Array substrate, display panel, display device and detection method of light filtering structure

Abstract

The invention discloses an array substrate, a display panel, a display device and a detection method of a light filtering structure, the array substrate comprises a substrate, a light emitting function layer and a light filtering layer, and the light filtering layer comprises the light filtering structure; the light-emitting functional layer comprises a plurality of pixel columns and a plurality of data signal lines which are arranged along a first direction and extend along a second direction; at least one data signal line is electrically connected with the sub-pixels in the two pixel columns; the array substrate further comprises a plurality of first shading lines which are located on the side, close to the substrate, of the filter layer, are arranged in the first direction and extend in the second direction. The orthographic projection of the data signal line on the plane where the substrate is located is overlapped with the orthographic projection of the first shading line on the plane where the substrate is located; the light filtering structure comprises a first edge and a second edge which are oppositely arranged along a first direction; the orthographic projection of the first edge and the orthographic projection of the second edge on the plane where the substrate is located are overlapped with the orthographic projection of the first shading line on the plane where the substrate is located. By adopting the technical scheme, the detection efficiency and the detection accuracy of the light filtering structure can be improved.

Description

Technical Field

[0001] This invention relates to the field of display technology, and in particular to a method for detecting array substrates, display panels, display devices, and filter structures. Background Technology

[0002] With the advancement of display technology, Color Filter on Array (COA) technology has been developed. COA technology involves fabricating filter structures on a thin-film transistor array substrate. The filter structures include multiple color filter structures to form sub-pixels of different colors.

[0003] To improve display quality and product yield, it is necessary to monitor the filter structure in the array substrate. However, the detection efficiency and accuracy of the filter structure in the existing technology are relatively low.

[0004] Therefore, how to efficiently and accurately identify alignment anomalies in filter structures has become an urgent technical problem to be solved. Summary of the Invention

[0005] This invention provides a method for detecting array substrates, display panels, display devices, and filter structures, so as to improve the detection efficiency and accuracy of filter structures.

[0006] According to one aspect of the present invention, an array substrate is provided, comprising: a substrate, a light-emitting functional layer located on one side of the substrate, and a filter layer located on the side of the light-emitting functional layer away from the substrate;

[0007] The light-emitting functional layer includes multiple pixel columns arranged along a first direction and extending along a second direction, and multiple data signal lines, wherein the first direction and the second direction intersect, and both the first direction and the second direction are parallel to the plane of the substrate; the pixel column includes multiple sub-pixels arranged along the second direction; at least one data signal line is electrically connected to the sub-pixels in two pixel columns.

[0008] The array substrate also includes multiple first shielding lines located on the side of the filter layer near the substrate, arranged along a first direction and extending in a second direction; the orthographic projection of the data signal line on the plane of the substrate overlaps with the orthographic projection of the first shielding lines on the plane of the substrate.

[0009] The filter layer is located in the display area. The filter layer includes a filter structure. The orthographic projection of the filter structure onto the plane of the substrate overlaps with the orthographic projection of the sub-pixel onto the plane of the substrate. The filter structure includes a first edge and a second edge that are disposed opposite to each other along a first direction. The orthographic projections of the first edge and the second edge onto the plane of the substrate overlap with the orthographic projection of the first shading light onto the plane of the substrate.

[0010] Optionally, along the first direction, adjacent filter structures may have different colors;

[0011] The orthographic projection of the same filter structure onto the plane of the substrate can cover the orthographic projection of multiple sub-pixels arranged along the second direction onto the plane of the substrate.

[0012] Optionally, along the second direction, the length of the first light-blocking light is greater than the length of the filter structure.

[0013] Optionally, the orthographic projection of the filter structure onto the plane of the substrate overlaps only with the orthographic projections of the two first shielding rays arranged adjacent to each other along the first direction onto the plane of the substrate.

[0014] Optionally, between two adjacent pixel columns arranged along the first direction, there is one and only one first shading light line projecting onto the plane of the substrate.

[0015] Optionally, the light-emitting functional layer also includes multiple first signal lines arranged along a first direction and extending in a second direction; the first signal lines are transparent traces.

[0016] Optionally, the data signal line can be multiplexed as the first light shield.

[0017] Optionally, the array substrate further includes a power signal line and a reset signal line, wherein the power signal line is multiplexed as a first light shield, and / or the reset signal line is multiplexed as a first light shield.

[0018] Optionally, along the first direction, the power signal line is located between two adjacent data signal lines, and / or, the reset signal line is located between two adjacent data signal lines.

[0019] Optionally, when both the power signal line and the reset signal line are multiplexed as the first shielding line, the power signal line and the reset signal line are arranged alternately along the first direction.

[0020] Optionally, the array substrate includes a plurality of pixel units located in the display area and arranged in an array; the pixel unit includes a first color sub-pixel, a second color sub-pixel, a third color sub-pixel and a fourth color sub-pixel arranged along a first direction;

[0021] In the same pixel unit, data signal lines are provided between the first color sub-pixel and the second color sub-pixel, as well as between the third color sub-pixel and the fourth color sub-pixel.

[0022] Optionally, the first shielding line includes a first sub-line and a second sub-line;

[0023] Along the first direction, the length of the first sub-line is greater than the length of the second sub-line.

[0024] Optionally, the array substrate includes multiple pixel units located in the display area and arranged in an array; the pixel unit includes multiple sub-pixels arranged along a first direction;

[0025] The orthographic projection of the first sub-line onto the plane of the substrate lies between the orthographic projections of adjacent pixel units along the first direction onto the plane of the substrate, and the orthographic projection of the second sub-line onto the plane of the substrate overlaps with the orthographic projection of the pixel units onto the plane of the substrate.

[0026] Optionally, the first sub-line can be multiplexed as a power signal line;

[0027] At least part of the second sub-line is multiplexed as a data signal line.

[0028] Optionally, the array substrate includes a plurality of pixel units located in the display area and arranged in an array; the pixel unit includes a first color sub-pixel, a second color sub-pixel, a third color sub-pixel and a fourth color sub-pixel arranged along a first direction;

[0029] The orthographic projection of the first sub-line onto the plane of the substrate lies between the orthographic projection of the first color sub-pixel onto the plane of the substrate and the orthographic projection of the fourth color sub-pixel onto the plane of the substrate.

[0030] The second sub-line includes a first trace, a second trace, and a third trace; the orthographic projection of the first trace onto the plane where the substrate is located is located between the orthographic projection of the first color sub-pixel onto the plane where the substrate is located and the orthographic projection of the second color sub-pixel onto the plane where the substrate is located; the orthographic projection of the second trace onto the plane where the substrate is located is located between the orthographic projection of the second color sub-pixel onto the plane where the substrate is located and the orthographic projection of the third color sub-pixel onto the plane where the substrate is located; the orthographic projection of the third trace onto the plane where the substrate is located is located between the orthographic projection of the third color sub-pixel onto the plane where the substrate is located and the orthographic projection of the fourth color sub-pixel onto the plane where the substrate is located.

[0031] The first and third traces are multiplexed as data signal lines; the second trace is multiplexed as a reset signal line.

[0032] Optionally, the first color subpixel is a white subpixel; or, the fourth color subpixel is a white subpixel.

[0033] Optionally, along the first direction, the length of the second trace is greater than the length of the first trace, and the length of the second trace is greater than the length of the third trace.

[0034] Optionally, the first light-shielding material is a metal light-shielding material;

[0035] The orthographic projections of the filter structures arranged adjacent to each other along the first direction onto the plane where the substrate is located overlap, and the overlapping area of ​​the orthographic projections of the filter structures arranged adjacent to each other along the first direction onto the plane where the substrate is located overlaps with the orthographic projection of the first shading light onto the plane where the substrate is located.

[0036] Optionally, the light-emitting functional layer includes light-emitting elements and pixel driving circuitry;

[0037] The array substrate also includes a black light-shielding layer;

[0038] The black light-blocking layer includes a plurality of first light-blocking portions arranged along a first direction and extending along a second direction;

[0039] The orthographic projection of the first light-shielding part onto the plane of the substrate does not overlap with the orthographic projection of the light-emitting element onto the plane of the substrate;

[0040] The orthographic projection of the first light-shielding part onto the plane of the substrate and the orthographic projection of the first light-shielding ray onto the plane of the substrate overlap.

[0041] Optionally, a black light-blocking layer is located between the light-emitting functional layer and the light-filtering layer;

[0042] The first shading light reuses the first shading part.

[0043] Optionally, the light-emitting functional layer includes a light-emitting layer and a circuit layer; the circuit layer includes a pixel driving circuit and a bottom light-shielding structure located on the side of the pixel driving circuit closer to the substrate.

[0044] The first light-shielding structure is installed on the same layer as the bottom light-shielding structure.

[0045] Optionally, along the second direction, adjacent filter structures may have different colors;

[0046] The array substrate also includes multiple second light-shielding lines located on the side of the filter layer near the substrate and arranged along the second direction and extending in the first direction;

[0047] The filter structure includes a third edge and a fourth edge disposed opposite to each other along the second direction;

[0048] The orthographic projections of the third and fourth edges onto the plane of the substrate overlap with the orthographic projections of the second shading light onto the plane of the substrate.

[0049] Optionally, the light-emitting functional layer may also include multiple second signal lines extending along the first direction;

[0050] Along the second direction, the length of the second light shield is greater than the length of the second signal line.

[0051] Optionally, the light-emitting functional layer includes multiple scan signal lines extending along a first direction;

[0052] Sub-pixels arranged along the first direction form a pixel row;

[0053] In the same pixel row, two sub-pixels connected to the same data signal line are connected to different scan signal lines;

[0054] In the display area, the orthographic projection of the second shielding light onto the plane of the substrate covers the orthographic projection of the scan signal line onto the plane of the substrate.

[0055] Optionally, at least a portion of the second shading light is disposed in the same layer as at least a portion of the first shading light.

[0056] Optionally, the light-emitting functional layer includes multiple scan signal lines extending along a first direction;

[0057] Sub-pixels arranged along the first direction form a pixel row;

[0058] In the same pixel row, two sub-pixels connected to the same data signal line are connected to different scan signal lines.

[0059] Optionally, the filter structure includes a first filter portion and a second filter portion arranged along the second direction;

[0060] Along the first direction, the lengths of the first filter section and the second filter section are different.

[0061] Optionally, the filter structures of at least two colors have different thicknesses in the direction perpendicular to the plane of the substrate.

[0062] Optionally, the filter structure includes a red filter structure, a green filter structure, and a blue filter structure;

[0063] Along the direction perpendicular to the plane of the substrate, the thickness of the red filter structure is greater than that of the blue filter structure, and the thickness of the blue filter structure is greater than that of the green filter structure.

[0064] Optionally, the filter structure includes a third filter portion and a fourth filter portion, wherein the orthographic projection of the fourth filter portion onto the plane of the substrate at least partially surrounds the orthographic projection of the third filter portion onto the plane of the substrate, and the thickness of the third filter portion and the thickness of the fourth filter portion are not equal in a direction perpendicular to the plane of the substrate.

[0065] Optionally, the orthographic projection of the fourth filter onto the plane of the substrate overlaps with the orthographic projection of the first shielding light onto the plane of the substrate.

[0066] According to another aspect of the present invention, a display panel is provided, comprising an array substrate of any of the above embodiments.

[0067] According to another aspect of the present invention, a display device is provided, comprising the display panel of any of the above embodiments.

[0068] According to another aspect of the present invention, a method for detecting the filter structure of an array substrate is provided, for detecting the filter structure in the array substrate;

[0069] The detection methods include:

[0070] An array substrate is provided; the array substrate includes a substrate, a light-emitting functional layer located on one side of the substrate, and a filter layer located on the side of the light-emitting functional layer away from the substrate;

[0071] A light source is positioned on the side of the substrate away from the filter layer; the light from the light source passes sequentially through the substrate, the light-emitting functional layer, and the filter layer.

[0072] An image of the array substrate is obtained by photographing the side of the filter layer away from the substrate.

[0073] Based on the outline of the filter structure and the outline of the first shading light in the detection image, determine whether there is misalignment of the filter structure in the filter layer.

[0074] Optionally, the orthographic projection of the first shielding light onto the plane of the array substrate can define a plurality of sub-pixel regions arranged along the first direction on the plane of the array substrate; the sub-pixel regions are provided with sub-pixels;

[0075] Each subpixel corresponds to a primary display color, and the color of the filter structure that overlaps with the subpixel is the same as the primary display color corresponding to the subpixel area;

[0076] Based on the outline of the filter structure and the outline of the first shading light in the detection image, determine whether there is misalignment of the filter structure in the filter layer, including:

[0077] In the detected image, if there are non-corresponding colors in the sub-pixel region, and / or, the orthogonal projection of the first shielding light onto the plane of the array substrate has an abnormal protrusion toward the adjacent sub-pixel region, then it is determined that the filter structure in the filter layer has misalignment.

[0078] Optionally, the filter layer includes a first color filter structure but does not include a second color filter structure;

[0079] An image of the array substrate is obtained by photographing the side of the filter layer away from the substrate, including:

[0080] The array substrate is photographed on the side of the filter layer away from the substrate to obtain the first detection image;

[0081] Based on the first detection image, detect whether there is misalignment in the first color filter structure in the filter layer;

[0082] If there is no misalignment in the first color filter structure, a second color filter structure is formed in the filter layer. Then, a light source is set on the side of the substrate away from the filter layer, and the array substrate is photographed on the side of the filter layer away from the substrate to obtain a second detection image.

[0083] Based on the second detection image, detect whether there is misalignment of the second color filter structure in the filter layer.

[0084] The technical solution of this invention utilizes Dual Gate Line Driving (DGLD) technology to electrically connect at least a portion of the data signal lines to the sub-pixels of two pixel columns. This reduces the number of conductive lines in the display area, which helps reduce interference from conductive lines on the detection of alignment anomalies in the filter structure. It also improves the situation where the detection image is prone to ghosting due to the close proximity of two conductive lines. By setting multiple first shielding lines arranged along a first direction and extending in a second direction on the side of the filter layer near the substrate, the alignment anomalies of the filter structure can be detected using the first shielding lines as a reference. The orthographic projection of the data signal lines on the plane of the substrate overlaps with the orthographic projection of the first shielding lines on the plane of the substrate, which helps improve detection accuracy and avoids misjudgment of the alignment anomaly detection results caused by the data signal lines. In addition, by setting the orthographic projection of the first edge and the second edge of the filter structure on the plane of the substrate to overlap with the first shielding line, the detection accuracy is improved, and misjudgment of the alignment anomaly detection results of the filter structure is avoided. The overlapping of the orthographic projections of the shielding light onto the plane of the substrate allows for the determination of misalignment of the filter structure when the orthographic projections of the first edge or second edge onto the plane of the substrate do not overlap. Thus, when detecting misalignment of the filter structure, it is sufficient to identify whether there is an abnormal protrusion along the first direction in the orthographic projection outline of the first shielding light onto the plane of the substrate, or whether there is a gap between the orthographic projections of the first edge or second edge onto the plane of the substrate and the orthographic projection of the first shielding light onto the plane of the substrate. This eliminates the need for precise measurement of the distance between the edge of the filter structure and the first shielding light in the first direction using the first shielding light as a reference, and also eliminates the need for precise focusing during the detection process. This enables accurate detection of the filter structure in the display area, simplifying the detection method and improving detection efficiency and accuracy.

