Image sensor starting method and image sensor

Abstract

The invention discloses an image sensor starting method and an image sensor, and belongs to the field of semiconductor integrated circuit design, the image sensor comprises an image sensing chip, and the image sensing chip comprises a digital control part, a software control part, a memory and a pin; the method comprises the following steps: performing logic built-in self-inspection on a digital control part, and storing a logic built-in self-inspection result; performing memory built-in self-inspection on the memory, and storing a memory built-in self-inspection result; after logic built-in self-test and memory built-in self-test pass, loading and starting a loading program in the software control part; after the starting loading program passes loading, pin signals are output according to the logic built-in self-checking result and the memory built-in self-checking result, and the pin signals are transmitted to the pins; and detecting the pin, and starting the output image or waiting to start the output image when the detection is judged to be successful. According to the invention, interaction with the vehicle-mounted terminal is not needed, and the image sensing chip can autonomously judge whether to directly select to output the image or not.

Description

Technical Field

[0001] This application relates to the field of semiconductor integrated circuit design, and in particular to an image sensor startup method and an image sensor. Background Technology

[0002] To meet certain functional safety requirements, automotive-grade image sensor chips must operate in a safe state. Therefore, during power-up, both analog and digital circuits need to undergo a comprehensive self-test. Normal operation can only commence after the self-test passes. The traditional power-up process for automotive-grade image sensor chips is as follows: after entering power-on reset, the chip completes self-tests sequentially and waits for output current. During this waiting period, the vehicle's infotainment system queries the image sensor chip's registers via a communication channel to read the detection results of different tests. Based on the results, the system decides whether to reset and retry or send an image output command to the chip. Upon receiving the command, the image sensor chip selects to output an image. Because this entire process requires waiting for the vehicle's infotainment system to become idle before interactive communication with the chip, it not only increases startup time but also wastes the system's computing resources. Furthermore, the self-test items are limited, and the image sensor chip's state cannot be autonomously controlled. Summary of the Invention

[0003] The purpose of this application is to provide an image sensor startup method and an image sensor, thereby shortening the image sensor startup and image output time and reducing the waste of vehicle computing resources.

[0004] To achieve the above objectives, this application provides an image sensor startup method, wherein the image sensor includes an image sensing chip, comprising: the image sensing chip includes a digital control section, a software control section, a memory, and pins;

[0005] Perform a built-in logic self-test on the digital control section and save the results of the built-in logic self-test;

[0006] Perform a built-in memory self-test on the memory and save the results of the built-in memory self-test;

[0007] After both the logic built-in self-test and the memory built-in self-test pass, the startup loading program is loaded in the software control section.

[0008] After the startup loader is successfully loaded, it outputs a pin signal based on the logic built-in self-test result and the memory built-in self-test result, and transmits the pin signal to the pin.

[0009] The pin is tested, and when the test is successful, the output image is started or the process waits to start the output image.

[0010] Optionally, after the image sensor enters the power-on reset state, the built-in logic self-test of the digital control part is performed, and the built-in logic self-test result is saved.

[0011] Accordingly, after the built-in logic self-test passes, the built-in memory self-test is performed on the memory, and the built-in memory self-test result is saved.

[0012] Optionally, the pin is an I / O pin; the step of detecting the pin and initiating image output when the detection is successful includes:

[0013] The pin is detected, and when a rising edge from low to high is detected on the pin, the detection is considered successful, and the image is output.

[0014] Optionally, the step of detecting the pin, and waiting for the output image to be started after determining that the detection is successful, further includes:

[0015] When an image output command is detected, the image is output; the image output command is the command output by the vehicle system when it detects that the pin detection is successful.

[0016] Optionally, after detecting the pin, the method further includes:

[0017] When a detection is deemed to have failed, the flow will be paused and the process will wait.

[0018] And / or, when a detection failure is determined, the register is read, the image sensor is reset, and the process returns to the power-on reset state of the image sensor chip.

