spatial period of the interferogram. For a more detailed explanation of step 1410, please refer to [link to relevant documentation]. Figure 12 The explanation in the text will not be elaborated here.

[0207] Optionally, the aforementioned interference pattern can be determined by the first device or by the second device.

[0208] One possible design is that the interference pattern is determined by the first device. As an example, and not a limitation, the second device sends its first position; correspondingly, the first device receives the first position of the second device and determines the interference pattern based on the first position, the position of the first reflector, and the position of the second reflector. The detailed process of the first device determining the interference pattern can be found above and will not be repeated here. After determining the interference pattern, the first device can send third indication information indicating the interference pattern. Correspondingly, the second device receives the third indication information. As an example, the third indication information includes an array characterizing the interference pattern; this array can be one-dimensional, two-dimensional, or three-dimensional, and this application does not limit its dimension. As another example, the third indication information includes the spatial period and gradient direction of the interference pattern near the first position to facilitate the second device's determination of the interference pattern.

[0209] It is understood that the aforementioned first location may be a rough location of the second device. For example, the aforementioned first location may be obtained by the second device, such as by the second device determining the first location based on a positioning system; or by the second device determining the first location based on a sensor. This application does not specifically limit the method by which the second device determines the first location.

[0210] In addition, when the first device determines the first reflector and the second reflector, the following conditions must be met: the first reflector and the second reflector are located at different positions, and the second device moves within the coverage area of ​​the first reflector and the second reflector.

[0211] Another possible design is that the interference pattern is determined by the second device. As an example, and not a limitation, the first device determines a first reflector and a second reflector, and instructs the second device on the positions of the first and second reflectors, such as by sending a fourth instruction message indicating the positions of the first and second reflectors. Further, the second device acquires a first position and determines the interference pattern based on the first position, the positions of the first reflector, and the positions of the second reflector. The specific process by which the second device determines the interference pattern can be found in the explanation of how the first device determines the interference pattern, and will not be detailed here.

[0212] Optionally, if the interference pattern is determined by the second device, the second device may also send a request message to request the positions of the first reflector and the second reflector.

[0213] In step 1420, the second device sends phase information. Correspondingly, the first device receives the aforementioned phase information.

[0214] After determining the phase information, the second device can send the phase information to the first device. Accordingly, the first device receives the phase information.

[0215] In step 1430, the first device may send first configuration information and second configuration information based on the aforementioned phase information. Accordingly, the first reflector receives the first configuration information, and the second reflector receives the second configuration information.

[0216] After determining the phase information (such as the phase difference), the first device can configure the phase modulation amount for the first reflector and the second reflector based on the phase difference, and the phase modulation amount of the first reflector and the phase modulation amount of the second reflector satisfy the phase difference.

[0217] For example, if the phase difference is 90 degrees, then the difference between the phase modulation amount of the first reflector and the phase modulation amount of the second reflector is 90 degrees.

[0218] A first device sends first configuration information to a first reflector, the first configuration information being used to configure the phase of the first reflector. The first device also sends second configuration information to a second reflector, the second configuration information being used to configure the phase of the second reflector. Accordingly, the first reflector receives the first configuration information, and the second reflector receives the second configuration information.

[0219] As previously mentioned, the first device can act as one of the reflectors (such as the first reflector). In this scenario, the first device does not need to send the first configuration information; instead, it can send the second configuration information to the second reflector.

[0220] Optionally, after determining the phase information, the second device can also determine a second position based on the phase information, which can be a calibrated precise position.

[0221] As an example and not a limitation, the second device determines its second position based on phase information, the interferogram, the first position of the second device, and the amplitude sequence. The amplitude sequence may be obtained based on measurements of the interferometric signal on a first time-frequency resource, which is the time-frequency resource associated with the first and second reflectors.

[0222] For example, the second device can measure the amplitude of the interference signal on the first time-frequency resource to obtain an amplitude sequence. The first time-frequency resource can be configured by the first device for the second device. For instance, the first device sends first information indicating the first time-frequency resource, and the second device receives the first information accordingly.

