Potentiometer detection system with parameter setting function
By combining a microcontroller module and related modules, the potentiometer parameters can be accurately detected, overcoming the limitations of traditional detection methods and ensuring the accurate use of the potentiometer in different scenarios.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2024-09-30
- Publication Date
- 2026-03-31
AI Technical Summary
Existing technologies cannot effectively detect the consistency between the actual and theoretical parameters of a potentiometer, especially its linearity and the continuity of its resistance. Traditional testing methods cannot meet high safety requirements.
The system employs a microcontroller module, a parameter setting input module, a constant current and constant voltage setting module, a test acquisition module, and a display module. The microcontroller module receives parameter setting data and test data, compares them, and displays them on the display module, thereby enabling the setting and testing of potentiometer parameters.
It provides practical basis for potentiometer parameters, ensuring the accuracy of potentiometer use in different scenarios and improving the precision and reliability of detection.
Smart Images

Figure CN121763183A_ABST
Abstract
Description
Technical Field
[0001] This invention relates to a potentiometer detection system with parameter setting function. Background Technology
[0002] In an aircraft cockpit, pilots use various potentiometers mounted on control panel assemblies to adjust cockpit lighting, air conditioning, and other functions. These potentiometers include single-layer and multi-layer potentiometers. There are two main methods of potentiometer adjustment used in aircraft systems: hard-wired adjustment, which directly obtains the voltage value across the potentiometer, and adjustment by converting the voltage signal from the potentiometer's adjustment pins into a digital signal. Hard-wired adjustment involves directly connecting the potentiometer to the aircraft system via a cable, with the potentiometer changing its resistance value to directly provide the adjustment status to the aircraft system. Digital adjustment involves a microcontroller integrated into the control panel assembly acquiring the switch pin levels, encoding these levels to form a digital signal, and transmitting it to the aircraft system via the aircraft bus network. The aircraft system then decodes the signal to obtain the final adjustment status. Hard-wired adjustment is used for aircraft systems with high safety requirements, while digital adjustment is mainly used for general-purpose aircraft systems such as environmental control systems and lighting systems. For any type of adjustment, the actual and theoretical parameters of the potentiometer must be consistent, and there should be no overshoot exceeding the tolerance range.
[0003] Currently, potentiometer testing methods are relatively traditional and outdated. Generally, a multimeter is used to test whether the output resistance of its pins meets the requirements. However, the multimeter has significant limitations in testing whether the resistance value of the potentiometer is continuous during the sliding process, and it cannot test the linearity of the potentiometer. In addition, since the potentiometer is a mechanical rotating device, it is impossible for it to contact every point during rotation or sliding. The contacts will touch different positions during operation, meaning that the situation is not exactly the same every time. The above points cannot be tested by traditional testing methods. Summary of the Invention
[0004] The purpose of this invention is to provide a novel potentiometer detection system with parameter setting function.
[0005] To achieve the above objectives, the present invention provides a technical solution: a potentiometer detection system with parameter setting function, comprising: a microcontroller module, a parameter setting input module, a constant current and constant voltage setting module, a test acquisition module, and a display module. The parameter setting input module is used to provide parameter setting data to the microcontroller module. The constant current and constant voltage setting module is used to provide corresponding constant current or constant voltage to the potentiometer under test according to the usage scenario. The test acquisition module is used to test the potentiometer under test and feed back the test data to the microcontroller module. The microcontroller module is used to receive the parameter setting data from the parameter setting input module and set the usage scenario according to the parameter setting data. The microcontroller module is also used to receive the test data from the test acquisition module and send the comparison data between the test data and the parameter setting data to the display module for display.
[0006] Compared with the prior art, the beneficial effects of the present invention are at least as follows: for potentiometer function testing, by inputting potentiometer parameter functions, setting usage environment parameters, outputting potentiometer linearity, and displaying the comparison between test parameters and set parameters, the present invention provides users with practical basis for using potentiometers in different scenarios. Attached Figure Description
[0007] Figure 1 This is a structural schematic diagram of an embodiment of the present invention.
[0008] Figure 2 This is a flowchart of a method according to an embodiment of the present invention.
[0009] Figure 3 This is a graph showing the distribution and dynamic trend of the resistance values tested in an embodiment of the present invention. Detailed Implementation
[0010] The present invention will now be described in further detail with reference to specific embodiments and accompanying drawings. It should be noted that these descriptions of embodiments are intended to aid in understanding the invention and do not constitute a limitation thereof. Furthermore, the technical features involved in the various embodiments of the present invention described below can be combined with each other as long as they do not conflict with each other.
[0011] See Figure 1 The figure shows a potentiometer detection system with parameter setting function. The potentiometer detection system includes: a microcontroller module, a parameter setting input module, a constant current and constant voltage setting module, a test acquisition module, and a display module. The microcontroller module is communicatively connected to the parameter setting input module, the constant current and constant voltage setting module, the test acquisition module, and the display module.