[0085] It should be understood that the description in this section is not intended to identify key or essential features of the embodiments of the present invention, nor is it intended to limit the scope of the invention. Other features of the invention will become readily apparent from the following description. Attached Figure Description

[0086] To more clearly illustrate the technical solutions in the embodiments of the present invention, the accompanying drawings used in the description of the embodiments will be briefly introduced below. Obviously, the accompanying drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0087] Figure 1 This is a schematic diagram of the film structure of an array substrate provided in an embodiment of the present invention. Figure 1 ;

[0088] Figure 2This is a top view schematic diagram of an array substrate provided in an embodiment of the present invention. Figure 1 ;

[0089] Figure 3 This is a top view schematic diagram of an array substrate provided in an embodiment of the present invention. Figure 2 ;

[0090] Figure 4 This is a schematic diagram of the film structure of an array substrate provided in an embodiment of the present invention. Figure 2 ;

[0091] Figure 5 This is a top view schematic diagram of an array substrate provided in an embodiment of the present invention. Figure 3 ;

[0092] Figure 6 This is a top view schematic diagram of an array substrate provided in an embodiment of the present invention. Figure 4 ;

[0093] Figure 7 This is a top view schematic diagram of an array substrate provided in an embodiment of the present invention. Figure 5 ;

[0094] Figure 8 This is a top view schematic diagram of an array substrate provided in an embodiment of the present invention. Figure 6 ;

[0095] Figure 9 This is a top view schematic diagram of an array substrate provided in an embodiment of the present invention. Figure 7 ;

[0096] Figure 10 This is a top view schematic diagram of an array substrate provided in an embodiment of the present invention. Figure 8 ;

[0097] Figure 11 This is a top view schematic diagram of an array substrate provided in an embodiment of the present invention. Figure 9 ;

[0098] Figure 12 This is a top view schematic diagram of an array substrate provided in an embodiment of the present invention. Figure 10 ;

[0099] Figure 13 This is a top view schematic diagram of an array substrate provided in an embodiment of the present invention. Figure 10 one;

[0100] Figure 14 yes Figure 13 Magnified view of a local area LA in the middle Figure 1 ;

[0101] Figure 15 yes Figure 13 Magnified view of a local area LA in the middle Figure 2 ;

[0102] Figure 16 This is a schematic diagram of the film structure of an array substrate provided in an embodiment of the present invention. Figure 3 ;

[0103] Figure 17 This is a schematic diagram of the film structure of an array substrate provided in an embodiment of the present invention. Figure 4 ;

[0104] Figure 18 This is a schematic diagram of the film structure of an array substrate provided in an embodiment of the present invention. Figure 5 ;

[0105] Figure 19 This is a top view schematic diagram of an array substrate provided in an embodiment of the present invention. Figure 10 two;

[0106] Figure 20 This is a flowchart of a method for detecting the filter structure of an array substrate provided in an embodiment of the present invention. Figure 1 ;

[0107] Figure 21 This is a flowchart of a method for detecting the filter structure of an array substrate provided in an embodiment of the present invention. Figure 2 ;

[0108] Figure 22 This is a schematic diagram of the structure of a display panel provided in an embodiment of the present invention;

[0109] Figure 23 This is a schematic diagram of the structure of a display device provided in an embodiment of the present invention. Detailed Implementation

[0110] To enable those skilled in the art to better understand the present invention, the technical solutions of the present invention will be clearly and completely described below with reference to the accompanying drawings of the embodiments of the present invention. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort should fall within the scope of protection of the present invention.

[0111] It should be noted that the terms "first," "second," etc., in the specification, claims, and accompanying drawings of this invention are used to distinguish similar objects and are not necessarily used to describe a specific order or sequence. It should be understood that such data can be interchanged where appropriate so that the embodiments of the invention described herein can be implemented in orders other than those illustrated or described herein. Furthermore, the terms "comprising" and "having," and any variations thereof, are intended to cover a non-exclusive inclusion; for example, a process, method, system, product, or apparatus that comprises a series of steps or units is not necessarily limited to those steps or units explicitly listed, but may include other steps or units not explicitly listed or inherent to such processes, methods, products, or apparatus.

[0112] In related technologies, there is a method for detecting alignment anomalies in filter structures. A detection area is set in the non-display area of ​​the array substrate, and an auxiliary measurement pattern is formed in the detection area as a measurement reference. The offset distance of the filter structure in the detection area relative to the auxiliary measurement pattern is used to detect the offset distance of the filter structure in the display area. In this way, an auxiliary measurement pattern can be formed only between the detected filter structure and the substrate, serving as a reference for measuring the physical properties of the filter structure. This reduces the interference of the circuit structure and conductive lines of the array substrate on the filter structure, improving detection accuracy. However, this detection method can only detect the overall alignment of the filter structure and cannot detect local alignment anomalies caused by local differences during the fabrication process. For example, the fabrication process of the filter structure typically uses photolithography, which includes exposure, development, and etching steps. Due to environmental and equipment factors, local temperature anomalies or optical path abnormalities may occur during exposure, affecting the shape and size of the local filter structure. Furthermore, uneven etching, over-etching, and material anisotropy may also cause local shape and size anomalies in the filter structure. These local alignment anomalies cannot be detected.

[0113] Another method for detecting alignment anomalies in filter structures exists in related technologies. This method directly detects the filter structure in the display area by photographing it and measuring the distance between the edge of the filter structure and the edge of a reference object to determine if the filter structure is misaligned. While this method can detect local alignment anomalies caused by local differences during the manufacturing process, the filter structures in the display area are small in size and numerous, and overlapping of different colored filter structures can create black opaque areas. Accurate focusing is required to capture clear images, but the focusing of the vision imaging system's lens is slow, resulting in a long detection time and low efficiency. To meet production demands and increase production line cycle time, detection time needs to be compressed, leading to images from the vision imaging system that are not fully focused, resulting in blurred edges. Furthermore, the display area contains many conductive lines; if two conductive lines are close together, ghosting and blurring can occur, blending with the edges of the filter structure and black opaque areas, potentially causing misjudgments of alignment anomalies and affecting product yield.

[0114] In related technologies, while detecting the offset of the filter structure in the non-display area can avoid interference from circuit structures and conductive lines, thus improving detection accuracy, it cannot detect local alignment anomalies in the filter structure. Directly detecting the filter structure in the display area, while capable of detecting local alignment anomalies, is easily affected by interference from circuit structures and conductive lines, resulting in lower detection accuracy. Furthermore, if precise focusing is required to improve accuracy, the detection time is long, which is detrimental to improving detection efficiency and affecting production line cycle time. Therefore, these technologies cannot efficiently and accurately identify alignment anomalies in the filter structure.

[0115] To address the aforementioned technical problems, embodiments of the present invention provide an array substrate, comprising: a substrate, a light-emitting functional layer located on one side of the substrate, and a light-filtering layer located on the side of the light-emitting functional layer away from the substrate; the light-emitting functional layer includes a plurality of pixel columns arranged along a first direction and extending along a second direction, and a plurality of data signal lines, wherein the first direction intersects the second direction, and both the first direction and the second direction are parallel to the plane of the substrate; the pixel columns include a plurality of sub-pixels arranged along the second direction; at least one data signal line is electrically connected to a sub-pixel in two pixel columns; the array substrate further includes a plurality of first shielding lines located on the side of the light-filtering layer near the substrate, arranged along the first direction and extending along the second direction; the orthographic projection of the data signal lines on the plane of the substrate overlaps with the orthographic projection of the first shielding lines on the plane of the substrate; the light-filtering layer is located in a display area, and the light-filtering layer includes a filter structure, the orthographic projection of the filter structure on the plane of the substrate overlaps with the orthographic projection of the sub-pixels on the plane of the substrate; the filter structure includes a first edge and a second edge disposed opposite to each other along the first direction; the orthographic projections of the first edge and the second edge on the plane of the substrate overlap with the orthographic projections of the first shielding lines on the plane of the substrate.

[0116] By employing the above technical solution and utilizing DGLD technology to electrically connect at least some data signal lines to the sub-pixels of two pixel columns, the number of conductive lines in the display area can be reduced. This helps to reduce interference from conductive lines on the detection of alignment anomalies in the filter structure and also improves the situation where the detection image is prone to ghosting due to the close proximity of two conductive lines. By setting multiple first shielding lines arranged along a first direction and extending in a second direction on the side of the filter layer near the substrate, the alignment anomalies of the filter structure can be detected using the first shielding lines as a reference. The orthographic projection of the data signal lines on the plane of the substrate overlaps with the orthographic projection of the first shielding lines on the plane of the substrate, which helps to improve detection accuracy and avoid misjudgment of the alignment anomaly detection results of the filter structure caused by the data signal lines. In addition, by setting the orthographic projection of the first edge and the second edge of the filter structure on the plane of the substrate and The overlapping of the orthographic projections of the first shielding light onto the plane of the substrate allows for the determination of misalignment of the filter structure when the orthographic projections of the first edge or the second edge onto the plane of the substrate do not overlap. Thus, when detecting misalignment of the filter structure, it is sufficient to identify whether there is an abnormal protrusion along the first direction in the orthographic projection outline of the first shielding light onto the plane of the substrate, or whether there is a gap between the orthographic projections of the first edge or the second edge onto the plane of the substrate and the orthographic projection of the first shielding light onto the plane of the substrate. This eliminates the need for precise measurement of the distance between the edge of the filter structure and the first shielding light in the first direction using the first shielding light as a reference, and also eliminates the need for precise focusing during the detection process. This enables accurate detection of the filter structure in the display area, simplifying the detection method and improving detection efficiency and accuracy.

[0117] The above is the core idea of ​​this invention. Based on the embodiments of this invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this invention. The technical solutions in the embodiments of this invention will be clearly and completely described below with reference to the accompanying drawings.

[0118] It should be noted that the implementation methods provided in the embodiments of the present invention can be combined with each other without contradiction.

[0119] Figure 1 This is a schematic diagram of the film structure of an array substrate provided in an embodiment of the present invention. Figure 1 , Figure 2 This is a top view schematic diagram of an array substrate provided in an embodiment of the present invention. Figure 1 ,refer to Figure 1 and Figure 2The array substrate 001 includes a substrate 100, a light-emitting functional layer 200 located on one side of the substrate, and a filter layer 300 located on the side of the light-emitting functional layer 200 away from the substrate. The light-emitting functional layer 200 includes a plurality of pixel columns arranged along a first direction X and extending along a second direction Y, and a plurality of data signal lines DL, wherein the first direction X intersects the second direction Y, and both the first direction X and the second direction Y are parallel to the plane of the substrate 100; the pixel columns include a plurality of sub-pixels P arranged along the second direction Y; at least one data signal line DL is electrically connected to the sub-pixels P in two pixel columns.

[0120] The substrate 100 may include a transparent, semi-transparent, or opaque substrate, and may also include a rigid substrate or a flexible substrate. Furthermore, the side of the substrate 100 closest to the light-emitting functional layer 200 may include a buffer layer. Figure 1 (Not shown in the image) to block oxygen and moisture, and to provide a flat surface on the side of the substrate 100 near the light-emitting functional layer 200. In an alternative embodiment, the substrate 100 may be a transparent substrate, such as a glass substrate.

[0121] The light-emitting functional layer 200 includes a circuit layer and a light-emitting layer. The circuit layer includes multiple thin-film transistors, a pixel driving circuit 210 composed of thin-film transistors, conductive lines (e.g., data signal lines DL) providing signals to the pixel driving circuit 210, and an interlayer dielectric layer disposed between the conductive film layers. In one optional embodiment, the interlayer dielectric layer may be or may include a transparent and insulating material, such as silicon oxide or silicon nitride. In another optional embodiment, the interlayer dielectric layer may also include an opaque and insulating material, such as non-conductive black particles, black pigment, or dark insulating material. The light-emitting layer includes multiple light-emitting elements D0, which may be OLEDs, Mini LEDs, or Micro LEDs. The light-emitting elements D0 may be white light-emitting elements, or red, green, or blue light-emitting elements. In one embodiment, the light-emitting layer and its light-emitting elements D0 may be disposed on the side of the circuit layer away from the substrate 100; in another embodiment, the light-emitting layer and its light-emitting elements D0 may also be disposed on the side of the circuit layer closer to the substrate 100. Figure 1 (not shown in the figure). In another embodiment, when the light-emitting element D0 is an OLED, the first electrode and the second electrode electrically connected to it can both be transparent electrodes.

[0122] The pixel driving circuit 210 and the light-emitting element D0 form a sub-pixel P. The pixel driving circuit 210 can provide a corresponding driving current to the light-emitting element D0 according to the data signal transmitted by the data signal line DL, so that the light-emitting element D0 presents a corresponding display grayscale. In an optional embodiment, the orthographic projection of the pixel driving circuit 210 on the plane of the substrate 100 and the orthographic projection of the light-emitting element D0 on the plane of the substrate 100 do not overlap. Figure 1The image only shows the illustrative positional relationship of the film layer between the pixel driving circuit 210 and the light-emitting element D0, and does not show the positional relationship of the pixel driving circuit 210 and the light-emitting element D0 as orthographic projections onto the plane of the substrate 100.

[0123] This invention provides a dual gate line driving (DGLD) technology, in which at least one data signal line DL can be electrically connected to sub-pixels P in two pixel columns simultaneously, and sub-pixels P located in the same pixel row and connected to the same data signal line DL are respectively connected to different scan signal lines. Figure 2 (Not shown in the diagram), enabling data signal lines DL that are simultaneously electrically connected to sub-pixels P in two pixel columns to provide data signals to the sub-pixels P in both pixel columns in a time-division manner. This reduces the number of data signal lines DL in the display area AA compared to the number of pixel columns, thus reducing the number of signal traces in the display area AA and consequently reducing interference from these traces on the alignment anomaly detection of the filter structure 310. It should be noted that... Figure 2 The example only shows two pixel columns electrically connected to the same data signal line DL arranged adjacently, and these two pixel columns are located on opposite sides of the data signal line DL; in other alternative embodiments, the two pixel columns electrically connected to the same data signal line DL may not be arranged adjacently, and / or, the two pixel columns may be located on the same side of the data signal line DL.

[0124] Continue to refer to Figure 1 and Figure 2 The array substrate 001 also includes multiple first shielding lines OL1 located on the side of the filter layer 300 near the substrate 100, arranged along the first direction X and extending in the second direction Y. The orthographic projection of the data signal line DL onto the plane of the substrate 100 overlaps with the orthographic projection of the first shielding lines OL1 onto the plane of the substrate 100. The filter layer 300 is located in the display area AA, and the filter layer 300 includes a filter structure 310. The orthographic projection of the filter structure 310 onto the plane of the substrate 100 overlaps with the orthographic projection of the sub-pixel P onto the plane of the substrate 100. The filter structure 310 includes a first edge S1 and a second edge S2 disposed opposite to each other along the first direction X. The orthographic projections of the first edge S1 and the second edge S2 onto the plane of the substrate 100 overlap with the orthographic projections of the first shielding lines OL1 onto the plane of the substrate 100.

[0125] The first light-shielding light OL1 comprises an opaque material, resulting in low light transmittance. The first light-shielding light OL1 can be a conductive or insulating material, and can include organic or inorganic materials. This embodiment of the invention does not limit the material of the first light-shielding light OL1. The first light-shielding light OL1 can be located anywhere between the substrate 100 and the filter layer 300. This embodiment of the invention also does not limit the location of the film layer containing the first light-shielding light OL1. In one embodiment, the first light-shielding light OL1 in the array substrate 001 can be disposed in the same layer; in another embodiment, the first light-shielding light OL1 in the array substrate 001 can also be disposed in different film layer locations. For example, a bottom light-shielding structure is provided on the side of the pixel driving circuit 210 near the substrate 100. Figure 1 and Figure 2 (not shown in the image) to block light rays incident from the substrate 100 toward the thin film transistor channel region. The first light-shielding light OL1 can be disposed in the same layer as the bottom light-shielding structure. The first light-shielding light OL1 is also located on the side of the pixel driving circuit 210 close to the substrate 100. In this case, both the bottom light-shielding structure and the first light-shielding light OL1 can include a metal light-shielding material.

