Circuit for detecting buckling reliability of board-to-board connector and electronic equipment

Abstract

The invention provides a circuit for detecting the buckling reliability of a board-to-board connector and electronic equipment, the circuit is applied to a first device and at least two second devices which are connected through the board-to-board connector, and the board-to-board connector comprises a first pin arranged on the first device and a second pin arranged on the second device. One first pin and one corresponding second pin are connected to form a detection pin group, and each board-to-board connector is provided with at least one detection pin group; the circuit comprises a power supply, a pull-up resistor, a pull-down resistor, an analog-to-digital converter (ADC), a grounding point and a plurality of detection pin groups, one end of the pull-up resistor is connected with a power supply, the other end of the pull-up resistor is connected with the pull-down resistor, the pull-down resistor is connected with a grounding point, and the ADC sampling port is connected between the pull-up resistor and the pull-down resistor. The invention provides a circuit for detecting the buckling reliability of a board-to-board connector and electronic equipment, and the circuit and the electronic equipment can achieve the effective detection of the buckling of a plurality of BTB connectors.

Description

[0001] This application is a divisional application. The original application has the application number 202011198128.5 and the original application date is October 30, 2020. The entire contents of the original application are incorporated herein by reference. Technical Field

[0002] This application relates to the field of electronic equipment technology, and in particular to a circuit and electronic equipment for detecting the reliability of board-to-board connector engagement. Background Technology

[0003] A board-to-board (BTB) connector consists of a male and a female connector, which interlock. These two connectors are fixed to two different devices, and by snapping them together, the two devices are connected. Currently, electronic devices often use multiple BTB connectors to provide electrical connections between the motherboard and various peripheral modules. During the assembly process, manual snapping of BTB connectors can lead to incomplete engagement, causing the connector to easily detach and break the electrical connection. This can result in peripheral device malfunctions. Therefore, reliable testing of BTB connector engagement is essential. Summary of the Invention

[0004] This application provides a circuit and electronic device for detecting the reliability of board-to-board connector engagement, which can detect the effectiveness of multi-channel BTB connector engagement.

[0005] This application provides a circuit for detecting the reliability of board-to-board connector engagement, applied to a first device and at least two second devices connected via a board-to-board connector. The board-to-board connector includes a first pin on the first device and a second pin on each of the second devices. A first pin and a corresponding second pin are connected to form a detection pin group, and each board-to-board connector has at least one detection pin group. The circuit includes a power supply, pull-up resistors, pull-down resistors, an analog-to-digital converter (ADC), a ground point, and multiple detection pin groups. One end of the pull-up resistor is connected to the power supply, and the other end is connected to the pull-down resistor. The pull-down resistor is connected to the ground point, and the ADC sampling port is connected between the pull-up resistor and the pull-down resistor.

[0006] At least two of the pull-up resistors are connected in parallel, and the detection pin group is connected in series with the pull-up resistors; or, at least two of the pull-down resistors are connected in parallel, and the detection pin group is connected in series with the pull-down resistors; or, at least two of the pull-up resistors are connected in parallel, at least two of the pull-down resistors are connected in parallel, a portion of the detection pin group is connected in series with the pull-up resistors, and another portion of the detection pin group is connected in series with the pull-down resistors.

[0007] This application provides a circuit for detecting the reliability of board-to-board connector fastening. By using a single-channel ADC for detection, the effectiveness of fastening of multiple BTB connectors can be monitored. This allows for full-process monitoring without requiring multiple GPIO resources. Furthermore, the hardware requirements for ADC detection are simple and do not depend on the hardware platform selection. In addition, the ADC sampling accuracy is high, thus the accuracy of detecting the fastening reliability of BTB connectors is high.

[0008] In one possible implementation, the first device is provided with the power supply, at least two second devices are provided with the ground point, the number of pull-up resistors is one, the number of pull-down resistors is at least two, and the detection pin group and the pull-down resistors are connected in series in a one-to-one correspondence.

[0009] At this point, the detection circuit has a simple structure and low cost. Using this simple detection circuit, it is possible to successfully determine whether there is a BTB connector failure and to identify which BTB connector is experiencing the failure.

[0010] In one possible implementation, the pull-down resistors have different resistance values, and the pull-up resistor has a resistance value equal to the parallel equivalent resistance value of all the pull-down resistors.

[0011] This setup simplifies the calculation of various parameters in the detection circuit and improves detection accuracy.

[0012] In one possible implementation, the power supply is provided on the first device and a portion of the second devices, and the ground point is provided on another portion of the second devices. The number of pull-up resistors is at least two, the number of pull-down resistors is at least two, the number of pull-up resistors and the number of pull-down resistors are equal, and the number of detection pin groups is less than the sum of the number of pull-up resistors and pull-down resistors.

