Receiving baseband evaluation test device

Abstract

The invention discloses a receiving baseband evaluation test device which comprises a test signal generation unit, a time-frequency matching unit, a high-speed interface, a data processing unit, a parameter configuration unit and an upper computer. According to the receiving baseband evaluation test device provided by the invention, any node data of the tested piece can be acquired by adopting the high-speed interface, so that the tested piece can be comprehensively tested; besides, the data processing unit can call the corresponding test algorithm modules according to the selected nodes and can flexibly configure the connection topology between the modules, so that a customized test architecture adaptive to each node of the tested piece is constructed, systematic verification of the whole machine performance of the tested piece can be realized, process depth debugging in the research and development process is improved, and the test efficiency is improved. And the fault diagnosis efficiency and the parameter tuning capability can be improved, and multi-dimensional test support with depth and breadth is provided for the tested piece.

Description

Technical Field

[0001] This invention relates to the field of wireless communication technology, and more particularly to a receiver baseband evaluation and testing device. Background Technology

[0002] The testing device can realize the development, debugging and testing process of baseband equipment during the comprehensive evaluation, testing and R&D process of satellite communication baseband receivers.

[0003] However, existing testing equipment for satellite communication baseband receivers has the following drawbacks: it can only test some of the baseband's performance or functions, which limits its testing capabilities; it only supports the verification of baseband equipment results and does not support in-depth debugging and diagnosis of development problems during the research and development process.

[0004] Therefore, existing technologies still need to be improved and developed. Summary of the Invention

[0005] In view of the shortcomings of the prior art, the purpose of this invention is to provide a receiving baseband evaluation and testing device to solve the problems of the limitations of existing receiving baseband evaluation and testing devices and their lack of support for in-depth debugging and diagnosis of R&D problems during the R&D process.

[0006] The technical solution of the present invention is as follows: A receiver baseband evaluation and testing device includes: a test signal generation unit, a time-frequency matching unit, a high-speed interface, a data processing unit, a parameter configuration unit, and a host computer; wherein, The test signal generation unit is used to connect to the device under test and to generate test signals; The time-frequency matching unit is connected to the data processing unit and is used to synchronize the clock of the data processing unit with the data rate of the test data of the device under test. The data processing unit, connected to the host computer, is used to call the corresponding test algorithm module according to the data acquisition node, configure the connection order of each algorithm module, process the test data, and output the data processing result to the host computer. The high-speed interface is used to connect the satellite baseband to the time-frequency matching unit, and is used to collect data from a designated node of the device under test and transmit it to the time-frequency matching unit. A parameter configuration unit, connected to the test signal generation unit and the data processing unit, is used to dynamically set parameters; The host computer and the data processing unit are used to perform real-time analysis of the data processing results, and to test and evaluate the data processing results and generate single or continuous test reports.

[0007] In a further embodiment of the present invention, the test signal generation unit includes: a local oscillator source, a clock configuration module, a data source, a frame adaptation module, a channel coding module, a DVB modulation module, an OFDM modulation module, a frequency-phase-amplitude adjustment module, and a digital-to-analog converter module; wherein, The local oscillator is connected to the clock configuration module and the device under test respectively, and is used to generate clock signals; The clock configuration module is connected to the digital-to-analog conversion module and is used to generate a data processing clock; The frame adaptation module is connected to the data source and the channel coding module, and is used for data framing and padding. It can be configured into a DVB-S2 / X baseband frame structure or an OFDM baseband frame structure according to user requirements. The channel coding module is connected to the DVB modulation module and the OFDM modulation module respectively, and is used to select the coding mode and configure the code rate and code length; wherein, the channel coding module supports the concatenation of BCH and LDPC under the DVB-S2 / X system; The frequency-phase-amplitude adjustment module is connected to the digital-to-analog conversion module and is used to add frequency offset, phase offset and adjust the amplitude of the transmitted signal according to debugging requirements; The digital-to-analog conversion module is connected to the clock configuration module, the DVB modulation module, the OFDM modulation module, the frequency-phase-amplitude adjustment module, and the device under test, respectively, and is used to convert the digital signal generated by the DVB modulation module or the OFDM modulation module into an analog signal, modulate it to the intermediate frequency, and output it to the satellite baseband.

[0008] In a further embodiment of the present invention, the data processing unit includes: a data stream connection configuration module, a data interface module, an automatic gain control module, a filtering module, a frequency offset adjustment module, a baseband frame parsing module, a deinterleaving module, a demodulation module, a time synchronization module, an equalization module, a frame synchronization module, a phase synchronization module, a carrier recovery module, a fine frequency offset synchronization module, a descrambling module, and a decoding module; wherein, The data stream connection configuration module is connected to the frequency offset adjustment module, the baseband frame parsing module, the deinterleaving module, the demodulation module, the time synchronization module, the equalization module, the frame synchronization module, the phase synchronization module, the carrier recovery module, the fine frequency offset synchronization module, the descrambling module, and the decoding module, respectively. It is used to call the corresponding test algorithm module according to the data acquisition node and configure the connection order of each algorithm module. The filtering module is connected to the time-frequency matching unit and is used to provide low-pass filtering function; The automatic gain control module is connected between the filtering module and the frequency offset adjustment module and is used to adjust the gain; The interface module is connected to the frequency offset adjustment module, the baseband frame parsing module, the deinterleaving module, the demodulation module, the time synchronization module, the equalization module, the frame synchronization module, the phase synchronization module, the carrier recovery module, the fine frequency offset synchronization module, the descrambling module, and the decoding module, respectively, and is used to output the data processing results.

[0009] In a further embodiment of the present invention, the data flow connection configuration module includes: a branching interface, a combining interface, an input switch array, an output switch array, and a data flow sequence switch matrix; The branch interface is connected to the input switch array and is used to receive the test data; The combining interface is connected to the output switch array and is used to output the data processing result; The data stream sequential switch matrix is ​​connected to the input switch array, the output switch array, the frequency offset adjustment module, the baseband frame parsing module, the deinterleaving module, the demodulation module, the time synchronization module, the equalization module, the frame synchronization module, the phase synchronization module, the carrier recovery module, the fine frequency offset synchronization module, the descrambling module, and the decoding module, respectively. The input switch array and the output switch array are respectively connected to the frequency offset adjustment module, the baseband frame parsing module, the deinterleaving module, the demodulation module, the time synchronization module, the equalization module, the frame synchronization module, the phase synchronization module, the carrier recovery module, the fine frequency offset synchronization module, the descrambling module, and the decoding module; The input switch array, the output switch array, and the data stream sequence switch matrix are linked to call the corresponding test algorithm module according to the data acquisition node, and the connection order of each algorithm module is configured.

