Surface defect detection device

Abstract

The invention provides a surface defect detection device, and relates to the technical field of detection equipment, and the surface defect detection device comprises a main body; the bearing platform is used for placing a to-be-tested piece, and the bearing platform is arranged on the main body in a sliding manner, so that the bearing platform can drive the to-be-tested piece to slide on the main body in a reciprocating manner; the light source assembly is used for irradiating the to-be-tested piece; the light source assembly is movably arranged on the main body, so that the irradiation direction of the light source assembly is adjustable; the information acquisition assembly is used for acquiring surface information of the to-be-tested piece; the information acquisition assembly is movably arranged on the main body, so that the acquisition direction of the information acquisition assembly can be adjusted; the intersection point of the irradiation direction of the light source assembly and the acquisition direction of the information acquisition assembly is located on the sliding path of the to-be-tested piece. According to the surface defect detection device provided by the invention, the problem that the reliability of a detection result is relatively low due to the fact that the surface defects of the copper foil are not comprehensively obtained in related technologies is solved.

Description

Technical Field

[0001] This application relates to the field of testing equipment technology, and in particular to a surface defect detection device. Background Technology

[0002] Copper foil is a fundamental material in electronic circuits, and its surface quality directly affects product performance and yield. Therefore, surface defects (such as scratches, dents, and punctures) of copper foil are frequently inspected to ensure its surface quality.

[0003] In related technologies, the detection device used includes a light source and a camera fixed to a worktable. During operation, the light source illuminates the surface of the copper foil from a fixed angle, and the camera acquires images of the copper foil surface at a fixed angle, thereby completing the surface defect detection of the copper foil.

[0004] However, using the above-mentioned detection device to detect surface defects in copper foil can easily lead to incomplete acquisition of surface defects, resulting in low reliability of the detection results. Summary of the Invention

[0005] This application provides a surface defect detection device to solve the problem in related technologies where the acquisition of surface defects of copper foil is incomplete, resulting in low reliability of the detection results.

[0006] This application provides a surface defect detection device, comprising:

[0007] main body;

[0008] A support platform is provided for placing the test piece, and the support platform is slidably mounted on the main body so that the support platform can drive the test piece to slide back and forth on the main body.

[0009] A light source assembly for illuminating the test piece; the light source assembly is movably disposed on the main body so that the illumination direction of the light source assembly is adjustable;

[0010] An information acquisition component is provided to acquire surface information of the workpiece under test; the information acquisition component is movably mounted on the main body so that the acquisition direction of the information acquisition component is adjustable.

[0011] The intersection of the illumination direction of the light source assembly and the acquisition direction of the information acquisition assembly is located on the sliding path of the device under test.

[0012] In one possible implementation, the information acquisition component includes a first support, a connector, and an acquisition component. The first support is connected to the main body, and the acquisition component is movably connected to the first support via the connector. The acquisition component is used to acquire surface information of the test piece.

[0013] In one possible implementation, the connector is slidably connected to the first bracket, and the collecting element is rotatably connected to the connector.

[0014] In one possible implementation, the light source assembly includes a second bracket and a light source element, the second bracket being connected to the main body, the light source element being rotatably connected to the second bracket, and the light source element being used to illuminate the test object.

[0015] In one possible implementation, the second bracket has a sliding seat that is slidably connected to the body;

[0016] The sliding seat is provided with a fastener, which is used to lock the sliding seat in the current position after the sliding seat slides.

[0017] In one possible implementation, the main body is provided with a linear guide rail, and the bearing platform is slidably connected to the main body through the linear guide rail, so that the bearing platform can slide back and forth along the linear guide rail.

[0018] In one possible implementation, the system further includes a drive member and a drive screw, the drive screw extending along the extension direction of the linear guide and threadedly connected to the bearing platform, the drive member being used to control the rotation or stop the rotation of the drive screw, so as to drive or stop the bearing platform to reciprocate along the linear guide.

[0019] In one possible implementation, a switch element is further included, which is electrically connected to the drive element and is located at the end of the linear guide in the extension direction; the switch element is configured to trigger the drive element to stop operating when the support platform is sensed.

