Power supply test method and system, and computing device
By constructing a power supply testing system, standard operating curves are automatically acquired using electronic loads and display devices to generate test cases and scripts, solving the problems of low efficiency and poor accuracy in existing power supply testing technologies, and achieving efficient and reliable power supply testing.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- XFUSION DIGITAL TECH CO LTD
- Filing Date
- 2025-11-21
- Publication Date
- 2026-04-21
AI Technical Summary
Current power supply testing requires manual intervention, which leads to low efficiency and a high risk of errors, failing to meet the requirements for efficient and reliable power supply testing.
By building a power supply testing system, using electronic loads and display devices, standard operating curves of computing devices can be automatically acquired, test cases and scripts can be generated, and automated testing of power supply groups can be achieved, simulating different load conditions and recording test results.
It improves the efficiency of power supply testing, reduces manpower consumption, avoids errors in manual parameter configuration, and ensures the accuracy of test results and the reliability of power supply units under various operating conditions.
Smart Images
Figure CN121901035A_ABST
Abstract
Description
Technical Field
[0001] This application relates to the field of computing device technology, and in particular to a power supply testing method, system and computing device. Background Technology
[0002] The application of graphics processing units (GPUs) in servers has greatly expanded their computing power and performance, enabling them to handle more complex and demanding tasks and meet the needs of various advanced applications. Currently, multiple GPUs are typically installed in servers to further increase their computing power and performance; however, this significantly increases the power requirements of the server.
[0003] To ensure reliable operation of power supplies in real-world applications, power supply testing is typically required before shipment. However, current power supply testing methods require manual intervention, increasing manpower costs and resulting in low testing efficiency. Summary of the Invention
[0004] This application provides a power supply testing method, system, and computing device that can improve the efficiency of power supply testing.
[0005] In a first aspect, the power supply testing method provided in the embodiments of this application is applied to a test device in a power supply testing system. The power supply testing system is used to perform power supply testing on a power supply group consisting of at least one power supply of a computing device. The power supply testing system further includes: an electronic load and a display device electrically connected to the output of the power supply group; wherein the electronic load consumes electrical energy by controlling the power of its internal components; the output of the power supply group is electrically connected to the electronic load and the display device; the test device is electrically connected to the electronic load and the display device; the method includes: acquiring a standard operating curve of the computing device under a target operating condition; generating a first test case based on the standard operating curve; the first test case is used to indicate the load conditions for testing the power supply group under the target operating condition; generating a first test script based on the first test case; running the first test script to configure the load parameters of the electronic load and perform power supply testing on the power supply group; and acquiring the test results of the power supply test through the display device, the test results being used to indicate the performance of the power supply group under the target operating condition.
[0006] The power supply testing method provided in this application is applied to a testing device within a power supply testing system. The power supply testing system further includes an electronic load and a display device electrically connected to the output of the power supply unit under test. The testing device is electrically connected to the electronic load and the display device. Through this power supply testing system, the testing device can acquire the standard operating curve of the computing device under target operating conditions and generate a first test case and a first test script accordingly, avoiding manual intervention in the testing process and thus reducing the consumption of human resources. Furthermore, the testing device can automatically run the test script to test the power supply unit, which effectively improves the efficiency of power supply testing compared to manual testing and can quickly obtain the test results of the power supply unit under target operating conditions. It also avoids the problem of errors easily caused by manual parameter configuration, which affects the accuracy of the test.
[0007] In one possible implementation, generating a first test case based on a standard operating curve includes: identifying abrupt change points in the standard operating curve; dividing the standard operating curve into multiple load segments based on the identification results; and generating a first test case according to the time sequence of the multiple load segments, based on the load value and corresponding load duration of each load segment. In this embodiment, by identifying abrupt change points, the standard operating curve can be divided into multiple load segments, and the load value in each load segment tends to be stable, facilitating the extraction of accurate load values for subsequent power supply testing. Through the above steps, a method for generating test cases is provided, enabling computing devices to automatically complete testing tasks for different load segments through test cases, eliminating the need for manual configuration of relevant parameters for the next load segment, improving power supply testing efficiency, and avoiding human error.
[0008] In another possible implementation, before generating the first test case based on the standard operating curve, the method further includes: superimposing deviation values onto the standard operating curve; the load value at any moment in the superimposed standard operating curve is higher than the load value at the same moment in the unsuperimposed standard operating curve. Power supply testing focuses more on the risk of "overload," therefore, this embodiment superimposes deviation values onto the standard operating curve to increase the upper limit of the load value, thereby obtaining the test operating curve and generating test cases. Through the above steps, "extreme fluctuation scenarios" that the device may face during operation can be simulated to verify the redundancy capability of the power supply group and avoid device downtime due to unexpected load during actual use.