[0010] In a further embodiment of the present invention, the time-frequency matching unit includes: a first integrated interface driving module, a control information framing module, a data buffer module, and a time-frequency matching module; wherein, The first integrated interface driver module is connected to the high-speed interface; The control information framing module is connected to the first integrated interface driver module and the parameter configuration unit respectively, and is used to frame the control information from the parameter configuration unit according to the control protocol and send it to the device under test via the first integrated interface driver module. The data caching module is connected to the first integrated interface driver module and is used to cache the collected data of the device under test. The time-frequency matching module is connected to the data processing unit and is used to complete the frequency matching between the cached data and the parallel algorithm module by controlling the duty cycle of the enable signal and the parallel data bit filling, based on the sampling clock of the device under test and in combination with the local clock rate.

[0011] In a further embodiment of the present invention, the high-speed interface includes: a second integrated interface driver module, a test data acquisition module, a control information parsing module, and an acquisition parameter configuration module; wherein, The second integrated interface driver module is connected to the first integrated interface driver module and is used to provide high-speed interface driver for the device under test; The test data acquisition module is connected to the second integrated interface driver module and is used to acquire data from any node inside the test component. The control information parsing module is connected to the second integrated interface driver module and is used to parse the control information sent by the parameter configuration unit; The parameter acquisition configuration module is connected to the second integrated interface driver module and the time-frequency matching unit respectively, and is used to perform parameter distribution and configuration operations.

[0012] In a further embodiment of the present invention, the host computer includes: a debugging and analysis area, a function setting area, and a test and evaluation area; wherein, The debugging and analysis area is used for visualization of time-domain and logic analysis, spectrum statistics, and custom algorithm simulation capabilities to assist in real-time debugging during the development phase. The function setting area is generally used for displaying and dynamically adjusting parameters; The test evaluation area is used to generate test reports and monitor the status of the device under test in real time.

[0013] In a further embodiment of the present invention, the debugging and analysis area includes: a signal logic analysis module, a signal spectrum analysis module, a data calculation and statistics module, and a custom algorithm simulation module; wherein, The signal logic analysis module is used for real-time time-domain logic analysis, adjusting the data depth of the display window, and diagnosing timing logic errors of the device under test. The signal spectrum analysis module is used to perform frequency domain characteristic analysis on the measured data; The data calculation and statistics module is used to provide calculation functions to perform real-time analysis of test data; The custom algorithm simulation module is used to run custom algorithms and realize real-time comparison between actual hardware operating data and theoretical simulation results.

[0014] In a further embodiment of the present invention, the test evaluation area includes status monitoring information and test reports; wherein, the status monitoring information includes demodulation and decoding monitoring information and modulation and coding monitoring information.

[0015] In a further embodiment of the present invention, the function setting area includes: basic matching setting, data processing flow matching setting, function module parameter configuration and configuration information display.

[0016] This invention provides a receiver baseband evaluation and testing device, comprising: a test signal generation unit, a time-frequency matching unit, a high-speed interface, a data processing unit, a parameter configuration unit, and a host computer. The receiver baseband evaluation and testing device provided by this invention uses a high-speed interface to collect data from any node of the device under test (DUT), thereby enabling comprehensive testing of the DUT. Furthermore, the data processing unit can call corresponding test algorithm modules based on selected nodes and flexibly configure the connection topology between modules, thereby constructing a customized test architecture adapted to each node of the DUT. This allows for systematic verification of the overall performance of the DUT, improves the depth of debugging during the R&D process, enhances fault diagnosis efficiency and parameter optimization capabilities, and provides multi-dimensional testing support for the DUT with both depth and breadth. Attached Figure Description

[0017] To more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on the structures shown in these drawings without creative effort.

[0018] Figure 1 This is a schematic block diagram of a receiving baseband evaluation and testing device in one embodiment of the present invention.

[0019] Figure 2 This is a functional module structure diagram of a receiving baseband evaluation and testing device in one embodiment of the present invention.

[0020] Figure 3 This is a schematic diagram of the data processing unit selection and connectivity control principle in one embodiment of the present invention.

[0021] Figure 4 This is a test flowchart of a receiving baseband evaluation test device in one embodiment of the present invention.

[0022] The labels in the attached diagram are as follows: 100, Test signal generation unit; 110, Local oscillator source; 120, Clock configuration module; 130, Data source; 140, Frame adaptation module; 150, Channel coding module; 160, DVB modulation module; 170, OFDM modulation module; 180, Frequency-phase-amplitude adjustment module; 190, Digital-to-analog conversion module; 200, Time-frequency matching unit; 210, First integrated interface driver module; 220, Control information framing module; 230, Data buffer module; 240, Time-frequency matching module; 300, High-speed interface; 310, Second integrated interface driver module; 320, Test data acquisition module; 330, Control information parsing module; 340, Acquisition parameter configuration module; 400, Data processing unit; 401, Data stream connection configuration module; 4011, Splitting interface; 4012, Combining interface; 4013, Input switch array. Columns; 4014, Output Switch Array; 4015, Data Stream Sequential Switch Matrix; 402, Data Interface Module; 403, Automatic Gain Control Module; 404, Filtering Module; 405, Frequency Offset Adjustment Module; 406, Baseband Frame Parsing Module; 407, Deinterleaving Module; 408, Demodulation Module; 409, Time Synchronization Module; 410, Frame Synchronization Module; 411, Equalization Module; 412, Phase Synchronization Module; 413, Carrier Recovery Module; 414, Fine Frequency Offset Synchronization Module; 415, Descrambling Module; 416, Decoding Module; 500, Parameter Configuration Unit; 600, Host Computer; 610, Debugging and Analysis Area; 611, Signal Logic Analysis Module; 612, Signal Spectrum Analysis Module; 613, Data Calculation and Statistics Module; 614, Custom Algorithm Simulation Module; 620, Function Setting Area; 630, Test and Evaluation Area; 700, Device Under Test. Detailed Implementation

[0023] This invention provides a baseband receiver evaluation and testing apparatus. To make the objectives, technical solutions, and effects of this invention clearer and more explicit, the invention will be further described in detail below with reference to the accompanying drawings and examples. It should be understood that the specific embodiments described herein are merely illustrative of the invention and are not intended to limit the invention.

[0024] In the implementation methods and claims, unless otherwise specified in the text, the terms "a," "an," "the," and "the" may also include plural forms. If the embodiments of the present invention involve descriptions of "first," "second," etc., such descriptions are for descriptive purposes only and should not be construed as indicating or implying their relative importance or implicitly specifying the number of indicated technical features. Therefore, a feature defined with "first" or "second" may explicitly or implicitly include at least one of those features.

