Self-adaptive MIPI eye pattern pressure testing method and system and storage medium

Abstract

The invention provides a self-adaptive MIPI eye pattern pressure test method and system and a storage medium, and the method comprises the steps: obtaining a test specification and a product specification to set a qualified threshold set, a limit threshold set and initial pressure information, coupling a pressure signal to a to-be-tested MIPI interface, and synchronously collecting eye pattern parameters such as eye height, eye width and jitter; real-time eye pattern parameters are compared with a qualified threshold set, pressure information is updated according to a pressure enhancement strategy, and testing is carried out again, so that pressure is gradually enhanced; if the parameters are not superior to the qualified threshold values, further comparing the parameters with the limit threshold value set, performing fine adjustment and iterative testing through a pressure fine adjustment strategy, and stopping testing and automatically generating a report until the parameters exceed the limit threshold values; therefore, the performance boundary of the MIPI interface under the composite pressure is automatically and accurately positioned, and the test intelligence level and the reliability evaluation efficiency are improved.

Description

Technical Field

[0001] This invention relates to the field of MIPI interface testing, and more specifically, to an adaptive MIPI eye diagram stress testing method, system, and storage medium. Background Technology

[0002] With the rapid development of mobile communications, automotive electronics, and IoT devices, MIPI interfaces (Mobile Industry Processor Interfaces, such as C-PHY, D-PHY, and M-PHY) have become the mainstream standard for data transmission between key modules such as cameras and displays. Their signal integrity and transmission reliability have become core factors affecting overall system performance. In complex real-world application environments, MIPI interfaces often face multiple pressures, including electromagnetic interference, power supply noise, and timing jitter. Therefore, conducting systematic, efficient, and realistic stress tests during the R&D and production stages is essential to ensure product quality and reliability.

[0003] Current testing technologies for signal integrity assessment of MIPI interfaces, especially eye diagram testing, generally suffer from significant shortcomings. First, testing schemes heavily rely on expensive hardware such as high-bandwidth oscilloscopes and dedicated test fixtures, resulting in high testing costs. Second, the testing scenarios are limited and detached from reality. Existing methods are typically conducted in idealized laboratory environments, failing to effectively simulate the complex combined stress conditions in real-world applications. For example, in automotive electronics, wideband noise, rapid temperature changes, and power supply transient drops create a combined interference, leading to discrepancies between test results and actual performance. Third, the testing process heavily relies on manual operation and experience-based judgment. From stress application and signal acquisition to result analysis, manual intervention is required, resulting in low automation. Finally, existing technologies mostly focus on single stress sources or static testing, lacking a comprehensive solution that can integrate multiple stress sources at the system level and dynamically and adaptively adjust the testing strategy based on the real-time response of the device under test. This makes it impossible to accurately pinpoint the true performance boundaries and failure thresholds of the device. Therefore, there is an urgent need for an intelligent testing technology that achieves low cost, high automation, and the ability to simulate complex real-world environmental stresses. Summary of the Invention

[0004] In view of the above problems, the purpose of this invention is to provide an adaptive MIPI eye diagram stress testing method, system and storage medium. By acquiring the test specification, it automatically sets two threshold sets of qualified and extreme levels, applies interference based on the initial stress information, and then adaptively selects stress enhancement or fine-tuning strategies for iterative testing based on the comparison results of real-time eye diagram parameters and thresholds, until the performance boundary is accurately located and a report is generated, realizing the leap from static testing to dynamic optimization. Specifically, firstly, by introducing an automated parsing and initial configuration model, accurate initialization of threshold and pressure parameters is achieved, improving configuration efficiency. Secondly, by employing an independently programmable pressure source module, flexible synthesis and coupling of noise, timing, and power supply interference are realized to simulate complex stress under complex environments. Thirdly, standardized logical comparison rules ensure the objectivity of the parameter comparison process and the reliability of decision-making, providing a solid basis for adaptive looping. Finally, through preset or intelligent pressure enhancement strategies, controllable pressure intensity increases are achieved, quickly pushing the equipment from the normal operating range to the critical range. Simultaneously, through a fine-tuning pressure strategy, small-step or combined adjustments are made within the performance critical range to achieve high-resolution positioning of the failure inflection point. Thus, a low-cost, highly automated, high-precision system-level pressure testing capability that reflects real-world operating conditions is achieved.

[0005] The first aspect of this invention provides an adaptive MIPI eye diagram stress testing method, the method comprising: Obtain test specifications and product specifications to obtain the set of acceptable thresholds, the set of extreme thresholds, and initial pressure information; Based on the initial or updated pressure information, a pressure source signal is coupled to the MIPI interface under test, and the output signal is acquired to extract eye diagram information. The eye diagram information is compared with the qualified threshold set; If all eye diagram parameters are better than the qualified threshold, the pressure information is updated and the test is repeated based on the preset pressure enhancement strategy. If any eye diagram parameter is not better than the qualified threshold, the eye diagram information is compared with the set of extreme thresholds. If all eye diagram parameters do not exceed the limit threshold, the pressure information is updated and the test is repeated based on the preset pressure fine-tuning strategy. If any eye diagram parameter exceeds the limit threshold, the pressure source signal is stopped, and a test report is generated based on the eye diagram information.

[0006] In this solution, obtaining the test specifications and product specifications to obtain the qualified threshold set, the extreme threshold set, and the initial pressure information specifically includes: Obtain the entered MIPI test protocol specification, parse it to obtain the set of qualified thresholds; Based on the qualified threshold set, and using a preset threshold tightening algorithm, the extreme threshold set is obtained; Obtain the entered product specification sheet, parse it, and input it into the initial pressure configuration model to obtain the initial pressure information; The initial pressure information includes at least the noise amplitude level, timing offset level, and power jitter level.

[0007] In this solution, the step of coupling a pressure source signal to the MIPI interface under test based on the initial pressure information or the updated pressure information specifically includes: Extract the pressure information to obtain a first noise amplitude level, a first timing offset level, and a first power supply jitter level; The programmable noise source is controlled according to the first noise amplitude level to output a noise signal; The programmable delay line is controlled according to the first timing offset level, and a timing offset signal is output. The programmable power supply interference source is controlled according to the first power supply jitter level, and a power supply jitter signal is output. At least one of the noise signal, timing offset signal, and power jitter signal is coupled and injected into the signal transmission path of the MIPI interface under test.

