Universal test fixture

Abstract

The invention belongs to the technical field of reliability testing of microelectronic devices, particularly relates to a universal test fixture, and aims to solve the problems that an existing special fixture is poor in universality, needs to be designed and machined repeatedly and is low in test efficiency. According to the technical scheme, the clamping device comprises a base and a clamping assembly detachably and fixedly connected, the base is provided with a plurality of assembling grooves, the assembling grooves can be distributed in a rectangular mode, a linear mode, an annular mode and the like, and the number of the assembling grooves is not smaller than 2; fixed clamping pieces and movable clamping pieces with different clamping face structures are arranged in the assembling grooves to be matched with various devices such as rectangular devices, cylindrical devices with different outer diameters and dual in-line devices, and the clamping assembly comprises an anti-loosening clamping force applying structure. According to the invention, multiple types of devices can be clamped at the same time, the test efficiency is improved, the research and development test cost is reduced, the clamping stability and the test accuracy are guaranteed, and the device is suitable for test scenes of multiple batches and multiple types of devices.

Description

TECHNICAL FIELD

[0001] The present application belongs to the technical field of microelectronic device reliability test, and particularly relates to a universal test fixture. BACKGROUND

[0002] In the research and development, test verification and screening process of microelectronic devices, vibration test is a key link for evaluating the structural stability and reliability of the devices. When carrying out vibration test, a special fixture is needed to fix the device on the vibration test equipment to ensure that the device is uniformly stressed and stably positioned during the test.

[0003] In the prior art, the vibration test fixture is usually specially designed, i.e. a fixture is designed and manufactured separately for a specific type and structure of microelectronic device. Such a special fixture has the following defects: on the one hand, it has poor universality, different types and sizes of devices need different fixtures, which leads to the need for frequent design, manufacture and verification of new fixtures during the test; on the other hand, repeated design and manufacture of special fixtures not only increase the economic cost of product development, but also prolong the development cycle, which is particularly uneconomical for small-batch and multi-type device testing scenarios.

[0004] To solve the problems of poor universality, high cost and long development cycle of the fixture in the prior art, the present application provides a universal test fixture, which realizes the adaptive clamping of different types and sizes of microelectronic devices through modular and detachable structure design, filling the gap in the prior art.

[0005] The methods described in this section can not have been previously conceived or made. Unless otherwise indicated herein, the methods described in this section should not be assumed to have been in the prior art merely because they are described in this section. Similarly, issues mentioned in this section should not be assumed to have been admitted to be prior art against anyone unless otherwise indicated. SUMMARY

[0006] The present application aims to provide a universal test fixture to solve the problems of poor universality, repeated design and manufacture, and low test efficiency of existing special fixtures, realize stable clamping of various types and different specifications of microelectronic devices, improve test efficiency, reduce development and test cost, and ensure the accuracy of vibration test.

[0007] To achieve the above-mentioned purpose, one technical solution adopted by the present application is: A universal test fixture for microelectronic device vibration test, comprising: a base; a clamping assembly, which is detachably fixedly connected with the base and is used to adapt to different types or sizes of microelectronic devices to be tested; The clamping assembly comprises: A fixed clamping piece is detachably fixedly connected with the base; A movable clamping piece is detachably slidably connected with the base, and the sliding direction is directed to the fixed clamping piece; A clamping force applying assembly is detachably fixedly connected with the base, for applying a pre-tightening force to the movable clamping piece towards the fixed clamping piece, driving the movable clamping piece to move along the sliding direction and cooperate with the fixed clamping piece to clamp the microelectronic device to be tested.

[0008] Further, the number of assembly grooves is multiple, and the distribution mode of the multiple assembly grooves includes at least one of rectangular distribution, linear distribution and annular distribution.

[0009] Further, the upper end of the base has an assembly groove, and the fixed clamping piece and the movable clamping piece are both located in the assembly groove.

[0010] Further, the clamping assembly further includes a first bolt; The fixed clamping piece has a first slot longitudinally penetrating through; The bottom wall of the assembly groove has a second slot; The first bolt penetrates through the first slot and is threadedly connected with the second slot, so as to fix the fixed clamping piece in the assembly groove.