[0009] In another possible implementation, the test results of the power supply test are obtained through a display device, including: recording the maximum and minimum voltage values of each load segment in the time sequence of multiple load segments using the display device to obtain the test results. For each load segment, the voltage variation should be stable within a voltage range. If the maximum or minimum voltage value in the current load segment exceeds this voltage range, it indicates that the power supply has an abnormal problem during operation overshoot. Therefore, in this embodiment, the test results are obtained by recording the maximum and minimum voltage values corresponding to the load segments to reflect the performance of the power supply under the target operating conditions.
[0010] In another possible implementation, the load parameters of the electronic load are configured, including: for each of the multiple load segments, configuring the load parameters of the electronic load based on the load value and corresponding load duration of the load segment. Through the above steps, the electronic load can simulate the load conditions for testing the power supply under the target operating conditions, thereby performing power supply testing on the power supply.
[0011] In another possible implementation, after obtaining the power supply test results through a display device, the method further includes: Based on the test results, modify the first test case to obtain a second test case. Use the second test case to generate a second test script and run it to perform power supply testing on the power supply group again. Alternatively, based on the test results, modify the hardware configuration of the power supply group and run the first test script again to perform power supply testing on the power supply group with the modified hardware configuration. Through these steps, test cases can be automatically adjusted, resulting in more accurate test results and ensuring the accuracy of power supply testing.
[0012] In another possible implementation, the power supply being tested is the enabled power supply within the power supply group. Before testing the power supply group, the method further includes: determining the number of power supplies to be connected in parallel based on the maximum value in the standard operating curve and the rated power of each power supply; and enabling the same number of power supplies in the power supply group according to the number of power supplies connected in parallel. Through these steps, the number of power supplies in the power supply group under test can be automatically adjusted to meet the needs of various testing scenarios.
[0013] In another possible implementation, the computing device is a GPU server, and the standard operating curve is the standard load curve of the GPU.
[0014] In another possible implementation, the target operating condition is one of a set of operating conditions. After completing the power supply test of the power supply unit under the target operating condition, the method further includes: polling other operating conditions in the set of operating conditions and performing power supply tests on the power supply unit under those other operating conditions. Through the above steps, the performance of the power supply unit under various operating conditions can be comprehensively evaluated.
[0015] Secondly, embodiments of this application provide a power supply testing device, which includes one or more functional modules for performing the method described in the first method above.
[0016] Thirdly, embodiments of this application provide a power supply testing system for testing a power supply group consisting of at least one power supply for a computing device. The power supply testing system includes: a testing device, an electronic load and a display device electrically connected to the output of the power supply group; the electronic load consumes electrical energy by controlling the power of its internal components; the testing device is electrically connected to the electronic load and the display device; the testing device is configured to: acquire a standard operating curve of the computing device under a target operating condition; generate test cases based on the standard operating curve; the test cases indicate the load conditions for testing the power supply group under the target operating condition; generate a test script based on the test cases; run the test script to configure the load parameters of the electronic load and perform power supply testing on the power supply group; and acquire the test results of the power supply test through the display device, the test results indicating the performance of the power supply group under the target operating condition.
[0017] Fourthly, embodiments of this application provide a computing device including a processor and a memory; the processor is coupled to the memory; the memory is used to store computer instructions, which are loaded and executed by the processor to enable the computing device to implement the method described in the first aspect.
[0018] Fifthly, embodiments of this application provide a computer-readable storage medium comprising: computer software instructions; when the computer software instructions are executed in a computing device, they cause the computing device to implement the method described in the first aspect.
[0019] In a sixth aspect, embodiments of this application provide a computer program product that, when run on a computing device, causes the computing device to execute the steps of the relevant method described in the first aspect above, so as to implement the method of the first aspect above.
[0020] The beneficial effects of the second to sixth aspects mentioned above can be referred to the corresponding descriptions in the first aspect, and will not be repeated here. Attached Figure Description
[0021] Figure 1 This is a schematic diagram of the composition of a power supply testing system provided in an embodiment of this application; Figure 2 This is a schematic diagram of the composition of a testing device provided in an embodiment of this application; Figure 3 A schematic flowchart of a power supply testing method provided in an embodiment of this application; Figure 4A schematic diagram of a standard operating curve of a computing device under target operating conditions provided in an embodiment of this application; Figure 5 A schematic flowchart of another power supply testing method provided in an embodiment of this application; Figure 6 A schematic diagram of a broken line provided in an embodiment of this application; Figure 7 A schematic diagram of a test operating curve provided for an embodiment of this application; Figure 8 This is a schematic diagram illustrating a complete power supply testing process provided in an embodiment of this application. Detailed Implementation
[0022] The technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, and not all embodiments. Based on the embodiments of this application, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application.
[0023] It should be noted that in the embodiments of this application, the words "exemplarily" or "for example" are used to indicate examples, illustrations, or explanations. Any embodiment or design scheme described as "exemplarily" or "for example" in the embodiments of this application should not be construed as being more preferred or advantageous than other embodiments or design schemes. Specifically, the use of the words "exemplarily" or "for example" is intended to present the relevant concepts in a specific manner.
