Method, equipment and product for measuring motion error of optical-mechanical structure under microgravity

Abstract

The invention relates to the technical field of spaceflight, and particularly provides an optical-mechanical structure motion error measurement method, device and product under microgravity. The method comprises the following steps: acquiring a pre-constructed microgravity simulation device and a measurement platform; the measuring platform is used for fixing and supporting a to-be-measured optical machine structure, and the to-be-measured optical machine structure comprises an optical delay line and a fast reflecting mirror; under the condition that the trigger signal is received, the measuring platform does free falling motion in the microgravity simulation device; after the measurement platform completes the free falling motion, motion error data of the to-be-measured optical machine structure is acquired; wherein the kinematic error data of the optical delay line represents the rotational kinematic error of the optical machine structure to be measured in three degrees of freedom and the translational kinematic error in one direction, and the kinematic error data of the fast reflecting mirror represents the translational kinematic error in three directions. According to the invention, the rotation motion error data and the translation motion error data of the to-be-tested optical machine structure are obtained by respectively measuring the motion error data of the optical delay line and the fast reflecting mirror.

Description

Technical Field

[0001] This disclosure relates to the field of aerospace technology, and in particular to methods, equipment and products for measuring motion errors of optomechanical structures under microgravity. Background Technology

[0002] In the field of aerospace technology, spacecraft play a crucial role in missions such as Earth observation, astronomical observation, and space target surveillance. High-performance optical payloads, as core components for achieving these functions, consist of a series of complex optomechanical elements, some of which possess motion characteristics. In the microgravity environment of space, due to the lack of gravity constraints, the preload of these optomechanical elements fails, mechanical gaps are released, and the effects of friction and micro-vibrations are significantly amplified, leading to minute motion errors in the optomechanical elements. These motion errors, amplified through a long baseline propagation path, can have a significant impact on the performance of the optical payload. Therefore, studying the motion errors of optomechanical structures under microgravity conditions is of paramount importance for improving the performance and reliability of spacecraft.

[0003] In related technologies, optical frequency comb dispersive interferometry can measure the distance and angle information of a moving target by analyzing the interference spectrum generated by multiple pyramidal prisms on a single moving target. Grating pyramidal prism measurement, utilizing the principle of diffraction, can simultaneously measure the pitch angle and absolute distance of a single optical element. However, while these methods can measure the absolute distance, yaw, and pitch angles of a single moving target, they cannot simultaneously measure motion errors in three degrees of freedom: vertical translation and rotation. Therefore, they cannot meet the requirement for comprehensive measurement of motion errors in optomechanical structures under microgravity conditions. Summary of the Invention

[0004] In view of this, exemplary embodiments of the present disclosure provide a method, apparatus, and product for measuring motion errors of optomechanical structures under microgravity, in order to solve the problems existing in the related art.

[0005] One aspect of an exemplary embodiment of this disclosure provides a method for measuring the motion error of an optomechanical structure under microgravity, the method comprising: A pre-constructed microgravity simulation device and a measurement platform are obtained; the microgravity simulation device is a drop tower used to simulate the microgravity environment of space; the measurement platform is used to fix and support the optomechanical structure under test, which includes an optical delay line that can be translated in one dimension and a fast-reflecting mirror that can be rotated in two dimensions. Upon receiving a trigger signal, the measurement platform is made to undergo free fall motion within the microgravity simulation device; After the measurement platform completes its free fall motion, motion error data of the optomechanical structure under test is acquired; wherein, the motion error data of the optical delay line characterizes the rotational motion error in three degrees of freedom and the translational motion error in one direction of the optomechanical structure under test, and the motion error data of the fast-reflecting mirror characterizes the translational motion error in three directions.

[0006] In another aspect of exemplary embodiments of this disclosure, a computer device is provided, including a memory, a processor, and a computer program stored in the memory, the processor executing the computer program to implement the methods described in exemplary embodiments of this disclosure.

[0007] In another aspect of exemplary embodiments of this disclosure, a computer-readable storage medium is provided having a computer program / instructions stored thereon that, when executed by a processor, implements the methods described in exemplary embodiments of this disclosure.

[0008] In another aspect of exemplary embodiments of this disclosure, a computer program product is provided, including a computer program / instructions that, when executed by a processor, implement the methods described in exemplary embodiments of this disclosure.

[0009] As will be described in detail below, a method for measuring the motion error of an optomechanical structure under microgravity according to an embodiment of the present disclosure involves acquiring a pre-constructed microgravity simulation device and a measurement platform. The microgravity simulation device is a drop tower used to simulate the microgravity environment of space. The measurement platform is used to fix and support the optomechanical structure under test, which includes an optical retardation line capable of one-dimensional translational motion and a fast-reflecting mirror capable of two-dimensional rotation. Upon receiving a trigger signal, the measurement platform is made to undergo free fall motion in the microgravity simulation device. After the measurement platform completes the free fall motion, motion error data of the optomechanical structure under test is acquired. The motion error data of the optical retardation line represents the rotational motion error in three degrees of freedom and the translational motion error in one direction of the optomechanical structure under test, while the motion error data of the fast-reflecting mirror represents the translational motion error in three directions. Therefore, the method for measuring the motion error of an optomechanical structure under microgravity provided in this disclosure obtains the rotational motion error in three degrees of freedom of the optomechanical structure under test, as well as the translational motion error in one direction and the translational motion error in three directions by measuring the motion error data of the optical delay line and the fast reflection mirror respectively, thereby meeting the requirement of comprehensively measuring the motion error of the optomechanical structure under microgravity conditions. Attached Figure Description

[0010] The above and other objects, features, and advantages of this disclosure will become more apparent from the more detailed description of the embodiments thereof in conjunction with the accompanying drawings. The drawings are provided to further illustrate the embodiments of this disclosure and form part of the specification. They are used together with the embodiments of this disclosure to explain the disclosure and do not constitute a limitation thereof. In the drawings, the same reference numerals generally represent the same components or steps.

