Testing device

Abstract

The invention discloses a testing device, and belongs to the technical field of testing. The testing device comprises a lamp panel, a bearing box and a testing board, the lamp panel is provided with a plurality of display areas, and the bearing box is configured to bear a decoding deck; the test board comprises a mounting plate and a plurality of test connecting seats arranged on the mounting plate, the mounting plate is configured to be connected with the bearing box, each test connecting seat is electrically connected with one display area, and the test connecting seats are configured to be electrically connected with a backlight driving unit of the decoding deck. The plurality of test connecting seats are integrated on the mounting plate, when the mounting plate is connected with the bearing box, the plurality of test connecting seats on the test plate are connected with the decoding deck, and the backlight driving units on the decoding deck are in circuit conduction with the display areas on the corresponding lamp panel, so that the plurality of backlight driving units do not need to be manually connected with the display areas respectively; the connection action is reduced, and the test efficiency can be improved.

Description

Technical Field

[0001] This application relates to the field of decoding board testing technology, and in particular to a testing device. Background Technology

[0002] In a display device, the decoder board is a core functional component. During use, it needs to be connected to the signal input module, main control unit, and light-emitting elements to receive encoded signals and convert them into control signals that can drive the display. The decoder board has multiple backlight driving units. During testing, these backlight driving units need to be electrically connected to the lamp boards of the corresponding display areas. The signal parsing and output control of the corresponding areas on the decoder board are judged to be normal based on the prompts provided by the corresponding display areas.

[0003] Currently, when testing the decoder board, it is necessary to first electrically connect the display area of ​​the lamp board to the backlight driver unit of the decoder board. Since there are many backlight driver units on the decoder board, multiple electrical connection operations are required, resulting in low testing efficiency. Summary of the Invention

[0004] This application provides a testing apparatus to at least partially solve the above-mentioned technical problems.

[0005] To achieve the above objectives, according to a first aspect of this application, a testing apparatus is provided, comprising: The light panel has multiple display areas; The support box is configured to carry the decoding board; The test board includes a mounting plate and a plurality of test connectors disposed on the mounting plate. The mounting plate is configured to be connected to the support box. Each test connector is electrically connected to a display area. The test connector is configured to be electrically connected to the backlight driving unit of the decoding board.

[0006] In some embodiments, the lamp board and the test board are spaced apart along the height direction of the test device, and the test connector is connected to the backlight driving unit via a wire harness, the length of which is greater than the distance between the lamp board and the test board.

[0007] In some embodiments, the distance between the lamp board and the test board is between 70cm and 90cm.

[0008] Reference Figure 3 In some embodiments, at least a portion of the wire harness extends in a spiral.

[0009] In some embodiments, the testing apparatus further includes: A buffer mechanism is located between the support box and the mounting plate. One end of the buffer mechanism is connected to the support box, and the other end is configured to abut against the side of the mounting plate away from the light panel.

[0010] In some embodiments, the buffer mechanism includes a first guide post, an abutment, and an elastic member. The first guide post is connected to the support box. The abutment is sleeved on one end of the first guide post near the mounting plate. One end of the elastic member is connected to the first guide post, and the other end is connected to the abutment, and it is located between the first guide post and the abutment. The abutment is configured to abut against the side of the mounting plate opposite to the light panel.

[0011] In some embodiments, the support box is provided with a second guide post, and the mounting plate is provided with a mounting hole corresponding to the second guide post. The second guide post is configured to pass through the mounting hole to guide the mounting plate to connect with the support box. The mounting plate is provided with a buckle, and the support box is provided with a slot corresponding to the buckle. The buckle and the slot cooperate to fix the mounting plate and the support box relative to each other. The slot is provided with a first magnetic suction component, the mounting plate is provided with a second magnetic suction component that cooperates with the first magnetic suction component, the testing device also includes a mounting frame, the lamp plate is provided on the mounting frame, the mounting frame is provided with a third magnetic suction component that cooperates with the second magnetic suction component, and the buckle is provided with a recessed groove for accommodating the third magnetic suction component on the side away from the support box.