[0223] In the above technical solution, the interference pattern is translated in space by changing the phase information over time, while maintaining the shape of the interference pattern. By controlling the change of phase information over time, the absolute value of the difference between the distance the second device moves along the gradient direction of the interference pattern and the distance the interference pattern moves in space is less than half of the spatial period of the interference pattern. This avoids the spatial interval between two adjacent samplings of the interference signal by the second device spanning multiple spatial periods of the interference pattern, thereby solving the problem of ambiguous position of the second device. This facilitates the improvement of the accuracy of the determined position of the second device, resulting in better imaging effect in the imaging scenario.

[0224] In addition, it is understandable that in scenarios where the second device moves at high speed and the sampling rate is limited, there may be a problem that the absolute value of the difference between the distance the second device moves along the gradient direction of the interferogram and the distance the interferogram moves in space is much greater than half of the spatial period of the interferogram, which in turn leads to the problem of the second device's position being blurred. In other words, the above solution can be applied to scenarios where the second device moves at high speed and the sampling rate is limited.

[0225] Furthermore, in the above-described scheme, having the second device determine the phase information is more suitable for scenarios where the second device processes sensing signals, such as when the second device performs imaging based on the sensing signals. Since the second device determines the phase information, it does not need to send the parameters used to determine the phase information to the first device, thus reducing the impact of transmission signaling delays on the calculation results. For example, the phase information may be related to the movement speed of the second device. If the movement speed of the second device is indicated to the first device for phase information determination, the movement speed of the second device may change during the transmission period, resulting in lower accuracy of the determined phase information. Therefore, having the second device determine the phase information improves its accuracy. Additionally, the fact that the second device does not need to send the parameters used to determine the phase information to the first device also helps protect the privacy of the second device.

[0226] The following will combine Figure 15 and Figure 16 right Figure 14 The detailed process of the method shown will be described. Figure 15 In the method shown, the first device determines the interferogram, and the second device determines the phase information; Figure 16In the method shown, both the interferogram and phase information are determined by a second device.

[0227] Figure 15 This is another detailed flowchart illustrating the motion error calibration method provided in the embodiments of this application.

[0228] In step 1501, the second device sends indication information 4, which indicates the first position of the second device. Accordingly, the first device receives the indication information 4.

[0229] In step 1502, the first device determines the interference pattern based on the first position, the position of the first reflector, and the position of the second reflector.

[0230] Optionally, before step 1502, the first device can determine the first reflector and the second reflector based on the first position, wherein the first reflector and the second reflector satisfy the following conditions: the first reflector and the second reflector are located at different positions, and the second device moves within the coverage area of ​​the first reflector and the second reflector.

[0231] In step 1503, the first device sends instruction information 5, which indicates the aforementioned interference pattern. Correspondingly, the second device receives the instruction information 5.

[0232] The above instruction information 5 is an example of the third instruction information.

[0233] In step 1504, the first device sends indication information 6, which indicates the first time-frequency resource associated with the first reflector and the second reflector. Accordingly, the second device receives the indication information 6.

[0234] It should be understood that the aforementioned indication information 5 and indication information 6 may be carried in the same signaling or in different signaling, and this application does not limit this. When the aforementioned indication information 5 and indication information 6 are carried in the same signaling, the first device sends signaling 2, which indicates the aforementioned interferogram and the first time-frequency resource associated with the first reflector and the second reflector. When the aforementioned indication information 5 and indication information 6 are carried in different signaling, this application does not limit the order in which the aforementioned indication information 5 and indication information 6 are carried.

[0235] In step 1505, the second device determines the phase information based on the moving speed of the second device, the time sampling interval of the interference signal by the second device, and the interference pattern.

[0236] In step 1506, the second device sends the aforementioned phase information. Correspondingly, the first device receives the aforementioned phase information.

[0237] In step 1507, the first device sends first configuration information and second configuration information. Correspondingly, the first reflector receives the first configuration information and the second reflector receives the second configuration information.

[0238] In step 1508, the second device measures the amplitude of the interference signal on the first time-frequency resource to determine the amplitude sequence.

[0239] In step 1509, the second device determines the second position of the second device based on the interferogram, the first position, the phase information, and the amplitude sequence.

[0240] Figure 15 For a detailed explanation of each step in the method shown, please refer to [link / reference]. Figure 12 The relevant information will not be repeated here.