[0013] Setting the number of pull-up resistors and pull-down resistors to be equal is beneficial for resistance value distribution and improves detection accuracy. Setting the number of detection pin groups to be less than the sum of the number of pull-up resistors and pull-down resistors allows the excess pull-up and pull-down resistors not connected in series with the detection pin groups to play a role in resistance value distribution and circuit protection.

[0014] In one possible implementation, the pull-up resistors have different resistance values, the pull-down resistors have different resistance values, and the pull-up resistors and pull-down resistors have equal resistance values ​​in a one-to-one correspondence.

[0015] This setup simplifies the calculation of various parameters in the detection circuit and improves detection accuracy.

[0016] In one possible implementation, one of the board-to-board connectors includes a set of detection pins located at the midpoint of the board-to-board connector along its length.

[0017] The detection pin group is located in the middle of the length of the BTB connector and is suitable for small BTB connectors. The signal detected by the detection pin group can represent the overall snap-fit ​​reliability of the BTB connector.

[0018] In one possible implementation, one of the board-to-board connectors includes two sets of detection pins, and the two sets of detection pins are located at opposite ends of the length of the board-to-board connector.

[0019] It is equipped with two detection pin groups, which are suitable for BTB connectors with long length and a large number of pins. It can detect the engagement of both sides of the BTB connector and detect whether there is a problem of one side floating.

[0020] In one possible implementation, the first device and the second device are connected by the board-to-board connector and the flexible circuit board, and the two detection pin groups are respectively connected to traces disposed on the two sides of the flexible circuit board.

[0021] This configuration allows for the triggering of abnormal ADC sampling voltage even when a tiny tear occurs at the edge of the flexible circuit board, thus helping to avoid equipment failure caused by tearing of the flexible circuit board edge.

[0022] In one possible implementation, the pull-up resistor, the pull-down resistor, and the ADC are all disposed on the first device.

[0023] The ADC can be set on the motherboard for easy connection to the processor on the motherboard. Pull-up resistors and pull-down resistors can also be set on the motherboard and concentrated in one area to facilitate the arrangement of various components in the test circuit. In addition, the test points for power supply voltage and ground voltage are concentrated in one area on the motherboard, which is beneficial for maintenance personnel to test voltage.

[0024] Another embodiment of this application provides an electronic device, including a processor and a circuit for detecting the reliability of board-to-board connector engagement as described above. The first device includes a motherboard, and the second device includes a camera module, a display module, and a sub-board. The ADC and the processor are connected.

[0025] This application provides a circuit and electronic device for detecting the reliability of board-to-board connector fastening. It can perform board-to-board connector fastening reliability testing on camera modules, screen modules, and sub-boards that have a high probability of failure when connected to the motherboard. On the one hand, it can intercept and accurately repair defective products without relying on the device function testing on the production line. On the other hand, it can play a role in device failure monitoring, which is beneficial for failure early warning during the R&D stage. Furthermore, it can also determine whether the BTB connector has a link abnormality by storing and processing the ADC sampling data through the processor, which is beneficial for improving the repair efficiency during the repair stage. Attached Figure Description

[0026] Figure 1 A schematic diagram of the circuit principle for detecting voltage by an analog-to-digital converter (ADC) according to an embodiment of this application;

[0027] Figure 2 A circuit diagram for detecting the engagement reliability of a BTB connector is provided in one embodiment of this application;

[0028] Figure 3 A schematic diagram of a circuit connection for detecting the engagement reliability of a BTB connector in an electronic device according to an embodiment of this application;

[0029] Figure 4 A schematic diagram of the pin structure of a BTB connector provided in an embodiment of this application;

[0030] Figure 5 This is a schematic diagram of another pin structure of a BTB connector provided in one embodiment of this application;

[0031] Figure 6 This is a schematic diagram of another circuit connection for detecting the engagement reliability of a BTB connector in an electronic device according to an embodiment of this application.

[0032] Explanation of reference numerals in the attached figures:

[0033] 100 - Mainboard; 21 - Camera module; 22 - Display module; 23 - Sub-board; 300 - BTB connector; J301 - First plug-in assembly; J302 - Second plug-in assembly; 31 - First BTB connector; 32 - Second BTB connector; 33 - Third BTB connector; 34 - Fourth BTB connector; 41 - First flexible circuit board; 42 - Second flexible circuit board; 43 - Third flexible circuit board. Detailed Implementation

[0034] This application provides an electronic device, including but not limited to mobile phones, tablets, laptops, ultra-mobile personal computers (UMPCs), handheld computers, walkie-talkies, netbooks, POS machines, personal digital assistants (PDAs), wearable devices, virtual reality devices, Bluetooth speakers, vehicle-mounted devices, and other devices that require electrical connections via BTB connectors.