[0012] In some embodiments, the mounting plate includes a connected abutment plate and a base plate, the abutment plate being configured to abut against the support box, and the test connection seat being disposed on the base plate; Along the thickness direction of the mounting plate, the distance between the surface of the abutment plate away from the support box and the base plate is greater than the distance between the surface of the test connector away from the support box and the base plate. The distance between the surface of the buckle facing the support box and the substrate is greater than the distance between the surface of the test connector facing the support box and the substrate.

[0013] In some embodiments, the testing apparatus further includes: A support frame, on which the lamp panel is mounted; A flexible pad is disposed between the lamp panel and the support frame.

[0014] In some embodiments, the mounting plate is a transparent material component; and / or, The test board further includes a gripping member disposed on the side of the mounting plate facing the lamp panel; and / or, The bearing surface of the support box is provided with a positioning protrusion, which is configured to position the decoding board.

[0015] In the testing device of this application embodiment, multiple test connectors are integrated on the mounting plate. When the mounting plate is connected to the support box, the multiple test connectors on the test plate are connected to the decoding board. The backlight driving unit on the decoding board and the display area on the corresponding lamp board are connected by circuit. There is no need to manually connect multiple backlight driving units to the display area separately, which reduces the connection action and helps to improve the testing efficiency.

[0016] Other features and advantages of this application will be described in detail in the following detailed description section. Attached Figure Description

[0017] To more clearly illustrate the technical solutions in the embodiments of this application, the accompanying drawings used in the description of the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0018] To gain a more complete understanding of this application and its beneficial effects, the following description will be provided in conjunction with the accompanying drawings, wherein the same reference numerals in the following description denote the same parts.

[0019] Figure 1 This is a three-dimensional structural schematic diagram of the testing device provided in some embodiments of this application; Figure 2 This is a front view of a testing apparatus provided in some embodiments of this application; Figure 3 These are schematic diagrams of the testing apparatus provided in other embodiments of this application; Figure 4 This is a schematic diagram of the front structure of the test board provided in some embodiments of this application; Figure 5 This is a schematic diagram of the structure of the back of the test board provided in some embodiments of this application; Figure 6 These are schematic diagrams of the decoding board provided in some embodiments of this application; Figure 7 These are schematic diagrams of the support box and mounting plate provided in some embodiments of this application; Figure 8 These are schematic diagrams of the support box provided in some embodiments of this application; Figure 9 These are front assembly views of the support box and mounting plate provided in some embodiments of this application; Figure 10 yes Figure 9 Sectional view along AA; Figure 11 These are schematic diagrams of the test apparatus provided in some other embodiments of this application.

[0020] Explanation of reference numerals in the attached figures: 100 - Test apparatus; 10-Light panel; 11-Display area; 20-Support box; 21-Positioning protrusion; 22-Slot; 23-First magnetic suction element; 24-Second guide post; 30-Test board; 31-Mounting plate; 311-Snap fastener; 313-Sink; 312-Second magnetic chuck; 32-Test connector; 40-Wire harness; 50 - Buffer mechanism; 51 - First guide post; 52 - Abutment part; 53 - Elastic part; 60 - Decoder board; 61 - Positioning slot; 71 - Male seat; 72 - Female seat; 80-Support frame; 81-Third magnetic chuck. Detailed Implementation

[0021] The technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only a part of the embodiments of this application, and not all of them. All other embodiments obtained by those skilled in the art based on the embodiments of this application without creative effort are within the protection scope of this application.

[0022] In the display device, the decoder board 60 is a core functional component. During use, it needs to be connected to the signal input module, main control unit, and light-emitting components to receive encoded signals and convert them into control signals that can drive the display. The decoder board 60 has multiple backlight driving units. During testing, these backlight driving units need to be electrically connected to the lamp board 10 of the corresponding display area 11. The signal parsing and output control of the corresponding area of ​​the decoder board 60 are judged to be normal based on the prompts given by the corresponding display area 11.