[0241] It should be understood that Figure 15 The order of the steps in the method shown is merely illustrative and should not be construed as limiting the scope of this application. For example, Figure 15 The order of the steps in the method shown can also be different, such as the order of steps 1503 and 1504 can be reversed.

[0242] Figure 16 This is another detailed flowchart of the motion error calibration method provided in the embodiments of this application.

[0243] In step 1601, the second device sends a request message to request the positions of the first and second reflectors. Correspondingly, the first device receives the request message.

[0244] The aforementioned request message may, for example, carry the first location of the second device, meaning the second device indicates the first location to the first device, but this should not constitute any limitation on this application. For example, the aforementioned request message and the first location of the second device may also be carried in different signaling messages, and this application does not limit this.

[0245] In step 1602, the first device determines the first reflector and the second reflector based on the first position. The first position may be indicated by the second device. For example, the first position may be carried in the request message. Alternatively, the second device may send indication information 9, which indicates the first position.

[0246] In step 1603, the first device sends indication information 7, which indicates the positions of the first reflector and the second reflector. Correspondingly, the second device receives the indication information 7.

[0247] The above instruction message 7 is an example of the fourth instruction message.

[0248] In step 1604, the first device sends indication information 8, which indicates the first time-frequency resource associated with the first reflector and the second reflector. Accordingly, the second device receives the indication information 8.

[0249] It should be understood that the aforementioned indication information 7 and indication information 8 may be carried in the same signaling or in different signaling, and this application does not limit this. When the aforementioned indication information 7 and indication information 8 are carried in the same signaling, the first device sends signaling 3, which indicates the positions of the first reflector and the second reflector, as well as the first time-frequency resource associated with the first reflector and the second reflector. When the aforementioned indication information 7 and indication information 8 are carried in different signaling, this application does not limit the order in which the aforementioned indication information 7 and indication information 8 are carried.

[0250] In step 1605, the second device determines the interference pattern based on the first position, the position of the first reflector, and the position of the second reflector.

[0251] In step 1606, the second device determines the phase information based on the moving speed of the second device, the time sampling interval of the interference signal by the second device, and the interference pattern.

[0252] In step 1607, the second device sends the aforementioned phase information. Correspondingly, the first device receives the aforementioned phase information.

[0253] In step 1608, the first device sends first configuration information and second configuration information. Correspondingly, the first reflector receives the first configuration information and the second reflector receives the second configuration information.

[0254] In step 1609, the second device measures the amplitude of the interference signal on the first time-frequency resource to determine the amplitude sequence.

[0255] In step 1610, the second device determines the second position of the second device based on the interferogram, the first position, the phase information, and the amplitude sequence.

[0256] Figure 16 For a detailed explanation of each step in the method shown, please refer to [link / reference]. Figure 12 The relevant information will not be repeated here.

[0257] It should be understood that Figure 16 The order of the steps in the method shown is merely illustrative and should not be construed as limiting the scope of this application. For example, Figure 16 The order of the steps in the method shown can also be different, such as the order of steps 1603 and 1604 can be reversed.

[0258] The methods provided in the embodiments of this application have been described in detail above with reference to the accompanying drawings. The apparatus provided in the embodiments of this application will now be described in detail with reference to the accompanying drawings.

[0259] It should be understood that Figure 17 and Figure 18 The apparatus shown can be used to implement the functions of the first device, the second device, the first reflector, or the second reflector in the above method embodiments, and thus can also achieve the beneficial effects of the above method embodiments.

[0260] Figure 17 This is a schematic block diagram of the motion error calibration device 1700 provided in the embodiments of this application.

[0261] like Figure 17 As shown, the device 1700 includes a processing module 1710 and a transceiver module 1720. The device 1700 can be used to implement the above-described... Figure 12 to Figure 16 The method described in any of the embodiments shown.

[0262] For example, when the motion error calibration device 1700 is used to implement Figure 12 In the method embodiment shown, when the first device functions, the processing module 1710 is used to determine phase information, which is used for phase modulation of the first reflector and the second reflector. The phase information changes over time to ensure that the absolute value of the difference between the distance the second device moves along the gradient direction of the interference pattern and the distance the interference pattern moves in space due to the change in phase information is less than half of the spatial period of the interference pattern. The interference pattern indicates the spatial distribution of the amplitude of the interference signal generated by the first reflector and the second reflector. The transceiver module 1720 is used to send first configuration information and second configuration information based on the phase information. The first configuration information is used to configure the phase corresponding to the first reflector, and the second configuration information is used to configure the phase corresponding to the second reflector.