[0126] In an optional embodiment, the orthographic projection of each data signal line DL onto the plane of the substrate 100 overlaps with the orthographic projection of the first shielding light OL1 onto the plane of the substrate 100. However, some orthographic projections of the first shielding light OL1 onto the plane of the substrate 100 may not overlap with the orthographic projections of the data signal lines DL onto the plane of the substrate 100. In one embodiment, the number of data signal lines DL is less than or equal to the number of first shielding light OL1, ensuring that the orthographic projections of all data signal lines DL onto the plane of the substrate 100 overlap with the orthographic projections of the first shielding light OL1 onto the plane of the substrate 100, thus preventing the data signal lines DL from interfering with the alignment anomaly detection of the filter structure 310. In another embodiment, along the first direction X, the length of the data signal lines DL is less than or equal to the length of the first shielding light OL1, preventing the data signal lines DL from having a large dimension in the first direction X, which could affect the alignment anomaly detection of the filter structure 310.

[0127] The filter layer 300 includes filter structures 310 of various colors. For example, the filter structure 310 may include a red filter structure 311, a green filter structure 312, and a blue filter structure 313. It should be noted that... Figure 1 and Figure 2The diagram only shows, by way of example, a red filter structure 311, a green filter structure 312, and a blue filter structure 313 arranged sequentially along the first direction X, but is not limited thereto. The orthogonal projection of the filter structure 310 onto the plane of the substrate 100 can cover the orthogonal projection of the light-emitting element D0 of the sub-pixel P onto the plane of the substrate 100. The filter structure 310 can transmit light of the corresponding color, so that different sub-pixels P can present different colors.

[0128] The first edge S1 and the second edge S2 of the filter structure 310 are arranged along the first direction X and extend along the second direction Y. In one embodiment, the orthographic projections of the first edge S1 and the second edge S2 onto the plane of the substrate 100 are both located within the outline (including the outline edge) of the orthographic projection of the first shading light OL1 onto the plane of the substrate 100; the orthographic projections of the first edge S1 and the second edge S2 of the same filter structure 310 onto the plane of the substrate 100 are respectively located within the outline (including the outline edge) of the orthographic projections of different first shading light OL1 onto the plane of the substrate 100. In another embodiment, the orthographic projection of the first shading light OL1 onto the plane of the substrate 100 can be used to divide the setting area of ​​the pixel column. That is, along the first direction X, the first shading light OL1 can be set on both sides of each pixel column, so that the orthographic projections of the first edge S1 and the second edge S2 of the filter structure 310 onto the plane of the substrate 100 can both be located within the outline of the orthographic projection of the first shading light OL1 onto the plane of the substrate 100 (including the outline edge). At this time, the number of first shading light OL1 is greater than the number of pixel columns.

[0129] Specifically, multiple first shielding rays OL1 are provided on the side of the filter layer 300 near the substrate 100, which can be used as a reference to detect whether the filter structure 310 is misaligned. The orthographic projections of the first edge S1 and the second edge S2 on the plane of the substrate 100 overlap with the orthographic projections of the first shielding rays OL1 on the plane of the substrate 100. When the orthographic projections of the first edge S1 or the second edge S2 on the plane of the substrate 100 do not overlap with the orthographic projections of the first shielding rays OL1 on the plane of the substrate 100, it can be determined that the filter structure 310 is misaligned. Thus, when detecting misalignment of the filter structure 310, it is not necessary to accurately measure the distance between the edge of the filter structure 310 and the first shielding rays OL1 in the first direction X, nor is it necessary to accurately focus during the detection process. This simplifies the detection method of the filter structure 310 and improves detection efficiency and accuracy.

[0130] At the same time, by combining DGLD technology, at least one data signal line DL can be electrically connected to the sub-pixel P of two pixel columns, which can reduce the number of data signal lines DL in the display area AA, thereby reducing the conductive lines in the display area AA. This helps to reduce the interference of the conductive lines in the display area AA on the detection of alignment anomalies of the filter structure 310, and can also improve the situation where the two conductive lines are close together, which makes the detection image prone to ghosting and blurring.

[0131] Furthermore, the orthographic projection of the data signal line DL onto the plane of the substrate 100 overlaps with the orthographic projection of the first shading light OL1 onto the plane of the substrate 100. This ensures that the orthographic projection of the data signal line DL onto the plane of the substrate 100 is also located at the orthographic projection position of the first edge S1 or the second edge S2 of the filter structure 310 onto the plane of the substrate 100. On the one hand, this avoids the situation where the orthographic projection of the data signal line DL onto the plane of the substrate 100 and the orthographic projection of the first shading light OL1 onto the plane of the substrate 100 are too close, causing ghosting and blurring in the detection image. On the other hand, it avoids the situation where the orthographic projection of the data signal line DL onto the plane of the substrate 100 and the orthographic projection of the first shading light OL1 onto the plane of the substrate 100 are too far apart, which could lead to the data signal line DL being mistakenly identified as the first shading light OL1 during detection, resulting in a misjudgment of the alignment abnormality detection result of the filter structure 310.

[0132] For example, when detecting alignment anomalies in the filter structure 310, a vision inspection system can be used to capture the display area AA of the array substrate 001 to obtain a detection image. Automated Optical Inspection (AOI) technology is then used to automatically identify the detection image. In one embodiment, a light source can be disposed on the side of the substrate 100 away from the filter layer 300, such as... Figure 1 As shown, the light from the light source passes through the substrate 100, the light-emitting functional layer 200 and the filter layer 300 in sequence, and the array substrate is photographed on the side of the filter layer 300 away from the substrate 100 to obtain the detection image.

[0133] Along the first direction X, if a filter structure 310 exists in a portion of the area between two adjacent first shading light rays OL1, and a filter structure 310 does not exist in a portion of the area, that is, along the first direction X, there is a color of part of the filter structure 310 and a color of part of the light source (usually white light) between two adjacent first shading light rays OL1, it may be that the size of part of the filter structure 310 in the first direction X is abnormally small, and the filter structure 310 does not completely cover the sub-pixel setting area between the two adjacent first shading light rays OL1, or it may be that the size of part of the filter structure 310 in the first direction X is abnormally large, and the filter structure 310 extends to other sub-pixel setting areas arranged along the first direction X, causing its first edge S1 and / or second edge S2 to not be located within the outline of the first shading light OL1, it should be judged that the alignment of the filter structure 310 is abnormal.

[0134] If the outline of the first light-shielding light OL1 is different from its outline when it was first prepared, for example, the outline of the first light-shielding light OL1 is straight when it was first prepared, and the outline of the first light-shielding light OL1 changes after the filter structure 310 is formed, there is an abnormal protrusion along the first direction X in a local area of ​​the first light-shielding light OL1. This abnormal protrusion is opaque and is a black area. It is possible that the size of some filter structures 310 in the first direction X is abnormally large. The orthographic projection of the filter structure 310 on the plane where the substrate 100 is located overlaps with the orthographic projection of multiple sub-pixels P arranged along the first direction X on the plane where the substrate 100 is located, and overlaps with the filter structures 310 in other sub-pixel setting areas to form a black opaque area. At this time, the first edge S1 and / or the second edge S2 are not located within the outline of the first light-shielding light OL1, and the alignment of the filter structure 310 should also be judged as abnormal.

[0135] The array substrate provided in this embodiment of the invention utilizes DGLD technology to electrically connect at least a portion of the data signal lines to the sub-pixels of two pixel columns. This reduces the number of conductive lines in the display area, which helps to reduce interference from conductive lines on the detection of alignment anomalies in the filter structure. It also improves the situation where the detection image is prone to ghosting due to the close proximity of two conductive lines. By setting multiple first shielding lines arranged along a first direction and extending in a second direction on the side of the filter layer near the substrate, the alignment anomalies of the filter structure can be detected using the first shielding lines as a reference. The orthographic projection of the data signal lines on the plane of the substrate overlaps with the orthographic projection of the first shielding lines on the plane of the substrate, which helps to improve detection accuracy and avoid misjudgment of the detection results of alignment anomalies in the filter structure caused by the data signal lines. In addition, by setting the first edge and the second edge of the filter structure to be orthographically aligned with the plane of the substrate, the alignment anomalies of the filter structure can be detected. The projection of the first shielding light onto the plane of the substrate overlaps with the projection of the first shielding light onto the plane of the substrate. This allows for the determination of misalignment of the filter structure when the projections of the first edge or the second edge onto the plane of the substrate do not overlap. Thus, when detecting misalignment of the filter structure, it is sufficient to identify whether there is an abnormal protrusion along the first direction in the outline of the projection of the first shielding light onto the plane of the substrate, or whether there is a gap between the projections of the first edge or the second edge onto the plane of the substrate and the projection of the first shielding light onto the plane of the substrate. This eliminates the need to precisely measure the distance between the edge of the filter structure and the first shielding light in the first direction using the first shielding light as a reference, and also eliminates the need for precise focusing during the detection process. This enables accurate detection of the filter structure in the display area, simplifying the detection method and improving detection efficiency and accuracy.

[0136] It should be noted that the array substrate provided in the embodiments of the present invention can be an intermediate product in the manufacturing process, such as an array substrate in which only part of the filter structure 310 has been fabricated; or, the array substrate provided in the embodiments of the present invention can also be a semi-finished product or a finished product in the manufacturing process, such as an array substrate in which all filter structures 310 have been fabricated and the surface processing of the filter structures 310 has been completed. The embodiments of the present invention do not limit the degree of completion of the array substrate.

[0137] Optional, continue to refer to Figure 2 Along the first direction X, the colors of adjacent filter structures 310 are different.

[0138] Specifically, when the array substrate displays light emission, the sub-pixels P arranged adjacent to each other along the first direction X present different colors. A first light shielding light OL1 is set between the sub-pixels P of different colors arranged along the first direction X. The first light shielding light OL1 can detect whether the filter structure 310 located on the light-emitting side of the sub-pixel P has a positional shift along the first direction X.

[0139] For example, refer to Figure 2 The filter structure 310 includes a red filter structure 311, a green filter structure 312, and a blue filter structure 313. Along the first direction X, adjacent filter structures 310 have different colors. When the filter structure 310 has a positional offset along the first direction X, it is possible to quickly detect whether the first edge S1 and / or the second edge S2 of the filter structure 310 has a positional offset along the first direction X by detecting whether there is a gap between the filter structure 310 and the first shading light OL or whether there is an abnormal black protrusion in the outline of the first shading light OL.

[0140] In an alternative embodiment, Figure 3 This is a top view schematic diagram of an array substrate provided in an embodiment of the present invention. Figure 2 The orthographic projection of the same filter structure 310 onto the plane of the substrate 100 can cover the orthographic projection of multiple sub-pixels P arranged along the second direction Y onto the plane of the substrate 100.

[0141] For example, adjacent filter structures 310 arranged along the first direction X have different colors, while adjacent filter structures 310 arranged along the second direction Y have the same color. In this case, the size of the filter structure 310 in the second direction can be increased so that its orthographic projection on the plane of the substrate 100 can cover the orthographic projection of the multiple sub-pixels P arranged along the second direction Y on the plane of the substrate 100. In this way, filter structures 310 of the same color arranged along the second direction Y can be set as a single structure, which can reduce the difficulty of the process, especially the processing difficulty of the filter layer 300 of the high-resolution array substrate 001, which is beneficial to simplify the manufacturing process and improve the product yield.

[0142] Based on the above embodiments, refer to Figure 2 and Figure 3 Along the second direction Y, the length of the first shading light OL1 is greater than the length of the filter structure 310.

[0143] For example, when adjacent filter structures 310 arranged along the first direction X overlap and the overlap area is large, causing an abnormal protrusion in the outline of the first shading light OL1 in the detection image along the first direction X, the length of the first shading light OL1 in the second direction Y can be greater than the length of the abnormally protruding part in the second direction Y. In this way, when the outline of the first shading light OL1 in the detection image has an abnormal protrusion, the visual detection system can quickly detect the misalignment at the position because the size of the abnormally protruding part in the first direction X is greater than the size of other parts of the first shading light OL1 in the first direction X, which is beneficial to improving detection efficiency and detection accuracy.

[0144] In an alternative embodiment, reference continues. Figure 2 and Figure 3 The orthographic projection of the filter structure 310 onto the plane of the substrate 100 overlaps only with the orthographic projections of the two first shielding rays OL1 arranged adjacent to each other along the first direction X onto the plane of the substrate 100.

[0145] Specifically, the orthographic projection of the same filter structure 310 onto the plane of the substrate 100 only overlaps with the orthographic projections of the two first shielding rays OL1 adjacent to each other along the first direction X onto the plane of the substrate 100, and does not overlap with the orthographic projection of the third first shielding ray OL1 onto the plane of the substrate 100. This can prevent the number of first shielding rays OL1 from being too large and interfering with the alignment anomaly detection of the filter structure 310.

[0146] Based on the above embodiments, the orthographic projection of the first shielding light OL1 on the plane of the substrate 100 overlaps with the orthographic projection of the first edge S1 and / or the second edge S2 on the plane of the substrate 100. In one embodiment, the orthographic projection of all the first shielding light OL1 on the plane of the substrate 100 overlaps with the orthographic projection of the first edge S1 and / or the second edge S2 of the filter structure 310 on the plane of the substrate 100. There is no situation where the orthographic projection of the first shielding light OL1 on the plane of the substrate 100 does not overlap with the orthographic projection of the first edge S1 on the plane of the substrate 100, nor does it overlap with the orthographic projection of the second edge S2 on the plane of the substrate 100.

[0147] In yet another alternative embodiment, reference continues to... Figure 2 and Figure 3 Between the orthographic projections of two adjacent pixel columns arranged along the first direction X onto the plane where the substrate 100 is located, there is one and only one orthographic projection of a first shading light OL1 onto the plane where the substrate 100 is located; in other words, between the orthographic projections of two adjacent first shading light OL1 arranged along the first direction X onto the plane where the substrate 100 is located, there is one and only one orthographic projection of a pixel column onto the plane where the substrate 100 is located.

[0148] For example, the orthographic projection of any two first shading rays OL1 arranged adjacent to each other along the first direction X onto the plane of the substrate 100 can define the area where the pixel column is located. And the area between the first shading rays OL1 arranged adjacent to each other along the first direction X has one and only one pixel column. That is, the area between two first shading rays OL1 arranged adjacent to each other along the first direction X must have a pixel column and only one pixel column. There will not be two first shading rays OL1 orthographic projections onto the plane of the substrate 100 between the two pixel columns arranged adjacent to each other along the first direction X. This is beneficial for detecting misalignment of the filter structure 310 and avoids setting multiple first shading rays OL1 in the area between two sub-pixels P arranged adjacent to each other along the first direction X, which would cause ghosting and blurring and interfere with detection.

[0149] Based on this, the orthographic projection of the filter structure 310 onto the plane of the substrate 100 can only overlap with the orthographic projection of the sub-pixel P in one pixel column defined by the area between the adjacent first shielding light OL1, and will not overlap with the orthographic projection of the sub-pixel P in two pixel columns onto the plane of the substrate 100 at the same time. This ensures that adjacent sub-pixels P arranged along the first direction X are not covered by the same filter structure 310. Thus, during display, adjacent sub-pixels P arranged along the first direction X can present different colors, which is beneficial to improving the display effect.

