Trolley device for inspecting appearance of test seat on semiconductor aging test board and operation method

Abstract

The invention provides a trolley device for appearance inspection of a test base on a semiconductor aging test board and an operation method, and belongs to the technical field of appearance inspection of jigs on the semiconductor aging test board. Comprising a frame body, moving wheels, an L-shaped corner pad and an anti-skid pad, the moving wheels are arranged at the bottom of the frame body, the L-shaped corner pad is arranged at the top of the frame body, and the anti-skid pad is arranged on the inner wall of the L-shaped corner pad. Through the arrangement of the pin testing module, the device can detect whether the pins on the appearance of the testing seat are bent, deformed and missed or not, the operation is simple, manual visual inspection is not needed, meanwhile, the testing seat on a whole testing plate can be observed, disassembly is avoided, and the testing efficiency is improved. The probability that the problem of the test seat is not found due to inattention during manual eye observation is reduced to a certain extent, meanwhile, the detection time is short, and the detection efficiency is also improved to a certain extent.

Description

Technical Field

[0001] This invention relates to the field of appearance inspection technology for fixtures on semiconductor aging test boards, and particularly to a trolley device and operating method for appearance inspection of test sockets on semiconductor aging test boards. Background Technology

[0002] The trolley device used for visual inspection of test sockets on semiconductor aging test boards is an automated mobile inspection device adapted to semiconductor testing scenarios. Its core function is to replace manual labor in the efficient and accurate detection of visual defects in test sockets. It often integrates modules such as conveying, visual inspection, and positioning and classification.

[0003] Existing devices for inspecting the appearance of test sockets mainly examine the surface and pins. However, most current inspections of the test socket appearance rely on manual inspection using a magnifying glass. This requires the operator to constantly hold the magnifying glass, increasing workload and the risk of arthritis. Similarly, the inspection of the pins on the test socket appearance is also mostly done manually with the naked eye while holding a magnifying glass. This is not only time-consuming but also increases the likelihood of missing problems due to inattention. Therefore, this application provides a cart device and operating method for inspecting the appearance of test sockets on semiconductor aging test boards to meet this need. Summary of the Invention

[0004] (a) Technical problems to be solved To address the shortcomings of existing technologies, this invention provides a trolley device and operating method for visual inspection of test sockets on semiconductor aging test boards. This solves the problems of existing devices increasing manual labor intensity and the probability of developing arthritis, as well as the time-consuming nature of existing devices and the increased probability of not detecting problems with the test sockets.

[0005] (II) Technical Solution To solve the above-mentioned technical problems, the present invention provides the following technical solution: A trolley device and operating method for visual inspection of test sockets on a semiconductor aging test board includes a frame body, with casters at the bottom of the frame body, an L-shaped corner pad at the top of the frame body, an anti-slip pad on the inner wall of the L-shaped corner pad, a slide rail fixedly connected to the side of the frame body, a sliding plate inside the frame body, a surface inspection module mounted on the slide rail via the sliding plate, a pin test module mounted on the slide rail via the sliding plate, a first L-shaped plate fixedly connected to the back of the frame body, a display on the front of the first L-shaped plate, and the display threadedly connected to the first L-shaped plate via bolts.

[0006] Preferably, the surface detection module includes a left track, and a first sliding block is provided inside the left track. The first sliding block has a first pulley groove on both its front and back sides. A first pulley is provided inside the first pulley groove. A first threaded hole is provided on the front side of the first sliding block. A first long bolt is threaded into the first threaded hole. The left track is mounted on the first sliding block by the first long bolt.

[0007] Preferably, a second L-shaped plate is fixedly connected to the top of the first sliding block, a first circular hole is provided on the top of the second L-shaped plate, a first cylinder is provided on the top of the second L-shaped plate, the first cylinder is threadedly connected to the second L-shaped plate through a first cylinder bolt, a first cylinder rod is provided at the bottom of the first cylinder, the first cylinder rod and the first circular hole are mutually adapted, and a first threaded sleeve is threadedly connected to the surface of the first cylinder rod.

[0008] Preferably, a first connecting plate is fixedly connected to the bottom of the first threaded sleeve, a vertical connecting plate is fixedly connected to the bottom of the first connecting plate, a top plate is fixedly connected to the bottom of the vertical connecting plate, a front plate is fixedly connected to the bottom of the top plate, a side plate is fixedly connected to the side of the front plate, and a first square groove is formed on the top of the top plate.

[0009] Preferably, the front of the front plate has a second square groove, the side of the side plate has a third square groove, and the surfaces of the top plate, the front plate and the side plate are all provided with image transmitters. The bottom of the image transmitter is provided with a high-definition camera, and one end of the high-definition camera is threadedly connected to a magnifying glass.

[0010] Preferably, the pin testing module includes a right-side rail, inside which is provided a second sliding block. The front and back of the second sliding block are provided with second pulley grooves, inside which is provided a second pulley. The front of the second sliding block is provided with a second threaded hole, inside which is threaded a second long bolt. The second sliding block is threadedly connected to the right-side rail via the second long bolt. The top of the second sliding block is fixedly connected with a third L-shaped plate.

