Electric oven aging test system and method and storage medium

Abstract

The invention discloses an electric oven aging test system and method and a storage medium, and relates to the technical field of electric oven tests.The electric oven aging test system specifically comprises an aging test platform, and the aging test platform is in communication connection with a test environment recognition module, a performance stability evaluation module, a life cycle setting module and a safety aging test module; performance stability evaluation is performed on the electric oven through the performance stability evaluation unit, high-strength temperature control information and control efficiency information are collected, whether performance stability analysis of the electric oven is abnormal or not is deduced according to information comparison, and the life cycle of the electric oven is set through the life cycle setting module. And the safety aging test unit is used for performing aging test on the electric oven, acquiring temperature control aging data and insulation aging data, and analyzing and deducing whether the aging phenomenon influence of the electric oven exists or not according to the data.

Description

Technical Field

[0001] This invention relates to the field of electric oven testing technology, specifically to an electric oven aging test system, method, and storage medium. Background Technology

[0002] An electric oven is a kitchen appliance that uses radiant heat from an electric heating element to bake food. Aging is a common phenomenon in electric ovens, and aging tests are a key step in ensuring the quality and reliability of electric ovens.

[0003] For example, patent publication number CN101858956A discloses an aging test system, including an aging test chamber, a test module, a data processing module, and a system control module. The test module is used to test the function and / or DC and / or AC parameters of the device to be aged, the data processing module is used to process the test data obtained by the test module, and the system control module is used to issue various control signals to control the completion of the aging test. The aging test chamber has at least one adapter board for placing the device to be aged, and the at least one adapter board, the test module, the data processing module, and the system control module are connected through an interface.

[0004] However, in the existing technology, it is still impossible to test the testing environment and evaluate the performance stability of electric ovens. It is difficult to obtain the life cycle of electric ovens based on testing and evaluation, so it is impossible to conduct aging tests in conjunction with the life cycle, and it is impossible to conduct aging tests and aging control of electric ovens in a timely manner. In addition, it is impossible to analyze the aging characteristics of electric ovens, making it difficult to achieve aging control and prevention of electric ovens. Therefore, a solution is proposed. Summary of the Invention

[0005] The purpose of this invention is to solve the problems mentioned above by providing an electric oven aging test system, method and storage medium.

[0006] The objective of this invention can be achieved through the following technical solution: an electric oven aging test system, comprising an aging test platform, wherein the aging test platform is communicatively connected to a test environment identification module, a performance stability evaluation module, a life cycle setting module, and a safety aging test module;

[0007] The test environment identification module identifies and analyzes the test environment of the electric oven, collects operating environment information, and calculates the operating environment classification coefficient. If the operating environment classification coefficient exceeds the operating environment classification coefficient threshold, the corresponding sub-period is marked as a high-intensity period; if the operating environment classification coefficient does not exceed the operating environment classification coefficient threshold, the corresponding sub-period is marked as a low-intensity period.

[0008] The performance stability assessment unit performs a performance stability assessment of the electric oven, collects high-intensity temperature control information and control efficiency information, and infers whether the performance stability analysis of the electric oven is abnormal based on information comparison.

[0009] The lifecycle setting module allows you to set the lifecycle of the electric oven.

[0010] The safety aging test unit conducts aging tests on the electric oven, collects temperature control aging data and insulation aging data, and infers whether there is any impact from the aging of the electric oven based on data analysis.

[0011] In a preferred embodiment of the present invention, the operating environment information includes the range of change in the ratio of the fluctuating duration of the operating environment parameters of the electric oven to the constant non-fluctuating duration within a sub-period, the sum of the maximum deviation of the numerical fluctuation rate of adjacent moments within the fluctuating phase of the operating environment parameters of the electric oven within a sub-period and the sum of the cumulative fluctuation rate of each moment within the non-fluctuating phase, and the sum of the frequency of the operating parameters of the internal components of the electric oven at their peak values ​​within the operating phase of the sub-period and the frequency corresponding to the frequency of the peak operating duration of the operating parameters exceeding the specified duration threshold.

[0012] In a preferred embodiment of the present invention, the high-intensity temperature control information and the control efficiency information are respectively the sum of the cumulative deviation of the electric oven's operating temperature from the set temperature during the high-intensity period and the corresponding value of the frequency reduction span of the operating temperature not being the set temperature during the continuous operation phase, and the corresponding value of the rate of decrease of the starting heating temperature of the internal components of the electric oven during the low-intensity period and the corresponding rate of the time delay of the peak operating temperature.