[0263] In one possible implementation, the processing module 1710 is specifically used to determine phase information based on the interference pattern, the moving speed of the second device, and the time sampling interval of the interference signal by the second device.

[0264] In one possible implementation, the aforementioned phase information includes the phase difference Δφ(t) between the phase modulations of the first reflector and the second reflector; and the aforementioned phase difference Δφ(t) satisfies the following formula: Where v(t) represents the moving speed of the second device, θ(t) represents the angle between the moving direction of the second device and the gradient direction of the interference pattern, Ts represents the time sampling interval of the interference signal by the second device, λ represents the wavelength of the interference signal, and D(t) represents the spatial period of the interference pattern.

[0265] In one possible implementation, the transceiver module 1720 is further configured to receive first indication information, which indicates the moving speed of the second device and the time sampling interval of the interference signal by the second device.

[0266] In one possible implementation, the transceiver module 1720 is further configured to receive measurement results, which include an amplitude sequence. The amplitude sequence is obtained based on the measurement of the interference signal on a first time-frequency resource, which is a time-frequency resource associated with the first reflector and the second reflector. The processing module 1710 is further configured to determine the second position of the second device based on the phase information, the interference pattern, the first position of the second device, and the amplitude sequence.

[0267] In one possible implementation, the transceiver module 1720 is further configured to receive second indication information, which indicates the first position of the second device; the processing module 1710 is further configured to determine an interference pattern based on the first position, the position of the first reflector, and the position of the second reflector.

[0268] For example, when the device 1700 is used to implement Figure 14 In the method embodiment shown, when the second device functions, the processing module 1710 is used to determine phase information, which is used for phase modulation of the first reflector and the second reflector. The phase information changes over time to ensure that the absolute value of the difference between the distance the second device moves along the gradient direction of the interference pattern and the distance the interference pattern moves in space due to the change in phase information is less than half of the spatial period of the interference pattern. The interference pattern indicates the spatial distribution of the amplitude of the interference signal generated by the first reflector and the second reflector. The transceiver module 1720 is used to transmit the aforementioned phase information.

[0269] In one possible implementation, the processing module 1710 is specifically used to determine phase information based on the interferogram, the moving speed of the second device, and the time sampling interval of the second device for the interferometric signal.

[0270] In one possible implementation, the aforementioned phase information includes the phase difference Δφ(t) between the phase modulations of the first reflector and the second reflector; and the phase difference Δφ(t) satisfies the following formula: Where v(t) represents the moving speed of the second device, θ(t) represents the angle between the moving direction of the second device and the gradient direction of the interference pattern, Ts represents the time sampling interval of the interference signal by the second device, λ represents the wavelength of the interference signal, and D(t) represents the spatial period of the interference pattern.

[0271] In one possible implementation, the transceiver module 1720 is further configured to receive third indication information, which indicates an interference pattern.

[0272] In one possible implementation, the transceiver module 1720 is further configured to transmit a first position of the second device, which is used to determine an interference pattern.

[0273] In one possible implementation, the processing module 1710 is further configured to determine an interference pattern based on the first position of the second device, the position of the first reflector, and the position of the second reflector.

[0274] In one possible implementation, the transceiver module 1720 is further configured to receive fourth indication information, which indicates the position of the first reflector and the position of the second reflector.

[0275] In one possible implementation, the transceiver module 1720 is further configured to send a request message, which requests the location of the first reflector and the location of the second reflector.

[0276] In one possible implementation, the processing module 1710 is further configured to determine the second position of the second device based on phase information, interferogram, first position of the second device, and amplitude sequence, wherein the amplitude sequence is obtained based on the measurement of the interferometric signal on a first time-frequency resource, the first time-frequency resource being the time-frequency resource associated with the first reflector and the second reflector.