[0020] In one possible implementation, multiple switching elements are provided, with at least two of the switching elements located at opposite ends of the linear guide rail in the extension direction.

[0021] In one possible implementation, the upper surface of the support platform is provided with a matte layer.

[0022] This application provides a surface defect detection device, comprising: a main body; a support platform for placing the workpiece under test (DUT), which is slidably mounted on the main body to allow the DUT to reciprocate on the main body; a light source assembly for illuminating the DUT; the light source assembly is movably mounted on the main body to allow its illuminating direction to be adjusted; and an information acquisition assembly for acquiring surface information of the DUT; the information acquisition assembly is movably mounted on the main body to allow its acquisition direction to be adjusted. The intersection of the illuminating direction of the light source assembly and the acquisition direction of the information acquisition assembly is located on the sliding path of the DUT. During detection, the DUT (such as copper foil) can be placed on the support platform, which then drives the copper foil to reciprocate on the main body. Simultaneously, the illuminating direction of the light source assembly and the acquisition direction of the information acquisition assembly can be adjusted according to actual needs, ensuring that the intersection of the illuminating direction of the light source assembly and the acquisition direction of the information acquisition assembly is located on the sliding path of the copper foil, enabling the information acquisition assembly to effectively acquire surface information of the copper foil from multiple different directions. This allows for a more comprehensive acquisition of surface defects in the copper foil, reducing the possibility of missing some surface defects and improving the reliability of the test results. It solves the problem of incomplete acquisition of surface defects in copper foil in related technologies, which leads to lower reliability of the test results. Attached Figure Description

[0023] The accompanying drawings, which are incorporated in and form part of this specification, illustrate embodiments consistent with this application and, together with the description, serve to explain the principles of this application.

[0024] Figure 1 This is a front view schematic diagram of a surface defect detection device provided in an embodiment of this application;

[0025] Figure 2 This is a top view of a surface defect detection device provided in an embodiment of this application;

[0026] Figure 3 for Figure 1 A schematic diagram of the structure of the acquisition component when it is rotated 27° counterclockwise.

[0027] Figure 4 for Figure 1 Schematic diagrams of the acquisition and light source components at various angles.

[0028] Explanation of reference numerals in the attached figures:

[0029] 100-Main Body;

[0030] 200 - Load-bearing platform; 210 - Drive component; 220 - Drive screw;

[0031] 300 - Light source assembly; 310 - Second bracket; 320 - Light source component; 330 - Sliding base;

[0032] 400 - Information acquisition component; 410 - First support; 420 - Connector; 430 - Acquisition component;

[0033] 500-Linear Guide;

[0034] 600 - Switching components.

[0035] The accompanying drawings illustrate specific embodiments of this application, which will be described in more detail below. These drawings and descriptions are not intended to limit the scope of the concept in any way, but rather to illustrate the concept of this application to those skilled in the art through reference to particular embodiments. Detailed Implementation

[0036] Exemplary embodiments will now be described in detail, examples of which are illustrated in the accompanying drawings. When the following description relates to the drawings, unless otherwise indicated, the same numbers in different drawings denote the same or similar elements. The embodiments described in the following exemplary embodiments do not represent all embodiments consistent with this application. Rather, they are merely examples of apparatuses and methods consistent with some aspects of this application as detailed in the appended claims.

[0037] In related technologies, copper foil is a fundamental material for electronic circuits, and its surface quality directly affects product performance and yield. Therefore, surface defects (such as scratches, dents, and punctures) of copper foil are frequently inspected to ensure its surface quality. Surface defect inspection of copper foil primarily involves identifying various quality flaws on or within the copper foil surface using a charge-coupled device (CCD) optical inspection system (hereinafter also referred to as a camera).

[0038] Specifically, the inspection device used includes a light source and a camera fixed to the worktable. During operation, the light source illuminates the surface of the copper foil from a fixed angle to reveal the target features through illumination; the camera acquires images of the copper foil surface from a fixed angle, thereby completing the surface defect inspection of the copper foil.