[0035] Taking mobile phones as an example, the current overall architecture of mobile phones contains a large number of board-to-board (BTB) connectors, such as camera modules, screen modules, fingerprint modules, batteries, various sensors, charging interfaces, etc., which can all be connected to the motherboard inside the mobile phone through BTB connectors. These BTB connectors carry the electrical connection functions between the motherboard and various peripheral modules.

[0036] During mobile phone manufacturing, BTB connectors are manually fastened, which presents potential problems such as incomplete fastening, improper pressing, and misalignment. This can lead to the BTB connector easily detaching and breaking the electrical connection when the phone is dropped or subjected to external forces during transport or use, resulting in malfunctions of peripheral devices. Furthermore, after the product is released to the market, users may encounter malfunctions in the display, camera, and fingerprint functions, which are highly likely caused by unreliable BTB connector connections. However, many of these malfunctions are not reproducible upon receiving the phone, or the functionality is restored after re-fastening the BTB connector. This makes it difficult to identify the root cause of the failure during fault analysis, hindering reverse engineering and limiting the ability to improve product quality.

[0037] In related technologies, one way to test the connection reliability of BTB connectors is to scan all the functions of the mobile phone manually or with equipment during the production process, and determine whether the connection of the BTB connector is reliable by checking whether the functions are implemented.

[0038] Due to the complexity of mobile phone functions, numerous production testing stations, and long testing cycles, the functional testing of each module is typically performed sequentially at different stations on the production line. For example, module A might pass testing at station A, but during transfer to another station, its BTB connector might detach. However, station B only tests module B, resulting in the defective module A entering the market. Furthermore, the functional testing of modules is heavily coupled with failures in the module components themselves. Before disassembly, it's impossible to determine whether the problem lies in the connection or the module itself. Cross-module verification after disassembly may not reproduce the issue, ultimately making it impossible to determine the cause of the defect. Consequently, the module and the entire device are re-entered into production, allowing potentially faulty individual units to enter the market and causing product failure.

[0039] In related technologies, another way to test the connection reliability of BTB connectors is to monitor the electrical connection quality of the BTB connector engagement by adding a series GPIO (General Purpose Input / Output) scheme. Specifically, a dedicated GPIO trace is allocated to the BTB connector and connected in series to the same pin of both the female and male connectors. This trace is grounded on the module side. When the BTB connector is properly engaged, the GPIO level is pulled low to output 0. If the BTB connector malfunctions and becomes loose, an open circuit exists, and the GPIO level is pulled high to output 1, thus reporting an error.

[0040] However, this method has a relatively singular monitoring target. Currently, a mobile phone has anywhere from a dozen to dozens of BTB connectors. If it is necessary to monitor the engagement status of multiple BTB connectors simultaneously, multiple GPIO data monitoring is required. As mobile phone functions increase, GPIO resources become increasingly scarce, resulting in practical use being limited by the selection of hardware components.

[0041] Based on the above description, this application provides a circuit for detecting the reliability of BTB connector fastening. By using a single-channel ADC for detection, the effectiveness of fastening of multiple BTB connectors can be monitored. This allows for full-process monitoring without requiring multiple GPIO resources. Furthermore, the hardware requirements for ADC detection are simple and do not depend on the hardware platform selection. In addition, the ADC sampling accuracy is high, thus the accuracy of detecting the fastening reliability of BTB connectors is high.

[0042] It should be noted that ADC stands for Analog-to-Digital Converter, which can convert an input voltage signal into an output digital signal. Voltage can be measured using an ADC.

[0043] Figure 1 This is a schematic diagram of the circuit principle for an analog-to-digital converter (ADC) to detect voltage according to an embodiment of this application. (Reference) Figure 1 As shown, multiple pull-up resistors, such as R1, R3, R5, R7... and multiple pull-down resistors, such as R2, R4, R6, R8..., are connected between the power supply and the ground point. One end of the pull-up resistor is connected to the power supply, and the other end is connected to the pull-down resistor. The pull-down resistor is connected to the ground point. The ADC sampling port is connected between the pull-up and pull-down resistors. The multiple pull-up resistors R1, R3, R5, R7... are connected in parallel, and the multiple pull-down resistors R2, R4, R6, R8... are connected in parallel. When the entire link is normal, the ADC sampling voltage is the standard theoretical calculation value, which can be calculated using the following formula:

[0044]

[0045] There is no specific limit to the number of pull-up and pull-down resistors, but the number of pull-up and pull-down resistors must be a positive integer not less than 1. V can be calculated using the formula above. ADC The value of .