[0277] For example, when the device 1700 is used to implement Figure 14 In the method embodiment shown, when the first device functions, the transceiver module 1720 is used to receive phase information, which is used for phase modulation of the first reflector and the second reflector. The phase information changes over time to ensure that the absolute value of the difference between the distance the second device moves along the gradient direction of the interference pattern and the distance the interference pattern moves in space due to the change in phase information is less than half the spatial period of the interference pattern. The interference pattern indicates the spatial distribution of the amplitude of the interference signal generated by the first reflector and the second reflector. The transceiver module 1720 is also used to send first configuration information and second configuration information based on the phase information. The first configuration information is used to configure the phase corresponding to the first reflector, and the second configuration information is used to configure the phase corresponding to the second reflector.

[0278] In one possible implementation, the transceiver module 1720 is further configured to receive the first position of the second device; the processing module 1710 is further configured to determine the interference pattern based on the first position, the position of the first reflector, and the position of the second reflector; and the transceiver module 1720 is further configured to send third indication information, which indicates the interference pattern.

[0279] In one possible implementation, the transceiver module 1720 is further configured to receive a request message for requesting the location of the first reflector and the location of the second reflector; and to send fourth indication information indicating the location of the first reflector and the location of the second reflector.

[0280] More detailed descriptions of the above modules can be obtained directly from the relevant descriptions in the method embodiments, and will not be repeated here.

[0281] It should be understood that the module division in the embodiments of this application is illustrative and only represents a logical functional division. In actual implementation, there may be other division methods. Furthermore, the functional modules in the various embodiments of this application can be integrated into a single processor, exist as separate physical entities, or be integrated into a single module. The integrated modules described above can be implemented in hardware or as software functional modules.

[0282] Figure 18 This is another schematic block diagram of the motion error calibration device 1800 provided in the embodiments of this application.

[0283] The motion error calibration device 1800 can be a chip system, or it can be a device configured with a chip system to implement the method described in the above-described method embodiments. In the embodiments of this application, the chip system can be composed of chips, or it can include chips and other discrete devices.

[0284] like Figure 18 As shown, the device 1800 may include a processor 1810, which can be used to execute computer programs or instructions in memory to achieve... Figure 12 to Figure 16 The method described in any one of the embodiments shown.

[0285] Optionally, the device 1800 further includes a communication interface 1820. The communication interface 1820 can be used to communicate with other devices via a transmission medium, thereby enabling the device 1800 to communicate with other devices. The communication interface 1820 may be, for example, a transceiver, interface, bus, circuit, or a device capable of transmitting and receiving functions. The processor 1810 can utilize the communication interface 1820 to input and output data and to implement... Figure 12 to Figure 16 The method described in any one of the embodiments shown.

[0286] Optionally, the device 1800 further includes at least one memory 1830 for storing program instructions and / or data. The memory 1830 is coupled to the processor 1810. The coupling in this embodiment is an indirect coupling or communication connection between devices, units, or modules, and can be electrical, mechanical, or other forms, used for information exchange between devices, units, or modules. The processor 1810 may operate in conjunction with the memory 1830. The processor 1810 may execute program instructions stored in the memory 1830. At least one of the at least one memory may be included in the processor.

[0287] It should be understood that the coupling in the embodiments of this application is an indirect coupling or communication connection between devices, units, or modules, which can be electrical, mechanical, or other forms, used for information interaction between devices, units, or modules. The processor 1810 may operate in conjunction with the memory 1830. The embodiments of this application do not limit the specific connection medium between the processor 1810, the communication interface 1820, and the memory 1830. Optionally, the processor 1810, the communication interface 1820, and the memory 1830 are connected via a bus 1840. The bus 1840 is in... Figure 18 The connections between other components are shown in bold lines only and are not intended to be limiting. The bus can be a peripheral component interconnect (PCI) bus or an extended industry standard architecture (EISA) bus, etc. The bus can be divided into address bus, data bus, control bus, etc. For ease of illustration, Figure 18 The bus is represented by a single thick line, but this does not mean that there is only one bus or one type of bus.

[0288] In one possible implementation, the device 1800 is a system-on-a-chip (SoC). Alternatively, the processor 1810 is an SoC.

