Positioning device and method based on laser confocal microscope

Abstract

The invention provides a positioning device and method based on a laser confocal microscopy, and relates to the technical field of microscope observation.The positioning device comprises a base, a first micrometer head, a second micrometer head, a movable disc, a sample clamp arm and an elastic element, and the displacement of the movable disc is accurately controlled through the micrometer heads; the power output direction of the first micrometer head and the power output direction of the second micrometer head are perpendicular to each other, adjustment in the X-axis direction and the Y-axis direction in the observation process can be met, the coordinate value of each adjustment position is positioned through a screen, then the specified observation point can be rapidly adjusted even in the position backtracking process, the adjustment time is greatly shortened, and the observation efficiency is improved. Meanwhile, accurate position backtracking is guaranteed, the activity and morphology of the sample are guaranteed, and the technical problems that when an existing microscope sample table is used for adjusting the observation position of the sample, the displacement is difficult to accurately control, the observation position is difficult to accurately backtrack, the adjusting time is long, and the efficiency is low are solved.

Description

Technical Field

[0001] This invention relates to the field of microscopy observation technology, and specifically to a positioning device and method based on a laser confocal microscope. Background Technology

[0002] Laser confocal microscopy is a high-resolution microscope that uses a laser beam focused on the sample surface to acquire high-resolution images by scanning the sample surface. Laser confocal microscopy has wide applications in fields such as biology, materials science, and nanotechnology.

[0003] Currently, imported equipment manufacturers are committed to improving the performance of instruments, including resolution, scanning speed, imaging speed, image quality, and imaging modes. In particular, some manufacturers have designed rapid screening laser confocal microscopy imaging systems or software. While these systems offer high-speed digital imaging and excellent image quality, they are often very expensive, costing millions of yuan or more, making them inaccessible to most laboratories. Furthermore, due to a lack of practical testing experience, manufacturers often struggle to design instruments that are more user-friendly, better suited to observers' working habits, and reduce their workload.

[0004] Currently, commercially available laser confocal microscope stages can only be adjusted in a single direction along the X, Y, and Z axes. However, in actual observation, it is often necessary to continuously adjust the sample's position to achieve the optimal observation location. During this process, the height along the Z-axis is fixed, requiring manual movement and repeated adjustments along the X and Y axes. The amount of displacement during manual movement is difficult to control precisely, necessitating significant time for fine-tuning to reach the optimal observation position, thus reducing observation efficiency. Furthermore, during continuous position adjustments, later adjusted observation positions are often inferior to earlier ones. If the previous position is selected as the optimal observation position, it is difficult to accurately trace back to that position. This backtracking process is not only time-consuming but also introduces a significant error compared to the previous position. Simultaneously, this process greatly increases the sample's exposure time to the light source, reducing the biological sample's activity and increasing the risk of morphological alteration, thus affecting the observation results. Summary of the Invention

[0005] Therefore, the technical problem to be solved by the present invention is to overcome the defects in the prior art, thereby providing a positioning device and method based on a laser confocal microscope.

[0006] A positioning device based on a laser confocal microscope includes: a base, an adjustment assembly, and a sample clamp assembly. The adjustment assembly includes a first differential head and a second differential head mounted on the base. Both the first and second differential heads are equipped with screens displaying displacement. The power output directions of the first and second differential heads are perpendicular. The sample clamp assembly includes a moving disk and a sample clamp arm. The sample clamp arm is slidably mounted on the moving disk and is equipped with a locking device. The moving disk is connected to the power output ends of the first and second differential heads. An elastic element is also connected between the base and the moving disk. The elastic stretching direction of the elastic element is parallel to the power output directions of the first and second differential heads.

[0007] Furthermore, the base is also provided with a bottom frame and a transverse guide rail. The transverse guide rail is located inside the bottom frame. A transverse slider is slidably arranged on the transverse guide rail. A guide rail support beam is fixedly connected to the transverse slider. A longitudinal guide rail is fixedly connected to the guide rail support beam. A longitudinal slider is slidably arranged on the longitudinal guide rail. The longitudinal slider is fixedly connected to the moving disk. The power output end of the first micrometer head is fixedly connected to the guide rail support beam.