[0039] However, when using the above-mentioned detection device to detect surface defects of copper foil, the light source illumination angle and camera shooting angle are singular, which easily leads to incomplete acquisition of surface defects of copper foil, and there is a high possibility of missing some surface defects, resulting in low reliability of the detection results.

[0040] Based on this, this application provides a surface defect detection device, including: a main body; a support platform for placing a workpiece under test (DUT), the support platform being slidably mounted on the main body so that the support platform can drive the DUT to slide back and forth on the main body; a light source assembly for illuminating the DUT; the light source assembly being movably mounted on the main body so that the illuminating direction of the light source assembly is adjustable; and an information acquisition assembly for acquiring surface information of the DUT; the information acquisition assembly being movably mounted on the main body so that the acquisition direction of the information acquisition assembly is adjustable; the intersection of the illuminating direction of the light source assembly and the acquisition direction of the information acquisition assembly is located on the sliding path of the DUT. Therefore, during detection, the DUT (such as copper foil) can be placed on the support platform, and the support platform can then drive the copper foil to slide back and forth on the main body; simultaneously, the illuminating direction of the light source assembly and the acquisition direction of the information acquisition assembly can be adjusted according to actual needs, and the intersection of the illuminating direction of the light source assembly and the acquisition direction of the information acquisition assembly is located on the sliding path of the copper foil, enabling the information acquisition assembly to effectively acquire surface information of the copper foil from multiple different directions. This allows for a more comprehensive acquisition of surface defects in the copper foil, reducing the possibility of missing some surface defects and improving the reliability of the test results. It solves the problem of incomplete acquisition of surface defects in copper foil in related technologies, which leads to lower reliability of the test results.

[0041] The technical solution of this application and how the technical solution of this application solves the above-mentioned technical problems are described in detail below with specific embodiments. These specific embodiments can be combined with each other, and the same or similar concepts or processes may not be described again in some embodiments. The embodiments of this application will now be described with reference to the accompanying drawings.

[0042] like Figure 1 and Figure 2 As shown in the figure, an embodiment of this application provides a surface defect detection device, comprising:

[0043] Main body 100;

[0044] The support platform 200 is used to place the test piece. The support platform 200 is slidably mounted on the main body 100 so that the support platform 200 can drive the test piece to slide back and forth on the main body 100.

[0045] The light source assembly 300 is used to illuminate the test piece; the light source assembly 300 is movably mounted on the main body 100 so that the illumination direction of the light source assembly 300 is adjustable.

[0046] Information acquisition component 400 is used to acquire surface information of the workpiece under test; information acquisition component 400 is movably mounted on main body 100 so that the acquisition direction of information acquisition component 400 is adjustable.

[0047] The intersection of the illumination direction of the light source component 300 and the acquisition direction of the information acquisition component 400 is located on the sliding path of the test piece.

[0048] It should be noted that in this embodiment, the test piece is copper foil. In other embodiments, the test piece can also be components or products from other fields.

[0049] In this embodiment, the main body 100 is horizontally positioned, and the supporting platform 200 is slidably positioned on the main body 100 in the horizontal direction.

[0050] During testing, the copper foil can be placed on the support platform 200, and then the support platform 200 can drive the copper foil to slide back and forth on the main body 100. Since the intersection of the illumination direction of the light source component 300 and the acquisition direction of the information acquisition component 400 is located on the sliding path of the copper foil, the copper foil can be illuminated by the light source component 300 during the cyclic sliding process, and the surface information can be acquired by the information acquisition component 400.

[0051] Furthermore, the illumination direction of the light source assembly 300 and the acquisition direction of the information acquisition assembly 400 can be adjusted according to actual needs, enabling the information acquisition assembly 400 to effectively acquire surface information of the copper foil from multiple different directions. This results in a more comprehensive acquisition of surface defects of the copper foil, reducing the possibility of missing some surface defects and improving the reliability of the detection results. This solves the problem of incomplete acquisition of surface defects of copper foil in related technologies, which leads to low reliability of the detection results.

