Position calibration improved structure of X-ray fluorescence spectrophotometer

Abstract

The invention relates to the technical field of position calibration, and provides a position calibration improved structure of an X fluorescence spectrometer, which comprises a spectrometer box, the bottom of the spectrometer box is fixedly connected with a base, the top of the spectrometer box is provided with a spectrum cavity, the outer surface of the spectrum cavity is provided with a visual sensor, and the visual sensor is connected with the base. Arc-shaped rails are symmetrically arranged on the two sides of the spectrometer box, the outer surfaces of the arc-shaped rails are slidably connected with isolation hoods, a sliding-out groove is formed in the bottom of the spectrum cavity, and a side groove is further formed in the inner wall of the spectrum cavity; the positioning unit is arranged at the bottom of the spectrum cavity and used for adjusting the position, the excitation unit is located above the positioning unit and emits X fluorescence, a material needing qualitative and quantitative treatment is put into the positioning unit, the positioning unit can drive the material to move to the position under the excitation unit, and the sample is bombarded by X rays to excite characteristic fluorescence; and non-destructive detection of qualitative and quantitative analysis of elements is realized.

Description

Technical Field

[0001] This invention relates to the field of position calibration technology, and in particular to an improved position calibration structure for an X-ray fluorescence spectrometer. Background Technology

[0002] X-ray fluorescence spectrometer is a non-destructive detection device that uses X-rays to bombard samples and excite characteristic fluorescence to achieve qualitative and quantitative elemental analysis. The analysis range covers Be to U and can be adapted to various sample forms such as solids, powders, and liquids. It is widely used in mineral exploration, materials testing, environmental monitoring and other fields.

[0003] When using X-ray fluorescence spectrometry to determine the elemental composition and content of samples, position calibration is often limited to static calibration before measurement (such as standard sample positioning and light field alignment), failing to cover dynamic deviation scenarios during the measurement process. In actual testing, the thermal expansion of the sample caused by continuous X-ray irradiation and the mechanical vibration of the sample stage during operation can lead to dynamic displacement of the sample. This not only distorts the fluorescence signal intensity but also causes errors in the identification of elemental characteristic peaks due to shifts in the detection angle, ultimately significantly reducing the accuracy of quantitative analysis. Summary of the Invention

[0004] The purpose of this invention is to solve the problem that dynamic displacement not only distorts the fluorescence signal intensity, but also causes errors in the identification of elemental characteristic peaks due to the shift in the detection angle, ultimately significantly reducing the accuracy of quantitative analysis. This invention provides an improved position calibration structure for X-ray fluorescence spectrometers.

[0005] The technical solution adopted by the present invention to solve its technical problem is: an improved position calibration structure for an X-ray fluorescence spectrometer, comprising: a spectrometer box, a base fixedly connected to the bottom of the spectrometer box, a control console fixedly connected to the front of the spectrometer box, a spectral cavity provided on the top of the spectrometer box, a visual sensor provided on the outer surface of the spectral cavity, arc-shaped tracks symmetrically arranged on both sides of the spectrometer box, an isolation cover slidably connected to the outer surface of the arc-shaped tracks, a handle fixedly connected to the outer surface of the isolation cover, a sliding groove provided at the bottom of the spectral cavity, and a side groove provided on the inner wall of the spectral cavity; Also includes: A positioning unit located at the bottom of the spectral cavity for adjusting the position, and an excitation unit located above the positioning unit for emitting X-ray fluorescence; By placing the material requiring qualitative and quantitative analysis into the positioning unit, the positioning unit moves the material directly below the excitation unit. The sample is then bombarded with X-rays to excite characteristic fluorescence, enabling non-destructive detection for elemental qualitative and quantitative analysis. The positioning unit includes a first track plate, a first transmission motor fixedly connected to the inner wall of the first track plate, a first reciprocating lead screw fixedly connected to the output end of the first transmission motor, a first moving nut threadedly connected to the outer surface of the first reciprocating lead screw, a second track plate fixedly connected to the outer surface of the first moving nut, a second transmission motor fixedly connected to the inner wall of the second track plate, a second reciprocating lead screw fixedly connected to the output end of the second transmission motor, a second moving nut threadedly connected to the outer surface of the second reciprocating lead screw, and a placement mechanism provided on the top of the second moving nut; The placement mechanism includes a placement platform, an irradiation groove at the top of the placement platform, a porous air-permeable pad at the bottom of the irradiation groove, a high-pressure blower fixedly connected to the top of the placement platform, a polytetrafluoroethylene (PTFE) container cup placed on the top of the porous air-permeable pad, five air supply pipes at the bottom of the high-pressure blower, a stable airflow nozzle fixedly connected to the top of the placement platform, and an air outlet plate fixedly connected to the bottom of the porous air-permeable pad. When the excitation unit irradiates the material to be tested, the gas outlet plate and the stable airflow nozzle will spray gas, causing the PTFE container holding the material to remain in a suspended state. Furthermore, the two ends of the first track plate are fixedly connected to the outer surface of the spectral cavity, and the bottom of the placement stage is fixedly connected to the top of the second movable nut.

