Test fixture and multi-item test method

Abstract

The invention provides a test fixture and a multi-item test method. The test fixture comprises a base assembly and a test assembly. The base assembly is provided with a mounting surface suitable for placing electronic equipment. The test assembly comprises a first connecting end and a plurality of second connecting ends, the first connecting end is used for connecting electronic equipment, and each second connecting end is used for connecting a test instrument. The mounting surface, the first connecting end and the second connecting ends are arranged in sequence along a first direction parallel to the mounting surface; according to the invention, the plurality of connecting ends are integrated on the test fixture, the electronic equipment can be electrically connected with the test assembly through the first connecting end, the test assembly can be electrically connected with the test instrument through the second connecting end, and the first connecting end and the second connecting end can be prevented from interfering with each other through the position arrangement of each part of the test fixture. And the space for connection is increased, so that the space utilization mode of the test fixture is more reasonable. Therefore, the test fixture provided by the invention can be more convenient for connection operation in the test process.

Description

Technical Field

[0001] This invention relates to the field of product testing technology, and in particular to a test fixture and a multi-item testing method. Background Technology

[0002] The main production process of some electronic devices consists of insertion, assembly, and testing. To cope with the increasingly challenging market environment, rising costs, and complex management issues, and to effectively improve product quality, it is necessary to address various problems arising in the testing phase. Taking PC (Personal Computer) power supply testing as an example, related technologies typically employ a manual testing mode, requiring manual placement and removal of the PC power supply to its designated position, and connection of the power supply's terminals to the test board. This manual, multi-item testing method requires a significant investment of manpower for multiple handling operations. Furthermore, the terminals are prone to scratches and defects during handling, and the repeated insertion and removal of the terminals can easily cause damage and cost losses. Summary of the Invention

[0003] The main objective of this invention is to provide a test fixture and a multi-item test method that facilitates connection operations during the testing process.

[0004] To achieve the above objectives, the embodiments of the present invention adopt the following technical solutions: A test fixture for using multiple test instruments to jointly test electronic equipment, each test instrument having different testing functions, the test fixture comprising: The base assembly has a mounting surface suitable for placing electronic equipment; The test assembly includes a connection base assembly and a first connection end and multiple second connection ends. The first connection end is used to connect to electronic equipment, and each of the second connection ends is used to connect to a test instrument. Along a first direction parallel to the mounting surface, the test component has a first connection end on the side closer to the mounting surface, and multiple second connection ends on the side farther from the mounting surface.

[0005] In some embodiments, the test assembly further includes a test board having a first side and a second side opposite to each other along a first direction, the mounting surface, the first side and the second side being arranged sequentially along the first direction, a first connection end being disposed on the first side, and each second connection end being disposed at intervals on the second side.

[0006] In some embodiments, the angle between the first side and the mounting surface is φ1, and satisfies: 89°≤φ1≤91°, and the angle between the second side and the mounting surface is φ2, and satisfies: 89°≤φ2≤91°.

[0007] In some embodiments, the base assembly includes a positioning block disposed on a mounting surface. The positioning block is configured to switch positions between a first position and a second position. The number of electronic devices is multiple, including a first device and a second device. When the positioning block is in the first position, the positioning block defines a first groove on the mounting surface, which is adapted to position the first device. When the positioning block is in the second position, the positioning block defines a second groove on the mounting surface, which is adapted to position the second device.

[0008] In some embodiments, the test fixture further includes a read / write component connected to the base component, the read / write component being configured to record specifications of the electronic device and test results from the test instrument.

[0009] In some embodiments, the base assembly includes a first base body, a second base body, and a guide post. The first base body has a mounting surface and a guide hole. The guide post is disposed on the second base body and inserted into the guide hole along a second direction, so that the first base body can slide relative to the second base body. The second direction is perpendicular to the mounting surface.

[0010] A second aspect of the present invention also provides a multi-item testing method, using a test fixture according to any of the above embodiments, wherein the multiple testing instruments include a first testing instrument and a second testing instrument, and the multi-item testing method includes: Place the electronic device on the mounting surface; Connect the first connection terminal to the electronic device, and connect the second connection terminal to the first test instrument; The electronic equipment was tested using the first testing instrument. Separate the second connection terminal from the first test instrument; Connect the second connector to the second testing instrument; The electronic equipment was tested using a second testing instrument.