[0008] Furthermore, the power output end of the first differential head is provided with a telescopic head, and the positioning device also includes a fixed base, a pressure cover and a first top plate. The first differential head is fixedly installed on the fixed base, the fixed base is installed on the base, the fixed base has an L-shaped cross section, the pressure cover is installed on the fixed base, the telescopic head is located between the pressure cover and the fixed base, the telescopic head contacts the first top plate, the first top plate has an L-shaped cross section, and the first top plate is fixedly connected to the guide rail support beam.

[0009] Furthermore, the positioning device also includes a second top plate, a transfer arm, and a transfer plate. The transfer plate is fixedly connected to the movable disk, the transfer arm is fixedly mounted on the transfer plate, the second top plate is fixedly mounted on the transfer arm, the second micro head has the same structure as the first micro head, and the telescopic head on the second micro head contacts the second top plate.

[0010] Furthermore, the movable disk has a sliding groove, and a sliding pad is provided on the side of the sliding groove away from the sample clamp arm. The locking device is a screw, and the sample clamp arm and the sliding pad are connected by screw engagement.

[0011] Furthermore, the sample clamp arm is provided with a mounting groove, which includes an arc-shaped part, a straight part and a notch part, which are connected in sequence. The mounting groove also includes a circular arc part, which is located on the side of the sample clamp arm.

[0012] Furthermore, one side of the sliding pad is straight, and the other side of the sliding pad is arc-shaped.

[0013] Furthermore, the elastic element includes a first spring and a second spring. One end of the first spring is fixedly connected to the base, and the other end of the first spring is fixedly connected to the guide rail support beam. One end of the second spring is fixedly connected to the movable disk, and the other end of the second spring is fixedly connected to the guide rail support beam.

[0014] Furthermore, the cross-sections of both the horizontal and vertical sliders are concave.

[0015] The present invention also includes a positioning method based on a laser confocal microscope. This method is based on a positioning device for a laser confocal microscope as described in any of the above claims. First, the positioning device is installed on the sample stage of the microscope. The instrument with the sample is placed on the sample clamp arm. Then, the sample clamp arm is adjusted to clamp the instrument with the sample. The locking device is used to lock the sample clamp arm onto the moving disk. Then, the first and second differential heads are controlled to adjust the position of the moving disk. The displacement displayed on the screen after each position adjustment is recorded until the optimal observation position is reached.

[0016] The technical solution of this invention has the following advantages: In the technical solution provided by this invention, the positioning device is installed on the sample stage of the microscope. The displacement of the moving disk is precisely controlled by the first and second differential heads. The power output directions of the first and second differential heads are set to be perpendicular to meet the adjustment in the X and Y axes during observation. The screen displaying the displacement can locate the coordinate values ​​of each adjustment position. Thus, even during position backtracking, the device can be quickly adjusted to the designated observation point, greatly reducing adjustment time and improving observation efficiency. At the same time, it also ensures accurate position backtracking, ensuring sample activity and morphology. The sliding sample clamp arm, together with the locking device, can firmly clamp the sample, which helps to improve the accuracy of the adjustment process. The elastic element ensures that the moving disk can always be in close contact with the power output ends of the first and second differential heads during movement, ensuring automatic following during movement. Attached Figure Description

[0017] To more clearly illustrate the specific embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the specific embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are some embodiments of the present invention. For those skilled in the art, other drawings can be obtained from these drawings without creative effort.

[0018] Figure 1 This is a schematic diagram of the overall structure of the present invention; Figure 2 This is a schematic diagram of the transverse and longitudinal guide rail structures of the present invention; Figure 3 This is a schematic diagram of the structure of the sliding pad of the present invention; Figure 4 This is a schematic diagram of the structure of the sample clamp arm of the present invention; Figure 5 This is a schematic diagram of the structure of the portable disk of the present invention; Figure 6 This is a schematic diagram of the structure of the first spring and the second spring of the present invention.

[0019] Explanation of reference numerals in the attached figures: 1-Base; 101-Bottom Frame; 2-First Micrometer Head; 201-Fixed Base; 202-Pressure Cap; 203-Telescopic Head; 204-First Top Plate; 3-Second Micrometer Head; 301-Second Top Plate; 302-Adapter Arm; 303-Adapter Plate; 4-Moving Disk; 401-Slide Groove; 5-Screw; 6-Sample Clamp Arm; 601-Arc-shaped Part; 602-Straight Part; 603-Circular Arc Part; 604-Notch Part; 7-Sliding Washer; 8-Transverse Guide Rail; 801-Transverse Slider; 9-Longitudinal Guide Rail; 901-Longitudinal Slider; 902-Guide Rail Support Beam; 10-First Spring; 11-Second Spring. Detailed Implementation

[0020] The technical solution of the present invention will now be clearly and completely described with reference to the accompanying drawings. Obviously, the described embodiments are only some, not all, of the embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0021] In the description of this invention, it should be noted that the terms "center," "upper," "lower," "left," "right," "vertical," "horizontal," "inner," and "outer," etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. They are used only for the convenience of describing the invention and for simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on the invention. Furthermore, the terms "first," "second," and "third" are used for descriptive purposes only and should not be construed as indicating or implying relative importance.