[0019] Optionally, the image sensing chip further includes analog circuitry and pixel array circuitry; after the startup loading program completes loading, it further includes:

[0020] Perform a built-in self-test on the software control section and save the results of the built-in self-test.

[0021] And / or, perform a pixel-in-pixel self-test on the pixel array circuit and save the pixel-in-pixel self-test results;

[0022] And / or, perform a built-in self-test on the analog circuit and save the results of the built-in self-test.

[0023] Optionally, the step of outputting a pin signal based on the logic's built-in self-test result and the memory's built-in self-test result, and transmitting the pin signal to the pin, includes:

[0024] By inputting the logic's built-in self-test result and the memory's built-in self-test result into the first AND gate, a first pin signal is output;

[0025] The second pin signal is output by inputting the software built-in self-test result, the pixel built-in self-test result, and the analog circuit built-in self-test result into the second AND gate.

[0026] By inputting the first pin signal and the second pin signal into a third AND gate, the pin signal is output and transmitted to the pin.

[0027] Optionally, the software-built-in self-test, the pixel-built-in self-test, and the analog circuit-built-in self-test are executed in parallel, and the results of the software-built-in self-test, the pixel-built-in self-test, and the analog circuit-built-in self-test are saved respectively.

[0028] Optionally, the step of performing a built-in self-test on the software control section and saving the results of the built-in self-test includes:

[0029] During the initialization of the software control section, the software test library program is loaded;

[0030] A calculation result is obtained by performing at least one logical operation and at least one memory call through the software test library program;

[0031] The calculation results are compared with the preset expected value;

[0032] When the calculation result is found to be consistent with the preset expected value, it is determined that the software built-in self-test is successful, the first result of the software built-in self-test is output and saved;

[0033] When the calculation result is found to be inconsistent with the preset expected value, it is determined that the software built-in self-test has failed, the second result of the software built-in self-test is output and saved.

[0034] Optionally, performing a pixel-based self-test on the pixel array circuit and saving the pixel-based self-test results includes:

[0035] Detect the voltage values ​​of multiple rows of pixels in the pixel array circuit;

[0036] Determine whether the voltage value is within the preset fluctuation range, and output the self-test result of the pixel;

[0037] When the detected voltage value is within the preset fluctuation range, it is determined that the pixel's built-in self-test is successful, the first result of the pixel's built-in self-test is output and saved;

[0038] When the detected voltage value is outside the preset fluctuation range, it is determined that the pixel's built-in self-test has failed, the second result of the pixel's built-in self-test is output and saved.

[0039] Optionally, performing a built-in self-test on the analog circuit and saving the self-test results includes:

[0040] During the built-in self-test of the analog circuit, errors are injected into each analog module of the analog circuit.

[0041] After the built-in self-test of the analog circuit passes, the error injection is revoked;

[0042] Determine whether each of the simulation modules successfully injected an error;

[0043] When the error injection of each analog module is successfully detected, after the signal interaction is completed, the built-in self-test of the analog circuit is output as a pass signal. After the error injection is cancelled, it is determined that the built-in self-test of the analog circuit is successful, the first result of the built-in self-test of the analog circuit is output and saved.

[0044] When it is detected that the error was not successfully injected by each of the simulation modules, it is determined that the built-in self-test of the simulation circuit has failed, the second result of the built-in self-test of the simulation circuit is output and saved.

[0045] To achieve the above objectives, this application also provides an image sensor employing any of the image sensor startup methods described above.

[0046] Obviously, the image sensor startup method provided in this application involves the image sensor chip completing all self-tests during power-up, outputting pin signals based on the self-test results, and transmitting these pin signals to the image sensor chip's own pins. By detecting the pins, if the detection is successful, the chip either starts outputting an image or waits to start outputting an image. Under normal self-test conditions, there is no need to interact with the vehicle's infotainment system during this process, enabling the image sensor chip to autonomously determine whether to directly select to output an image. This reduces the interaction time with the vehicle's infotainment system, resulting in faster image output. Through this improved state machine design, the image sensor chip can reduce the image output time to less than 100ms while completing all module self-tests, resulting in more stable and secure image output, meeting the special requirements of real-time performance and security for vehicle-mounted image sensor chips. Attached Figure Description

[0047] To more clearly illustrate the technical solutions in the embodiments of this application or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only embodiments of this application. For those skilled in the art, other drawings can be obtained based on the provided drawings without creative effort.

