Automatic testing device for electronic component

Abstract

The invention relates to the technical field of electronic components, and provides an automatic testing device for electronic components, which comprises a bearing mechanism, a pressure resistance testing mechanism, a to-be-tested piece placing mechanism and a tested piece conveying mechanism, and is characterized in that the bearing mechanism comprises a bearing rack, and an arc-shaped pressing piece and a longitudinal rod in the pressure resistance testing mechanism are arranged below a telescopic piece; the position, away from the arc-shaped pressing piece, of the surface of the longitudinal rod is provided with meshing teeth, the to-be-tested piece containing mechanism comprises a movable containing table, two-way threaded rods and a transmission gear, the two-way threaded rods are installed on the surface of the bearing rack, the transmission gear is installed on the surfaces of the two-way threaded rods, and the meshing teeth are in transmission connection with the transmission gear. The lower portions of the two movable placement tables are in threaded connection to the surface of the bidirectional threaded rod, the upper surfaces of the two movable placement tables are provided with containing cavities, the arc-shaped pressing pieces are located above the containing cavities, the detected piece conveying mechanism is located below the movable placement tables, and the device has the advantages of being simple in structure, low in cost and high in working efficiency.

Description

Technical Field

[0001] This invention relates to the field of electronic components technology, specifically to an automatic testing device for electronic components. Background Technology

[0002] Electronic components are the building blocks of electronic parts and small machines and instruments. They are often composed of several parts and can be used interchangeably in similar products. They commonly refer to certain parts in the electrical, radio, and instrument industries, and are a general term for electronic devices such as capacitors, transistors, hairsprings, and mainsprings. Common examples include diodes.

[0003] Considering the special nature of certain electronic component usage scenarios, it is necessary to conduct voltage withstand tests on electronic components to ensure that they can withstand a certain degree of pressure. In the existing voltage withstand test process for electronic components, manual feeding or unloading of materials is required, which is inconvenient to use. Summary of the Invention

[0004] To achieve the above objectives, the present invention provides the following technical solution: an automatic testing device for electronic components, comprising a carrying mechanism, a withstand voltage testing mechanism, a test component placement mechanism, and a tested component conveying mechanism. The carrying mechanism includes a carrying frame, and the withstand voltage testing mechanism includes a telescopic component, an arc-shaped pressing component, and a longitudinal rod. The telescopic component is fixedly installed on the top of the carrying frame, and the arc-shaped pressing component and the longitudinal rod are disposed below the telescopic component. The surface of the longitudinal rod is provided with meshing teeth at a position away from the arc-shaped pressing component. The test piece placement mechanism includes a movable placement platform, a bidirectional threaded rod, and a transmission gear. Two bidirectional threaded rods are mounted on the surface of the support frame, and the transmission gear is mounted on the surface of the bidirectional threaded rod. The meshing teeth are connected to the transmission gear. The lower parts of the two movable placement platforms are threaded to the surface of the bidirectional threaded rod. The upper surfaces of the two movable placement platforms are provided with receiving cavities. The arc-shaped pressing element is located above the receiving cavity. The test piece conveying mechanism is located below the movable placement platform. Two longitudinal rods are respectively distributed on the same side of the two transmission gears.

[0005] As a further embodiment of the present invention, the pressure resistance testing mechanism further includes a lifting plate and a fixed rod. The lifting plate is fixedly connected below the telescopic member, and the upper part of the arc-shaped pressing member is connected to the surface of the lifting plate through the fixed rod. The telescopic member drives the arc-shaped pressing member and the longitudinal rod to move downward through the lifting plate. The downward-moving longitudinal rod drives the transmission gear and the bidirectional threaded rod to rotate through the meshing teeth. The rotating bidirectional threaded rod drives the two movable placement platforms to move towards each other. When the two movable placement platforms are in contact (the shape formed by splicing the receiving cavities in the two movable placement platforms is arc-shaped, and the shape formed by splicing the two feeding ports is circular), the meshing teeth on the surface of the longitudinal rod just disengage from the transmission gear, and the arc-shaped pressing member is located at a certain height above the two receiving cavities. At this time, the test piece is inserted between the two feeding ports. When the telescopic member drives the arc-shaped pressing member and the longitudinal rod to move downward through the lifting plate, the downward-moving longitudinal rod no longer drives the transmission gear and the bidirectional threaded rod to rotate through the meshing teeth. The downward-moving arc-shaped pressing member shapes the test piece for pressure resistance testing in the two receiving cavities.