[0052] In other words, by changing the illumination direction of the light source component 300 and the acquisition direction of the information acquisition component 400, copper foil can be captured from various angles, resulting in a complete three-dimensional image. Furthermore, an optimal lighting scheme (different directions for different defects) can be used for specific defects, maximizing the enhancement of defect features and reducing algorithm complexity.

[0053] Understandably, during the entire cyclic sliding process, the position of the copper foil when it is illuminated and the position of the surface information of the copper foil when it is acquired will change as the illumination direction of the light source component 300 and the acquisition direction of the information acquisition component 400 are adjusted.

[0054] In other words, the cyclic sliding of the copper foil allows surface information to be acquired within the adjustable range of the illumination direction of the light source component 300 and the acquisition direction of the information acquisition component 400. Correspondingly, the greater the distance the copper foil slides back and forth, the wider the adjustable range of the illumination direction of the light source component 300 and the acquisition direction of the information acquisition component 400. In this embodiment, there are no limitations on the adjustable range of the copper foil's sliding distance, the illumination direction of the light source component 300, and the acquisition direction of the information acquisition component 400.

[0055] In some embodiments, such as Figure 1 As shown, the information acquisition component 400 includes a first support 410, a connector 420, and an acquisition component 430. The first support 410 is connected to the main body 100, and the acquisition component 430 is movably connected to the first support 410 through the connector 420. The acquisition component 430 is used to acquire surface information of the test piece.

[0056] The main body 100 can be plate-shaped, frame-shaped, or other shapes, and the first support 410 can be frame-shaped, rod-shaped, or other shapes, without limitation.

[0057] In this embodiment, the first support 410 is vertically arranged, and its lower end can be fixedly connected to the main body 100 by screws, welding, or other means. The acquisition element 430 is movably connected to the first support 410 via a connector 420, which can be block-shaped, strip-shaped, or other shapes, without limitation. The acquisition element 430 can be a camera, and its model is not limited (such as a CCD camera), enabling it to acquire surface information of the copper foil by taking pictures, which is equivalent to acquiring a surface image of the copper foil.

[0058] During testing, the acquisition component 430 can move relative to the first support 410 via the connector 420, thereby facilitating the adjustment of the acquisition direction (i.e., the shooting direction) of the acquisition component 430 to effectively acquire surface information of the copper foil from multiple different directions.

[0059] Specifically, connector 420 is slidably connected to the first bracket 410, and acquisition component 430 is rotatably connected to connector 420.

[0060] In this embodiment, the connector 420 is slidably connected to the first bracket 410 along the vertical direction. In practice, the connector 420 can be automatically controlled to slide back and forth vertically by means of a cylinder, hydraulic cylinder, electric telescopic rod, or motor screw installed on the first bracket 410, thereby adjusting the height of the connector 420 and the acquisition element 430.

[0061] The data acquisition component 430 is rotatably connected to the connector 420 around a horizontal rotation axis. In practice, the rotation of the data acquisition component 430 can be automatically controlled by a motor mounted on the connector 420. The type of motor is not limited; for example, a stepper motor or a servo motor can be used. Furthermore, the motor can drive the data acquisition component 430 to rotate, thereby adjusting the deflection angle of the data acquisition component 430.

[0062] Therefore, the connection 420 can be raised or lowered or the acquisition component 430 can be rotated by the aforementioned power source, thereby adjusting the height or deflection angle of the acquisition component 430 and achieving the purpose of automatically adjusting the acquisition direction of the acquisition component 430, thus improving intelligence.

[0063] For example, the rotation of the data acquisition unit 430 can be controlled by a stepper motor (the output shaft of the stepper motor is coaxially connected to the rotating part of the data acquisition unit 430). Based on this, a 1.8° stepper motor can be used to adjust the deflection angle of the data acquisition unit 430 (by stepping at fixed angles using electrical pulse signals, completing one revolution every 200 pulse signals), which is quite precise. The deflection angle of the data acquisition unit 430 can be adjusted as needed, for example, such as... Figure 3 As shown, the signal is generated by rotating counterclockwise by 27° from the vertical direction, which is equivalent to 15 pulse signals.