[0006] Furthermore, the bottom of the air outlet plate is fixedly connected to the outer surface of one of the air supply pipes, and the bottom of the stable airflow nozzle is fixedly connected to the outer surfaces of the other four air supply pipes.

[0007] Furthermore, the excitation unit includes a support frame, one end of which is fixedly connected to an X-ray fluorescence emitter. An X-ray source is disposed at the bottom of the X-ray fluorescence emitter. A primary optical device is fixedly connected at the bottom of the X-ray source. A secondary optical device is fixedly connected at the bottom of the primary optical device. A pre-test mechanism is disposed on the outer surface of the X-ray fluorescence emitter. A signal receiving mechanism adapted to the pre-test mechanism is disposed on the side of the X-ray fluorescence emitter away from the pre-test mechanism.

[0008] Furthermore, the end of the support frame furthest from the X-ray fluorescence emitter is fixedly connected to the outer surface of the spectral cavity; The primary optical device is a collimator located immediately adjacent to the light source outlet, and the secondary optical device is an X-ray capillary used for micro-area analysis.

[0009] Furthermore, the pre-testing mechanism includes a first support plate, a first motor is fixedly connected to the top of the first support plate, a telescopic machine base is fixedly connected to the output end of the first motor, a telescopic rod is fixedly connected to the bottom of the telescopic machine base, a clamping device is fixedly connected to the output end of the telescopic rod, clamping arms are symmetrically arranged at the bottom of the clamping device, and a rubber ring is fixedly connected to the outer surface of the clamping device.

[0010] Furthermore, the outer surface of the first support plate is fixedly connected to the outer surface of the X-ray fluorescence emitter; The radius of the rubber ring is matched with the radius of the polytetrafluoroethylene container.

[0011] Furthermore, the signal receiving mechanism includes an arc-shaped frame, a supporting arc rod is fixedly connected to the inner wall of the arc-shaped frame, a motor support plate is fixedly connected to the outer surface of the arc-shaped frame, a second motor is fixedly connected to the outer surface of the motor support plate, a receiving component is fixedly connected to the output end of the second motor, a ring frame is also fixedly connected to the outer surface of the support frame, a wiping cotton board is fixedly connected to the outer surface of the ring frame, the wiping cotton board is soaked in anhydrous ethanol, and a notch is provided at the bottom of the wiping cotton board.

[0012] Furthermore, the receiving component includes a rotating arm, with a detector fixedly connected to the end of the rotating arm away from the second motor. The detector is used to receive the characteristic fluorescence excited after the sample is irradiated. A receiving plate is fixedly connected to the end of the detector away from the rotating arm. A support column is fixedly connected to the outer surface of the detector. A wiping plate is fixedly connected to the end of the support column away from the detector.

[0013] Furthermore, the top of the arc-shaped frame is fixedly connected to the outer surface of the X-ray fluorescence emitter, and the end of the rotating arm near the second motor is fixedly connected to the output end of the second motor.