[0150] As described above, the alignment anomaly detection of the filter structure 310 relies on multiple first shielding light lines OL1 arranged along the first direction X and extending along the second direction Y. Similarly, the orthographic projections of multiple data signal lines DL arranged along the first direction X and extending along the second direction Y onto the plane of the substrate 100 need to overlap with the orthographic projections of the first shielding light lines OL1 onto the plane of the substrate 100 to avoid interference from the data signal lines DL with the alignment anomaly detection of the filter structure 310. However, the display area AA of the array substrate 001 is not only provided with data signal lines DL. In addition to data signal lines DL, other signal lines are also provided. These other signal lines may also interfere with the alignment anomaly detection of the filter structure 310, especially other signal lines arranged along the first direction X and extending along the second direction Y. Therefore, this embodiment of the invention provides various implementation methods to improve the situation where other signal lines may interfere with the alignment anomaly detection of the filter structure 310.

[0151] In one embodiment, only the data signal line DL can be arranged along the first direction X and extended along the second direction Y, while other signal lines can be arranged along the second direction Y and extended along the first direction X. For example, scan signal lines, power signal lines, reference signal lines, etc., can all extend along the first direction X. Figures 1-3 (Not shown in the image). This reduces the number of signal traces extending along the second direction Y, thereby avoiding excessive interference from signal traces extending along the second direction Y with the alignment anomaly detection of the filter structure 310.

[0152] In another embodiment, the orthographic projection of other signal traces arranged along the first direction X and extending along the second direction Y onto the plane where the substrate 100 is located may also overlap with the orthographic projection of the first shielding light OL1 onto the plane where the substrate 100 is located. For example, the display area AA is further provided with power signal lines and / or reference signal lines arranged along the first direction X and extending along the second direction Y, and the orthographic projection of the power signal lines and / or reference signal lines onto the plane where the substrate 100 is located overlaps with the orthographic projection of the first shielding light OL1 onto the plane where the substrate 100 is located. Figures 1-3(Not shown in the image) This reduces interference from power signal lines and / or reference signal lines to the alignment anomaly detection of the filter structure 310. Furthermore, at least some power signal lines and / or reference signal lines can be electrically connected to sub-pixels P of multiple pixel columns, reducing the number of power signal lines and / or reference signal lines in the display area AA, further reducing interference and improving detection efficiency and accuracy.

[0153] In another embodiment, at least a portion of the signal traces extending along the second direction Y, excluding the data signal line DL, may be configured as transparent traces. Figure 4 This is a schematic diagram of the film structure of an array substrate provided in an embodiment of the present invention. Figure 2 , Figure 5 This is a top view schematic diagram of an array substrate provided in an embodiment of the present invention. Figure 3 ,refer to Figure 4 and Figure 5 The light-emitting functional layer 200 also includes multiple first signal lines TL1 arranged along the first direction X and extending along the second direction Y, and the first signal lines TL1 are transparent traces.

[0154] The first signal line TL1 includes, but is not limited to, power signal line PVDD, reset signal line VREF, and other signal lines.

[0155] Specifically, the first signal line TL1 is a transparent trace. The transparent first signal line TL1 has little impact on the detection image and will hardly interfere with the visual detection system's identification of alignment anomalies in the filter structure 310. By setting the first signal line TL1, which is arranged along the first direction X and extends along the second direction Y, as a transparent trace, the interference of the first signal line TL1 extending along the second direction Y on the detection of alignment anomalies in the filter structure 310 can be reduced.

[0156] It is understood that the first signal line TL1 is a transparent trace with good light transmittance, which hardly affects the detection of alignment anomalies of the filter structure 310. Therefore, the orthographic projection of the first signal line TL1 on the plane of the substrate 100 and the orthographic projection of the first shielding light OL1 on the plane of the substrate 100 may or may not overlap. The embodiment of the present invention does not limit the position of the first signal line TL1.

[0157] Optional, Figure 6 This is a top view schematic diagram of an array substrate provided in an embodiment of the present invention. Figure 4 , Figure 7 This is a top view schematic diagram of an array substrate provided in an embodiment of the present invention. Figure 5 ,refer to Figure 6 and Figure 7 The data signal line DL is multiplexed as the first shielding line OL1.

[0158] For example, taking the case where all data signal lines DL are electrically connected to sub-pixels P in two pixel columns, and the orthographic projections of the two pixel columns electrically connected to the same data signal line DL onto the plane of the substrate 100 are respectively located on opposite sides of the orthographic projection of the data signal line DL onto the plane of the substrate 100, refer to... Figure 6 and Figure 7 The i-th data signal line DL, arranged along the first direction X, can be electrically connected to the sub-pixels P in the 2×i-1 pixel column and the 2×i pixel column. The orthographic projection of the i-th data signal line DL along the first direction X onto the plane of the substrate 100 lies between the orthographic projections of the 2×i-1 pixel column and the 2×i pixel column onto the plane of the substrate 100. Similarly, the orthographic projection of the 2×i first shielding light line OL1 arranged along the first direction X onto the plane of the substrate 100 also lies between the orthographic projections of the 2×i-1 pixel column and the 2×i pixel column onto the plane of the substrate 100. The 2×i first shielding light line OL1 arranged along the first direction X can be configured to multiplex the data signal line DL, where i is a positive integer. By multiplexing the data signal line DL into the first shielding light line OL, it is beneficial to reduce the number of traces in the display area AA, thereby reducing the number of film layers, simplifying the process, and lowering the manufacturing cost.

[0159] It is understood that in other embodiments, the orthographic projections of two pixel columns electrically connected by the same data signal line DL onto the plane of the substrate 100 can also be located on the same side of the orthographic projection of the data signal line DL onto the plane of the substrate 100. For example, the i-th data signal line DL arranged along the first direction X can be electrically connected to the sub-pixel P in the 2×i-1 pixel column and the 2×i pixel column, and the orthographic projection of the i-th data signal line DL arranged along the first direction X onto the plane of the substrate 100 can be located between the orthographic projections of the 2×i-1+m pixel column and the 2×i+m pixel column onto the plane of the substrate 100. In this case, the 2×i+m first shielding light OL1 multiplexed data signal line DL arranged along the first direction X can be set, where i is a positive integer and m is a non-zero integer.

[0160] In other embodiments, the two pixel columns electrically connected by the same data signal line DL may not be adjacent. For example, the i-th data signal line DL arranged along the first direction X can be electrically connected to the sub-pixel P in the 2×i-1+r and 2×i+k pixel columns, and the orth projection of the i-th data signal line DL arranged along the first direction X onto the plane of the substrate 100 can be located between the orth projections of the 2×i-1+n and 2×i+n pixel columns onto the plane of the substrate 100. In this case, the 2×i+n first shielding light OL1 multiplexed data signal line DL arranged along the first direction X can be set, where r and k are different integers, and n is an integer.

[0161] It should be noted that, Figure 6 and Figure 7 The different filling patterns of the first shielding light OL1 of the multiplexed data signal line DL and the first shielding light OL1 of the non-multiplexed data signal line DL are only to represent different structures and are not limited to differences in film layer position and / or material. In one embodiment, the first shielding light OL1 of the non-multiplexed data signal line DL can be disposed on a different film layer than the data signal line DL, i.e., on a different film layer than the first shielding light OL1 of the multiplexed data signal line DL; or, the first shielding light OL1 of the non-multiplexed data signal line DL can also be disposed on the same film layer as the data signal line DL and formed in the same process. In one embodiment, the first shielding light OL1 of the non-multiplexed data signal line DL is disposed on the same layer as the data signal line DL, but is not electrically connected to the sub-pixel P.

[0162] As described above, at least some data signal lines DL are electrically connected to the sub-pixels P of two pixel columns, and the number of data signal lines DL is less than the number of pixel columns. Along the first direction X, each pixel column has a first shielding light OL1 on both sides, and the area between two adjacent pixel columns also has a first shielding light OL1. The number of first shielding light OL1 is greater than the number of pixel columns; therefore, the number of first shielding light OL1 is greater than the number of data signal lines DL. In one embodiment, all data signal lines DL are multiplexed as first shielding light OL1, meaning that some first shielding light OL1 can multiplex data signal lines DL. However, some first shielding light OL1 may not multiplex data signal lines DL. The first shielding light OL1 that does not multiplex data signal lines DL may not multiplex any signal traces, or it may multiplex other signal traces extending along the second direction Y besides the data signal lines DL.

[0163] In an alternative embodiment, reference continues. Figure 6 and Figure 7 The array substrate 001 also includes a power signal line PVDD and a reset signal line VREF. The power signal line PVDD is multiplexed as a first shielding light OL1, and / or the reset signal line VREF is multiplexed as a first shielding light OL1.

[0164] For example, in one embodiment, the first shielding light OL1 multiplexes the data signal line DL and the power signal line PVDD, that is, it uses the data signal line DL and the power signal line PVDD in the array substrate 001 as the first shielding light OL1, such as... Figure 6 As shown, at this time, the reset signal line VREF can be set to extend along the first direction X or set to a transparent trace. Figure 6(not shown in the image). In another embodiment, the first shielding light OL1 multiplexes the data signal line DL and the reset signal line VREF, that is, it uses the data signal line DL and the reset signal line VREF in the array substrate 001 as the first shielding light OL1, such as... Figure 7 As shown, at this time, the power signal line PVDD can be set to extend along the first direction X or set to a transparent trace. Figure 7 (Not shown in the image). By multiplexing the power signal line PVDD and / or the reset signal line VREF as the first shielding line OL1, the first shielding line OL1 of the unmultiplexed data signal line DL can be multiplexed with the power signal line PVDD and / or the reset signal line VREF. Thus, there is no need to prepare the first shielding line OL1 separately, which simplifies the process, reduces the number of film layers, and lowers the preparation cost.

[0165] Understandable, Figure 6 The different filling patterns of the data signal line DL, which is multiplexed as the first shielding light OL1, and the power signal line PVDD, which is multiplexed as the first shielding light OL1, are only to indicate different structures and are not used to limit the different film layer positions and / or materials of the two. Figure 7 The different filling patterns of the data signal line DL, which is multiplexed as the first shielding light OL1, and the reset signal line VREF, which is also multiplexed as the first shielding light OL1, are only to indicate different structures and are not used to limit the different film layer positions and / or materials of the two.

[0166] Based on the above embodiments, continue to refer to Figure 6 and Figure 7 Along the first direction X, the power signal line PVDD is located between two adjacent data signal lines DL, and / or the reset signal line VREF is located between two adjacent data signal lines DL.

[0167] Specifically, along the first direction X, the orthographic projection of the power signal line PVDD, which is multiplexed as the first shielding light OL1, onto the plane where the substrate 100 is located is between the orthographic projections of the two adjacent data signal lines DL onto the plane where the substrate 100 is located, and / or, the orthographic projection of the reset signal line VREF, which is multiplexed as the first shielding light OL1, onto the plane where the substrate 100 is located is between the orthographic projections of the two adjacent data signal lines DL onto the plane where the substrate 100 is located.

[0168] For example, if along the first direction X, the 2×i first shielding line OL1 multiplexes the data signal line DL, then the 2×i-1 first shielding line OL1 can multiplex the power signal line PVDD or the reset signal line VREF, as shown below. Figure 6 and Figure 7As shown, the multiple first shielding lines OL1 arranged sequentially along the first direction X can be PVDD-DL-PVDD-DL-··· or VREF-DL-VREF-DL-···; if the 2×i-1th first shielding line OL1 multiplexes the data signal line DL along the first direction X, then the 2×ith first shielding line OL1 can multiplex the power signal line PVDD or the reset signal line VREF. The multiple first shielding lines OL1 arranged sequentially along the first direction X can also be DL-PVDD-DL-PVDD-··· or DL-VREF-DL-VREF-···; where i is a positive integer.

[0169] Based on the above embodiments, Figure 8 This is a top view schematic diagram of an array substrate provided in an embodiment of the present invention. Figure 6 When both the power signal line PVDD and the reset signal line VREF are multiplexed as the first shielding line OL1, the power signal line PVDD and the reset signal line VREF are arranged alternately along the first direction X.

[0170] For example, if along the first direction X, the 2×i first shielding light OL1 multiplexes the data signal line DL, then the 2×i-1 first shielding light OL1 multiplexes the power signal line PVDD, and the 2×i+1 first shielding light OL1 multiplexes the reset signal line VREF, as shown. Figure 8 As shown, the multiple first shielding lines OL1 arranged sequentially along the first direction X can be PVDD-DL-VREF-DL-PVDD-DL-VREF-DL-···; or, when the 2×i first shielding line OL1 multiplexes the data signal line DL, the 2×i-1 first shielding line OL1 multiplexes the reset signal line VREF, and the 2×i+ first shielding line OL1 multiplexes the power signal line PVDD. The multiple first shielding lines OL1 arranged sequentially along the first direction X can also be VREF-DL-PVDD-DL-VREF-DL-PVDD-DL-···.

[0171] In other alternative embodiments, when the 2×i-1th first shielding line OL1 multiplexes the data signal line DL along the first direction X, the multiple first shielding lines OL1 arranged sequentially along the first direction X can also be DL-PVDD-DL-VREF-DL-PVDD-DL-VREF-··· or DL-VREF-DL-PVDD-DL-VREF-DL-PVDD-···.

[0172] Optional, Figure 9 This is a top view schematic diagram of an array substrate provided in an embodiment of the present invention. Figure 7 ,refer to Figure 9The array substrate 001 includes multiple pixel units PU located in the display area AA and arranged in an array; the pixel unit PU includes a first color sub-pixel P01, a second color sub-pixel P02, a third color sub-pixel P03 and a fourth color sub-pixel P04 arranged along the first direction X; in the same pixel unit PU, data signal lines DL are provided between the first color sub-pixel P01 and the second color sub-pixel P02 and between the third color sub-pixel P03 and the fourth color sub-pixel P04.

[0173] In this embodiment of the invention, the first color, second color, third color, and fourth color are not limited. In one embodiment, the first color, second color, third color, and fourth color can all be different colors, that is, any two colors are different. In another embodiment, the first color, second color, third color, and fourth color may contain the same color. For example, the pixel unit PU may include R, G, B, and G sub-pixels. In yet another embodiment, the first color, second color, third color, and fourth color may include white. For example, the pixel unit PU may include R, G, B, and W sub-pixels, and the fourth color is white. The filter structure 310 above the fourth color sub-pixel P04 needs to be able to transmit white light. The filter structure 310 may not be provided above the fourth color sub-pixel P04. Alternatively, after the filter structures 310 of all other colors are prepared, when a planarization layer is prepared on the side of the filter layer 300 away from the substrate 100, part of the planarization layer can fill the recessed area above the fourth color sub-pixel P04 as a white filter structure.

[0174] For example, the data signal line DL located between the first color sub-pixel P01 and the second color sub-pixel P02 is electrically connected to its adjacent first color sub-pixel P01 and second color sub-pixel P02, and the data signal line DL located between the third color sub-pixel P03 and the fourth color sub-pixel P04 is electrically connected to its adjacent third color sub-pixel P03 and fourth color sub-pixel P04. By setting the data signal line DL between the first color sub-pixel P01 and the second color sub-pixel P02 and between the third color sub-pixel P03 and the fourth color sub-pixel P04, the distance between each sub-pixel P in the pixel unit PU and its electrically connected data signal line DL is relatively close and the distance is the same, which helps to reduce the transmission impedance of the data signal and improve the display uniformity.