[0011] Preferably, the top of the third L-shaped plate is provided with a second circular hole, the top of the third L-shaped plate is provided with a second cylinder, the second cylinder is threadedly connected to the third L-shaped plate by a second cylinder bolt, the bottom of the second cylinder is provided with a second cylinder rod, the surface of the second cylinder rod is threadedly connected with a second threaded sleeve, the bottom of the second threaded sleeve is fixedly connected with a second connecting plate, and the bottom of the second connecting plate is provided with a signal transmitter.

[0012] Preferably, the signal transmitter is connected to a second connecting plate via a signal transmitter bolt thread, the second cylinder rod and the second circular hole are mutually adapted, the bottom of the signal transmitter is provided with a trigger button connector, the bottom of the trigger button connector is provided with a trigger button, the bottom of the trigger button connector is fixedly connected with a spring, the bottom of the spring is fixedly connected with a first pin, the top of the first pin is fixedly connected with a trigger rod, and the bottom of the first pin is threadedly connected with a second pin.

[0013] Preferably, the bottom of the second pin is threadedly connected to a third pin, the bottom of the third pin is fixedly connected to a conical column, the surface of the conical column is threadedly connected to a fiber cloth, and the bottom of the fiber cloth is provided with an adhesive layer.

[0014] A method for operating a trolley device for visual inspection of test sockets on a semiconductor aging test board includes the following steps: Step 1: When needed, the worker needs to push the frame to rotate the moving wheels, thus moving the entire device to the designated position. The L-shaped corner pads define the specific position of the anti-slip pads, which increase the friction between the test seat and the device. The device uses a surface inspection module to inspect the surface of the test seat for scratches or other damage, and a pin inspection module to check for bent, deformed, or missing pins. Both the surface inspection module and the pin inspection module transmit real-time detection data to the display wirelessly. The worker only needs to observe the data transmitted on the display. Both the surface inspection module and the pin inspection module can move longitudinally within their respective modules, allowing easy access to any longitudinal position on the anti-slip pads. Step 2: When it is necessary to check whether there are scratches or other hard damages on the surface of the test seat, the first long bolt needs to be loosened from between the first sliding block and the left rail, so that the first sliding block can move within the left rail. Then, the first cylinder can move with the second L-shaped plate to the top of the test seat. Then, the first cylinder is activated, so that the first cylinder rod moves downward, allowing the top plate, front plate, and side plate to cover the top and sides of the test seat. Then, the image transmitter and high-definition camera are activated, so that the high-definition camera can capture the test seat through the magnifying glass. The image captured by the high-definition camera is transmitted to the monitor through the image transmitter. The worker observes the test seat for scratches or other hard damages through the monitor. Step 3: Check the pins of the test socket for bending, deformation, or missing parts. Loosen the second long bolt to allow the second sliding block to move within the right track. This causes the third L-shaped plate to move with the second cylinder. Once the second cylinder is directly above the test socket, stop moving the second sliding block. Then, use the second long bolt to fix the second sliding block and the right track together. Start the second cylinder, causing its rod to move downwards. This causes the assembled pins on the signal transmitter to move into the pins of the test socket. If the pins are normal, the conical column will not touch the bottom, preventing the trigger rod on the first pin from hitting the trigger button, and the signal transmitter will not emit a signal. If there is a defect in the pins, the trigger rod will hit the trigger button, and the signal transmitter will transmit the signal to the display. As the conical column moves downwards, a cotton cloth can wipe away water stains and dust from the pins, while the adhesive layer can remove dust and small impurities.

[0015] Compared with the prior art, the present invention has at least the following beneficial effects: In the above solution, the surface detection module allows the test stand to be inspected when it is placed on the device, eliminating the need for manual inspection with a magnifying glass. This reduces the workload of manual labor and also decreases the probability of arthritis caused by prolonged arm raising.

[0016] By setting up a pin testing module, the device can detect whether there are bent, deformed, or missing pins on the test socket. It is simple to operate and does not require manual visual inspection. This reduces the probability that manual visual inspection may miss problems with the test socket due to lack of concentration. At the same time, the inspection time is short, which also improves the inspection efficiency to some extent.

[0017] In summary, the present invention has the advantages of reducing the intensity of manual labor and the probability of manual inflammation, reducing the time spent on testing, and reducing the probability of not finding problems with the test socket. Attached Figure Description