[0014] The beneficial effects of the improved position calibration structure for an X-ray fluorescence spectrometer provided by this invention are as follows: (1) By setting up a positioning unit, after placing the blank sample and the sample to be measured, the first transmission motor and the second transmission motor drive the first reciprocating screw and the second reciprocating screw to rotate respectively, thereby driving the sample placement mechanism to move directly below the excitation unit. At the same time, the vision sensor will locate the position of the placement mechanism in real time to avoid the X-ray beam from deviating from the preset measurement point of the sample. (2) By setting up a placement mechanism, although the positioning unit will complete the static calibration before measurement (such as standard sample positioning and light field alignment), it does not cover the dynamic deviation scenario during the measurement process. Continuous X-ray irradiation will cause thermal expansion of the sample (especially polymer or low melting point samples). Combined with the mechanical vibration of the sample stage, it will cause the sample to have a micro displacement in the polytetrafluoroethylene container, causing the X-ray beam to deviate from the preset measurement point, resulting in distortion of fluorescence signal intensity and a significant increase in quantitative analysis error. Therefore, by setting up a high-pressure fan to output stable air to the air outlet plate and the stable airflow nozzle through the air supply pipe, the air output by the air outlet plate will flow upward through the micron-level air holes on the porous breathable pad, and the gas will overflow evenly to form a stable gas film, causing the polytetrafluoroethylene container containing the sample to float. At the same time, the stable airflow nozzles around will also generate airflow, limiting the horizontal shaking amplitude of the sample. Although it cannot completely eliminate vibration, it can reduce the vibration amplitude and effectively isolate the mechanical vibration of the sample stage. (3) Simply positioning the standard sample cannot accurately measure the data. Therefore, before placing the sample to be tested, a blank sample with the same matrix as the sample to be tested needs to be placed in the polytetrafluoroethylene container (e.g., pure plastic without target elements should be used when testing plastic). Then, the X-ray fluorescence emitter will test the blank sample, and the receiving signal mechanism will test at different receiving angles to eliminate angles with "blurred characteristic peaks / interference" and select the angle with "highest S / B ratio + count rate ≥ 1000", which is the best receiving signal angle for subsequent sample testing.

[0015] (4) During the process of the second motor driving the receiving component to adjust the angle, the wiping cotton plate will clean the impurities and dust on the receiving plate to avoid the impurities and dust interfering with the core process of "fluorescent photon transmission → signal conversion", which will lead to fluorescence count rate distortion, background noise increase, characteristic peak interference, and ultimately reduce the accuracy of qualitative and quantitative analysis. At the same time, the wiping plate will also scrape the dust adhering to the wiping cotton plate. Finally, the wiping plate will scrape the dust to the notch and remove it from the wiping cotton, thereby achieving self-cleaning. Attached Figure Description

[0016] Figure 1 This is a three-dimensional structural schematic diagram of the present invention; Figure 2 This is a three-dimensional structural cross-sectional view of the present invention; Figure 3 This is a schematic diagram of the spectral cavity structure of the present invention; Figure 4 This is a schematic diagram of the positioning unit of the present invention; Figure 5 This is a bottom view of the positioning unit of the present invention; Figure 6 This is a schematic diagram of the placement mechanism of the present invention; Figure 7This is a structural cross-sectional view of the placement mechanism of the present invention; Figure 8 This is a schematic diagram of the excitation unit of the present invention; Figure 9 This is a cross-sectional view of the excitation unit of the present invention; Figure 10 This is a schematic diagram of the pre-testing mechanism of the present invention; Figure 11 This is a schematic diagram of the structure of the signal receiving mechanism of the present invention; Figure 12 This is a schematic diagram of the receiving component of the present invention.

[0017] In the diagram: 1. Spectrometer housing; 2. Base; 3. Control console; 4. Spectroscopic cavity; 5. Vision sensor; 6. Excitation unit; 7. Positioning unit; 8. Arc-shaped track; 9. Isolation cover; 10. Handle; 11. Sliding groove; 12. Side groove; 71. First track plate; 72. First transmission motor; 73. First reciprocating screw; 74. First moving nut; 75. Second track plate; 76. Second transmission motor; 77. Second moving nut; 78. Placement mechanism; 781. Placement platform; 782. Irradiation chamber; 783. High-pressure blower; 784. Porous breathable pad; 785. PTFE container; 786. Gas supply pipe; 787. Stabilizing airflow nozzle; 788. Gas outlet plate; 61. 62. Support frame; 63. X-ray fluorescence emitter; 64. X-ray source; 65. Pre-testing mechanism; 66. Signal receiving mechanism; 67. Primary optical component; 68. Secondary optical component; 69. First support plate; 60. First motor; 61. Telescopic base; 62. Telescopic rod; 63. Clamping device; 644. Clamping arm; 65. Rubber ring; 66. Arc frame; 67. Support arc rod; 68. Motor support plate; 69. Receiving assembly; 60. Ring frame; 61. Wiping cotton plate; 62. Notch; 63. Second motor; 64. Rotating arm; 65. Detector; 65. Receiver plate; 65. Column; 66. Wiping plate. Detailed Implementation