[0025] It should be further understood that the term "comprising" as used in this specification means the presence of the stated features, integers, steps, operations, elements, and / or components, but does not exclude the presence or addition of one or more other features, integers, steps, operations, elements, components, and / or groups thereof. It should be understood that when an element is referred to as "connected" or "coupled" to another element, it can be directly connected or coupled to the other element, or there may be intermediate elements present. Furthermore, "connected" or "coupled" as used herein can include wireless connections or wireless coupling. The term "and / or" as used herein includes all or any of the units and all combinations thereof of one or more associatedly listed items.

[0026] It will be understood by those skilled in the art that, unless otherwise defined, all terms used herein (including technical and scientific terms) have the same meaning as commonly understood by one of ordinary skill in the art to which this invention pertains. It should also be understood that terms such as those defined in general dictionaries should be understood to have the same meaning as in the context of the prior art, and should not be interpreted in an idealized or overly formal sense unless specifically defined as herein.

[0027] Furthermore, the technical solutions of the various embodiments can be combined with each other, but only if they are feasible for those skilled in the art. If the combination of technical solutions is contradictory or cannot be implemented, it should be considered that such combination of technical solutions does not exist and is not within the scope of protection claimed by this invention.

[0028] Please also refer to Figures 1 to 4 The present invention provides a preferred embodiment of a receiver baseband evaluation and testing device.

[0029] In some embodiments, such as Figure 1As shown, the present invention provides a receiving baseband evaluation and testing device, which includes: a test signal generation unit 100, a time-frequency matching unit 200, a high-speed interface 300, a data processing unit 400, a parameter configuration unit 500, and a host computer 600. The test signal generation unit 100 is connected to the device under test (DUT) 700 and is used to generate test signals; the time-frequency matching unit 200 is connected to the data processing unit 400 and is used to synchronize the clock of the data processing unit 400 with the data rate of the test data of the DUT 700; the data processing unit 400 is connected to the host computer 600 and is used to call the corresponding test algorithm module according to the data acquisition node, configure the connection order of each algorithm module, process the test data, and output the data processing result to the host computer 600. 00; The high-speed interface 300 is used to connect the satellite baseband to the time-frequency matching unit 200, and to collect data from a designated node of the device under test 700 and transmit it to the time-frequency matching unit 200; The parameter configuration unit 500 is connected to the test signal generation unit 100 and the data processing unit 400, and is used to dynamically set parameters; The host computer 600 is connected to the data processing unit 400, and is used to perform real-time analysis of the data processing results, and to perform test evaluation of the data processing results and generate single or continuous test reports.

[0030] In this embodiment, the receiving baseband evaluation and testing device consists of two parts: an FPGA hardware platform and a host computer 600. The test signal generation unit 100, time-frequency matching unit 200, high-speed interface 300, data processing unit 400, and parameter configuration unit 500 are integrated on a single FPGA hardware platform. The device under test 700 can be a satellite baseband, etc. Please refer to [the relevant documentation / reference]. Figure 2 The test device 700 contains modules 1, 2, 3, 4, 5, 6, 7, 8, and N to be tested. The receiving baseband evaluation and testing device provided by this invention can realize the debugging, overall performance verification, and factory testing of the test device 700, such as satellite communication baseband equipment, during the development process, and achieve full-process closed-loop testing support.

[0031] The test signal is an intermediate frequency (IF) signal suitable for testing. This IF signal is input to the device under test (DUT) 700, and the DUT 700 outputs test data. The test signal generation unit 100 can generate test signals for both Orthogonal Frequency Division Multiplexing (OFDM) and the second generation of Digital Video Broadcasting (DVB-S2 / X) systems, adapting to the two commonly used systems in satellite baseband, thus making the test device versatile. Orthogonal Frequency Division Multiplexing is a multi-carrier modulation technique used to transmit data in wireless and digital communication systems. The second generation of Digital Video Broadcasting (DVB-S2 / X) aims to improve channel transmission capacity and expand service coverage.

[0032] The high-speed interface 300 is connected to the time-frequency matching unit 200, which collects data from designated nodes of the device under test 700 and transmits it to the time-frequency matching unit 200, thereby enabling the acquisition of data from any node of the device under test 700. The time-frequency matching unit 200 is mainly used to synchronize the data processing clock with the data rate of the test data of the device under test 700. The parameter configuration unit 500 can dynamically set detailed parameters such as signal system, sampling frequency, modulation method, symbol rate, and frame structure. The data processing unit 400 integrates a baseband algorithm module library, supports user-defined algorithm module connection relationships and selection, and realizes in-depth data processing. In-depth processing refers to the multi-angle evaluation of the test data through the selection and processing order settings of various algorithm modules of the data processing unit 400, such as frequency offset measurement, frame synchronization detection, spectrum analysis, phase measurement, etc. of the received data. It can not only evaluate the final performance of the receiver, but also evaluate the intermediate state of the receiver development stage and the signals of individual nodes inside the receiver.

[0033] The host computer 600 is connected to the data processing unit 400 and can debug, analyze, and evaluate the data processing results output by the data processing unit 400, and output test results. It can automatically generate test reports. The host computer 600 supports single and continuous test report modes. Users can control the timing parameter changes of the test signal generation unit 100 through software programming to obtain dynamic and continuous test results, thereby constructing a complete automated test process and efficiently outputting reports.

[0034] The parameter matching unit 200 serves as a key interface between the software and the FPGA hardware. It is responsible for receiving configuration parameters issued by the host computer 600, distributing the configuration data to various functional units inside the FPGA in real time through register mapping, ensuring that software instructions are accurately applied to the underlying hardware logic, and providing the hardware module with core control capabilities for initialization and runtime parameter updates.

[0035] In the above technical solution, the receiving baseband evaluation and testing device provided by the present invention uses a high-speed interface 300 to collect data from any node of the device under test 700, thereby enabling comprehensive testing of the device under test 700. Furthermore, the data processing unit 400 can call the corresponding test algorithm module according to the selected node and flexibly configure the connection topology between the test algorithm modules, thereby constructing a customized test architecture adapted to each node of the device under test 700. This enables systematic verification of the overall performance of the device under test 700, improves the depth of debugging during the R&D process, and enhances fault diagnosis efficiency and parameter tuning capabilities, providing multi-dimensional testing support for the device under test 700 with both depth and breadth. The host computer 600 can perform debugging, analysis, and evaluation based on the data processing results and generate a test report for user reference.