[0024] To facilitate a clear description of the technical solutions of the embodiments of this application, the terms "first" and "second" are used in the embodiments of this application to distinguish the same or similar items with essentially the same function and effect. Those skilled in the art can understand that the terms "first" and "second" are not intended to limit the quantity or execution order.
[0025] The following is a brief explanation of the technical terms used in the embodiments of this application: 1. Electronic data peak processing (EDPp): A method for testing power supplies to ensure their reliable operation under complex real-world conditions and prevent downstream equipment failures caused by power supply anomalies, which could result in greater property damage or safety accidents.
[0026] 2. Power Supply: This is a dedicated power supply module that provides stable, efficient, and reliable power to the entire computing device and its internal core components (such as the central processing unit, memory, hard drive, and motherboard in a server). It is connected to an external power supply and is the "energy core" for the operation of the computing device.
[0027] As server computing power increases, the demands on server power supplies will increase significantly. These demands can include: higher power consumption support, redundant power supply configurations, high-performance power supply support, effective power management, and effective cooling systems, all to ensure system stability and reliability.
[0028] Current power supply testing takes several days in total, and manual configuration of test parameters is required during the testing phase, resulting in low testing efficiency and a high risk of errors due to manual configuration.
[0029] This application provides a power supply testing method that, by constructing a power supply testing system and combining it with script files, enables automated testing of power supplies, thereby improving the efficiency of power supply testing.
[0030] In some embodiments, the power supply testing method provided in this application is applied to a scheduling system within a power supply testing system. The power supply testing system further includes an electronic load and a display device electrically connected to the output of the power supply group under test. The testing equipment is electrically connected to the electronic load and the display device. Through the aforementioned power supply testing system, the testing equipment can acquire the standard operating curve of the computing device under target operating conditions and generate a first test case and a first test script accordingly, avoiding manual intervention in the testing process and thus reducing the consumption of human resources. Furthermore, the testing equipment can automatically run the test script to test the power supply group, which can effectively improve the efficiency of power supply testing compared to manual testing, and can quickly obtain the test results of the power supply group under target operating conditions. It also avoids the problem of errors easily caused by manual parameter configuration, which affects the accuracy of the test.
[0031] The embodiments provided in this application will now be described in detail with reference to the accompanying drawings.
[0032] Figure 1 This is a schematic diagram illustrating the composition of a power supply testing system provided in an embodiment of this application. Figure 1 As shown, the power supply testing system includes: a test device 101, an electronic load 102, and a display device 103; the power supply testing system can be used to perform power supply testing on a power supply group 104 consisting of at least one power supply of a computing device. The output of the power supply group 101 is electrically connected to the electronic load 102 and the display device 103; the test device 104 is electrically connected to the electronic load 102 and the display device 103.
[0033] The power supply group 104, which is the object under test, includes at least one power supply. When the power supply group 104 includes multiple power supplies (such as two or more power supplies), the multiple power supplies are connected in parallel to form the power supply group, that is, the multiple power supplies are treated as a whole as the object under test. In the actual testing process, a power supply 105 is also used to supply power to the power supply group 104 so that the power supply group 104 can operate normally. In addition, the power supply 105 is also programmable, which can be used to set different supply voltages according to different scenarios (for example, the standard voltage in some areas is 110V, and the standard voltage in other areas is 220V). Before conducting power supply testing, the initial parameters of the power supply 105 (such as output voltage magnitude, output AC frequency, etc.) can be pre-configured. The electronic load 102 consumes electrical energy by controlling the power of its internal components to simulate electrical equipment in a real-world environment (such as a GPU server). Furthermore, the electronic load 102 is programmable, allowing for dynamic adjustment of the load size and simulation of scenarios such as short circuits and overcurrents, enabling testing of the power supply's performance under various operating conditions.
[0034] Display device 103 is used to display the changes in the electrical signal output by the power supply group. As an example, display device 103 can specifically be an oscilloscope. In this embodiment, display device 103 can record the voltage changes output by the power supply group 101 to facilitate analysis of the power supply group 101's operation. Before performing power supply testing, the initial parameters of the display device (such as sampling frequency, sampling accuracy, etc.) can be pre-configured.
[0035] Test equipment 101, acting as the control center of the power control system, possesses sufficient computing and data processing capabilities to coordinate the interactive operation between each device in the power control system for power testing. Test equipment 101 can be a server with a display screen, tablet computer, laptop computer, netbook, desktop computer, all-in-one computer, etc. Specifically, the test equipment is configured as follows: Obtain the standard operating curve of the computing device under the target operating conditions; wherein, the standard operating curve is used to describe the law of load change over time under ideal conditions when the computing device is running under the target operating conditions; Based on the standard operating curve, test cases are generated; the test cases are used to indicate the load conditions for testing the target operating condition. Generate test scripts based on test cases; Run the test script to configure the load parameters of the electronic load and perform power supply tests on the power supply group; The test results of the power supply test are obtained through a display device, and these test results are used to indicate the performance of the power supply under target operating conditions.