[0008] In this solution, comparing the eye diagram parameters with the qualified threshold set and comparing the eye diagram parameters with the extreme threshold set specifically includes: The eye diagram information is parsed to obtain at least one eye diagram parameter; Each real-time eye diagram parameter is compared one by one with the threshold corresponding to the qualified threshold set based on the first logical comparison rule to obtain the first logical result. The first logical comparison rule is used to determine whether a parameter is better than its corresponding qualified threshold. Each real-time eye diagram parameter is compared one by one with the threshold corresponding to the set of limit thresholds based on the second logical comparison rule to obtain the second logical result; The second logical comparison rule is used to determine whether a parameter exceeds its corresponding limit threshold.

[0009] In this solution, updating the pressure information based on a preset pressure enhancement strategy specifically includes: Based on the current pressure information and the preset pressure stepping rules, the enhanced pressure source strength parameters are obtained. The pressure stepping rule includes at least: applying a preset fixed increment to the intensity of all pressure sources; applying an increase to the intensity of all pressure sources according to a preset ratio of the current intensity; or, extracting historical eye diagram parameter change features, inputting them into a pre-trained pressure enhancement model, obtaining a first pressure source, and setting the intensity increment of the first pressure source according to a fixed or dynamic setting. Update the enhanced pressure source strength parameters to the pressure information used in the next test.

[0010] In this solution, updating the pressure information based on a preset pressure fine-tuning strategy specifically includes: Based on the current pressure information, eye diagram parameters, and comparison results with the qualified threshold set and the extreme threshold set, the adjusted pressure information is obtained based on the preset pressure fine-tuning rules. The pressure fine-tuning rules include at least: uniformly reducing the intensity of all current pressure sources by a preset fine-tuning step size; keeping the intensity of some pressure sources unchanged while adjusting the intensity of another part of the pressure sources; or changing the combination of applied pressure source types. The adjusted pressure information is then updated to the pressure information to be used in the next test.

[0011] A second aspect of the present invention provides an adaptive MIPI eye diagram stress testing system, comprising an adaptive MIPI eye diagram stress testing method program, wherein the adaptive MIPI eye diagram stress testing method program, when executed by the processor, performs the following steps: Obtain test specifications and product specifications to obtain the set of acceptable thresholds, the set of extreme thresholds, and initial pressure information; Based on the initial or updated pressure information, a pressure source signal is coupled to the MIPI interface under test, and the output signal is acquired to extract eye diagram information. The eye diagram information is compared with the qualified threshold set; If all eye diagram parameters are better than the qualified threshold, the pressure information is updated and the test is repeated based on the preset pressure enhancement strategy. If any eye diagram parameter is not better than the qualified threshold, the eye diagram information is compared with the set of extreme thresholds. If all eye diagram parameters do not exceed the limit threshold, the pressure information is updated and the test is repeated based on the preset pressure fine-tuning strategy. If any eye diagram parameter exceeds the limit threshold, the pressure source signal is stopped, and a test report is generated based on the eye diagram information.

[0012] A third aspect of the present invention provides a computer-readable storage medium comprising an adaptive MIPI eye diagram stress testing method program, wherein when executed by a processor, the adaptive MIPI eye diagram stress testing method program implements the steps of the adaptive MIPI eye diagram stress testing method as described in any of the preceding claims.

[0013] This invention provides an adaptive MIPI eye diagram stress testing method, system, and storage medium. It acquires test specifications and product specifications to set a pass threshold set, a limit threshold set, and initial stress information, and couples a stress signal to the MIPI interface under test, simultaneously acquiring eye diagram parameters such as eye height, eye width, and jitter. By comparing real-time eye diagram parameters with the pass threshold set, the stress information is updated according to a stress enhancement strategy, and the test is repeated to gradually increase the stress. If any parameter is not better than the pass threshold, it is further compared with the limit threshold set, and fine adjustments and iterative tests are performed through a stress fine-tuning strategy until any parameter exceeds the limit threshold. At this point, the test stops, and a report is automatically generated. This achieves automatic and accurate positioning of the MIPI interface's performance boundaries under combined stress, improving the level of testing intelligence and reliability assessment efficiency. Attached Figure Description

[0014] To more clearly illustrate the technical solutions of the embodiments of the present invention, the accompanying drawings used in the embodiments will be briefly described below. It should be understood that the following drawings only show some embodiments of the present invention and should not be regarded as a limitation on the scope.

[0015] Figure 1 A flowchart of an adaptive MIPI eye diagram stress testing method according to the present invention is shown; Figure 2 A flowchart illustrating the configuration of initial pressure information and threshold set provided by an embodiment of the present invention is shown. Figure 3 A flowchart illustrating the coupling of a pressure signal according to an embodiment of the present invention is shown; Figure 4 A block diagram of an adaptive MIPI eye diagram stress testing system according to the present invention is shown. Detailed Implementation

[0016] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0017] Unless otherwise defined, all terms (including technical and scientific terms) used in embodiments of this invention shall have the same meaning as commonly understood by one of ordinary skill in the art to which this invention pertains. It should also be understood that terms such as those defined in a common dictionary shall be interpreted as having a meaning consistent with their meaning in the context of the relevant art, and not as being interpreted in an idealized or highly formalized sense, unless expressly defined in this embodiment of the invention.

[0018] The terms "first," "second," and similar words used in the embodiments of this invention do not indicate any order, quantity, or importance, but are merely used to distinguish different components. Terms such as "an," "a," or "the" do not indicate a quantity limitation, but rather indicate the presence of at least one. Similarly, terms such as "including" or "comprising" mean that the element or object preceding the word encompasses the elements or objects listed after the word and their equivalents, without excluding other elements or objects. Terms such as "connected" or "linked" are not limited to physical or mechanical connections, but can include electrical connections, whether direct or indirect. The steps preceding or following the steps in the method of the embodiments of this invention are not necessarily performed precisely in sequence. Instead, various steps can be processed in reverse order or simultaneously. Furthermore, other operations can be added to these processes, or one or more steps can be removed from these processes.