[0011] In some embodiments, the test fixture further includes a read / write component connected to the base component; The first testing instrument is used to test electronic equipment, including: The test results of the first testing instrument are entered through the read / write component; The electronic equipment is tested using a second testing instrument, including: The test results of the second testing instrument are entered through the read / write component.

[0012] In some embodiments, before testing the electronic device with the first testing instrument, the method further includes: Read the specification information of the read / write component, read the product process code information of the electronic device, and enter it into the read / write component.

[0013] In some embodiments, the test instrument tests the electronic device's test functions, including at least one of vibration testing, overvoltage protection testing, wire continuity testing, lighting testing, high voltage testing, ATE function testing, fan testing, and information storage testing.

[0014] Compared with the prior art, the beneficial effects of the present invention are: The test fixture of the present invention includes a base assembly and a test assembly. The base assembly has a mounting surface suitable for placing electronic equipment. The test assembly is connected to the base assembly and includes a first connecting end and multiple second connecting ends. The first connecting end is used to connect to the electronic equipment, and each of the second connecting ends is used to connect to a test instrument. Along a first direction parallel to the mounting surface, the test assembly has a first connecting end on the side closer to the mounting surface and multiple second connecting ends on the side farther from the mounting surface. Compared to related technologies that employ manual testing and require repeated operations of picking up and placing the device and plugging and unplugging wires each time the test instrument is switched, the present invention integrates multiple connecting ends into the test fixture. The first connecting end enables electrical connection between the electronic equipment and the test assembly, and the second connecting ends enable electrical connection between the test assembly and the test instrument. Furthermore, the arrangement of the components of the test fixture avoids interference between the first and second connecting ends, increases the space available for connection, and makes more rational use of the space in the test fixture. Therefore, the test fixture of the present invention facilitates connection operations during the testing process. Attached Figure Description

[0015] To more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on the structures shown in these drawings without creative effort.

[0016] Figure 1 This is a three-dimensional schematic diagram of the test fixture and electronic equipment combined according to one embodiment of the present invention; Figure 2 This is a three-dimensional schematic diagram of a test fixture provided in one embodiment of the present invention; Figure 3 This is a schematic diagram of one side of the test fixture provided in one embodiment of the present invention along the first direction; Figure 4 This is a schematic diagram of the second side of the test fixture provided in one embodiment of the present invention along the first direction; Figure 5 This is an exploded view of a test fixture provided in one embodiment of the present invention; Figure 6This is a flowchart of a multi-item testing method provided in one embodiment of the present invention; Figure 7 This is a flowchart of the first part of a multi-item testing method provided in another embodiment of the present invention; Figure 8 This is a flowchart of the second part of a multi-item testing method provided in another embodiment of the present invention; wherein, S205 is... Figure 7 The steps following S204, and the two steps are adjacent.

[0017] Explanation of icon numbers: Test fixture 100; Base assembly 110; mounting surface 111; positioning block 112; first groove 113; second groove 114; first seat 115; guide hole 1151; second seat 116; guide post 117; Test component 120; first connection terminal 121; second connection terminal 122; test board 123; first side 124; second side 125; Read / write component 130; 200 electronic devices; First direction X; Second direction Y. Detailed Implementation

[0018] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the scope of protection of the present invention.

[0019] It should be noted that if the embodiments of the present invention involve directional indicators (such as up, down, left, right, front, back, etc.), the directional indicators are only used to explain the relative positional relationship and movement of the components in a specific posture. If the specific posture changes, the directional indicators will also change accordingly.

[0020] Furthermore, if the embodiments of this invention involve descriptions such as "first" or "second," these descriptions are for descriptive purposes only and should not be construed as indicating or implying their relative importance or implicitly specifying the number of technical features indicated. Therefore, a feature defined with "first" or "second" may explicitly or implicitly include at least one of those features. Additionally, the use of "and / or," "and / or," or "and / or" throughout the text implies three parallel solutions. For example, "A and / or B" includes solution A, solution B, or a solution where both A and B are satisfied simultaneously. Furthermore, the technical solutions of the various embodiments can be combined with each other, but this must be based on the ability of those skilled in the art to implement them. When the combination of technical solutions is contradictory or impossible to implement, it should be considered that such a combination of technical solutions does not exist and is not within the scope of protection claimed by this invention.