[0011] Further, the side of the fixed clamping piece away from the movable clamping piece has a third slot; The side wall of the assembly groove has a limiting pin for plugging with the third slot, so as to guide the first slot and the second slot when the fixed clamping piece is installed, so that the first bolt is inserted, and the rotation of the fixed clamping piece around the first bolt after the first bolt is installed is limited.

[0012] Further, the movable clamping piece is slidably assembled in the assembly groove, so as to limit the sliding direction of the movable clamping piece through the assembly groove.

[0013] Further, the clamping force applying assembly includes a second bolt; The side wall of the assembly groove has a fourth slot penetrating through the side wall of the base, the second bolt penetrates through the fourth slot and is threadedly connected with the fourth slot, and one end of the second bolt is used for abutting against the movable clamping piece.

[0014] Further, the side of the movable clamping piece has a fifth slot for inserting the second bolt, so as to position the end of the second bolt, ensure the accurate application of the pre-tightening force along the sliding direction of the movable clamping piece, and limit the relative displacement of the second bolt and the movable clamping piece in the vibration test.

[0015] Further, the clamping force applying assembly further includes a locking nut, which is used for threadedly connecting with the second bolt, so as to cooperate with the inner wall of the assembly groove to limit the movement of the second bolt in the direction of releasing the pre-tightening force.

[0016] Further, at least one of the clamping surfaces of the fixed clamp and the movable clamp has one of a first clamping groove and a second clamping groove; The first clamping groove is a circular arc shape; The second clamping groove includes a first accommodating groove and a second accommodating groove, the first accommodating groove has two and is distributed on opposite sides of the second accommodating groove and communicates with the second accommodating groove, and the depth of the second accommodating groove is less than the depth of the first accommodating groove.

[0017] The present application has at least the following beneficial effects: The present application has at least the following beneficial effects:

[0018] The test efficiency is significantly improved: the four assembly grooves can simultaneously clamp multiple different types of devices to be tested, without the need for installation and debugging in batches, effectively reducing the waiting time for multiple types of device testing; and each component is provided with precise positioning guide structure (such as the insertion fit of the limiting pin and the third groove, the guide constraint of the assembly groove wall), which can realize quick alignment and installation of the clamp and precise clamping of the device, the whole operation process is simple and convenient, without complex debugging, which greatly shortens the test preparation period, and is especially suitable for testing scenes of multiple batches and multiple types of devices.

[0019] The clamping is stable and reliable, and the test precision is guaranteed: the fixed clamp is fixed by bolts and limiting pins, the movable clamp is limited in sliding direction by the assembly groove wall, to ensure that the clamping position is stable and has no deviation; the clamping force applying assembly is matched with a locking nut, which can effectively prevent the bolts from loosening during vibration test, and ensure the continuous stability of the pre-tightening force; the adaptive design of the clamping surface (the circular arc first clamping groove fits the cylindrical device, the second clamping groove accurately accommodates the pins) and the optional anti-slip pattern and elastic pad layer can not only uniformly transmit the clamping force, but also avoid device slipping or surface damage, ensuring that the device is stressed evenly and positioned stably during the test, providing a strong guarantee for the accuracy of test data.

[0020] The cost advantage is prominent, and the economy is good: the special fixture for different types and sizes of devices does not need to be designed and processed separately, the adaptation demand can be met by replacing the clamp or directly selecting the corresponding assembly groove, the repeated design, processing and verification cost of the special fixture is greatly reduced; at the same time, the fixture main body can be reused, only the special device needs to be designed to adapt to the clamp, the time cost and economic cost of product research and development are significantly reduced, especially suitable for small-batch, multi-type device test scene, and the resource utilization rate is improved.

[0021] Flexibility and expansibility: the present application supports various detachable connection modes (bolt connection, buckle cooperation, magnetic attraction fixation, etc.), assembly groove layout adjustment (number, distribution, shape) and multi-element configuration of clamping force applying assembly (spring pre-tightening, screw transmission, pneumatic push rod, etc.), which can be flexibly adapted according to different test equipment interfaces, clamping force requirements and scenes; at the same time, the clamping surface structure can be adjusted as needed, further expanding to the clamping of more special specifications of devices, having strong scene adaptation ability and subsequent expansion space. BRIEF DESCRIPTION OF DRAWINGS