[0013] In a preferred embodiment of the present invention, if the high-intensity temperature control information exceeds the deviation span value ratio threshold, or the control efficiency information exceeds the speed value and threshold, a performance stability abnormal signal is generated and the current test moment is marked as a stability abnormal moment; if the high-intensity temperature control information does not exceed the deviation span value ratio threshold, and the control efficiency information does not exceed the speed value and threshold, a performance stability normal signal is generated and the current test moment is marked as a stability normal moment.

[0014] In a preferred embodiment of the present invention, the process of the lifecycle setting module is as follows:

[0015] The moment when the electric oven is put into operation is taken as the start time of the life cycle, and the moment when the stability is abnormal is taken as the preset end time. The preset end time is screened to obtain the end time of the life cycle. The start time and end time of the life cycle are marked as the set life cycle, and the moment of occasional influence is marked as the inspection time. At the same time, the set life cycle is collected for multiple electric ovens, and the marked life cycle of the electric oven is calculated based on the average value.

[0016] In a preferred embodiment of the present invention, if the number of consecutive occurrences of the preset end time exceeds a set quantity threshold, or the span of the frequency increase of the second occurrence after the first occurrence exceeds a frequency increase span threshold, then the corresponding preset end time is marked as the end time of the life cycle; if the number of consecutive occurrences of the preset end time does not exceed the set quantity threshold, and the span of the frequency increase of the second occurrence after the first occurrence does not exceed a frequency increase span threshold, then the corresponding preset end time is marked as an occasional impact time.

[0017] In a preferred embodiment of the present invention, the temperature control aging data and the insulation aging data are respectively the maximum increase span of heat leakage caused by the moment when the electric oven has a sealing abnormality within the marked life cycle, and the increase span of the electrical charge on the body surface corresponding to the moment when the insulation performance of the electric oven deteriorates within the marked life cycle.

[0018] In a preferred embodiment of the present invention, if the temperature control aging data does not exceed the maximum heat increase span threshold, or the insulation aging data does not exceed the charge increase span threshold, a safety aging signal is generated; if the temperature control aging data exceeds the maximum heat increase span threshold, and the insulation aging data exceeds the charge increase span threshold, a safety normal signal is generated.

[0019] This invention also proposes an aging test method for an electric oven, comprising the following:

[0020] 1. Test Environment Identification: The test environment of the electric oven is identified and analyzed, the operating environment information is collected, and the operating environment classification coefficient is obtained by calculation. If the operating environment classification coefficient exceeds the operating environment classification coefficient threshold, the corresponding sub-time period is marked as a high-intensity time period. If the operating environment classification coefficient does not exceed the operating environment classification coefficient threshold, the corresponding sub-time period is marked as a low-intensity time period.

[0021] 2. Performance stability assessment: The performance stability of the electric oven is assessed by collecting high-intensity temperature control information and control efficiency information. Based on the comparison of the information, the performance stability of the electric oven is analyzed to determine whether there are any abnormalities.

[0022] 3. Lifecycle Setting: Set the lifecycle of the electric oven;

[0023] 4. Safety Aging Test: An aging test is conducted on the electric oven, and temperature control aging data and insulation aging data are collected. Based on the data analysis, it is inferred whether there is any impact from the aging of the electric oven.

[0024] One of the methods is a computer-readable storage medium storing a computer program that, when executed by a processor, implements the above-described method for testing the aging of an electric oven.

[0025] Compared with the prior art, the beneficial effects of the present invention are:

[0026] 1. In this invention, the test environment of the electric oven is identified and analyzed. The type of operating environment of the electric oven within the test cycle is inferred through the environmental identification and analysis. The operating life cycle of the electric oven is set according to the type of operating environment. The aging test can be carried out effectively and accurately by setting the operating life cycle. The aging test combined with the performance of the electric oven itself is conducive to the targeting of the aging test and improves the testing efficiency.

[0027] The system also conducts performance stability assessments on electric ovens to determine whether their operational performance stability is up to standard, ensuring the ovens' operational stability. Furthermore, it enables aging tests on electric ovens based on fluctuations in operational stability, thereby improving the efficiency of aging detection.