[0022] In the description of this invention, it should be noted that, unless otherwise explicitly specified and limited, the terms "installation," "connection," and "linking" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral connection; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; and they can refer to the internal connection of two components. Those skilled in the art can understand the specific meaning of the above terms in this invention based on the specific circumstances.

[0023] Furthermore, the technical features involved in the different embodiments of the present invention described below can be combined with each other as long as they do not conflict with each other.

[0024] like Figure 1 and Figure 2 The positioning device based on a laser confocal microscope shown includes: a base 1, an adjustment assembly, and a sample clamp assembly. The adjustment assembly includes a first differential head 2 and a second differential head 3 mounted on the base 1. Both the first differential head 2 and the second differential head 3 are equipped with screens displaying displacement. The power output directions of the first differential head 2 and the second differential head 3 are perpendicular. The sample clamp assembly includes a movable disk 4 and a pair of sample clamp arms 6. The sample clamp arms 6 are slidably mounted on the movable disk 4 and are equipped with locking devices. The movable disk 4 is connected to the power output ends of the first differential head 2 and the second differential head 3. An elastic element is also connected between the base 1 and the movable disk 4. The elastic stretching direction of the elastic element is parallel to the power output direction of the first differential head 2 and the second differential head 3.

[0025] The aforementioned positioning device based on a laser confocal microscope, by mounting the positioning device on the sample stage of the microscope, uses the first differential head 2 and the second differential head 3 to precisely control the displacement of the moving disk 4. The perpendicular orientation of the power output directions of the first differential head 2 and the second differential head 3 allows for adjustments along the X and Y axes during observation. The screen displaying the displacement allows for the location of the coordinate values ​​of each adjustment position, enabling rapid adjustment to the designated observation point even during position backtracking, significantly reducing adjustment time and improving observation efficiency. It also ensures accurate position backtracking, preserving sample activity and morphology. The sliding sample clamp arm 6, in conjunction with the locking device, provides stable clamping of the sample, contributing to improved accuracy during adjustment. The elastic element ensures that the moving disk 4 remains in close contact with the power output ends of the first differential head 2 and the second differential head 3 during movement, guaranteeing automatic following during the movement.

[0026] like Figure 1 and Figure 2As shown, in this embodiment, the base 1 is also provided with a bottom frame 101 and a pair of transverse guide rails 8. The transverse guide rails 8 are located inside the bottom frame 101. A transverse slider 801 is slidably disposed on the transverse guide rails 8. A guide rail support beam 902 is fixedly connected to the transverse slider 801. A longitudinal guide rail 9 is fixedly connected to the guide rail support beam 902. A longitudinal slider 901 is slidably disposed on the longitudinal guide rail 9. The longitudinal slider 901 is fixedly connected to the moving disk 4. The power output end of the first micrometer head 2 is fixedly connected to the guide rail support beam 902. The bottom frame 101 has an octagonal structure and is integrally formed with the base 1. The bottom frame 101 provides a limit for the movement of the transverse slider 801, ensuring that the transverse slider 801 will not slide out. The horizontal guide rail 8 is fixedly installed on the base 1 inside the bottom frame 101 with screws. The horizontal slider 801 slides on the horizontal guide rail 8 to achieve position adjustment. The guide rail support beam 902 is fixedly installed on the horizontal slider 801 with screws. The vertical guide rail 9 is fixedly installed on the guide rail support beam 902 with screws. The vertical slider 901 is fixedly connected to the moving disk 4 with screws. The vertical slider 901 slides on the vertical guide rail 9. The displacement is adjusted in the mutually perpendicular X-axis and Y-axis directions by sliding the horizontal slider 801 and the vertical slider 901. The cross-section of the horizontal slider 801 and the vertical slider 901 is concave, which cooperates with the horizontal guide rail 8 and the vertical guide rail 9 with rectangular cross-section to achieve more stable sliding adjustment.