[0018] To make the objectives, technical solutions, and advantages of this invention clearer, the invention will be further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the further embodiments described herein are merely illustrative and not intended to limit the invention.

[0019] After an X-ray source bombards a sample with X-rays, inner-shell electrons are ejected, creating holes. When outer-shell electrons transition to lower-energy orbitals to fill these holes, they release X-ray fluorescence with specific energy or wavelength. According to Moseley's law, the fluorescence wavelength is strongly correlated with the atomic number of the element. By detecting the energy, wavelength, and intensity of the fluorescence, the types and contents of elements in the sample can be accurately determined. However, position calibration is required before X-ray emission. Current X-ray fluorescence spectrometers' position calibration is mostly limited to static calibration before measurement, failing to cover dynamic deviations during the measurement process. Dynamic displacement can cause errors in identifying elemental characteristic peaks, ultimately significantly reducing the accuracy of quantitative analysis. Therefore, an improved position calibration structure for an X-ray fluorescence spectrometer was designed. like Figures 1-3 As shown, it includes: a spectrometer box 1, a base 2 fixedly connected to the bottom of the spectrometer box 1, a control console 3 fixedly connected to the front of the spectrometer box 1, a spectrometer cavity 4 set on the top of the spectrometer box 1, a vision sensor 5 set on the outer surface of the spectrometer cavity 4, arc-shaped tracks 8 symmetrically arranged on both sides of the spectrometer box 1, an isolation cover 9 slidably connected to the outer surface of the arc-shaped tracks 8, and a handle 10 fixedly connected to the outer surface of the isolation cover 9. When performing sample detection, the isolation cover 9 needs to be closed to prevent external impurities from entering. A sliding groove 11 is set at the bottom of the spectrometer cavity 4, and a side groove 12 is also set on the inner wall of the spectrometer cavity 4. The placement mechanism 78 can move out of the side groove 12 to place the sample. Also includes: Positioning unit 7 is located at the bottom of the spectral cavity 4 and is used to adjust the position, and excitation unit 6 is located above the positioning unit 7 and emits X-ray fluorescence; In the operation of this invention, the material to be qualitatively and quantitatively analyzed needs to be placed into the positioning unit 7. The positioning unit 7 will move the material to the direct below the excitation unit 6, and use X-rays to bombard the sample to excite characteristic fluorescence, thereby achieving non-destructive detection of elemental qualitative and quantitative analysis. like Figures 4-5 As shown, the positioning unit 7 includes a first track plate 71, a first transmission motor 72 is fixedly connected to the inner wall of the first track plate 71, a first reciprocating screw 73 is fixedly connected to the output end of the first transmission motor 72, a first moving nut 74 is threadedly connected to the outer surface of the first reciprocating screw 73, a second track plate 75 is fixedly connected to the outer surface of the first moving nut 74, a second transmission motor 76 is fixedly connected to the inner wall of the second track plate 75, a second reciprocating screw is fixedly connected to the output end of the second transmission motor 76, a second moving nut 77 is threadedly connected to the outer surface of the second reciprocating screw, and a placement mechanism 78 is provided on the top of the second moving nut 77; After the sample is placed, the first transmission motor 72 drives the first reciprocating screw 73 to rotate, thereby moving the first moving nut 74. At the same time, the second transmission motor 76 drives the second reciprocating screw to rotate, thereby moving the second moving nut 77. This drives the sample placement mechanism 78 to move directly below the excitation unit 6. Meanwhile, the vision sensor 5 will locate the position of the placement mechanism 78 in real time to avoid deviation between the X-ray beam and the preset measurement point of the sample.