[0028] 2. In this invention, the life cycle of the electric oven is set. By setting the life cycle, the accuracy of aging tests can be improved, and the operation can be controlled according to the aging tests, thereby reducing the risk of accelerated aging of the electric oven.

[0029] An aging test is conducted on the electric oven, taking into account the oven's marked lifespan. This improves the accuracy of the aging test and ensures the reliability of the aging test data, so that the aging test results can be used for targeted maintenance.

[0030] 3. In this invention, the aging characteristics of the electric oven are analyzed, and the impact of the aging characteristics analysis on the operating performance of the electric oven is evaluated. This allows for effective control of the operation, which can slow down the aging process of the electric oven, extend its normal operating life, improve its operating efficiency, and enable targeted management based on the aging characteristics to reduce the impact of aging. Attached Figure Description

[0031] To facilitate understanding by those skilled in the art, the present invention will be further described below with reference to the accompanying drawings.

[0032] Figure 1 This is a principle block diagram of Embodiment 1 of the present invention;

[0033] Figure 2 This is a principle block diagram of Embodiment 2 of the present invention. Detailed Implementation

[0034] To enable those skilled in the art to better understand the present invention, the technical solutions of the present invention will be clearly and completely described below with reference to the accompanying drawings of the embodiments of the present invention. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0035] In this document, the term "embodiment" means that a particular feature, structure, or characteristic described in connection with an embodiment may be included in at least one embodiment of the invention. The appearance of this phrase in various places throughout the specification does not necessarily refer to the same embodiment, nor is it a separate or alternative embodiment mutually exclusive with other embodiments. It will be explicitly and implicitly understood by those skilled in the art that the embodiments described herein can be combined with other embodiments.

[0036] Example 1: Please refer to Figure 1 As shown, an electric oven aging test system includes an aging test platform, which is communicatively connected to a test environment identification module, a performance stability evaluation module, a life cycle setting module, and a safety aging test module.

[0037] The aging test platform generates a test environment identification signal and sends it to the test environment identification module. After receiving the test environment identification signal, the test environment identification module identifies and analyzes the test environment of the electric oven. Through environmental identification and analysis, it infers the operating environment type of the electric oven within the test cycle. Based on the operating environment type, the operating life cycle of the electric oven is set. By setting the operating life cycle, aging tests can be carried out effectively and accurately. Combining the aging test with the performance of the electric oven itself is beneficial to the targeting of the aging test and improves the testing efficiency.

[0038] The running period from the start of the electric oven's use is marked as the test period, and the test period is divided into several sub-periods. The range of change of the ratio of the fluctuating duration of the electric oven's operating environment parameters to the constant duration without fluctuation is obtained in each sub-period, and the range of change of the ratio of the fluctuating duration of the electric oven's operating environment parameters to the constant duration without fluctuation in each sub-period is marked as BDK.

[0039] In this invention, the floating duration is the duration during which the floating span exceeds a set numerical threshold, and the absence of a floating duration is the duration during which the floating span does not exceed the set numerical threshold. The operating environment parameters are the environmental parameters that affect the operation of the internal components of the electric oven, such as the temperature of the surrounding environment affecting the temperature of the internal components of the electric oven.

[0040] The maximum deviation of the value fluctuation rate of adjacent moments in the floating phase of the electric oven operating environment parameters within each sub-period is obtained, along with the sum of the cumulative floating value increase rate at each moment in the non-floating phase. The sum of the maximum deviation of the value fluctuation rate of adjacent moments in the floating phase of the electric oven operating environment parameters within each sub-period is then marked as SDH.

[0041] The sum of the frequencies corresponding to the frequencies at which the operating parameters of the internal components of the electric oven are at their peak and the frequencies at which the peak operating time exceeds the specified time threshold is obtained in each sub-period. The sum of the frequencies corresponding to the frequencies at which the operating parameters of the internal components of the electric oven are at their peak and the frequencies at which the peak operating time exceeds the specified time threshold is marked as PLH. In this invention, the numerical ratio or numerical sum is calculated by comparing or summing the numerical values ​​of the data, without considering the problem of inconsistent units of the data.