[0036] In some embodiments, such as Figure 1 and Figure 2As shown, the test signal generation unit 100 includes: a local oscillator 110, a clock configuration module 120, a data source 130, a frame adaptation module 140, a channel coding module 150, a DVB modulation module 160, an OFDM modulation module 170, a frequency-phase-amplitude adjustment module 180, and a digital-to-analog conversion module 190. The local oscillator 110 is connected to the clock configuration module 120 and the device under test 700 to generate a clock signal. The clock configuration module 120 is connected to the digital-to-analog converter module 190 to generate a data processing clock. The frame adaptation module 140 is connected to the data source 130 and the channel coding module 150 to perform data framing and padding, configuring it into a DVB-S2 / X baseband frame structure or an OFDM baseband frame structure according to user requirements. The channel coding module 150 is connected to the DVB modulation module 160 and the OFDM modulation module 170 to select the coding mode and configure the code rate and code length. The channel coding module 150 supports Bose-Chaudhuri-Hocquenghem Code (BCH) and Low-Density Parity-Check Code (LDPC) under the DVB-S2 / X system. Code (LDPC) cascaded; the frequency, phase, and amplitude adjustment module 180 is connected to the digital-to-analog converter module 190, and is used to add frequency offset, phase offset, and adjust the amplitude of the transmitted signal according to debugging requirements; the digital-to-analog converter module 190 is connected to the clock configuration module 120, the DVB modulation module 160, the OFDM modulation module 170, the frequency, phase, and amplitude adjustment module 180, and the device under test 700, respectively, and is used to convert the digital signal generated by the DVB modulation module 160 or the OFDM modulation module 170 into an analog signal, modulate it to the intermediate frequency, and output it to the satellite baseband.

[0037] In this embodiment, the test signal generation unit 100 can generate the test signal required by the user based on the selection of the signal system and the configuration of different parameters.

[0038] The local oscillator 110 uses a high-performance 10MHz local oscillator as input and generates a stable 250MHz clock signal through a phase-locked loop as the system clock. The clock configuration module 120 uses a 250MHz clock as input and employs a high-bit-width numerically controlled oscillator (NCO) technology. The user configures the step value to dynamically generate the data processing clock. This data processing clock step is used by the test signal generation unit and can also be used by the data processing unit 400. The data source 130 has a built-in fixed data sequence, and external data can be input in text form through parameter configuration information.

[0039] The frame adaptation module 140 is used for data framing and padding, and can be configured into a DVB-S2 / X baseband frame structure or an OFDM baseband frame structure according to user requirements. The channel coding module 150 includes BCH coding, LDPC coding, and convolutional code coding functions, and can flexibly select the coding mode and configure the code rate and code length according to requirements, supporting the concatenation of BCH and LDPC under the DVB-S2 / X system. The DVB modulation module 160 runs when configured for the DVB-S2 / X system, and includes bit interleaving, constellation mapping, physical layer encapsulation, pilot insertion, baseband shaping filtering, and other processing. The OFDM modulation module 170 runs when configured for the OFDM system, and includes sub-serial-to-parallel conversion, subcarrier mapping, inverse fast Fourier transform (IFFT) transformation, cyclic prefix addition, windowing processing, baseband shaping filtering, and other processing. Through the frequency, phase, and amplitude adjustment module 180, users can independently add frequency offset, phase offset, and adjust the amplitude of the transmitted signal according to debugging needs. The digital-to-analog converter module 190 can convert digital signals into analog signals and modulate them to the intermediate frequency output. It can also configure the corresponding transmission frequency point according to the intermediate frequency input point of the baseband under test.

[0040] In some embodiments, such as Figure 1 and Figure 2As shown, the data processing unit 400 includes: a data stream connection configuration module 401, a data interface module 402, an automatic gain control (AGC) module 403, a filtering module 404, a frequency offset adjustment module 405, a baseband frame parsing module 406, a deinterleaving module 407, a demodulation module 408, a time synchronization module 409, an equalization module 411, a phase synchronization module 412, a carrier recovery module 413, a fine frequency offset synchronization module 414, a descrambling module 415, and a decoding module 416. The data stream connection configuration module 401 is connected to the frequency offset adjustment module 405, the baseband frame parsing module 406, the deinterleaving module 407, the demodulation module 408, the time synchronization module 409, the frame synchronization module 410, the equalization module 411, the phase synchronization module 412, the carrier recovery module 413, the fine frequency offset synchronization module 414, the descrambling module 415, and the decoding module 416, respectively. It is used to call the corresponding test algorithm module according to the data acquisition node and configure the connection order of each test algorithm module. The filtering module 404 is connected to the time-frequency matching unit 200. The automatic gain control module 403 is used to provide low-pass filtering; it is connected between the filtering module 404 and the frequency offset adjustment module 405 to adjust the gain; the interface module is connected to the frequency offset adjustment module 405, the baseband frame parsing module 406, the deinterleaving module 407, the demodulation module 408, the time synchronization module 409, the frame synchronization module 410, the equalization module 411, the phase synchronization module 412, the carrier recovery module 413, the fine frequency offset synchronization module 414, the descrambling module 415, and the decoding module 416 respectively, and is used to output the data processing results.

[0041] In this embodiment, the data processing unit 400 includes multiple standard algorithm processing modules, which can be used to perform real-time algorithm processing on test data for analyzing the performance of the baseband under test and locating problems during debugging. The data processing unit 400 can flexibly select the algorithm processing modules to use and can configure the order of data streams online, providing users with a flexible debugging solution.

[0042] The data processing unit 400 includes a data stream connection configuration module 401, a data interface module 402, an automatic gain control module 403, a filtering module 404, a frequency offset adjustment module 405, a baseband frame parsing module 406, a deinterleaving module 407, a demodulation module 408, a time synchronization module 409, a frame synchronization module 410, an equalization module 411, a phase synchronization module 412, a carrier recovery module 413, a fine frequency offset synchronization module 414, a descrambling module 415, and a decoding module 416.

[0043] The filtering module 404 provides low-pass filtering functionality, with configurable parameters such as filter order and cutoff frequency. This module is only enabled when active and is skipped by default. The automatic gain control module 403 provides automatic gain adjustment functionality, with settable signal amplitude. This module is also only enabled when active and is skipped by default. The frequency offset adjustment module 405, time synchronization module 409, carrier recovery module 413, fine frequency offset synchronization module 414, phase synchronization module 412, baseband frame parsing module 406, deinterleaving module 407, demodulation module 408, frame synchronization module 410, equalization module 411, descrambling module 415, and decoding module 416 are commonly used algorithm modules for satellite communication baseband systems and will not be described in detail here. All of the above algorithm modules are compatible with DVB-S2 / X and OFDM systems and provide multiple configurable algorithm schemes, allowing users to flexibly select according to their needs. Users can flexibly combine algorithm modules and customize the data stream processing order through the data stream connection configuration module 401 to perform in-depth real-time debugging of the device under test 700.