[0289] This application also provides a communication system, which includes a first device and a second device as described above. In one possible implementation, the first device may, for example, be implemented as... Figure 14 The steps performed by the first device in the method shown can be implemented by the second device, for example. Figure 14 The steps performed by the second device in the illustrated method. Optionally, the above communication system further includes a first reflector and a second reflector, wherein the first reflector can, for example, implement... Figure 14 The steps performed by the first reflector in the method shown can be implemented by the second reflector, for example. Figure 14 The steps performed by the second reflector in the method shown.

[0290] This application also provides a communication system comprising a first device, a first reflector, and a second reflector as described above. In one possible implementation, the first device may, for example, be implemented as... Figure 12 The steps performed by the first device in the method shown can be implemented, for example, by the first reflector. Figure 12 The steps performed by the first reflector in the method shown can be implemented by the second reflector, for example. Figure 12 The steps performed by the second reflector in the method shown.

[0291] This application also provides a computer program product, which includes: a computer program (also referred to as code or instructions), which, when run, can achieve... Figure 12 to Figure 16 The method described in any one of the embodiments shown.

[0292] This application also provides a computer-readable storage medium storing a computer program (also referred to as code or instructions). When the computer program is executed, it can achieve... Figure 12 to Figure 16 The method described in any one of the embodiments shown.

[0293] It should be understood that the processor in the embodiments of this application can be an integrated circuit chip with signal processing capabilities. In implementation, each step of the above method embodiments can be completed by the integrated logic circuitry in the processor's hardware or by instructions in software form. The processor can be a general-purpose processor, a digital signal processor (DSP), an application-specific integrated circuit (ASIC), a field-programmable gate array (FPGA), or other programmable logic devices, discrete gate or transistor logic devices, or discrete hardware components. It can implement or execute the methods, steps, and logic block diagrams disclosed in the embodiments of this application. The general-purpose processor can be a microprocessor or any conventional processor. The steps of the methods disclosed in the embodiments of this application can be directly embodied in the execution of a hardware decoding processor, or executed by a combination of hardware and software modules in the decoding processor. The software modules can be located in random access memory, flash memory, read-only memory, programmable read-only memory, electrically erasable programmable memory, registers, or other mature storage media in the art. The storage medium is located in memory, and the processor reads the information in the memory and, in conjunction with its hardware, completes the steps of the above method.

[0294] It should also be understood that the memory in the embodiments of this application can be volatile memory or non-volatile memory, or may include both volatile and non-volatile memory. The non-volatile memory can be read-only memory (ROM), programmable read-only memory (PROM), erasable programmable read-only memory (EPROM), electrically erasable programmable read-only memory (EEPROM), or flash memory. The volatile memory can be random access memory (RAM), which is used as an external cache. By way of example, but not limitation, many forms of RAM are available, such as static random access memory (SRAM), dynamic random access memory (DRAM), synchronous dynamic random access memory (SDRAM), double data rate synchronous dynamic random access memory (DDR SDRAM), enhanced synchronous dynamic random access memory (ESDRAM), synchronous linked dynamic random access memory (SLDRAM), and direct rambus RAM (DR RAM). It should be noted that the memory used in the systems and methods described herein is intended to include, but is not limited to, these and any other suitable types of memory.

[0295] The terms "unit," "module," etc., used in this specification can be used to refer to computer-related entities, hardware, firmware, combinations of hardware and software, software, or software in execution. In the embodiments of this application, "unit" and "module" have the same meaning and can be used interchangeably.

[0296] Those skilled in the art will recognize that the various illustrative logical blocks and steps described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, or a combination of computer software and electronic hardware. Whether these functions are implemented in hardware or software depends on the specific application and design constraints of the technical solution. Those skilled in the art can use different methods to implement the described functions for each specific application, but such implementation should not be considered beyond the scope of this application. In the several embodiments provided in this application, it should be understood that the disclosed apparatus, devices, and methods can be implemented in other ways. For example, the apparatus embodiments described above are merely illustrative; for example, the division of units is only a logical functional division, and in actual implementation, there may be other division methods. For example, multiple units or components may be combined or integrated into another system, or some features may be ignored or not executed. Furthermore, the shown or discussed mutual couplings or direct couplings or communication connections may be through some interfaces; indirect couplings or communication connections between devices or units may be electrical, mechanical, or other forms.