[0021] In related technologies, the PC power supply testing section employs a manual testing mode, requiring manual placement and removal of the PC power supply to the corresponding position, and connection of the product terminals to the test board. This manual multi-item testing method requires a significant investment of manpower for multiple handling operations, and the product's appearance is easily scratched or damaged during transport. Furthermore, the product terminals require repeated insertion and removal, which can easily cause damage and cost losses.

[0022] Specifically, in the relevant technology, when electronic devices need to be tested on multiple test instruments for different items, each test item corresponds to a set of test instruments and a set of test boards. Before each new test item, it is necessary to first disconnect the electronic device from the test instrument and test board corresponding to the previous test item by unplugging the terminal, and then insert a new terminal to connect the electronic device to the test instrument and test board corresponding to the next test item.

[0023] In view of this, see Figures 1-5 In a first aspect of the present invention, a test fixture 100 is provided for multiple test instruments to jointly test an electronic device 200, each test instrument having different test functions.

[0024] The electronic device 200 can be any suitable type of electronic device 200. The embodiments of the present invention are all illustrated with the electronic device 200 as the power supply for a PC.

[0025] The test fixture 100 includes a base assembly 110 and a test assembly 120.

[0026] For details, see Figures 1-2The base assembly 110 has a mounting surface 111 suitable for placing the electronic device 200. The mounting surface 111 can be flat or curved. In some embodiments, the base assembly 110 can fix the electronic device 200 to (or limit) the mounting surface 111; in other embodiments, the base assembly 110 only provides a mounting surface 111 suitable for supporting the electronic device 200, without being fixedly connected to the electronic device 200.

[0027] See Figures 1-5 The test component 120 is connected to the base component 110. The test component 120 includes a first connection terminal 121 and a plurality of second connection terminals 122. The first connection terminal 121 is used to connect to the electronic device 200, and each of the second connection terminals 122 is used to connect to the test instrument.

[0028] Both the first connection end 121 and the second connection end 122 are connection terminal structures for electrical connection. Specifically, both the first connection end 121 and the second connection end 122 can be pluggable connection terminals and have plug-in posts or plug-in holes.

[0029] Regarding the connection relationship of the first connection terminal 121, in some embodiments, there may be only one first connection terminal 121, so that the electronic device 200 and the test component 120 can be electrically connected through one first connection terminal 121. This setting means that the first connection terminal 121 does not need to be plugged and unplugged again during the transfer between different test instruments, which can save plugging and unplugging operation time. In other embodiments, there are multiple first connection terminals 121, and the multiple first connection terminals 121 can correspond to different test functions of different test instruments. Therefore, during the transfer between different test instruments, it is necessary to switch the first connection terminal 121 connected to the electronic device 200. The above setting means that the operation of switching the first connection terminal 121 only needs to be completed on the test fixture 100, so the operation method is more convenient.

[0030] Regarding the connection relationship of the second connection terminals 122, in some embodiments, multiple second connection terminals 122 can correspond one-to-one with multiple test instruments; or in other embodiments, multiple second connection terminals 122 can be connected to a single test instrument simultaneously.

[0031] Specifically, see Figures 1-5 Along a first direction X parallel to the mounting surface 111, the test component 120 is provided with a first connection end 121 on the side close to the mounting surface 111, and a plurality of second connection ends 122 on the side away from the mounting surface 111.

[0032] With the above-described arrangement, the wiring direction of the first connection terminal 121 and the wiring position of the second connection terminal 122 can be located on both sides of the test assembly 120 along the first direction. This means that on one side of the test assembly 120 along the first direction X, the first connection terminal 121 can be connected to the electronic device 200, and on the other side along the first direction X, the second connection terminal 122 can be connected to the test instrument. This avoids interference between the first connection terminal 121 and the second connection terminal 122, increases the space available for connection, and makes the space utilization of the test fixture 100 more reasonable.

[0033] As can be seen, the test fixture 100 of the present invention includes a base assembly 110 and a test assembly 120. The base assembly 110 has a mounting surface 111 suitable for placing an electronic device 200. The test assembly 120 includes a first connecting end 121 and a plurality of second connecting ends 122. The first connecting end 121 is used to connect the electronic device 200, and each of the second connecting ends 122 is used to connect a test instrument. Along a first direction X parallel to the mounting surface 111, the mounting surface 111, the first connecting end 121, and each of the second connecting ends 122 are arranged sequentially. Compared to related technologies that employ manual testing and require repeated instrument loading / unloading and wiring operations each time testing instruments are switched, the present invention integrates multiple connection terminals into the test fixture 100. The first connection terminal 121 enables electrical connection between the electronic device 200 and the test component 120, while the second connection terminal 122 enables electrical connection between the test component 120 and the testing instrument. Furthermore, the arrangement of the components within the test fixture 100 avoids interference between the first and second connection terminals 121 and 122, increasing the available space for connections and making more efficient use of the space in the test fixture 100. Therefore, the test fixture 100 of the present invention facilitates connection operations during the testing process.