[0064] Furthermore, a driver can be used to subdivide the stepper motor, that is, to cut the inherent step angle of the motor. For example, when the subdivision is set to 4, the driver will divide each whole step into 4 small steps, and the actual step angle becomes 0.45 degrees. However, the higher the subdivision, the smaller the single step angle, and more pulses are required to complete a whole circle of motion.

[0065] In other embodiments, the connector 420 may also be slidably connected to the first bracket 410 in a horizontal, inclined, or other manner. Of course, the acquisition member 430 may also be rotatably connected to the connector 420 about a rotation axis in other directions.

[0066] In some embodiments, such as Figure 1 As shown, the light source assembly 300 includes a second bracket 310 and a light source element 320. The second bracket 310 is connected to the main body 100, and the light source element 320 is rotatably connected to the second bracket 310. The light source element 320 is used to illuminate the test object.

[0067] The second support 310 can be in the form of a frame, a rod, or other shapes, and there are no restrictions on this. The light source 320 can be a lighting lamp, and there are no restrictions on its model.

[0068] In this embodiment, the second bracket 310 is vertically arranged, and its lower end is connected to the main body 100. The light source 320 is rotatably connected to the second bracket 310 around a horizontal rotation axis. In practice, a motor mounted on the second bracket 310 can be used to control the rotation of the light source 320. The type of motor is not limited, such as a stepper motor or a servo motor.

[0069] Therefore, during testing, the light source 320 can be automatically rotated by the motor to adjust the deflection angle of the light source 320, thereby achieving the purpose of automatically adjusting the illumination direction of the light source 320 and improving intelligence.

[0070] In summary, it can automatically adjust the angles of the acquisition element 430 and the light source element 320, making the angles more precise and the adjustment more convenient.

[0071] In other embodiments, the light source 320 may also be rotatably connected to the second bracket 310 about a rotation axis in other directions.

[0072] In some embodiments, such as Figure 1 and Figure 2 As shown, the second bracket 310 has a sliding seat 330, which is slidably connected to the main body 100;

[0073] The slide block 330 is provided with a fastener, which is used to lock the slide block 330 in the current position after it slides.

[0074] The sliding seat 330 can be connected to the lower end of the second bracket 310 by integral molding, welding, screwing, or other means. The sliding seat 330 is slidably connected to the main body 100, and the sliding direction of the sliding seat 330 is consistent with the sliding direction of the bearing platform 200.

[0075] The slide block 330 is provided with a fastener, which can lock the slide block 330 in the current position.

[0076] Therefore, the position of the second bracket 310 and the light source 320 in the horizontal direction can be adjusted by sliding the sliding seat 330, thereby further increasing the adjustable range of the light source 320 to adapt to various different detection needs.

[0077] For example, the fasteners can be screws, bolts, pins, etc. Specifically, the sliding seat 330 can be locked by abutting against the body 100 with screws or bolts; multiple positioning holes distributed along the sliding direction of the sliding seat 330 can also be opened on the body 100, and the sliding seat 330 can be locked by inserting screws, bolts or pins into the positioning holes.

[0078] In practice, a horizontally extending slide rail can be installed on the main body 100 so that the sliding seat 330 cooperates with the slide rail, allowing the sliding seat 330 to slide under the guidance of the slide rail, thus ensuring the stability of the sliding seat 330 and the second support 310 when sliding.

[0079] Additionally, in some embodiments, similar to the acquisition element 430, the light source element 320 can be further slidably connected to the second bracket 310 in the vertical direction. Similarly, similar to the second bracket 310, the first bracket 410 can be slidably connected to the main body 100 in the horizontal direction. This correspondingly increases the adjustability range of the acquisition element 430 and the light source element 320.

[0080] During implementation, a graduated ruler can be attached to the first bracket 410 and the second bracket 310 according to actual needs, so that the height adjustment is more precise.