[0020] like Figures 6-7 As shown, the placement mechanism 78 includes a placement platform 781, an irradiation groove 782 on the top of the placement platform 781, a porous ventilated pad 784 at the bottom of the irradiation groove 782, a high-pressure blower 783 fixedly connected to the top of the placement platform 781, a polytetrafluoroethylene (PTFE) container 785 placed on the top of the porous ventilated pad 784, five air supply pipes 786 at the bottom of the high-pressure blower 783, a stable airflow nozzle 787 fixedly connected to the top of the placement platform 781, and an air outlet plate 788 fixedly connected to the bottom of the porous ventilated pad 784. Continuous X-ray irradiation causes thermal expansion of the sample (especially polymers or low-melting-point samples). Combined with the mechanical vibration of the sample stage, this causes a slight displacement of the sample in the PTFE container 785. A high-pressure blower 783 outputs stable air to the air outlet plate 788 and the stabilizing airflow nozzle 787 through the air supply pipe 786. The air output from the air outlet plate 788 flows upward through the micron-sized pores on the porous breathable pad 784, and the gas overflows evenly to form a stable gas film, causing the PTFE container 785 containing the sample to float. At the same time, the stabilizing airflow nozzles 787 around the container also generate airflow, limiting the horizontal swaying amplitude of the sample. Although it cannot completely eliminate vibration, it can reduce the vibration amplitude and effectively isolate the mechanical vibration of the sample stage.

[0021] When the excitation unit 6 irradiates the material to be tested, the gas outlet plate 788 and the stable airflow nozzle 787 will eject gas, causing the polytetrafluoroethylene container 785 containing the material to be suspended. The two ends of the first track plate 71 are fixedly connected to the outer surface of the spectral cavity 4, and the bottom of the placement stage 781 is fixedly connected to the top of the second moving nut 77.

[0022] The bottom of the air outlet plate 788 is fixedly connected to the outer surface of one of the air supply pipes 786, and the bottom of the stable airflow nozzle 787 is fixedly connected to the outer surface of the other four air supply pipes 786.

[0023] like Figures 8-9As shown, the excitation unit 6 includes a support frame 61, one end of which is fixedly connected to an X-ray fluorescence emitter 62. An X-ray source 63 is disposed at the bottom of the X-ray fluorescence emitter 62. A primary optical device 66 is fixedly connected at the bottom of the X-ray source 63. A secondary optical device 67 is fixedly connected at the bottom of the primary optical device 66. A pre-test mechanism 64 is disposed on the outer surface of the X-ray fluorescence emitter 62. A signal receiving mechanism 65 adapted to the pre-test mechanism 64 is disposed on the side of the X-ray fluorescence emitter 62 away from the pre-test mechanism 64.

[0024] The end of the support frame 61 away from the X-ray fluorescence emitter 62 is fixedly connected to the outer surface of the spectral cavity 4; The primary optical element 66 is a collimator located immediately adjacent to the light source outlet, and the secondary optical element 67 is an X-ray capillary used for micro-area analysis.

[0025] The X-ray fluorescence emitter 62 emits an X-ray beam through the X-ray source 63. After passing through the collimator, the beam is constrained into a parallel / focused beam with a diameter of 0.1-1 mm. Finally, it is further focused / oriented through the X-ray capillary, precisely pointing to the sample measurement point. After the sample is irradiated, characteristic fluorescence is excited and dispersed to the side and upward to the receiving signal mechanism 65.

[0026] like Figure 10 As shown, the pre-testing mechanism 64 includes a first support plate 641, a first motor 642 fixedly connected to the top of the first support plate 641, a telescopic base 643 fixedly connected to the output end of the first motor 642, a telescopic rod 644 fixedly connected to the bottom of the telescopic base 643, a clamping device 645 fixedly connected to the output end of the telescopic rod 644, clamping arms 646 symmetrically arranged at the bottom of the clamping device 645, and a rubber ring 647 fixedly connected to the outer surface of the clamping device 645.

[0027] The outer surface of the first support plate 641 is fixedly connected to the outer surface of the X-ray fluorescence emitter 62; The radius of the rubber ring 647 is matched with the radius of the polytetrafluoroethylene container 785.