[0042] The collected data is uniformly labeled as operating environment information, and the operating environment classification coefficient during the electric oven test period is obtained by substituting it into the formula. The calculation formula is as follows: G is the classification coefficient of the operating environment during the test period of the electric oven, and k1, k2 and k3 are preset proportional coefficients, and the preset proportional coefficients are all positive integers greater than 1.

[0043] Compare the classification coefficient of the operating environment with the threshold of the operating environment classification coefficient during the test period of the electric oven:

[0044] If the classification coefficient of the operating environment during the test period of the electric oven exceeds the threshold of the operating environment classification coefficient, the corresponding sub-period will be marked as a high-intensity period; if the classification coefficient of the operating environment during the test period of the electric oven does not exceed the threshold of the operating environment classification coefficient, the corresponding sub-period will be marked as a low-intensity period.

[0045] Send the type of the sub-time period to the aging test platform.

[0046] Simultaneously, a performance stability evaluation signal is generated and sent to the performance stability evaluation unit. After receiving the performance stability evaluation signal, the performance stability evaluation unit performs a performance stability evaluation on the electric oven. Through the performance stability evaluation, it infers whether the operating performance stability of the electric oven is qualified, ensuring the operating stability of the electric oven. Furthermore, it can perform an aging test on the electric oven based on the fluctuation of the operating stability, thereby improving the efficiency of the aging test.

[0047] The cumulative deviation of the oven's operating temperature from the set temperature during high-intensity periods is obtained as the ratio of the frequency of the oven's operating temperature not being the set temperature during continuous operation to the corresponding value of the frequency of the oven's operating temperature not being the set temperature during continuous operation. The ratio of the cumulative deviation of the oven's operating temperature from the set temperature during high-intensity periods to the corresponding value of the frequency of the oven's operating temperature not being the set temperature during continuous operation is marked as high-intensity temperature control information.

[0048] The sum of the speed values ​​corresponding to the time delay speed of the starting heating temperature decrease rate of the internal components of the electric oven during the low-intensity period and the time delay speed of the peak heating temperature is obtained, and the sum of the speed values ​​corresponding to the time delay speed of the starting heating temperature decrease rate of the internal components of the electric oven during the low-intensity period is marked as control efficiency information.

[0049] The high-intensity temperature control information and control efficiency information are compared with the deviation span value and the threshold, and the speed value and the threshold, respectively:

[0050] If the high-intensity temperature control information exceeds the deviation span value ratio threshold, or the control efficiency information exceeds the speed value and threshold, it is inferred that the performance stability analysis of the electric oven in the current sub-period is abnormal, a performance stability abnormal signal is generated, and the current test time is marked as the stability abnormal time. The performance stability abnormal signal and the corresponding stability abnormal time are sent to the life cycle setting module together.

[0051] If the high-intensity temperature control information does not exceed the deviation span value ratio threshold, and the control efficiency information does not exceed the speed value and threshold, then it is inferred that the performance stability analysis of the electric oven in the current sub-period is normal, a performance stability normal signal is generated, and the current test time is marked as a stability normal time. The performance stability normal signal and the corresponding stability normal time are sent to the life cycle setting module together.

[0052] After receiving the normal stability time and the abnormal stability time, the life cycle setting module sets the life cycle of the electric oven. The life cycle setting can improve the accuracy of aging test and also control the operation based on the aging test, reducing the risk of accelerated aging of the electric oven.

[0053] The moment the electric oven is put into operation is taken as the start time of its life cycle, and the moment of abnormal stability is taken as the preset end time. If the number of consecutive occurrences of the preset end time exceeds the set number threshold, or the increase in frequency of the second occurrence after the first occurrence exceeds the frequency increase span threshold, then the corresponding preset end time is marked as the end time of the life cycle; if the number of consecutive occurrences of the preset end time does not exceed the set number threshold, and the increase in frequency of the second occurrence after the first occurrence does not exceed the frequency increase span threshold, then the corresponding preset end time is marked as an occasional impact moment.

[0054] The start and end times of the lifecycle are marked as the set lifecycle, and the time of occasional impact is marked as the test time. At the same time, the set lifecycle is collected for multiple electric ovens, and the marked lifecycle of the electric oven is calculated based on the average value.

[0055] The lifecycle markers are then sent to the aging test platform.

[0056] The aging test platform controls the operating environment parameters of the electric oven based on the fluctuation of the marked life cycle.