[0018] Figure 1 A schematic diagram of the trolley device and its operation method for visual inspection of test sockets on semiconductor aging test boards; Figure 2 for Figure 1 Enlarged schematic diagram of a partial structure in section A; Figure 3 for Figure 1 Enlarged schematic diagram of a partial structure in section B; Figure 4 A schematic diagram of the X-display assembly showing the cart device and operating method for visual inspection of test sockets on semiconductor aging test boards; Figure 5 A schematic diagram of a trolley device and its operation method for visual inspection of test sockets on semiconductor aging test boards, including a surface inspection module. Figure 6 A schematic diagram of the surface inspection module moving assembly, showing the trolley device and operating method for visual inspection of test sockets on semiconductor aging test boards; Figure 7 A schematic diagram of the surface inspection module cylinder assembly, showing the trolley device and operating method for visual inspection of test sockets on semiconductor aging test boards; Figure 8 A schematic diagram of a high-definition imaging assembly of a surface inspection module for a carriage device and operating method used for visual inspection of test sockets on semiconductor aging test boards; Figure 9 A schematic diagram of a carriage device and its operation method for visual inspection of test sockets on semiconductor aging test boards, including a pin test module. Figure 10 A schematic diagram of the pin test module moving assembly, showing the trolley device and operating method for visual inspection of test sockets on semiconductor aging test boards; Figure 11 A schematic diagram of a trolley device and its operation method for visual inspection of test sockets on semiconductor aging test boards, and a schematic diagram of a pin test module cylinder assembly. Figure 12 A schematic diagram of a trolley device and its operation method for visual inspection of test sockets on semiconductor aging test boards, including a pin test module and pin detection assembly. Figure 13 for Figure 12 Enlarged schematic diagram of a local part of the structure; Figure 14 for Figure 1 Schematic diagram of the slide rail assembly.

[0019] [Figure Labels] 1. Chassis main body; 2. Casters; 3. L-shaped corner pads; 4. Anti-slip pads; 5. Surface inspection module; 501. Left side rail; 502. First sliding block; 503. First pulley; 504. First long bolt; 505. Second L-shaped plate; 506. First cylinder; 507. First cylinder rod; 508. First threaded sleeve; 509. First connecting plate; 510. Vertical connecting plate; 511. Top plate; 512. Front plate; 513. Side plate; 514. Image transmitter; 515. High-definition camera; 516. Magnifying glass; 6. Pin testing module; 601. Right side rail; 602, second sliding block; 603, second pulley; 604, second long bolt; 605, third L-shaped plate; 606, second cylinder; 607, second cylinder rod; 608, second threaded sleeve; 609, second connecting plate; 610, signal transmitter; 611, trigger button connector; 612, trigger button; 613, spring; 614, first pin; 615, trigger rod; 616, second pin; 617, third pin; 618, tapered column; 619, fiber cotton cloth; 620, adhesive layer; 7, first L-shaped plate; 8, display.

[0020] As shown in the figure, specific structures and devices are marked in the figure to clearly illustrate the structure of the embodiments of the present invention. However, this is only for illustrative purposes and is not intended to limit the present invention to this specific structure, device and environment. Those skilled in the art can adjust or modify these devices and environments according to specific needs. Detailed Implementation

[0021] The following describes in detail, with reference to the accompanying drawings and specific embodiments, a trolley device and operating method for visual inspection of test sockets on a semiconductor aging test board provided by the present invention. It should also be noted that, to make the embodiments more detailed, the following embodiments are the best and preferred embodiments; those skilled in the art can also use other alternative methods to implement some known technologies; and the accompanying drawings are only for more specific description of the embodiments and are not intended to specifically limit the present invention.

[0022] It should be noted that the use of terms such as "an embodiment," "an embodiment," "an exemplary embodiment," and "some embodiments" in the specification indicates that the described embodiment may include a specific feature, structure, or characteristic, but not every embodiment necessarily includes that specific feature, structure, or characteristic. Furthermore, when a specific feature, structure, or characteristic is described in connection with an embodiment, implementing such a feature, structure, or characteristic in conjunction with other embodiments (whether explicitly described or not) should be within the knowledge of those skilled in the art.

[0023] Generally, terms can be understood at least partly from their use in context. For example, depending at least partly on the context, the term "one or more" as used herein can be used to describe any feature, structure, or characteristic in a singular sense, or a combination of features, structures, or characteristics in a plural sense. Additionally, the term "based on" can be understood not necessarily to convey an exclusive set of factors, but rather, alternatively, depending at least partly on the context, to allow for the presence of other factors that are not necessarily explicitly described.

[0024] It is understood that the meanings of “on”, “above”, and “above” in this invention should be interpreted in the broadest manner, such that “on” means not only “directly on” something, but also includes the meaning of being “on” something with an intervening feature or layer, and that “above” or “above” means not only “on” something, but also includes the meaning of being “on” something without an intervening feature or layer.

[0025] Furthermore, spatially related terms such as “below,” “under,” “lower,” “above,” and “upper” are used herein for convenience to describe the relationship of one element or feature to one or more other elements or features, as illustrated in the accompanying drawings. Spatially related terms are intended to cover different orientations in the use or operation of the device other than those depicted in the accompanying drawings. The device may be oriented in other ways, and the spatially related descriptive terms used herein can be interpreted similarly.