[0011] Figure 1 A flowchart illustrating the method for measuring the motion error of an optomechanical structure under microgravity provided in this embodiment of the disclosure; Figure 2 This is a schematic diagram of the dropping tower and measurement platform model provided in the embodiments of this disclosure; Figure 3 A schematic diagram of the optical delay line structure and degrees of freedom provided in the embodiments of this disclosure; Figure 4a A schematic diagram of the optical path after the K-mirror undergoes angular deflection, provided in an embodiment of this disclosure; Figure 4b This is a schematic diagram of the optical path after the K-mirror is displaced along the x-axis according to an embodiment of the present disclosure; Figure 5 A schematic diagram of the fast-reflecting mirror structure and its degrees of freedom provided in the embodiments of this disclosure; Figure 6a This is a schematic diagram of the optical path after the fast-reflecting mirror is displaced along the z-axis, as provided in an embodiment of this disclosure. Figure 6b A schematic diagram of the optical path after the fast-reflecting mirror is displaced along the x-axis and y-axis according to an embodiment of this disclosure; Figure 7 A schematic block diagram of the functional modules of the optomechanical structure motion error measurement device under microgravity provided in the embodiments of this disclosure; Figure 8 A structural block diagram of an electronic device provided in an embodiment of this disclosure; Figure 9 A schematic diagram of a computer program product provided in an embodiment of this disclosure. Detailed Implementation

[0012] Embodiments of this disclosure will now be described in more detail with reference to the accompanying drawings. While some embodiments of this disclosure are shown in the drawings, it should be understood that this disclosure can be implemented in various forms and should not be construed as limited to the embodiments set forth herein. Rather, these embodiments are provided to provide a more thorough and complete understanding of this disclosure. It should be understood that the accompanying drawings and embodiments of this disclosure are for illustrative purposes only and are not intended to limit the scope of protection of this disclosure.

[0013] It should be understood that the steps described in the method embodiments of this disclosure may be performed in different orders and / or in parallel. Furthermore, the method embodiments may include additional steps and / or omit the steps shown. The scope of this disclosure is not limited in this respect.

[0014] The term "comprising" and its variations as used herein are open-ended, meaning "including but not limited to". The term "based on" means "at least partially based on". The term "one embodiment" means "at least one embodiment"; the term "another embodiment" means "at least one additional embodiment"; the term "some embodiments" means "at least some embodiments". Definitions of other terms will be given in the description below. It should be noted that the concepts of "first", "second", etc., used in this disclosure are only used to distinguish different devices, modules, or units, and are not intended to limit the order of functions performed by these devices, modules, or units or their interdependencies.

[0015] It should be noted that the terms "a" and "a plurality of" used in this disclosure are illustrative rather than restrictive, and those skilled in the art should understand that, unless otherwise expressly indicated in the context, they should be understood as "one or more".

[0016] The names of messages or information exchanged between multiple devices in the embodiments of this disclosure are for illustrative purposes only and are not intended to limit the scope of such messages or information.

[0017] It is understood that before using the technical solutions disclosed in the various embodiments of this disclosure, users should be informed of the types, scope of use, and usage scenarios of the personal information involved in this disclosure in an appropriate manner in accordance with relevant laws and regulations, and user authorization should be obtained.

[0018] For example, upon receiving a user's active request, a prompt message is sent to the user to explicitly inform them that the requested operation will require the acquisition and use of the user's personal information. This allows the user to independently choose whether to provide personal information to the software or hardware, such as the electronic device, application, server, or storage medium performing the operations of this disclosed technical solution, based on the prompt message.

[0019] As an optional but non-limiting implementation, in response to a user's active request, sending a prompt message to the user can be done via a pop-up window, where the prompt message can be presented in text format. Furthermore, the pop-up window can also include a selection control allowing the user to choose "agree" or "disagree" to provide personal information to the electronic device. It is understood that the above notification and user authorization process is merely illustrative and does not constitute a limitation on the implementation of this disclosure; other methods that comply with relevant laws and regulations may also be applied to the implementation of this disclosure.

[0020] In the field of aerospace technology, spacecraft play a crucial role in missions such as Earth observation, astronomical observation, and space target surveillance. High-performance optical payloads, as core components for achieving these functions, consist of a series of complex optomechanical elements, some of which possess motion characteristics. In the microgravity environment of space, due to the lack of gravity constraints, the preload of these optomechanical elements fails, mechanical gaps are released, and the effects of friction and micro-vibrations are significantly amplified, leading to minute motion errors in the optomechanical elements. These motion errors, amplified through a long baseline propagation path, can have a significant impact on the performance of the optical payload. Therefore, studying the motion errors of optomechanical structures under microgravity conditions is of paramount importance for improving the performance and reliability of spacecraft.

