Method for cleaning interface cone of inductively coupled plasma mass spectrometer
By immersing the ICP-MS interface cone in NaOH and HCl solutions combined with polishing with fine sandpaper and sponge, the problems of poor cleaning effect and short lifespan of the interface cone were solved, achieving a long lifespan and efficient use of the interface cone.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- 山东省地质矿产勘查开发局第四地质大队
- Filing Date
- 2023-04-26
- Publication Date
- 2026-04-17
AI Technical Summary
In the existing technology, the cleaning method for ICP-MS interface cones has the problems of strong corrosion to nickel cones and poor cleaning effect, resulting in short life of interface cones and limited single use time.
After soaking the interface cone in a 20% NaOH solution for 5 days, rinse it with a 2% HCl solution, then polish it with 2000-grit fine sandpaper and polish it with a white fine sponge, avoiding the cone tip to ensure no damage and achieve thorough surface cleaning.
It extends the service life of the interface cone to 3 years, saves on consumable costs, increases the single-use time to 2000 samples, and is easy to operate.
Abstract
Description
Technical Field
[0001] This invention relates to the field of interface cone cleaning technology, and specifically to a method for cleaning the interface cone of an inductively coupled plasma mass spectrometer. Background Technology
[0002] ICP-MS is an inorganic element and isotope analysis technique developed in the 1980s. It combines the high-temperature ionization characteristics of inductively coupled plasma with the sensitive and rapid scanning advantages of mass spectrometry through a unique interface technology, forming a highly sensitive analysis technique. It can detect all elements from Li to U except for C, O, N, F and inert gases. It features low detection limits, extremely wide dynamic linear range, and fast analysis speed, and has been widely used in geological science, environment, semiconductor, metallurgy, petroleum, biology, and medical analysis.
[0003] The interface cone of ICP-MS is a dual cone: a sampling cone and a truncating cone. The conditions of the sampling cone and the truncating cone affect the signal sensitivity and background level. Deformation of the interface cone surface will cause scattering of the plasma gas flow and the generation of high-level interfering ions during sampling. If the interface cone surface has dents or is not smooth, it is more likely to generate oxide particles. Therefore, the interface cone must be cleaned regularly to keep it clean and smooth.
[0004] Currently, there are many methods for cleaning interface cones, the most common being: 1) immersing the cone in a beaker containing dilute acid or in an ultrasonic water bath or acid bath; 2) wiping with a fine-bristled cloth or polishing powder, etc. The disadvantages of these methods are as follows: Interface taps come in platinum and nickel varieties. Platinum taps are expensive, so we generally purchase nickel taps. Nickel is a relatively reactive metal that readily reacts with acids. Dilute acids are corrosive to nickel taps, and even a 3% concentration of acid can damage the interface tap over time. Additionally, ultrasound can alter the density of the tap material, creating tiny pores that allow liquid to seep in and shorten the tap's lifespan.
[0005] The polishing powder is alumina powder, which easily falls into the conical rim during wiping. Even if the aluminum powder is thoroughly cleaned, the interference from aluminum in the test is difficult to eliminate. Furthermore, a fine-textured cloth is ineffective at removing impurities adsorbed on the surface of the interface cone, resulting in poor cleaning performance. Summary of the Invention
[0006] To address the aforementioned problems, this invention provides a method for cleaning the interface cone of an inductively coupled plasma mass spectrometer, thereby improving the service life and single-use time of the interface cone.
[0007] To achieve the above objectives, the technical solution adopted by the present invention is as follows: A method for cleaning the interface cone of an inductively coupled plasma mass spectrometer includes the following steps: Soak the sampling cone and the severing cone in a 20% NaOH solution for 5 days. Remove them, clean them with deionized water, and let them air dry. Use the rough side of the sandpaper on the polishing board to remove the adsorbed substances from the cone surface, and then use the sponge side of the polishing board to polish the cone surface.
[0008] Furthermore, the specific steps include the following: S1. Remove the sampling cone and snipping cone of the inductively coupled plasma mass spectrometer and immerse them in a 20% NaOH alkaline solution to wet the basic ions adsorbed on the surface of the cone, making them a potential acid and softening them. After 5 days, take them out and put them in a 2% HCl solution for 5 seconds to remove the alkaline solution adhering to the cone surface. Then clean them with deionized water and let them dry. S2. Gently sand the cone surface with the rough side of 2000-grit fine sandpaper on the polishing board. After the adsorbed substances on the cone surface are completely removed, use the fine white sponge side of the polishing board to finely polish the cone surface. Avoid sanding and polishing the cone tip to prevent damage to the cone hole and causing test errors.