[0044] In some embodiments, such as Figure 2 and Figure 3As shown, the data stream connection configuration module 401 includes: a splitter interface 4011, a combiner interface 4012, an input switch array 4013, an output switch array 4014, and a data stream sequence switch matrix 4015. The splitter interface 4011 is connected to the input switch array 4013 and is used to receive the test data. The combiner interface 4012 is connected to the output switch array 4014 and is used to output the data processing result. The data stream sequence switch matrix 4015 is connected to the input switch array 4013, the output switch array 4014, the frequency offset adjustment module 405, the baseband frame parsing module 406, the deinterleaving module 407, the demodulation module 408, the time synchronization module 409, the equalization module 411, the phase synchronization module 412, and the carrier recovery module 4015. The frequency offset adjustment module 413, the fine frequency offset synchronization module 414, the descrambling module 415, and the decoding module 416 are connected; the input switch array 4013 and the output switch array 4014 are respectively connected to the frequency offset adjustment module 405, the baseband frame parsing module 406, the deinterleaving module 407, the demodulation module 408, the time synchronization module 409, the equalization module 411, the phase synchronization module 412, the carrier recovery module 413, the fine frequency offset synchronization module 414, the descrambling module 415, and the decoding module 416; the input switch array 4013 and the output switch array 4014 are linked with the data stream sequence switch matrix 4015 to call the corresponding test algorithm module according to the data acquisition node and configure the connection order of each algorithm module.

[0045] In this embodiment, the data flow connection configuration module 401 consists of a branching interface 4011, a combining interface 4012, an input switch array 4013, and an output switch array 4014. The input switch array 4013 and the output switch array 4014 are composed of several gating components. Each gating component has three connection points, for example, points A, B, and C, and four connection methods: AB connection, BC connection, CA connection, and no connection between them, thus forming a flexible gating switch matrix. The input switch array 4013 and the output switch array 4014 have the same function. The data flow sequential switch matrix 4015 includes several switch nodes, enabling the connection and disconnection between the input switch array 4013, the output switch array 4014, and the algorithm module.

[0046] The branch interface 4011 is used to receive test data, inputting the test data to each gating component of the input switch array 4013. The combiner interface 4012 is connected to each gating component of the output switch array 4014, and can output the data processing results to the host computer 600.

[0047] In this embodiment, the input switch array 4013 is connected to the input terminal of the algorithm module, and the output switch array 4014 is connected to the output terminal of the algorithm module. The data flow sequence switch matrix 4015 is linked with the input / output switch matrix. When the input and output of each algorithm module can form a path through the input / output switch matrix, the data flow sequence switch matrix 4015 automatically connects the corresponding node. This establishes a path for the connection of the algorithm modules. The data processing unit 400, through the selection of various baseband processing algorithm modules and the flexible configuration of the connection order between algorithm modules, can adapt to the reception testing and debugging requirements of corresponding signal systems. The host computer 600 is responsible for debugging, analyzing, and evaluating the data processing results and finally outputting the test results. In addition, the data processing unit 400 can call the corresponding test algorithm module according to the selected node and can flexibly configure the connection topology between modules, thereby constructing a customized test architecture adapted to each node of the device under test 700. In this way, not only is the overall performance of the satellite baseband system verified systematically, but it can also serve R&D and debugging scenarios: by dynamically switching data acquisition nodes, abnormal links inside the baseband can be accurately located, significantly improving fault diagnosis efficiency and parameter optimization capabilities, and providing multi-dimensional testing support with both depth and breadth for the baseband under test.

[0048] Taking four algorithm modules as an example (algorithm module 1, algorithm module 2, algorithm module 3, and algorithm module 4), each algorithm module has an input terminal In and an output terminal Out. The corresponding input switch array 4013 and output switch array 4014 each have four selection switch components. The data stream sequence switch array has four signal paths (C1, C2, C3, C4) horizontally and four signal paths (R1, R2, R3, R4) vertically. By configuring the input switch array 4013 and the output switch array 4014, the connection path between algorithm modules 1, 2, and 3 can be established, thus not only selecting the algorithm modules used but also determining their sequential order.

[0049] In some embodiments, such as Figure 1 and Figure 2As shown, the time-frequency matching unit 200 includes: a first integrated interface driver module 210, a control information framing module 220, a data caching module 230, and a time-frequency matching module 240. The first integrated interface driver module 210 is connected to the high-speed interface 300; the control information framing module 220 is connected to both the first integrated interface driver module 210 and the parameter configuration unit 500, and is used to frame control information from the parameter configuration unit 500 according to the control protocol and send it to the device under test 700 via the first integrated interface driver module 210; the data caching module 230 is connected to the first integrated interface driver module 210 and is used to cache the acquired data from the device under test 700; the time-frequency matching module 240 is connected to the data processing unit 400 and is used to match the frequency of the cached data with that of the parallel algorithm module by controlling the duty cycle of the enable signal and the parallel data bit filling, based on the sampling clock of the device under test 700 and in conjunction with the local clock rate.

[0050] In this embodiment, the time-frequency matching unit 200 includes a first integrated interface driving module 210, a control information framing module 220, a data caching module 230, and a time-frequency matching module 240, which can process the data and control interface with the device under test 700 and complete the time-frequency matching.

[0051] The first integrated interface driver module 210, consistent with the driver provided to the device under test (DUT) 700, supports multiple commonly used high-speed communication interfaces. The control information framing module 220 frames the control information from the parameter configuration module according to the control frame protocol and sends it to the DUT 700. The control information includes data acquisition mode, acquisition enable signal, trigger signal, and acquisition data depth. The acquisition mode is divided into continuous acquisition mode and burst acquisition mode, with the data acquisition depth parameter taking effect in burst mode. The data caching module 230 caches the acquired data from the DUT 700. The time-frequency matching module 240 adapts to the 8-channel parallel architecture of the local algorithm module. Based on the sampling clock of the DUT 700 and the local clock rate, the module controls the duty cycle of the enable signal and the parallel data bit filling to achieve frequency matching between the cached data and the parallel algorithm module.