[0021] In related technologies, optical frequency comb dispersive interferometry can measure the distance and angle information of a moving target by analyzing the interference spectrum generated by multiple pyramidal prisms on a single moving target. Grating pyramidal prism measurement, utilizing the principle of diffraction, can simultaneously measure the pitch angle and absolute distance of a single optical element. However, while these methods can measure the absolute distance, yaw, and pitch angles of a single moving target, they cannot simultaneously measure motion errors in three degrees of freedom: vertical translation and rotation. Therefore, they cannot meet the requirement for comprehensive measurement of motion errors in optomechanical structures under microgravity conditions.

[0022] Therefore, to address the aforementioned problems, this exemplary embodiment provides a method for measuring the motion error of an optomechanical structure under microgravity. It uses an optical delay line capable of one-dimensional translational motion and a fast-reflecting mirror capable of two-dimensional rotation as representatives of the optomechanical structure within the optomechanical payload, and designs a fixed optomechanical structure measurement platform covered by a vacuum shield. Through the measurement platform, the motion error of the optomechanical structure under test is decomposed into displacement in three directions and angular changes in three directions, and each degree of freedom is measured in real-time with high precision. This method enables comprehensive measurement of the motion error of the optomechanical structure under simulated microgravity conditions, while simultaneously achieving precise measurement of the motion errors in the three degrees of freedom: vertical translation and its own rotation angle.

[0023] For example, Figure 1 This is a flowchart illustrating the method for measuring the motion error of an optomechanical structure under microgravity provided in this embodiment of the disclosure. Figure 1 As shown, the specific steps may include: Step S110: Obtain the pre-constructed microgravity simulation device and measurement platform. The microgravity simulation device is a drop tower used to simulate the microgravity environment of space; the measurement platform is used to fix and support the optomechanical structure under test, which includes an optical delay line that can be translated in one dimension and a fast-reflecting mirror that can be rotated in two dimensions.

[0024] For example, Figure 2 This is a schematic diagram of the tower lowering and measurement platform model provided in an embodiment of this disclosure. Figure 2 As shown, the drop tower is an experimental device for a high-vacuum environment, with an internal vacuum level of approximately 1 Pa, used to simulate the microgravity and vacuum environment of space. Optical windows are installed on the tower walls to transmit laser and other measurement beams, ensuring the integrity of the measurement optical path.

[0025] The measurement platform is used to fix and support the optomechanical structure under test, which may include an optical delay line capable of one-dimensional translational motion and a fast-reflecting mirror capable of two-dimensional rotation. A vacuum isolation chamber covers the measurement platform, inside which the optomechanical structure under test and the measurement components are located to protect the internal equipment from external environmental influences.

[0026] Step S120: Upon receiving a trigger signal, the measurement platform is made to undergo free fall motion in the microgravity simulation device.

[0027] In this embodiment, a suspension and release device is installed on the drop tower. The measurement platform is suspended from the top of the drop tower by a suspension rope, which is connected to a controllable shearing device. At the start of the measurement, a trigger signal cuts the suspension rope, causing the measurement platform to undergo free fall within the drop tower, thereby simulating a microgravity environment.

[0028] Step S130: After the measurement platform completes its free fall motion, acquire the motion error data of the optomechanical structure under test. The motion error data of the optical delay line characterizes the rotational motion error in three degrees of freedom and the translational motion error in one direction of the optomechanical structure under test, while the motion error data of the fast-reflecting mirror characterizes the translational motion error in three directions.

[0029] During the measurement process, the measurement platform, which is equipped with an optical retardation line and a fast-reflecting mirror, is released. After the measurement platform completes its free-fall motion, the motion error data of the optomechanical structure under test is acquired and recorded in real time through the data acquisition system integrated within the measurement platform. The motion error data of the optical retardation line represents the rotational motion error of the optomechanical structure under test in three degrees of freedom and the translational motion error in one direction, while the motion error data of the fast-reflecting mirror represents the translational motion error in three directions.

[0030] Based on this, the measurement platform can simulate a microgravity environment by undergoing free fall motion in a drop tower with a vacuum of approximately 1 Pa. Furthermore, by separately measuring the motion error data of the optical retardation line and the fast-reflecting mirror, the rotational motion error in three degrees of freedom, the translational motion error in one direction, and the translational motion error in all three directions of the optomechanical structure under test can be obtained, thus meeting the requirement for comprehensive measurement of the motion error of the optomechanical structure under microgravity conditions.

[0031] Based on the above embodiments, in another embodiment provided in this disclosure, the structure of the optical delay line includes two K-mirrors, a displacement platform and an actuator; during the measurement process, one K-mirror remains stationary, while the other K-mirror moves along the displacement platform under the drive of the actuator.

[0032] For example, Figure 3 A schematic diagram of the optical delay line structure and degrees of freedom provided for embodiments of this disclosure. (See diagram below.) Figure 3 As shown, the optical delay line structure capable of one-dimensional translational motion consists of two K-mirrors, one of which can be translated along the y-axis direction under the drive of an actuator along a guide rail (displacement platform).