[0019] In addition, the functional modules in the various embodiments of the present invention can be integrated together to form an independent part, or each module can exist independently, or two or more modules can be integrated to form an independent part.

[0020] Figure 1 A flowchart of an adaptive MIPI eye diagram stress testing method according to the present invention is shown.

[0021] like Figure 1 As shown, the first aspect of the present invention discloses an adaptive MIPI eye diagram stress testing method, the method comprising: S102, obtain test specifications and product specifications, and obtain the qualified threshold set, the extreme threshold set and the initial pressure information; S104, based on the initial pressure information or the updated pressure information, couple the pressure source signal to the MIPI interface under test, and collect the output signal to extract eye diagram information; S106, compare the eye diagram information with the qualified threshold set; S108, If all eye diagram parameters are better than the qualified threshold, then based on the preset pressure enhancement strategy, update the pressure information and retest. S110, if any eye diagram parameter is not better than the qualified threshold, then the eye diagram information is compared with the set of limit thresholds; S112, If all eye diagram parameters do not exceed the limit threshold, then based on the preset pressure fine-tuning strategy, update the pressure information and retest; S114. If any eye diagram parameter exceeds the limit threshold, stop applying the pressure source signal and generate a test report based on the eye diagram information.

[0022] The pressure information refers to the intensity of the pressure source, which includes at least noise amplitude, timing offset, and power supply jitter; the eye diagram information includes multiple eye diagram parameters, which include at least eye height, eye width, and jitter amplitude parameters.

[0023] It should be noted that in this embodiment, firstly, the testing system automatically parses and sets the qualified threshold set and the extreme threshold set according to the input test specifications and product specifications, and simultaneously generates initial pressure information including noise amplitude, timing offset, and power supply jitter intensity level. Subsequently, the testing system controls a programmable pressure source to couple corresponding interference signals into the signal path of the MIPI interface under test based on this initial pressure information, and simultaneously collects the output signal after interference. Eye diagram information including parameters such as eye height, eye width, and jitter amplitude is extracted using digital signal processing algorithms. Next, the testing system compares the real-time eye diagram parameters with the qualified threshold set one by one. If all parameters are better than the qualified threshold, a preset pressure enhancement strategy is invoked to calculate the enhanced pressure information, and the pressure configuration is updated accordingly before restarting the test, forming a positive pressure ramp-up cycle. If any parameter is not better than the qualified threshold, the eye diagram parameters are further compared with the extreme threshold set. If all parameters do not exceed the extreme threshold, a pressure fine-tuning strategy is invoked to finely adjust the pressure information before continuing iterative testing to accurately map the performance critical range. If any parameter exceeds the limit threshold, the performance boundary is determined to have been reached. Pressure application is stopped, and a test report containing the pressure-performance correspondence throughout the entire process is automatically generated. This embodiment achieves automated and intelligent exploration of the performance boundary of the MIPI interface under complex pressure through closed-loop control of two-level threshold comparison and adaptive pressure adjustment, thereby improving testing efficiency and positioning accuracy.

[0024] Figure 2 A flowchart illustrating the configuration of initial pressure information and threshold set provided by an embodiment of the present invention is shown.

[0025] According to embodiments of the present invention, such as Figure 2 As shown, the process of obtaining test specifications and product specifications to obtain the qualified threshold set, the extreme threshold set, and the initial pressure information specifically includes: S202, obtain the entered MIPI test protocol specification, parse it to obtain the qualified threshold set; S204, Based on the qualified threshold set, and using a preset threshold tightening algorithm, obtain the extreme threshold set; S206, Obtain the entered product specification sheet, parse it, and input it into the initial pressure configuration model to obtain the initial pressure information; S208, the initial pressure information includes at least the noise amplitude level, timing offset level, and power supply jitter level.

[0026] It should be noted that in this embodiment, the testing system receives the MIPI protocol specification text entered by the user. Through a natural language parsing and key parameter extraction module, it automatically identifies and converts qualified thresholds for parameters such as eye height, eye width, and jitter, forming a qualified threshold set. Subsequently, based on a preset threshold tightening algorithm, such as compression at a fixed ratio or derivation based on a statistical model, the testing system generates a more stringent set of extreme thresholds from the qualified threshold set, serving as a target for performance boundary exploration. Simultaneously, the testing system receives the product specification input and sends it along with the selected test scenario information into the initial stress configuration model. This initial stress configuration model outputs adapted initial stress information, including noise amplitude level, timing offset level, and power jitter level, based on historical data or a typical configuration library. This embodiment ensures the accuracy, consistency, and traceability of thresholds and initial stress values ​​through automated parsing and model-based configuration.

[0027] Figure 3 A flowchart illustrating the coupling of a pressure signal according to an embodiment of the present invention is shown.

[0028] According to embodiments of the present invention, such as Figure 3 As shown, the step of coupling a pressure source signal to the MIPI interface under test based on the initial pressure information or the updated pressure information specifically includes: S302, extract the pressure information to obtain the first noise amplitude level, the first timing offset level and the first power supply jitter level; S304 controls a programmable noise source according to a first noise amplitude level and outputs a noise signal; S306 controls the programmable delay line according to the first timing offset level and outputs a timing offset signal; S308 controls a programmable power interference source based on the first power jitter level and outputs a power jitter signal; S310, at least one of the noise signal, timing offset signal and power jitter signal is coupled and injected into the signal transmission path of the MIPI interface under test.

[0029] It should be noted that in this embodiment, the test system extracts the first noise amplitude level, the first timing offset level, and the first power jitter level from the current pressure information. Based on the first noise amplitude level, a programmable noise source is controlled to generate a noise signal with corresponding spectral characteristics and amplitude. Based on the first timing offset level, a programmable delay line is controlled to generate a precise clock or data delay signal. Based on the first power jitter level, a programmable power interference source is controlled to output a power ripple or transient drop signal with a specific frequency and amplitude. Subsequently, the test system injects one or more of the above interference signals into the transmission link of the MIPI interface under test through a signal coupling circuit. This embodiment generates various types of interference through independent programmable modules, supports flexible combinations of pressure types and intensity control, and can accurately simulate composite stress conditions in real-world environments, thereby achieving a comprehensive evaluation of the MIPI interface's anti-interference capability.