[0006] As a further embodiment of the present invention, the two movable placement platforms are respectively provided with feeding ports on both sides, and the receiving cavity corresponds to the position of the feeding port. The size of the feeding port and the receiving cavity is not limited and will not be described in detail.

[0007] As a further embodiment of the present invention, the cross-section of the receiving cavity is semi-circular, and the shape formed by splicing two receiving cavities is circular. The cross-section of the feeding port is semi-circular, and the shape formed by splicing two feeding ports is circular. In order to ensure that the electronic components are not damaged in the feeding port during the withstand voltage test, a protective buffer component such as a rubber ring can be installed in the feeding port.

[0008] As a further embodiment of the present invention, the bearing mechanism further includes a transverse guide rod and a longitudinal guide rail. The transverse guide rod and the longitudinal guide rail are both fixedly connected to the surface of the bearing frame. The movable placement platform is movably sleeved on the surface of the transverse guide rod, and the longitudinal rod is movably sleeved in the longitudinal guide rail. The transverse guide rod and the longitudinal guide rail both serve to limit and guide. The transverse guide rod can ensure that the movable placement platform makes stable transverse linear movement, and the longitudinal guide rail can ensure that the longitudinal rod makes stable longitudinal movement.

[0009] As a further embodiment of the present invention, the measured component conveying mechanism includes a support frame and a belt conveyor. The belt conveyor is installed at the bottom of the carrier frame via the support frame. The moving direction of the belt conveyor is perpendicular to the moving direction of the movable placement platform. The belt conveyor includes a conveyor belt, a drive roller, a driven roller, and a drive motor. The drive roller, driven roller, and drive motor are all installed on the surface of the support frame. The conveyor belt is connected between the drive roller and the driven roller. The drive motor is connected to the drive roller and is used to drive the drive roller to rotate. Since the belt conveyor can directly transport the unloaded electronic components to the designated position, when the next electronic component falls, there will be no collision between the two electronic components, ensuring that the electronic components are not damaged during the entire unloading process.

[0010] As a further aspect of the present invention, when the arc-shaped pressing member is completely located within the receiving cavity, the meshing teeth are located below the transmission gear. When the telescopic member drives the arc-shaped pressing member and the longitudinal rod to move upward through the lifting plate, after the arc-shaped pressing member moves to a certain height above the two receiving cavities, the meshing teeth on the surface of the longitudinal rod begin to mesh with the transmission gear and drive it to rotate in the opposite direction. The bidirectional threaded rod rotating in the opposite direction drives the two movable placement platforms to move in opposite directions. The movable placement platforms moving in opposite directions can separate the two receiving cavities and the two feeding ports from each other. When the distance between the two movable placement platforms reaches a certain level, the electronic components located between the two receiving cavities and the two feeding ports will automatically unload under the action of gravity by utilizing the design of the arc-shaped pressing member, the longitudinal rod, the meshing teeth, the transmission gear, the bidirectional threaded rod, and the movable placement platforms.

[0011] In summary, the beneficial effects of this invention are: it requires only one telescopic component as a driving component, and utilizes the design of the coordinated interaction between the arc-shaped pressing component, longitudinal rod, meshing teeth, transmission gear, bidirectional threaded rod, and movable placement platform. This not only enables the pressure resistance testing of electronic components of different sizes, but also allows for the automatic removal of the tested electronic components without damage using their own weight. It features simple structure, convenient operation, low cost, and high work efficiency. Attached Figure Description

[0012] Figure 1 This is a perspective view of the support mechanism in an embodiment of the present invention.

[0013] Figure 2 This is a perspective view of the pressure resistance testing mechanism in an embodiment of the present invention.

[0014] Figure 3 This is a front view of the pressure resistance testing mechanism in an embodiment of the present invention.

[0015] Figure 4This is a first perspective view of the test piece placement mechanism in an embodiment of the present invention.

[0016] Figure 5 This is a second perspective view of the test piece placement mechanism in an embodiment of the present invention.

[0017] Figure 6 This is a perspective view of an automatic testing device for electronic components according to the present invention.