[0023] Currently, when testing the decoder board 60, the display area 11 of the lamp board 10 needs to be electrically connected to the backlight driving unit of the decoder board 60. Since there are many backlight driving units on the decoder board 60, multiple electrical connection operations are required, resulting in low testing efficiency.

[0024] Reference Figures 1 to 6 Therefore, this application provides a testing device 100 for testing a decoding board 60.

[0025] The testing apparatus 100 includes a support box 20, a light panel 10, and a test board 30. The support box 20 is configured to carry the decoding board 60 and can be moved along with the process progress to transport the decoding board 60 to the testing area. The testing area is the area where the testing apparatus 100 is located, and the completed decoding board 60 is transported from the support box 20 to the testing area for testing.

[0026] The lamp board 10 has multiple display areas 11, and the decoder board 60 has multiple backlight driving units. When the backlight driving unit is electrically connected to the corresponding display area 11, the display area 11 corresponding to the backlight driving unit gives a corresponding prompt to indicate to the tester whether it is qualified.

[0027] The test board 30 includes a mounting plate 31 and a plurality of test connectors 32 disposed on the mounting plate 31. The mounting plate 31 is configured to be connected to the support box 20. Each test connector 32 is electrically connected to a display area 11 and is configured to connect to the decoding board 60.

[0028] It is understood that multiple test connectors 32 are integrated on the mounting plate 31, which provides the mounting base for the test connectors 32. The decoding board 60 has multiple backlight driving units (not shown in the figure), and each test connector 32 corresponds to a backlight driving unit. The display area 11 is connected to the corresponding backlight driving unit through the test connector 32. When the test connector 32 is connected to the decoding board 60, the display area 11 is connected to the corresponding backlight driving unit circuit, and the display area 11 provides a corresponding prompt to indicate whether it is qualified or not.

[0029] In this embodiment, multiple test connectors 32 are integrated into the mounting plate 31. When the mounting plate 31 is connected to the support box 20, the multiple test connectors 32 on the test plate 30 are connected to the decoding board 60. The backlight driving unit on the decoding board 60 is connected to the display area 11 on the corresponding lamp board 10. There is no need to manually connect the multiple backlight driving units to the display area 11 respectively, which reduces the connection action and helps to improve the test efficiency.

[0030] It is understandable that when the mounting plate 31 is connected to the support box 20, the test connector 32 is docked with the decoder board 60. When the mounting plate 31 is removed from the support box 20, the test connector 32 is also disengaged from the decoder board 60.

[0031] In one example, the length, width, and height of the test connector 32 are 400mm, 300mm, and 50mm, respectively.

[0032] For example, display area 11 uses LED indicator lights to display the test results in real time (green for qualified, red for unqualified). Test personnel follow the prompts to transfer qualified products to the next process and place unqualified products in the rework area.

[0033] In some embodiments, the lamp board 10 has eight display areas 11, and the testing device 100 can test a decoding board 60 with eight backlight driving units at once. Experimental verification shows that using a testing board 30 that integrates multiple test connectors 32 can shorten the testing cycle of a single decoding board 60 from 60 seconds to less than 50 seconds.

[0034] In some embodiments, the test connector 32 is detachably connected to the mounting plate 31, for example, by snap-fit ​​or plug-in.

[0035] For example, the mounting plate 31 is provided with a connection hole, and the test connector 32 is snapped into the connection hole.

[0036] In some embodiments, the test connector 32 is connected to the decoder board 60 via a connector.

[0037] In one example, the connector is a male-female connector.

[0038] In one example, the connector includes a male connector 71 and a female connector 72. The test connector 32 is provided with the male connector 71 on the side facing the support box 20, and the decoder board 60 is provided with the female connector 72. The male connector 71 and the female connector 72 are plugged in, and the circuit is connected.

[0039] The decoder board 60 uses a star topology circuit board to provide independent power supply and signal channels for each test connector 32. This design effectively avoids mutual interference between channels.