[0034] See Figures 1-5 In some embodiments, the test assembly 120 further includes a test plate 123, which has a first side 124 and a second side 125 opposite to each other along the first direction X. The mounting surface 111, the first side 124 and the second side 125 are arranged sequentially along the first direction X. A first connecting end 121 is disposed on the first side 124 and each second connecting end 122 is spaced apart on the second side 125.

[0035] The test board 123 can be a plate structure of any shape, such as a rectangular plate structure. In some embodiments, in addition to integrating the first connection terminal 121 and the second connection terminal 122, the test board 123 can also have other functions, such as power supply, overvoltage / overcurrent / short circuit protection, and temperature control.

[0036] Based on the settings of test board 123, further details can be found in [link to test board 123]. Figures 1-5 The angle between the first side and the mounting surface is φ1, and satisfies: 89°≤φ1≤91°; the angle between the second side and the mounting surface is φ2, and satisfies: 89°≤φ2≤91°. For example, φ1 can be any one of 89°, 90°, and 91°, and φ2 can be any one of 89°, 90°, and 91°.

[0037] Understandably, the aforementioned angle setting allows the test board 123 to be installed vertically on the base assembly 110. On the one hand, this saves the space required for the test assembly 120 to be connected to the base assembly 110. On the other hand, with the first side 124 and the second side 125 perpendicular to the mounting surface 111, the docking direction of the first connecting end 121 with the electronic device 200 and the docking direction of the second connecting end 122 with the test instrument are both parallel to the first direction X of the mounting surface 111. This reduces the difficulty of docking operations, makes it easier for employees to identify the connection, and when the first connecting end 121 or the second connecting end 122 involves the connection between wires, it can avoid bending of the wires during connection, thus making the wiring operation more convenient.

[0038] Regarding the specific connection method between the base assembly 110 and the electronic device 200, in some embodiments, the number of electronic devices 200 is multiple, including a first device and a second device. The device specifications, dimensions, or installation positioning references of the first device and the second device may be different. Corresponding to the different positioning requirements of the electronic devices 200, in some embodiments, the base assembly 110 includes a positioning block 112, which is disposed on the mounting surface 111 and configured to switch positions between a first position and a second position.

[0039] The positioning block 112 can have different installation positions to adapt to the installation and positioning of different electronic devices 200. For details, see [link to documentation]. Figure 1 and Figure 2 In some embodiments, when the positioning block 112 is in the first position, the positioning block 112 defines a first groove 113 on the mounting surface 111, the first groove 113 being adapted to position the first device; when the positioning block 112 is in the second position, the positioning block 112 defines a second groove 114 on the mounting surface 111, the second groove 114 being adapted to position the second device.

[0040] It is understood that the positioning block 112 can protrude from the mounting surface 111, thereby enclosing a space suitable for placing the first device and the second device, namely the first groove 113 and the second groove 114. To facilitate position switching of the positioning block 112, in some embodiments, the positioning block 112 can be detachably connected to the base assembly 110, for example, by magnetic attraction, snap-fit, or threaded connection. When the positioning block 112 snaps into the mounting surface 111, the mounting surface 111 can have multiple snap-fit ​​grooves, and the positioning block 112 snapping into different snap-fit ​​grooves corresponds to the positioning block 112 being located in different positions. In other embodiments, the positioning block 112 can be slidably connected to the base assembly 110, thereby achieving position switching of the positioning block 112 through relative sliding between the two.

[0041] In some embodiments, the number of positioning blocks 112 can be multiple, and the dimensions of each positioning block 112 can be the same or different. Based on the above settings, in some embodiments, multiple positioning blocks 112 can jointly enclose a first groove 113 or a second groove 114. In other embodiments, when it is necessary to install the positioning electronic device 200, one or more of the multiple positioning blocks 112 can be selected as needed, so that only a portion of the positioning blocks 112 need to be connected to the mounting surface 111.