[0026] like Figures 1 to 4 As shown, an embodiment of the present invention provides a trolley device and operating method for visual inspection of test sockets on a semiconductor aging test board. The device includes a frame body 1, with casters 2 at the bottom, an L-shaped corner pad 3 at the top, an anti-slip pad 4 on the inner wall of the L-shaped corner pad 3, a slide rail fixedly connected to the side of the frame body 1, a sliding plate inside the slide rail, a surface inspection module 5 mounted on the slide rail via the sliding plate, a pin test module 6 mounted on the slide rail via the sliding plate, a first L-shaped plate 7 fixedly connected to the back of the frame body 1, a display 8 on the front of the first L-shaped plate 7, and a display 8 threadedly connected to the first L-shaped plate 7 via bolts.

[0027] Install the movable wheel 2 to the bottom of the frame body 1, attach the L-shaped corner pad 3 to the top of the frame body 1, place the anti-slip pad 4 in the area of ​​the L-shaped corner pad 3, install the surface inspection module 5 and the pin test module 6 to the left and right sides of the frame body 1, weld the first L-shaped plate 7 to the back of the frame body 1, place the display 8 in the front of the first L-shaped plate 7, and then fix the display 8 and the first L-shaped plate 7 together with the first L-shaped plate bolts. The slide rail is welded to both sides of the frame body 1, and the sliding piece is welded to the surface inspection module 5 and the pin test module 6. The surface inspection module 5 and the pin test module 6 both slide in the slide rail by sliding pieces.

[0028] When needed, the worker pushes the frame body 1 to rotate the moving wheels 2, thereby moving the entire device to the designated position. The L-shaped corner pads 3 define the specific position of the anti-slip pads 4, which increase the friction between the test seat and the device. The device uses the surface detection module 5 to detect the surface of the test seat and observe whether there are scratches or other external damage. The pin detection module 6 detects whether the pins of the test seat are bent, deformed, or missing. Both the surface detection module 5 and the pin detection module 6 transmit real-time detection data to the display 8 wirelessly. The worker only needs to observe the transmitted data on the display 8. Both the surface detection module 5 and the pin detection module 6 can move longitudinally within the surface detection module 5 and the pin detection module 6, thus facilitating access to any longitudinal position on the anti-slip pads 4.

[0029] like Figures 5 to 8 As shown, in this embodiment, the surface detection module 5 includes a left track 501. The left track 501 is provided with a first sliding block 502 inside. The front and back of the first sliding block 502 are provided with first pulley grooves. The first pulley grooves are provided with first pulleys 503 inside. The front of the first sliding block 502 is provided with a first threaded hole. The first threaded hole is threaded with a first long bolt 504. The left track 501 is installed on the first sliding block 502 through the first long bolt 504.

[0030] The top of the first sliding block 502 is fixedly connected to the second L-shaped plate 505. The top of the second L-shaped plate 505 is provided with a first circular hole. The top of the second L-shaped plate 505 is provided with a first cylinder 506. The first cylinder 506 is threadedly connected to the second L-shaped plate 505 through a first cylinder bolt. The bottom of the first cylinder 506 is provided with a first cylinder rod 507. The first cylinder rod 507 and the first circular hole are mutually adapted. The surface of the first cylinder rod 507 is threadedly connected with a first threaded sleeve 508.

[0031] The bottom of the first threaded sleeve 508 is fixedly connected to a first connecting plate 509, the bottom of the first connecting plate 509 is fixedly connected to a vertical connecting plate 510, the bottom of the vertical connecting plate 510 is fixedly connected to a top plate 511, the bottom of the top plate 511 is fixedly connected to a front plate 512, the side of the front plate 512 is fixedly connected to a side plate 513, and the top of the top plate 511 is provided with a first square groove.

[0032] The front of the front plate 512 is provided with a second square groove, and the side of the side plate 513 is provided with a third square groove. The surfaces of the top plate 511, the front plate 512 and the side plate 513 are all provided with image transmitters 514. The bottom of the image transmitters 514 is provided with a high-definition camera 515, and one end of the high-definition camera 515 is threaded with a magnifying glass 516.

[0033] The left rail 501 is welded to the left side of the frame body 1. The first sliding block 502 is placed inside the left rail 501. The first long bolt 504 is rotated through the left rail 501 and screwed into the first threaded hole of the first sliding block 502, thereby fixing the left rail 501 and the first sliding block 502 together. The second L-shaped plate 505 is welded to the top of the first sliding block 502. The first cylinder 506 is installed on the top of the second L-shaped plate 505 by the first cylinder bolt. The first cylinder rod 507 is integrally connected to the first cylinder 506. The first threaded sleeve 508 is then installed. The first cylinder rod 507 is screwed onto the first connecting plate 509, which is welded to the bottom of the first threaded sleeve 508. The vertical connecting plate 510 is welded to the top plate 511 and the first connecting plate 509. The front plate 512 is welded to the bottom of the first connecting plate 509, and the side plate 513 is welded to the side of the front plate 512. The image transmitter 514 and the high-definition camera 515 are connected as a whole. The assembled image transmitter 514 is installed on the top plate 511, the front plate 512 and the side plate 513 by bolts. The magnifying glass 516 is screwed onto the high-definition camera 515.