[0175] Continue to refer to Figure 9The pixel units PU array is arranged, and the first color sub-pixel P01, the second color sub-pixel P02, the third color sub-pixel P03 and the fourth color sub-pixel P04 in the pixel unit PU are arranged sequentially along the first direction X. The sub-pixels P in the same pixel column can present the same color when displayed. In an optional embodiment, a power signal line PVDD or a reset signal line VREF is provided between the second color sub-pixel P02 and the third color sub-pixel P03, and a reset signal line VREF or a power signal line PVDD is provided between the fourth color sub-pixel P04 and the first color sub-pixel P01. This ensures that the distance between each color sub-pixel P and the fixed potential signal line (power signal line PVDD or reset signal line VREF) is the same. That is, the distances of each color sub-pixel P in the same pixel unit PU from the same fixed potential signal line (power signal line PVDD or reset signal line VREF) are respectively equal, which is beneficial for improving the display uniformity of different pixel units PU. Furthermore, based on the transmission impedance of the fixed potential signal, the same data signal compensation can be provided to sub-pixels P of the same color, and different data signal compensation can be provided to at least some sub-pixels P of different colors. This improves the display deviation caused by the different distances between different color sub-pixels P and the fixed potential signal line (power signal line PVDD or reset signal line VREF), which is beneficial for accurate image display and improved color reproduction.

[0176] Based on the above embodiments, Figure 10 This is a top view schematic diagram of an array substrate provided in an embodiment of the present invention. Figure 8 ,refer to Figure 10 The pixel unit PU includes a first color sub-pixel P01, a second color sub-pixel P02, a third color sub-pixel P03, and a fourth color sub-pixel P04 arranged along the first direction X. Data signal lines DL are provided between the first color sub-pixel P01 and the second color sub-pixel P02, and between the third color sub-pixel P03 and the fourth color sub-pixel P04. A reset signal line VREF is provided between the second color sub-pixel P02 and the third color sub-pixel P03, and a power signal line PVDD is provided between the fourth color sub-pixel P04 and the first color sub-pixel P01. The array substrate 001 also includes a first auxiliary power line PV1 and a second auxiliary power line PV2 arranged along the second direction Y and extending along the first direction X. The first auxiliary power line PV1 and the second auxiliary power line PV2 are located on opposite sides of the data signal line DL and the reset signal line VREF. Along the second direction Y, the length of the power signal line PVDD is greater than the length of the reset signal line VREF, and both ends of the power signal line PVDD can be electrically connected to the first auxiliary power line PV1 and the second auxiliary power line PV2, respectively.

[0177] In this way, the power signal lines PVDD at different locations can be electrically connected to each other through the first auxiliary power line PV1 and the second auxiliary power line PV2, which helps to reduce the voltage difference between the power signal lines PVDD at different locations, reduce the transmission voltage drop, and improve the display uniformity. In addition, the power signal lines PVDD located between pixel units PU have a longer length in the second direction Y and are electrically connected to the first auxiliary power line PV1 and the second auxiliary power line PV2 extending along the first direction X, which is beneficial for feature extraction during visual recognition and makes it easier to locate. The visual inspection system can quickly identify the power signal lines PVDD and the pixel units PU located between two adjacent power signal lines PVDD, so that it can quickly determine whether the color of the filter structure 310 in the setting area of ​​each sub-pixel PU in the pixel unit PU is accurate, which helps to improve detection efficiency and detection accuracy, and avoids the overall misalignment of the filter structure 310, such as avoiding the red filter structure 311 being set above the green sub-pixel and failing to be detected in time.

[0178] In one implementation, continue to refer to Figure 10 The power signal line PVDD, the first auxiliary power line PV1, and the second auxiliary power line PV2 can be arranged on the same layer as an integrated structure. Based on this, the data signal line DL and the reset signal line VREF, multiplexed as the first shielding light line OL1, can be arranged on different film layers than the power signal line PVDD; alternatively, the data signal line DL and the reset signal line VREF, multiplexed as the first shielding light line OL1, can also be arranged on the same film layer as the power signal line PVDD. To avoid short circuits with the power signal line PVDD, the end of the data signal line DL near the fan-out trace can be electrically connected to the fan-out trace through a conductive structure overlapping other film layers. The reset signal line VREF can also be electrically connected to each other through conductive structures overlapping other film layers, or electrically connected to the pad. Figure 10 (Not shown in the image).

[0179] To facilitate feature extraction and better localization during visual recognition by the visual inspection system, this embodiment of the invention also proposes an array substrate, optionally... Figure 11 This is a top view schematic diagram of an array substrate provided in an embodiment of the present invention. Figure 9 ,refer to Figure 11 The first shading light OL1 includes a first sub-line OL1_10 and a second sub-line OL1_20; along the first direction X, the length of the first sub-line OL1_10 is greater than the length of the second sub-line OL1_20.

[0180] Wherein, the first sub-line OL1_10 can be any first shading light OL1, and the second sub-line OL1_20 can be any first shading light OL1 other than the first sub-line OL1_10. The first sub-line OL1_10 and the second sub-line OL1_20 can be set on the same layer or on different layers, and the embodiments of the present invention do not limit this.

[0181] For example, the filter structure 310 includes a red filter structure 311, a green filter structure 312, and a blue filter structure 313. The area of ​​the green filter structure 312 is smaller than that of the red filter structure 311, and the area of ​​the green filter structure 312 is also smaller than that of the blue filter structure 313. The orthographic projection of the green filter structure 312 onto the plane of the substrate 100 overlaps with the orthographic projection of the green sub-pixel onto the plane of the substrate 100. Since the green sub-pixel has a higher luminous efficiency, the area of ​​the green sub-pixel and the area of ​​the green filter structure 312 can be set to be smaller. The smaller area of ​​the green filter structure 312 makes it more difficult to manufacture and more prone to misalignment. In one embodiment, the orthographic projection of the first sub-line OL1_10 onto the plane of the substrate 100 may overlap with the orthographic projection of the green filter structure 312 onto the plane of the substrate 100, while the orthographic projection of the second sub-line OL1_20 onto the plane of the substrate 100 may not overlap with the orthographic projection of the green filter structure 312 onto the plane of the substrate 100; or, the orthographic projection of the first sub-line OL1_10 onto the plane of the substrate 100 may not overlap with the orthographic projection of the green filter structure 312 onto the plane of the substrate 100, while the orthographic projection of the second sub-line OL1_20 onto the plane of the substrate 100 may overlap with the orthographic projection of the green filter structure 312 onto the plane of the substrate 100. By setting the lengths of the first sub-line OL1_10 and the second sub-line OL1_20 in the first direction X to be different, the first sub-line OL1_10 and the second sub-line OL1_20 can be quickly identified based on the size characteristics of the first shielding light OL1. Thus, the position of the green filter structure 312 can be quickly identified based on the first sub-line OL1_10 and the second sub-line OL1_20. On the one hand, this is beneficial for quickly detecting misalignment of the green filter structure 312. On the other hand, it can also quickly determine whether the colors of the red filter structure 311 and the blue filter structure 313 adjacent to the green filter structure 312 are accurate based on the position of the green filter structure 312, which is beneficial for improving detection efficiency and detection accuracy.

[0182] In an alternative embodiment, Figure 12 This is a top view schematic diagram of an array substrate provided in an embodiment of the present invention. Figure 10 ,refer to Figure 12The array substrate 001 includes multiple pixel units (PUs) arranged in an array in the display area AA; each pixel unit (PU) includes multiple sub-pixels (Ps) arranged along a first direction; the orthographic projection of the first sub-line OL1_10 onto the plane of the substrate 100 is located between the orthographic projections of adjacent pixel units (PUs) along the first direction X onto the plane of the substrate 100; and the orthographic projection of the second sub-line OL1_20 onto the plane of the substrate 100 overlaps with the orthographic projection of the pixel units (PUs) onto the plane of the substrate 100.

[0183] Specifically, the first shading light OL1 set in the region between adjacent pixel units PU along the first direction X is the first sub-line OL1_10. The first sub-line OL1_10 has a large size in the first direction X, which is beneficial for feature extraction and better positioning during visual recognition. The visual inspection system can quickly identify the first sub-line OL1_10 and the pixel units PU set adjacent to the first sub-line OL1_10. Therefore, it can quickly determine whether the color of the filter structure 310 in the setting area of ​​each sub-pixel PU in the pixel unit PU is accurate, which is beneficial to improving detection efficiency and detection accuracy and avoiding overall misalignment of the filter structure 310.

[0184] In another alternative embodiment, reference continues... Figure 12 The first sub-line OL1_10 is multiplexed as a power signal line PVDD; at least a portion of the second sub-line OL1_20 is multiplexed as a data signal line DL. Multiplexing the first sub-line OL1_10, which has a larger size in the first direction X, as a power signal line PVDD helps to reduce the impedance of the power signal line PVDD and reduce the transmission voltage drop.

[0185] For example, a pixel unit PU includes three sub-pixels P arranged along a first direction. A first shading light OL1 disposed in the region between adjacent pixel units PU along the first direction X can be a first sub-line OL1_10, which can be multiplexed as a power signal line PVDD. The first shading light OL1 not disposed in the region between adjacent pixel units PU along the first direction X can be a second sub-line OL1_20, which can be multiplexed as a data signal line DL. Part of the data signal line DL can be electrically connected to sub-pixels P of two pixel columns, and part of the data signal line can be electrically connected to sub-pixels P of one pixel column. Based on this, a reset signal line VREF can be configured to extend along the first direction X; or, the reset signal line VREF can be configured as a transparent trace extending along the second direction Y; or, the reset signal line VREF can be configured to extend along the second direction Y, with the orthographic projection of the reset signal line VREF onto the plane of the substrate 100 overlapping the orthographic projection of the first shading light OL1 onto the plane of the substrate 100.

[0186] In yet another alternative embodiment, Figure 13 This is a top view schematic diagram of an array substrate provided in an embodiment of the present invention. Figure 10 one, Figure 14 yes Figure 13 Magnified view of a local area LA in the middle Figure 1 ,refer to Figure 13 and Figure 14 The array substrate 001 includes multiple pixel units PU located in the display area AA and arranged in an array; the pixel unit PU includes a first color sub-pixel P01, a second color sub-pixel P02, a third color sub-pixel P03 and a fourth color sub-pixel P04 arranged along a first direction.

[0187] The orthographic projection of the first sub-line OL1_10 onto the plane of substrate 100 lies between the orthographic projection of the first color sub-pixel P01 onto the plane of substrate 100 and the orthographic projection of the fourth color sub-pixel P04 onto the plane of substrate 100; the second sub-line OL1_20 includes a first trace OL1_21, a second trace OL1_22, and a third trace OL1_23. The orthographic projection of the first trace OL1_21 onto the plane of substrate 100 lies between the orthographic projection of the first color sub-pixel P01 onto the plane of substrate 100 and the orthographic projection of the fourth color sub-pixel P04 onto the plane of substrate 100. The orthographic projection of sub-pixel P02 onto the plane of substrate 100 is between the orthographic projections of the second trace OL1_22 onto the plane of substrate 100 and the orthographic projections of the second color sub-pixel P02 onto the plane of substrate 100 and the third color sub-pixel P03 onto the plane of substrate 100. The orthographic projection of the third trace OL1_23 onto the plane of substrate 100 is between the orthographic projections of the third color sub-pixel P03 onto the plane of substrate 100 and the fourth color sub-pixel P04 onto the plane of substrate 100.

[0188] Among them, the first sub-line OL1_10 is multiplexed as the power signal line PVDD; the first trace OL1_21 and the third trace OL1_23 in the second sub-line OL1_20 are multiplexed as the data signal line DL, and the second trace OL1_22 is multiplexed as the reset signal line VREF.

[0189] For example, in the same pixel unit PU, the first color sub-pixel P01 and the second sub-pixel P02 can be electrically connected to the first trace OL1_21 multiplexed as a data signal line DL, and the third color sub-pixel P03 and the fourth sub-pixel P04 can be electrically connected to the third trace OL1_23 multiplexed as a data signal line DL; the first color sub-pixel P01, the second color sub-pixel P02, the third color sub-pixel P03 and the fourth color sub-pixel P04 in the same pixel unit PU can also be electrically connected to the same second trace OL1_22 multiplexed as a reset signal line VREF; the first color sub-pixel P01 and the second color sub-pixel P02 in the same pixel unit PU can be electrically connected to the first sub-line OL1_10 multiplexed as a power signal line PVDD near the first color sub-pixel P01, and the third color sub-pixel P03 and the fourth color sub-pixel P04 can be electrically connected to the first sub-line OL1_10 multiplexed as a power signal line PVDD near the fourth color sub-pixel P04. By multiplexing the first sub-line OL1_10 as the power signal line PVDD, multiplexing part of the second sub-line OL1_20 (first trace OL1_21 and third trace OL1_23) as the data signal line DL, and multiplexing part of the second sub-line OL1_20 (second trace OL1_22) as the reset signal line VREF, it is no longer necessary to set up a separate reset signal line VREF. This helps to reduce the number of film layers, simplify the process, and reduce the preparation cost.

[0190] Based on the above embodiment, the color of the sub-pixel P that is adjacent to the first sub-line OL1_10 in the pixel unit PU is white.

[0191] For example, refer to Figure 13 and Figure 14 The first color sub-pixel P01 is a white sub-pixel; or, the fourth color sub-pixel P04 is a white sub-pixel, which allows the larger first sub-line OL1_10 along the first direction X to be set adjacent to the white sub-pixel. The white sub-pixel may not have a filter structure 310 or may have a transparent filter structure 310. After the display area AA of the array substrate 001 is captured by the vision inspection system and the detection image is obtained, the position of the larger first sub-line OL1_10 along the first direction X in the detection image can be intuitively obtained and identified, which is beneficial for feature recognition and better positioning.

[0192] Based on the above embodiments, continue to refer to Figure 13 and Figure 14 Along the first direction X, the length of the second trace OL1_22 is greater than the length of the first trace OL1_21, and the length of the second trace OL1_22 is greater than the length of the third trace OL1_23.

[0193] For example, the dimension of the second trace OL1_22, multiplexed as a reset signal line VREF, in the first direction X is larger than the dimensions of the first trace OL1_21 and the third trace OL1_23, multiplexed as data signal lines DL, in the first direction X. The reset signal line VREF is typically used to transmit a fixed-potential signal. Increasing the dimension of the second trace OL1_22, multiplexed as a reset signal line VREF, in the first direction X helps to reduce the impedance of the reset signal line VREF and decrease the transmission voltage drop. Furthermore, the difference in dimension between the second trace OL1_22, multiplexed as a reset signal line VREF, and the first trace OL1_21 and the third trace OL1_23, multiplexed as data signal lines DL, in the first direction X facilitates feature extraction, rapid localization, and accurate identification of the positions of sub-pixels P of different colors within the same pixel unit PU.

[0194] Based on this, continue to refer to Figure 13 and Figure 14 The second trace OL1_22, multiplexed as the reset signal line VREF, has a smaller dimension in the first direction X than the first sub-trace OL1_10, multiplexed as the power signal line PVDD, in the first direction X. For example, after quickly identifying the pixel unit PU using the first sub-trace OL1_10 with its larger dimension in the first direction X, it is possible to further accurately identify sub-pixels P of different colors within the pixel unit PU using the first trace OL1_21, the second trace OL1_22, and the third trace OL1_23, which have different dimension characteristics in the first direction X. This improves detection efficiency and accuracy.