[0042] With the positioning block 112 configured as described above, when the electronic device 200 to be tested includes multiple electronic devices 200 of different sizes (i.e., the first device and the second device), the position of the positioning block 112 can be changed to make the positioning block 112 suitable for positioning electronic devices 200 of different sizes, thereby making the positioning block 112 more versatile.

[0043] See Figures 1-5 In some embodiments, the base assembly 110 also includes a DC cable placement area to prevent the DC cable of the electronic product from becoming too long, causing the cable to come loose during the transmission of the test fixture 100, which could then conflict with other mechanisms and cause damage.

[0044] See Figure 5 In some embodiments, the test fixture 100 further includes a read / write component 130, which is connected to the base component 110 and is configured to record the specifications of the electronic device 200 and the test results of the test instrument.

[0045] The read / write component 130 can be an RFID reader or a barcode / 2D code reader. When the read / write component 130 needs to input information, an external reader (whose structure and reading / writing method can be the same as or similar to that of the read / write component 130) can input the information into the read / write component 130.

[0046] exist Figure 5In the embodiment shown, along the direction perpendicular to the mounting surface 111, the base assembly 110 has a read / write groove on the side opposite to the mounting surface 111, and the read / write assembly 130 is connected in the read / write groove. The above arrangement makes it so that the read / write groove does not occupy additional setting space on the test fixture 100, and makes it easier for the read / write assembly 130 to perform read / write operations.

[0047] See Figures 1-5 In some embodiments, the base assembly 110 includes a first base 115, a second base 116, and a guide post 117. The first base 115 has a mounting surface 111 and a guide hole 1151. The guide post 117 is disposed on the second base 116 and inserted into the guide hole 1151 along a second direction Y, so that the first base 115 can slide relative to the second base 116. The second direction Y is perpendicular to the mounting surface 111.

[0048] In some embodiments, the sliding connection between the first base 115 and the second base 116 can be used in the testing process. For example, during vibration testing, the lifting cylinder can be raised and drive the first base 115 to separate the first base 115 from the second base 116 to meet the testing requirements. In other embodiments, the sliding connection between the first base 115 and the second base 116 can be used for the connection operation between the first connection end 121 and the electronic device 200. That is, in the direction perpendicular to the mounting surface 111, when the height of the first connection end 121 is inconsistent with the height of the wiring terminal of the electronic device 200, the sliding connection between the first base 115 and the second base 116 can be used to make the heights of the two as aligned as possible, thereby making the wiring operation more convenient and avoiding bending of the wires during connection.

[0049] See Figures 1-8 A second aspect of the present invention also provides a multi-item testing method, which applies the test fixture 100 of any of the above embodiments. To meet diverse testing needs, the multiple testing instruments include a first testing instrument and a second testing instrument.

[0050] See details Figure 6 This multi-item testing method includes, but is not limited to, the following steps: S101: Place the electronic device 200 on the mounting surface 111; S102: Connect the first connection terminal 121 to the electronic device 200, and connect the second connection terminal 122 to the first test instrument; S103: Test electronic equipment 200 using the first testing instrument; S104: Separate the second connection terminal 122 from the first test instrument; S105: Connect the second connection terminal 122 to the second test instrument; S106: Test electronic equipment 200 using a second testing instrument.

[0051] The steps described above will be further explained below.

[0052] In step S101, the electronic device 200 can be placed on the mounting surface 111 by manual or automatic driving (e.g., robotic arm driving). In some embodiments, this step may also include adjusting the positioning element of the base assembly 110 (e.g., the positioning block 112 in the aforementioned embodiments) and fixing the base assembly 110 to (or limiting) the electronic device 200.

[0053] It should be noted that employees can either place the electronic device 200 first and then connect it to the first connection terminal 121, or they can connect the electronic device 200 to the first connection terminal 121 first and then place it on the mounting surface 111. Therefore, the order of steps S101 and S102 can be interchanged. In the testing processes corresponding to steps S103 and S106, when more testing instruments are involved, multiple testing instruments can simultaneously test the electronic device 200 in each testing process. For example, if a third instrument is included among the multiple testing instruments, the third instrument can also be used to test the electronic device 200 simultaneously in step S103 or S106. Additionally, in some embodiments, two testing positions can be designed. When two testing fixtures 100 are provided, while one testing fixture 100 is being tested at one testing position, a robotic arm can move the other testing fixture 100 to the other testing position in advance to wait. After the current testing fixture 100 completes its test, the other testing fixture 100 can start testing directly, avoiding wasted time. Furthermore, in some embodiments, the electronic device 200 can undergo multiple tests simultaneously at the same testing position. For example, while performing ATE function testing, two robotic arms behind the testing position can identify the information of the electronic product, move to the corresponding fan position, and test the fan speed and abnormal noise.

