Aging test device, method and system for driver or light-emitting film

Abstract

The invention relates to the technical field of electronic equipment testing, in particular to an aging test device, method and system for a driver or a light-emitting film. The device comprises a time relay PLC, a starting switch, a direct-current power supply and a wiring terminal. The direct-current power supply supplies power to the PLC; the starting switch is connected between the input common terminal and the input terminal of the PLC; and a to-be-aged device is connected into a loop formed by the positive pole of the direct-current power supply, the PLC output terminal, the corresponding output common terminal and the negative pole of the direct-current power supply through the wiring terminal. The PLC controls the on-off of the output terminal according to a preset program, and achieves the automatic timing control of the aging process. According to the invention, the functions of multichannel independent control, parameter acquisition, closed-loop adjustment and the like are further expanded, and parallel and accurate aging test can be carried out on a plurality of devices at the same time.

Description

Technical Field

[0001] This application relates to the field of electronic device testing technology, and more specifically, to an aging test apparatus, method, and system for a driver or light-emitting film. Background Technology

[0002] In the product manufacturing process, aging testing is a crucial step in evaluating product durability and reliability. Traditional aging tests for drivers or light-emitting films often employ manual control or simple timed on / off devices. Manual control methods are inefficient, inconsistent, and prone to errors.

[0003] Existing automated testing devices, such as those using time relays or basic PLCs for timing control, while achieving automation, still have significant drawbacks: their control logic is open-loop and preset, and cannot provide real-time feedback and adjustment based on the actual working state or aging environment (such as junction temperature and light decay) of the device under test (DUT). This "blind testing" method may cause the test conditions to deviate from the real application scenario, or fail to accurately trigger and capture potential faults.

[0004] With increasing demands for production efficiency, aging systems capable of handling a large number of devices simultaneously while ensuring test quality have become crucial. Existing technologies lack a solution that can independently and in parallel intelligent closed-loop control of multiple aging drivers or light-emitting films, making it difficult to meet the needs of high-efficiency and high-precision batch aging tests.

[0005] Therefore, there is an urgent need for an aging test device, method, and system for drivers or light-emitting films to solve the above problems. Summary of the Invention

[0006] In view of this, in order to solve the above-mentioned problems in the prior art, this application provides an aging test apparatus, method and system for a driver or light-emitting film.

[0007] The embodiments of this application are implemented as follows:

[0008] In a first aspect, this application provides an aging test device for a driver or light-emitting film, including a time relay PLC, a start switch, a DC power supply, and wiring terminals;

[0009] The time relay PLC is provided with power supply terminals, input terminals and output terminals, as well as an input common terminal for the input terminals and an output common terminal for the output terminals. The power supply terminals include a positive power supply terminal and a negative power supply terminal.

[0010] The positive terminal of the DC power supply is connected to the positive power terminal of the time relay PLC, and the negative terminal of the DC power supply is connected to the negative power terminal of the time relay PLC.

[0011] One end of the start switch is connected to the common input terminal of the time relay PLC, and the other end is connected to one input terminal of the time relay PLC.

[0012] The terminal block is used to connect the device to be aged, and includes a first terminal block and a second terminal block. The first terminal block is connected to the positive terminal of the DC power supply, and the second terminal block is connected to an output terminal of the time relay PLC. The common output terminal of the time relay PLC corresponding to the output terminal is connected to the negative terminal of the DC power supply.

[0013] In one possible implementation, a parameter acquisition module is also included, which is connected to the analog input terminal of the time relay PLC and is used to acquire the real-time operating parameters of the device to be aged; the time relay PLC is configured to adjust its output according to the real-time operating parameters.

[0014] In one possible implementation, the parameter acquisition module includes a temperature sensor, a photometer, and a current detection circuit.

[0015] In one possible implementation, the time relay PLC has a pre-stored control program;

[0016] The control program is configured to compare the real-time operating parameters with preset target parameters, and dynamically adjust the conduction state of the output terminal of the time relay PLC or the drive signal parameters output to the output terminal based on the comparison result.