[0036] For the specific power supply testing procedure performed by the test equipment, please refer to the following: Figure 3 The corresponding descriptions of the method embodiments are not detailed here.
[0037] The power supply testing method provided in this application embodiment can perform power supply testing on a server. In terms of form, the server can be a blade server, a high-density server, a rack server, or a full-rack server; in terms of function, the server can be a general-purpose server, a GPU server, an artificial intelligence (AI) server, etc.
[0038] Figure 2 This is a schematic diagram illustrating the composition of a testing device provided in an embodiment of this application. Figure 2 As shown, the test device may include a processor 201 and a memory 202; the memory 202 stores instructions executable by the processor 201; when the processor 201 is configured to execute instructions, the test device executes the power supply test method in the embodiments of this application.
[0039] It should be noted that the system architecture and application scenarios described in the embodiments of this application are for the purpose of more clearly illustrating the technical solutions of the embodiments of this application, and do not constitute a limitation on the technical solutions provided in the embodiments of this application. As those skilled in the art will know, with the evolution of system architecture and the emergence of new business scenarios, the technical solutions provided in the embodiments of this application are also applicable to similar technical problems.
[0040] Figure 3 This is a schematic flowchart illustrating a power supply testing method provided in an embodiment of this application. Exemplarily, the power supply testing method provided in this embodiment can be applied to... Figure 2 In the test equipment shown, in other words, it can be tested by Figure 2 The test device shown executes this method; specifically, the test device's processor can execute this method.
[0041] like Figure 3 As shown, the power supply testing method provided in this application embodiment may include the following steps: S301. Obtain the standard operating curve of the computing device under the target operating conditions.
[0042] The computing device can refer to an electrical device with a certain computing capability, such as a server, terminal device, or intelligent lathe. This application uses a GPU server as an example for illustration, where the standard operating curve can be the standard load curve of the GPU in the GPU server.
[0043] The standard operating curve describes how the load changes over time under ideal conditions when a computing device is operating under target conditions. For example, Figure 4A schematic diagram of a standard operating curve of a computing device under target operating conditions provided in an embodiment of this application, as shown below. Figure 4 As shown, the horizontal axis represents the time dimension, and the vertical axis represents the load dimension. The curves in the figure describe how the load value changes over time.
[0044] Here, "operating condition" refers to the various scenarios that a computing device may encounter during actual power consumption. Examples include low-power consumption scenarios (the computing device operates continuously at low power), high-power consumption scenarios (the computing device operates continuously at high power), and various abrupt change scenarios (such as a sudden increase or decrease in power, or a sudden increase followed by a decrease in power). The target operating condition is any one of the various operating conditions that the computing device may encounter; multiple operating conditions can be stored in a set of operating conditions.
[0045] In this embodiment, power supply testing of a computing device requires testing the stability of the device's power supply under different operating conditions. Therefore, the testing equipment (such as a computer with an automated platform installed) can obtain the standard operating curve of the computing device under the target operating conditions from relevant data sources (such as technical documents from the GPU manufacturer's website or a pre-stored database) to facilitate subsequent power supply testing based on the operating curve.
[0046] S302. Generate the first test case based on the standard working curve.
[0047] Test cases are pre-designed test plans used to verify whether a specific function / scenario meets the requirements. Test cases indicate which functions need to be tested, what configuration parameters need to be set, and so on. In this embodiment, the first test case indicates the load conditions for testing the power supply under target operating conditions.
[0048] In some possible implementations, such as Figure 5 As shown, the above S302 can be specifically implemented as follows: S3021. Identify abrupt changes in the standard working curve and divide the standard working curve into multiple load segments.
[0049] S3022. Generate the first test case according to the time sequence of multiple load segments, based on the load value and corresponding load duration of each load segment.
[0050] The mutation point refers to a point in the standard operating curve where the load value suddenly increases or decreases. For example, Figure 4 Some mutation points are shown, and the changes in load values are more obvious at the locations of mutation points.
[0051] In this embodiment, by identifying abrupt change points, the standard operating curve can be divided into multiple load segments. The load value in each load segment tends to be stable, making it convenient to extract accurate load values for subsequent power supply testing. After dividing into multiple load segments, the test equipment can record the load value and load duration in test cases according to time sequence, based on the load value of each load segment and the corresponding load duration, to generate test cases, such as the first test case mentioned above.
[0052] In some implementations, each load segment obtained after direct division is still a curve. Therefore, for each load segment, the following processing can be performed: If the curve of the load segment fluctuates within a certain range, the comprehensive average value of all load values within the load segment can be taken as the load value of the load segment. If the curve of the load segment rises or falls steadily, a time-dependent linear function can be extracted to characterize the load value of the load segment.