[0034] When it is necessary to check whether there are scratches or other hard damages on the surface of the test seat, the first long bolt 504 needs to be loosened from the first sliding block 502 and the left rail 501, so that the first sliding block 502 can move within the left rail 501. Then, the first cylinder 506 can move to the top of the test seat along with the second L-shaped plate 505. Then, the first cylinder 506 is activated, so that the first cylinder rod 507 moves downward, so that the top plate 511, the front plate 512 and the side plate 513 can cover the top and sides of the test seat. Then, the image transmitter 514 and the high-definition camera 515 are activated, so that the high-definition camera 515 can capture the test seat inside the magnifying glass 516. The image captured by the high-definition camera 515 is transmitted to the display 8 through the image transmitter 514. The worker can observe whether there are scratches or other hard damages on the test seat through the display 8.

[0035] By using the surface inspection module 5, the appearance of the test seat can be inspected when it is placed on the device, eliminating the need for manual inspection with a magnifying glass. This can reduce the workload of manual labor to some extent and also reduce the probability of arthritis caused by prolonged arm raising.

[0036] like Figures 9 to 13 As shown, in this embodiment, the pin test module 6 includes a right rail 601, inside which is provided a second sliding block 602. The front and back of the second sliding block 602 are provided with second pulley grooves, inside which are provided a second pulley 603. The front of the second sliding block 602 is provided with a second threaded hole, inside which is threaded a second long bolt 604. The second sliding block 602 is threadedly connected to the right rail 601 through the second long bolt 604. The top of the second sliding block 602 is fixedly connected to a third L-shaped plate 605.

[0037] The top of the third L-shaped plate 605 is provided with a second circular hole, and the top of the third L-shaped plate 605 is provided with a second cylinder 606. The second cylinder 606 is threadedly connected to the third L-shaped plate 605 by a second cylinder bolt. The bottom of the second cylinder 606 is provided with a second cylinder rod 607. The surface of the second cylinder rod 607 is threadedly connected with a second threaded sleeve 608. The bottom of the second threaded sleeve 608 is fixedly connected with a second connecting plate 609. The bottom of the second connecting plate 609 is provided with a signal transmitter 610.

[0038] The signal transmitter 610 is connected to the second connecting plate 609 by a signal transmitter bolt thread. The second cylinder rod 607 and the second circular hole are mutually adapted. The bottom of the signal transmitter 610 is provided with a trigger button connector 611. The bottom of the trigger button connector 611 is provided with a trigger button 612. The bottom of the trigger button connector 611 is fixedly connected with a spring 613. The bottom of the spring 613 is fixedly connected with a first pin post 614. The top of the first pin post 614 is fixedly connected with a trigger rod 615. The bottom of the first pin post 614 is threadedly connected with a second pin post 616.

[0039] The bottom of the second pin 616 is threadedly connected to the third pin 617, and the bottom of the third pin 617 is fixedly connected to the conical pin 618. The surface of the conical pin 618 is threadedly connected to the fiber cotton cloth 619, and the bottom of the fiber cotton cloth 619 is provided with an adhesive layer 620.

[0040] The right-side rail 601 is welded to the right side of the frame body 1. The second pulley groove and the second sliding block 602 are integrally formed. The second pulley 603 is installed into the second pulley groove. The second sliding block 602 is placed into the right-side rail 601. The second long bolt 604 is screwed through the right-side rail 601 and into the second threaded hole of the second sliding block 602. The third L-shaped plate 605 is welded to the top of the second sliding block 602. The second cylinder 606 is installed to the top of the third L-shaped plate 605 by the second cylinder bolt. The second cylinder rod 607 and the second cylinder 606 are integrally connected. The second threaded sleeve 608 is screwed onto the second cylinder rod 607. The second connecting plate 609 is welded to the bottom of the second threaded sleeve 608. The signal transmitter 610 is installed to the bottom of the second connecting plate 609 by the signal transmitter bolt. The trigger button connector 611 is integrally connected to the signal transmitter 610. The trigger button 612 is integrally connected to the trigger button connector 611. The spring 613 is welded between the trigger button connector 611 and the first pin 614. The trigger rod 615 is welded to the first pin 614. The second pin 616 is screwed to the bottom of the first pin 614. The third pin 617 is screwed to the bottom of the second pin 616. The conical post 618 is welded to the bottom of the third pin 617. The fiber cloth 619 is screwed onto the conical post 618. The adhesive layer 620 is integrally connected to the fiber cloth 619.