[0027] like Figure 1 and Figure 2 As shown, in this embodiment, the power output end of the first differential head 2 is provided with a telescopic head 203. The positioning device also includes a fixed base 201, a pressure cover 202, and a first top plate 204. The first differential head 2 is fixedly mounted on the fixed base 201 by screws. The fixed base 201 is mounted on the base 1 by screws. The fixed base 201 has an L-shaped cross-section. The pressure cover 202 is mounted on the fixed base 201 by screws. The telescopic head 203 is located between the pressure cover 202 and the fixed base 201. The telescopic head 203 contacts the first top plate 204. The plate 204 has an L-shaped cross-section. The first top plate 204 is fixedly connected to the guide rail support beam 902 by screws. By rotating the knob at the tail of the first micro head 2, the telescopic head 203 can be adjusted to extend or retract. The fixed base 201 provides installation support for the first micro head 2. The fixed base 201 and the pressure cover 202 effectively support the telescopic head 203. The L-shaped first top plate 204 acts as a transition plate to connect the telescopic head 203 and the moving disk 4, transmitting the power of the telescopic head 203 to the moving disk 4, and pushing the moving disk 4 to move and adjust its position.

[0028] like Figure 1 and Figure 2As shown, in this embodiment, the positioning device further includes a second top plate 301, a transition arm 302, and a transition plate 303. The transition plate 303 is fixedly connected to the movable disk 4 by screws. The transition arm 302 is fixedly mounted on the transition plate 303 by screws. The second top plate 301 is fixedly mounted on the transition arm 302. The second micro head 3 has the same structure as the first micro head 2. The telescopic head 203 on the second micro head 3 contacts the second top plate 301. The second top plate 301 and the transition arm 302 are integrally formed. The second top plate 301 has a cylindrical structure. Through the contact between the telescopic head 203 on the second micro head 3 and the second top plate 301, the power of the telescopic head 203 on the second micro head 3 is transmitted to the movable disk 4 through the transition arm 302 and the transition plate 303, causing the movable disk 4 to slide and achieve displacement adjustment.

[0029] like Figure 5 As shown, in this embodiment, a sliding groove 401 is provided on the movable disk 4. A pair of sliding pads 7 are provided on the side of the sliding groove 401 away from the sample clamp arm 6. The locking device is a screw 5. The sample clamp arm 6 and the sliding pads 7 are connected by the screw 5. The sliding pads 7 and the sample clamp arm 6 are fixedly connected by the screw 5, ensuring that after the sample is clamped, the sliding pads 7 and the sample clamp arm 6 clamp the movable disk 4, thus fixing it. Therefore, the sample being observed will not move during the movement and adjustment of the movable disk 4, improving the accuracy of the movement process and the position backtracking process. Moreover, before the screw 5 is tightened, the sample clamp arm 6 can slide and adjust along the sliding groove 401. The sliding groove 401 and the screw 5 work together to play a guiding role, adapting to the clamping of sample instruments of different sizes, and improving the flexibility and practicality of the positioning device.

[0030] like Figure 4 As shown, in this embodiment, the sample clamp arm 6 is provided with a mounting groove, which includes an arc-shaped part 601, a straight part 602, and a notch part 604. The straight part 602, the arc-shaped part 601, and the notch part 604 are connected in sequence. The mounting groove also includes a circular arc part 603, which is located on the side of the sample clamp arm 6. The mounting groove composed of the straight part 602, the arc-shaped part 601, and the notch part 604 can be adapted to square, round, and polygonal sample instruments, such as glass slides or small dishes, to ensure that the positioning device can be adapted to the detection of various samples. The circular arc part 603 on the side can be used to clamp cup-shaped sample instruments, which greatly improves the adaptability of the device.

[0031] like Figure 3As shown, in this embodiment, one side of the sliding pad 7 is straight, and the other side of the sliding pad 7 is arc-shaped. The straight side is located on the side close to each other in the pair of sliding pads 7, which ensures that even when facing relatively small sample instruments, the paired sample clamp arms 6 can fit completely together to clamp the small sample instruments. The arc-shaped side is located on the outside of the pair of sliding pads 7. The arc-shaped side can be well adapted to the moving disk 4, ensuring that the sample clamp arms 6 can open to the maximum extent, especially for adapting to larger sample instruments. Through the straight and arc-shaped settings, the range of sample clamping by the positioning device is effectively improved.