[0028] like Figure 11 As shown, the signal receiving mechanism 65 includes an arc-shaped frame 651, a supporting arc rod 652 fixedly connected to the inner wall of the arc-shaped frame 651, a motor support plate 653 fixedly connected to the outer surface of the arc-shaped frame 651, a second motor 658 fixedly connected to the outer surface of the motor support plate 653, a receiving component 654 fixedly connected to the output end of the second motor 658, a ring frame 655 fixedly connected to the outer surface of the support frame 61, a wiping cotton plate 656 fixedly connected to the outer surface of the ring frame 655, the wiping cotton plate 656 is soaked in anhydrous ethanol, and a notch 657 is provided at the bottom of the wiping cotton plate 656.

[0029] like Figure 12As shown, the receiving component 654 includes a rotating arm 6541. A detector 6542 is fixedly connected to one end of the rotating arm 6541 away from the second motor 658. The detector 6542 is used to receive the characteristic fluorescence excited after the sample is irradiated, and the S / B ratio and count rate can be directly displayed based on the characteristic fluorescence signal. A receiving plate 6543 is fixedly connected to one end of the detector 6542 away from the rotating arm 6541. A support column 6544 is fixedly connected to the outer surface of the detector 6542. A wiping plate 6545 is fixedly connected to one end of the support column 6544 away from the detector 6542.

[0030] Before testing the sample to be tested, a blank sample with the same matrix as the sample to be tested is placed in a polytetrafluoroethylene container 785. Then, the X-ray fluorescence emitter 62 emits an X-ray beam through the X-ray source 63 and irradiates the blank sample. Afterward, the second motor 658 drives the rotating arm 6541 to rotate, and moves the detector 6542 to between 70° and 85°. Four angles are selected evenly, and the predicted quantity is performed with 70°, 75°, 80°, and 85° as target points respectively. The receiving plate 6543 receives the signals from the four different angles respectively. The detector 6542 calculates whether the characteristic peak of the target element is clear (without overlapping interference peaks) and the S / B ratio (S / B is the target element's characteristic peak) based on the received signals. The ratio of the "characteristic peak peak count rate" to the "background count rate near the peak" of a target element is a core indicator for measuring the signal's anti-interference capability. A higher S / B ratio indicates that the characteristic peak of the target element is more prominent, the interference from background noise is smaller, the characteristic peak identification is more accurate, and the quantitative analysis error is smaller. The count rate (the count rate is the "effective fluorescent photon count" captured by the detector per unit time, which directly reflects the intensity of the characteristic fluorescence signal excited by the sample) is also considered. First, angles with "blurred or interfering characteristic peaks" are eliminated, and then angles with "highest S / B ratio + count rate ≥ 1000" are selected. This angle is the optimal scattering angle for the sample to be tested, thereby further calibrating the position of detector 6542. The detector 6542 uses a silicon drift detector (SDD) with an energy resolution of 120 eV. During measurement, the irradiation time is set to 15 s / time. The background window is selected from the interference-free region from 50 eV to the left and 50 eV to the right of the characteristic peak of the target element. The average count rate in this region is used as the background count rate. The peak count rate of the characteristic peak is taken as the instantaneous count rate corresponding to the peak. The ratio of the two is the S / B ratio. When the S / B ratio is ≥50 and the count rate is ≥1000 cps, it is determined to be an effective angle.

[0031] After testing with a blank sample, the positioning unit 7 drives the placement mechanism 78 containing the blank sample to move below the pre-testing mechanism 64. Then, the telescopic rod 644 extends downward, and the clamping device 645 drives the clamping arm 646 to clamp the blank sample. Afterward, the first motor 642 drives the structure below the overall telescopic base 643 to rotate, thereby causing the rubber ring 647 to brush the inner wall of the polytetrafluoroethylene container 785, collecting and removing debris from the blank sample and impurities adhering to the inner wall, thus preventing blank sample residue and impurities from affecting the subsequent testing of the sample to be tested.