[0048] Figure 1 This is a schematic diagram of the startup process of a traditional image sensor.

[0049] Figure 2 This application provides a flowchart of an image sensor startup method according to an embodiment;

[0050] Figure 3 This is a schematic diagram of the basic structure of an automotive-grade image sensing chip provided in an embodiment of this application;

[0051] Figure 4 A flowchart illustrating an IO detection method provided in an embodiment of this application;

[0052] Figure 5 This is a flowchart illustrating an image sensor startup method provided in an embodiment of this application. Detailed Implementation

[0053] To make the objectives, technical solutions, and advantages of the embodiments of this application clearer, the technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, not all embodiments. Based on the embodiments of this application, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application.

[0054] The power-on process of traditional automotive-grade image sensor chips is as follows: Figure 1 As shown, the process includes:

[0055] 1. After entering the Power-On Reset Idle (POR IDEL) state, the image sensor chip performs a Logic Built-in Self-Test (LBIST). During this stage, the Digital Control (DIG_CTRL) section performs the LBIST.

[0056] 2. After the logic built-in self-test passes (LBIST DONE), the memory built-in self-test (MBIST) is performed.

[0057] 3. After the built-in memory self-test passes (MBIST DONE), the image sensor chip begins to load the software control unit (Microcontroller Unit, MCU) initialization program (i.e., the bootloader).

[0058] 4. After the startup loading is successful (BOOT DONE), the image sensor chip prepares to output (i.e. enters the waiting state). During this period, the vehicle system can communicate with the image sensor chip via IIC (Inter-Integrated Circuit) to query the various functional safety registers and status registers of the image sensor chip inside the image sensor.

[0059] When the vehicle system detects a certain functional safety failure (Check Fail), it will check the status or reset the image sensor chip to start a second power-on self-test.

[0060] If the check is successful, a command to start the outflow is sent. After receiving the command, the image sensor chip selects the outflow (i.e., outputs the image).

[0061] Traditional in-vehicle infotainment systems typically take around 150ms to start up and generate images. The main time consumed is waiting for the system to become idle before engaging in interactive communication and querying. Existing technologies not only increase startup time but also waste the system's computing resources. Furthermore, the self-check items are limited, and the image sensor chip status cannot be autonomously controlled.

[0062] Therefore, this application provides an image sensor startup method that enables the image sensor chip to autonomously determine whether to directly select the output image by detecting the pins, thereby shortening the image sensor startup and image output time and reducing the waste of vehicle computing resources.

[0063] Please refer to Figure 2 , Figure 2 A flowchart of an image sensor startup method provided in this application embodiment, the method may include:

[0064] S101: Performs a built-in logic self-test on the digital control section and saves the results of the built-in logic self-test; the image sensor chip includes a digital control section, a software control section, a memory, and pins.

[0065] The image sensor in this embodiment may include, but is not limited to, automotive-grade image sensors, such as CMOS (Complementary Metal-Oxide-Semiconductor) image sensors. The image sensor in this embodiment includes an image sensing chip, which can be any chip capable of implementing an image sensor. For example... Figure 3As shown, the image sensor chip in this embodiment includes a digital control section (DIG_CTRL), a software control section (MCU), a memory (not shown in the figure), and pins, which can be I / O (Input / Output) pins. The image sensor chip in this embodiment also includes analog circuitry (ANA) and a pixel array circuit.

[0066] It should be noted that, in principle, each module of the image sensing chip in this embodiment needs to perform a self-test when the vehicle is powered on and started to ensure that each module can work normally. At the same time, there is a real-time requirement when the vehicle is powered on and started.