[0195] It should be noted that, for ease of explanation, 13 and... Figure 14 The diagram only shows, by way of example, the top view shape of the filter structure 310, which is a rectangular structure, and the size of the filter structures 310 of different colors is basically equal. However, it is not limited to this. In other optional embodiments, the filter structure 310 may also be an irregular shape, and / or the size of the filter structures 310 of different colors may be different.

[0196] In an alternative implementation, Figure 15 yes Figure 13 Magnified view of a local area LA in the middle Figure 2 ,refer to Figure 15 The filter structure 310 includes a first filter portion 331 and a second filter portion 332 arranged along the second direction Y; along the first direction X, the lengths of the first filter portion 331 and the second filter portion 332 are different.

[0197] For example, the dimensions of the end of the filter structure 310 in the first direction X can be adjusted according to the process error during the fabrication of the filter structure 310, so that the dimensions of the first filter portion 331 and the second filter portion 332 in the first direction X are different. Here, the end refers to the end of the filter structure 310 in the second direction Y, which can be the end of the filter structure 310 on any side in the second direction Y, or it can be the end of the filter structure 310 on both sides in the second direction Y. That is, the first filter portion 331 and / or the second filter portion 332 can be the end of the filter structure 310 in the second direction Y. The dimensions of the first filter portion 331 and / or the second filter portion 332 change in the first direction X. This allows the filter structure 310 to leak light only in a small area and / or cover the other sub-pixels P when there is a small positional shift due to process errors. This reduces the area of ​​light leakage and / or erroneous color emission, forming a transition zone. That is, the region along the second direction Y experiences discontinuous and intermittent light leakage and / or erroneous color display, avoiding continuous light leakage or erroneous color display in the continuous region along the second direction Y. This effectively compensates for the periodic stripe unevenness visible to the naked eye caused by process errors during fabrication. Furthermore, the length of the first filter portion 331 and / or the length of the second filter portion 332 in the first direction X can be less than the maximum length of the filter structure in the first direction X.

[0198] In another optional embodiment, the filter structure 310 includes a red filter structure 311, a green filter structure 312, and a blue filter structure 313; the area of ​​the blue filter structure 313 is larger than the area of ​​the red filter structure 311, and the area of ​​the red filter structure 311 is larger than the area of ​​the green filter structure 312; and / or, along the first direction X, the length of the blue filter structure 313 is greater than the length of the red filter structure 311, and the length of the red filter structure 311 is greater than the length of the green filter structure 312. This can compensate for the differences in luminous efficiency of sub-pixels P of different colors, as well as the differences in human eye perception of different colors.

[0199] In yet another implementation, Figure 16 This is a schematic diagram of the film structure of an array substrate provided in an embodiment of the present invention. Figure 3 ,refer to Figure 16 The filter structures 310 of at least two colors have different thicknesses in the direction perpendicular to the plane of the substrate 100.

[0200] For example, continue to refer to Figure 16The filter structure 310 includes a red filter structure 311, a green filter structure 312, and a blue filter structure 313. The green filter material has a strong absorption capacity for red and blue light, therefore the thickness of the green filter structure 312 can be set relatively thin. The red filter material has a weak absorption capacity for green and blue light, therefore the thickness of the red filter structure 311 can be set relatively thick, extending the absorption path of the red filter structure 311 for blue and green light, allowing it to absorb blue and green light to a greater extent and ensuring high red light purity. Along the direction perpendicular to the plane of the substrate 100, the thickness of the red filter structure 311 is greater than the thickness of the blue filter structure 313, and the thickness of the blue filter structure 313 is greater than the thickness of the green filter structure 312. This effectively compensates for the display error caused by the different filtering capabilities of the filter structures 310 of different colors, which is beneficial to improving the display effect.

[0201] In other alternative implementations, the luminous efficiency of subpixels of different colors is different, and the sensitivity of the human eye to different colors is also different. The thickness relationship of the filter structures 310 of different colors can also be adjusted according to the differences in luminous efficiency and / or human eye perception. The thickness relationship of the filter structures 310 of different colors is not limited to the red filter structure 311 being thicker than the blue filter structure 313, or the blue filter structure 313 being thicker than the green filter structure 312.

[0202] In another embodiment, the filter structure 310 includes a third filter portion 333 and a fourth filter portion 334. The orthographic projection of the fourth filter portion 334 onto the plane of the substrate 100 at least partially surrounds the orthographic projection of the third filter portion 333 onto the plane of the substrate 100. Along a direction perpendicular to the plane of the substrate 100, the thickness of the third filter portion 333 is not equal to the thickness of the fourth filter portion 334.

[0203] For example, continue to refer to Figure 16 Along the first direction X, the fourth filter portion 334 is located on opposite sides of the third filter portion 333, perpendicular to the plane of the substrate 100. The thickness of the fourth filter portion 334 is less than that of the third filter portion 333, making the thickness of the middle region of the filter structure 310 greater. This is beneficial to enhance the filtering capability of the middle region of the filter structure 310 and ensure the purity of the emitted light from the middle region. At the same time, the edge region of the filter structure 310 is thinner, especially the edge region located on opposite sides of the middle region along the first direction X. This can reduce the thickness of the overlapping region when the fourth filter portions 334 of the filter structures 310 arranged adjacent to each other along the first direction X overlap in the orthographic projection of the plane of the substrate 100. This avoids severe stacking in the overlapping part, which would result in a large difference between the thickness of the overlapping region and the thickness of the middle region of the filter structure 310, which would be detrimental to subsequent processing steps.

[0204] In other embodiments, continuing with the example where the fourth filter portion 334 is located on opposite sides of the third filter portion 333 along the first direction X, Figure 17 This is a schematic diagram of the film structure of an array substrate provided in an embodiment of the present invention. Figure 4 ,refer to Figure 17 In a direction perpendicular to the plane of the substrate 100, the thickness of the fourth filter portion 334 can also be greater than the thickness of the third filter portion 333. The fourth filter portion 334 can increase the light absorption path, better absorb light of other colors, and enhance the filtering capability of the edge region of the filter structure 310. In this way, it can better filter out the light of adjacent sub-pixels P and reduce the light crosstalk between adjacent sub-pixels P. For adjacent sub-pixels P that need to be displayed as white, a filter structure 310 may not be provided above them. The fourth filter portion 334 can, to a certain extent, block the light emitted from adjacent sub-pixels P without a filter structure 310 from shining onto the sub-pixels P with a filter structure 310. The greater the thickness of the fourth filter portion 334, the stronger the blocking capability. This is also beneficial to reduce the light crosstalk between adjacent sub-pixels P, especially to reduce the light crosstalk between adjacent sub-pixels P that are displayed as white.

[0205] Based on this, when the thickness of the fourth filter portion 334 is large, the orthographic projections of the fourth filter portions 334 of the filter structures 310 arranged adjacent to each other along the first direction X on the plane where the substrate 100 is located do not overlap. There may be gaps between the fourth filter portions 334 of the filter structures 310 arranged adjacent to each other along the first direction X. However, since the thickness of the fourth filter portion 334 is large, and the light rays from the sub-pixel P toward the gap are usually obliquely emitted, that is, the light rays are not perpendicular to the plane where the substrate 100 is located, the light rays toward the gap can be blocked by the fourth filter portion 334, filtering out light rays of other colors, and also reducing light crosstalk between adjacent sub-pixels P, thereby increasing the display contrast.

[0206] Understandable, Figure 16 and Figure 17 The fourth filter 334 is shown as an example only, located on opposite sides of the third filter 333 in the first direction X. However, it is not limited to this. The fourth filter 334 may also be located on one side of the third filter 333 in the first direction X, or the fourth filter 334 may also be located on one or both sides of the third filter 333 in the second direction Y.

[0207] Based on the above embodiment, the orthographic projection of the fourth filter portion 334 onto the plane of the substrate 100 overlaps with the orthographic projection of the first shading light OL1 onto the plane of the substrate 100. On one hand, this ensures that the orthographic projections of the first edge S1 and the second edge S2 of the filter structure 310 onto the plane of the substrate 100 overlap with the orthographic projection of the first shading light OL1 onto the plane of the substrate 100. On the other hand, since the first shading light OL1 is located between adjacent pixel columns, and the orthographic projection of the first shading light OL1 onto the plane of the substrate 100 does not overlap with the orthographic projection of the sub-pixel P onto the plane of the substrate 100, the orthographic projection of the fourth filter portion 334 onto the plane of the substrate 100 also does not overlap with the orthographic projection of the sub-pixel P onto the plane of the substrate 100. Thus, regardless of the thickness of the fourth filter portion 334, the sub-pixel P can still display the corresponding color through the third filter portion 333 of the filter structure 310, thereby preventing the fourth filter portion 334 from affecting the display emission of the sub-pixel P.

[0208] As can be seen from the above, the first light-shielding line OL1 can be disposed in the same layer as the bottom light-shielding structure, or it can be reused as a data signal line DL, a power signal line PVDD, a reset signal line VREF, etc. The first light-shielding line OL1 can be a metal light-shielding line. Based on this, the orthographic projections of the filter structures 310 disposed adjacent to each other along the first direction X on the plane where the substrate 100 is located can overlap, and the overlapping area of ​​the orthographic projections of the filter structures 310 disposed adjacent to each other along the first direction X on the plane where the substrate 100 is located overlaps with the orthographic projection of the first light-shielding line OL1 on the plane where the substrate is located.

[0209] For example, refer to Figure 14 , Figure 15 and Figure 16 The orthographic projections of adjacent filter structures 310 arranged along the first direction X onto the plane of the substrate 100 overlap, forming a black opaque area. This helps reduce crosstalk between different colors of light between adjacent sub-pixels P. Especially when the light-emitting element DO in the sub-pixel P in the array substrate 001 emits white light and presents different colors through the filter structure 310, it can effectively prevent white light leakage from adjacent sub-pixels P and improve the display effect. For sub-pixels P that need to be white during display, the white light leakage between them and their adjacent sub-pixels P has little impact on the display effect. Therefore, filter structure 310 does not need to be set above the sub-pixel P that needs to be white during display, nor does it need to overlap with the filter structure 310 above its adjacent sub-pixels P. Alternatively, when a planarization layer is prepared on the side of the filter layer 300 away from the substrate 100, part of the planarization layer can fill the area above the fourth color sub-pixel P04 as a white filter structure, and the white filter structure overlaps with the filter structure 310 above its adjacent sub-pixel P.

[0210] Furthermore, the overlapping area overlaps with the orthographic projection of the first shielding light OL1 onto the plane of the substrate. On the one hand, this can reduce the interference of the overlapping area on the detection of alignment anomalies in the filter structure 310, thereby improving detection efficiency and accuracy. On the other hand, it can also reduce the reflected light from the metal shielding light, which is beneficial to improving the display effect of the array substrate.

[0211] Optional, Figure 18 This is a schematic diagram of the film structure of an array substrate provided in an embodiment of the present invention. Figure 5 ,refer to Figure 18 The light-emitting functional layer 200 includes a light-emitting element D0 and a pixel driving circuit 210; the array substrate 001 also includes a black light-shielding layer, which includes a plurality of first light-shielding portions BB1 arranged along a first direction X and extending along a second direction Y; the orthographic projection of the first light-shielding portion BB1 on the plane of the substrate 100 does not overlap with the orthographic projection of the light-emitting element D0 on the plane of the substrate; the orthographic projection of the first light-shielding portion BB1 on the plane of the substrate 100 overlaps with the orthographic projection of the first light-shielding ray OL1 on the plane of the substrate 100.

[0212] For example, the black light-shielding layer can be a black matrix layer, wherein the orthographic projection of the first light-shielding portion BB1 arranged along the first direction X and extending along the second direction Y in the black matrix layer onto the plane of the substrate 100 needs to overlap with the orthographic projection of the first light-shielding ray OL1 onto the plane of the substrate 100. If the black matrix layer is disposed on the side of the filter layer 300 close to the substrate 100, the overlapping of the orthographic projections of the two onto the plane of the substrate 100 can prevent the black matrix layer from interfering with the alignment anomaly detection of the filter structure; if the black matrix layer is disposed on the side of the filter layer 300 close to the substrate 100, the overlapping of the orthographic projections of the two onto the plane of the substrate 100 allows the first light-shielding portion BB1 to be correspondingly disposed on the side along the first direction X and extending along the second direction Y. In the overlapping area or gap of the filter structures arranged adjacent to each other in the first direction X, the light-emitting area defined by the black matrix layer is prevented from being misaligned with the setting area of ​​the filter structure 310, thus affecting the display effect. At the same time, regardless of whether the black matrix layer is set on the side of the filter layer 300 closer to the substrate 100 or the side of the filter layer 300 farther from the substrate 100, the black matrix layer can reduce the crosstalk of different colors of light between adjacent sub-pixels P, reduce the process requirements when preparing the filter structure 310, that is, allow the orthographic projection of the filter structures 310 arranged adjacent to each other in the first direction X to not overlap or to have a small positional offset in the first direction X, which is beneficial to improve production efficiency and reduce preparation cost.

[0213] In one embodiment, the black light-shielding layer is located between the light-emitting functional layer 200 and the light-filtering layer 300, and the first light-shielding line OL1 can be reused as the first light-shielding part OL1.

[0214] For example, after the light-emitting functional layer 200 is fabricated, a black light-shielding layer can be formed on the side of the light-emitting functional layer 200 away from the substrate 100. Then, a filter structure 310 can be fabricated on the side of the black light-shielding layer away from the substrate 100. The orthographic projection of the fourth filter portion 334 of the filter structure 310 onto the plane of the substrate 100 may overlap with the orthographic projection of the black light-shielding layer onto the plane of the substrate 100. If they overlap, a direction perpendicular to the plane of the substrate 100 can be provided. The thickness of the fourth filter portion 334 is less than the thickness of the third filter portion 333. Figure 18 As shown; if the two do not overlap, a direction perpendicular to the plane of the substrate 100 can be set, and the thickness of the fourth filter 334 is greater than the thickness of the third filter 333. Figure 18 (Not shown in the image).

[0215] Optional, Figure 19 This is a top view schematic diagram of an array substrate provided in an embodiment of the present invention. Figure 10 Second, reference Figure 19 Along the second direction Y, adjacent filter structures 310 have different colors; the array substrate 001 also includes multiple second shielding lines OL2 located on the side of the filter layer 300 near the substrate 100 and arranged along the second direction Y and extending in the first direction X; the filter structure 310 includes a third edge S3 and a fourth edge S4 arranged opposite to each other along the second direction Y, and the orthographic projections of the third edge S3 and the fourth edge S4 on the plane where the substrate 100 is located overlap with the orthographic projections of the second shielding lines OL2 on the plane where the substrate 100 is located.

[0216] The second light-shielding light OL2 also includes an opaque material, resulting in a lower light transmittance of the first light-shielding light OL1. The second light-shielding light OL2 may contain the same material as the first light-shielding light OL1 and be located in the same film layer position, but this is not a limitation. In other embodiments, the second light-shielding light OL2 and the first light-shielding light OL1 may contain different materials and / or be located in different film layer positions. Alternatively, a portion of the second light-shielding light OL2 may be co-layered with a portion of the first light-shielding light OL1, or a portion of the second light-shielding light OL2 may be located in a different film layer position.