[0052] In some embodiments, such as Figure 1 and Figure 2As shown, the high-speed interface 300 includes: a second integrated interface driver module 310, a test data acquisition module 320, a control information parsing module 330, and a parameter acquisition configuration module 340. The second integrated interface driver module 310 is connected to the first integrated interface driver module 210 and is used to provide high-speed interface 300 driving for the device under test 700. The test data acquisition module 320 is connected to the second integrated interface driver module 310 and is used to acquire data from any node within the device under test 700. The control information parsing module 330 is connected to the second integrated interface driver module 310 and is used to parse the control information sent by the parameter configuration unit 500. The parameter acquisition configuration module 340 is connected to both the second integrated interface driver unit 300 and the time-frequency matching module 240 and is used to perform parameter distribution and configuration operations.

[0053] In this embodiment, the high-speed interface 300 consists of a second integrated interface driver module 310, a test data acquisition module 320, a control information parsing module 330, and an acquisition parameter configuration module 340. It can provide the test data frame protocol format for the device under test 700. The device under test 700 only needs to connect the data of the node under test to the test data acquisition module 320 according to the data frame protocol format, and then the device under test 700 can acquire data from the specified node through control commands and transmit it to the data processing unit 400 for analysis and debugging.

[0054] The test data acquisition module 320 is used to acquire data from any node within the program of the device under test (DUT) 700. It supports flexible configuration of multiple parameters such as bit width, depth, and trigger signal, and can select any test node for test data acquisition on the baseband of the satellite under test. It also supports parallel test data acquisition, supporting up to 32-bit data. After buffering and parallel-to-serial conversion, the data is sent to the second integrated interface driver module 310 for transmission. The second integrated interface driver module 310 provides drivers for various commonly used high-speed interfaces 300 for the DUT 700. Supported interface types include 10 / 100BASE-T Ethernet interface, 1000BASE-T Ethernet interface, Small Form-factor Pluggable Plus (SFP) interface, Quad Small Form-factor Pluggable Plus (QSFP) interface, and Optical-Copper Link (OCuLink) high-speed direct connection interface, adapted according to the hardware interface of the baseband receiver under test. Among them, the 10 / 100BASE-T Ethernet interface has a communication rate of up to 10Mbps / 100Mbps; the 1000BASE-T Ethernet interface has a communication rate of up to 1Gbps; the SFP+ interface has a transmission rate of up to 10Gbps; the QSFP+ interface has a transmission rate of up to 40Gbps; and the Oculink high-speed direct connection interface has a transmission rate of up to 100Gbps.

[0055] The control information parsing module 330 parses the control information from the satellite baseband test device according to the control frame protocol. The control information includes data acquisition mode, acquisition enable signal, trigger signal, acquisition data depth, etc. The acquisition mode is divided into continuous acquisition mode and burst acquisition mode, in which the data acquisition depth parameter takes effect in burst mode. The acquisition parameter configuration module 340 is used to perform parameter distribution and configuration operations.

[0056] It should be noted that in continuous acquisition mode, it is necessary to consider whether the transmission rate of the currently selected test data interface meets the user's requirements. The following condition must be met: the test data sampling clock frequency multiplied by the test data bit width is less than the maximum transmission rate of the current test data interface.

[0057] In some embodiments, such as Figure 1 and Figure 2As shown, the host computer 600 includes a debugging and analysis area 610, a function setting area 620, and a test and evaluation area 630. The debugging and analysis area 610 is used for visualizing time-domain and logic analysis, spectrum statistics, and custom algorithm simulation capabilities to assist in real-time debugging during the development phase. The function setting area 620 is used to display and dynamically adjust parameters. The test and evaluation area 630 is used to generate test reports and monitor the status of the device under test 700 in real time.

[0058] In this embodiment, the host computer 600 includes a debugging and analysis area 610, a function setting area 620, and a test and evaluation area 630. The test and evaluation area 630 performs a full-function performance evaluation, automatically generates a test report, and monitors the status of the device under test 700 in real time. It includes two parts of information: status monitoring information and a test report. The status monitoring information has two types: demodulation and decoding monitoring information and modulation and coding monitoring information. The demodulation and decoding monitoring information displays the signal processing modules used by the receiver and their connection order in icon form. The status is displayed in the upper right corner of the page, and the status information includes frame synchronization lock, carrier lock, time synchronization lock, power display, frequency offset, total number of frames, number of misaligned frames, frame error rate (FER), modulation and coding combination (MODCOD), normalized signal-to-noise ratio (Eb / N0), etc.

[0059] Modulation and coding monitoring information is displayed in the form of icons showing the signal processing modules used at the signal generation end and their connection order. The status is displayed in the upper right corner of the page. The status information includes the baseband waveform display, MODCOD, Doppler, noise, intermediate frequency output switch, intermediate frequency point, symbol rate, output power, etc.

[0060] The test report has two reporting modes: a single test report and a customized continuous test report. A single test report refers to the test items configured by the user through the software. During the hardware execution test process, the software monitors the system status in real time, extracts relevant data for the test items, and automatically compiles and generates a single test report.

[0061] Customized continuous test reports refer to the process where, after the software is set to this mode, the test signal generation unit 100 (i.e., the excitation source of the device under test 700) generates customized continuous test reports. Examples include testing the frame error rate (FER) of the device under test 700 at different symbol rates and the signal-to-noise ratio (Eb / N0) of the device under test 700 at different transmit powers. Specifically, in real-time, the parameter configuration module needs to set the test items to be displayed in the test report, configure the range and step values ​​of the relevant variables of the excitation source, and set the duration of each test segment. The excitation source automatically and continuously adjusts the parameters according to the configuration to perform the test. Finally, the test data is integrated and output in a structured table format to form a complete customized continuous test report.

[0062] In some embodiments, such as Figure 1 and Figure 2 As shown, the debugging and analysis area 610 includes: a signal logic analysis module 611, a signal spectrum analysis module 612, a data calculation and statistics module 613, and a custom algorithm simulation module 614. Specifically, the signal logic analysis module 611 is used for real-time time-domain logic analysis, adjusting the data depth of the display window, and diagnosing timing logic errors in the device under test 700; the signal spectrum analysis module 612 is used for frequency domain characteristic analysis of the tested data; the data calculation and statistics module 613 provides calculation functions for real-time analysis of the test data; and the custom algorithm simulation module 614 is used to run custom algorithms to achieve real-time comparison between actual hardware operating data and theoretical simulation results.