[0057] Simultaneously, a safety aging test signal is generated and sent to the safety aging test unit. After receiving the safety aging test signal, the safety aging test unit performs an aging test on the electric oven, combining the aging test with the marked lifespan of the electric oven to improve the accuracy of the aging test and ensure the reliability of the aging test data, so as to ensure that the aging test results can be used for targeted maintenance.

[0058] The maximum increase span of heat leakage caused by the moment when the oven's sealing abnormality occurred within and outside the marked lifespan was obtained, as well as the increase span of the electrical charge on the oven's surface corresponding to the moment when the oven's insulation performance deteriorated within and outside the marked lifespan. These maximum increase spans of heat leakage caused by the moment when the oven's sealing abnormality occurred within the marked lifespan, and the increase spans of the electrical charge on the oven's surface corresponding to the moment when the oven's insulation performance deteriorated within the marked lifespan, were respectively labeled as temperature control aging data and insulation aging data, and compared with the maximum heat increase span threshold and the electrical charge increase span threshold, respectively.

[0059] If the maximum increase in heat leakage caused by the moment when the electric oven experiences a sealing abnormality within or outside the marked lifespan does not exceed the maximum heat increase span threshold, or if the increase in the charge on the surface of the electric oven does not exceed the charge increase span threshold when the insulation performance of the electric oven deteriorates within or outside the marked lifespan, it is inferred that the aging phenomenon of the electric oven within the marked lifespan has a high impact. A safety aging signal is generated and sent to the aging test platform. After receiving the safety aging signal, the aging test platform shuts down and repairs the electric oven currently undergoing aging test.

[0060] If the maximum increase in heat leakage caused by the moment when the electric oven experiences a sealing abnormality within or outside the marked lifespan exceeds the maximum heat increase threshold, and the increase in the surface charge of the electric oven exceeds the charge increase threshold when the insulation performance of the electric oven deteriorates within or outside the marked lifespan, then it is inferred that the aging phenomenon of the electric oven within the marked lifespan has a low impact, a safety normal signal is generated, and the safety normal signal is sent to the aging test platform.

[0061] Example 2: Please refer to Figure 2 As shown, the aging test platform has an aging characteristic analysis signal connected to it to complete the safety aging test. The specific aging characteristic analysis content is as follows:

[0062] The aging test platform generates an aging characteristic analysis signal and sends it to the aging characteristic analysis unit. After receiving the aging characteristic analysis signal, the aging characteristic analysis unit performs aging characteristic analysis on the electric oven and evaluates the impact on the oven's operating performance through the aging characteristic analysis. This allows for effective operation control, which can slow down the aging process of the electric oven, extend its normal operating life, improve its operating efficiency, and enable targeted management based on the aging characteristics to reduce the impact of aging.

[0063] The system obtains the ratio of the number of high-intensity periods to the number of low-intensity periods. If the ratio exceeds a set threshold, the current test period is marked as a high-intensity test period; if the ratio does not exceed the set threshold, the current test period is marked as a low-intensity test period.

[0064] The deviation duration of the moment when the electric oven experiences occasional effects during the high-intensity test period and the low-intensity test period is obtained. Simultaneously, the probability deviation value of the electric oven exhibiting high aging effects within its lifespan during the high-intensity test period and the low-intensity test period is obtained. The deviation duration of the moment when the electric oven experiences occasional effects during the high-intensity test period and the probability deviation value of the electric oven exhibiting high aging effects within its lifespan during the high-intensity test period and the low-intensity test period are respectively labeled as intensity effect data and aging effect data. Furthermore, the deviation duration threshold and the probability deviation threshold are compared respectively.

[0065] If the deviation duration of the time when the electric oven experiences occasional effects during the high-intensity test period and the low-intensity test period exceeds the deviation duration threshold, or if the probability deviation value of the electric oven experiencing high aging effects during its life cycle exceeds the probability deviation threshold, it is inferred that the operating environment parameters of the electric oven are affected. The aging characteristics are marked as intensity-affected characteristics, an intensity control signal is generated, and the intensity control signal is sent to the aging test platform. After receiving the intensity control signal, the aging test platform controls the operating intensity of the electric oven, controls the operating environment parameters of the electric oven, and monitors the environmental parameters of the internal components.