[0017] In one possible implementation, the time relay PLC is further provided with multiple input terminals and multiple output terminals;

[0018] The testing device includes multiple start switches and multiple sets of terminals for connecting multiple devices to be aged.

[0019] Wherein, at least one of the start switches is connected between the common input terminal of the time relay PLC and another input terminal;

[0020] In at least another set of terminals, the first terminal is connected to the positive terminal of the DC power supply or the positive terminal of another independent power supply, and the second terminal is connected to another output terminal of the time relay PLC. The common output terminal of the time relay PLC corresponding to the other output terminal is connected to the negative terminal of the corresponding DC power supply.

[0021] In one possible implementation, the time relay PLC is configured to independently control each output terminal, enabling the devices to be aged connected to different output terminals to undergo aging tests according to their own independent timing or logic.

[0022] Secondly, this application provides an aging test method for a driver or light-emitting film, comprising:

[0023] A start signal is input to the time relay PLC via the start switch;

[0024] The time relay PLC controls the on / off state between its output terminal and the corresponding common output terminal according to its internal preset program, thereby controlling the power supply circuit of the device to be aged connected between the first terminal and the second terminal.

[0025] In one possible implementation, the testing method further includes:

[0026] The real-time operating parameters of the device to be aged are obtained through the parameter acquisition module.

[0027] The time relay PLC adjusts the working state of the device to be aged by adjusting the duty cycle, frequency, or on / off timing of the output signal based on the deviation between the real-time working parameters and the preset target parameters.

[0028] Thirdly, this application provides an aging test system for a driver or light-emitting film, including a test device, multiple aging test stations and a host computer;

[0029] Multiple aging test stations are connected to the test device via the wiring terminals for mounting the devices to be aged.

[0030] The host computer is connected to the communication interface of the time relay PLC, and is used to send control programs or parameters to the time relay PLC and receive test data from the time relay PLC.

[0031] In one possible implementation, the time relay PLC is connected to multiple aging test stations through its multiple input terminals and multiple output terminals to achieve centralized parallel control and independent monitoring of multiple devices to be aged.

[0032] The technical solution provided in this application can achieve at least the following beneficial effects:

[0033] This application provides an aging test device, method, and system for drivers or light-emitting films. It systematically applies time relay PLC control technology to the aging test scenario of drivers and light-emitting films, replacing the traditional inefficient and error-prone manual adjustment and control methods. By constructing a hardware device with programmable logic and precise timing control capabilities, the entire aging test process is automated. The device can precisely control the power-on duration, power-off interval, and number of cycles of the device under test according to a preset program, ensuring the consistency, repeatability, and high accuracy of test conditions. This solves the fundamental problem of large fluctuations and low reliability in test results of the original method.

[0034] Furthermore, this application provides a universal and efficient aging test platform for drivers or light-emitting films of different models and voltage requirements through standardized wiring terminals, unified control logic, and programmable interfaces. This changes the previous decentralized construction approach of "one set of test fixtures for one product" and establishes a unified automated test standard and method. The modular design of the device and the support of time relay PLC multi-channel I / O terminals give it excellent flexibility and scalability. It can quickly adapt to new test requirements and meet the challenges of product iteration and batch testing through simple program adjustments and interface expansion. Attached Figure Description

[0035] To more clearly illustrate the technical solutions in the embodiments of this application or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0036] Figure 1 This is a schematic diagram of the front panel of an aging test device for a driver or light-emitting film, as shown in an exemplary embodiment of this application.

[0037] Figure 2 This is a schematic diagram of the structure of the rear panel of an aging test device for a driver or a light-emitting film, as shown in an exemplary embodiment of this application.

[0038] Figure 3 This is a schematic diagram of the base plate mounting layout of an aging test device for a driver or a light-emitting film, as shown in an exemplary embodiment of this application;

[0039] Figure 4 This is a schematic diagram of the structure of a time relay PLC for an aging test device for a driver or a light-emitting film, as shown in an exemplary embodiment of this application.