[0033] The motion of the K-mirror is used to simulate the minute motion errors of an optomechanical structure in a space environment. The motion error of the K-mirror is decomposed into three degrees of freedom of displacement (x, y, and z axes) and three degrees of freedom of angular change (rotation around the x-axis). α Angle of rotation about the y-axis β and the angle of rotation about the z-axis ).

[0034] z The direction of the axis is perpendicular to the paper and outwards, because z Since minute motion errors of the axes have no effect on the light propagation path, the main focus is on the displacement of the X-axis and the rotation angles around the x, y, and z axes. Therefore, the measurement of motion error of the axis can be decomposed into the measurement of the angular changes in the three degrees of freedom and the change in displacement along the x-axis.

[0035] Based on the above embodiments, in another embodiment provided in this disclosure, it may further include: Construct a K-mirror measurement system for optical delay lines; the K-mirror measurement system includes a laser, collimator, mirror, K-mirror, displacement platform, actuator, autocollimator, and position-sensitive detector.

[0036] In this embodiment, a laser is used to provide the laser beam required for measurement. A collimator is used to collimate the laser beam. A mirror is used to reflect the laser beam. The motion of the K-mirror is used to simulate the minute motion errors of the optomechanical structure under test in a space environment. A displacement platform serves as a guide for the translation of the K-mirror. An actuator is used to drive the K-mirror to translate along the y-axis on the displacement platform. An autocollimator is used to measure the rotation angles of the K-mirror about the x and z axes. A position-sensitive detector is used to measure the displacement of the K-mirror along the x-axis and the rotation angle about the y-axis.

[0037] A K-mirror measurement system may also include an optical support and a vacuum chamber. The optical support is used to fix the measurement equipment, and the vacuum chamber is used to house devices that are not vacuum-compatible, such as autocollimators and position-sensitive detectors.

[0038] Based on the above embodiments, in another embodiment provided in this disclosure, the above-mentioned method for measuring the motion error of optomechanical structures under microgravity further includes: The K-mirror measurement system was placed in a drop tower and allowed to fall freely. The rotation angles of mirror K around the x-axis and z-axis were measured using an autocollimator; The displacement of the K-mirror in the x-axis direction is measured using a position-sensitive detector; The rotation angle of the K-mirror around the y-axis was measured using a position-sensitive detector and an autocollimator.

[0039] In this embodiment, the motion error data of the optical delay line may include: the rotation angle of the K-mirror about the x, y and z axes, and the displacement of the K-mirror along the x-axis.

[0040] The measurement methods of the K-mirror measurement system may include: First, the K-mirror measurement platform is placed in a vacuum drop tower for free fall to simulate a microgravity environment. The K-mirror is fixed on a displacement platform, and its degree of freedom of movement along the y-axis is adjustable. All parts of the measurement platform are controlled wirelessly to ensure normal operation during free fall.

[0041] Next, angular deflection measurements are performed. A reflector is attached behind the K-mirror, and the rotation angles of the K-mirror around the x-axis and z-axis are transmitted through the reflector and precisely measured by an autocollimator. Rotation around the z-axis does not cause a change in the position of the laser spot on the position-sensitive detector, while rotation around the x-axis and y-axis will cause a change in the vertical position of the laser spot on the position-sensitive detector.

[0042] Next, displacement measurement is performed. The displacement of the K-mirror in the x-axis direction can be determined by measuring the position change of the light spot using a position-sensitive detector.

[0043] Finally, the rotation angle of the K-mirror about the y-axis is calculated. This rotation angle can be obtained from the measurements of the position-sensitive detector and the autocollimator. Specifically, the rotation angle about the y-axis is obtained by subtracting the spot offset caused by rotation about the x-axis as measured by the autocollimator from the overall spot offset measured by the position-sensitive detector.

[0044] For example, Figure 4a This is a schematic diagram of the optical path after the K-mirror produces an angular deflection, as provided in the embodiments of this disclosure. Figure 4a As shown, the black line represents the optical path without angular deflection by the K-mirror, while the red line represents the optical path with angular deflection by the K-mirror.

[0045] For example, Figure 4b This is a schematic diagram of the optical path after the K-mirror is displaced along the x-axis according to an embodiment of this disclosure, as shown below. Figure 4bAs shown, the black line represents the optical path where the K-mirror does not shift, and the red line represents the optical path where the K-mirror shifts.

[0046] The above measurement scheme enables high-precision measurement of the three-degree-of-freedom angular deflection and displacement along the x-axis of the K-mirror under microgravity conditions, providing data support for the study of motion errors of optomechanical structures in optical payloads.

[0047] Based on the above embodiments, in another embodiment provided in this disclosure, the fast-reflecting mirror includes a reflector and a piezoelectric deflector; during the measurement process, the two degrees of freedom of the reflector to rotate around the x and y directions are controlled by the piezoelectric deflector.

[0048] For example, Figure 5 A schematic diagram of the fast-reflecting mirror structure and its degrees of freedom provided in the embodiments of this disclosure. Figure 5 As shown, a fast reflector is a two-dimensional rotatable optomechanical structure, including a reflector and a piezoelectric deflector. The fast reflector is used to quickly adjust the beam direction, and the two degrees of freedom of the reflector to rotate around the x and y directions can be controlled by the piezoelectric deflector.