[0053] For example, such as Figure 6 To approximate the standard operating curve, a line graph diagram is generated, including seven load segments: D1 (load value L1), D2 (load value L2), ..., D7 (load value L7). The load value at D4 decreases steadily, therefore, the corresponding load value L4 is characterized by a linear function that decreases over time. The load values of the other segments are fixed. The test equipment can record the load value and duration of each load segment in the order of D1-D7 to obtain test cases.
[0054] The above steps provide a way to generate test cases, enabling computing devices to automatically complete testing tasks for different load segments without the need for manual configuration of parameters for the next load segment. This improves power supply testing efficiency and avoids human error.
[0055] In one possible implementation, prior to S302 above, the test equipment further performs the following: superimposing deviation values onto the standard operating curve. Wherein, the load value at any moment in the superimposed standard operating curve (which may be called the test operating curve) is higher than the load value of the standard operating curve at the same moment before superposition.
[0056] The deviation value can be set based on historical experience. The testing equipment can superimpose the deviation value onto the standard operating curve to obtain the test operating curve. Then, the testing equipment can further extract relevant parameters from the test operating curve to generate test cases. Similarly, the steps for generating test cases based on the test operating curve are similar to those for generating test cases based on the standard operating curve, namely: 1. Identify abrupt changes in the test operating curve and divide the test operating curve into multiple load segments based on the identification results. 2. Record the load value and corresponding load duration of each load segment in the time sequence of the multiple load segments to generate the first test case.
[0057] As an example, the deviation value can be set to 10%. For instance, if the load value at time t1 in the standard operating curve is 100, after adding the deviation value, the load value at time t1 in the test operating curve can be 110. If the load value at time t2 in the standard operating curve is 80, after adding the deviation value, the load value at time t2 in the test operating curve can be 88.
[0058] For example, Figure 7 This is a schematic diagram of a test operating curve provided in an embodiment of this application. Figure 7 As shown in the figure, the solid line represents the standard operating curve, and the dashed line represents the test operating curve. It can be seen that the load value at any given moment on the test operating curve is higher than the load value at the same moment on the standard operating curve.
[0059] Power supply testing primarily considers the risk of "overload." Therefore, this application embodiment superimposes deviation values onto the standard operating curve and increases the upper limit of the load value to obtain a test operating curve, thereby generating test cases. Through the above steps, "extreme fluctuation scenarios" that the device may face during operation can be simulated to verify the redundancy capability of the power supply group and avoid device downtime due to unexpected loads during actual use.
[0060] S303. Generate the first test script based on the first test case.
[0061] Test scripts are tools for implementing test cases; they convert manual steps into machine-executable code / instructions.
[0062] The testing equipment can obtain a test script template and populate it with the generated test cases to create the first test script. For example, the test script template might include commands for remotely configuring an electronic load, but the specific parameters configured on the electronic load and when to configure the next parameter are determined by the test cases. Therefore, generating a machine-executable first test script based on the first test cases is crucial for automating power supply testing.
[0063] Optionally, the first test script in this embodiment of the application may also perform the following functions: Configure relevant power supply parameters, such as voltage and frequency, to meet the testing requirements of the current testing scenario. Configure the parameters of the display device, such as sampling frequency and sampling accuracy, so that the display device can accurately display the voltage changes of the power supply. Read the test results from the display device and save the test results to the preset storage location; In addition, to ensure automated testing of each operating condition, the test script also has the following functions: after completing a power supply test, such as testing a power supply group under a certain operating condition, it can retrieve the test cases for the next operating condition to be tested from the specified storage location and continue the power supply test.
[0064] S304. Run the first test script to configure the load parameters of the electronic load and perform a power supply test on the power supply group.
[0065] In this embodiment of the application, the test equipment runs a test script and configures the load parameters of the electronic load according to the contents of the test script, so that the electronic load can simulate the load conditions for testing the power supply under the target operating conditions, and then perform power supply testing on the power supply.
[0066] Specifically, the load parameters of the electronic load in S304 above include: for each of the multiple load segments, configuring the load parameters of the electronic load according to the load value and load duration of the load segment.
[0067] For example, during the test of load segment D1, the test equipment is configured with an electronic load to maintain a load value of L1 for the corresponding time period, and the power supply is tested under the current load condition. When the test of load segment L1 ends, the test equipment is configured with an electronic load to maintain a load value of L2 for the corresponding time period of load segment L2, and the power supply is tested again until the power supply tests of the power supply are completed under the corresponding load conditions for all load segments.
[0068] Optionally, after the test equipment runs the test script, relevant parameters such as power supply and display device can also be configured.
[0069] S305. Obtain the test results of the power supply test through the display device.
[0070] The test results are used to indicate the performance of the power supply under target operating conditions.
[0071] During power supply testing, the display device can record the voltage changes at the power supply output. The testing equipment can then use the display device to acquire these voltage changes and extract test results reflecting the power supply's performance.