[0040] Figure 5This is a schematic diagram of an aging test apparatus for a driver or light-emitting film, as shown in an exemplary embodiment of this application.

[0041] Figure 6 This is a schematic flowchart illustrating an aging test method for a driver or light-emitting film according to an exemplary embodiment of this application;

[0042] Figure 7 This is a schematic diagram of an aging test system for a driver or light-emitting film, as illustrated in an exemplary embodiment of this application. Detailed Implementation

[0043] To make the objectives, implementation methods and advantages of this application clearer, the exemplary implementation methods of this application will be clearly and completely described below with reference to the accompanying drawings of the exemplary embodiments of this application. Obviously, the exemplary embodiments described are only some embodiments of this application, and not all embodiments. It should be understood that the specific embodiments described herein are only used to explain this application and are not intended to limit this application.

[0044] It should be noted that the brief descriptions of terms in this application are only for the convenience of understanding the embodiments described below, and are not intended to limit the embodiments of this application. Unless otherwise stated, these terms should be understood in their ordinary and common meaning.

[0045] The terms "first," "second," "third," etc., used in the specification, claims, and accompanying drawings of this application are used to distinguish similar or related objects or entities, and do not necessarily imply a specific order or sequence, unless otherwise specified. It should be understood that such terms are interchangeable where appropriate.

[0046] The terms “comprising” and “having”, and any variations thereof, are intended to cover but not exclude inclusion, for example, a product or device that includes a range of components is not necessarily limited to all of the components that are clearly listed, but may include other components that are not clearly listed or that are inherent to such product or device.

[0047] In the product manufacturing process, aging testing is a crucial step in evaluating product durability and reliability. Traditional aging tests for drivers or light-emitting films often employ manual control or simple timed on / off devices. Manual control methods are inefficient, inconsistent, and prone to errors.

[0048] Existing automated testing devices, such as those using time relays or basic PLCs for timing control, while achieving automation, still have significant drawbacks: their control logic is open-loop and preset, and cannot provide real-time feedback and adjustment based on the actual working state or aging environment (such as junction temperature and light decay) of the device under test (DUT). This "blind testing" method may cause the test conditions to deviate from the real application scenario, or fail to accurately trigger and capture potential faults.

[0049] With increasing demands for production efficiency, aging systems capable of handling a large number of devices simultaneously while ensuring test quality have become crucial. Existing technologies lack a solution that can independently and in parallel intelligent closed-loop control of multiple aging drivers or light-emitting films, making it difficult to meet the needs of high-efficiency and high-precision batch aging tests.

[0050] Therefore, there is an urgent need for an aging test device, method, and system for drivers or light-emitting films to solve the above problems.

[0051] Next, the technical solutions of this application and how they solve the aforementioned technical problems will be described in detail through embodiments and in conjunction with the accompanying drawings. The embodiments can be combined with each other, and the same or similar concepts or processes may not be repeated in some embodiments. Obviously, the described embodiments are only some, not all, of the embodiments of this application.

[0052] In one exemplary embodiment, such as Figure 1 As shown, an aging test device for a driver or light-emitting film is provided. In this embodiment, the device may include a time relay PLC, a start switch, a DC power supply, and wiring terminals.

[0053] The time relay PLC is provided with power supply terminals, input terminals and output terminals, as well as an input common terminal for the input terminals and an output common terminal for the output terminals. The power supply terminals include a positive power supply terminal and a negative power supply terminal.

[0054] The positive terminal of the DC power supply is connected to the positive power terminal of the time relay PLC, and the negative terminal of the DC power supply is connected to the negative power terminal of the time relay PLC.

[0055] One end of the start switch is connected to the common input terminal of the time relay PLC, and the other end is connected to one input terminal of the time relay PLC.

[0056] The terminal block is used to connect the device to be aged, and includes a first terminal block and a second terminal block. The first terminal block is connected to the positive terminal of the DC power supply, and the second terminal block is connected to an output terminal of the time relay PLC. The common output terminal of the time relay PLC corresponding to the output terminal is connected to the negative terminal of the DC power supply.