[0297] The units described as separate components may or may not be physically separate. The components shown as units may or may not be physical units; that is, they may be located in one place or distributed across multiple network units. Some or all of the units can be selected to achieve the purpose of this embodiment according to actual needs.

[0298] In addition, the functional units in the various embodiments of this application can be integrated into one processing unit, or each unit can exist physically separately, or two or more units can be integrated into one unit.

[0299] In the above embodiments, the functions of each functional unit can be implemented entirely or partially through software, hardware, firmware, or any combination thereof. When implemented using software, it can be implemented entirely or partially in the form of a computer program product. The computer program product includes one or more computer instructions (programs). When the computer program instructions (programs) are loaded and executed on a computer, all or part of the processes or functions described in the embodiments of this application are generated. The computer can be a general-purpose computer, a special-purpose computer, a computer network, or other programmable device. The computer instructions can be stored in a computer-readable storage medium or transmitted from one computer-readable storage medium to another. For example, the computer instructions can be transmitted from one website, computer, server, or data center to another website, computer, server, or data center via wired (e.g., coaxial cable, optical fiber, digital subscriber line (DSL)) or wireless (e.g., infrared, wireless, microwave, etc.) means. The computer-readable storage medium can be any available medium that a computer can access or a data storage device such as a server or data center that integrates one or more available media. The available media may be magnetic media (e.g., floppy disks, hard disks, magnetic tapes), optical media (e.g., digital video discs, DVDs), or semiconductor media (e.g., solid-state disks, SSDs), etc.

[0300] If the aforementioned functions are implemented as software functional units and sold or used as independent products, they can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of this application, in essence, or the part that contributes to the technology, or a portion of the technical solution, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions to cause a computer device (which may be a personal computer, server, or network device, etc.) to execute all or part of the steps of the methods described in the various embodiments of this application. The aforementioned storage medium includes various media capable of storing program code, such as USB flash drives, portable hard drives, ROM, RAM, magnetic disks, or optical disks.

[0301] The above description is merely a specific embodiment of this application, but the scope of protection of this application is not limited thereto. Any variations or substitutions that can be easily conceived by those skilled in the art within the scope of the technology disclosed in this application should be included within the scope of protection of this application. Therefore, the scope of protection of this application should be determined by the scope of the claims.

Claims

1. A method of motion error calibration, characterized by, The method applied to a first device comprises: determining phase information, the phase information being used for phase modulation of a first reflector and a second reflector, the phase information changing over time to satisfy that an absolute value of a difference between a moving distance of a second device along a gradient direction of an interference pattern and a moving distance of the interference pattern in space caused by a change of the phase information is less than half of a spatial period of the interference pattern, wherein the interference pattern indicates a distribution of amplitudes of an interference signal generated by the first reflector and the second reflector in space; sending first configuration information and second configuration information based on the phase information, the first configuration information being used for configuring a phase corresponding to the first reflector, and the second configuration information being used for configuring a phase corresponding to the second reflector.

2. The method of claim 1, wherein, The determining phase information comprises: determining the phase information according to the interference pattern, a moving speed of the second device, and a time sampling interval of the second device to the interference signal.

3. The method of claim 2, wherein, The phase information comprises a phase difference Δφ(t) of the phase modulation of the first reflector and the second reflector, and the phase difference Δφ(t) satisfies the following formula: where v(t) represents a moving speed of the second device, θ(t) represents an included angle between a moving direction of the second device and a gradient direction of the interference pattern, Ts represents a time sampling interval of the second device to the interference signal, λ represents a wavelength of the interference signal, and D(t) represents a spatial period of the interference pattern.

4. The method of claim 2 or 3, wherein, The method further comprises: receiving first indication information, the first indication information indicating the moving speed of the second device and the time sampling interval of the second device to the interference signal.

5. The method of any one of claims 1 to 4, wherein, The method further comprises: receiving a measurement result, the measurement result comprising an amplitude sequence, the amplitude sequence being obtained based on a measurement of the interference signal on a first time-frequency resource, the first time-frequency resource being a time-frequency resource associated with the first reflector and the second reflector; determining a second position of the second device according to the phase information, the interference pattern, a first position of the second device, and the amplitude sequence.