[0049] The motion error of a fast-reflecting mirror can be decomposed into displacements in three degrees of freedom (x, y, and z axes). Since rotation about the z-axis has no effect on the light propagation path, we are mainly concerned with the displacement changes of the mirror's center of gravity in the x, y, and z-axis directions.

[0050] Based on the above embodiments, in another embodiment provided in this disclosure, it may further include: Construct a fast-reflecting mirror measurement system; the fast-reflecting mirror measurement system includes: laser, collimator, corner cube prism, piezoelectric deflector, reflector, laser rangefinder, reflector target surface and position-sensitive detector.

[0051] In this embodiment, a laser is used to provide the laser beam required for measurement. A cornerstone prism is attached to the fast reflector to reflect the laser beam. A piezoelectric deflector is used to control the rotation of the reflector about the x and y axes. A laser rangefinder and a reflector target are used to measure the displacement of the fast reflector along the z-axis. A position-sensitive detector is used to measure the deflection of the reflected light, thus obtaining the displacement of the fast reflector in the x and y axes.

[0052] The fast-reflection mirror measurement system may also include an optical support and a vacuum chamber. The optical support is used to fix the measurement equipment, and the vacuum chamber is used to house devices that are not vacuum-compatible, such as position-sensitive detectors.

[0053] Based on the above embodiments, in another embodiment provided in this disclosure, the above-mentioned method for measuring the motion error of optomechanical structures under microgravity further includes: The fast-reflection mirror measurement system is placed in a drop tower and subjected to free fall. The displacement of the fast-reflecting mirror along the z-axis is obtained by measuring the change in optical path using a laser rangefinder and a reflector target surface. The displacement of the fast reflector in the x-axis and y-axis directions is measured using a position-sensitive detector.

[0054] In this embodiment, the motion error data of the fast-reflecting mirror may include the displacement of the fast-reflecting mirror along the x, y, and z axes.

[0055] The measurement methods of a fast-reflection mirror measurement system may include: First, the fast-reflecting mirror measurement platform is placed in a vacuum drop tower for free-fall motion to simulate a microgravity environment. The mirror is fixed by a piezoelectric deflector, and its rotational degrees of freedom around the x and y axes can be adjusted. All parts of the fast-reflecting mirror measurement platform are controlled wirelessly to ensure normal operation during free fall.

[0056] Next, z-axis displacement is measured. The displacement of the reflector along the z-axis can be calculated by measuring the change in optical path using a rangefinder and combining this with the angle between the light ray and the reflector. The laser rangefinder emits a laser beam to the reflector target surface and receives the reflected beam, thereby measuring the displacement change of the beam during its round trip. Specifically, when the reflector displaces along the z-axis, the optical path of the reflected light received by the laser rangefinder from the reflector target surface changes. By measuring this change, the displacement of the reflector in the z-axis direction can be accurately calculated.

[0057] Finally, the displacement of the fast-reflecting mirror in the x and y axes is measured. A corner prism is attached to the mirror; after the laser beam is reflected by the corner prism, the offset signal of the reflected light is received by a position-sensitive detector. By measuring the change in position of the reflected light on the detector, the displacement of the mirror in the x and y axes is indirectly obtained.

[0058] For example, Figure 6a This is a schematic diagram of the optical path after the fast-reflecting mirror is displaced along the z-axis according to an embodiment of this disclosure, as shown below. Figure 6a As shown, the black line represents the optical path without displacement of the fast-reflecting mirror, while the red line represents the optical path with displacement of the fast-reflecting mirror.

[0059] Figure 6b This is a schematic diagram of the optical path after the fast-reflecting mirror has been displaced along the x-axis and y-axis according to an embodiment of this disclosure, as shown below. Figure 6b As shown, the black line represents the optical path without displacement of the fast-reflecting mirror, while the red line represents the optical path with displacement of the fast-reflecting mirror.

[0060] Using the above measurement scheme, the displacement changes of the center of gravity of the mirror surface of a fast-reflecting mirror in three degrees of freedom can be measured simultaneously under simulated microgravity conditions.

[0061] One or more technical solutions provided in the exemplary embodiments of this disclosure, by simulating the free fall motion of the measurement platform in the drop tower, can achieve 10 -4 The microgravity conditions, even lower than g, meet the requirements for microgravity environment simulation. Secondly, the measurement platform employs vacuum cavity isolation, allowing for normal measurement even during free fall at a vacuum level of approximately 1 Pa, effectively simulating a vacuum environment. Furthermore, the motion error measurement method provided in this disclosure combines multiple measurement approaches, enabling simultaneous measurement of multiple degrees of freedom motion errors of a single optical element, thus providing a more accurate description of the optical element's motion. Finally, experimental results show that the single-channel ranging uncertainty of the above motion error measurement method is ≤ ±2 μm, the relative position measurement resolution along the x, y, and z axes is ≤ 3 μm, the relative attitude measurement resolution along the x, y, and z axes is ≤ ±5, and the measurement frequency reaches up to 500 Hz, enabling real-time and precise control of the element's motion state.