[0057] In one embodiment, such as Figures 1 to 5 As shown, the testing device mainly includes the following components, which are connected in the following manner:

[0058] 1. Hardware Components:

[0059] Dedicated chassis: Serves as the physical carrier and electromagnetic shielding enclosure for all components.

[0060] AC power input: It adopts a standard 220V / 50Hz AC power supply, which is connected to the chassis via a power cord. The rear panel of the chassis has a power socket and a fuse holder (FU1).

[0061] Power switch: Mounted on the front panel, used to control the AC power supply to the entire device.

[0062] AC power indicator light: Connected in parallel with the power switch, used to indicate that AC power has been connected.

[0063] AC / DC power conversion module: It adopts an AC220V to DC24V switching power supply. Its input terminal is connected to the AC power through the power switch, and the output terminal provides a stable DC 24V power supply (V+ is 24V positive terminal, V- is 24V negative terminal / ground).

[0064] Time relay PLC: Uses small PLCs such as Siemens or Mitsubishi series as the core controller. The model must have at least 1 digital input, 1 relay output and corresponding common terminal.

[0065] Start switch: A normally open self-resetting push-button switch is used, which is installed on the front panel and is marked with the word "Start".

[0066] Terminal blocks: Use multi-position fence or spring-loaded terminal blocks, defining two terminals as the first terminal (connected to the positive DC power supply V+) and the second terminal (connected to the PLC output Y1).

[0067] 2. Electrical connection relationship:

[0068] DC power supply connection: Connect the positive terminal (V+) of the DC power output from the AC / DC converter power supply module to the power supply terminal of the time relay PLC (usually marked as L+ or V+); connect the negative terminal (V-) of the DC power supply to the power supply terminal of the PLC (usually marked as M or V-). This is the operating power supply for the PLC.

[0069] Start switch connection: Connect one end of the start switch wire to the common input terminal (XCOM) of the PLC; connect the other end of the wire to one input terminal (X1) of the PLC. When the button is pressed, X1 and XCOM are connected.

[0070] Aging circuit connection: In the wiring terminals used to connect the device to be aged, the first terminal is directly connected to the positive terminal (V+) of the DC power supply via a wire, and the second terminal is connected to the output terminal (Y1) of the PLC via a wire. The common output terminal (COM1) of the PLC corresponding to Y1 is connected back to the negative terminal (V-) of the DC power supply via a wire.

[0071] Connection of the device to be aged: The positive power input of the driver or light-emitting film to be tested is connected to the first terminal via a cable (crimped FOT wire loop), and the negative power input is connected to the second terminal via a cable.

[0072] Its working process is as follows:

[0073] The operator connects to a 220V AC power supply, turns on the power switch, the AC power indicator light illuminates, and the DC24V power module starts working.

[0074] (1) Press the start switch and the PLC input terminal X1 detects a signal (connected to XCOM).

[0075] (2) The PLC controls its internal relays according to its pre-written program (e.g., conduct for 5 minutes, disconnect for 1 minute, cycle 100 times).

[0076] (3) When the program requires the circuit to be turned on, the PLC connects its output terminal Y1 to the internal output common terminal COM1. At this time, the current path is: DC power supply V+ → first terminal → device to be aged → second terminal → PLC Y1 terminal → PLC internal contact → PLC COM1 terminal → DC power supply V-. The device to be aged is powered on and starts working.

[0077] (4) When the set conduction time is reached, the PLC controls Y1 and COM1 to disconnect internally, the circuit is interrupted, and the aging device loses power.

[0078] (5) After the set total number of cycles is reached, the PLC stops outputting or waits for the next start signal.

[0079] In one possible implementation, a parameter acquisition module is also included, which is connected to the analog input terminal of the time relay PLC and is used to acquire the real-time operating parameters of the device to be aged; the time relay PLC is configured to adjust its output according to the real-time operating parameters.

[0080] In one possible implementation, the parameter acquisition module includes a temperature sensor, a photometer, and a current detection circuit.