[0041] To check for bent, deformed, or missing pins on the test socket, the second long bolt 604 needs to be loosened. This allows the second sliding block 602 to move within the right track 601, which in turn causes the third L-shaped plate 605 to move along with the second cylinder 606. After the second cylinder 606 moves directly above the test socket, the movement of the second sliding block 602 stops. Then, the second long bolt 604 is used to fix the second sliding block 602 and the right track 601 together. The second cylinder 606 is then activated, causing the cylinder rod 607 to move downwards. This causes the assembled pins on the signal transmitter 610 to align with the pins on the test socket. When the pin is inserted into the pin of the test socket, if the pin of the test socket is normal, the conical column 618 will not touch the bottom, and the trigger rod 615 on the first pin 614 will not hit the trigger button 612. The signal transmitter 610 will not emit a signal. If there is a defect in the pin of the test socket, the trigger rod 615 will hit the trigger button 612, and then the signal transmitter 610 will transmit the signal to the display 8. When the conical column 618 moves downward, the fiber cloth 619 can wipe away water stains and dust in the pin of the test socket, while the adhesive layer 620 can stick away dust and small impurities in the pin.

[0042] By setting up the pin testing module 6, the device can detect whether there are bent, deformed, or missing pins on the test socket. The operation is simple and does not require manual visual inspection. This reduces the probability that the test socket may not be detected due to lack of concentration when observing with the naked eye. At the same time, the inspection time is short, which also improves the inspection efficiency to a certain extent.

[0043] All electrical components mentioned in this article are connected to an external main controller and 220V AC mains power, and the main controller can be a conventional known device such as a computer that can control it.

[0044] A method for operating a trolley device for visual inspection of test sockets on a semiconductor aging test board includes the following steps during use; Step 1: When needed, the worker needs to push the frame body 1 to rotate the moving wheels 2, thereby moving the entire device to the designated position. The L-shaped corner pads 3 define the specific position of the anti-slip pads 4, which increase the friction between the test seat and the device. The device uses the surface detection module 5 to detect the surface of the test seat and observe whether there are scratches or other external damage. The pin testing module 6 detects whether the pins of the test seat are bent, deformed, or missing. Both the surface detection module 5 and the pin testing module 6 transmit real-time detection data to the display 8 wirelessly. The worker only needs to observe the transmitted data on the display 8. Step 2: When it is necessary to check whether there are scratches or other hard damages on the surface of the test seat, the first long bolt 504 needs to be loosened from the first sliding block 502 and the left rail 501, so that the first sliding block 502 can move within the left rail 501. Then, the first cylinder 506 can move to the top of the test seat along with the second L-shaped plate 505. Then, the first cylinder 506 is activated, so that the first cylinder rod 507 moves downward, so that the top plate 511, the front plate 512 and the side plate 513 can cover the top and sides of the test seat. Then, the image transmitter 514 and the high-definition camera 515 are activated, so that the high-definition camera 515 can capture the test seat inside the magnifying glass 516. The image captured by the high-definition camera 515 is transmitted to the display 8 through the image transmitter 514. The worker can observe whether there are scratches or other hard damages on the test seat through the display 8. Step 3: Check the test socket for bent, deformed, or missing pins. Loosen the second long bolt 604 to allow the second sliding block 602 to move within the right track 601. This causes the third L-shaped plate 605 to move along with the second cylinder 606. After the second cylinder 606 reaches directly above the test socket, stop moving the second sliding block 602. Then, use the second long bolt 604 to secure the second sliding block 602 to the right track 601. Start the second cylinder 606, causing the cylinder rod 607 to move downwards. This causes the assembled pins on the signal transmitter 610 to point towards the test socket. When the pin is inserted into the pin of the test socket, if the pin of the test socket is normal, the tapered post 618 will not touch the bottom, and the trigger rod 615 on the first pin 614 will not hit the trigger button 612. The signal transmitter 610 will not emit a signal. If there is a defect in the pin of the test socket, the trigger rod 615 will hit the trigger button 612, and then the signal transmitter 610 will transmit the signal to the display 8. When the tapered post 618 moves downward, the fiber cloth 619 can wipe away water stains and dust in the pin of the test socket, while the adhesive layer 620 can stick away dust and small impurities in the pin.

[0045] The technical solution provided by this invention is as follows: When needed, the worker pushes the frame body 1 to rotate the moving wheels 2, thereby moving the entire device to a designated position. The L-shaped corner pad 3 defines the specific position of the anti-slip pad 4, increasing the friction between the test seat and the device. The device uses a surface detection module 5 to inspect the surface of the test seat for scratches or other external damage. A pin testing module 6 detects whether the pins of the test seat are bent, deformed, or missing. Both the surface detection module 5 and the pin testing module 6 transmit real-time detection data wirelessly to a display 8. The worker only needs to observe the transmitted data on the display 8 to check for scratches or other hard surfaces on the test seat. When the test is initiated, the first long bolt 504 needs to be loosened between the first sliding block 502 and the left rail 501, allowing the first sliding block 502 to move within the left rail 501. This allows the first cylinder 506 to move with the second L-shaped plate 505 to the top of the test seat. Then, the first cylinder 506 is activated, causing the first cylinder rod 507 to move downwards. This allows the top plate 511, the front plate 512, and the side plate 513 to cover the top and sides of the test seat. Then, the image transmitter 514 and the high-definition camera 515 are activated, allowing the high-definition camera 515 to capture images of the test seat inside the magnifying glass 516. The images captured by the high-definition camera 515 are transmitted via a diagram. The signal is transmitted from transmitter 514 to display 8. Workers observe the test socket for scratches or other damage on the display 8, and need to check for bent, deformed, or missing pins. At this point, the second long bolt 604 needs to be loosened, allowing the second sliding block 602 to move within the right track 601. This causes the third L-shaped plate 605 to move along with the second cylinder 606. After the second cylinder 606 reaches directly above the test socket, it stops moving the second sliding block 602. Then, the second long bolt 604 is used to fix the second sliding block 602 and the right track 601 together. The second cylinder 606 is then activated, causing the second cylinder rod 607 to move downwards, which in turn causes the signal transmitter 61 to... The assembled pins on pin 0 move into the pins of the test socket. When the pins are inserted into the pins of the test socket, if the pins of the test socket are normal, the tapered post 618 will not touch the bottom, and the trigger rod 615 on the first pin 614 will not hit the trigger button 612. The signal transmitter 610 will not emit a signal. If there is a defect in the pins of the test socket, the trigger rod 615 will hit the trigger button 612, and then the signal transmitter 610 will transmit the signal to the display 8. When the tapered post 618 moves downward, the fiber cloth 619 can wipe away water stains and dust in the pins of the test socket, while the adhesive layer 620 can stick away dust and small impurities in the pins.