[0032] like Figure 6 As shown, in this embodiment, the elastic element includes a first spring 10 and a second spring 11. One end of the first spring 10 is fixedly connected to the base 1, and the other end of the first spring 10 is fixedly connected to the guide rail support beam 902. One end of the second spring 11 is fixedly connected to the movable disk 4, and the other end of the second spring 11 is fixedly connected to the guide rail support beam 902. The main function of the first spring 10 and the second spring 11 is to automatically release the deformation stored in the first spring 10 and the second spring 11 when the telescopic head 203 extends, based on the deformation stored in the first spring 10 and the second spring 11 when the telescopic head 203 extends. The retraction head 203 is restored to its original shape by connecting the movable disk 4 to the top plate, ensuring that the top plate remains in contact with the telescopic head 203 when it retracts. This allows the movable disk 4 to be reset, enabling a return to the previous observation position and ultimately achieving rapid and accurate observation position retracing. The first spring 10 is parallel to the telescopic head 203 on the first differential head 2, and the second spring 11 is parallel to the telescopic head 203 on the second differential head 3, maximizing the reset effect of the first spring 10 and the second spring 11 and avoiding any misalignment during the reset movement process that could affect accuracy.

[0033] like Figures 1-6 As shown, the present invention also includes a positioning method based on a laser confocal microscope. This method is based on a positioning device for a laser confocal microscope as described in any of the above claims. First, the positioning device is placed on the sample stage of the microscope, and the instrument with the sample is placed on the sample clamp arm 6. Then, the sample clamp arm 6 is adjusted to clamp the instrument with the sample. The locking device is used to lock the sample clamp arm 6 onto the moving disk 4. Then, the first differential head 2 and the second differential head 3 are controlled to adjust the position of the moving disk 4. The displacement displayed on the screen after each position adjustment is recorded until the optimal observation position is reached. Specifically, the positioning device is first fixedly installed on the sample stage of the laser microscope using screws. The instrument with the sample is placed on the sample clamp arm 6. The sample clamp arm 6 is slidably adjusted to clamp the instrument with the sample. Screws 5 are used to lock the sample clamp arm 6 and the sliding pad 7 onto the moving disk 4 for fixation, thereby securing the glass slide or small dish. The original sample is then scanned using a laser confocal microscope to obtain relevant data for the material sample. Afterwards, the extension and retraction of the telescopic head 203 is adjusted using the knobs on the first micrometer head 2 and the second micrometer head 3, and then the extension and retraction are controlled via the first top plate 204 and the second top plate 301. The displacement of the control disk 4 in the two vertical directions of the X-axis or Y-axis is adjusted. After each adjustment, the displacement and corresponding position coordinate information are recorded on the display screen. During the process, the sample is scanned using a laser confocal microscope to obtain real-time data of the material sample. Then, multiple positions are selected from the real-time data and the relevant position coordinate information is recorded. The state of the material sample at different positions is analyzed and compared. Based on the previously recorded coordinate information, the first differential head 2 and the second differential head 3 quickly and accurately trace back to the observed and calibrated position. Then, the above steps are repeated to change the position of the sample and finally determine the best observation position of the sample. The above method was used to observe and measure the nucleus, cytoskeleton F-actin, and intracellular vimentin in bladder cancer cells. The positioning device is compatible with almost all models of laser confocal microscopes on the market. It is small, lightweight, and easy to carry, and can be used in different scenarios. The displacement adjustment is also more intuitive, effectively reducing the exposure time of the sample in the light source, thereby avoiding problems such as changes in the activity and morphology of biological samples.

[0034] Obviously, the above embodiments are merely illustrative examples for clear explanation and are not intended to limit the implementation. Those skilled in the art will recognize that other variations or modifications can be made based on the above description. It is neither necessary nor possible to exhaustively list all possible implementations here. However, obvious variations or modifications derived therefrom are still within the scope of protection of this invention.