[0040] By plugging in the male and female connectors 72, the power and signal lines of the lamp board 10 are automatically connected to the test circuit inside the decoder board 60. The tester applies a preset excitation signal (such as a specific voltage, current, or digital command) to the lamp board 10 through the decoder board 60, and simultaneously collects the response parameters of the lamp board 10 (such as output voltage, waveform, power consumption, or communication response).

[0041] To prevent the decoder board 60 from moving, in some embodiments, a limiting groove is provided on the support box 20, and the decoder board 60 is disposed in the limiting groove.

[0042] In some embodiments, the support box 20 is further provided with a positioning protrusion 21, and the decoding plate 60 is provided with a positioning groove 61 that cooperates with the positioning protrusion 21. The positioning protrusion 21 is embedded in the positioning groove 61 to restrict the movement of the decoding plate 60.

[0043] In some embodiments, the mounting plate 31 is a transparent component, so that testers can observe through the mounting plate 31 whether the decoding board 60 is deformed by the mounting plate 31, and whether the test connector 32 is properly connected to the decoding board 60.

[0044] To balance the light transmittance and structural strength required for the mounting plate 31, in one example, the mounting plate 31 is made of acrylic material.

[0045] In some embodiments, the test plate 30 further includes a gripper disposed on the side of the mounting plate 31 facing the lamp plate 10.

[0046] For example, the grip is positioned above the mounting plate 31.

[0047] For example, there are two grips, spaced apart. This arrangement facilitates the removal of the mounting plate 31 and the disassembly of the test plate 30 from the support box 20 after the test is completed.

[0048] In some embodiments, the test plate 30 snaps into the support box 20. This arrangement facilitates the installation of the test plate 30 into the support box 20 and the removal of the test plate 30 from the support box 20.

[0049] In some embodiments, the lamp plate 10 and the test plate 30 are spaced apart along the height direction of the testing device 100. This arrangement can avoid the risk of damage caused by contact between the lamp plate 10 and the test plate 30 or the support box 20.

[0050] In some embodiments, the test connector 32 is connected to the corresponding display area 11 via a wiring harness 40, the length of which is greater than the distance between the lamp board 10 and the test board 30. Properly setting the length redundancy of the wiring harness 40 provides a certain amount of flexibility, thereby preventing excessive tension caused by external pulling during assembly, use, or maintenance, thus reducing the risk of poor contact and ensuring the stability of the circuit connection.

[0051] In some embodiments, the distance between the lamp board 10 and the test board 30 is between 70cm and 90cm. This arrangement provides a suitable distance between the lamp board 10 and the test board 30, offering ample operating space for the assembly and disassembly of the test board 30, thus improving testing convenience. Furthermore, it effectively prevents collisions and friction between the test board 30 and the lamp board 10 during assembly / disassembly, thereby preventing damage to the lamp board 10 and ensuring its structural integrity and reliability.

[0052] For example, the distance between the light panel 10 and the test panel 30 can be 70cm, 75cm, 80cm, 85cm, 90cm and any value in between.

[0053] In some embodiments, the length of the wire harness 40 is between 70cm and 90cm. This length ensures that the test board 30 has sufficient room for movement and can be properly placed when not being tested (e.g., placed on a dedicated anti-static mat or on a mounting bracket, such as the third magnetic 81 described below), avoiding direct contact with the housing or other hard surfaces.

[0054] In some embodiments, at least a portion of the wire harness 40 extends in a spiral.

[0055] It can be a spiral extension of the middle section of the wire harness 40, or a spiral extension of the wire harness 40 near the lamp board 10, or a spiral extension of the wire harness 40 near the test board 30.

[0056] At least a portion of the wire harness 40 adopts a spiral extension design, which can not only utilize the elastic expansion and contraction characteristics of the spiral structure to form length redundancy, buffer the mechanical stress generated by external force pulling, effectively reduce the risk of poor contact at the connection part of the wire harness 40, and ensure the stability of circuit connection, but also achieve a compact layout of the wire harness 40, rationally plan the wiring path in a limited space, and avoid the wire harness 40 from getting tangled with surrounding components.