6. The method of any one of claims 1 to 5, wherein, The method further comprises: receiving second indication information, the second indication information indicating the first position of the second device; determining the interference pattern according to the first position, a position of the first reflector, and a position of the second reflector.

7. A motion error calibration method, characterized by, The method applied to a second device comprises: determining first indication information, the first indication information indicating a moving speed of the second device and a time sampling interval of the second device to an interference signal; sending the first indication information.

8. A motion error calibration method, characterized by, The method applied to a second device comprises: determining phase information, the phase information being used for phase modulation of a first reflector and a second reflector, the phase information changing over time to satisfy that an absolute value of a difference between a moving distance of a second device along a gradient direction of an interference pattern and a moving distance of the interference pattern in space caused by a change of the phase information is less than half of a spatial period of the interference pattern, wherein the interference pattern indicates a distribution of amplitudes of an interference signal generated by the first reflector and the second reflector in space; sending the phase information.

9. The method of claim 8, wherein, The determining phase information comprises: determining the phase information according to the interference pattern, a moving speed of the second device, and a time sampling interval of the second device to the interference signal.

10. The method of claim 9, wherein, The phase information includes a phase difference Δφ(t) of phase modulation of the first reflector and the second reflector; and the phase difference Δφ(t) satisfies the following formula: where v(t) represents a moving speed of the second device, θ(t) represents an included angle between a moving direction of the second device and a gradient direction of the interference pattern, Ts represents a time sampling interval of the second device to the interference signal, λ represents a wavelength of the interference signal, and D(t) represents a spatial period of the interference pattern.

11. The method of claim 9 or 10, wherein, The method further includes: receiving third indication information, the third indication information indicating the interference pattern.

12. The method of claim 11, wherein, The method further includes: sending a first position of the second device, the first position being used to determine the interference pattern.

13. The method of claim 9 or 10, wherein, The method further includes: determining the interference pattern according to the first position of the second device, a position of the first reflector and a position of the second reflector.

14. The method of claim 13, wherein, The method further includes: receiving fourth indication information, the fourth indication information indicating the position of the first reflector and the position of the second reflector.

15. The method of claim 13 or 14, wherein, The method further includes: sending a request message, the request message being used to request to obtain the position of the first reflector and the position of the second reflector.

16. The method of any one of claims 8 to 15, wherein, The method further includes: determining a second position of the second device according to the phase information, the interference pattern, the first position of the second device and an amplitude sequence, the amplitude sequence being obtained based on measurement of an interference signal on a first time-frequency resource, the first time-frequency resource being a time-frequency resource associated with the first reflector and the second reflector.

17. A method of motion error calibration, the method comprising: The method applied to a first device includes: receiving phase information, the phase information being used for phase modulation of a first reflector and a second reflector, the phase information changing over time to satisfy that an absolute value of a difference between a moving distance of a second device along a gradient direction of an interference pattern and a moving distance of the interference pattern in space caused by a change of the phase information is less than half of a spatial period of the interference pattern, wherein the interference pattern indicates a distribution of an amplitude of an interference signal generated by the first reflector and the second reflector in space; based on the phase information, sending first configuration information and second configuration information, the first configuration information being used to configure a phase corresponding to the first reflector, and the second configuration information being used to configure a phase corresponding to the second reflector.

18. The method of claim 17, wherein, The method further includes: receiving a first position of the second device; determining the interference pattern according to the first position, a position of the first reflector and a position of the second reflector; sending third indication information, the third indication information indicating the interference pattern.

19. The method of claim 17, wherein, The method further includes: receiving a request message, the request message being used to request to obtain the position of the first reflector and the position of the second reflector; sending fourth indication information, the fourth indication information indicating the position of the first reflector and the position of the second reflector.

20. A motion error calibration apparatus, characterized by, The module is used to implement the method in any one of claims 1 to 19.

21. A motion error calibration apparatus, characterized by, The processor is used to invoke a computer program stored in the memory, so that the method in any one of claims 1 to 19 is executed. The storage medium stores a computer program or instructions, when the computer program or instructions are executed, the method in any one of claims 1 to 19 is implemented.

22. A computer-readable storage medium, characterized in that, ​ 23. A computer program product, characterised in that, The computer program product comprises instructions which, when executed, implement the method of any one of claims 1 to 19.

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