[0062] Therefore, the method for measuring the motion error of an optomechanical structure under microgravity provided in the exemplary embodiments of this disclosure not only provides a means to measure the motion error of an optomechanical structure under microgravity conditions, but also meets the need for comprehensive measurement of the motion error of an optomechanical structure under microgravity conditions.

[0063] The foregoing primarily describes the solutions provided by exemplary embodiments of this disclosure. It is understood that, in order to achieve the above functions, the electronic device includes corresponding hardware structures and / or software modules for performing each function. Those skilled in the art should readily recognize that, based on the units and algorithm steps of the various examples described in conjunction with the embodiments disclosed herein, this disclosure can be implemented in hardware or a combination of hardware and computer software. Whether a function is executed in hardware or by computer software driving hardware depends on the specific application and design constraints of the technical solution. Those skilled in the art can use different methods to implement the described functions for each specific application, but such implementation should not be considered beyond the scope of this disclosure.

[0064] The exemplary embodiments of this disclosure can divide the electronic device into functional units according to the above method examples. For example, each function can be divided into a separate functional module, or two or more functions can be integrated into a single processing module. The integrated module can be implemented in hardware or as a software functional module. It should be noted that the module division in the exemplary embodiments of this disclosure is illustrative and only represents one logical functional division; other division methods may be used in actual implementation.

[0065] By dividing each functional module according to its corresponding function, an exemplary embodiment of this disclosure provides a device for measuring the motion error of an optomechanical structure under microgravity. This device can be a server or a chip applied to a server. Figure 7 This is a schematic block diagram of the functional modules of the optomechanical structure motion error measurement device under microgravity provided in an embodiment of this disclosure. Figure 7 As shown, the microgravity-based optomechanical structure motion error measurement device 700 includes: The data acquisition module 710 is used to acquire a pre-constructed microgravity simulation device and a measurement platform; the microgravity simulation device is a drop tower used to simulate the microgravity environment of space; the measurement platform is used to fix and support the optomechanical structure under test, which includes an optical delay line that can be translated in one dimension and a fast-reflecting mirror that can be rotated in two dimensions. The data processing module 720 is used to cause the measurement platform to undergo free fall motion in the microgravity simulation device upon receiving a trigger signal. The data processing module 720 is further configured to acquire motion error data of the optomechanical structure under test after the measurement platform completes free fall motion; wherein, the motion error data of the optical delay line characterizes the rotational motion error of the optomechanical structure under test in three degrees of freedom and the translational motion error in one direction, and the motion error data of the fast-reflecting mirror characterizes the translational motion error in three directions.

[0066] In another embodiment provided in this disclosure, the data processing module 720 further includes: the structure of the optical delay line includes two K-mirrors, a displacement platform and an actuator; during the measurement process, one K-mirror remains stationary, while the other K-mirror moves along the displacement platform under the drive of the actuator.

[0067] In another embodiment provided in this disclosure, the data processing module 720 is further configured to construct a K-mirror measurement system for the optical delay line; the K-mirror measurement system includes a laser, a collimator, a reflector, a K-mirror, a displacement platform, an actuator, an autocollimator, and a position-sensitive detector.

[0068] In another embodiment provided in this disclosure, the data processing module 720 is further configured to place the K-mirror measurement system in a drop tower for free fall motion; measure the rotation angle of the K-mirror around the x-axis and z-axis using the autocollimator; measure the displacement of the K-mirror in the x-axis direction using the position-sensitive detector; and measure the rotation angle of the K-mirror around the y-axis using the position-sensitive detector and the autocollimator.

[0069] In another embodiment provided in this disclosure, the data processing module 720 further includes: the fast-reflecting mirror includes a reflector and a piezoelectric deflector; during the measurement process, the two degrees of freedom of the reflector to rotate around the x and y directions are controlled by the piezoelectric deflector.

[0070] In another embodiment provided in this disclosure, the data processing module 720 is further configured to construct a fast-reflecting mirror measurement system; the fast-reflecting mirror measurement system includes a laser, a collimator, a corner cube prism, a piezoelectric deflector, a reflector, a laser rangefinder, a reflector target surface, and a position-sensitive detector.

[0071] In another embodiment provided in this disclosure, the data processing module 720 is further configured to place the fast reflector measurement system on a drop tower for free fall motion; measure the change in optical path using the laser rangefinder and the reflector target surface to obtain the displacement of the fast reflector along the z-axis; and measure the displacement of the fast reflector in the x-axis and y-axis directions using the position-sensitive detector.

[0072] Exemplary embodiments of this disclosure also provide an electronic device, including: at least one processor; and a memory communicatively connected to the at least one processor. The memory stores a computer program executable by the at least one processor, the computer program being executed by the at least one processor to cause the electronic device to perform a method according to an embodiment of this disclosure.

[0073] Exemplary embodiments of this disclosure also provide a non-transitory computer-readable storage medium storing a computer program, wherein the computer program, when executed by a computer's processor, is used to cause the computer to perform a method according to embodiments of this disclosure.