[0081] In some embodiments, such as Figure 2 As shown, a linear guide rail 500 is provided on the main body 100 by welding, integral molding or other means, and the bearing platform 200 is slidably connected to the main body 100 through the linear guide rail 500 so that the bearing platform 200 can slide back and forth along the linear guide rail 500.

[0082] Therefore, the linear guide rail 500 can guide the reciprocating sliding of the bearing platform 200, thereby improving the stability of the bearing platform 200 during reciprocating sliding.

[0083] For the control method of the 200 sliding bearing platform, such as Figure 2 As shown, in this embodiment, the surface defect detection device further includes a drive component 210 and a drive screw 220. The drive screw 220 passes through the linear guide rail 500 and is threadedly connected to the support platform 200. The drive component 210 controls the rotation or stopping of the drive screw 220 to drive or stop the support platform 200 to reciprocate along the linear guide rail 500. The drive component 210 is a motor, and its model is not limited. The drive component 210 can be fixed to the main body 100 by screwing, welding, or other means. In practice, the drive screw 220 can also pass through and be rotatably connected to the main body 100 so that the main body 100 provides a certain degree of support for the drive screw 220.

[0084] Therefore, the drive screw 220 can be automatically controlled to rotate or stop rotating by the drive component 210, thereby driving or stopping the bearing platform 200 to slide cyclically along the linear guide rail 500, improving intelligence. Furthermore, the bearing platform 200 can operate at a uniform speed and smoothly, simulating the copper foil sample in the production process.

[0085] In practice, the lead screw 220 can be selected with a smaller lead to improve feed accuracy.

[0086] Furthermore, such asFigure 2 As shown, the surface defect detection device also includes a switch 600, which is electrically connected to the drive unit 210. The switch 600 is located at the end of the linear guide 500 in the extension direction. The switch 600 is configured to trigger the drive unit 210 to stop running when it senses the support platform 200.

[0087] Among them, the switch 600 can be a photoelectric switch, and the model is not limited. Of course, it can also be other forms of contact or non-contact limit switches.

[0088] Therefore, when the support platform 200 (sliding to the end of the linear guide 500) approaches or contacts the switch 600, the switch 600 can sense the support platform 200 and trigger the drive unit 210 to stop running, thereby automatically controlling the support platform 200 to stop, further improving the degree of automation, and also improving the safety and convenience of the sliding control of the support platform 200. Of course, in implementation, the drive unit 210 can also be manually controlled to stop running.

[0089] In implementation, multiple switches 600 can be provided, with at least two switches 600 located at both ends of the linear guide rail 500 in the extension direction. This ensures that when the carrying platform 200 slides to both ends of the linear guide rail 500, the corresponding switches 600 can promptly control the carrying platform 200 to stop, effectively improving the safety and convenience of the sliding control of the carrying platform 200.

[0090] In other embodiments, the reciprocating sliding of the bearing platform 200 may also be controlled by a cylinder, hydraulic cylinder, electric telescopic rod, transmission belt or other power source, and there are no restrictions on this.

[0091] In some embodiments, the upper surface of the support platform 200 (i.e., the surface used to place the copper foil) is provided with a matte layer. In practice, the upper surface of the support platform 200 can be treated with a black matte finish to form a matte layer. Exemplarily, the matte layer can be applied to the upper surface of the support platform 200 by smearing, pasting, or other methods. This is to suppress interference from ambient light and specular reflections.

[0092] During implementation, a relatively three-dimensional 2D panoramic image of the sample can be formed by capturing details from different angles and directions. Defects can be captured more clearly and accurately from different angles, and the defects that can be identified from different angles are not the same. By adjusting the multiple angles, all defects can be identified as comprehensively as possible. Finally, all detected defects can be integrated through algorithms.

[0093] It can also combine and stitch together image information from different angles using computer algorithms and AI to model a three-dimensional copper foil surface and the outline of defects.