[0054] See Figure 5 In some embodiments, the test fixture 100 also includes a read / write component 130. The configuration of the read / write component 130 can be found in the aforementioned related embodiments, and will not be repeated here.

[0055] The read / write component 130 is configured to record the test results of the test instrument. Based on this, in some embodiments, after the step of testing the electronic device 200 with the first test instrument, the multi-item test method further includes: The test results of the first test instrument are entered through the read / write component 130.

[0056] Similarly, in some embodiments, after testing the electronic device 200 with a second testing instrument, the multi-item testing method further includes: The test results of the second test instrument are entered through the read / write component 130.

[0057] In some embodiments of the above steps, the read / write component 130 may only record the test results, which can be viewed by employees on the read / write component 130 (or a device that communicates with the read / write component 130) after the test is completed; in other embodiments, the read / write component 130 may also perform data processing on the recorded test results.

[0058] Furthermore, in order to bind the read / write component 130 to the electronic device 200, in some embodiments, before testing the electronic device 200 with the first test instrument, the multi-item test method further includes: Read the specification information of the read / write component 130, read the product process code information of the electronic device 200 and enter it into the read / write component 130.

[0059] The above steps ensure that each electronic device 200 is accurately matched with the corresponding test fixture 100 and test data, avoiding problems such as incompatibility between the test fixture 100 and the electronic device 200 and confusion of test data, and preventing test misalignment or omission. After reading the information from the read / write component 130, the system can automatically call the corresponding test program and parameters according to the calibration status and adaptability of the test fixture 100.

[0060] For specific test types, in some embodiments, the test instrument tests the electronic equipment 200 for at least one of vibration testing, overvoltage protection testing, wire continuity testing, lighting testing, high voltage testing, ATE function testing, fan testing, and information storage testing.

[0061] Taking the electronic device 200 as a PC power supply as an example, the various tests mentioned above are explained in detail below. Among them, the vibration test can be performed using a vibration table, and the first seat 115 and the second seat 116, which are relatively movable, as described in the previous embodiment, are used so that during the vibration test, the vibrating electronic device 200 does not affect the second seat 116 and the test component 120.

[0062] Overvoltage protection testing can be referred to as OVP (Over Voltage Protection) testing. It is designed to test the protection mechanism (output cut-off, lock-up, or restart) that the PC power supply should automatically trigger when the output voltage exceeds a preset safety threshold due to a fault (such as feedback circuit failure or component damage), in order to prevent excessive voltage from burning out core hardware such as the motherboard, CPU, and graphics card.

[0063] Continuity testing of cables is used to check the conductivity, short circuits, misconnections, and insulation performance of PC power cables, ensuring that the circuit connection between the power output terminal and the interface is correct and fault-free.

[0064] Lighting tests can verify the functional integrity, consistency, stability, and user interaction experience of various lights.

[0065] In high-voltage testing, a descendable metal pressure plate can be used at the test position to contact the metal casing of the PC power supply for high-voltage testing.

[0066] ATE functional testing can comprehensively and in a standardized manner test the electrical performance, functional integrity, and protection mechanisms of PC power supplies through an integrated automated testing system.

[0067] Fan testing can include fan speed, fan noise, and fan PWM. These tests can be performed at the same test station or at different test stations. Fan PWM refers to a specific test of the PWM speed control function, speed response characteristics, and control logic of PC power supply cooling fans. The core verification is whether the fan can accurately adjust its speed according to the PWM signal to match the cooling requirements under different loads. This is a crucial test to ensure cooling stability and quiet operation. This test requires dedicated equipment to simulate different PWM signals and test key indicators such as fan speed response, speed control linearity, and start / stop thresholds.

[0068] Information storage testing can be used to test whether the PC power supply's information storage capability is normal. Specifically, a PC power supply may fail under special circumstances. In this case, the PC power supply can store the information before the failure. The information storage test verifies whether this information storage function is properly activated by reading node signals.