[0022] The drawings described herein are used to provide further understanding of the present application, constitute a part of the present application, the illustrative embodiments of the present application and the description thereof are used to explain the present application, and do not constitute improper limitation on the present application. In the drawings: Figure 1 It is a structure schematic view of an embodiment of the universal test fixture of the present application; Figure 2 It is a structure schematic view of a base in an embodiment of the universal test fixture of the present application; Figure 3 It is a structure schematic view of a first clamp implementation in an embodiment of the universal test fixture of the present application; Figure 4 It is a structure schematic view of a second clamp implementation in an embodiment of the universal test fixture of the present application; Figure 5 It is a structure schematic view of a third clamp implementation in an embodiment of the universal test fixture of the present application; Figure 6 It is a structure schematic view of a fourth clamp implementation in an embodiment of the universal test fixture of the present application.

[0023] The meanings of various signs in the drawings are as follows: Base 1, assembly groove 1a, second groove 1b, fourth groove 1c, limit pin 11, clamping assembly 2, first clamping groove 2a, second clamping groove 2b, first containing groove 2b1, second containing groove 2b2, fixed clamp 21, first groove 21a, third groove 21b, movable clamp 22, fifth groove 22a, clamping force applying assembly 23, first bolt 231, second bolt 232, locking nut 233. Detailed Implementation

[0024] The invention will now be further described with reference to the accompanying drawings.

[0025] Reference Figures 1-6 As shown, the general-purpose test fixture in this embodiment is used for vibration testing of microelectronic devices. It includes a base 1 and a clamping assembly 2. The clamping assembly 2 and the base 1 are detachably fixedly connected. This design allows for the adaptation of different types or sizes of microelectronic devices under test by replacing the clamping assembly 2 with different structures, breaking the limitations of traditional dedicated fixtures. In other embodiments, the detachable fixed connection between the clamping assembly 2 and the base 1 is not limited to bolt connection. It can also adopt structures such as snap-fit ​​with positioning pins, high-strength magnetic attraction with anti-detachment pins, and quick-release locks. As long as the fixture can be stably assembled and quickly disassembled, it can flexibly adapt to the assembly efficiency requirements of different test scenarios. In order to further improve the adaptability and efficiency of the fixture, the upper end of the base 1 in this embodiment is provided with four rectangularly distributed assembly slots 1a. Each assembly slot 1a is rectangular, and the fixed clamping component 21 and the movable clamping component 22 configured in each slot are different in clamping surface structure. This can simultaneously meet the clamping requirements of multiple different types and specifications of devices without frequent clamping component replacement, further simplifying the test operation process. In other embodiments, the number of assembly slots 1a can be adjusted to 2, 6 or more according to actual test requirements, and the distribution can also be linear, annular or other. The shape of the slot can also be adapted to the clamp structure design as a trapezoidal slot, T-slot or other, as long as it can provide a stable assembly and guiding space for the clamp.

[0026] The clamping assembly 2 includes a fixed clamp 21, a movable clamp 22, and a clamping force application assembly 23. The fixed clamp 21 is detachably and fixedly connected to the base 1, providing a stable fixed support surface for device clamping. The movable clamp 22 is detachably and slidably connected to the base 1, and the sliding direction always points towards the fixed clamp 21. By adjusting the distance between the two, devices of different sizes can be accommodated. The clamping force application assembly 23 is also detachably and fixedly connected to the base 1, and is used to apply a preload force to the movable clamp 22 towards the fixed clamp 21, driving the movable clamp 22 to slide in a set direction, thereby cooperating with the fixed clamp 21 to clamp the microelectronic device under test. In other embodiments, the structure of the clamping force application assembly 23 is not limited to a combination of bolts and locking nuts. It can also adopt structures such as "spring preload + bolt locking", "screw drive + pawl anti-loosening", and "pneumatic push rod + mechanical locking", as long as it can stably apply the preload force and prevent vibration-induced loosening, adapting to test scenarios with different clamping force requirements. The walls of the four assembly slots 1a can provide a positioning reference for the installation of the fixed clamp 21 in the corresponding slot, and can also guide and constrain the sliding of the movable clamp 22, ensuring stable movement and accurate assembly of the components in each slot.