[0066] If the deviation duration of the time when the electric oven experiences occasional impacts during the high-intensity test period and the low-intensity test period exceeds the deviation duration threshold, and the probability deviation of the electric oven experiencing high aging impacts within its life cycle exceeds the probability deviation threshold, then it is inferred that the operating environment parameters of the electric oven have no impact. The aging characteristic is marked as a life cycle impact characteristic, a periodic monitoring signal is generated, and the periodic monitoring signal is sent to the aging test platform. After receiving the periodic monitoring signal, the aging test platform performs periodic monitoring on the electric oven. When the marked life cycle is exceeded or at the end of the marked life cycle, the aging operation and maintenance control of the electric oven is performed.

[0067] The present invention also proposes an aging test method for an electric oven, comprising the following contents:

[0068] 1. Test Environment Identification: The test environment of the electric oven is identified and analyzed, the operating environment information is collected, and the operating environment classification coefficient is obtained by calculation. If the operating environment classification coefficient exceeds the operating environment classification coefficient threshold, the corresponding sub-time period is marked as a high-intensity time period. If the operating environment classification coefficient does not exceed the operating environment classification coefficient threshold, the corresponding sub-time period is marked as a low-intensity time period.

[0069] 2. Performance stability assessment: The performance stability of the electric oven is assessed by collecting high-intensity temperature control information and control efficiency information. Based on the comparison of the information, the performance stability of the electric oven is analyzed to determine whether there are any abnormalities.

[0070] 3. Lifecycle Setting: Set the lifecycle of the electric oven;

[0071] 4. Safety Aging Test: An aging test is conducted on the electric oven, and temperature control aging data and insulation aging data are collected. Based on the data analysis, it is inferred whether there is any impact from the aging of the electric oven.

[0072] Additionally, a computer-readable storage medium stores a computer program that, when executed by a processor, implements the above-described method for testing the aging of an electric oven.

[0073] Those skilled in the art will understand that all or part of the processes in the above embodiments can be implemented by a computer program instructing related hardware. The computer program can be stored in a non-volatile computer-readable storage medium. When the computer program is executed, it can include the processes of the embodiments of the above methods.

[0074] In the embodiments provided by the present invention, any reference to memory, storage, database or other media may include non-volatile and / or volatile memory. Non-volatile memory may include read-only memory (ROM), programmable ROM (PROM), electrically programmable ROM (EPROM), electrically erasable programmable ROM (EEPROM) or flash memory. Volatile memory may include random access memory (RAM) or external cache memory.

[0075] By way of illustration and not limitation, RAM is available in a variety of forms, such as static RAM (SRAM), dynamic RAM (DRAM), synchronous DRAM (SDRAM), dual data rate SDRAM (DDRSDRAM), enhanced SDRAM (ESDRAM), synchronous link DRAM (SLDRAM), RAMbus direct RAM (RDRAM), direct memory bus dynamic RAM (DRDRAM), and memory bus dynamic RAM (RDRAM).

[0076] Those skilled in the art will clearly understand that, for the sake of convenience and brevity, the above-described division of functional units and modules is used as an example. In practical applications, the above functions can be assigned to different functional units and modules as needed, that is, the internal structure of the device can be divided into different functional units or modules to complete all or part of the functions described above.

[0077] The above formulas are all derived from software simulations using a large amount of data, and are selected to be close to the true values. The coefficients in the formulas are set by those skilled in the art based on the actual situation, such as formula... Multiple sets of sample data were collected by a person skilled in the art, and a corresponding verification coefficient was set for each set of sample data. The set verification coefficient and the collected sample data were substituted into the formula. Any two formulas constituted a system of two linear equations in two variables. The calculated coefficients were filtered and the average value was taken. The values ​​of k1, k2 and k3 were 2.83, 2.15 and 2.08, respectively.

[0078] The preferred embodiments of the present invention disclosed above are merely illustrative of the invention. These preferred embodiments do not exhaustively describe all details, nor do they limit the invention to any specific implementation. Clearly, many modifications and variations can be made based on the content of this specification. This specification selects and specifically describes these embodiments to better explain the principles and practical applications of the invention, thereby enabling those skilled in the art to better understand and utilize the invention. The invention is limited only by the claims and their full scope and equivalents.