[0057] Reference Figures 7 to 10 In some embodiments, the test apparatus 100 further includes a buffer mechanism 50 located between the support box 20 and the mounting plate 31. One end of the buffer mechanism 50 is connected to the support box 20, and the other end is configured to abut against the side of the mounting plate 31 away from the lamp panel 10.

[0058] The buffer mechanism 50 has a natural state and a compressed state. When the mounting plate 31 is not connected to the support box 20, the buffer mechanism 50 is in its natural state. In this state, the end of the buffer mechanism 50 closest to the test plate 30 extends out from the side of the decoding plate 60 facing the mounting plate 31. When the mounting plate 31 is connected to the support box 20, the buffer mechanism 50 is in its compressed state. That is, in its natural state, the top of the buffer mechanism 50 is closer to the mounting plate 31 than the decoding plate 60. During the connection between the mounting plate 31 and the support box 20, the buffer mechanism 50 can first abut against the mounting plate 31, offsetting part of the impact force generated when the mounting plate 31 is installed in the support box 20, reducing the risk of damage to the decoding plate 60. At the same time, the buffer mechanism 50 is compressed, which does not affect the connection between the mounting plate 31 and the support box 20. In addition, the buffer mechanism 50 can also provide support for the mounting plate 31, preventing the mounting plate 31 from deforming due to repeated assembly and disassembly.

[0059] Specifically, the buffer mechanism 50 is connected to the bottom plate of the support box 20.

[0060] Reference Figure 10In some embodiments, the buffer mechanism 50 includes a first guide post 51, an abutment 52, and an elastic member 53. The first guide post 51 is connected to the support box 20. The abutment 52 is sleeved on one end of the first guide post 51 near the mounting plate 31. One end of the elastic member 53 is connected to the first guide post 51, and the other end is connected to the abutment 52. It is located between the first guide post 51 and the abutment 52. The abutment 52 is configured to abut against the side of the mounting plate 31 away from the lamp panel 10.

[0061] When the tester places the test plate 30 on the support box 20, the abutment 52 abuts against the test plate 30 and sinks under the force of the test plate 30. At the same time, the elastic member 53 accumulates elastic force. When the tester removes the test plate 30 from the support box 20, the elastic member 53 drives the abutment 52 to reset, and the abutment 52 moves upward to reset. It can be understood that the abutment 52 provided in this embodiment has a small displacement stroke in the extension direction of the first guide post 51 (the height direction of the test device 100).

[0062] The elastic element 53 can be a spring, elastic sleeve, etc.

[0063] Reference Figure 7 In some embodiments, the support box 20 is provided with a second guide post 24, and the mounting plate 31 is provided with a mounting hole corresponding to the second guide post 24. The second guide post 24 is configured to pass through the mounting hole to guide the mounting plate 31 to connect with the support box 20.

[0064] It is understood that the second guide post 24 can guide the mounting plate 31 to align and connect with the support box 20 so that the position of the test connection seat 32 on the mounting plate 31 (e.g., male seat 71) corresponds to the connection position of the backlight driving unit on the decoding board 60 (e.g., female seat 72).

[0065] In one example, the diameter of the top end of the second guide post 24 is smaller than the diameter of the mounting hole so that the second guide post 24 can be inserted into the mounting hole. The diameter of the bottom end of the second guide post 24 is equal to the inner diameter of the mounting hole to avoid the risk of movement of the mounting plate 31 caused by the redundancy of the mounting hole.

[0066] In some embodiments, the mounting plate 31 is provided with a buckle 311, and the support box 20 is provided with a slot 22 corresponding to the buckle 311. The buckle 311 and the slot 22 cooperate to fix the mounting plate 31 and the support box 20 relative to each other.

[0067] In one example, the width of the opening of the slot 22 is greater than the width of the bottom of the slot 22, and the shape of the buckle 311 is adapted to the shape of the slot 22. Exemplarily, the cross-section of the slot 22 is an inverted trapezoid. This arrangement facilitates the engagement of the buckle 311 and the slot 22, helps reduce the pressing force required for them to engage, and also makes it easier to disengage the buckle 311 from the slot 22 with less force.