[0030] According to an embodiment of the present invention, comparing the eye diagram parameters with a set of acceptable thresholds and comparing the eye diagram parameters with a set of limiting thresholds specifically includes: The eye diagram information is parsed to obtain at least one eye diagram parameter; Each real-time eye diagram parameter is compared one by one with the threshold corresponding to the qualified threshold set based on the first logical comparison rule to obtain the first logical result. The first logical comparison rule is used to determine whether a parameter is better than its corresponding qualified threshold. Each real-time eye diagram parameter is compared one by one with the threshold corresponding to the set of limit thresholds based on the second logical comparison rule to obtain the second logical result; The second logical comparison rule is used to determine whether a parameter exceeds its corresponding limit threshold.

[0031] It should be noted that in this embodiment, the testing system first parses and processes the real-time acquired eye diagram information, extracting a parameter sequence that includes at least eye height, eye width, and jitter amplitude. During the first-level comparison, the testing system compares each real-time eye diagram parameter with its corresponding threshold in the qualified threshold set, according to a first logical comparison rule of "whether it is better than or equal to," obtaining a set of first logical results. Based on the comparison results of all parameters, the testing system determines whether all parameters are better than the qualified threshold. During the second-level comparison, the testing system compares each real-time eye diagram parameter with its corresponding threshold in the extreme threshold set, according to a second logical comparison rule of "whether it exceeds or equal to," obtaining a set of second logical results, and thereby determining whether any parameter exceeds the extreme threshold. This embodiment avoids subjective misjudgment through standardized one-by-one comparison and logical integration judgment.

[0032] According to an embodiment of the present invention, updating the pressure information based on a preset pressure enhancement strategy specifically includes: Based on the current pressure information and the preset pressure stepping rules, the enhanced pressure source strength parameters are obtained. The pressure stepping rule includes at least: applying a preset fixed increment to the intensity of all pressure sources; applying an increase to the intensity of all pressure sources according to a preset ratio of the current intensity; or, extracting historical eye diagram parameter change features, inputting them into a pre-trained pressure enhancement model, obtaining a first pressure source, and setting the intensity increment of the first pressure source according to a fixed or dynamic setting. Update the enhanced pressure source strength parameters to the pressure information used in the next test.

[0033] It should be noted that in this embodiment, after the testing system determines that all eye diagram parameters are better than the qualified threshold, the current pressure information is input into a preset pressure stepping rule engine. This pressure stepping rule engine calculates the enhanced noise amplitude, timing offset, and power supply jitter level based on a pre-configured strategy, such as applying a preset fixed increment to the intensity of all pressure sources, or increasing it proportionally according to a certain percentage of the current intensity. Another implementation involves the testing system extracting data features of eye diagram parameters changing with pressure from historical test cycles and inputting them into a pre-trained pressure enhancement model. This model intelligently outputs the specific pressure source types that should be prioritized for enhancement and their corresponding dynamic intensity increments by analyzing parameter sensitivity. The testing system then updates the enhanced intensity parameters calculated or output by the model to the pressure information used in the next test cycle. This embodiment, through a rule-based or intelligent intensity increment mechanism, ensures the controllability and efficiency of the pressure ramp-up process, and can systematically and quickly push the interface under test from the normal operating range to its performance critical range.

[0034] According to an embodiment of the present invention, updating the pressure information based on a preset pressure fine-tuning strategy specifically includes: Based on the current pressure information, eye diagram parameters, and comparison results with the qualified threshold set and the extreme threshold set, the adjusted pressure information is obtained based on the preset pressure fine-tuning rules. The pressure fine-tuning rules include at least: uniformly reducing the intensity of all current pressure sources by a preset fine-tuning step size; keeping the intensity of some pressure sources unchanged while adjusting the intensity of another part of the pressure sources; or changing the combination of applied pressure source types. The adjusted pressure information is then updated to the pressure information to be used in the next test.

[0035] It should be noted that in this embodiment, when the test system enters the performance critical range, it invokes a preset pressure fine-tuning rule set based on the current pressure information, real-time eye diagram parameters, and their comparison with the two-level thresholds. This pressure fine-tuning rule set includes various fine-tuning modes, such as uniformly reducing the intensity of all current pressure sources by a preset fine-tuning step size to slightly backtrack and detect precise failure points; or keeping the noise injection intensity unchanged while only fine-tuning the timing offset to separate the coupling effects of different pressure sources; or changing the combination type of pressure sources, such as removing power jitter in subsequent tests while retaining only noise and timing interference. The test system selects a fine-tuning mode according to the rules and calculates the specific pressure level after adjustment, updating it as the pressure information for the next round of testing. This embodiment achieves high-resolution positioning of interface performance inflection points by providing multiple fine-tuning methods within the critical range.

[0036] It is worth mentioning that it also includes: The current stress information and eye diagram information are input into the pre-trained deterioration type recognition model to obtain deterioration eye diagram parameters; The coupling weight coefficient of the MIPI interface is dynamically adjusted based on the deteriorating eye diagram parameters. in, If the dominant deterioration parameter is eye height, then increase the noise amplitude and the pressure source signal of power supply jitter; If the dominant deterioration parameter is eye width or jitter, then increase the pressure source signal of the time offset; Based on the adjusted coupling weight coefficient, the pressure source signal is coupled to the MIPI interface under test according to the pressure information.