[0067] It should be noted that in this embodiment, the logic built-in self-test result after reset is low level; when the logic built-in self-test is determined to be successful, the first logic built-in self-test result can be output; when the logic built-in self-test is determined to be unsuccessful, the second logic built-in self-test result can be output; wherein, the first logic built-in self-test result is high level; and the second logic built-in self-test result is low level.

[0068] S102: Perform a built-in memory self-test on the memory and save the results of the built-in memory self-test.

[0069] This embodiment does not limit the specific order of the logic built-in self-test and the memory built-in self-test. After the image sensor enters the power-on reset state, step S101 can be executed first, and step S102 can be executed after the logic built-in self-test passes. Alternatively, after the image sensor enters the power-on reset state, step S102 can be executed first, and step S101 can be executed after the memory built-in self-test passes.

[0070] In this embodiment, self-tests are performed on each module of the image sensor chip, which may include, but is not limited to, logic-built-in self-tests and memory-built-in self-tests. Specifically, the memory-built-in self-test involves performing a memory-built-in self-test on all memories within the image sensor chip.

[0071] It should be noted that in this embodiment, the memory built-in self-test result is low after reset; when the memory built-in self-test is determined to be successful, the first memory built-in self-test result can be output; when the memory built-in self-test is determined to be unsuccessful, the second memory built-in self-test result can be output; wherein, the first memory built-in self-test result is high; and the second memory built-in self-test result is low.

[0072] S103: After both the logic built-in self-test and the memory built-in self-test pass, the startup loader is loaded in the software control section.

[0073] This embodiment does not limit the specific method of loading the startup loader, as long as it can be loaded into the software control part. For example, the startup loader in the external flash memory can be loaded in the software control part.

[0074] Furthermore, to perform a comprehensive circuit self-test, this embodiment may further include the following after step S103:

[0075] Perform a built-in self-test on the software control section and save the results.

[0076] And / or, perform pixel-in-pixel self-test on the pixel array circuit and save the pixel-in-pixel self-test results;

[0077] And / or, perform a built-in self-test on the analog circuit and save the results of the built-in self-test.

[0078] This embodiment may include at least one of software built-in self-test, pixel built-in self-test, and analog circuit built-in self-test.

[0079] Furthermore, in order to shorten the startup time, when the software built-in self-test, pixel built-in self-test, and analog circuit built-in self-test are all performed, this embodiment can execute the software built-in self-test, pixel built-in self-test, and analog circuit built-in self-test in parallel, and save the software built-in self-test results, pixel built-in self-test results, and analog circuit built-in self-test results respectively.

[0080] It should be noted that the built-in software self-test in this embodiment is to check whether the software functions of the software control section are normal. This embodiment does not limit the specific method of performing the built-in software self-test, as long as it can determine whether the software functions of the software control section are normal. For example, the following methods can be used:

[0081] During the initialization of the software control section, the software test library program is loaded;

[0082] A calculation result is obtained by performing at least one logical operation and at least one memory call through the software test library program;

[0083] Compare the calculation results with the preset expected value;

[0084] When the calculation result is found to be consistent with the preset expected value, it is determined that the software built-in self-test is successful, the first result of the software built-in self-test is output and saved;

[0085] When the calculated result is found to be inconsistent with the preset expected value, it is determined that the software's built-in self-test has failed, the second result of the software's built-in self-test is output and saved.

[0086] It should be noted that in this embodiment, the software built-in self-test result after reset is low level; when the software built-in self-test is determined to be successful, it means that the software function of the software control part is normal, and the first result of the software built-in self-test is high level; when the software built-in self-test is determined to be unsuccessful, it means that the software function of the software control part is abnormal, and the second result of the software built-in self-test is low level.