[0046] The circuit for detecting the engagement reliability of a BTB connector provided in this application will be described below with reference to the accompanying drawings and specific embodiments.

[0047] Figure 2 This is a circuit diagram illustrating a method for detecting the engagement reliability of a BTB connector, as provided in one embodiment of this application. (Reference) Figure 2 As shown, a pull-up resistor and a pull-down resistor are connected between the power supply and the ground point. One end of the pull-up resistor is connected to the power supply, and the other end is connected to the pull-down resistor. The pull-down resistor is connected to the ground point. The ADC sampling port is connected between the pull-up resistor and the pull-down resistor. The pull-up resistor may include R0, and the pull-down resistor may include R1, R2, R3, etc., connected in parallel. A BTB connector 300 is connected between the ADC sampling port and the ground point. Multiple BTB connectors 300 can be connected in series with the pull-down resistors R1, R2, R3, etc., respectively.

[0048] The BTB connector 300 includes a first plug-in component J301 and a second plug-in component J302 that are interlocked. The first plug-in component J301 is provided with a plurality of first pins, and the second plug-in component J302 is provided with a plurality of second pins. A first pin and a corresponding second pin constitute a set of electrically connected pins. By engaging the first plug-in component and the second plug-in component, an electrical connection can be achieved between the first pin and the corresponding second pin.

[0049] It should be noted that the connection between the BTB connector 300 and the pull-down resistor refers to the connection between the detection pin group in the BTB connector and the pull-down resistor. The detection pin group includes a first pin and a second pin that are electrically connected. For example, the connection between the detection pin group and the pull-down resistor can be such that the first and second pins are connected between the pull-down resistor and a ground point (e.g., the first pin is connected to the pull-down resistor and the second pin is connected to the ground point), or the first and second pins are connected between the ADC detection port and the pull-down resistor (e.g., the first pin is connected to the ADC detection port and the second pin is connected to the pull-down resistor). Therefore, when the first insertion component J301 and the second insertion component J302 of the BTB connector 300 are reliably engaged, the first and second pins of the detection pin group are connected, and the corresponding link connection is normal. When the engagement of the first insertion component J301 and the second insertion component J302 of the BTB connector 300 fails, the first and second pins of the detection pin group are disconnected, and the corresponding link is open.

[0050] Based on the above formula, it is easy to obtain that when all links are connected normally, the ADC sampling voltage is:

[0051]

[0052] If the BTB connector 300 in a certain link fails to engage, for example, if the BTB connector 300 connected in series with R1 fails to engage, then that link is disconnected. In this case, the ADC sampling voltage is:

[0053]

[0054] As can be seen from the comparison of Formula 2 and Formula 3 above, when the BTB connector 300 in one of the links fails to engage, the ADC sampling voltage changes.

[0055] In one possible implementation, the pull-down resistors R1, R2, R3... have the same value. When the BTB connector 300 in any line is not properly engaged, the ADC sampling voltage will be the same and different from the voltage value when the link connection is normal. In this case, the detection circuit has a simple structure and low cost. Using this simple detection circuit, it is possible to successfully determine whether there is a situation where the BTB connector 300 is not properly engaged.

[0056] When the pull-down resistors R1=R2=R3=...Rn, R0 can be set to 1 / nR1 so that when the link connection is normal, the ADC sampling voltage is half of the power supply voltage. This setting simplifies the calculation of various parameters of the detection circuit and helps improve the accuracy of detection.

[0057] In another possible implementation, the values ​​of the pull-down resistors R1, R2, R3...Rn can be unequal. In this case, it is easy to see that the ADC sampling voltage will be different when the BTB connector 300 in any link is not properly engaged. Given the power supply voltage and the resistance values ​​of each resistor, the ADC sampling voltage when the link is normal and the ADC sampling voltage when any link is open can be calculated using formulas two and three. Therefore, based on the ADC sampling voltage in the actual circuit, it is possible to determine whether the link is normal and to deduce which link is open. In this case, using this detection circuit, it is possible not only to determine whether there is a situation where the BTB connector 300 is not properly engaged, but also to determine which BTB connector 300 is specifically not properly engaged.

[0058] When the values ​​of pull-down resistors R1, R2, R3...Rn are not equal, the value of R0 can be set to the equivalent resistance value of the parallel connection of R1, R2, R3...Rn. This ensures that when the link connection is normal, the ADC sampling voltage is half of the power supply voltage. This setting simplifies the calculation of various parameters of the detection circuit and helps improve the accuracy of detection.