[0046] This invention encompasses any substitutions, modifications, equivalent methods, and solutions made within the spirit and scope of this invention. To provide the public with a thorough understanding of this invention, specific details are described in detail in the following preferred embodiments; however, those skilled in the art will fully understand the invention even without these details. Furthermore, to avoid unnecessary misunderstanding of the essence of this invention, well-known methods, processes, procedures, components, and circuits are not described in detail.

[0047] The above are merely preferred embodiments of the present invention. It should be noted that those skilled in the art can make various improvements and modifications without departing from the principles of the present invention, and these improvements and modifications should also be considered within the scope of protection of the present invention.

Claims

1. A trolley device and operating method for visual inspection of test sockets on a semiconductor aging test board, characterized in that, The frame includes a frame body (1), with a movable wheel (2) at the bottom of the frame body (1), an L-shaped corner pad (3) at the top of the frame body (1), an anti-slip pad (4) on the inner wall of the L-shaped corner pad (3), a slide rail fixedly connected to the side of the frame body (1), a sliding plate inside the frame body (1), a surface detection module (5) installed on the slide rail through the sliding plate, a pin test module (6) installed on the slide rail through the sliding plate, a first L-shaped plate (7) fixedly connected to the back of the frame body (1), a display (8) on the front of the first L-shaped plate (7), and the display (8) is threadedly connected to the first L-shaped plate (7) through the first L-shaped plate bolt.

2. The trolley device for visual inspection of test sockets on a semiconductor aging test board according to claim 1, characterized in that, The surface detection module (5) includes a left track (501), and a first sliding block (502) is provided inside the left track (501). The first sliding block (502) has a first pulley groove on both the front and back sides. A first pulley (503) is provided inside the first pulley groove. A first threaded hole is provided on the front side of the first sliding block (502). A first long bolt (504) is threaded inside the first threaded hole. The left track (501) is installed on the first sliding block (502) through the first long bolt (504).

3. The trolley device for visual inspection of test sockets on a semiconductor aging test board according to claim 2, characterized in that, The top of the first sliding block (502) is fixedly connected to a second L-shaped plate (505). The top of the second L-shaped plate (505) is provided with a first circular hole. The top of the second L-shaped plate (505) is provided with a first cylinder (506). The first cylinder (506) is threadedly connected to the second L-shaped plate (505) through a first cylinder bolt. The bottom of the first cylinder (506) is provided with a first cylinder rod (507). The first cylinder rod (507) and the first circular hole are mutually adapted to each other. The surface of the first cylinder rod (507) is threadedly connected with a first threaded sleeve (508).

4. The trolley device for visual inspection of test sockets on a semiconductor aging test board according to claim 3, characterized in that, The bottom of the first threaded sleeve (508) is fixedly connected to a first connecting plate (509), the bottom of the first connecting plate (509) is fixedly connected to a vertical connecting plate (510), the bottom of the vertical connecting plate (510) is fixedly connected to a top plate (511), the bottom of the top plate (511) is fixedly connected to a front plate (512), the side of the front plate (512) is fixedly connected to a side plate (513), and the top of the top plate (511) is provided with a first square groove.

5. The trolley device for visual inspection of test sockets on a semiconductor aging test board according to claim 4, characterized in that, The front of the front plate (512) is provided with a second square groove, and the side of the side plate (513) is provided with a third square groove. The surfaces of the top plate (511), the front plate (512) and the side plate (513) are all provided with image transmitters (514). The bottom of the image transmitter (514) is provided with a high-definition camera (515), and one end of the high-definition camera (515) is threaded with a magnifying glass (516).