[0037] It should be noted that in this embodiment, the testing system inputs the current stress information and real-time eye diagram information into a pre-trained degradation type identification model. This model analyzes the relative degradation degree of parameters such as eye height, eye width, and jitter, and outputs the currently dominant degradation parameter type. Subsequently, the testing system dynamically adjusts the coupling weight coefficients of each stress source signal based on this determination. If the dominant degradation parameter is eye height, the weights of noise amplitude and power supply jitter signals are increased accordingly to specifically simulate interference affecting voltage amplitude. If the dominant degradation parameter is eye width or jitter, the weight of timing offset signals is increased to strengthen the testing of timing tolerance. Finally, the testing system performs weighted synthesis of the original stress information based on the adjusted weight coefficients and couples the final composite stress signal to the interface. This embodiment achieves precise targeting of stress testing, intelligently focusing on the current performance shortcomings of the interface, improving the targeting of stress testing and the efficiency of defect finding.

[0038] It is worth mentioning that it also includes: If a communication interruption or protocol lockout is detected in the MIPI interface under test during the application of the pressure source signal, the application of the current pressure source signal shall be stopped immediately. The pressure information is marked as interrupted pressure information; Based on the interrupt pressure information and the eye diagram information before the interrupt, and based on the preset backtracking strategy, a recovery pressure information with a lower intensity than the interrupt pressure information is calculated and loaded. Starting with the restored pressure information, the test method is re-executed, and the step increment in the pressure enhancement strategy is reduced.

[0039] It should be noted that in this embodiment, during the test, the test system monitors the communication status of the MIPI interface under test in real time. Once an anomaly such as protocol lockout or data interruption is detected, it immediately sends a command to the pressure generation unit to stop the application of all pressure signals. The test system simultaneously records and marks the pressure information that caused this interruption as interrupt pressure information. Subsequently, the test system invokes a preset backtracking strategy, and based on the interrupt pressure information and the eye diagram information recorded just before the interruption, calculates a recovery pressure information with a significantly lower intensity than the interruption point, for example, reducing the intensity of all pressure sources to a certain safety level before the interruption. Using this recovery pressure information as a new starting point, the test system restarts the entire adaptive test process and automatically reduces the step increment in subsequent pressure enhancement stages, or directly enters the pressure fine-tuning stage. This embodiment ensures the safety and recoverability of the test process in the event of a sudden failure, and can completely map and record the integrity performance boundaries, including hard failure points, without damaging the device.

[0040] Figure 4 A block diagram of an adaptive MIPI eye diagram stress testing system according to the present invention is shown.

[0041] like Figure 4 As shown, a second aspect of the present invention discloses an adaptive MIPI eye diagram stress testing system 4, including a memory 41 and a processor 42. The memory includes an adaptive MIPI eye diagram stress testing method program, which, when executed by the processor, performs the following steps: Obtain test specifications and product specifications to obtain the set of acceptable thresholds, the set of extreme thresholds, and initial pressure information; Based on the initial or updated pressure information, a pressure source signal is coupled to the MIPI interface under test, and the output signal is acquired to extract eye diagram information. The eye diagram information is compared with the qualified threshold set; If all eye diagram parameters are better than the qualified threshold, the pressure information is updated and the test is repeated based on the preset pressure enhancement strategy. If any eye diagram parameter is not better than the qualified threshold, the eye diagram information is compared with the set of extreme thresholds. If all eye diagram parameters do not exceed the limit threshold, the pressure information is updated and the test is repeated based on the preset pressure fine-tuning strategy. If any eye diagram parameter exceeds the limit threshold, the pressure source signal is stopped, and a test report is generated based on the eye diagram information.

[0042] The pressure information refers to the intensity of the pressure source, which includes at least noise amplitude, timing offset, and power supply jitter; the eye diagram information includes multiple eye diagram parameters, which include at least eye height, eye width, and jitter amplitude parameters.

[0043] It should be noted that in this embodiment, firstly, the testing system automatically parses and sets the qualified threshold set and the extreme threshold set according to the input test specifications and product specifications, and simultaneously generates initial pressure information including noise amplitude, timing offset, and power supply jitter intensity level. Subsequently, the testing system controls a programmable pressure source to couple corresponding interference signals into the signal path of the MIPI interface under test based on this initial pressure information, and simultaneously collects the output signal after interference. Eye diagram information including parameters such as eye height, eye width, and jitter amplitude is extracted using digital signal processing algorithms. Next, the testing system compares the real-time eye diagram parameters with the qualified threshold set one by one. If all parameters are better than the qualified threshold, a preset pressure enhancement strategy is invoked to calculate the enhanced pressure information, and the pressure configuration is updated accordingly before restarting the test, forming a positive pressure ramp-up cycle. If any parameter is not better than the qualified threshold, the eye diagram parameters are further compared with the extreme threshold set. If all parameters do not exceed the extreme threshold, a pressure fine-tuning strategy is invoked to finely adjust the pressure information before continuing iterative testing to accurately map the performance critical range. If any parameter exceeds the limit threshold, the performance boundary is determined to have been reached. Pressure application is stopped, and a test report containing the pressure-performance correspondence throughout the entire process is automatically generated. This embodiment achieves automated and intelligent exploration of the performance boundary of the MIPI interface under complex pressure through closed-loop control of two-level threshold comparison and adaptive pressure adjustment, thereby improving testing efficiency and positioning accuracy.

[0044] According to an embodiment of the present invention, the step of obtaining test specifications and product specifications to obtain a set of acceptable thresholds, a set of extreme thresholds, and initial pressure information specifically includes: Obtain the entered MIPI test protocol specification, parse it to obtain the set of qualified thresholds; Based on the qualified threshold set, and using a preset threshold tightening algorithm, the extreme threshold set is obtained; Obtain the entered product specification sheet, parse it, and input it into the initial pressure configuration model to obtain the initial pressure information; The initial pressure information includes at least the noise amplitude level, timing offset level, and power jitter level.

[0045] It should be noted that in this embodiment, the testing system receives the MIPI protocol specification text entered by the user. Through a natural language parsing and key parameter extraction module, it automatically identifies and converts qualified thresholds for parameters such as eye height, eye width, and jitter, forming a qualified threshold set. Subsequently, based on a preset threshold tightening algorithm, such as compression at a fixed ratio or derivation based on a statistical model, the testing system generates a more stringent set of extreme thresholds from the qualified threshold set, serving as a target for performance boundary exploration. Simultaneously, the testing system receives the product specification input and sends it along with the selected test scenario information into the initial stress configuration model. This initial stress configuration model outputs adapted initial stress information, including noise amplitude level, timing offset level, and power jitter level, based on historical data or a typical configuration library. This embodiment ensures the accuracy, consistency, and traceability of thresholds and initial stress values ​​through automated parsing and model-based configuration.