[0217] For example, the third edge S3 and the fourth edge S4 of the filter structure 310 are arranged along the second direction Y and extend along the first direction X. In one embodiment, the orthographic projections of the third edge S3 and the fourth edge S4 onto the plane where the substrate 100 is located are both within the outline (including the outline edge) of the orthographic projection of the second shading light OL2 onto the plane where the substrate 100 is located; the orthographic projections of the third edge S3 and the fourth edge S4 of the same filter structure 310 onto the plane where the substrate 100 is located are respectively within the outline (including the outline edge) of the orthographic projections of different second shading light OL2 onto the plane where the substrate 100 is located. In another embodiment, the orthographic projection of the second shading light OL2 onto the plane of the substrate 100 can be used to divide the setting area of ​​pixel rows. That is, along the second direction Y, the second shading light OL2 can be provided on both sides of each pixel row, so that the orthographic projections of the third edge S3 and the fourth edge S4 of the filter structure 310 onto the plane of the substrate 100 can both be located within the outline of the orthographic projection of the second shading light OL2 onto the plane of the substrate 100 (including the outline edge). In this case, the number of second shading light OL2 is greater than the number of pixel rows. In one embodiment, when the array substrate 001 is provided with a first auxiliary power line PV1 arranged along the second direction Y and an extension in the first direction X, the first auxiliary power line PV1 and the second auxiliary power line PV2 can be reused as the second shading light OL2. Figure 19 (Not shown in the image).

[0218] When performing alignment anomaly detection on the filter structure 310, if a portion of the area between two adjacent second shading rays OL2 contains the filter structure 310 while another portion does not, along the second direction Y, there is a partial color of the filter structure 310 and a partial color of the light source (usually white light) between the two adjacent second shading rays OL2. This may be because the size of the filter structure 310 in the second direction Y is abnormally small, and the filter structure 310 does not completely cover the sub-pixel setting area between the two adjacent second shading rays OL2. Alternatively, the size of the filter structure 310 in the second direction Y may be abnormally large, and the filter structure 310 extends into other sub-pixel setting areas arranged along the second direction Y, causing its third edge S3 and / or fourth edge S4 to not be located within the outline of the second shading ray OL2. In such cases, the alignment of the filter structure 310 should be judged as abnormal.

[0219] If the outline of the second light-shielding light OL2 is different from its outline when it was first prepared, for example, the outline of the second light-shielding light OL2 is straight when it was first prepared, and the outline of the second light-shielding light OL2 changes after the filter structure 310 is formed, there is an abnormal protrusion along the second direction Y in a local area of ​​the second light-shielding light OL2. This abnormal protrusion is opaque and is a black area. It is possible that the size of some filter structures 310 in the second direction Y is abnormally large. The orthographic projection of the filter structure 310 on the plane where the substrate 100 is located overlaps with the orthographic projection of multiple sub-pixels P arranged along the second direction Y on the plane where the substrate 100 is located, and overlaps with the filter structures 310 in other sub-pixel setting areas to form a black opaque area. At this time, the third edge S3 and / or the fourth edge S4 are not located within the outline of the first light-shielding light OL1, and the alignment of the filter structure 310 should also be judged as abnormal.

[0220] This invention improves display performance by setting multiple second shading lines arranged along a second direction and extending in a first direction on the side of the filter layer near the substrate. This allows for the detection of misalignment of the filter structure in the second direction using the second shading lines as a reference. Furthermore, by ensuring that the orthographic projections of the third and fourth edges of the filter structure onto the substrate plane overlap with the orthographic projections of the second shading lines onto the substrate plane, misalignment of the filter structure can be determined when the orthographic projections of the third or fourth edges onto the substrate plane do not overlap with the orthographic projections of the first shading lines onto the substrate plane. This simplifies the detection method for the filter structure and improves detection efficiency and accuracy.

[0221] Based on the above embodiments, continue to refer to Figure 19 The light-emitting functional layer 200 also includes multiple second signal lines TL2 extending along the first direction X; along the second direction Y, the length of the second shading light OL2 is greater than the length of the second signal lines TL2. Specifically, along the second direction Y, the size of the second shading light OL2 is larger, which is beneficial for feature extraction and quickly identifying the second shading light OL2 that needs to be used to detect whether the filter structure 310 is misaligned in the second direction Y.

[0222] The second signal line TL2 includes, but is not limited to, signal traces extending along the first direction X, such as power signal lines, reset signal lines, and scan signal lines. In one embodiment, the second signal line TL2 may also include overlapping traces extending along the first direction X, which can be electrically connected to signal traces extending along the second direction Y.

[0223] In optional implementations, continue to refer to Figure 19The light-emitting functional layer 200 also includes a plurality of scan signal lines SL arranged along the second direction Y and extending along the first direction X; sub-pixels P arranged along the first direction X form a pixel row, and sub-pixels P in the same pixel row can be electrically connected to two scan signal lines SL; in the same pixel row, two sub-pixels P connected to the same data signal line DL are respectively connected to different scan signal lines. In the display area AA, the orthographic projection of the second shielding light OL2 onto the plane of the substrate 100 covers the orthographic projection of the scan signal lines SL onto the plane of the substrate 100.

[0224] It should be noted that the orthographic projection of the second shielding light OL2 onto the plane of the substrate 100 covering the orthographic projection of the scan signal line SL onto the plane of the substrate 100 means that the orthographic projection of the scan signal line SL located in the display area AA onto the plane of the substrate 100 is located within the orthographic projection outline of the second shielding light OL2 onto the plane of the substrate 100 (including the outline edge), and is not limited to the second shielding light OL2 being located on the side of the scan signal line SL closer to the substrate 100 or the side farther away from the substrate 100.

[0225] For example, sub-pixels P in the same pixel row are electrically connected to two scanning signal lines SL located on opposite sides of the pixel row in the second direction Y, and two scanning signal lines SL are provided between at least partially adjacent pixel rows; in the display area AA, the second shielding light OL2 located between the partially adjacent pixel rows may include the orthographic projection of the two scanning signal lines SL onto the plane of the substrate 100 within the orthographic projection outline (including the outline edge) of the plane where the substrate 100 is located. In this way, the scanning signal lines SL can be effectively prevented from interfering with the alignment anomaly detection of the filter structure 310.

[0226] It is understood that in other embodiments, the sub-pixel P of the same pixel row that is electrically connected to the two scan signal lines SL may also be located on the same side of the pixel row in the second direction Y. The embodiments of the present invention do not limit the position of the scan signal lines SL and the pixel rows to which they are electrically connected.

[0227] Based on the same inventive concept, embodiments of the present invention also provide a method for detecting the filter structure of an array substrate, which can be used to detect the filter structure in the array substrate provided in any embodiment of the present invention. Figure 20 This is a flowchart of a method for detecting the filter structure of an array substrate provided in an embodiment of the present invention. Figure 1 ,refer to Figure 20 The detection methods include:

[0228] S110, Provide an array substrate; wherein the array substrate includes a substrate, a light-emitting functional layer located on one side of the substrate, and a filter layer located on the side of the light-emitting functional layer away from the substrate.

[0229] The array substrate includes multiple first light-shielding lines arranged along a first direction and extending in a second direction; the filter layer includes a filter structure of at least one color.

[0230] S120. A light source is placed on the side of the substrate away from the filter layer, so that the light from the light source passes through the substrate, the light-emitting functional layer and the filter layer in sequence.

[0231] The light source is typically a white light source and can uniformly illuminate one side of the substrate of the array substrate. In one embodiment, the length of the light source in the first direction is greater than the length of the array substrate in the first direction, and / or the length of the light source in the second direction is greater than the length of the array substrate in the second direction. This facilitates uniform illumination of one side of the substrate of the array substrate, allowing the light from the light source to pass through the substrate, the light-emitting functional layer, and the filter layer in sequence.

[0232] S130. Take a picture of the array substrate on the side of the filter layer away from the substrate to obtain a detection image.

[0233] Specifically, the light from the light source shines onto the filter layer from the side of the substrate away from the filter layer, while the array substrate is also photographed from the side of the filter layer away from the substrate. At the same time, the first light-blocking light is opaque, while the filter structure can transmit light of the corresponding color and absorb light of other colors. Therefore, in the detection image, the area where the first light-blocking light is located appears as a black area, and the area where the filter structure is located appears as the corresponding color.

[0234] S140. Based on the outline of the filter structure and the outline of the first shading light in the detection image, determine whether there is misalignment of the filter structure in the filter layer.

[0235] For example, if the first edge and / or second edge of the filter structure can be detected and identified in the detection image, it indicates that the projection of the first edge and / or second edge of the filter structure onto the plane of the substrate does not overlap with the projection of the first shading light onto the plane of the substrate, and it can be determined that the filter structure has misalignment. If the black outline of the first shading light is different from its outline when it was just completed, for example, the outline of the first shading light is straight when it was just completed, and the outline of the first shading light in the detection image obtained during the detection of the filter structure changes, there is an abnormal protrusion along the first direction in a local area of ​​the first shading light. This abnormal protrusion is opaque and is a black area. It may be that the size of some filter structures in the first direction is abnormally large. The orthographic projection of the filter structure onto the plane of the substrate overlaps with the orthographic projection of multiple sub-pixels arranged along the first direction onto the plane of the substrate, and overlaps with the filter structures in other sub-pixel setting areas to form a black opaque area, which is a black abnormal protrusion. At this time, the first edge and / or second edge of the filter structure are not located within the outline of the first shading light, and it should also be determined that the filter structure has misalignment.

[0236] The detection method for the filter structure provided in this embodiment of the invention adopts projection detection. The first shielding light in the array substrate is used as a reference. The first shielding light can be used to detect whether there is misalignment of the filter structure. This detection process does not require precise focusing or distance calculation. It can be performed even under blurred focus, which is beneficial to improving detection efficiency and accuracy.

[0237] Based on the above embodiments, the orthographic projection of the first shielding light onto the plane of the array substrate can define a plurality of sub-pixel regions arranged along a first direction on the plane of the array substrate. Each sub-pixel region is provided with sub-pixels; each sub-pixel region corresponds to a display primary color, and the color of the filter structure overlapping with the sub-pixels is the same as the display primary color corresponding to the sub-pixel region. In one embodiment, determining whether there is misalignment of the filter structure in the filter layer based on the outline of the filter structure and the outline of the first shielding light in the detection image includes: if, in the detection image, there are non-corresponding colors in the sub-pixel regions, and / or, the orthographic projection of the first shielding light onto the plane of the array substrate has an abnormal protrusion towards the adjacent sub-pixel region, then it is determined that there is misalignment of the filter structure in the filter layer.

[0238] For example, if a subpixel in a certain subpixel region corresponds to the red display primary color, but the subpixel region at that location appears green in the detection image, it indicates that a green filter structure has been formed at that location, and the green filter structure has misalignment defects; or, after the red filter structure is prepared, the subpixel region at that location appears white, it indicates that the red filter structure has misalignment defects; or, after the red filter structure is prepared, the subpixel region at that location appears partially red and partially white, it indicates that the size of the red filter structure at that location is abnormally small or its position is offset, and the red filter structure at that location has misalignment defects.

[0239] The length of the first shading light in the second direction is greater than the length of the filter structure in the second direction. A portion of the first shading light does not overlap with the filter structure. If a local area of ​​the first shading light has a length in the first direction greater than the length of the portion of the first shading light that does not overlap with the filter structure in the first direction, it indicates that there is an abnormal protrusion in the local area along the first direction. This indicates that the size of a portion of the filter structure is abnormally large, or that there is a serious positional shift along the first direction, indicating misalignment at that position.

[0240] In this way, detection can be performed even under blurred focus without calculating distance. The defect determination of the filter structure can be achieved simply by judging whether there are abnormal protrusions in the outline of the first shading light in the detection image, and whether there are display primary colors corresponding to sub-pixels that do not belong to the region. This is beneficial to improving detection efficiency and accuracy.

[0241] Optional, Figure 21This is a flowchart of a method for detecting the filter structure of an array substrate provided in an embodiment of the present invention. Figure 2 ,refer to Figure 21 The detection methods include:

[0242] S210. An array substrate is provided; wherein the array substrate includes a substrate, a light-emitting functional layer located on one side of the substrate, and a filter layer located on the side of the light-emitting functional layer away from the substrate, the filter layer including a first color filter structure but not including a second color filter structure.

[0243] For example, the array substrate includes a first sub-pixel region and a second sub-pixel region arranged along a first direction. The sub-pixels in the first sub-pixel region correspond to a first display primary color, and the sub-pixels in the second sub-pixel region correspond to a second display primary color. The color of the first color filter structure is the first display primary color, and the color of the second color filter structure is the second display primary color. At this time, the first color filter structure has been fabricated on the surface of the first sub-pixel region, but the second color filter structure has not yet been fabricated on the surface of the second sub-pixel region.

[0244] S220. A light source is placed on the side of the substrate away from the filter layer, so that the light from the light source passes through the substrate, the light-emitting functional layer and the filter layer in sequence.

[0245] S230. Take a picture of the array substrate on the side of the filter layer away from the substrate to obtain the first detection image.

[0246] For example, the array substrate includes a first sub-pixel region, a second sub-pixel region, a third sub-pixel region, and other sub-pixel regions arranged along a first direction, each corresponding to a variety of display primary colors. However, in the first detection image, only the color of the first color filter structure, i.e., the first display primary color corresponding to the sub-pixel set in the first sub-pixel region, is presented. The color of the second color filter structure, i.e., the second display primary color corresponding to the sub-pixel set in the second sub-pixel region, is not presented.

[0247] S240. Based on the first detection image, detect whether there is misalignment in the first color filter structure in the filter layer. If not, proceed to S250; if so, rework and re-fabricate the first color filter structure.

[0248] For example, the presence of misalignment in the first color filter structure can be determined by whether the first sub-pixel region in the first detection image displays the color of the first color filter structure. If a white area appears in the first sub-pixel region or the first display primary color appears in other sub-pixel regions, it indicates that the first color filter structure has misalignment. When misalignment exists in the first color filter structure, the first color filter structure in the array substrate can be removed, and the first color filter structure can be re-fabricated. Then, steps S210, S220, S230, and S240 are executed sequentially until the first color filter structure in the first detection image no longer has misalignment. If the first color filter structure does not have misalignment, step S250 can be executed.

[0249] S250. A second color filter structure is formed in the filter layer. Then, a light source is set on the side of the substrate away from the filter layer. The array substrate is photographed on the side of the filter layer away from the substrate to obtain a second detection image.

[0250] For example, during this step, a first color filter structure has been prepared on the surface of the first sub-pixel region, and no defects in the first color filter structure are detected. A second color filter structure has also been prepared on the surface of the second sub-pixel region. In the second detection image, the colors of the first and second color filters can be displayed, namely, the first display primary color corresponding to the sub-pixel set in the first sub-pixel region and the second display primary color corresponding to the sub-pixel set in the second sub-pixel region.

[0251] S260. Based on the second detection image, detect whether there is misalignment of the second color filter structure in the filter layer.

[0252] For example, the alignment of the second color filter structure can be determined by whether the second sub-pixel region in the second detection image displays the color of the second color filter structure. If a white area appears in the first sub-pixel region or the second display primary color appears in other sub-pixel regions, it indicates that the second color filter structure has an alignment problem. Alternatively, the alignment of the second color filter structure can be determined by whether there is an abnormal protrusion of the first light-blocking contour in the first sub-pixel region. If there is an abnormal protrusion of the first light-blocking contour in the first sub-pixel region, it also indicates that the second color filter structure has an alignment problem. When the second color filter structure has an alignment problem, the first color filter structure in the array substrate can be removed and a new first color filter structure can be fabricated. Then, steps S250 and S260 are executed sequentially until the second color filter structure in the second detection image no longer has an alignment problem. If there is no misalignment in the second color filter structure, a third color filter structure can be formed in the filter layer. Then, a light source is set on the side of the substrate away from the filter layer, and the array substrate is photographed on the side of the filter layer away from the substrate to obtain a third detection image. Based on the third detection image, the misalignment of the third color filter structure in the filter layer is detected until all color filter structures are prepared.