[0012] The parameter setting input module is used to provide the microcontroller module with the potentiometer performance indicators or potentiometer parameters required for the application scenario.
[0013] The constant current and constant voltage setting module is used to provide corresponding constant current or constant voltage to the potentiometer under test according to the scene control signal of the microcontroller module. The constant current and constant voltage setting module provides at least two reference voltage signals and a current signal, and the amplitudes of each reference voltage signal are different.
[0014] The test acquisition module is electrically connected to the constant current and constant voltage setting module and the potentiometer under test. The test acquisition module sends the constant current or constant voltage provided by the constant current and constant voltage setting module to the potentiometer under test. The test acquisition module also tests the potentiometer under test and feeds back the obtained test data to the microcontroller module. The microcontroller module receives parameter setting data from the parameter setting input module. The microcontroller module also sends control signals corresponding to the scenario of the potentiometer under test to the constant current and constant voltage module. The microcontroller module further receives test data from the test acquisition module and sends the comparison data between the test data and the parameter setting data to the display module for display.
[0015] If the potentiometer's theoretical parameters are a rotation angle of 30° to 300°, a resistance variation range of 50Ω to 5000Ω, and an operating voltage of 2.7V to 3.2V; and a resistance tolerance of 5%; See Figure 2 The detection process is as follows: (1) Input parameters: rotation angle 30°~300°, resistance range 50Ω~5000Ω, working voltage 2.7V~3.5V, tolerance 5%, input parameter setting module; the parameter setting module will output the corresponding test conditions according to the input parameters; and set the corresponding test value according to the tolerance; (2) Adjust the potentiometer to be measured to the position of maximum or minimum angle; (3) Click Start Test and rotate the potentiometer in the same direction; At this point, the constant current and constant voltage module defaults to a 3.3V input voltage, but the voltage can be selected according to the actual situation; and it also rapidly acquires resistance changes. At this time, the test module collects and records the continuous resistance values at the active point; records the test values in the order of rotation time; when the potentiometer selection ends from small to large, the test module records all the test values in time; when the potentiometer rotates from large to small, the test module records all the test values in time order.
[0016] (4) Repeatedly rotate the potentiometer (from the smallest to the largest angle, and then from the largest angle to the smallest angle, which can be repeated), and the test image curve is displayed on the LCD screen; In data processing, all measured values of the potentiometer during the selection process from small to large are first marked on the number axis. Then, all measured values of the potentiometer from large to small are inserted into the number axis. Next, the theoretical and actual measured values are compared, and a two-dimensional graph of the selection angle and resistance value is plotted. This graph clearly shows the resistance trend (i.e., the monotonicity of the function) during the selection process of the potentiometer from large to small and from small to large. When the monotonicity is consistent, it indicates that the resistance trend of the potentiometer increases monotonically from small to large; when the rotation angle of the potentiometer decreases, the resistance trend decreases monotonically. The LCD screen dynamically displays the change trend of the potentiometer with the rotation angle. The distribution and dynamic trend of the tested resistance values are shown in the graph. Figure 3 .
[0017] (5) Test result analysis: Click on the test result analysis on the LCD screen to view: Linearity: During rotation, the resistance increases with the angle, with no overshoot point (i.e., the point exceeding the tolerance of 5% of its corresponding position). Consistency: The resistance values of the potentiometer are all within the product specification range when rotated back and forth; Conclusion: Based on the comparison between the potentiometer's test values and the product parameter values, the potentiometer's function meets the requirements; The above description merely illustrates embodiments of the present invention and is quite specific and detailed; however, it should not be construed as limiting the scope of the invention patent. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of the present invention, and these all fall within the protection scope of the present invention. Therefore, the protection scope of this invention patent should be determined by the appended claims.
Claims
1. A potentiometer detection system with parameter setting function, characterized in that, include: The system comprises a microcontroller module, a parameter setting input module, a constant current and constant voltage setting module, a test acquisition module, and a display module. The parameter setting input module provides parameter setting data to the microcontroller module. The constant current and constant voltage setting module provides corresponding constant current or constant voltage to the potentiometer under test according to the usage scenario. The test acquisition module tests the potentiometer under test and feeds back the test data to the microcontroller module. The microcontroller module receives the parameter setting data from the parameter setting input module and sets the usage scenario according to the parameter setting data. The microcontroller module also receives test data from the test acquisition module and sends the comparison data between the test data and the parameter setting data to the display module for display.
2. The potentiometer detection system with parameter setting function according to claim 1, characterized in that, The parameter setting data includes: the usage scenario and the required potentiometer performance indicators or the potentiometer's own parameter indicators.
3. The potentiometer detection system with parameter setting function according to claim 1, characterized in that, The comparison data between the test data and the parameter setting data includes: a comparison table of the actual usage scenario parameters of the potentiometer and the parameters in the potentiometer's factory report, as well as the main parameters.