[0018] Reference numerals: 1-Bearing mechanism, 11-Bearing frame, 12-Transverse guide rod, 13-Longitudinal guide rail, 2-Pressure resistance testing mechanism, 21-Extension component, 22-Lifting plate, 23-Fixed rod, 24-Arc-shaped pressing component, 25-Longitudinal rod, 26-Meshing teeth, 3-Test piece placement mechanism, 31-Mobile placement platform, 311-Receiving cavity, 312-Feeding port, 32-Bidirectional threaded rod, 33-Transmission gear, 4-Tested piece conveying mechanism, 41-Support frame, 42-Belt conveyor. Detailed Implementation

[0019] To make the objectives, technical solutions, and advantages of this invention clearer, the invention will be further described in detail below with reference to the accompanying drawings and specific embodiments. It should be understood that the specific embodiments described herein are merely illustrative and not intended to limit the invention.

[0020] The specific implementation of the present invention will be described in detail below with reference to specific embodiments.

[0021] Please see Figures 1 to 6 This invention provides an automatic testing device for electronic components, comprising a carrying mechanism 1, a withstand voltage testing mechanism 2, a test component placement mechanism 3, and a tested component conveying mechanism 4. The carrying mechanism 1 includes a carrying frame 11, and the withstand voltage testing mechanism 2 includes a telescopic component 21, an arc-shaped pressing component 24, and a longitudinal rod 25. The telescopic component 21 is fixedly installed on the top of the carrying frame 11, and the arc-shaped pressing component 24 and the longitudinal rod 25 are disposed below the telescopic component 21. The surface of the longitudinal rod 25 is provided with meshing teeth 26 at a position away from the arc-shaped pressing component 24. The telescopic component 21 is a hydraulic telescopic rod, and a pressure sensor is disposed below the arc-shaped pressing component 24. The pressure sensor is communicatively connected to a computer system. The test piece placement mechanism 3 includes a movable placement platform 31, a bidirectional threaded rod 32, and a transmission gear 33. The two bidirectional threaded rods 32 are mounted on the surface of the support frame 11, and the transmission gear 33 is mounted on the surface of the bidirectional threaded rod 32. The meshing teeth 26 are connected to the transmission gear 33. The lower parts of the two movable placement platforms 31 are threaded to the surface of the bidirectional threaded rod 32. The upper surfaces of the two movable placement platforms 31 are provided with receiving cavities 311. The arc-shaped pressing member 24 is located above the receiving cavity 311. The test piece conveying mechanism 4 is located below the movable placement platform 31. The two longitudinal rods 25 are respectively distributed on the same side of the two transmission gears 33.

[0022] Furthermore, the pressure resistance testing mechanism 2 also includes a lifting plate 22 and a fixing rod 23. The lifting plate 22 is fixedly connected to the lower part of the telescopic member 21, and the upper part of the arc-shaped pressing member 24 is connected to the surface of the lifting plate 22 through the fixing rod 23.

[0023] Furthermore, the movable placement platform 31 is provided with a feeding port 312 on both sides, and the receiving cavity 311 corresponds to the position of the feeding port 312. The size of the feeding port 312 and the receiving cavity 311 is not limited and will not be described in detail.

[0024] Furthermore, the cross-section of the receiving cavity 311 is semi-circular, and the shape formed by splicing two receiving cavities 311 is arc-shaped. The cross-section of the feeding port 312 is semi-circular, and the shape formed by splicing two feeding ports 312 is circular. In order to ensure that the electronic components under test are not damaged in the feeding port 312 during the withstand voltage test, protective buffer components such as rubber rings can be installed in the feeding port 312.

[0025] Furthermore, the bearing mechanism 1 also includes a transverse guide rod 12 and a longitudinal guide rail 13. The transverse guide rod 12 and the longitudinal guide rail 13 are both fixedly connected to the surface of the bearing frame 11. The movable placement platform 31 is movably sleeved on the surface of the transverse guide rod 12, and the longitudinal rod 25 is movably sleeved in the longitudinal guide rail 13. The transverse guide rod 12 and the longitudinal guide rail 13 both play a limiting and guiding role. The transverse guide rod 12 can ensure that the movable placement platform 31 makes stable transverse linear movement, and the longitudinal guide rail 13 can ensure that the longitudinal rod 25 makes stable longitudinal movement.

[0026] Furthermore, when the arc-shaped pressing member 24 is completely located within the receiving cavity 311, the meshing teeth 26 are located below the transmission gear 33.