[0081] In one possible implementation, the time relay PLC has a pre-stored control program;

[0082] The control program is configured to compare the real-time operating parameters with preset target parameters, and dynamically adjust the conduction state of the output terminal of the time relay PLC or the drive signal parameters output to the output terminal based on the comparison result.

[0083] In one embodiment, the testing apparatus further includes a parameter acquisition module, which comprises:

[0084] Temperature sensor: Use PT100 RTD or K-type thermocouple, installed close to the heat sink of the device to be aged, and its signal line is connected to the corresponding channel (such as AI1) of the analog input expansion module of the time relay PLC.

[0085] Current detection circuit: A Hall current sensor is connected in series in the power supply circuit of the device to be aged (e.g., before the first terminal). Its output is an analog voltage signal, which is connected to another analog input channel of the PLC (e.g., AI2).

[0086] Photometer: For testing of luminescent films, use an industrial photometer probe with analog output (0-10V or 4-20mA) to point at its luminescent surface, and connect the output signal to the analog input channel of the PLC (such as AI3).

[0087] Its control logic includes:

[0088] The control program inside the PLC has been upgraded, including not only timing logic but also closed-loop control algorithms.

[0089] Data acquisition: The program periodically (e.g., every second) reads temperature, current, and brightness values ​​from AI1, AI2, and AI3.

[0090] Comparison and Decision: The program compares the real-time operating parameters it reads with the preset target parameters set by the user through a human-machine interface (such as a touch screen connected to the PLC).

[0091] For example, the target temperature is 70℃±2℃ and the target current is 500mA±10mA.

[0092] Dynamically adjust output:

[0093] Method 1 (Enhanced On / Off Control): If the temperature exceeds 72℃, even if the original timing sequence has not reached the off time, the program will immediately disconnect the Y1 output to force cooling; it will be restored after the temperature drops below 68℃. This achieves parameter-based protective on / off control.

[0094] Method 2 (Drive Signal Adjustment): If the PLC's Y1 output is used in conjunction with an external constant current source or PWM controller, the PLC can dynamically adjust the output current value of the external driver or the duty cycle / frequency of the PWM signal by sending commands through its analog output channel (AO1) or communication port (such as RS485) based on the deviation between the current feedback (AI2) and the target current, so that the actual current is stabilized within the target range. This achieves true closed-loop feedback control.

[0095] In one possible implementation, the time relay PLC is further provided with multiple input terminals and multiple output terminals;

[0096] The testing device includes multiple start switches and multiple sets of terminals for connecting multiple devices to be aged.

[0097] Wherein, at least one of the start switches is connected between the common input terminal of the time relay PLC and another input terminal;

[0098] In at least another set of terminals, the first terminal is connected to the positive terminal of the DC power supply or the positive terminal of another independent power supply, and the second terminal is connected to another output terminal of the time relay PLC. The common output terminal of the time relay PLC corresponding to the other output terminal is connected to the negative terminal of the corresponding DC power supply.

[0099] In one possible implementation, the time relay PLC is configured to independently control each output terminal, enabling the devices to be aged connected to different output terminals to undergo aging tests according to their own independent timing or logic.

[0100] In one embodiment, the testing device also includes a time relay PLC with more I / O points, such as a model with 8 inputs (X1-X8) and 4-8 outputs (Y1-Y8, corresponding to COM1-COM4).

[0101] Multiple start switches (such as SW1-SW4) are added, each of which can independently control the start and stop of a set of tests. For example, SW2 is connected between XCOM and X2 to start channel 2.

[0102] Set up multiple sets of terminal blocks, each set corresponding to one test channel (station). For example:

[0103] Channel 1: The first terminal (CH1+) is connected to V+ of the main DC power supply (PSU1), the second terminal (CH1_Y1) is connected to Y1 of the PLC, and COM1 is connected to V- of PSU1.

[0104] Channel 2: The first terminal (CH2+) can be connected to the V+ of another independent power supply (PSU2) to achieve power isolation. The second terminal (CH2_Y2) is connected to the Y2 of the PLC, and COM2 is connected to the V- of PSU2.