[0032] During the process of the second motor 658 driving the receiving component 654 to adjust the angle, the wiping cotton plate 656 cleans away the impurities and dust on the receiving plate 6543, avoiding interference from impurities and dust with the core process of "fluorescent photon transmission → signal conversion", which would lead to fluorescence count rate distortion, increased background noise, and characteristic peak interference, ultimately reducing the accuracy of qualitative and quantitative analysis. At the same time, the wiping plate 6545 also scrapes the dust adhering to the wiping cotton plate 656, and finally the wiping plate 6545 scrapes the dust to the notch 657 and removes it from the wiping cotton plate 656, thereby achieving self-cleaning.

[0033] The top of the arc frame 651 is fixedly connected to the outer surface of the X-ray fluorescence emitter 62, the end of the rotating arm 6541 near the second motor 658 is fixedly connected to the output end of the second motor 658, and the inner wall of the rotating arm 6541 is slidably connected to the outer surface of the supporting arc rod 652.

[0034] The working process of the improved position calibration structure for an X-ray fluorescence spectrometer provided by this invention is as follows: First, a blank sample identical to the matrix of the sample to be tested is placed in the PTFE container 785. The blank sample is then tested by the X-ray fluorescence emitter 62, and the signal receiving mechanism 65 tests at different receiving angles to select the optimal scattering angle. Then, the telescopic rod 644 extends downwards, and the clamping device 645 drives the clamping arm 646 to clamp the blank sample. Finally, the sample is released and flows out through the sliding groove 11. Then, the sample to be tested is placed in. The first transmission motor 72 and the second transmission motor 76 respectively drive the first reciprocating screw 73 and the second reciprocating screw to rotate, thereby moving the sample-containing placement mechanism 78 to directly below the excitation unit 6. Simultaneously, the visual sensor 5 provides real-time... The placement mechanism 78 is positioned, and the high-pressure blower 783 outputs stable air to the air outlet plate 788 and the stabilizing airflow nozzle 787 through the air supply pipe 786. The air output from the air outlet plate 788 flows upward through the micron-sized pores on the porous breathable pad 784, and the gas overflows evenly to form a stable gas film, causing the polytetrafluoroethylene container 785 containing the sample to float. At the same time, the stabilizing airflow nozzles 787 around the sample also generate airflow to limit the horizontal swaying amplitude of the sample. Finally, the X-ray fluorescence emitter 62 emits an X-ray beam through the X-ray source 63. After the sample is irradiated, it is excited with characteristic fluorescence, which is emitted to the side and upward to the receiving signal mechanism 65, thereby accurately determining the type and corresponding content of elements in the sample.

[0035] In the description of this disclosure, it should be noted that, unless otherwise expressly specified and limited, the term "fixed connection" should be interpreted broadly. For example, it can refer to a bolted connection, a welded connection, or an integral connection; it can refer to a mechanical connection or an electrical connection; it can refer to a direct connection or an indirect connection through an intermediate medium; it can refer to the internal connection of two components. Those skilled in the art can understand the specific meaning of the above terms in this disclosure according to the specific circumstances.

[0036] The above are merely preferred embodiments of the present invention and are not intended to limit the present invention. Any modifications, equivalent substitutions, and improvements made within the spirit and principles of the present invention should be included within the protection scope of the present invention.

Claims

1. An improved structure for position calibration of an X-ray fluorescence spectrometer, comprising: A spectrometer housing, wherein a spectral cavity is provided on the top of the spectrometer housing, and an openable isolation cover is slidably provided on the outer surface of the spectral cavity via an arc-shaped track; Its characteristic is that it further includes: A positioning unit located at the bottom of the spectral cavity for adjusting the position, and an excitation unit located above the positioning unit for emitting X-ray fluorescence; By placing the material requiring qualitative and quantitative analysis into the positioning unit, the positioning unit moves the material directly below the excitation unit. The sample is then bombarded with X-rays to excite characteristic fluorescence, enabling non-destructive detection for elemental qualitative and quantitative analysis. The positioning unit includes a first track plate, a first transmission motor fixedly connected to the inner wall of the first track plate, a first reciprocating lead screw fixedly connected to the output end of the first transmission motor, a first moving nut threadedly connected to the outer surface of the first reciprocating lead screw, a second track plate fixedly connected to the outer surface of the first moving nut, a second transmission motor fixedly connected to the inner wall of the second track plate, a second reciprocating lead screw fixedly connected to the output end of the second transmission motor, a second moving nut threadedly connected to the outer surface of the second reciprocating lead screw, and a placement mechanism provided on the top of the second moving nut; The placement mechanism includes a placement platform, an irradiation groove on the top of the placement platform, a porous air-permeable pad at the bottom of the irradiation groove, a high-pressure blower fixedly connected to the top of the placement platform, a polytetrafluoroethylene (PTFE) container placed on the top of the porous air-permeable pad, five air supply pipes at the bottom of the high-pressure blower, a stable airflow nozzle fixedly connected to the top of the placement platform, and an air outlet plate fixedly connected to the bottom of the porous air-permeable pad.