[0027] In this embodiment of the invention, the telescopic member 21 drives the arc-shaped pressing member 24 and the longitudinal rod 25 to move downward through the lifting plate 22. The downward-moving longitudinal rod 25 drives the transmission gear 33 and the bidirectional threaded rod 32 to rotate through the meshing teeth 26. The rotating bidirectional threaded rod 32 drives the two movable placement platforms 31 to move towards each other. When the two movable placement platforms 31 are in contact, the meshing teeth 26 on the surface of the longitudinal rod 25 just disengage from the transmission gear 33, and the arc-shaped pressing member 24 is located at a certain height above the two receiving cavities 311. At this time, the test piece is inserted between the two feeding ports 312. When the telescopic member 21 drives the arc-shaped pressing member 24 and the longitudinal rod 25 to move downward through the lifting plate 22, the downward-moving longitudinal rod 25 no longer drives the transmission gear 33 and the bidirectional threaded rod 32 to rotate through the meshing teeth 26. The downward-moving arc-shaped pressing member 24 performs a pressure resistance test on the test piece in the two receiving cavities 311.

[0028] Please see Figures 1 to 6 In one embodiment of the present invention, the measured part conveying mechanism 4 includes a support frame 41 and a belt conveyor 42. The belt conveyor 42 is installed at the bottom of the carrier frame 11 through the support frame 41, and the moving direction of the belt conveyor 42 is perpendicular to the moving direction of the movable placement platform 31.

[0029] In this embodiment of the invention, the belt conveyor 42 includes a conveyor belt, a drive roller, a driven roller, and a drive motor. The drive roller, driven roller, and drive motor are all mounted on the surface of the support frame 41. The conveyor belt is connected between the drive roller and the driven roller. The drive motor is connected to the drive roller and is used to drive the drive roller to rotate. After the pressure test is completed, when the arc-shaped pressing member 24 moves to a certain height above the two receiving cavities 311, the meshing teeth 26 on the surface of the longitudinal rod 25 begin to mesh with the transmission gear 33 and drive it to rotate. The rotating bidirectional threaded rod 32 drives the two movable placement platforms 31. The movable placement platform 31, which moves in opposite directions, allows the two receiving cavities 311 and the two loading ports 312 to separate from each other. At this time, the electronic components between the two receiving cavities 311 and the two loading ports 312 will automatically fall onto the surface of the belt conveyor 42 below under the action of gravity. Since the belt conveyor 42 can directly transport the unloaded electronic components to the designated position, when the next electronic component falls, there will be no collision between the two electronic components, which can ensure that the electronic components will not be damaged during the entire unloading process.

[0030] Working principle: When the telescopic component 21 is activated, it drives the arc-shaped pressing component 24 and the longitudinal rod 25 downwards via the lifting plate 22. The downward-moving longitudinal rod 25 drives the transmission gear 33 and the bidirectional threaded rod 32 to rotate via the meshing teeth 26. The rotating bidirectional threaded rod 32 drives the two movable placement platforms 31 to move towards each other. When the two movable placement platforms 31 are in contact (the shape formed by the splicing of the receiving cavities 311 in the two movable placement platforms 31 is arc-shaped, and the shape formed by the splicing of the two feeding ports 312 is circular), the meshing teeth 26 on the surface of the longitudinal rod 25 just disengage from the transmission gear 33, and the arc-shaped pressing component 24 is located at a certain height above the two receiving cavities 311. At this time, the test piece is inserted between the two feeding ports 312. When the telescopic component 21 drives the arc-shaped pressing component 24 and the longitudinal rod 25 downwards via the lifting plate 22, the downward-moving longitudinal rod 25 no longer drives the transmission gear 33 and the bidirectional threaded rod 32 to rotate via the meshing teeth 26, and continues to move downwards. The arc-shaped pressing member 24 presses the electronic components in the two receiving cavities 311. A pressure sensor is provided on the lower surface of the arc-shaped pressing member 24 to monitor the pressure signal on the electronic components. Then, when the telescopic member 21 drives the arc-shaped pressing member 24 and the longitudinal rod 25 to move upward through the lifting plate 22, when the arc-shaped pressing member 24 moves to a certain height above the two receiving cavities 311, the meshing teeth 26 on the surface of the longitudinal rod 25 begin to mesh with the transmission gear 33 and drive it to rotate in the opposite direction. The bidirectional threaded rod 32 rotating in the opposite direction drives the two movable placement platforms 31 to move in opposite directions. The moving movable placement platforms 31 can separate the two receiving cavities 311 and the two feeding ports 312 from each other. When the distance between the two movable placement platforms 31 reaches a certain level, the electronic components located between the two receiving cavities 311 and the two feeding ports 312 will automatically fall onto the surface of the belt conveyor 42 below under the action of gravity, realizing the function of automatically unloading the electronic components.