[0253] In this embodiment of the invention, by performing an alignment anomaly detection after each color filter structure is prepared, rework can be carried out in a timely manner if an alignment anomaly occurs. This is beneficial for improving product yield, reducing workload, and avoiding the large amount of rework required when an alignment defect is found after all filter structures have been prepared.

[0254] It is understood that the above-mentioned detection of the filter structure can be performed globally on the filter structure at all locations in the display area, or it can be performed on the filter structure in a local area of ​​the display area, or multiple areas can be set in the display area for sampling inspection of local areas. The embodiments of the present invention do not limit the detection area.

[0255] The method for detecting the filter structure of an array substrate provided in this embodiment of the invention is used to detect the filter structure of an array substrate provided in any embodiment of the invention. It has the corresponding technical features and beneficial effects of the array substrate. For contents not described in detail in the embodiments of the filter structure detection method, please refer to the description of the array substrate above, and will not be repeated here. Similarly, the array substrate provided in this embodiment of the invention also has functional modules and beneficial effects that can perform the method for detecting the filter structure of an array substrate provided in this embodiment of the invention. For contents not described in detail in the embodiments of the array substrate, please refer to the description of the filter structure detection method above, and will not be repeated here.

[0256] Based on the same inventive concept, embodiments of the present invention also provide a display panel. Figure 22This is a schematic diagram of the structure of a display panel provided in an embodiment of the present invention, such as... Figure 22 The display panel 002 includes the array substrate 001 provided in any embodiment of the present invention.

[0257] In this embodiment of the invention, the display panel 002 can be a liquid crystal display panel, with the filter layer 300 located on the array substrate 001; or, the display panel 002 provided in this embodiment of the invention can be an OLED display panel, such as a WOLED display panel; or, the display panel 002 provided in this embodiment of the invention can be a Mini LED display panel or a Micro LED display panel. This embodiment of the invention does not limit the type of the display panel 002.

[0258] For example, taking the display panel 002 provided in this embodiment of the invention as a WOLED display panel, refer to... Figure 22 The display panel 002 also includes a planarization layer 400, an optical functional layer 500, and a cover plate 600 located on the side of the filter layer 300 away from the substrate.

[0259] Based on the same inventive concept, embodiments of the present invention also provide a display device. Figure 23 This is a schematic diagram of the structure of a display device provided in an embodiment of the present invention, such as... Figure 23 The display device 003 includes the display panel 002 provided in any embodiment of the present invention. The display device 003 provided in the embodiments of the present invention can be... Figure 23 The mobile phone shown can also be any electronic product with display function, including but not limited to the following categories: television, laptop, desktop monitor, tablet computer, digital camera, smart bracelet, smart glasses, in-vehicle display, medical equipment, industrial control equipment, touch interactive terminal, etc. The embodiments of the present invention do not make any special limitations on this.

[0260] Note that the above description is merely a preferred embodiment of the present invention and the technical principles employed. Those skilled in the art will understand that the present invention is not limited to the specific embodiments described herein, and various obvious changes, readjustments, and substitutions can be made without departing from the scope of protection of the present invention. Therefore, although the present invention has been described in detail through the above embodiments, the present invention is not limited to the above embodiments, and may include many other equivalent embodiments without departing from the concept of the present invention, the scope of which is determined by the scope of the appended claims.

Claims

1. An array substrate, characterized by, The array substrate comprises: a substrate, a light-emitting functional layer located on one side of the substrate, and a filter layer located on the side of the light-emitting functional layer away from the substrate; the light-emitting functional layer comprises a plurality of pixel columns arranged along a first direction and extending along a second direction, and a plurality of data signal lines, wherein the first direction intersects the second direction, and the first direction and the second direction are both parallel to the plane on which the substrate lies; the pixel column comprises a plurality of sub-pixels arranged along the second direction; at least one data signal line is electrically connected to the sub-pixels in two pixel columns; the array substrate further comprises a plurality of first light-shielding lines arranged along the first direction and extending along the second direction on the side of the filter layer close to the substrate; the orthogonal projection of the data signal line on the plane on which the substrate lies overlaps with the orthogonal projection of the first light-shielding line on the plane on which the substrate lies; the filter layer is located in a display area, and the filter layer comprises a filter structure, the orthogonal projection of the filter structure on the plane on which the substrate lies overlaps with the orthogonal projection of the sub-pixel on the plane on which the substrate lies; the filter structure comprises a first edge and a second edge oppositely arranged along the first direction; the orthogonal projection of the first edge and the second edge on the plane on which the substrate lies both overlap with the orthogonal projection of the first light-shielding line on the plane on which the substrate lies.

2. The array substrate according to claim 1, wherein the colors of the filter structures arranged adjacently along the first direction are different; the orthogonal projection of the same filter structure on the plane on which the substrate lies can cover the orthogonal projection of a plurality of sub-pixels arranged along the second direction on the plane on which the substrate lies.

3. The array substrate according to claim 1, wherein the length of the first light-shielding line along the second direction is greater than the length of the filter structure.

4. The array substrate according to claim 1, wherein the orthogonal projection of the filter structure on the plane on which the substrate lies only overlaps with the orthogonal projection of two first light-shielding lines arranged adjacently along the first direction on the plane on which the substrate lies.

5. The array substrate according to claim 1, wherein there is and only one first light-shielding line in the orthogonal projection of the first light-shielding line on the plane on which the substrate lies between the orthogonal projection of two pixel columns arranged adjacently along the first direction on the plane on which the substrate lies.

6. The array substrate according to claim 1, wherein the light-emitting functional layer further comprises a plurality of first signal lines arranged along the first direction and extending along the second direction; the first signal line is a transparent trace.

7. The array substrate according to claim 1, wherein the data signal line is multiplexed as the first light-shielding line.

8. The array substrate according to claim 7, wherein the array substrate further comprises a power signal line and a reset signal line, the power signal line is multiplexed as the first light-shielding line, and / or the reset signal line is multiplexed as the first light-shielding line.

9. The array substrate according to claim 8, wherein The power signal line is located between two adjacent data signal lines in the first direction, and / or the reset signal line is located between two adjacent data signal lines in the first direction.

10. The array substrate of claim 9, wherein, when the power signal line and the reset signal line are multiplexed as the first light-shielding line, the power signal line and the reset signal line are arranged alternately in the first direction.

11. The array substrate of claim 7, wherein, the array substrate comprises a plurality of pixel units arranged in an array in the display area; the pixel units comprise first color sub-pixels, second color sub-pixels, third color sub-pixels and fourth color sub-pixels arranged in the first direction; the data signal line is arranged between the first color sub-pixel and the second color sub-pixel and between the third color sub-pixel and the fourth color sub-pixel in the same pixel unit.

12. The array substrate of claim 1, wherein, the first light-shielding line comprises a first sub-line and a second sub-line; the length of the first sub-line is greater than the length of the second sub-line in the first direction.

13. The array substrate of claim 12, wherein, the array substrate comprises a plurality of pixel units arranged in an array in the display area; the pixel units comprise a plurality of sub-pixels arranged in the first direction; the orthogonal projection of the first sub-line on the substrate plane is located between the orthogonal projections of the pixel units arranged adjacent in the first direction on the substrate plane, and the orthogonal projection of the second sub-line on the substrate plane overlaps the orthogonal projection of the pixel unit on the substrate plane.

14. The array substrate of claim 12, wherein, the first sub-line is multiplexed as a power signal line; at least part of the second sub-line is multiplexed as a data signal line.

15. The array substrate of claim 14, wherein, the array substrate comprises a plurality of pixel units arranged in an array in the display area; the pixel units comprise first color sub-pixels, second color sub-pixels, third color sub-pixels and fourth color sub-pixels arranged in the first direction; the orthogonal projection of the first sub-line on the substrate plane is located between the orthogonal projection of the first color sub-pixel on the substrate plane and the orthogonal projection of the fourth color sub-pixel on the substrate plane. The second sub-line includes a first trace, a second trace and a third trace; a projection of the first trace on a plane where the substrate is located is between a projection of the first color sub-pixel on the plane where the substrate is located and a projection of the second color sub-pixel on the plane where the substrate is located, a projection of the second trace on the plane where the substrate is located is between a projection of the second color sub-pixel on the plane where the substrate is located and a projection of the third color sub-pixel on the plane where the substrate is located, and a projection of the third trace on the plane where the substrate is located is between a projection of the third color sub-pixel on the plane where the substrate is located and a projection of the fourth color sub-pixel on the plane where the substrate is located; The first trace and the third trace are multiplexed as a data signal line, and the second trace is multiplexed as a reset signal line.

16. The array substrate of claim 15, wherein: The first color sub-pixel is a white color sub-pixel, or the fourth color sub-pixel is a white color sub-pixel.

17. The array substrate of claim 15, wherein: In the first direction, a length of the second trace is greater than a length of the first trace, and the length of the second trace is greater than a length of the third trace.

18. The array substrate of claim 1, wherein: The first light-shielding line is a metal light-shielding line; Projections of the filter structures arranged adjacent to each other in the first direction on the plane where the substrate is located overlap, and an overlapping area of the projections of the filter structures arranged adjacent to each other in the first direction on the plane where the substrate is located overlaps with the projection of the first light-shielding line on the plane where the substrate is located.

19. The array substrate of claim 1, wherein: The light-emitting functional layer includes light-emitting elements and pixel driving circuits; The array substrate further includes a black light-shielding layer; The black light-shielding layer includes a plurality of first light-shielding portions arranged in the first direction and extending in the second direction; The projection of the first light-shielding portion on the plane where the substrate is located does not overlap with the projection of the light-emitting element on the plane where the substrate is located; The projection of the first light-shielding portion on the plane where the substrate is located overlaps with the projection of the first light-shielding line on the plane where the substrate is located.

20. The array substrate of claim 19, wherein: The black light-shielding layer is located between the light-emitting functional layer and the filter layer; The first light-shielding line multiplexes the first light-shielding portions.

21. The array substrate of claim 1, wherein: The light-emitting functional layer includes a light-emitting layer and a circuit layer; the circuit layer includes pixel driving circuits and a bottom light-shielding structure located on a side of the pixel driving circuits close to the substrate; The first light-shielding line is arranged in the same layer as the bottom light-shielding structure.

22. The array substrate of claim 1, wherein: In the second direction, colors of the filter structures arranged adjacent to each other are different; The array substrate further includes a plurality of second light-shielding lines arranged in the second direction and extending in the first direction and located on a side of the filter layer close to the substrate. The light filtering structure comprises a third edge and a fourth edge arranged oppositely along the second direction; The third edge and the fourth edge both overlap the second light shielding line in the orthographic projection of the substrate plane.

23. The array substrate of claim 22, wherein, The light emitting functional layer further comprises a plurality of second signal lines extending along the first direction; Along the second direction, the length of the second light shielding line is greater than the length of the second signal line.

24. The array substrate of claim 23, wherein, The light emitting functional layer comprises a plurality of scanning signal lines extending along the first direction; The sub-pixels arranged along the first direction form a pixel row; In the same pixel row, two sub-pixels connected to the same data signal line are connected to different scanning signal lines, respectively; In the display area, the orthographic projection of the second light shielding line on the substrate plane covers the orthographic projection of the scanning signal line on the substrate plane.

25. The array substrate of claim 22, wherein, At least part of the second light shielding line is arranged in the same layer as at least part of the first light shielding line.

26. The array substrate of claim 1, wherein, The light emitting functional layer comprises a plurality of scanning signal lines extending along the first direction; The sub-pixels arranged along the first direction form a pixel row; In the same pixel row, two sub-pixels connected to the same data signal line are connected to different scanning signal lines, respectively.

27. The array substrate of claim 1, wherein, The light filtering structure comprises a first light filtering part and a second light filtering part arranged along the second direction; Along the first direction, the length of the first light filtering part and the length of the second light filtering part are different.

28. The array substrate of claim 1, wherein, The thickness of the light filtering structure of at least two colors in the direction perpendicular to the substrate plane is different.

29. The array substrate of claim 28, wherein, The light filtering structure comprises a red light filtering structure, a green light filtering structure and a blue light filtering structure; Along the direction perpendicular to the substrate plane, the thickness of the red light filtering structure is greater than the thickness of the blue light filtering structure, and the thickness of the blue light filtering structure is greater than the thickness of the green light filtering structure.

30. The array substrate of claim 1, wherein, The light filtering structure comprises a third light filtering part and a fourth light filtering part, the orthographic projection of the fourth light filtering part on the substrate plane at least partially surrounds the orthographic projection of the third light filtering part on the substrate plane, and along the direction perpendicular to the substrate plane, the thickness of the third light filtering part is not equal to the thickness of the fourth light filtering part.

31. The array substrate of claim 30, wherein, The orthographic projection of the fourth light filtering part on the substrate plane overlaps the orthographic projection of the first light shielding line on the substrate plane.

32. A display panel comprising: The array substrate of any one of claims 1-31.

33. A display device comprising: The display panel of any one of claim 32.

34. A method for detecting a filter structure of an array substrate, the method comprising: applying a voltage to a first electrode of the filter structure; and detecting a current flowing through the filter structure. A method for detecting the light filtering structure in the array substrate of any one of claims 1-31; The detection method comprises: The array substrate is provided; the array substrate comprises a substrate, a light-emitting functional layer on one side of the substrate, and a filter layer on the side of the light-emitting functional layer away from the substrate; A light source is arranged on the side of the substrate away from the filter layer; the light of the light source passes through the substrate, the light-emitting functional layer and the filter layer in sequence; The array substrate is photographed on the side of the filter layer away from the substrate to obtain a detection image; According to the outline of the filter structure and the outline of the first light-shielding line in the detection image, it is determined whether the filter structure in the filter layer has misalignment.

35. The detection method of the filter structure of the array substrate according to claim 34, wherein the first light-shielding line can define a plurality of sub-pixel regions arranged along the first direction on the plane of the array substrate in the orthogonal projection on the plane of the array substrate; the sub-pixel regions are provided with the sub-pixels; The sub-pixels correspond to a display primary color, and the color of the filter structure overlapping the sub-pixels is the same as the display primary color corresponding to the sub-pixel region; According to the outline of the filter structure and the outline of the first light-shielding line in the detection image, it is determined whether the filter structure in the filter layer has misalignment, comprising: In the detection image, if there is a color that does not correspond in the sub-pixel region, and / or the orthogonal projection of the first light-shielding line on the plane of the array substrate has an abnormal protrusion towards the adjacent sub-pixel region, it is determined that the filter structure in the filter layer has misalignment.

36. The detection method of the filter structure of the array substrate according to claim 34, wherein the filter layer comprises first color filter structures and does not comprise second color filter structures; The array substrate is photographed on the side of the filter layer away from the substrate to obtain a detection image, comprising: The array substrate is photographed on the side of the filter layer away from the substrate to obtain a first detection image; According to the first detection image, it is detected whether the first color filter structure in the filter layer has misalignment; If the first color filter structure does not have misalignment, the second color filter structure is formed on the filter layer, then a light source is arranged on the side of the substrate away from the filter layer, the array substrate is photographed on the side of the filter layer away from the substrate to obtain a second detection image; According to the second detection image, it is detected whether the second color filter structure in the filter layer has misalignment. ​ ​

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