[0105] Add a host computer: an industrial computer connected to the PLC's communication interface (such as Ethernet port or programming port) via an Ethernet cable or RS485 communication cable.

[0106] The control logic is written independently for each output channel (Y1-Y8).

[0107] Channel 1 (connected to Y1) can perform a cycle of "power on for 2 hours, power off for 0.5 hours" to age a certain type of driver A.

[0108] Channel 2 (connected to Y2) can execute an intelligent aging program that "continuously powers on, but reads the temperature every 10 minutes, and pauses if the temperature exceeds the limit," for aging drivers B that generate a lot of heat.

[0109] Channel 3 (connected to Y3) can execute a complex duty cycle gradient program to test the light decay characteristics of the light-emitting film.

[0110] The PLC's multitasking capabilities ensure that these programs can run in parallel and independently without timing interference between them.

[0111] Corresponding to the aforementioned embodiments of the aging test apparatus for drivers or light-emitting films, this application also provides embodiments of the aging test method for drivers or light-emitting films.

[0112] In one exemplary embodiment, such as Figure 6 As shown, the aging test method for the actuator or light-emitting film may include the following steps:

[0113] Step 100: Input a start signal to the time relay PLC via the start switch;

[0114] Step 200: The time relay PLC controls the on / off state between its output terminal and the corresponding common output terminal according to the internal preset program, thereby controlling the power supply circuit of the device to be aged connected between the first terminal and the second terminal.

[0115] In one possible implementation, the testing method further includes:

[0116] The real-time operating parameters of the device to be aged are obtained through the parameter acquisition module.

[0117] The time relay PLC adjusts the working state of the device to be aged by adjusting the duty cycle, frequency, or on / off timing of the output signal based on the deviation between the real-time working parameters and the preset target parameters.

[0118] It should be understood that although the steps in the flowcharts of the above embodiments are shown sequentially as indicated, these steps are not necessarily executed in the indicated order. Unless explicitly stated herein, there is no strict order restriction on the execution of these steps, and they can be executed in other orders. Moreover, at least some steps in the flowcharts of the above embodiments may include multiple steps or multiple stages. These steps or stages are not necessarily completed at the same time, but can be executed at different times. The execution order of these steps or stages is not necessarily sequential, but can be performed alternately or in turn with other steps or at least some of the steps or stages in other steps.

[0119] Corresponding to the aforementioned embodiments of aging test apparatus for drivers or light-emitting films, this application also provides an embodiment of an aging test system for drivers or light-emitting films.

[0120] In one exemplary embodiment, such as Figure 7 As shown, the aging test system for drivers or light-emitting films may include a test device, multiple aging test stations, and a host computer.

[0121] Multiple aging test stations are connected to the test device via the wiring terminals for mounting the devices to be aged.

[0122] The host computer is connected to the communication interface of the time relay PLC, and is used to send control programs or parameters to the time relay PLC and receive test data from the time relay PLC.

[0123] In one possible implementation, the time relay PLC is connected to multiple aging test stations through its multiple input terminals and multiple output terminals to achieve centralized parallel control and independent monitoring of multiple devices to be aged.

[0124] In one embodiment, multiple aging test stations are connected to corresponding sets of terminals in the control cabinet via cables to form a complete test system.

[0125] The host computer sends control programs or modifies parameters (such as timing values ​​for each channel and target temperature) to the PLC.

[0126] Receive test data uploaded by PLC, including the on / off status of each channel and the collected temperature / current historical curves.

[0127] The system centrally displays the real-time status of all workstations. When a channel (such as channel 5) experiences abnormal current due to a device malfunction, the host computer interface will highlight the alarm and record the time of the malfunction.

[0128] This architecture enables centralized parallel control and independent monitoring of multiple devices to be aged.

[0129] The technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0130] The embodiments described above are merely illustrative of several implementation methods of this application, and while the descriptions are relatively specific and detailed, they should not be construed as limiting the scope of the invention patent. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of this application, and these all fall within the protection scope of this application. Therefore, the protection scope of this patent application should be determined by the appended claims.