[0059] The circuit described above for detecting the reliability of BTB connector engagement can be applied in electronic devices. These devices contain a first device and multiple second devices connected via BTB connectors 300. The detection circuit is positioned between the first device and the multiple second devices and can be used to detect the reliability of the engagement of each BTB connector 300. The first device has a power supply, and each of the multiple second devices has a ground point. Only a pull-up resistor R0 is provided between the ADC sampling port and the power supply. Pull-down resistors R1, R2, R3…Rn are provided between the ADC sampling port and each ground point. Each BTB connector 300 is connected in series with each of the pull-down resistors R1, R2, R3…Rn.

[0060] In practical applications, electronic devices contain a motherboard and numerous functional modules, such as camera modules, screen modules, fingerprint modules, batteries, various sensors, and charging interfaces. These functional modules can all be connected to the motherboard via BTB connectors. Among these, the camera module, screen module, and sub-board have a higher probability of connection failure with the motherboard. In this embodiment, taking the motherboard as the first device and the camera module, display module, and sub-board as examples, the circuit for detecting the reliability of the BTB connector engagement in the electronic device is described in detail.

[0061] Figure 3 This is a schematic diagram of a circuit connection for detecting the engagement reliability of a BTB connector in an electronic device according to an embodiment of this application. (Reference) Figure 3 As shown, a first flexible circuit board 41 is connected to the camera module 21, and a first BTB connector 31 is connected to the end of the first flexible circuit board 41. The first BTB connector 31 is fastened to the main board 100. A second flexible circuit board 42 is connected to the display module 22, and a second BTB connector 32 is connected to the end of the second flexible circuit board 42. The second BTB connector 32 is fastened to the main board 100. The sub-board 23 and the main board 100 are connected by a third flexible circuit board 43. The two ends of the third flexible circuit board 43 are fastened to the main board 100 and the sub-board 23 by a third BTB connector 33 and a fourth BTB connector 34, respectively.

[0062] The detection circuit provided in this embodiment is used to simultaneously detect the engagement reliability of the first BTB connector 31, the second BTB connector 32, the third BTB connector 33, and the fourth BTB connector 34. The power supply can be located on the motherboard 100. The ADC sampling port is connected between the pull-up resistor and the pull-down resistor. One end of the pull-up resistor R0 is connected to the power supply, and the other end is connected to the pull-down resistors R1, R2, and R3 respectively. One end of the first BTB connector 31, the second BTB connector 32, and the third BTB connector 33 are connected to the pull-down resistors R1, R2, and R3 respectively. The other end of the first BTB connector 31 is connected to the camera module 21 via the first flexible circuit board 41 and grounded. The other end of the second BTB connector 32 is connected to the display module 22 via the second flexible circuit board 42 and grounded. The other end of the third BTB connector 33 is connected to the sub-board 23 via the third flexible circuit board 43 and the fourth BTB connector 34 and grounded.

[0063] In one possible implementation, taking R1=R2=R3 as an example, the resistance values ​​in each link can be as shown in Table 1:

[0064] Table 1

[0065]

[0066] The ADC voltage values ​​calculated for when the link connection is normal and when one of the links is open are shown in Table 2:

[0067] Table 2

[0068]

[0069] As can be seen from the table above, when the ADC sampling voltage is 900mV, it can be determined that the entire link connection is normal; when the ADC sampling voltage is not 900mV, it can be determined that there is an open circuit abnormality in the link, that is, there may be a BTB connector snap-fit ​​abnormality.

[0070] In another possible implementation, taking an example where the values ​​of R1, R2, and R3 are all different, and the value of R0 is equal to the parallel voltage value of R1, R2, and R3, the resistance values ​​in each link can be as shown in Table 3:

[0071] Table 3

[0072]

[0073] The ADC voltage values ​​calculated for when the link connection is normal and when one of the links is open are shown in Table 4:

[0074] Table 4

[0075]

[0076] As shown in Table 4, when the ADC sampling voltage is 900mV, the entire link connection is considered normal. When the ADC sampling voltage is not 900mV, an open-circuit fault is detected in the link. By using this sampling voltage to deduce the location of the fault, the specific path causing the open-circuit fault can be identified. For example, if the ADC sampling voltage is 1010mV, referring to Table 4, it can be determined that the open-circuit fault occurs in the link containing R2, indicating a possible malfunction in the second BTB connector 32.

[0077] Figure 4 This is a schematic diagram of the pin structure of a BTB connector provided in one embodiment of this application. (Reference) Figure 4 As shown, the BTB connector 300 can be configured with signal pins and power pins. For example, P1-P10 are signal pins, and S1-S4 are power pins. The aforementioned detection circuit can be connected in series with any group of signal pins. For example, the detection pin group can be the signal pin P5 marked in bold in the figure. Therefore, when connecting the BTB connector 300 to a circuit that detects the reliability of the BTB connector's engagement, it is only necessary to pre-change the definition of one group of signal pins on the BTB connector 300, so that the first and second pins corresponding to that group of signal pins are connected in series with a resistor and grounded, respectively. The hardware structure of the BTB connector 300 does not need to be changed, therefore the detection circuit is easy to implement and has low cost.