[0031] In summary, only one telescopic component 21 is needed as the driving component. By utilizing the coordinated design of the arc-shaped pressing component 24, the longitudinal rod 25, the meshing teeth 26, the transmission gear 33, the bidirectional threaded rod 32, and the movable placement platform 31, it is possible not only to perform pressure tests on electronic components of different sizes, but also to automatically remove the tested electronic components without damage by utilizing their own weight. It features simple structure, convenient operation, low cost, and high work efficiency.

[0032] While several embodiments and examples of the present invention have been described for those skilled in the art, these embodiments and examples are provided as examples and are not intended to limit the scope of the invention. These new embodiments can be implemented in various other ways, and various omissions, substitutions, and modifications can be made without departing from the spirit of the invention. These embodiments and their variations are included within the scope and spirit of the invention, and are included within the scope of the invention as described in the claims and its equivalents.

[0033] Furthermore, it should be understood that although this specification describes embodiments, not every embodiment contains only one independent technical solution. This narrative style is merely for clarity. Those skilled in the art should consider the specification as a whole, and the technical solutions in each embodiment can also be appropriately combined to form other embodiments that can be understood by those skilled in the art.

Claims

1. An automatic testing device for electronic components, comprising a bearing mechanism, a withstand voltage testing mechanism, a test component placement mechanism, and a tested component conveying mechanism, characterized in that, The bearing mechanism includes a bearing frame, and the pressure resistance testing mechanism includes a telescopic component, an arc-shaped pressing component, and a longitudinal rod. The telescopic component is fixedly installed on the top of the bearing frame, and the arc-shaped pressing component and the longitudinal rod are arranged below the telescopic component. The surface of the longitudinal rod is provided with meshing teeth at a position away from the arc-shaped pressing component. The test piece placement mechanism includes a movable placement platform, a bidirectional threaded rod, and a transmission gear. Two bidirectional threaded rods are mounted on the surface of the support frame, and the transmission gear is mounted on the surface of the bidirectional threaded rod. The meshing teeth are connected to the transmission gear. The lower parts of the two movable placement platforms are threaded to the surface of the bidirectional threaded rod. The upper surfaces of the two movable placement platforms are provided with receiving cavities. The arc-shaped pressing element is located above the receiving cavity, and the test piece conveying mechanism is located below the movable placement platform. When the arc-shaped pressing element is fully located within the receiving cavity, the meshing teeth are located below the transmission gear.

2. The automatic testing device for electronic components according to claim 1, characterized in that, The pressure resistance testing mechanism also includes a lifting plate and a fixing rod. The lifting plate is fixedly connected to the lower part of the telescopic component, and the upper part of the arc-shaped pressing component is connected to the surface of the lifting plate through the fixing rod.

3. The automatic testing device for electronic components according to claim 2, characterized in that, The two movable placement platforms are respectively provided with feeding ports on both sides, and the receiving cavity corresponds to the position of the feeding port.

4. The automatic testing device for electronic components according to claim 3, characterized in that, The cross-section of the receiving cavity is semi-circular, and the shape formed by splicing two receiving cavities is circular. The cross-section of the feeding port is semi-circular, and the shape formed by splicing two feeding ports is circular.

5. The automatic testing device for electronic components according to claim 4, characterized in that, The bearing mechanism also includes a transverse guide rod and a longitudinal guide rail. The transverse guide rod and the longitudinal guide rail are both fixedly connected to the surface of the bearing frame. The movable placement platform is movably sleeved on the surface of the transverse guide rod, and the longitudinal rod is movably sleeved inside the longitudinal guide rail.

6. The automatic testing device for electronic components according to claim 5, characterized in that, The measured part conveying mechanism includes a support frame and a belt conveyor. The belt conveyor is installed at the bottom of the carrier frame via the support frame, and the moving direction of the belt conveyor is perpendicular to the moving direction of the movable placement platform.

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