Claims

1. An aging test apparatus for a driver or a light-emitting film, characterized in that, Includes time relay PLC, start switch, DC power supply and wiring terminals; The time relay PLC is provided with power supply terminals, input terminals and output terminals, as well as an input common terminal for the input terminals and an output common terminal for the output terminals. The power supply terminals include a positive power supply terminal and a negative power supply terminal. The positive terminal of the DC power supply is connected to the positive power terminal of the time relay PLC, and the negative terminal of the DC power supply is connected to the negative power terminal of the time relay PLC. One end of the start switch is connected to the common input terminal of the time relay PLC, and the other end is connected to one input terminal of the time relay PLC. The terminal block is used to connect the device to be aged, and includes a first terminal block and a second terminal block. The first terminal block is connected to the positive terminal of the DC power supply, and the second terminal block is connected to an output terminal of the time relay PLC. The common output terminal of the time relay PLC corresponding to the output terminal is connected to the negative terminal of the DC power supply.

2. The aging test apparatus for a driver or light-emitting film as described in claim 1, characterized in that, It also includes a parameter acquisition module, which is connected to the analog input terminal of the time relay PLC and is used to acquire the real-time operating parameters of the device to be aged; the time relay PLC is configured to adjust its output according to the real-time operating parameters.

3. The aging test apparatus for a driver or light-emitting film as described in claim 2, characterized in that, The parameter acquisition module includes a temperature sensor, a photometer, and a current detection circuit.

4. The aging test apparatus for a driver or light-emitting film as described in claim 2 or 3, characterized in that, The time relay PLC has a pre-stored control program. The control program is configured to compare the real-time operating parameters with preset target parameters, and dynamically adjust the conduction state of the output terminal of the time relay PLC or the drive signal parameters output to the output terminal based on the comparison result.

5. The aging test apparatus for a driver or light-emitting film as described in claim 1, characterized in that, The time relay PLC is also equipped with multiple input terminals and multiple output terminals; The testing device includes multiple start switches and multiple sets of terminals for connecting multiple devices to be aged. Wherein, at least one of the start switches is connected between the common input terminal of the time relay PLC and another input terminal; In at least another set of terminals, the first terminal is connected to the positive terminal of the DC power supply or the positive terminal of another independent power supply, and the second terminal is connected to another output terminal of the time relay PLC. The common output terminal of the time relay PLC corresponding to the other output terminal is connected to the negative terminal of the corresponding DC power supply.

6. The aging test apparatus for a driver or light-emitting film as described in claim 5, characterized in that, The time relay PLC is configured to independently control each output terminal, so that the devices to be aged connected to different output terminals can be aged according to their own independent timing or logic.

7. An aging test method for a driver or light-emitting film, applied to the test apparatus as described in any one of claims 1-6, characterized in that, include: A start signal is input to the time relay PLC via the start switch; The time relay PLC controls the on / off state between its output terminal and the corresponding common output terminal according to its internal preset program, thereby controlling the power supply circuit of the device to be aged connected between the first terminal and the second terminal.

8. The aging test method for a driver or light-emitting film as described in claim 7, characterized in that, Also includes: The real-time operating parameters of the device to be aged are obtained through the parameter acquisition module. The time relay PLC adjusts the working state of the device to be aged by adjusting the duty cycle, frequency, or on / off timing of the output signal based on the deviation between the real-time working parameters and the preset target parameters.

9. An aging test system for an actuator or a light-emitting film, characterized in that, Includes the testing apparatus as described in any one of claims 1-6, multiple aging test stations, and a host computer; Multiple aging test stations are connected to the test device via the wiring terminals for mounting the devices to be aged. The host computer is connected to the communication interface of the time relay PLC, and is used to send control programs or parameters to the time relay PLC and receive test data from the time relay PLC.

10. The aging test system for a driver or light-emitting film as described in claim 9, characterized in that, The time relay PLC is connected to multiple aging test stations through its multiple input terminals and multiple output terminals to achieve centralized parallel control and independent monitoring of multiple devices to be aged.

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