[0027] The clamping assembly 2 is also provided with a first bolt 231. Each positioning clamp 21 in each assembly slot 1a is provided with a first slot 21a extending longitudinally. The bottom wall of each assembly slot 1a is provided with a second slot 1b. The first bolt 231 is screwed into the second slot 1b after passing through the first slot 21a. In this way, the positioning clamp 21 can be stably fixed in the corresponding assembly slot 1a. In other embodiments, the first bolt 231 can be replaced by a screw, a stud with a nut, or other fasteners. The first slot 21a can also be designed as a waist-shaped slot, a stepped slot, or the like, as long as it can achieve the detachable fixing and positioning of the positioning clamp 21. In this embodiment, the side of each positioning clamp 21 away from the corresponding movable clamp 22 is provided with a third slot 21b. The side wall of each assembly slot 1a is provided with a limiting pin 11. The limiting pin 11 is inserted into the third slot 21b. This structure can not only accurately align the first slot 21a and the second slot 1b when the positioning clamp 21 is installed, making it easier for the first bolt 231 to be inserted, but also prevent the positioning clamp 21 from rotating around the first bolt 231 after the first bolt 231 is fixed, ensuring the stability of the direction of the clamping surface. In other embodiments, the structure of the limiting pin 11 and the third slot 21b can be replaced by a “limiting protrusion and limiting groove” or a “guide key and keyway”, as long as it can achieve the functions of installation alignment and anti-rotation.

[0028] The movable clamping pieces 22 in the four assembly grooves 1a are all slidingly assembled in the corresponding grooves, the groove walls of the assembly grooves 1a directly define the sliding direction of the movable clamping pieces 22, ensuring that the movable clamping pieces 22 can only translate in the direction towards or away from the corresponding fixed clamping pieces 21, avoiding the influence of sliding deviation on the clamping effect. In other embodiments, the sliding guide structure of the movable clamping pieces 22 can also use combinations such as "sliding rail and sliding block", "guide rod and guide hole", etc., to further improve the sliding smoothness and positioning accuracy. The clamping force applying assembly 23 corresponding to each assembly groove 1a includes a second bolt 232, and each assembly groove 1a has a fourth groove 1c penetrating the side wall of the base 1, the second bolt 232 penetrates the fourth groove 1c and is threadedly connected with the fourth groove 1c, one end of the second bolt 232 is used to abut against the corresponding movable clamping piece 22, and rotating the second bolt 232 can transmit the pre-tightening force to the movable clamping piece 22. Each movable clamping piece 22 is provided with a fifth groove 22a on the side surface for inserting the corresponding second bolt 232, the fifth groove 22a can position the end of the second bolt 232, so that the pre-tightening force is accurately applied along the sliding direction of the movable clamping piece 22, and at the same time, during the vibration test, the relative displacement between the second bolt 232 and the movable clamping piece 22 can be limited, ensuring the clamping stability. In other embodiments, the fifth groove 22a can be designed as a tapered groove, a spherical groove, etc., and the end of the second bolt 232 can be correspondingly designed as a tapered head, a spherical head, to further improve the positioning accuracy and force transmission efficiency. Each clamping force applying assembly 23 is also provided with a locking nut 233, which is threadedly connected with the corresponding second bolt 232, and cooperates with the inner wall of the assembly groove 1a to limit the movement of the second bolt 232 in the direction of releasing the pre-tightening force, effectively avoiding the loosening of the second bolt 232 in the vibration environment.