[0072] In one possible implementation, the testing equipment can record the maximum and minimum voltage values corresponding to each load segment in chronological order using a display device to obtain the test results. For example, for load segment D1, the recorded maximum voltage value is Vmax1, and the minimum value is Vmin1; for load segment D2, the recorded maximum voltage value is Vmax2, and the minimum value is Vmin2, and so on. For each load segment, the voltage variation should be stable within a certain voltage range. If the maximum or minimum voltage value in the current load segment exceeds this voltage range, it indicates an abnormality in the power supply's overshoot operation. Therefore, in this embodiment, the test results obtained by recording the maximum and minimum voltage values corresponding to the load segments reflect the performance of the power supply under the target operating conditions.
[0073] In another possible implementation, the test equipment can continuously record the voltage changes of the power supply group throughout the entire test process (i.e., multiple consecutive load segments) through a display device, generating a complete voltage change data as the test result, so as to facilitate a more comprehensive analysis of the power supply group's performance.
[0074] In some implementations, the testing equipment can store the test results of the power supply unit in relation to the target operating conditions, so that users can perform performance optimization, problem localization, and other processing on the power supply unit based on the test results.
[0075] In some possible implementations, the power supply is tested on the enabled power supplies within a power supply group. That is, the power supply group contains multiple pre-configured power supplies. During power supply testing, one or more power supplies from the group can be selected to connect to the power supply testing system (i.e., the enabled power supplies), while other power supplies remain disconnected. This allows the power supply testing system to selectively test the connected power supplies. Furthermore, before conducting the power supply test, the test equipment can configure the power supply group and perform the following steps: Step a: Determine the number of units to be connected in parallel based on the maximum value in the standard operating curve and the rated power of each power supply.
[0076] Step b: Enable the same number of power supplies in the power supply group according to the number of parallel units.
[0077] Depending on the device's form factor or performance, different computing devices have different rated maximum power. For example, a cluster of multiple servers has a higher rated maximum power than a single server. Servers with higher computing power have a higher rated maximum power than those with lower computing power. For instance, in the standard operating curve of a certain computing device, the maximum value is 30KW, and each power supply tested has a rated power of 10KW. In this case, at least three power supplies need to be connected in parallel to support the operation of the current computing device. Another computing device has a maximum power of 50KW, so at least five power supplies need to be connected in parallel to support its operation. Therefore, in the power supply testing system of this application embodiment, multiple power supplies can be pre-configured in the power supply group. The testing equipment can determine the number of power supplies to be connected in parallel according to the current testing scenario, and then configure the same number of power supplies in the power supply group to meet the testing requirements under different scenarios.
[0078] In some possible implementations, before power supply testing, the test equipment can optimize test cases based on the capacitive load of the power supply unit. The capacitive load refers to the output capacitor in the power supply unit. Capacitive loads can cause voltage undershoot (e.g., when the power supply is powered on, the capacitor charging causes a large instantaneous current, resulting in a voltage drop) or overshoot (when the load is unloaded, the capacitor discharging causes a voltage rise). The larger the capacitance value, the more pronounced the overshoot / undershoot phenomena. Therefore, the test equipment can adjust relevant content in the test cases based on the output capacitor size (e.g., setting a charging time for the capacitor before increasing the load value; the larger the capacitance value, the longer the charging time should be) to avoid overshoot or undershoot.
[0079] In some possible implementations, after S305 above, the power supply testing method provided in this application embodiment further includes: modifying the first test case according to the test results, obtaining the second test case, generating a second test script using the second test case and running it, so as to perform power supply testing on the power supply group again.
[0080] For example, if test results show that the power supply performs poorly under certain load conditions, such as excessive voltage fluctuations exceeding the allowable range, it may be due to unreasonable load segmentation, leading to unreasonable load value settings. In this case, the load segments can be redefined by increasing the segmentation precision, then a second test case can be generated, and the power supply test can be performed again. As another example, if test results show excessive voltage fluctuations, it may be due to excessive deviation from the standard operating curve. In this case, the deviation can be reduced (e.g., from 10% to 8%), the test operating curve can be regenerated, and a second test case can be generated based on the test operating curve, and the power supply test can be performed again.
[0081] In some possible implementations, after S305 above, the power supply testing method provided in this application embodiment further includes: modifying the hardware configuration of the power supply group according to the test results, and running the first test script again to perform power supply testing on the power supply group with modified hardware configuration.
[0082] The hardware configuration includes one or more of the following: the number of power supplies in the power supply group, and the output capacitor capacity of the power supply group. The number of power supplies determines the maximum power of the power supply group. The output capacitor capacity determines whether the output current of the power supply group is stable and whether it is prone to voltage fluctuations.
[0083] For example, if test results indicate that the power supply's capacity is insufficient, such as a significant voltage drop under high load, the number of power supplies included in the power supply can be increased to improve its capacity. As another example, if test results show large output voltage fluctuations, the capacitance of the output capacitor in the power supply can be increased to extend the output standby time and improve the power supply's stability and reliability.