[0046] According to an embodiment of the present invention, the step of coupling a pressure source signal to the MIPI interface under test based on the initial pressure information or the updated pressure information specifically includes: Extract the pressure information to obtain a first noise amplitude level, a first timing offset level, and a first power supply jitter level; The programmable noise source is controlled according to the first noise amplitude level to output a noise signal; The programmable delay line is controlled according to the first timing offset level, and a timing offset signal is output. The programmable power supply interference source is controlled according to the first power supply jitter level, and a power supply jitter signal is output. At least one of the noise signal, timing offset signal, and power jitter signal is coupled and injected into the signal transmission path of the MIPI interface under test.

[0047] It should be noted that in this embodiment, the test system extracts the first noise amplitude level, the first timing offset level, and the first power jitter level from the current pressure information. Based on the first noise amplitude level, a programmable noise source is controlled to generate a noise signal with corresponding spectral characteristics and amplitude. Based on the first timing offset level, a programmable delay line is controlled to generate a precise clock or data delay signal. Based on the first power jitter level, a programmable power interference source is controlled to output a power ripple or transient drop signal with a specific frequency and amplitude. Subsequently, the test system injects one or more of the above interference signals into the transmission link of the MIPI interface under test through a signal coupling circuit. This embodiment generates various types of interference through independent programmable modules, supports flexible combinations of pressure types and intensity control, and can accurately simulate composite stress conditions in real-world environments, thereby achieving a comprehensive evaluation of the MIPI interface's anti-interference capability.

[0048] According to an embodiment of the present invention, comparing the eye diagram parameters with a set of acceptable thresholds and comparing the eye diagram parameters with a set of limiting thresholds specifically includes: The eye diagram information is parsed to obtain at least one eye diagram parameter; Each real-time eye diagram parameter is compared one by one with the threshold corresponding to the qualified threshold set based on the first logical comparison rule to obtain the first logical result. The first logical comparison rule is used to determine whether a parameter is better than its corresponding qualified threshold. Each real-time eye diagram parameter is compared one by one with the threshold corresponding to the set of limit thresholds based on the second logical comparison rule to obtain the second logical result; The second logical comparison rule is used to determine whether a parameter exceeds its corresponding limit threshold.

[0049] It should be noted that in this embodiment, the testing system first parses and processes the real-time acquired eye diagram information, extracting a parameter sequence that includes at least eye height, eye width, and jitter amplitude. During the first-level comparison, the testing system compares each real-time eye diagram parameter with its corresponding threshold in the qualified threshold set, according to a first logical comparison rule of "whether it is better than or equal to," obtaining a set of first logical results. Based on the comparison results of all parameters, the testing system determines whether all parameters are better than the qualified threshold. During the second-level comparison, the testing system compares each real-time eye diagram parameter with its corresponding threshold in the extreme threshold set, according to a second logical comparison rule of "whether it exceeds or equal to," obtaining a set of second logical results, and thereby determining whether any parameter exceeds the extreme threshold. This embodiment avoids subjective misjudgment through standardized one-by-one comparison and logical integration judgment.

[0050] According to an embodiment of the present invention, updating the pressure information based on a preset pressure enhancement strategy specifically includes: Based on the current pressure information and the preset pressure stepping rules, the enhanced pressure source strength parameters are obtained. The pressure stepping rule includes at least: applying a preset fixed increment to the intensity of all pressure sources; applying an increase to the intensity of all pressure sources according to a preset ratio of the current intensity; or, extracting historical eye diagram parameter change features, inputting them into a pre-trained pressure enhancement model, obtaining a first pressure source, and setting the intensity increment of the first pressure source according to a fixed or dynamic setting. Update the enhanced pressure source strength parameters to the pressure information used in the next test.

[0051] It should be noted that in this embodiment, after the testing system determines that all eye diagram parameters are better than the qualified threshold, the current pressure information is input into a preset pressure stepping rule engine. This pressure stepping rule engine calculates the enhanced noise amplitude, timing offset, and power supply jitter level based on a pre-configured strategy, such as applying a preset fixed increment to the intensity of all pressure sources, or increasing it proportionally according to a certain percentage of the current intensity. Another implementation involves the testing system extracting data features of eye diagram parameters changing with pressure from historical test cycles and inputting them into a pre-trained pressure enhancement model. This model intelligently outputs the specific pressure source types that should be prioritized for enhancement and their corresponding dynamic intensity increments by analyzing parameter sensitivity. The testing system then updates the enhanced intensity parameters calculated or output by the model to the pressure information used in the next test cycle. This embodiment, through a rule-based or intelligent intensity increment mechanism, ensures the controllability and efficiency of the pressure ramp-up process, and can systematically and quickly push the interface under test from the normal operating range to its performance critical range.

[0052] According to an embodiment of the present invention, updating the pressure information based on a preset pressure fine-tuning strategy specifically includes: Based on the current pressure information, eye diagram parameters, and comparison results with the qualified threshold set and the extreme threshold set, the adjusted pressure information is obtained based on the preset pressure fine-tuning rules. The pressure fine-tuning rules include at least: uniformly reducing the intensity of all current pressure sources by a preset fine-tuning step size; keeping the intensity of some pressure sources unchanged while adjusting the intensity of another part of the pressure sources; or changing the combination of applied pressure source types. The adjusted pressure information is then updated to the pressure information to be used in the next test.

[0053] It should be noted that in this embodiment, when the test system enters the performance critical range, it invokes a preset pressure fine-tuning rule set based on the current pressure information, real-time eye diagram parameters, and their comparison with the two-level thresholds. This pressure fine-tuning rule set includes various fine-tuning modes, such as uniformly reducing the intensity of all current pressure sources by a preset fine-tuning step size to slightly backtrack and detect precise failure points; or keeping the noise injection intensity unchanged while only fine-tuning the timing offset to separate the coupling effects of different pressure sources; or changing the combination type of pressure sources, such as removing power jitter in subsequent tests while retaining only noise and timing interference. The test system selects a fine-tuning mode according to the rules and calculates the specific pressure level after adjustment, updating it as the pressure information for the next round of testing. This embodiment achieves high-resolution positioning of interface performance inflection points by providing multiple fine-tuning methods within the critical range.