[0069] For ease of understanding, the following describes the multi-item test methods corresponding to a more complete embodiment of the present invention. See [link to relevant documentation]. Figures 7-8 This multi-item testing method includes: S201: Place the electronic device 200 on the mounting surface 111; S202: Connect the first connection terminal 121 to the electronic device 200, and connect the second connection terminal 122 to the first test instrument; S203: Read the specification information of the read / write component 130, read the product process code information of the electronic device 200 and enter it into the read / write component 130; S204: The electronic device 200 is tested using the first testing instrument, and the test results of the first testing instrument are recorded through the read / write component 130; S205: Separate the second connection terminal 122 from the first test instrument; S206: Connect the second connection terminal 122 to the second test instrument; S207: The electronic device 200 is tested using a second testing instrument, and the test results of the second testing instrument are entered through the read / write component 130.

[0070] The above are merely preferred embodiments of the present invention and do not limit the patent scope of the present invention. Any equivalent structural transformations made using the contents of the present invention specification and drawings under the concept of the present invention, or direct / indirect applications in other related technical fields, are included within the patent protection scope of the present invention.

Claims

1. A test fixture for using multiple test instruments to jointly test electronic equipment, each of the test instruments having different test functions, characterized in that, The test fixture includes: The base assembly has a mounting surface suitable for placing the electronic device; A test component is connected to the base component. The test component includes a first connection terminal and a plurality of second connection terminals. The first connection terminal is used to connect to the electronic device, and each of the second connection terminals is used to connect to the test instrument. Wherein, along a first direction parallel to the mounting surface, the test component is provided with a first connection end on the side closer to the mounting surface, and a plurality of second connection ends are provided on the side of the test component away from the mounting surface.

2. The test fixture as described in claim 1, characterized in that: The test assembly further includes a test board having a first side and a second side opposite to each other along a first direction. The mounting surface, the first side and the second side are arranged sequentially along the first direction. The first connecting end is disposed on the first side, and each second connecting end is disposed at intervals on the second side.

3. The test fixture as described in claim 2, characterized in that: The angle between the first side and the mounting surface is φ1, and satisfies: 89°≤φ1≤91°. The angle between the second side and the mounting surface is φ2, and satisfies: 89°≤φ2≤91°.

4. The test fixture as described in claim 1, characterized in that: The base assembly includes a positioning block disposed on the mounting surface. The positioning block is configured to switch between a first position and a second position. The number of electronic devices is multiple, including a first device and a second device. When the positioning block is in the first position, the positioning block defines a first groove on the mounting surface, which is adapted to position the first device. When the positioning block is in the second position, the positioning block defines a second groove on the mounting surface, which is adapted to position the second device.

5. The test fixture as described in claim 1, characterized in that: The test fixture also includes a read / write component connected to the base component, and the read / write component is configured to record the specifications of the electronic device and the test results of the test instrument.

6. The test fixture as described in claim 1, characterized in that: The base assembly includes a first base body, a second base body, and a guide post. The first base body has the mounting surface and a guide hole. The guide post is disposed on the second base body and inserted into the guide hole along a second direction, so that the first base body can slide relative to the second base body. The second direction is perpendicular to the mounting surface.

7. A multi-item testing method, characterized in that, Using the test fixture according to any one of claims 1-6, the plurality of test instruments includes a first test instrument and a second test instrument, and the multi-item test method includes: Place the electronic device on the mounting surface; Connect the first connection terminal to the electronic device, and connect the second connection terminal to the first test instrument; The electronic device is tested using the first testing instrument; Separate the second connection end from the first test instrument; Connect the second connection terminal to the second testing instrument; The electronic device is tested using the second testing instrument.

8. The multi-item testing method as described in claim 7, characterized in that: The test fixture also includes a read / write component, which is connected to the base component; The step of testing the electronic device using the first testing instrument includes: The test results of the first testing instrument are entered through the read / write component; The step of testing the electronic device using the second testing instrument includes: The test results of the second testing instrument are entered through the read / write component.

9. The multi-item testing method as described in claim 8, characterized in that: Before testing the electronic device using the first testing instrument, the method further includes: Read the specification information of the read / write component, read the product process code information of the electronic device and enter it into the read / write component.

10. The multi-item testing method as described in claim 7, characterized in that: The testing instruments are used to test the electronic equipment's testing functions, including at least one of vibration testing, overvoltage protection testing, wire continuity testing, lighting testing, high voltage testing, ATE function testing, fan testing, and information storage testing.

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