[0094] The overall inspection process can include: placing the copper foil on the support platform 200, the drive component 210 rotating in the forward direction to drive the drive screw 220 to rotate, the support platform 200 moving at a constant speed, and the acquisition component 430 and the light source component 320 being adjusted and fixed according to the required position, height, and angle (initially, the image-taking direction of the acquisition component 430 is vertically downward, and the intersection of the image-taking direction of the acquisition component 430 and the illumination direction of the light source component 320 is located on the sliding path of the copper foil). As the support platform 200 moves, the acquisition component 430 continuously captures images to identify defects. The support platform 200 automatically stops when it reaches the switch component 600, but can also be manually controlled to start and stop.

[0095] The control drive component 210 reverses, the carrying platform 200 moves in the opposite direction at a constant speed, the acquisition component 430 captures and photographs to identify defects, the carrying platform 200 returns to the starting point, and under the control of the switch component 600, the carrying platform 200 automatically stops after reaching the starting point.

[0096] Secondly, the angle and height positions of the acquisition element 430 and the light source element 320 can be pre-adjusted as needed (adjusted to other directions), and then the support platform 200 can complete the above reciprocating motion again. By repeating the above steps, defects on the copper foil surface under the acquisition element 430 and the light source element 320 at different angles and height positions can be randomly detected. By observing the degree of obviousness of different defects illuminated by different angles of light, obvious defects can be identified.

[0097] like Figure 4As shown, for example, with the vertical illumination intersection point of the acquisition element 430 (i.e., the intersection of the imaging direction of the acquisition element 430 and the illumination direction of the light source 320) as the origin of the coordinate axis, the vertical distance of the rotation axis of the acquisition element 430 from the illumination direction of the acquisition element 430 is 151.5mm, the vertical distance of the rotation axis from the sleeve on the acquisition element 430 is 169.2mm, and the distance between the sleeve surface and the fixed point is L (mm) (which can be adjusted according to process requirements). Given an angle θ (0° < θ < 90°) between the line connecting the acquisition element 430 and the intersection point and the horizontal plane, let the coordinate of the rotation axis of the acquisition element 430 be (-1 51.5, y), the coordinates of the intersection point on the bearing platform 200 are (x, 0), (the acquisition component 430 rotates to the right by (90-θ)°), y=sinθ(L+169.2+151.5tanθ)-303tanθ, x=cosθL+169.2cosθ+151.5sinθ-151.5; (the acquisition component 430 rotates to the left by (90-θ)°), y=151.5cosθ+sinθ(L+169.2)), x=151.5sinθ-cosθ(169.2+L)-151.5. The distance between the rotation axis of the light source 320 and the line connecting the intersection point is fixed at l (mm), and the rotation direction of the light source 320 is fixed (a fixed rotation α° to the left and right). Calculate the coordinates of the rotation axis of the light source 320. Let the coordinates of the light source 320 be (a, b). (Starting with the light source 320 facing vertically downwards, rotate clockwise by α°, the angle needs to be changed according to the type of defect to be detected) b = sinαl, a = cosθL + 169.2cosθ + 151.5sinθ - 151.5 + cosαl; (Starting with the light source 320 facing vertically downwards, rotate counterclockwise by α°, the angle needs to be changed according to the type of defect to be detected) b = sinαl, a = 151.5sinθ - cosθ(169.2 + L) - 151.5 - cosαl.

[0098] In summary, the surface defect detection device provided in this application allows the copper foil to be placed on the support platform 200 during detection, and then the support platform 200 can drive the copper foil to slide back and forth on the main body 100. Since the intersection of the illumination direction of the light source component 300 and the acquisition direction of the information acquisition component 400 is located on the sliding path of the copper foil, the copper foil can be illuminated by the light source component 300 during the cyclic sliding process, and the surface information can be acquired by the information acquisition component 400. Furthermore, the illumination direction of the light source component 300 and the acquisition direction of the information acquisition component 400 can be adjusted according to actual needs, enabling the information acquisition component 400 to effectively acquire surface information of the copper foil from multiple different directions. This results in a more comprehensive acquisition of surface defects of the copper foil, reducing the possibility of missing some surface defects and improving the reliability of the detection results. This solves the problem in related technologies where the acquisition of surface defects of the copper foil is incomplete, leading to low reliability of the detection results.