[0084] By following the steps above, test cases can be adjusted automatically, resulting in more accurate test results and ensuring the accuracy of power supply testing.
[0085] In some scenarios, the target operating condition mentioned above is one of a set of operating conditions. After completing the power supply test of the power supply group under the target operating condition, the test equipment can also poll other operating conditions in the set of operating conditions and perform power supply tests on the power supply group under other operating conditions, that is, execute S301-S305 again.
[0086] For example, the set of operating conditions includes normal operating conditions, full load operating conditions, and sudden high load operating conditions. Each operating condition is tested in sequence according to the above test procedure, which can comprehensively evaluate the performance of the power supply under various operating conditions.
[0087] In some implementations, the testing equipment can aggregate and store multiple test results of the power supply group, which can be used for subsequent performance optimization, problem localization, and other processing based on the multiple test results.
[0088] Figure 8 This is a schematic diagram illustrating a complete power supply testing process provided in an embodiment of this application. Figure 8 As shown, firstly, an automated testing environment is set up (i.e., the environment described above is set up accordingly). Figure 1 The power supply test system shown. Then, the power supply group is subjected to multiple power supply tests, and the test process data (such as the test cases used in each test) and test results are recorded (i.e., S301-S305 above are repeated according to each operating condition in the operating condition set).
[0089] The power supply testing method provided in this application is applied to the scheduling system within a power supply testing system. The power supply testing system also includes an electronic load and a display device electrically connected to the output of the power supply group under test. The testing equipment is electrically connected to the electronic load and the display device. Through the aforementioned power supply testing system, the testing equipment can acquire the standard operating curve of the computing device under target operating conditions and generate a first test case and a first test script accordingly, avoiding manual intervention in the testing process and thus reducing the consumption of human resources. Furthermore, the testing equipment can automatically run the test script to test the power supply group, which can effectively improve the efficiency of power supply testing compared to manual testing, and can quickly obtain the test results of the power supply group under target operating conditions. It also avoids the problem of errors easily caused by manual parameter configuration, which affects the accuracy of the test.
[0090] In addition, this solution can generate corresponding test cases and test scripts according to different operating conditions, thereby enabling more comprehensive and accurate testing of the power supply's performance in various real-world usage scenarios and ensuring the reliable operation of the power supply in actual use.
[0091] As can be seen, the above mainly describes the solutions provided by the embodiments of this application from a methodological perspective. To achieve the above functions, the embodiments of this application provide corresponding hardware structures and / or software modules for executing each function. Those skilled in the art should readily recognize that, in conjunction with the modules and algorithm steps of the various examples described in the embodiments disclosed herein, the embodiments of this application can be implemented in hardware or a combination of hardware and computer software. Whether a function is executed in hardware or by computer software driving hardware depends on the specific application and design constraints of the technical solution. Those skilled in the art can use different methods to implement the described functions for each specific application, but such implementation should not be considered beyond the scope of this application.
[0092] In an exemplary embodiment, this application also provides a power supply testing apparatus. This power supply testing apparatus may be the aforementioned testing equipment, or it may be a processor within the testing equipment. The power supply testing apparatus may include one or more functional modules for implementing the power supply testing methods of the above method embodiments.
[0093] In an exemplary embodiment, a power supply testing system is used to perform power supply testing on a power supply group consisting of at least one power supply of a computing device; the power supply testing system includes: a testing device, and an electronic load and a display device electrically connected to the output of the power supply group; the testing device is electrically connected to the power supply group, the electronic load, and the display device; the testing device is configured to: Obtain the standard operating curve of the computing device under target operating conditions; Based on the standard operating curve, test cases are generated; the test cases are used to indicate the load conditions for testing the power supply under the target operating conditions. Generate test scripts based on test cases; Run the test script to configure the load parameters of the electronic load and perform power supply tests on the power supply group; The test results of the power supply test are obtained through a display device, and the test results are used to indicate the performance of the power supply under target operating conditions.
[0094] This application also provides a computer-readable storage medium. All or part of the processes in the above method embodiments can be executed by computer instructions instructing related hardware; for example, the related hardware can be a processor of a computing device. The program instructions can be stored in the above-mentioned computer-readable storage medium, and when executed, the processes of the above method embodiments can be implemented. The computer-readable storage medium can be memory. The above-mentioned computer-readable storage medium can also be an external storage device, such as a hard disk, smart media card (SMC), secure digital (SD) card, flash card, etc. Further, the above-mentioned computer-readable storage medium can include both memory and external storage devices. The above-mentioned computer-readable storage medium is used to store the above-mentioned computer program instructions and other programs and data required for the above power supply test.
[0095] This application also provides a computer program product comprising a computer program that, when run on a computing device, causes the computing device to perform any of the power testing methods provided in the above embodiments.