[0087] It should be noted that the pixel-based self-test in this embodiment is to check whether the photoelectric conversion logic of the pixel array circuit is normal. This embodiment does not limit the specific method of performing the pixel-based self-test, as long as it can determine whether the photoelectric conversion logic of the pixel array circuit is normal. For example, the following methods can be used:

[0088] Detect the voltage values ​​of multiple rows of pixels in the pixel array circuit;

[0089] Determine whether the voltage value is within the preset fluctuation range and output the pixel's built-in self-test result;

[0090] When the detected voltage value is within the preset fluctuation range, it is determined that the pixel built-in self-test is successful, the first result of the pixel built-in self-test is output and saved;

[0091] When the detected voltage value is outside the preset fluctuation range, it is determined that the pixel built-in self-test has failed, the second result of the pixel built-in self-test is output and saved.

[0092] It should be noted that in this embodiment, the pixel's built-in self-test result is low after reset; when the pixel's built-in self-test is determined to be successful, it means that the photoelectric conversion logic of the pixel array circuit is normal, and the first result of the pixel's built-in self-test is high; when the pixel's built-in self-test is determined to be unsuccessful, it means that the photoelectric conversion logic of the pixel array circuit is abnormal, and the second result of the pixel's built-in self-test is low.

[0093] It should be noted that the built-in self-test of the analog circuit in this embodiment is to check whether the analog circuit is functioning properly. This embodiment does not limit the specific method of performing the built-in self-test of the analog circuit, as long as it can determine whether the analog circuit is functioning properly. For example, the following methods can be used:

[0094] During the built-in self-test of the analog circuit, errors are injected into each analog module of the analog circuit;

[0095] After the built-in self-test of the analog circuit passes, the error injection is canceled.

[0096] Determine whether each simulation module has successfully injected errors;

[0097] When the error injection of each analog module is successfully detected, after the signal interaction is completed, the built-in self-test of the analog circuit is output as a pass signal. After the error injection is cancelled, the built-in self-test of the analog circuit is determined to be successful, the first result of the built-in self-test of the analog circuit is output and saved.

[0098] When an error is detected that an analog module has failed to inject, it is determined that the built-in self-test of the analog circuit has failed. The second result of the built-in self-test of the analog circuit is output and saved.

[0099] It should be noted that in this embodiment, the built-in self-test result of the analog circuit after reset is low level; when an error injection is detected, the built-in self-test result of the analog circuit is low level; and when the error is cleared, if the built-in self-test of the analog circuit is determined to be successful, it means that the function of the analog circuit is normal, and the first result of the built-in self-test of the analog circuit is high level; if the built-in self-test of the analog circuit is determined to be unsuccessful, it means that the function of the analog circuit is abnormal, and the second result of the built-in self-test of the analog circuit is low level.

[0100] S104: After the startup loader passes the loading test, it outputs a pin signal based on the logic built-in self-test result and the memory built-in self-test result, and transmits the pin signal to the pin.

[0101] This embodiment does not limit the specific method of outputting the pin signal. It can be determined according to the actual pin detection judgment conditions. For example, the logic built-in self-test result and the memory built-in self-test result can be input into an AND gate to output the pin signal and transmit the pin signal to the pin.

[0102] It should be noted that the AND gate in this embodiment includes two input terminals and one output terminal. When both the logic built-in self-test result and the memory built-in self-test result are low after reset, the pin signal output by the output terminal is low. When both the logic built-in self-test result and the memory built-in self-test result are high, the pin signal output by the output terminal becomes high. Therefore, the existence of a rising edge from low to high can be used as the judgment condition for pin detection.

[0103] Furthermore, when the software-built-in self-test, pixel-built-in self-test, and analog circuit-built-in self-test are all performed, S104 in this embodiment may include:

[0104] The first pin signal is output by inputting the logic built-in self-test result and the memory built-in self-test result into the first AND gate;

[0105] The second pin signal is output by inputting the software built-in self-test result, the pixel built-in self-test result, and the analog circuit built-in self-test result into the second AND gate.

[0106] By inputting the first pin signal and the second pin signal into the third AND gate, a pin signal is output and transmitted to the pin.