[0078] For small BTB connectors, as in the embodiment described above, a single resistor connected in series with one BTB connector is sufficient to perform the latching function detection. In this case, the detection pin group is located at the middle of the length of the BTB connector, so that the signal detected by the detection pin group can represent the overall latching reliability of the BTB connector.

[0079] However, for longer BTB connectors, the failure rate of the fastening is generally higher. Due to the length, there may be a problem where one side is properly fastened while the other side is not, i.e., one side is floating. In this case, if the detection pin group is set only in the middle of the length direction of the BTB connector, the problem of one side floating will not be detected.

[0080] Figure 5 This is a schematic diagram illustrating another pin structure of a BTB connector provided in one embodiment of this application. (See reference...) Figure 5 As shown, when the BTB connector 300 has a long length and a large number of pins, two detection pin groups can be set. These two detection pin groups are located on opposite edges along the length of the BTB connector 300 and can be centrally symmetrical to enable detection of the engagement on both sides of the BTB connector 300, thus detecting issues such as unilateral floating of the BTB connector. For example, for... Figure 6For a BTB connector with power supply pins S1-S4 and signal pins P1-P34, the two detection pin groups can be P1 and P34 as marked in bold in the figure.

[0081] Figure 6 This is a schematic diagram of another circuit connection for detecting the engagement reliability of a BTB connector in an electronic device according to an embodiment of this application. (See reference...) Figure 6 As shown, the camera module 21 is connected to the motherboard 100 via the first flexible circuit board 41 and the first BTB connector 31, the display module 22 is connected to the motherboard 100 via the second flexible circuit board 42 and the second BTB connector 32, and the sub-board 23 is connected to the motherboard 100 via the third BTB connector 33, the third flexible circuit board 43 and the fourth BTB connector 34.

[0082] Power supplies are provided on the main board 100 and the sub-board 23 respectively. Grounding points are provided on the camera module 21 and the display module 22 respectively. An ADC is also provided on the main board 100. The ADC detection port is connected between the pull-up resistor and the pull-down resistor. The pull-up resistor includes R1, R3, R5 and R7 connected in parallel. The two sets of pins of the third BTB connector 33 are connected in series with R5 and R7 respectively. The pull-down resistor includes R2, R4, R6 and R8 connected in parallel. The two sets of pins of the second BTB connector 32 are connected in series with R6 and R8 respectively. The two sets of pins of the first BTB connector 31 are connected in series with R2 and R4 respectively.

[0083] When all links are connected normally, it is not difficult to obtain the ADC sampling voltage according to the above formula:

[0084]

[0085] If one side of a BTB connector 300 fails to engage, for example, the side of the first BTB connector 31 connected in series with R2 fails to engage, then the link is broken. In this case, the ADC sampling voltage is:

[0086]

[0087] If the latching of both sides of a BTB connector 300 fails, for example, if the latching of the first BTB connector 31 fails, then the link containing R2 and R4 is broken. In this case, the ADC sampling voltage is:

[0088]

[0089] Comparing Formulas 4 to 6 above, it can be seen that when one or both sides of the BTB connector 300 fail to engage, the ADC sampling voltage changes. Given the power supply voltage and the resistance values ​​of each resistor, Formulas 4 to 6 can be used to calculate the ADC sampling voltage when the link is normal and the ADC sampling voltage when any link is open. Therefore, based on the ADC sampling voltage in the actual circuit, it is possible to determine whether the link is normal and to deduce which link is open. In this case, using this detection circuit, it is possible not only to determine whether there is a situation where the BTB connector 300 is not engaging, but also to determine which side of the BTB connector 300 is specifically experiencing the engagement failure.

[0090] In one specific implementation, the resistance values ​​in each link can be as shown in Table 5:

[0091] Table 5

[0092]

[0093] Specifically, the equivalent resistance of R1, R3, R5, and R7 connected in parallel is set to be equal to the equivalent resistance of R2, R4, R6, and R8 connected in parallel. This ensures that when the link connection is normal, the ADC sampling voltage is half the power supply voltage. This setting simplifies the calculation of various parameters of the detection circuit and helps improve the accuracy of the detection.