[0096] Although this application has been described herein in conjunction with various embodiments, those skilled in the art, by reviewing the accompanying drawings, disclosure, and appended claims, will understand and implement other variations of the disclosed embodiments in carrying out the claimed application. In the claims, the word "comprising" does not exclude other components or steps, and "a" or "an" does not exclude multiple instances. A single processor or other unit can implement several functions listed in the claims. While different dependent claims may recite certain measures, this does not mean that these measures cannot be combined to produce good results.
[0097] Although this application has been described in conjunction with specific features and embodiments, it is obvious that various modifications and combinations can be made thereto without departing from the spirit and scope of this application. Accordingly, this specification and drawings are merely exemplary illustrations of this application as defined by the appended claims, and are considered to cover any and all modifications, variations, combinations, or equivalents within the scope of this application. Clearly, those skilled in the art can make various alterations and modifications to this application without departing from the spirit and scope of this application. Thus, if such modifications and modifications of this application fall within the scope of the claims of this application and their equivalents, this application is also intended to include such modifications and modifications.
[0098] The above are merely specific embodiments of this application, but the scope of protection of this application is not limited thereto. Any changes or substitutions within the technical scope disclosed in this application should be included within the scope of protection of this application. Therefore, the scope of protection of this application should be determined by the scope of the claims.
Claims
1. A power supply testing method, characterized in that, A test device is used in a power supply testing system, the power supply testing system being used to perform power supply testing on a power supply group consisting of at least one power supply of a computing device; the power supply testing system further includes: an electronic load and a display device electrically connected to the output of the power supply group; wherein the electronic load consumes electrical energy by controlling the power of its internal components; the test device is electrically connected to the electronic load and the display device; the method includes: Obtain the standard operating curve of the computing device under the target operating conditions; Based on the standard operating curve, a first test case is generated; the first test case is used to indicate the load conditions for testing the power supply under the target operating condition. Based on the first test case, generate the first test script; Run the first test script to configure the load parameters of the electronic load and perform a power supply test on the power supply group; The test results of the power supply test are obtained through the display device, and the test results are used to indicate the performance of the power supply group under the target operating conditions.
2. The method according to claim 1, characterized in that, The step of generating the first test case based on the standard working curve includes: Identify abrupt change points in the standard operating curve, and divide the standard operating curve into multiple load segments based on the identification results; The first test case is generated according to the time sequence of the multiple load segments, based on the load value and corresponding load duration of each load segment.
3. The method according to claim 2, characterized in that, Before generating the first test case based on the standard working curve, the method further includes: The deviation values of the standard working curve are superimposed; the load value of the standard working curve at any time after superposition is higher than the load value of the standard working curve at the same time before superposition.
4. The method according to claim 2, characterized in that, The step of obtaining the power supply test results through the display device includes: The test results are obtained by recording the maximum and minimum voltage values of each load segment in the order of time of multiple load segments through the display device.
5. The method according to claim 3, characterized in that, The configuration of the load parameters of the electronic load includes: For each of the plurality of load segments, the load parameters of the electronic load are configured according to the load value of the load segment and the corresponding load duration.
6. The method according to any one of claims 1-5, characterized in that, After obtaining the test results of the power supply test through the display device, the method further includes: Based on the test results, the first test case is modified to obtain a second test case. The second test case is used to generate a second test script and run it so as to perform power supply testing on the power supply group again. or, Based on the test results, modify the hardware configuration of the power supply group and run the first test script again to perform power supply testing on the power supply group with the modified hardware configuration.
7. The method according to any one of claims 1-6, characterized in that, The power supply test targets the enabled power supplies in the power supply group; prior to performing the power supply test on the power supply group, the method further includes: The number of parallel units is determined based on the maximum value in the standard operating curve and the rated power of each power supply. The same number of power supplies are enabled in the power supply group according to the number of parallel units.
8. The method according to any one of claims 1-7, characterized in that, The computing device is a graphics processing unit (GPU) server, and the standard operating curve is the standard load curve of the GPU.
9. A power supply testing system, characterized in that, The power supply testing system is used to perform power supply testing on a power supply group consisting of at least one power supply of a computing device; the power supply testing system includes: a testing device, and an electronic load and a display device electrically connected to the output of the power supply group; the electronic load consumes electrical energy by controlling the power of its internal components; the testing device is electrically connected to the power supply group, the electronic load, and the display device; the testing device is configured to: Obtain the standard operating curve of the computing device under the target operating conditions; Based on the standard operating curve, test cases are generated; the test cases are used to indicate the load conditions for testing the power supply under the target operating condition. Based on the test cases, generate test scripts; Run the test script to configure the load parameters of the electronic load and perform a power supply test on the power supply group; The test results of the power supply test are obtained through the display device, and the test results are used to indicate the performance of the power supply group under the target operating conditions.
10. A computing device, characterized in that, The computing device includes a processor and a memory; the processor is coupled to the memory. The memory is used to store computer instructions; The computer instructions are loaded and executed by the processor to enable the computing device to implement the power supply test method as described in any one of claims 1-8.