2. The position calibration improvement structure of an X-fluorescence spectrometer according to claim 1, characterized in that: The two ends of the first track plate are fixedly connected to the outer surface of the spectral cavity, and the bottom of the placement stage is fixedly connected to the top of the second movable nut.

3. The position calibration improvement structure of an X-ray fluorescence spectrometer according to claim 1, characterized in that: The bottom of the air outlet plate is fixedly connected to the outer surface of one of the air supply pipes, and the bottom of the stable airflow nozzle is fixedly connected to the outer surfaces of the other four air supply pipes.

4. The improved position calibration structure for an X-ray fluorescence spectrometer according to claim 1, characterized in that: The excitation unit includes a support frame, one end of which is fixedly connected to an X-ray fluorescence emitter. An X-ray source is disposed at the bottom of the X-ray fluorescence emitter. A primary optical device is fixedly connected at the bottom of the X-ray source. A secondary optical device is fixedly connected at the bottom of the primary optical device. A pre-test mechanism is disposed on the outer surface of the X-ray fluorescence emitter. A signal receiving mechanism adapted to the pre-test mechanism is disposed on the side of the X-ray fluorescence emitter away from the pre-test mechanism.

5. The improved position calibration structure for an X-ray fluorescence spectrometer according to claim 4, characterized in that: The end of the support frame furthest from the X-ray fluorescence emitter is fixedly connected to the outer surface of the spectral cavity.

6. The improved position calibration structure for an X-ray fluorescence spectrometer according to claim 5, characterized in that: The pre-testing mechanism includes a first support plate, a first motor is fixedly connected to the top of the first support plate, a telescopic machine base is fixedly connected to the output end of the first motor, a telescopic rod is fixedly connected to the bottom of the telescopic machine base, a clamping device is fixedly connected to the output end of the telescopic rod, clamping arms are symmetrically arranged at the bottom of the clamping device, and a rubber ring is fixedly connected to the outer surface of the clamping device.

7. The improved position calibration structure for an X-ray fluorescence spectrometer according to claim 6, characterized in that: The outer surface of the first support plate is fixedly connected to the outer surface of the X-ray fluorescence emitter.

8. The improved position calibration structure for an X-ray fluorescence spectrometer according to claim 4, characterized in that: The signal receiving mechanism includes an arc-shaped frame, a supporting arc rod fixedly connected to the inner wall of the arc-shaped frame, a motor support plate fixedly connected to the outer surface of the arc-shaped frame, a second motor fixedly connected to the outer surface of the motor support plate, a receiving component fixedly connected to the output end of the second motor, a ring frame fixedly connected to the outer surface of the support frame, a wiping cotton board fixedly connected to the outer surface of the ring frame, and a notch provided at the bottom of the wiping cotton board.

9. The improved position calibration structure for an X-ray fluorescence spectrometer according to claim 8, characterized in that: The receiving component includes a rotating arm, with a detector fixedly connected to the end of the rotating arm away from the second motor, a receiving plate fixedly connected to the end of the detector away from the rotating arm, a support column fixedly connected to the outer surface of the detector, and a wiping plate fixedly connected to the end of the support column away from the detector.

10. The improved position calibration structure for an X-ray fluorescence spectrometer according to claim 9, characterized in that: The top of the arc-shaped frame is fixedly connected to the outer surface of the X-ray fluorescence emitter, and the end of the rotating arm near the second motor is fixedly connected to the output end of the second motor.

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