[0009] The above solution uses an alkaline impregnation agent that does not damage the cone; it uses a polishing plate with two properties: one side is 2000-grit fine sandpaper to wipe the cone surface, and the other side is a white fine sponge for fine polishing of the cone surface, which increases the service life of the interface cone from 0.5 years to 3 years; this alone can save more than 30,000 yuan in consumable costs per year; at the same time, it increases the single use time of the interface cone from 500 samples to 2000 samples per test, and the operation is simple. Detailed Implementation
[0010] The present invention will now be described in detail with reference to specific embodiments. These embodiments will help those skilled in the art to further understand the present invention, but do not limit the invention in any way. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of the present invention. These all fall within the scope of protection of the present invention. Example 1
[0011] A method for cleaning the interface cone of an inductively coupled plasma mass spectrometer specifically includes the following steps: S1. Remove the sampling cone and snipping cone of the inductively coupled plasma mass spectrometer and immerse them in a 20% NaOH alkaline solution to wet the basic ions adsorbed on the surface of the interface cone, so that they become potential acids and soften them. After 5 days, take them out and put them in a 2% HCl solution for 5 seconds to remove the alkaline solution adhering to the cone surface. Then clean them with deionized water and let them dry. S2. Gently sand the cone surface with the rough side of 2000-grit fine sandpaper. After the adsorbed substances on the cone surface are completely removed, finely polish the cone surface with the fine white sponge side of the polishing board. Avoid sanding and polishing the cone tip to prevent damage to the cone hole and subsequent testing errors. The rough side of the 2000-grit fine sandpaper effectively removes adsorbed substances while preventing damage to the cone surface, while the fine white sponge side provides a fine polish, restoring the cone's original characteristics.
[0012] This invention combines the advantages of nickel's alkali resistance and the strong wettability of alkalis, which can wet the adsorbed basic ions on the interface cone surface, turning the basic ions into potential acids and softening them. Soaking the sampling cone and the cut cone in a 20% NaOH solution for 5 days fully wets the adsorbed basic ions on the interface cone surface, softening them and facilitating complete removal of the adsorbed material during subsequent polishing without damaging the interface cone. A polishing plate with two properties is used: one side is 2000-grit fine sandpaper to wipe the cone surface and remove adsorbed material, and the other side is a fine white sponge for fine polishing of the cone surface.
[0013] The cleaning method of the present invention can extend the service life of the interface cone from 0.5 years to 3 years; this alone can save more than 30,000 yuan in consumable costs per year; at the same time, it increases the single-use time of the interface cone from 500 samples to 2,000 samples per test.
[0014] The specific embodiments of the present invention have been described above. It should be understood that the present invention is not limited to the specific embodiments described above, and those skilled in the art can make various modifications or variations within the scope of the claims, which do not affect the essence of the present invention.
Claims
1. A method for cleaning the interface cone of an inductively coupled plasma mass spectrometer, characterized in that: Includes the following steps: Soak the sampling cone and the severing cone in a 20% NaOH solution for 5 days. Remove them, clean them with deionized water, and let them air dry. Use the rough side of the sandpaper on the polishing board to remove the adsorbed substances from the cone surface, and then use the sponge side of the polishing board to polish the cone surface.
2. The method for cleaning the interface cone of an inductively coupled plasma mass spectrometer as described in claim 1, characterized in that: Specifically, the steps include the following: S1. Remove the sampling cone and snipping cone from the inductively coupled plasma mass spectrometer, immerse them in a 20% NaOH alkaline solution, and after 5 days, take them out and rinse them in a 2% HCl solution for 5 seconds to remove the alkaline solution adhering to the cone surface. Then, clean them with deionized water and let them air dry. S2. Gently sand the cone surface with the rough side of 2000-grit fine sandpaper on the polishing board. After the adsorbed substances on the cone surface are completely removed, use the fine white sponge side of the polishing board to finely polish the cone surface. Avoid sanding and polishing the cone tip to prevent damage to the cone hole and causing test errors.