[0029] Regarding the specific adaptation design of the clamping pieces in the four assembly slots 1a, the clamping surfaces of the fixed clamping piece 21 and the movable clamping piece 22 in the first assembly slot 1a are both flat surfaces. This flat clamping structure is specially used for clamping devices with two opposite flat surfaces, such as rectangular housing devices. By being fitted with two parallel flat surfaces, the clamping force can be evenly transmitted, avoiding uneven force on the device and causing deformation. In the second and third assembly slots 1a, the clamping surfaces of the fixed clamping piece 21 and the movable clamping piece 22 are both provided with a first clamping groove 2a. The first clamping groove 2a is a circular arc. The difference between the two is that the radii of the first clamping grooves 2a in the two assembly slots 1a are different. The first clamping groove 2a in the second assembly slot 1a is adapted to a cylindrical device with a smaller outer diameter, and the first clamping groove 2a in the third assembly slot 1a is adapted to a cylindrical device with a larger outer diameter. By being fitted with arc surfaces of different radii with the outer surface of the cylindrical device, the device can be firmly fixed and prevented from slipping during vibration. In the fourth assembly slot 1a, the clamping surface of the fixed clamping piece 21 is flat, and the clamping surface of the movable clamping piece 22 is provided with a second clamping groove 2b. The second clamping groove 2b includes a first receiving groove 2b1 and a second receiving groove 2b2. The two first receiving grooves 2b1 are distributed on the opposite sides of the second receiving groove 2b2 and are in communication with the second receiving groove 2b2. The depth of the second receiving groove 2b2 is less than that of the first receiving groove 2b1. This structure is specially applicable to microelectronic devices with pins, such as dual-in-line packages. When in use, the pins of the device can be placed in the first receiving groove 2b1, and the main body of the device is placed in the second receiving groove 2b2, which can achieve precise positioning and avoid damaging the device pins during clamping. In other embodiments, the clamping surface structure of the clamping pieces in the four assembly slots 1a can be adjusted according to actual test requirements. For the first clamping groove 2a, more specifications with different circular arc radii can be added, or an elliptical arc shape can be designed to adapt to devices with an elliptical cross-section. For the second clamping groove 2b, the number of first receiving grooves 2b1 (such as 4 or 6) can be adjusted to adapt to multi-pin devices, or the angle between the first receiving groove 2b1 and the second receiving groove 2b2 can be changed to adapt to devices with special pin layouts. In addition, anti-slip patterns, elastic pads (such as silicone pads and rubber pads), and other structures can be added to the clamping surface to further improve the clamping stability and protect the device surface. These designs do not deviate from the core technical solution of "the clamping surface having one of the first clamping groove or the second clamping groove". At the same time, in other embodiments, the clamp can also adapt to devices with special cross-sections, ultra-thin devices, and multi-pin array devices by replacing the clamping pieces, as long as the clamping surface structure or the size of the clamping piece is adjusted to achieve stable clamping.

[0030] In use, the corresponding assembly groove 1a can be selected for clamping operation according to the type, size and test requirements of the microelectronic device to be tested. If multiple different types of devices need to be tested simultaneously, four assembly grooves 1a can also be used for clamping respectively, greatly improving the test efficiency. In specific operation, if the device to be tested is a rectangular device, the first assembly groove 1a is selected; if it is a small outer diameter cylindrical device, the second assembly groove 1a is selected; if it is a large outer diameter cylindrical device, the third assembly groove 1a is selected; if it is a dual-in-line type device with pins, the fourth assembly groove 1a is selected.

[0031] After determining the assembly groove 1a, the fixing clamp 21 in the corresponding groove is installed, the base 1 is placed stably, the fixing clamp 21 is held by hand, the third groove 21b is aligned with the limiting pin 11 on the side wall of the assembly groove 1a and is inserted, and is slid along the limiting pin 11 until the side surface of the fixing clamp 21 is in contact with the side wall of the assembly groove 1a. At this time, the first groove 21a and the second groove 1b are automatically aligned, the first bolt 231 is inserted through the first groove 21a and is threadedly connected with the second groove 1b, and the fixing of the fixing clamp 21 is completed. Then the movable clamp 22 in the groove is assembled, the movable clamp 22 is placed in the assembly groove 1a, it is ensured that the sliding direction is towards the fixing clamp 21, and the fifth groove 22a is aligned in the direction of the fourth groove 1c, and the movable clamp 22 is pushed to check whether the sliding is smooth. Then the clamping force applying assembly 23 is installed, the second bolt 232 is inserted from the outside of the base 1 into the fourth groove 1c and is threadedly connected, is turned until the end part extends into the assembly groove 1a, the locking nut 233 is then sleeved on the outside of the second bolt 232 and is in contact with the side wall of the base 1, and is not tightened temporarily.