[0094] Based on Table 5, Formula 4, and Formula 5, the corresponding ADC voltage values ​​when the link connection is normal and when one of the links is open can be calculated as shown in Table 6:

[0095] Table 6

[0096]

[0097] Based on Table 5 and Formula 6 above, the corresponding ADC voltage values ​​when two links connected to a BTB connector are open can be calculated as shown in Table 7:

[0098] Table 7

[0099]

[0100] As can be seen from Tables 6 and 7, when the ADC sampling voltage is 900mV, it can be determined that the entire link connection is normal; when the ADC sampling voltage is not 900mV, it can be determined that there is an open circuit abnormality in the link. By reverse calculation using the sampling voltage, it is possible to locate which one or two paths have an open circuit abnormality. For example, if the ADC sampling voltage is 1177mV, referring to Table 6, it can be located that the link containing R2 has an open circuit abnormality, that is, the side of the first BTB connector 31 connected to R2 may have a latching abnormality. If the ADC sampling voltage is 1530mV, referring to Table 7, it can be located that the link containing R2 and R4 has an open circuit abnormality, that is, the first BTB connector 31 may have a latching abnormality.

[0101] The flexible circuit board has traces for connecting the pins of the BTB connector 300 to the modules connected to the flexible circuit board. When a detection pin group is set on each side edge of the BTB connector and connected to the aforementioned detection circuit, the traces on the flexible circuit board connecting to these two detection pin groups can be arranged on the two sides edge of the flexible circuit board as shown by the dotted lines in the figure. In this way, when a small tear occurs at the edge of the flexible circuit board, it can still trigger an abnormal ADC sampling voltage, thereby helping to avoid equipment failure caused by tearing of the flexible circuit board edge.

[0102] The ADC can be set on the motherboard 100 for easy connection with the processor on the motherboard. Pull-up resistors and pull-down resistors can also be set on the motherboard 100 and concentrated in one area to facilitate the arrangement of various components in the detection circuit. The test points for power supply voltage and ground voltage are concentrated in one area on the motherboard 100, which is beneficial for maintenance personnel to test voltage.

[0103] In the above embodiments, it should be noted that the third BTB connector 33 and the fourth BTB connector 34 are connected in series in the same link through the third flexible circuit board 43. When an open circuit abnormality is detected in the link where R5 and / or R7 are located, it can only be determined that the connection between the sub-board 23 and the main board 100 has failed. The cause of the failure may be an abnormality in the engagement of the third BTB connector 33 and / or the fourth BTB connector 34. Based solely on the above detection circuit, it is impossible to determine which BTB connector 33 is unreliable in its engagement.

[0104] Furthermore, in the aforementioned mapping table of resistors and ADC sampling voltages, the ADC sampling voltage is a theoretically calculated value. In practical applications, various interferences exist, which may cause the ADC sampling voltage to not perfectly match the theoretically calculated value, thus affecting the detection effect. One possible implementation is to provide full-process ground protection for the ADC network to prevent interference from affecting the monitoring results; alternatively, adding electronic components such as filter capacitors to the detection circuit can improve detection accuracy; and data debouncing can be implemented to improve the reliability of the ADC sampling voltage data.

[0105] The circuit for detecting the reliability of BTB connector engagement provided in this application embodiment can serve as a production line interception mechanism. During the production of electronic devices, an ADC (Analog-to-Digital Converter) can be connected to a voltage acquisition device. The voltage acquisition device can acquire the ADC sampling voltage in real time. When an abnormal value occurs, the voltage acquisition device stores the abnormal voltage value and reports the error to the equipment at the current testing station, thereby intercepting electronic devices with BTB connector engagement abnormalities. R&D personnel or maintenance staff can locate the faulty BTB connector by comparing the abnormal ADC sampling voltage with a pre-calculated voltage-resistance mapping table, enabling precise repair. This interception function does not rely on component function testing on the production line; it allows for full-process testing throughout the entire production process, effectively preventing defective products from entering the market.

[0106] The circuit for detecting the reliability of BTB connector engagement provided in this application embodiment can also serve as a device failure monitoring tool. By performing big data monitoring on all electronic devices equipped with this detection circuit, such as reliability testing electronic devices in the testing department and user simulation testing electronic devices, when a short-term or intermittent abnormality is detected in the ADC sampling voltage, it indicates a potential connection unreliability issue with the BTB connector. Through statistical analysis of the overall big data, the location of potentially faulty BTB connectors in new projects can be quickly identified, and early warnings can be issued during R&D, thereby contributing to a reduction in the failure rate of electronic devices.

[0107] The ADC can connect to the processor on the motherboard of an electronic device. The processor can acquire the ADC sampling voltage in real time and save and process the data. For example, it can compare the data with the aforementioned mapping table of resistors and ADC sampling voltages to determine if there is a link abnormality in the BTB connector. During product repair, querying the ADC sampling voltage records can help repair personnel determine whether the fault in the electronic device is caused by component failure or abnormal BTB connector engagement, thus improving repair efficiency.