[0074] Figure 8 The structural block diagram of the electronic device provided in the embodiments of this disclosure will now be described as follows: An electronic device 800 that can serve as a server or client of this disclosure is an example of a hardware device that can be applied to various aspects of this disclosure. The electronic device is intended to represent various forms of digital electronic computer devices, such as laptop computers, desktop computers, workstations, personal digital assistants, servers, blade servers, mainframe computers, and other suitable computers. The electronic device can also represent various forms of mobile devices, such as personal digital processors, cellular phones, smartphones, wearable devices, and other similar computing devices. The components shown herein, their connections and relationships, and their functions are merely examples and are not intended to limit the implementation of the disclosure described and / or claimed herein.

[0075] like Figure 8As shown, the electronic device 800 includes a computing unit 801, which can perform various appropriate actions and processes based on a computer program stored in a read-only memory (ROM) 802 or a computer program loaded from a storage unit 808 into a random access memory (RAM) 803. The RAM 803 may also store various programs and data required for the operation of the electronic device 800. The computing unit 801, ROM 802, and RAM 803 are interconnected via a bus 804. An input / output (I / O) interface 805 is also connected to the bus 804.

[0076] Multiple components in electronic device 800 are connected to I / O interface 805, including: input unit 806, output unit 807, storage unit 808, and communication unit 809. Input unit 806 can be any type of device capable of inputting information to electronic device 800. Input unit 806 can receive input digital or character information and generate key signal inputs related to user settings and / or function control of electronic device. Output unit 807 can be any type of device capable of presenting information and may include, but is not limited to, a display, speaker, video / audio output terminal, vibrator, and / or printer. Storage unit 808 may include, but is not limited to, disks and optical discs. Communication unit 809 allows electronic device 800 to exchange information / data with other devices through computer networks such as the Internet and / or various telecommunications networks, and may include, but is not limited to, modems, network cards, infrared communication devices, wireless communication transceivers, and / or chipsets, such as Bluetooth™ devices, WiFi devices, WiMax devices, cellular communication devices, and / or the like.

[0077] The computing unit 801 can be a variety of general-purpose and / or special-purpose processing components with processing and computing capabilities. Some examples of the computing unit 801 include, but are not limited to, a central processing unit (CPU), a graphics processing unit (GPU), various special-purpose artificial intelligence (AI) computing chips, various computing units running machine learning model algorithms, a digital signal processor (DSP), and any suitable processor, controller, microcontroller, etc. The computing unit 801 performs the various methods and processes described above. The various methods described above can all be implemented as computer software programs, which are tangibly contained in a machine-readable medium, such as storage unit 808. In some embodiments, part or all of the computer program can be loaded and / or installed on the electronic device 800 via ROM 802 and / or communication unit 809.

[0078] Figure 9The diagram illustrates a computer program product provided in an embodiment of this disclosure. An exemplary embodiment of this disclosure also provides a computer program product 900, including a computer program 901, wherein the computer program 901, when executed by a computer's processor, is used to cause the computer to perform a method according to an embodiment of this disclosure.

[0079] The program code used to implement the methods of this disclosure may be written in any combination of one or more programming languages. This program code may be provided to a processor or controller of a general-purpose computer, special-purpose computer, or other programmable data processing apparatus, such that when executed by the processor or controller, the program code causes the functions / operations specified in the flowcharts and / or block diagrams to be implemented. The program code may be executed entirely on a machine, partially on a machine, as a standalone software package partially on a machine and partially on a remote machine, or entirely on a remote machine or server.

[0080] In the context of this disclosure, a machine-readable medium can be a tangible medium that may contain or store a program for use by or in conjunction with an instruction execution system, apparatus, or device. A machine-readable medium can be a machine-readable signal medium or a machine-readable storage medium. A machine-readable medium can be, but is not limited to, electronic, magnetic, optical, electromagnetic, infrared, or semiconductor systems, apparatus, or devices, or any suitable combination of the foregoing. More specific examples of machine-readable storage media include electrical connections based on one or more wires, portable computer disks, hard disks, random access memory (RAM), read-only memory (ROM), erasable programmable read-only memory (EPROM or flash memory), optical fiber, portable compact disk read-only memory (CD-ROM), optical storage devices, magnetic storage devices, or any suitable combination of the foregoing.

[0081] As used in this disclosure, the terms "machine-readable medium" and "computer-readable medium" refer to any computer program product, device, and / or apparatus (e.g., disk, optical disk, memory, programmable logic device (PLD)) for providing machine instructions and / or data to a programmable processor, including machine-readable media that receive machine instructions as machine-readable signals. The term "machine-readable signal" refers to any signal for providing machine instructions and / or data to a programmable processor.

[0082] To provide interaction with a user, the systems and techniques described herein can be implemented on a computer having: a display device for displaying information to the user (e.g., a CRT (cathode ray tube) or LCD (liquid crystal display) monitor); and a keyboard and pointing device (e.g., a mouse or trackball) through which the user provides input to the computer. Other types of devices can also be used to provide interaction with the user; for example, feedback provided to the user can be any form of sensory feedback (e.g., visual feedback, auditory feedback, or tactile feedback); and input from the user can be received in any form (including sound input, voice input, or tactile input).