[0107] It should be noted that in this embodiment, the first AND gate and the third AND gate each include two input terminals and one output terminal; the second AND gate includes three input terminals and one output terminal. After the image sensor chip is reset, the input terminals of the first AND gate, the second AND gate, and the third AND gate are all at low level, therefore the output terminal of the third AND gate is at low level. When the logic built-in self-test result, the memory built-in self-test result, the software built-in self-test result, the pixel built-in self-test result, and the analog circuit built-in self-test result are all at high level, the pin signals output by the output terminals of the first AND gate, the second AND gate, and the third AND gate are all at high level. Therefore, the existence of a rising edge from low level to high level at the output terminal of the third AND gate can be used as the judgment condition for pin detection.

[0108] S105: Detects the pin. When the detection is successful, starts the output image or waits for the output image to start.

[0109] This embodiment does not limit the specific judgment conditions for pin detection, as long as it can be ensured that the various self-test results of the image sensor chip are normal or exist or not. For example, when the pin is an IO pin, the pin can be detected. When a rising edge from low to high level is detected on the pin, the detection is considered successful, and image output is started. Furthermore, the IO pin in this embodiment can be the ERRB (Error Bit) pin, which is the IO pin in the image sensor chip used to output error reports. An error is reported when the ERRB pin is low, and the ERRB pin is low after the system is powered on and reset.

[0110] Furthermore, in this embodiment, the pin is detected. When the detection is successful, after waiting for the output image to be started, the process may further include:

[0111] When an output image command is detected, the image output is initiated; the output image command is the command output by the vehicle system when it detects successful pin detection.

[0112] It should be noted that in this embodiment, when the detection is successful, in addition to directly starting the image output, the image sensor chip can also, according to the initial configuration, pause and wait after completing its self-test. In this case, the vehicle system can detect whether the pin detection is successful (e.g., whether there is a rising edge from low to high on the pin). When the pin detection is successful, it can send an image output command to the image sensor chip at any time, allowing the image sensor chip to output the image without reading the image sensor chip's internal registers and other inserted information lines to determine the image sensor chip's status and image quality.

[0113] This embodiment does not limit the subsequent operations after a detection failure, and can be determined according to the actual situation. For example, after detecting the pin, it may also include:

[0114] When the detection is determined to be a failure, the stream is stopped and the system waits, meaning it does not output any images and enters a standby state.

[0115] And / or, when a detection failure is determined, the register is read, the image sensor is reset, and the process returns to the power-on reset state of the image sensor chip.

[0116] Based on the above embodiments, during power-up, the image sensor chip in this application, after passing all self-tests, outputs pin signals according to the self-test results and transmits the pin signals to its own pins. By detecting the pins, when the detection is successful, it starts outputting an image or waits to start outputting an image. Under normal self-test conditions, there is no need to interact with the vehicle system during this process, enabling the image sensor chip to autonomously determine whether to directly select to output an image, thereby reducing the interaction time with the vehicle system and thus quickly generating an image. Through this improved state machine design, the image sensor chip can reduce the image generation time to less than 100ms while completing all module self-tests, resulting in more stable and secure image output, meeting the special requirements of real-time performance and security for vehicle system image sensor chips.

[0117] This application also provides an image sensor that uses the image sensor startup method described above.

[0118] Based on the above embodiments, this application adopts the above-described image sensor activation method, and therefore also has the above-described beneficial effects.

[0119] The following example illustrates the image sensor startup process. Please refer to [link / reference]. Figure 4 and Figure 5 , Figure 4 This is a flowchart illustrating an IO detection method provided in an embodiment of this application. Figure 5 The following is a flowchart illustrating an image sensor startup method provided in an embodiment of this application.

[0120] 1. After power-on reset, the image sensor chip enters the power-on reset (POR IDLE) state;

[0121] 2. Next, a built-in logic self-test (LBIST) is performed on the digital control section. The estimated time for this process is 20ms, and the result of the built-in logic self-test (LBIST_ERR) is saved. When the built-in logic self-test is successful, the result of the built-in logic self-test (LBIST_ERR) is high.

[0122] 3. After the built-in logic self-test passes (LBIST DONE), a built-in memory self-test (MBIST) is performed on the memory. The estimated time for this process is 10ms, and the built-in memory self-test result (MBIST_ERR) is saved. When the built-in memory self-test is successful, the built-in memory self-test result (MBIST_ERR) is high.