[0099] Additionally, this surface defect detection device is applicable to the following areas: quality monitoring during the electrolytic copper foil production process: defect detection in the foil forming process, surface treatment process, and slitting process; lithium battery copper foil inspection; standard electronic circuit copper foil inspection; and surface inspection of other metal foils: aluminum foil, stainless steel foil, titanium foil, etc.

[0100] Finally, it should be noted that other embodiments of the invention will readily occur to those skilled in the art upon consideration of the specification and practice of the invention disclosed herein. This invention is intended to cover any variations, uses, or adaptations of the invention that follow the general principles of the invention and include common knowledge or customary techniques in the art not disclosed herein, and is not limited to the precise structures described above and shown in the accompanying drawings, and various modifications and changes can be made without departing from its scope. The scope of the invention is limited only by the appended claims.

Claims

1. A surface defect detection device, characterized in that, include: Main body (100); A support platform (200) is used to place the test piece. The support platform (200) is slidably disposed on the main body (100) so that the support platform (200) can drive the test piece to slide back and forth on the main body (100). A light source assembly (300) is used to illuminate the test piece; the light source assembly (300) is movably disposed on the main body (100) so that the illumination direction of the light source assembly (300) is adjustable; An information acquisition component (400) is used to acquire surface information of the test piece; the information acquisition component (400) is movably disposed on the main body (100) so that the acquisition direction of the information acquisition component (400) is adjustable; The intersection of the illumination direction of the light source assembly (300) and the acquisition direction of the information acquisition assembly (400) is located on the sliding path of the test piece.

2. The surface defect detection device according to claim 1, characterized in that, The information acquisition component (400) includes a first bracket (410), a connector (420), and an acquisition component (430). The first bracket (410) is connected to the main body (100), and the acquisition component (430) is movably connected to the first bracket (410) through the connector (420). The acquisition component (430) is used to acquire the surface information of the test piece.

3. The surface defect detection device according to claim 2, characterized in that, The connector (420) is slidably connected to the first bracket (410), and the collecting element (430) is rotatably connected to the connector (420).

4. The surface defect detection device according to claim 1, characterized in that, The light source assembly (300) includes a second bracket (310) and a light source element (320). The second bracket (310) is connected to the main body (100), and the light source element (320) is rotatably connected to the second bracket (310). The light source element (320) is used to illuminate the test piece.

5. The surface defect detection device according to claim 4, characterized in that, The second bracket (310) has a sliding seat (330) which is slidably connected to the body (100). The sliding seat (330) is provided with a fastener, which is used to lock the sliding seat (330) in the current position after the sliding seat (330) slides.

6. The surface defect detection device according to any one of claims 1-5, characterized in that, The main body (100) is provided with a linear guide rail (500), and the bearing platform (200) is slidably connected to the main body (100) through the linear guide rail (500) so that the bearing platform (200) can slide back and forth along the linear guide rail (500).

7. The surface defect detection device according to claim 6, characterized in that, It also includes a drive unit (210) and a drive screw (220), the drive screw (220) passing through the extension direction of the linear guide (500) and threadedly connected to the bearing platform (200), the drive unit (210) is used to control the drive screw (220) to rotate or stop rotating, so as to drive or stop the bearing platform (200) to slide back and forth along the linear guide (500).

8. The surface defect detection device according to claim 7, characterized in that, It also includes a switch (600) electrically connected to the drive (210), the switch (600) being located at the end of the linear guide (500) in the extension direction; the switch (600) is configured to trigger the drive (210) to stop operating when the carrier platform (200) is sensed.

9. The surface defect detection device according to claim 8, characterized in that, Multiple switches (600) are provided, and at least two switches (600) are located at both ends of the linear guide (500) in the extension direction.

10. The surface defect detection device according to any one of claims 1-5, characterized in that, The upper surface of the support platform (200) is provided with a matte layer.

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