[0063] In this embodiment, the debugging and analysis area 610 is used to cooperate with the hardware system to perform comprehensive debugging and analysis on the device under test 700, providing multi-dimensional signal processing capabilities, including visualized time-domain / logic analysis, spectrum statistics, and custom algorithm simulation capabilities, to assist in real-time debugging during the development phase. The debugging and analysis area 610 consists of a signal logic complex analysis module, a signal spectrum analysis module 612, a data calculation and statistics module 613, and a custom algorithm simulation module 614. The signal logic analysis module 611 enables real-time time-domain logic analysis, supports flexible configuration of trigger signal forms (such as edge, pulse, or custom modes), and allows adjustment of the display window data depth. This module captures timing characteristics with high precision, enabling rapid diagnosis of timing logic errors in the device under test 700 and significantly improving fault location efficiency. The signal spectrum analysis module 612 possesses the basic functions of a spectrum analyzer (such as FFT transformation, window function selection, and amplitude / phase spectrum display), supporting frequency domain characteristic analysis of the measured signal (e.g., noise distribution, harmonic distortion detection). The data calculation and statistics module 613 provides basic statistical operation functions, including summation, mean, standard deviation, and variance calculations, facilitating real-time analysis of test data by users. The custom algorithm simulation module 614 can be built based on the MATLAB engine, allowing users to import and run custom algorithms to achieve real-time comparison between actual hardware operating data and theoretical simulation results (such as algorithm convergence verification or error analysis), thus enabling users to analyze and evaluate the algorithm of the device under test 700.

[0064] In some embodiments, such as Figure 1 and Figure 2 As shown, the function setting area 620 includes: basic matching setting, data processing flow matching setting, function module parameter configuration and configuration information display.

[0065] In this embodiment, the function setting area 620 has an interactive configuration interface that supports parameter display and dynamic adjustment. It consists of pages for basic matching settings, data processing flow matching settings, function module parameter configuration, and configuration information display. The basic parameter configuration includes: signal system, modulation method, encoding method, intermediate frequency point, symbol rate, frame structure, FFT points + CP length, roll-off factor, and subcarrier spacing. The data processing flow configuration includes: algorithm module selection and data flow configuration. This part uses a visual window display, allowing users to drag selected algorithm modules to the graphical display, arranging them from left to right according to data flow, and supporting drag-and-drop adjustments to the module order. The function module parameter configuration provides detailed parameter configuration subpages for all modules in the test signal generation unit 100, all modules in the data processing unit 400, and all modules in the time-frequency matching unit 200. Subpage configuration items provide a storage function, allowing users to recall stored configuration parameters to simplify operations. After the configuration parameters are fully set, the configured parameters will be displayed on the right side of the configuration page in a grayed-out, uneditable format.

[0066] Exemplarily, the present invention provides an embodiment of the test procedure for a receiver baseband evaluation test apparatus, such as... Figure 4 As shown: First, connect the device under test (DUT) to this test and evaluation device via cables to set up the test environment. After setting up the test environment, select the output port of the DUT or its internal nodes as the test data sampling points. Then, configure the test mode parameters, such as the test mode parameters (burst mode or continuous acquisition mode) and related acquisition duration. Next, set the test items, which correspond to the specific test items in the test report (such as signal-to-noise ratio, bit error rate, error vector magnitude (EVM), etc.); configure the signal generation unit parameters (including data source selection, clock configuration, modulation scheme selection, transmitted signal amplitude / phase, channel coding scheme, etc.); set the interface rate matching parameters, which are adapted to the 8-channel parallel architecture of this test and evaluation device based on the number of parallel channels inside the DUT's FPGA; configure the data flow parameters of the data processing unit (including the selection of the required analysis algorithm modules (multiple selections are supported) and the setting of their processing flow order).

[0067] After setting the parameters, start the test process. First, select a debugging and analysis tool (options include spectrum analysis, logic analysis, data statistics, custom Matlab algorithm analysis, etc.). After the data analysis is completed, the raw data and analysis results can be stored. If the test mode is continuous data acquisition, the parameters of the signal generation unit and data processing unit can be adjusted in real time, and the test can be restarted to achieve real-time online debugging and analysis. Before the test starts, the test report generation process can be configured and enabled synchronously (supporting single test or continuous test report modes). After the test starts, the test data will be automatically stored according to the test items, and test reports will be generated synchronously. The host computer supports online viewing and export of test reports.

[0068] In summary, the receiving baseband evaluation and testing device provided by the present invention has the following beneficial effects: To address the limitations of existing baseband testing systems, such as insufficient testing functionality, lack of versatility, and insufficient debugging flexibility and depth, this invention designs a universal testing system compatible with the DVB-S2 / X and OFDM systems commonly used in satellite communication basebands. This system not only provides comprehensive performance and functional evaluation of satellite baseband receivers but also allows for flexible configuration of test nodes during their development. Utilizing a data processing task flow constructed from multiple built-in algorithm modules, it enables precise location of receiver development issues and performance evaluation. Simultaneously, the system supports user-defined algorithm simulations, allowing for comparative analysis between actual receiver performance and simulation results. Through highly integrated and universal design, this invention constructs a unified testing framework supporting multi-system baseband receivers and provides flexible and in-depth debugging capabilities throughout the entire development cycle, significantly improving the development efficiency and test coverage of baseband receivers.

[0069] It should be understood that the application of the present invention is not limited to the examples above. Those skilled in the art can make improvements or modifications based on the above description, and all such improvements and modifications should fall within the protection scope of the appended claims.

Claims

1. A receiver baseband evaluation and testing apparatus, characterized in that, include: The system includes a test signal generation unit, a time-frequency matching unit, a high-speed interface, a data processing unit, a parameter configuration unit, and a host computer; among which, The test signal generation unit is used to connect to the device under test and to generate test signals; The time-frequency matching unit is connected to the data processing unit and is used to synchronize the clock of the data processing unit with the data rate of the test data of the device under test. The data processing unit, connected to the host computer, is used to call the corresponding test algorithm module according to the data acquisition node, configure the connection order of each algorithm module, process the test data, and output the data processing result to the host computer. The high-speed interface is used to connect the satellite baseband to the time-frequency matching unit, and is used to collect data from a designated node of the device under test and transmit it to the time-frequency matching unit. A parameter configuration unit, connected to the test signal generation unit and the data processing unit, is used to dynamically set parameters; The host computer and the data processing unit are used to perform real-time analysis of the data processing results, and to test and evaluate the data processing results and generate single or continuous test reports.