[0054] It is worth mentioning that it also includes: The current stress information and eye diagram information are input into the pre-trained deterioration type recognition model to obtain deterioration eye diagram parameters; The coupling weight coefficient of the MIPI interface is dynamically adjusted based on the deteriorating eye diagram parameters. in, If the dominant deterioration parameter is eye height, then increase the noise amplitude and the pressure source signal of power supply jitter; If the dominant deterioration parameter is eye width or jitter, then increase the pressure source signal of the time offset; Based on the adjusted coupling weight coefficient, the pressure source signal is coupled to the MIPI interface under test according to the pressure information.

[0055] It should be noted that in this embodiment, the testing system inputs the current stress information and real-time eye diagram information into a pre-trained degradation type identification model. This model analyzes the relative degradation degree of parameters such as eye height, eye width, and jitter, and outputs the currently dominant degradation parameter type. Subsequently, the testing system dynamically adjusts the coupling weight coefficients of each stress source signal based on this determination. If the dominant degradation parameter is eye height, the weights of noise amplitude and power supply jitter signals are increased accordingly to specifically simulate interference affecting voltage amplitude. If the dominant degradation parameter is eye width or jitter, the weight of timing offset signals is increased to strengthen the testing of timing tolerance. Finally, the testing system performs weighted synthesis of the original stress information based on the adjusted weight coefficients and couples the final composite stress signal to the interface. This embodiment achieves precise targeting of stress testing, intelligently focusing on the current performance shortcomings of the interface, improving the targeting of stress testing and the efficiency of defect finding.

[0056] It is worth mentioning that it also includes: If a communication interruption or protocol lockout is detected in the MIPI interface under test during the application of the pressure source signal, the application of the current pressure source signal shall be stopped immediately. The pressure information is marked as interrupted pressure information; Based on the interrupt pressure information and the eye diagram information before the interrupt, and based on the preset backtracking strategy, a recovery pressure information with a lower intensity than the interrupt pressure information is calculated and loaded. Starting with the restored pressure information, the test method is re-executed, and the step increment in the pressure enhancement strategy is reduced.

[0057] It should be noted that in this embodiment, during the test, the test system monitors the communication status of the MIPI interface under test in real time. Once an anomaly such as protocol lockout or data interruption is detected, it immediately sends a command to the pressure generation unit to stop the application of all pressure signals. The test system simultaneously records and marks the pressure information that caused this interruption as interrupt pressure information. Subsequently, the test system invokes a preset backtracking strategy, and based on the interrupt pressure information and the eye diagram information recorded just before the interruption, calculates a recovery pressure information with a significantly lower intensity than the interruption point, for example, reducing the intensity of all pressure sources to a certain safety level before the interruption. Using this recovery pressure information as a new starting point, the test system restarts the entire adaptive test process and automatically reduces the step increment in subsequent pressure enhancement stages, or directly enters the pressure fine-tuning stage. This embodiment ensures the safety and recoverability of the test process in the event of a sudden failure, and can completely map and record the integrity performance boundaries, including hard failure points, without damaging the device.

[0058] A third aspect of the present invention provides a computer-readable storage medium comprising an adaptive MIPI eye diagram stress testing method program, wherein when executed by a processor, the adaptive MIPI eye diagram stress testing method program implements the steps of the adaptive MIPI eye diagram stress testing method as described in any of the preceding claims.

[0059] In summary, this invention provides an adaptive MIPI eye diagram stress testing method, system, and storage medium. It acquires test specifications and product specifications to set acceptable threshold sets, limit threshold sets, and initial stress information, and couples a stress signal to the MIPI interface under test, simultaneously acquiring eye diagram parameters such as eye height, eye width, and jitter. By comparing real-time eye diagram parameters with the acceptable threshold sets, the stress information is updated according to a stress enhancement strategy, and the test is retested to gradually increase the stress. If any parameter is not better than the acceptable threshold, it is further compared with the limit threshold set, and fine adjustments and iterative testing are performed through a stress fine-tuning strategy until any parameter exceeds the limit threshold. At this point, the test stops, and a report is automatically generated. This achieves automatic and accurate positioning of the MIPI interface's performance boundaries under combined stress, improving the level of testing intelligence and reliability assessment efficiency.

[0060] If the aforementioned functions are implemented as software functional modules and sold or used as independent products, they can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of this invention, or the part that contributes to the prior art, or a portion of the technical solution, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions to cause a computer device (which may be a personal computer, server, or network device, etc.) to execute all or part of the steps of the methods described in the various embodiments of this invention. The aforementioned storage medium includes various media capable of storing program code, such as USB flash drives, portable hard drives, read-only memory (ROM), random access memory (RAM), magnetic disks, or optical disks.

[0061] The above description is merely a preferred embodiment of the present invention and is not intended to limit the invention. Various modifications and variations can be made to the present invention by those skilled in the art. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the present invention should be included within the scope of protection of the present invention.

Claims

1. An adaptive MIPI eye diagram stress testing method, characterized in that, The method includes: Obtain test specifications and product specifications to obtain the set of acceptable thresholds, the set of extreme thresholds, and initial pressure information; Based on the initial or updated pressure information, a pressure source signal is coupled to the MIPI interface under test, and the output signal is acquired to extract eye diagram information. The eye diagram information is compared with the qualified threshold set; If all eye diagram parameters are better than the qualified threshold, the pressure information is updated and the test is repeated based on the preset pressure enhancement strategy. If any eye diagram parameter is not better than the qualified threshold, the eye diagram information is compared with the set of extreme thresholds. If all eye diagram parameters do not exceed the limit threshold, the pressure information is updated and the test is repeated based on the preset pressure fine-tuning strategy. If any eye diagram parameter exceeds the limit threshold, the pressure source signal is stopped, and a test report is generated based on the eye diagram information.