Claims

1. An electric oven burn-in test system comprising a burn-in test platform, characterized in that, The aging test platform is communicatively connected with a test environment identification module, a performance stability evaluation module, a life cycle setting module, and a safety aging test module; The test environment identification module identifies and analyzes the test environment of the electric oven, collects running environment information, obtains a running environment classification coefficient through calculation, and if the running environment classification coefficient exceeds a running environment classification coefficient threshold, marks the corresponding sub-period as a high-intensity period, and if the running environment classification coefficient does not exceed the running environment classification coefficient threshold, marks the corresponding sub-period as a low-intensity period. The performance stability evaluation unit evaluates the performance stability of the electric oven, collects high-intensity temperature control information and control efficiency information, and compares the information to infer whether the performance stability analysis of the electric oven is abnormal. The life cycle setting module sets the life cycle of the electric oven. The safety aging test unit tests the electric oven, collects temperature control aging data and insulation aging data, and analyzes the data to infer whether the electric oven aging phenomenon exists.

2. The electrical oven aging test system according to claim 1, wherein, The running environment information includes the ratio of the variable span of the reciprocating floating duration and the constant non-floating duration of the electric oven running environment parameters in the sub-period, the sum of the maximum deviation of the numerical floating speed of adjacent time in the floating stage and the speed value of the cumulative floating numerical value increase speed in the non-floating stage of the electric oven running environment parameters in the sub-period, and the sum of the frequency of the peak value of the internal element running parameters and the frequency of the running parameter peak value duration exceeding the specification duration threshold.

3. The electrical oven aging test system of claim 1, wherein, The high-intensity temperature control information and the control efficiency information are respectively the numerical deviation cumulative amount of the electric oven running temperature from the set temperature in the high-intensity period and the frequency reduction span corresponding to the numerical value of the running temperature not being the set temperature in the continuous running stage, and the sum of the speed value corresponding to the starting heating temperature reduction speed and the running heating peak temperature time delay speed of the internal elements of the electric oven in the low-intensity period.

4. The electrical oven aging test system according to claim 3, wherein, If the high-intensity temperature control information exceeds the deviation span numerical value ratio threshold, or the control efficiency information exceeds the speed value sum threshold, a performance stability abnormal signal is generated and the current test time is marked as a stability abnormal time; If the high-intensity temperature control information does not exceed the deviation span numerical value ratio threshold, and the control efficiency information does not exceed the speed value sum threshold, a performance stability normal signal is generated and the current test time is marked as a stability normal time.

5. The electrical oven aging test system of claim 1, wherein, The process of the life cycle setting module is as follows: The time when the electric oven is put into operation is taken as the life cycle starting time, and the stability abnormal time is taken as the preset ending time. After screening, the life cycle ending time is obtained, and the life cycle starting time and the life cycle ending time are marked as the set life cycle. The occasional influence time is marked as the inspection time, and the set life cycle of multiple electric ovens is collected. The marked life cycle of the electric oven is calculated according to the mean value.

6. The electrical oven aging test system of claim 5, wherein, If the number of continuous preset end time points exceeds the set number threshold, or the frequency increase span of the second occurrence after the first occurrence exceeds the frequency increase span threshold, the corresponding preset end time point is marked as a life cycle end time point; if the number of continuous preset end time points does not exceed the set number threshold, and the frequency increase span of the second occurrence after the first occurrence does not exceed the frequency increase span threshold, the corresponding preset end time point is marked as an accidental influence time point.

7. The electrical oven aging test system of claim 1, wherein, The temperature control aging data and the insulation aging data are respectively the maximum growth span of the heat leakage caused by the time point marked as the abnormal sealing time of the electric oven in the life cycle, and the rising span of the body surface charge corresponding to the time point marked as the insulation performance decline of the electric oven in the life cycle.

8. The electrical oven aging test system of claim 7, wherein, If the temperature control aging data does not exceed the maximum heat growth span threshold, or the insulation aging data does not exceed the charge rising span threshold, a safety aging signal is generated; if the temperature control aging data exceeds the maximum heat growth span threshold, and the insulation aging data exceeds the charge rising span threshold, a safety normal signal is generated.

9. An electric oven burn-in test method, characterized by, An electric oven aging test system according to any one of claims 1-8.

10. A computer readable storage medium characterized by A computer program is stored thereon, and when the computer program is executed by a processor, an electric oven aging test method according to claim 9 is implemented.

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