[0108] In this application embodiment, it should be noted that, unless otherwise explicitly specified and limited, the terms "installation," "connection," and "linking" should be interpreted broadly. For example, they can refer to a fixed connection, an indirect connection through an intermediate medium, or the internal connection of two components or the interaction between two components. Those skilled in the art can understand the specific meaning of the above terms in this application embodiment according to the specific circumstances. The terms "first," "second," and "third," etc., in the specification, claims, and accompanying drawings of this application embodiment are used to distinguish similar objects and are not necessarily used to describe a specific order or sequence.

[0109] Furthermore, the terms “comprising” and “having”, and any variations thereof, are intended to cover non-exclusive inclusion, such that a process, method, system, product, or apparatus that includes a series of steps or units is not necessarily limited to those steps or units that are explicitly listed, but may include other steps or units that are not explicitly listed or that are inherent to such process, method, product, or apparatus.

[0110] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the embodiments of this application, and are not intended to limit them; although the embodiments of this application have been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the foregoing embodiments, or make equivalent substitutions for some or all of the technical features; and these modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the scope of the technical solutions of the embodiments of this application.

Claims

1. An electronic device, characterized in that, Includes processor and detection circuitry. The detection circuit includes a first device, a second device, a board-to-board connector, an analog-to-digital converter (ADC), pull-up resistors, pull-down resistors, a power supply, and a ground point. The board-to-board connector includes a first pin and a second pin. The first pin is connected to the first device, and the second pin is connected to the second device. The first detection pin and the second detection pin are connected to form a detection pin group. Each board-to-board connector is provided with at least two detection pin groups. The detection pin groups are respectively arranged along the length direction of the board-to-board connector. One end of the pull-up resistor is connected to the power supply, and the other end is connected to the pull-down resistor. The pull-down resistor is connected to the ground point, and the ADC sampling port is connected between the pull-up resistor and the pull-down resistor. At least two of the pull-up resistors are connected in parallel, and the detection pin group and the pull-up resistors are connected in series; or, At least two of the pull-down resistors are connected in parallel, and the detection pin group and the pull-down resistors are connected in series; or, At least two of the pull-up resistors are connected in parallel, at least two of the pull-down resistors are connected in parallel, a portion of the detection pin group is connected in series with the pull-up resistors, and another portion of the detection pin group is connected in series with the pull-down resistors.

2. The electronic device according to claim 1, characterized in that, One of the board-to-board connectors is provided with two detection pin groups, which are located at opposite ends of the length of the board-to-board connector.

3. The electronic device according to claim 1 or 2, characterized in that, When at least two of the pull-up resistors are connected in parallel, the resistance values ​​of the pull-up resistors are not equal; or, When at least two of the pull-down resistors are connected in parallel, the resistance values ​​of the pull-down resistors are not equal; or, When at least two of the pull-up resistors are connected in parallel and at least two of the pull-down resistors are connected in parallel, the resistance values ​​of the pull-up resistors are not equal, and the resistance values ​​of the pull-down resistors are not equal.

4. The electronic device according to any one of claims 1-3, characterized in that, When at least two of the pull-up resistors are connected in parallel, the detection pin group is connected in series with each of the pull-up resistors in a one-to-one correspondence; or... When at least two of the pull-down resistors are connected in parallel, the detection pin group is connected in series with each of the pull-down resistors in a one-to-one correspondence; or... When at least two of the pull-up resistors are connected in parallel and at least two of the pull-down resistors are connected in parallel, the detection pin group is connected in series with each of the pull-up resistors or the pull-down resistors in a one-to-one correspondence.

5. The electronic device according to any one of claims 1-4, characterized in that... When at least two of the pull-up resistors are connected in parallel, the equivalent resistance of the parallel pull-up resistor circuit is equal to the resistance of the pull-down resistor; or, When at least two of the pull-down resistors are connected in parallel, the equivalent resistance of the parallel pull-down resistor circuit is equal to the resistance of the pull-up resistor; or, When at least two of the pull-up resistors are connected in parallel and at least two of the pull-down resistors are connected in parallel, the equivalent resistance value of the parallel pull-up resistor circuit is equal to the equivalent resistance value of the parallel pull-down resistor circuit.

6. The electronic device according to any one of claims 1-5, characterized in that, The first device and the second device are connected by the board-to-board connector and the flexible circuit board, and the detection pin group is respectively connected to the traces disposed on both sides of the flexible circuit board.

7. The electronic device according to any one of claims 1-6, characterized in that, The first device includes at least one of a motherboard, a sub-board, a camera module, and a display module; or The second device includes at least one of a motherboard, a sub-board, a camera module, and a display module.

Images