[0068] In some embodiments, a first magnetic suction member 23 is provided in the slot 22, and a second magnetic suction member 312 that cooperates with the first magnetic suction member 23 is provided in the mounting plate 31. The testing device 100 also includes a mounting frame, a lamp plate 10 is provided in the mounting frame, a third magnetic suction member 81 is provided in the mounting frame, and a recess 313 for accommodating the third magnetic suction member 81 is provided on the side of the buckle 311 away from the support box 20.

[0069] It is understood that the second magnetic chuck 312 can be used to connect the mounting plate 31 to the support box 20, and also to connect the mounting plate 31 to the mounting bracket. Specifically, when the test plate 30 is connected to the support box 20, the first magnetic chuck 23 and the second magnetic chuck 312 are magnetically attracted to each other, improving the connection stability. When the test plate 30 is separated from the support box 20, in order to place the test plate 30, the second magnetic chuck 312 and the third magnetic chuck 81 are magnetically attracted to each other, improving the placement stability of the test plate 30.

[0070] In this configuration, one of the first magnetic attractor 23 and the second magnetic attractor 312 is a magnet, and the other is a magnetic material. Similarly, one of the second magnetic attractor 312 and the third magnetic attractor 81 is a magnet, and the other is a magnetic material. The magnet can be made of materials such as neodymium iron boron or aluminum nickel cobalt, and the magnetic material can be made of materials such as iron, nickel, or cobalt.

[0071] In one example, a mounting post is provided on the side of the mounting bracket facing the support box 20, and a third magnetic member 81 is provided at the end of the mounting post near the support box 20.

[0072] Reference Figure 11 In some embodiments, the mounting plate 31 includes a connecting abutment plate and a base plate. When the mounting plate 31 is connected to the support box 20, the abutment plate abuts against the support box 20, and the support box 20 provides support for the mounting plate 31. The test connection seat 32 is disposed on the base plate.

[0073] For example, mounting holes are provided in the abutment plate.

[0074] For example, the abutment plate and the substrate are connected by a snap fastener 311, which protrudes from the side of the substrate facing the support box 20.

[0075] In some embodiments, there is a height difference between the abutment plate and the substrate. Along the thickness direction of the mounting plate 31, the distance between the surface of the abutment plate facing away from the support box 20 and the substrate is greater than the distance between the surface of the test connector 32 facing away from the support box 20 and the substrate. With this configuration, the abutment plate is higher than the top of the test connector 32. During transportation, the abutment plate can support the packaging box or stacked items above, reducing the risk of damage to the top of the test connector 32.

[0076] The distance between the surface of the latch 311 facing the support box 20 and the substrate is greater than the distance between the surface of the test connector 32 facing the support box 20 and the substrate. It can be understood that the protrusion height of the latch 311 towards the support box 20 is greater than that of the test connector 32. With this configuration, the bottom of the latch 311 is lower than the bottom of the test connector 32. During transportation, the latch 311 can abut against the packaging box or stacked items below, reducing the risk of damage to the bottom of the test connector 32.

[0077] Reference Figures 1 to 3 In some embodiments, the testing device 100 further includes a support frame 80 and a flexible pad, with the lamp plate 10 disposed on the support frame 80 and the flexible pad disposed between the lamp plate 10 and the support frame 80. The flexible pad can prevent the lamp plate 10 from rigidly colliding with the mounting frame, reducing the risk of damage to the lamp plate 10.

[0078] Specifically, the flexible pad is a soft silicone pad. After the lamp board 10 is inserted, its edges are supported and limited by the silicone pad, which not only ensures stability during testing but also reduces the risk of scratches or compression to the lamp board 10.

[0079] In some embodiments, the bearing surface of the support box 20 is provided with a positioning protrusion 21, which is configured as a positioning decoding plate 60. The decoding plate 60 is provided with a positioning groove 61 that cooperates with the positioning protrusion 21, and the positioning protrusion 21 is embedded in the positioning groove 61 so that the decoding plate 60 and the support box 20 remain relatively fixed.