Claims

1. A positioning device based on a laser confocal microscope, comprising: The base (1), adjustment assembly, and sample clamp assembly are characterized in that the adjustment assembly includes a first differential head (2) and a second differential head (3) mounted on the base (1), both the first differential head (2) and the second differential head (3) are provided with screens displaying displacement, the power output directions of the first differential head (2) and the second differential head (3) are perpendicular, the sample clamp assembly includes a moving disk (4) and a sample clamp arm (6), the sample clamp arm (6) is slidably mounted on the moving disk (4), the sample clamp arm (6) is provided with a locking device, the moving disk (4) is connected to the power output ends of the first differential head (2) and the second differential head (3), and an elastic element is also connected between the base (1) and the moving disk (4), the elastic stretching direction of the elastic element is parallel to the power output direction of the first differential head (2) and the second differential head (3).

2. The positioning device based on a laser confocal microscope according to claim 1, characterized in that, The base (1) is also provided with a bottom frame (101) and a transverse guide rail (8). The transverse guide rail (8) is located inside the bottom frame (101). A transverse slider (801) is slidably arranged on the transverse guide rail (8). A guide rail support beam (902) is fixedly connected to the transverse slider (801). A longitudinal guide rail (9) is fixedly connected to the guide rail support beam (902). A longitudinal slider (901) is slidably arranged on the longitudinal guide rail (9). The longitudinal slider (901) is fixedly connected to the moving disk (4). The power output end of the first micrometer head (2) is fixedly connected to the guide rail support beam (902).

3. The positioning device based on a laser confocal microscope according to claim 2, characterized in that, The first microhead (2) is provided with a telescopic head (203) at its power output end. The positioning device also includes a fixed base (201), a pressure cover (202) and a first top plate (204). The first microhead (2) is fixedly installed on the fixed base (201). The fixed base (201) is installed on the base (1). The fixed base (201) has an L-shaped cross section. The pressure cover (202) is installed on the fixed base (201). The telescopic head (203) is located between the pressure cover (202) and the fixed base (201). The telescopic head (203) is in contact with the first top plate (204). The first top plate (204) has an L-shaped cross section. The first top plate (204) is fixedly connected to the guide rail support beam (902).

4. A positioning device based on a laser confocal microscope according to claim 3, characterized in that, The positioning device also includes a second top plate (301), a transfer arm (302) and a transfer plate (303). The transfer plate (303) is fixedly connected to the movable disk (4). The transfer arm (302) is fixedly installed on the transfer plate (303). The second top plate (301) is fixedly installed on the transfer arm (302). The second micro head (3) has the same structure as the first micro head (2). The telescopic head (203) on the second micro head (3) is in contact with the second top plate (301).

5. A positioning device based on a laser confocal microscope according to claim 1, characterized in that, The movable disk (4) has a sliding groove (401), and a sliding pad (7) is provided on the side of the sliding groove (401) away from the sample clamp arm (6). The locking device is a screw (5), and the sample clamp arm (6) and the sliding pad (7) are connected by the screw (5).

6. The positioning device based on a laser confocal microscope according to claim 1, characterized in that, The sample clamp arm (6) is provided with a mounting groove, which includes an arc-shaped part (601), a straight part (602) and a notch part (604). The straight part (602), the arc-shaped part (601) and the notch part (604) are connected in sequence. The mounting groove also includes a circular arc part (603), which is located on the side of the sample clamp arm (6).

7. A positioning device based on a laser confocal microscope according to claim 1, characterized in that, One side of the sliding pad (7) is straight, and the other side of the sliding pad (7) is arc-shaped.

8. A positioning device based on a laser confocal microscope according to claim 2, characterized in that, The elastic element includes a first spring (10) and a second spring (11). One end of the first spring (10) is fixedly connected to the base (1), and the other end of the first spring (10) is fixedly connected to the guide rail support beam (902). One end of the second spring (11) is fixedly connected to the movable disk (4), and the other end of the second spring (11) is fixedly connected to the guide rail support beam (902).

9. A positioning device based on a laser confocal microscope according to claim 2, characterized in that, The cross-sections of the horizontal slider (801) and the vertical slider (901) are both concave.

10. A positioning method based on a laser confocal microscope, wherein the method is implemented based on a positioning device based on a laser confocal microscope as described in any one of claims 1 to 9, characterized in that, First, install the positioning device on the sample stage of the microscope, place the instrument with the sample on the sample clamp arm (6), then adjust the sample clamp arm (6) to clamp the instrument with the sample, use the locking device to lock the sample clamp arm (6) onto the moving disk (4), then control the first differential head (2) and the second differential head (3) to adjust the position of the moving disk (4), record the displacement displayed on the screen after each position adjustment, until the optimal observation position is reached.

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