[0083] The systems and technologies described herein can be implemented in computing systems that include backend components (e.g., as a data server), or computing systems that include middleware components (e.g., an application server), or computing systems that include frontend components (e.g., a user computer with a graphical user interface or web browser through which a user can interact with implementations of the systems and technologies described herein), or any combination of such backend, middleware, or frontend components. The components of the system can be interconnected via digital data communication of any form or medium (e.g., a communication network). Examples of communication networks include local area networks (LANs), wide area networks (WANs), and the Internet.

[0084] Computer systems can include clients and servers. Clients and servers are generally located far apart and typically interact through communication networks. Client-server relationships are created by computer programs running on the respective computers and having a client-server relationship with each other.

[0085] In the above embodiments, implementation can be achieved, in whole or in part, through software, hardware, firmware, or any combination thereof. When implemented using software, it can be implemented, in whole or in part, as a computer program product. The computer program product includes one or more computer programs or instructions. When the computer program or instructions are loaded and executed on a computer, the processes or functions described in the embodiments of this disclosure are performed, in whole or in part. The computer can be a general-purpose computer, a special-purpose computer, a computer network, a terminal, a user equipment, or other programmable device. The computer program or instructions can be stored in a computer-readable storage medium or transferred from one computer-readable storage medium to another. For example, the computer program or instructions can be transferred from one website, computer, server, or data center to another website, computer, server, or data center via wired or wireless means. The computer-readable storage medium can be any available medium accessible to a computer or a data storage device such as a server or data center integrating one or more available media. The available medium can be a magnetic medium, such as a floppy disk, hard disk, or magnetic tape; it can also be an optical medium, such as a digital video disc (DVD); or it can be a semiconductor medium, such as a solid-state drive (SSD).

[0086] Although this disclosure has been described in conjunction with specific features and embodiments, it will be apparent that various modifications and combinations can be made therein without departing from the spirit and scope of this disclosure. Accordingly, this specification and drawings are merely exemplary illustrations of the disclosure as defined by the appended claims and are to be considered as covering any and all modifications, variations, combinations, or equivalents within the scope of this disclosure. It is obvious that those skilled in the art can make various alterations and modifications to this disclosure without departing from its spirit and scope. Thus, this disclosure is also intended to include any such modifications and modifications that fall within the scope of the claims of this disclosure and their equivalents.

Claims

1. A method for measuring the motion error of an optomechanical structure under microgravity, characterized in that, The method includes: A pre-constructed microgravity simulation device and a measurement platform are obtained; the microgravity simulation device is a drop tower used to simulate the microgravity environment of space; the measurement platform is used to fix and support the optomechanical structure under test, which includes an optical delay line that can be translated in one dimension and a fast-reflecting mirror that can be rotated in two dimensions. Upon receiving a trigger signal, the measurement platform is made to undergo free fall motion within the microgravity simulation device; After the measurement platform completes its free fall motion, motion error data of the optomechanical structure under test is acquired; wherein, the motion error data of the optical delay line characterizes the rotational motion error of the optomechanical structure under test in three degrees of freedom and the translational motion error in one direction, and the motion error data of the fast-reflecting mirror characterizes the translational motion error in three directions.

2. The method according to claim 1, characterized in that, The optical delay line consists of two K-mirrors, a displacement platform, and an actuator. During the measurement process, one K-mirror remains stationary while the other K-mirror moves along the displacement platform under the drive of the actuator.

3. The method according to claim 2, characterized in that, The method further includes: Construct a K-mirror measurement system for the optical delay line; the K-mirror measurement system includes a laser, a collimator, a mirror, a K-mirror, a displacement platform, an actuator, an autocollimator, and a position-sensitive detector.

4. The method according to claim 3, characterized in that, The method further includes: The K-mirror measurement system was placed in a drop tower and allowed to fall freely. The rotation angles of the K-mirror around the x-axis and z-axis are measured using the autocollimator. The displacement of the K-mirror in the x-axis direction is measured using the position-sensitive detector. The rotation angle of the K-mirror around the y-axis is measured using the position-sensitive detector and the autocollimator.

5. The method according to claim 1, characterized in that, The fast-reflecting mirror includes a reflector and a piezoelectric deflector; during the measurement process, the two degrees of freedom of the reflector to rotate around the x and y directions are controlled by the piezoelectric deflector.

6. The method according to claim 5, characterized in that, The method further includes: A fast-reflecting mirror measurement system is constructed; the fast-reflecting mirror measurement system includes a laser, a collimator, a corner cube prism, a piezoelectric deflector, a reflector, a laser rangefinder, a reflector target surface, and a position-sensitive detector.

7. The method according to claim 6, characterized in that, The method further includes: The fast-reflection mirror measurement system is placed in a drop tower for free fall. The displacement of the fast-reflecting mirror along the z-axis is obtained by measuring the change in optical path using the laser rangefinder and the reflector target surface. The displacement of the fast-reflecting mirror in the x-axis and y-axis directions is measured by the position-sensitive detector.

8. A computer device, comprising a memory, a processor, and a computer program stored in the memory, characterized in that, The processor executes the computer program to implement the method of claim 1.

9. A computer-readable storage medium having a computer program / instructions stored thereon, characterized in that, When the computer program / instruction is executed by the processor, it implements the method of claim 1.

10. A computer program product comprising a computer program / instructions, characterized in that, When the computer program / instruction is executed by the processor, it implements the method of claim 1.

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