[0080] In the description of this application, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Therefore, a feature defined as "first" or "second" may explicitly or implicitly include one or more features. In the description of this application, "multiple" means two or more, unless otherwise explicitly specified.

[0081] In the above embodiments, the descriptions of each embodiment have different focuses. For parts not described in detail in a certain embodiment, please refer to the relevant descriptions in other embodiments.

[0082] The embodiments, implementation methods, and related technical features of this application can be combined and substituted for each other without conflict.

[0083] The above are merely preferred embodiments of this application and are not intended to limit this application in any way. Any simple modifications, equivalent changes, and alterations made to the above embodiments based on the technical essence of this application without departing from the scope of the technical solution of this application shall still fall within the scope of the technical solution of this application.

Claims

1. A testing device, characterized in that, include: The light panel has multiple display areas; The support box is configured to carry the decoding board; The test board includes a mounting plate and a plurality of test connectors disposed on the mounting plate. The mounting plate is configured to be connected to the support box. Each test connector is electrically connected to a display area. The test connector is configured to be electrically connected to the backlight driving unit of the decoding board.

2. The testing apparatus according to claim 1, characterized in that, The lamp board and the test board are spaced apart along the height direction of the test device. The test connector is connected to the backlight driving unit via a wire harness, the length of which is greater than the distance between the lamp board and the test board.

3. The testing apparatus according to claim 2, characterized in that, The distance between the lamp board and the test board is between 70cm and 90cm.

4. The testing apparatus according to claim 2, characterized in that, At least a portion of the wire harness extends in a spiral.

5. The testing apparatus according to claim 2, characterized in that, The testing apparatus also includes: A buffer mechanism is located between the support box and the mounting plate. One end of the buffer mechanism is connected to the support box, and the other end is configured to abut against the side of the mounting plate away from the light panel.

6. The testing apparatus according to claim 5, characterized in that, The buffer mechanism includes a first guide post, an abutment, and an elastic member. The first guide post is connected to the support box. The abutment is sleeved on one end of the first guide post near the mounting plate. One end of the elastic member is connected to the first guide post, and the other end is connected to the abutment, and it is located between the first guide post and the abutment. The abutment is configured to abut against the side of the mounting plate away from the light panel.

7. The testing apparatus according to any one of claims 1-6, characterized in that, The support box is provided with a second guide post, and the mounting plate is provided with mounting holes corresponding to the second guide post. The second guide post is configured to pass through the mounting holes to guide the mounting plate to connect with the support box. The mounting plate is provided with a buckle, and the support box is provided with a slot corresponding to the buckle. The buckle and the slot cooperate to fix the mounting plate and the support box relative to each other. The slot is provided with a first magnetic suction component, the mounting plate is provided with a second magnetic suction component that cooperates with the first magnetic suction component, the testing device also includes a mounting frame, the lamp plate is provided on the mounting frame, the mounting frame is provided with a third magnetic suction component that cooperates with the second magnetic suction component, and the buckle is provided with a recessed groove for accommodating the third magnetic suction component on the side away from the support box.

8. The testing apparatus according to claim 7, characterized in that, The mounting plate includes a connected abutment plate and a base plate, the abutment plate being configured to abut against the support box, and the test connection seat being disposed on the base plate; Along the thickness direction of the mounting plate, the distance between the surface of the abutment plate away from the support box and the base plate is greater than the distance between the surface of the test connector away from the support box and the base plate. The distance between the surface of the buckle facing the support box and the substrate is greater than the distance between the surface of the test connector facing the support box and the substrate.

9. The testing apparatus according to any one of claims 1-6, characterized in that, The testing apparatus also includes: A support frame, on which the lamp panel is mounted; A flexible pad is disposed between the lamp panel and the support frame.

10. The testing apparatus according to any one of claims 1-6, characterized in that, The mounting plate is a transparent component; and / or, The test board further includes a gripping member disposed on the side of the mounting plate facing the lamp panel; and / or, The bearing surface of the support box is provided with a positioning protrusion, which is configured to position the decoding board.

Images