[0032] The device to be tested is placed between the fixing clamp 21 and the movable clamp 22 in the groove, and it is ensured that the device is in contact with the clamping surface or the corresponding clamping groove: the rectangular device needs to be in close contact with the two planar clamping surfaces in the first assembly groove 1a; the cylindrical device needs to be embedded in the first clamping groove 2a in the corresponding assembly groove 1a and be in complete contact with the arc surface; the device with pins needs to place the pins into the first accommodating groove 2b1 of the fourth assembly groove 1a and embed the main body into the second accommodating groove 2b2. Then the second bolt 232 is turned clockwise, the end part of the second bolt 232 is inserted into the fifth groove 22a and drives the movable clamp 22 to move towards the fixing clamp 21, until the device is clamped, and then the locking nut 233 is tightened to complete the anti-loose fixing. If multiple devices need to be tested simultaneously, the above steps are repeated to install the clamps in other assembly grooves 1a and clamp the devices, and finally the fixture is fixed on the vibration test equipment through the mounting structure at the bottom of the base 1, so that the vibration test can be carried out. In other embodiments, the fixing mode of the fixture as a whole on the vibration test equipment can be adjusted according to the type of equipment interface, such as using T-shaped bolt cooperating with T-shaped groove, flange connection, magnetic attraction fixing and the like, as long as the stable installation of the fixture as a whole can be realized.

[0033] After the test is completed, first loosen the locking nut 233 corresponding to each assembly groove 1a, then reverse rotate the second bolt 232 to release the pre-tightening force, and take out the device; if subsequent testing of other types of devices is required, the corresponding assembly groove 1a can be directly selected for operation, without the need to replace the clamp, and if the specifications not covered need to be adapted, the fixed clamp 21 or the movable clamp 22 in the corresponding assembly groove 1a can also be replaced, thus flexibly meeting the test requirements.

[0034] In summary, the universal test fixture of the present embodiment, through the design of four assembly grooves 1a in a rectangular distribution, in combination with the fixed clamp 21 and the movable clamp 22 of different clamping surface structures, can simultaneously adapt to various types and specifications of microelectronic devices such as rectangular, different outer diameter cylindrical, double row straight insertion type, etc., without the need to design a special fixture for each type of device, thus greatly improving the universality and reusability of the fixture. The positioning and guiding structure in each assembly groove 1a ensures the assembly precision of the components, and the setting of the locking nut 233 effectively prevents the loosening of the bolt during vibration, making the clamping more stable and ensuring the accuracy of the test data. The design of the four assembly grooves 1a not only meets the test requirements of a single type of device, but also can simultaneously clamp multiple devices, significantly improving the test efficiency, the entire use process is simple to operate without complex debugging, shortening the test preparation time, reducing the cost of repeated design and processing of special fixtures, and reducing the time cost and economic cost of product research and development. For devices with special structures or specifications, only the clamps in the corresponding assembly groove 1a need to be replaced to use them, further expanding the application range of the fixture, and effectively solving the problems of poor universality, high cost and low efficiency of existing special fixtures.

[0035] In the description of the present application, it should be understood that the terms "center", "longitudinal", "transverse", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", "axial", "radial", "circumferential" and the like indicate the orientation or positional relationship based on the orientation or positional relationship shown in the drawings, and are only for the convenience of describing the present application and simplifying the description, and therefore cannot be understood as indicating or implying that the devices or elements referred to must have a particular orientation, be constructed and operated in a particular orientation, and therefore cannot be understood as limiting the present application.

[0036] In addition, the terms "first" and "second" are only for descriptive purposes and cannot be understood as indicating or implying relative importance or implicitly indicating the number of the technical features indicated. Therefore, the features defined with "first" and "second" can explicitly or implicitly include at least one of the features. In the description of the present application, the meaning of "multiple" is at least two, such as two, three, etc., unless otherwise specifically limited.

[0037] In the present application, unless specifically defined otherwise, the terms "mount", "connected", "connecting", "fixed", "linking", and the like, should be construed broadly and can include fixed connections, detachable connections, or integral connections; mechanical connections, electrical connections, or communication connections between two elements; direct connections between two elements, indirect connections between two elements through an intermediate medium, or internal communication or interaction between two elements, unless specifically defined otherwise. Those skilled in the art can understand the specific meanings of the above terms in the present application according to specific circumstances.