6. The trolley device for visual inspection of test sockets on a semiconductor aging test board according to claim 1, characterized in that, The pin test module (6) includes a right rail (601), inside which is provided a second sliding block (602). The front and back of the second sliding block (602) are provided with second pulley grooves. Inside the second pulley grooves are provided second pulleys (603). The front of the second sliding block (602) is provided with a second threaded hole. The inside of the second threaded hole is threaded with a second long bolt (604). The second sliding block (602) is threadedly connected to the right rail (601) through the second long bolt (604). The top of the second sliding block (602) is fixedly connected with a third L-shaped plate (605).

7. The trolley device for visual inspection of test sockets on a semiconductor aging test board according to claim 6, characterized in that, The top of the third L-shaped plate (605) is provided with a second circular hole, and the top of the third L-shaped plate (605) is provided with a second cylinder (606). The second cylinder (606) is threadedly connected to the third L-shaped plate (605) by a second cylinder bolt. The bottom of the second cylinder (606) is provided with a second cylinder rod (607). The surface of the second cylinder rod (607) is threadedly connected with a second threaded sleeve (608). The bottom of the second threaded sleeve (608) is fixedly connected with a second connecting plate (609). The bottom of the second connecting plate (609) is provided with a signal transmitter (610).

8. The trolley device for visual inspection of test sockets on a semiconductor aging test board according to claim 7, characterized in that, The signal transmitter (610) is connected to a second connecting plate (609) by a signal transmitter bolt thread. The second cylinder rod (607) and the second circular hole are mutually adapted. The bottom of the signal transmitter (610) is provided with a trigger button connector (611). The bottom of the trigger button connector (611) is provided with a trigger button (612). The bottom of the trigger button connector (611) is fixedly connected with a spring (613). The bottom of the spring (613) is fixedly connected with a first pin post (614). The top of the first pin post (614) is fixedly connected with a trigger rod (615). The bottom of the first pin post (614) is threadedly connected with a second pin post (616).

9. The trolley device for visual inspection of test sockets on a semiconductor aging test board according to claim 8, characterized in that, The bottom of the second pin (616) is threadedly connected to a third pin (617), the bottom of the third pin (617) is fixedly connected to a conical pin (618), the surface of the conical pin (618) is threadedly connected to a fiber cloth (619), and the bottom of the fiber cloth (619) is provided with an adhesive layer (620).

10. The method of operating the trolley device for visual inspection of test sockets on a semiconductor aging test board according to any one of claims 1-9, characterized in that, Includes the following steps: Step 1: When needed, the worker needs to push the frame body (1) to make the moving wheels (2) rotate, and then move the entire device to the designated position. The L-shaped corner pad (3) defines the specific position of the anti-slip pad (4). The anti-slip pad (4) increases the friction of the test seat on the device. The device uses the surface detection module (5) to detect the surface of the test seat and observe whether there are scratches or other external damage. The pin test module (6) detects whether the pins of the test seat are bent, deformed or missing. Both the surface detection module (5) and the pin test module (6) transmit real-time detection data to the display (8) wirelessly. The worker only needs to observe the data transmitted on the display (8). Both the surface detection module (5) and the pin test module (6) can move longitudinally within the surface detection module (5) and the pin test module (6), so as to easily reach any longitudinal position on the anti-slip pad (4). Step 2: When it is necessary to check whether there are scratches or other hard damage on the surface of the test seat, the first long bolt (504) needs to be loosened from the first sliding block (502) and the left rail (501), so that the first sliding block (502) can move in the left rail (501), and then the first cylinder (506) can move to the top of the test seat with the second L-shaped plate (505). Then the first cylinder (506) is started, so that the first cylinder rod (507) moves downward, and then the top plate (511), the front plate (512) and the side plate (513) can cover the top and sides of the test seat. Then the image transmitter (514) and the high-definition camera (515) are started, so that the high-definition camera (515) can capture the test seat in the magnifying glass (516). The image captured by the high-definition camera (515) is transmitted to the display (8) through the image transmitter (514). The worker observes whether there are scratches or other hard damage on the test seat through the display (8). Step 3: Check the pins of the test socket for bending, deformation, or missing parts. Loosen the second long bolt (604) to allow the second sliding block (602) to move within the right track (601). This causes the third L-shaped plate (605) to move along with the second cylinder (606). After the second cylinder (606) reaches directly above the test socket, stop moving the second sliding block (602). Then, use the second long bolt (604) to fix the second sliding block (602) and the right track (601) together. Start the second cylinder (606), causing the cylinder rod (607) to move downwards. This causes the assembled pins on the signal transmitter (610) to move towards the test socket. When the pin is inserted into the pin of the test socket, if the pin of the test socket is normal, the conical column (618) will not touch the bottom, and the trigger rod (615) on the first pin (614) will not hit the trigger button (612), and the signal transmitter (610) will not emit a signal. If there is a defect in the pin of the test socket, the trigger rod (615) will hit the trigger button (612), and then the signal transmitter (610) will transmit the signal to the display (8). When the conical column (618) moves downward, the fiber cloth (619) can wipe the water stains and dust in the pin of the test socket, and the adhesive layer (620) can stick away the dust and small impurities in the pin.

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