[0123] 4. After the built-in memory self-test (MBIST DONE) passes, the startup loader (MCU BOOT LOADER) is loaded in the software control section. The estimated time for this process is 60ms.

[0124] 5. After the loader successfully loads (BOOT DONE), proceed in parallel:

[0125] Perform a built-in self-test (MCU SOFT BIST) on the software control section. The process is expected to take 1ms. Save the built-in self-test results (SBIST).

[0126] Perform a Pixel Built-in Self-Test (PBIST) on the pixel array circuit. The process is expected to take 1ms. Save the Pixel Built-in Self-Test (PBIST) results.

[0127] It also performs an analog circuit built-in self-test (ANA BIST) on the analog circuit, which is expected to take 3ms, and saves the results of the analog circuit built-in self-test (ABIST).

[0128] 6. After the image sensor chip completes the above three self-tests (SBIST DONE, PBIST DONE and ABIST DONE), it outputs the first pin signal by inputting the logic built-in self-test result (LBIST_ERR) and the memory built-in self-test result (MBIST_ERR) into the first AND gate.

[0129] The second pin signal is output by inputting the software built-in self-test results (SBIST), pixel built-in self-test results (PBIST), and analog circuit built-in self-test results (ABIST) into the second AND gate;

[0130] By inputting the first pin signal and the second pin signal into the third AND gate, a pin signal (ERRB) is output and transmitted to the pin;

[0131] 7. Test the pins, such as... Figure 4 As shown, in the MCU initialization program, after detecting the rising edge of the pin signal (ERRB) from low to high, normal image output can be selected; otherwise, the image sensor chip will stop current and wait.

[0132] After this, the image sensor chip completes all self-tests and judges the results. If the self-tests pass, it autonomously controls the output image; otherwise, the image sensor chip enters a standby state. Under normal self-test conditions, there is no need to interact with the vehicle's infotainment system during this process, which can shorten the image sensor chip startup time to less than 100ms (the sum of the above times), thereby making the output image more stable and reliable, and improving real-time performance.

[0133] This document uses specific examples to illustrate the principles and implementation methods of this application. The various embodiments are progressive, with each embodiment focusing on its differences from others. Similar or identical parts between embodiments can be referred to interchangeably. The descriptions of the embodiments above are merely illustrative of the method and core ideas of this application. For those skilled in the art, various improvements and modifications can be made to this application without departing from its principles, and these improvements and modifications also fall within the scope of protection of the claims of this application.

[0134] It should also be noted that, in this specification, relational terms such as "first" and "second" are used only to distinguish one entity or operation from another, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Furthermore, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such process, method, article, or apparatus. Without further limitations, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes the element.

Claims

1. A method for activating an image sensor, the image sensor comprising an image sensing chip, characterized in that, include: The image sensing chip includes a digital control section, a software control section, a memory, and pins; Perform a built-in logic self-test on the digital control section and save the results of the built-in logic self-test; Perform a built-in memory self-test on the memory and save the results of the built-in memory self-test; After both the logic built-in self-test and the memory built-in self-test pass, the startup loading program is loaded in the software control section. After the startup loader is successfully loaded, it outputs a pin signal based on the logic built-in self-test result and the memory built-in self-test result, and transmits the pin signal to the pin. The pin is tested, and when the test is successful, the output image is started or the process waits to start the output image.

2. The image sensor startup method according to claim 1, characterized in that, After the image sensor enters the power-on reset state, the built-in logic self-test of the digital control part is performed and the result of the built-in logic self-test is saved. After the built-in logic self-test passes, the built-in memory self-test is performed on the memory, and the result of the built-in memory self-test is saved.

3. The image sensor startup method according to claim 1, characterized in that, The pin is an I / O pin; the detection of the pin, and when the detection is successful, the image output is initiated, including: The pin is detected, and when a rising edge from low to high is detected on the pin, the detection is considered successful, and the image is output.