2. The receiving baseband evaluation and testing apparatus according to claim 1, characterized in that, The test signal generation unit includes: a local oscillator source, a clock configuration module, a data source, a frame adaptation module, a channel coding module, a DVB modulation module, an OFDM modulation module, a frequency-phase-amplitude adjustment module, and a digital-to-analog converter module; wherein, The local oscillator is connected to the clock configuration module and the device under test respectively, and is used to generate clock signals; The clock configuration module is connected to the digital-to-analog conversion module and is used to generate a data processing clock; The frame adaptation module is connected to the data source and the channel coding module, and is used for data framing and padding. It can be configured into a DVB-S2 / X baseband frame structure or an OFDM baseband frame structure according to user requirements. The channel coding module is connected to the DVB modulation module and the OFDM modulation module respectively, and is used to select the coding mode and configure the code rate and code length; The frequency-phase-amplitude adjustment module is connected to the digital-to-analog conversion module and is used to add frequency offset, phase offset and adjust the amplitude of the transmitted signal according to debugging requirements; The digital-to-analog conversion module is connected to the clock configuration module, the DVB modulation module, the OFDM modulation module, the frequency-phase-amplitude adjustment module, and the device under test, respectively, and is used to convert the digital signal generated by the DVB modulation module or the OFDM modulation module into an analog signal, modulate it to the intermediate frequency, and output it to the satellite baseband.

3. The receiving baseband evaluation and testing apparatus according to claim 1, characterized in that, The data processing unit includes: a data stream connection configuration module, a data interface module, an automatic gain control module, a filtering module, a frequency offset adjustment module, a baseband frame parsing module, a deinterleaving module, a demodulation module, a time synchronization module, an equalization module, a frame synchronization module, a phase synchronization module, a carrier recovery module, a fine frequency offset synchronization module, a descrambling module, and a decoding module; wherein... The data stream connection configuration module is connected to the frequency offset adjustment module, the baseband frame parsing module, the deinterleaving module, the demodulation module, the time synchronization module, the equalization module, the frame synchronization module, the phase synchronization module, the carrier recovery module, the fine frequency offset synchronization module, the descrambling module, and the decoding module, respectively. It is used to call the corresponding test algorithm module according to the data acquisition node and configure the connection order of each algorithm module. The filtering module is connected to the time-frequency matching unit and is used to provide low-pass filtering function; The automatic gain control module is connected between the filtering module and the frequency offset adjustment module and is used to adjust the gain; The interface module is connected to the frequency offset adjustment module, the baseband frame parsing module, the deinterleaving module, the demodulation module, the time synchronization module, the equalization module, the frame synchronization module, the phase synchronization module, the carrier recovery module, the fine frequency offset synchronization module, the descrambling module, and the decoding module, respectively, and is used to output the data processing results.

4. The receiving baseband evaluation and testing apparatus according to claim 3, characterized in that, The data stream connection configuration module includes: a splitter interface, a combiner interface, an input switch array, an output switch array, and a data stream sequence switch matrix; The branch interface is connected to the input switch array and is used to receive the test data; The combining interface is connected to the output switch array and is used to output the data processing result; The data stream sequential switch matrix is ​​connected to the input switch array, the output switch array, the frequency offset adjustment module, the baseband frame parsing module, the deinterleaving module, the demodulation module, the time synchronization module, the equalization module, the frame synchronization module, the phase synchronization module, the carrier recovery module, the fine frequency offset synchronization module, the descrambling module, and the decoding module, respectively. The input switch array and the output switch array are respectively connected to the frequency offset adjustment module, the baseband frame parsing module, the deinterleaving module, the demodulation module, the time synchronization module, the equalization module, the frame synchronization module, the phase synchronization module, the carrier recovery module, the fine frequency offset synchronization module, the descrambling module, and the decoding module; The input switch array, the output switch array, and the data stream sequence switch matrix are linked to call the corresponding test algorithm module according to the data acquisition node, and the connection order of each algorithm module is configured.

5. The receiving baseband evaluation and testing apparatus according to claim 1, characterized in that, The time-frequency matching unit includes: a first integrated interface driver module, a control information framing module, a data buffer module, and a time-frequency matching module; wherein... The first integrated interface driver module is connected to the high-speed interface; The control information framing module is connected to the first integrated interface driver module and the parameter configuration unit respectively, and is used to frame the control information from the parameter configuration unit according to the control protocol and send it to the device under test via the first integrated interface driver module. The data caching module is connected to the first integrated interface driver module and is used to cache the collected data of the device under test. The time-frequency matching module is connected to the data processing unit and is used to complete the frequency matching between the cached data and the parallel algorithm module by controlling the duty cycle of the enable signal and the parallel data bit filling, based on the sampling clock of the device under test and in combination with the local clock rate.

6. The receiving baseband evaluation and testing apparatus according to claim 5, characterized in that, The high-speed interface includes: a second integrated interface driver module, a test data acquisition module, a control information parsing module, and an acquisition parameter configuration module; wherein... The second integrated interface driver module is connected to the first integrated interface driver module and is used to provide high-speed interface driver for the device under test; The test data acquisition module is connected to the second integrated interface driver module and is used to acquire data from any node inside the test component. The control information parsing module is connected to the second integrated interface driver module and is used to parse the control information sent by the parameter configuration unit; The parameter acquisition configuration module is connected to the second integrated interface driver module and the time-frequency matching unit respectively, and is used to perform parameter distribution and configuration operations.

7. The receiving baseband evaluation and testing apparatus according to claim 1, characterized in that, The host computer includes: a debugging and analysis area, a function setting area, and a test and evaluation area; wherein... The debugging and analysis area is used for visualization of time-domain and logic analysis, spectrum statistics, and custom algorithm simulation capabilities to assist in real-time debugging during the development phase. The function setting area is generally used for displaying and dynamically adjusting parameters; The test evaluation area is used to generate test reports and monitor the status of the device under test in real time.

8. The receiving baseband evaluation and testing apparatus according to claim 7, characterized in that, The debugging and analysis area includes: a signal logic analysis module, a signal spectrum analysis module, a data calculation and statistics module, and a custom algorithm simulation module; wherein... The signal logic analysis module is used for real-time time-domain logic analysis, adjusting the data depth of the display window, and diagnosing timing logic errors of the device under test. The signal spectrum analysis module is used to perform frequency domain characteristic analysis on the measured data; The data calculation and statistics module is used to provide calculation functions to perform real-time analysis of test data; The custom algorithm simulation module is used to run custom algorithms and realize real-time comparison between actual hardware operating data and theoretical simulation results.

9. The receiving baseband evaluation and testing apparatus according to claim 7, characterized in that, The test evaluation area includes status monitoring information and test reports; wherein, the status monitoring information includes demodulation and decoding monitoring information and modulation and coding monitoring information.

10. The receiving baseband evaluation and testing apparatus according to claim 7, characterized in that, The function settings area includes: basic matching settings, data processing flow matching settings, function module parameter configuration and configuration information display.

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