2. The adaptive MIPI eye diagram stress testing method according to claim 1, characterized in that, The process of obtaining test specifications and product specifications to obtain the qualified threshold set, the extreme threshold set, and the initial pressure information specifically includes: Obtain the entered MIPI test protocol specification, parse it to obtain the set of qualified thresholds; Based on the qualified threshold set, and using a preset threshold tightening algorithm, the extreme threshold set is obtained; Obtain the entered product specification sheet, parse it, and input it into the initial pressure configuration model to obtain the initial pressure information; The initial pressure information includes at least the noise amplitude level, timing offset level, and power jitter level.

3. An adaptive MIPI eye diagram stress testing method according to claim 1 or 2, characterized in that, The step of coupling a pressure source signal to the MIPI interface under test based on the initial pressure information or the updated pressure information specifically includes: Extract the pressure information to obtain a first noise amplitude level, a first timing offset level, and a first power supply jitter level; The programmable noise source is controlled according to the first noise amplitude level to output a noise signal; The programmable delay line is controlled according to the first timing offset level, and a timing offset signal is output. The programmable power supply interference source is controlled according to the first power supply jitter level, and a power supply jitter signal is output. At least one of the noise signal, timing offset signal, and power jitter signal is coupled and injected into the signal transmission path of the MIPI interface under test.

4. The adaptive MIPI eye diagram stress testing method according to claim 1, characterized in that, The comparison of the eye diagram parameters with the qualified threshold set and the comparison of the eye diagram parameters with the extreme threshold set specifically include: The eye diagram information is parsed to obtain at least one eye diagram parameter; Each real-time eye diagram parameter is compared one by one with the threshold corresponding to the qualified threshold set based on the first logical comparison rule to obtain the first logical result. The first logical comparison rule is used to determine whether a parameter is better than its corresponding qualified threshold. Each real-time eye diagram parameter is compared one by one with the threshold corresponding to the set of limit thresholds based on the second logical comparison rule to obtain the second logical result; The second logical comparison rule is used to determine whether a parameter exceeds its corresponding limit threshold.

5. The adaptive MIPI eye diagram stress testing method according to claim 1, characterized in that, The update of stress information based on the preset stress enhancement strategy specifically includes: Based on the current pressure information and the preset pressure stepping rules, the enhanced pressure source strength parameters are obtained. The pressure stepping rule includes at least: applying a preset fixed increment to the intensity of all pressure sources; applying an increase to the intensity of all pressure sources according to a preset ratio of the current intensity; or, extracting historical eye diagram parameter change features, inputting them into a pre-trained pressure enhancement model, obtaining a first pressure source, and setting the intensity increment of the first pressure source according to a fixed or dynamic setting. Update the enhanced pressure source strength parameters to the pressure information used in the next test.

6. The adaptive MIPI eye diagram stress testing method according to claim 1, characterized in that, The pressure information update based on the preset pressure fine-tuning strategy specifically includes: Based on the current pressure information, eye diagram parameters, and comparison results with the qualified threshold set and the extreme threshold set, the adjusted pressure information is obtained based on the preset pressure fine-tuning rules. The pressure fine-tuning rules include at least: uniformly reducing the intensity of all current pressure sources by a preset fine-tuning step size; keeping the intensity of some pressure sources unchanged while adjusting the intensity of another part of the pressure sources; or changing the combination of applied pressure source types. The adjusted pressure information is then updated to the pressure information to be used in the next test.

7. An adaptive MIPI eye diagram stress testing system, characterized in that, The system includes a memory and a processor. The memory includes an adaptive MIPI eye diagram stress testing method program, which, when executed by the processor, performs the following steps: Obtain test specifications and product specifications to obtain the set of acceptable thresholds, the set of extreme thresholds, and initial pressure information; Based on the initial or updated pressure information, a pressure source signal is coupled to the MIPI interface under test, and the output signal is acquired to extract eye diagram information. The eye diagram information is compared with the qualified threshold set; If all eye diagram parameters are better than the qualified threshold, the pressure information is updated and the test is repeated based on the preset pressure enhancement strategy. If any eye diagram parameter is not better than the qualified threshold, the eye diagram information is compared with the set of extreme thresholds. If all eye diagram parameters do not exceed the limit threshold, the pressure information is updated and the test is repeated based on the preset pressure fine-tuning strategy. If any eye diagram parameter exceeds the limit threshold, the pressure source signal is stopped, and a test report is generated based on the eye diagram information.

8. The adaptive MIPI eye diagram stress testing system according to claim 7, characterized in that, The process of obtaining test specifications and product specifications to obtain the qualified threshold set, the extreme threshold set, and the initial pressure information specifically includes: Obtain the entered MIPI test protocol specification, parse it to obtain the set of qualified thresholds; Based on the qualified threshold set, and using a preset threshold tightening algorithm, the extreme threshold set is obtained; Obtain the entered product specification sheet, parse it, and input it into the initial pressure configuration model to obtain the initial pressure information; The initial pressure information includes at least the noise amplitude level, timing offset level, and power jitter level.

9. An adaptive MIPI eye diagram stress testing system according to claim 7 or 8, characterized in that, The step of coupling a pressure source signal to the MIPI interface under test based on the initial pressure information or the updated pressure information specifically includes: Extract the pressure information to obtain a first noise amplitude level, a first timing offset level, and a first power supply jitter level; The programmable noise source is controlled according to the first noise amplitude level to output a noise signal; The programmable delay line is controlled according to the first timing offset level, and a timing offset signal is output. The programmable power supply interference source is controlled according to the first power supply jitter level, and a power supply jitter signal is output. At least one of the noise signal, timing offset signal, and power jitter signal is coupled and injected into the signal transmission path of the MIPI interface under test.

10. A computer-readable storage medium having a computer program stored thereon, characterized in that, The computer-readable storage medium includes an adaptive MIPI eye diagram stress testing method program, which, when executed by a processor, implements the steps of the adaptive MIPI eye diagram stress testing method as described in any one of claims 1 to 6.

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