4. The image sensor startup method according to claim 1, characterized in that, The step of detecting the pin, and when the detection is successful, after waiting for the output image to be started, also includes: When an image output command is detected, the image is output; the image output command is the command output by the vehicle system when it detects that the pin detection is successful.

5. The image sensor startup method according to claim 1, characterized in that, After detecting the pin, the process further includes: When a detection is deemed to have failed, the flow is paused and the process waits. And / or, when a detection failure is determined, the register is read, the image sensor is reset, and the process returns to the power-on reset state of the image sensor chip.

6. The image sensor startup method according to any one of claims 1 to 5, characterized in that, The image sensing chip also includes analog circuitry and a pixel array circuitry; after the startup loading program completes loading, it further includes: Perform a built-in self-test on the software control section and save the results of the built-in self-test. And / or, perform a pixel-in-pixel self-test on the pixel array circuit and save the pixel-in-pixel self-test results; And / or, perform a built-in self-test on the analog circuit and save the results of the built-in self-test.

7. The image sensor startup method according to claim 6, characterized in that, The step of outputting a pin signal based on the logic's built-in self-test result and the memory's built-in self-test result, and transmitting the pin signal to the pin, includes: By inputting the logic's built-in self-test result and the memory's built-in self-test result into the first AND gate, a first pin signal is output; The second pin signal is output by inputting the software built-in self-test result, the pixel built-in self-test result, and the analog circuit built-in self-test result into the second AND gate. By inputting the first pin signal and the second pin signal into a third AND gate, the pin signal is output and transmitted to the pin.

8. The image sensor startup method according to claim 6, characterized in that, The software-built-in self-test, the pixel-built-in self-test, and the analog circuit-built-in self-test are executed in parallel, and the results of the software-built-in self-test, the pixel-built-in self-test, and the analog circuit-built-in self-test are saved respectively.

9. The image sensor startup method according to claim 6, characterized in that, The step of performing a built-in self-test on the software control section and saving the results of the built-in self-test includes: During the initialization of the software control section, the software test library program is loaded; A calculation result is obtained by performing at least one logical operation and at least one memory call through the software test library program; The calculation results are compared with the preset expected value; When the calculation result is found to be consistent with the preset expected value, it is determined that the software built-in self-test is successful, the first result of the software built-in self-test is output and saved; When the calculation result is found to be inconsistent with the preset expected value, it is determined that the software built-in self-test has failed, the second result of the software built-in self-test is output and saved.

10. The image sensor startup method according to claim 6, characterized in that, The step of performing a pixel-based self-test on the pixel array circuit and saving the pixel-based self-test results includes: Detect the voltage values ​​of multiple rows of pixels in the pixel array circuit; Determine whether the voltage value is within the preset fluctuation range, and output the self-test result of the pixel; When the detected voltage value is within the preset fluctuation range, it is determined that the pixel's built-in self-test is successful, the first result of the pixel's built-in self-test is output and saved; When the detected voltage value is outside the preset fluctuation range, it is determined that the pixel's built-in self-test has failed, the second result of the pixel's built-in self-test is output and saved.

11. The image sensor startup method according to claim 6, characterized in that, The step of performing a built-in self-test on the analog circuit and saving the results of the built-in self-test includes: During the built-in self-test of the analog circuit, errors are injected into each analog module of the analog circuit. After the built-in self-test of the analog circuit passes, the error injection is revoked; Determine whether each of the simulation modules successfully injected an error; When the error injection of each analog module is successfully detected, after the signal interaction is completed, the built-in self-test of the analog circuit is output as a pass signal. After the error injection is cancelled, it is determined that the built-in self-test of the analog circuit is successful, the first result of the built-in self-test of the analog circuit is output and saved. When it is detected that the error was not successfully injected by each of the simulation modules, it is determined that the built-in self-test of the simulation circuit has failed, the second result of the built-in self-test of the simulation circuit is output and saved.

12. An image sensor, characterized in that, The image sensor startup method as described in any one of claims 1 to 11 is adopted.

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