[0038] In the present application, unless specifically defined otherwise, "on" or "under" of a first feature to a second feature can be direct contact between the first and second features, or indirect contact between the first and second features through an intermediate medium. Moreover, "over", "above", and "on" of the first feature to the second feature can be directly above or obliquely above the first feature to the second feature, or can only mean that the horizontal height of the first feature is higher than that of the second feature. "Under", "below", and "under" of the first feature to the second feature can be directly below or obliquely below the first feature to the second feature, or can only mean that the horizontal height of the first feature is lower than that of the second feature. In the present application, the terms "one embodiment", "some embodiments", "example", "specific example", or "some examples" mean that the specific features, structures, materials, or characteristics described in connection with the embodiment or example are included in at least one embodiment or example of the present application. In the present specification, the illustrative expressions of the above terms do not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials, or characteristics described can be combined in any appropriate manner in any one or more embodiments or examples. Furthermore, different embodiments or examples described in the present specification and the features of different embodiments or examples can be combined and combined by those skilled in the art without contradiction.

[0039] The above embodiments only exemplarily illustrate the principles and effects of the present application, and are not intended to limit the present application. Any person skilled in the art can modify or change the above embodiments without departing from the spirit and scope of the present application. Therefore, all equivalent modifications or changes made by those skilled in the art without departing from the spirit and technical thought of the present application should be covered by the claims of the present application.

Claims

1. A general-purpose test fixture for vibration testing of microelectronic devices, characterized in that, include: Base; A clamping assembly, which is detachably and fixedly connected to the base, is used to adapt to different types or sizes of microelectronic devices under test; The clamping assembly includes: A fixed clamp is detachably and fixedly connected to the base; The movable clamp is detachably and slidably connected to the base, and the sliding direction is towards the fixed clamp; A clamping force application component is detachably and fixedly connected to the base to apply a preload force toward the fixed clamp to the movable clamp, thereby driving the movable clamp to move along the sliding direction and cooperate with the fixed clamp to clamp the microelectronic device under test.

2. The general-purpose test fixture according to claim 1, characterized in that: The upper end of the base has an assembly groove, and both the fixed clamp and the movable clamp are located in the assembly groove.

3. The general-purpose test fixture according to claim 2, characterized in that: The number of assembly slots is multiple, and the distribution of the multiple assembly slots includes at least one of rectangular distribution, linear distribution, and ring distribution.

4. The general-purpose test fixture according to claim 2, characterized in that: The clamping assembly also includes a first bolt; The fixed clamp has a first groove that runs longitudinally through it; The bottom wall of each assembly slot has a second slot; The first bolt passes through the first groove and is threadedly connected to the second groove to fix the clamping member in the assembly groove.

5. The general-purpose test fixture according to claim 4, characterized in that: The fixed clamp has a third groove on the side opposite to the movable clamp; The sidewall of the assembly slot has a limiting pin for insertion into the third slot, so as to guide the alignment of the first slot and the second slot during the installation of the fixed clamp, so that the first bolt can be inserted and the fixed clamp can be restricted from rotating around the first bolt after the first bolt is installed.

6. The general-purpose test fixture according to claim 3, characterized in that: The movable clamp is slidably assembled in the assembly groove to restrict the sliding direction of the movable clamp through the assembly groove.

7. The general-purpose test fixture according to claim 3, characterized in that: The clamping force application assembly includes a second bolt; The sidewall of the assembly slot has a fourth slot that penetrates the sidewall of the base. The second bolt penetrates the fourth slot and is threadedly connected to the fourth slot. One end of the second bolt is used to abut against the moving clamp.

8. The general-purpose test fixture according to claim 7, characterized in that: The moving clamp has a fifth groove on its side for inserting the second bolt, which positions the end of the second bolt to ensure that the preload is applied precisely along the sliding direction of the moving clamp and to limit the relative displacement between the second bolt and the moving clamp during vibration testing.

9. The general-purpose test fixture according to claim 7, characterized in that: The clamping force application assembly also includes a locking nut, which is threaded to the second bolt to cooperate with the inner wall of the assembly groove to restrict the movement of the second bolt in the direction of releasing the preload.

10. The general-purpose test fixture according to claim 2, characterized in that: Of the fixed clamp and the movable clamp, at least one clamp has a clamping surface that has one of a first clamping groove and a second clamping groove. The first clamping groove is arc-shaped; The second clamping groove includes a first receiving groove and a second receiving groove. There are two first receiving grooves, which are distributed on opposite sides of the second receiving groove and communicate with the second receiving groove. The depth of the second receiving groove is less than the depth of the first receiving groove.

Images